TWI294559B - Coating composition of positive photosensitive polyimide - Google Patents
Coating composition of positive photosensitive polyimide Download PDFInfo
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- TWI294559B TWI294559B TW93114164A TW93114164A TWI294559B TW I294559 B TWI294559 B TW I294559B TW 93114164 A TW93114164 A TW 93114164A TW 93114164 A TW93114164 A TW 93114164A TW I294559 B TWI294559 B TW I294559B
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- 239000008199 coating composition Substances 0.000 title claims description 18
- 239000004642 Polyimide Substances 0.000 title claims description 12
- 229920001721 polyimide Polymers 0.000 title claims description 12
- 239000000203 mixture Substances 0.000 claims description 16
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical group CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 claims description 13
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 claims description 7
- -1 mercapto compound Chemical class 0.000 claims description 7
- 239000003960 organic solvent Substances 0.000 claims description 7
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N phenol group Chemical group C1(=CC=CC=C1)O ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 claims description 7
- LZCLXQDLBQLTDK-UHFFFAOYSA-N ethyl 2-hydroxypropanoate Chemical compound CCOC(=O)C(C)O LZCLXQDLBQLTDK-UHFFFAOYSA-N 0.000 claims description 6
- MWPLVEDNUUSJAV-UHFFFAOYSA-N anthracene Chemical compound C1=CC=CC2=CC3=CC=CC=C3C=C21 MWPLVEDNUUSJAV-UHFFFAOYSA-N 0.000 claims description 4
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 claims description 4
- 150000001875 compounds Chemical class 0.000 claims description 4
- 239000001257 hydrogen Substances 0.000 claims description 4
- 229910052739 hydrogen Inorganic materials 0.000 claims description 4
- 125000000962 organic group Chemical group 0.000 claims description 4
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 3
- 229940116333 ethyl lactate Drugs 0.000 claims description 3
- 125000000217 alkyl group Chemical group 0.000 claims description 2
- 125000005577 anthracene group Chemical group 0.000 claims description 2
- 125000003118 aryl group Chemical group 0.000 claims description 2
- 239000003795 chemical substances by application Substances 0.000 claims description 2
- IPZJQDSFZGZEOY-UHFFFAOYSA-N dimethylmethylene Chemical compound C[C]C IPZJQDSFZGZEOY-UHFFFAOYSA-N 0.000 claims description 2
- BDHFUVZGWQCTTF-UHFFFAOYSA-M sulfonate Chemical compound [O-]S(=O)=O BDHFUVZGWQCTTF-UHFFFAOYSA-M 0.000 claims description 2
- 125000003396 thiol group Chemical group [H]S* 0.000 claims description 2
- 238000010276 construction Methods 0.000 claims 1
- 150000002431 hydrogen Chemical class 0.000 claims 1
- KHECLXBZYQYEGI-UHFFFAOYSA-O sulfanium azide Chemical compound [N-]=[N+]=[N-].[SH3+] KHECLXBZYQYEGI-UHFFFAOYSA-O 0.000 claims 1
- 239000000243 solution Substances 0.000 description 24
- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 description 16
- 238000000034 method Methods 0.000 description 12
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 10
- 239000011521 glass Substances 0.000 description 10
- 239000002904 solvent Substances 0.000 description 10
- 230000014759 maintenance of location Effects 0.000 description 9
- 239000007864 aqueous solution Substances 0.000 description 8
- 238000003756 stirring Methods 0.000 description 7
- 239000000758 substrate Substances 0.000 description 6
- 230000015572 biosynthetic process Effects 0.000 description 5
- 238000000576 coating method Methods 0.000 description 5
- 230000000052 comparative effect Effects 0.000 description 5
- 229910052757 nitrogen Inorganic materials 0.000 description 5
- 238000004528 spin coating Methods 0.000 description 5
- 238000003786 synthesis reaction Methods 0.000 description 5
- OAKJQQAXSVQMHS-UHFFFAOYSA-N Hydrazine Chemical compound NN OAKJQQAXSVQMHS-UHFFFAOYSA-N 0.000 description 4
- 239000002981 blocking agent Substances 0.000 description 4
- 238000001816 cooling Methods 0.000 description 4
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 4
- 229910052753 mercury Inorganic materials 0.000 description 4
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 3
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 3
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 3
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 3
- 238000001459 lithography Methods 0.000 description 3
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 3
- RKFCDGOVCBYSEW-AUUKWEANSA-N tmeg Chemical compound COC=1C(OC)=CC(C(OC(C=2OC)=C34)=O)=C3C=1OC(=O)C4=CC=2O[C@@H]1O[C@H](CO)[C@@H](O)[C@H](O)[C@H]1O RKFCDGOVCBYSEW-AUUKWEANSA-N 0.000 description 3
- XUSNPFGLKGCWGN-UHFFFAOYSA-N 3-[4-(3-aminopropyl)piperazin-1-yl]propan-1-amine Chemical compound NCCCN1CCN(CCCN)CC1 XUSNPFGLKGCWGN-UHFFFAOYSA-N 0.000 description 2
- QQGYZOYWNCKGEK-UHFFFAOYSA-N 5-[(1,3-dioxo-2-benzofuran-5-yl)oxy]-2-benzofuran-1,3-dione Chemical compound C1=C2C(=O)OC(=O)C2=CC(OC=2C=C3C(=O)OC(C3=CC=2)=O)=C1 QQGYZOYWNCKGEK-UHFFFAOYSA-N 0.000 description 2
- QUSNBJAOOMFDIB-UHFFFAOYSA-N Ethylamine Chemical compound CCN QUSNBJAOOMFDIB-UHFFFAOYSA-N 0.000 description 2
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 description 2
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 2
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 239000003431 cross linking reagent Substances 0.000 description 2
- 239000008367 deionised water Substances 0.000 description 2
- 229910021641 deionized water Inorganic materials 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000004615 ingredient Substances 0.000 description 2
- 239000000178 monomer Substances 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- 229920000642 polymer Polymers 0.000 description 2
- 150000003141 primary amines Chemical class 0.000 description 2
- 238000004626 scanning electron microscopy Methods 0.000 description 2
- 238000005507 spraying Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- YJTKZCDBKVTVBY-UHFFFAOYSA-N 1,3-Diphenylbenzene Chemical compound C1=CC=CC=C1C1=CC=CC(C=2C=CC=CC=2)=C1 YJTKZCDBKVTVBY-UHFFFAOYSA-N 0.000 description 1
- KUMMBDBTERQYCG-UHFFFAOYSA-N 2,6-bis(hydroxymethyl)-4-methylphenol Chemical compound CC1=CC(CO)=C(O)C(CO)=C1 KUMMBDBTERQYCG-UHFFFAOYSA-N 0.000 description 1
- ZGDMDBHLKNQPSD-UHFFFAOYSA-N 2-amino-5-(4-amino-3-hydroxyphenyl)phenol Chemical compound C1=C(O)C(N)=CC=C1C1=CC=C(N)C(O)=C1 ZGDMDBHLKNQPSD-UHFFFAOYSA-N 0.000 description 1
- FXWFZIRWWNPPOV-UHFFFAOYSA-N 2-aminobenzaldehyde Chemical compound NC1=CC=CC=C1C=O FXWFZIRWWNPPOV-UHFFFAOYSA-N 0.000 description 1
- UENRXLSRMCSUSN-UHFFFAOYSA-N 3,5-diaminobenzoic acid Chemical compound NC1=CC(N)=CC(C(O)=O)=C1 UENRXLSRMCSUSN-UHFFFAOYSA-N 0.000 description 1
- CWLKGDAVCFYWJK-UHFFFAOYSA-N 3-aminophenol Chemical compound NC1=CC=CC(O)=C1 CWLKGDAVCFYWJK-UHFFFAOYSA-N 0.000 description 1
- 229940018563 3-aminophenol Drugs 0.000 description 1
- HLBLWEWZXPIGSM-UHFFFAOYSA-N 4-Aminophenyl ether Chemical compound C1=CC(N)=CC=C1OC1=CC=C(N)C=C1 HLBLWEWZXPIGSM-UHFFFAOYSA-N 0.000 description 1
- WTQZSMDDRMKJRI-UHFFFAOYSA-N 4-diazoniophenolate Chemical compound [O-]C1=CC=C([N+]#N)C=C1 WTQZSMDDRMKJRI-UHFFFAOYSA-N 0.000 description 1
- 238000004566 IR spectroscopy Methods 0.000 description 1
- KDXKERNSBIXSRK-UHFFFAOYSA-N Lysine Natural products NCCCCC(N)C(O)=O KDXKERNSBIXSRK-UHFFFAOYSA-N 0.000 description 1
- 239000004472 Lysine Substances 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- 108010039918 Polylysine Proteins 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- GTDPSWPPOUPBNX-UHFFFAOYSA-N ac1mqpva Chemical compound CC12C(=O)OC(=O)C1(C)C1(C)C2(C)C(=O)OC1=O GTDPSWPPOUPBNX-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 230000004913 activation Effects 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- MZNDIOURMFYZLE-UHFFFAOYSA-N butan-1-ol Chemical compound CCCCO.CCCCO MZNDIOURMFYZLE-UHFFFAOYSA-N 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- 238000007766 curtain coating Methods 0.000 description 1
- 150000004985 diamines Chemical class 0.000 description 1
- HPNMFZURTQLUMO-UHFFFAOYSA-N diethylamine Chemical compound CCNCC HPNMFZURTQLUMO-UHFFFAOYSA-N 0.000 description 1
- 238000003618 dip coating Methods 0.000 description 1
- 239000003814 drug Substances 0.000 description 1
- 229940079593 drug Drugs 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 150000002466 imines Chemical class 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 150000007529 inorganic bases Chemical class 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229920000656 polylysine Polymers 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 239000002243 precursor Substances 0.000 description 1
- 125000002924 primary amino group Chemical group [H]N([H])* 0.000 description 1
- 239000001294 propane Substances 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 1
- 150000003242 quaternary ammonium salts Chemical class 0.000 description 1
- 150000004060 quinone imines Chemical class 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000010992 reflux Methods 0.000 description 1
- 238000007761 roller coating Methods 0.000 description 1
- 238000001878 scanning electron micrograph Methods 0.000 description 1
- 150000003335 secondary amines Chemical class 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000002791 soaking Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 150000003457 sulfones Chemical class 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 150000003512 tertiary amines Chemical class 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
Landscapes
- Macromolecular Compounds Obtained By Forming Nitrogen-Containing Linkages In General (AREA)
- Materials For Photolithography (AREA)
Description
1294559 玖、發明說明: 【發明所屬之技術領域】 本發明係關於一種正型光敏感性聚醯亞胺塗佈組合 物’其可用於形成一顯示器之絕緣層。 【先前技術】 聚醯亞胺(polyimide,PI)由於具有優異的熱安定性及 良好的機械,電氣及化學性質,被廣泛地應用於半導體及 顯示器產業’例如1C晶片保護膜,晶片級封裝(chip scale package,CSP)及顯示器上的絕緣層(insuiat〇r)等。由於使用 光敏感性聚醯亞胺(PSPI)可簡化製程、降低成本而且可提 高產品良率,所以使用PSPI已是一種趨勢。 正型光敏感性聚醯亞胺的相關文獻非常多,但大多為 醯亞胺之前驅物如聚醯胺酸g旨(p〇lyainic acid ester),如 US 6329110、US 6291619、US 6232032 及 US 5858584 等 專利中所揭示。聚醯胺酸酯在顯影後的圖案為標準矩形, 但顯示器中絕緣層的需求為截面呈漸窄(tapered_angle at the cross section)的圖形,且聚醯胺酸酯最後還需以35〇它 高溫進行亞醯胺化(imidized),與低於250°C的製程需求 相衝突。因此以聚醯胺酸酯所製成的pspi並不適用。另外 有已亞醯胺化(imidized)的 PSPI 如 US 6627377、US 5441845、US 5573886等專利所揭示,其硬烤溫度雖然可 以較低,但其普遍都是可溶型的PI,故其耐溶劑性都普遍 較差,且需用高濃度的鹼性顯影液方能顯影,故其實用性 1294559 較低。 s a ο Τ 〇 m i k a w a J 〇 u r n a 1 〇 f p h 〇 t ο ρ ο 1 y in e r1294559 发明, DESCRIPTION OF THE INVENTION: FIELD OF THE INVENTION The present invention relates to a positive-type light-sensitive polyimide coating composition which can be used to form an insulating layer of a display. [Prior Art] Polyimine (PI) is widely used in the semiconductor and display industries due to its excellent thermal stability and good mechanical, electrical and chemical properties, such as 1C wafer protective film, wafer level packaging ( Chip scale package, CSP) and the insulating layer (insuiat〇r) on the display. The use of PSPI has been a trend due to the use of light-sensitive polyimine (PSPI) to simplify processes, reduce costs and increase product yield. There are many related literatures on positive-type light-sensitive polyimine, but most of them are quinone imine precursors such as poly-p- lysine, such as US 6329110, US 6291619, US 6232032 and US. 5858584 and other patents disclosed. The pattern of the polyphthalate after development is a standard rectangle, but the requirement of the insulating layer in the display is a pattern of tapered_angle at the cross section, and the polyglycolate finally needs to be 35 〇 high temperature. Imidization is in conflict with process requirements below 250 °C. Therefore, pspi made of polyglycolate is not suitable. In addition, it has been disclosed that the imidized PSPI, as disclosed in US Pat. No. 6,627,377, US Pat. No. 5, 441, 845, and U.S. Patent No. 5,573, 886, discloses that the hard-baked temperature can be low, but it is generally soluble in PI, so it is solvent resistant. The sex is generally poor, and it needs to be developed with a high concentration of alkaline developer, so its practicality is lower than 1294559. s a ο Τ 〇 m i k a w a J 〇 u r n a 1 〇 f p h 〇 t ο ρ ο 1 y in e r
Science and Technology,2002,15,205〜208、US 6593043 及US 65247 64揭示在主鏈導入末端基為酚基的聚醯胺酸酯 及加入具有酚基(phenolic hydroxyl gr0Up)之化合物當作交 聯劑(crosslinking agent),可使圖案有截面呈漸窄 (tapered-angle at the cross section)的效果,但其聚醯胺酸 酯的主結構在亞醯胺化(imidized )時仍是需要高溫才能確 保其亞醯胺化完全。在US 6524764實施例6-13中有指出 在聚酿胺自θ轉化為聚酿亞胺時會造成收縮(shrinkage ), 故聚醯胺酸酯所組成的PSPI其膜厚保持率也較低(66%), 其合成步驟亦較複雜。 【發明内容】 本發明的一主要目的在於提出一種新型的正型光敏感 性聚醯亞胺塗佈組合物,合成步驟簡單,可用鹼性水溶液 在短時間内顯影完成,具有高感度,良好的解析度,低的 硬烤溫度,高膜厚保持率,且在硬化後其圖案具有截面呈 漸窄(tapered-angle at the cross section)的形狀。本發明的 塗佈組合物在室溫下具有良好的儲存性。 本發明的正型光敏感性聚醯亞胺塗佈組合物包含一有 機溶劑及溶於該有機溶劑中的(a)聚醯亞胺,其主鏈末端具 有一齡基(phenolic hydroxyl group)或竣基(carboxyl group) ’(b)具有紛基(phenolic hydroxyl group)之化合物, 1294559 及(e)作為感光劑的ί昆疊氮石黃酸鹽(quinonediazide sulfonate),其中相對於每一百重量份的成分,成分(b) 的用量為1-50重量份,較佳的5-25重量份,及成分(c)的 用量為1-50重量份,較佳的5-25重量份。 較佳的5-25,該聚醯亞胺具有下列式(1)或(2)的構造:Science and Technology, 2002, 15, 205 to 208, US Pat. No. 6,593,043 and US Pat. No. 65,247,64 disclose the introduction of a polyglycolate having a phenol group at the end of the main chain and the addition of a compound having a phenolic hydroxyl gr0Up as a crosslink. The crosslinking agent can make the pattern have a tapered-angle at the cross section, but the main structure of the polyphthalate is still high temperature when it is imidized. Make sure that the imidization is complete. In Examples 6-13 of US Pat. No. 6,524,764, it is indicated that the shrinkage of the polystyrene from the conversion of θ to the styrene, so that the PSPI composed of the polyphthalate has a lower film thickness retention rate ( 66%), the synthesis steps are also more complicated. SUMMARY OF THE INVENTION A main object of the present invention is to provide a novel positive-type photosensitive polyimide coating composition with simple synthesis steps, which can be developed in a short time with an alkaline aqueous solution, and has high sensitivity and good performance. The resolution, the low hard baking temperature, the high film thickness retention, and the pattern after hardening have a tapered-angle at the cross section. The coating composition of the present invention has good storage properties at room temperature. The positive-type photosensitive polyimide coating composition of the present invention comprises an organic solvent and (a) polyimine dissolved in the organic solvent, and has a phenolic hydroxyl group at the end of the main chain or A carboxyl group '(b) has a phenolic hydroxyl group compound, 1294559 and (e) a sensitizer quinonediazide sulfonate, which is relative to each hundred weight The component (b) is used in an amount of 1 to 50 parts by weight, preferably 5 to 25 parts by weight, and the component (c) is used in an amount of 1 to 50 parts by weight, preferably 5 to 25 parts by weight. Preferably, 5 to 25, the polyimine has the following formula (1) or (2):
式(1)及(2)中η為10-600的整數,An為四價有機基團,In the formulae (1) and (2), η is an integer of 10 to 600, and An is a tetravalent organic group.
Ah為二至四價有機基團,A。為二價芳基,ri為一 〇H基 或COOH基。Ah is a di- to tetravalent organic group, A. As a divalent aryl group, ri is a hydrazine H group or a COOH group.
較佳的,Aq為 1294559Preferably, Aq is 1294559
較佳的,其中Ar2為Preferably, wherein Ar2 is
0¾ Cl -H6C3^i-〇-^ ch3 LCH303⁄4 Cl -H6C3^i-〇-^ ch3 LCH3
1^3%- mCH3 或擎 其中m為1-20的整數,及Χι為 8 1294559 _Ο—,一S—,一C(CF3)2 —.一C(CH3)2 — -CH,-, -S〇2-, -NHCO-,1^3%- mCH3 or qing where m is an integer from 1-20, and Χι is 8 1294559 _Ο—, an S—, a C(CF3)2 —. A C(CH3)2 — —CH,-, - S〇2-, -NHCO-,
其中m為1-20的整數,Z為H或甲基。 較佳的,該成分(b)之具有紛基(phenolic hydroxyl group)化合物具有下列構造:Wherein m is an integer from 1 to 20, and Z is H or methyl. Preferably, the phenolic hydroxyl group compound of the component (b) has the following structure:
其中R3至R9為Η、-OH基、CVCm烷基或C4-C2〇環脂基, 及z為0-5的整數。更佳的,該成分(b)為: 1294559Wherein R3 to R9 are an anthracene, an -OH group, a CVCm alkyl group or a C4-C2 anthracene ring group, and z is an integer of 0-5. More preferably, the ingredient (b) is: 1294559
OH , H丨OH , H丨
-OH-OH
BisP-BBisP-B
Bis-FBis-F
或or
較佳的,該成分(C)之感光劑具有下列結構 CH3Preferably, the sensitizer of the component (C) has the following structure: CH3
CH3CH3
10 1294559 其中D為氫, 〇 0 o V S〇2 S〇2 S〇2 1 且D不全為氫。 較佳的,該成分(a),(b)及(c)的重量和佔該組合物全部 重量的5-50%。 較佳的,該有機溶劑為N-甲基·2-吡咯烷酮、γ-丁内酯、 或乳酸乙 6旨(ethyl lactate)。 【實施方式】 聚醯亞胺的合成步驟為將適量的二胺單體與二酸酐單 體溶於一合適的有機溶劑例如N-甲基-2-°比洛烧酮 (N-methyl-2-pyrrolidone;NMP)中,並於 0〜4°C 下劇烈授拌10 1294559 wherein D is hydrogen, 〇 0 o V S〇2 S〇2 S〇2 1 and D is not all hydrogen. Preferably, the weight of the ingredients (a), (b) and (c) is from 5 to 50% by weight based on the total weight of the composition. Preferably, the organic solvent is N-methyl-2-pyrrolidone, γ-butyrolactone, or ethyl lactate. [Embodiment] The synthesis step of the polyimine is to dissolve an appropriate amount of the diamine monomer and the dianhydride monomer in a suitable organic solvent such as N-methyl-2-pyrrolidone (N-methyl-2). -pyrrolidone; NMP) and vigorously mix at 0~4 °C
4小時,再加入封端劑(endcapped agent)例如一具有紛基或 緩基的初級胺後授摔4小時,加入二曱苯(x y 1 e n e)並加熱至 1 80°C使其迴流,約3小時後將其冷卻,得到主鏈末端具有 一酚基或羧基的聚醯亞胺(PI)溶液。本發明的光敏感性聚醯 亞胺(PSPI)溶液的配製為取適量的PI溶液,加入酚基 (phenolic hydroxyl group)交聯劑及感光劑,其中可加入 NMP、γ-丁内酯(γ-butyrolactone,GBL)、或乳酸乙酯(ethyl lactate)等溶劑將PSPI溶液稀釋至所需濃度,以備使用。 使用本發明的PSPI溶液的微影製程如下:(丨)將PSPI 11 1294559 溶液利用旋轉塗布或其他方式塗布於適當的基材上;(Η)預 烤;(iii)曝光;(iv)顯影;及(v)硬烤,所得到的圖案為聚醯 亞胺。於上述步驟⑴中,將此正型PSPI溶液塗佈於一適當 基材上’而上述基材例如為一矽基材、玻璃或IT〇玻璃。 而上述塗佈的方法如旋轉塗佈法(spin coating)、滾輪塗佈 法(roller coating)、網版塗佈法(screen c〇ating)、淋幕塗佈 法(curtain coating)、浸鍍法(dip coating)及喷灑塗佈法 (spray coating),但並不侷限於上述塗佈方法。於本發明較 佳實施例中,經塗佈所形成之薄膜先於2〇〇c下預烤 (prebake)數分鐘以蒸除其中之溶劑。接著將上述經塗佈之 基材於一光罩下經由光化射線曝光,上述之光化射線例如 為X光射線、電子束射線、紫外光射線、可見光射線或其 他可作為光化射線之光源等。 曝光後上述經塗佈之基材隨後藉由一鹼性水性顯影劑 顯影,來洗去該薄膜的被曝光部份而得到一光阻圖形。上 述之鹼性水性顯影劑包含一鹼性水溶液,例如為無機鹼(氫 氧化鉀、氫氧化鈉)、一級胺(乙胺)、二級胺(二乙胺)、三 級胺(三乙胺)、或四級銨鹽(四曱基氫氧化銨 (teti:amethylamm〇niumhydr〇xide))的水溶液,其中以含有 四甲基氫氧化銨之水溶液為較佳。顯影可藉由浸泡、噴灑 或覆液或使用其他已知顯影方法而完成。上述經顯影後之 光阻圖形隨後經由去離子水清洗後,及在18〇〜4〇〇。〇下執 行硬烤程序(post-cure)將剩餘的溶劑趕乾,即得到具有截面 呈漸窄的聚醯亞胺圖形。 12 1294559 膜厚保持率(Film residual rate)的計算如下式·· 膜厚保持率(%)=[(硬烤後的膜厚)/(預烤後的膜厚)] 本發明可藉下列實施例被進一步瞭解,該等實施例僅 用於說明,而非用於限制本發明範圍。 藥品After 4 hours, an endcapped agent such as a primary amine having a sulfhydryl group or a slow group was added and then dropped for 4 hours. Dixybenzene (xy 1 ene) was added and heated to 180 ° C to reflux. After 3 hours, it was cooled to obtain a polyimine (PI) solution having a phenol group or a carboxyl group at the end of the main chain. The photosensitive polyimine (PSPI) solution of the invention is prepared by adding an appropriate amount of PI solution, adding a phenolic hydroxyl group crosslinking agent and a sensitizer, wherein NMP and γ-butyrolactone (γ) can be added. -butyrolactone, GBL), or ethyl lactate and other solvents to dilute the PSPI solution to the desired concentration for use. The lithography process using the PSPI solution of the present invention is as follows: (丨) Apply PSPI 11 1294559 solution to a suitable substrate by spin coating or other means; (Η) pre-bake; (iii) exposure; (iv) development; And (v) hard baking, the resulting pattern is polyimine. In the above step (1), the positive PSPI solution is applied to a suitable substrate, and the substrate is, for example, a tantalum substrate, glass or IT glass. The above coating method is, for example, spin coating, roller coating, screen coating, curtain coating, immersion plating. (dip coating) and spray coating, but are not limited to the above coating method. In a preferred embodiment of the invention, the film formed by coating is prebaked for 2 minutes at 2 ° C to distill off the solvent therein. Then, the coated substrate is exposed to actinic radiation under a mask, such as X-ray, electron beam, ultraviolet, visible, or other sources that can be used as actinic rays. Wait. After exposure, the coated substrate is subsequently developed by an alkaline aqueous developer to wash away the exposed portions of the film to obtain a photoresist pattern. The above alkaline aqueous developer comprises an alkaline aqueous solution such as an inorganic base (potassium hydroxide, sodium hydroxide), a primary amine (ethylamine), a secondary amine (diethylamine), a tertiary amine (triethylamine). Or an aqueous solution of a quaternary ammonium salt (teti:amethylamm〇niumhydr〇xide), wherein an aqueous solution containing tetramethylammonium hydroxide is preferred. Development can be accomplished by soaking, spraying or laminating or using other known development methods. The developed photoresist pattern is subsequently washed with deionized water and at 18 Torr to 4 Torr. The remaining solvent is drained by performing a post-cure under the armpit to obtain a polyimine pattern having a tapered cross section. 12 1294559 The film thickness retention rate is calculated as follows: Film thickness retention ratio (%) = [(film thickness after hard baking) / (film thickness after prebaking)] The present invention can be implemented by the following The examples are further understood to be illustrative only and not to limit the scope of the invention. drug
二(無水-偏苯三酸)乙二 g旨(ethylene glycol bis(anhydro-trimellitate) (TMEG)),Ethylene glycol bis (anhydro-trimellitate (TMEG)),
雙(3,4-二魏苯基)醚二酐(bis(3,4-dicarboxyphenyl)ether dianhydride (ODPA)), 13 1294559Bis(3,4-dicarboxyphenyl)ether dianhydride (ODPA), 13 1294559
(HAB) (BisAPAF) (3,5-DABA)(HAB) (BisAPAF) (3,5-DABA)
(ODA) 3,3-二經聯苯胺(3,3-dihydroxybenzidine (HAB)), 六氟-2, 2-二(3-胺基-4-羥苯基) (Hexofluoro-2,2_bis(3_amino-4-hydroxyphenyl) (BisAPAF)), 3,5-二胺基苯曱酸(3,5_diaminobenzoic acid (3,5_DΑΒΑ)), 4,4 ’-氧二苯胺(4,4’-Oxydianiline (ODA)),(ODA) 3,3-dihydroxybenzidine (HAB), hexafluoro-2,2-di(3-amino-4-hydroxyphenyl) (Hexofluoro-2, 2_bis (3_amino) -4-hydroxyphenyl) (BisAPAF)), 3,5-diaminobenzoic acid (3,5_DΑΒΑ), 4,4'-Oxydianiline (ODA) ),
2>二(4_(4_胺基苯氧基)苯基)丙烷 (2,2-bis(4-(4-aminophenoxyl)phenyl)propane (BAPP)),2>2(2-bis(4-aminophenoxyl)phenyl)propane (BAPP)),
Ά 2,2_ 二(4-(3_ 胺基苯氧基)苯基)職(2,2-bis(4-(3-aminophenoxyl)phenyl)sulfone 14 1294559 (m-BAPS))2,2-bis(4-(3-aminophenoxyl)phenyl)sulfone 14 1294559 (m-BAPS))
其中D爲Where D is
so2 2,3,4-三羥基-苯曱酮-1,2-二重氮萘醌-5_石黃酸鹽 (2,3?4-trihydroxy-benzophenone-152-diazonaphthoquinone-5-sulfonate (PIC-3), 由 KOYO chemicals Inc.購得) 實施例1 使用配備有一機械攪拌器與氮氣進口之1000毫升之三 頸圓底燒瓶,加入18.3公克(50毫莫耳)之Bis-APAF、12.3公 克(30毫莫耳)之BAPP、2.02公克(10毫莫耳)之ODA、20_5 公克(50毫莫耳)之丁“£0及15.5公克(50毫莫耳)之00?八,並 加入400克之NMP溶劑。將上述溶液於攪拌4小時後,再 加入2· 18克(20毫莫耳)之封端劑3-胺基苯醇 (3-aminophenol),並於室溫下再擾拌4小時,再加入80克之 二曱苯後升溫至1 80°C攪拌3小時。冷卻後可得到黏稠PI溶 液PI_1。經由紅外線(IR)光譜分析,本實施例所合成的PI 在1781 cm·1及1377 cm·1有醯亞胺C = Ο及C-N的特性吸收, 1294559 如圖1所示。取PI_1溶液50克,加入1.875克PIC-3、1.875克 DML-PC後混和均勻,可得一感光聚醯亞胺塗佈組合物 PSPI-1 〇然後利用旋轉塗佈法塗佈PSPI-1塗佈組合物於ITO 玻璃上,經由加熱板(Hot-Plate)於110°C下,2分鐘之軟 烤程序(prebake)後,便可得到一膜厚約為1 · 1 μπι之薄膜。 然後將上述經塗佈之ΙΤ0玻璃利用一未經過濾之汞弧光燈 (其所測得之波長介於250〜400nm),投予約100 mj/cm2之能 量,而加以曝光。以2.38% (重量百分比)之氳氧化四甲基銨 (tetramethylammonium hydroxide ; TMAH)水溶液顯影劑加 以顯影,顯影時間為35秒。隨後在熱風循環烘箱230°C下, 經30分鐘的硬烤程序(post-cure),便可得到一耐熱性之pi 圖形。如圖2a及2b所示,上述圖形具有一 10 μηι之線寬與間 距,膜厚約為2·0 μπι。而此圖形於硬烤後與其原先軟烤後 之厚度相較,具有91%之膜厚保持率(Film residual rate), 由掃描電子顯微(scanning electron microscope,SEM)鏡照片可觀察 到該聚贐亞胺圖案為具有呈漸窄的截面(tapered-angle at the cross section) ° 實施例2 使用配備有一機械攪拌器與氮氣進口之1000毫升之 三頸圓底燒瓶,加入7.6公克(50毫莫耳)之3,5-DABA、 12.975公克(30毫莫耳)之m_BAPS、1.54公克(7.5毫莫耳) 之ODA、32.8公克(80毫莫耳)之TMEG及6.2公克(20毫 莫耳)之0DPA,並加入400克之NMP溶劑。將上述溶液於 16 1294559 (TC攪拌4小時後,再加入2·73克(25毫莫耳)之封端劑% 胺基苯酵,並於室溫下再攪拌4小時,加入8〇克之-甲苯 後升溫至1 80°C攪拌3小時。冷卻後可得到黏稠p][溶液 PI-2。取 PI-2 溶液 50 克,加入 1.875 克 PIC-3、1·〇 克 MTpc 後混和均勻,可得一感光聚醯亞胺塗佈組合物pspi_2。然 後利用旋轉塗佈法塗佈PSPI-2塗佈組合物於IT〇玻璃上, 且經由加熱板於11(TC下,2分鐘之軟烤程序後,便可得到 一膜厚約為1 · 1 μιη之薄膜。然後將上述經塗佈之IT〇玻璃 利用一未經過濾之汞弧光燈(其所測得之波長介於 籲 250〜400nm)投予約120 mJ/cm2之能量加以曝光。以2 38% (重量百分比)之TMAH水溶液顯影劑加以顯影,顯影時間 為35秒。隨後在熱風循環烘箱23(rc下,經3〇分鐘的硬 烤程序,便可得到一耐熱性之PI圖形。上述ρι圖形具有 15 μηι之線寬與間距,膜厚為〇 95 um。而此ρι圖形於硬 烤後與其原先軟烤後之厚度相較,具有86%之膜厚保持 率,由SEM圖亦可觀察到該聚醯亞胺圖案為具有呈漸窄的 籲 截面。 實施例3 使用配備有一機械攪拌器與氮氣進口之1000毫升之 三頸圓底燒瓶,加入10·8公克(5〇毫莫耳)之HAB、12.975 公克(30毫莫耳)之m_BAps、2 〇2公克(1〇毫莫耳)之〇da 及41·〇公克(100毫莫耳)之TMEG,並加入400克之NMP 溶劑。將上述溶液於0^攪拌4小時後,再加入218克(2〇 17 1294559 毫莫耳)之封端劑3-胺基苯醇,並於室溫下再攪拌4小時, 加入80克之二甲苯後,升溫至180°C攪拌3小時。冷卻後 可得到黏稠PI溶液PI-3 。取PI-3溶液50克,加入1.875 克PIC-3、2.25克BIPC-PC後混和均勻,可得一感光聚醯 亞胺塗佈組合物PSPI-3。利用旋轉塗佈法塗佈PSPI-3塗佈 組合物於ITO玻璃上,且經由加熱板於U(rc下,2分鐘之 軟烤程序後,便可得到一膜厚約為1 ·2 μπι之薄膜。然後將 上述經塗佈之ΙΤΟ玻璃利用一未經過濾之汞弧光燈(其所 測得之波長介於250〜400 nm)投予約120 mj/cm2之能量加 以曝光。以2.38% (重量百分比)之TMAH水溶液顯影劑加 以顯影’顯影時間為40秒。隨後在熱風循環烘箱23〇〇c下, 經30分鐘的硬烤程序,便可得到一耐熱性之ρι圖形。上 述PI圖形具有15 μπι之線寬與間距,膜厚為1〇5 μιη。而 此ΡΙ圖形於硬烤後與其原先預烤後之厚度相較,具有一為 原先厚度87·5%之膜厚保持率(Film residual rate),由sem 圖亦可觀察到其圖案為(tapered_angle at the cr〇ss ⑽)。 比較例1 使用配備有一機械攪拌器與氮氣進口之ι〇〇〇毫升之 三頸圓底燒瓶,加人36.6公克(1〇〇毫莫耳)之Bis_ApAF、 31.0公克(HH)毫莫耳)之0DPA ’並加入4〇〇克之NMp溶 劑。將上述溶液於(TC擾拌4小時後加入8〇克之二曱笨後 升溫至18(TC擾拌3小時。冷卻後可得到黏稠Η溶液 PI C1。取ΡΙ-Cl溶液50克’加入i 8克pic_3混和均句, 18 1294559 可得一感光聚醯亞胺塗佈組合物PSPI-C1。利用旋轉塗佈 法塗佈PSPI-C1塗佈組合物於ITO玻璃上,且經由加熱板 於110°c下,2分鐘之軟烤程序後,便可得到一膜厚約為u μιη之薄膜。然後將上述經塗佈之IT〇玻璃利用一未經過濾 之汞弧光燈(其所測得之波長介於250〜400nm)投予約120 mJ/cm2之能量加以曝光。以2.38% (重量百分比)之TMAH 水溶液顯影劑加以顯影,顯影時間超過3分鐘仍無法得到 圖案。在此比較例中,該PI的合成未使用封端劑。 比較例2 取實施例1製備的PI-1溶液50克,加入1·875克PIC_3 後混和均勻’可得一感光聚醯亞胺塗佈組合物pSpi_C2。 重覆貫施例1的微影製程,其中軟烤後的膜厚為i. 〇 μπι, 以TMAH水溶液顯影的顯影時間為60秒,得具有20 μπι 之線寬與間距,膜厚為0·8 μιη (膜厚保持率80%)。由seM 圖觀察其PI圖案的截面為矩形,並無漸窄的形狀。在此比籲 較例中,該感光聚醯亞胺塗佈組合物pSPI_C2未使用成分 (b)具有紛基(phenolic hydroxyl group)之化合物。 比較例3 HAB_ODPA_ 丁醇(butanol)·聚醯胺酸酯(p〇lyamic acid ester) 之合成 使用配備有一機械攪拌器與氮氣進口之25〇毫升之三 頸圓底燒瓶,加入15.50公克(5〇毫莫耳)之〇dpa、7.4 0公 19 1294559 克(100毫莫耳)之正丁醇(n_butanol)及115公克之NMP溶 劑。加熱上述混合物至80°C並於此溫度下攪拌4小時,進 行_化反應,將上述溶液冷卻至4°C以下,再加入16.63公 克(200氅莫耳)之π比咬(pyridine)及19.5〇公克(1〇〇毫莫耳) 之本基膦酸二氯化物(phenvlphosphonic dichlorirlfi),再於 室溫下攪拌2小時後,進行C00H基的活化反應。將上述 溶液冷卻至〇〜41後,再加入10.8公克(50毫莫耳)之HAB, 並於0〜4°C下攪拌1小時後,再於室溫下攪拌8小時(進行 聚醯胺酸酯的聚合反應)。利用1 〇〇〇毫升之甲醇將所形成 之溶液沉澱,並過濾之以收集其中之聚合物,並將所收集 之聚合物利用去離子水清洗三次。最後將所得到的聚醯胺 酸S旨置放於8(rC之真空環境下24小時使之乾燥。取5公 克的聚醯胺酸酯、125公克的PIC-3及18.75公克的NMP 溶劑配成感光聚醯胺酸酯塗佈組合物PSPI_C3。重覆實施 例1微影製程,其中軟烤後的膜厚為1 ·〇 μιη,以TMAH水 溶液顯影的顯影時間為60秒,得到具有2〇 μιη之線寬與間 距的圖形,膜厚為〇·9 um。而此圖形於35〇cc硬烤後與其 原先軟烤之厚度相較,具有70%之膜厚保持率(Film residual rate),其圖案為矩形。 比較例3為一般感光聚醯胺酸酯塗佈組合物,在此只 是強調其需經由350°C硬烤及其膜厚保持率較低。 【圖式簡單說明】 圖1為本發明實施例1所合成的聚醯亞胺的紅外線光 20 1294559 譜,其中被分析的聚醯亞胺有於180°C反應3小時及於190 °C反應3小時的兩種。 圖2a及2b分別為使用本發明實施例1所製備的正型 光敏感性聚醯亞胺塗佈組合物的圖形的上視及剖視掃描電 子顯微鏡(SEM)照片。So2 2,3,4-trihydroxy-benzophenone-1,2-diabazonaphthoquinone-5_rexate (2,3?4-trihydroxy-benzophenone-152-diazonaphthoquinone-5-sulfonate (PIC -3), available from KOYO chemicals Inc.) Example 1 A 1000 ml three-necked round bottom flask equipped with a mechanical stirrer and a nitrogen inlet was used, and 18.3 g (50 mmol) of Bis-APAF, 12.3 g was added. (30 millimoles) of BAPP, 2.02 grams (10 millimoles) of ODA, 20_5 grams (50 millimoles) of "000 and 15.5 grams (50 millimoles) of 00? eight, and joined 400 NMP solvent. After stirring the above solution for 4 hours, add 2·18 g (20 mmol) of blocking agent 3-aminophenol, and then stir-fry at room temperature. After adding 80 g of diphenylbenzene, the temperature was raised to 180 ° C and stirred for 3 hours. After cooling, the viscous PI solution PI_1 was obtained. By infrared (IR) spectroscopy, the PI synthesized in this example was 1781 cm·1 and 1377 cm·1 醯imine C = 特性 and CN characteristic absorption, 1294559 as shown in Figure 1. Take 50 grams of PI_1 solution, add 1.875 grams of PIC-3, 1.875 grams of DML-PC and mix evenly, get The photosensitive polyimide coating composition PSPI-1 was then coated onto the ITO glass by spin coating using a hot plate (Hot-Plate) at 110 ° C for 2 minutes. After the soft bake process (prebake), a film having a film thickness of about 1 · 1 μm is obtained. The coated ΙΤ0 glass is then subjected to an unfiltered mercury arc lamp (the wavelength measured is between 250 to 400 nm), an energy of about 100 mj/cm 2 was applied and exposed, and developed with 2.38% by weight of a tetramethylammonium hydroxide (TMAH) aqueous solution developer, and the development time was 35 seconds. A heat-resistant pi pattern is then obtained in a hot air circulating oven at 230 ° C for 30 minutes by post-cure. As shown in Figures 2a and 2b, the pattern has a line width of 10 μηι With a pitch, the film thickness is about 2·0 μπι. This pattern has a film thickness retention ratio of 91% compared to the thickness of the original soft baked after hard baking, by scanning electron microscopy (scanning electron microscopy) Electron microscope, SEM) The imine pattern has a tapered-angle at the cross section. Example 2 A 1000 ml three-necked round bottom flask equipped with a mechanical stirrer and a nitrogen inlet was used, and 7.6 g (50 mmol) was added. 3,5-DABA, 12.975 grams (30 millimoles) of m_BAPS, 1.54 grams (7.5 millimoles) of ODA, 32.8 grams (80 millimoles) of TMEG and 6.2 grams (20 millimoles) 0 DPA and add 400 grams of NMP solvent. After stirring the above solution at 16 1294559 (TC for 4 hours, add 2.73 g (25 mmol) of the blocking agent % aminobenzaldehyde, and stir at room temperature for another 4 hours, add 8 gram - After toluene, the temperature was raised to 180 ° C and stirred for 3 hours. After cooling, viscous p] [solution PI-2 was obtained. Take 50 g of PI-2 solution, and add 1.875 g of PIC-3, 1 · gram of MTpc, and mix evenly. A photosensitive polyimide coating composition pspi_2 was obtained. The PSPI-2 coating composition was then coated onto the IT glass by spin coating and passed through a hot plate at 11 (TC, 2 minute soft bake procedure). Thereafter, a film having a film thickness of about 1 · 1 μm can be obtained. Then, the coated IT glass is coated with an unfiltered mercury arc lamp (the measured wavelength is between 250 and 400 nm). An energy of about 120 mJ/cm 2 was applied for exposure. Development was carried out with 2 38% by weight of TMAH aqueous developer, and the development time was 35 seconds. Then, in a hot air circulating oven 23 (rc, after 3 minutes of hard baking) Program, you can get a heat-resistant PI graphics. The above ρι graphics have a line width and spacing of 15 μηι, film thickness 〇95 um. The ρι pattern has a film thickness retention of 86% after being hard-baked compared with the original soft-baked thickness. It can also be observed by the SEM image that the polyimine pattern has a tapered shape. Cross section. Example 3 Using a 1000 ml three-necked round bottom flask equipped with a mechanical stirrer and a nitrogen inlet, add 10·8 g (5 Torr) of HAB, 12.975 g (30 mmol) of m_BAps. , 2 公 2 gram (1 〇 millimolar) 〇 da and 41 〇 gram (100 millimolar) of TMEG, and add 400 grams of NMP solvent. Stir the above solution at 0 ^ for 4 hours, then add 218 Gram (2〇17 1294559 mM) of the blocking agent 3-aminophenyl alcohol, and stirred at room temperature for another 4 hours, after adding 80 g of xylene, the temperature was raised to 180 ° C and stirred for 3 hours. A viscous PI solution PI-3 was obtained. 50 g of the PI-3 solution was added, and 1.875 g of PIC-3 and 2.25 g of BIPC-PC were added and mixed uniformly to obtain a photosensitive polyimide coating composition PSPI-3. The PSPI-3 coating composition was coated on the ITO glass by a coating method, and passed through a hot plate at U (rc, after a soft baking process for 2 minutes). A film having a film thickness of about 1.25 μm can be obtained. The coated bismuth glass is then applied to an unfiltered mercury arc lamp (having a wavelength of 250 to 400 nm) for about 120 mj. The energy of /cm2 was exposed. Development was carried out with 2.38% by weight of TMAH aqueous solution developer' development time of 40 seconds. Then, under the hot air circulating oven 23〇〇c, a heat-hardening process can be obtained by a hard baking process for 30 minutes. The above PI pattern has a line width and a pitch of 15 μm, and the film thickness is 1〇5 μιη. The ΡΙ pattern is compared with the thickness of the original pre-baked after hard baking, and has a film thickness retention rate of 87.5% of the original thickness, and the pattern can also be observed by the sem diagram (tapered_angle) At the cr〇ss (10)). Comparative Example 1 A three-necked round bottom flask equipped with a mechanical stirrer and a nitrogen inlet was used to add 36.6 g (1 Torr) of Bis_ApAF, 31.0 g (HH) millimolar. 0DPA 'and add 4 grams of NMp solvent. After the solution was stirred for 4 hours, the solution was heated to 18 (TC scrambled for 3 hours. After cooling, a viscous hydrazine solution PI C1 was obtained. 50 g of ΡΙ-Cl solution was added to add i 8克pic_3 mixed uniform sentence, 18 1294559 A photosensitive polyimide coating composition PSPI-C1 was obtained. The PSPI-C1 coating composition was coated on the ITO glass by spin coating and passed through a heating plate at 110°. After a soft baking process of 2 minutes, a film with a thickness of about u μιη can be obtained. Then the coated IT glass is coated with an unfiltered mercury arc lamp (the wavelength measured) An energy of about 120 mJ/cm 2 was applied for exposure at 250 to 400 nm. Development was carried out with 2.38% by weight of TMAH aqueous developer, and the pattern could not be obtained after the development time exceeded 3 minutes. In this comparative example, the PI was used. For the synthesis, no blocking agent was used. Comparative Example 2 50 g of the PI-1 solution prepared in Example 1 was added, and after adding 1.875 g of PIC_3, the mixture was uniformly mixed to obtain a photosensitive polyimide coating composition pSpi_C2. The lithography process of Example 1, wherein the film thickness after soft baking is i. 〇μπι, to TMAH The development time of the aqueous solution development was 60 seconds, and the line width and pitch of 20 μπι were obtained, and the film thickness was 0·8 μm (the film thickness retention rate was 80%). The cross section of the PI pattern was observed by the seM diagram as a rectangle, and there was no gradation. In this case, the photosensitive polyimide coating composition pSPI_C2 does not use a compound having a phenolic hydroxyl group as component (b). Comparative Example 3 HAB_ODPA_butanol·butanol· The synthesis of p〇lyamic acid ester was carried out using a 25-ml three-necked round bottom flask equipped with a mechanical stirrer and a nitrogen inlet, and 15.50 g (5 mM m) of 〇dpa, 7.4 0 was added. 19 19,294,559 g (100 mmol) of n-butanol (n-butanol) and 115 g of NMP solvent. The mixture was heated to 80 ° C and stirred at this temperature for 4 hours to carry out a crystallization reaction, and the solution was cooled to Below 4 ° C, add 16.63 grams (200 moles) of π pyridine and 19.5 gram gram (1 〇〇 millimoles) of phenvlphosphonic dichlorirlfi, and then room After stirring for 2 hours at room temperature, activation of C00H group After cooling the above solution to 〇~41, add 10.8 g (50 mmol) of HAB, stir at 0 to 4 ° C for 1 hour, and then stir at room temperature for 8 hours. Polymerization of the amine ester) The resulting solution was precipitated using 1 mL of methanol and filtered to collect the polymer therein, and the collected polymer was washed three times with deionized water. Finally, the obtained polylysine S was placed in a vacuum environment of 8 (rC for 24 hours to dry it. 5 g of polyphthalate, 125 g of PIC-3 and 18.75 g of NMP solvent were used. The photosensitive polyamidate coating composition PSPI_C3 was repeated. The lithography process of Example 1 was repeated, wherein the film thickness after soft baking was 1 ·〇μιη, and the development time of developing with TMAH aqueous solution was 60 seconds, which was obtained with 2〇. The line width and pitch pattern of μιη is 〇·9 um. This pattern has a 70% film residual rate after being hard-baked at 35〇cc and its original soft-baked thickness. The pattern is rectangular. Comparative Example 3 is a general photosensitive polyamidate coating composition, which only emphasizes that it needs to be hard baked at 350 ° C and its film thickness retention rate is low. [Simplified illustration] Figure 1 The infrared light 20 1294559 spectrum of the polyimine synthesized in Example 1 of the present invention, wherein the analyzed polyimine has two kinds of reactions of reacting at 180 ° C for 3 hours and at 190 ° C for 3 hours. And 2b are the positive-type photosensitive polyimide coating compositions prepared by using the first embodiment of the present invention, respectively. On view and cross-sectional scanning electron microscope pattern (SEM) photographs.
21twenty one
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