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TWI264155B - Apparatus and method for interfacing electronic packages with a circuit board - Google Patents

Apparatus and method for interfacing electronic packages with a circuit board

Info

Publication number
TWI264155B
TWI264155B TW091137394A TW91137394A TWI264155B TW I264155 B TWI264155 B TW I264155B TW 091137394 A TW091137394 A TW 091137394A TW 91137394 A TW91137394 A TW 91137394A TW I264155 B TWI264155 B TW I264155B
Authority
TW
Taiwan
Prior art keywords
socket
contact
removable
circuit board
electronic packages
Prior art date
Application number
TW091137394A
Other languages
English (en)
Other versions
TW200301592A (en
Inventor
Larre H Nelson
John M Winter
John C Bergeron
Original Assignee
Rika Denshi America Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rika Denshi America Inc filed Critical Rika Denshi America Inc
Publication of TW200301592A publication Critical patent/TW200301592A/zh
Application granted granted Critical
Publication of TWI264155B publication Critical patent/TWI264155B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Measuring Leads Or Probes (AREA)
  • Connecting Device With Holders (AREA)
  • Manufacturing Of Electrical Connectors (AREA)
TW091137394A 2001-12-27 2002-12-26 Apparatus and method for interfacing electronic packages with a circuit board TWI264155B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US34222801P 2001-12-27 2001-12-27
US10/151,060 US6685492B2 (en) 2001-12-27 2002-05-17 Sockets for testing electronic packages having contact probes with contact tips easily maintainable in optimum operational condition

Publications (2)

Publication Number Publication Date
TW200301592A TW200301592A (en) 2003-07-01
TWI264155B true TWI264155B (en) 2006-10-11

Family

ID=26848289

Family Applications (1)

Application Number Title Priority Date Filing Date
TW091137394A TWI264155B (en) 2001-12-27 2002-12-26 Apparatus and method for interfacing electronic packages with a circuit board

Country Status (6)

Country Link
US (1) US6685492B2 (zh)
JP (1) JP2006504226A (zh)
KR (1) KR20040068988A (zh)
AU (1) AU2002324585A1 (zh)
TW (1) TWI264155B (zh)
WO (1) WO2003058769A1 (zh)

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JP5280511B2 (ja) * 2011-09-05 2013-09-04 株式会社島野製作所 接触端子
JP5523416B2 (ja) * 2011-09-07 2014-06-18 茂治郎 清水 通電用コネクター
CN103018625A (zh) * 2011-09-21 2013-04-03 鸿富锦精密工业（深圳）有限公司 连接器检测装置
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US11067601B2 (en) * 2013-03-08 2021-07-20 Donald DeMille High accuracy electrical test interconnection device and method for electrical circuit board testing
JP6029511B2 (ja) * 2013-03-28 2016-11-24 株式会社エンプラス 電気接触子、電気接触子の製造方法および電気部品用ソケット
JP5985447B2 (ja) * 2013-08-21 2016-09-06 オムロン株式会社 プローブピン、および、これを用いた電子デバイス
JP6553472B2 (ja) * 2015-09-30 2019-07-31 株式会社ヨコオ コンタクタ
US20170146568A1 (en) * 2015-11-19 2017-05-25 WinWay Tech. Co., Ltd. Electronic test equipment
JP6556612B2 (ja) * 2015-12-04 2019-08-07 ルネサスエレクトロニクス株式会社 半導体装置の製造方法
US10608354B2 (en) * 2017-03-23 2020-03-31 Verily Life Sciences Llc Implantable connector with two electrical components
JP2019074483A (ja) 2017-10-19 2019-05-16 株式会社日本マイクロニクス 電気的接続装置
US10367279B2 (en) * 2017-10-26 2019-07-30 Xilinx, Inc. Pusher pin having a non-electrically conductive portion
KR102013176B1 (ko) * 2019-06-13 2019-08-22 주식회사 제네드 교체 가능한 싱글타입 프로브 핀
CN112510434A (zh) * 2019-09-16 2021-03-16 康普技术有限责任公司 具有轴向浮动的内接触部的同轴连接器
IT201900020656A1 (it) * 2019-11-08 2021-05-08 Isanik S R L Elemento di fissaggio, lettore, attrezzo di serraggio, kit e metodo di acquisizione segnale
JP2021086788A (ja) * 2019-11-29 2021-06-03 株式会社ヨコオ スプリングコネクタ
KR102214091B1 (ko) * 2020-03-20 2021-02-09 주식회사 메가터치 포고핀의 플런저 및 그 플런저를 구비한 포고핀
US11942722B2 (en) 2020-09-25 2024-03-26 Apple Inc. Magnetic circuit for magnetic connector
US11437747B2 (en) * 2020-09-25 2022-09-06 Apple Inc. Spring-loaded contacts having capsule intermediate object
JP7602112B2 (ja) * 2020-11-17 2024-12-18 山一電機株式会社 検査用ソケット
US11569601B2 (en) * 2021-03-11 2023-01-31 Enplas Corporation Socket and inspection socket
US12510562B2 (en) 2022-09-16 2025-12-30 Ironwood Electronics, Inc. Test socket with conductive compression contacts for integrated circuits
KR102467671B1 (ko) * 2022-09-20 2022-11-16 (주)티에스이 테스트 소켓

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Also Published As

Publication number Publication date
KR20040068988A (ko) 2004-08-02
JP2006504226A (ja) 2006-02-02
US20030124895A1 (en) 2003-07-03
AU2002324585A1 (en) 2003-07-24
WO2003058769A1 (en) 2003-07-17
TW200301592A (en) 2003-07-01
US6685492B2 (en) 2004-02-03

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees