TW202603605A - Optimization method for defect detection model and electronic device - Google Patents
Optimization method for defect detection model and electronic deviceInfo
- Publication number
- TW202603605A TW202603605A TW113126099A TW113126099A TW202603605A TW 202603605 A TW202603605 A TW 202603605A TW 113126099 A TW113126099 A TW 113126099A TW 113126099 A TW113126099 A TW 113126099A TW 202603605 A TW202603605 A TW 202603605A
- Authority
- TW
- Taiwan
- Prior art keywords
- optimized
- optimization method
- electronic device
- defect detection
- detection model
- Prior art date
Links
Abstract
The invention provides an optimization method for a defect detection model and an electronic device. The electronic device includes a processing device and a storage device electrically connected to the processing device. The processing device performs the optimization method, including: reading at least one negative sample training data, which has the same original image size; calculating an optimized segmentation range based on a target defect information; estimating an effective range of an overlapping area based on the optimized segmentation range; calculating a model segmentation quantity based on the original image size, the optimized segmentation range and the effective range to obtain an optimized modeling parameter; and applying the optimized modeling parameter to a defect detection model to perform model inference on at least one target image.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW113126099A TWI877045B (en) | 2024-07-11 | 2024-07-11 | Optimization method for defect detection model and electronic device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW113126099A TWI877045B (en) | 2024-07-11 | 2024-07-11 | Optimization method for defect detection model and electronic device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TWI877045B TWI877045B (en) | 2025-03-11 |
| TW202603605A true TW202603605A (en) | 2026-01-16 |
Family
ID=95830784
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW113126099A TWI877045B (en) | 2024-07-11 | 2024-07-11 | Optimization method for defect detection model and electronic device |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI877045B (en) |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2023092302A1 (en) * | 2021-11-23 | 2023-06-01 | 宁德时代新能源科技股份有限公司 | Image recognition method and apparatus, and computer-readable storage medium |
| TWI826108B (en) * | 2022-11-10 | 2023-12-11 | 州巧科技股份有限公司 | Method for establishing defect-detection model using fake defect images and system |
| CN116433978A (en) * | 2023-04-18 | 2023-07-14 | 心鉴智控(深圳)科技有限公司 | Automatic generation and automatic labeling method and device for high-quality flaw image |
| TWI843591B (en) * | 2023-06-01 | 2024-05-21 | 聯策科技股份有限公司 | Method for creating flaw image detection model, method for detecting flaw image and electronic device |
-
2024
- 2024-07-11 TW TW113126099A patent/TWI877045B/en active
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