TWI283938B - Organic electroluminescent devices and fabrication methods thereof - Google Patents
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- 238000004519 manufacturing process Methods 0.000 title claims description 4
- 238000000034 method Methods 0.000 title description 6
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- 239000000758 substrate Substances 0.000 claims abstract description 18
- 239000010410 layer Substances 0.000 claims description 168
- 230000005284 excitation Effects 0.000 claims description 14
- 238000005401 electroluminescence Methods 0.000 claims description 9
- 229910052732 germanium Inorganic materials 0.000 claims description 7
- 239000011241 protective layer Substances 0.000 claims description 7
- 230000003287 optical effect Effects 0.000 claims 2
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 claims 1
- 239000000344 soap Substances 0.000 claims 1
- 238000005286 illumination Methods 0.000 abstract description 4
- MZLGASXMSKOWSE-UHFFFAOYSA-N tantalum nitride Chemical compound [Ta]#N MZLGASXMSKOWSE-UHFFFAOYSA-N 0.000 description 12
- 150000002367 halogens Chemical group 0.000 description 11
- 239000000463 material Substances 0.000 description 10
- VGRFVJMYCCLWPQ-UHFFFAOYSA-N germanium Chemical compound [Ge].[Ge] VGRFVJMYCCLWPQ-UHFFFAOYSA-N 0.000 description 7
- 229920002120 photoresistant polymer Polymers 0.000 description 7
- 229910052736 halogen Inorganic materials 0.000 description 6
- 229910052751 metal Inorganic materials 0.000 description 6
- 239000002184 metal Substances 0.000 description 6
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 description 5
- 229910001936 tantalum oxide Inorganic materials 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 229910052735 hafnium Inorganic materials 0.000 description 4
- VBJZVLUMGGDVMO-UHFFFAOYSA-N hafnium atom Chemical compound [Hf] VBJZVLUMGGDVMO-UHFFFAOYSA-N 0.000 description 4
- 239000003989 dielectric material Substances 0.000 description 3
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- SIWVEOZUMHYXCS-UHFFFAOYSA-N oxo(oxoyttriooxy)yttrium Chemical compound O=[Y]O[Y]=O SIWVEOZUMHYXCS-UHFFFAOYSA-N 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- RGCKGOZRHPZPFP-UHFFFAOYSA-N alizarin Chemical compound C1=CC=C2C(=O)C3=C(O)C(O)=CC=C3C(=O)C2=C1 RGCKGOZRHPZPFP-UHFFFAOYSA-N 0.000 description 2
- 239000002019 doping agent Substances 0.000 description 2
- 230000005283 ground state Effects 0.000 description 2
- 239000007943 implant Substances 0.000 description 2
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
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- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 2
- 229920005591 polysilicon Polymers 0.000 description 2
- 229910000951 Aluminide Inorganic materials 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 229910000577 Silicon-germanium Inorganic materials 0.000 description 1
- 239000004964 aerogel Substances 0.000 description 1
- 235000019169 all-trans-retinol Nutrition 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
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- 238000005516 engineering process Methods 0.000 description 1
- 239000010436 fluorite Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000005525 hole transport Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- QLOAVXSYZAJECW-UHFFFAOYSA-N methane;molecular fluorine Chemical compound C.FF QLOAVXSYZAJECW-UHFFFAOYSA-N 0.000 description 1
- SYHGEUNFJIGTRX-UHFFFAOYSA-N methylenedioxypyrovalerone Chemical compound C=1C=C2OCOC2=CC=1C(=O)C(CCC)N1CCCC1 SYHGEUNFJIGTRX-UHFFFAOYSA-N 0.000 description 1
- NFFIWVVINABMKP-UHFFFAOYSA-N methylidynetantalum Chemical compound [Ta]#C NFFIWVVINABMKP-UHFFFAOYSA-N 0.000 description 1
- 239000012044 organic layer Substances 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
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- 239000002861 polymer material Substances 0.000 description 1
- 230000035484 reaction time Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 230000035807 sensation Effects 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 150000003384 small molecules Chemical class 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910003468 tantalcarbide Inorganic materials 0.000 description 1
- XSOKHXFFCGXDJZ-UHFFFAOYSA-N telluride(2-) Chemical compound [Te-2] XSOKHXFFCGXDJZ-UHFFFAOYSA-N 0.000 description 1
- RUDFQVOCFDJEEF-UHFFFAOYSA-N yttrium(III) oxide Inorganic materials [O-2].[O-2].[O-2].[Y+3].[Y+3] RUDFQVOCFDJEEF-UHFFFAOYSA-N 0.000 description 1
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Abstract
Description
1283938 •九、發明說明: 【發明所屬之技術領域】 本發明係有關於一種顯示元件,特別是有關有機電 激發光顯示元件及其製造方法。 【先前技術】 有機電激發光顯示器(organic electroluminescent devices)(又稱為有機發光二極體(organic light emitting 鲁diode,OLED)顯示器)其發光原理係在有機分子材料(依 分子量大小可分為小分子材料(small molecule material) 及聚合物材料(polymer material))施加一外加電場使其產 生發光現象。有機電激發光顯示器(organic electroluminescent devices)因其為自發光性(self emission) 元件’可陣列式顯示(dot matrix type display),具有輕 薄、高對比、低消耗功率、高解析度、反應時間短(fast _ response time)、不需背光源及廣視角等特性,且其面板 尺寸可由4mm微型顯示器至1〇〇吋之大型戶外看板顯示 裔’被視為下一世代之平面面板顯示器(fjat panei display, FPD)。除了顯示器之應用外,由於有機電激發光元件更 可在輕薄、可撓曲之材質上形成陣列式結構,使其在應 用上更加的廣泛,尤其是非常適合應用於照明。一般預 估有機電激發光元件其發光效率若能提昇至1〇〇Lm/w以 上,有機電激發光顯示器裝置即有機會取代一般照明光 源。 請參照第1圖,一開關電晶體1〇2控制一有機電激 0773-A31696TWF;P93079;wayne 6 1283938 發光单元1 06,且_驅動^ 然而’有機電激發光顯ta%體1G4轉接到-電源線VP。 佳的問題,特料有=11面板存在有晝相均勻性不 後會產生亮度的衰退的發光顯不器在長時間操作之 【發明内容】 因此,為解決μ、+、_ 機電激發光顯示器面的為解決有 更之::r ♦使得有機電激發光= _ f月^、-種有機電激發光顯示^件。在一金辛 和-驅動元件位於控制區上 ^件 匕上 尤琢測态位於感測區 古、一有^激發光單元位於感測區上,且可操作以照 売,感測器,一電容器耦接到光感測器和驅動元件,其1283938 • NEXT DESCRIPTION OF THE INVENTION: TECHNICAL FIELD The present invention relates to a display element, and more particularly to an organic electroluminescence display element and a method of fabricating the same. [Prior Art] Organic electroluminescent devices (also known as organic light emitting diodes (OLED) displays) are based on organic molecular materials (which can be divided into small molecular weights). A small molecule material and a polymer material apply an applied electric field to cause luminescence. Organic electroluminescent devices are light matrix, high contrast, low power consumption, high resolution, and short reaction time because they are self-emission elements' dot matrix type display. (fast _ response time), no need for backlight and wide viewing angle, and its panel size can be displayed from 4mm microdisplay to 1〇〇吋 large outdoor kanban display' as the next generation flat panel display (fjat panei Display, FPD). In addition to the application of the display, the organic electroluminescent element can form an array structure on a thin and flexible material, making it more widely used in applications, especially suitable for illumination. It is generally estimated that if the luminous efficiency of the organic electroluminescent device is increased to more than 1 〇〇 Lm/w, the organic electroluminescent display device has an opportunity to replace the general illumination source. Please refer to Figure 1, a switching transistor 1〇2 controls an organic galvanic 0773-A31696TWF; P93079; wayne 6 1283938 illuminating unit 106, and _drive ^ However 'organic electric excitation light ta% body 1G4 transfer to - Power cord VP. The problem is that there is a illuminating display that has a 昼 phase uniformity that does not cause a decrease in brightness after a long period of operation. [Inventive content] Therefore, in order to solve the μ, +, _ electromechanical excitation light display For the solution, there are more::r ♦ Make organic electroluminescence = _ f month ^, - kind of organic electroluminescence display. In a Jinxin and - drive component is located on the control area, the measurement state is located in the sensing area, and the excitation light unit is located on the sensing area, and is operable to take care of the sensor, a sensor a capacitor coupled to the photosensor and the drive element,
二藉由光感測器感應到有機f激發光單元照射到光感測 器之光線,產生一對應到有機電激發光單元之光電流, 如此,藉由光電流調整電容器之電壓,以控制通過驅動 元件之電流,因此,改變有機電激發光單元之照度。 本發明提供一種有機電激發光顯示元件之製造方 法。首先,提供一包括控制區和感測區之基板。其後, 形成一主動層於基板之控制區上,形成一閘極介電層於 主動層和基板之感測區上。接下來,形成一導電層於閘 極介電層上,圖形化導電層,以於控制區形成第一和第 0773-A31696TWF;P93079; wayne 7 1283938 二閘極,且於感測區形成一第三閘極。 電層至少覆蓋第一、第二和第二 1,形成一介 主動層於感靡上之部分介則元件 元件摻雜層於感測元件主動層上,形:形成一感測 和感測元件汲極分別電性連接感剛丰f/l!l7L件源極 邊。其後’形成-有機電激發光單元二雜層之兩對 感測區上。 ;祁分之控制區和 【實施方式】 〃以下將以實施例詳細說明做為本發日月之 例係伴隨著圖示說明之。在圖示或 乾 夕都八# & 返中,相似或相同 係使用相同之圖號。在圖示中,實施例之 β度可擴大,以簡化或是方便“。圖示巾元件之部 /刀將以描述說明之。可了解的是,杨示或描述之元件, 可以具有各種熟習此技藝之人所知的形式。此外, 位於一基板或是另-層上時,此層可直接:於 基板或疋另一層上,或是其間亦可以有中介層。 在說明書中,有關,,於基板上,,(ovserlying the substrate)、,,於該層上”⑽刚如或,,於膜上”(〇讀e 跑)等的敘述係表示與當層表面的相對位置關係,其忽 略中間存在的各層’因此’上述敘述可表示為與當層直 接接觸或中間有一或更多層相隔的非接觸狀態。 第2圖係為本發明一實施例具有補償元件之有機電 激發光顯示器之電路示意圖。請參照帛2目,一有機電 0773-A31696TWF;P93079;wayne 8 1283938 激發光顯示元件包括一晝素單元20,且在晝素單元20 中,一例如開關積體電路(switch 1C)或是開關電晶體之開 關元件206控制有機電激發光顯示單元202。晝素單元 20亦包括一連接到電源線VP之驅動元件204(亦可稱為 驅動積體電路),其中通過驅動元件204之電流係可控制 有機電激發光單元202之照度212。行資料線220係對開 關元件206進行控制,可供選擇的,一電容器208係連 |接到驅動元件204之閘極,其中電容器208亦耦接一光 感測器210,此外,可對電容器208之電壓進行調整,以 根據光感測器210所感測到之有機電激發光單元202之 照度212而控制通過驅動元件204的電流,如此,可改 變有機電激發光單元202之照度212做為補償。 第3N圖繪示本發明一實施例之有機發光單元之剖 面圖,第3A圖〜第3N圖係繪示本發明一實施例有機發 光單元之之製程中介剖面圖。請參照第3A圖,首先提供 φ —基板3〇2,基板包括一控制區3〇4、一感測區3〇6和一 電容區307。於基板302上形成一緩衝層308,緩衝層308 可以是氧化矽、氮化矽或是氮氧化矽所組成,在本發明 之一較佳實施例中,緩衝層308係為氧化矽和氮化矽之 堆疊層,而其厚度可以為例如氮化矽約為350〜650埃, 氧化矽約為1000〜1600埃。 接下來,形成一導電層(未繪示)於緩衝層上,導電 層可以是一多晶矽所組成,,舉例來說,導電層可首先以 化學氣相沉積方法沉積一非晶矽,再以準分子雷射退火 0773-A31696TWF;P93079;wayne 9 1283938 • (Excimer Laser Annealing,以下可簡稱ELA)將其轉換成 多晶矽。之後,將導電層以傳統之微影和蝕刻方法定義 成一第一主動層310和一第二主動層312於基板302之 控制區304上方,並形成一下電極309於基板302之電 容區307的上方,而感測區306上並不保留主動層。 其後,如第3B圖所示,以一光阻314遮住第二主 動層312,而對第一主動層310進行一通道佈植步驟316 • ( channel doping),在本發明之一較佳實施例中,此佈 植步驟316可佈植B +,而其摻雜量可為0〜lE13/cm2。 後續,請參照第3 C圖,再形成另一光阻318遮住 第一主動層310之通道區320,並隨後佈植N+離子322 以形成N型電晶體之源極324和没極326,在本發明之一 較佳實施例中,此佈植步驟322可佈植磷,而其摻雜量 可為 1E14〜lE16/cm2。 接者,請參照第3D圖,移除上述光阻並毯覆性沉 翁積一閘極介電層328於第一主動層310、第二主動層 312、缓衝層308和電容區307之下電極309上,閘極介 電層328可以為氧化矽、氮化矽、氮氧化矽、其組合或 是其堆疊層,或是其它高介電材料所組成。需注意的是, 閘極介電層328在電容區307係供作電容介電層。 後續,請參照第3E圖,沉積一閘極導電層(未繪示) 於閘極介電層328上,閘極導電層可以為摻雜之多晶矽 或是金屬,在本發明之一較佳實施例史,閘極導電層可 以為厚度約為1500〜2500埃之Mo。 0773-A31696TWF;P93079;wayne 10 1283938 接著以傳統之微影和餘刻方法對閘極導電層進行 圖形化’a在第—主動層310上方形成N型電晶體間: 330 ’在第二主動層312上方形成P型電晶體閘極332, 在感測區306之閘極介電層似上形成—感測元件閑極 334,且於電容區3〇7上形成一上電極335,如此,下 極309、閘極介電層328和上電極335構成如第2圖 之電容器208。 ’、 • 在本發明之一較佳實施例中,在形成上述閘極 330、332和334之後,可進行一輕摻雜步驟,以例如離 子佈植的方法,於N型電晶體2〇6第一主動層31〇通道 區320兩側形成輕摻雜區336(light d〇ped drain,以下= 簡稱LDD),如此,在控制區形成第2圖所示之N型之開 關元件206和P型之驅動元件2〇4,在本發明之一實施; 中,開關元件206和驅動元件;2〇4係為上閘極電晶體。 後續,請參照第3F圖,形成一光阻338遮住第—主 φ動層310,並進行一離子佈植步驟34〇(如佈植p型摻雜 物)’以在p型電晶體閘極332下方之通道區342兩侧形 成P型電晶體之源極344和没極346,在此步驟及上述体 植步驟中,感測區306的感測元件閘極334下方的結構 層由於有感測元件閘極334遮蔽,不會形成摻雜物於其 中。 接著,請參照第3G圖,移除上述之光阻,並毯覆 性的沉積一介電層348於控制區304之吼極介電層328、 N型電晶體閘極330、P型電晶體閘極332、感測區3〇6 0773-A31696TWF;P93079;wayne 11 1283938 •之感測元件閘極334,及電容區307之上電極335上。此 介電層348在控制區304可用作控制元件(例如N型電晶 體或P型電晶體)之金屬連線間介電層,而其在感測區306 係可用作感測元件之閘極介電層。 介電層348可依照產品的需求或製程要求而決定其 組成和厚度,舉例來說,介電層348可由氧化矽、氮化 矽、氮氧化矽、其組合或其堆疊層所組成,另外,介電 鲁層348又可以為低介電材料,例如··聚烯銨(p〇iyimide)、 旋轉玻璃(SOG)、類鑽石碳(例如美商應材所開發之&lack2. The light that is irradiated to the photosensor by the organic f excitation light unit is sensed by the photo sensor to generate a photocurrent corresponding to the organic electroluminescence light unit, so that the voltage of the capacitor is adjusted by the photo current to control the passage. The current of the driving element, therefore, changes the illumination of the organic electroluminescent unit. The present invention provides a method of manufacturing an organic electroluminescent display element. First, a substrate including a control region and a sensing region is provided. Thereafter, an active layer is formed on the control region of the substrate to form a gate dielectric layer on the active layer and the sensing region of the substrate. Next, a conductive layer is formed on the gate dielectric layer, and the conductive layer is patterned to form the first and the first 0773-A31696TWF; P93079; wayne 7 1283938 two gates in the control region, and form a first in the sensing region Three gates. The electrical layer covers at least the first, second, and second portions, and forms a portion of the active layer on the sensing layer. The component element is doped on the active layer of the sensing element, forming a sensing and sensing element. The poles are electrically connected to each other with a sense of f/l!l7L source edge. Thereafter, the two pairs of sensing regions of the two layers of the organic electroluminescent unit are formed. The control area and the [Implementation] of the present invention will be described below with reference to the detailed description of the embodiments. In the illustration or on the same day, the same figure number is used for similar or identical. In the drawings, the β degree of the embodiment may be expanded to simplify or facilitate. "The parts/knife of the illustrated towel element will be described. It will be appreciated that the elements shown or described may have various familiarities. In the form known to those skilled in the art, in addition, when located on a substrate or another layer, the layer may be directly on the substrate or another layer, or may have an intervening layer therebetween. On the substrate, (ovserlying the substrate), on the layer, "(10) just as or, on the film" (reading e running), etc., indicates the relative positional relationship with the surface of the layer, Ignoring the layers present in the middle 'so the above description can be expressed as a non-contact state in which one or more layers are in direct contact with the layer or in between. FIG. 2 is an organic electroluminescent display with compensation elements according to an embodiment of the invention. Schematic diagram of the circuit. Please refer to 帛2, an organic electric 0773-A31696TWF; P93079; wayne 8 1283938 The excitation light display element comprises a halogen unit 20, and in the halogen unit 20, for example, a switch integrated circuit (switch 1C) ) or open The switching element 206 of the transistor is controlled to control the organic electroluminescent display unit 202. The pixel unit 20 also includes a driving element 204 (also referred to as a driving integrated circuit) connected to the power line VP, wherein the current passing through the driving element 204 The illuminance 212 of the organic electroluminescent device 202 can be controlled. The data line 220 controls the switching element 206. Alternatively, a capacitor 208 is connected to the gate of the driving element 204, wherein the capacitor 208 is also coupled. Connected to a photo sensor 210, in addition, the voltage of the capacitor 208 can be adjusted to control the current through the driving element 204 according to the illuminance 212 of the organic electroluminescent unit 202 sensed by the photo sensor 210, thus, The illuminance 212 of the organic electroluminescent device 202 can be changed as a compensation. FIG. 3N is a cross-sectional view showing an organic light emitting unit according to an embodiment of the present invention, and FIGS. 3A to 3N are diagrams showing organic light emission according to an embodiment of the present invention. Referring to FIG. 3A, firstly, a φ-substrate 3〇2 is provided. The substrate includes a control region 3〇4, a sensing region 3〇6, and a capacitor region 307. Forming a buffer layer 308, the buffer layer 308 may be composed of tantalum oxide, tantalum nitride or hafnium oxynitride. In a preferred embodiment of the invention, the buffer layer 308 is a stacked layer of tantalum oxide and tantalum nitride. The thickness of the layer may be, for example, about 350 to 650 angstroms of tantalum nitride and about 1000 to 1600 angstroms of yttrium oxide. Next, a conductive layer (not shown) is formed on the buffer layer, and the conductive layer may be composed of a polysilicon. For example, the conductive layer may first deposit an amorphous germanium by chemical vapor deposition, followed by excimer laser annealing 0773-A31696TWF; P93079; wayne 9 1283938 • (Excimer Laser Annealing, hereinafter referred to as ELA) It is converted into polycrystalline germanium. Thereafter, the conductive layer is defined by a conventional lithography and etching method as a first active layer 310 and a second active layer 312 over the control region 304 of the substrate 302, and a lower electrode 309 is formed over the capacitor region 307 of the substrate 302. The active layer is not retained on the sensing region 306. Thereafter, as shown in FIG. 3B, the second active layer 312 is covered by a photoresist 314, and the first active layer 310 is subjected to a channel implantation step 316 (channel doping), which is preferred in the present invention. In an embodiment, the implantation step 316 can implant B + and the doping amount can be 0 to 1 E13/cm 2 . Subsequently, please refer to FIG. 3C, and another photoresist 318 is formed to cover the channel region 320 of the first active layer 310, and then N+ ions 322 are implanted to form the source 324 and the gate 326 of the N-type transistor. In a preferred embodiment of the present invention, the implanting step 322 can implant phosphorus, and the doping amount can be 1E14~1E16/cm2. Referring to FIG. 3D, the photoresist is removed and a gate dielectric layer 328 is deposited on the first active layer 310, the second active layer 312, the buffer layer 308, and the capacitor region 307. On the lower electrode 309, the gate dielectric layer 328 may be composed of tantalum oxide, tantalum nitride, hafnium oxynitride, a combination thereof or a stacked layer thereof, or other high dielectric materials. It should be noted that the gate dielectric layer 328 is used as a capacitor dielectric layer in the capacitor region 307. Subsequently, please refer to FIG. 3E to deposit a gate conductive layer (not shown) on the gate dielectric layer 328, and the gate conductive layer may be doped polysilicon or metal, in a preferred embodiment of the present invention. For example, the gate conductive layer may be Mo having a thickness of about 1500 to 2500 angstroms. 0773-A31696TWF; P93079; wayne 10 1283938 Next, the gate conductive layer is patterned by conventional lithography and residual method. 'a N-type transistor is formed over the first active layer 310: 330' in the second active layer A P-type transistor gate 332 is formed over 312, and a sensing dielectric idler 334 is formed on the gate dielectric layer of the sensing region 306, and an upper electrode 335 is formed on the capacitor region 3?7. The pole 309, the gate dielectric layer 328 and the upper electrode 335 constitute a capacitor 208 as shown in FIG. In a preferred embodiment of the present invention, after forming the gates 330, 332 and 334, a light doping step can be performed, for example, by ion implantation, in an N-type transistor 2〇6. A lightly doped region 336 is formed on both sides of the first active layer 31 and the channel region 320. Thus, the N-type switching elements 206 and P shown in FIG. 2 are formed in the control region. A driving element 2〇4, in one embodiment of the invention; the switching element 206 and the driving element; 2〇4 are upper gate transistors. Subsequently, please refer to FIG. 3F, forming a photoresist 338 to cover the first main φ moving layer 310, and performing an ion implantation step 34 (such as implanting p-type dopant) to be in the p-type transistor gate. The source 344 and the gate 346 of the P-type transistor are formed on both sides of the channel region 342 below the pole 332. In this step and the above-mentioned body building step, the structural layer under the sensing element gate 334 of the sensing region 306 is The sensing element gate 334 is shielded from forming dopants therein. Next, referring to FIG. 3G, the photoresist is removed, and a dielectric layer 348 is deposited on the drain dielectric layer 328, the N-type transistor gate 330, and the P-type transistor of the control region 304. Gate 332, sensing region 3〇6 0773-A31696TWF; P93079; wayne 11 1283938 • sensing element gate 334, and capacitor region 307 above electrode 335. The dielectric layer 348 can be used as a metal interconnect layer for the control element (eg, an N-type transistor or a P-type transistor) in the control region 304, and can be used as a sensing element in the sensing region 306. Gate dielectric layer. The dielectric layer 348 can determine its composition and thickness according to the requirements of the product or the process requirements. For example, the dielectric layer 348 can be composed of tantalum oxide, tantalum nitride, hafnium oxynitride, a combination thereof, or a stacked layer thereof. The dielectric layer 348 may in turn be a low dielectric material, such as polypyrene (p〇iyimide), rotating glass (SOG), diamond-like carbon (for example, &lack developed by American Applied Materials)
Diamond)、氟石夕玻璃FSG,Dow Chemical所開發之 SILKTM,Trikon Technologies 所開發之 OrionTM,Diamond), Fluorite Glass FSG, SILKTM developed by Dow Chemical, OrionTM developed by Trikon Technologies,
Honeywell所開發之FLARE™,JSR Micro所開發之 LKD、Xerogel、Aerogel,多晶氟化碳和/或其它材料所組 成’或是可以為高介電材料例如·· Ta2〇5、Hf02、Al2〇3、FLARETM developed by Honeywell, LKD, Xerogel, Aerogel, polycrystalline fluorinated carbon and/or other materials developed by JSR Micro' can be high dielectric materials such as Ta2〇5, Hf02, Al2〇 3,
In02、La203、Zr〇2、Ta02、矽化物、鋁化物和上述金屬 φ氧化物之氮氧化物,和劈鈦礦結構之氧化物 (perovskite-type〇xide)。在本發明之較佳實施例中,介電 層348係為氧化矽和氮化矽之堆疊層,更佳為氮化矽/氧 化矽/氮化矽之堆疊結構,其中下層氮化矽之厚度約為 2500〜3500埃,氧化矽之厚度約為2500〜3500埃,上層氮 化矽之厚度約為5〇〇〜15〇〇埃。 曰大 接著,請參照第3H圖,形成感測元件主動層35〇 和感測兀件摻雜層352於感測區306之介電層348上, 在本發明之一實施例中感測元件主動層350可以為基礎 〇773.A31696TWF;P93079;wayne ^ !283938 半導體(例如多晶矽、單晶矽、複晶矽和/或鍺)、複合半 導體(例如碳化矽、和/或砷化稼)、合金半導體(例如 SiGe、GaAsP、A1InAs、A1GaAs、如好和域 Gainp,在 本發明之-較佳實施例中,感測元件主動層35〇係由無 :雜之非晶矽所組成’而感測元件摻雜層M2係由摻雜 組成’如此,感測元件主動層 、、“•步驟形成之有機電激發光單元之照射更 马靈敏。 體材雜層可以為以感測元件主動層350為主 體材枓之㈣層,較佳者,感心件 摻雜非晶石夕’而感測元件摻雜層 動層35G係為… N+離子非晶梦,更佳者,感測^ 係為厚度約為摻雜 為1000埃〜10000埃,感測元:主動層350之厚度約 100埃〜1000埃。 4滩層352之厚度約為 其後’請參照第31圖,以傳 圖形化介電層348和閘極介電展、之汽光和姓刻製私, 354分別暴露N型電晶體之源才=328,形成複數個開口 326,及P型電晶體之源極344 4、閘極·和没極 以供做後續金屬導線連接用。甲極332和汲極346, 接下來,請參照第3J圖,毯覆# 繪示),並隨後以習知的黃光和蝕岁I 、沉積一金屬層(未 元件摻雜層352兩側分別形成感夠 與感測元件摻雜層352,以於上、,丨技術,圖形化金屬層 356,並同時於感測區306之感述開口中形成導電接觸 元杜撿濰靥士如人……,…&件主動層350和感測 元件源極358和感測 0773-A31696TWF;P93079;wayne 13 1283938 •元件汲極360,如此,形成第2圖中之光感測元件210, 舉例來說,光感測元件210可以為例如下閘極型態之電 晶體。 在本發明之一些實施例中,開關元件206、驅動元 件204和光感測器210可包括位於同一層之閘極,舉例 來說,請參照第3J圖,開關元件之閘極330、驅動元件 之閘極332和光感測器之閘極334係為同一層。 | 後續,請參照第3K圖,形成一保護層362於導電 接觸356、介電層348、感測元件源極358和感測元件汲 極360上,保護層362可以是氮化矽或氮氧化矽所組成, 較佳者,保護層362係由厚度約1000埃〜5000埃之氮化 矽所組成。 接下來,請參照第3L圖,形成一例如有機物或是氧 化矽所組成之平坦化層364於保護層362上,在發本發 明之較佳實施例中,平坦化層364之厚度約介於10000 馨埃〜50000埃,並在接下來的步驟,以傳統的黃光及蝕刻 方法圖形化平坦化層364及其下之保護層362,以在上述 之導電接觸356上方形成接觸開口 366,在本發明之一較 佳實施例中,接觸開口 366係暴露P型電晶體之汲極346 上方之導電接觸356。 後續,請參照第3M圖,形成一例如銦錫氧化物 (indium tin oxide,以下可簡稱ITO)之晝素電極層368於 平坦化層364上,並電性連接到上述導電接觸356。之後, 形成一例如氧化物或是有機物所組成之畫素定義層370 0773-A31696TWF;P93079;wayne 14 1283938 於部分平坦化層364及晝素電極層368上,特別是,晝 素定義層370暴露部分或全部之感測元件。 後續,請參照第3N圖,在上述之畫素電極層368 和晝素定義層370上方形成有機電激發光層372。在本發 明之一實施例中’有機電激發光層372在晝素電極層368 上(又可稱為陽極導電層)包括依序設置之一電洞注入 層、一電洞傳輸層、一有機發光材料層、一電子傳輸層、 鲁一電子注入層以及一陰極導電層。其中,陽極導電層係 採用銦錫氧化物(In2〇3:Sn,簡稱為ITO),其具有易蝕刻 性、低成膜溫度、低電阻等優點。當外加一偏壓之後, 電子、電洞係分別經過電子傳輸層、電洞傳輸層而進入 有機發光材料層中並結合成為一激發光子(exciton),再將 能1釋放出來而回到基態(ground state),而在這些被釋放 出來的能量中,會依據所選擇的發光材料的不同而以不 同顏色光的型式釋放出來,例如:紅光(R)、綠光、藍 •光(B)。 風 接著’形成一例如鋁或銀等具高反射係數所組成之 陰極374於有機電激發光層372上,如此,晝素電極層 368、有機電激發光層372和陰極374係構成有機電激發 光單元,如第2圖所示,而形成向下發射有機電激發光 元件202 〇 如第2圖和第3N圖所示,在本發明之一些實施例 中,當有機電激發光單元'202照射光感测器210時,光 感測器210中係產生光電流,有機電激發光單元202之 0773-A31696TWF;P93079;wayne 15 1283938 •亮度係可決定光電流之大小,因此,可依據光感測器210 所感測到之有機電激發光單元202照度,調整耦接到驅 動元件204之電容器208的電壓,以控制通過驅動元件 204之電流,如此,可改變有機電激發光單元202之照度 以做為補償。因此,在有機電激發光元件衰退之後,可 藉由上述之内部補償改進有機電激發光單元202之亮度 均勻性。In02, La203, Zr〇2, Ta02, telluride, aluminide and the above-mentioned metal φ oxide oxynitride, and perovskite-type 〇xide. In a preferred embodiment of the present invention, the dielectric layer 348 is a stacked layer of tantalum oxide and tantalum nitride, more preferably a tantalum nitride/yttria/tantalum nitride stack structure, wherein the thickness of the lower tantalum nitride layer It is about 2500~3500 angstroms, the thickness of yttrium oxide is about 2500~3500 angstroms, and the thickness of the upper layer of tantalum nitride is about 5 〇〇~15 〇〇. Next, referring to FIG. 3H, a sensing element active layer 35A and a sensing element doping layer 352 are formed on the dielectric layer 348 of the sensing region 306. In one embodiment of the invention, the sensing element is The active layer 350 may be based on 〇 773.A31696TWF; P93079; wayne ^ !283938 semiconductors (eg, polycrystalline germanium, single crystal germanium, germanium germanium, and/or germanium), composite semiconductors (eg, tantalum carbide, and/or arsenic), Alloy semiconductors (e.g., SiGe, GaAsP, AlIns, A1GaAs, such as good and domain Gainp, in the preferred embodiment of the invention, the sensing element active layer 35 is composed of no: amorphous amorphous germanium) The doping layer M2 of the measuring element is composed of a doping composition. Thus, the active layer of the sensing element, and the irradiation of the organic electroluminescent light unit formed by the step are more sensitive. The bulk layer of the body material may be the active layer 350 of the sensing element. For the (four) layer of the main material, preferably, the sensible core is doped with amorphous slabs and the sensing element doped layer is 35g... N+ ionic amorphous dream, better, sensing ^ is thickness The doping is about 1000 angstroms to 10,000 angstroms, and the sensing element: the thickness of the active layer 350 is about 100. Å ~ 1000 angstroms. 4 beach layer 352 thickness is about the latter 'Please refer to Figure 31, to transfer the patterned dielectric layer 348 and gate dielectric exhibition, the vapor and the name of the private, 354 respectively exposed N The source of the transistor is only 328, forming a plurality of openings 326, and the source 344 4 of the P-type transistor, the gate and the gate for the subsequent metal wire connection. The pole 332 and the drain 346 are connected. Next, please refer to the 3J figure, the blanket cover # shows), and then deposit a metal layer with the conventional yellow light and eclipse I (the two sides of the undoped layer 352 are respectively formed to be sensitive to the sensing element The impurity layer 352 is used to form the metal layer 356, and simultaneously form a conductive contact element in the sensing opening of the sensing region 306. 350 and sensing element source 358 and sensing 0773-A31696TWF; P93079; wayne 13 1283938 • element drain 360, thus forming the light sensing element 210 of FIG. 2, for example, the light sensing element 210 can For example, a gate type transistor is used. In some embodiments of the invention, the switching element 206, the driving element 204, and the light sensation The device 210 may include a gate on the same layer. For example, referring to FIG. 3J, the gate 330 of the switching element, the gate 332 of the driving element, and the gate 334 of the photo sensor are in the same layer. Referring to FIG. 3K, a protective layer 362 is formed on the conductive contact 356, the dielectric layer 348, the sensing element source 358, and the sensing element drain 360. The protective layer 362 may be composed of tantalum nitride or hafnium oxynitride. Preferably, the protective layer 362 is composed of tantalum nitride having a thickness of about 1000 angstroms to 5000 angstroms. Next, referring to FIG. 3L, a planarization layer 364 composed of, for example, an organic material or yttrium oxide is formed on the protective layer 362. In the preferred embodiment of the invention, the thickness of the planarization layer 364 is approximately 10000 angstroms to 50,000 angstroms, and in a subsequent step, the planarization layer 364 and the underlying protective layer 362 are patterned in a conventional yellow light and etching process to form contact openings 366 over the conductive contacts 356 described above, In a preferred embodiment of the invention, the contact opening 366 exposes the conductive contact 356 above the drain 346 of the P-type transistor. Subsequently, referring to FIG. 3M, a halogen electrode layer 368 such as indium tin oxide (hereinafter referred to as ITO) is formed on the planarization layer 364 and electrically connected to the conductive contact 356. Thereafter, a pixel defining layer 370 0773-A31696TWF, such as an oxide or an organic material, is formed; P93079; wayne 14 1283938 is on the partial planarization layer 364 and the halogen electrode layer 368, in particular, the halogen defining layer 370 is exposed. Some or all of the sensing elements. Subsequently, referring to FIG. 3N, an organic electroluminescent layer 372 is formed over the above-described pixel electrode layer 368 and the halogen defining layer 370. In an embodiment of the present invention, the organic electroluminescent layer 372 is disposed on the halogen electrode layer 368 (also referred to as an anode conductive layer), including a hole injection layer, a hole transmission layer, and an organic layer. a luminescent material layer, an electron transport layer, a Lu-electron injection layer, and a cathode conductive layer. Among them, the anode conductive layer is made of indium tin oxide (In2〇3:Sn, abbreviated as ITO), which has the advantages of easy etching property, low film formation temperature, and low resistance. After a bias voltage is applied, the electrons and the holes are respectively passed through the electron transport layer and the hole transport layer into the organic light-emitting material layer and combined to form an excitation photon (exciton), and then the energy 1 is released and returned to the ground state ( Ground state), and in these released energy, it will be released in different color light depending on the selected luminescent material, for example: red light (R), green light, blue light (B) . The wind then 'forms a cathode 374 having a high reflection coefficient such as aluminum or silver on the organic electroluminescent layer 372. Thus, the halogen electrode layer 368, the organic electroluminescent layer 372 and the cathode 374 constitute an organic electrical excitation. The light unit, as shown in FIG. 2, forms a downwardly-emitting organic electroluminescent element 202, as shown in Figures 2 and 3N, in some embodiments of the invention, when the organic electroluminescent unit '202 When the light sensor 210 is irradiated, a photocurrent is generated in the photo sensor 210, and the organic electroluminescence excitation unit 202 is 0773-A31696TWF; P93079; wayne 15 1283938. The brightness system determines the magnitude of the photocurrent, and therefore, the light can be determined according to the light. The illuminance of the organic electroluminescent light unit 202 sensed by the sensor 210 adjusts the voltage coupled to the capacitor 208 of the driving element 204 to control the current through the driving element 204. Thus, the illuminance of the organic electroluminescent light unit 202 can be changed. As a compensation. Therefore, after the organic electroluminescent device is degraded, the brightness uniformity of the organic electroluminescent unit 202 can be improved by the internal compensation described above.
I 第4圖係顯示一晝素單元20(例如第2圖或是第3N 圖所顯示之晝素單元)可併入一面板(例如面板30),而此 面板係可以為有機電激發光面板,此外,此面板可以做 為各種型態之電子元件(例如電子元件50)之一部分。一 般來說,電子元件包括有機電激發光面板20和輸入單元 40,更甚者,輸入單元40係操作性的耦接到有機電激發 光面板30,且提供輸入訊號(例如一晝面訊號),舉例來 說,此電子元件50可以為一個人數位助理(personal 參digital assistant,簡稱PDA)、筆記型電腦、桌上型電腦、 手機、車用電視(car TV)或是數位相機。 雖然本發明已以較佳實施例揭露如上,然其並非用 以限定本發明,任何熟習此技藝者,在不脫離本發明之 精神和範圍内,當可作些許之更動與潤飾,因此本發明 之保護範圍當視後附之申請專利範圍所界定者為準。 【圖式簡單說明】 第1圖係揭示有機電激發光顯示器面板存在有晝素 0773-A31696TWF;P93079;wayne 16 1283938 ‘間均勻性不佳的問題。 第2圖係為本發明一實施例具有補償元件之有機電 激發光顯示器之電路示意圖。 第3A圖〜第3N圖係繪示本發明一實施例形成一感 測元件補償有機發光元件之製程中介剖面圖。 第4圖係揭示本發明一實施例之電子元件之示意 圖。I Fig. 4 shows that a halogen unit 20 (for example, a halogen unit shown in Fig. 2 or Fig. 3N) can be incorporated into a panel (e.g., panel 30), and the panel can be an organic electroluminescent panel. In addition, the panel can be implemented as part of various types of electronic components (eg, electronic component 50). In general, the electronic component includes the organic electroluminescent panel 20 and the input unit 40. Further, the input unit 40 is operatively coupled to the organic electroluminescent panel 30 and provides an input signal (eg, a surface signal). For example, the electronic component 50 can be a personal assistant (PDA), a notebook computer, a desktop computer, a mobile phone, a car TV (car TV), or a digital camera. While the present invention has been described in its preferred embodiments, the present invention is not intended to limit the invention, and the present invention may be modified and modified without departing from the spirit and scope of the invention. The scope of protection is subject to the definition of the scope of the patent application. [Simple description of the diagram] Fig. 1 reveals that there is a problem of poor uniformity between the organic electroluminescent display panel and the substrate 0773-A31696TWF; P93079; wayne 16 1283938. Fig. 2 is a circuit diagram showing an organic electroluminescent display having a compensating element according to an embodiment of the present invention. 3A to 3N are cross-sectional views showing a process medium for forming a sensing element compensation organic light emitting element according to an embodiment of the present invention. Fig. 4 is a schematic view showing an electronic component of an embodiment of the present invention.
【主要元件符號說明】 VP〜電源線; 20〜晝素單元; 30〜面板; 40〜輸入單元; 50〜電子元件; 102〜開關電晶體; 104〜驅動電晶體, 106〜有機電激發光單元; 202〜有機電激發光顯示單元; 204〜驅動元件; 206〜開關元件; 208〜電容器; 210〜光感測器; 212〜照度; 302〜基板; 3 04〜控制區; 306〜感測區, 307〜電容區, 3 0 8〜緩衝層; 309〜下電極; 310〜第一主動層; 312〜第二主動層; 314〜光阻; 316〜通道佈植步驟; 318〜光阻; 320〜通道區; 322〜N +離子; 324〜源極; 326〜汲極; 0773-A31696TWF;P93079;wayne 17 1283938 328〜閘極介電層; 330〜N型電晶體閘極; 332〜P型電晶體閘極;334〜感測元件閘極; 335〜上電極; 344〜P型電晶體之源極; 346〜P型電晶體之汲極; 348〜介電層; 350〜感測元件主動層; 352〜感測元件摻雜層; 354〜開口; 356〜導電接觸; 3 5 8〜感測元件源極,3 6 0〜感測兀件〉及極, 362〜保護層; 364〜平坦化層; 366〜接觸開口; 368〜晝素電極層; 370〜晝素定義層; 372〜有機電激發光層; 374〜陰極。[Main component symbol description] VP ~ power line; 20 ~ halogen unit; 30 ~ panel; 40 ~ input unit; 50 ~ electronic components; 102 ~ switch transistor; 104 ~ drive transistor, 106 ~ organic electroluminescent unit 202~organic electroluminescent display unit; 204~ drive element; 206~switch element; 208~capacitor; 210~photo sensor; 212~illuminance; 302~substrate; 3 04~ control area; 306~ sensing area , 307 ~ capacitor region, 3 0 8 ~ buffer layer; 309 ~ lower electrode; 310 ~ first active layer; 312 ~ second active layer; 314 ~ photoresist; 316 ~ channel implantation step; 318 ~ photoresist; ~ channel area; 322~N + ion; 324~ source; 326~dip; 0773-A31696TWF; P93079; wayne 17 1283938 328~ gate dielectric layer; 330~N type transistor gate; 332~P type Transistor gate; 334~ sensing element gate; 335~ upper electrode; 344~P type transistor source; 346~P type transistor drain; 348~ dielectric layer; 350~ sensing element active Layer; 352~ sensing element doped layer; 354~ opening; 356~ Electrical contact; 3 5 8~ sensing element source, 3 6 0~ sensing element> and pole, 362~ protective layer; 364~ planarization layer; 366~ contact opening; 368~ 昼 element layer; 370~ Alizarin defined layer; 372~organic electroluminescent layer; 374~ cathode.
0773-A31696TWF;P93079;wayne 180773-A31696TWF; P93079; wayne 18
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