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TWI340391B - Test device - Google Patents

Test device

Info

Publication number
TWI340391B
TWI340391B TW095116499A TW95116499A TWI340391B TW I340391 B TWI340391 B TW I340391B TW 095116499 A TW095116499 A TW 095116499A TW 95116499 A TW95116499 A TW 95116499A TW I340391 B TWI340391 B TW I340391B
Authority
TW
Taiwan
Prior art keywords
test device
test
Prior art date
Application number
TW095116499A
Other languages
English (en)
Other versions
TW200639868A (en
Inventor
Masahiko Hata
Shinya Sato
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200639868A publication Critical patent/TW200639868A/zh
Application granted granted Critical
Publication of TWI340391B publication Critical patent/TWI340391B/zh

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/006—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation at wafer scale level, i.e. wafer scale integration [WSI]
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C2029/0401—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals in embedded memories
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5602—Interface to device under test
TW095116499A 2005-05-13 2006-05-10 Test device TWI340391B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005140622A JP4167244B2 (ja) 2005-05-13 2005-05-13 試験装置

Publications (2)

Publication Number Publication Date
TW200639868A TW200639868A (en) 2006-11-16
TWI340391B true TWI340391B (en) 2011-04-11

Family

ID=37396460

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095116499A TWI340391B (en) 2005-05-13 2006-05-10 Test device

Country Status (4)

Country Link
US (1) US7904765B2 (zh)
JP (1) JP4167244B2 (zh)
TW (1) TWI340391B (zh)
WO (1) WO2006120951A1 (zh)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080133165A1 (en) * 2006-12-04 2008-06-05 Advantest Corporation Test apparatus and device interface
US7779313B2 (en) * 2008-03-30 2010-08-17 Advantest Corporation Testing apparatus and testing method
WO2011140233A2 (en) * 2010-05-05 2011-11-10 Teradyne, Inc. System for concurrent test of semiconductor devices
US8839057B2 (en) * 2011-02-03 2014-09-16 Arm Limited Integrated circuit and method for testing memory on the integrated circuit
CN107677951B (zh) * 2017-08-29 2019-12-06 深圳市江波龙电子股份有限公司 Die测试装置及方法
CN107680633B (zh) * 2017-08-29 2022-05-27 深圳市江波龙电子股份有限公司 Dram测试装置及方法
US11733290B2 (en) * 2020-03-31 2023-08-22 Advantest Corporation Flexible sideband support systems and methods
CN113091793B (zh) * 2021-03-02 2023-09-05 北京小米移动软件有限公司 一种测试设备以及测试设备的测试方法
US12008234B2 (en) 2021-11-10 2024-06-11 Teradyne, Inc. Managing memory in an electronic system
CN115078971B (zh) * 2022-07-05 2025-10-10 长江存储科技有限责任公司 集成电路测试设备及其测试方法
US12313683B2 (en) 2023-03-20 2025-05-27 Teradyne, Inc. Controlling storage of test data based on prior test program execution

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07130200A (ja) * 1993-09-13 1995-05-19 Advantest Corp 半導体メモリ試験装置
JP3557887B2 (ja) * 1998-01-14 2004-08-25 日立ハイテク電子エンジニアリング株式会社 Ｉｃデバイスのコンタクト装置
JP2003035747A (ja) * 2001-07-19 2003-02-07 Mitsubishi Electric Corp 半導体検査システムおよび半導体検査方法
JP3934434B2 (ja) * 2002-02-19 2007-06-20 富士通株式会社 回路の試験装置
JP2005122490A (ja) * 2003-10-16 2005-05-12 Nohmi Bosai Ltd 火災報知設備

Also Published As

Publication number Publication date
JP4167244B2 (ja) 2008-10-15
US7904765B2 (en) 2011-03-08
US20080229162A1 (en) 2008-09-18
JP2006318577A (ja) 2006-11-24
TW200639868A (en) 2006-11-16
WO2006120951A1 (ja) 2006-11-16

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