TW202409756A - Advanced analytics for bio-/chemical and semiconductor production sites - Google Patents
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Abstract
Description
本發明涉及AI增強生物/化學及半導體生產程序之技術領域。The present invention relates to the technical field of AI-enhanced biological/chemical and semiconductor production processes.
特此描述之發明揭示一種藉由應用進階分析資料驅動之AI模型來改良生物/化學及半導體(可能任何)生產程序之方法及系統。The invention described herein discloses a method and system for improving biological/chemical and semiconductor (possibly any) manufacturing processes by applying advanced analytical data-driven AI models.
根據工業4.0及數位化,化學、製藥及半導體工業存在創新工廠技術以提高生產力、效率且降低成本以及縮短上市時間。歸因於生產設備之標準化,模組化工廠經部署以解決此等給定工業問題。此等工廠正在工業中使用,但其未帶來所有工業4.0之益處。不幸的是,資料科學及自動化技術在不同方向上發展,且現此兩者之間存在一間隙。此不僅適用於模組化工廠,亦適用於任何工廠。可藉由為一特定程序組裝此等預工程模組化設備而非為選定多個程序對一整個工廠進行硬程式設計而快速生成模組化生產工廠。實驗室中之主題內容專家可構建其自身之模組化工廠而無需單獨程式設計生產設備及驅動其程序。此等程序主要用於在升級至先導或生產規模之前對一反應以及其原料輸入資料及其最終品質資料進行實驗。相同反應將頻繁地驅動。當然,在此等實驗期間,歸因於各種感測器量測及原料特性,各嘗試將不同於其他嘗試。一些此等嘗試可具有強烈變動。主題內容專家需要最佳化其最終品質輸出資料且減少其手中之感測器資料及原料輸入之品質波動。即使使用創新生產方法亦不直接提供最佳化程序之一選項。為最佳化程序,感測器資料、原料輸入資料及最終品質資料必須由主題內容專家手動蒐集且發送至一資料科學團隊以解譯此模型及可能改良建議。由於相關性不隱含因果關係,因此資料科學團隊必須具備深入化學及程序知識以得出科學合理結論。對於僅具有機器學習知識之程序,主題內容專家可比一不熟悉的同事更佳地合理化其結果。因此,允許主題內容專家擁有分析之所有權可節省一步驟且確保將程序知識併入分析技術中。In line with Industry 4.0 and digitalization, innovative factory technologies exist in the chemical, pharmaceutical and semiconductor industries to increase productivity, efficiency and reduce costs and time to market. Modular chemical plants are deployed to solve these given industrial problems due to the standardization of production equipment. Such plants are being used in industry, but they do not bring all the benefits of Industry 4.0. Unfortunately, data science and automation technology have developed in different directions and now there is a gap between the two. This applies not only to modular chemical plants, but to any plant. Modular production plants can be quickly generated by assembling these pre-engineered modular equipment for a specific process rather than hard programming an entire plant for selected multiple processes. A subject matter expert in a laboratory can build his own modular chemical plant without having to individually program production equipment and drive his processes. These processes are primarily used to experiment with a reaction along with its raw material input data and its final quality data before scaling up to pilot or production scale. The same reaction will be driven frequently. Of course, during these experiments, each attempt will be different from the other due to various sensor measurements and raw material characteristics. Some of these attempts can have drastic variations. The subject matter expert needs to optimize his final quality output data and reduce the quality fluctuations of the sensor data and raw material inputs he has on hand. Even using innovative production methods does not directly provide an option to optimize the process. To optimize the process, sensor data, raw material input data, and final quality data must be manually collected by the subject matter expert and sent to a data science team to interpret the model and possible improvement suggestions. Since correlation does not imply causation, the data science team must have in-depth chemistry and process knowledge to draw scientifically sound conclusions. For a process with only machine learning knowledge, the subject matter expert can rationalize the results better than an unfamiliar colleague. Therefore, allowing the subject matter expert to take ownership of the analysis saves a step and ensures that process knowledge is incorporated into the analysis technique.
亦不存在即時監測程序且將其等與由選定最佳批次建立之黃金軌跡比較或使用基本單變量或多變量統計程序監測以時間序列方式自最佳批次監測黃金單變量輪廓之可能性。There is also no possibility to monitor the process in real time and compare it to the gold trajectory established from the selected best batch or to monitor the univariate profile of gold from the best batch in a time series manner using basic univariate or multivariate statistical procedures.
考慮到上文給出之論證,在一程序期間出現故障或中斷之情況中,亦不存在即時監測程序或警告主題內容專家之技術功能。考慮到一程序期間之任何故障、中斷、失效等,可利用一模型,諸如資料驅動、實體或混合模型。Taking into account the arguments given above, there is also no technical capability to instantly monitor the process or alert subject matter experts in the event of a failure or interruption during a process. To account for any faults, interruptions, failures, etc. during a process, a model may be utilized, such as a data-driven, entity, or hybrid model.
此應用之範疇係用於具有一足夠數位化位準之基地,諸如模組化工廠。在缺乏數位化模組或工廠之情況中,此應用仍可藉由上傳資料或藉由映射另一儲存系統或使用至模組之任何既有通信介面而使用。The scope of this application is for bases with a sufficient level of digitization, such as modular chemical plants. In the absence of digitized modules or plants, this application can still be used by uploading data or by mapping another storage system or using any existing communication interface to the module.
如上文已提及,即使各相同程序出於自然過程而彼此有所不同。有時,具有多個步驟之一複雜程序內之一步驟可歸因於新原料批次、新原料源或更新模組/工廠而改變。在此情況中,必須驗證:程序在自先前驗證之程序改變後是否強烈變動。除此之外,找出類似程序之任何技術功能可有利於避免最終品質偏離。As mentioned above, even identical procedures differ from each other due to natural processes. Sometimes, a step within a complex program with multiple steps can change due to a new raw material batch, a new raw material source, or an updated module/factory. In this case, it must be verified whether the program has changed significantly since it was changed from a previously verified program. In addition, identifying any technical features of similar programs can help avoid deviations in final quality.
問題: 1-)主題內容專家無法獨立建立資料驅動模型或使用統計方法來最佳化實驗室、先導及生產規模中之程序。此等模型及方法之目標係多樣的,諸如瞭解一故障產品之根本原因、比較多個產品以選擇具有較小變動之產品及識別最類似於選定歷史程序之程序。 2-)主題內容專家必須手動蒐集其程序資料、將程序資料與其原料及品質資料組合,且將其等發送至其資料科學團隊進行分析。此顯著增加分析所需時間且延遲品質控制程序。 3-)即使最新生產技術亦未給予主題內容專家建立單變量及多變量輪廓或黃金軌跡及使用其等以時間序列方式在一進行中程序期間監測此等輪廓之可能性。 4-)在一程序期間,在中斷或故障之前或期間,不存在警告主題內容專家之可能性。此外,不存在藉由使用同時監測及控制各程序參數之一模型來自主驅動一程序之機制。 5-)在程序步驟改變之情況中(諸如新原料或新工廠/模組),最終產品品質可改變。不存在驗證此等改變之機制,無論其等是否在吾人之目標邊界內,且最終建立結果之一證書。 6-)不存在支援選擇最類似程序來比較選定批准歷史程序資料之機制。另一應用將識別程序中之漂移且幫助使用者進行預測性維護。 Problem: 1-) Subject matter experts cannot independently build data-driven models or use statistical methods to optimize processes at laboratory, pilot, and production scales. The goals of these models and methods are diverse, such as understanding the root cause of a failed product, comparing multiple products to select products with less variation, and identifying processes that are most similar to selected historical processes. 2-) Subject matter experts must manually collect their process data, combine the process data with their raw material and quality data, and send it to their data science team for analysis. This significantly increases the time required for analysis and delays the quality control process. 3-) Even the latest production technologies do not give the subject matter expert the possibility to create univariate and multivariate profiles or golden tracks and use them to monitor these profiles in a time series manner during an ongoing process. 4-) There is no possibility to warn the subject matter expert before or during interruptions or failures during a process. Furthermore, there is no mechanism to autonomously drive a process by using a model that simultaneously monitors and controls each process parameter. 5-) In case of changes in process steps (such as new raw materials or new plants/modules), the final product quality can change. There is no mechanism to verify such changes, whether they are within our target boundaries, and finally to create a certificate of the results. 6-) There is no mechanism to support the selection of the most similar process to compare selected approved historical process data. Another application will identify drift in processes and help users perform predictive maintenance.
因此,本專利申請案之任務係揭示一種提高數位化生物/化學及半導體生產程序之效率及生產力之方法。Therefore, the mission of this patent application is to disclose a method for improving the efficiency and productivity of digitalized bio/chemical and semiconductor production processes.
此任務已藉由一種在一生產基地上執行之改良生物/化學及半導體生產程序之方法解決,其包括以下步驟:由該至少一個電腦以程序變數之形式收集/上傳及準備關於該生產程序之資料;取決於該等程序變數,由該至少一個電腦最佳化及定標一適合機器學習模型;由該至少一個電腦經由該最佳化機器學習模型建立該生產基地之一程序操作之統計單變量及/或多變量輪廓;藉由將所建立之統計單變量及/或多變量輪廓應用於至少一個線上程序變數以偵測該生產程序之異常、中斷及/或故障而經由該至少一個電腦所提供之一數位儀表板監測該生產程序之至少一個線上程序變數;及藉由校正偵測到之異常、中斷及/或故障及/或若破壞(或已包括)所需品質標準則指示該使用者中斷該生產程序來調適該生產程序。僅使用一個線上程序變數藉此導致一單變量輪廓,而使用若干線上程序變數導致一各自多變量輪廓,藉此該多個線上程序參數被整合至一多變量分數中,其接著被監測且用於該等多變量輪廓。程序變數可為(例如)特定感測器輸入,例如來自監測該生產基地之該等機器之一重量或溫度感測器。如所描述之建立資料驅動模型及解譯圖之步驟可在數位及互動儀表板上自動化以蒐集及訓練一模型而不需要瞭解任何關於機器學習或進行任何體力勞動。以下資料驅動步驟係自動化:資料收集、資料映射、資料清理、資料轉換、資料定標、使用機器學習方法生成一模型、對所生成之模型進行超參數調諧,及運行函數以解譯該模型。鑑於此等自動化步驟,主題內容專家僅需要選擇其專案、批次及/或變數進行分析以建立模型資料。在該等使用者輸入之後,可選擇一演算法及定標器來分析資料。此演算法及定標器可預定義為僅進行整個分析程序。在「生成模型」按鈕之後,將擬合、最佳化及解譯一模型。此解譯結果將展示在該儀表板上。該儀表板進一步允許其使用者建立一程序步驟之統計單變量及多變量輪廓,諸如一黃金軌跡。一旦主題內容專家選擇對應函數及專案-批次-變數資訊,即自動計算該等單變量及多變量輪廓。接著,可使用此等所建立之單變量及/或多變量輪廓來監測一反應期間之線上程序資料且將其與該黃金軌跡比較或將當前程序步驟保持在統計臨限值之間。此單變量及多變量線上監測將藉由偵測異常、中斷、故障來改良程序品質且有助於識別程序中之漂移。此可用作主題內容專家之一預警系統。鑑於指示一產品之效能之一定量輸入及關於該產品之歷史資料,該儀表板允許該使用者預測當前正在生產或最近已生產之一批次之效能。最終,可向該使用者提供偵測到之異常、中斷及/或故障以藉由校正該等議題來改良該生產程序。再者,若偵測到之議題非常嚴重以至於需要立即停止該生產程序,則該軟體經由該儀表板告知該使用者使得該使用者可採取相應行動或至少允許自動停止該程序。接著,若必要,則此等議題可長期解決或可完全中止該生產程序。此外,可利用該等資料源來監測一控制圖表上之一程序之各步驟。由於映射/上傳之資料,若一程序之各步驟失控,則可藉由檢查離群值、偏差、趨勢及漂移來控制該等步驟。This task has been solved by a method for improving biological/chemical and semiconductor production processes performed at a production base, comprising the following steps: collecting/uploading and preparing data about the production process in the form of process variables by the at least one computer; optimizing and calibrating a suitable machine learning model by the at least one computer depending on the process variables; establishing by the at least one computer, via the optimized machine learning model, a statistical unit variable of a process operation of the production base and/or or multivariate profiles; monitoring at least one online process variable of the production process via a digital instrument panel provided by the at least one computer by applying the established statistical univariate and/or multivariate profiles to at least one online process variable to detect anomalies, interruptions and/or failures of the production process; and adjusting the production process by correcting the detected anomalies, interruptions and/or failures and/or instructing the user to interrupt the production process if the required quality standards are violated (or included). Using only one online process variable thereby results in a univariate profile, while using several online process variables results in a respective multivariate profile, whereby the multiple online process parameters are integrated into a multivariate score, which is then monitored and used for the multivariate profiles. Process variables may be, for example, specific sensor inputs, such as a weight or temperature sensor from one of the machines monitoring the production site. The steps of building a data-driven model and interpreting plots as described can be automated on a digital and interactive dashboard to collect and train a model without having to know anything about machine learning or perform any physical labor. The following data-driven steps are automated: data collection, data mapping, data cleaning, data transformation, data calibration, generating a model using machine learning methods, performing hyperparameter tuning on the generated model, and running functions to interpret the model. Given these automated steps, the subject matter expert need only select their projects, batches, and/or variables to analyze to build the model data. After the user inputs, an algorithm and calibrator can be selected to analyze the data. This algorithm and calibrator can be predefined to perform the entire analysis process only. After the "Generate Model" button, a model will be fit, optimized and interpreted. The results of this interpretation will be displayed on the dashboard. The dashboard further allows its users to create statistical univariate and multivariate profiles of a process step, such as a Golden Trail. Once the subject matter expert selects the corresponding function and the project-batch-variable information, these univariate and multivariate profiles are automatically calculated. These created univariate and/or multivariate profiles can then be used to monitor the online process data during a reaction period and compare it to the Golden Trail or keep the current process step between statistical thresholds. This single and multi-variable online monitoring will improve process quality by detecting anomalies, interruptions, failures and help identify drift in the process. This can be used as an early warning system for subject matter experts. Given a quantitative input indicating the performance of a product and historical data about the product, the dashboard allows the user to predict the performance of a batch currently being produced or recently produced. Ultimately, the user can be provided with detected anomalies, interruptions and/or failures to improve the production process by correcting such issues. Furthermore, if the detected issue is so serious that the production process needs to be stopped immediately, the software informs the user via the dashboard so that the user can take appropriate action or at least allow the process to be automatically stopped. These issues can then be resolved permanently or the production process can be stopped completely if necessary. In addition, these data sources can be used to monitor each step of a process on a control chart. Due to the mapped/uploaded data, if steps of a process are out of control, they can be controlled by checking for outliers, deviations, trends and drifts.
本發明之有利且因此較佳之進一步發展自相關聯之子技術方案及自描述及相關聯之圖式中顯現。Advantageous and therefore preferred further developments of the invention emerge from the associated sub-technical solutions and from the description and the associated drawings.
本發明方法之較佳進一步發展包含(例如但不限於): 1.經由一第一演算法藉由分析該等程序變數來建立該機器學習模型,其中經由該數位儀表板向一使用者展示該分析結果,接著,該使用者取決於該分析結果而選擇一適合模型類型,且接著該選定模型由該電腦藉由應用適合機器學習方法(諸如主最小平方迴歸、隨機森林迴歸、XGBoost或主成分分析(PCA))來建立及最佳化。 2.該使用者經由該數位儀表板為該生產程序選擇至少一個批次作為該等線上程序變數之源且亦選擇待監測之特定程序變數。 3.對於統計單變量輪廓,選擇至少兩個不同批次及至少一個程序變數來計算統計特徵,諸如平均值、±2σ,及±3σ(其可在+0.5σ與+7σ之間變動)。 4.經由該第一演算法藉由分析該等程序變數來使用一既有適合機器學習模型,其中取決於該分析結果,匯入及最佳化一適合模型,其可完全自主驅動一給定最佳化黃金軌跡上之程序而無需任何進一步使用者輸入。 5.該第一演算法使用若干解譯函數(諸如排列特徵重要性、夏普力(Shapley)可加性法解釋(SHAP)或吉尼(Gini)重要性)來尋找及分析基本程序變數。 6.該機器學習模型額外包括導致一混合模型之一實體模型。 7.該機器學習模型使用特定第二演算法,諸如主成分分析(PCA)、偏最小平方(PLS)、隨機森林、極限梯度提升(XGBoost)、支援向量機、高斯(Gaussian)程序、多層感知器,其等可為線性、非線性或一神經網路機器學習方法,且使用各第二演算法來完成一迴歸分析且將該迴歸分析之該等結果連同模型效能度量以及互動圖表一起供應。 8.將所建立之統計單變量及/或多變量輪廓應用於該等線上程序變數係藉由將其等及由該等統計單變量及/或多變量輪廓表示之一黃金軌跡比較或藉由將所監測之當前反應保持在給定統計臨限值之間來完成。 9.若該至少一個監測到之線上程序變數達到諸如±2σ或±3σ之臨限值,則該電腦經由該數位儀表板發出一警告信號及/或該電腦藉由將新設定點應用於所建立之統計單變量及/或多變量輪廓而從不使該等基地組件之監測到之線上程序參數在一程序期間超過該等臨限值。 10.該機器學習模型表示該生產基地之一精確模型且用於經由即時模型預測控制(MPC)來驅動一生產程序,其中該MPC之該等參數映射至該等基地組件以監測該等線上程序變數,且其中校正該等偵測到之異常、中斷及/或故障以改良該生產程序藉由生成最佳化設定點且將其等應用於所建立之統計單變量及/或多變量輪廓來完成。 11.該儀表板經由該等線上程序變數來指示一產品之效能且經由該產品之歷史資料藉由分析一給定定量輸入來預測當前正在生產或最近已生產之一批次之效能。 12.該等線上程序變數由該各自基地程序控制系統之該電腦蒐集,在使用來自該基地之各查詢及/或可用生產程序元資料之後將該等變數發送至操作該機器學習模型之該各自電腦。 13.對於統計多變量輪廓,各批次之資料減少至至少一個潛在變數,接著監測該至少一個潛在變數。 14.為發現單變量、雙變量、多變量空間中之程序之間的相似性,可使用諸如歐氏空間之數學計算來對具有相同拓撲之所有程序針對一特定程序自最類似及最不類似程序進行排序。 Preferred further developments of the method of the invention include (for example but not limited to): 1. The machine learning model is established by analyzing the process variables via a first algorithm, wherein the analysis results are displayed to a user via the digital dashboard, then the user selects a suitable model type depending on the analysis results, and then the selected model is established and optimized by the computer by applying a suitable machine learning method (such as principal least squares regression, random forest regression, XGBoost or principal component analysis (PCA)). 2. The user selects at least one batch for the production process as the source of the online process variables and also selects specific process variables to be monitored via the digital dashboard. 3. For statistical univariate profiles, at least two different batches and at least one process variable are selected to calculate statistical features, such as mean, ±2σ, and ±3σ (which can vary between +0.5σ and +7σ). 4. An existing suitable machine learning model is used by the first algorithm by analyzing the process variables, wherein depending on the analysis results, a suitable model is imported and optimized, which can completely drive the process on a given optimization golden track without any further user input. 5. The first algorithm uses several interpretation functions (such as permutation feature importance, Shapley additivity explanation (SHAP) or Gini importance) to find and analyze basic process variables. 6. The machine learning model additionally includes a physical model leading to a mixed model. 7. The machine learning model uses a specific second algorithm, such as principal component analysis (PCA), partial least squares (PLS), random forest, extreme gradient boosting (XGBoost), support vector machine, Gaussian program, multi-layer perceptron, which can be linear, nonlinear or a neural network machine learning method, and uses each second algorithm to complete a regression analysis and provide the results of the regression analysis together with model performance metrics and interactive graphs. 8. Applying the established statistical univariate and/or multivariate profiles to the online process variables is accomplished by comparing them with a golden track represented by the statistical univariate and/or multivariate profiles or by keeping the monitored current response between given statistical thresholds. 9. If the at least one monitored online process variable reaches a critical value such as ±2σ or ±3σ, the computer issues a warning signal via the digital instrument panel and/or the computer never allows the monitored online process parameters of the base components to exceed the critical values during a process by applying new set points to the established statistical univariate and/or multivariate profiles. 10. The machine learning model represents an accurate model of the production base and is used to drive a production process via real-time model predictive control (MPC), wherein the parameters of the MPC are mapped to the base components to monitor the online process variables, and wherein correction of the detected anomalies, interruptions and/or failures to improve the production process is accomplished by generating optimized set points and applying them to the established statistical univariate and/or multivariate profiles. 11. The dashboard indicates the performance of a product via the online process variables and predicts the performance of a batch currently being produced or recently produced via historical data of the product by analyzing a given quantitative input. 12. The online process variables are collected by the computer of the respective base process control system and sent to the respective computer operating the machine learning model after using the queries and/or available production process metadata from the base. 13. For statistical multivariate profiling, the data of each batch is reduced to at least one potential variable, and then the at least one potential variable is monitored. 14. To find similarities between programs in univariate, bivariate, and multivariate spaces, mathematical calculations such as Euclidean space can be used to sort all programs with the same topology from most similar to least similar programs for a particular program.
所提供之任務之一進一步解決方案係一種操作一生產基地之系統,其包括所有既有硬體基地設備之以下組件:一基地程序控制程式、由一軟體執行之一機器學習模型、呈一GUI之形式之一數位儀表板、一資料庫、用於操作該軟體、該數位儀表板之一電腦,及用於操作該基地程序控制程式之一基地程序控制單元,其中所有系統組件經由一閉路網路結構連接且該系統經組態以執行先前所揭示之方法。接著,該系統可設定為將進行中程序保持在該等公差限制之間且將新設定點發送回至該基地。該系統進一步使該使用者上傳一模型檔案且將其連接至該程序或該(等)批次。此上傳模型可用於生成此等單變量及多變量輪廓或黃金軌跡以及用於來自該基於模型之分析之該等輸出之一程序之該等解譯圖。One further solution to the task provided is a system for operating a production base, which includes the following components of all existing hardware base equipment: a base process control program, a machine learning model executed by a software, a GUI A digital dashboard in the form of a database, a computer for operating the software, the digital dashboard, and a base process control unit for operating the base process control program, wherein all system components are connected via a closed circuit network The circuit structure is connected and the system is configured to perform the previously disclosed method. The system can then be set up to keep the ongoing process between these tolerance limits and send new set points back to the base. The system further enables the user to upload a model file and connect it to the program or batch(s). The uploaded model may be used to generate the univariate and multivariate contours or golden trajectories and the interpretation plots for use in a program of the outputs from the model-based analysis.
本發明系統之較佳進一步發展包含(例如但不限於): 各組件藉由使用一OPC-UA協定經由該閉路網路與該基地通信,其中各程序變數名稱藉由一首碼指示其各自組件,此使得該系統能夠將各程序變數指派至其特定組件且經由其在可用生產程序元資料中之位址對其進行監測。 該數位儀表板使得該使用者能夠經由一給定功能手動指派該等組件名稱。 Preferred further developments of the system of the present invention include (for example but not limited to): Each component communicates with the base through the closed network using an OPC-UA protocol, where each process variable name indicates its respective component by a first code, which enables the system to assign each process variable to its specific component and It is monitored by its address in the available production program metadata. The digital dashboard enables the user to manually assign component names via a given function.
進一步解決方案包括一電腦程式產品及一非暫時性電腦可讀媒體,其中該電腦程式產品儲存於其上,其包括指令,當在如先前所描述操作一生產基地之用於自助進階分析之一系統之一或多個處理器上執行時,該等指令引起該系統執行先前所描述之方法。Further solutions include a computer program product and a non-transitory computer readable medium, with the computer program product stored thereon, including instructions for self-service advanced analysis when operating a manufacturing site as previously described. When executed on one or more processors of a system, these instructions cause the system to perform the methods previously described.
本發明方法及系統可應用於任何適合生產基地。圖1以一示意性方式展示使用其經指派模組化生產工廠7作為一基地之此一系統1之此一較佳實施例之組件。在此較佳實施例中,蒐集及儲存藉由在模組化生產工廠7中執行生產程序而建立之生產相關資料2,諸如來自工廠機器之感測器資料、原料資料、程序資料及/或品質資料。生產工廠7較佳地由使用一或多個特定控制程式6來控制模組化生產工廠7之組件且執行(若干)生產程序之至少一個控制單元5控制。控制單元或電腦5較佳地直接位於模組化生產工廠7中,但一遠端控制單元5亦可行,只要確保控制單元5與工廠7之組件之間的一適合資料連接,諸如某種網路。為執行本發明方法,已建立呈一SW分析工具8形式之一軟體8,其使用呈資料驅動模型3之形式之不同AI演算法3來分析生產相關資料2,以作為所儲存之歷史資料或作為經由控制程式6即時蒐集之「即時資料」。將使用哪種AI演算法或模型類型3 (例如XGBoost、決策樹、隨機森林等)取決於具體用例且本發明方法通常不取決於一特定模型類型。方法本身及其各自方法步驟展示於圖3中,其中圖2給出關於先前所描述之目前最新技術行動方式之一示意性概述以更容易地與本發明方法比較。軟體8進一步在一適合分析電腦4上操作,其可相同於模組化生產工廠7之本地控制單元/電腦5,但較佳地使用一單獨電腦4。軟體8進一步在一螢幕上以一數位儀表板10之形式提供一圖形使用者介面(GUI),其使得一使用者9能夠操作軟體8且使用軟體8之特定分析功能。The method and system of the present invention can be applied to any suitable production base. Figure 1 shows in a schematic way the components of this preferred embodiment of such a system 1 using its assigned modular production plant 7 as a base. In this preferred embodiment, production-related data 2 created by executing production processes in the modular production factory 7 is collected and stored, such as sensor data, raw material data, process data and/or from factory machines. Quality information. The production plant 7 is preferably controlled by at least one control unit 5 using one or more specific control programs 6 to control the components of the modular production plant 7 and to execute the production program(s). The control unit or computer 5 is preferably located directly in the modular production plant 7, but a remote control unit 5 is also feasible, as long as a suitable data connection between the control unit 5 and the components of the plant 7 is ensured, such as some kind of network road. To perform the method of the present invention, a software 8 in the form of a SW analysis tool 8 has been created which uses different AI algorithms 3 in the form of a data-driven model 3 to analyze production-related data 2 as stored historical data or As "real-time data" collected in real time through control program 6. Which AI algorithm or model type 3 (e.g. XGBoost, decision tree, random forest, etc.) will be used depends on the specific use case and the method of the present invention generally does not depend on a specific model type. The method itself and its respective method steps are shown in Figure 3, wherein Figure 2 gives a schematic overview of the previously described state-of-the-art approach to facilitate comparison with the method of the invention. The software 8 further operates on a suitable analysis computer 4, which may be the same as the local control unit/computer 5 of the modular production plant 7, but preferably a separate computer 4 is used. The software 8 further provides a graphical user interface (GUI) in the form of a digital dashboard 10 on a screen, which enables a user 9 to operate the software 8 and use specific analysis functions of the software 8 .
由於此進階SW分析工具8現組合許多此等功能及特徵,因此可使用此工具8處置不同用例以導致許多不同較佳實施例,其中在以下章節中描述兩個最佳實施例。 用例1 –時間序列分析及工廠之即時監測/控制 Since this advanced SW analysis tool 8 now combines many of these functions and features, this tool 8 can be used to address different use cases leading to many different preferred embodiments, two of which are described in the following sections. Use case 1 – Time series analysis and real-time monitoring/control of factories
SW分析工具8經由GUI提供一儀表板10,其展示可由使用者選擇之可能分析功能/特徵。圖4展示GUI 10之主選單,其使使用者9能夠對工廠7進行一程序監測。對於第一描述之實施例,用例係藉由執行以下步驟來實現之一多變量監測: 1-)一使用者9 (例如工廠7之一操作者)希望驅動一程序且監測該程序。 2-)每個程序步驟(一工廠將具有若干此等步驟)若非具有幾百個變數,則具有幾十個變數。因此,操作者9自儀表板10中之相關專案之下拉式選單中選擇良好批次。 3-)儀表板10收集選定批次之資料。其定標資料、建立一適合資料驅動模型3且對其進行交叉驗證。此可針對若干適合模型類型進行。在超參數調諧之後,將選擇最佳模型3作為最終模型3。基於此資料驅動模型3,儀表板10生成一所謂之多變量黃金軌跡。 4-)在黃金軌跡旁,亦將存在統計變數,諸如此黃金軌跡之標準差。在此情況中,使用三個標準差作為一臨限值。 5-)一旦模型及黃金軌跡準備就緒,即可選擇任何程序資料進行比較以辨識任何離群值、偏差及漂移。自任何時間序列圖(諸如圖4及圖5)點擊一時間戳記,將生成一新圖。此新生成之圖(圖10)展示選定時間戳記處之各參數之三個不同長條圖:黃金程序之平均值、選定程序之值,及選定程序參數在選定時間相對於平均程序參數之百分比改變。 6-)在黃金軌跡準備就緒之後,使用者9起始程序且啟動監測。 7-)儀表板10基於選定專案使用OPC-UA或其他協定到達此專案之實驗室設備。 8-)儀表板10利用多執行緒且近似每5秒查詢來自各件設備之即時值。可設定此時間跨度且此必須由使用者9經由GUI預先完成。 9-)各收集之即時值將被捆綁起來且最終,來自選定良好批次之已生成模型3將用於轉換及生成即時多變量分數。 10-)接著,將其用作一預警系統或基於一多變量輪廓而辨識中斷。 11-)使用者9現可設定/建立一警告。若進行中程序之多變量輪廓達到計算臨限值,例如,通常2σ或3σ;則使用者9將獲得一警報或一通知且可停止生產程序。在另一較佳實施例中,此最後步驟亦可由工具8本身完成,藉此同時使程序/驅動程序完全自動化。圖5展示來自工具8之結果,分別經由GUI 10及儀表板10呈現。 12-)替代在步驟3-)中生成一模型3,在一進一步較佳實施例中,亦可將一外部模型3上傳至儀表板中以生成此等黃金軌跡或用於完全自主地驅動程序,諸如利用一回饋控制器。 用例2 –批次層級分析 The SW analysis tool 8 provides a dashboard 10 via a GUI that displays possible analysis functions/features that can be selected by the user. Figure 4 shows the main menu of the GUI 10, which enables the user 9 to perform a process monitoring of the factory 7. For the first described embodiment, the use case is a multi-variable monitoring implemented by performing the following steps: 1-) A user 9 (e.g. an operator of the factory 7) wants to drive a process and monitor the process. 2-) Each process step (a factory will have several such steps) has dozens if not hundreds of variables. Therefore, the operator 9 selects the good batch from the drop-down menu of the relevant project in the dashboard 10. 3-) The dashboard 10 collects data for the selected batch. The calibration data is used to build a suitable data-driven model 3 and cross-validate it. This can be done for several suitable model types. After hyperparameter tuning, the best model 3 is selected as the final model 3. Based on this data-driven model 3, the dashboard 10 generates a so-called multivariate golden track. 4-) Next to the golden track, there will also be statistical variables such as the standard deviation of the golden track. In this case, three standard deviations are used as a critical value. 5-) Once the model and golden track are ready, any process data can be selected for comparison to identify any outliers, deviations and drifts. Clicking a timestamp from any time series plot (such as Figures 4 and 5) will generate a new plot. This newly generated graph (Figure 10) shows three different bar graphs of each parameter at the selected timestamp: the average of the golden process, the value of the selected process, and the percentage change of the selected process parameter relative to the average process parameter at the selected time. 6-) After the golden track is ready, the user 9 starts the process and starts monitoring. 7-) The dashboard 10 uses OPC-UA or other protocols based on the selected project to reach the laboratory equipment of this project. 8-) The dashboard 10 uses multiple threads and queries the real-time value from each piece of equipment approximately every 5 seconds. This time span can be set and must be done in advance by the user 9 through the GUI. 9-) The collected real-time values will be bundled and finally, the generated model 3 from the selected good batch will be used to transform and generate real-time multivariate scores. 10-) Then, it is used as an early warning system or to identify interruptions based on a multivariate profile. 11-) The user 9 can now set/create an alarm. If the multivariate profile of the ongoing process reaches a calculated limit, for example, usually 2σ or 3σ; the user 9 will get an alarm or a notification and can stop the production process. In another preferred embodiment, this last step can also be done by the tool 8 itself, thereby making the process/driver fully automated at the same time. Figure 5 shows the results from the tool 8, presented via the GUI 10 and the dashboard 10 respectively. 12-) Instead of generating a model 3 in step 3-), in a further preferred embodiment, an external model 3 can also be uploaded to the dashboard to generate such golden tracks or used to drive the process completely autonomously, for example using a feedback controller. Use Case 2 – Batch Level Analysis
此較佳實施例涵蓋一不同用例。此處,將藉由執行以下步驟來分析一特定批次: 1-)使用者/操作者9希望進行一分析以最佳化未來程序或找出程序、最終/中間品質或原料中之任何歷史程序動態/問題。 2-)接著,使用者9選擇待分析之程序。若選定專案係或曾經係外部完成,則可在儀表板10中互動地上傳及編輯此生產資料2。 3-)分析方法(諸如統計方法、機器學習或深度學習)係預定義或可選擇。 4-)使用者9亦被給予選擇一定標器之一選項。此等定標方法係為各機器學習方法預定義。但其亦可為自願挑選。超參數最佳化方法及交叉驗證技術亦可為自願組態。 5-)最終,使用者9點擊「訓練」按鈕。儀表板10收集選定批次之資料。其定標資料、建立一資料驅動模型3,對其進行交叉驗證。圖6及圖7展示一XGBoost演算法之各自訓練及測試資料集之交叉驗證程序。再次,在超參數調諧之後,將選擇最佳模型3作為最終模型3。此最終模型3將使用一些函數來解譯,諸如「排列特徵重要性」、「SHAP」或「吉尼(Gini)重要性」、「哈特林(Hotelling)之T2分佈」或「至模型之距離」。圖8展示XGBoost演算法之排列重要性之結果。另一方面,圖9展示哈特林之T2分佈。此處,經由資料輸出中之95%信賴橢圓展示:一些程序在橢圓外部。此處,任何控制圖表可與模型一起使用且此等圖表可取決於程序。 6-)一旦模型3準備就緒;使用者9即可控制解譯圖。基於此等圖,可辨識及最佳化程序之最基本特性。一旦自此等圖中理解實體相關性,此導致一總改良程序輸出。 7-)對於一特定程序或所有程序,可繪製相似性。此可(例如)使用基於一多變量空間中之各程序之距離之方法來實現。此可藉由選擇最相似材料來減少最終品質變動。 用例3 –變動分析 This preferred embodiment covers a different use case. Here, a specific batch will be analyzed by performing the following steps: 1-) The user/operator 9 wishes to perform an analysis to optimize future processes or to identify any historical process dynamics/issues in the process, final/intermediate quality or raw materials. 2-) Next, the user 9 selects the program to be analyzed. If the selected project is or has been completed externally, this production data can be uploaded and edited interactively in the dashboard 10 2 . 3-) Analysis methods (such as statistical methods, machine learning or deep learning) are predefined or selectable. 4-) The user 9 is also given the option to select one of the calibrators. These calibration methods are predefined for each machine learning method. But it can also be a voluntary choice. Hyperparameter optimization methods and cross-validation techniques can also be configured voluntarily. 5-) Finally, the user 9 clicks the "training" button. Dashboard 10 collects the data of the selected batch. Calibrate the data, build a data-driven model 3, and perform cross-validation on it. Figures 6 and 7 show the cross-validation procedures of the respective training and test data sets of an XGBoost algorithm. Again, after hyperparameter tuning, the best model 3 will be selected as the final model 3. This final model 3 will be interpreted using some functions such as "permutation feature importance", "SHAP" or "Gini importance", "Hotelling's T2 distribution" or "to model's distance". Figure 8 shows the results of the permutation importance of the XGBoost algorithm. On the other hand, Figure 9 shows Hartling’s T2 distribution. Here, shown via the 95% confidence ellipse in the data output: some procedures are outside the ellipse. Here, any control chart can be used with the model and such charts can be program dependent. 6-) Once model 3 is ready; user 9 can control the interpretation diagram. Based on these diagrams, the most basic characteristics of the program can be identified and optimized. Once entity dependencies are understood from these graphs, this results in an overall improved program output. 7-) Similarities can be drawn for a specific program or for all programs. This can be achieved, for example, using methods based on distances between programs in a multivariate space. This reduces final quality variation by selecting the most similar materials. Use Case 3 – Change Analysis
本實施例涵蓋程序之一變動分析。此變動可具有多個目的。由於程序主要由多個階段組成,因此可以一更結構化方式進行此等單一分析而非進行多個單一分析。此變動分析可用於以一單變量或多變量方式偵測任何類型之參數及量測是否因任何原因在一程序期間失控或變動,其可或可不對總程序品質或最終產品具有不希望之影響。 1-)除非不存在至工廠/模組或任何儲存器之連接,否則使用者必須在應用中上傳資料集。若上傳包含所有步驟及程序種類之一資料集,其中使用「首碼」、「尾碼」或任何規則表達式/型樣,則將剖析一程序之步驟。若存在至工廠/模組或任何儲存器之一直接連接,則將收集一程序之步驟連同資料。 2-)使用者選擇程序/資料集/批次。 3-)應用辨識程序/資料集/批次中之型樣/步驟,且使用方便機器學習演算法(諸如主成分分析/偏最小平方迴歸分析)對程序中辨識之步驟進行多個批次層級別及時間序列分析。此等步驟/型樣可基於一程序界定。 4-)將使用選定σ邊界(但可界定諸如2及3σ)或信賴區間繪製結果。 5-)結果將在多變量及單變量空間中使用一系統規則進行調查,諸如內爾孫(Nelson)規則違例: a)離平均數3σ以外之一或多個點或一特定信賴區間 b)平均值之相同側上之一列中之九或更多點 c)一列中之六或更多點連續增加或減少 d)一列中之十四或更多點以交替方式增加且接著減少 e)一列中之三個點中之兩個點在2σ標準差以外 f)五個點中之四或更多點在與平均值相同之方向上離平均值一個以上σ標準差 g)一列中之十五個點在1σ標準差內 h)列中之八個點均不在1σ內且點在兩個方向上 此等調查之某些步驟可自動進行。 6-)若此等結果指示無違反界定/選定規則,則應用將建立證明選定批次之生產程序內之變動在一特定公差內之一證書。 This embodiment covers a variation analysis of a process. This variation can have multiple purposes. Since processes mainly consist of multiple stages, such single analyses can be performed in a more structured manner rather than performing multiple single analyses. This variation analysis can be used to detect in a single variable or multivariate manner whether any type of parameters and measurements are out of control or vary during a process for any reason, which may or may not have an undesirable impact on the overall process quality or the final product. 1-) Unless there is no connection to the factory/module or any storage, the user must upload a data set in the application. If a data set containing all steps and process types is uploaded, using "prefix", "last code" or any regular expression/pattern, the steps of a process will be analyzed. If there is a direct connection to the factory/module or any storage, the steps of a process will be collected along with the data. 2-) The user selects the process/dataset/batch. 3-) The application identifies patterns/steps in the process/dataset/batch and performs multiple batch-level and time-series analyses of the identified steps in the process using convenient machine learning algorithms (such as PCA/PLS). These steps/patterns can be defined based on a process. 4-) The results will be plotted using selected σ bounds (but can be defined as 2 and 3σ) or confidence intervals. 5-) The results will be investigated in multivariate and univariate space using a system of rules, such as violations of Nelson's rule: a) One or more points outside 3σ of the mean or a certain confidence interval b) Nine or more points in a row on the same side of the mean c) Six or more points in a row increase or decrease continuously d) Fourteen or more points in a row increase and then decrease in an alternating manner e) Two of three points in a row are outside 2σ standard deviations f) Four or more of five points are more than one σ standard deviation away from the mean in the same direction as the mean g) Fifteen points in a row are within 1σ standard deviation h) Eight points in a row are not within 1σ and the points are in both directions Some steps of these investigations can be automated. 6-) If these results indicate no violation of the defined/selected rules, the application will create a certificate that proves that the variation within the production process of the selected batch is within a specified tolerance.
1:用於自助進階分析之系統 2:生產相關資料 3:模型/AI演算法 4:分析電腦 5:工廠/基地控制單元/工廠/基地控制電腦 6:工廠/基地控制程式 7:模組化生產工廠/基地 8:SW分析工具/軟體 9:使用者/操作者 10:數位儀表板 1: System for self-service advanced analysis 2: Production-related data 3: Model/AI algorithm 4: Analysis computer 5: Factory/base control unit/factory/base control computer 6: Factory/base control program 7: Modular production factory/base 8: SW analysis tool/software 9: User/operator 10: Digital instrument panel
根據本發明之方法、系統及軟體產品及其功能上有利之發展將在下文使用至少一個較佳例示性實施例參考相關聯圖式更詳細描述。在圖式中,彼此對應之元件具有相同元件符號。The methods, systems and software products according to the present invention and their functionally advantageous developments will be described in more detail below using at least one preferred exemplary embodiment with reference to the associated drawings. In the drawings, corresponding elements have the same element symbol.
圖式展示: 圖1:使用本發明系統以增強基地生產效能之一生產基地 圖2:關於最新技術生產資料分析之一概述 圖3:關於本發明生產資料分析之一概述 圖4:用於控制分析軟體之GUI之主選單 圖5:經由GUI之一多變量分析之結果 圖6:一批次層級分析之交叉驗證結果之第一部分 圖7:一批次層級分析之交叉驗證結果之第二部分 圖8:使用一排列特徵重要性對最終模型之解譯 圖9:最終批次品質評估 圖10:來自最佳程序之平均之特徵與一選定程序之比較 Graphic display: Figure 1: A production base using the system of the present invention to enhance production efficiency of the base Figure 2: An overview of the latest technology production data analysis Figure 3: An overview of the production data analysis of the present invention Figure 4: Main menu of the GUI used to control the analysis software Figure 5: Results of a multivariate analysis via GUI Figure 6: The first part of the cross-validation results of a batch-level analysis Figure 7: The second part of the cross-validation results of a batch-level analysis Figure 8: Interpretation of the final model using a ranked feature importance Figure 9: Final batch quality assessment Figure 10: Comparison of averaged features from the best program with a selected program
1:用於自助進階分析之系統 1: A system for self-service advanced analysis
2:生產相關資料 2:Production related information
3:模型/AI演算法 3: Model/AI algorithm
4:分析電腦 4: Analyze the computer
5:工廠/基地控制單元/工廠/基地控制電腦 5: Factory/base control unit/factory/base control computer
6:工廠/基地控制程式 6: Factory/base control program
7:模組化生產工廠/基地 7: Modular production plant/base
8:SW分析工具/軟體 8: SW analysis tools/software
9:使用者/操作者 9:User/Operator
10:數位儀表板 10: Digital instrument panel
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP22170870.4 | 2022-04-29 | ||
| EP22170870 | 2022-04-29 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW202409756A true TW202409756A (en) | 2024-03-01 |
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| Application Number | Title | Priority Date | Filing Date |
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| TW112115920A TW202409756A (en) | 2022-04-29 | 2023-04-28 | Advanced analytics for bio-/chemical and semiconductor production sites |
Country Status (3)
| Country | Link |
|---|---|
| DE (1) | DE112023002048T5 (en) |
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| WO (1) | WO2023212132A1 (en) |
Families Citing this family (3)
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| CN117371821B (en) * | 2023-11-28 | 2024-09-17 | 广州市中大信息技术有限公司 | BIM technology-based enterprise data visual display method and system |
| WO2025228934A1 (en) | 2024-05-01 | 2025-11-06 | Merck Patent Gmbh | Automated material process control method with multivariate analysis for manufacturing industry |
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-
2023
- 2023-04-27 DE DE112023002048.5T patent/DE112023002048T5/en active Pending
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Also Published As
| Publication number | Publication date |
|---|---|
| DE112023002048T5 (en) | 2025-12-11 |
| WO2023212132A1 (en) | 2023-11-02 |
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