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TW202519815A - Infrared heating device - Google Patents

Infrared heating device Download PDF

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Publication number
TW202519815A
TW202519815A TW113139796A TW113139796A TW202519815A TW 202519815 A TW202519815 A TW 202519815A TW 113139796 A TW113139796 A TW 113139796A TW 113139796 A TW113139796 A TW 113139796A TW 202519815 A TW202519815 A TW 202519815A
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Taiwan
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furnace
heating
temperature
gas
steam
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TW113139796A
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Chinese (zh)
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指宿貞幸
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日商DiV股份有限公司
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Publication of TW202519815A publication Critical patent/TW202519815A/en

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    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27FURNACES; KILNS; OVENS; RETORTS
    • F27BFURNACES, KILNS, OVENS OR RETORTS IN GENERAL; OPEN SINTERING OR LIKE APPARATUS
    • F27B9/00Furnaces through which the charge is moved mechanically, e.g. of tunnel type; Similar furnaces in which the charge moves by gravity
    • F27B9/06Furnaces through which the charge is moved mechanically, e.g. of tunnel type; Similar furnaces in which the charge moves by gravity heated without contact between combustion gases and charge; electrically heated
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B22CASTING; POWDER METALLURGY
    • B22FWORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
    • B22F3/00Manufacture of workpieces or articles from metallic powder characterised by the manner of compacting or sintering; Apparatus specially adapted therefor ; Presses and furnaces
    • B22F3/10Sintering only
    • B22F3/1003Use of special medium during sintering, e.g. sintering aid
    • B22F3/1007Atmosphere
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27FURNACES; KILNS; OVENS; RETORTS
    • F27BFURNACES, KILNS, OVENS OR RETORTS IN GENERAL; OPEN SINTERING OR LIKE APPARATUS
    • F27B9/00Furnaces through which the charge is moved mechanically, e.g. of tunnel type; Similar furnaces in which the charge moves by gravity
    • F27B9/30Details, accessories or equipment specially adapted for furnaces of these types
    • F27B9/3005Details, accessories or equipment specially adapted for furnaces of these types arrangements for circulating gases
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27FURNACES; KILNS; OVENS; RETORTS
    • F27BFURNACES, KILNS, OVENS OR RETORTS IN GENERAL; OPEN SINTERING OR LIKE APPARATUS
    • F27B9/00Furnaces through which the charge is moved mechanically, e.g. of tunnel type; Similar furnaces in which the charge moves by gravity
    • F27B9/30Details, accessories or equipment specially adapted for furnaces of these types
    • F27B9/36Arrangements of heating devices
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27FURNACES; KILNS; OVENS; RETORTS
    • F27DDETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
    • F27D11/00Arrangement of elements for electric heating in or on furnaces
    • F27D11/08Heating by electric discharge, e.g. arc discharge
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27FURNACES; KILNS; OVENS; RETORTS
    • F27DDETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
    • F27D7/00Forming, maintaining or circulating atmospheres in heating chambers
    • F27D7/04Circulating atmospheres by mechanical means

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical & Material Sciences (AREA)
  • Combustion & Propulsion (AREA)
  • Furnace Details (AREA)
  • Waste-Gas Treatment And Other Accessory Devices For Furnaces (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)

Abstract

The present invention provides an infrared heating device capable of performing a debinding process and a baking process in a short period of time. The infrared heating device comprises a carrier part for carrying an object, a heating lamp for illuminating infrared light for heating the object, a furnace chamber configured with the carrier part and the heating lamp and formed to be closed, a gas supply part for supplying gas to the furnace chamber, a gas discharge part for discharging gas from the furnace chamber, and a steam supply part that supplies steam to the furnace chamber separately from the gas supplied from the gas supply part, and a pressure control device that controls the pressure in the furnace chamber to positive or negative pressure.

Description

紅外線加熱裝置Infrared heating device

本發明是有關紅外線加熱裝置。更詳細而言,涉及一種紅外線加熱裝置,其包括:載置對象物的載置部;為了加熱該對象物而照射紅外線光的加熱燈;配置有該載置部及該加熱燈且構成可密閉的爐腔;向該爐腔內供給氣體的氣體供給部;及從該爐腔內排出氣體的氣體排氣部。The present invention relates to an infrared heating device. More specifically, it relates to an infrared heating device, which includes: a placing portion for placing an object; a heating lamp for irradiating infrared light to heat the object; a furnace cavity that is equipped with the placing portion and the heating lamp and is sealable; a gas supply portion for supplying gas into the furnace cavity; and a gas exhaust portion for exhausting gas from the furnace cavity.

眾所皆知,作為上述紅外線加熱裝置,例如有日本專利文獻1中記載的裝置。在該裝置中,從爐內天花板部的遠紅外線加熱器的間隙向爐內導入環境氣體。當進行去除粘合劑處理(以下簡稱為「脫黏」)時,爐內粘合劑成分中所含的C(碳)會增加,因此如果不排出(排氣)到爐外,則加熱器等就會被該C(碳)成分污染,並降低加熱效率。然而,該裝置沒有排氣構造,所以不能解決污染問題。另外,由於該裝置是連續輸送對象物並進行加熱,因此爐內無法實現氣密,難以對環境進行控制和管理。因此,脫粘和加熱(烘烤)需要時間。As is well known, as the above-mentioned infrared heating device, there is a device described in Japanese Patent Document 1, for example. In this device, ambient gas is introduced into the furnace from the gap of the far-infrared heater in the ceiling of the furnace. When the adhesive removal treatment (hereinafter referred to as "debonding") is performed, the C (carbon) contained in the adhesive component in the furnace will increase. Therefore, if it is not discharged (exhausted) to the outside of the furnace, the heater and the like will be contaminated by the C (carbon) component and the heating efficiency will be reduced. However, this device does not have an exhaust structure, so it cannot solve the pollution problem. In addition, since this device continuously transports the object and heats it, it is impossible to achieve airtightness in the furnace, and it is difficult to control and manage the environment. Therefore, debonding and heating (baking) take time.

[專利文獻][Patent Literature]

專利文獻1:日本專利特開2003-114092號公報。Patent document 1: Japanese Patent Publication No. 2003-114092.

有鑒於上述習知技術的實際情況,本發明的目的在於提供一種能夠在短時間內進行去除粘合劑處理及烘烤處理等加熱處理的紅外線加熱裝置。In view of the actual situation of the above-mentioned prior art, the purpose of the present invention is to provide an infrared heating device that can perform heating treatments such as adhesive removal treatment and baking treatment in a short time.

上述本發明的紅外線加熱裝置的目的,是根據以下技術所實現:The purpose of the infrared heating device of the present invention is achieved according to the following technologies:

一種紅外線加熱裝置,係包括有:載置對象物的載置部;為了加熱該對象物而照射紅外線光的加熱燈;配置有該載置部及該加熱燈且構成為可密閉的爐腔;向該爐腔內供給氣體的氣體供給部;及從該爐腔內排出氣體的氣體排氣部,其中,還包括:與從該氣體供給部所供給的該氣體分別地向該爐腔內供給蒸氣的蒸氣供給部;及將該爐腔內的壓力控制為正壓或負壓的壓力控制裝置。An infrared heating device includes: a placing portion for placing an object; a heating lamp for irradiating infrared light for heating the object; a furnace cavity which is equipped with the placing portion and the heating lamp and is configured to be sealable; a gas supply portion for supplying gas into the furnace cavity; and a gas exhaust portion for exhausting gas from the furnace cavity, wherein the device further includes: a steam supply portion for supplying steam into the furnace cavity separately from the gas supplied from the gas supply portion; and a pressure control device for controlling the pressure in the furnace cavity to be positive pressure or negative pressure.

在此,根據本發明的紅外線加熱裝置在配置有加熱燈並構成為可密閉的爐腔內,利用來自加熱燈的紅外線光對載置部的對象物進行加熱,因此能夠對對象物進行急劇加熱(升溫)。此時,對象物內部存在的粘合劑和溶劑等成分可在短時間內燃燒並與內部的氧結合,迅速釋放出有機成分(碳)。另一方面,由於該急劇的溫度上升,對對象物施加較多的熱應力,因此有時也會產生裂紋等現象。根據上述構造,還包括有與從該氣體供給部所供給的該氣體分別地向該爐腔內供給蒸氣的蒸氣供給部。由此,在加熱處理中能夠從蒸氣供給部向爐腔內供給蒸氣,因此氧容易浸透到對象部內部,進而促進加熱處理(反應)的同時防止裂紋等現象的發生。並且,還包括有將該爐腔內的壓力控制為正壓或負壓的壓力控制裝置。如果將爐腔內設為正壓,則由於在導入蒸氣時成為往爐腔內部施加了壓力的狀態,因此能夠將蒸氣均勻地填充到爐腔內,並能夠均勻地傳遞到對象物,進而能夠促進加熱處理(反應)。另一方面,若將爐腔內設為負壓,則促進爐腔內的氣體的排氣。這樣一來,透過在供給蒸氣的同時控制爐腔內的壓力,可以使處理迅速化。Here, according to the infrared heating device of the present invention, in a furnace cavity which is equipped with a heating lamp and is configured to be sealed, the infrared light from the heating lamp is used to heat the object on the carrier, so that the object can be rapidly heated (heated up). At this time, the components such as the adhesive and the solvent existing inside the object can burn in a short time and combine with the internal oxygen to quickly release the organic component (carbon). On the other hand, due to the rapid temperature rise, more thermal stress is applied to the object, so cracks and the like may sometimes occur. According to the above structure, it also includes a steam supply part which supplies steam to the furnace cavity separately from the gas supplied from the gas supply part. Thus, during the heat treatment, steam can be supplied from the steam supply unit to the furnace chamber, so that oxygen can easily penetrate into the interior of the object, thereby promoting the heat treatment (reaction) while preventing the occurrence of cracks and the like. In addition, a pressure control device is included to control the pressure in the furnace chamber to be positive pressure or negative pressure. If the furnace chamber is set to a positive pressure, since pressure is applied to the interior of the furnace chamber when the steam is introduced, the steam can be evenly filled into the furnace chamber and can be evenly transferred to the object, thereby promoting the heat treatment (reaction). On the other hand, if the furnace chamber is set to a negative pressure, the exhaust of the gas in the furnace chamber is promoted. In this way, by supplying steam and controlling the pressure in the furnace, the process can be accelerated.

在上述構造中,還包括用於冷卻該爐腔的爐壁的冷卻裝置,並且該蒸氣供給部可以具有在將該蒸氣供給到該爐腔內之前加溫的加溫部。為了使加熱爐整體冷卻,在爐壁上設置有冷卻器等冷卻裝置來冷卻爐壁。透過在向爐腔內供給之前利用加溫部進行加溫,就能夠抑制蒸氣的溫度降低,並且能夠防止在爐腔內發生結露。In the above structure, a cooling device for cooling the furnace wall of the furnace cavity is further included, and the steam supply part may have a heating part for heating the steam before supplying the steam into the furnace cavity. In order to cool the heating furnace as a whole, a cooling device such as a cooler is provided on the furnace wall to cool the furnace wall. By heating the steam by the heating part before supplying the steam into the furnace cavity, the temperature drop of the steam can be suppressed, and condensation can be prevented from occurring in the furnace cavity.

在如此的構造中,該加溫部設置在該爐壁的天花板部,可以具有向該爐腔內突出的複數個噴嘴。並且,該複數個噴嘴在噴嘴本體的圓周面上的四面設置有複數個通孔,該噴嘴本體的前端部可以封閉。由此,能夠使蒸氣更均勻地傳遞於載置部上的整個對象物。In such a structure, the heating part is arranged on the ceiling of the furnace wall and may have a plurality of nozzles protruding into the furnace cavity. In addition, the plurality of nozzles are provided with a plurality of through holes on four sides of the circumferential surface of the nozzle body, and the front end of the nozzle body may be closed. Thus, the steam can be more evenly transmitted to the entire object on the mounting part.

另外,在上述構造中,該蒸氣供給部是從該爐腔的頂部供給該蒸氣,該氣體排氣部可以從該爐腔的側面的至少一面排出該爐腔內的氣體。由於從頂部供給蒸氣並從側面的至少一面排出氣體,因此產生的氣體難以滯留在爐腔內,能夠順利地進行排氣。且,該載置部是具有與該加熱燈的長邊方向平行的長邊的長方形托盤,該氣體排氣部是從與該托盤的短邊相對的該爐腔的兩側面排出該爐腔內的氣體。由此,產生的氣體沿著托盤的長邊方向流向兩側面,因此能夠抑制產生的氣體的滯留,並能夠更有效地進行排氣。In addition, in the above structure, the steam supply part supplies the steam from the top of the furnace cavity, and the gas exhaust part can exhaust the gas in the furnace cavity from at least one side of the furnace cavity. Since the steam is supplied from the top and the gas is exhausted from at least one side, the generated gas is difficult to be retained in the furnace cavity, and the gas can be exhausted smoothly. In addition, the mounting part is a rectangular tray having a long side parallel to the long side direction of the heating lamp, and the gas exhaust part exhausts the gas in the furnace cavity from both sides of the furnace cavity opposite to the short side of the tray. As a result, the generated gas flows along the long side of the tray to both sides, so it is possible to suppress the stagnation of the generated gas and exhaust it more efficiently.

另一方面,在上述構造中,該蒸氣供給部是從該爐腔的頂部供應該蒸氣,而該氣體排放部也可以從該爐腔的頂部排放該爐腔中的氣體。On the other hand, in the above structure, the steam supply part supplies the steam from the top of the furnace cavity, and the gas discharge part can also discharge the gas in the furnace cavity from the top of the furnace cavity.

在上述構造中,該壓力控制裝置在向該爐腔內供給該蒸氣的期間,可以將該爐腔內的壓力控制為正壓。如果將爐腔內設定為正壓,則由於在導入蒸氣時成為往爐腔內部施加了壓力的狀態,因此能夠將蒸氣均勻地填充到爐腔內,能夠均勻地傳遞到對象物,進而能夠促進加熱處理(反應)。In the above structure, the pressure control device can control the pressure in the furnace chamber to be positive pressure during the period of supplying the steam into the furnace chamber. If the furnace chamber is set to be positive pressure, since the pressure is applied to the inside of the furnace chamber when the steam is introduced, the steam can be evenly filled into the furnace chamber and evenly transferred to the object, thereby promoting the heating process (reaction).

另外,在上述構造中,具有:複數次設定使該爐腔內的爐內溫度上升的升溫階段和使該爐內溫度下降的降溫階段的階段溫度設定部;及根據該爐內溫度的上升及下降來調整該加熱燈的輸出的輸出調整部,其中,該階段溫度設定部是設定以交替方式重複該升溫階段和該降溫階段至少2次以上的步驟中的各個升溫速度及降溫速度,該輸出調整部也可以根據該升溫速度及該降溫速度調整該加熱燈的輸出以使該加熱燈照射該紅外線光。根據我們的實驗,發現在短時間內升溫時,爐腔氧濃度在升溫過程中會降低,而升溫後的溫度保持一段時間,爐腔氧濃度幾乎沒有變化。也就是說,推測在升溫過程中脫黏會被促進。然後,在該急劇的溫度上升後降低溫度,再次使溫度急劇上升,透過反覆進行升溫和降溫至少2次以上,就可以在短時間內進行脫黏等的處理。In addition, in the above-mentioned structure, there are: a stage temperature setting unit that sets a plurality of heating stages for increasing the temperature inside the furnace cavity and a cooling stage for decreasing the temperature inside the furnace cavity; and an output adjusting unit that adjusts the output of the heating lamp according to the increase and decrease of the temperature inside the furnace, wherein the stage temperature setting unit sets each heating rate and cooling rate in the steps of repeating the heating stage and the cooling stage at least twice in an alternating manner, and the output adjusting unit can also adjust the output of the heating lamp according to the heating rate and the cooling rate so that the heating lamp irradiates the infrared light. According to our experiments, when the temperature is raised in a short time, the oxygen concentration in the furnace chamber decreases during the temperature rise process, and the oxygen concentration in the furnace chamber hardly changes when the temperature is kept for a period of time after the temperature rise. In other words, it is speculated that debonding is promoted during the temperature rise process. Then, after the rapid temperature rise, the temperature is lowered, and the temperature is raised again rapidly. By repeating the temperature rise and fall at least twice, debonding and other treatments can be performed in a short time.

另外,在上述構造中,該蒸氣供給部還可以包括:貯存溫水的貯存罐;向該溫水內供給混合氣體的混合氣體供給部;以及將該貯存罐內產生的蒸氣加溫並供給至該加溫部的加溫管路。在這種情況下,還包括:測量該爐腔內的爐內溫度的爐內溫度測量部;和設定將該蒸氣供給到該爐腔內時的供給開始溫度的供給開始溫度設定部,當該爐內溫度超過該供給開始溫度時,該蒸氣供給部可以將來自該加溫部的該蒸氣供給到該爐腔內。另外,還可以包括加溫溫度設定部,分別設定該貯存槽的溫度、該加溫管路的溫度及該加溫部的溫度。這樣一來,透過控制蒸氣的供給,能夠防止結露。在上述任一構造中,例如,上述對象物為MLCC。In addition, in the above structure, the steam supply unit may also include: a storage tank for storing hot water; a mixed gas supply unit for supplying a mixed gas into the hot water; and a heating pipeline for heating the steam generated in the storage tank and supplying it to the heating unit. In this case, it also includes: a furnace temperature measuring unit for measuring the furnace temperature in the furnace cavity; and a supply start temperature setting unit for setting the supply start temperature when the steam is supplied to the furnace cavity. When the furnace temperature exceeds the supply start temperature, the steam supply unit can supply the steam from the heating unit to the furnace cavity. In addition, it may also include a heating temperature setting unit for setting the temperature of the storage tank, the temperature of the heating pipeline, and the temperature of the heating unit, respectively. In this way, condensation can be prevented by controlling the supply of steam. In any of the above structures, for example, the above object is an MLCC.

根據上述本發明的紅外線加熱裝置的特徵,可以在短時間內進行去除粘合劑處理和烘烤處理等加熱處理。According to the characteristics of the infrared heating device of the present invention, heating treatments such as adhesive removal treatment and baking treatment can be performed in a short time.

關於本發明的其他的目的、構造及效果,透過以下的發明的實施方式的說明變得顯而易見。Other objects, structures and effects of the present invention will become apparent from the following description of the embodiments of the present invention.

以下,適當參考附圖並對本發明進行更詳細的說明。根據本發明的紅外線加熱裝置1大致包括有:供氣系統2、排氣系統3、蒸氣供給系統6、攝像頭7、控制裝置8和加熱爐20(如第一圖~第十圖所示)。作為載置進行處理的對象物C的載置部的托盤34為具有邊緣的橫長方形的盤狀,呈具有與加熱燈31(後述)的長邊方向L1平行的長邊的長方形。在本實施例中,以在托盤34上載置複數個作為對象物C的MLCC(multi-layer ceramic capacitor,層疊陶瓷電容器),從脫脂(去除黏合劑)到釉燒(glost firing)連續進行處理的情況為例進行以下說明。The present invention will be described in more detail below with reference to the accompanying drawings as appropriate. The infrared heating device 1 according to the present invention generally includes: an air supply system 2, an exhaust system 3, a steam supply system 6, a camera 7, a control device 8 and a heating furnace 20 (as shown in the first to tenth figures). The tray 34 as a placing part for placing the object C to be processed is a horizontal rectangular plate with edges, and is a rectangle with a long side parallel to the long side direction L1 of the heating lamp 31 (described later). In this embodiment, a case where a plurality of MLCCs (multi-layer ceramic capacitors) as objects C are placed on a tray 34 and are processed successively from degreasing (binder removal) to glaze firing (glost firing) is described below as an example.

供氣系統2具有供給路徑2a1、電磁閥2b1、氣瓶2c1,將氣瓶2c1內的氣體供給到在烘烤爐20的頂部設置的複數個氣體供給口(氣體供給部)即噴嘴30。供氣系統2具有供給路徑2a2、電磁閥2b2、氣瓶2c2,將氣瓶2c2內的冷卻氣體供給到設置在托盤34正下方的複數個冷卻噴嘴50。冷卻氣體,例如可以舉出氮氣N2氣體。The gas supply system 2 has a supply path 2a1, an electromagnetic valve 2b1, and a gas cylinder 2c1, and supplies the gas in the gas cylinder 2c1 to a plurality of gas supply ports (gas supply parts), i.e., nozzles 30, provided at the top of the baking oven 20. The gas supply system 2 has a supply path 2a2, an electromagnetic valve 2b2, and a gas cylinder 2c2, and supplies the cooling gas in the gas cylinder 2c2 to a plurality of cooling nozzles 50 provided just below the tray 34. The cooling gas may be, for example, nitrogen N2 gas.

另一方面,排氣系統3具有排出路徑3a和噴射器3b,在本實施例中,將爐腔21內的氣體從設置在與托盤34的短邊相對的爐腔21的兩側面上的左右氣體排氣口(氣體排氣部)35、35強制排出。噴射器3b由控制裝置8控制,作為將爐腔21內的壓力控制為正壓或負壓的壓力控制裝置而發揮作用。另外,控制裝置8除了進行氣體的供給和排氣之外,還按照設定的條件(曲線、程式),執行從脫脂到釉燒的處理。On the other hand, the exhaust system 3 has an exhaust path 3a and an ejector 3b, and in this embodiment, the gas in the furnace cavity 21 is forcibly exhausted from the left and right gas exhaust ports (gas exhaust parts) 35, 35 provided on both sides of the furnace cavity 21 opposite to the short side of the tray 34. The ejector 3b is controlled by the control device 8, and functions as a pressure control device for controlling the pressure in the furnace cavity 21 to positive pressure or negative pressure. In addition to supplying and exhausting gas, the control device 8 also executes the process from degreasing to glaze firing according to the set conditions (curve, program).

蒸氣供給系統6具有與從氣體供給噴嘴30供給的氣體分別地向爐腔21內供給蒸氣We的蒸氣供給部60。在本實施例中,蒸氣供給部60從加熱爐20的頂部(天花板)20a供給蒸氣We。The steam supply system 6 has a steam supply unit 60 for supplying steam We into the furnace chamber 21 separately from the gas supplied from the gas supply nozzle 30. In the present embodiment, the steam supply unit 60 supplies steam We from the top (ceiling) 20a of the heating furnace 20.

該蒸氣供給部60大致包括有:在向爐腔21內供給蒸氣We之前進行加溫的加溫部61;儲存生成往加溫部61供給的蒸氣We的溫水H的貯存罐62;作為往貯存罐62內供給混合氣體的混合氣體供給部的混合氣罐63(如第二圖所示)。The steam supply section 60 generally includes: a heating section 61 for heating the steam We before supplying it into the furnace chamber 21; a storage tank 62 for storing warm water H for generating the steam We supplied to the heating section 61; and a mixed gas tank 63 (as shown in the second figure) serving as a mixed gas supply section for supplying the mixed gas into the storage tank 62.

該加溫部61具有:設在加熱爐20的天花板部23a上的箱體61a和從箱體61a內部貫通天花板部23a並向爐腔21內突出的複數個蒸氣供給噴嘴61b。在箱體61a上設置有對內部空間進行加熱的加熱器61c。於此,在爐腔21的爐壁23上設置有作為冷卻裝置的冷卻管路36,對加熱爐20進行冷卻(如第四圖、第五圖所示)。因此,透過在將蒸氣We供給至爐腔21之前,在加溫部61中對蒸氣We進行加溫供給,抑制蒸氣We的溫度降低,同時防止在爐腔21內發生結露。另外,在加溫部61上設有測量內部溫度的溫度感測器61d。The heating part 61 includes a box 61a provided on the ceiling 23a of the heating furnace 20 and a plurality of steam supply nozzles 61b which penetrate the ceiling 23a from the inside of the box 61a and protrude into the furnace chamber 21. A heater 61c for heating the internal space is provided on the box 61a. Here, a cooling pipe 36 as a cooling device is provided on the furnace wall 23 of the furnace chamber 21 to cool the heating furnace 20 (as shown in the fourth and fifth figures). Therefore, by heating and supplying the steam We in the heating part 61 before supplying the steam We to the furnace chamber 21, the temperature drop of the steam We is suppressed, and condensation is prevented from occurring in the furnace chamber 21. In addition, the heating section 61 is provided with a temperature sensor 61d for measuring the internal temperature.

貯存罐62在槽罐體62a上設有加熱器62b,將溫水H加溫到預定溫度。從混合氣體罐63供給的混合氣體透過供給管62c供給到溫水H中,並在槽罐體62a內產生蒸氣(氣泡)。生成的蒸氣We從排出管62d通過加溫管路64供給到加溫部61。加溫管路64防止例如被加溫到30℃~50℃的蒸氣We的降溫。另外,在加溫管路64上也設置有測量內部溫度的溫度感測器64a。The storage tank 62 is provided with a heater 62b on the tank body 62a, and the hot water H is heated to a predetermined temperature. The mixed gas supplied from the mixed gas tank 63 is supplied to the hot water H through the supply pipe 62c, and steam (bubbles) are generated in the tank body 62a. The generated steam We is supplied to the heating part 61 through the exhaust pipe 62d through the heating pipe 64. The heating pipe 64 prevents the steam We heated to 30°C to 50°C from cooling down. In addition, the heating pipe 64 is also provided with a temperature sensor 64a for measuring the internal temperature.

混合氣罐63包括有MFC(Mass flow Controller)等流量控制部63a,控制向槽罐體62a的氣體供給量。作為混合氣體,例如至少含有氫和氮,其混合比等可適當調整。The mixed gas tank 63 includes a flow control unit 63a such as an MFC (Mass flow Controller) to control the amount of gas supplied to the tank body 62a. The mixed gas contains at least hydrogen and nitrogen, for example, and the mixing ratio thereof can be appropriately adjusted.

加熱燈31透過紅外線加熱上述托盤34。另一方面,溫度測量部32透過熱電偶測量托盤34的溫度。在基於溫度測量部32的溫度監測中,後述的控制裝置8的輸出調整部88a控制加熱燈31的加熱電力,並根據由後述的曲線設定部80設定(程式)的曲線進行加溫或冷卻。The heating lamp 31 heats the tray 34 by infrared rays. On the other hand, the temperature measuring unit 32 measures the temperature of the tray 34 by a thermocouple. In the temperature monitoring by the temperature measuring unit 32, the output adjustment unit 88a of the control device 8 described later controls the heating power of the heating lamp 31, and performs heating or cooling according to the curve set (programmed) by the curve setting unit 80 described later.

控制裝置8例如由個人電腦構成,包括有:設定作為對象物C的MLCC的至少脫黏條件及烘烤條件的曲線設定部80、監控部87、控制部88、記錄部89(如第三圖所示)。The control device 8 is constituted by, for example, a personal computer, and includes: a curve setting unit 80 for setting at least debonding conditions and baking conditions of the MLCC as the object C, a monitoring unit 87, a control unit 88, and a recording unit 89 (as shown in the third figure).

第一圖、第二圖中的點劃線表示電控系統,與此等連接的構件或測定部、感測器類等全部向控制裝置8發送信號或數據,由控制裝置8的控制部88來控制。攝像頭7將加熱爐20內的狀況記錄到逐次控制裝置8的記錄部89中。亦即,控制裝置8能夠簡單地設定、變更在處理(從脫脂到釉燒)時何時以幾次進行加熱或冷卻的溫度曲線和氣體供給及排氣的兩個定時,能夠在執行加熱或冷卻的同時將攝像頭7的圖像與執行結果的溫度數據一起記錄。The dotted lines in the first and second figures represent the electronic control system, and all the components, measuring parts, sensors, etc. connected thereto send signals or data to the control unit 8, and are controlled by the control unit 88 of the control unit 8. The camera 7 records the conditions in the heating furnace 20 in the recording unit 89 of the sequential control unit 8. That is, the control unit 8 can easily set and change the temperature curve and the two timings of gas supply and exhaust when and how many times to perform heating or cooling during the process (from degreasing to glazing), and can record the image of the camera 7 together with the temperature data of the execution result while performing heating or cooling.

曲線設定部80大致具有:階段溫度設定部81、溫度設定部82、調整向爐腔21內的氣體供給量及從爐腔21內的氣體排氣量的氣體量設定部83、及設定蒸氣We的供給的蒸氣供給設定部84。The curve setting unit 80 generally includes a stage temperature setting unit 81, a temperature setting unit 82, a gas amount setting unit 83 for adjusting the gas supply amount to the furnace chamber 21 and the gas exhaust amount from the furnace chamber 21, and a steam supply setting unit 84 for setting the supply of steam We.

階段溫度設定部81複數次設定使爐腔21內的爐內溫度上升的升溫階段S1和使爐腔21內的爐內溫度下降的降溫階段S2。階段溫度設定部81設定至少包含以交替方式重複升溫階段S1和降溫階段S2至少2次以上的處理步驟的脫黏處理和烘烤處理中的各升溫速度及降溫速度。另外,在本說明書中,將以交替方式反覆升溫階段S1和降溫階段S2至少2次以上的處理步驟稱為脈冲處理S。另外,設定的升溫速度為+5℃/sec~+25℃/sec,降溫速度為-25℃/sec~-5℃/sec。The stage temperature setting unit 81 sets the temperature rising stage S1 for raising the internal temperature of the furnace chamber 21 and the temperature falling stage S2 for lowering the internal temperature of the furnace chamber 21 multiple times. The stage temperature setting unit 81 sets the temperature rising speed and the temperature falling speed in the debonding treatment and baking treatment, which at least include the treatment steps of repeating the temperature rising stage S1 and the temperature falling stage S2 at least twice in an alternating manner. In addition, in this specification, the treatment step of repeating the temperature rising stage S1 and the temperature falling stage S2 at least twice in an alternating manner is referred to as the pulse treatment S. In addition, the set temperature rising speed is +5°C/sec to +25°C/sec, and the temperature falling speed is -25°C/sec to -5°C/sec.

溫度設定部82包括有:設定向爐腔21內供給蒸氣We時的供給開始溫度的供給開始溫度設定部82a;和分別設定貯存罐62的溫度、加溫管路64的溫度及加溫部61的溫度的加溫溫度設定部82b。另外,階段溫度設定部81設定處理中的各階段的峰值溫度和保持溫度。The temperature setting unit 82 includes a supply start temperature setting unit 82a for setting the supply start temperature when the steam We is supplied into the furnace chamber 21, and a heating temperature setting unit 82b for respectively setting the temperature of the storage tank 62, the temperature of the heating pipe 64, and the temperature of the heating unit 61. In addition, the stage temperature setting unit 81 sets the peak temperature and the holding temperature of each stage in the process.

氣體量設定部83具有:設定向爐腔21內供給的氣體量的供給量設定部83a;和設定從爐腔21排出的氣體量的排氣量設定部83b。蒸氣供給設定部84在脫黏處理或烘烤處理的熱處理中設定有蒸氣We的供給的開/關。The gas amount setting unit 83 includes a supply amount setting unit 83a for setting the amount of gas supplied into the furnace chamber 21 and an exhaust amount setting unit 83b for setting the amount of gas exhausted from the furnace chamber 21. The steam supply setting unit 84 sets the on/off of the supply of steam We during the heat treatment of the debonding treatment or the baking treatment.

控制部88包括根據升溫速度及降溫速度來調整加熱燈31的輸出的輸出調整部88a。輸出調整部88a根據由階段溫度設定部81所設定的升溫速度及降溫速度來調整加熱燈31的輸出,讓加熱燈31照射紅外線光。The control unit 88 includes an output adjustment unit 88a for adjusting the output of the heating lamp 31 according to the heating speed and the cooling speed. The output adjustment unit 88a adjusts the output of the heating lamp 31 according to the heating speed and the cooling speed set by the stage temperature setting unit 81, so that the heating lamp 31 radiates infrared light.

監控部87是用以監視上述溫度測量部32的溫度(爐內溫度)、各溫度感測器61d、64a的加溫溫度、爐內的氧濃度感測器39的氧濃度等爐內狀況。控制部88是基於由曲線設定部80所設定的條件(曲線)及由監控部87監視的各種數據,控制氣體的供給、排氣、蒸氣We的供給、停止、加熱燈的輸出等。記錄部89是記錄由監控部87所監視的各種數據和控制部88的控制、攝像頭7等的處理中的狀況。The monitoring unit 87 is used to monitor the temperature of the temperature measuring unit 32 (temperature in the furnace), the heating temperature of each temperature sensor 61d, 64a, the oxygen concentration of the oxygen concentration sensor 39 in the furnace, and other conditions in the furnace. The control unit 88 controls the supply and exhaust of gas, the supply and stop of steam We, the output of the heating lamp, etc. based on the conditions (curve) set by the curve setting unit 80 and various data monitored by the monitoring unit 87. The recording unit 89 records various data monitored by the monitoring unit 87 and the control of the control unit 88, the conditions in the processing of the camera 7, etc.

如第二圖~第四圖所示,加熱爐20在剖面上呈現具有6個頂點的拋物線如花的形狀那樣集中的內表面,並成為相對於左右的長邊方向L1具有相同形狀的爐壁23。在各拋物線的焦點F(F1、F2a、F2b、F3a、F3b)上,沿該長邊方向L1配置成條狀的加熱燈,以使其中心的燈絲位於該加熱燈上。因此,從作為焦點F的加熱燈31的燈絲所發出的紅外線光被作為反射面的爐壁23反射並平行行進,集中到爐腔21的內部空間22的中央部,對該部分進行均勻加熱。As shown in the second to fourth figures, the heating furnace 20 has an inner surface where parabolas with six vertices are concentrated like a flower shape in cross section, and the furnace wall 23 has the same shape with respect to the longitudinal direction L1 on the left and right. At the focal point F (F1, F2a, F2b, F3a, F3b) of each parabola, a strip-shaped heating lamp is arranged along the longitudinal direction L1 so that the filament at the center is located on the heating lamp. Therefore, the infrared light emitted from the filament of the heating lamp 31 as the focal point F is reflected by the furnace wall 23 as a reflection surface and travels in parallel, and is concentrated to the central part of the internal space 22 of the furnace cavity 21, and the part is uniformly heated.

特別是參考第五圖說明這一點。在該圖中,在左右4個地方和下面1個地方設置了加熱燈31。從燈絲所在的各拋物線的焦點F(F1,F2a,F2b,F3a,F3b)所發出的光的光路徑中,透過拋物線端部附近和中央的部分用雙點劃線記述。透過從左右焦點F2a、F2b、F3a、F3b來的光,可以看到托盤34被容置在中央部分的4個菱形區域內並被均勻加熱的樣子。另外,透過下側的焦點F1,包含有接觸構件32a的中央部被加熱,並能夠正確地進行溫度測量。另外,除了從各焦點F往托盤34的直接照射以外,進入到其他焦點區域的拋物線的面的光在該面被反射,同樣地照射到托盤34。This point is explained with reference to FIG. 5 in particular. In the figure, heating lamps 31 are provided at four locations on the left and right and one location at the bottom. In the optical path of the light emitted from the focal points F (F1, F2a, F2b, F3a, F3b) of each parabola where the filament is located, the portion passing through the vicinity of the end of the parabola and the center is indicated by a double-point line. Through the light from the left and right focal points F2a, F2b, F3a, and F3b, it can be seen that the tray 34 is accommodated in the four diamond-shaped areas in the center and is heated uniformly. In addition, through the focal point F1 on the lower side, the center portion including the contact member 32a is heated, and the temperature can be measured accurately. In addition to direct radiation from each focal point F to the tray 34 , light entering the parabola surface of other focal point regions is reflected by the surface and radiates to the tray 34 in the same manner.

因此,即使托盤34在與長邊方向L1正交的前後方向L2上具有寬度,也能夠均勻地加熱。另外,剖面的形狀也可以是拋物線以外的橢圓形狀,在一個焦點上配置加熱燈31的燈絲,在另一個焦點上配置托盤34的中央。然而,對於托盤34整體的加溫均一性,拋物線形狀更好。在橢圓的情況下,透過增加燈絲的發光面積,可以緩和加熱的偏差。Therefore, even if the tray 34 has a width in the front-rear direction L2 orthogonal to the long-side direction L1, it can be heated uniformly. In addition, the cross-sectional shape may be an elliptical shape other than a parabola, and the filament of the heating lamp 31 may be arranged at one focus, and the center of the tray 34 may be arranged at another focus. However, for the uniform heating of the entire tray 34, a parabolic shape is better. In the case of an ellipse, the heating deviation can be alleviated by increasing the light-emitting area of the filament.

加熱燈31雖然省略了圖示,但是將作為發熱部(發光部)的螺旋狀燈絲沿該長邊方向L1被容置在直管狀的石英管中並左右支撐,在其內部封入有鹵素氣體等。從左右端子供給電力,透過晶閘管等並由前面的控制裝置8來控制散熱狀態。在電力的供給下,當燈絲發光時,從這裏所發出的紅外線光被前面的爐壁23反射,進行如上所述的加溫。加熱燈31除了頂部之外設置有5個。Although the heating lamp 31 is not shown in the figure, the spiral filament as the heating part (light-emitting part) is accommodated in a straight quartz tube along the longitudinal direction L1 and supported on the left and right sides, and halogen gas etc. is sealed inside. Electricity is supplied from the left and right terminals, and the heat dissipation state is controlled by the control device 8 in front through the thyristor etc. When the filament is lit under the supply of electricity, the infrared light emitted from here is reflected by the furnace wall 23 in front, and the heating is performed as described above. There are 5 heating lamps 31 except the top one.

在此,如第四圖、第五圖所示,在爐腔21上形成有作為爐壁23的冷卻裝置的適當的冷卻管路36,透過使冷卻管路36流通冷卻水,進而防止爐腔21的過熱。由於爐壁23被冷卻管路36冷卻,所以當向爐腔21內供給蒸氣We時,爐壁23的內面結露而附著水滴。因此,在本發明中,如上所述,透過由加溫部61對蒸氣We進行加溫,抑制蒸氣We的溫度降低,進而防止在爐腔21內發生結露。並且,透過控制裝置8控制在爐內溫度升溫到預定溫度以上時向爐腔21內供給蒸氣We,從而進一步抑制結露的現象發生。Here, as shown in FIG. 4 and FIG. 5, an appropriate cooling pipe 36 is formed in the furnace chamber 21 as a cooling device for the furnace wall 23, and cooling water is passed through the cooling pipe 36 to prevent overheating of the furnace chamber 21. Since the furnace wall 23 is cooled by the cooling pipe 36, when the steam We is supplied into the furnace chamber 21, condensation occurs on the inner surface of the furnace wall 23 and water droplets are attached. Therefore, in the present invention, as described above, the steam We is heated by the heating unit 61 to suppress the temperature drop of the steam We, thereby preventing condensation from occurring in the furnace chamber 21. Furthermore, the control device 8 controls the supply of steam We into the furnace chamber 21 when the temperature in the furnace rises to a predetermined temperature or higher, thereby further suppressing the occurrence of condensation.

在加熱爐20的爐腔21中,前面開口部24和背面開口部25是與前端的前後方向L2並列設置,容易進行內部空間22的清掃等。各開口部由前蓋26和背蓋27封閉成密閉狀態。在爐腔21的中央部形成通孔28a,並在該通孔28a上設置由石英等透明耐熱材料構成的觀察視窗28,用上述攝像頭7進行攝影。儘管第八圖中僅示意性地圖示一個代表性的加熱燈31,但是使兩端的各端子部都貫通到爐腔21外而突出,且各端部均透過密封件31a及固定端蓋31b保持內部空間22的氣密性。In the furnace chamber 21 of the heating furnace 20, the front opening 24 and the back opening 25 are arranged in parallel with the front-rear direction L2 of the front end, so that the internal space 22 can be easily cleaned. Each opening is sealed by a front cover 26 and a back cover 27. A through hole 28a is formed in the central part of the furnace chamber 21, and an observation window 28 made of a transparent heat-resistant material such as quartz is provided on the through hole 28a, and photography is performed using the above-mentioned camera 7. Although only a representative heating lamp 31 is schematically illustrated in FIG. 8, each terminal portion at both ends is passed through the furnace chamber 21 to protrude, and each end portion is sealed by a seal 31a and a fixed end cover 31b to maintain the airtightness of the internal space 22.

背蓋27主要只在清掃時使用,平常托盤34是透過前蓋26的開閉進行取放動作。背蓋27是由下側的鉸鏈來支撐,以鉸鏈作為支點來開閉。相對之,前蓋26透過動作裝置(未圖示)水平移動而開閉。The back cover 27 is mainly used only during cleaning. The tray 34 is usually placed and taken out by opening and closing the front cover 26. The back cover 27 is supported by the hinge on the lower side and is opened and closed with the hinge as a fulcrum. In contrast, the front cover 26 is opened and closed by horizontal movement of the motion device (not shown).

托盤34的上面為扁平狀,在其周圍具有防止MLCC滑落的凸部,沿長邊方向L1在橫向上以略相同的剖面形成。另外,溫度測量部32在與上述托盤34接觸的小塊狀的接觸構件32a上所形成的孔中插入有支撐臂32b,其中配置有熱電偶結合部32c,並透過連接器32d用電纜與上述控制裝置8連接。托盤34和接觸構件32a都由吸收紅外線光的同一材料所構成,例如可以使用陶瓷、碳化矽(SiC)、在碳化矽(SiC)上塗布有氧化鋯(ZrO 2)等。 The upper surface of the tray 34 is flat, and has a convex portion around it to prevent the MLCC from sliding off, and is formed with a substantially uniform cross section in the transverse direction along the long side direction L1. In addition, the temperature measuring unit 32 has a support arm 32b inserted into a hole formed on a small block-shaped contact member 32a in contact with the tray 34, in which a thermocouple coupling portion 32c is arranged, and is connected to the control device 8 via a connector 32d with a cable. The tray 34 and the contact member 32a are both made of the same material that absorbs infrared light, for example, ceramics, silicon carbide (SiC), and silicon carbide (SiC) coated with zirconium oxide (ZrO 2 ) or the like.

另外,在托盤34的正下方,沿長邊方向L1以適當間隔配置有複數個往托盤34的下面噴射冷卻氣體的冷卻噴嘴50。在該冷卻噴嘴50中,在噴嘴50的上面沿噴嘴長邊方向(前後方向L2)以適當間隔形成有複數個噴嘴孔50a。由此,能夠對托盤34整體均勻且迅速地進行冷卻。如上所述,托盤34透過來自加熱燈31的紅外線光而升溫。本發明的紅外線加熱裝置1不是對對象物C本身直接加熱、冷卻,而是透過托盤34進行加熱、冷卻,特別是在烘烤MLCC等微細且大量的對象物C的情況下,能夠迅速且均勻地進行加熱、冷卻,能夠抑制各個對象物C的偏差。而且,由於溫度測量部32與托盤34的下表面接觸,所以能夠適當地進行溫度管理。In addition, a plurality of cooling nozzles 50 for spraying cooling gas toward the bottom of the tray 34 are arranged at appropriate intervals along the longitudinal direction L1 directly below the tray 34. In the cooling nozzle 50, a plurality of nozzle holes 50a are formed at appropriate intervals along the longitudinal direction of the nozzle (front-rear direction L2) on the top of the nozzle 50. Thus, the entire tray 34 can be uniformly and quickly cooled. As described above, the tray 34 is heated by the infrared light from the heating lamp 31. The infrared heating device 1 of the present invention heats and cools the object C directly, but heats and cools the object C through the tray 34. In particular, when baking a large number of fine objects C such as MLCC, the infrared heating device 1 can heat and cool the object C quickly and evenly, and can suppress the deviation of each object C. In addition, since the temperature measuring part 32 is in contact with the lower surface of the tray 34, the temperature can be properly managed.

在前蓋26上設有由石英等耐熱材料構成的一對支撐臂33。透過使用難以吸收紅外線光的材料(紅外線光的透過率較高的材料),防止對前蓋26的傳熱,同時不妨礙對托盤34的紅外線光照射,進而提高溫度控制和響應性能。前述支撐臂32b配置在支撐臂33、33之間,前述接觸構件32a配置在它們之間。A pair of support arms 33 made of heat-resistant material such as quartz is provided on the front cover 26. By using a material that is difficult to absorb infrared light (a material with high infrared light transmittance), heat transfer to the front cover 26 is prevented, while infrared light irradiation to the tray 34 is not hindered, thereby improving temperature control and response performance. The support arm 32b is arranged between the support arms 33, 33, and the contact member 32a is arranged between them.

在爐腔21的上面形成有複數個通孔29,在氣密狀態下安裝複數個作為氣體供給口的噴嘴30及蒸氣供給噴嘴61b。這些噴嘴3、061 b由難以吸收紅外線光的材料(紅外線光的透過率較高的材料)、例如石英管等構成,且不會妨礙紅外線光對托盤34的照射。在管狀噴嘴本體30a的周圍形成有複數個噴嘴孔30b,使氣體往四方分散。A plurality of through holes 29 are formed on the upper surface of the furnace chamber 21, and a plurality of nozzles 30 as gas supply ports and a steam supply nozzle 61b are installed in an airtight state. These nozzles 30, 61b are made of a material that is difficult to absorb infrared light (a material with a high transmittance of infrared light), such as a quartz tube, and do not hinder the irradiation of infrared light to the tray 34. A plurality of nozzle holes 30b are formed around the tubular nozzle body 30a to disperse the gas in all directions.

透過上述噴嘴30、61 b,氣體及蒸氣We均勻地傳遞到扁平的托盤34上。並且,從在與托盤34略相同的高度上,從沿托盤34的長邊方向L1的左右設置的氣體排氣口35、35透過噴射器3b進行排氣。透過該氣體及蒸氣We的供給和排氣的組合,氣體及蒸氣We的層都均勻地傳遞到托盤34上的對象物C。在MLCC的情況下,為了防止溶劑因脫黏等而脫離、錫膏(solder paste)的氧化,通常會使氣體及蒸氣We的層均勻地流動並更新,從而能夠防止這些不良影響。Through the above-mentioned nozzles 30, 61b, the gas and vapor We are uniformly transferred to the flat tray 34. And, the gas is exhausted through the ejector 3b from the gas exhaust ports 35, 35 provided at approximately the same height as the tray 34 and on the left and right along the long side direction L1 of the tray 34. Through the combination of the supply and exhaust of the gas and vapor We, the layer of the gas and vapor We is uniformly transferred to the object C on the tray 34. In the case of MLCC, in order to prevent the solvent from being separated due to debonding and the oxidation of the solder paste, the layer of the gas and vapor We is usually uniformly flowed and renewed, thereby preventing these adverse effects.

然而,在上述文獻等所示的一般使用的隧道爐中,由於是一邊用傳送帶等之運送裝置依次運送進行脫黏處理和烘烤處理的對象物,不能確保爐內的氣密性,因此不能將爐內的壓力切換控制為正壓或負壓。例如,在負壓的情況下,為了排出爐內產生的氣體,則需要吸入爐內的氣體(空氣),但是由於燃燒器或加熱器加熱後的氣體也會被排出,這往往會使爐內溫度容易下降,因此難以進行強排氣。另外,在正壓的情況下,從對象物產生的各種氣體不被排出而滯留在爐內,難以進行烘烤或脫黏等穩定的處理。However, in the tunnel furnace generally used as shown in the above-mentioned literature, the airtightness of the furnace cannot be ensured because the object to be debonded and baked is transported in sequence by a conveying device such as a conveyor belt, and therefore the pressure in the furnace cannot be switched to positive pressure or negative pressure. For example, in the case of negative pressure, in order to exhaust the gas generated in the furnace, it is necessary to suck in the gas (air) in the furnace, but since the gas heated by the burner or heater is also exhausted, this often makes the temperature in the furnace easy to drop, making it difficult to perform strong exhaust. In addition, in the case of positive pressure, various gases generated from the object are not exhausted but remain in the furnace, making it difficult to perform stable treatments such as baking or debonding.

另一方面,本發明的加熱爐20是利用來自加熱燈31的紅外線光對托盤34進行加熱(升溫),因此爐內溫度不會因排氣而急劇下降。另外,由於溫度測量部32設置在托盤34上,所以能夠測量對象物的正確的溫度。然後,如上所述,透過噴射器3b從氣體排氣口(氣體排氣部)35、35排出氣體。因此,透過控制向爐腔21內供給的供給量和從爐腔21內排出的排氣量,就能夠在避免爐內溫度降低的同時,控制處理中的爐腔21內部的壓力。相對於向爐腔21內的氣體供給量,透過增加噴射器3b的氣體排氣量使爐腔21內成為負壓,而透過減小噴射器3b的氣體排氣量使爐腔21內成為正壓,來控制爐腔21內的正壓和負壓的切換。On the other hand, the heating furnace 20 of the present invention heats (raises the temperature of) the tray 34 using infrared light from the heating lamp 31, so the temperature inside the furnace does not drop sharply due to exhaust gas. In addition, since the temperature measuring unit 32 is provided on the tray 34, the correct temperature of the object can be measured. Then, as described above, the gas is exhausted from the gas exhaust ports (gas exhaust units) 35, 35 through the ejector 3b. Therefore, by controlling the amount of gas supplied to the furnace chamber 21 and the amount of gas exhausted from the furnace chamber 21, the pressure inside the furnace chamber 21 during processing can be controlled while avoiding a decrease in the temperature inside the furnace. Relative to the gas supply amount to the furnace chamber 21, the furnace chamber 21 becomes negative pressure by increasing the gas exhaust amount of the injector 3b, and the furnace chamber 21 becomes positive pressure by reducing the gas exhaust amount of the injector 3b, thereby controlling the switching between positive pressure and negative pressure in the furnace chamber 21.

如果在爐腔21內形成負壓,則不會降低爐內溫度,而能夠將從對象物C產生的各種氣體強制排出到爐腔21外,爐腔21內產生的氣體不會滯留,因此能夠將對對象物C的不良影響抑制在最小限度。另外,還可以抑制產生的氣體附著在加熱燈31的表面或爐壁23的內面,防止熱效率的降低。If negative pressure is formed in the furnace chamber 21, various gases generated from the object C can be forced to be discharged outside the furnace chamber 21 without lowering the temperature in the furnace, and the gases generated in the furnace chamber 21 will not be retained, so that the adverse effects on the object C can be suppressed to a minimum. In addition, the generated gases can be suppressed from adhering to the surface of the heating lamp 31 or the inner surface of the furnace wall 23, thereby preventing the reduction of thermal efficiency.

另一方面,如果將爐腔21內設為正壓,則在導入蒸氣We時爐腔21內部則處於施加了壓力的狀態,因此,導入的蒸氣We能夠均勻地填充到爐腔21內,並能夠均勻地傳遞到對象物C上。另一方面,如果使爐腔21內為負壓,則促進爐腔21內的氣體的排氣,能夠抑制產生的氣體的滯留。On the other hand, if the furnace chamber 21 is set to a positive pressure, the furnace chamber 21 is in a state of being pressurized when the steam We is introduced, so the introduced steam We can be uniformly filled into the furnace chamber 21 and can be uniformly transferred to the object C. On the other hand, if the furnace chamber 21 is set to a negative pressure, the exhaust of the gas in the furnace chamber 21 is promoted, and the stagnation of the generated gas can be suppressed.

接著,作為紅外線加熱裝置1的使用方法,以第九圖及第十圖所示的曲線為例,說明從作為對象物C的在電極上附著了含有玻璃粉的銅膏(copper paste)的MLCC的去除粘合劑處理(脫黏、脫脂)及脫黏處理開始,在同一爐腔內連續進行烘烤處理的處理步驟。Next, as a method of using the infrared heating device 1, taking the curves shown in Figures 9 and 10 as an example, the processing steps starting from the removal of the adhesive (debonding, degreasing) and debonding treatment of the MLCC with copper paste containing glass powder attached to the electrode as the object C, and continuously performing the baking treatment in the same furnace chamber are explained.

首先,透過控制裝置8進行例如第九圖所示的曲線設定。在該實施例中,將處理步驟設為14個階段,設定各階段中的峰值溫度(℃)、升溫速度(℃/min)、峰值溫度維持時間(sec)、供給氣體(氮氫混合氣體及氮氣)及蒸氣的開關(Dry/Wet)以及排氣量(L/min)。該曲線如第十圖所示,表示溫度(縱軸)-時間(橫軸)的關係。在這種情況下,在供給開始溫度設定部81a中,將向爐腔21內供給蒸氣We時的供給開始溫度設定為例如100℃。因此,例如在階段2中,當爐內溫度超過100℃時,蒸氣We將被供給到爐腔21內。First, the control device 8 performs the curve setting as shown in FIG. 9, for example. In this embodiment, the processing steps are set to 14 stages, and the peak temperature (°C), the heating rate (°C/min), the peak temperature maintenance time (sec), the supply gas (nitrogen-hydrogen mixed gas and nitrogen) and the steam switch (Dry/Wet) and the exhaust volume (L/min) in each stage are set. The curve is shown in FIG. 10, which shows the relationship between temperature (vertical axis) and time (horizontal axis). In this case, in the supply start temperature setting unit 81a, the supply start temperature when the steam We is supplied to the furnace chamber 21 is set to, for example, 100°C. Therefore, for example, in stage 2, when the temperature in the furnace exceeds 100°C, the steam We will be supplied to the furnace chamber 21.

然後,將對象物C鋪在托盤34上,用機械手臂等將其放在支撐臂33、33上移動。接著,使開閉致動器(未圖示)伸長,並在氣密狀態下關閉前蓋26,同時將托盤34安裝在爐腔21的中央。Then, the object C is placed on the tray 34 and moved on the support arms 33, 33 by a robot arm or the like. Next, the opening and closing actuator (not shown) is extended, and the front cover 26 is closed in an airtight state, and the tray 34 is installed in the center of the furnace cavity 21.

接著,控制部88點亮加熱燈31開始加溫,同時打開電磁閥2b1,向噴嘴30供給氮氣。使噴射器3b動作而從氣體排氣口35排出爐腔21內的氣體。然後,根據設定的曲線,輸出調整部88a根據所設定的升溫速度及降溫速度來調整加熱燈31的輸出,使加熱燈31照射紅外線光。另外,控制部88根據氣體量設定部83及蒸氣供給設定部84來控制氣體的供給、排氣、蒸氣的開/關。當爐內溫度超過100℃時,則向爐腔21內供給蒸氣We。Next, the control unit 88 turns on the heating lamp 31 to start heating, and at the same time opens the electromagnetic valve 2b1 to supply nitrogen to the nozzle 30. The ejector 3b is operated to discharge the gas in the furnace chamber 21 from the gas exhaust port 35. Then, according to the set curve, the output adjustment unit 88a adjusts the output of the heating lamp 31 according to the set temperature increase rate and temperature decrease rate, so that the heating lamp 31 irradiates infrared light. In addition, the control unit 88 controls the supply of gas, exhaust, and on/off of steam according to the gas amount setting unit 83 and the steam supply setting unit 84. When the temperature in the furnace exceeds 100°C, steam We is supplied to the furnace chamber 21.

於此,在第九圖和第十圖所示的示例中,透過階段溫度設定部81將階段3設定為升溫速度為5℃/min的升溫階段S1,而將階段4設定為升溫速度為-5℃/min(降溫速度為5℃/min)的降溫階段S2。在階段5~10中,透過階段溫度設定部81以交替方式反覆設定升溫階段S1和降溫階段S2。因此,在階段3~10中,升溫階段S1和降溫階段S2以交替方式反覆4次,該熱處理步驟成為脈冲熱處理S。Here, in the example shown in FIG. 9 and FIG. 10, the stage 3 is set to the temperature rising stage S1 with a temperature rising rate of 5°C/min, and the stage 4 is set to the temperature falling stage S2 with a temperature rising rate of -5°C/min (temperature falling rate of 5°C/min) through the stage temperature setting unit 81. In stages 5 to 10, the temperature rising stage S1 and the temperature falling stage S2 are set alternately through the stage temperature setting unit 81. Therefore, in stages 3 to 10, the temperature rising stage S1 and the temperature falling stage S2 are repeated 4 times in an alternating manner, and the heat treatment step becomes a pulse heat treatment S.

另外,在本實施例中,透過供給量設定部83a及排氣量設定部83b,在升溫階段S1(階段3、5、7、9)中,將向爐腔21內的氣體排氣量設定為比氣體供給量少,而在降溫階段S2(階段4,6,8,10)中,將向爐腔21內的氣體排氣量設定為比氣體供給量多。亦即,在升溫階段S1中,將爐腔21內控制為正壓,而在降溫階段S2中,將爐腔21內控制為負壓。In addition, in this embodiment, the gas exhaust amount into the furnace chamber 21 is set to be less than the gas supply amount in the temperature increase stage S1 (stages 3, 5, 7, 9) through the supply amount setting unit 83a and the exhaust amount setting unit 83b, and the gas exhaust amount into the furnace chamber 21 is set to be greater than the gas supply amount in the temperature decrease stage S2 (stages 4, 6, 8, 10). That is, in the temperature increase stage S1, the furnace chamber 21 is controlled to be positive pressure, and in the temperature decrease stage S2, the furnace chamber 21 is controlled to be negative pressure.

如上所述,在該曲線中,設定為複數次反覆進行升溫(升溫速度為正值)和降溫(升溫速度為負值)。除了MLCC之外,感應器、線圈、高頻基板等電子零件都是在材料內混入粘合劑(樹脂、有機物)而製造的,在製品化時需要去除所含有的粘合劑。在上述文獻等所示的常用的隧道爐中,由於燃燒效率低,因此在升溫至預定溫度後,經過長時間(數小時至數十小時)並持續保持在預定溫度進行脫黏(脫脂)。As mentioned above, in this curve, the temperature is set to rise (the temperature rise rate is a positive value) and fall (the temperature rise rate is a negative value) repeatedly. In addition to MLCC, electronic parts such as sensors, coils, and high-frequency substrates are manufactured by mixing binders (resins, organic substances) into the materials, and the contained binders need to be removed during productization. In the commonly used tunnel furnace shown in the above literature, due to the low combustion efficiency, after the temperature is raised to a predetermined temperature, it takes a long time (several hours to dozens of hours) and is continuously maintained at the predetermined temperature for debonding (degreasing).

另外,在習知的隧道爐等中,透過利用燃燒器或加熱器來加熱內部的空氣(氣體)來進行熱處理,因此難以急劇地改變空氣的溫度,並且,由於與所產生的氣體一起被排出且爐內溫度容易降低,因此難以進行強排氣。另外,在正壓的情況下,從對象物產生的各種氣體不被排出而滯留在爐內,難以進行烘烤或脫黏等穩定的處理。In addition, in the known tunnel furnace, heat treatment is performed by heating the air (gas) inside with a burner or heater, so it is difficult to change the temperature of the air rapidly, and it is difficult to perform strong exhaust because the generated gas is exhausted and the temperature inside the furnace is easily lowered. In addition, in the case of positive pressure, various gases generated from the object are not exhausted but remain in the furnace, making it difficult to perform stable treatment such as baking or debonding.

然而,在根據本發明的紅外線加熱裝置1中,由於在密閉的爐腔21內利用來自加熱燈31的紅外線光對托盤34進行加熱(升溫),所以能夠使對象物C急劇升溫(升溫)。由此,存在於對象物C的內部的粘合劑和溶劑等能夠在短時間內燃燒,與內部的氧結合而迅速地釋放出有機成分(碳)。根據本發明人的實驗可知,在短時間升溫的情況下,在升溫過程中爐內的氧濃度會降低。另一方面,即使將升溫後的溫度保持一定時間,爐內的氧濃度也幾乎沒有變化。也就是說,推測在升溫過程中脫黏被促進。而且,在該急劇的溫度上升後降低溫度再次使溫度急劇上升,透過複數次反覆升溫和降溫,可以在短時間內脫黏。However, in the infrared heating device 1 according to the present invention, since the tray 34 is heated (heated) by infrared light from the heating lamp 31 in the closed furnace chamber 21, the object C can be rapidly heated (heated). As a result, the adhesive and solvent existing inside the object C can burn in a short time, combine with the internal oxygen and quickly release the organic component (carbon). According to the experiments of the inventors, when the temperature is raised in a short time, the oxygen concentration in the furnace will decrease during the temperature rise process. On the other hand, even if the temperature after the temperature rise is maintained for a certain period of time, the oxygen concentration in the furnace hardly changes. In other words, it is speculated that debonding is promoted during the temperature rise process. Then, after the rapid temperature rise, the temperature is lowered and the temperature is rapidly raised again. By repeating the temperature rise and fall multiple times, debonding can be achieved in a short time.

如上所述,由於急劇的溫度上升,對對象物C施加較多的熱應力,因此有時也會產生裂紋等。因此,在本實施例中,透過蒸氣供給設定部84,在脫黏處理(階段2~11)中,將蒸氣We的供給設定為ON。由此,由於在脫黏處理中從蒸氣供給部60向爐腔21內供給蒸氣We,所以氧氣容易浸透到對象物C內部,進一步促進脫黏的同時防止裂紋等的發生。在本實施例中,在升溫階段S1中將爐腔21內的壓力控制為正壓,同時在降溫階段S2中將爐腔21內的壓力控制為負壓。As described above, due to the rapid temperature rise, a large amount of thermal stress is applied to the object C, so cracks and the like may sometimes occur. Therefore, in this embodiment, the supply of steam We is set to ON in the debonding process (stages 2 to 11) through the steam supply setting unit 84. As a result, since steam We is supplied from the steam supply unit 60 to the furnace chamber 21 during the debonding process, oxygen easily penetrates into the interior of the object C, further promoting debonding while preventing the occurrence of cracks and the like. In this embodiment, the pressure in the furnace chamber 21 is controlled to be positive pressure in the temperature rise stage S1, and the pressure in the furnace chamber 21 is controlled to be negative pressure in the temperature drop stage S2.

特別是在對象物C為較大的產品的情況下,使蒸氣浸透至該對象物C(產品)內部需要點時間。因此,在促進脫黏(反應)的升溫時,透過將爐腔21內的壓力設為正壓促進氧向對象物C內部的滲透,而在降溫時,透過將爐腔21內的壓力設為負壓促進排氣,因此,脫黏處理能夠迅速化。在對象物C內為粘合劑成分較少的產品的情況下,升溫時透過將爐腔21內的壓力設為正壓來促進脫黏處理。In particular, when the object C is a relatively large product, it takes some time for the steam to penetrate into the object C (product). Therefore, when the temperature rises to promote the debonding (reaction), the pressure in the furnace chamber 21 is set to positive pressure to promote the penetration of oxygen into the object C, and when the temperature drops, the pressure in the furnace chamber 21 is set to negative pressure to promote the exhaust, so that the debonding process can be accelerated. In the case of a product with a small amount of adhesive components in the object C, the debonding process is promoted by setting the pressure in the furnace chamber 21 to positive pressure when the temperature rises.

另外,在本實施例中,階段11相當於2次脫黏處理。當溫度超過900℃時,如果對象物C中不含有粘合劑,則不會產生脫黏衍生的氣體,因此將排氣量控制為比供給氣體供給量少,將爐腔21內控制為正壓。In this embodiment, stage 11 is equivalent to the secondary debonding treatment. When the temperature exceeds 900°C, if the object C does not contain an adhesive, no debonding-derived gas is generated, so the exhaust gas volume is controlled to be less than the supply gas volume, and the furnace chamber 21 is controlled to be positive pressure.

然後,在本實施例的曲線中,持續脫黏處理(階段2~11)之後,設定烘烤處理(階段12)。如上所述,在本發明的控制裝置8中,由於能夠連續地設定脫黏處理及烘烤處理的條件(曲線),因此,不需要像習知技術那樣將脫黏處理和烘烤處理分為不同的步驟、裝置,就能夠連續地在同一爐內處理從脫黏到釉燒的步驟。另外,由於能夠將爐腔21內的壓力控制為正壓/負壓,因此透過在脫黏處理中切換正壓/負壓就能夠促進脫黏處理,並且還能夠促進脫黏處理產生的氣體的排氣。因此,即使在同一爐中連續進行脫黏處理和烘烤處理,也不會降低對象物C的品質。Then, in the curve of this embodiment, after the debonding process (stages 2 to 11) is continued, the baking process (stage 12) is set. As described above, in the control device 8 of the present invention, since the conditions (curves) of the debonding process and the baking process can be set continuously, it is not necessary to divide the debonding process and the baking process into different steps and devices as in the prior art, and the steps from debonding to glaze firing can be continuously processed in the same furnace. In addition, since the pressure in the furnace chamber 21 can be controlled to be positive pressure/negative pressure, the debonding process can be promoted by switching between positive pressure/negative pressure during the debonding process, and the exhaust of the gas generated by the debonding process can also be promoted. Therefore, even if the debonding process and the baking process are performed continuously in the same furnace, the quality of the object C will not be reduced.

烘烤結束後,在階段13、14中降低或停止加熱燈31的通電使其降溫。另外,根據需要也可以從冷卻噴嘴50向托盤34噴射作為冷卻氣體的氮氣,促進對象物C和托盤34的冷卻。在這些烘烤處理後的這些冷卻處理(階段13、14)中,透過蒸氣供給設定部84將蒸氣We的供給設定為OFF,在烘烤處理中完成蒸氣We的供給。依據與設定相反的順序移動各動作裝置等,更換托盤,就完成烘烤作業。根據本發明的紅外線加熱裝置1,在極短時間內就完成脫黏處理及烘烤處理(如第十圖所示)。After the baking is completed, the power supply to the heating lamp 31 is reduced or stopped in stages 13 and 14 to cool it down. In addition, if necessary, nitrogen as a cooling gas can be sprayed from the cooling nozzle 50 to the tray 34 to promote the cooling of the object C and the tray 34. In these cooling processes (stages 13 and 14) after these baking processes, the supply of steam We is set to OFF through the steam supply setting unit 84, and the supply of steam We is completed during the baking process. By moving each action device in the opposite order to the setting and replacing the tray, the baking operation is completed. According to the infrared heating device 1 of the present invention, the debonding process and the baking process are completed in a very short time (as shown in Figure 10).

以下,列舉本發明的其他實施例的可能性。對相同的構件標註相同的符號。在上述實施例中,冷卻噴嘴50配置在托盤34的正下方,但冷卻噴嘴50的位置並不限於托盤34的正下方。例如,也可以在托盤34的斜下方配置冷卻噴嘴50。這樣一來,透過將冷卻噴嘴50配置在托盤34的下側,就不會對對象物C產生影響而有效地冷卻托盤34。另外,只要是不對對象物C產生影響的方式,也可以將冷卻噴嘴50配置在托盤34的附近。The following lists possible other embodiments of the present invention. The same symbols are used for the same components. In the above embodiment, the cooling nozzle 50 is arranged directly below the tray 34, but the position of the cooling nozzle 50 is not limited to directly below the tray 34. For example, the cooling nozzle 50 may be arranged obliquely below the tray 34. In this way, by arranging the cooling nozzle 50 on the lower side of the tray 34, the tray 34 is effectively cooled without affecting the object C. In addition, as long as the cooling nozzle 50 is arranged in a manner that does not affect the object C, it is also possible to arrange it near the tray 34.

在上述實施例中,在MLCC中使用了銅膏,但也可以使用銀膏。在這種情況下,作為氣體,除了氮氣之外,也可以使用氧氣。另外,在上述實施例中,作為外部電極,將塗布了含有玻璃粉的銅膏的MLCC作為對象物C進行了說明。然而,對象物C及其烘烤步驟並不限於上述實施例。本發明的紅外線加熱裝置1例如也可以用於作為MLCC的外部電極燒結步驟的前步驟的晶片烘烤步驟。In the above-mentioned embodiment, copper paste is used in MLCC, but silver paste may also be used. In this case, oxygen may also be used as a gas in addition to nitrogen. In addition, in the above-mentioned embodiment, MLCC coated with copper paste containing glass powder as an external electrode is described as object C. However, object C and its baking step are not limited to the above-mentioned embodiment. The infrared heating device 1 of the present invention may also be used, for example, for a chip baking step as a previous step of the external electrode sintering step of MLCC.

在上述實施例中,分別說明了供給到加熱爐20內部的氣體和冷卻用氣體,但也可以切換使用兩種氣體。當然,本發明並不限於兩種,也可以使用一種或多種氣體。In the above embodiment, the gas supplied to the inside of the heating furnace 20 and the cooling gas are described separately, but the two gases can also be switched. Of course, the present invention is not limited to two gases, and one or more gases can also be used.

紅外線加熱裝置1的構造在不脫離本發明的主旨的前提下,皆可以進行上述以外的改變。例如,爐壁的剖面形狀雖然是6條拋物線,但也可以是5條或4條拋物線的集合形狀。The structure of the infrared heating device 1 can be modified other than the above without departing from the main purpose of the present invention. For example, although the cross-sectional shape of the furnace wall is 6 parabolas, it can also be a collection of 5 or 4 parabolas.

在上述實施例中,從爐腔21的上部供給蒸氣並從隔著托盤相對的爐腔21的兩側面排出氣體,但本發明不限於兩側面,也可以從爐腔21的側面的至少一面排出爐腔21內的氣體。另一方面,當排出的氣體量較多時,也可以從爐腔21的上部供給蒸氣,同時從爐腔21的上部排出爐腔21內的氣體。In the above embodiment, steam is supplied from the upper part of the furnace cavity 21 and gas is exhausted from both sides of the furnace cavity 21 opposite to each other across the tray, but the present invention is not limited to both sides, and gas in the furnace cavity 21 may be exhausted from at least one side of the furnace cavity 21. On the other hand, when the amount of exhausted gas is large, steam may be supplied from the upper part of the furnace cavity 21 and gas in the furnace cavity 21 may be exhausted from the upper part of the furnace cavity 21.

另外,第九圖和第十圖所示的上述實施例中的曲線只不過是一個示例,本發明並不限於此。在上述的曲線的示例中,在脫黏處理中,在升溫階段S1中將爐腔21內的壓力控制為正壓,同時在降溫階段中將爐腔21內的壓力控制為負壓。然而,也可以透過脫黏處理過程中向爐腔21內供給蒸氣We,同時將爐腔21內的壓力控制為正壓。由此,促進讓氧往對象物C內部的浸透,謀求脫黏處理的迅速化。另外,在烘烤處理時,也可以將爐腔21內的壓力控制為負壓,以促進排氣。另外,如上述實施例所示,在烘烤處理後,也可以將爐腔21內的壓力控制為負壓。In addition, the curves in the above-mentioned embodiments shown in Figures 9 and 10 are only examples, and the present invention is not limited to this. In the above-mentioned curve example, in the debonding process, the pressure in the furnace chamber 21 is controlled to be positive pressure in the temperature rise stage S1, and the pressure in the furnace chamber 21 is controlled to be negative pressure in the temperature drop stage. However, it is also possible to supply steam We into the furnace chamber 21 during the debonding process, and at the same time control the pressure in the furnace chamber 21 to be positive pressure. In this way, the penetration of oxygen into the interior of the object C is promoted, and the debonding process is accelerated. In addition, during the baking process, the pressure in the furnace chamber 21 can also be controlled to be negative pressure to promote exhaust. In addition, as shown in the above embodiment, after the baking process, the pressure in the furnace cavity 21 can also be controlled to be negative pressure.

另外,本發明的實施例如上所述構造,但更全面而言,也可以包括以下列舉的構造。本發明之另一目的是提供一種能夠大幅度縮短脫黏處理時間的脫黏裝置及使用該脫黏裝置的脫黏方法。In addition, the embodiments of the present invention are constructed as described above, but more comprehensively, they may also include the following structures. Another object of the present invention is to provide a debonding device that can significantly shorten the debonding treatment time and a debonding method using the debonding device.

為了達到上述目的,脫黏裝置其特徵為,包括有:載置包含有粘合劑成分的對象物的載置部;為了加熱該對象物而照射紅外線光的加熱燈;配置有該載置部及該加熱燈且構成為可密閉的爐腔;向該爐腔內供給氣體的氣體供給部;及從該爐腔內排出氣體的氣體排氣部,並具有:複數次設定使該爐腔內的爐內溫度上升的升溫階段和使該爐內溫度下降的降溫階段的階段溫度設定部;及根據該爐內溫度的上升及下降來調整該加熱燈的輸出的輸出調整部,該階段溫度設定部是設定至少包括以交替方式重複該升溫階段和該降溫階段至少2次以上的脫黏處理中的各個升溫速度及降溫速度,該輸出調整部是根據該升溫速度及該降溫速度調整該加熱燈的輸出以使該加熱燈照射該紅外線光。In order to achieve the above-mentioned purpose, the debonding device is characterized by comprising: a placing portion for placing an object containing an adhesive component; a heating lamp for irradiating infrared light for heating the object; a furnace cavity configured with the placing portion and the heating lamp and configured to be sealable; a gas supply portion for supplying gas into the furnace cavity; and a gas exhaust portion for exhausting gas from the furnace cavity, and having: a plurality of temperature rising stages for increasing the temperature in the furnace cavity and a plurality of temperature reducing stages for increasing the temperature in the furnace cavity. a stage temperature setting unit for a cooling stage in which the temperature drops; and an output adjusting unit for adjusting the output of the heating lamp according to the rise and fall of the temperature in the furnace, wherein the stage temperature setting unit sets each heating rate and cooling rate in the debonding process including at least repeating the heating stage and the cooling stage at least twice in an alternating manner, and the output adjusting unit adjusts the output of the heating lamp according to the heating rate and the cooling rate so that the heating lamp irradiates the infrared light.

於此,根據本發明的脫黏裝置,包括有:載置包含有粘合劑成分的對象物的載置部;為了加熱該對象物而照射紅外線光的加熱燈;配置有該載置部及該加熱燈且構成為可密閉的爐腔;向該爐腔內供給氣體的氣體供給部;及從該爐腔內排出氣體的氣體排氣部。因此,含有粘合劑成分的對象物在配置有加熱燈且構成為可密閉的爐腔內,透過來自加熱燈的紅外線光進行加熱,因此能夠急劇加熱(升溫)對象物。此時,對象物內部存在的粘合劑和溶劑等成分可在短時間內燃燒,與內部的氧結合,迅速地釋放出有機成分(碳)。根據本發明人的實驗可知,在短時間升溫的情況下,在升溫過程中爐內的氧濃度會降低。另一方面,即使將升溫後的溫度保持一定時間,爐內的氧濃度也幾乎沒有變化。也就是說,推測在升溫過程中脫黏會被促進。Here, according to the debonding device of the present invention, it includes: a placing part for placing an object containing an adhesive component; a heating lamp for irradiating infrared light to heat the object; a furnace cavity equipped with the placing part and the heating lamp and configured to be sealable; a gas supply part for supplying gas into the furnace cavity; and a gas exhaust part for exhausting gas from the furnace cavity. Therefore, the object containing an adhesive component is heated by the infrared light from the heating lamp in the furnace cavity equipped with the heating lamp and configured to be sealable, so that the object can be rapidly heated (temperature increased). At this time, components such as the adhesive and solvent existing inside the object can burn in a short time, combine with the oxygen inside, and quickly release organic components (carbon). According to the experiments of the inventors, when the temperature is raised in a short time, the oxygen concentration in the furnace decreases during the temperature rise process. On the other hand, even if the temperature after the temperature rise is maintained for a certain period of time, the oxygen concentration in the furnace hardly changes. In other words, it is speculated that debonding is promoted during the temperature rise process.

根據上述構造,具有:複數次設定使該爐腔內的爐內溫度上升的升溫階段和使該爐內溫度下降的降溫階段的階段溫度設定部;及根據該爐內溫度的上升及下降來調整該加熱燈的輸出的輸出調整部。並且,該階段溫度設定部是設定至少包括以交替方式重複該升溫階段和該降溫階段至少2次以上的處理步驟(脈衝處理)脫黏處理中的各個升溫速度及降溫速度,該輸出調整部是根據該升溫速度及該降溫速度調整該加熱燈的輸出以使該加熱燈照射該紅外線光。According to the above structure, there are: a stage temperature setting part that sets a plurality of temperature increase stages for increasing the temperature in the furnace chamber and a temperature drop stage for decreasing the temperature in the furnace chamber; and an output adjustment part that adjusts the output of the heating lamp according to the increase and decrease of the temperature in the furnace chamber. In addition, the stage temperature setting part sets the temperature increase speed and the temperature drop speed in the debonding treatment that at least includes a treatment step (pulse treatment) of repeating the temperature increase stage and the temperature drop stage at least twice in an alternating manner, and the output adjustment part adjusts the output of the heating lamp according to the temperature increase speed and the temperature drop speed so that the heating lamp irradiates the infrared light.

這樣一來,透過在急劇的溫度上升後降低溫度,再次使溫度急劇上升,反覆升溫和降溫至少2次以上,就能夠大幅縮短脫黏時間,便能夠在短時間內進行脫黏處理。In this way, by lowering the temperature after a rapid temperature rise, and then rapidly raising the temperature again, and repeating the temperature rise and fall at least twice, the debonding time can be greatly shortened, and the debonding process can be performed in a short time.

在上述構造中,還包括:與從該氣體分別地向該爐腔內供給蒸  氣的蒸氣供給部;及將該爐腔內的壓力控制為正壓或負壓的壓力控制裝置,該蒸氣供給部在該脫黏處理中向該爐腔內供給該蒸氣,該壓力控制裝置在該升溫階段中將該爐腔內的壓力控制為正壓並且在該降溫階段中將該爐腔內的壓力控制為負壓即可。例如,在使蒸氣浸透至對象物內部需要時間的情況下,透過在促進脫黏的升溫步驟中控制為正壓來促進氧往對象物內部的浸透,同時透過在降溫步驟中控制為負壓來促進排氣,能夠使脫黏處理更迅速化。In the above structure, it also includes: a steam supply part that supplies steam from the gas to the furnace cavity separately; and a pressure control device that controls the pressure in the furnace cavity to be positive pressure or negative pressure. The steam supply part supplies the steam to the furnace cavity during the debonding process, and the pressure control device controls the pressure in the furnace cavity to be positive pressure in the temperature rising stage and controls the pressure in the furnace cavity to be negative pressure in the temperature falling stage. For example, if it takes time for steam to penetrate into the object, the debonding process can be accelerated by controlling the temperature rise step to positive pressure to promote oxygen penetration into the object, and by controlling the temperature fall step to negative pressure to promote exhaust.

在上述構造中,還包括:與從該氣體分別地向該爐腔內供給蒸  氣的蒸氣供給部;及將該爐腔內的壓力控制為正壓或負壓的壓力控制裝置,該蒸氣供給部在該脫黏處理中向該爐腔內供給該蒸氣,該壓力控制裝置可以在該脫黏處理中將該爐腔內的壓力控制為正壓。若將爐腔內設為正壓,則由於在導入蒸氣時成為往爐腔內部施加了壓力的狀態,因此能夠將蒸氣均勻地填充到爐腔內,並能夠均勻地傳遞到對象物,能夠進一步促進脫黏處理。在上述任一構造中,該升溫速度及該降溫速度例如可以為5℃/sec~25℃/sec。In the above structure, it also includes: a steam supply part that supplies steam to the furnace cavity separately from the gas; and a pressure control device that controls the pressure in the furnace cavity to be positive pressure or negative pressure. The steam supply part supplies the steam to the furnace cavity during the debonding process, and the pressure control device can control the pressure in the furnace cavity to be positive pressure during the debonding process. If the furnace cavity is set to a positive pressure, since pressure is applied to the inside of the furnace cavity when the steam is introduced, the steam can be evenly filled into the furnace cavity and can be evenly transferred to the object, which can further promote the debonding process. In any of the above structures, the temperature increase rate and the temperature decrease rate may be, for example, 5° C./sec to 25° C./sec.

另外,在上述任一構造中,還包括用於冷卻該爐腔的爐壁的冷卻裝置,該蒸氣供給部在該爐腔的爐壁上可以具有在將該蒸氣供給到該爐腔內之前進行加溫的加溫部。為了使加熱爐整體冷卻,在爐壁上設置了冷卻器等之冷卻裝置來冷卻爐壁。透過在向爐腔內供給之前利用加溫部進行加溫,能夠防止在爐腔內發生結露,並抑制蒸氣的溫度降低,同時能夠防止在爐腔內發生結露。In any of the above structures, a cooling device for cooling the furnace wall of the furnace chamber is further included, and the steam supply part may have a heating part on the furnace wall of the furnace chamber for heating the steam before supplying the steam into the furnace chamber. In order to cool the heating furnace as a whole, a cooling device such as a cooler is provided on the furnace wall to cool the furnace wall. By heating the steam by the heating part before supplying the steam into the furnace chamber, condensation can be prevented from occurring in the furnace chamber, and a decrease in the temperature of the steam can be suppressed, and condensation can be prevented from occurring in the furnace chamber.

在上述構造中,可以在上述爐腔內設置測量上述爐腔內的氧濃度的氧測定器。另外,在上述構造中,例如,上述對象物是形成有Ni內部電極的MLCC,在上述脫黏處理後連續進行烘烤處理。In the above structure, an oxygen measuring device for measuring the oxygen concentration in the above furnace chamber may be provided in the above furnace chamber. In addition, in the above structure, for example, the above object is an MLCC having a Ni internal electrode formed thereon, and a baking process is continuously performed after the above debonding process.

另外,在上述構造中,還包括與該氣體分別地往該爐腔內供給蒸氣的蒸氣供給部、和將該爐腔內的壓力控制為正壓或負壓的壓力控制裝置,於該脫黏處理後在同一個爐腔內進行烘烤處理,該蒸氣供給部在該脫黏處理中向該爐腔內供給該蒸氣,該壓力控制裝置在該脫黏處理中將該爐腔內的壓力控制為正壓的同時在該烘烤處理中將該爐腔內的壓力控制為負壓即可。透過在脫黏處理中使爐腔內成為正壓,由於在導入蒸氣時成為往爐腔內部施加了壓力的狀態,因此能夠將蒸氣均勻地填充到爐腔內,能夠均勻地傳遞到對象物,便能夠促進脫黏處理。並且,透過在烘烤處理中使爐腔內成為負壓,便能夠將因烘烤而產生的氣體迅速地排出到爐腔外,因此能夠抑制對產品的不良影響,並且還能夠縮短烘烤時間。In addition, the above structure also includes a steam supply part that supplies steam to the furnace cavity separately from the gas, and a pressure control device that controls the pressure in the furnace cavity to be positive pressure or negative pressure. After the debonding treatment, a baking treatment is performed in the same furnace cavity. The steam supply part supplies the steam to the furnace cavity during the debonding treatment, and the pressure control device controls the pressure in the furnace cavity to be positive pressure during the debonding treatment and to be negative pressure during the baking treatment. By making the furnace cavity positive pressure during the debonding process, the furnace cavity is pressurized when the steam is introduced, so the steam can be evenly filled into the furnace cavity and evenly transferred to the object, which can promote the debonding process. In addition, by making the furnace cavity negative pressure during the baking process, the gas generated by baking can be quickly discharged to the outside of the furnace cavity, so the adverse effects on the product can be suppressed and the baking time can be shortened.

另外,為了達到上述目的,使用了脫黏裝置的脫黏方法,其特徵在使用了脫黏裝置的脫黏方法中,該脫黏裝置包括有:載置包含有粘合劑成分的對象物的載置部;為了加熱該對象物而照射紅外線光的加熱燈;配置有該載置部及該加熱燈且構成為可密閉的爐腔;向該爐腔內供給氣體的氣體供給部;及從該爐腔內排出氣體的氣體排氣部,並具有:複數次設定使該爐腔內的爐內溫度上升的升溫階段和使該爐內溫度下降的降溫階段的階段溫度設定部;及根據該爐內溫度的上升及下降來調整該加熱燈的輸出的輸出調整部,設定至少包括以交替方式重複該升溫階段和該降溫階段至少2次以上的熱處理步驟的脫黏處理中的各個升溫速度及降溫速度,並根據該升溫速度及該降溫速度調整該加熱燈的輸出以使該加熱燈照射該紅外線光。In addition, in order to achieve the above-mentioned purpose, a debonding method using a debonding device is provided, wherein the debonding device includes: a placing portion for placing an object containing an adhesive component; a heating lamp for irradiating infrared light for heating the object; a furnace cavity configured with the placing portion and the heating lamp and configured to be sealable; a gas supply portion for supplying gas into the furnace cavity; and a gas exhaust portion for exhausting gas from the furnace cavity, and having: a plurality of settings for making the furnace cavity A stage temperature setting unit includes a heating stage for raising the temperature in the furnace in the cavity and a cooling stage for lowering the temperature in the furnace; and an output adjusting unit for adjusting the output of the heating lamp according to the rising and falling temperature in the furnace, wherein each heating rate and cooling rate in the debonding treatment of the heat treatment step including at least repeating the heating stage and the cooling stage at least twice in an alternating manner are set, and the output of the heating lamp is adjusted according to the heating rate and the cooling rate so that the heating lamp irradiates the infrared light.

在上述構造中,該脫黏裝置還包括與該氣體分別地往該爐腔內供給蒸氣的蒸氣供給部、和將該爐腔內的壓力控制為正壓或負壓的壓力控制裝置, 該蒸氣供給部在該脫黏處理中向該爐腔內供給該蒸氣,該壓力控制裝置在該脫黏處理中將該爐腔內的壓力控制為正壓即可。In the above structure, the debonding device also includes a steam supply part that supplies steam into the furnace cavity separately from the gas, and a pressure control device that controls the pressure in the furnace cavity to positive pressure or negative pressure. The steam supply part supplies the steam into the furnace cavity during the debonding process, and the pressure control device controls the pressure in the furnace cavity to positive pressure during the debonding process.

另外,在上述構造中,該脫黏裝置還包括與該氣體分別地往該爐腔內供給蒸氣的蒸氣供給部、和將該爐腔內的壓力控制為正壓或負壓的壓力控制裝置, 該蒸氣供給部在該脫黏處理中向該爐腔內供給該蒸氣,該壓力控制裝置可以在該升溫階段中將該爐腔內的壓力控制為正壓並且在該降溫階段中將該爐腔內的壓力控制為負壓。In addition, in the above-mentioned structure, the debonding device also includes a steam supply part that supplies steam into the furnace cavity separately from the gas, and a pressure control device that controls the pressure in the furnace cavity to be a positive pressure or a negative pressure. The steam supply part supplies the steam into the furnace cavity during the debonding process, and the pressure control device can control the pressure in the furnace cavity to be a positive pressure in the temperature rising stage and to be a negative pressure in the temperature falling stage.

除了上述各實施例以外,還可以包括更全面地列舉如下的構造。本發明的另一個目的是提供一種能夠在同一個爐中連續進行脫黏處理和烘烤處理的MLCC製造裝置及使用有紅外線加熱裝置的MLCC製造方法。In addition to the above-mentioned embodiments, the following structures can also be included in a more comprehensive list. Another object of the present invention is to provide an MLCC manufacturing device capable of continuously performing a debonding process and a baking process in the same furnace and an MLCC manufacturing method using an infrared heating device.

為了達到上述目的,MLCC製造裝置,其特徵為包括有:載置有MLCC的載置部;為了加熱該MLCC而照射紅外線光的加熱燈;配置有該載置部及該加熱燈且構成為可密閉的爐腔;向該爐腔內供給氣體的氣體供給部;及從該爐腔內排出氣體的氣體排氣部,並還包括有根據設定該MLCC的至少脫黏條件及烘烤條件的曲線設定部和該爐腔內的爐內溫度的上升及下降來調整該加熱燈的輸出的輸出調整部,其中,該曲線設定部至少包括複數次設定使該爐腔內的爐內溫度上升的升溫階段和使該爐內溫度下降的降溫階段的階段溫度設定部,透過基於該輸出調整部的輸出調整照射該紅外線光,從該MLCC去除粘合劑成分的同時排出含有被去除的粘合劑成分的氣體而進行脫黏處理,之後,進行將被去除了該粘合劑成分的該MLCC在同一個爐腔內進行烘烤的烘烤處理。In order to achieve the above-mentioned purpose, an MLCC manufacturing device is characterized by comprising: a placing portion on which an MLCC is placed; a heating lamp for irradiating infrared light for heating the MLCC; a furnace cavity configured with the placing portion and the heating lamp and configured to be sealable; a gas supply portion for supplying gas into the furnace cavity; and a gas exhaust portion for exhausting gas from the furnace cavity, and further comprising a curve setting portion for setting at least debonding conditions and baking conditions of the MLCC and adjusting the heating lamp according to the rise and fall of the furnace temperature in the furnace cavity. An output adjusting unit for outputting the output, wherein the curve setting unit at least includes a stage temperature setting unit for setting a plurality of temperature rising stages for raising the furnace temperature in the furnace cavity and a temperature falling stage for lowering the furnace temperature in the furnace cavity, and the infrared light is irradiated based on the output adjustment of the output adjusting unit to remove the adhesive component from the MLCC while discharging the gas containing the removed adhesive component to perform a debonding treatment, and then the MLCC from which the adhesive component is removed is baked in the same furnace cavity.

於此,根據本發明的MLCC製造裝置,包括有:載置有MLCC的載置部;為了加熱該MLCC而照射紅外線光的加熱燈;配置有該載置部及該加熱燈且構成為可密閉的爐腔;向該爐腔內供給氣體的氣體供給部;及從該爐腔內排出氣體的氣體排氣部。因此,MLCC在配置有加熱燈且構成可密閉的爐腔內,透過來自加熱燈的紅外線光進行加熱,因此能夠急劇地加熱(升溫)對象物。Here, the MLCC manufacturing device according to the present invention includes: a placement portion on which MLCC is placed; a heating lamp for irradiating infrared light to heat the MLCC; a furnace cavity configured with the placement portion and the heating lamp and configured to be sealed; a gas supply portion for supplying gas into the furnace cavity; and a gas exhaust portion for exhausting gas from the furnace cavity. Therefore, the MLCC is heated by infrared light from the heating lamp in the furnace cavity configured with the heating lamp and configured to be sealed, so that the object can be heated (temperature increased) rapidly.

根據上述構造,還包括有根據設定該MLCC的至少脫黏條件及烘烤條件的曲線設定部和該爐腔內的爐內溫度的上升及下降來調整該加熱燈的輸出的輸出調整部,其中,該曲線設定部至少包括複數次設定使該爐腔內的爐內溫度上升的升溫階段和使該爐內溫度下降的降溫階段的階段溫度設定部。因此,根據該階段溫度設定部的設定,並透過根據該輸出調整部的輸出來調整照射該紅外線光,從該MLCC去除粘合劑成分的同時,將含有被去除的粘合劑成分的氣體排出並進行脫黏處理然後,可以進行將去除了該粘合劑成分的該MLCC在同一個爐腔內進行烘烤的烘烤處理。According to the above structure, it also includes an output adjustment unit that adjusts the output of the heating lamp according to a curve setting unit that sets at least the debonding conditions and baking conditions of the MLCC and the rise and fall of the furnace temperature in the furnace cavity, wherein the curve setting unit includes at least a stage temperature setting unit that sets a plurality of temperature rising stages for raising the furnace temperature in the furnace cavity and a temperature falling stage for lowering the furnace temperature. Therefore, according to the setting of the stage temperature setting unit, and by adjusting the irradiation of the infrared light according to the output of the output adjustment unit, the adhesive component is removed from the MLCC, and the gas containing the removed adhesive component is discharged and debonding treatment is performed. Then, the MLCC from which the adhesive component is removed can be baked in the same furnace cavity.

在上述構造中,還包括與該氣體分別地往該爐腔內供給蒸氣的蒸氣供給部、和將該爐腔內的壓力控制為正壓或負壓的壓力控制裝置,該該曲線設定部還包括有:設定該蒸氣的供給的蒸氣供給設定部;和調整向該爐腔內的氣體供給量及來自該爐腔內的氣體排氣量的氣體量調整部,該蒸氣供給設定部在該脫黏處理中將該蒸氣的供給設定為ON,並且在該烘烤處理中將該蒸氣的供給設定為OFF,該氣體量調整部可以在該脫黏處理中使該氣體供給量比該氣體排氣量多而將該爐腔內的壓力控制為正壓,並且在該烘烤處理中使該氣體供給量比該氣體排氣量少而將該爐腔內的壓力控制為負壓。透過在脫黏處理中使爐腔內成為正壓,由於在導入蒸氣時成為往爐腔內部施加了壓力的狀態,因此能夠將蒸氣均勻地填充到爐腔內,並能夠均勻地傳遞到對象物,進而能夠促進脫黏處理。並且,透過在烘烤處理中使爐腔內成為負壓,便能夠將因烘烤而產生的氣體迅速地排出到爐腔外,因此能夠抑制對產品的不良影響。In the above structure, it also includes a steam supply unit for supplying steam to the furnace cavity separately from the gas, and a pressure control device for controlling the pressure in the furnace cavity to be positive pressure or negative pressure. The curve setting unit also includes: a steam supply setting unit for setting the supply of the steam; and a gas amount adjustment unit for adjusting the gas supply amount to the furnace cavity and the gas exhaust amount from the furnace cavity. The steam supply setting unit The gas quantity adjustment unit sets the steam supply to ON during the debonding process and sets the steam supply to OFF during the baking process. The gas quantity adjustment unit can control the pressure in the furnace cavity to be positive pressure by making the gas supply quantity greater than the gas exhaust quantity during the debonding process, and control the pressure in the furnace cavity to be negative pressure by making the gas supply quantity less than the gas exhaust quantity during the baking process. By making the furnace cavity to be positive pressure during the debonding process, since the pressure is applied to the inside of the furnace cavity when the steam is introduced, the steam can be evenly filled into the furnace cavity and evenly transferred to the object, thereby promoting the debonding process. Furthermore, by making the furnace cavity negative pressure during the baking process, the gas generated by baking can be quickly discharged to the outside of the furnace cavity, thereby suppressing the adverse effects on the product.

在這樣的構造中,該階段溫度設定部是在該脫黏處理中,設定以交替方式重複該升溫階段和該降溫階段至少2次以上的處理步驟(脈衝處理)同時設定各個升溫速度及降溫速度,該輸出調整部可以根據該升溫速度及該降溫速度調整該加熱燈的輸出以使該加熱燈照射該紅外線光。透過在急劇的溫度上升後降低溫度,再次使溫度急劇上升,反覆升溫和降溫至少2次以上,便能夠大幅縮短脫黏時間,進而能夠在短時間內進行脫黏處理。In such a structure, the stage temperature setting unit sets the processing step (pulse processing) of repeating the heating stage and the cooling stage at least twice in an alternating manner in the debonding process, and sets each heating speed and cooling speed at the same time, and the output adjustment unit can adjust the output of the heating lamp according to the heating speed and the cooling speed so that the heating lamp irradiates the infrared light. By lowering the temperature after a rapid temperature rise, and raising the temperature again, and repeating the heating and cooling at least twice, the debonding time can be greatly shortened, and the debonding process can be performed in a short time.

另外,在上述任一構造中,還包括冷卻該爐腔的爐外壁的冷卻裝置,該蒸氣供給部在該爐腔的爐壁上可以具有在將該蒸氣供給到該爐腔內之前進行加溫的加溫部。為了使爐整體冷卻,在爐壁上設置了冷卻器等冷卻裝置來冷卻爐壁。透過在向爐腔內供給之前由加溫部進行加溫,能夠防止在爐腔內發生結露,並抑制爐腔內的溫度降低,同時能夠防止在爐腔內發生結露。In any of the above structures, a cooling device for cooling the outer wall of the furnace cavity is further included, and the steam supply part may have a heating part on the furnace wall of the furnace cavity for heating the steam before supplying the steam into the furnace cavity. In order to cool the entire furnace, a cooling device such as a cooler is provided on the furnace wall to cool the furnace wall. By heating the steam by the heating part before supplying the steam into the furnace cavity, condensation can be prevented from occurring in the furnace cavity, and a temperature drop in the furnace cavity can be suppressed, and condensation can be prevented from occurring in the furnace cavity.

為了達到上述目的,MLCC的製造方法,其特徵是一種使用了紅外線加熱裝置的MLCC的製造方法為包括有:載置有MLCC的載置部;為了加熱該MLCC而照射紅外線光的加熱燈;配置有該載置部及該加熱燈且構成為可密閉的爐腔;向該爐腔內供給氣體的氣體供給部;及從該爐腔內排出氣體的氣體排氣部,該紅外線加熱裝置還包括設定該MLCC的至少脫黏條件及烘烤條件的曲線設定部,該曲線設定部至少包括:複數次設定使該爐腔內的爐內溫度上升的升溫階段和使該爐內溫度下降的降溫階段的階段設定部;以及根據該爐內溫度的上升及下降調整該加熱燈的輸出的輸出調整部,透過基於該輸出調整部的輸出來調整照射該紅外線光,從該MLCC去除粘合劑成分的同時排出含有被去除的粘合劑成分的氣體而進行脫黏處理,之後,進行將被去除了該粘合劑成分的該MLCC在同一個爐腔內進行烘烤的烘烤處理。In order to achieve the above-mentioned purpose, a method for manufacturing MLCC is characterized in that a method for manufacturing MLCC using an infrared heating device includes: a mounting portion on which the MLCC is mounted; a heating lamp for irradiating infrared light to heat the MLCC; a furnace cavity configured with the mounting portion and the heating lamp and configured to be sealable; a gas supply portion for supplying gas into the furnace cavity; and a gas exhaust portion for exhausting gas from the furnace cavity, wherein the infrared heating device further includes a curve setting portion for setting at least a debonding condition and a baking condition of the MLCC, and the curve setting portion The invention at least comprises: a stage setting unit for setting a plurality of temperature rising stages for raising the temperature in the furnace cavity and a temperature falling stage for lowering the temperature in the furnace cavity; and an output adjusting unit for adjusting the output of the heating lamp according to the rise and fall of the temperature in the furnace, and adjusting the irradiation of the infrared light based on the output of the output adjusting unit to remove the adhesive component from the MLCC while discharging the gas containing the removed adhesive component to perform a debonding treatment, and then performing a baking treatment in which the MLCC from which the adhesive component has been removed is baked in the same furnace cavity.

本發明的紅外線加熱裝置可以用於MLCC及其他電子零件、電子零件以外需要控制溫度及氣體環境的零件的加熱處理。The infrared heating device of the present invention can be used for heating treatment of MLCC and other electronic components, and components other than electronic components that require temperature and gas environment control.

1:紅外線加熱裝置(脫黏裝置、MLCC製造裝置) 2a1,2a2:供給路徑 2b1,2b2:電磁閥 2c1,2c2:氣瓶 3a:排氣道 3b:噴射器(壓力控制裝置) 4a:電流供應路徑 6:蒸氣供給系統 7:攝像頭 8:控制裝置 20:加熱爐 21:爐腔 22:內部空間 23:爐壁 23a:天花板部(頂部) 24:前面開口部 25:背面開口部 26:前蓋 27:背蓋 28:觀察視窗 28a:通孔 29:通孔 30:噴嘴(氣體供給口、氣體供給部) 30a:噴嘴本體 30b:噴嘴孔 31:加熱燈 31a:密封件 31b:固定端蓋 32:溫度測量部 32a:接觸構件 32b:支撐臂 32c:熱電偶結合部 32d:連接器 33:支撐臂 34:托盤(載置部、基座(susceptor)、設置器 (setter))35:氣體排氣口(氣體排氣部) 36:冷卻管路(冷卻裝置) 39:氧氣濃度測量器(感測器) 50:冷卻噴嘴 50a:噴嘴孔 60:蒸氣供給部 61:加溫部 61a:盒子 61b:蒸氣供給噴嘴 61b1:噴嘴體 61b2:噴嘴孔 61c:加熱器 61d:溫度感測器 62:貯存罐 62a:槽罐體 62b:加熱器 62c:供給管 62d:排出管 63:混合氣罐(混合氣供給部) 63a:流量控制部(MFC) 64:加溫管路 64a:溫度感測器 80:曲線設定部 81:階段溫度設定部 82:溫度設定部 82a:供給開始溫度設定 82b:加溫溫度設定部 83:氣體量設定部 83a:供給量設定部 83b:排氣量設定部 84:蒸氣供給設定部 87:監控部 88:控制部 88a:輸出調整部 89:記錄部 L1:長邊方向 L2:前後方向 C:對象物(MLCC) H:溫水 We:蒸氣 1: Infrared heating device (debonding device, MLCC manufacturing device) 2a1, 2a2: Supply path 2b1, 2b2: Solenoid valve 2c1, 2c2: Gas cylinder 3a: Exhaust duct 3b: Injector (pressure control device) 4a: Current supply path 6: Steam supply system 7: Camera 8: Control device 20: Heating furnace 21: Furnace cavity 22: Internal space 23: Furnace wall 23a: Ceiling (top) 24: Front opening 25: Back opening 26: Front cover 27: Back cover 28: Observation window 28a: Through hole 29: Through hole 30: Nozzle (gas supply port, gas supply unit) 30a: Nozzle body 30b: Nozzle hole 31: Heating lamp 31a: Seal 31b: Fixed end cap 32: Temperature measuring part 32a: Contact member 32b: Support arm 32c: Thermocouple coupling part 32d: Connector 33: Support arm 34: Tray (mounting part, susceptor, setter) 35: Gas exhaust port (gas exhaust part) 36: Cooling pipeline (cooling device) 39: Oxygen concentration measuring device (sensor) 50: cooling nozzle 50a: nozzle hole 60: steam supply part 61: heating part 61a: box 61b: steam supply nozzle 61b1: nozzle body 61b2: nozzle hole 61c: heater 61d: temperature sensor 62: storage tank 62a: tank body 62b: heater 62c: supply pipe 62d: discharge pipe 63: mixed gas tank (mixed gas supply part) 63a: flow control part (MFC) 64: Heating pipeline 64a: Temperature sensor 80: Curve setting unit 81: Stage temperature setting unit 82: Temperature setting unit 82a: Supply start temperature setting 82b: Heating temperature setting unit 83: Gas volume setting unit 83a: Supply volume setting unit 83b: Exhaust volume setting unit 84: Steam supply setting unit 87: Monitoring unit 88: Control unit 88a: Output adjustment unit 89: Recording unit L1: Long side direction L2: Front and back direction C: Object (MLCC) H: Warm water We: Steam

[第一圖]繪製為根據本發明的紅外線加熱裝置的示意圖。 [第二圖]繪製為根據本發明的紅外線加熱裝置的蒸氣供給部的示意圖。 [第三圖]繪製控制裝置的方框圖。 [第四圖]繪製爐腔的部分剖視圖。 [第五圖]繪製爐腔的縱向剖面圖。 [第六圖]繪製爐腔的俯視圖。 [第七圖]繪製各噴嘴的圖,其中(a)是噴嘴的透視圖,(b)是噴嘴的橫向剖面圖。 [第八圖]繪製各噴嘴與吸入口的關係的示意的縱向剖面圖。 [第九圖]繪製處理步驟的曲線一示例圖。 [第十圖]繪製第九圖所示的曲線中的爐內溫度的變化圖。 [Figure 1] is a schematic diagram of an infrared heating device according to the present invention. [Figure 2] is a schematic diagram of a steam supply unit of an infrared heating device according to the present invention. [Figure 3] is a block diagram of a control device. [Figure 4] is a partial cross-sectional view of a furnace cavity. [Figure 5] is a longitudinal cross-sectional view of a furnace cavity. [Figure 6] is a top view of a furnace cavity. [Figure 7] is a diagram of each nozzle, wherein (a) is a perspective view of the nozzle and (b) is a transverse cross-sectional view of the nozzle. [Figure 8] is a schematic longitudinal cross-sectional view of the relationship between each nozzle and the suction port. [Figure 9] is a curve-one example diagram of a processing step. [Figure 10] Plot the temperature variation in the furnace in the curve shown in Figure 9.

1:紅外線加熱裝置 1: Infrared heating device

7:攝像頭 7: Camera

8:控制裝置 8: Control device

2a1,2a2:供給路徑 2a1,2a2: Supply path

2b1,2b2:電磁閥 2b1,2b2: Solenoid valve

2c1,2c2:氣瓶 2c1,2c2: Gas cylinders

3:排氣系統 3: Exhaust system

3a:排氣道 3a: Exhaust duct

3b:噴射器(壓力控制裝置) 3b: Injector (pressure control device)

4a:電流供應路徑 4a: Current supply path

6:蒸氣供給系統 6: Steam supply system

20:加熱爐 20: Heating furnace

21:爐腔 21: Furnace cavity

23a:天花板部(頂部) 23a: Ceiling (top)

29:通孔 29:Through hole

30:噴嘴(氣體供給口、氣體供給部)供氣 30: Nozzle (gas supply port, gas supply unit) supplying gas

31:加熱燈 31: Heating lamp

32:溫度測量部 32: Temperature measurement department

34:托盤(載置部、基座(susceptor)、設置器(setter)) 34: Tray (loading part, susceptor, setter)

35:氣體排氣口(氣體排氣部) 35: Gas exhaust port (gas exhaust part)

39:氧氣濃度測量器(感測器) 39: Oxygen concentration meter (sensor)

50:冷卻噴嘴 50: Cool nozzle

60:蒸氣供給部 60: Steam supply unit

61:加溫部 61: Heating section

61b:蒸氣供給噴嘴 61b: Steam supply nozzle

C:對象物(MLCC) C: Object (MLCC)

Claims (13)

一種紅外線加熱裝置,包括有: 用於載置對象物的載置部; 為了加熱該對象物而照射紅外線光的加熱燈; 配置有該載置部及該加熱燈且構成為可密閉的爐腔; 向該爐腔內供給氣體的氣體供給部;及 從該爐腔內排出氣體的氣體排氣部, 其中,還包括:與從該氣體供給部所供給的該氣體分別地向該爐腔內供給蒸氣的蒸氣供給部;及將該爐腔內的壓力控制為正壓或負壓的壓力控制裝置。 An infrared heating device includes: a placing portion for placing an object; a heating lamp for irradiating infrared light to heat the object; a furnace cavity configured with the placing portion and the heating lamp and configured to be sealable; a gas supply portion for supplying gas into the furnace cavity; and a gas exhaust portion for exhausting gas from the furnace cavity, wherein the device further includes: a steam supply portion for supplying steam into the furnace cavity separately from the gas supplied from the gas supply portion; and a pressure control device for controlling the pressure in the furnace cavity to be positive pressure or negative pressure. 如請求項1所述之紅外線加熱裝置,其中,還包括用於冷卻該爐腔的爐壁的冷卻裝置,並且該蒸氣供給部具有在將該蒸氣供給到該爐腔內之前加溫的加溫部。The infrared heating device as described in claim 1, further comprising a cooling device for cooling the furnace wall of the furnace cavity, and the steam supply part has a heating part for heating the steam before supplying it into the furnace cavity. 如請求項2所述之紅外線加熱裝置,其中,該加溫部設置在該爐壁的天花板部,具有向該爐腔內突出的複數個噴嘴。An infrared heating device as described in claim 2, wherein the heating portion is arranged on the ceiling portion of the furnace wall and has a plurality of nozzles protruding into the furnace cavity. 如請求項3所述之紅外線加熱裝置,其中,複數個該噴嘴在其噴嘴本體的圓周上的四面設置有複數個通孔,且該噴嘴本體的前端部為封閉。As described in claim 3, the infrared heating device, wherein the plurality of nozzles are provided with a plurality of through holes on four sides of the circumference of the nozzle body, and the front end of the nozzle body is closed. 如請求項3所述之紅外線加熱裝置,其中,該蒸氣供給部是從該爐腔的頂部供給該蒸氣,該氣體排氣部從該爐腔的側面的至少一面排出該爐腔內的氣體。An infrared heating device as described in claim 3, wherein the steam supply part supplies the steam from the top of the furnace cavity, and the gas exhaust part exhausts the gas in the furnace cavity from at least one side of the side of the furnace cavity. 如請求項5所述之紅外線加熱裝置,其中,該載置部是具有與該加熱燈的長邊方向平行的長邊的長方形托盤,該氣體排氣部從與該托盤的短邊相對的該爐腔的兩側面排出該爐腔內的氣體。An infrared heating device as described in claim 5, wherein the mounting portion is a rectangular tray having long sides parallel to the long sides of the heating lamp, and the gas exhaust portion exhausts the gas in the furnace cavity from both side surfaces of the furnace cavity opposite to the short sides of the tray. 如請求項3所述之紅外線加熱裝置,其中,該蒸氣供給部是從該爐腔的頂部供應該蒸氣,而該氣體排放部是從該爐腔的頂部排放該爐腔中的氣體。An infrared heating device as described in claim 3, wherein the steam supply part supplies the steam from the top of the furnace cavity, and the gas exhaust part exhausts the gas in the furnace cavity from the top of the furnace cavity. 如請求項3所述之紅外線加熱裝置,其中,該壓力控制裝置在向該爐腔內供給該蒸氣的期間,將該爐腔內的壓力控制為正壓。An infrared heating device as described in claim 3, wherein the pressure control device controls the pressure in the furnace cavity to be positive pressure during the period when the steam is supplied to the furnace cavity. 如請求項3所述之紅外線加熱裝置,其中,具有:複數次設定使該爐腔內的爐內溫度上升的升溫階段和使該爐內溫度下降的降溫階段的階段溫度設定部;及根據該爐內溫度的上升及下降來調整該加熱燈的輸出的輸出調整部,該階段溫度設定部是設定以交替方式重複該升溫階段和該降溫階段至少2次以上的步驟中的各個升溫速度及降溫速度,該輸出調整部是根據該升溫速度及該降溫速度調整該加熱燈的輸出以使該加熱燈照射該紅外線光。An infrared heating device as described in claim 3, wherein the device comprises: a stage temperature setting unit for setting a plurality of heating stages for increasing the temperature inside the furnace cavity and a cooling stage for decreasing the temperature inside the furnace cavity; and an output adjusting unit for adjusting the output of the heating lamp according to the increase and decrease of the temperature inside the furnace, wherein the stage temperature setting unit sets each heating rate and cooling rate in the step of repeating the heating stage and the cooling stage at least twice in an alternating manner, and the output adjusting unit adjusts the output of the heating lamp according to the heating rate and the cooling rate so that the heating lamp irradiates the infrared light. 如請求項3所述之紅外線加熱裝置,其中,該蒸氣供給部還包括:貯存溫水的貯存罐;向該溫水內供給混合氣體的混合氣體供給部;以及將該貯存罐內產生的蒸氣加溫並供給至該加溫部的加溫管路。The infrared heating device as described in claim 3, wherein the steam supply unit further includes: a storage tank for storing warm water; a mixed gas supply unit for supplying a mixed gas into the warm water; and a heating pipeline for heating the steam generated in the storage tank and supplying it to the heating unit. 如請求項10所述之紅外線加熱裝置,其中,還包括:測量該爐腔內的爐內溫度的爐內溫度測量部;和設定將該蒸氣供給到該爐腔內時的供給開始溫度的供給開始溫度設定部,當該爐內溫度超過該供給開始溫度時,該蒸氣供給部將來自該加溫部的蒸氣供給到該爐腔內。The infrared heating device as described in claim 10, further comprising: a furnace temperature measuring unit for measuring the furnace temperature in the furnace cavity; and a supply start temperature setting unit for setting a supply start temperature for supplying the steam into the furnace cavity, wherein when the furnace temperature exceeds the supply start temperature, the steam supply unit supplies the steam from the heating unit into the furnace cavity. 如請求項11所述之紅外線加熱裝置,其中,還包括加熱溫度設定部,分別設定該貯存槽的溫度、該加溫管路的溫度及該加溫部的溫度。The infrared heating device as described in claim 11, further comprising a heating temperature setting unit for setting the temperature of the storage tank, the temperature of the heating pipeline and the temperature of the heating unit respectively. 如請求項1至12之任一項所述之紅外線加熱裝置,其中,該對象物為MLCC。An infrared heating device as described in any one of claims 1 to 12, wherein the object is an MLCC.
TW113139796A 2023-11-02 2024-10-18 Infrared heating device TW202519815A (en)

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