TWI250454B - Method of using scan chains and boundary scan for power saving - Google Patents
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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1250454 五、發明說明(1) 【發明所屬之技術領域】 on ^ ^明有關於在同步邏輯ASIC(Appl icati 一1250454 V. Description of the invention (1) [Technical field to which the invention belongs] On ^ ^ is related to the synchronous logic ASIC (Appl icati one)
Spe=m、IC,特製積體電路)中降漏電的方法,尤其是指 使^ :鍵(Scan Chain)及邊界掃描(ΙΕΕΕ 1149·;[)等技 術而省電的方法。 V t 【先前技術】 ^對於^所有的便攜式裝備(如PD A、可攜式電腦、行動電 話等)而言,積體電路的省電是越來越重要了。這些裝備 的電力消耗可以分成兩大範疇:自態電力消耗(開關時消 耗的電力,p = cv2f)及靜態電力消耗(即漏電)。 對於動恶電力消耗,已經應用兩種技術藉降低C、v或 f (整體電容、所供電壓或工作頻率)而減少電力消耗·· 1 ·改良製程技術,使所供電壓及電路大小/電容等都 降低(即降低c及v)。 2 ·關閉時鐘訊號,以減少開關頻率f。 對於靜態電力消耗(即漏電),已經使用下述方法: 3 ·元件/電路的改良,在次微米及便攜式電路設計 中’漏電成為電力消耗的主要因素,電路設計師使用切入 電壓VT (cut-in voltage)較高的元件而減少漏電,改善 靜態電力消耗。 4 ·關閉電源,對於不使用的電路關閉其電源。 對於上述第三種方法,高切入電壓VT可能增加短路電 流,因而消耗更多的動態電力。而且第一種方法與第三種Spe=m, IC, special integrated circuit) The method of reducing leakage current, especially the method of saving power by technology such as ^:Key (Scan Chain) and boundary scan (ΙΕΕΕ 1149·;[). V t [Prior Art] ^ For all portable equipment (such as PD A, portable computers, mobile phones, etc.), the power saving of integrated circuits is becoming more and more important. The power consumption of these equipment can be divided into two categories: self-state power consumption (power consumed during switching, p = cv2f) and static power consumption (ie leakage). For the consumption of kinetic power, two techniques have been applied to reduce power consumption by reducing C, v or f (integral capacitance, supplied voltage or operating frequency) · · 1 · Improved process technology to supply voltage and circuit size / capacitance And so on (ie lower c and v). 2 • Turn off the clock signal to reduce the switching frequency f. For static power consumption (ie leakage), the following methods have been used: 3 • Improvement of components/circuits, in the sub-micron and portable circuit design, 'leakage becomes a major factor in power consumption, and circuit designers use the cut-in voltage VT (cut- In voltage) higher components to reduce leakage and improve static power consumption. 4 • Turn off the power and turn off the power for unused circuits. For the third method described above, the high cut-in voltage VT may increase the short-circuit current and thus consume more dynamic power. And the first method and the third
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五、發明說明(2) 方法必肩改變製程技術,成本高且進展較慢,大部分产 =圓廠的I C設計公司無法承受其費用及發展時間,因:〇 能使用現有技術以達成節省電力,所以第二種方法與第只 種方^對於沒有晶圓廠的1C設計公司是較可以控制預算四 的第—種方法是動態省電的較佳方法,第四種方法 減少漏電的最佳方法。 則疋 夕 第二種方法是習知的方法,而且已經廣泛使用,有許 夕C A D工具可以提供關閉時鐘訊號的設計技術(例如V. Description of the invention (2) The method must change the process technology, the cost is high and the progress is slow. Most of the IC design companies in the factory can not afford the cost and development time because: can use the existing technology to save electricity. Therefore, the second method and the first kind of method are the best way to control the budget for the 1C design company without the fab. The fourth method is the best method for dynamic power saving, and the fourth method is to reduce the best leakage. method. The second method is a well-known method, and it has been widely used. The C A D tool can provide design techniques for turning off the clock signal (for example)
Synopsys’ p〇wer Compiler)。 、了 t式衣置9 5 /的工作時間都是在備便(S ^ a n d b y )模 式丄因此漏電是電力消耗的主要因素之一,但是漏電是無 法藉關閉日守鐘訊號(第二種方法)而終止的。第四種方法關 閉電源則是可攜式裝置靜態省電的最佳方案。不過第四種 方法的關閉電源尚未廣泛使用,原因如下列兩點: 1 ·關閉電源需要額外的記憶體、控制電路及接線以儲 存關閉方塊的内容,這牽涉到太多的硬體管理設計。 2 ·關閉電源/打開電源的程序十分瑣碎。 由於上述兩種缺點’關閉電源雖然眾所周知,但不常 使用,因此具有改良的空間。 【發明内容】 因此本發明之目的在提供一種方法與電路,利用既有 的掃描鏈(Scan Chains)及邊界掃描(Boundary Scan, WEE 1149. 1 )技術以關閉電源,減少同步邏輯ASIC中省電Synopsys’ p〇wer Compiler). The t-style clothing set 9 5 / working time is in the S ^ andby mode, so leakage is one of the main factors of power consumption, but leakage is unable to close the clock signal (the second method) ) and terminated. The fourth method to turn off the power supply is the best solution for static power saving of the portable device. However, the power-off of the fourth method has not been widely used for the following two reasons: 1 • Turning off the power requires additional memory, control circuitry, and wiring to store the contents of the shutdown block, which involves too many hardware management designs. 2 · The procedure for turning off the power/turning on the power is very trivial. Due to the above two disadvantages, the power-off is well known, but it is not commonly used, so there is room for improvement. SUMMARY OF THE INVENTION It is therefore an object of the present invention to provide a method and circuit for utilizing existing Scan Chains and Boundary Scan (WEE 1149. 1) techniques to turn off the power supply and reduce power savings in the synchronous logic ASIC.
1250454 五、發明說明(3) 的硬體設計。將一省電控制器裝在同少邏輯AS I C中 描键及邊界掃描電路原有的共治訊號〇1^一s— mode, org—s—enable , org—bs一mode , org一bs一enab1e , power —of f,cl〇ck及reset信號輸入省電控制器 生一組新的控制信號s_mode,s_enable bs—enable ,pw—switch , scan—cloc八 以控制掃描鏈及邊界掃描電路,於是: 省電控制器裝在同步邏輯A S I C中,讓掃 並產 bs—mode , mem. ,bs—c1ock 及 a) 在同步邏輯as I C關閉電源時: 1) 先關閉同步邏輯AS I C的時鐘訊號; 2) 將同步邏輯ASIC的一組主要輸出儲存在 電路的記憶體元件中,然後將一外部電沾2描 端從該主要輸出端切換至邊界掃描電路的記二^ 件; < 凡 3) 以掃描鏈電路將同步邏輯ASK的内部 目岫狀態經由掃描鏈電路移出到一:元件的 4 )關閉同步邏輯AS丨c的電源; σ 。己憶體; b) 在同步邏輯AS I C打開電源時: 1) 打開電源且初始化被關閉電路; 2) 將外部記憶體所儲存的數值繾 到同步邏輯ASIC的内部記憶元株輙祂鏈電路移回 3) 將外部電路的輸人端從邊界^ 切換至該主要輸出端; “電路的記憶元件 4) 啟動時鐘訊號。1250454 V. Hardware design of invention description (3). The power-saving controller is installed in the same logic AS IC, the original co-processing signal of the keystroke and boundary scan circuit, org_s-enable, org-bs-mode, org-bs- Enab1e , power —of f,cl〇ck and reset signals are input to the power-saving controller to generate a new set of control signals s_mode, s_enable bs-enable, pw-switch, scan-cloc eight to control the scan chain and boundary scan circuit, so : The power-saving controller is installed in the synchronous logic ASIC, so that the bs_mode, mem., bs-c1ock and a) are turned on when the synchronous logic as IC is turned off: 1) The clock signal of the synchronous logic AS IC is turned off first; 2) storing a set of main outputs of the synchronous logic ASIC in the memory component of the circuit, and then switching an external electrode 2 from the main output terminal to the boundary scan circuit; < 3) The internal chain state of the synchronous logic ASK is shifted out to the one via the scan chain circuit by a scan chain circuit: 4) the power supply of the synchronous logic AS丨c is turned off; σ. b) When the synchronous logic AS IC is powered on: 1) Turn on the power and initialize the circuit to be turned off; 2) Drag the value stored in the external memory to the internal memory cell of the synchronous logic ASIC. Back to 3) Switch the input of the external circuit from the boundary ^ to the main output; "Memory element 4 of the circuit" starts the clock signal.
1250454 五、發明說明(4) 【實施方式 請參考圖一,厂一 、 —同步邏輯AS I C中不# 一生產測試的掃描鏈代表電路。在 主要電路包含’多:輛鏈電路將沿著主要電路而配置, 如正反器、位邏輯/路1及許多記憶型元件例 器4,多工哭3右:f為)。知描鏈電路包含多工器3與多工 奖j本 ° 有兩個輸入「測讀31 夕丄 口口 4有兩個輪 「 、八31」及「工作32」,多工 42”當多工器3Λ時鐘訊號41」及「主要時鐘訊號 Y〇d“3為低電;立日;工,4工的:制信號s — enable 33與 4么將輸入至同步邏輯㈣作】常;訊號 “的控制信號s__enable 業,虽夕^益3與多 日守,電路進入掃描模式作生產測I/ —m「〇de 43為高電位 將取代「主要時鐘外节^產武,掃描時鐘訊號41」 「測試31」的資料蔣銘〜」而輪入同步邏輯ASIC中, 移暫存器),繞過組合邏輯電路如正反器、位 记憶型元件2移出輸出物作邏步一步經過各個 界η參考圖二,在測試設計功能時 1平田(IEEE 11 49· 1 )機構(陰影區域) 达 要的輸出信號52。使用bs clock 59幻::繞而,存/觀察主 將測試資·經由多王器55輸入主 S^nabl = 54信號 5的主要輸出信號52則由記憶元件57,待測單元 掃描機構而移出。邊界掃描機構是 ^ 過邊界 設計的。 Λ列σ式待測早元5的 圖三示出本發明一實施例 將既有的掃描鏈及邊界舞 1250454 五 以發明說明(5) —-- 描(IEEE 1149· 1)組合而環繞一欲關閉電源的方塊8。 j::及邊界掃描電路是所有可攜式應用的積體田 j =,本發明只是利用掃描鏈電路及邊界 : Λ己Λ 發明Λ用掃描鏈電路將一欲關閉電源的方: ° fe兀件的内谷存入一外部記憶體6, 鬼 工器4的s — enable 33及s—m〇de 43拉成寻夕-轉多 電源的方塊8就進入掃描模式。本發 關閉 將欲關閉電源的方塊8的邊界狀態存入—夕用卜==田電路 圖—四(a)不出本發明所規劃的關閉 序。 9” ;其次是將主要輸出52存入ΙΕΠ日寸鐘訊號關閉(步驟 =器57,然後將外部電 輸9:1 (邊界掃描) 攸奴關閉電源的方塊8)切換/入鸲攸主要輸出52(即 =;並將内部)正反器2的、邊界=描正反器57(步驟 4冗憶體6 (步驟9 3 );茫銘 恶透過掃描鏈移出到外 驟94)。 後—步則是關閉方塊8的電源(步 (b)示^^^雷閉t源的電路回復到正常工你、 打開電源的程序。 吊工作模式,圖四 路(步驟95);其=打開電源且初始化被關 ^移回(步驟96);第二牛,過知描鏈將儲存的正反哭之 =塊8回到正常作步驟97);最後打 關閉電源的方、土 耒〈步驟9 8 ) 閉電源的方塊8中所必須執行下面兩種 中所有記憶元件的内Λ務:f先將欲關 --合设製到一外部記憶1250454 V. INSTRUCTIONS (4) [Embodiment] Refer to Figure 1, Factory I, Synchronous Logic AS I C No. The main circuit contains 'multiple: the chain circuit will be configured along the main circuit, such as the flip-flop, bit logic/road 1 and many memory component examples 4, multiplex cry 3 right: f is). The tracing chain circuit includes multiplexer 3 and multiplex prize j. There are two inputs: "Reading 31 丄 丄 口 4 has two rounds ", eight 31" and "working 32", multiplex 42" 3" clock signal 41" and "main clock signal Y〇d" 3 are low power; day; work, 4 work: signal s - enable 33 and 4 will be input to the synchronization logic (4) often; signal "The control signal s__enable industry, although the evening and the benefits of 3 and more than the day, the circuit enters the scan mode for production measurement I / - m "〇de 43 for the high potential will replace the "main clock outside the section ^ production Wu, scan clock signal 41 "Test 31" information Jiang Ming ~ "and wheeled into the synchronous logic ASIC, shift register", bypassing the combination logic circuit such as the flip-flop, the bit memory component 2 removes the output for a step by step The boundary η refers to FIG. 2, and when the design function is tested, a flat field (IEEE 11 49·1) mechanism (shaded area) reaches the desired output signal 52. Use bs clock 59 illusion:: circumvent, save/observe the master. The test capital is input to the main S^nabl = 54 signal via the multi-master 55. The main output signal 52 of the signal 5 is removed by the memory element 57 and the scanning mechanism of the unit to be tested. The boundary scan mechanism is designed to pass the boundary. Figure 3 of the first embodiment of the present invention shows an embodiment of the present invention. The existing scan chain and boundary dance 1250454 are surrounded by a combination of inventions (5) and (IEEE 1149·1). Block 8 to turn off the power. j:: and the boundary scan circuit is the integrated field of all portable applications. The invention uses only the scan chain circuit and the boundary: Λ Λ Λ Λ 扫描 扫描 扫描 扫描 扫描 扫描 扫描 扫描 扫描 扫描 扫描 扫描 ° ° ° ° ° ° ° ° ° ° ° The inner valley of the piece is stored in an external memory 6, and the s_enable 33 and s-m〇de 43 of the ghoster 4 are pulled into the eve-turn-multiple power supply block 8 to enter the scanning mode. The present invention turns off the boundary state of the block 8 to be turned off, and the following is the closed sequence planned by the present invention. 9”; secondly, the main output 52 is stored in the next day, the signal is turned off (step = 57, then the external power is 9:1 (boundary scan), the slave is turned off, and the main output is switched). 52 (ie =; and will be internal) the boundary of the flip-flop 2 = the flip-flop 57 (step 4 redundant body 6 (step 9 3); 茫 恶 透过 透过 透过 扫描 扫描 扫描 扫描 扫描 透过 透过 透过 透过 透过 透过 透过 。 。 。 。 。 。 。 。 。 。 。 The step is to turn off the power of the block 8 (step (b) shows ^ ^ ^ thunder closed t source circuit to return to normal work, turn on the power of the program. Hang work mode, Figure four (step 95); its = turn on the power And the initialization is turned off (step 96); the second cow, the over-the-know chain will store the positive and negative crying = block 8 back to normal step 97); finally hit the power off the side, the soil <Step 9 8) In the block 8 of the closed power supply, it is necessary to perform the internal tasks of all the memory elements in the following two types: f first to turn off - set to an external memory
第10頁 以,器57轉;到外部電路7的信;從 1250454Page 10 with the device 57 turn; the letter to the external circuit 7; from 1250454
五、發明說明(6) 體6(另一組正反器、RAM或任何其他記憶元件),使工 態玎以在後來打開電源的程序中恢復。其次,關閉電 方法將使欲關閉電源的方塊8的主要輸出5 2浮動,因為、言、 按浮動的輸入在I C設計中是不容許的,所以需要額外的^ 體以保留原來的信號,請再次參閱圖三。 、 吏 為了達成關閉電源的兩種任務,圖五示出一控制器9 之彡又叶,此控制器9將收集掃描鏈及邊界掃描的原來信號 而產生一組新的控制信號以達成省電的應用。 〜 掃描鏈及邊界掃描的原來信號是分別用來作生產測^ 及設計測試的,但在產品通過測試後,掃描鏈及邊界掃 的原來信號都固定為高電位或固定於低電位,在產品的^ 命週期中不再使用,因此必須根據掃描鏈及邊界掃描的原 來信號產生一組新的控制信號供省電之用。掃描鏈及邊界 知 4田的原來 # 號包含〇rg__s_mode,〇rg_s__enable, 〇一rg_bs — mode,〇rg —bs —enable,如圖五控制器9 左邊所 不。Power — of f、ci〇ck及reset信號亦安排在圖五控制哭 左邊以指示控制器。 °口 控制為9右邊的輸出接腳s_mode 43是將欲關閉電源 的方塊8的内部記憶元件在三種作業模式之間切換:正常' 作業模式、關閉時鐘訊號的低電力模式及移入/移出模 式。s—mode 43是匯流排式,只要掃描鏈的正反器數目 變,就必須調整控制器,使其輸出訊號能符合時間要 s —enable 33切換内部資料路徑,使記憶元件2可以V. INSTRUCTIONS (6) Body 6 (another set of flip-flops, RAM or any other memory element) causes the process to be restored in a later power-on procedure. Secondly, the power off method will float the main output 5 2 of the block 8 to be powered off, because the floating input is not allowed in the IC design, so an extra body is needed to retain the original signal. See Figure 3 again. In order to achieve the two tasks of turning off the power, FIG. 5 shows a controller 9 and a leaf. The controller 9 collects the original signals of the scan chain and the boundary scan to generate a new set of control signals to save power. Applications. ~ The original signals of the scan chain and boundary scan are used for production measurement and design test respectively. However, after the product passes the test, the original signals of the scan chain and the boundary scan are fixed at a high potential or fixed at a low potential. It is no longer used in the life cycle, so a new set of control signals must be generated for power saving based on the original signals of the scan chain and boundary scan. Scan chain and boundary know that the original # of the field contains 〇rg__s_mode, 〇rg_s__enable, rrg_bs — mode, 〇rg —bs —enable, as shown in Figure 5 on the left side of controller 9. The Power — of f, ci〇ck, and reset signals are also arranged on the left side of Figure 5 to control the controller to indicate the controller. The port is controlled to the right of the 9th output pin s_mode 43 is the internal memory component of block 8 to turn off the power to switch between the three modes of operation: normal 'operation mode, low power mode to turn off the clock signal and shift in/out mode. S-mode 43 is a bus type. As long as the number of flip-flops in the scan chain changes, the controller must be adjusted so that its output signal can meet the time. s —enable 33 switches the internal data path so that the memory element 2 can
12504541250454
從「測試31」或「工作32」取得不同 bs一mode 53決定何時切換邊界 翰入。 或主要輸出的省電模式。bs_enable 5/的鎖住時鐘訊號 〇rg — bs —enable相同外,因為此除維持與 輸出需切換到記憶元件57,所以外部y 冤時,方塊8的 出值。 〃路7永遠可取得輸 pw_switch 61控制電源開關。 scan —clock 41提供掃描時鐘 用 K唬供内部掃描鏈之 bs_cl〇Ck 59 由 bs —mode 53 控制,提供 正反器5 7的時鐘訊號。 〃為邊界掃描 mem—i f 60為記憶體控制介面, 對於不同的印柃胤 態必須改變記憶體介面。 < fe體形 器9。 ’不必 可以用一個内含的CPU取代圖五所示的控制 本發明方法利用既有的電路/技術達成省電的目的 增設太多的電路。 ' 本發明的精神與範圍僅由下述申請專利範圍決 受上述實施例之限制。 /' 定 不Get different from "Test 31" or "Work 32" bs-mode 53 decide when to switch borders. Or the main output power saving mode. Bs_enable 5/ locks the clock signal 〇rg — bs —enable is the same, because this saves and outputs need to switch to memory element 57, so the external y 冤, the value of block 8. 〃路7 can always get the pw_switch 61 control power switch. Scan —clock 41 provides the scan clock. Ks is used by the internal scan chain. bs_cl〇Ck 59 is controlled by bs —mode 53 to provide the clock signal of the flip-flop 5 7 . 〃 is the boundary scan mem—i f 60 is the memory control interface, and the memory interface must be changed for different print states. < fe body 9. It is not necessary to replace the control shown in Figure 5 with an included CPU. The method of the present invention utilizes existing circuits/techniques to achieve power saving purposes by adding too many circuits. The spirit and scope of the present invention are limited only by the scope of the invention described below. /'No
1250454 圖式簡單說明 【圖式簡单說明】 圖一為一掃描鏈電路之示意圖。 圖二為一邊界掃描(IEEE 1 149. 1 )電路之示意圖。 圖三為在同步邏輯AS I C中合併掃描鏈電路及邊界掃描 (IEEE 1149· 1 )電路之示意圖。 圖四示出本發明所規劃的關閉電源/打開電源程序之 流程圖。 圖五示出本發明控制電路之方塊圖。1250454 Simple description of the drawing [Simple description of the drawing] Figure 1 is a schematic diagram of a scanning chain circuit. Figure 2 is a schematic diagram of a boundary scan (IEEE 1 149. 1) circuit. Figure 3 is a schematic diagram of a combined scan chain circuit and boundary scan (IEEE 1149·1) circuit in synchronous logic AS I C. Figure 4 is a flow chart showing the planned power off/on power cycle procedure of the present invention. Figure 5 shows a block diagram of the control circuit of the present invention.
【主要元件符號說明】[Main component symbol description]
1 邏輯電路 2 記憶型元件 20 輸出埠 3 多工器 31 測試信號 32 工作信號 33 s_enab1e 4 多工器 41 掃描時鐘訊號(scan_c 1 ock) 42 主要時鐘訊號 43 s_m〇de 5 待測單元 51 主要輸入 52 主要輸出信號1 Logic circuit 2 Memory element 20 Output 埠3 multiplexer 31 Test signal 32 Operation signal 33 s_enab1e 4 multiplexer 41 scan clock signal (scan_c 1 ock) 42 main clock signal 43 s_m〇de 5 unit to be tested 51 main input 52 main output signal
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| CN110007217A (en) * | 2019-05-22 | 2019-07-12 | 哈尔滨工业大学(威海) | A Low Power Consumption Boundary Scan Test Method |
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| CN103838344B (en) * | 2012-11-27 | 2016-08-03 | 英业达科技有限公司 | The system and method for mainboard power supply supply control are carried out by boundary scan |
| TWI480726B (en) * | 2012-12-11 | 2015-04-11 | Inventec Corp | Power supply controlling system for motherboard by boundary scan and method thereof |
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| CN110007217A (en) * | 2019-05-22 | 2019-07-12 | 哈尔滨工业大学(威海) | A Low Power Consumption Boundary Scan Test Method |
| CN110007217B (en) * | 2019-05-22 | 2021-06-25 | 哈尔滨工业大学(威海) | A Low Power Consumption Boundary Scan Test Method |
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