[go: up one dir, main page]

TWD138876S1 - Electric contact - Google Patents

Electric contact

Info

Publication number
TWD138876S1
TWD138876S1 TW099302401F TW99302401F TWD138876S1 TW D138876 S1 TWD138876 S1 TW D138876S1 TW 099302401 F TW099302401 F TW 099302401F TW 99302401 F TW99302401 F TW 99302401F TW D138876 S1 TWD138876 S1 TW D138876S1
Authority
TW
Taiwan
Prior art keywords
electrical contact
support plate
contact component
item
lower support
Prior art date
Application number
TW099302401F
Other languages
Chinese (zh)
Inventor
Ken Kimura
Katsuyuki Kakizaki
Original Assignee
日本麥克隆尼股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本麥克隆尼股份有限公司 filed Critical 日本麥克隆尼股份有限公司
Publication of TWD138876S1 publication Critical patent/TWD138876S1/en

Links

Abstract

【物品用途】;本創作的物品是電接觸元件，是與被試驗電路的電極和測試器端連接以進行試驗時，讓被試驗電路的電極與測試器端接觸的電接觸元件，該電接觸元件是被組裝在對於半導體裝置、液晶面板、太陽能電池板等的檢查裝置的物品，係以電接觸元件單體作為交易對象。;【創作特點】;在右側視圖及左側視圖中，下側的一片支柱板(plunger)，是被上側的兩片支柱板所夾持，在上下方向中間部分可看得見的是線圈彈簧，該線圈彈簧是彈性的支撐下側的一片支柱板和上側的兩片支柱板，上下側支柱板的寬度是一端細長、另一端寬大的設計，下側支柱板的最下端是略呈W形狀，上側支柱板的最上端則是呈V形缺口形狀。[Purpose of the item]: The item of this creation is an electrical contact component, which is an electrical contact component that allows the electrodes of the tested circuit to contact the tester terminals when connected to the electrodes of the tested circuit for testing. The electrical contact component is an item assembled in an inspection device for semiconductor devices, liquid crystal panels, solar panels, etc., and the transaction object is the electrical contact component unit. ;【Creative Features】;In the right and left views, the lower support plate (plunger) is clamped by the two upper support plates. The coil spring can be seen in the middle part of the upper and lower directions. The coil spring elastically supports the lower support plate and the two upper support plates. The width of the upper and lower support plates is thin at one end and wide at the other end. The lower end of the lower support plate is slightly W-shaped, and the upper end of the upper support plate is V-shaped.

TW099302401F 2010-01-27 2010-05-14 Electric contact TWD138876S1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010001789 2010-01-27

Publications (1)

Publication Number Publication Date
TWD138876S1 true TWD138876S1 (en) 2011-02-01

Family

ID=46320529

Family Applications (1)

Application Number Title Priority Date Filing Date
TW099302401F TWD138876S1 (en) 2010-01-27 2010-05-14 Electric contact

Country Status (2)

Country Link
US (1) USD662895S1 (en)
TW (1) TWD138876S1 (en)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWD151640S (en) * 2011-10-31 2013-02-01 日本麥克隆尼股份有限公司 Electric contact
USD758970S1 (en) * 2014-05-27 2016-06-14 Vishay Dale Electronics, Llc Edge-wound resistor
US9396847B2 (en) 2014-05-27 2016-07-19 Vishay Dale Electronics, Llc Edge-wound resistor, resistor assembly, and method of making same
JP1529603S (en) * 2014-12-04 2015-07-27
JP1529604S (en) * 2014-12-04 2015-07-27
JP1529602S (en) * 2014-12-04 2015-07-27
JP1529605S (en) * 2014-12-15 2015-07-27
JP1529608S (en) * 2014-12-15 2015-07-27
JP1529606S (en) * 2014-12-15 2015-07-27
JP1529609S (en) * 2014-12-15 2015-07-27
JP1529607S (en) * 2014-12-15 2015-07-27
TWD177827S (en) * 2014-12-15 2016-08-21 歐姆龍股份有限公司 A part of probe pin for ic socket
JP1529612S (en) * 2014-12-19 2015-07-27
JP1529613S (en) * 2014-12-19 2015-07-27
USD775984S1 (en) * 2015-03-04 2017-01-10 Omron Corporation Probe pin
JP1554474S (en) * 2015-09-15 2016-07-25
JP1554473S (en) * 2015-09-15 2016-07-25
USD1090440S1 (en) * 2023-01-12 2025-08-26 Johnstech International Corporation Spring probe contact assembly

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3545080A (en) * 1967-05-16 1970-12-08 Amp Inc Method of making resilient pins
USD280401S (en) * 1982-03-26 1985-09-03 Oxley Developments Company Limited Terminal pin
USD354268S (en) * 1993-10-19 1995-01-10 The Siemon Company Telecommunications terminal clip
JP3768183B2 (en) 2002-10-28 2006-04-19 山一電機株式会社 IC socket for narrow pitch IC package
DE10323615A1 (en) * 2003-05-26 2004-12-23 Hirschmann Electronics Gmbh & Co. Kg Contact element and complementary line chamber for a plug or socket using insulation displacement technology
US6997757B2 (en) * 2004-06-24 2006-02-14 Sm Contact Electrical contact pin carrying a charge of solder and process for producing it
KR100584225B1 (en) 2004-10-06 2006-05-29 황동원 Electronic Contact
USD551623S1 (en) * 2005-01-21 2007-09-25 Tyco Electronics Amp Korea Ltd. Action pin
US7249981B2 (en) * 2005-07-08 2007-07-31 J.S.T. Corporation Press-fit pin
USD594420S1 (en) * 2008-09-02 2009-06-16 Iriso Electronics Co., Ltd. Electrical contact

Also Published As

Publication number Publication date
USD662895S1 (en) 2012-07-03

Similar Documents

Publication Publication Date Title
TWD138876S1 (en) Electric contact
MY167319A (en) Touch panel and display device with touch panel
TWI414802B (en)
TWD151640S (en) Electric contact
PH12013500859A1 (en) Method and apparatus for measuring oxidation-reduction potential
MX342862B (en) Method and apparatus for testing utility power devices.
JP2013032938A5 (en)
SG195107A1 (en) An electrical interconnect assembly
TWD157152S (en) Electric contact
CN202159074U (en) Power-on test device for solar cell
CN203658409U (en) Solar cell front side main gate line current and voltage test contact device
MX2014011821A (en) Multiple layer gel.
TWD157584S (en) Electric contact
WO2013138487A8 (en) Liquid sampling device for use with mobile device and methods
CN104730367A (en) Static test jig
CN203037788U (en) Conduction testing device
CN203645626U (en) Contact pressure solar cell I-V characteristic test probe station
TWD156495S (en) Electric contact
GB2522371A (en) Thermal-mechanical testing apparatus for electrically conductive specimen testing systems and method for use thereof
CN203414560U (en) Device detecting polarity of shearing sheet
AR090185A1 (en) CONNECTOR FOR CONNECTIONS BY FLAT INTERFACE AND HIGH VOLTAGE SUBSTATION THAT INCLUDES THE SAME
SG144903A1 (en) Electrical test device for testing electrical test pieces
CN203502508U (en) Field-type liquid crystal screen electrical performance testing tool
CN202794225U (en) Special fixture for battery testing device
CN202837527U (en) Watt hour meter testing platform