1229749 玖、發明說明·· 【發明所屬之技術領域】 本發明係關於鏡頭光學解析量測系統與方法，特別是 關於利用數位影像處理方式直接將物理上的光學解析調 制轉換函數（Modulation Transfer Function 簡稱 MTF)直接 計算量測之鏡頭光學解析量測系統與方法。 【先前技術】 傳統鏡頭光學解析之檢驗方式是以人眼作判斷。第i 圖是傳統鏡頭解析之檢測設備構造。如第丨圖所示，該鏡 頭解析之檢測設備10包含一光源裝置u、一測試線對圖 板12、一待測鏡頭13、以及一屏幕14。該檢測設備1〇 9 將測試線對圖板12之特定的線對圖面（Chart)經由待： 鏡頭13投影至屏幕14。之後’測試者用人眼去觀究 二彻圖面，並判斷何種最高空間頻率之線物 或一m)是可被分_，鏡頭 力即為多少線對。 直之解析旎 弟2A圖為測試線對圖板之測試圖樣的一例 所示’測試圖# 20包含複數個不同半徑之圓圈，且: 冋位置具有測試線對圖。第2B圖為傳統 個例子。^圖為不㈣列之測試線對圖板的― 圖的規格。圖與第3圖所示，每二 =線對 含“等7個不同寬度之線對，而每;線對圖包 義在第3圖。 j V線對的寬度定 1229749 第4圖為鏡碩光學解析對空間頻 為單位距離之線對、縱轴為光、：：、、中檢軸 為人眼鑑別之㈣㈣轉換函數、虛線 Λ為鏡頭Α的光學解析調制轉換函 根據第4圖可看m q析_制轉換函數。因此， 低頻率時JL解折1 * 、 解析馬者並不代表在中 頭正堂# m π a 此傳統1測方式並無法將鏡 M m k ^ . 、中低湧）之知析作有效分析且因 利用人眼為判斷工具將產生各別差異。 【發明内容】 有繁於上述問題，本發明 ^ . . m _ 的疋提出一種利用數位 衫像處理方式直接將物 … 上的先學解析調制轉換函數直 接计异置測之鏡頭光學解析量測系統與方法。 為達成上述目的，本發明鏡頭光學解析量測系統包 …光源裝置’係提供該鏡頭光學解析量測系統所需要 之^源^測試線對圖，係提供測試線對圖；一面型感 應器’係接收前述光源照射前述測試線對圖板，並穿過前 述待測鏡頭的光學信號，並將該光學信號轉換成電㈣； 一控制系 '统’係接收前述面型感應器之電訊號，並產生亮 度分布訊號；以及-顯示器，係、接收並顯示前述亮度分布b 訊號；其中’前述測試線對圖之排列方式為中心、對稱分佈 以及垂直水平交錯分佈’且分佈於整個測試線對圖板。 【實施方式】 7 1229749 以下參考圖式詳細說明本發明鏡頭光學解析量測系 統與方法。由於習知之量測系統是由人眼判別而衍生出— 些問題，因此本發明利用面型感應器取代人眼，並利用影 像處理運算將在特定空間頻率下所對應之光學解析調制 轉換函數（MTF)直接算出。且為了避免數位化過程中在高 空間頻率時所產生尼奎士（Nyquist)效應以致產生量測誤 差，本發明還利用相位偏移方式來降低尼奎士效應。 第5圖是本發明鏡頭光學解析量測系統。如第$圖所 示，本發明鏡頭光學解析量測系統5〇包含一光源裝置 (g S〇urce)5 1、一測试線對圖板（testing chart)52、一待 /貝J 鏡頭（lens)53、一面型感應器（area ph〇t〇 sens〇r)54、一 控制電路板55、一電腦系統56、以及一顯示器57。本發 明鏡頭解析之檢測設備5〇係利用光源裝置51提供光源， 該光源照射於測試線對圖板52。而穿過測試線對圖板U 之光線經由待測鏡頭53而投射於面型感應器54。面型感 應器54將所接收捌的光線轉換成數位信號後，傳給控制 電路板55。電腦系統56接收控制電路板55 後’將相對的資料顯示於顯示器57。 " 第6圖為本發明測試線對圖板之線對的第一個實施 例。該測試線對圖佈滿垂直及水平線對主要原因是鏡頭垂 ^及水平解析度不一定同步（像差造成），且此設計安排 1讓使用者任思選擇其所想要得知的成像位置所對應之 =學解析MTF。習知的測試線對圖板之線對圖是分布於特 疋之區域，但本發明之測試線對圖板則佈滿線對圖，且所 1229749 包含之線對圖具有不同線對密度。而且，線對可以形成相 位差，亦即一部分線對可偏移一預設距離。 第7圖顯示顯示器所顯示之面型感應器的亮度分佈的 -個例子。當檢測設備5 G利用待測鏡頭5 3將測試線對圖 板52之測試線對圖成像於面型感應器54後，利用電腦系 統5 6處理面型感應器5 4上傻音夕沾古由、 上傢素之間的壳度分佈，以及利 用電腦影像處理運算將MTF啖宾声八右同h 士 一 4儿度刀布圖即時顯示在顯 示器57上。其中，MTF的計算方法一般是採用式⑴來計 算。1229749 发明 、 Explanation of the invention ... [Technical field to which the invention belongs] The present invention relates to a lens optical analytical measurement system and method, and in particular, to a digital image processing method for directly converting a physical optical analytical modulation conversion function (Modulation Transfer Function for short) MTF) Lens optical analytical measurement system and method for direct measurement. [Previous Technology] The inspection method of traditional lens optical analysis is judged by human eyes. Figure i shows the structure of a traditional lens analysis detection device. As shown in FIG. 丨, the detection device 10 for analyzing the lens includes a light source device u, a test line pair plate 12, a lens 13 to be tested, and a screen 14. The testing device 109 projects a specific line-to-surface (Chart) of the test line-to-board 12 through a lens 13 to a screen 14. After that, the tester used the human eye to look at the two planes and determine what kind of line object or m) with the highest spatial frequency can be classified. The lens force is the number of line pairs. Straight analysis 图 Brother 2A picture is an example of the test pattern of the test line-to-board. ‘Test chart # 20 contains a number of circles with different radii, and: 冋 has a test line-pair chart at the position. Figure 2B shows a traditional example. ^ The picture shows the specifications of the test line-to-picture board that are not listed. As shown in the figure and Figure 3, every two = line pair contains "equivalent to 7 pairs of different widths, and each line pair is included in Figure 3. The width of the V line pair is set to 1229749. Figure 4 is a mirror The optical analysis pair is a pair of lines with space frequency as the unit distance, the vertical axis is light, and the central axis is the ㈣㈣ conversion function of human eye identification. The dotted line Λ is the optical analysis modulation conversion function of lens A. Look at the mq analysis system conversion function. Therefore, at low frequencies, JL unfolds 1 *, and the horse analysis does not mean that in the middle head Zhengtang # m π a This traditional 1 measurement method cannot mirror M mk ^. The analysis of known knowledge is effective analysis, and individual differences will occur due to the use of human eyes as a judgment tool. [Summary of the Invention] There are problems in the above, the present invention ^.. M _ proposes a method of directly using digital shirt image processing The lens optical analytical measurement system and method for directly measuring differently-measured direct-analyzed modulation conversion functions on ... Learn to achieve the above purpose, the lens optical analytical measurement system package of the present invention ... the light source device is to provide the lens optical analytical measurement ^ Source ^ test line pair diagram required by the system A test line pair diagram is provided; a surface-type sensor 'receives the aforementioned light source to illuminate the test line pair diagram board, passes through the optical signal of the lens under test, and converts the optical signal into an electrical signal; a control system' "The system" receives electrical signals from the aforementioned surface-type sensors and generates a luminance distribution signal; and-a display device, receives, and displays the aforementioned luminance distribution b signals; of which, the "arrangement of the aforementioned test line-pair diagram is centered, symmetrically distributed, and Vertical and horizontal staggered distribution 'and distributed over the entire test line-to-board. [Embodiment] 7 1229749 The following describes the lens optical analytical measurement system and method of the present invention in detail with reference to the drawings. Because the conventional measurement system is discriminated by the human eye Some problems arise, so the present invention uses a surface sensor to replace the human eye, and uses image processing operations to directly calculate the optical analytical modulation conversion function (MTF) corresponding to a specific spatial frequency. In order to avoid digitization, The Nyquist effect generated at high spatial frequencies causes measurement errors. The present invention also uses phase offset To reduce the Nyquist effect. Fig. 5 is an optical analysis and measurement system of the lens of the present invention. As shown in Fig. 5, the optical analysis and measurement system of the lens of the present invention 50 includes a light source device (g Source) 5 1. A test chart 52, a lens 53, a surface sensor 54, a control circuit board 55, a computer The system 56 and a display 57. The lens analyzing detection device 50 of the present invention uses a light source device 51 to provide a light source, which illuminates the test line to the chart 52. The light passing through the test line to the chart U passes through the test The lens 53 is projected on the surface sensor 54. The area sensor 54 converts the light of the received chirp into a digital signal and transmits it to the control circuit board 55. After receiving the control circuit board 55, the computer system 56 displays the relative data on the display 57. " Fig. 6 is a first embodiment of a wire pair of a test wire-to-board according to the present invention. The main reason why this test line pair is full of vertical and horizontal line pairs is that the vertical lens and horizontal resolution are not necessarily synchronized (caused by aberrations), and this design arrangement 1 allows users to choose the imaging position they want to know Corresponding = learn to analyze MTF. Conventional test line-to-board line-to-line maps are distributed in special regions, but the test line-to-board of the present invention is full of line-to-line maps, and the line-to-line maps included in 1229749 have different line-pair densities. Moreover, the line pairs can form a phase difference, that is, a part of the line pairs can be shifted by a preset distance. Fig. 7 shows an example of the brightness distribution of a surface sensor displayed on a display. When the testing device 5 G uses the test lens 5 3 to form the test line pair diagram of the test line 52 to the surface sensor 54, the computer system 5 6 processes the surface sensor 5 4 Based on the shell distribution between Shangjiasu and the computer image processing operation, the MTF and the sound of the guests are displayed on the display 57 in real time. Among them, the calculation method of MTF is generally calculated by using formula ⑴.
Modulation^ (Max - Min) / (Max + Min) ⑴ 旦、其中’心X為所量測區域之亮度最大值，而Mh!為所 里測區域之免度最小值。交於上田 曰 於所明之夏測區域是包含線對 圖的區域，其範圍由使用者自行設$。 f 8圖為本發明測試線對圖板之線對的第二個實施 例。弟8圖之線對圖在不同 、 〜 J位置形成不同線對數量之線對 二糟:乂㈤個測试線對圖板上同時包含兩種頻率。當 然’測試線對圖板還可 4 峻對…入 兩種以上之頻率。由於測試 線對圖板包含兩種以上 MTF。 之y員羊，可同時測試不同頻率之 在鏡頭成像之空間頻率箄 間頻率的-半及—半以,0面型感應器、54之像素空 得到不同的町"直二即容易因取樣位置的不同而 效應產生量測誤差。因 土 τ # # < 本創作刻意在原線對圖内製造相 位差以降低量測誤差。 、和 弟 Α圖顯不沒有相位差之線對圖 1229749 以及其所對應之亮度信號與取樣位置。第9B圖顯示 才^差之線對圖以及其所對應之亮度信號與取樣位置。而 所謂在原線對圖内製造相位差的方式，是將原有線 四區塊，且讓區塊間兩兩差1/4線寬，若將原有線對拆成 一區塊，則讓區塊間差1/2、線寬。例如帛i〇a圖為具有四 種相位之線對圖。 如第9A圖所示，當鏡頭成像之空間頻率等於面型感 應器54之像素空間頻率為的一半時，則面型感應器μ於 每個鏡頭成像之空間頻率的信號中只能取樣到兩點，所取 !到的信號可能是實心方塊處之信號，亦即mtf為。，或 是空心方塊處之信號，亦即MTF為丨，所以會有較大之誤 差。第9A圖之矩形區域96為取樣區域。但如第所示， 由於線對圖具有相位差，因此面型感應器54㈣個鏡頭 成像之空間頻率的㈣中可取樣到人點，取樣點包含了兩 個實心方塊、兩個實心三角、兩個空心方塊、以及兩個空 心三角。所以’只要利用軟體對於不同相位差之取樣信號 進行分析’即可輸出較正確之MTF值。第9B _之矩形區 域97為取樣區域。 以上雖以實施例說明本發明，但並不因此限定本發明 之範圍，只要不脫離本發明之要旨，該行業者可進行各種 變形或變更。 【圖式簡單說明】 第1圖是傳統鏡頭解析之檢測設備構造。 10 1229749 第2A圖為測試線 “式圖樣的一例。 卜㈤為傳統測試線對圖的-個例子。 第3圖為不同系而f 圖的規格。 ’、傳相試線對圖板中的測試線對 第？為鏡頭光學解析對空間頻率之反應，其中橫軸 兔早立距之線對、縱軸為光學解析調制轉換函數 匕力粗線為鏡頭A的光學解析調制轉換函 數、以及細線為镑卩S D AA、丨> M a ......、 的光+解析調制轉換函數。 第5圖是本發明鏡頭光學解析量測系統。 弟6圖為本發明測試線對圖板之線對的第一個實施 例0 、 第7圖顯示顯示器所顯示之面型感應器的亮度分佈的 一個例子。 第8圖為本發明測試線對圖板之線對的第二個實施 例。 弟9A圖顯示沒有相位差之線對圖以及其所對應之亮 度信號與取樣位置。 弟9B圖顯示具有相位差之線對圖以及其所對應之亮 度信號與取樣位置。 圖式編號 5〇 鏡頭光學解析量測系統 5 1 光源裝置 52 測試線對圖板 53 待測鏡頭 1229749 54 面型感應器 55 控制電路板 5 6 電腦系統 57 顯示器 90 沒有相位差之線對圖 9 1〜9 4 有相位差之線對圖 96、97 取樣區域Modulation ^ (Max-Min) / (Max + Min) ⑴, where ‘Heart X is the maximum brightness of the measured area, and Mh! Is the minimum immunity of the measured area. Submitted to Ueda: The summer measurement area of Yuming Ming is an area containing line-to-line diagrams. The range is set by the user. Figure 8 is the second embodiment of the test line-to-board pair of the present invention. The line-to-line diagram of Figure 8 forms different line-pairs with different numbers of line-pairs at different positions, ~ J. The worst is that a test line-pair chart contains two frequencies at the same time. Of course, the test line pairs can also be paired with 4 or more frequencies. Because the test line pair board contains more than two MTFs. Y member sheep, can test different frequencies at the same time-half and-half of the spatial frequency of the lens imaging, 0 area sensor, 54 pixel space to get different towns " straight two is easy to sample The effect of measurement is caused by different positions. Because soil τ # # < This creation deliberately creates a phase difference in the original line-pair diagram to reduce measurement errors. Figure A and Figure A show that there is no line pair with phase difference as shown in Figure 1229749 and its corresponding luminance signal and sampling position. Fig. 9B shows the difference line-to-line diagram and its corresponding luminance signal and sampling position. The so-called way of making phase difference in the original line-pair diagram is to divide the original line into four blocks and make the blocks differ by 1/4 line width. If the original line pair is divided into one block, the block-to-block Difference 1/2, line width. For example, the 帛 ioa diagram is a line-pair diagram with four phases. As shown in FIG. 9A, when the spatial frequency of the lens imaging is equal to half the pixel spatial frequency of the area sensor 54, the area sensor μ can only sample two signals in the spatial frequency of each lens image. Point, the signal obtained! May be the signal at the solid square, that is, mtf is. , Or the signal at the hollow square, that is, the MTF is 丨, so there will be a large error. The rectangular area 96 in FIG. 9A is a sampling area. However, as shown in the figure, because the line-pair diagram has a phase difference, the human body can be sampled from the spatial frequency of the 54 images of the surface sensor. The sampling point includes two solid squares, two solid triangles, two Hollow squares, and two hollow triangles. Therefore, 'as long as the software analyzes the sampling signals with different phase differences', a more accurate MTF value can be output. The 9B_ rectangular area 97 is a sampling area. Although the present invention has been described by way of examples, the scope of the present invention is not limited thereby, and those skilled in the art can make various modifications or changes without departing from the gist of the present invention. [Schematic description] Figure 1 shows the structure of a traditional lens analysis detection device. 10 1229749 Figure 2A is an example of a test line "pattern. Bu is an example of a traditional test line pair chart. Figure 3 shows the specifications of different lines and f chart. The test line pair is the response of the optical analysis of the lens to the spatial frequency, where the horizontal pair of rabbits has a vertical distance, the vertical axis is the optical analytical modulation conversion function, and the thick line is the optical analytical modulation conversion function of the lens A, and the thin line. It is the light + analytical modulation conversion function of SD AA, 丨 > M a, .... Fig. 5 is an optical analytical measurement system for the lens of the present invention. Fig. 6 is a test line pair chart of the present invention. The first embodiment of the line pair 0 and FIG. 7 show an example of the brightness distribution of the surface-type sensor displayed on the display. FIG. 8 is the second embodiment of the line pair of the test line-to-board of the present invention. Figure 9A shows the line pair diagram without phase difference and its corresponding luminance signal and sampling position. Figure 9B shows the line pair diagram with phase difference and its corresponding luminance signal and sampling position. Pattern No. 5〇 Lens Optical Resolution Measurement System 5 1 Set 52 Test line pair chart 53 Test lens 1229749 54 Surface sensor 55 Control circuit board 5 6 Computer system 57 Display 90 Line pair without phase difference Figure 9 1 ~ 9 4 Line pair with phase difference Figures 96, 97 Sampling area
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