TW202300911A - Array ultrasonic video device and control method therefor - Google Patents
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Abstract
Description
本發明係關於一種陣列式超音波影像裝置及其控制方法。The invention relates to an array type ultrasonic imaging device and a control method thereof.
有對半導體等被檢體照射超音波,基於其之反射波產生被檢體內部之圖像資訊,而檢測被檢體內部之缺陷之超音波影像裝置。根據該超音波影像裝置,可進行非破壞之高分解能檢查,可確保電子零件之可靠性。There is an ultrasonic imaging device that irradiates an object such as a semiconductor with ultrasonic waves, generates image information inside the object based on the reflected waves, and detects defects inside the object. According to this ultrasonic imaging device, a non-destructive high-resolution inspection can be performed, and the reliability of electronic components can be ensured.
於超音波影像裝置之一形態,有具有由單一之振子構成之單探針之超音波影像裝置。於具有該單探針之超音波影像裝置中,使單探針於被檢體之表面或積層界面之特定區域之X方向/Y方向進行機械性掃描,而進行對被檢體照射超音波與反射波之檢測。As one form of the ultrasonic imaging device, there is an ultrasonic imaging device having a single probe composed of a single vibrator. In the ultrasonic imaging device with the single probe, the single probe is mechanically scanned in the X direction/Y direction of a specific area on the surface of the subject or the layered interface, and the subject is irradiated with ultrasonic waves and Detection of reflected waves.
為縮短該超音波影像裝置之作業時間,需加快單探針之掃描速度。但,於將被檢體與單探針浸水之超音波影像裝置,若加快單探針之掃描速度,則會產生出現夾帶氣泡或波紋等引起圖像劣化之現象之問題。In order to shorten the operation time of the ultrasonic imaging device, it is necessary to increase the scanning speed of the single probe. However, in an ultrasonic imaging device in which the subject and a single probe are immersed in water, if the scanning speed of the single probe is increased, there will be a problem of image degradation caused by air bubbles or ripples.
因此,例如,有一種超音波檢查裝置,其具備具有複數個壓電振動元件之陣列式超音波感測器,且藉由於陣列排列方向上進行電子掃描,進而於陣列排列之法線方向上進行機械掃描,而使用來自檢查對象內部之反射信號產生檢查圖像(參考專利文獻1)。 [先前技術文獻] [專利文獻] Therefore, for example, there is an ultrasonic inspection device that has an array ultrasonic sensor with a plurality of piezoelectric vibrating elements, and conducts electronic scanning in the direction of the array arrangement, and then conducts scanning in the normal direction of the array arrangement. Scanning is performed mechanically to generate an inspection image using reflected signals from inside the inspection object (refer to Patent Document 1). [Prior Art Literature] [Patent Document]
[專利文獻1]日本專利特開2007-263780號公報[Patent Document 1] Japanese Patent Laid-Open No. 2007-263780
[發明所欲解決之問題][Problem to be solved by the invention]
根據上述先前技術,由於可降低探針之掃描速度,故可降低出現夾帶氣泡或波紋等引起圖像劣化之現象之發生。但,於對陣列式超音波探針進行往復機械掃描而產生被檢體之大範圍之反射波圖像時,於機械掃描之端部,即,於切換機械掃描之去路與返路之位置等,有時會於超音波反射波之圖像產生偏差。於專利文獻1中,未記載對陣列式超音波探針進行往復機械掃描,且未考慮該問題。According to the above-mentioned prior art, since the scanning speed of the probe can be reduced, it is possible to reduce the occurrence of phenomena such as entrained air bubbles or moiré that cause image degradation. However, when the reciprocating mechanical scanning of the array ultrasonic probe is performed to generate a large-scale reflected wave image of the subject, at the end of the mechanical scanning, that is, at the position where the forward path and the return path of the mechanical scanning are switched, etc. , Sometimes there will be deviations in the image of the ultrasonic reflected wave. In
本發明之目的在於提供一種於使陣列式超音波探針進行往復掃描而產生被檢體之反射波圖像之陣列式超音波影像裝置中,圖像偏差較少之陣列式超音波影像裝置及其控制方法。 [解決問題之技術手段] The object of the present invention is to provide an array type ultrasonic imaging device which has less image deviation in the array type ultrasonic imaging device which makes the array type ultrasonic probe perform reciprocating scanning to generate the reflected wave image of the subject and its control method. [Technical means to solve the problem]
為解決上述問題,本發明之陣列式超音波影像裝置,係藉由一面進行以特定之掃描順序對被檢體照射超音波光束之電子掃描一面於垂直於上述振子之排設方向之方向上往復移動之掃描動作、及與上述振子之排設方向平行地移動超音波陣列探針之移位動作,使複數個振子直線排設之超音波陣列探針進行平面掃描,且對被檢體之表面或積層邊界面照射超音波光束,顯示來自被檢體之超音波反射波之信號強度者,且以於電子掃描之一端之照射點照射超音波光束,接著於對向之另一端之照射點照射超音波光束,成為自各個端部逐一向中央部交替依序照射超音波光束之掃描順序之方式選擇上述複數個振子照射超音波光束而進行上述電子掃描。In order to solve the above-mentioned problems, the array type ultrasonic imaging device of the present invention reciprocates in a direction perpendicular to the arrangement direction of the above-mentioned vibrators while performing electronic scanning of irradiating the subject with ultrasonic beams in a specific scanning order. The scanning action of movement and the displacement action of moving the ultrasonic array probe parallel to the arrangement direction of the above-mentioned vibrators make the ultrasonic array probe with a plurality of vibrators arranged in a straight line perform plane scanning, and scan the surface of the object Or irradiate the ultrasonic beam on the boundary surface of the laminate to display the signal strength of the ultrasonic reflected wave from the subject, and irradiate the ultrasonic beam at the irradiation point at one end of the electronic scan, and then irradiate at the irradiation point at the opposite end The ultrasonic beam is selected in such a way that the plurality of vibrators are irradiated with the ultrasonic beam in a scanning sequence in which the ultrasonic beam is alternately and sequentially irradiated from each end portion one by one to the central portion to perform the electronic scanning.
又,本發明之陣列式超音波影像裝置之控制方法為將複數個振子直線排設之超音波陣列探針之超音波光束依序照射至被檢體而進行電子掃描,顯示來自上述被檢體之超音波反射波之信號強度之陣列式超音波影像裝置的控制方法;且該控制方法包含:第1步驟,其一面以於電子掃描之一端之照射點照射超音波光束,接著於對向之另一端之照射點照射超音波光束,成為自各個端部逐一向中央部交替依序照射超音波光束之掃描順序之方式選擇上述複數個振子,而對上述被檢體依特定之掃描順序照射超音波光束,一面於垂直於上述超音波陣列探針之振子之排設方向之方向上以特定速度連續移動上述超音波陣列探針;移位步驟,其於上述電子掃描之掃描寬度量,進行與上述振子之排設方向並行地移動上述超音波陣列探針之移位動作;及第2步驟,其一面以於電子掃描之一端之照射點照射超音波光束,接著於對向之另一端之照射點照射超音波光束,成為自各個端部逐一向中央部交替依序照射超音波光束之掃描順序之方式選擇上述複數個振子,而對上述被檢體依特定之掃描順序照射超音波光束,一面與上述第1步驟逆向地以特定速度連續移動上述超音波陣列探針;且藉由重複上述第1步驟、上述移位步驟、及上述第2步驟,對被檢體整面進行電子掃描。 [發明之效果] In addition, the control method of the arrayed ultrasonic imaging device of the present invention is to sequentially irradiate the ultrasonic beams of the ultrasonic array probe with a plurality of vibrators arranged in a straight line to the subject for electronic scanning, and display images from the subject above. The method for controlling the signal intensity of the ultrasonic reflected wave of the array type ultrasonic imaging device; and the control method includes: the first step, one side irradiates the ultrasonic beam at the irradiation point at one end of the electronic scanning, and then irradiates the ultrasonic beam on the opposite side The irradiation point at the other end is irradiated with ultrasonic beams, and the plurality of vibrators are selected in such a way that the scanning order of ultrasonic beams is irradiated alternately from each end to the central part one by one, and the above-mentioned subject is irradiated with ultrasonic beams in a specific scanning order. The sonic beam continuously moves the above-mentioned ultrasonic array probe at a specific speed in a direction perpendicular to the arrangement direction of the vibrators of the above-mentioned ultrasonic array probe; the shifting step is carried out with the scanning width of the above-mentioned electronic scanning. The arrangement direction of the above-mentioned vibrator moves the displacement action of the above-mentioned ultrasonic array probe in parallel; and the second step, one side irradiates the ultrasonic beam at the irradiation point at one end of the electronic scanning, and then irradiates at the opposite end Spot irradiate the ultrasonic beam, and select the plurality of vibrators in such a way that the scanning order of the ultrasonic beam is alternately irradiated from each end to the central part one by one, and the above-mentioned object is irradiated with the ultrasonic beam in a specific scanning order. Continuously moving the ultrasonic array probe at a specific speed in reverse to the above-mentioned first step; and electronically scanning the entire surface of the subject by repeating the above-mentioned first step, the above-mentioned shifting step, and the above-mentioned second step. [Effect of Invention]
根據本發明,於使陣列式超音波探針進行平面掃描而產生被檢體之超音波反射圖像之陣列式超音波影像裝置中,可抑制於陣列式超音波探針之掃描之往復移動中產生之反射波圖像之圖像偏差。According to the present invention, in the array type ultrasonic imaging device that scans the array type ultrasonic probe in a plane to generate an ultrasonic reflection image of the subject, the scanning reciprocation of the array type ultrasonic probe can be suppressed Image deviation of the resulting reflected wave image.
以下,對本發明之實施形態,一面參考圖式一面詳細地進行說明。 圖1係顯示實施形態之陣列式超音波影像裝置之整體構成之圖。 Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. Fig. 1 is a diagram showing the overall configuration of an array type ultrasonic imaging device of an embodiment.
陣列式超音波影像裝置1具備3軸掃描器2(掃描機構)、與超音波陣列探針(以下記為探針4)。該3軸掃描器2使探針4對平面狀之被檢體8以X軸方向與Y軸方向之二維進行掃描(平面掃描)。藉此,陣列式超音波影像裝置1可藉由超音波將平面狀之被檢體8影像化。The array type
探針4為將多個振子短條狀排列之相控陣列超音波探針。詳細而言,藉由控制多個振子中之一部分之複數個振子(振子群)各者之振盪時序製作超音光波收斂光束(超音波光束),並對其進行電子切換,改變照射位置而照射超音波光束,對被檢體8進行一維掃描。於本說明書中,將相控陣列超音波探針之電子超音波光束之掃描記為電子掃描。
超音波光束之反射波之接收控制亦控制振子群而進行。
The
又,探針4可將由單一之振子產生之超音波以聲透鏡(acoustic lens)聚焦而照射至被檢體,並將複數個該振子構成短條狀。於該構成中,亦藉由對振子進行電子切換,而改變超音波光束之照射位置,進行被檢體8之電子掃描。In addition, the
探針4配置為浸漬於注滿水槽91之水中,探針4之前端與被檢體8對向。探針4藉由保持器24安裝於3軸掃描器2。
水槽91載置於台92上。
The
該3軸掃描器2於使探針4二維掃描時,基於藉由內置之檢測位置變化之編碼器檢測出之直線位置或旋轉位置(角度位置),檢測其之掃描位置。藉此,陣列式超音波影像裝置1可將被檢體8之各掃描位置(掃描點)與回波之關係二維影像化。The 3-
3軸掃描器2具備使探針4進行掃描之X軸掃描器21及Y軸掃描器22、可改變探針4與被檢體8之間隔之Z軸掃描器23、及固持探針4之保持器24。
又,探針4於檢查前藉由台92調整高度,且藉由Z軸掃描器23調整與被檢體8之間隔。
The 3-
探針4於與複數個振子直線排設之方向垂直之方向(以下,將該方向稱為X軸方向)上,藉由3軸掃描器2之X軸掃描器21以特定速度連續移動(掃描動作),其後,藉由3軸掃描器2之Y軸掃描器22,與複數個振子之排設方向並行地進行電子掃描之掃描寬度量之移動(移位動作)。The
該保持器24支持設置於探針4之上部之鍔部42,於對該探針4施加朝上之力時順利地朝上方向移動。於保持器24設置有感測器3,檢測探針4朝上方向移動之情況。This
控制裝置10具備掃描器控制部11、收發指令部12、時序處理部13、振子動作信號產生部14、反射波信號處理部15、反射波圖像產生部16及顯示部17,且進行3軸掃描器之控制、探針4之收發控制、及來自被檢體8之回波之顯示控制。The
掃描器控制部11為基於X軸掃描器21及Y軸掃描器22內置之編碼器輸出,驅動X軸掃描器21及Y軸掃描器22,而使探針4於被檢體8上進行平面掃描之控制部。The
收發指令部12與自掃描器控制部11通知之X軸掃描器21之編碼器輸出同步,開始探針4之電子掃描。即,收發指令部12係與探針4之掃描動作同步開始電子掃描。因此,藉由探針4之電子掃描所產生被檢體8之X軸方向之掃描間距,與X軸掃描器21之編碼器輸出之間距相等。The transmission and
時序處理部13選擇與電子掃描中之超音波光束之掃描順序對應之探針4之振子群。The
振子動作信號產生部14根據由時序處理部13選擇之振子群與掃描順序產生振子動作信號,並於每個掃描點,將其發送至探針7。
探針4根據振子動作信號產生部14之振子動作信號,照射超音波光束。
The vibrator action
反射波信號處理部15係於每個掃描點自探針4接收超音波光束之反射波之信號,設置閘極進行閘極處理,藉此求出反射波之位移(振幅),並根據該位移算出信號強度。The reflected wave
反射波圖像產生部16例如將由反射波信號處理部15算出之每個照射點之反射波之信號強度轉換為0~255之灰階度。於被檢體8與水槽91之水之邊界或被檢體8內部之材料邊界、剝離部、空隙部等聲阻抗(密度)變化之邊界面,產生超音波光束之反射波。反射波圖像產生部16將無超音波光束之反射波之點設為灰階度255,反射波之信號強度越大,灰階度越小。The reflected wave
顯示部17顯示由反射波圖像產生部16求出之超音波光束之反射波之信號強度,作為被檢體8之平面掃描之濃淡圖像。具體而言,於灰階度為255之情形時顯示黑色,於灰階度為0之情形時顯示白色,於灰階度為中間值之情形時根據灰階度顯示灰色。
因此,陣列式超音波影像裝置1將經平面掃描之被檢體8之空洞(與周圍之密度差較大),顯示為白色圖像。
The
接著,藉由圖2,說明陣列式超音波影像裝置1中之探針4之平面掃描之動作內容。
探針4例如由192個振子直線排設而構成,但於圖2中,顯示探針4由振子a、b、c、d、e、f、g之7個振子構成之情形。
Next, with reference to FIG. 2 , the operation content of the planar scanning of the
陣列式超音波影像裝置1將被檢體8之設定之位置設為掃描之原點(圖2之掃描區域之左上方),指定掃描區域之大小,進行探針4之平面掃描。
首先,以探針4之電子掃描之開始點位於掃描原點之方式,驅動3軸掃描器2,來移動探針4。詳細而言,由於電子掃描於探針4之移動期間進行,故以探針4通過電子掃描之開始點時之移動速度成為特定值之方式,包含助跑部分而移動。
The array
於平面掃描之原點(開始位置),探針4利用振子a、b、c、d、e、f、g進行電子掃描,且藉由3軸掃描器2之X軸掃描器21,於與振子之排設方向垂直之方向移動。且,探針4與X軸掃描器21之編碼器輸出同步,進行下一個電子掃描。探針4於掃描區域之寬度量(X軸方向之大小量)重複上述動作。At the origin (starting position) of the plane scan, the
探針4如上所述,一面進行X軸方向之探針4之連續移動(掃描動作1),一面重複電子掃描,而對Y軸方向之長度為電子掃描之掃描寬度量,且X軸方向之長度為設定之掃描區域之寬度量之帶狀之掃描區域照射超音波光束,檢測來自被檢體8之反射波。As mentioned above, the
此時,控制裝置10將以探針4之一次電子掃描檢測出之來自被檢體8之反射波設為X軸方向之位置(掃描行)相同之超音波光束之反射波,算出反射波之信號強度,並顯示為濃淡圖像。At this time, the
接著,探針4藉由3軸掃描器2之Y軸掃描器22,與複數個振子之排設方向並行地進行電子掃描之掃描寬度量之移動(移位動作)。且,以探針4之電子掃描之開始點與上述掃描動作1之最後之電子掃描之開始點於X軸方向上成為同一位置之方式,藉由X軸掃描器21移動探針4。Next, the
探針4利用振子a、b、c、d、e、f、g進行電子掃描,且藉由3軸掃描器2之X軸掃描器21,於與掃描動作1為相反方向之垂直於振子之排設方向之方向移動。且,探針4與X軸掃描器21之編碼器輸出同步,進行下一個電子掃描。探針4於掃描區域之寬度量(X軸方向之大小量)重複上述動作。The
探針4如上所述,一面進行X軸方向之探針4之連續移動(掃描動作2),一面重複電子掃描,而對Y軸方向之長度為電子掃描之掃描寬度量,且X軸方向之長度為設定之掃描區域之寬度量之帶狀之掃描區域照射超音波光束,檢測來自被檢體8之反射波。As mentioned above, the
控制裝置10係若可藉由上述探針4之掃描動作1與掃描動作2,覆蓋所指定之掃描區域,則結束平面掃描,但於不足之情形時,使探針4進行電子掃描之掃描寬度量之移位動作而移動,與進行電子掃描之同時進行與先前之動作同樣之掃描動作3、移位動作、掃描動作4。
控制裝置10重複上述動作直至覆蓋所指定之掃描區域為止,進行被檢體8之平面掃描。
If the
於本說明書中,將探針4之掃描動作1、掃描動作3……記為正向移動掃描動作(第1掃描動作),將探針4之掃描動作2、掃描動作4……記為反向移動掃描動作(第2掃描動作)。In this specification, the
由於探針4於上述掃描動作1、2、3、4中,一面連續移動,一面進行電子掃描,故詳細而言,因超音波光束之照射時序,超音波光束之照射點之X軸方向之位置產生偏移。接著,對超音波光束之照射時序與照射點之關係進行說明。Since the
圖3A係對比較例之探針4之超音波光束之照射點進行說明之圖。
照射點a、b、c、d、e、f、g為探針4之振子a、b、c、d、e、f、g之電子掃描之超音波光束之照射點。尤其,照射點a為與掃描區域之原點對應之照射點,且為掃描動作時,與X軸掃描器21之編碼器輸出同步之電子掃描之最初之超音波光束之照射點。
FIG. 3A is a diagram illustrating irradiation points of ultrasonic beams of the
探針4之電子掃描於掃描動作之連續移動期間進行。圖3A之實線之矩形表示最初照射超音波光束時之探針4之位置,虛線之矩形表示最後照射超音波光束時之探針4之位置。
於比較例之探針4中,自照射點a向探針4之另一端依序照射超音波光束。因此,照射點b、c、d、e、f、g成為於掃描方向上逐漸偏移之位置。
The electronic scanning of the
圖3B係顯示比較例之探針4之掃描動作1與掃描動作2之平面掃描中之超音波光束之照射點之位置之圖。
由於與X軸掃描器21之編碼器輸出同步進行電子掃描,故比較例之探針4之照射點a之X軸方向之位置於掃描動作1與掃描動作2中一致(例如,Xn座標)。但,照射點b、c、d、e、f、g成為根據掃描方向逐漸偏移之位置。
FIG. 3B is a diagram showing the position of the irradiation point of the ultrasonic beam in the
此處,對探針4照射之超音波光束之反射波之超音波圖像之顯示詳細地進行說明。
圖4A係顯示由反射波信號處理部15處理之反射波中之信號強度之時間變化之一例的圖。反射波信號處理部15求出以與要檢查之被檢體8之特定深度對應之時間為中心之特定時段之反射波之信號強度之位移(振幅)。
Here, the display of the ultrasonic image of the reflected wave of the ultrasonic beam irradiated by the
圖4B係說明反射波圖像產生部16將每個照射點之反射波之信號強度轉換為0~255之灰階度之圖。將反射波之信號強度為0(位移為0)時設為灰階度255之黑色,將反射波之信號強度為最大(位移最大)時設為灰階度0之白色,且隨著反射波之信號強度(位移)變大,減小灰階度(中間值),而設為灰色。FIG. 4B is a diagram illustrating the conversion of the signal intensity of the reflected wave of each irradiation point into a gray scale of 0 to 255 by the reflected wave
接著,利用圖4C、圖4D說明藉由比較例之探針4進行電子掃描時之超音波圖像。
圖4C係顯示探針4之超音波光束之照射點與以如圖所示般之短條狀具有3個反射率不同之區域之被檢體8之位置關係的圖。雖探針4之電子掃描之最初之照射點位於3個反射率不同之區域之各個區域,但由於在探針4之移動期間進行電子掃描,故電子掃描之最後之照射點進入相鄰之短條區域。
Next, an ultrasonic image when electronic scanning is performed by the
圖4D係顯示圖4C中之電子掃描之超音波圖像之圖。
此時,反射波圖像產生部16將以探針4之一次電子掃描檢測出之來自被檢體8之反射波設為X軸方向之位置(掃描行)相同之超音波光束之反射波,算出反射波之信號強度,求出濃淡圖像,並由顯示部17顯示為超音波圖像。因此,顯示圖4C中說明之被檢體8之不同之反射率之分佈之濃淡圖像。
Figure 4D is a diagram showing the ultrasound image of the electronic scan in Figure 4C.
At this time, the reflected
圖5A、圖5B係說明使比較例之探針4往復移動時之超音波圖像之顯示例之圖。5A and 5B are diagrams illustrating display examples of ultrasonic images when the
圖5A係顯示將被檢體8之外形設為掃描區域時之探針4之電子掃描之照射點之位置之圖。
如圖3B所說明,由於與X軸掃描器21之編碼器輸出同步進行電子掃描,故X軸方向之位置於掃描動作1與掃描動作2中一致(例如,Xn座標)。但,照射點b、c、d、e、f、g成為根據掃描方向逐漸偏移之位置。因此,掃描動作1之最後之電子掃描之照射點e、f、g係於被檢體外照射超音波光束。
FIG. 5A is a diagram showing the position of the irradiation point of the electronic scanning of the
圖5B係顯示圖5A之電子掃描之超音波圖像之圖。
由於反射波圖像產生部16將以探針4之一次電子掃描檢測出之來自被檢體8之反射波顯示為X軸方向之位置(掃描行)相同之超音波光束之反射波,故將照射點e、f、g顯示為被檢體8之Xn座標之超音波圖像。
Figure 5B is a diagram showing the ultrasound image of the electronic scan of Figure 5A.
Since the reflected
由於被檢體8之反射波與被檢體外之反射波之信號強度不同,故相當於照射點e、f、g之反射波圖像顯示為不同之濃淡圖像,並視認為圖像資訊之偏差。另,於圖5B中,為說明起見,將被檢體8之反射波圖像設為白色,將被檢體外之反射波圖像設為黑色。Since the signal intensity of the reflected wave of the subject 8 is different from that of the reflected wave outside the subject, the reflected wave images corresponding to the irradiation points e, f, and g are displayed as images of different shades, which are regarded as image information deviation. In addition, in FIG. 5B , for the sake of explanation, the reflected wave image of the subject 8 is set to white, and the reflected wave image outside the subject is set to black.
以下,對實施形態之陣列式超音波影像裝置1進行說明。Hereinafter, an array type
圖6A係對實施形態之探針4之超音波光束之照射點進行說明之圖。
照射點a、b、c、d、e、f、g為探針4之振子a、b、c、d、e、f、g之電子掃描之超音波光束之照射點。尤其,照射點a為與掃描區域之原點對應之照射點,且為掃描動作時,與X軸掃描器21之編碼器輸出同步之電子掃描之最初之超音波光束之照射點。
FIG. 6A is a diagram illustrating irradiation points of ultrasonic beams of the
探針4之電子掃描於掃描動作之連續移動期間進行。圖6A之實線之矩形表示最初照射超音波光束時之探針4之位置,虛線之矩形表示最後照射超音波光束時之探針4之位置。The electronic scanning of the
藉由時序處理部13(參考圖1),探針4於將超音波光束照射至照射點a後,於電子掃描之另一端之照射點g照射超音波光束。接著,於較照射點a更靠近中央側之照射點b照射超音波光束。如此,探針4自對向之端部之照射點向中央部之照射點依序交替照射超音波光束而進行電子掃描。After the
換言之,探針4以隨著掃描動作之方向超音波光束之照射點成為く字狀或倒く字狀之方式照射超音波光束。In other words, the
圖6B係顯示探針4之掃描動作1與掃描動作2之掃描區域中之超音波光束之照射點之位置之圖。
由於與X軸掃描器21之編碼器輸出同步進行電子掃描,故探針4之照射點a之X軸方向之位置於掃描動作1與掃描動作2中一致,照射點b、c、d、e、f、g成為根據掃描方向而逐漸偏移之位置。
FIG. 6B is a diagram showing the position of the irradiation point of the ultrasonic beam in the scanning area of the
圖7A、圖7B係說明使比較例之探針4往復移動時之超音波圖像之顯示例之圖。7A and 7B are diagrams illustrating display examples of ultrasonic images when the
圖7A係顯示將被檢體8之外形設為掃描區域時之探針4之電子掃描之照射點之位置之圖。
如圖6B所說明,由於與X軸掃描器21之編碼器輸出同步進行電子掃描,故探針4之照射點a之X軸方向之位置於掃描動作1與掃描動作2中一致,照射點b、c、d、e、f、g根據掃描方向,超音波光束之照射點成為倒く字狀、或く字狀。藉此,掃描動作1之最後之電子掃描之照射點c、d、e於被檢體外照射超音波光束。
FIG. 7A is a diagram showing the position of the irradiation point of the electronic scanning of the
圖7B係顯示圖7A之電子掃描之超音波圖像之圖。
由於反射波圖像產生部16將以探針4之一次電子掃描檢測出之來自被檢體8之反射波顯示為X軸方向之位置(掃描行)相同之超音波光束之反射波,故將照射點c、d、e以黑色顯示為被檢體8之Xn座標之超音波圖像。另,為說明起見,將被檢體8之反射波圖像設為白色,將反射波之信號強度不同之被檢體外之反射波圖像設為黑色。
Figure 7B is a diagram showing the ultrasound image of the electronic scan of Figure 7A.
Since the reflected
如此,於移位處理之前一刻之正向移動處理之最終電子掃描中,與反向移動處理之端部邊緣附近之圖像顯示為白色,另一方面,反向移動處理之最初電子掃描之與正向移動處理之端部邊緣附近之圖像亦顯示為白色。其結果,正向移動與反向移動之端部邊緣附近之圖像以相同之灰階度即白色顯示。即,根據圖6A所說明之掃描動作之方向以超音波光束之照射點成為く字狀或倒く字狀之方式照射超音波光束,藉此於掃描動作之去路與返路之端部邊緣附近之圖像中,成為相同之灰階度,而可抑制產生之圖像資訊之偏差,顯示接近被檢體之實像之圖像。即,可修正切換掃描動作之去路與返路之位置處之超音波反射波之顯示偏差。In this way, in the final electronic scan of the forward shift process immediately before the shift process, the image near the end edge of the reverse shift process is displayed in white, and on the other hand, the image of the first electronic scan of the reverse shift process and The image near the end edge of the positive shift process is also displayed in white. As a result, the images in the vicinity of the end edges of the forward movement and the reverse movement are displayed with the same gray scale, that is, white. That is, according to the direction of the scanning operation described in FIG. 6A , the ultrasonic beam is irradiated in such a way that the irradiation point of the ultrasonic beam becomes a “く” shape or an inverted “く” shape, thereby irradiating the ultrasonic beam near the end edge of the forward path and the return path of the scanning action. In the image, the same gray scale can be achieved, and the deviation of the generated image information can be suppressed, and an image close to the real image of the subject can be displayed. That is, it is possible to correct the display deviation of the ultrasonic reflected wave at the position where the forward path and the return path of the scanning operation are switched.
接著,藉由圖8,說明陣列式超音波影像裝置1之平面掃描之動作流程。
於步驟S81中,控制裝置10取得掃描區域之原點之位置(XY座標)、寬度(X軸方向之長度)、高度(Y軸方向之長度)之掃描條件。
Next, with reference to FIG. 8 , the operation flow of the plane scanning of the array type
於步驟S82中,控制裝置10之掃描器控制部11驅動3軸掃描器2將探針4移動至掃描範圍之原點之位置。In step S82, the
於步驟S83中,控制裝置10於掃描區域之高度量(Y軸方向),重複步驟S83至步驟S811之處理。In step S83, the
於步驟S84中,掃描器控制部11藉由X軸掃描器21開始掃描區域之X軸方向之探針4之掃描動作。In step S84 , the
於步驟S85中,控制裝置10於掃描區域之寬度量(X軸方向),重複步驟S86至步驟S88之處理。In step S85, the
於步驟S86中,控制裝置10之收發指令部12判定是否檢測到自掃描器控制部11通知之X軸掃描器21之編碼器輸出,於檢測到編碼器輸出之情形時(S86之是(Yes)),進行細節後述之步驟S87之探針4之電子掃描之處理。於無法檢測編碼器輸出之情形時,重複步驟S86之處理,等待檢測編碼器輸出。In step S86, the sending and receiving
於步驟S89中,控制裝置10之掃描器控制部11藉由3軸掃描器2之Y軸掃描器22,於Y軸方向上進行電子掃描之掃描寬度量之移動,而進行移位動作。In step S89 , the
於步驟S810中,掃描器控制部11係設定為將步驟S84開始之掃描動作中之探針4之移動方向(掃描方向)反轉。
藉由以上處理,陣列式超音波影像裝置1拍攝被檢體8之特定掃描區域之超音波影像。
In step S810, the
圖9係顯示圖8之步驟S87之探針4之電子掃描之處理之細節之流程圖。
於圖9中,將探針4之照射點數設為n個(奇數),將電子掃描之一端之照射點之序號設為1,並向另一端以升序進行編號。
FIG. 9 is a flow chart showing the details of the electronic scanning process of the
於步驟S91中,時序處理部13(參考圖1)一面每次對變數i加1,一面重複步驟S92至步驟S94,直至變數i自1變為(n-1)/2為止。In step S91, the sequential processing unit 13 (refer to FIG. 1 ) adds 1 to the variable i each time, and repeats steps S92 to S94 until the variable i changes from 1 to (n-1)/2.
於步驟S92中,時序處理部13選擇於照射點(i)照射超音波光束之振子群,並藉由振子動作信號產生部14(參考圖1)於探針4產生振子動作信號,於照射點(i)照射超音波光束。In step S92, the
於步驟S93中,時序處理部13選擇於照射點(n+1-i)照射超音波光束之振子群,並藉由振子動作信號產生部14(參考圖1)於探針4產生振子動作信號,於照射點(n+1-i)照射超音波光束。
藉由重複步驟S92與步驟S93,時序處理部13自對向之端部之照射點向中央部之照射點,交替依序照射超音波光束。
In step S93, the
於步驟S95中,時序處理部13於照射點((n+1)/2)照射超音波光束。即,於電子掃描之中央之照射點照射超音波光束。In step S95, the
藉由上述處理,於自電子掃描之一端朝向中心側之第1照射點、第3照射點……之位置、及自對向之另一端朝向中心側之第2照射點、第4照射點……之位置,依第1照射點、第2照射點、第3照射點、第4照射點之位置之順序照射超音波光束。Through the above processing, at the position of the first irradiation point, the third irradiation point... from one end of the electronic scanning toward the center side, and the second irradiation point, the fourth irradiation point... from the opposite end toward the center side The positions of ... are irradiated with ultrasonic beams in the order of the positions of the first irradiation point, the second irradiation point, the third irradiation point, and the fourth irradiation point.
另,圖9已就探針4之照射點數為奇數個之情形進行說明,於偶數個之情形時,於步驟S91中,一面每次對變數i加1一面重複步驟S92至步驟S94直至變數i自1至n/2為止。且,只要刪除步驟S95之處理即可。In addition, FIG. 9 has explained the case where the number of irradiation points of the
藉由上述處理,如圖6B所示,掃描動作1中之電子掃描之最後之超音波光束之照射點即照射點g之點列、與掃描動作2中之電子掃描之最初之超音波光束之照射點即照射點a之點列之偏差,較圖3B所示之情形小。Through the above processing, as shown in FIG. 6B, the irradiation point of the last ultrasonic beam in the electronic scanning in
因此,控制裝置10將電子掃描之反射波設為X軸方向之位置(掃描行)相同之超音波光束之反射波,而可將算出反射波之信號強度並顯示為濃淡圖像時之、掃描動作1之顯示區域與掃描動作2之顯示區域之邊界部之濃淡圖像之偏差減小。Therefore, the
又,由於探針4自對向之端部之照射點向中央部之照射點交替依序照射超音波光束來進行電子掃描,故可減小電子掃描之相鄰之照射點之位置偏移之惡化,可抑制掃描動作1之顯示區域內及掃描動作2之顯示區域內之濃淡圖像之偏差顯著化。Also, since the
以上說明之實施形態之陣列式超音波影像裝置1可抑制於探針4之掃描之正向移動與反向移動中產生之反射波圖像之圖像偏差之發生,而可高速地取得降低被檢體8之圖像偏差之超音波圖像。The array type
本發明並非限定於上述之實施例者,而包含各種變化例。上述實施形態係為了易於理解地說明本發明而詳細說明者,並非限定於必須具備說明之所有構成者。The present invention is not limited to the above-described embodiments, but includes various modifications. The above-described embodiments are described in detail for the sake of easy understanding of the present invention, and are not limited to those that must include all the components described.
1:陣列式超音波影像裝置 2:3軸掃描器 3:感測器 4:探針(超音波陣列探針) 8:被檢體 10:控制裝置 11:掃描器控制部 12:收發指令部 13:時序處理部 14:振子動作信號產生部 15:反射波信號處理部 16:反射波圖像產生部 17:顯示部 21:X軸掃描器 22:Y軸掃描器 23:Z軸掃描器 24:保持器 42:鍔部 91:水槽 92:台 a~g:振子/照射點 S81~S89,S810,S811:步驟 S91~S95:步驟 X:方向 Xn:座標 Y:方向 Z:方向 1: Array Ultrasonic Imaging Device 2: 3-axis scanner 3: Sensor 4: Probe (ultrasonic array probe) 8: Subject 10: Control device 11: Scanner control unit 12: Send and receive command department 13: Timing processing department 14: Vibrator action signal generation part 15: Reflected wave signal processing unit 16:Reflected wave image generation unit 17: Display part 21: X-axis scanner 22: Y-axis scanner 23: Z-axis scanner 24: Retainer 42: Neck 91: Sink 92: Taiwan a~g: vibrator/irradiation point S81~S89,S810,S811: steps S91~S95: steps X: direction Xn: coordinates Y: Direction Z: Direction
圖1係顯示實施形態之陣列式超音波影像裝置之整體構成之圖。
圖2係說明陣列式超音波影像裝置中之探針之平面掃描之動作內容之圖。
圖3A係對比較例之探針之超音波光束之照射點進行說明之圖。
圖3B係顯示比較例之探針之平面掃描中之超音波光束之照射點之位置的圖。
圖4A係顯示反射波中之信號強度之時間變化之一例之圖。
圖4B係說明將反射波之信號強度轉換為0~255之灰階度之圖。
圖4C係顯示超音波光束之照射點與短條狀具有3個反射率不同之區域之被檢體8之位置關係之圖。
圖4D係顯示圖4C中之電子掃描之超音波圖像之圖。
圖5A係顯示比較例之藉由探針4將被檢體之外形設為掃描區域時之電子掃描之照射點之位置的圖。
圖5B係顯示圖5A之電子掃描之超音波圖像之圖。
圖6A係對實施形態之探針4之超音波光束之照射點進行說明之圖。
圖6B係顯示探針之平面掃描中之超音波光束之照射點之位置之圖。
圖7A係顯示實施形態之將被檢體之外形設為掃描區域時之電子掃描之照射點之位置的圖。
圖7B係顯示圖7A之電子掃描之超音波圖像之圖。
圖8係說明陣列式超音波影像裝置之平面掃描之動作之流程圖。
圖9係顯示電子掃描之處理之細節之流程圖。
Fig. 1 is a diagram showing the overall configuration of an array type ultrasonic imaging device of an embodiment.
FIG. 2 is a diagram illustrating the operation content of planar scanning of a probe in the array type ultrasonic imaging device.
FIG. 3A is a diagram illustrating irradiation points of ultrasonic beams of a probe of a comparative example.
3B is a diagram showing the position of the irradiation point of the ultrasonic beam in the planar scanning of the probe of the comparative example.
FIG. 4A is a graph showing an example of temporal changes in signal strength in reflected waves.
FIG. 4B is a diagram illustrating the conversion of the signal intensity of the reflected wave into gray scales of 0-255.
FIG. 4C is a diagram showing the positional relationship between the irradiation point of the ultrasonic beam and the subject 8 having three strip-shaped regions with different reflectances.
Figure 4D is a diagram showing the ultrasound image of the electronic scan in Figure 4C.
FIG. 5A is a diagram showing the position of the irradiation point of the electronic scanning when the shape of the subject is set as the scanning area by the
a,g:照射點 a,g: irradiation point
Xn:座標 Xn: coordinates
Claims (9)
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| JP2583939B2 (en) * | 1988-02-03 | 1997-02-19 | 日立建機株式会社 | Ultrasonic flaw detector |
| JPH06138109A (en) * | 1992-10-29 | 1994-05-20 | Hitachi Constr Mach Co Ltd | Method and apparatus for ultrasonic wave inspection |
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