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TWI366675B - - Google Patents

Info

Publication number
TWI366675B
TWI366675B TW097109483A TW97109483A TWI366675B TW I366675 B TWI366675 B TW I366675B TW 097109483 A TW097109483 A TW 097109483A TW 97109483 A TW97109483 A TW 97109483A TW I366675 B TWI366675 B TW I366675B
Authority
TW
Taiwan
Application number
TW097109483A
Other versions
TW200844464A (en
Inventor
Tatsuya Yamada
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200844464A publication Critical patent/TW200844464A/zh
Application granted granted Critical
Publication of TWI366675B publication Critical patent/TWI366675B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31813—Test pattern generators

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Semiconductor Integrated Circuits (AREA)
TW097109483A 2007-03-21 2008-03-18 Test apparatus and electronic device TW200844464A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/688,879 US7716541B2 (en) 2007-03-21 2007-03-21 Test apparatus and electronic device for generating test signal to a device under test

Publications (2)

Publication Number Publication Date
TW200844464A TW200844464A (en) 2008-11-16
TWI366675B true TWI366675B (zh) 2012-06-21

Family

ID=39765778

Family Applications (1)

Application Number Title Priority Date Filing Date
TW097109483A TW200844464A (en) 2007-03-21 2008-03-18 Test apparatus and electronic device

Country Status (4)

Country Link
US (1) US7716541B2 (zh)
JP (1) JPWO2008114670A1 (zh)
TW (1) TW200844464A (zh)
WO (1) WO2008114670A1 (zh)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5183447B2 (ja) * 2008-12-12 2013-04-17 株式会社アドバンテスト 試験装置および診断方法
JP5580709B2 (ja) * 2010-10-05 2014-08-27 株式会社アドバンテスト 試験装置及び試験方法
WO2012073395A1 (ja) * 2010-11-29 2012-06-07 株式会社アドバンテスト 通信システムおよび試験装置
DE102016203270B3 (de) * 2016-02-29 2017-08-10 Infineon Technologies Ag Mikrocontroller und Verfahren zum Testen eines Mikrocontrollers
US11353496B2 (en) * 2019-05-08 2022-06-07 Hamilton Sundstrand Corporation Frequency-based built-in-test for discrete outputs

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3550194B2 (ja) 1994-09-22 2004-08-04 株式会社アドバンテスト Ｌｓｉ試験装置用パターン発生器
JP2897660B2 (ja) * 1994-10-07 1999-05-31 日本電気株式会社 半導体集積回路検査装置のテストパターンメモリの制御方式
JPH09128257A (ja) 1995-10-26 1997-05-16 Hitachi Ltd プロセッサシステム及びプロセッサ
US5737512A (en) * 1996-05-22 1998-04-07 Teradyne, Inc. Fast vector loading for automatic test equipment
JPH1078476A (ja) 1996-09-02 1998-03-24 Advantest Corp 半導体試験装置用パターン発生器
KR100310969B1 (ko) 1996-11-29 2001-11-15 오우라 히로시 패턴발생기
US5838694A (en) * 1997-04-28 1998-11-17 Credence Systems Corporation Dual source data distribution system for integrated circuit tester
US6009546A (en) * 1998-07-30 1999-12-28 Credence Systems Corporation Algorithmic pattern generator
US6092225A (en) * 1999-01-29 2000-07-18 Credence Systems Corporation Algorithmic pattern generator for integrated circuit tester
JP2003090863A (ja) 2001-09-18 2003-03-28 Mitsubishi Electric Corp 半導体デバイスの製造方法、半導体デバイス、半導体テスト装置、及びテストボード
KR100882361B1 (ko) 2003-06-09 2009-02-05 주식회사 아도반테스토 패턴 발생기 및 시험 장치

Also Published As

Publication number Publication date
TW200844464A (en) 2008-11-16
US7716541B2 (en) 2010-05-11
US20080235548A1 (en) 2008-09-25
JPWO2008114670A1 (ja) 2010-07-01
WO2008114670A1 (ja) 2008-09-25

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees