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TWI347447B - Array tester - Google Patents

Array tester

Info

Publication number
TWI347447B
TWI347447B TW096140411A TW96140411A TWI347447B TW I347447 B TWI347447 B TW I347447B TW 096140411 A TW096140411 A TW 096140411A TW 96140411 A TW96140411 A TW 96140411A TW I347447 B TWI347447 B TW I347447B
Authority
TW
Taiwan
Prior art keywords
array tester
tester
array
Prior art date
Application number
TW096140411A
Other languages
Chinese (zh)
Other versions
TW200827750A (en
Inventor
Hee-Geun Kim
Joon-Young Kim
Original Assignee
Top Eng Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Top Eng Co Ltd filed Critical Top Eng Co Ltd
Publication of TW200827750A publication Critical patent/TW200827750A/en
Application granted granted Critical
Publication of TWI347447B publication Critical patent/TWI347447B/en

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
    • B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
    • B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
    • B65G49/061—Lifting, gripping, or carrying means, for one or more sheets forming independent means of transport, e.g. suction cups, transport frames
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G51/00—Conveying articles through pipes or tubes by fluid flow or pressure; Conveying articles over a flat surface, e.g. the base of a trough, by jets located in the surface
    • B65G51/02—Directly conveying the articles, e.g. slips, sheets, stockings, containers or workpieces, by flowing gases
    • B65G51/03—Directly conveying the articles, e.g. slips, sheets, stockings, containers or workpieces, by flowing gases over a flat surface or in troughs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G2812/00—Indexing codes relating to the kind or type of conveyors
    • B65G2812/16—Pneumatic conveyors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Fluid Mechanics (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • Mechanical Engineering (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
TW096140411A 2006-10-26 2007-10-26 Array tester TWI347447B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020060104640A KR100756229B1 (en) 2006-10-26 2006-10-26 Array test equipment

Publications (2)

Publication Number Publication Date
TW200827750A TW200827750A (en) 2008-07-01
TWI347447B true TWI347447B (en) 2011-08-21

Family

ID=38736756

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096140411A TWI347447B (en) 2006-10-26 2007-10-26 Array tester

Country Status (4)

Country Link
JP (1) JP2008134238A (en)
KR (1) KR100756229B1 (en)
CN (1) CN101136156B (en)
TW (1) TWI347447B (en)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101604075B (en) * 2008-06-13 2013-04-10 统宝光电股份有限公司 Electrostatic protection device and method for lighting test of liquid crystal display panel
KR101470591B1 (en) * 2008-08-04 2014-12-11 주식회사 탑 엔지니어링 An array tester
KR101519618B1 (en) * 2008-08-06 2015-05-13 주식회사 탑 엔지니어링 Optic chuck for array tester and array tester having the same
KR101002429B1 (en) * 2008-10-06 2010-12-21 주식회사 탑 엔지니어링 Array test device
KR100911331B1 (en) * 2008-12-30 2009-08-07 주식회사 탑 엔지니어링 Array test apparatus and method for measuring substrate one point position of array test apparatus
KR100911330B1 (en) * 2008-12-30 2009-08-07 주식회사 탑 엔지니어링 An array test apparatus, a method of measuring the position of a substrate point of the substrate of the array test apparatus, and a method of measuring a specific position coordinate captured by the camera assembly
CN101833179B (en) * 2009-03-13 2012-02-15 华映视讯（吴江）有限公司 Detection gauge and method
KR101089059B1 (en) * 2009-08-03 2011-12-05 주식회사 탑 엔지니어링 Array tester with optical chuck cleaner
KR101115879B1 (en) * 2009-12-11 2012-02-22 주식회사 탑 엔지니어링 Apparatus for testing array
KR101052490B1 (en) * 2009-12-31 2011-07-29 주식회사 탑 엔지니어링 Array test device
TWI467162B (en) * 2011-04-18 2015-01-01 財團法人工業技術研究院 Electro-optical modulation device, electro-optical detector and detection method thereof
KR20130005128A (en) * 2011-07-05 2013-01-15 주식회사 탑 엔지니어링 Glass panel tranferring apparatus
KR101316812B1 (en) * 2012-02-22 2013-10-23 주식회사 넥스트아이 A inspecting apparatus of LCD panel
KR20170055064A (en) 2015-11-10 2017-05-19 삼성전자주식회사 Fabricating method of substrate
CN107741658A (en) * 2017-10-25 2018-02-27 武汉华星光电技术有限公司 A kind of panel apparatus for baking
CN108563047B (en) * 2018-03-15 2021-10-01 京东方科技集团股份有限公司 Line detection device and line detection method
CN108572470B (en) * 2018-04-24 2021-03-26 京东方科技集团股份有限公司 Electrical measurement jig and control method thereof
CN110715942A (en) * 2018-07-11 2020-01-21 皓琪科技股份有限公司 Circuit board automatic detection method and system
JP7143134B2 (en) * 2018-07-26 2022-09-28 株式会社アドバンテスト Load board and electronic component test equipment
CN110596147A (en) * 2019-08-23 2019-12-20 深圳市华星光电技术有限公司 Method for reducing static electricity generation of array electrical property testing machine
CN112201186A (en) * 2020-10-10 2021-01-08 深圳市华星光电半导体显示技术有限公司 Test component group
CN113109957A (en) * 2021-05-24 2021-07-13 安徽熙泰智能科技有限公司 Incoming material electrical property detection system with silicon-based display
CN116386488B (en) * 2023-03-31 2024-05-28 惠科股份有限公司 Detection method and detection equipment for electronic paper array substrate
CN116609604B (en) * 2023-05-31 2024-05-10 武汉云岭光电股份有限公司 Electrostatic discharge testing system and method
CN117630020B (en) * 2024-01-25 2024-05-10 上海波创电气有限公司 A device for detecting surface defects of materials

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08304852A (en) * 1995-04-28 1996-11-22 Nec Corp Method and device for inspecting liquid crystal display substrate
JPH08316284A (en) * 1995-05-15 1996-11-29 Sony Corp Photomask transport device
JPH1152551A (en) * 1997-07-29 1999-02-26 Toshiba Corp Exposure mask and its pattern evaluation method and evaluation apparatus
JP4104728B2 (en) 1998-03-25 2008-06-18 フォトン・ダイナミクス・インコーポレーテッド Liquid crystal drive substrate inspection apparatus and inspection method thereof
JP3378795B2 (en) * 1998-03-27 2003-02-17 シャープ株式会社 Display device inspection apparatus and inspection method
JP3580550B1 (en) * 2003-08-20 2004-10-27 レーザーテック株式会社 Pattern substrate defect correcting method, defect correcting apparatus, and pattern substrate manufacturing method

Also Published As

Publication number Publication date
KR100756229B1 (en) 2007-09-07
TW200827750A (en) 2008-07-01
JP2008134238A (en) 2008-06-12
CN101136156B (en) 2011-02-02
CN101136156A (en) 2008-03-05

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees