TWI278525B - Copper sputtering targets and methods of forming copper sputtering targets - Google Patents
Copper sputtering targets and methods of forming copper sputtering targets Download PDFInfo
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1278525 玖、發明說明: 【發明所屬之技術領域】 本發明有關含銅單塊濺射標靶及含銅結合濺射標靶。本 發明額外關於形成含銅單塊及結合濺射標靶之方法。 【先前技術】 高純度銅濺射標靶及銅合金濺射標靶目前用於種種應用 (包括例如積體電路之製造)。含銅結構(如連接器及薄膜) 之=質視標靶之濺射性能而定。濺射標靶之種種因子可影 ,標把之賤射性能’其包括:標㈣料之平均晶粒大小及 曰曰粒大小均一性、標靶材料之結晶取向/紋理、標靶内結構 及組成均勻性及標靶材料之強度。典型上,較小之平均晶 津大】與増加強度之材料相關。另外,合金元素之量可影 響標靶材料之強度及硬度,隨合金元素之增加典型上造成 標乾強度之增加。 、由於高純度銅(高於99.99重量%之銅)之低強度,傳統高純 度銅濺射標靶典型上形成結合標靶。結合銅濺射標靶可具 結合至含較高強度材料(如鋁)之背襯板之高純度銅標靶。 然而,在結合銅標靶至背襯板時利用之高溫常造成產生非 勻彳政結構及整體平均晶粒大小之增加的異常晶粒成長。 傳統回純度銅標靶典型上具有可造成較低降伏強度之大於 50微米的平均晶粒大小。傳統形成之高純度銅濺鍍標靶產 生(晶粒大小及結構非均一性不利地影響濺射沉積高純度 銅膜及連接器之品質。 除了在結合過程中可造成產生大晶粒大小及不規則晶粒 成長 < 外’擴散結合銅標靶常受如燒穿或短標靶壽命之問 1278525 t 口杈。此外,結合過程可能為複雜且耗時的。 :種為了 __巴目的增加晶粒大小均—性及增強 ’虫度之万法為將銅與一或多個合金元素形成八八 二’因為合金元素之存在影響銅之阻抗,限制合;:辛: 咖才料内總量不大於1〇重量%為合適的。對:在 ,σ至兀素〈量應限制在少於或等於3重量%。人公_ 之另-缺點為可能成為潛在之缺陷,如形成:二 分離。 ^儿歲或 雖然減少或移除沉殿或分離之缺陷的傳統材料處理在— 些情況中可行,然而這樣之處理典型上包括可產生極大晶 幸大1 (大於丨5()微米)之溫度。另—選擇為部分減少存在傳 ㈣枓中第二相沉;殿或分離缺陷可在—些情況下利用傳 壓乳及/或鍛造技術在—些情況中達到 '然而,留下之缺陷 ^影響賤射膜之品質。目前,形成具小於或等於3重量: 合金兀素之銅合金的傳統加工產生典型上大於30微米之平 均晶粒大小(―般超過5〇微米)且在其中有第二相沉殿之標 #巴0 發展製造具?文良濺射性能之銅賤射標革巴及銅合金藏射標 革巴的方法為所需的。 【發明内容】 在一觀點中本發明包括一種含銅濺射標靶。標靶含至少 99.99重里/〇之銅且具丨微米至5〇微米之平均晶粒大小。含銅 標祀《降㈣度大於或等於約15 ksiJL勃^硬度(hb)大於約 1278525 40 ° 在一觀點中本發明包括一種銅合金濺射標靶,其基本上 由小於或等於約99.99重量%之銅及至少一種選自*Cd,1278525 玖, DESCRIPTION OF THE INVENTION: TECHNICAL FIELD The present invention relates to a copper-containing monolithic sputtering target and a copper-containing bonded sputtering target. The invention additionally relates to a method of forming a copper-containing monolith and bonding a sputtering target. [Prior Art] High-purity copper sputtering targets and copper alloy sputtering targets are currently used in various applications (including, for example, fabrication of integrated circuits). The sputtering properties of the copper-containing structure (such as connectors and films) = quality target. The various factors of the sputtering target can be shadowed, and the sputtering performance of the target includes: the average grain size of the standard (four) material and the uniformity of the grain size, the crystal orientation/texture of the target material, and the structure of the target and Composition uniformity and strength of the target material. Typically, the smaller average crystal size is related to the strength of the material. In addition, the amount of alloying elements can affect the strength and hardness of the target material, and the increase in the alloying element typically results in an increase in the dry strength. Due to the low strength of high purity copper (more than 99.99% by weight copper), conventional high purity copper sputtering targets typically form a bonding target. The copper sputtering target can be combined with a high purity copper target bonded to a backing plate containing a relatively high strength material such as aluminum. However, the high temperatures utilized in combining copper targets to backing sheets often result in abnormal grain growth that results in a non-homogeneous structure and an increase in the overall average grain size. Conventional back-purity copper targets typically have an average grain size greater than 50 microns that results in lower repulsive strength. Traditionally formed high-purity copper sputter targets (grain size and structural heterogeneity adversely affect the quality of sputter deposited high-purity copper films and connectors. In addition to the large grain size and Regular grain growth < External 'diffusion bonded copper targets are often subject to burnt-through or short target lifetimes. 1278525 t. In addition, the bonding process can be complex and time consuming. The grain size uniformity and the enhancement of the 'worm' method are to form copper with one or more alloying elements 八' because the existence of alloying elements affects the impedance of copper, limiting the combination;: Xin: The amount of not more than 1% by weight is suitable. For: σ to 兀素 <the amount should be limited to less than or equal to 3% by weight. The other is that the disadvantage is that it may become a potential defect, such as formation: two Separation. ^Children or traditional material treatments that reduce or remove defects in the sink or separation are feasible in some cases, but such treatments typically include a large crystal size of 1 (greater than 丨5 () microns). Temperature. Another - select as part There is little transmission (4) the second phase sink in the sputum; the temple or separation defects can be achieved in some cases by using pressure-transmitting milk and/or forging techniques in some cases At present, the conventional processing of forming a copper alloy having a weight of less than or equal to 3: alloy bismuth produces an average grain size of typically greater than 30 microns ("typically over 5 〇 microns") and has a second phase sink in it. #巴0 Development of a tool for the production of copper-based smear and copper alloys for the sputtering performance of Wenliang. [Invention] In one aspect, the invention includes a copper-containing sputtering target. Target. The target contains at least 99.99 liters/inch of copper and has an average grain size from 丨 micron to 5 〇 micron. The copper-containing standard 降 "four degrees" is greater than or equal to about 15 ksiJL and the hardness (hb) is greater than about 1278525 40 In one aspect the invention includes a copper alloy sputtering target having substantially less than or equal to about 99.99% by weight copper and at least one selected from the group consisting of *Cd,
Au ’ Ag,Be,Li,Mg,Al,Pd,Hg,Ni,In,Zn,B,Ga,μAu' Ag, Be, Li, Mg, Al, Pd, Hg, Ni, In, Zn, B, Ga, μ
Sn ’ Ge,W,Cr,O,Sb,Ir,P,As,Co,Te,Fe,S,ΊΊ 7 丄i , Zr ,Sn ′ Ge, W, Cr, O, Sb, Ir, P, As, Co, Te, Fe, S, ΊΊ 7 丄i , Zr ,
Sc ’ Si,Mo,pt,Nb,Re及Hf組成之群之合金元素組成。^ 革巴之合金元素總量以重量計至少100 PPm且小於10%。把革巴 <平均晶粒大小亦為丨微米至50微米且在整個標靶内掉谁 差小於約15%之1個希格瑪的晶粒大小均一性。 在一觀點中本發明包括一種形成單塊濺射標靶的方法。 基本上由銅及小於或等於10重量%之總量之一或多種八金 元素組成之銅坦加熱至少約900T並維持在此溫度至心 V約 45分鐘。銅坯以高度減少率至少約50%之熱鍛造以形成礙造 塊且鍛造塊冷軋至減少率至少約60%以形成靶心。加熱革巴、 以引起再結晶及形成平均晶粒大小小於1〇〇微米之微細曰 粒分佈。靶心隨後形成單塊標靶形狀。 在一觀點中本發明包括一種由純度為至少99·99%之鋼的 銅述形成含銅濺射標靶之方法。銅坯在高於3〇〇°c之溫戶以 高度減少率至少40%之熱鍛造形成鍛造塊。鍛造塊以水淬火 並受包括將锻造塊至少4次通過透過等徑轉角擠形(Η。八幻 之擠形過程。視需要之溶液化過程可在鍛造,隨後之水、、卒 火及ECAE後進行。中間退火在至少一些eCae通過間執行 在完成ECAE加工後,鍛造塊冷軋至小於9〇q/q之減少 、 :以形 成靶心。靶心可做熱處理並隨後形成濺射標靶。 !278525 實施方式 本發明包括單塊高純度銅濺射 標乾、單塊銅合金職把、:=人=高純綱射 方法。1 了本發明敘述之目的,高純度銅可指 量:卜重里紅钢疋鋼材料。本發明包括具以重 用至99·99995%之鋼的高純度標革巴。此外,使 捃早太°σ_Η日用作政射而没有結合至背襯板之標革巴。 :二明之結合或單塊高純度標乾可具有小於i微米 广或寺於約輝米(以小於50微米較佳)之平均晶粒大 為V二一些情況中。可利用本發明方法產生平均晶粒大小 約職米之單塊或結合科。根據本發明之單塊及結 :::在特別之情況中以W米至約20微米之平均粒子大 小致佳,例如約5微米至約10微米。 本純度職跨標^賤射表面及/或標乾内具 性,晶粒大小之均-性使標準差⑽格瑪)小 於約15%(亦稱為W非均—性)。在性別之情況 句一性可反映小於或等於1〇% (1希格瑪)之標準差。 曰:發明高純度銅濺射標靶可比基本上相同元:組成平均 印粒大小為50微米之標乾至少大約1〇%之降伏強纟,而在— :情況中比基本上相同元素組成平均晶粒大小為3〇微米之 :革巴至少大10 〇/〇。為了本發明敘述之目的“基本上相同组成” 一^指沒有可制到之組成差異的材科。由下面敘述之方 法&供;^ I巴之降伏強度大於或等於15丨如。 本發明之高純度銅餘可具比基本上相同元素組成平均 I278525 日曰粒大小為50微米之標靶至少大15%之極限抗張強度,而在 、些情況中比基本上相同元素組成平均晶粒大小為30微米 之%靶至少大15%之極限抗張強度。此外,高純度銅標靶之 硬度比基本上相同元素組成平均晶粒大小為3 〇微米之標靶 土少大約1 5%。在特別之情況中,本發明之高純度標靶之 勃氏硬度大於40 HB,且在特別情況中大於約6〇 Ηβ。 在特別之觀點中,本發明之高純度銅濺鍍標靶之純度為 99·99% (4N)或更高。為了本發明敘述之目的,所有百分比 及包含之量除非另有說明為以重量計。在一些觀點中高純 度標靶之包含99.999% (5N)之銅較佳,可包括99·9999% (6n) 之銅較佳或可括99.99995% (6N5)之銅較佳。An alloying element composition of a group consisting of Sc ' Si, Mo, pt, Nb, Re, and Hf. ^ The total amount of alloying elements of gram is at least 100 PPm and less than 10% by weight. The average grain size of the granules is also from 丨 micron to 50 micrometers and the grain size uniformity of one sigma which is less than about 15% in the entire target. In one aspect the invention includes a method of forming a monolithic sputtering target. The copper tantalum consisting essentially of copper and one or more of the eight gold elements in a total amount of less than or equal to 10% by weight is heated to at least about 900 T and maintained at this temperature to the center V for about 45 minutes. The billet is hot forged at a height reduction of at least about 50% to form a barrier and the forged block is cold rolled to a reduction rate of at least about 60% to form a bullseye. The leather is heated to cause recrystallization and to form a fine particle distribution having an average grain size of less than 1 Å. The bullseye then forms a monolithic target shape. In one aspect the invention includes a method of forming a copper-containing sputtering target from a copper having a purity of at least 99.9%. The billet is forged at a temperature of at least 40% above the temperature of 3 〇〇 °c to form a forged block. The forged block is quenched with water and is subjected to at least 4 passes through the equal-diameter corner extrusion process. The solubilization process can be performed in the forging, followed by water, fire and ECAE. The intermediate annealing is performed between at least some of the eCae passes. After the ECAE processing is completed, the forged block is cold rolled to a reduction of less than 9 〇q/q to form a bullseye. The target can be heat treated and subsequently formed into a sputtering target. 278525 Embodiments The present invention comprises a single high-purity copper sputtering standard dry, single-copper alloy handle, := human = high-purity method. 1 For the purpose of the present invention, high-purity copper can be used to refer to: Buzhongli red steel Neodymium steel material. The present invention includes a high-purity standard leather bar with a steel weight of up to 99.99999%. In addition, the 捃 太 ° ° Η Η Η Η 用作 用作 政 政 政 政 政 政 政 政 。 。 。 。 。 。 。 。 : : : : : : : : The combination of Erming or a single piece of high-purity dry can have a smaller average size of less than i microns or a temple of about gamma (preferably less than 50 microns), and may be averaged by V. The grain size is about a single piece or a combination of the meter. Monoliths and junctions according to the present invention:: in particular, an average particle size of from W meters to about 20 microns, such as from about 5 microns to about 10 microns. Or the dryness of the standard, the uniformity of the grain size makes the standard deviation (10) gamma less than about 15% (also known as W non-uniformity). In the case of gender, the sentence can reflect the standard deviation of less than or equal to 1〇% (1 Sigma).曰: The invention of the high-purity copper sputtering target can be compared with substantially the same element: a composition of an average granule size of 50 μm of the standard dryness of at least about 1%, and in the case of: - The grain size is 3 〇 microns: the gram is at least 10 〇 / 〇. For the purposes of the present invention, "substantially the same composition" means a material that has no compositional differences that can be made. The method of <Desc/Clms Page number> The high-purity copper balance of the present invention may have an ultimate tensile strength at least 15% greater than a target having an average elemental composition of I278525 and a particle size of 50 μm, and in some cases, an average of the same elemental composition. The target has a grain size of 30 microns and the target has an ultimate tensile strength of at least 15%. In addition, the hardness of the high-purity copper target is about 5% less than that of the target material having an average crystal grain size of 3 μm. In particular, the high purity target of the present invention has a Brinell hardness greater than 40 HB and, in particular, greater than about 6 Η Ηβ. In a particular aspect, the high purity copper sputter target of the present invention has a purity of 99.99% (4N) or higher. For the purposes of the present invention, all percentages and amounts included are by weight unless otherwise indicated. In some aspects, high purity targets comprising 99.999% (5N) of copper are preferred, and may include 99.9999% (6n) of copper preferably or may include 99.99995% (6N5) of copper.
本發明之結合高純度銅標靶可包括擴散結合至背襯板之The combined high purity copper target of the present invention may comprise diffusion bonding to the backing plate
咼純度銅標革巴。在特別情況中 度大於10 ksi,以大於或等於約 結合降伏強度大於或等於約30 包括例如一或多種之怪壓、輥 摩擦鍛造之其他結合方法結合 合高純度銅標靶至背襯板以產 ksi之結合較佳。 結合標乾之擴散結合降伏強 15 ksi較佳,而在特別情況中 ksi。另一選擇為標靶可利用 包覆、焊錫、爆炸結合及無 至背襯板。其他結合方法钟 生降伏強度大於或等於約1〇 用於本發明結合標靶中之背襯板為鋁或CuCr背襯板鲈 佳。如熟諳此藝者所了解的,利用其他背襯板材料 x 當的。 為通 本發明包括包含小於或等於約99·99重量%之鋼之鋼八八 濺射標靶。本發明之銅合金濺射標靶基本上由 :至 、或等於 -10- 1278525 約99.99重量°/。之銅及至少一種選自由〇(1,€3,八11,八§,:^,咼 Purity copper standard leather bar. In a special case, the degree is greater than 10 ksi, and the combined high-purity copper target is bonded to the backing plate at a bonding strength greater than or equal to about 30, including, for example, one or more types of pressure, roll friction forging. The combination of ksi is preferred. It is better to combine the diffusion of the standard dryness with the 15 vsi, and in special cases ksi. Another option is to use cladding, soldering, explosive bonding, and no backing. Other bonding methods have a clocking strength of greater than or equal to about 1 Torr. The backing sheet used in the bonding target of the present invention is preferably an aluminum or CuCr backing sheet. If you know what this artist knows, use other backing materials x. For purposes of the present invention, a steel eighty-eight sputtering target comprising less than or equal to about 99.9% by weight of steel is included. The copper alloy sputtering target of the present invention consists essentially of: to, or equal to -10- 1278525, about 99.99 weight %. The copper and at least one selected from the group consisting of 〇 (1, €3, eight 11, eight §, :^,
Li,Mg,A1,Pd,Hd,Ni,In,zn,B,Ga,Μη,Sn,Ge,W, Ci*,O,Sb ’ Ir ’ P ’ As ’ Co,Te,Fe,S,Ti,Zr,Sc,Si,pt,Li,Mg,A1,Pd,Hd,Ni,In,zn,B,Ga,Μη,Sn,Ge,W, Ci*,O,Sb ' Ir ' P ' As 'Co,Te,Fe,S,Ti ,Zr,Sc,Si,pt,
Nb ’ Re、Mo及Hf組成之群之合金元素組成較佳。在特別之 情況中,至少一種合金元素選自Ag,A卜In,Zn,B,^, Mg,Sn,Ge,Ti及Zr較佳。存在標靶内至少一種合金元素之 總量以重量計至少約100卯111至少於約1〇%較佳。在一此情 況中,至少一種合金元素可存在以重量計至少l〇〇〇ppm^、 於約3%較佳,小於2%更佳。 根據本發明之銅合金濺射標靶在特別觀點中平均晶粑大 小小於1微米。另一選擇為銅合金濺射標靶可包括s 约100微米(以小於50微米較佳)之平均晶粒大小。在一些ς 點中’'銅合金標把之晶粒大小為i至職米較佳。本發明方 法之應用在-些情況中可產生平均晶粒大小小於或等於加 微米之標乾,而在特別觀點中為約5微米至㈣微米。、此 外,本發明《銅合金標革巴在整個標革巴内及或跨標革巴賤射表 面具晶粒大小均—性。在特職財,在整個料内平均 晶粒大小非均—性小於15%(#4^^<_ 等於約15%)’而在特別情況中之標準差〇希格 小於或料约·(非均-性小於或等於1〇%)。 根:本發明之銅合金賤射標乾之勃氏硬度至少約4〇 册此夕^情況中’本發明㈣之硬度大Μ等於約60 Γ度二性銅合金標乾具有跨職射表面及/或整個標乾内之 例如,在特別情況中整個銅合金標革巴内硬度 1278525 之標準差Ο希格瑪)小於約5% 、 於5%)。在特別情況中,硬度均(:::二革…‘性小 希格瑪)。 /勾午爰小於约3.5% (1 本發明鋼A人Δ 結合的。本二 為單塊或在其他具體實施例中可為 -或多種=之rr:合金標乾可藉擴散結合或藉利= 及其他適:=技=、二:錫、爆炸結合、無摩擦鍛造 結合之處,蛀入、万〜合至背槭板。在銅合金標靶 ksi較佳…〈結合降伏強度大於约10-且以大於約15 (:近方法加工銅材料可產生之紋理範園由極弱 強心銅標靶,視利用之加工路徑而定(在 材料::為了本發明敘述之目的,“銅,,(以“銅標乾”、“銅 本發明二㈣使用)—般指高純度銅或銅合金。根據 小;之典型銅躲之晶體晶粒取向分佈函數_) 、έ:5寺於約15倍之任意值。在特別情況中標靶可具極弱 又,又理,其特徵為ODF小於5倍之任意值。 t標靶可包括一個主要晶粒取向,其中‘‘主要,,一詞指存 2私靶中之某個晶粒取向比任何單一其他晶粒取向更豐 田。〉王意“主要”不必須指大部分晶粒存在此取向中。而“主 要扎铋靶内沒有單一其他取向較大量存在。在特別觀點 中,可利用本發明方法論產生除(22〇)之外之顯著晶粒取向 的標革巴。 ^ 根據本發明之另一加工法可產生小於任意紋理之銅標 革巴。本發明包括在產生銅物件中引起強紋理之加工,此處 1278525 “強紋理詞指⑽高於約15倍任意值之材料。本發明標革巴 另外:製造4具特徵為⑽高於2G倍任意值之極強紋理。在 特別情況中本發明標乾且除了(22G)之外之主要晶粒取向較 利用根據本發明方法產生之銅標靶大小不受特定值之限 制。此外,標靶可製造成如圖形或矩形之種種形狀。由於 由所述万法製造之材料比傳統方法增加強度,可製造比由 傳統方法論製造者較大之銅標乾大小。如上面之討論,傳 統銅標靶結合至背襯板以提供足夠之強度。本發明材料之 高強度特別有利因為增加之強度可在製造及或㈣過程中 減少或避免標乾之彎曲。此方法論允許利用單塊(非結合) 銅標靶且允許結合及單標靶之較大標靶大小。本發明之結 合或單塊標靶可製造作為種種濺射應用,包括但^限於2〇°〇 mm晶圓加工及300 mm晶圓加工。 雖然本發明之標乾及方法以特定參照鋼及銅合金敘述, 應了解本發明包括其他材料(包括高純度金屬及合金材 料)。對所述方法論之應用特別有利之典型其他材料包括 鋁、鋁合金、鈦、鈦合金、鈕、钽合金、鎳、鎳合金、鉬、 鉬合金、金、金合金、銀、銀合金、鉑及鉑合金。列出之 合金包含小於或等於1〇重量%之合金元素較佳。如熟諳此藝 者所了解,下面所述方法論相關銅材料之溫度及其他值可 以將應用此方法論之特定組合物為基礎調整。 在典型加工方案1〇中欲 工步驟100中提供。最初 本發明方法論一般參照圖1敘述。 加工形成藏射標乾之材料在最初加 !278525 材料可用如圖2描續之典型㈣ 岛12可包含下表面Η、上表面16且可包各H参照圖2, 16間標示為Tl材料之厚度。㈣可為如圖9中所_4與上表面 tr或另一選擇為包含圓柱或其他形狀(未:二正:f2 缚造材料較佳,雖然可考慮其他拓材料在且= ~造材料可提供極純之形式*西為 血荆L甘+ 知乃万,去論屋生之標靶 〆、土上基本上與坯之組成相同之組 妯拉了 S 1 A K此處基本上相同指 材枓不具可偵測到之組成差異。 运12之材料纹理可影變好翌 、 」心音、,又理及/或達成根據本發明產生 2件之所需最終紋理。因此’可提供有利產生銅標把内所 需紋理之最初紋理。提供坯12強紋理為有利的,此處強紋 理為最終物件中所需的。然而應注意可利用本發明另一方 去娜由具強紋理之坯產生弱或極弱之紋理。此外,具弱紋 理之趣可根據本發明之方法論加工以產生具強或極強紋理 您標靶。具特別主要或預定晶粒取向之坯可加工產生具相 同或不同主要預定取向或不具單一預定晶粒取向之標靶。 在特別觀點中,坯12可包含至少99.99重量%之高純度銅材 料。在特別應用中,述12基本上由以重量計99.99%純(4N)、 99.999%純(5N)、99.9999%純(6N)或超過 6N (例如 99.99995%純) 之銅組成、本發明亦包括埋12包含其他可選擇之高純度金 屬如銘、金、銀 '鈥、4s、鎳、顧或鉬之過程。 坯12另一選擇可包括小於99.99%之銅或小於99.99%之上 面所示之任何其他可選擇之金屬。為了容易敘述,坯12此 1278525 後將稱為銅坯雖然應了本發明包括其他可選擇之金屬及其 合金。在一些本發明之觀點中,銅坯12基本上小於99.99% 之銅及至少一種選自由Cd,Ca,Au,Ag,Be,Li,Mg,A1,The alloying element composition of the group consisting of Nb'Re, Mo and Hf is preferred. In particular, at least one alloying element is selected from the group consisting of Ag, A, In, Zn, B, ^, Mg, Sn, Ge, Ti and Zr. Preferably, the total amount of at least one alloying element in the target is at least about 100 卯 111 by weight, preferably at least about 1% by weight. In one case, at least one alloying element may be present at least 10 ppm by weight, preferably about 3%, more preferably less than 2% by weight. The copper alloy sputtering target according to the present invention has an average crystallite size of less than 1 micrometer in a particular viewpoint. Another option for copper alloy sputtering targets can include an average grain size of about 100 microns (preferably less than 50 microns). In some cases, the grain size of the ''copper alloy scale is better than i to the working meter. The application of the method of the present invention can produce, in some cases, an average grain size of less than or equal to plus microns, and in particular from about 5 microns to (four) microns. In addition, the copper alloy standard bag of the present invention has a uniform grain size throughout the standard leather bar or across the standard leather. In special accounts, the average grain size is less than 15% (#4^^<_ is equal to about 15%) throughout the material. In the special case, the standard deviation is less than or equal to (non-uniformity is less than or equal to 1%). Root: The copper alloy of the present invention has a Brinell hardness of at least about 4 Å. In the case of the present invention, the hardness of the invention (4) is greater than about 60 Γ. The bismuth copper alloy has a cross-progressive surface and / or in the entire standard dryness, for example, in the special case, the standard deviation of the entire copper alloy standard bar hardness of 1278525 Ο Sigma) is less than about 5%, 5%). In special cases, the hardness is (::: two leather... ‘sex small sigma). / 勾午爰 is less than about 3.5% (1 the steel of the present invention is Δ-bonded. The second is a monolith or in other embodiments may be - or a plurality of = rr: alloy dry can be combined by diffusion or borrowing = and other suitable: = technology =, two: tin, explosive combination, frictionless forging combination, intrusion, 10,000 ~ to the back of the maple plate. In the copper alloy target ksi better ... <combined fall strength greater than about 10 - and greater than about 15 (: The near-method of processing copper material can be produced by a very weak core copper target, depending on the processing path utilized (in material: for the purposes of the present invention, "copper," ("copper standard dry", "copper invention two (four) use) - generally refers to high-purity copper or copper alloy. According to small; typical copper hiding crystal grain orientation distribution function _), έ: 5 temple at about 15 Any value. In special cases, the target can be extremely weak and reasonable, characterized by an ODF less than 5 times any value. The t target can include a major grain orientation, where ''primary,' One of the grain orientations in the private target is more Toyota than any other grain orientation. > Wang Yi "main" does not have to be large Part of the grains are present in this orientation. "There is no single other orientation in the main target, but a large amount of other orientations are present. In a particular view, the method of the present invention can be used to produce a grain boundary of significant grain orientation other than (22〇). ^ Another processing method according to the present invention can produce a copper-based leather bar having less than any texture. The present invention includes processing to cause strong texture in a copper-generating article, where 1278525 "strong texture word refers to (10) is higher than about 15 times arbitrary. Material of value. The standard of the present invention additionally: manufactures four extremely strong textures characterized by (10) any value higher than 2G times. In special cases, the present invention is dry and the main grain orientation other than (22G) is utilized. The size of the copper target produced according to the method of the present invention is not limited by a specific value. In addition, the target can be manufactured in various shapes such as a pattern or a rectangle. Since the material manufactured by the method is increased in strength compared with the conventional method, the manufacturing ratio can be made. The larger size of the copper standard is produced by conventional methodologies. As discussed above, conventional copper targets are bonded to the backing plate to provide sufficient strength. The high strength of the materials of the present invention is particularly advantageous because of the increase In addition, the strength can be reduced or avoided in the manufacturing and/or (d) process. This methodology allows for the use of monolithic (unbound) copper targets and allows for larger target sizes for binding and single target. Monolithic targets can be fabricated for a variety of sputtering applications, including but limited to 2°° mm wafer processing and 300 mm wafer processing. Although the standard and method of the present invention are described in terms of specific reference steels and copper alloys, it should be understood The invention includes other materials, including high purity metals and alloy materials. Typical other materials that are particularly advantageous for use in the methodology include aluminum, aluminum alloys, titanium, titanium alloys, knobs, niobium alloys, nickel, nickel alloys, molybdenum, Molybdenum alloys, gold, gold alloys, silver, silver alloys, platinum and platinum alloys. It is preferred that the alloys listed contain less than or equal to 1% by weight of alloying elements. As will be appreciated by those skilled in the art, the temperature and other values of the method-related copper materials described below can be adjusted based on the particular composition to which the methodology is applied. It is provided in the desired step 100 in a typical processing scheme. Initially, the methodology of the present invention is generally described with reference to FIG. The material that is processed to form the Tibetan standard dry is initially added! 278525 The material can be as shown in Figure 2. (4) The island 12 can include the lower surface Η, the upper surface 16 and can be packaged with each H. Referring to Figure 2, 16 is labeled as Tl material. thickness. (4) It may be as shown in Fig. 9 with the upper surface tr or another selected to contain a cylinder or other shape (not: two positive: f2 binding material is better, although other extension materials may be considered and the material may be Providing a very pure form * West is Blood Jing L Gan + Zhi Nai Wan, to the target of the housing estate, the soil is basically the same as the composition of the blank. S 1 AK here basically the same reference枓There is no detectable difference in composition. The texture of the material of Figure 12 can be changed, "heart sound," and/or achieve the desired final texture of 2 pieces according to the present invention. The initial texture of the desired texture within the label. It is advantageous to provide a strong texture of the blank 12, where the strong texture is required in the final object. However, it should be noted that the other side of the invention can be used to produce a weak texture from a strong textured blank. Or extremely weak texture. In addition, the interest of weak texture can be processed according to the methodology of the present invention to produce a target with strong or extremely strong texture. A blank with a particular primary or predetermined grain orientation can be processed to produce the same or different primary Oriented or not having a single predetermined grain orientation In particular, the blank 12 may comprise at least 99.99% by weight of a high purity copper material. In a particular application, 12 is substantially 99.99% by weight pure (4N), 99.999% pure (5N), 99.9999% by weight. Pure (6N) or more than 6N (e.g., 99.99995% pure) copper composition, the present invention also includes the process of burying 12 other high purity metals such as Ming, Jin, Silver '鈥, 4s, nickel, Gu or molybdenum. Another option for the blank 12 may include less than 99.99% copper or less than 99.99% of any other selectable metal shown above. For ease of description, the blank 12 will be referred to as a copper blank, although the invention includes other Selected metals and alloys thereof. In some aspects of the invention, the copper blank 12 is substantially less than 99.99% copper and at least one selected from the group consisting of Cd, Ca, Au, Ag, Be, Li, Mg, A1,
Pd,Hg,Ni,In,Zn,B,Ga,Mn,Sn,Ge,W,Cr,〇,Sb,Pd, Hg, Ni, In, Zn, B, Ga, Mn, Sn, Ge, W, Cr, 〇, Sb,
Ir,P,As,Co,Te,Fe,S,Ti,Zr,Sc,Si,Pt,Nb,Re、Mo 及Hf組成之群之合金元素組成較佳。銅坯中合金元素之總 量為以重量計至少100 ppm至小於或等於約10%較佳。在特 別觀點中,銅述包含以重量計至少1000 ppm至小於或等於約 3%之合金元素較佳,或以重量計小於或等於約2%之總合金 元素更佳。在特別具體實施例中合金元素可包含一或多種 之 Ag,Al,In,Zn,B,Ga,Mg,Sn,Ge,Ti及Zr車交佳。 再次參照圖1,步驟100提供之銅坯經初步處理200。初步 處理200可包含均勻化、溶液化及熱鍛造之至少一項。如熟 諳此藝者將了解的,進行溶液化、均勻化或熱鍛造之適當 溫度可視坯12之特定組成而定。在特別觀點中,本發明在 初步處理200中包括熱鍛造以形成鍛塊較佳。銅坯12之熱鍛 造在至少約300°C之溫度進行,而以在至少約500°C之溫度進 行較佳。熱鍛造減少坯12之最初厚度(圖2之1)至少約40%較 佳,而在特別情況中至少約50%較佳。 在初步處理時,熱鍛造可視需要在包含溶液化及/或均勻 化銅材料之額外熱處理之前或之後。熱處理可在欲處理特 別組合物中足以引起溶液化及/或均句化發生之溫度下進 行。這溶液化/均勻化溫度維持足以最大化組合物之溶液化 及/或均勻化之時間較佳。應注意足以溶液化或均勻化之溫The alloying element composition of the group consisting of Ir, P, As, Co, Te, Fe, S, Ti, Zr, Sc, Si, Pt, Nb, Re, Mo and Hf is preferred. The total amount of alloying elements in the copper billet is preferably at least 100 ppm by weight to less than or equal to about 10%. In particular, it is preferred that the copper comprises at least 1000 ppm by weight to less than or equal to about 3% of the alloying element, or less than or equal to about 2% by weight of the total alloying element. In a particular embodiment, the alloying elements may comprise one or more of Ag, Al, In, Zn, B, Ga, Mg, Sn, Ge, Ti and Zr. Referring again to FIG. 1, the copper blank provided in step 100 is subjected to preliminary processing 200. The preliminary treatment 200 can include at least one of homogenization, solubilization, and hot forging. As will be appreciated by those skilled in the art, the appropriate temperature for solubilization, homogenization or hot forging may depend on the particular composition of the blank 12. In a particular aspect, the invention preferably includes hot forging in the preliminary treatment 200 to form a forged block. Hot forging of the billet 12 is carried out at a temperature of at least about 300 ° C, preferably at a temperature of at least about 500 ° C. Hot forging reduces the initial thickness of the blank 12 (1 of Figure 2) by at least about 40%, and in particular, at least about 50% is preferred. At the time of initial processing, hot forging may be required before or after additional heat treatment comprising solubilizing and/or homogenizing the copper material. The heat treatment can be carried out at a temperature sufficient to cause solubilization and/or homogenization in the particular composition to be treated. This solubilization/homogenization temperature is preferably maintained for a time sufficient to maximize solubilization and/or homogenization of the composition. Pay attention to the temperature sufficient for solubilization or homogenization
-15 - Ϊ278525 度可造成產生晶粒大小大於、 ^ 晶# 士、且 、万;、’力1 〇 〇微米之所兩问、 曰4成長。因此’企圖達成較 彳而靶圍之 最小化溶液化或均勾化處理。^…傳_方法傾向 。。午均勾化/溶液化後晶粒 〈万法sw 化/均勻化處理及小曰_ 士, 減^猎以同時達到溶液 中溶液化及/或均^7 # A # 處。在初步處理步驟200 叫粒子均::^ 離。 —— 毛、外減少或除去坯12中之化學分-15 - Ϊ278525 degrees can cause the occurrence of grain size greater than, ^ crystal #士, and 10,000;, 'force 1 〇 〇 micron two questions, 曰 4 growth. Therefore, it is attempted to achieve a more targeted and minimized solution or homogenization treatment. ^...pass _ method tends. . In the afternoon, the grains are squashed/smelted and the grains are squashed and homogenized, and the sputum is reduced, and the shovel is reduced to achieve solution and/or both at the same time. In the preliminary processing step 200, the particles are all ::: ^ away. - reduce or remove the chemical components in the blank 12
::明:初步處理過程不限於均勻化、溶液化 =理^特別順序。在㈣觀M,初 ^ Γ造後之銅这之均句化及隨後之溶液化。在其他; :’溶液化在熱鍛造之後進行。典型之較佳初步處理: 本發明之典型較佳具體實施例之敘述陳述。 在當熱鍛造在初步處理2〇〇中進行之一些情況中 理可額外包括熱鍛造後之淬火,❼以鍛造後立刻進^:: Ming: The preliminary treatment process is not limited to homogenization, solutionization = rational order. In (4) view M, the initial sentence of the copper after the formation of the sentence and subsequent solubilization. In other; :' The solubilization is carried out after hot forging. Typical Preferred Preliminary Processing: A narrative statement of a typical preferred embodiment of the invention. In some cases when hot forging is carried out in the preliminary treatment, it may additionally include quenching after hot forging, and the forging is immediately after forging.
佳。Μ可利用其他可選擇之淬火技術,以利用水淳火 佳。 、在特別具體實施例中,熱鍛造可包括一段最初加熱且可 〔行或更多之隨後再加熱事件。在每一鍛造事件中最初 加熱及每一隨後之再加熱間產生之高度減少可隨如特別之 組成及利用之鍛造溫度之因子而變化。進行之任何淬火只 在最終再加熱後發生較佳。典型之再加熱可包含一或多次 再加熱鍛造塊至1400卞之溫度至少約1〇分鐘隨後做最初熱 麵造。 -16 - 1278525 除了上面敘述之過程之外,初步處理2〇〇可視需要包各時 效處理。當初步處理包含時效時,坦12在時效前加工二為 鍛造塊較佳。時效在前處理階段中最終步驟進行更佳。在 特別情況中,可利用時效以引起銅材料内微細沉澱之形 成。這類引起之沉殿之平均直徑小於約Q5微米。在特別應 用中,藉時效引起沉澱為有利的因為這類沉澱可在隨後二 加工中促進微細及均一晶粒之發展且可安定如此產生之晶 粒結構。 在初步處理200中形成之熱鍛造及/或溶化塊隨後經歷如 圖丨所示之其他可選擇之加工。在一觀點中,經加工塊$經 等徑轉角擠形(ECAE)加工310形成標靶之靶心。參照圖3, 這描述典型之ECAE裝置20。裝置2〇包含界定一對相交通道 24及26ι模具組合22。相交通道24及26在剖面上相同或基本 上相同,“基本上相同” 一詞指通道在£(:八]£裝置可接受之公 差内為相同的。在操作中,擠壓坯28 (可為上面所述之鍛造 塊)通過通道24及26。這樣之擠壓藉位於通道之交叉平面薄 區中之男力一層接著一層造成坯之塑性變形。雖然通道Μ 及26以約90。之角度交叉較佳,應了解可利用其他可選之工 具角度(未顯tf )。約90。之工具角度(通道交叉角度)較佳因 為可達到最佳之變形(真實之剪應變)。 ECAE可在鍛造塊材料中導入嚴重之塑性變形,同時其尺 寸未改變。ECAE對在金屬材料中引起嚴重之應變為較佳之 方法’在其中在低負載及壓力下利用ecae引起嚴格之均_ 且均勻之應變。此外,ECAE可達到每次通過之高變形(真實 1278525 應變8J1·17),以多次通過ECAE裝置(N=4次通過,ε = 4.64)可 ^到冋聚—集之應變’且可利用在材料内藉利用不同之變形 路徑(即藉在通過ECAE裝置間改變鍛造塊之取向)產生種種 紋理/微結構。 〜在本發明之典型方法中,ECAE在足以在銅坯或鍛造塊θ 得到所需微結構(例如弱紋理及小晶粒大小)及在整個&巾; 、生句底力-應變狀態之應變速率及加工溫度下進行。銅 =料以11牛夕路徑及符合冷或熱加工材料的溫度通過ECAE 裝置數次:利用多次通過ECAE裝置20之較佳路徑可為“路徑·· D在每—連續通過前符合固定90。旋轉。因為ECAE路徑 在動態再結晶中可影響產生之結構取向,可選擇一或多種 特別路徑作變形通過以引起加工材料中所需之取向。 在特別應用中,在步驟2〇〇中加工之鍛造塊在過程31〇中經 — 至少四次ECAE通過。典f ±,ECAE加工31〇包含4至8次通 - 過而以包含4至6次通過較佳。已發現一般這樣之典型數 目足以藉機械引起動態再結晶促進晶粒精製至次微米之大 小(此處次微米指平均晶粒大小小於丨微米)。 典型上,ECAE通過由1至3次每次連續地產生缺陷(微帶、' 男力帶、列陣之差排等)。在這些最初通過中,熱力重排發 ·. 生產生小室及次晶粒及最初不利取向之晶粒邊界。£(:八£前 材料之紋理強度可影響在最初3次通過中產生之強度,具強 最初紋理者比具弱最初紋理之材料典型上在大數目之通過 後變凌亂的。隨後之通過(即第4次通過及任何額外之通過) 藉引起大角度邊界數目之增加產生動態再結晶之次微米晶 -18- 1278525 才大]在動怨再結晶中,新產生之晶粒逐漸地得到較弱 之纹理且逐漸變成等軸的。 - 在一些應用中,在ECAE通過中可利用加熱ecae裝置模具 : 加f坯2曰8。杈具可加熱至小於產生受加工銅材料之靜態再 、’日日之最低/皿度(另一稱呼為最小再結晶溫度)較佳,而以-加熱至約125t至約350。(:之溫度更佳。 , 在ECAE加工310中,中間退火可視需要在一些或所有 ECAE通過間執行。中間退火可在低於靜態再結晶之開始溫_ 度,在或接近靜態再結晶之開始溫度(定義為開始引起受加 工材料再結晶之最低溫度)或在組合物完全靜態再結晶之 溫度範圍内執行。中間退火進行之溫度可影響晶體晶粒之 大小及取向且可因此利用作為促進在指定情況中所需之纹 - 理。good. Μ Other alternative quenching techniques can be utilized to take advantage of the water. In a particular embodiment, hot forging can include a period of initial heating and a subsequent reheating event. The height reduction produced between the initial heating and each subsequent reheating in each forging event may vary with factors such as the particular composition and the forging temperature utilized. Any quenching that takes place is preferred only after the final reheating. Typical reheating may include one or more reheating of the forged mass to a temperature of 1400 Torr for at least about 1 minute followed by initial hot forming. -16 - 1278525 In addition to the process described above, the initial processing 2 can be visually processed as needed. When the preliminary treatment involves aging, it is preferred that Tan 12 is a forged block before aging. The aging is better in the final step in the pre-processing stage. In special cases, aging can be utilized to cause the formation of fine precipitates in the copper material. The resulting diameter of the sinks of this type is less than about Q5 microns. In special applications, it is advantageous to cause precipitation by aging because such precipitation promotes the development of fine and uniform grains in the subsequent two processes and stabilizes the crystal structure thus produced. The hot forged and/or melted block formed in the preliminary treatment 200 then undergoes other alternative processing as shown in FIG. In one aspect, the machined block $ is formed by an equal diameter corner extrusion (ECAE) process 310 to form the target's bullion. Referring to Figure 3, this depicts a typical ECAE device 20. Apparatus 2 includes a pair of intersecting channels 24 and 26 ι mold combination 22. The intersecting passages 24 and 26 are identical or substantially identical in cross-section, and the term "substantially identical" means that the passage is the same within a tolerance acceptable to the device. In operation, the blank 28 is extruded. For the forged block described above, it passes through channels 24 and 26. Such extrusion causes plastic deformation of the blank by a layer of men in the thin plane of the intersecting plane of the channel, although the channels Μ and 26 are at an angle of about 90. The crossover is better, it should be understood that other optional tool angles can be used (not shown tf). Approximately 90. The tool angle (channel crossing angle) is better because the best deformation (true shear strain) can be achieved. ECAE can be Severe plastic deformation is introduced into the forged block material, and its size is not changed. ECAE is a better method for causing severe strain in metal materials, in which ecae is used to cause strict uniformity and uniform strain under low load and pressure. In addition, the ECAE can achieve a high deformation per pass (true 1278525 strain 8J1·17), and multiple passes through the ECAE device (N=4 passes, ε = 4.64) can reach the convergence of the set-up Use in material Various textures/microstructures are created by utilizing different deformation paths (ie, by changing the orientation of the forged blocks between ECAE devices). ~ In the typical method of the present invention, the ECAE is sufficient to obtain the copper blank or forged block θ. Microstructures (such as weak texture and small grain size) and are carried out under the entire &towel; the base strain-strain state strain rate and processing temperature. Copper = material in 11 夕 path and in accordance with cold or hot processed materials The temperature is passed through the ECAE device several times: the preferred path for multiple passes through the ECAE device 20 can be "path · D in each - continuous pass before the fixed 90 rotation. Because the ECAE path can be affected in dynamic recrystallization Structural orientation, one or more special paths may be selected for deformation to cause the desired orientation in the processed material. In a particular application, the forged block processed in step 2 is passed through process 31〇 - at least four ECAE passes Code f ±, ECAE processing 31 〇 contains 4 to 8 passes - and preferably contains 4 to 6 passes. It has been found that the typical number is generally sufficient to promote grain refinement by mechanically causing dynamic recrystallization. The size of the next micron (where the submicron refers to the average grain size is less than 丨 microns). Typically, ECAE produces defects (microstrip, 'man's belt, array') by successively producing defects from 1 to 3 times. Etc.) In these initial passes, the heat is rearranged to produce the grain boundaries of the primary and secondary grains and the initial unfavorable orientation. £(: The texture strength of the material before the eight can affect the initial 3 passes. The strength of a material with a strong initial texture is typically more messy than a material with a weak initial texture. Subsequent passes (ie, the 4th pass and any additional passes) cause an increase in the number of large-angle boundaries. The submicron crystals that produce dynamic recrystallization are large. In the re-crystallization, the newly formed grains gradually get a weaker texture and gradually become equiaxed. - In some applications, the heated ecae device mold can be used in the ECAE pass: plus the blank 2曰8. The cookware can be heated to a temperature less than the static of the processed copper material, 'the lowest day/dish of the day (the other is referred to as the minimum recrystallization temperature), and is heated to about 125t to about 350. (The temperature is better.) In ECAE processing 310, intermediate annealing may be performed between some or all of the ECAE passes. Intermediate annealing may be below the onset of static recrystallization, at or near the beginning of static recrystallization. The temperature (defined as the lowest temperature at which the recrystallization of the material to be processed begins to occur) or within the temperature range in which the composition is completely static recrystallized. The temperature at which the intermediate annealing is carried out can affect the size and orientation of the crystal grains and can therefore be utilized as a Specify the pattern required in the situation.
在可產生完全靜態再結晶之溫度下之中間退火可讓更多 之紋理弱化在隨後ECAE通過中發生。在低於靜態再結晶之 開始溫度之溫度的退火可產生亦造成紋理強度及取向上改 變之回復(應用力釋放)。再取向效應當次結晶化溫度退火 在一或多次最初4次通過間執行時最大,而當在第4次通過 後之通過間執行時變得較不顯著。在靜態再結晶之開始溫 度之中間退火可同時造成紋理(強度及/或取向)及一些再結 晶上之改變。在連續通過間重複之中間退火可比個別退火 事件所述之效應有加強效應。 在本發明之特別應用中在小於可造成受加工材料靜態再 結晶之溫度及時間下進行任何中間退火為較佳的。在低於 -19- 1278525 引起靜態再結晶之溫度進行中間退火為有利的,以便將表 面裂缝最小化及增強結構均一性。當受ECAE之鍛造塊包含 高純度銅時,中間退火在約125°C至約225°C之溫度及比約1 小時長之時間下進行較佳。這讓ECAE加工3 10產生具極均一 且小晶粒大小(例如平均為次微米晶粒大小至約20微米)之 向純度銅材料。 在本發明之觀點中當鍛造塊材料包含銅合金時,在ECAE 加工310中執行次結晶溫度中間退火可包含約150°C至約325 °C之溫度較佳,這樣之溫度維持至少1小時較佳。此次再結 晶溫度退火處理可產生平均晶粒大小小於1微米之銅合金 材料。 上述ECAE法產生之高純度銅及銅合金材料比傳統加工 技術產生之材料具改良之硬度。根據本發明方法論加工之 6N銅及種種銅合金之最終硬度與相同材料ECAE前之比較 列在表1中。圖4比較根據本發明方法論加工之高純度銅及 種種銅合金之降伏強度及極限抗張強度,以及晶粒大小為 40微米之6N銅與種種背襯板材料。 表1 : ECAE處理在材料晶粒大小及硬度上之影響 ECAE前之材料 (晶粒大小30-50 μιη) 硬度 (維克氏) ECAE後平均 晶粒大小 ECAE後硬度 (維克氏) 硬度增加率 6Ν銅 48.44 HV 5 μΐΉ 72.2 HV 49% 6Ν Cu+0.8% Ag 73.02 HV 4 μηι 89.88 HV 23% 6N Cu+0.8% Ag 73.02 HV 0.3 5 μιτι 172.4 HV 136% 6N Cu+0.5% Sn 75 HV 4 μιτι 104.56 HV 39.4% 6N Cu+0.5% Sn 75 HV 0.35 μηι 182 HV 142% -20 - 1278525 在初步處理200後,銅材料可經歷包含壓軋過程之另一可 選擇路徑330以產生標靶靶心(如圖1所示)。壓軋處理330包 含使由初步處理220產生之鍛造塊受總共減少60%之冷乳較 佳,而以60°/。至85%較佳。冷卻可包含大於4次之通過,以 大於8次通過較佳而以8至16次通過更佳。在全邵之壓乳過 程中,每一次之最初4次通過以每次通過減少锻造塊之厚度 約5%至約6%下進行較佳。此外最後4次壓軋通過每次產生 約10%至約20%之厚度減少為較佳的。在最初4次通過中較 小之減少緩和或避免壓軋過程中之裂缝。壓軋可在產生之 冷軋高純度銅或銅合金材料中產生小晶粒大小。 對上面加工路徑之另一選擇為加工路徑320可如圖1所示 進行。路徑320利用冷軋及等徑轉角擠形技術之組合。在本 發明觀點中當利用加工選擇320時,將初步處理200產生之熱 鍛造塊受ECAE及隨後之冷軋處理為較佳的。然而,應了解 本發明打算在ECAE之前或同時在ECAE之前及之後執行冷 軋。 過程320之ECAE部分可包含上述之ECAE加工法。ECAE擠 出之材料隨後可冷軋至小於90%之減少率以形成靶心。在特 別之情況中,路徑320之冷軋部分產生至少約60%之減少率 較佳。ECAE擠出材料之冷軋加工可包含相關壓軋加工330 之上述壓軋過程。在特別觀點中,路徑320可結合鍛造與壓 軋以產生至少60%且小於90°/。之總減少率。另一選擇為可利 用鍛造過程在沒有壓軋下產生60%至90%之所需減少率。 結合ECAE與隨後壓軋及/或鍛造過程為有利的,因為這樣 1278525 之加工可引起所需之晶粒取向至銅材料中。引起之取向可 包含主要晶粒取向或可包含最顯著之晶粒取向。可使用壓 乳及/或锻造產生本發明銅物件内強或極強之纹理。在一些 觀點中,ECAE後壓軋/鍛造產生之強紋理將是(220)之外的紋 理。 包含銅或銅合金之產生的乾心可經歷最終標形成加工 500且可視需要在最終標靶形成500之前經歷額外之熱處理 過程400 (如圖1中所示)。視需要之熱處理過程400可包含在 小於引起靜態再結晶之開始溫度及時間下進行退火處理。 低溫退火(亦稱為回復退火)在低於靜態再結晶之最小溫度 下進行。回復退火或視需要不做退火對維持極小之晶粒大 小為有利的。這樣低之溫度或無退火可造成小於約1微米之 平均晶粒大小的靶心。 另一可選擇的是靶心可受等於或超過引起再結晶之最低 溫度之溫度一段足以形成靶心内最終晶粒分佈之時間。雖 然靜態再結晶可增加晶粒大小,此增加可藉進行接近再結 晶最低溫度之退火一段產生所需量之再結晶(部分或完全 再結晶)之最小時間最小化。銅合金之再結晶退火以約350 °C至約500 °C之溫度約1小時至約8小時之時間下進行較 佳。高純度銅之再結晶退火在約225°C至約300°C之溫度約1 小時至約4小時之時間下進行較佳。Intermediate annealing at temperatures that produce complete static recrystallization allows more texture weakening to occur in subsequent ECAE passes. Annealing at temperatures below the onset temperature of static recrystallization can also result in a change in texture strength and orientation (applied force release). The reorientation effect is greatest when the secondary crystallization temperature anneal is performed between one or more initial four passes, and becomes less significant when performed between passes after the fourth pass. Annealing at the onset temperature of static recrystallization can simultaneously cause texture (strength and/or orientation) and some changes in recrystallization. The intermediate annealing repeated between successive passes may have a reinforcing effect than the effect described by the individual annealing events. In the particular application of the invention it is preferred to carry out any intermediate annealing at temperatures and times which would result in static recrystallization of the material being processed. It is advantageous to perform an intermediate anneal at a temperature below -19-1278525 which causes static recrystallization to minimize surface cracking and enhance structural uniformity. When the forged block of ECAE comprises high purity copper, the intermediate annealing is preferably carried out at a temperature of from about 125 ° C to about 225 ° C and for a period of time of about one hour. This allows the ECAE process 3 10 to produce a directionally pure copper material having a very uniform and small grain size (e.g., an average submicron grain size to about 20 microns). In the view of the present invention, when the forged block material comprises a copper alloy, it is preferred to perform the sub-crystallization temperature intermediate annealing in the ECAE process 310 to include a temperature of from about 150 ° C to about 325 ° C, such that the temperature is maintained for at least 1 hour. good. This recrystallization temperature annealing process produces a copper alloy material having an average grain size of less than 1 micron. The high purity copper and copper alloy materials produced by the above ECAE process have improved hardness compared to materials produced by conventional processing techniques. A comparison of the final hardness of 6N copper and various copper alloys processed according to the methodology of the present invention with that of the same material before ECAE is shown in Table 1. Figure 4 compares the drop strength and ultimate tensile strength of high purity copper and various copper alloys processed in accordance with the methodology of the present invention, as well as 6N copper and various backing sheet materials having a grain size of 40 microns. Table 1: Effect of ECAE treatment on grain size and hardness of materials. Material before ECAE (grain size 30-50 μιη) Hardness (Vickers) Average grain size after ECAE Hardness after ECAE (Vickers) Hardness increase Rate 6 Ν copper 48.44 HV 5 μΐΉ 72.2 HV 49% 6Ν Cu+0.8% Ag 73.02 HV 4 μηι 89.88 HV 23% 6N Cu+0.8% Ag 73.02 HV 0.3 5 μιτι 172.4 HV 136% 6N Cu+0.5% Sn 75 HV 4 μιτι 104.56 HV 39.4% 6N Cu+0.5% Sn 75 HV 0.35 μηι 182 HV 142% -20 - 1278525 After preliminary treatment 200, the copper material may undergo another alternative path 330 including a rolling process to produce a target bullion (eg Figure 1). The embossing process 330 comprises forging the forged mass produced by the preliminary treatment 220 by a total of 60% reduction in cold milk, and at 60°/. Up to 85% is preferred. Cooling may include more than 4 passes, preferably more than 8 passes and preferably 8 to 16 passes. In the total squeezing process, the first four passes of each pass are preferably carried out at a reduction of from about 5% to about 6% of the thickness of the forged block. Further, the last four presses are preferably reduced by a thickness reduction of from about 10% to about 20% each time. Smaller reductions in the first 4 passes reduce or avoid cracks during the rolling process. Rolling produces small grain sizes in the resulting cold rolled high purity copper or copper alloy materials. Another option for the upper processing path is that the processing path 320 can be performed as shown in FIG. Path 320 utilizes a combination of cold rolling and equal diameter corner extrusion techniques. In the present invention, when the processing option 320 is utilized, it is preferred that the hot forged block produced by the preliminary process 200 is subjected to ECAE and subsequent cold rolling. However, it should be understood that the present invention contemplates performing cold rolling before or after ECAE before and after ECAE. The ECAE portion of process 320 can include the ECAE processing described above. The material extruded from the ECAE can then be cold rolled to a reduction of less than 90% to form the bullseye. In particular, the cold rolled portion of path 320 produces a reduction of at least about 60%, preferably. The cold rolling of the ECAE extruded material may include the above-described rolling process of the associated embossing process 330. In a particular aspect, path 320 can be combined with forging and rolling to produce at least 60% and less than 90°/. The total reduction rate. Another option is to use the forging process to produce a desired reduction of 60% to 90% without nip. Combining ECAE with subsequent nip and/or forging processes is advantageous because such processing of 1278525 can cause the desired grain orientation into the copper material. The resulting orientation may comprise a predominantly grain orientation or may comprise the most significant grain orientation. Pressurization and/or forging can be used to produce a strong or strong texture within the copper article of the present invention. In some views, the strong texture produced by post-ECAE embossing/forging will be a texture other than (220). The dry core comprising the copper or copper alloy may undergo a final target forming process 500 and may optionally undergo an additional heat treatment process 400 (as shown in Figure 1) prior to final target formation 500. The heat treatment process 400 as desired may include annealing at a temperature and time less than the onset of static recrystallization. Low temperature annealing (also known as recovery annealing) is carried out at a minimum temperature below static recrystallization. Re-annealing or annealing as needed is advantageous to maintain a very small grain size. Such low temperatures or no annealing can result in a bulls-eye having an average grain size of less than about 1 micron. Alternatively, the target may be subjected to a temperature equal to or greater than the lowest temperature at which recrystallization occurs for a period of time sufficient to form a final grain distribution within the target. Although static recrystallization increases the grain size, this increase can be minimized by the minimum time to produce the desired amount of recrystallization (partial or complete recrystallization) by annealing at a temperature close to the recrystallization minimum temperature. The recrystallization annealing of the copper alloy is preferably carried out at a temperature of from about 350 ° C to about 500 ° C for from about 1 hour to about 8 hours. The recrystallization annealing of the high purity copper is preferably carried out at a temperature of from about 225 ° C to about 300 ° C for from about 1 hour to about 4 hours.
圖5及6顯示使用根據本發明方法論之ECAE及隨後在250 °C退火5小時產生之平均晶粒大小為約6微米之6N銅的晶粒 大小及分佈。圖7顯示晶粒大小之演變為退火前經6次路徑D -22 - 1278525 之ECAE之與0.53% Mg合金化之銅的熱處理之函數。圖8顯示 圖7之銅/0.53% Mg合金在300°C退火2小時後之晶粒大小及 分布。圖9及圖10顯示圖7之銅/0.53% Mg合金在450°C退火1.5 小時後之晶粒大小及分佈,使用EBSD/SEM (圖9及光學顯微 鏡(圖10)分析。Figures 5 and 6 show the grain size and distribution of 6N copper having an average grain size of about 6 microns produced using the ECAE according to the methodology of the present invention and subsequently annealed at 250 °C for 5 hours. Figure 7 shows the evolution of grain size as a function of heat treatment of copper alloyed with 0.53% Mg alloyed by ECAE of 6 passes D -22 - 1278525 before annealing. Figure 8 shows the grain size and distribution of the copper/0.53% Mg alloy of Figure 7 after annealing at 300 °C for 2 hours. Figures 9 and 10 show the grain size and distribution of the copper/0.53% Mg alloy of Figure 7 after annealing at 450 °C for 1.5 hours, using EBSD/SEM (Figure 9 and optical microscopy (Figure 10) analysis.
應注意任選其一之步驟310,32〇或33〇中產生之靶心可在 沒有熱處理步驟400或在熱處理步驟4〇〇後受時效處理(未顯 不)。當利用時效時,時效在小於約5〇(rc之溫度執行。如 上面所指示執行時效步驟藉引起平均沉澱大小小於約〇·5微 米之微細沉澱增加銅或銅合金靶心之強度。 由本务月方法產生之向純度銅或銅合金乾心可受最終標 &形成500以產生單塊標革巴或另—選擇產生結合標革巴(此處 結合標靶”指結合至如背襯板之支撐的濺射標靶)。It should be noted that the optional target 310, 32 〇 or 33 靶 can be aged (not shown) after the heat treatment step 400 or after the heat treatment step 4 . When aging is utilized, the aging is performed at a temperature of less than about 5 Torr (rc). Performing the aging step as indicated above increases the strength of the copper or copper alloy bullseye by causing a fine precipitate having an average precipitate size of less than about 〇5 microns. The method produces a purity copper or copper alloy dry core which can be subjected to a final standard & 500 to produce a monolithic standard or alternatively - to produce a bonded standard leather (here, the binding target) means to be bonded to, for example, a backing sheet. Supported sputtering target).
田過矛王500中形成〈取終標革巴為單塊標革巴時,最終標革巴形 成可包含例如機械力口工乾心產生所需之標革巴形狀。當由本 發明万法論產生之躲用作半導體晶圓加 步驟500可包含大小適人 ^ ^ ,^ ^ ^ 口 00 mm印圓或加工300 mm晶圓 之和巴、〇根據本發明可用於例如加工200 mm半導髀 晶圓之典型單塊銅 :丰導- 於力…。。職晶圓之寸且厚度為約。·89叶。可用 曰曰圓又相付標靶之濺射表面直 面直徑為20.7吋且屋_! λ丄 且仏為17·5对、冃 塊標靶為平面俨“由本發明方法論形成之單 塊祆靶為千面禚靶較佳’雖然可考/ 他可選擇之大小。 拎靶形狀以及其 -23 - 1278525 根據本發明古i 、 、 剛屋生之單塊標乾之晶粒大小小於或等 於約50微米較佳以便曰 f ^革巴^度取大化。具次微米晶粒大 小 < 本發明單塊標| 卩牛伙強度,極限抗張強度(UTS)及硬 度比平均晶粒大為3〇微 U未4基本上相同組成的標靶大至少 約5〇%。根據本發明產 σ 生王卞叼印权大小為1至小於20微米之 :二‘靶比傳統銅標靶強度增強至少10%。對極大之單塊 需要最大標㈣度之應用,單塊標乾在沒有熱處理 f 〇曰下屋生較佳。因Λ,產生單塊標靶維持前面加工產 ' 半大】例如,當次微米晶粒大小利用壓軋及/或 生時,在最終單塊標乾中可維持次微米晶粒大小將 禚靶強度最大化。在另一^ ^彳 T違擇又硯點中,在加工中可利 ,理步驟400產生可產生使產生單塊標乾中平均晶粒 小為约m米至約20微米之最終晶粒分佈之單塊標革巴。 當步驟500產生之椁|巴 > 纟士人拆# & 、立 知粑為、々口軚靶時,標靶形成可包含除 了為了形成期望標靶形狀而執行之任何機械加工之外:社 合步驟。結合過程可包含將先前加工法形成之乾心結合至 如背襯板之支撐。典型背襯板可包含例如銘及/或銅。血刑 ^現板材料為㈤、A1胸及A1606 i T4。結合過程可包各 -或多種之怪壓、壓乾、包覆、焊錫、爆炸結合、血摩捧 锻造、擴散結合或熟諳此藝者所知的其他可選擇方法。处 :過程可產生降伏強度至少约10 ksi之結合。在特別情況 ’結合過程產生大於或等於m5ksi之結合強度且在特定 應用中,產生之結合強度等於或超過3〇 ksi。 可利用上述種種加工法產生極均一且小晶粒大小之銅物 -24- Ϊ278525 2。產生之晶粒大小平均常為次微米至龙附、# ,, 大小讓極高之沾人$ _ 1 〃、附近。此小晶粒 门又〜3強度達到因為可利用高⑽ 造結合標乾砗 ^酿、、^ β法。在製 ▽靶時,加熱(熱處理400)可與標 合合併。 .、祀元成過程中之結 根據本务明方法之高純度 約聊之溫度小於或等於約4小時之;=小於或等於 中晶粒成長最小化。雖然在高溫社:執行將標標革巴 晶粒成長,最初極細之晶粒大小;: = 些 Α利用值姑4 一印I成長發生而不 在牙』用傳統加工法形成之標 士小。力太穴τ座玍軏大又硯察到之晶粒 在本&明之最終結合標財丨至約 大小讓強度比傳統銅標乾增強至少10%。 曰4 結合銅合金標I >形士 、 再結晶者下,佳、 度及時間小於產生完全靜態 9 仃。廷樣 < 結合包含在小於約400t:之、产、佳 行結合4小時較佳,而以小於 4〇〇〜度進 々、JJU u進仃1-4小時#佳。 另-選擇為結合可包含造 含高於特定合全粤〜拓从 土卉、.'口印义/皿度。在包 怨再'°晶之最低溫度之溫度的結合中, 將結合4溫度及陆卩卩異f μ _ 的n士入Γ 化精以將晶粒成長最小化為所需 的。在結合中私& 一 $ ^丄而 " 再、、'日曰使銅合金中產生之平均晶粒大 小為1 土为20微米較佳。這 6 ^^ &凡全再結晶之熱處理在約200 C之丨皿度至少約1小時下推 守下進仃較佳,而在350°C至500°C間大 於1小時之時間較佳。 合併加熱及結合過赶> & #足外的另一選擇為熱處理可在結合 步驟(即熱處理4〇〇)夕访弋+力丄人卜 疋則或在結合步驟後進行。合併結合及 熱處理為有利的以增強社八 曰城d 度及將銅或銅合金材料再結 1278525 曰曰 根據本發明方法論形级 用傳統法形成之結合女:口鋼及結合銅合金標靶比利 一些本發明觀點中對結人、加〈結合強度。擴散結合在 乾心之晶粒大小為次二為較佳的。當標乾 可產生極高強度之擴散結合。Q4起細晶粒之增強擴散性 為15 ksi或更高,左—I 13。產生之擴散結合之降伏強度 之結合銅及銅合金標2 於或超―本發明 對標革巴彎曲之抵抗力、減少電=革巴〈額外優點包括改良 應用可提供改良品皙之 ^ 。利用本發明標靶作濺射 提供較佳均—性之:厂:及具::=在其中之粒子的膜且可 外,利用根據本發明方法論形= = ==—性。此 改良之膜厚及阻抗之晶圓至晶:導體加工提供 式::,發明万法論形成之單塊高純度銅及銅合金標乾之 用其他可選擇方法論形成之傳統結合銅及銅 二二,0%。典型上長40%。達到單塊銅標乾之能 力可避:在傳統結合綱生之去結合(與背襯板分離)。 根據本發明 < 單塊標靶額外具有對標靶彎曲增加之抵抗 力、減少之電弧、減少之由這類標靶濺鍍之薄膜產生之= 子、增強之膜厚度及阻抗之均一性。此外,根據本發明之 單塊標靶頃改良晶圓至晶圓膜厚度之一致性及阻抗之均一 性。 下面所示之實例為典型之本發明較佳具體實施例。應了 解本發明預期額外具體實施例且不打算受限於所示之特定 -26- 1278525 實例。 實例1 :高純度銅單塊濺射標靶之製造 6N純度之6吋直徑且長丨1吋之擬鑄銅坯在空氣烘箱中加 熱並維持在約990°F之溫度約60分鐘。之後將銅坯熱锻造(在 熱鍛造中利用氧化矽或石墨箔)至最終高度減少55-75%且 互刻以水洋火。之後鍛造塊用丨6次通過冷軋,在最初8次通 過後淬火,總減少率為約6〇。/()至約80%。在冷軋中藉進行每 一最初四次通過產生每次約5%至約6%之減少率避免裂 缝。進行13-16次之通過產生每次約10%至約11%之減少率以 達到小晶粒大小。在冷軋後,|巴心藉加熱至約480 F約120 分鐘再結晶化。機械加工靶心產生最終之標靶。產生之高 純度銅單塊標靶之平均晶粒大小小於50微米且在整個標靶 中有均一之晶粒分佈。 圖11描述用於分析產生單塊標靶的取樣位置。標把之厚 度為0.89吋。在濺射表面標示每一點測得之晶粒大小及其平 均列在表2中。 兔子·標革巴表面之晶粒大小測量 位f 1 2 3 4 6 7 8 9 平均 晶粒 大小 38 45 45 38 38 53 38 38 53 43 圖11之内部平面標示點測得之晶粒大小以及這類測待值足 平均。表4顯示圖11中相同之標示標靶點之測定紋理。 標靶内標示 點之晶赶大小測至 深展 2 4 5 7 _ 平均 0.250" 53 38 ______一 45 _ 45.3 0.460" 45 38 45_„_ 45 __ 43.3 〇·7〇〇" 45 45 ------ _^ 45 _, 45 -27- 1278525 表4 :標示點上標靶微結構之紋理 深度 位置 (111) (200) (220) (Π3) 0.00 丨, 2 24.0% 20.9% 25.0% 30.1% 4 23.9% 22.3% 23.7% 30.1% 5 21.5% 20.6% 26.2% 31.7% 7 23.5% 20.5% 24.2% 31.7% 0.250,’ 2 22.5% 16.9% 30.8% 29.7% 4 24.6% 16.7% 28.7% 30.2% 5 18.0% 15.2% 39.4% 27.5% 7 24.5% 15.2% 31.2% 28.0% 0.460" 2 21.5% 17.6% 35.1% 25.8% 4 19.0% 17.6% 42.4% 21.0% 5 16.8% 15.9% 41.2% 26.2% 7 20.5% 17.2% 33.1% 29.3% 0.700" 2 21.9% 20.5% 26.0% 31.6% 4 23.0% 20.8% 25.8% 30.4% 5 22.2% 20.8% 27.2% 29.8% 7 22.4% 22.4% 21.1% 34.0%When the final crown is formed as a single piece of standard leather, the final standard of the leather can include, for example, the shape of the standard leather required for the mechanical work of the dry heart. When used in the semiconductor wafer addition step 500 generated by the method of the present invention, the method and the method can be applied to a wafer having a size of 00 mm, or a 300 mm wafer, and can be used for processing, for example, according to the present invention. A typical single piece of copper on a 200 mm semi-conductive silicon wafer: 丰导- 于力.... . The size of the wafer is about the thickness. · 89 leaves. The sputtering surface of the sputtering target can be used with a diameter of 20.7 吋 and the housing _! λ 丄 and 仏 is 17·5 pairs, and the 标 block target is a plane 俨 “The monolithic target formed by the method of the present invention is千面禚 target is preferred 'Although it can be tested / he can choose the size. 拎 target shape and its -23 - 1278525 According to the invention, the grain size of the monolithic stem of the ancient i, 刚屋生 is less than or equal to about 50 The micron is preferably so as to increase the size of the 微米f^. The submicron grain size < The monolithic standard of the invention | The strength of the yak, the ultimate tensile strength (UTS) and the hardness are larger than the average grain size of 3 The micro-U is not substantially the same as the target composition of at least about 5%. According to the present invention, the size of the σ 生 卞叼 卞叼 为 大小 大小 大小 大小 大小 大小 大小 : : : : : : : : : : : : : : : : : : : : : 10%. For the application of the maximum standard (four degrees) for the monolithic block, the single block is better in the case of no heat treatment. Because of this, a single block is produced to maintain the front processing yield of 'half large'. When the sub-micron grain size is pulverized and/or produced, the sub-micron grain can be maintained in the final monolithic standard dry The target strength of the scorpion is maximized. In another 彳 彳 违 违 违 违 违 违 违 违 违 违 违 违 违 违 违 违 违 违 违 违 违 违 违 违 违 , , , , , , , , , , , , , The final grain distribution of 20 micrometers is a single piece of standard bar. When the step 500 is generated, the 巴 巴 巴 巴 纟 & & & & & & & & & 立 & & & 标 标 标 标 标 标 标 标 标 标 标 标 标 标 标 标 标 标 标 标 标 标In addition to any machining performed to form the desired target shape: a social integration step. The bonding process may include bonding the dry core formed by the prior processing method to a support such as a backing sheet. A typical backing sheet may include, for example, and/or Copper. The bloody board is made of (5), A1 chest and A1606 i T4. The combination process can include various types or kinds of strange pressure, pressing, coating, soldering, explosion combination, blood and forging, diffusion bonding or familiarity. Other alternative methods known to the artist: The process can produce a combination of a drop strength of at least about 10 ksi. In particular, the 'bonding process produces a bond strength greater than or equal to m5 ksi and in a particular application, the bond strength produced is equal to Or more than 3〇ksi. Available on Various processing methods produce a very uniform and small grain size of copper -24- Ϊ 278525 2. The average grain size is usually sub-micron to Longfu, #, and the size is extremely high. $ _ 1 〃, nearby The small grain gate has a strength of ~3, because the high (10) can be used to combine the standard dryness, and the β method. When the target is prepared, the heating (heat treatment 400) can be combined with the standard. The high-purity temperature of the process according to the method of the present invention is less than or equal to about 4 hours; = less than or equal to the minimum grain growth. Although in the high temperature society: the implementation of the standard grain growth Initially fine grain size;: = Some of the Α Α 姑 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 成长 成长 成长 成长 成长 成长 成长The strength of the crater of the 太 穴 τ 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在曰4 combined with the copper alloy standard I > shape, recrystallization, the better, the degree and time is less than the full static 9 仃. The sample is combined with less than about 400t: production, good combination is better for 4 hours, and less than 4〇〇~ degrees for 々, JJU u for 1-4 hours. Another-choice for the combination can include a higher than a specific combination of Yue ~ Tuo from the earth, the 'mouth imitation / dish degree. In the combination of the temperature of the lowest temperature of the crystal, the combination of the temperature of 4 and the amount of f f f μ _ will be minimized to minimize the grain growth. In combination with the private & a $ ^ 丄 and ", then, the daily average grain size produced in the copper alloy is 1 soil is preferably 20 microns. The heat treatment of the full recrystallization is preferably carried out at a temperature of about 200 C for at least about 1 hour, and preferably between 350 ° C and 500 ° C for more than 1 hour. . Another option for heat treatment combined with heat and combined with >&<>> is that the heat treatment can be carried out in the bonding step (i.e., heat treatment 4), or after the bonding step. The combined combination and heat treatment are beneficial to enhance the social bagua city d degree and re-bond the copper or copper alloy material to 1278525. According to the method of the present invention, the shape is formed by a conventional method: the combination of the mouth steel and the combined copper alloy target ratio In some aspects of the present invention, the binding strength is increased. It is preferred that the diffusion is combined with the grain size of the dry core. When the standard dry can produce a very high intensity diffusion bond. The enhanced diffusivity of fine grains from Q4 is 15 ksi or higher, and left-I 13. The combined diffusion and strength of the resulting diffusion combined with copper and copper alloys 2 or super-the present invention is resistant to bending of the standard leather, reducing electricity = gram-bar. Additional advantages include improved applications that provide improved quality. The use of the target of the present invention for sputtering provides a better uniformity: the factory: and the film: and = in the film of the particles therein, and the method according to the invention is used ====-. This improved film thickness and impedance of the wafer to crystal: conductor processing provides::, the invention of the monolithic high-purity copper and copper alloy formed by the traditional method of the formation of the traditional combination of copper and copper two , 0%. Typically 40% longer. The ability to achieve a single piece of copper standard can be avoided: in the traditional combination of the combination (separated from the backing plate). According to the present invention <single block target additionally has increased resistance to target bending, reduced arcing, reduced uniformity of film produced by such target sputtered films, enhanced film thickness and impedance. In addition, the monolithic target according to the present invention improves wafer-to-wafer film thickness uniformity and impedance uniformity. The examples shown below are typical preferred embodiments of the invention. It is understood that the present invention contemplates additional specific embodiments and is not intended to be limited to the particular -26-1278525 examples shown. Example 1: Manufacture of a High Purity Copper Monolithic Sputtering Target A 6N purity 6 inch diameter and 1 inch long cast copper billet was heated in an air oven and maintained at a temperature of about 990 °F for about 60 minutes. The copper billet is then hot forged (using yttria or graphite foil in hot forging) to a final height reduction of 55-75% and engraved with water and ocean fire. Thereafter, the forged block was passed through cold rolling for 6 times, and quenched after the first 8 passes, and the total reduction rate was about 6 Torr. /() to about 80%. Cracking is avoided by cold rolling in each of the first four passes resulting in a reduction of about 5% to about 6% each time. A 13-16 pass is made to produce a reduction of about 10% to about 11% each time to achieve a small grain size. After cold rolling, the Baxin was recrystallized by heating to about 480 F for about 120 minutes. Machining the bullseye produces the final target. The resulting high purity copper monolithic target has an average grain size of less than 50 microns and a uniform grain distribution throughout the target. Figure 11 depicts a sampling location for analyzing the production of a monolithic target. The thickness of the standard is 0.89吋. The grain sizes measured at each point on the sputter surface and their average are listed in Table 2. The grain size measurement of the surface of the rabbit and the standard bar f 1 2 3 4 6 7 8 9 The average grain size 38 45 45 38 38 53 38 38 53 43 The internal plane of Figure 11 indicates the grain size measured and the The test value is average. Table 4 shows the measured texture of the same labeled target point in Figure 11. The crystals of the marked points in the target are measured to the depth of 2 4 5 7 _ average 0.250" 53 38 ______ a 45 _ 45.3 0.460" 45 38 45_„_ 45 __ 43.3 〇·7〇〇" 45 45 ------ _^ 45 _, 45 -27- 1278525 Table 4: Texture depth position of the target microstructure on the marked point (111) (200) (220) (Π3) 0.00 丨, 2 24.0% 20.9% 25.0% 30.1% 4 23.9% 22.3% 23.7% 30.1% 5 21.5% 20.6% 26.2% 31.7% 7 23.5% 20.5% 24.2% 31.7% 0.250, ' 2 22.5% 16.9% 30.8% 29.7% 4 24.6% 16.7% 28.7% 30.2% 5 18.0% 15.2% 39.4% 27.5% 7 24.5% 15.2% 31.2% 28.0% 0.460" 2 21.5% 17.6% 35.1% 25.8% 4 19.0% 17.6% 42.4% 21.0% 5 16.8% 15.9% 41.2% 26.2% 7 20.5% 17.2% 33.1% 29.3% 0.700" 2 21.9% 20.5% 26.0% 31.6% 4 23.0% 20.8% 25.8% 30.4% 5 22.2% 20.8% 27.2% 29.8% 7 22.4% 22.4% 21.1% 34.0%
高純度標靶之額外實例如前面實例所示形成,除了在此 加工中包括ECAE之外。ECAE在冷軋前執行以減少存在擬鑄 坯中存在之晶粒大小。產生之標靶如前面實例所示分析。 標靶之平均晶粒大小在整個標靶中小於15微米。 實例2 :銅合金單塊濺射標靶之製造 小於10%之Ag、Sn、A1或Ti之銅合金坯加熱並維持在約900 °F至約1500°F之溫度約45分鐘。之後將坯經熱鍛造產至少約 50°/〇之最終減少率。一些鍛造埋(視合金而定)在鍛造中再加 熱至少10分鐘。在最終鍛造後,鍛造运立刻以水淬火。鍛 造塊冷軋至至少60%之減少率以形成藉加熱至約750°F至約 1 200°F 120分鐘再結晶化之靶心。再結晶化之靶心經機械加 工形成單塊標靶。每一標靶之平均晶粒大小為約15微米至 -28 - 1278525 約5 0微米。 具以〇.3原子%足Α1合金化的銅之特定標靶由直徑6吋長丄i 吋之坏形成。坏最初在1400T加熱1小時且最初鍛造至6吋 高。在最初鍛造後,坏在1400T再加熱15分鐘且隨後鍛造至 3吋咼。在最終鍛造後,鍛造塊立刻以水淬火。由丨7次通過 組成之冷軋之後根據表5中所示之壓軋計劃進行以形成壓 軋乾心。Additional examples of high purity targets were formed as shown in the previous examples except that ECAE was included in this process. The ECAE is performed prior to cold rolling to reduce the presence of grain size present in the pseudo-cast. The resulting targets were analyzed as shown in the previous examples. The average grain size of the target is less than 15 microns throughout the target. Example 2: Fabrication of a Copper Alloy Monolithic Sputtering Target A copper alloy billet of less than 10% Ag, Sn, Al or Ti was heated and maintained at a temperature of from about 900 °F to about 1500 °F for about 45 minutes. The billet is then hot forged to produce a final reduction of at least about 50°/〇. Some forgings (depending on the alloy) are heated in forging for at least 10 minutes. After the final forging, the forging is immediately quenched with water. The forged block is cold rolled to a reduction of at least 60% to form a bullion recrystallized by heating to about 750 °F to about 1 200 °F for 120 minutes. The recrystallized target core is mechanically processed to form a monolithic target. The average grain size of each target is from about 15 microns to -28 - 1278525 to about 50 microns. The specific target of copper alloyed with 原子.3 atom% of foot Α1 is formed by the diameter of 6 吋 long 丄i 吋. The bad was initially heated at 1400 T for 1 hour and initially forged to 6 吋 high. After the initial forging, the bad was heated at 1400 T for another 15 minutes and then forged to 3 Torr. After the final forging, the forged block is immediately quenched with water. After the cold rolling consisting of 7 passes, it was carried out according to the rolling plan shown in Table 5 to form a rolled dry core.
在壓軋後靶心在約825°F退火約120分鐘並形成最終單塊 標靶。分析標靶表(根據圖11所示之表面點)顯示均勺之組成 及37微米之平均晶粒大小。晶粒大小之非均勻性為8 6% (丄 希格瑪)。After rolling, the bulls were annealed at about 825 °F for about 120 minutes and formed the final monolithic target. The analysis target table (according to the surface points shown in Figure 11) shows the composition of the scoop and the average grain size of 37 microns. The grain size non-uniformity is 8 6% (丄 Sigma).
表5 : 〇11-0.3原子%A1之壓軋計劃 通過 方向(角度) △高(吋) 鬲(吋、 % )¾ 1 !/n 1 0 0.1 / υ //ρχ^ y -χ- _3.3 :— 2 135 0.1 __2^δ _ 3.4 ---— _: 3 270 0.1 2.7 ---—— 4 45 0.1 Z .0 5 180 0.1 -----__ 1 Q 6 315 0.1 ----—--- --~~L J . 〇 __4.0 ~Γ —·—_ 7 90 0.1 - 2.3 —----- 4.2 8 225 0.1 - 丄2 9 0 0.13 2.07^^ -__ 4.3 C Q 10 135 0.13 1.94 _ J . y _ 6.2 C 7 _ 11 270 0.13 — —12 45 0.13 __L68 _ 0./ _ 7.1 7 7 13 180 0.13 14 315 0.13 1.4? Q ^ —15 90 0.13 O . J 〇 1 —16 225 0.13 _J^16 y . 1 in Π —17 一次自由通過 -~-— -—— -29- 1278525 實例3 :銅合金擴散結合濺射標靶之製造 提供銅合金坯並如實例2所述加工除了冷軋進行至至少 約50%之減少率之外。冷軋I巴心在約450°C之結合溫度120分 鐘結合至CuCr背襯板。合金之再結晶在結合中發生。結合 標革巴之晶粒大小小於約30微未且結合強度最南至約30 ksi。 實例4 :利用ECAE製造高純度銅濺射標靶 提供至少99.9999%之純之鑄造銅的銅运。高純度銅述在至 少約500°C之溫度至少約40%之高度減少率鍛造以形成鍛造 塊。鍛造塊藉加熱至至少約500°C之溫度並維持至少約1小 時落液化。落液化之鍛造塊在熱處理後立刻以水淬火並利 用4至6次通過根據路徑D (在連續通過間90。旋轉鍛造塊)之 等徑轉角擠形(ECAE)擠壓至產生次微米結構。在約125^至 約225°C之溫度且至少約丨小時之時間之中間退火在一些或 所有ECAE通過間執行。擠出之高純度銅塊冷幸[至至少6〇0/〇 之減少率以形成單塊或結合標靶之靶心。 機械加工單塊標乾之|巴心以產生最終標起。直接機械加 工乾〜產生/人彳政米晶粒大小之標把。執行再結晶以產生平 均晶粒大小為1微米至約2〇微米之單塊標靶。 將結合標靶之靶心擴散結合至背襯板。擴散結合在低於 350°C之溫度進行小於4小時。結合之降伏強度大於約15 ksi。結合標靶之晶粒大小為次微米至約2〇微米。次微米標 乾=傳統標革巴強度增強約·。晶粒大小為⑴峨米之結 合^乾比傳統銅標1巴強度增強至少1G%。整個6N銅標革巴在 250 C擴散結合2小時後不同位置上之晶粒大小顯示在表6 1278525 平句印^大小為丨1.37微米而標準差為6.97% (1希格瑪) 標靶之晶粒大小(μιη)Table 5: 压11-0.3 atom% A1 nip plan pass direction (angle) △ high (吋) 鬲 (吋, %) 3⁄4 1 !/n 1 0 0.1 / υ //ρχ^ y -χ- _3. 3 :— 2 135 0.1 __2^δ _ 3.4 --- _: 3 270 0.1 2.7 --- -- 4 45 0.1 Z .0 5 180 0.1 -----__ 1 Q 6 315 0.1 ---- —————- --~~LJ . 〇__4.0 ~Γ —·—_ 7 90 0.1 - 2.3 —----- 4.2 8 225 0.1 - 丄2 9 0 0.13 2.07^^ -__ 4.3 CQ 10 135 0.13 1.94 _ J . y _ 6.2 C 7 _ 11 270 0.13 — — 12 45 0.13 __L68 _ 0./ _ 7.1 7 7 13 180 0.13 14 315 0.13 1.4? Q ^ —15 90 0.13 O . J 〇1 —16 225 0.13 _J^16 y . 1 in Π —17 One free passage -~-- - - -29- 1278525 Example 3: Copper alloy diffusion bonded sputtering target fabrication Copper alloy billet and processed as described in Example 2 Except for cold rolling to a reduction rate of at least about 50%. The cold rolled I bar was bonded to the CuCr backing plate at a bonding temperature of about 450 ° C for 120 minutes. Recrystallization of the alloy occurs in combination. The grain size of the bonded standard bar is less than about 30 micrometers and the bonding strength is up to about 30 ksi. Example 4: Fabrication of a High Purity Copper Sputtering Target Using ECAE Provides a copper run of at least 99.9999% pure cast copper. High purity copper is forged at a height reduction rate of at least about 40% at a temperature of at least about 500 ° C to form a forged block. The forged block is liquefied by heating to a temperature of at least about 500 ° C for at least about 1 hour. The liquefied forged block was quenched with water immediately after heat treatment and extruded 4 to 6 times to obtain a submicron structure by equal channel angular extrusion (ECAE) according to path D (in continuous passage 90. rotary forged block). An intermediate anneal at a temperature of from about 125 Torr to about 225 ° C for a period of at least about ten hours is performed between some or all of the ECAE passes. The extruded high-purity copper block is cold [to a reduction rate of at least 6〇0/〇 to form a monolith or a target target of the binding target. Machining a single block of dry | Ba Xin to produce the final mark. Direct mechanical processing dry ~ produce / people 彳 米 rice grain size of the standard. Recrystallization is performed to produce a monolithic target having an average grain size of from 1 micron to about 2 microns. The target core of the binding target is diffusion-bound to the backing plate. The diffusion bonding is carried out at a temperature lower than 350 ° C for less than 4 hours. The combined fall strength is greater than about 15 ksi. The size of the bound target is from submicron to about 2 microns. Sub-micron standard dry = traditional standard strength of the standard bar. The grain size is (1) the combination of glutinous rice and the strength of the traditional copper standard 1 bar is at least 1G%. The grain size of the entire 6N copper standard bag after 2 hours of diffusion at 250 C is shown in Table 6 1278525. The size of the sentence is 丨1.37 μm and the standard deviation is 6.97% (1 Sigma). Grain size (μιη)
、旦疋供由表6之標靶之上平面及下平面得到之三點硬度 測量。平均硬度為53·3 ΗΒ而標準差為218% (ι希格瑪)。 標靶之硬度(hb)The three-point hardness measurement obtained from the upper and lower planes of the target of Table 6 is used. The average hardness is 53.3% and the standard deviation is 218% (ι Sigma). Target hardness (hb)
實例5 :利用ECAE製造銅合金濺射標革巴 楗供含以1000 ppm至小於或等於約10% Ag,A卜In,Zn,B, %,Ge,Ti或Zr合金化之銅之鋼坯。銅坯在至少約 C之度至少約4〇%之咼度減少率熱鍛造以形成鍛造 塊。鍛造塊藉加熱鍛造塊至至少約5〇(rc之溫度並維持至少 1278525 约1小時溶液化以形成溶液化塊。溶液化塊在溶液化後立刻 以水淬火。 溶液化塊藉執行4至6次通過ECAE擠壓。溶液化塊在每次 根據路徑D之通過間旋轉90。。中間退火在ECAE中之一些通 過間在約150 C至約325 C之溫度進行至少1小時。ecae擠出 塊冷軋至至少約60%之減少率以形成銅合金乾心。 第塊單塊銅合金&乾藉機械加工如所述產生之銅合金 靶心形成單塊標靶產生。第一塊單塊標靶之平均晶粒大小 小於1微米。此外,第一塊單塊標靶之降伏強度、極限抗張 強度(UTS)及硬度比平均晶粒大小為30微米之基本上相同 元素組成之標靶至少高約50%。 第一塊單塊銅合金標靶藉熱處理如上所述產生銅合金靶 心產生。熱處理在350t之溫度進行約丨小時。第二塊標靶 之平均晶粒大小為1微米至約2〇微米,基本上無沉澱(此處 基本上無沉澱指無可偵測到之沉澱)及沒有可偵測到的分 離且最大空洞之大小小於1微米。 第一塊結合銅合金標靶藉擴散結合如所述產生之銅合金 標靶至背襯板產生。擴散結合在小於35〇t:之溫度進行丨至々 小時。第一塊結合合金標靶之平均晶粒大小小於丨微米。 第二塊結合銅合金標靶在約35〇t:至約5〇〇τ:之結合溫度 至少1小時擴散結合如上述產生之銅合金靶心至背襯板產 生。弟二塊結合銅合金標靶完全再結晶且平均晶粒大小為 約1微米至約20微米。 ~ 【圖式簡單說明】 1278525 施例在上面參照下面之 明—項觀點之加工方法 附圖敘述。 一般概觀之 本發明之較佳具體實 圖1為描繪根據本發 流程度。 圖2描述在根據本發明最⑽工” 圖3,以等徑轉角擠形裝置處理之材料的剖面、圖。 伏二利用’徑轉角擠形加工之種種銅及銅合金之降 …及極限抗張強度相較晶粒大小為 及相較種種背襯板之比較。 铋卞6N銅 圖5為99.9999%之銅材料(6N)在根據本發明之一項觀點、 等徑轉角擠型及隨後在25吖退火5小時後晶粒大小分体: 、k理之影像EBSD/SEM圖。 曰圖6顯示圖5中影像之材料的晶粒區域分佈。材料之平均 晶粒大小為約6微米。 圖7顯示如EBSD及光學顯微鏡所測得產生之平均晶粒大 小為退火處理之函數。退火處理在已受六次通過路徑D之等 I轉角擠型之以〇·53重量“§合金化之銅的銅材料上執行。 圖8顯示圖7之Cu 0·53重量。/〇 Mg之ECAE材料在300°C退火2 小時後之EBSD/SEM圖。 圖9為圖7之Cu 0.53重量% Mg之ECAE材料在450°C退火1.5 小時後之EBSD/SEM圖。 圖10顯示利用光學顯微鏡得到圖9材料之影像。 圖11為描繪根據本發明一項觀點之標把晶粒大小及紋理 測量之取樣圖。 【圖式代表符號說明】 1278525 10 加工方案 12 正方坯 14 下表面 16 上表面 20 等徑轉角擠形裝置 22 模具組合 24,26 通道 28 100 提供銅埋 200 初步處理 310 等徑轉角擠形 320 壓軋及等徑轉角擠形 330 壓軋 400 熱處理 500 最終標把形成 •34-Example 5: Copper alloy sputtered leather was produced using ECAE. A steel billet containing copper alloyed at 1000 ppm to less than or equal to about 10% Ag, A, In, Zn, B, %, Ge, Ti or Zr was used. The billet is hot forged at a reduced rate of at least about 4% of the C to form a forged block. The forging block is heated to forge a block to a temperature of at least about 5 Torr (arc and maintained for at least 1278525 for about 1 hour to form a solution block. The solubilized block is quenched with water immediately after solubilization. The solubilized block is carried out by 4 to 6 The second pass through the ECAE extrusion. The solubilized block is rotated 90 each time according to the passage of path D. The intermediate annealing is carried out in some of the ECAE for at least one hour between about 150 C and about 325 C. The ecae extrusion block Cold rolling to a reduction rate of at least about 60% to form a copper alloy dry core. The first monolithic copper alloy & dry by mechanical processing of the resulting copper alloy bullseye to form a monolithic target. The first monolithic standard The average grain size of the target is less than 1 micron. In addition, the first piece of the monolith target has a maximum strength, ultimate tensile strength (UTS), and hardness of at least 30 mm of the average element size of the target component. The height of the first single copper alloy target is generated by heat treatment as described above to produce a copper alloy bullhead. The heat treatment is carried out at a temperature of 350 t for about 丨 hours. The average grain size of the second target is from 1 μm to about 2 〇 micron, basically no sink Precipitate (where essentially no precipitation means no detectable precipitation) and no detectable separation and the largest void size is less than 1 micron. The first piece is combined with a copper alloy target by diffusion bonding as described. The copper alloy target is produced to the backing plate. The diffusion bonding is carried out at a temperature of less than 35 〇t: 丨 to 々 hours. The average grain size of the first bonded alloy target is less than 丨 micron. The second bond is combined with the copper alloy target. Spreading at a bonding temperature of about 35 〇t: to about 5 〇〇τ for at least 1 hour, the copper alloy target core generated as described above is diffused to the backing plate. The second copper-bonded copper alloy target is completely recrystallized and the average grain size is It is about 1 micrometer to about 20 micrometers. ~ [Simple description of the scheme] 1278525 The following is a description of the processing method of the present invention with reference to the following. A general overview of the present invention is generally based on Figure 2 depicts a cross-section and a view of a material treated by an equal-diameter angle extrusion device in Figure 3 of Figure 3. The two types of copper and copper alloys are processed by 'turn-angle extrusion. Drop...and The tensile strength is compared with the grain size and compared with the various backing sheets. 铋卞6N copper Figure 5 is 99.9999% copper material (6N) in accordance with one aspect of the invention, equal-diameter angular extrusion and Subsequently, after annealing at 25 吖 for 5 hours, the grain size is divided into: EBSD/SEM image of the image of K. 曰 Figure 6 shows the grain area distribution of the material of the image of Figure 5. The average grain size of the material is about 6 μm. Figure 7 shows that the average grain size as measured by EBSD and optical microscopy is a function of the annealing process. The annealing process is performed on the I-corner extrusion of the six-pass path D. The copper material was performed on copper. Figure 8 shows the EBSD/SEM image of the Cu 0·53 weight of Figure 7 / 〇Mg of the ECAE material after annealing at 300 °C for 2 hours. Figure 9 is an EBSD/SEM image of the Cu 0.53 wt% Mg ECAE material of Figure 7 after annealing at 450 °C for 1.5 hours. Figure 10 shows an image of the material of Figure 9 obtained using an optical microscope. Figure 11 is a sampling diagram depicting the measurement of grain size and texture in accordance with one aspect of the present invention. [Illustration of symbolic representation] 1278525 10 Machining scheme 12 Square blank 14 Lower surface 16 Upper surface 20 Equal-diameter angle extrusion device 22 Mold combination 24, 26 Channel 28 100 Provide copper burial 200 Preliminary treatment 310 Equal-diameter angular extrusion 320 Pressure Rolling and Equal Channel Corner Extrusion 330 Rolling 400 Heat Treatment 500 Final Marker Formation • 34-
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| US09/465,492 US6878250B1 (en) | 1999-12-16 | 1999-12-16 | Sputtering targets formed from cast materials |
| US39654402P | 2002-07-16 | 2002-07-16 | |
| US47118203P | 2003-05-15 | 2003-05-15 | |
| US10/614,807 US20040072009A1 (en) | 1999-12-16 | 2003-07-09 | Copper sputtering targets and methods of forming copper sputtering targets |
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| JP5464352B2 (en) * | 2010-03-05 | 2014-04-09 | 三菱マテリアル株式会社 | Method for producing high purity copper processed material having uniform and fine crystal structure |
| US11035036B2 (en) * | 2018-02-01 | 2021-06-15 | Honeywell International Inc. | Method of forming copper alloy sputtering targets with refined shape and microstructure |
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