TW201947399A - USB port test system and method for dynamically testing USB port - Google Patents

Abstract

The invention provides an USB port test system connecting and testing an USB port, including: a trigger signal source sending a first signal and a second signal; a logic circuit sending a trigger signal of a specific USB type according to the combination of the logic levels of the first signal and the second signal; and a control module receiving the trigger signal and sending a test signal of an USB type represented by the trigger signal to the USB port.

Description

   USB port test system and method for dynamically testing USB port   

The invention relates to a USB port test system and a method for dynamically testing USB ports, and particularly to a USB port test system and a method for dynamically testing USB ports that can efficiently test a large number of USB ports.

Testing of motherboard products includes testing whether the specifications and speed of the USB (Universal Serial Bus) ports are up to standard. Since the motherboard's USB ports can be as many as 20 to 30, if all USB ports are tested at the same time, the maximum number of USB ports recognized by the system is 21 ports. When this number is exceeded , The system will fail to recognize the USB port.

In order to solve the problem of the above-mentioned quantity limitation, the conventional technology will test by separately plugging or unplugging or dividing the USB port into different operating systems (such as DOS and Windows). However, the former method requires sequential plug-in testing of the USB port, and the test efficiency is extremely poor. The latter method requires the increase of the number of USB test fixtures according to the different operating systems. In addition, USB ports include 3.1, 3.0, 2.0 and other types. How to efficiently test whether each type of USB port meets specifications is also a problem that needs to be improved.

In view of the above problems, an object of the present invention is to provide a USB port test system and a method for dynamically testing USB ports, which can dynamically perform type switching tests on a large number of USB ports, thereby reducing testing. The number of fixtures and improve test efficiency.

In order to solve the above problems, the present invention provides a USB port test system for connecting and testing a USB port, which includes: a trigger signal source, sending a first signal and a second signal; a logic circuit according to the first The combination of the logic level of the signal and the second signal sends a trigger signal corresponding to the specific USB type; and a control module receives the trigger signal and sends a test signal of the USB type indicated by the trigger signal to The USB port.

In the above USB port test system, the USB port test system has a plurality of the control modules for testing the plurality of USB ports. After each of the control modules receives the trigger signal, it will send the Test signal.

In the above USB port test system, the control module includes: an output port connected to the USB port; a control chip that sends the test signal according to the trigger signal; and a switch circuit according to the trigger signal , Select the path to which the test signal is to be output.

In the above USB port test system, the control module further includes: an expansion port that allows an external USB device to be connected. The trigger signal source further sends a third signal and a fourth signal, and the logic circuit sends a selection signal corresponding to a specific USB type according to a combination of the logic levels of the third signal and the fourth signal. The switch circuit selects to connect the external USB device to the output port according to the selection signal.

In the above USB port test system, when the first signal and the second signal are both at a low level, the control module sends the test signal corresponding to a first USB type, the first signal is at a high level and the first signal When the two signals are at a low level, the control module sends the test signal corresponding to a second USB type.

In the above USB port test system, the first USB type is a USB 3.1 type, and the second USB type is a USB 2.0 type. Alternatively, the first USB type is a USB 3.0 type, and the second USB type is a USB 2.0 type.

According to another aspect of the present invention, the present invention also provides a method for dynamically testing a USB port, which is applied to a USB port test system including a trigger signal source, a logic circuit, and a plurality of control modules. The method for dynamically testing a USB port includes: connecting the USB port test system to at least one USB port as a test object; using the signal source to send a low-level first signal and a second signal; and using the logic The circuit receives the first signal and the second signal, and sends a trigger signal corresponding to a first USB type; using the plurality of control modules to receive the trigger signal, and sequentially sends a first USB type Test signals to each of the USB ports; and check whether each of the USB ports meets the standard under the first USB type.

The method for dynamically testing a USB port further includes: using the signal source to send a high-level first signal and a low-level second signal; using the logic circuit to receive the first signal and the second signal, and sending A trigger signal corresponding to a second USB type; using the plurality of control modules to receive the trigger signal and sequentially sending the test signal of the second USB type to each of the USB ports; and checking each USB Whether the port complies with the standard in the second USB type.

In the above method for dynamically testing a USB port, the test signal of the first USB type is used to test whether the USB port meets the specifications and rates of the USB 3.1 and USB 3.0 types, and the test signal of the second USB type is used To test whether the USB port meets the USB 2.0 type specifications and speed.

According to the above-mentioned USB port test system and method for dynamically testing USB ports, it is possible to reduce the number of test fixtures and improve test efficiency by dynamically performing type switching tests on a large number of USB ports.

10‧‧‧Trigger signal source

20‧‧‧test fixture

21‧‧‧Terminal Block

22‧‧‧Logic Circuit

23, 23a, 23b, 23c, 23d‧‧‧ Control Module

231, 231a, 231b, 231c, 231d‧‧‧‧ output port

232, 232a, 232b, 232c, 232d‧‧‧control chip

233, 233a, 233b, 233c, 233d‧‧‧ Switch circuit

234, 234a, 234b, 234c, 234d‧‧‧Expansion ports

DUT‧‧‧Motherboard

usb, usb1, usb2, usb3, usb4‧‧‧USB ports

FIG. 1 is a schematic diagram of a USB port test system and a USB port according to the present invention.

FIG. 2 is a schematic diagram of the USB port test system of the present invention when testing a USB port.

FIG. 3 is a timing diagram of signals sent by the USB trigger signal of the present invention.

FIG. 4 is another timing diagram of signals sent by the USB trigger signal of the present invention.

FIG. 5 is a schematic diagram of the USB port test system of the present invention when an external USB device is connected to an extended function.

The following description provides many different embodiments, or examples, for implementing different features of the present disclosure. The components and arrangements described in the following specific examples are only used to express the disclosure concisely. They are only examples, and are not intended to limit the disclosure.

In addition, this specification uses the same component numbers and / or text in different examples. The foregoing use is merely for simplification and clarity, and does not mean that there must be a correlation between different embodiments and settings.

The shapes, sizes, and thicknesses in the drawings may not be drawn to scale or simplified for clarity, and are provided for illustration purposes only.

The USB port test system of the present invention will be described with reference to FIG. 1. FIG. 1 is a schematic diagram of a USB port test system and a USB port according to the present invention. In the first figure, the motherboard DUT as a test object has a plurality of USB ports usb1, usb2, usb3, and usb4 (collectively referred to as a component symbol usb). It should be noted that the number of the ports in the figure is only 4 for the sake of simplicity. The present invention can be applied to a motherboard with up to 30 ports. The USB port test system according to the present invention includes a trigger signal source 10 and a test fixture 20. The trigger signal source 10 is used to supply a signal to the test fixture 20 so that the test fixture 20 starts a test operation. The test tool 20 includes a terminal block 21, a logic circuit 22, and a plurality of control modules 23a, 23b, 23c, and 23d (collectively referred to as a component symbol 23). The number of control modules 23 will be greater than or equal to the number of USB ports usb on the motherboard DUT. During the test, each control module 23a, 23b, 23c, 23d will be connected to USB ports usb1, usb2, usb3, usb4 and each Send a test signal. It should be noted that the number of control modules in the diagram is only four for the sake of simplicity. In fact, one test fixture 20 is not limited to four control modules 23. In addition, the present invention can also borrow The total number of control modules 23 is increased by a plurality of test fixtures 20 connected in series and parallel, so that all USB ports usb can be tested in the same test operation.

The connection base 21 has a plurality of electrical contacts, and receives a plurality of signals from the trigger signal source 10 respectively, and outputs the signals to the logic circuit 22. The logic circuit 22 sends trigger signals corresponding to tests of different USB types to the control modules 23a, 23b, 23c, and 23d according to the combination of the logic levels of the signals received from the terminal block 21. The plurality of control modules 23a, 23b, 23c, and 23d sequentially send test signals to each of the USB ports usb1, usb2, usb3, and usb4 according to a trigger signal from the logic circuit 22. The DUT side of the motherboard can determine whether the specifications or speeds of the USB ports usb1, usb2, usb3, and usb4 are in compliance with the standards according to the status of each USB port usb1, usb2, usb3, usb4 receiving test signals.

Next, the detailed structure of the USB port test system of the present invention and the method for dynamically testing the USB port of the system will be further explained. FIG. 2 is a schematic diagram of the USB port test system of the present invention when testing a USB port. As shown in FIG. 2, each control module 23 includes: an output port 231, a control chip 232, a switch circuit 233, and an expansion port 234. To perform a USB test on the USB port, each output port 231a, 231b, 231c, and 231d of the test fixture 20 is connected to the USB ports usb1, usb2, usb3, and usb4 through the USB cable, and then sent by the trigger signal source 10. Signal to start testing.

In one embodiment of the present invention, the trigger signal source 10 sends at least two pulse wave signals. The combination of the high and low levels of these two signals determines the type of the USB port to be tested. Currently, there are multiple revisions of USB devices. Currently, there are three types of 2.0, 3.0, and 3.1. Because the 2.0 and 3.0 / 3.1 types use different transmission pins, they must be tested separately. The 3.0 and 3.1 types both use the same transmission pin, so you can determine whether it meets the specifications of the 3.0 type or 3.1 type according to the transmission speed during the test. In the present invention, the trigger signal source 10 sends a first signal 31OE and a second signal 20OE. When the second signal 20OE is at a high level, regardless of the level of the first signal 31OE, the test is closed. When the first signal 31OE and the second signal 20OE are both at a low level, it indicates that the USB3.0 / 3.1 type specification test is to be performed. When the first signal 31OE is at a high level, but the second signal 20OE is at a low level, it indicates that the USB2.0 type specification test is to be performed.

According to the combination of the high and low levels of the first signal 31OE and the second signal 20OE described above, in one embodiment, the trigger signal source 10 of the present invention sends a signal waveform diagram as shown in FIG. 3 during a test. As shown in FIG. 3, the first signal 31OE and the second signal 20OE sent from the trigger signal source 10 at the beginning are both at a high level, and this is the test shutdown period. Next, since the response speed of the device is inconsistent when the levels of the first signal 31OE and the second signal 20OE are actually changed, in practice, the first signal 31OE is first lowered to a low level, and at this time, it is still in the shutdown period. After a short delay time after the first signal 31OE drops to the low level, the second signal 20OE also drops from the high level to the low level, and enters the time period to start the USB3.0 / 3.1 type test. After the USB3.0 / 3.1 type test is completed, the second signal 20OE is maintained at a low level and the first signal 31OE is raised to a high level, followed by a USB2.0 type test. After the USB2.0 type test is completed, the second signal 20OE is raised to a high level, and the test of the USB port is ended.

In another embodiment of the present invention, the trigger signal source 10 may send a signal waveform diagram as shown in FIG. 4 during a test. As shown in FIG. 4, the first signal 31OE and the second signal 20OE sent from the trigger signal source 10 at the beginning are both at a high level, and this is the test shutdown period. Then, the first signal 31OE is first lowered to a low level, and after a short delay time, the second signal 20OE is lowered from a high level to a low level, and enters a time measurement period. The USB3.0 / 3.1 type test is performed at this time. After the USB3.0 / 3.1 type test is completed, both the first signal 31OE and the second signal 20OE are raised to a high level, and the test is closed. Then lower the second signal 20OE to a low level, and perform a USB2.0 type test. After the USB2.0 type test is completed, the second signal 20OE is raised to a high level, and the test of the USB port is ended. In the signal sending sequence of Figure 4, because the USB3.0 / 3.1 type test period is separated from the USB2.0 type test period, it can ensure that the USB2.0 type test will not be affected by the previous test. .

Returning to FIG. 2, when the USB test of the USB port is started, the trigger signal source 10 sends the first signal 31OE and the second signal 20OE to the terminal block 21 of the test fixture 20, and then transmits it to the logic circuit 22. The logic circuit 22 sends a USB3.1 / 3.0 type trigger signal (when a signal 31OE and a second signal 20OE are both low level) or USB2.0 according to the high-low level relationship of the first signal 31OE and the second signal 20OE. The trigger signal of the type (when a signal 31OE is at a high level and a second signal 20OE is at a low level) goes to the switch circuit 233a in the control module 23a. The switch circuit 233a selects the path to output the test signal according to the trigger signal (for the USB3.1 / 3.0 type trigger signal, select the USB3.1 / 3.0 signal pin, and for the USB2.0 type trigger signal, select USB2.0 Signal pin), and the trigger signal is transmitted to the control chip 232a and the switch circuit 233b in the next control module 23b. The control chip 232a sends the test signal of USB3.1 / 3.0 type or 2.0 type to the output port 231a through the path selected by the switch circuit 233a according to the type of the trigger signal. The output port 231a sends a test signal to the USB port usb1 for testing. In addition, after receiving the trigger signal from the switch circuit 233a, the next control module 23b will perform the same operation as the control module 23a and send out a test signal for testing the USB port usb2. By analogy, each control module 23a, 23b, 23c, 23d will send test signals in sequence (with time difference) to test the USB ports usb1, usb2, usb3, usb4.

When the operating system of the motherboard DUT runs the test program of the USB port, the type of each of the USB ports usb1, usb2, usb3, and usb4 can be determined according to the status of the USB port usb1, usb2, usb3, and usb4 receiving the test signal. , And whether it meets the rate specifications for that type.

According to the USB port test system and the method for dynamically testing a USB port of the present invention, by switching the level combination of signals sent by a trigger signal source, it is possible to dynamically switch between different USB types (USB2.0 / 3.0 / 3.1) Test. And after the signal is sent, each control module of the test fixture will sequentially send the test signal to the USB port to be tested in order to allow the operating system of the motherboard to have sufficient buffer time to identify the USB port. Avoid unrecognizable problems when all USB ports receive signals at the same time. According to the USB port test system and the method for dynamically testing a USB port according to the present invention, a large number of USB ports (20 to 30 ports) can be tested, reducing the number of test fixtures and improving test efficiency.

In another embodiment of the present invention, the USB port test system of the present invention can provide a function of connecting an external USB device to a port of a motherboard. FIG. 5 is a schematic diagram of the USB port test system of the present invention when an external USB device is connected to an extended function. As shown in Figure 5, the test fixture 20 is maintained in a connected state with each USB port of the motherboard DUT. If you want to temporarily use an external USB device 30 and a USB port (Figure 5 uses USB port usb3) For example, you can directly insert an expansion port corresponding to the USB port in the test tool 20 (the corresponding USB port usb3 in Figure 5 is the expansion port 234c) to connect with the USB port of the motherboard. There is no need to remove the connection between the test fixture 20 and the main board DUT, which simplifies the operation procedure between different operations.

In FIG. 5, when the external USB device 30 is connected to the expansion port 234 c of the test fixture 20, in order to access the external USB device 30, the USB port test system of the present invention performs the following operations. The trigger signal source 10 also sends a third signal 31SE and a fourth signal 20SE. At this time, the first signal 31OE and the second signal 20OE can be maintained at, for example, a high level, that is, a state in which the test is turned off. Similarly, according to the combination of the high and low levels of the third signal 31SE and the fourth signal 20SE, a USB type (2.0, 3.0, or 3.1) to be used for connection with the external USB device 30 can be determined. The third signal 31SE and the fourth signal 20SE are sent to the terminal block 21 to the test fixture 20 and then passed to the logic circuit 22. The logic circuit 22 sends a selection signal of the USB3.1 / 3.0 type or a selection signal of the USB2.0 type to the switch circuit 233a in the control module 23a according to the level relationship between the third signal 31SE and the fourth signal 20SE. . The switch circuit 233a selects a corresponding path according to the selection signal, connects the expansion port 234a to the output port 231a, and transmits the selection signal to the control chip 232a and the switch circuit 233b in the next control module 23b. Thereby, the USB port usb1 can access the external USB device through the expansion port 234a. However, the expansion port 234a in Figure 5 is not plugged into an external USB device, so the USB port usb1 will be in an unused state. In addition, after receiving the selection signal from the switch circuit 233a, the next control module 23b will perform the same operation as the control module 23a, and select the corresponding path according to the selection signal to connect the expansion port 234b to the output port 231b. By analogy, each expansion port 234 and the corresponding USB port usb form a data-accessible state. In FIG. 5, the external USB device 30 is inserted into the expansion port 234 c. Therefore, the USB port usb3 of the motherboard DUT can access the external USB device 30 through the test fixture 20.

According to the above embodiment, the expandability of the USB port test system can be increased, the test operation can be switched to the operation using a USB device at any time, and the complexity of switching between operations can be simplified.

The above-mentioned disclosed features can be combined, modified, replaced or transferred with one or more of the disclosed embodiments in any suitable manner, and are not limited to the specific embodiments. For example, the trigger signals or selection signals of the respective USB types corresponding to the combination of the high and low levels of the first to fourth signals are only examples, and the present invention can also arbitrarily adjust the USB types represented by the combinations of the high and low levels. Trigger or selection signal.

Although the present disclosure is disclosed in various embodiments as above, it is only an example reference and is not intended to limit the scope of this disclosure. Any person skilled in this art can make some changes without departing from the spirit and scope of this disclosure. With retouch. Therefore, the above embodiments are not intended to limit the scope of this disclosure, and the scope of protection of this disclosure shall be determined by the scope of the attached patent application.

Claims (10)

    A USB port test system for connecting and testing a USB port includes: a trigger signal source that sends a first signal and a second signal; a logic circuit according to the first signal and the logic bit of the second signal A combination of the standard and a trigger signal corresponding to a specific USB type; and a control module that receives the trigger signal and sends a test signal of the USB type indicated by the trigger signal to the USB port.         According to the USB port test system described in the first patent application scope, wherein the USB port test system has a plurality of the control modules for testing a plurality of USB ports, and each of the control modules receives the trigger After the signal, the test signal will be sent out in sequence.         The USB port test system according to item 1 or 2 of the scope of patent application, wherein the control module includes: an output port connected to the USB port; a control chip that sends the test signal according to the trigger signal And a switch circuit, according to the trigger signal, selecting a path to which the test signal is output to the output port.         According to the USB port test system described in the third item of the patent application scope, the control module further includes: an expansion port to allow an external USB device to be connected, and the trigger signal source further sends a third signal and a A fourth signal, the logic circuit sends a selection signal corresponding to a specific USB type according to the combination of the third signal and the logic level of the fourth signal, and the switch circuit selects the external USB device according to the selection signal Connect to this output port.         According to the USB port test system described in item 1 of the scope of patent application, wherein when the first signal and the second signal are both low level, the control module sends the test signal corresponding to a first USB type, and the first When a signal is at a high level and the second signal is at a low level, the control module sends the test signal corresponding to a second USB type.         The USB port test system according to item 5 of the scope of the patent application, wherein the first USB type is a USB 3.1 type and the second USB type is a USB 2.0 type.         The USB port test system according to item 5 of the scope of the patent application, wherein the first USB type is a USB 3.0 type and the second USB type is a USB 2.0 type.         A method for dynamically testing a USB port is applied to a USB port test system including a trigger signal source, a logic circuit, and a plurality of control modules. The method for dynamically testing a USB port includes: connecting the USB The port test system is connected to at least one USB port as a test object; using the signal source to send a first signal and a second signal at a low level; using the logic circuit to receive the first signal and the second signal and sending A trigger signal corresponding to a first USB type; using the plurality of control modules to receive the trigger signal, and sequentially sending a test signal of the first USB type to each of the USB ports; and checking each USB Whether the port meets the standard in the first USB type.         The method for dynamically testing a USB port according to item 8 of the scope of patent application, further comprising: using the signal source to send a first signal of a high level and a second signal of a low level; using the logic circuit to receive the first signal Signal and the second signal, and send a trigger signal corresponding to a second USB type; use the plurality of control modules to receive the trigger signal, and sequentially send the test signal of the second USB type to each of the A USB port; and checking whether each USB port complies with the standard in the second USB type.         The method for dynamically testing a USB port as described in item 9 of the scope of the patent application, wherein the first USB type test signal is used to test whether the USB port conforms to the specifications and speed of the USB 3.1 and USB 3.0 types. The test signal of the USB type is used to test whether the USB port conforms to the specifications and speed of the USB 2.0 type.