TWI284349B - System and method for supplying photoresist - Google Patents
System and method for supplying photoresist Download PDFInfo
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- TWI284349B TWI284349B TW91135006A TW91135006A TWI284349B TW I284349 B TWI284349 B TW I284349B TW 91135006 A TW91135006 A TW 91135006A TW 91135006 A TW91135006 A TW 91135006A TW I284349 B TWI284349 B TW I284349B
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- reservoir
- photoresist
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- 229920002120 photoresistant polymer Polymers 0.000 title claims abstract description 152
- 238000000034 method Methods 0.000 title claims description 23
- 238000003860 storage Methods 0.000 claims abstract description 93
- 239000000758 substrate Substances 0.000 claims abstract description 5
- 239000004615 ingredient Substances 0.000 claims description 40
- 239000000463 material Substances 0.000 claims description 13
- 239000011232 storage material Substances 0.000 claims description 5
- 101150099099 twf1 gene Proteins 0.000 claims description 3
- 150000001875 compounds Chemical class 0.000 claims description 2
- 108091008695 photoreceptors Proteins 0.000 claims 1
- 235000012431 wafers Nutrition 0.000 description 16
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 10
- 238000004519 manufacturing process Methods 0.000 description 9
- 230000008569 process Effects 0.000 description 9
- 229910052757 nitrogen Inorganic materials 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 239000007789 gas Substances 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 239000000356 contaminant Substances 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 239000000975 dye Substances 0.000 description 2
- 235000013399 edible fruits Nutrition 0.000 description 2
- 229920000515 polycarbonate Polymers 0.000 description 2
- 239000004417 polycarbonate Substances 0.000 description 2
- 101100008044 Caenorhabditis elegans cut-1 gene Proteins 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- YGYAWVDWMABLBF-UHFFFAOYSA-N Phosgene Chemical compound ClC(Cl)=O YGYAWVDWMABLBF-UHFFFAOYSA-N 0.000 description 1
- 206010036790 Productive cough Diseases 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 238000012512 characterization method Methods 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000004043 dyeing Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 238000001393 microlithography Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000007790 scraping Methods 0.000 description 1
- 239000002689 soil Substances 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 210000003802 sputum Anatomy 0.000 description 1
- 208000024794 sputum Diseases 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
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- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
Description
1284349 案號 91135006 曰 修正 五、發明說明(1) 發明所屬之技術領域 本發明是有關於半導體晶圓以及光碟的製造,且特別 是有關於一種光阻或是其他類似之操作液體的供應系統及 方法。 先前 面上 構的 以及 程而 圖案 光阻 至光 後, 部分 晶圓 光阻 的表 此, 的圖 的特 技術 在半導體 形成圖案 表面尺寸 電晶體在 言,微影 的能力變 般而言 層, 阻, 依照 或是 的表 圖案 層。 在半 案區 徵圖 在其 接著 並改 所使 曝光 層。 並且 而且 導體 域將 案。 他的 晶圓的 。而微 而為晶 積體電 製程的 得更為 ,微影 ,經由 變光阻 用光阻 圖案之 當所需 例如是 ,光阻 晶圓表 會被餘 製程 影製 圓製 路的 精確 重要 製程 一圖 中對 的型 外的 的光 藉由 通常 層上 刻, 中, 程通 造的 集積 性與 〇 包括 案對 應圖 態, 部分 阻圖 I虫刻 對化 ,只 以於 光阻係用以於半導體晶圓表 常係決定電路製造與電路結 關鍵製程。當積體電路變小 度增加,對先進的半導體製 圖案化更小特徵(feature) 在半 光阻 案區 將光 ,以 案被 製程 學蝕 有在 半導 導體 進行 域的 阻顯 將光 建立 而被 刻劑 顯影 體晶 晶圓 曝光 結構 影以 阻中 ,特 定義 具有 後光 圓表 的表 以將 與性 移除 的圖 徵圖 於半 抵抗 阻被 層定 層上塗佈 圖案轉移 質。然 曝光圖案 案定義於 案則根據 導體晶圓 力,因 移除部分 義出所需 技術中,光阻亦通常用於光碟母片後製1284349 Ref. No. 91135006 曰Revision 5, Invention Description (1) Field of the Invention The present invention relates to the manufacture of semiconductor wafers and optical discs, and more particularly to a supply system for photoresist or other similar operating liquids and method. On the surface of the previous surface and the pattern of the photoresist to the light, part of the photoresist of the wafer, the special technique of the pattern in the semiconductor surface pattern of the transistor size, the ability of the lithography to change the layer, the resistance , according to the pattern layer of the table. In the case area, the map is subsequently changed to make the exposure layer. And the conductor domain will be the case. His wafers. For micro-lithography, the electro-optical process is more lithographic, and the photo-resist pattern is required to be changed by photo-resistance. For example, the photoresist wafer table will be accurately processed by the remaining process. In the figure, the light outside the pattern is etched by the usual layer, and the accumulation of the process is in accordance with the pattern of the 〇 〇 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 The semiconductor wafer table often determines the key process of circuit fabrication and circuit junction. As the integrated circuit becomes smaller, the features of the advanced semiconductor pattern are smaller. The feature in the semi-resistance case will be light, and the process will be etched in the field of the semiconducting conductor. While the engraving agent develops the crystal wafer to expose the structure to resist, a table having a back light circle is specifically defined to coat the pattern of the sexually removed pattern on the semi-resistance layer. However, the exposure pattern is defined according to the conductor wafer force. Because the removal part is required, the photoresist is also commonly used in the optical disc master.
8243twf1.ptc 第6頁 1284349 _案號 91135006_年月日__ 五、發明說明(2) (mastering)製程,在光碟母片的製造中,光阻係塗佈於 玻璃、聚碳酸酯(polycarbonate)或是其他合適材料所構 成的基底上。然後塗佈有光阻的碟片係使用母片後製雷射 選擇性的曝光。在曝光後碟片係浸泡於顯影液中以根據光 阻的型態移除光阻之顯影或是未顯影部分。經顯影殘留光 阻的碟片係形成碟片的物理模版結構。 如一般所知,光阻通常為光敏性化學物質,並會對特 定範圍的光波長感光。當將光阻曝光於特定波長的光時, 光阻將會感光與改變其結構與性質。根據所使用光阻的型 態,其結構與性質的改變通常係形成可溶或是不可溶的狀 態,或是形成不可溶結構或是可溶的結構。在個別狀況 中,經曝光的光阻係在曝光後被顯影,光阻的顯影通常係 將可溶部分的光阻移除,而殘留的不可溶部分光阻則定義 出圖案。 為了在光阻中定義出更小甚至更複雜的特徵圖案,光 阻中必須無污染物並具有需要的黏度與均勻的濃度。對於 光阻的要求黏度以及光阻供應時的要求厚度而言,需考慮 到被塗佈光阻之晶圓或碟片的尺寸。而且,光阻必須均勻 的黏著於晶圓或碟片表面,並必須均勻的分佈且具有足夠 的厚度,以使殘留在晶圓或碟片的光阻定義出圖案並作為 此些區域的餘刻阻障。 光阻通常係使用一個旋轉夾盤或其他類似的裝置以將 光阻沈積於晶圓或是碟片的中心,並經由旋轉將光阻分布 至整個晶圓或是碟片的表面。光阻通常係經由配置於晶圓8243twf1.ptc Page 6 1284349 _ Case No. 91135006_年月日日__ V. Description of invention (2) (mastering) process, in the manufacture of optical disc master, photoresist is coated on glass, polycarbonate (polycarbonate ) or on a substrate made of other suitable materials. The disc coated with the photoresist is then laser-selectively exposed using a master wafer. After the exposure, the disc is immersed in the developing solution to remove the developed or undeveloped portion of the resist depending on the type of the resist. The disc that develops the residual photoresist forms the physical stencil structure of the disc. As is generally known, photoresists are typically photosensitive chemicals that are sensitive to a specific range of wavelengths of light. When the photoresist is exposed to light of a specific wavelength, the photoresist will be photosensitive and change its structure and properties. Depending on the type of photoresist used, changes in structure and properties typically result in a soluble or insoluble state, or an insoluble structure or a soluble structure. In some cases, the exposed photoresist is developed after exposure, and the development of the photoresist typically removes the photoresist of the soluble portion, while the residual insoluble portion of the photoresist defines the pattern. In order to define a smaller or even more complex pattern of features in the photoresist, the photoresist must be free of contaminants and have the desired viscosity and uniform concentration. For the required viscosity of the photoresist and the required thickness for the photoresist supply, the size of the wafer or disc to which the photoresist is applied must be considered. Moreover, the photoresist must be uniformly bonded to the surface of the wafer or disc and must be evenly distributed and of sufficient thickness to define the photoresist remaining in the wafer or disc and to serve as a remnant of these areas. Barrier. The photoresist typically uses a rotating chuck or other similar device to deposit photoresist on the wafer or the center of the disc and distribute the photoresist to the entire wafer or disc surface via rotation. The photoresist is usually disposed on the wafer.
8243twf1.ptc 第7頁 1284349 修正8243twf1.ptc Page 7 1284349 Fix
j是碟片上方的噴嘴以配料。且光阻通常係儲 ^(storage tank)或是貯存器(reserv〇i 後 ^ = 案號 91135006 發明說明(3) Ϊ二以K由ίί種系統中,光阻首先被抽二= 應財存益,然後由供應貯存器抽吸至配料噴嘴。 仏 在例如是上^述的習知光阻供應系統中,微泡 (m 1 c r 〇 b u b b 1 e s )將會被引入本 ,,.,,,, 中構成不被接受的污染物。 箱 /=泡係會在光阻 方面上,會在所製存ΐ:微泡在許多 ^n^ϊ黏著於晶圓或碟片表面所導致 的不S光阻移除以及其他的缺陷。 發明内容 有鑑於此’係需要一種能夠避免產生微泡以供應光阻 或是其他類似材質的方法與系統。 大體而έ ’本發明滿足此些需要的方法係藉由··提供 一真空(vacuum)或負壓光阻供應系統連接至一個或多個光 阻儲存瓶,並經由一個瓶自動切換閥(b 〇 11 i e auto-change valve)以配料光阻或其他類似的材質。本發 明能夠經由多種方法實施,包括一個製程(p r 0 c e s s )、一 個設備(apparatus)、一個系統(system)、一個裝置 (d e v i c e )與一個方法(m e t h 〇 d )。而且數個實施例將會敘述 如下。j is the nozzle above the disc to make the ingredients. And the photoresist is usually stored in a storage tank or a reservoir (reserv〇i ^ = case number 91135006 invention description (3) Ϊ two to K by ί system, the photoresist is first pumped two = should be saved And then pumped to the dispensing nozzle by the supply reservoir. In a conventional photoresist supply system such as that described above, the microbubbles (m 1 cr 〇bubb 1 es ) will be introduced into the present, ,,,,,, It constitutes an unacceptable contaminant. The box/=bubble will be in the light resistance, and it will be in the process of: the micro-bubble is not attached to the surface of the wafer or disc. Removal and other deficiencies. SUMMARY OF THE INVENTION In view of the need for a method and system that avoids the generation of microbubbles to supply photoresist or other similar materials, it is generally preferred that the method of the present invention satisfies such needs. Providing a vacuum or negative pressure photoresist supply system connected to one or more photoresist storage bottles and via a bottle automatic switching valve (b 〇 11 ie auto-change valve) to compound photoresist or other Similar materials. The invention can be implemented in a variety of ways, including a process (p r 0 c e s s ), an apparatus (apparatus), a system (system), a device (d e v i c e ) and a method (m e t h 〇 d ), and several embodiments will be described below.
8243twfl.ptc 第8頁 1284349 案號91135006 年月日 修正 五、發明說明(4) 實。,並 儲。具係 動以 佳料器。 二 口器泵 自口 較材存瓶 第出存空 瓶出 一 阻貯存 一 一貯真 一一 於光一儲 括有二二 括的 。存括至 包具第第 包器 統儲包接 統樣此一統存 系以更連 系同且且 系貯 應用統口 應瓶,並 應一 供瓶系入 供存器。 供第 阻存應器 阻儲存瓶 阻至 光儲供存 光二貯存 光接 種一阻貯。此第二儲 此連 一括光此器,此第二 ,係 的 貯 配連 此係貯 性存 #二 個係 於阻二 擇貯 h第。一嘴 。光第 選料 $且動括噴 法中一 以配-I並流包料。方其。 用至 ,壁更配面的,器 係接 動側統個表應器存 閥連 U流内系一的供存貯 換一 纟壁的應。底阻貯一 系 - > 切之 β側器供器基光料第 動中 U内存阻存至種配入 自其 Μ的貯光貯料一 一引 瓶的 U器二,料配供至槽 此器 、存第中配阻提接存 本發明的目的係提供 施例中,光阻供應系統包 此儲存瓶具有一出口。此 其中具有一貯存器入口, 且一真空泵係連接至貯存 於另一較佳實施例中 存瓶用以儲存光阻材料。 光阻供應系統更包括一個 有一貯存器入口連接至第 連接至第二貯存器。 於再一較佳實施例中 切換閥,此瓶自動切換閥 及第二貯存器的一出口。 將第一貯存器與第二貯存 器。 於更一較佳實施例中 入口係使光阻接觸第一貯 存器的入口係使光阻接觸 於再更一較佳實施例 料泵,此配料泵係連接至 接至配料泵,並用以將光 本發明的另一目的係 方法中,一第一貯存器連 藉由一真空狀態由第一儲8243twfl.ptc Page 8 1284349 Case No. 91135006 Revision Date V. Description of Invention (4) Real. And save. It is equipped with a good feeder. Two-port pump from the mouth to the material storage bottle, the first empty storage bottle, one storage, one storage, one true, one in the light, including two. It is stored in the package and the package is connected to the same package and is connected to the bottle, and a bottle is attached to the supply. For the first block of the storage device, the storage bottle is blocked to the light storage, storage, storage, storage, light storage, and storage. This second store is connected to the device, and the second, the storage of the system is connected to the storage system. a mouth. The light is selected from the material and the liquid is sprayed. Fang Qi. When the wall is more matched, the device is connected to the side of the device, and the valve is connected to the U-flow system for storage. Bottom resistance storage system - > Cut the side device of the β side device, the U memory is blocked in the first movement, and the U device is equipped with the light storage material from the other side. The purpose of the invention is to provide a solution in which the storage bottle has an outlet. There is a reservoir inlet therein and a vacuum pump is connected to the storage bottle stored in another preferred embodiment for storing the photoresist material. The photoresist supply system further includes a reservoir inlet connected to the first connection to the second reservoir. In still another preferred embodiment, the valve is switched, the bottle automatically switching the valve and an outlet of the second reservoir. The first reservoir is coupled to the second reservoir. In a further preferred embodiment, the inlet causes the photoresist to contact the inlet of the first reservoir to contact the photoresist to a further preferred embodiment pump that is coupled to the dispensing pump and used to In another method of the present invention, a first reservoir is connected to the first reservoir by a vacuum state.
& 8243twf1.ptc 第9頁 1284349 案號 91135006 曰 修正 五、發明說明(5) 存器連接至配料貯存器 二儲存槽引入第二貯存 器或是第二貯存器的其 於一較佳實施例中 以及第二貯存器的内壁 本發明係具有多數 點係為:真空或負壓光 使光阻流經系統,並將 能夠消除在習知的供應 其他氣體或媒體所產生 污染光阻而導致不被接 藉由將微泡的產生源消 成本。 ,其 器。 中之 ,光 而引 的優 阻供 光阻 糸統 的微 受以 除, 中光 且光 一流 阻係 入此 點。 應系 供應 中, 泡。 及昂 以增 阻係 阻係 進酉己 各自 些貯 其中 統係 至工 由於 在製 貴的 加產 精由 選擇 料貯 經由 存器 一個 使用 具或 使用 作過 缺陷 品的 真空狀態由第 性的 存器 接觸 中 〇 顯著 真空 其他 加壓 程中 與刮 良率 由第一貯存 〇 第一貯存器 的好處及優 或是負壓以 系統,因此 的氮氣以及 ,微泡將會 痕。本發明 與減少製造 另一個 藉由提供一 動。使光阻 落入貯存器 入口以使光 經由入口流 槽或是貯存 動。 本發明 動切換閥。 阻供應系統 顯著的好處 個入口以使 沿著内側壁 或儲存槽中 阻沿著儲存 入儲存槽或 器的内壁流 係在真空或負壓光阻供應系統中, 光阻沿著光阻貯存器的内側壁流 流動的話,係能夠避免光阻經内管 。本發明的光阻供應系統係包含一 槽或是貯存器的内壁流動。當光阻 是貯存器,光阻係平滑的沿著儲存 動,以避免光阻的過度混合與攪 之一個附加的好處係於較佳實施例中使用瓶自 瓶自動切換閥係能夠連結至兩個或是以上的光 而使得當其中一個供應源被抽空,其他供應源& 8243 twf1.ptc Page 9 1284349 Case No. 91135006 曰 Amendment 5, Invention Description (5) A device connected to the ingredient reservoir 2 storage tank is introduced into the second reservoir or the second reservoir in a preferred embodiment The inner wall of the second reservoir and the present invention have a plurality of points: vacuum or negative pressure light causes the photoresist to flow through the system, and will be able to eliminate the contamination of the photoresist generated by the conventional supply of other gases or media. It is taken over by the source of microbubbles. , its device. In the light, the excellent resistance of the light is used to remove the micro-resistance of the photoresist system, and the medium-light and the first-class light resistance are incorporated into this point. Should be supplied in the medium, bubble. And the increase in the resistance of the resistance system into the 酉 酉 各自 各自 各自 各自 各自 各自 各自 各自 各自 各自 各自 由于 由于 由于 由于 由于 由于 由于 由于 由于 由于 由于 由于 由于 由于 由于 由于 由于 由于 由于 由于 由于 由于 由于 由于 由于 由于 由于 由于 由于 由于 由于During the contact of the reservoir, the vacuum is significantly higher in the other pressurization process and the scraping yield is better by the first storage 〇 first reservoir and the superior or negative pressure to the system, so the nitrogen as well as the microbubbles will be traced. The invention is provided with a reduction in manufacturing. The photoresist is allowed to fall into the reservoir inlet to allow light to pass through the inlet channel or to store. The present invention is a dynamic switching valve. Significant benefits of the resistance supply system are such that the flow along the inner sidewall or the storage tank is stored in the vacuum or negative pressure photoresist supply system along the inner wall of the storage tank or the device, and the photoresist is along the photoresist reservoir. If the inner side wall flows, it is possible to prevent the light from passing through the inner tube. The photoresist supply system of the present invention comprises a tank or an inner wall of the reservoir. When the photoresist is a reservoir, the photoresist is smoothly moved along the storage to avoid over-mixing and stirring of the photoresist. An additional benefit is that in the preferred embodiment, the bottle-to-bottle automatic switching valve system can be coupled to two Light or more, such that when one of the sources is evacuated, other sources
8243twf1.ptc 第10頁 1284349 案號 91135006 曰 修正 五、發明說明(6) 係自動被接上以保持系統的操作連續不中斷。藉由保持穩 定的供應光阻,則能夠避免在切換空氣、氮氣或是其他氣 體或媒體進入系統時,所可能產生的系統潔淨需求。 為讓本發明之上述和其他目的、特徵、和優點能更明 顯易懂,下文特舉較佳實施例,並配合所附圖式,作詳細 說明如下: 實施方法 本發明之光阻供應系統的數個較佳實施例將被描述如 下。在一較佳實施例中,一個供應系統係包括一個負壓供 應系統以及一個具有入口設計特徵的光阻貯存器以避免光 阻供應系統產生微泡。為了使本發明能夠被通盤的瞭解, 係對具體細節更進一步描述如下。然而,必須瞭解的是熟 悉此技藝者係能夠在缺少部分或是全部具體細節的情形下 實施本發明。於其他實例中,對於公知的技術將不做詳細 描述以避免與本發明產生不必要的混淆。 第1圖所繪示為依據本發明一較佳實施例之光阻供應 系統的概示圖。如第1圖所示,第一儲存瓶1 1 0係經由第一 入口導管1 1 4供應至第一貯存器1 1 2。第二儲存瓶1 1 6係經 由第二入口導管120供應至第二貯存器118。第一真空泵 1 2 2係連結於第一貯存器1 1 2,並且第二真空泵1 2 4係連結 於第二貯存器1 1 8。於圖式說明的較佳實施例中,光阻供 應系統包含兩個個別具有真空泵1 2 2、1 2 4的真空系統,並 個別連接至兩個貯存器1 1 2、1 1 8以維持光阻的持續供應。8243twf1.ptc Page 10 1284349 Case No. 91135006 修正 Amendment 5. The invention description (6) is automatically connected to keep the operation of the system uninterrupted. By maintaining a stable supply of photoresist, it is possible to avoid the system cleanup requirements that may arise when switching air, nitrogen or other gases or media into the system. The above and other objects, features, and advantages of the present invention will become more apparent and understood. Several preferred embodiments will be described below. In a preferred embodiment, a supply system includes a negative pressure supply system and a photoresist reservoir having inlet design features to prevent microbubbles from being generated by the photoresist supply system. In order to enable the invention to be fully understood, the specific details are further described below. However, it must be understood that those skilled in the art can implement the invention in the absence of some or all of the specific details. In other instances, well-known techniques are not described in detail to avoid unnecessarily obscuring the invention. Figure 1 is a schematic diagram of a photoresist supply system in accordance with a preferred embodiment of the present invention. As shown in Fig. 1, the first storage bottle 110 is supplied to the first reservoir 1 1 2 via the first inlet conduit 1 1 4 . The second storage bottle 1 16 is supplied to the second reservoir 118 via the second inlet conduit 120. The first vacuum pump 1 2 2 is coupled to the first reservoir 1 1 2, and the second vacuum pump 1 2 4 is coupled to the second reservoir 1 18 . In the preferred embodiment illustrated in the drawings, the photoresist supply system comprises two vacuum systems each having a vacuum pump 1 2 2, 1 2 4 and individually connected to two reservoirs 1 1 2, 1 1 8 to maintain light. Continued supply of resistance.
8243twf1.ptc 第11頁 1284349 案號 91135006 曰 修正 五、發明說明(7) 在其他的較佳實施例,光阻供應系統係依照系統的需求, 包含具有一個真空泵的一個真空系統,並連結於一個或是 更多個貯存器,或具有一個以上真空泵的複數個真空系統 連結於複數個貯存器,亦或是將其任意組合以供應光阻。 第1圖中的光阻供應系統1 〇 〇包含一個瓶自動切換閥 1 2 6,以控制從第一貯存器1 1 2或第二貯存器1 1 8的其中之 一選擇光阻,用以維持光阻的持續供應。在其他較佳實施 例中,瓶自動切換閥1 2 6係配置為相符於併入光阻供應系 統中的多個貯存器。在另一較佳實施例中,複數的瓶自動 切換閥係被包含於光阻供應系統,以控制由包含於光阻供 應系統中的多個貯存器中選擇光阻。 配料入口導管1 2 8係由所選擇的貯存器1 1 2、1 1 8供應 至配料貯存器1 3 0。配料貯存器真空泵1 3 3係於配料貯存器 1 3 0產生一個負壓,以使光阻由所選擇的貯存器1 1 2、1 1 8 流入配料貯存為1 3 0。 在一較佳實施例中,一個系統控制器(未繪示)係用以 控制光阻的供應以及當貯存器1 1 2、1 1 8中的光阻到達一預 定水平時,自動決定選擇並由貯存器1 1 2、1 1 8其中之一切 換至貯存器1 1 2、1 1 8的其中另一個。在一較佳實施例中, 當貯存器1 1 2、1 1 8中的光阻到達一預定水平時,則提供警 示給操作員並及時手動致能瓶自動切換閥1 2 6,或建議系 統致能瓶自動切換閥1 2 6。 在圖式說明的較佳實施例中,在配料貯存器1 3 0的光 阻係被配料泵1 3 2經由配料喷嘴1 3 4供應至晶圓或是碟片表8243twf1.ptc Page 11 1284349 Case No. 91135006 曰Revision 5. Invention Description (7) In other preferred embodiments, the photoresist supply system includes a vacuum system having a vacuum pump and is coupled to one according to the requirements of the system. Or more reservoirs, or multiple vacuum systems with more than one vacuum pump connected to a plurality of reservoirs, or any combination thereof to supply photoresist. The photoresist supply system 1 in FIG. 1 includes a bottle automatic switching valve 126 to control the selection of photoresist from one of the first reservoir 1 1 2 or the second reservoir 1 18 for Maintain a continuous supply of photoresist. In other preferred embodiments, the automatic bottle switching valve 1 26 is configured to conform to a plurality of reservoirs incorporated into the photoresist supply system. In another preferred embodiment, a plurality of automatic bottle switching valves are included in the photoresist supply system to control the selection of photoresist from a plurality of reservoirs included in the photoresist supply system. The ingredient inlet conduit 1 2 8 is supplied to the ingredient reservoir 130 by the selected reservoirs 1 1 2, 1 1 8 . The ingredient reservoir vacuum pump 1 3 3 is tied to the ingredient reservoir 1 3 0 to generate a negative pressure so that the photoresist is stored in the batch from the selected reservoir 1 1 2, 1 1 8 to 1 300. In a preferred embodiment, a system controller (not shown) is used to control the supply of photoresist and automatically determine the selection when the photoresist in the reservoirs 1 1 2, 1 18 reaches a predetermined level. Switching from one of the reservoirs 1 1 2, 1 1 8 to the other of the reservoirs 1 1 2, 1 1 8 . In a preferred embodiment, when the photoresist in the reservoirs 1 1 2, 1 18 reaches a predetermined level, an alert is provided to the operator and the bottle automatic switching valve 1 2 6 is manually activated in time or the system is suggested. Enable the automatic switching valve 1 2 6 . In the preferred embodiment illustrated in the drawings, the photoresist system in the ingredient reservoir 130 is supplied to the wafer or disc table by the dosing pump 134 via the dispensing nozzle 134.
8243twf1.ptc 第12頁 1284349 案號91135006 年月日 修正8243twf1.ptc Page 12 1284349 Case No. 91135006
8 /IV 阻 光 的 例 施 實 佳 較一 明 發 本 示 所 圖 11 第 如 ο 示 明繪 說k 明未 、·面 五 含 包 統 系 應 供 器 存 貯 個 兩 統, 系8 阻11 光、 個2 瓶 存 儲 個 兩 有 具 其 應 對 別 個 個 兩 有 具 少 至 及 以 11貯 1 一 槽一。 存第8 貯於11 至結器 器 存 瓶 個 一續 f /fc 12第持 泵於的 空結阻 真連光 一係持 第4維 2 中1以 其趴用 ,空係 充真6 二 2 系 1 第閥 空 · I 且換 真i彳 ,切 的 1 5 2動 -\gc 係 存 貯流 器 存 貯 料 配 至 流 以 統 系η 應3 供泵 由空 係真 阻三 光第 後個 然一 應 供 阻 光 於 含 包 被 係 持 維?喷 貯 並彳料 生:I配 酉 . 產V經 ο A 3流、> 1—- ο 器183 11 1 存>1器 貯2存 料11貯 配器料 器 3 於 以 統 系 個 存配 貯由 由而 阻吸 光抽 使泵 驅由 並經 ,阻 壓光 面 表 片 碟 或 圓 晶 至 料 配 以 上 應 供 以 統 系 應 供 負 個一 供 提 係 例 施 實 佳 較一 明 發 本 染係的 污泡中 無微統 須的系 必中應 阻料供 光材阻 ,阻光 述光, 上 ,中 同論例 如討施 。所實 料中佳 材明較 似發明 類本發 他如本 其。在 或料。 阻配物 光續染 料持污 配的為 與物視 ,中 是阻 的光 同致 不導 統而 系壓 應施 供向 阻正 光氣 的氮 知用 習使 與係 ο ΙΦΙ 除統 消系 被應 會供 係阻 生光 產在 泡知 微習 光 取 吸 以 壓 負 用 使。 係統 中系 例應 施供 實阻 佳光 45— 、i 明通 發動 本流 在阻 ,光 泡使 微並 生, 產阻 中2 T 1-* 例泵 施空 實真 佳用 較使 一中 明統 發系 本應 在供 阻 光 在 由 藉 係 源 染 污 個 1 中 其 第 〇 除 消 被 而 果壓 空負 真生 一產 第 於 結 >gc 係 泵 空 真 - 第 器第 存使 貯係 於 並 器 存 貯 2的 2 1足 器充 存生 貯產The example of 8 / IV light blocking is better than the one shown in Figure 11. The first picture shows that the figure is not clear, the surface of the five-package system is stored in a system, and the system is 8 Light, a 2 bottle storage two have their own response to each of the two have a small to 11 storage and 1 slot. Save the 8th storage in the 11th to the device storage bottle one continuous f / fc 12 The first holding of the pump in the air junction is really connected to the light of the 4th dimension 2 in 1 for its use, the air system is full 6 2 2 Line 1 valve air · I and change the true 彳, cut 1 5 2 move - \ gc storage device storage material is assigned to the flow to the system η should be 3 for the pump by the air system true resistance three light the second Should one be used to block light in the containment system? Spraying and sputum production: I with 酉. Production V by ο A 3 flow, > 1 - ο 183 11 1 storage > 1 storage 2 storage material 11 storage device hopper 3 The storage is blocked by the light, and the pump is driven by the pump. The pressure-resisting surface of the disc or the round crystal to the material should be supplied to the system for the supply of the system. In the stains of the dyeing system, there is no need for micro-systems to be blocked by the light-blocking material, and the light is blocked, and the above-mentioned theory is discussed. In the actual material, it is better than the invention. In or. The resistance of the dyes in the dyes is the same as that of the matter, the light in the middle is the same as the light, and the pressure is applied to the nitrogen of the phosgene. ο Ι Ι Ι 统 Ι It should be used to block the light and produce light in the bubble. In the system, the system should be applied with a real resistance of good light 45—i, i Mingtong starts the flow in the resistance, the light bubble makes the micro-concurrence, and the production resistance is 2 T 1-* The pump is empty and the real use is better. The system of hairdressing should be used to block light in the first source of the soil by the source of the source, and the fruit is empty. 2 1 foot device attached to the parallel storage 2
8243twf1.ptc 第13頁 1284349 銮號 91135006 曰 修正 五、發明說明(9) 負壓,以吸取光阻由第一儲存瓶出口 1 1 1流出第一儲存瓶 110,並經由第一入口導管114流入第一貯存器112。於一 較佳實施例中’產生的負壓係足以吸取光阻由第一儲存瓶 1 1 0流出並流入第一貯存器1 1 2,然而負壓並不會過強以避 免光阻由第一貯存器出口 1 1 5流出第一貯存器1 1 2。因此, 光阻係能經由第一貯存器出口 1 1 5流出第一貯存器1 1 2,並 流經瓶自動切換閥1 2 6、配料入口導管1 2 8以流入配料貯存 器 130。 同樣地,第二真空泵1 2 4係使第二貯存器1 1 8產生負 壓。第二貯存器1 1 8中的負壓係吸取光阻由第二儲存瓶出 口 1 2 3流出第二儲存瓶1 1 6,並經由第二入口導管1 2 0流入 第二貯存器1 1 8。第二真空泵1 2 4係使第二貯存器1 1 8產生 充足的負壓,以吸取光阻由第二儲存瓶出口123流出第二 儲存瓶1 1 6 ’並經由第二入口導管1 2 0流入第二貯存器 1 1 8。然而負壓並不會過強以避免光阻由第二貯存器出口 1 2 5流出第二貯存器1 1 8。因此,光阻係能夠經由第二貯存 裔出口 1 2 5流出第二貯存器1 1 8,並流經瓶自動切換閥 1 2 6、配料入口導管丨2 8以流入配料貯存器丨3 〇。 # 第二真空泵13 3係連結於配料貯存器1 3 〇以於配 吸ί 10屮產产負壓。於配料貯存器1 30所產生的負壓係 1 2Θ、配料入口道: 1 1 8,並流經瓶自動切換閥 於苴導官1 2 8以流入配料貯存器1 3 0。 泵係使用於_柄實%例中,根據系統的需要,單一的真空 、個或是一個以上的貯存器。亦或是複數的真8243twf1.ptc Page 13 1284349 Nickname 91135006 曰 Amendment 5, invention description (9) Negative pressure to draw light from the first storage bottle outlet 1 1 1 out of the first storage bottle 110 and flow through the first inlet conduit 114 The first reservoir 112. In a preferred embodiment, the resulting negative pressure system is sufficient to draw light from the first storage bottle 110 and flow into the first reservoir 1 1 2, but the negative pressure is not too strong to prevent the photoresist from being A reservoir outlet 1 1 5 flows out of the first reservoir 1 1 2 . Accordingly, the photoresist system can flow out of the first reservoir 1 1 2 via the first reservoir outlet 1 15 and through the vial automatic switching valve 1 2 6 and the dosing inlet conduit 1 2 8 to flow into the ingredient reservoir 130. Similarly, the second vacuum pump 1 2 4 causes the second reservoir 1 18 to generate a negative pressure. The negative pressure sucking photoresist in the second reservoir 1 1 8 flows out of the second storage bottle 1 16 from the second storage bottle outlet 1 2 3 and flows into the second storage 1 1 8 via the second inlet conduit 1 2 0 . The second vacuum pump 1 2 4 causes the second reservoir 1 18 to generate sufficient negative pressure to draw the photoresist from the second storage bottle outlet 123 out of the second storage bottle 1 16 ' and via the second inlet conduit 1 2 0 Flowing into the second reservoir 1 18 . However, the negative pressure is not too strong to prevent the photoresist from flowing out of the second reservoir 1 18 from the second reservoir outlet 1 2 5 . Thus, the photoresist system can flow out of the second reservoir 1 1 8 via the second reservoir outlet 1 2 5 and through the vial automatic switching valve 1 2 6 and the ingredient inlet conduit 丨28 to flow into the ingredient reservoir 丨3 〇. #第二真空泵13 3 is connected to the ingredient reservoir 1 3 〇 to dispense ί 10 屮 production negative pressure. The negative pressure system 1 2 产生 produced by the ingredient reservoir 1 30, the ingredient inlet channel: 1 18, and flows through the bottle automatic switching valve to the 苴 guide 1 2 8 to flow into the ingredient reservoir 130. The pump system is used in the % handle case, depending on the needs of the system, a single vacuum, one or more reservoirs. Or the plural
第14頁 1284349 修Page 14 1284349 repair
------案號9113500fi_年月曰 五、發明說明(10) 空果係用於複數的貯存器而包含於大型的光阻供廉 、 此真空或負壓系統係在不導入使光阻產生微5 ^,二 或其他氣體的情況下,使光阻由儲存裝置流至配料^氣 瓶自動切換裝置1 2 6係用以在儲存容器耗盡時%拄止' ° 符、’供應。此外,藉由消除糸統運轉中補充光阻的干, 以及消除在對換光阻供應時的系統清洗操作,使得舰自動 切換裝置1 2 6係能夠維持系統的正常運轉時間,因而能夠 增進產率,並且更經濟且有效率的利用系統。瓶自動&切換 閥1 2 6係可以連接至一個以上的複數供應源入口 ,且此此、 複數供應源入口係個別連接至複數的光阻貯存器,並提供 一個或多個的閥出口並流經一個或多個的配料入口導管 1 2 8,以流入一個或多個的配料貯存器丨3 0。瓶自動切換閥 1 2 6係選擇一個以上的供應源入口,以使流體經過瓶自動 切換閥1 2 6流至閥出口。 除了加壓的氮氣會形成微泡之外,習知的光阻供應系 統亦會在光阻進入貯存器1 1 2、1 1 8、1 3 0其中之一的場合 產生微泡。在本發明一較佳實施例中,個別的入口導管 1 1 4、1 2 0、1 2 8係使光阻對應流入貯存器1 1 2、1 1 8、1 3 〇, 其中入口導管1 1 4、1 2 0、1 2 8係使光阻流經入口導管1 ! 4、 1 2 0、1 2 8,然後沿著貯存器1 1 2、1 1 8、1 3 0的内側壁流 動。在一較佳實施例中,入口導管1 1 4、1 2 0、1 2 8係使流 出入口導管1 1 4、1 2 0、1 2 8的光阻,係沿著貯存器i i 2、爪 1 1 8、1 3 0的内側壁流動。 的 第2 A圖所緣示為依據本發明一較佳實施例之貯存琴------ Case No. 9113500fi_年月五五, invention description (10) Empty fruit is used for multiple reservoirs and is included in large-scale photoresist supply, this vacuum or vacuum system is not imported In the case where the photoresist generates micro 5 ^, two or other gases, the photoresist is caused to flow from the storage device to the batching device. The automatic switching device of the gas cylinder 1 2 6 is used to stop the '° character, ' when the storage container is exhausted. supply. In addition, by eliminating the dryness of the photoresist during the operation of the system and eliminating the system cleaning operation when the light resistance is supplied, the automatic switching device 1 2 6 can maintain the normal running time of the system, thereby improving production. Rate, and use the system more economically and efficiently. The bottle automatic & switching valve 1 26 can be connected to more than one of the plurality of supply inlets, and wherein the plurality of supply inlets are individually connected to the plurality of photoresist reservoirs and provide one or more valve outlets and Flow through one or more of the ingredient inlet conduits 128 to flow into one or more ingredient reservoirs 丨30. Automatic Bottle Switching Valves 1 2 6 Select more than one source inlet to allow fluid to flow through the bottle automatic switching valve 1 2 6 to the valve outlet. In addition to the formation of microbubbles by pressurized nitrogen, conventional photoresist supply systems also generate microbubbles where the photoresist enters one of the reservoirs 1 1 2, 1 18, and 130. In a preferred embodiment of the invention, the individual inlet conduits 1 1 4, 1 2 0, 1 2 8 are configured to cause the photoresist to flow into the reservoir 1 1 2, 1 18, 1 3 〇, wherein the inlet conduit 1 1 4. 1 2 0, 1 2 8 causes the photoresist to flow through the inlet conduits 1 ! 4, 1 2 0, 1 2 8 and then along the inner sidewalls of the reservoirs 1 1 2, 1 18, 1 30. In a preferred embodiment, the inlet conduits 1 1 4, 1 2 0, 1 2 8 are such that the photoresist exiting the inlet conduits 1 1 4, 1 2 0, 1 2 8 is along the reservoir ii 2 The inner side wall of 1 1 8 and 1 30 is flowing. Figure 2A shows the storage of a piano in accordance with a preferred embodiment of the present invention.
8243twfl.ptc 第15頁 1284349 ___案號91135006_年月 日 鉻,下_ 五、發明說明(11) 細部示意圖。需注意的是第一貯存器1 1 2係與第二貯存器 1 1 8相同(請參照第1圖),並以第一貯存器丨丨2圖示說明本 發明的特徵。除非是另外的指明,每一相關於第一貯存器 1 1 2的特徵描述亦同樣的適用於第二貯存器丨丨8,並且適用 於本發明其他實施例中所包含之任何標號的貯存器。 第2A圖所示的第一貯存器112係包含入口導管114、真 空入口導管113、出口導管115與内壁面117。真空入口導、 管1 1 3係連接至第一真空泵丨2 2 (請參照第1圖),且真空泵 I 2 2係於第一貯存器1 1 2產生真空。入口導管1 1 4係使流出 入口導管1 1 4的光阻於位置1 1 9接觸内側壁1 1 7,然後沿著 内側壁1 1 7流動。與習知的光阻供應系統不同的是,習知 系統係置於通常是由氮氣所形成的正壓下,然後使光阻藉春 由簡單的重力從入口落下至貯存器底部,而在本發明一較 佳實,例中,入口導管丨丨4係使流出入口導管丨丨4的光阻將 會沿著第一貯存器1 1 2的内側壁1 1 7流動。在一較佳實施例 , 中’光阻係於位置1 1 9接觸内側壁11 7。 、當光阻流經入口導管1 1 4,光阻將會到達第一貯存器 112並沿著内側壁117以聚集於第一貯存器112中。第2β圖 不為第2A圖的第一貯存器112,其中光阻121係依據本 又曰 較佳實施例聚集於第一貯存器1 1 2内的詳細示意 圖。、、^ 口導管114的配置位置係使光阻1 2 1能夠沿著内1則壁 II 7#流動而消除微泡的形成源。而且,既然光阻不會單純 2 聚集中之光阻121,因而能夠避免光阻121之多餘的馨 攪捽與混合且避免微泡的產生。此外,在一較佳實施例8243twfl.ptc Page 15 1284349 ___ Case No. 91135006_Year Month Day Chromium, Next _ V. Invention Description (11) Detailed diagram. It is to be noted that the first reservoir 1 1 2 is identical to the second reservoir 1 18 (please refer to Fig. 1), and the features of the present invention are illustrated by the first reservoir 丨丨2. Unless otherwise indicated, each characterization relating to the first reservoir 112 is equally applicable to the second reservoir 丨丨8 and is applicable to any number of reservoirs included in other embodiments of the invention. . The first reservoir 112 shown in Fig. 2A includes an inlet duct 114, a vacuum inlet duct 113, an outlet duct 115, and an inner wall surface 117. The vacuum inlet guide tube 1 1 3 is connected to the first vacuum pump 丨 2 2 (please refer to Fig. 1), and the vacuum pump I 2 2 is vacuumed by the first reservoir 1 1 2 . The inlet duct 1 1 4 is such that the light exiting the inlet duct 1 1 4 contacts the inner side wall 1 1 7 at the position 1 1 9 and then flows along the inner side wall 1 17 . Unlike conventional photoresist supply systems, conventional systems are placed under a positive pressure, usually formed by nitrogen, and then the photoresist is dropped from the inlet to the bottom of the reservoir by simple gravity. In a preferred embodiment, the inlet conduit 4 is such that the photoresist exiting the inlet conduit 4 will flow along the inner sidewall 117 of the first reservoir 112. In a preferred embodiment, the ' photoresist is in contact with the inner sidewall 11 7 at position 1 1 9 . When the photoresist flows through the inlet conduit 1 14 , the photoresist will reach the first reservoir 112 and along the inner sidewall 117 to collect in the first reservoir 112. The second ? map is not the first reservoir 112 of Fig. 2A, wherein the photoresist 121 is a detailed schematic view of the first reservoir 1 1 2 in accordance with the preferred embodiment of the present invention. The position of the nozzle 114 is such that the photoresist 1 2 1 can flow along the inner wall II 7# to eliminate the formation source of the microbubbles. Moreover, since the photoresist does not simply converge the photoresist 121, it is possible to avoid unnecessary entanglement and mixing of the photoresist 121 and to avoid generation of microbubbles. Moreover, in a preferred embodiment
1284349 案號 91135006 曰 修正 五、發明說明(12) 中,入口導管1 1 4的設置位置係高於第一貯存器1 1 2中所聚 集之光阻的液面。 請再參照第1圖,在本發明一較佳實施例中,配料貯 存器130同樣包含配料入口導管128,並將配料入口導管 1 2 8配置為使流出配料入口導管1 2 8的光阻係接觸内側壁, 然後沿著内側壁流動並聚集於配料貯存器1 3 0中。個別裝 配於第一貯存器1 1 2、第二貯存器11 8與配料貯存器1 3 0的 入口導管,係能夠在光阻供應系統之個別的區域中避免微 泡的產生。在本發明一較佳實施例中,藉由結合真空或負 壓以及貯存器入口接觸位置而能夠消除光阻供應系統中微 泡的產生。如第1、2 A、2 Β圖所示,本發明一較佳實施例 係包含一個光阻供應系統,其中光阻供應系統係包含兩個 真空或負壓系統,且每一負壓系統係具有一貯存器並連接 至一儲存瓶。一真空泵係連接至貯存器用以在貯存器中產 生真空或負壓。此真空或負壓係能夠吸取光阻,以使光阻 在不產生氣泡的情形下由儲存瓶進入貯存器。同樣地,於 配料貯存器中的真空或負壓係使光阻由所選擇的貯存器流 經瓶自動切換閥並流入配料貯存器。然後光阻係由配料貯 存器被泵至配料喷嘴以用於光阻或是其他阻劑塗佈操作。 所提供之瓶自動切換閥係能在不干擾系統運轉下,無缝隙 的對換供應的貯存器。在另外的較佳實施例中,一個或是 更多的真空系統係被裝配至一個或是更多的貯存器,且貯 存器係依序連接至一個或是更多的儲存瓶。 雖然本發明已以一較佳實施例揭露如上,然其並非用1284349 Case No. 91135006 修正 Amendment 5. In the invention description (12), the inlet conduit 1 14 is disposed at a higher position than the liquid level of the photoresist accumulated in the first reservoir 112. Referring again to Figure 1, in a preferred embodiment of the invention, the ingredient reservoir 130 also includes a ingredient inlet conduit 128 and the ingredient inlet conduit 1 28 is configured to cause the photoresist system to exit the ingredient inlet conduit 1 28 The inner side wall is contacted and then flows along the inner side wall and collects in the ingredient reservoir 130. Inlet conduits that are individually assembled to the first reservoir 1 1 2, the second reservoir 11 8 and the ingredient reservoir 130 are capable of avoiding the generation of microbubbles in individual regions of the photoresist supply system. In a preferred embodiment of the invention, the generation of microbubbles in the photoresist supply system can be eliminated by combining vacuum or negative pressure and reservoir inlet contact locations. As shown in the first, second, and second drawings, a preferred embodiment of the present invention includes a photoresist supply system in which the photoresist supply system includes two vacuum or negative pressure systems, and each vacuum system is There is a reservoir and is connected to a storage bottle. A vacuum pump is coupled to the reservoir for creating a vacuum or negative pressure in the reservoir. This vacuum or negative pressure system is capable of drawing light to prevent the photoresist from entering the reservoir from the storage bottle without generating bubbles. Similarly, the vacuum or negative pressure in the ingredient reservoir causes the photoresist to flow from the selected reservoir through the vial automatic switching valve and into the ingredient reservoir. The photoresist is then pumped from the ingredient reservoir to the dispensing nozzle for photoresist or other resist coating operations. The supplied automatic bottle switching valve is capable of seamlessly changing the supply of the reservoir without disturbing the operation of the system. In another preferred embodiment, one or more vacuum systems are assembled to one or more reservoirs, and the reservoirs are sequentially coupled to one or more storage bottles. Although the present invention has been disclosed above in a preferred embodiment, it is not
8243twf1.ptc 第17頁 12843498243twf1.ptc Page 17 1284349
8243twf1.ptc 第18頁 1284349 案號 91135006 _η 曰 修正 圖式簡單說明 圖式係包含於本發明並構成本發明的一部份,且圖式 係用以說明本發明之較佳實施例,並結合說明書以解釋本 發明的原理。 第1圖所繪示為依據本發明一較佳實施例之光阻供應 系統的概示圖。 第2 Α圖所繪示為依據本發明一較佳實施例之貯存器的 細部示意圖。 第2 B圖所繪示為第2 A圖的貯存器,依據本發明一較佳 實施例之光阻流入的不意圖。 圖式標示說明: 1 0 0 :光阻供應系統 1 1 0、1 1 6 :儲存瓶 111、123 :儲存瓶出口 1 1 2、1 1 8 :貯存器 1 1 3 :真空泵入口 1 14、120 :入口導管 1 1 5、1 2 5 :貯存器出口 1 1 7 :貯存器内側壁 1 1 9 :位置 1 2 1 :光阻 122、124、133 :真空泵 1 2 6 :瓶自動交換閥 1 2 8 :配料入口導管 1 3 0 :配料貯存器8243 twf1.ptc Page 18 1284349 Case No. 91135006 _η 曰Revisional drawings The following is a part of the present invention and is intended to illustrate a preferred embodiment of the invention, and The description explains the principles of the invention. Figure 1 is a schematic diagram of a photoresist supply system in accordance with a preferred embodiment of the present invention. Figure 2 is a schematic view showing a detail of a reservoir in accordance with a preferred embodiment of the present invention. Fig. 2B is a view showing the reservoir of Fig. 2A, which is not intended to flow in accordance with a preferred embodiment of the present invention. Schematic indication: 1 0 0 : Photoresist supply system 1 1 0, 1 1 6 : Storage bottle 111, 123: Storage bottle outlet 1 1 2, 1 1 8 : Reservoir 1 1 3 : Vacuum pump inlet 1 14 , 120 : inlet conduit 1 1 5, 1 2 5 : reservoir outlet 1 1 7 : reservoir inner side wall 1 1 9 : position 1 2 1 : photoresist 122, 124, 133: vacuum pump 1 2 6 : bottle automatic exchange valve 1 2 8: ingredient inlet conduit 1 3 0 : ingredient reservoir
8243twf1.ptc 第19頁 1284349 案號91135006_年月日_修正 圖式簡單說明 1 3 2 ·配料豕 1 3 4 :配料喷嘴 iiii 8243twf1.ptc 第20頁8243twf1.ptc Page 19 1284349 Case No. 91135006_Year of the month _ Correction Simple description of the diagram 1 3 2 ·Ingredients 豕 1 3 4 : Dosing nozzle iiii 8243twf1.ptc Page 20
Claims (1)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW91135006A TWI284349B (en) | 2002-12-03 | 2002-12-03 | System and method for supplying photoresist |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW91135006A TWI284349B (en) | 2002-12-03 | 2002-12-03 | System and method for supplying photoresist |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200410291A TW200410291A (en) | 2004-06-16 |
| TWI284349B true TWI284349B (en) | 2007-07-21 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW91135006A TWI284349B (en) | 2002-12-03 | 2002-12-03 | System and method for supplying photoresist |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI284349B (en) |
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2002
- 2002-12-03 TW TW91135006A patent/TWI284349B/en not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| TW200410291A (en) | 2004-06-16 |
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| MK4A | Expiration of patent term of an invention patent |