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TW202131356A - Resistor array, measuring circuit with resistor array and method of manufacturing a strip material composite for resistor array - Google Patents

Resistor array, measuring circuit with resistor array and method of manufacturing a strip material composite for resistor array Download PDF

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TW202131356A
TW202131356A TW110101490A TW110101490A TW202131356A TW 202131356 A TW202131356 A TW 202131356A TW 110101490 A TW110101490 A TW 110101490A TW 110101490 A TW110101490 A TW 110101490A TW 202131356 A TW202131356 A TW 202131356A
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strip
resistance element
resistance
resistor array
measuring
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TW110101490A
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Chinese (zh)
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TWI865709B (en
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邁克爾 沃爾夫
格哈德 圖姆
福爾克爾 福格澤
斯特凡 格德
康斯坦丁 賴希邁爾
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德國商威蘭德沃克公開股份有限公司
德國商慕尼黑電氣化有限公司
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/203—Resistors used for electric measuring, e.g. decade resistors standards, resistors for comparators, series resistors, shunts
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01C—RESISTORS
    • H01C13/00—Resistors not provided for elsewhere
    • H01C13/02—Structural combinations of resistors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0038—Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing pulses or pulse trains according to amplitude)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01C—RESISTORS
    • H01C1/00—Details
    • H01C1/01—Mounting; Supporting
    • H01C1/014—Mounting; Supporting the resistor being suspended between and being supported by two supporting sections
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01C—RESISTORS
    • H01C1/00—Details
    • H01C1/14—Terminals or tapping points or electrodes specially adapted for resistors; Arrangements of terminals or tapping points or electrodes on resistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01C—RESISTORS
    • H01C1/00—Details
    • H01C1/14—Terminals or tapping points or electrodes specially adapted for resistors; Arrangements of terminals or tapping points or electrodes on resistors
    • H01C1/144—Terminals or tapping points or electrodes specially adapted for resistors; Arrangements of terminals or tapping points or electrodes on resistors the terminals or tapping points being welded or soldered
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01C—RESISTORS
    • H01C1/00—Details
    • H01C1/14—Terminals or tapping points or electrodes specially adapted for resistors; Arrangements of terminals or tapping points or electrodes on resistors
    • H01C1/148—Terminals or tapping points or electrodes specially adapted for resistors; Arrangements of terminals or tapping points or electrodes on resistors the terminals embracing or surrounding the resistive element
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01C—RESISTORS
    • H01C1/00—Details
    • H01C1/16—Resistor networks not otherwise provided for
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01C—RESISTORS
    • H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01C—RESISTORS
    • H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
    • H01C17/006—Apparatus or processes specially adapted for manufacturing resistors adapted for manufacturing resistor chips
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01C—RESISTORS
    • H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
    • H01C17/22—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01C—RESISTORS
    • H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
    • H01C17/28—Apparatus or processes specially adapted for manufacturing resistors adapted for applying terminals
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01C—RESISTORS
    • H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
    • H01C7/06—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material including means to minimise changes in resistance with changes in temperature
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01C—RESISTORS
    • H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
    • H01C7/20—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material the resistive layer or coating being tapered

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Electromagnetism (AREA)
  • Apparatuses And Processes For Manufacturing Resistors (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

A resistor array is provided, which comprises: a first connection element and a second connection element, a first resistance element conductively connected to the first connection element, a second resistance element conductively connected to the second connection element, and an intermediate element disposed between the first resistance element and the second resistance element and conductively connected to the resistance elements, wherein the connection elements, the resistance elements and the intermediate element are disposed side by side in a row with each other. The connection element, the intermediate element and the resistance element are made of different materials, wherein the material of the first resistance element is different from the material of the second resistance element. In addition, a method of manufacturing a strip material composite for the resistor array is also provided.

Description

電阻器陣列、具有電阻器陣列的測量電路以及製造用於電阻器陣列的帶狀材料複合體的方法Resistor array, measuring circuit with resistor array, and method of manufacturing strip material composite for resistor array

本發明涉及一種電阻器陣列，其包括：第一導電連接元件和第二導電連接元件、與所述第一連接元件導電連接的第一電阻元件、與所述第二連接元件導電連接的第二電阻元件、導電中間元件，所述中間元件佈置在所述第一電阻元件與所述第二電阻元件之間並且與所述電阻元件導電連接，其中所述連接元件、電阻元件和所述中間元件彼此並排佈置成一排。所述連接元件和所述中間元件與所述電阻元件由不同的材料構成，其中所述第一電阻元件的材料與所述第二電阻元件的材料有所不同。此外，本發明還涉及一種具有所述電阻器陣列的測量電路以及一種製造用於所述電阻器陣列的帶狀材料複合體的方法。The present invention relates to a resistor array, which includes: a first conductive connection element and a second conductive connection element, a first resistance element conductively connected to the first connection element, and a second conductive connection element to the second connection element. A resistive element, a conductive intermediate element, the intermediate element is arranged between the first resistive element and the second resistive element and is conductively connected to the resistive element, wherein the connecting element, the resistive element, and the intermediate element Arranged side by side in a row. The connecting element and the intermediate element and the resistance element are made of different materials, wherein the material of the first resistance element is different from the material of the second resistance element. In addition, the present invention also relates to a measuring circuit having the resistor array and a method of manufacturing a strip material composite for the resistor array.

就測量電子電路中的電流而言，採用與待監測的元件串聯的測量電阻器，其中可以根據跨越被稱為分流電阻器或簡稱為分流器的測量電阻器的電壓降來測定電流。正確且可靠的電流測量例如在混合動力車輛或電動車的電池管理系統中或者對於監測燃料電池裝置而言尤為重要。這種低電阻的測量電阻器，例如約10至50微歐姆（μOhm）的分流器，可以由縱縫焊接的複合材料帶製成。例如由EP 0605800 A1已知上述方案。這個複合材料由三個材料帶製成，具體方式在於，借助電子束或雷射焊接工藝通過縱縫將各個金屬帶相互連接。For measuring the current in the electronic circuit, a measuring resistor in series with the element to be monitored is used, wherein the current can be determined based on the voltage drop across the measuring resistor called a shunt resistor or simply a shunt. Correct and reliable current measurement is particularly important, for example, in battery management systems of hybrid or electric vehicles or for monitoring fuel cell devices. Such low-resistance measuring resistors, such as shunts of approximately 10 to 50 microohms (μOhm), can be made of composite material strips welded longitudinally. The above-mentioned solution is known from EP 0605800 A1, for example. This composite material is made of three material strips, and the specific way is to connect the metal strips to each other through longitudinal seams by means of electron beam or laser welding.

在現今的混合動力車輛和電動車中，對正確且可靠的電流測量的要求在不斷提高，在這些混合動力車輛和電動車中，部分要運行非常高的持續電流。就這類電流而言，對安全相關的元件的監測非常重要。就此而言，必須非常精確地對能量密度較高的鋰離子電池進行監測，以便確保這些鋰離子電池始終處於安全的工作狀態。因此，為了監測特定的工作參數，例如充電狀態（SOC/State of Charge）或工作狀態（SOH/State of health）或功能狀態（SOF/State of functions），電池中的電流測量是必不可少的。就該應用領域中不超過ASIL C和D（ISO 26262）的安全等級而言，需要通過冗餘功能來保障相關測量儀器的安全，以便可以完全實現這個安全級別。In today's hybrid vehicles and electric vehicles, the requirements for correct and reliable current measurement are constantly increasing. In these hybrid vehicles and electric vehicles, some of them have to run very high continuous currents. For this type of current, monitoring of safety-related components is very important. In this regard, it is necessary to monitor lithium-ion batteries with higher energy density very accurately to ensure that these lithium-ion batteries are always in a safe working state. Therefore, in order to monitor specific operating parameters, such as SOC/State of Charge or SOH/State of health or SOF/State of functions, current measurement in the battery is essential . As far as the safety level of this application field does not exceed ASIL C and D (ISO 26262), it is necessary to ensure the safety of related measuring instruments through redundant functions so that this safety level can be fully realized.

可以通過組合不同的感測器來實現達到安全等級ASIL C所必需的電流測量的冗餘，即同時檢測兩個完全不同的測量訊號，例如通過測量已知尺寸的分流電阻器上的電壓以及通過測量磁場中的載流導體上的霍爾電壓。這個結構的成本相對較高，這是因為集成度較低並且需要多個空間需求相應較高的元件。The redundancy of current measurement necessary to achieve safety level ASIL C can be achieved by combining different sensors, that is, detecting two completely different measurement signals at the same time, for example, by measuring the voltage on a shunt resistor of known size and passing Measure the Hall voltage on the current-carrying conductor in the magnetic field. The cost of this structure is relatively high because of the low integration and the need for multiple components with correspondingly high space requirements.

測量值採集中的冗餘也是可以實現的，具體方式在於，代替霍爾電壓測量而將第二分流電阻器與第一分流電阻器串聯並且對以這種方式形成的雙分流器的兩個分流電阻器分別進行獨立的電壓測量以測得電流強度。在此情況下，通過對這兩個測量進行比較，可以測定這些測量是否似真或者是否存在錯誤。因此，這個雙分流器能夠診斷「單點故障」，即各個測量抽頭的漂移、電阻變化、脫離。此外，這個雙分流器還可以借助似真檢驗為分流電子設備提供更好的診斷選項，該似真檢驗為對通過集成在一個元件中的兩個分流元件而進行的測量的。與借助單分流器和霍爾效應進行的電流測量相比，借助雙分流器進行的電流測量在這個雙分流器的結構方面更為簡單且成本更低。由US 9343208 B2已知製造多分流器的方案。Redundancy in the measurement value collection can also be achieved, the specific way is to replace the Hall voltage measurement and connect the second shunt resistor in series with the first shunt resistor and pair the two shunts of the double shunt formed in this way. The resistors perform independent voltage measurements to measure the current intensity. In this case, by comparing these two measurements, it can be determined whether these measurements are plausible or whether there are errors. Therefore, this double shunt can diagnose "single point failure", that is, drift, resistance change, and detachment of each measurement tap. In addition, this dual shunt can also provide better diagnostic options for shunt electronic devices with the help of plausibility test, which is a measurement performed through two shunt elements integrated in one element. Compared with the current measurement with the single shunt and the Hall effect, the current measurement with the double shunt is simpler and lower in cost in terms of the structure of the double shunt. From US 9343208 B2, a solution for manufacturing a multi-shunt is known.

但是，在採用這種雙分流器時，兩個測量可能會經受相同的故障，例如由於兩個電阻器的平行漂移。However, when using such a dual shunt, the two measurements may experience the same failure, for example due to parallel drift of the two resistors.

因此，本發明的目的在於減少已知的缺點。Therefore, the object of the present invention is to reduce the known disadvantages.

本發明用以達成上述目的的解決方案在於具有請求項1的特徵的電阻器陣列、具有請求項9的特徵的測量電路以及具有請求項12的特徵的方法。本發明的有利技術方案和有利的改進方案參閱從屬請求項。The solution of the present invention to achieve the above-mentioned object lies in a resistor array having the characteristics of claim 1, a measuring circuit having the characteristics of claim 9, and a method having the characteristics of claim 12. Refer to the dependent claims for the advantageous technical solutions and advantageous improvement solutions of the present invention.

開篇所述類型的電阻測量裝置的特徵在於，這兩個電阻元件選擇性地由不同的材料製成，特別是由可以具有不同化學成分的不同材料製成，其中特別是可以將CuMn10Ni4和CuMn12Ni2以及CuMn14Ni2和CuZn15Mn15Al做為電阻合金的示例。在此情況下，這個電阻測量裝置包括由這些合金（即例如用於第一電阻元件的CuMn10Ni4和用於第二電阻元件的CuMn14Ni2）構成的材料對。The resistance measuring device of the type mentioned in the opening paragraph is characterized in that the two resistance elements are selectively made of different materials, in particular made of different materials that can have different chemical compositions, in particular, CuMn10Ni4 and CuMn12Ni2 can be combined with CuMn14Ni2 and CuZn15Mn15Al are examples of resistance alloys. In this case, this resistance measuring device includes a material pair composed of these alloys (ie, for example, CuMn10Ni4 for the first resistance element and CuMn14Ni2 for the second resistance element).

這樣就特別地確保了兩個電阻元件來自不同的生產批次。因此，在兩個電阻元件中，無法同時發生以及以相同的方式在一個批次中發生未識別的故障，這些故障例如可能引發漂移。這樣就實現了改善測量冗餘的優點。This particularly ensures that the two resistance elements come from different production batches. Therefore, in two resistance elements, unrecognized faults cannot occur simultaneously and in the same way in a batch, and these faults may cause drift, for example. This achieves the advantage of improving measurement redundancy.

此外，所述兩個連接元件呈板狀，所述中間元件呈條狀，並且與所述兩個連接元件中的每一個相比，所述中間元件均更窄。這樣就能節省材料和空間，因為這個中間元件僅具有容置用於電壓測量的接頭的功能，而不具有用於容置與電路連接的裝置的功能。這些電阻元件也可以呈條狀。In addition, the two connecting elements have a plate shape, the intermediate element has a strip shape, and the intermediate element is narrower than each of the two connecting elements. This saves material and space, because this intermediate element only has the function of accommodating the connector for voltage measurement, but not the function of accommodating the device connected to the circuit. These resistance elements may also be strip-shaped.

因此，僅所述第一連接元件和所述第二連接元件具有用於嵌入電路中的連接構件，而所述中間元件則無法與電路連接。Therefore, only the first connection element and the second connection element have a connection member for embedding in a circuit, and the intermediate element cannot be connected to the circuit.

所述電阻元件的厚度均小於所述連接元件的厚度和所述中間元件的厚度，這在例如安裝在PCB（印製電路板）上時具有優勢並且還可以實現焊接。The thickness of the resistance element is smaller than the thickness of the connecting element and the thickness of the intermediate element, which has advantages when mounted on a PCB (printed circuit board), for example, and can also realize soldering.

在此情況下，以某種方式選擇設計方案，使得所述第一電阻元件的厚度與所述第二電阻元件的厚度有所不同。這樣就能更好地匹配兩個電阻元件的電阻值。In this case, the design solution is selected in a certain way so that the thickness of the first resistance element is different from the thickness of the second resistance element. In this way, the resistance values of the two resistance elements can be better matched.

此外，優選的是，設有用於測量跨越第一電阻元件的電壓降的第一測量接頭對和用於測量跨越第二電阻元件的電壓降的第二測量接頭對，來自這個第一測量接頭對的第一測量接頭和來自這個第二測量連接對的第二測量接頭對應於中間元件。In addition, it is preferable to provide a first pair of measurement contacts for measuring the voltage drop across the first resistance element and a second pair of measurement contacts for measuring the voltage drop across the second resistance element, from this first pair of measurement contacts The first measurement joint of and the second measurement joint from this second measurement connection pair correspond to the intermediate element.

做為替代或補充性方案，可以設有用於測量跨越第一電阻元件的電壓降的測量接頭對以及用於測量跨越第一電阻元件和第二電阻元件的累積電壓降的第三測量接頭對。As an alternative or supplementary solution, a pair of measurement contacts for measuring the voltage drop across the first resistance element and a third pair of measurement contacts for measuring the cumulative voltage drop across the first resistance element and the second resistance element may be provided.

如果第一電阻元件的電阻值小於第二電阻元件的電阻值，特別是如果這些電阻值的差異如此明顯，以至於必須使用不同的測量範圍來測量這兩個電壓，則這些測量值的獨立性將有所提升。If the resistance value of the first resistance element is less than the resistance value of the second resistance element, especially if the difference in these resistance values is so significant that different measurement ranges must be used to measure the two voltages, the independence of these measurement values Will be improved.

這個電阻器陣列特別是可以集成至測量電路中。在此情況下，這個測量電路包括如上所述的這種電阻器陣列以及用於測量跨越第一電阻元件而下降的第一電壓的第一電壓抽頭、用於測量至少包括跨越第二電阻元件的電壓降的第二電壓的第二電壓抽頭以及至少一個用於測定第一電壓和第二電壓的電子器件。In particular, this resistor array can be integrated into the measuring circuit. In this case, the measurement circuit includes the resistor array as described above, a first voltage tap for measuring the first voltage dropped across the first resistance element, and the first voltage tap for measuring at least the resistance across the second resistance element. The second voltage tap of the second voltage of the voltage drop and at least one electronic device for measuring the first voltage and the second voltage.

可以借助用於對所測得的第一電壓和所測得的第二電壓進行比較的比較器對這些測量值的可靠性進行分析。The reliability of these measured values can be analyzed by means of a comparator for comparing the measured first voltage with the measured second voltage.

優選地，這個電子器件被設置成使得第一電壓的測量和第二電壓的測量可以彼此獨立地進行，從而可以通過對這兩個測量進行比較來識別兩個測量鏈中的一個的故障。Preferably, this electronic device is arranged so that the measurement of the first voltage and the measurement of the second voltage can be performed independently of each other, so that the failure of one of the two measurement chains can be identified by comparing the two measurements.

用於製造帶狀材料複合體的方法，包括以下步驟：a) 至少提供由導電性較高的材料構成的一個第一帶材、一個第二帶材和一個第三帶材，b) 至少提供分別由電阻材料構成的一個第四帶材和一個第五帶材，其中所述第四帶材的材料與所述第五帶材的材料有所不同，c) 對這些帶材進行縱縫焊接，從而形成帶材的複合體，其中由電阻材料構成的兩個帶材分別在其兩個縱向邊緣上鄰接由導電性較高的材料構成的帶材中的一個。The method for manufacturing a strip-shaped material composite includes the following steps: a) providing at least a first strip, a second strip and a third strip made of materials with higher conductivity, b) at least providing A fourth strip and a fifth strip composed of resistance materials, wherein the material of the fourth strip is different from the material of the fifth strip, c) longitudinal seam welding of these strips , Thereby forming a composite body of strips, in which two strips made of resistive material abut one of the strips made of a material with higher conductivity on its two longitudinal edges, respectively.

在此情況下，可以在步驟c)中首先分別通過縱縫焊接形成由第一帶材和第四帶材構成的第一部分複合體以及由第二帶材和第三帶材以及佈置在這兩個帶材之間的第五帶材構成的第二部分複合體，然後通過縱縫焊接將這個第一部分複合體與這個第二部分複合體連接在一起。In this case, in step c), the first partial composite body composed of the first strip and the fourth strip and the second strip and the third strip and arranged in the two can be formed by longitudinal seam welding, respectively. The fifth strip between the two strips constitutes a second partial composite body, and then the first partial composite body and the second partial composite body are connected together by longitudinal seam welding.

此外，在方法步驟b)與方法步驟c)之間以某種方式對這些帶材進行佈置，使得第四帶材和第五帶材處於由導電性較高的材料構成的兩個帶材之間並且這些由導電性較高的材料構成的帶材中的一個處於由電阻材料構成的兩個帶材之間。借助上述方法及其關於步驟c)的變體方案以及在方法步驟b)和c)之間實現帶材的佈置，提供帶狀複合材料，其中通過橫向於帶材縱向方向地分離帶狀材料複合體來製造和提供上述電阻器陣列。In addition, between method step b) and method step c), these strips are arranged in a certain way so that the fourth strip and the fifth strip are between the two strips made of a material with higher conductivity. One of these strips made of a material with higher conductivity is located between two strips made of a resistive material. By means of the above-mentioned method and its variants with respect to step c) and the arrangement of the strips between method steps b) and c), a strip-shaped composite material is provided, wherein the strip-shaped composite material is composited by separating the strip material transversely to the longitudinal direction of the strip Body to manufacture and provide the above resistor array.

在此情況下，還可以將用於將電阻器陣列連接至電路的連接構件插入兩個連接元件中。In this case, it is also possible to insert a connecting member for connecting the resistor array to the circuit in the two connecting elements.

此外，也可以調整所述電阻元件中的至少一個，借助這個電阻元件來設置期望的電阻值。通過縮短所述一個電阻元件來進行調整，以便減小其橫截面面積。In addition, at least one of the resistance elements can also be adjusted, and a desired resistance value can be set with this resistance element. The adjustment is made by shortening the one resistance element so as to reduce its cross-sectional area.

在不超出本發明的範圍的情況下，說明書中述及的上述特徵和特徵組合以及附圖說明中述及的和/或在附圖中單獨示出的以下特徵和特徵組合不僅可以以給定的組合使用，還可以以其他組合使用或單獨使用。因此，附圖中未詳細示出或說明但可以通過單獨的特徵組合由已說明的實施方案而得出和產生的實施方案也應被認為是本發明所包含的揭示內容。Without exceeding the scope of the present invention, the above-mentioned features and feature combinations mentioned in the specification and the following features and feature combinations mentioned in the description of the drawings and/or shown separately in the drawings may not only be given It can also be used in other combinations or alone. Therefore, embodiments that are not shown or described in detail in the drawings but can be derived and produced from the described embodiments through a single feature combination should also be considered as the disclosure contained in the present invention.

圖1示出電阻器陣列，這個電阻器陣列有利地通過製造帶狀材料複合體的方法來提供，其中所述方法包括以下步驟：a) 至少提供由導電性較高的材料構成的一個第一帶材1、一個第二帶材2和一個第三帶材3，b) 至少提供分別由電阻材料構成的一個第四帶材4和一個第五帶材5，其中第四帶材4的材料與第五帶材5的材料有所不同，c) 對第一帶材1、第二帶材2、第三帶材3、第四帶材4和第五帶材5進行縱縫焊接，從而形成第一帶材1、第二帶材2、第三帶材3、第四帶材4和第五帶材5的複合體，其中由電阻材料構成的第四帶材4和第五帶材5分別在其兩個縱向邊緣上鄰接由導電性較高的材料構成的第一帶材1、第二帶材2和第三帶材3中的一個。Figure 1 shows a resistor array, which is advantageously provided by a method of manufacturing a strip-shaped material composite, wherein the method includes the following steps: a) at least one first made of a material with higher conductivity is provided Strip 1, a second strip 2 and a third strip 3, b) at least provide a fourth strip 4 and a fifth strip 5 composed of resistive materials, of which the material of the fourth strip 4 The material of the fifth strip 5 is different, c) the first strip 1, the second strip 2, the third strip 3, the fourth strip 4 and the fifth strip 5 are welded longitudinally, thereby A composite body of the first strip 1, the second strip 2, the third strip 3, the fourth strip 4, and the fifth strip 5 is formed, wherein the fourth strip 4 and the fifth strip are made of resistive material 5 is adjacent to one of the first strip 1, the second strip 2 and the third strip 3 made of a material with higher conductivity on its two longitudinal edges, respectively.

在此情況下，可以在步驟c)中首先分別通過縱縫焊接形成由第一帶材1和第四帶材4構成的第一部分複合體6以及由第二帶材2和第三帶材3以及佈置在第二帶材2和第三帶材3之間的第五帶材5構成的第二部分複合體7，然後通過縱縫焊接將第一部分複合體6與第二部分複合體7連接在一起。In this case, in step c), the first partial composite body 6 composed of the first strip 1 and the fourth strip 4 and the second strip 2 and the third strip 3 can be formed by longitudinal seam welding, respectively. And the second partial composite body 7 composed of the fifth strip material 5 arranged between the second strip material 2 and the third strip material 3, and then the first partial composite body 6 and the second partial composite body 7 are connected by longitudinal seam welding Together.

做為替代方案，也可以以某種方式對所述方法進行修改，從而在方法步驟b)與方法步驟c)之間以某種方式對所述第一帶材1、所述第二帶材2、所述第三帶材3、所述第四帶材4和所述第五帶材5進行佈置，使得第四帶材4處於由導電性較高的材料構成的第一帶材1和第二帶材2之間，第五帶材5處於由導電性較高的材料構成的第二帶材2和第三帶材3之間，並且使得由導電性較高的材料構成的第一帶材1、第二帶材2和第三帶材3中的一個第二帶材2處於由電阻材料構成的第四帶材4和第五帶材5之間。As an alternative, the method can also be modified in a certain way, so that between method step b) and method step c), the first strip 1 and the second strip can be modified in a certain way. 2. The third strip 3, the fourth strip 4 and the fifth strip 5 are arranged so that the fourth strip 4 is in the first strip 1 and Between the second strips 2, the fifth strip 5 is between the second strips 2 and the third strips 3 made of materials with higher conductivity, and makes the first strip made of materials with higher conductivity One of the strip 1, the second strip 2 and the third strip 3, the second strip 2 is located between the fourth strip 4 and the fifth strip 5 made of resistive material.

在此情況下，如果橫向於第一帶材1、第二帶材2、第三帶材3、第四帶材4和第五帶材5縱向方向地分離帶狀材料複合體，則製成電阻器陣列8，其中以下結構：第一連接元件10和第二連接元件11、與第一連接元件10導電連接的第一電阻元件12、與第二連接元件11導電連接的第二電阻元件13、中間元件14，中間元件14佈置在第一電阻元件12與第二電阻元件13之間並且與第一電阻元件12與第二電阻元件13導電連接，其中第一連接元件10、第二連接元件11、第一電阻元件12、第二電阻元件13以及中間元件14彼此並排佈置成一排，且其中第一連接元件10以及第二連接元件11和中間元件14與第一電阻元件12與第二電阻元件13由不同的材料構成。在此情況下，重要的是，第一電阻元件12的材料與第二電阻元件13的材料有所不同，因此，與第一電阻元件12與第二電阻元件13均由相同的材料構成或者甚至由相同的材料批次構成的情況相比，可以更可靠地排除第一電阻元件12與第二電阻元件13的「平行漂移」或類似的效應。In this case, if the strip-shaped material composite is separated transversely to the longitudinal direction of the first strip 1, the second strip 2, the third strip 3, the fourth strip 4, and the fifth strip 5, it is made The resistor array 8 has the following structures: a first connection element 10 and a second connection element 11, a first resistance element 12 conductively connected to the first connection element 10, and a second resistance element 13 conductively connected to the second connection element 11 , The intermediate element 14, the intermediate element 14 is arranged between the first resistance element 12 and the second resistance element 13 and is electrically conductively connected to the first resistance element 12 and the second resistance element 13, wherein the first connection element 10, the second connection element 11. The first resistance element 12, the second resistance element 13, and the intermediate element 14 are arranged side by side with each other in a row, and the first connection element 10 and the second connection element 11 and the intermediate element 14 are the same as the first resistance element 12 and the second resistance The element 13 is composed of different materials. In this case, it is important that the material of the first resistance element 12 and the material of the second resistance element 13 are different, so that the first resistance element 12 and the second resistance element 13 are made of the same material or even Compared with the case of being composed of the same material batch, the "parallel drift" or similar effects of the first resistance element 12 and the second resistance element 13 can be eliminated more reliably.

在此情況下，中間元件14呈條狀並且與兩個呈板狀的第一連接元件10及第二連接元件11的每一個相比，該中間元件14更窄。In this case, the intermediate element 14 has a strip shape and is narrower than each of the two plate-shaped first connection elements 10 and second connection elements 11.

如圖1所示，只有第一連接元件10和第二連接元件11具有用於嵌入電路中的連接構件15，也就是說，中間元件14無法與電路連接。As shown in FIG. 1, only the first connection element 10 and the second connection element 11 have the connection member 15 for embedding in the circuit, that is, the intermediate element 14 cannot be connected to the circuit.

第一電阻元件12與第二電阻元件13的厚度小於第一連接元件10及第二連接元件11的厚度和中間元件14的厚度。這樣一來，在將電阻器陣列8固定在電路板上時，特別地，第一電阻元件12與第二電阻元件13能夠與這個電路板保持一定距離。在製造電阻器陣列8時，也可以更容易地對第一電阻元件12與第二電阻元件13中的至少一個進行調整。The thickness of the first resistance element 12 and the second resistance element 13 is smaller than the thickness of the first connection element 10 and the second connection element 11 and the thickness of the intermediate element 14. In this way, when the resistor array 8 is fixed on the circuit board, in particular, the first resistance element 12 and the second resistance element 13 can keep a certain distance from the circuit board. When the resistor array 8 is manufactured, at least one of the first resistance element 12 and the second resistance element 13 can also be adjusted more easily.

此外，第一電阻元件12的厚度與第二電阻元件13的厚度有所不同，從而能夠更好地適應第一電阻元件12與第二電阻元件13的電阻值，特別是考慮到第一電阻元件12的電阻值小於、特別是明顯小於第二電阻元件13的電阻值，以便如此強制實現不同的測量範圍並提高測量值的獨立性。In addition, the thickness of the first resistance element 12 and the thickness of the second resistance element 13 are different, so that the resistance values of the first resistance element 12 and the second resistance element 13 can be better adapted, especially considering the first resistance element The resistance value of 12 is smaller than, in particular, is significantly smaller than the resistance value of the second resistance element 13, in order to thus force the realization of different measurement ranges and increase the independence of the measurement values.

圖2示出設有用於測量跨越第一電阻元件12的電壓降的第一測量接頭對9和用於測量跨越第二電阻元件13的電壓降的第二測量接頭對16，其中來自第一測量接頭對9的第一測量接頭17和來自第二測量連接對16的第二測量接頭18對應於中間元件14。FIG. 2 shows that a first pair of measurement contacts 9 for measuring the voltage drop across the first resistance element 12 and a second pair of measurement contacts 16 for measuring the voltage drop across the second resistance element 13 are provided, which is from the first measurement The first measuring connection 17 of the connection pair 9 and the second measuring connection 18 from the second measuring connection pair 16 correspond to the intermediate element 14.

然而，如圖3所示，在此情況下同樣可能的是，設有用於測量跨越第一電阻元件12的電壓降的第一測量接頭對9以及用於測量跨越第一電阻元件12和第二電阻元件13的累積電壓降的另一測量接頭對19。However, as shown in FIG. 3, it is also possible in this case to provide a first measuring contact pair 9 for measuring the voltage drop across the first resistive element 12 and for measuring across the first resistive element 12 and the second Another measuring terminal pair 19 of the cumulative voltage drop of the resistance element 13.

可以將這個測量裝置集成在測量電路中，除了電阻器陣列8之外，這個測量電路還包括用於測量跨越第一電阻元件12而下降的第一電壓的第一電壓抽頭、用於測量至少包括跨越第二電阻元件13的電壓降的第二電壓的第二電壓抽頭以及至少一個用於測定第一電壓和第二電壓的電子器件，其中設有用於對所測得的第一電壓和所測得的第二電壓進行比較的比較器，借助這個比較器可以對測量值的可靠性進行分析。This measuring device can be integrated in a measuring circuit. In addition to the resistor array 8, this measuring circuit also includes a first voltage tap for measuring the first voltage dropped across the first resistance element 12, and for measuring at least including The second voltage tap of the second voltage across the voltage drop of the second resistance element 13 and at least one electronic device for measuring the first voltage and the second voltage are provided for comparing the measured first voltage and the measured voltage. A comparator for comparing the obtained second voltage, with the help of this comparator, the reliability of the measured value can be analyzed.

這個電子器件被設置成使得第一電壓的測量和第二電壓的測量可以彼此獨立地進行。This electronic device is arranged so that the measurement of the first voltage and the measurement of the second voltage can be performed independently of each other.

雖然本發明已以實施例揭露如上，然其並非用以限定本發明，本發明所屬技術領域中具有通常知識者，在不脫離本發明之精神和範圍內，當可作些許之更動與潤飾，因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention. Those with ordinary knowledge in the technical field of the present invention can make some changes and modifications without departing from the spirit and scope of the present invention. Therefore, the protection scope of the present invention shall be subject to those defined by the attached patent application scope.

1:第一帶材 2:第二帶材 3:第三帶材 4:第四帶材 5:第五帶材 6:第一部分複合體 7:第二部分複合體 8:電阻器陣列 9:第一測量接頭對 10:第一連接元件 11:第二連接元件 12:第一電阻元件 13:第二電阻元件 14:中間元件 15:連接構件 16:第二測量接頭對 17:第一測量接頭 18:第二測量接頭 19:另一測量接頭對1: The first strip 2: The second strip 3: The third strip 4: The fourth strip 5: The fifth strip 6: The first part of the complex 7: The second part of the complex 8: resistor array 9: The first measurement connector pair 10: The first connecting element 11: The second connecting element 12: The first resistance element 13: The second resistance element 14: Intermediate element 15: connecting member 16: The second measurement connector pair 17: The first measuring connector 18: Second measuring connector 19: Another measuring connector pair

本發明的其他優點、特徵和細節參閱請求項以及結合附圖對優選實施方式的以下說明。其中： 圖1為電阻器陣列的透視示意圖； 圖2為具有連接的第一和第二測量接頭對的對應於圖1的圖示；以及 圖3為具有連接的第一和第三測量接頭對的對應於圖1的圖示。For other advantages, features and details of the present invention, please refer to the claims and the following description of the preferred embodiments in conjunction with the accompanying drawings. in: Figure 1 is a perspective schematic diagram of a resistor array; FIG. 2 is a diagram corresponding to FIG. 1 with a pair of connected first and second measurement joints; and Fig. 3 is a diagram corresponding to Fig. 1 with a pair of connected first and third measuring joints.

1:第一帶材1: The first strip

2:第二帶材2: The second strip

3:第三帶材3: The third strip

4:第四帶材4: The fourth strip

5:第五帶材5: The fifth strip

6:第一部分複合體6: The first part of the complex

7:第二部分複合體7: The second part of the complex

8:電阻器陣列8: resistor array

10:第一連接元件10: The first connecting element

11:第二連接元件11: The second connecting element

12:第一電阻元件12: The first resistance element

13:第二電阻元件13: The second resistance element

14:中間元件14: Intermediate element

15:連接構件15: connecting member

Claims (17)

一種電阻器陣列（8），包括： 一第一連接元件（10）和一第二連接元件（11）， 與該第一連接元件（10）導電連接的一第一電阻元件（12）， 與該第二連接元件（11）導電連接的一第二電阻元件（13）， 佈置在該第一電阻元件（12）與該第二電阻元件（13）之間並且與該第一電阻元件（12）和該第二電阻元件（13）導電連接的一中間元件（14）， 其中該第一連接元件（10）、該第二連接元件（11）、該第一電阻元件（12）、該第二電阻元件（13）以及該中間元件（14）彼此並排佈置成一排， 且其中該第一連接元件（10）及該第二連接元件（11）和該中間元件（14）與該第一電阻元件（12）及該第二電阻元件（13）由不同的材料構成， 其中該第一電阻元件（12）的材料與該第二電阻元件（13）的材料有所不同。A resistor array (8), including: A first connecting element (10) and a second connecting element (11), A first resistance element (12) conductively connected to the first connection element (10), A second resistance element (13) conductively connected to the second connection element (11), An intermediate element (14) arranged between the first resistance element (12) and the second resistance element (13) and conductively connected to the first resistance element (12) and the second resistance element (13), Wherein the first connection element (10), the second connection element (11), the first resistance element (12), the second resistance element (13) and the intermediate element (14) are arranged side by side in a row, And wherein the first connection element (10), the second connection element (11), the intermediate element (14) and the first resistance element (12) and the second resistance element (13) are made of different materials, The material of the first resistance element (12) is different from the material of the second resistance element (13). 如請求項1所述之電阻器陣列（8），其中該第一連接元件（10）及該第二連接元件（11）呈板狀，該中間元件（14）呈條狀，並且與該第一連接元件（10）及該第二連接元件（11）中的每一個相比該中間元件（14）均更窄。The resistor array (8) according to claim 1, wherein the first connecting element (10) and the second connecting element (11) are in a plate shape, and the intermediate element (14) is in a strip shape, and is connected to the first Each of a connecting element (10) and the second connecting element (11) is narrower than the intermediate element (14). 如請求項1或2所述之電阻器陣列（8），其中僅該第一連接元件（10）和該第二連接元件（11）具有用於嵌入電路中的一連接構件（15）。The resistor array (8) according to claim 1 or 2, wherein only the first connection element (10) and the second connection element (11) have a connection member (15) for embedding in a circuit. 如請求項1或2所述之電阻器陣列（8），其中該第一電阻元件（12）及該第二電阻元件（13）的厚度小於該第一連接元件（10）的厚度、該第二連接元件（11）的厚度和該中間元件（14）的厚度。The resistor array (8) according to claim 1 or 2, wherein the thickness of the first resistance element (12) and the second resistance element (13) is less than the thickness of the first connecting element (10), the thickness of the The thickness of the second connecting element (11) and the thickness of the intermediate element (14). 如請求項1或2所述之電阻器陣列（8），其中該第一電阻元件（12）的厚度與該第二電阻元件（13）的厚度有所不同。The resistor array (8) according to claim 1 or 2, wherein the thickness of the first resistance element (12) is different from the thickness of the second resistance element (13). 如請求項1或2所述之電阻器陣列（8），其中設有用於測量跨越該第一電阻元件（12）的電壓降的一第一測量接頭對（9）和用於測量跨越該第二電阻元件（13）的電壓降的一第二測量接頭對（16），來自該第一測量接頭對（9）的一第一測量接頭（17）和來自該第二測量接頭對（16）的一第二測量接頭（18）對應於該中間元件（14）。The resistor array (8) according to claim 1 or 2, wherein a first measuring contact pair (9) for measuring the voltage drop across the first resistance element (12) and a pair of measuring contacts (9) for measuring across the first resistance element (12) are provided. A second measurement connector pair (16) of the voltage drop of the two resistance elements (13), a first measurement connector (17) from the first measurement connector pair (9), and a second measurement connector pair (16) from the first measurement connector pair (9) A second measuring joint (18) corresponding to the intermediate element (14). 如請求項1或2所述之電阻器陣列（8），其中設有用於測量跨越該第一電阻元件（12）的電壓降的該第一測量接頭對（9）以及用於測量跨越該第一電阻元件（12）和該第二電阻元件（13）的累積電壓降的一另一測量接頭對（19）。The resistor array (8) according to claim 1 or 2, wherein the first measuring contact pair (9) for measuring the voltage drop across the first resistance element (12) and the first measuring contact pair (9) for measuring across the first resistance element (12) are provided A resistance element (12) and another measuring contact pair (19) of the cumulative voltage drop of the second resistance element (13). 如請求項7所述之電阻器陣列（8），其中該第一電阻元件（12）和該第二電阻元件（13）中的一個的電阻值小於該第一電阻元件（12）和該第二電阻元件（13）中的另一個的電阻值。The resistor array (8) according to claim 7, wherein the resistance value of one of the first resistance element (12) and the second resistance element (13) is smaller than that of the first resistance element (12) and the first resistance element (12) and the second resistance element (13). The resistance value of the other of the two resistance elements (13). 一種測量電路，其包括根據上述請求項中任一項所述之電阻器陣列（8）、用於測量跨越該第一電阻元件（12）而下降的一第一電壓的一第一電壓抽頭、用於測量至少包括跨越該第二電阻元件（13）的電壓降的一第二電壓的一第二電壓抽頭，以及至少一個用於測定該第一電壓和該第二電壓的一電子器件。A measuring circuit, comprising a resistor array (8) according to any one of the above claims, a first voltage tap for measuring a first voltage dropped across the first resistance element (12), A second voltage tap for measuring at least a second voltage including a voltage drop across the second resistance element (13), and at least one electronic device for measuring the first voltage and the second voltage. 如請求項9所述之電阻器陣列（8），其中設有用於對所測得的該第一電壓和所測得的該第二電壓進行比較的一比較器。The resistor array (8) according to claim 9, wherein a comparator for comparing the measured first voltage with the measured second voltage is provided. 如請求項9或10所述之電阻器陣列（8），其中該電子器件被設置成使得該第一電壓的測量和該第二電壓的測量彼此獨立地進行。The resistor array (8) according to claim 9 or 10, wherein the electronic device is arranged such that the measurement of the first voltage and the measurement of the second voltage are performed independently of each other. 一種製造帶狀材料複合體的方法，其中所述之製造帶狀材料複合體的方法包括以下步驟： a) 至少提供由導電性較高的材料構成的一第一帶材（1）、一第二帶材（2）和一第三帶材（3）， b) 至少提供分別由電阻材料構成的一第四帶材（4）和一第五帶材（5），其中該第四帶材（4）的材料與該第五帶材（5）的材料有所不同， c) 對該第一帶材（1）、該第二帶材（2）、該第三帶材（3）、該第四帶材（4）和該第五帶材（5）進行縱縫焊接，從而形成該第一帶材（1）、該第二帶材（2）、該第三帶材（3）、該第四帶材（4）和該第五帶材（5）的複合體，其中由電阻材料構成的該第四帶材（4）和該第五帶材（5）分別在其兩個縱向邊緣上鄰接與由導電性較高的材料構成的該第一帶材（1）、該第二帶材（2）和該第三帶材（3）中的一個。A method of manufacturing a ribbon-shaped material composite body, wherein the method of manufacturing a ribbon-shaped material composite body includes the following steps: a) Provide at least a first strip (1), a second strip (2) and a third strip (3) composed of materials with higher conductivity, b) Provide at least a fourth strip (4) and a fifth strip (5) each made of resistive material, wherein the material of the fourth strip (4) and the material of the fifth strip (5) Different, c) Perform longitudinal slits on the first strip (1), the second strip (2), the third strip (3), the fourth strip (4) and the fifth strip (5) Welding to form a composite of the first strip (1), the second strip (2), the third strip (3), the fourth strip (4) and the fifth strip (5) Body, in which the fourth strip (4) and the fifth strip (5) made of resistive material are respectively adjacent to the first strip ( 1) One of the second strip (2) and the third strip (3). 如請求項12所述之製造帶狀材料複合體的方法，其中在該步驟c)中首先分別通過縱縫焊接形成由該第一帶材（1）和該第四帶材（4）構成的一第一部分複合體（6）以及由該第二帶材（2）和該第三帶材（3）以及佈置在該第二帶材（2）和該第三帶材（3）之間的該第五帶材（5）構成的一第二部分複合體（7），然後再通過縱縫焊接將該第一部分複合體（6）與該第二部分複合體（7）連接在一起。The method for manufacturing a strip-shaped material composite body according to claim 12, wherein in the step c), the first strip (1) and the fourth strip (4) are formed by longitudinal seam welding, respectively A first partial composite body (6) and composed of the second strip (2) and the third strip (3) and arranged between the second strip (2) and the third strip (3) The fifth strip (5) constitutes a second partial composite body (7), and then the first partial composite body (6) and the second partial composite body (7) are connected together by longitudinal seam welding. 如請求項12所述之製造帶狀材料複合體的方法，其中，在該方法步驟b)與該方法步驟c)之間將該第一帶材（1）、該第二帶材（2）、該第三帶材（3）、該第四帶材（4）和該第五帶材（5）佈置成使得該第四帶材（4）處於由導電性較高的材料構成的該第一帶材（1）和該第二帶材（2）之間，該第五帶材（5）處於由導電性較高的材料構成的該第二帶材（2）和該第三帶材（3）之間，並且由導電性較高的材料構成的該第一帶材（1）、該第二帶材（2）和該第三帶材（3）中的該第二帶材（2）處於由電阻材料構成的該第四帶材（4）和該第五帶材（5）之間。The method for manufacturing a strip-shaped material composite according to claim 12, wherein the first strip (1) and the second strip (2) are performed between step b) of the method and step c) of the method. , The third strip (3), the fourth strip (4) and the fifth strip (5) are arranged such that the fourth strip (4) is in the first Between a strip (1) and the second strip (2), the fifth strip (5) is located between the second strip (2) and the third strip made of a material with higher conductivity (3) between the first strip (1), the second strip (2), and the third strip (3) made of a material with higher conductivity, and the second strip ( 2) Located between the fourth strip (4) and the fifth strip (5) made of resistive material. 如請求項12至14中任一項所述之製造帶狀材料複合體的方法，其包括橫向於該第一帶材（1）、該第二帶材（2）、該第三帶材（3）、該第四帶材（4）和該第五帶材（5）縱向方向地分離該帶狀材料複合體以製造根據請求項1至8中任一項該的電阻器陣列（8）的步驟。The method for manufacturing a strip-shaped material composite according to any one of claims 12 to 14, which includes transverse to the first strip (1), the second strip (2), and the third strip ( 3) The fourth strip (4) and the fifth strip (5) separate the strip-shaped material composite in the longitudinal direction to manufacture the resistor array (8) according to any one of claims 1 to 8 A step of. 如請求項15所述之製造帶狀材料複合體的方法，其中，將用於將該電阻器陣列（8）連接至電路的一連接構件（15）插入一第一連接元件（10）及一第二連接元件（11）中。The method of manufacturing a strip-shaped material composite body according to claim 15, wherein a connecting member (15) for connecting the resistor array (8) to a circuit is inserted into a first connecting element (10) and a The second connecting element (11). 如請求項15所述之製造帶狀材料複合體的方法，其中，對一第一電阻元件（12）和一第二電阻元件（13）中的至少一個進行調整。The method for manufacturing a strip-shaped material composite body according to claim 15, wherein at least one of a first resistance element (12) and a second resistance element (13) is adjusted.
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