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TW376458B - Timing generator - Google Patents

Timing generator

Info

Publication number
TW376458B
TW376458B TW087113080A TW87113080A TW376458B TW 376458 B TW376458 B TW 376458B TW 087113080 A TW087113080 A TW 087113080A TW 87113080 A TW87113080 A TW 87113080A TW 376458 B TW376458 B TW 376458B
Authority
TW
Taiwan
Prior art keywords
clock
data
value
subtractor
periodic
Prior art date
Application number
TW087113080A
Other languages
English (en)
Inventor
Kazumichi Yoshiba
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Application granted granted Critical
Publication of TW376458B publication Critical patent/TW376458B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/02—Digital function generators
    • G06F1/025—Digital function generators for functions having two-valued amplitude, e.g. Walsh functions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
TW087113080A 1997-08-06 1998-08-06 Timing generator TW376458B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21183497 1997-08-06

Publications (1)

Publication Number Publication Date
TW376458B true TW376458B (en) 1999-12-11

Family

ID=16612368

Family Applications (1)

Application Number Title Priority Date Filing Date
TW087113080A TW376458B (en) 1997-08-06 1998-08-06 Timing generator

Country Status (6)

Country Link
US (1) US6253360B1 (zh)
JP (1) JP3068859B2 (zh)
KR (1) KR100318226B1 (zh)
DE (1) DE19881319C2 (zh)
TW (1) TW376458B (zh)
WO (1) WO1999008123A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI743638B (zh) * 2019-10-25 2021-10-21 瑞昱半導體股份有限公司 時序產生器、時序產生方法以及控制晶片

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6173432B1 (en) 1997-06-20 2001-01-09 Micron Technology, Inc. Method and apparatus for generating a sequence of clock signals
US6101197A (en) 1997-09-18 2000-08-08 Micron Technology, Inc. Method and apparatus for adjusting the timing of signals over fine and coarse ranges
TW428092B (en) * 1998-05-20 2001-04-01 Advantest Corp Semiconductor test system
US6349399B1 (en) 1998-09-03 2002-02-19 Micron Technology, Inc. Method and apparatus for generating expect data from a captured bit pattern, and memory device using same
US6470060B1 (en) * 1999-03-01 2002-10-22 Micron Technology, Inc. Method and apparatus for generating a phase dependent control signal
US6801989B2 (en) 2001-06-28 2004-10-05 Micron Technology, Inc. Method and system for adjusting the timing offset between a clock signal and respective digital signals transmitted along with that clock signal, and memory device and computer system using same
US6934896B2 (en) * 2001-12-31 2005-08-23 Advantest Corp. Time shift circuit for functional and AC parametric test
US7168027B2 (en) 2003-06-12 2007-01-23 Micron Technology, Inc. Dynamic synchronization of data capture on an optical or other high speed communications link
US7234070B2 (en) 2003-10-27 2007-06-19 Micron Technology, Inc. System and method for using a learning sequence to establish communications on a high-speed nonsynchronous interface in the absence of clock forwarding
US20060083626A1 (en) * 2004-10-19 2006-04-20 Manole Dan M Compressor and hermetic housing with minimal housing ports
US20060209884A1 (en) * 2005-03-15 2006-09-21 Macmullan Samuel J System, method and apparatus for automatic detection and automatic connection between a generalized content source and a generalized content sink
US20060209890A1 (en) * 2005-03-15 2006-09-21 Radiospire Networks, Inc. System, method and apparatus for placing training information within a digital media frame for wireless transmission
US20060212911A1 (en) * 2005-03-15 2006-09-21 Radiospire Networks, Inc. System, method and apparatus for wireless delivery of analog media from a media source to a media sink
US20060209892A1 (en) * 2005-03-15 2006-09-21 Radiospire Networks, Inc. System, method and apparatus for wirelessly providing a display data channel between a generalized content source and a generalized content sink
US7499462B2 (en) * 2005-03-15 2009-03-03 Radiospire Networks, Inc. System, method and apparatus for wireless delivery of content from a generalized content source to a generalized content sink
TWI339948B (en) * 2007-11-19 2011-04-01 Faraday Tech Corp Pll base timing generator and method of generating timing signal

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3235739B2 (ja) * 1992-06-24 2001-12-04 株式会社アドバンテスト タイミングおよび波形発生器
JP3466774B2 (ja) * 1995-05-17 2003-11-17 株式会社アドバンテスト 半導体試験装置における周期発生回路
JP2976276B2 (ja) * 1996-05-31 1999-11-10 安藤電気株式会社 タイミング発生器
JP3501200B2 (ja) * 1997-02-21 2004-03-02 株式会社アドバンテスト Ｉｃ試験装置
JP3701428B2 (ja) * 1997-03-25 2005-09-28 株式会社ルネサステクノロジ 半導体試験装置のタイミング発生装置
US6173432B1 (en) * 1997-06-20 2001-01-09 Micron Technology, Inc. Method and apparatus for generating a sequence of clock signals

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI743638B (zh) * 2019-10-25 2021-10-21 瑞昱半導體股份有限公司 時序產生器、時序產生方法以及控制晶片

Also Published As

Publication number Publication date
WO1999008123A1 (fr) 1999-02-18
KR100318226B1 (ko) 2001-12-22
KR20000068712A (ko) 2000-11-25
US6253360B1 (en) 2001-06-26
DE19881319T1 (de) 1999-09-02
DE19881319C2 (de) 2003-05-28
JP3068859B2 (ja) 2000-07-24

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees