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TW202603605A - Optimization method for defect detection model and electronic device - Google Patents

Optimization method for defect detection model and electronic device

Info

Publication number
TW202603605A
TW202603605A TW113126099A TW113126099A TW202603605A TW 202603605 A TW202603605 A TW 202603605A TW 113126099 A TW113126099 A TW 113126099A TW 113126099 A TW113126099 A TW 113126099A TW 202603605 A TW202603605 A TW 202603605A
Authority
TW
Taiwan
Prior art keywords
optimized
optimization method
electronic device
defect detection
detection model
Prior art date
Application number
TW113126099A
Other languages
Chinese (zh)
Other versions
TWI877045B (en
Inventor
洪聖閎
陳太一
Original Assignee
華碩電腦股份有限公司
Filing date
Publication date
Application filed by 華碩電腦股份有限公司 filed Critical 華碩電腦股份有限公司
Priority to TW113126099A priority Critical patent/TWI877045B/en
Priority claimed from TW113126099A external-priority patent/TWI877045B/en
Application granted granted Critical
Publication of TWI877045B publication Critical patent/TWI877045B/en
Publication of TW202603605A publication Critical patent/TW202603605A/en

Links

Abstract

The invention provides an optimization method for a defect detection model and an electronic device. The electronic device includes a processing device and a storage device electrically connected to the processing device. The processing device performs the optimization method, including: reading at least one negative sample training data, which has the same original image size; calculating an optimized segmentation range based on a target defect information; estimating an effective range of an overlapping area based on the optimized segmentation range; calculating a model segmentation quantity based on the original image size, the optimized segmentation range and the effective range to obtain an optimized modeling parameter; and applying the optimized modeling parameter to a defect detection model to perform model inference on at least one target image.
TW113126099A 2024-07-11 2024-07-11 Optimization method for defect detection model and electronic device TWI877045B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW113126099A TWI877045B (en) 2024-07-11 2024-07-11 Optimization method for defect detection model and electronic device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW113126099A TWI877045B (en) 2024-07-11 2024-07-11 Optimization method for defect detection model and electronic device

Publications (2)

Publication Number Publication Date
TWI877045B TWI877045B (en) 2025-03-11
TW202603605A true TW202603605A (en) 2026-01-16

Family

ID=95830784

Family Applications (1)

Application Number Title Priority Date Filing Date
TW113126099A TWI877045B (en) 2024-07-11 2024-07-11 Optimization method for defect detection model and electronic device

Country Status (1)

Country Link
TW (1) TWI877045B (en)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023092302A1 (en) * 2021-11-23 2023-06-01 宁德时代新能源科技股份有限公司 Image recognition method and apparatus, and computer-readable storage medium
TWI826108B (en) * 2022-11-10 2023-12-11 州巧科技股份有限公司 Method for establishing defect-detection model using fake defect images and system
CN116433978A (en) * 2023-04-18 2023-07-14 心鉴智控(深圳)科技有限公司 Automatic generation and automatic labeling method and device for high-quality flaw image
TWI843591B (en) * 2023-06-01 2024-05-21 聯策科技股份有限公司 Method for creating flaw image detection model, method for detecting flaw image and electronic device

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