TW201935007A - Probe for high frequency test including a high elastic core, a high conductive layer and an anti-oxidation layer - Google Patents

Abstract

The present invention relates to a probe for high frequency test. The probe comprises a high elastic core, a high conductive layer and an anti-oxidation layer. The outer part of the high elastic core is surrounded and wrapped by the high conductive layer, and the outer part of the high conductive layer is surrounded and wrapped by the anti-oxidation layer, as such, the high elastic core, the high conductive layer and the anti-oxidation layer are combined to for a probe. The probe is characterized by having high elasticity and high electrical conductivity at the same time through the high elastic core and the high conductive layer. Also, the anti-oxidation layer is utilized to prevent oxidation of the high conductive layer which affects the conduction rate. The probe gains high transmission efficiency through the high elastic core, the high conductive layer and the anti-oxidation layer, and can be used for detecting a to-be-tested object required to have high frequencies.

Description

Probes for high-frequency testing

The invention relates to a probe used for high-frequency testing, in particular, the probe is capable of transmitting high elasticity and high conductivity through a highly elastic core and a high-conductivity layer, and can be prevented by an anti-oxidation layer. Oxidation of the high-conductivity layer affects the conduction rate. The probe can achieve high transmission efficiency through a highly elastic core, a high-conductivity layer, and an anti-oxidation layer.

According to the current, a circuit board is a wiring pattern composed of a plurality of wirings, which must transmit correct electronic signals to electronic components such as ICs, semiconductors, or resistors mounted on the circuit board. In the past, semiconductors or electronics were not installed. Components such as printed circuit boards, flexible substrates, multilayer wiring substrates, circuit wiring substrates used to form wiring patterns used in liquid crystal panels (LCD panels) or plasma display panels, or semiconductor substrates. The formed wiring pattern is used as a detection object, and the resistance value between a plurality of detection points provided on the wiring pattern is detected to determine whether the electrical characteristics are good or not.

In addition, in order to detect whether the wiring pattern on the circuit board is completed as designed, a detection device that is actually applied to various circuit boards is proposed. The general detection device uses a plurality of pogo pins to communicate with the object under test. A plurality of detection points are electrically contacted for the purpose of detecting electrical characteristics. However, the current fifth generation mobile communication system ( The era of 5th generation wireless systems (5G for short) is coming. The communication band defined by 5G is at least 28GHz, and its 5G communication band is more than 10 times the 4G maximum communication band (2.6GHz). Therefore, all industries are moving towards 5G. Product design and manufacturing based on the defined communication frequency band.

However, because the 5G frequency band is significantly more than the 4G frequency band, when multiple pogo pin detection is applied to a 5G test object, it must press down more force to generate more deformation to detect the electrical characteristics of the 5G frequency band. In the detection operation, the multiple spring needles frequently touch the multiple detection points on the object to be tested, and because the amount of downforce is increased, scratches or indentations may occur on the spring needles or detection points, and These scratches or indentations will affect the electrical conductivity of the pogo pin, affect the quality of telecommunication transmission, and increase the amount of downforce, it may also damage the pogo pin or detection point, resulting in a problem that the service life of the product is reduced.

Therefore, how to solve the above-mentioned shortcomings and inconveniences is the direction that the relevant industry players in this industry are eager to study and improve.

Therefore, the inventor, in view of the above-mentioned shortcomings, collected relevant information, evaluated and considered from various parties, and based on years of experience accumulated in this industry, and continued to make trials and modifications, he began to design such probes for high-frequency testing. Inventor.

The main purpose of the present invention is that the outer portion of the highly elastic core of the probe is surrounded by a high-conductivity layer, and the outer portion of the high-conductivity layer is surrounded by an anti-oxidation layer. The conductive layer and the anti-oxidation layer are combined to form a probe. The probe can pass through the highly elastic core and the high-conducting layer to have the characteristics of high elasticity and high conductivity at the same time, and the anti-oxidation layer can be used to prevent the high-conducting layer. Oxidation affects the conduction rate, so that this probe has high transmission efficiency The efficacy of the device can be used to detect the test object that needs to meet the high frequency.

The secondary purpose of the present invention is that the highly elastic core of the probe can reduce the occurrence of scratches and damages due to compression of the highly elastic core or the metal contacts on the object to be tested, so as to avoid affecting the high elasticity. The electrical conductivity between the core and the metal contacts further improves the service life of the highly elastic core.

Another object of the present invention is that the probe can be covered with an insulating layer on the outside of the anti-oxidation layer. The insulating layer can be used to prevent multiple probes from contacting each other during the detection operation. In the case of a short circuit, the plurality of probes are prevented from being damaged or destroyed, thereby achieving the purpose of improving the stability of the detection operation.

1‧‧‧ Probe

11‧‧‧High elastic core

12‧‧‧High conduction layer

13‧‧‧anti-oxidation layer

14‧‧‧ Insulation

The first figure is a sectional view of the present invention.

The second figure is a side sectional view of the present invention.

In order to achieve the above-mentioned objects and effects, the technical means and structure adopted by the present invention, the following is a detailed description of the features and functions of the preferred embodiment of the present invention.

Please refer to the first and second figures, which are the front sectional view and the side sectional view of the present invention. It can be clearly seen from the figure that the probe 1 of the present invention is used in high-frequency test operations and includes The elastic core 11, the high-conductivity layer 12, and the anti-oxidation layer 13, among which the material of the high-elastic core 11 may be tungsten steel or thorium tungsten and other highly elastic materials, and preferably tungsten steel. The tungsten steel is not only It has high elasticity and high abrasion resistance. To achieve the effect of long-term use.

The high-conductivity layer 12 is wrapped around the outside of the highly-elastic core 11. The material of the highly-elastic core 11 may be made of a highly conductive material such as silver, copper, or gold, and is preferably made of silver. For best electrical conductivity.

The anti-oxidation layer 13 is wrapped around the high-conductivity layer 12. The anti-oxidation layer 13 can prevent the high-conductivity layer 12 from oxidizing. The material of the anti-oxidation layer 13 is preferably gold. Anti-oxidation and high conductivity, and the probe 1 can be combined to form a coaxial probe 1 through a highly elastic wire core 11, a high-conductivity layer 12, and an anti-oxidation layer 13.

The outside of the anti-oxidation layer 13 of the above-mentioned probe 1 is surrounded by an insulating layer 14, and the insulating layer 14 may be a fluororesin, polyurethane, polyester fiber, or polyimide. Or an insulating material such as polytetrafluoroethene, and polytetrafluoroethylene is preferred.

In practice, the present invention is applicable to a probe holder (not shown in the figure) of a 5th generation wireless systems (5G) detection device for detection and application to a 5th generation mobile system. Whether the electrical characteristics of the electronic parts and equipment on the communication system waiting to be measured (not shown) meet the high-frequency requirements of the fifth generation mobile communication system, a plurality of probes can be inserted into the probe holder of the detection device 1 When the probe holder performs a detection operation and the plurality of probes 1 contact the plurality of metal contacts on the object to be measured, it is because each probe 1 is composed of a highly elastic wire core 11, a high-conductivity layer 12 and a resistance The oxide layer 13 is compounded, and the high elasticity characteristic of the highly elastic core 11 can be used to increase the bonding between the probe 1 and the metal contact, thereby improving the conduction efficiency and the bonding stability. The characteristics can also reduce the occurrence of scratches and damages to the highly elastic core 11 or the metal contacts on the object under test due to pressure, and because the highly elastic core 11 is covered with a high-conductivity layer 12 on the outside, it can be used. The high-conductivity layer 12 enables the conduction rate to meet the high-frequency requirements of the fifth-generation mobile communication system, and then the plurality of probes 1 can be used to reliably complete the operation of detecting the object to be tested applied to the fifth-generation mobile communication system.

The outside of the anti-oxidation layer 13 of the above-mentioned probe 1 can be surrounded by an insulating layer 14 so that the insulating layer 14 can be used to prevent the multiple probes 1 from contacting each other during the detection operation. In the case of a short circuit, and if the insulating layer 14 is made of polytetrafluoroethylene, it can further have the function of blocking electromagnetic signals through the insulating layer 14 made of polytetrafluoroethylene to effectively prevent the plurality of probes 1 in Electromagnetic waves, static electricity, or noise generated during high-frequency transmission to prevent mutual interference between multiple components, thereby ensuring the stability and reliability of the overall signal transmission, and thus achieving the effects of stable use and non-destructibility .

The invention has the following advantages:

(1) The probe 1 is composed of a highly elastic core 11, a high-conductivity layer 12, and an anti-oxidation layer 13, and can pass through the high-elastic core 11 and the high-conductivity layer 12 to have characteristics of high elasticity and high conductivity at the same time. In addition, the anti-oxidation layer 13 can be used to prevent the high-conductivity layer 12 from oxidizing and affecting the conduction rate, so that the probe 1 can have high transmission efficiency through the high-elastic core 11, the high-conductivity layer 12, and the anti-oxidation layer 13. The efficacy of the device can be used to detect the test object that needs to meet the high frequency.

(2) The high-elasticity wire core 11 of the probe 1 is capable of utilizing high-elasticity To reduce the occurrence of scratches and damages to the metal contacts on the high-elastic core 11 or the object under test due to pressure, so as to avoid affecting the electrical conductivity between the high-elastic core 11 and the metal contacts, thereby achieving a high level of improvement. The useful life of the elastic core 11.

(3) The probe 1 can be covered with an insulating layer 14 to prevent a plurality of probes 1 from being short-circuited due to contact with each other when a plurality of probes 1 are performing a detection operation, so as to avoid a plurality of probes 1 1 Damaged and destroyed, thereby achieving the effect of improving the stability of the inspection operation.

The above detailed description is only a description of a preferred feasible embodiment of the present invention, but this embodiment is not intended to limit the scope of patent application of the present invention, and any other equivalent changes and modifications made without departing from the spirit of the technology disclosed by the present invention Changes should be included in the scope of patents covered by the present invention.

In summary, the above-mentioned probes for high-frequency testing are practically applied and implemented in order to achieve their efficacy and purpose. Therefore, the present invention is a research and development with excellent practicality, in order to comply with the application for invention patents In order to protect the inventor's hard research and development and creation, I hope that the trial committee will grant the case as soon as possible. If there is any suspicion in the jury of the Bureau, please follow the instructions of the letter, and the inventor will cooperate as hard as possible.

Claims (7)

A probe for high-frequency testing. The probe comprises a high-elastic core, a high-conductivity layer, and an anti-oxidation layer. The high-elastic core is surrounded by a high-conductivity layer and is surrounded by the high-conductivity layer. The outer surround is covered with an antioxidant layer. The probe used for high-frequency testing according to item 1 of the scope of patent application, wherein the material of the highly elastic wire core of the probe is tungsten steel. The probe used for high-frequency test as described in the first scope of the patent application, wherein the material of the high-conductivity layer of the probe is silver. The probe used for high-frequency testing as described in the first item of the patent application scope, wherein the material of the high-conductivity layer of the probe is copper. The probe used for high-frequency testing as described in the first item of the patent application scope, wherein the material of the anti-oxidation layer of the probe is gold. The probe used for high-frequency testing as described in the first item of the scope of the patent application, wherein the outer surface of the anti-oxidation layer of the probe is covered with an insulating layer. The probe used for high-frequency testing as described in item 6 of the scope of patent application, wherein the material of the insulating layer of the probe is polytetrafluoroethylene.