TWI223087B - Circuit board testing jig - Google Patents

Abstract

A circuit board testing jig tests a circuit board. The jig includes a first testing unit, a second testing unit, and a carrier. The first testing unit has at least one first alignment hole. The second testing unit has at least one first alignment rod. The carrier is set between the first testing unit and the second testing unit. The carrier includes a first surface, a second surface, and at least one carrier alignment hole. The first surface of the carrier faces the first testing unit. The second surface of the carrier carries the circuit board and faces the second testing unit. The carrier alignment hole passes through the first surface of the carrier to the second surface of the carrier. The edge of carrier alignment hole on the second surface has a guiding angle. The first alignment rod passes through the carrier alignment hole and then inserts into the first alignment hole.

Description

1223087

1. The technical field to which the invention belongs] The present invention relates to a test fixture, especially a circuit board test fixture. Setting the position One kind of easy to set up (2), [Previous technology]: Generally, the quality of the circuit board is maintained, and most of the electrical testing of the circuit board or circuit board components is made after the circuit is completed. The conventional equipment for testing circuit boards is shown in Fig. 1. A circuit board testing machine 1 and a circuit board testing jig 2 used in the circuit board testing machine / center. As shown in Fig. 1, the first circuit of the second board test fixture 2 mainly includes a unit 21, a second test unit 22, and a carrier board. Among them, the first test unit 21 is also called the lower pin plate. The second test unit 22 is also called upper: board 0 The second test unit 22 is connected to the circuit board test machine} When the press u of the circuit board test machine 1 is pressed downward, the second test Department of Chaos! Move in the pressure direction so that the second test unit 22, the carrier board 23 and the first test TC21 abut each other, and the circuit board carried by the carrier board 23 is measured accordingly. As shown in FIG. 2, the first test unit A plurality of probes 211 and a connection port 212 are provided on 21. The probes 211 are protruded from the first test unit and correspond to the pins of the electronic component 31 of the circuit board 3. In addition, at least a first positioning hole and a plurality of impeachment 2 = at least one second positioning hole 215 are provided on the upper side.

The carrier board 23 is disposed between the first test unit 21 and the second test unit 22, and one surface of the carrier board 23 is used to carry the circuit board 3. The carrier plate 23 is provided with at least one carrier plate positioning hole 1223087 corresponding to the first positioning hole 21 3 of the first test unit 21 V. Description of the invention (2) The second test unit 2 2 is provided in the first test The upper part of the unit 21 is mainly composed of a positioning plate 222 and a detection plate 223 separated by a plurality of pillars 221 in parallel. The positioning plate 2 2 2 is connected to the press 11, and the detection plate 2 2 3 is provided with at least a first positioning post 224 and a plurality of probes 2 2 5 corresponding to the pins of the electronic component 31 of the circuit board 3. And ports 2 2 6. 2 3 1 and the holes 2 3 3 corresponding to the pin 1 of the electronic component 3 of the circuit board 3. In addition, the other side of the 'carrier plate 2 3 is provided with at least one second positioning post 2 3 2. ≫ With reference to Figs. 1, 2 and 3, when the circuit board 3 is tested, the second test, the unit 22 is first fixed to the press 11 of the circuit board test machine 1, and the-test The unit 2 1 is fixed on the lower platform 丨 2 of the circuit board testing machine j, and the board 3 is on the carrier board 23; Then, the white-bearing post 232 that has carried the circuit board 3 is placed in the second position. The second locator of a test unit 21 (= the positioning hole 231 of the carrier plate and the first-position hole Z i 3㈣ of the first test unit 21 are set correspondingly; Control the operation of the press 1 1 so that the first position of the second test unit 2 2 a 丄 ^? Ι2Ή ^-λ ^ τ penetrates the load plate and fixes the Zaz d 1 and inserts the first test Unit? 1 H⑽-99 in the first positioning hole 213, and make the first, then call the probe 225 of the early 22 with fen neodymium ^ touch the thunderbolt enf the probe 211 of the first test unit 21 "circuit The electronics of the board d / [car ^ 1 pull step j from the ,,.... ^ Pins, and then connect the circuit board test 5 崞 each connection of the mouthpiece 2 with the circuit 丨 by f 31 & m Stomach Testing Society ^. 1 electricity Air connection, you can borrow the circuit board test machine 1 1 test circuit board 3

Carrying on the above, please refer to the 4th office-^ ^ Γ Di Tuo Suo ’because of the positioning holes 2 3 1 of the carrier board

Page 1223087 Description of the invention (3), both are larger than the aperture of the first positioning hole 213 of the first test unit 21, so when the first positioning post 224 of the first test unit 22 penetrates the load plate positioning hole 23 Γ, It is not easy to directly position to insert the first positioning hole 2 1 3 of the first test unit 2 'that is,' the operator needs to be very careful and spend more time aiming at each first positioning post 224 passing through the carrier board = Each first positioning hole 2 1 3 of the first test unit 21 is inserted. In other words, the conventional circuit board test fixture has the following defects: 1. It is not easy to align: it is not easy to directly position the first positioning posts 2 24 of the second test unit 22 and insert them into the first positioning holes of the first test unit 21 213, so the operator needs to spend more time. ^ 2 The fixture is fragile: as shown in Figure 4 and Figure 5, because the press 11 of the circuit board testing machine j is pressed on the circuit board test fixture 2, if each of the second test unit 2 2 The first positioning post 224 is not inserted into each of the first positioning holes 213 of the first test unit 21, but only abuts against the first test unit 21, which will cause the presser u to not press down when the second test unit is pressed. Each of the first positioning posts 224 of 22 has space for storage, and making the first positioning posts 224 of the second test unit 22 abut against the second and second test units 21 and the pressure of the press 11 will cause acrylic or glass The manufactured first test unit 22 cannot withstand the pressure of the press 11 and the first test unit 22 is broken and damaged, which causes the circuit board test fixture 2 to be damaged. Therefore, how to provide a new type of circuit board test fixture that can solve the above-mentioned shortcomings for the use of circuit board test is obviously anxious for the industry. '(Three), [invention content]

1223087 V. Description of the invention (4) In view of the above problems, the object of the present invention is to provide a circuit board test fixture that is easy to locate. For this reason, in order to achieve the above object, the circuit board test fixture according to the present invention is used to test a circuit board, which includes a first test unit, a second test unit, and a carrier board. Among them, the first test unit The second test unit has at least one first positioning post; the carrier board is located between the first test unit and the second test unit, i has a first surface, a ΐf surface, and at least —Carrier board positioning hole, the first surface is facing the first test sheet 7G ', the second surface supports the circuit board and faces the second test unit, and the carrier board positioning hole runs through the first surface and the second surface, and is on the second surface The edge has a lead angle 'wherein when the circuit board is tested, the first positioning post passes through the positioning hole of the carrier board' and is inserted into the first positioning hole. As mentioned above, the circuit board test fixture according to the present invention has a carrier board positioning hole with a lead angle on the edge of the second surface of the carrier board, which is fast and easy to automatically guide the circuit board test fixture assembly to achieve savings. The time for assembling the circuit board to test the jig is effective to prevent damage. (4) [Embodiment] To make the inner valley of this month easier to understand, a preferred embodiment of the present invention will be described below with reference to the related drawings'. A Please, as shown in FIG. 6, the circuit board test fixture 2 of the present invention includes a first unit 21, a second test unit 22, and a carrier board 23, of which the second test unit 21 and the second test The structure of the unit 22 is substantially the same as that of the second test unit and the second test unit described above, in order to avoid repeating its detailed description.

1223087 V. Description of the invention (5) Omit '' and use part of the drawing for convenience. Please refer to FIG. 6, the carrier board 2 3 of the present invention has a first surface 2 3 5 and a second surface 2 3 6. At least one carrier plate positioning hole 231 corresponding to the first positioning hole 213 of the first test unit 21 is provided in the carrier plate 2 3 ′. The carrier plate positioning holes 231 'are respectively penetrated from the first surface 23 5 of the carrier plate 23 ′ to the second surface 236 of the carrier plate 23 ′. The carrier plate positioning hole 231 has a hole diameter on the second surface 236 of the carrier plate 23 that is larger than the hole diameter of the first surface 2 3 5 of the carrier plate 2 3 ′, and the hole diameter of the carrier plate positioning hole 231 ′ is from the carrier plate 23, The second surface 236 is gradually reduced toward the first surface 2 3 5 of the carrier plate 23, so that the positioning holes 2 3 1 of the carrier plate have a leading angle 2311 'at the edge of the second surface 2 3 6 (see FIG. 7). (Shown), and further, the inner wall of the positioning hole 2 3 Γ of the carrier board presents a smooth surface. In addition, as shown in FIG. 7, since the carrier board positioning hole 231 ′ in the second surface 236 of the carrier board 23 has a larger diameter than the first surface 235, and the carrier board positioning hole 231 ′ in the second surface 236 It has a lead angle of 2311, and at the same time, the hole diameter of the carrier plate positioning hole 2 3 1 ′ of the first surface 2 3 5 is approximately equal to the outer diameter of the first positioning post 224 of the second test unit 22, so that the second test unit 22 The first positioning post 224 is guided to pass through the carrier plate 23 ′, and is then quickly inserted into the first positioning hole 2 1 3 of the first test unit 21. In this embodiment, the cross-sectional shape of the positioning holes 2 31 of the carrier board may be a circular solitary shape, an alpha-eight shape, or a funnel shape. It can be known from the foregoing that the carrier board positioning holes 231 of the carrier board 23 have a lead angle 2311 and the aperture in the first surface 236 is larger than the aperture in the first surface 235, so it can be easily assembled, saving time and Avoid during assembly

1223087 V. Description of the invention (6) The spirit and scope of the present invention, and equivalent modifications or alterations made to it shall be included in the scope of the attached patent application. 1223087 Schematic description (five), [simple description] Figure 1 is a schematic diagram of a conventional circuit board testing machine and a circuit board testing fixture. Figure 2 is an exploded view of a conventional circuit board test fixture. Figure 3 is a conventional circuit board test fixture assembly diagram. Figure 4 is an enlarged view of a conventional circuit board test fixture. Figure 5 is the damage diagram of the conventional circuit board test fixture under stress. FIG. 6 is an exploded view of a circuit board test fixture according to a preferred embodiment of the present invention. FIG. 7 is an enlarged view of a circuit board test fixture according to a preferred embodiment of the present invention.

Illustration. Explanation of component symbols ... 1 Circuit board test machine 11 Press bed 12 Under roof 2 Circuit board test fixture 21 First test unit 211 Probe 212 Port 213 First positioning hole 214 Elastic element 215 Second positioning hole 22 Second test unit 221 pillar

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Claims (1)

1223087 VI. Scope of patent application 1. A circuit board test fixture for testing a circuit board, including: a first test unit having at least one first positioning hole; A second test unit having at least one first positioning post; and a carrier board located between the first test unit and the second test unit, and having a first surface, a second surface, and at least one Carrier board positioning hole, the first surface facing the first test unit, the second surface carrying the circuit board and facing the second test unit, the carrier board positioning hole penetrating the first surface and the second surface The edge of the second surface has a lead angle. When the circuit board is tested, the first positioning post passes through the positioning hole of the carrier board and is inserted into the first positioning hole. 2. The circuit board test fixture according to item 1 of the scope of patent application, wherein the first test unit further includes at least a second positioning hole, and the carrier board further includes at least a second positioning post, the second positioning The post is placed in the second positioning hole, and when a pressure is applied to the carrier board, the carrier board approaches the first test unit. 3. The circuit board test fixture according to item 1 of the scope of patent application, wherein the aperture of the positioning hole of the carrier board is gradually limited from the second surface toward the first surface. 4. The circuit board testing jig as described in item 1 of the scope of patent application, wherein the cross-sectional shape of the positioning hole of the carrier board is a horn shape. 5. The circuit board test fixture as described in item 1 of the scope of patent application, wherein: Page 15 1223087 VI. Scope of patent application The cross-sectional shape of the positioning hole of the carrier board is funnel-shaped. 6. The circuit board testing jig as described in item 1 of the scope of patent application, wherein the cross-sectional shape of the positioning hole of the carrier board is arc-shaped. 7. The circuit board testing jig as described in item 1 of the scope of patent application, wherein the hole diameter of the positioning hole of the carrier board on the first surface is approximately equal to the outer diameter of the first positioning post. 8. The circuit board test fixture according to item 1 of the scope of patent application, wherein the second test unit further includes a positioning board and a detection board, and the positioning board and the detection board are arranged in parallel. 9. The circuit board test fixture according to item 1 of the scope of patent application, wherein the first test unit has a plurality of probes. 10. The circuit board testing jig according to item 1 of the scope of patent application, wherein the second testing unit has a plurality of probes. Page 16