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TWI266215B - Method for analyzing power noise and method for reducing the same - Google Patents

Method for analyzing power noise and method for reducing the same

Info

Publication number
TWI266215B
TWI266215B TW091118119A TW91118119A TWI266215B TW I266215 B TWI266215 B TW I266215B TW 091118119 A TW091118119 A TW 091118119A TW 91118119 A TW91118119 A TW 91118119A TW I266215 B TWI266215 B TW I266215B
Authority
TW
Taiwan
Prior art keywords
unit blocks
design
network model
power network
components
Prior art date
Application number
TW091118119A
Other languages
English (en)
Inventor
Hao-Luen Tien
Shang-Yi Chen
Ming-Huan Lu
Chun-An Tu
Original Assignee
Silicon Integrated Sys Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Silicon Integrated Sys Corp filed Critical Silicon Integrated Sys Corp
Priority to TW091118119A priority Critical patent/TWI266215B/zh
Priority to US10/299,361 priority patent/US7079998B2/en
Application granted granted Critical
Publication of TWI266215B publication Critical patent/TWI266215B/zh

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/36—Circuit design at the analogue level
    • G06F30/367—Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2119/00—Details relating to the type or aim of the analysis or the optimisation
    • G06F2119/06—Power analysis or power optimisation

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Evolutionary Computation (AREA)
  • Geometry (AREA)
  • General Engineering & Computer Science (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
TW091118119A 2002-08-12 2002-08-12 Method for analyzing power noise and method for reducing the same TWI266215B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW091118119A TWI266215B (en) 2002-08-12 2002-08-12 Method for analyzing power noise and method for reducing the same
US10/299,361 US7079998B2 (en) 2002-08-12 2002-11-19 Method for analyzing power noise and method for reducing the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW091118119A TWI266215B (en) 2002-08-12 2002-08-12 Method for analyzing power noise and method for reducing the same

Publications (1)

Publication Number Publication Date
TWI266215B true TWI266215B (en) 2006-11-11

Family

ID=31493297

Family Applications (1)

Application Number Title Priority Date Filing Date
TW091118119A TWI266215B (en) 2002-08-12 2002-08-12 Method for analyzing power noise and method for reducing the same

Country Status (2)

Country Link
US (1) US7079998B2 (zh)
TW (1) TWI266215B (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI460991B (zh) * 2007-12-12 2014-11-11 希諾皮斯股份有限公司 可變阻抗之閘控去耦合單元
US9183345B2 (en) 2014-01-14 2015-11-10 Industrial Technology Research Institute Apparatus and method for generating a power delivery network

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EP1635274B1 (en) * 2004-02-25 2011-07-13 Panasonic Corporation Device and method for checking printed circuit board power source isolation
US7278120B2 (en) * 2004-07-23 2007-10-02 Synplicity, Inc. Methods and apparatuses for transient analyses of circuits
EP2226641A3 (en) 2005-07-05 2010-10-06 Freescale Semiconductor, Inc. Device and method for compensating for voltage drops
EP1952214A1 (en) 2005-11-15 2008-08-06 Freescale Semiconductor, Inc. Device and method for compensating for voltage drops
JP2009187325A (ja) * 2008-02-06 2009-08-20 Nec Electronics Corp 半導体集積回路の設計方法および設計支援装置
KR101046731B1 (ko) * 2008-12-26 2011-07-05 주식회사 하이닉스반도체 파워 분배 장치와 그를 갖는 메모리 장치
KR101532634B1 (ko) * 2008-12-31 2015-07-01 삼성전자주식회사 풀-칩의 결함 메탈라인 검출 방법 및 시스템
US9262572B2 (en) * 2014-06-27 2016-02-16 Apple Inc. Fast and accurate capacitance checker
US9806524B2 (en) * 2014-10-23 2017-10-31 Glenn Kenton Rosendahl Electrical power tranmission
US10491002B2 (en) * 2014-10-23 2019-11-26 Glenn Kenton Rosendahl Electrical power transmission
US9767240B2 (en) * 2015-11-19 2017-09-19 Globalfoundries Inc. Temperature-aware integrated circuit design methods and systems
US20170308639A1 (en) * 2016-04-25 2017-10-26 Mediatek Inc. Method for analyzing ir drop and electromigration of ic
CN110535489B (zh) * 2019-08-08 2021-03-16 国网新疆电力有限公司营销服务中心(资金集约中心、计量中心) 低压载波通信高频干扰信号的采集与播放系统
CN112289697B (zh) * 2020-10-20 2024-09-24 上海兆芯集成电路股份有限公司 验证方法
TWI815410B (zh) 2022-04-22 2023-09-11 創意電子股份有限公司 晶片功率消耗的分析器及其分析方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4247007A (en) * 1978-11-02 1981-01-27 Yuriko Kai Strands and netting and screens made thereof
US6067409A (en) * 1996-06-28 2000-05-23 Lsi Logic Corporation Advanced modular cell placement system
US6026223A (en) * 1996-06-28 2000-02-15 Scepanovic; Ranko Advanced modular cell placement system with overlap remover with minimal noise
US6618847B1 (en) * 1998-11-13 2003-09-09 Stmicroelectronics, Inc. Power stabilizer using under-utilized standard cells
US7707305B2 (en) * 2000-10-17 2010-04-27 Cisco Technology, Inc. Methods and apparatus for protecting against overload conditions on nodes of a distributed network
US6665843B2 (en) * 2001-01-20 2003-12-16 International Business Machines Corporation Method and system for quantifying the integrity of an on-chip power supply network
WO2003078652A2 (en) * 2002-03-15 2003-09-25 Nanomix, Inc. Modification of selectivity for sensing for nanostructure device arrays
US20030212973A1 (en) * 2002-05-13 2003-11-13 Shen Lin Methods for full-chip vectorless dynamic IR analysis in IC designs

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI460991B (zh) * 2007-12-12 2014-11-11 希諾皮斯股份有限公司 可變阻抗之閘控去耦合單元
US9183345B2 (en) 2014-01-14 2015-11-10 Industrial Technology Research Institute Apparatus and method for generating a power delivery network

Also Published As

Publication number Publication date
US20040030511A1 (en) 2004-02-12
US7079998B2 (en) 2006-07-18

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