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TW201920414A - Resin composition - Google Patents

Resin composition Download PDF

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Publication number
TW201920414A
TW201920414A TW107130793A TW107130793A TW201920414A TW 201920414 A TW201920414 A TW 201920414A TW 107130793 A TW107130793 A TW 107130793A TW 107130793 A TW107130793 A TW 107130793A TW 201920414 A TW201920414 A TW 201920414A
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Taiwan
Prior art keywords
resin composition
resin
mass
layer
epoxy resin
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TW107130793A
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Chinese (zh)
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TWI857938B (en
Inventor
川合賢司
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日商味之素股份有限公司
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0313Organic insulating material
    • H05K1/0353Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement
    • H05K1/0373Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement containing additives, e.g. fillers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/38Layered products comprising a layer of synthetic resin comprising epoxy resins
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/01Use of inorganic substances as compounding ingredients characterized by their specific function
    • C08K3/013Fillers, pigments or reinforcing additives
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K5/00Use of organic ingredients
    • C08K5/04Oxygen-containing compounds
    • C08K5/10Esters; Ether-esters
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K5/00Use of organic ingredients
    • C08K5/16Nitrogen-containing compounds
    • C08K5/34Heterocyclic compounds having nitrogen in the ring
    • C08K5/35Heterocyclic compounds having nitrogen in the ring having also oxygen in the ring
    • C08K5/357Six-membered rings
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L63/00Compositions of epoxy resins; Compositions of derivatives of epoxy resins
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0313Organic insulating material
    • H05K1/032Organic insulating material consisting of one material
    • H05K1/0326Organic insulating material consisting of one material containing O
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K2201/00Specific properties of additives
    • C08K2201/002Physical properties
    • C08K2201/005Additives being defined by their particle size in general
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L2203/00Applications
    • C08L2203/20Applications use in electrical or conductive gadgets
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L2205/00Polymer mixtures characterised by other features
    • C08L2205/02Polymer mixtures characterised by other features containing two or more polymers of the same C08L -group
    • C08L2205/025Polymer mixtures characterised by other features containing two or more polymers of the same C08L -group containing two or more polymers of the same hierarchy C08L, and differing only in parameters such as density, comonomer content, molecular weight, structure
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L2205/00Polymer mixtures characterised by other features
    • C08L2205/03Polymer mixtures characterised by other features containing three or more polymers in a blend
    • C08L2205/035Polymer mixtures characterised by other features containing three or more polymers in a blend containing four or more polymers in a blend

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  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Laminated Bodies (AREA)
  • Epoxy Resins (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)

Abstract

This invention provides a resin composition capable of obtaining a cured product capable of maintaining well-balanced adhesion with a conductor layer after an environmental test performed under a high temperature and high humidity environment even if a large amount of inorganic filler is used. A resin composition comprises an epoxy resin (A), a benzoxazine compound (B), and an inorganic filler (C), wherein the (B) component is represented by the following general formula (B-1): the content of the component (C) is 67% by mass or more when the nonvolatile component in the resin composition is 100% by mass. In formula (B-1), R1 represents an n-valent group containing an oxygen atom, and R2 each independently represents a halogen atom, an alkyl group, or an aryl group. n represents an integer of 2 to 4, and m represents an integer of 0 to 4.

Description

樹脂組成物Resin composition

本發明係關於一種樹脂組成物。進一步關於使用該樹脂組成物所得之樹脂薄片、印刷電路板及半導體裝置。The present invention relates to a resin composition. The present invention further relates to a resin sheet, a printed circuit board, and a semiconductor device obtained by using the resin composition.

作為印刷電路板的製造技術,已知記由交互重疊絕緣層與導體層的累積方式之製造方法。對於藉由累積方式的製造方法,一般絕緣層係由硬化樹脂組成物而形成。As a manufacturing technique of a printed circuit board, a manufacturing method in which an accumulation method in which an insulating layer and a conductor layer are alternately overlapped is known. In the manufacturing method by the accumulation method, the insulating layer is generally formed by curing a resin composition.

例如專利文獻1中揭示含有苯並噁嗪50~99質量%及參酚甲烷50~1質量%之熱硬化性樹脂組成物。又,專利文獻2中揭示含有多官能環氧化合物(A)、活性酯化合物(B)、苯並噁嗪化合物(C)及填充劑(D)所成,前述活性酯化合物(B)的活性酯基與前述苯並噁嗪化合物(C)的酚性羥基之比率算成酚性羥基/活性酯基之當量比時為0.3~0.9之硬化性樹脂組成物。
[先前技術文獻]
[專利文獻]
For example, Patent Document 1 discloses a thermosetting resin composition containing 50 to 99% by mass of benzoxazine and 50 to 1% by mass of phenolox methane. In addition, Patent Document 2 discloses that the active ester compound (B) contains a polyfunctional epoxy compound (A), an active ester compound (B), a benzoxazine compound (C), and a filler (D). The ratio of the ester group to the phenolic hydroxyl group of the benzoxazine compound (C) is calculated as a curable resin composition having a phenolic hydroxyl group / active ester group equivalent ratio of 0.3 to 0.9.
[Prior technical literature]
[Patent Literature]

[專利文獻1]特開2012-171968號公報
[專利文獻2]特開2014-148562號公報
[Patent Document 1] JP 2012-171968
[Patent Document 2] JP 2014-148562

[發明所解決的問題][Problems Solved by the Invention]

一般而言,對於大量添加無機填充材的樹脂組成物而言,已知有著導體層之密著性會降低的傾向。本發明者們,進一步進行檢討結果,發現在添加更多無機填充材的樹脂組成物中,即使在高溫高濕環境下的環境試驗(HAST試驗)後,亦會降低與導體層之間的密著性,經過長期的密著性維持變的困難。特別對於印刷電路板,因導體層與絕緣層之熱膨張率的不符合之解消,有時會添加更多無機填充材,此在維持環境試驗後之密著性上為重要。Generally, it is known that the resin composition to which a large amount of an inorganic filler is added tends to reduce the adhesiveness of a conductive layer. The present inventors further conducted a review and found that the resin composition containing more inorganic fillers would reduce the density of the conductive layer even after an environmental test (HAST test) under a high temperature and high humidity environment. Adhesion is difficult to maintain over a long period of time. Especially for printed circuit boards, due to the elimination of the non-conformity between the thermal expansion coefficients of the conductor layer and the insulating layer, more inorganic fillers are sometimes added, which is important in maintaining the adhesion after environmental tests.

本發明之課題為提供即使使用大量無機填充材,在高溫高濕環境下的環境試驗後,可得到可達到維持與導體層之間的密著性的平衡之硬化物的樹脂組成物;含有該樹脂組成物的樹脂薄片;具備使用該樹脂組成物所形成的絕緣層之印刷電路板及半導體裝置。

[解決課題的手段]
An object of the present invention is to provide a resin composition that can obtain a hardened product capable of maintaining a balance of adhesion with a conductor layer after an environmental test under a high temperature and high humidity environment, even if a large amount of inorganic filler is used; A resin sheet of a resin composition; a printed circuit board and a semiconductor device including an insulating layer formed using the resin composition.

[Means for solving problems]

為了解決本發明之課題,本發明者們進行詳細檢討結果,發現即使使用大量無機填充材,藉由於樹脂組成物中含有特定苯並噁嗪化合物,即使在環境試驗後,亦可維持導體層與絕緣層之間的密著性。又,發現除上述密著性以外,亦具有優良的污跡除去性,而完成本發明。In order to solve the problem of the present invention, the present inventors conducted a detailed review and found that even if a large amount of inorganic filler is used, the resin composition contains a specific benzoxazine compound, and the conductor layer and the conductive layer can be maintained even after an environmental test. Adhesion between insulation layers. In addition, they found that in addition to the above-mentioned adhesion, they also have excellent stain removal properties, and completed the present invention.

即,本發明含有以下內容。
[1]一種樹脂組成物,其為含有(A)環氧樹脂、(B)苯並噁嗪化合物及(C)無機填充劑的樹脂組成物,
(B)成分以下述一般式(B-1)表示,
(C)成分的含有量係將樹脂組成物中之不揮發成分作為100質量%時,其為67質量%以上;

式(B-1)中、R1 表示含有氧原子的n價基,R2 各獨立表示鹵素原子、烷基或芳基。n表示2~4的整數,m表示0~4的整數。
[2]如[1]所記載的樹脂組成物,其中(B)成分的含有量係將樹脂組成物中之不揮發成分作為100質量%時,其為0.1質量%以上10質量%以下。
[3]如[1]或[2]所記載的樹脂組成物,其中進一步含有(D)活性酯化合物。
[4]如[3]所記載的樹脂組成物,其中(D)成分的含有量係將樹脂組成物中之不揮發成分作為100質量%時,其為5質量%以上。
[5]如[1]~[4]中任一所記載的樹脂組成物,其中(C)無機填充材之平均粒徑為0.5μm以上。
[6]如[1]~[5]中任一所記載的樹脂組成物,其中一般式(B-1)中,R1 為由氧原子與伸芳基的組合所成的n價基。
[7]如[1]~[6]中任一所記載的樹脂組成物,其中一般式(B-1)中,m表示0。
[8]如[1]~[7]中任一所記載的樹脂組成物,其為使用於印刷電路板之絕緣層形成上。
[9]如[1]~[8]中任一所記載的樹脂組成物,其為使用於印刷電路板的層間絕緣層形成上。
[10]一種樹脂薄片,其為含有支持體與設置於該支持體上的如[1]~[9]中任一所記載的樹脂組成物所形成的樹脂組成物層。
[11]如[10]所記載的樹脂薄片,其中樹脂組成物層的厚度為25μm以下。
[12]一種印刷電路板,其為含有第1導體層、第2導體層及於第1導體層與第2導體層之間所形成的絕緣層者,該絕緣層為如[1]~[9]中任一所記載的樹脂組成物之硬化物。
[13]一種半導體裝置,其為含有[12]所記載的印刷電路板。

[發明之效果]
That is, the present invention includes the following.
[1] A resin composition, which is a resin composition containing (A) an epoxy resin, (B) a benzoxazine compound, and (C) an inorganic filler,
(B) The component is represented by the following general formula (B-1),
(C) The content of the component is 67% by mass or more when the nonvolatile content in the resin composition is 100% by mass;

In the formula (B-1), R 1 represents an n-valent group containing an oxygen atom, and R 2 each independently represents a halogen atom, an alkyl group, or an aryl group. n represents an integer from 2 to 4, and m represents an integer from 0 to 4.
[2] The resin composition according to [1], wherein when the content of the component (B) is 100% by mass of a nonvolatile component in the resin composition, the content is 0.1% by mass or more and 10% by mass or less.
[3] The resin composition according to [1] or [2], further comprising (D) an active ester compound.
[4] The resin composition according to [3], wherein the content of the component (D) is 5 mass% or more when the content of the non-volatile component in the resin composition is 100 mass%.
[5] The resin composition according to any one of [1] to [4], wherein the average particle diameter of the (C) inorganic filler is 0.5 μm or more.
[6] The resin composition according to any one of [1] to [5], wherein in the general formula (B-1), R 1 is an n-valent group formed by a combination of an oxygen atom and an arylene group.
[7] The resin composition according to any one of [1] to [6], wherein m represents 0 in the general formula (B-1).
[8] The resin composition according to any one of [1] to [7], which is used for forming an insulating layer of a printed circuit board.
[9] The resin composition according to any one of [1] to [8], which is used for forming an interlayer insulating layer of a printed circuit board.
[10] A resin sheet comprising a support and a resin composition layer formed of the resin composition according to any one of [1] to [9] provided on the support.
[11] The resin sheet according to [10], wherein the thickness of the resin composition layer is 25 μm or less.
[12] A printed circuit board comprising a first conductor layer, a second conductor layer, and an insulation layer formed between the first conductor layer and the second conductor layer, and the insulation layer is as described in [1] ~ [ 9] A cured product of the resin composition according to any one of the above.
[13] A semiconductor device comprising the printed circuit board according to [12].

[Effect of the invention]

依據本發明可提供一種樹脂組成物,其為即使使用大量無機填充材,在高溫高濕環境下的環境試驗後,亦可得到可達到維持與導體層之間的密著性之平衡的硬化物之樹脂組成物;含有該樹脂組成物的樹脂薄片;具備使用該樹脂組成物所形成的絕緣層之印刷電路板及半導體裝置。According to the present invention, it is possible to provide a resin composition that is a hardened material that can achieve a balance of maintaining the adhesion with the conductor layer after an environmental test under a high temperature and high humidity environment even if a large amount of inorganic filler is used. A resin composition; a resin sheet containing the resin composition; a printed circuit board and a semiconductor device including an insulating layer formed using the resin composition;

[實施發明的型態][Form of Implementing Invention]

以下對於本發明之樹脂組成物、樹脂薄片、印刷電路板及半導體裝置做詳細說明。The resin composition, resin sheet, printed circuit board, and semiconductor device of the present invention will be described in detail below.

[樹脂組成物]
本發明之樹脂組成物係為含有(A)環氧樹脂、(B)苯並噁嗪化合物及(C)無機填充劑的樹脂組成物,(B)成分以下述一般式(B-1)表示,(C)成分的含有量係將樹脂組成物中之不揮發成分作為100質量%時67質量%以上。

式(B-1)中,R1 表示含有氧原子的n價基,R2 各獨立表示鹵素原子、烷基或芳基。n表示2~4的整數,m表示0~4的整數。
[Resin composition]
The resin composition of the present invention is a resin composition containing (A) an epoxy resin, (B) a benzoxazine compound, and (C) an inorganic filler, and the (B) component is represented by the following general formula (B-1) The content of the component (C) is 67% by mass or more when the nonvolatile component in the resin composition is 100% by mass.

In the formula (B-1), R 1 represents an n-valent group containing an oxygen atom, and R 2 each independently represents a halogen atom, an alkyl group, or an aryl group. n represents an integer from 2 to 4, and m represents an integer from 0 to 4.

在本發明中,將樹脂組成物中之不揮發成分作為100質量%時,即使使用67質量%以上的大量之無機填充材,藉由含有特定苯並噁嗪化合物,即使在高溫高濕環境下的環境試驗後,可得到維持與導體層之間的密著性,且具有優良的污跡除去性之硬化物。通常即使在如此高溫高濕環境下的環境試驗後,可維持高密著性之硬化物,其經過長期間亦可發揮高密著性。In the present invention, when the non-volatile content in the resin composition is 100% by mass, even if a large amount of inorganic fillers of 67% by mass or more are used, the specific benzoxazine compound is contained, even in a high-temperature and high-humidity environment. After the environmental test, a hardened material with excellent adhesion to the conductor layer and excellent stain removal properties can be obtained. Normally, even after an environmental test under such a high temperature and high humidity environment, a hardened material that can maintain high adhesion can exhibit high adhesion over a long period of time.

自過去已知(B)苯並噁嗪化合物可作為環氧樹脂的硬化劑之功能。然而,本發明者們發現即使使用大量無機填充劑,藉由含有特定苯並噁嗪化合物,在高溫高濕環境下的環境試驗後亦可維持導體層與絕緣層之間的密著性。又,發現除前述密著性亦具有優良的污跡除去性。藉由含有特定苯並噁嗪化合物,即使使用大量無機填充材,在高溫高濕環境下的環境試驗後亦可維持高密著性,且對於具有優良污跡除去性之技術構思,依據本發明者們所知,在過去完全未被提出。It has been known from the past that (B) benzoxazine compounds can function as hardeners for epoxy resins. However, the present inventors have found that even if a large amount of inorganic filler is used, the adhesion between the conductor layer and the insulating layer can be maintained after an environmental test in a high temperature and high humidity environment by containing a specific benzoxazine compound. In addition, it was found that in addition to the above-mentioned adhesion, it has excellent stain removal properties. By containing a specific benzoxazine compound, even if a large number of inorganic fillers are used, high adhesion can be maintained after an environmental test under a high temperature and high humidity environment, and the technical concept of excellent stain removal properties is based on the inventors As we know, it has not been proposed at all in the past.

樹脂組成物中除(A)~(C)成分以外,可視需要含有(D)活性酯化合物、(E)硬化劑、(F)硬化促進劑、(G)熱塑性樹脂及(H)任意的添加劑。以下詳細說明含於本發明之樹脂組成物的各成分。In addition to the components (A) to (C), the resin composition may contain (D) an active ester compound, (E) a hardener, (F) a hardening accelerator, (G) a thermoplastic resin, and (H) any additives as necessary. . Hereinafter, each component contained in the resin composition of this invention is demonstrated in detail.

<(A)環氧樹脂>
樹脂組成物為含有(A)環氧樹脂。作為(A)環氧樹脂,例如可舉出雙二甲酚型環氧樹脂、雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚S型環氧樹脂、雙酚AF型環氧樹脂、二環戊二烯型環氧樹脂、參酚型環氧樹脂、萘酚酚醛清漆型環氧樹脂、酚酚醛清漆型環氧樹脂、tert-丁基-鄰苯二酚型環氧樹脂、萘型環氧樹脂、萘酚型環氧樹脂、蒽型環氧樹脂、縮水甘油基胺型環氧樹脂、縮水甘油基酯型環氧樹脂、甲酚酚醛清漆型環氧樹脂、聯苯基型環氧樹脂、線狀脂肪族環氧樹脂、具有丁二烯結構的環氧樹脂、脂環式環氧樹脂、雜環式環氧樹脂、含有螺環的環氧樹脂、環己烷型環氧樹脂、環己烷二甲醇型環氧樹脂、亞萘基醚型環氧樹脂、三羥甲基型環氧樹脂、四苯基乙烷型環氧樹脂等。環氧樹脂可單獨使用1種,亦可組合2種以上後使用。
< (A) Epoxy resin >
The resin composition contains (A) an epoxy resin. Examples of the (A) epoxy resin include a biscresol epoxy resin, a bisphenol A epoxy resin, a bisphenol F epoxy resin, a bisphenol S epoxy resin, and a bisphenol AF ring. Epoxy resin, dicyclopentadiene epoxy resin, phenol novolac epoxy resin, naphthol novolac epoxy resin, phenol novolac epoxy resin, tert-butyl-catechol epoxy resin , Naphthalene epoxy resin, naphthol epoxy resin, anthracene epoxy resin, glycidylamine epoxy resin, glycidyl ester epoxy resin, cresol novolac epoxy resin, biphenyl Epoxy resin, linear aliphatic epoxy resin, epoxy resin with butadiene structure, alicyclic epoxy resin, heterocyclic epoxy resin, epoxy resin containing spiro ring, cyclohexane ring Oxygen resin, cyclohexanedimethanol type epoxy resin, naphthylene ether type epoxy resin, trimethylol type epoxy resin, tetraphenylethane type epoxy resin and the like. The epoxy resin may be used singly or in combination of two or more kinds.

(A)環氧樹脂由在高溫高濕環境下的環境試驗後亦可得到維持高密著性的硬化物之觀點,以芳香族系的環氧樹脂為佳,使用雙酚A型環氧樹脂、雙酚F型環氧樹脂及萘酚型環氧樹脂的任一者為佳。(A) Epoxy resins are based on the viewpoint that a hardened product that maintains high adhesion can be obtained even after an environmental test under a high temperature and high humidity environment. An aromatic epoxy resin is preferred. A bisphenol A type epoxy resin, Either a bisphenol F-type epoxy resin or a naphthol-type epoxy resin is preferred.

(A)環氧樹脂以於1分子中具有2個以上環氧基者為佳。將環氧樹脂的不揮發成分作為100質量%之情況下,至少50質量%以上為於1分子中具有2個以上環氧基的環氧樹脂者為佳。其中,樹脂組成物以組合在溫度20℃為液狀的環氧樹脂(以下亦稱為「液狀環氧樹脂」)與在溫度20℃為固體狀的環氧樹脂(亦稱為「固體狀環氧樹脂」)下含有者為佳。作為液狀環氧樹脂,以於1分子中具有2個以上環氧基的液狀環氧樹脂者為佳,以於1分子中具有2個以上環氧基的芳香族系液狀環氧樹脂者為較佳。作為固體狀環氧樹脂,以於1分子中具有3個以上環氧基的固體狀環氧樹脂者為佳,以於1分子中具有3個以上環氧基的芳香族系固體狀環氧樹脂者為較佳。對於本發明,所謂芳香族系環氧樹脂表示於該分子內具有芳香環之環氧樹脂。(A) The epoxy resin is preferably one having two or more epoxy groups in one molecule. When the non-volatile content of the epoxy resin is 100% by mass, at least 50% by mass or more is preferably an epoxy resin having two or more epoxy groups in one molecule. Among them, the resin composition is a combination of a liquid epoxy resin (hereinafter also referred to as a "liquid epoxy resin") at a temperature of 20 ° C and a solid epoxy resin (also referred to as a "solid state" at a temperature of 20 ° C). Epoxy resin ") is preferred. The liquid epoxy resin is preferably a liquid epoxy resin having two or more epoxy groups in one molecule, and an aromatic liquid epoxy resin having two or more epoxy groups in one molecule. Which is better. The solid epoxy resin is preferably a solid epoxy resin having three or more epoxy groups in one molecule, and an aromatic solid epoxy resin having three or more epoxy groups in one molecule. Which is better. In the present invention, the term “aromatic epoxy resin” means an epoxy resin having an aromatic ring in the molecule.

作為液狀環氧樹脂,以雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚AF型環氧樹脂、萘型環氧樹脂、縮水甘油基酯型環氧樹脂、縮水甘油基胺型環氧樹脂、酚酚醛清漆型環氧樹脂、具有酯骨架的脂環式環氧樹脂、環己烷型環氧樹脂、環己烷二甲醇型環氧樹脂、縮水甘油基胺型環氧樹脂及具有丁二烯結構的環氧樹脂為佳,以雙酚A型環氧樹脂、雙酚F型環氧樹脂為較佳。作為液狀環氧樹脂的具體例子,可舉出DIC公司製的「HP4032」、「HP4032D」、「HP4032SS」(萘型環氧樹脂)、三菱化學公司製的「828US」、「jER828EL」、「825」、「EPICOAT828EL」(雙酚A型環氧樹脂)、「jER807」、「1750」(雙酚F型環氧樹脂)、「jER152」(酚酚醛清漆型環氧樹脂)、「630」、「630LSD」(縮水甘油基胺型環氧樹脂)、新日鐵住金化學公司製的「ZX1059」(雙酚A型環氧樹脂與雙酚F型環氧樹脂之混合品)、Nagase Chemtex公司製的「EX-721」(縮水甘油基酯型環氧樹脂)、Daicel Chemical Industries, Ltd.製的「CELLOXIDE2021P」(具有酯骨架之脂環式環氧樹脂)、「PB-3600」(具有丁二烯結構之環氧樹脂)、新日鐵住金化學公司製的「ZX1658」、「ZX1658GS」(液狀1,4-縮水甘油基環己烷型環氧樹脂)、三菱化學公司製的「630LSD」(縮水甘油基胺型環氧樹脂)等可舉出。這些可單獨使用1種,亦可組合2種以上後使用。As the liquid epoxy resin, there are bisphenol A type epoxy resin, bisphenol F type epoxy resin, bisphenol AF type epoxy resin, naphthalene type epoxy resin, glycidyl ester type epoxy resin, and glycidyl group. Amine type epoxy resin, phenol novolac type epoxy resin, alicyclic epoxy resin with ester skeleton, cyclohexane type epoxy resin, cyclohexanedimethanol type epoxy resin, glycidylamine type epoxy resin A resin and an epoxy resin having a butadiene structure are preferable, and a bisphenol A type epoxy resin and a bisphenol F type epoxy resin are more preferable. Specific examples of the liquid epoxy resin include "HP4032", "HP4032D", "HP4032SS" (naphthalene-type epoxy resin) manufactured by DIC, "828US", "jER828EL", " 825 "," EPICOAT828EL "(bisphenol A type epoxy resin)," jER807 "," 1750 "(bisphenol F type epoxy resin)," jER152 "(phenol novolac type epoxy resin)," 630 ", "630LSD" (glycidylamine type epoxy resin), "Nippon Steel & Sumitomo Chemical Co., Ltd." "ZX1059" (mixture of bisphenol A type epoxy resin and bisphenol F type epoxy resin), Nagase Chemtex company "EX-721" (glycidyl ester type epoxy resin), "CELLOXIDE2021P" (alicyclic epoxy resin with ester skeleton) manufactured by Daicel Chemical Industries, Ltd., "PB-3600" (with succinic acid) Epoxy resin with olefin structure), "ZX1658", "ZX1658GS" (liquid 1,4-glycidyl cyclohexane type epoxy resin) manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd., and "630LSD" manufactured by Mitsubishi Chemical Corporation (Glycidylamine type epoxy resin) and the like are mentioned. These may be used individually by 1 type, and may be used in combination of 2 or more type.

作為固體狀環氧樹脂,以雙二甲酚型環氧樹脂、萘型環氧樹脂、萘型4官能環氧樹脂、甲酚酚醛清漆型環氧樹脂、二環戊二烯型環氧樹脂、參酚型環氧樹脂、萘酚型環氧樹脂、聯苯基型環氧樹脂、亞萘基醚型環氧樹脂、蒽型環氧樹脂、雙酚A型環氧樹脂、雙酚AF型環氧樹脂、四苯基乙烷型環氧樹脂者為佳,以萘型環氧樹脂為較佳。作為固體狀環氧樹脂的具體例子,可舉出DIC公司製的「HP4032H」(萘型環氧樹脂)、「HP-4700」、「HP-4710」(萘型4官能環氧樹脂)、「N-690」(甲酚酚醛清漆型環氧樹脂)、「N-695」(甲酚酚醛清漆型環氧樹脂)、「HP-7200」(二環戊二烯型環氧樹脂)、「HP-7200HH」、「HP-7200H」、「EXA-7311」、「EXA-7311-G3」、「EXA-7311-G4」、「EXA-7311-G4S」、「HP6000」(亞萘基醚型環氧樹脂)、日本化藥公司製的「EPPN-502H」(參酚型環氧樹脂)、「NC7000L」(萘酚酚醛清漆型環氧樹脂)、「NC3000H」、「NC3000」、「NC3000L」、「NC3100」(聯苯基型環氧樹脂)、新日鐵住金化學公司製的「ESN475V」(萘型環氧樹脂)、「ESN485」(萘酚酚醛清漆型環氧樹脂)、三菱化學公司製的「YX4000H」、「YX4000」、「YL6121」(聯苯基型環氧樹脂)、「YX4000HK」(雙二甲酚型環氧樹脂)、「YX8800」(蒽型環氧樹脂)、大阪氣體化學公司製的「PG-100」、「CG-500」、三菱化學公司製的「YL7760」(雙酚AF型環氧樹脂)、「YL7800」(芴型環氧樹脂)、三菱化學公司製的「jER1010」(固體狀雙酚A型環氧樹脂)、「jER1031S」(四苯基乙烷型環氧樹脂)等。這些可單獨使用1種,亦可組合2種以上後使用。As the solid epoxy resin, bis-cresol-type epoxy resin, naphthalene-type epoxy resin, naphthalene-type 4-functional epoxy resin, cresol novolac-type epoxy resin, dicyclopentadiene-type epoxy resin, Ginseng type epoxy resin, naphthol type epoxy resin, biphenyl type epoxy resin, naphthylene ether type epoxy resin, anthracene type epoxy resin, bisphenol A type epoxy resin, bisphenol AF type ring Oxygen resin and tetraphenylethane type epoxy resin are preferable, and naphthalene type epoxy resin is more preferable. Specific examples of the solid epoxy resin include "HP4032H" (naphthalene-type epoxy resin), "HP-4700", "HP-4710" (naphthalene-type tetrafunctional epoxy resin), and " "N-690" (cresol novolac epoxy resin), "N-695" (cresol novolac epoxy resin), "HP-7200" (dicyclopentadiene epoxy resin), "HP -7200HH "," HP-7200H "," EXA-7311 "," EXA-7311-G3 "," EXA-7311-G4 "," EXA-7311-G4S "," HP6000 "(naphthylene ether ring Oxygen resin), "EPPN-502H" (ginsenophenol-type epoxy resin), "NC7000L" (naphthol novolac-type epoxy resin), "NC3000H", "NC3000", "NC3000L", `` NC3100 '' (biphenyl type epoxy resin), `` ESN475V '' (naphthalene type epoxy resin), `` ESN485 '' (naphthol novolac type epoxy resin) by Nippon Steel & Sumitomo Chemical Co., Ltd., and Mitsubishi Chemical Corporation "YX4000H", "YX4000", "YL6121" (biphenyl type epoxy resin), "YX4000HK" (bisxylenol type epoxy resin), "YX8800" (anthracene type epoxy resin), Osaka Gas Chemical Company-based PG-100 "," CG-500 "," YL7760 "(bisphenol AF type epoxy resin)," YL7800 "(type epoxy resin) made by Mitsubishi Chemical Corporation," jER1010 "(solid made by Mitsubishi Chemical Corporation) Bisphenol A epoxy resin), "jER1031S" (tetraphenylethane epoxy resin), and the like. These may be used individually by 1 type, and may be used in combination of 2 or more type.

作為(A)成分,併用液狀環氧樹脂與固體狀環氧樹脂時,各量比(液狀環氧樹脂:固體狀環氧樹脂)以質量比計算時以1:1~1:20的範圍為佳。藉由將液狀環氧樹脂與固體狀環氧樹脂的量比在此範圍時,可得到i)在樹脂薄片的形態下使用時可具有適度黏著性、ii)在樹脂薄片的形態下使用時可得到充分可撓性而提高處理性,以及iii)可得到具有充分斷裂強度之硬化物等效果。由上述i)~iii)的效果之觀點來看,液狀環氧樹脂與固體狀環氧樹脂的量比(液狀環氧樹脂:固體狀環氧樹脂)以質量比計算時,以1:1~1:15的範圍為較佳,以1:1~1:10的範圍為更佳。When the liquid epoxy resin and the solid epoxy resin are used as the component (A), the quantity ratio (liquid epoxy resin: solid epoxy resin) is 1: 1 to 1:20 when calculated by mass ratio. The range is better. When the amount ratio of the liquid epoxy resin to the solid epoxy resin is within this range, i) can be obtained with moderate adhesion when used in the form of a resin sheet, and ii) when used in the form of a resin sheet. It is possible to obtain sufficient flexibility to improve handling properties, and iii) to obtain effects such as a hardened material having sufficient breaking strength. From the viewpoint of the effects of i) to iii) above, when the mass ratio of the liquid epoxy resin to the solid epoxy resin (liquid epoxy resin: solid epoxy resin) is calculated as the mass ratio, the ratio is 1: A range of 1 to 1: 15 is preferable, and a range of 1: 1 to 1: 10 is more preferable.

樹脂組成物中之(A)成分的含有量,由可得到顯示良好機械強度及絕緣信賴性之絕緣層的觀點來看,在將樹脂組成物中之不揮發成分作為100質量%時,以5質量%以上為佳,較佳為10質量%以上,更佳為15質量%以上。環氧樹脂的含有量之上限若可達到本發明之效果下並無特別限定,以30質量%以下為佳,較佳為25質量%以下,更佳為20質量%以下。
且,對於本發明,樹脂組成物中之各成分的含有量若無特別另外說明,其為將樹脂組成物中之不揮發成分作為100質量%時的值。
The content of the component (A) in the resin composition is from the viewpoint that an insulating layer showing good mechanical strength and insulation reliability can be obtained. When the nonvolatile component in the resin composition is 100% by mass, the content is 5 It is preferably at least mass%, more preferably at least 10 mass%, and even more preferably at least 15 mass%. The upper limit of the content of the epoxy resin is not particularly limited as long as it can achieve the effects of the present invention, and is preferably 30% by mass or less, more preferably 25% by mass or less, and more preferably 20% by mass or less.
In addition, in the present invention, the content of each component in the resin composition is a value when the nonvolatile component in the resin composition is 100% by mass unless otherwise specified.

(A)成分的環氧當量以50~5000為佳,較佳為50~3000,更佳為80~2000,更較佳為110~1000。若在該範圍下,硬化物的交聯密度會變的充足,且可得到表面粗度小之絕緣層。且,環氧當量可依據JIS K7236進行測定,其為含有1當量環氧基之樹脂的質量。The epoxy equivalent of the component (A) is preferably 50 to 5000, more preferably 50 to 3000, more preferably 80 to 2000, and still more preferably 110 to 1,000. Within this range, the crosslinked density of the hardened material becomes sufficient, and an insulating layer with a small surface roughness can be obtained. The epoxy equivalent can be measured in accordance with JIS K7236, and is the mass of a resin containing 1 equivalent of an epoxy group.

(A)成分之重量平均分子量以100~5000為佳,較佳為250~3000,更佳為400~1500。其中,環氧樹脂的重量平均分子量為藉由凝膠滲透層析法(GPC)法所測定的聚苯乙烯換算之重量平均分子量。The weight average molecular weight of the component (A) is preferably 100 to 5000, more preferably 250 to 3000, and even more preferably 400 to 1500. The weight average molecular weight of the epoxy resin is a weight average molecular weight in terms of polystyrene measured by a gel permeation chromatography (GPC) method.

<(B)苯並噁嗪化合物>
樹脂組成物為含有下述一般式(B-1)所示(B)苯並噁嗪化合物。

式(B-1)中,R1 表示含有氧原子的n價基,R2 各獨立表示鹵素原子、烷基或芳基。n表示2~4的整數,m表示0~4的整數。
< (B) benzoxazine compound >
The resin composition contains a benzoxazine compound (B) represented by the following general formula (B-1).

In the formula (B-1), R 1 represents an n-valent group containing an oxygen atom, and R 2 each independently represents a halogen atom, an alkyl group, or an aryl group. n represents an integer from 2 to 4, and m represents an integer from 0 to 4.

R1 表示含有氧原子的n價基。作為如此基,可舉出由氧原子與伸芳基之組合所成的n價基、由氧原子與伸烷基之組合所成的n價基、由氧原子與伸芳基與伸烷基之組合所成的n價基等,由提高環境試驗後之絕緣層與導體層的密著性之觀點,及由有效地改善污跡除去性之觀點來看,以氧原子與伸芳基之組合所成的n價基者為佳。R 1 represents an n-valent group containing an oxygen atom. Examples of such a base include an n-valent group composed of a combination of an oxygen atom and an alkylene group, an n-valent group composed of a combination of an oxygen atom and an alkylene group, and an n-valent group composed of an oxygen atom and an alkylene group and an alkylene group. From the viewpoint of improving the adhesion between the insulating layer and the conductor layer after the environmental test, and from the viewpoint of effectively improving the stain removal property, the n-valent group formed by the combination of A combination of n-valent bases is preferred.

作為伸芳基,以碳原子數6~20的伸芳基為佳,以碳原子數6~15的伸芳基為較佳,以碳原子數6~12的伸芳基為更佳。作為伸芳基的具體例子,可舉出伸苯基、亞萘基、亞蒽基、雙亞苯基等,以伸苯基為佳。
作為伸烷基,以碳原子數1~10的伸烷基為佳,以碳原子數1~6的伸烷基為較佳,以碳原子數1~3的伸烷基為更佳。作為伸烷基的具體例子,例如可舉出伸甲基、伸乙基、伸丙基等,以伸甲基為佳。
As the arylene group, an arylene group having 6 to 20 carbon atoms is preferable, an arylene group having 6 to 15 carbon atoms is more preferable, and an arylene group having 6 to 12 carbon atoms is more preferable. Specific examples of the arylene group include a phenylene group, a naphthylene group, an anthracenylene group, and a bisphenylene group, and the phenylene group is preferred.
As the alkylene group, an alkylene group having 1 to 10 carbon atoms is preferred, an alkylene group having 1 to 6 carbon atoms is more preferred, and an alkylene group having 1 to 3 carbon atoms is more preferred. Specific examples of the alkylene group include a methyl group, an ethyl group, and a propyl group, and a methyl group is preferred.

作為含有氧原子的n價基之具體例子,可舉出以下基。式中,「*」表示結合鍵。Specific examples of the n-valent group containing an oxygen atom include the following groups. In the formula, "*" represents a bonding key.

伸芳基及伸烷基可具有取代基。作為取代基,並無特別限制,例如可舉出鹵素原子、-OH、-O-C1-6
烷基、-N(C1-6 烷基)2 、C1-6 烷基、C6-10 芳基、-NH2 、-CN、
-C(O)O-C1-6 烷基、-COOH、-C(O)H、-NO2 等。其中,「Cp-q 」(p及q為正整數,滿足p<q)之用語表示記載於該用語後的有機基之碳原子數為p~q。例如所謂「C1-6 烷基」的表現表示碳原子數1~6的烷基。
The arylene group and the alkylene group may have a substituent. The substituent is not particularly limited, and examples thereof include a halogen atom, -OH, and -OC 1-6.
Alkyl, -N (C 1-6 alkyl) 2 , C 1-6 alkyl, C 6-10 aryl, -NH 2 , -CN,
-C (O) OC 1-6 alkyl, -COOH, -C (O) H, -NO 2 and the like. The term “C pq ” (p and q are positive integers and satisfy p <q) means that the number of carbon atoms of the organic group described in the term is p to q. For example, the expression "C 1-6 alkyl" means an alkyl group having 1 to 6 carbon atoms.

上述取代基可進一步具有取代基(以下有時為「二次取代基」)。作為二次取代基,若無特別記載,可使用與上述取代基相同者。The said substituent may further have a substituent (henceforth a "secondary substituent"). As a secondary substituent, unless otherwise stated, the same thing as the said substituent can be used.

R2 各獨立表示鹵素原子、烷基或芳基。烷基以碳原子數1~10的烷基為佳,以碳原子數1~6的烷基為較佳,以碳原子數1~3的烷基為更佳。芳基以碳原子數6~20的芳基為佳,以碳原子數6~15的芳基為較佳,以碳原子數6~10的芳基為更佳。鹵素原子表示氟原子、氯原子、溴原子或碘原子。烷基及芳基可具有取代基。作為取代基,與可具有上述伸芳基的取代基相同。R 2 each independently represents a halogen atom, an alkyl group, or an aryl group. The alkyl group is preferably an alkyl group having 1 to 10 carbon atoms, more preferably an alkyl group having 1 to 6 carbon atoms, and even more preferably an alkyl group having 1 to 3 carbon atoms. The aryl group is preferably an aryl group having 6 to 20 carbon atoms, more preferably an aryl group having 6 to 15 carbon atoms, and even more preferably an aryl group having 6 to 10 carbon atoms. The halogen atom means a fluorine atom, a chlorine atom, a bromine atom or an iodine atom. The alkyl group and the aryl group may have a substituent. The substituent is the same as the substituent which may have the above-mentioned arylene group.

n表示2~4的整數,以2~3的整數為佳,以2為較佳。m表示0~4的整數,以0~3的整數為佳,以0為較佳。n represents an integer of 2 to 4, an integer of 2 to 3 is preferred, and 2 is more preferred. m represents an integer from 0 to 4, an integer from 0 to 3 is preferred, and 0 is more preferred.

一般式(B-1)所示苯並噁嗪化合物由可有效地得到本發明所望效果之觀點來看,以下述一般式(B-2)所示苯並噁嗪化合物者為佳。From the viewpoint that the desired effect of the present invention can be effectively obtained, the benzoxazine compound represented by the general formula (B-1) is preferably a benzoxazine compound represented by the following general formula (B-2).

一般式(B-2)所示苯並噁嗪化合物以一般式(B-3)及一般式(B-4)所示苯並噁嗪化合物中至少任一種為佳。The benzoxazine compound represented by the general formula (B-2) is preferably at least one of the benzoxazine compound represented by the general formula (B-3) and the general formula (B-4).

一般式(B-1)所示苯並噁嗪化合物可單獨使用1種類,亦可使用組合2種類以上的混合物。例如將一般式(B-3)所示苯並噁嗪化合物與一般式(B-4)所示苯並噁嗪化合物作為混合物使用時,質量混合比(一般式(B-3):一般式(B-4))以1:10~10:1為佳,以1:5~5:1為較佳,以1:3~3:1為更佳。藉由使質量混合比在該範圍內時,可提高環境試驗後絕緣層與導體層之密著性。通常可進一步有效地改善污跡除去性。The benzoxazine compound represented by the general formula (B-1) may be used singly or in combination of two or more kinds. For example, when a benzoxazine compound represented by the general formula (B-3) and a benzoxazine compound represented by the general formula (B-4) are used as a mixture, the mass mixing ratio (general formula (B-3): general formula (B-4)) 1: 10 ~ 10: 1 is preferred, 1: 5 ~ 5: 1 is preferred, and 1: 3 ~ 3: 1 is more preferred. When the mass mixing ratio is within this range, the adhesion between the insulating layer and the conductor layer after the environmental test can be improved. Smear removal is often further effectively improved.

作為(B)苯並噁嗪化合物的具體例子,可舉出JFE化學公司製的「JBZ-OP100D」、「ODA-BOZ」;四國化成工業公司製的「F-a」;昭和高分子公司製的「HFB2006M」等。Specific examples of the (B) benzoxazine compound include "JBZ-OP100D" and "ODA-BOZ" manufactured by JFE Chemical Co., Ltd .; "Fa" manufactured by Shikoku Chemical Industry Co., Ltd .; and manufactured by Showa Polymer Co., Ltd. "HFB2006M", etc.

作為(B)苯並噁嗪化合物的分子量,由提高密著性之觀點來看,以200以上為佳,較佳為300以上,更佳為400以上,以1000以下為佳,較佳為800以下,更佳為500以下。The molecular weight of the (B) benzoxazine compound is preferably 200 or more, more preferably 300 or more, more preferably 400 or more, more preferably 1,000 or less, and more preferably 800 from the viewpoint of improving adhesion. Below, more preferably 500 or less.

(B)苯並噁嗪化合物的含有量在將、在將樹脂組成物中之不揮發成分作為100質量%時,以0.1質量%以上為佳,較佳0.5質量%以上,更佳為1質量%以上。上限以10質量%以下為佳,較佳為8質量%以下,更佳為5質量%以下或3質量%以下。藉由使(B)成分之含有量在該範圍內時,可提高環境試驗後之絕緣層與導體層的密著性。通常可有效地進一步改善污跡除去性。(B) When the content of the benzoxazine compound is 100% by mass of the nonvolatile matter in the resin composition, it is preferably 0.1% by mass or more, more preferably 0.5% by mass or more, and more preferably 1% by mass. %the above. The upper limit is preferably 10% by mass or less, more preferably 8% by mass or less, more preferably 5% by mass or less or 3% by mass. When the content of the component (B) is within this range, the adhesion between the insulating layer and the conductor layer after the environmental test can be improved. Smear removal is often effectively further improved.

<(C)無機填充材>
樹脂組成物為含有(C)無機填充材。(C)無機填充材之含有量由降低熱膨張率之觀點來看,在將樹脂組成物中之不揮發成分作為100質量%時為67質量%以上,以68質量%以上為佳,較佳為70質量%以上。上限以85質量%以下為佳,較佳為80質量%以下,更佳為75質量%以下。本發明中,藉由含有(B)苯並噁嗪化合物,即使含有(C)無機填充材67質量%以上,亦可維持HAST試驗後之密著性。
< (C) Inorganic fillers >
The resin composition contains (C) an inorganic filler. (C) The content of the inorganic filler is from the viewpoint of reducing the thermal expansion rate. When the non-volatile content in the resin composition is 100% by mass, it is preferably 67% by mass or more, and preferably 68% by mass or more. It is 70 mass% or more. The upper limit is preferably 85% by mass or less, more preferably 80% by mass or less, and even more preferably 75% by mass or less. In the present invention, by containing the (B) benzoxazine compound, the adhesiveness after the HAST test can be maintained even if the (C) inorganic filler is 67% by mass or more.

(C)無機填充材的材料若為無機化合物即可,並無特別限定,例如可舉出二氧化矽、氧化鋁、玻璃、堇青石、矽酸化物、硫酸鋇、碳酸鋇、滑石、黏土、雲母粉、氧化鋅、水滑石、勃姆石、氫氧化鋁、氫氧化鎂、碳酸鈣、碳酸鎂、氧化鎂、氮化硼、氮化鋁、氮化錳、硼酸鋁、碳酸鍶、鈦酸鍶、鈦酸鈣、鈦酸鎂、鈦酸鉍、氧化鈦、氧化鋯、鈦酸鋇、鈦酸鋯酸鋇、鋯酸鋇、鋯酸鈣、磷酸鋯及磷酸鎢酸鋯等。這些中亦以二氧化矽為特佳。作為二氧化矽,例如可舉出無定形二氧化矽、熔融二氧化矽、結晶二氧化矽、合成二氧化矽、中空二氧化矽等。又,作為二氧化矽以球狀二氧化矽為佳。無機填充材可單獨使用1種,亦可組合2種以上後使用。(C) The material of the inorganic filler is not particularly limited as long as it is an inorganic compound, and examples thereof include silicon dioxide, alumina, glass, cordierite, silicate, barium sulfate, barium carbonate, talc, clay, Mica powder, zinc oxide, hydrotalcite, boehmite, aluminum hydroxide, magnesium hydroxide, calcium carbonate, magnesium carbonate, magnesium oxide, boron nitride, aluminum nitride, manganese nitride, aluminum borate, strontium carbonate, titanic acid Strontium, calcium titanate, magnesium titanate, bismuth titanate, titanium oxide, zirconia, barium titanate, barium titanate zirconate, barium zirconate, calcium zirconate, zirconium phosphate, and zirconium tungstate phosphate. Of these, silicon dioxide is particularly preferred. Examples of the silicon dioxide include amorphous silicon dioxide, fused silicon dioxide, crystalline silicon dioxide, synthetic silicon dioxide, and hollow silicon dioxide. Further, as the silica, spherical silica is preferred. The inorganic filler may be used singly or in combination of two or more kinds.

作為(C)無機填充材的市售品,例如可舉出新日鐵住金Materials公司製的「SP60-05」、「SP507-05」;Admatechs公司製的「YC100C」、「YA050C」、「YA050C-MJE」、「YA010C」;Denka公司製的「UFP-30」;Tokuyama公司製的「SilfirNSS-3N」、「SilfirNSS-4N」、「SilfirNSS-5N」;Admatechs公司製的「SC2500SQ」、「SO-C4」、「SO-C2」、「SO-C1」等。Examples of commercially available products of (C) inorganic fillers include "SP60-05" and "SP507-05" manufactured by Nippon Steel & Sumitomo Metal Materials; "YC100C", "YA050C", and "YA050C" manufactured by Admatechs -MJE "," YA010C ";" UFP-30 "by Denka;" SilfirNSS-3N "," SilfirNSS-4N "," SilfirNSS-5N "by Tokuyama;" SC2500SQ "," SO by Admatechs " -C4 "," SO-C2 "," SO-C1 ", etc.

通常(C)無機填充材以粒子狀態含於樹脂組成物。(C)無機填充材的平均粒徑由可顯著得到本發明所望效果之觀點來看,以0.01μm以上為佳,較佳為0.1μm以上,特佳為0.5μm以上,以5.0μm以下為佳,較佳為2.0μm以下,更佳為1.0μm以下。又,藉由(C)無機填充材之平均粒徑在前述範圍,通常可提高樹脂組成物層之迴路嵌入性,或縮小絕緣層的表面粗度,或可容易填充大量(C)無機填充材。The (C) inorganic filler is usually contained in the resin composition in a particulate state. (C) From the viewpoint that the average particle diameter of the inorganic filler can remarkably obtain the desired effect of the present invention, it is preferably 0.01 μm or more, more preferably 0.1 μm or more, particularly preferably 0.5 μm or more, and more preferably 5.0 μm or less. Is preferably 2.0 μm or less, and more preferably 1.0 μm or less. In addition, when the average particle diameter of the (C) inorganic filler is in the aforementioned range, the circuit embedding property of the resin composition layer can be generally improved, the surface roughness of the insulating layer can be reduced, or a large amount of (C) inorganic filler can be easily filled. .

(C)無機填充材的平均粒徑為可藉由依據米氏(Mie)散射理論的雷射衍射・散射法而進行測定。具體為藉由雷射衍射散射式粒徑分布測定裝置,將(C)無機填充材之粒徑分以據體積基準作成,將該中位數徑作為平均粒徑而可測定。測定試樣以使用將(C)無機填充材藉由超音波分散於甲基乙基酮中者為佳。作為雷射衍射散射式粒徑分布測定裝置,可使用堀場製作所公司製「LA-500」、島津製作所公司製「SALD-2200」等。(C) The average particle diameter of the inorganic filler can be measured by a laser diffraction / scattering method based on Mie scattering theory. Specifically, the particle size distribution of the (C) inorganic filler is prepared on a volume basis using a laser diffraction scattering particle size distribution measurement device, and the median diameter can be measured as the average particle size. The measurement sample is preferably one in which (C) an inorganic filler is dispersed in methyl ethyl ketone by ultrasound. As a laser diffraction scattering type particle size distribution measuring device, "LA-500" manufactured by Horiba, Ltd., and "SALD-2200" manufactured by Shimadzu Corporation can be used.

(C)無機填充材之比表面積由可顯著得到本發明所望效果之觀點來看,以1m2 /g以上為佳,較佳為3m2 /g以上,更佳為5m2 /g以上。上限雖無特別限制,以30m2 /g以下為佳,較佳為20m2 /g以下,更佳為10m2 /g以下。
比表面積為依據BET法,使用比表面積測定裝置(Mountech公司製Macsorb HM-1210)於試料表面吸附氮氣,使用BET多點法算出比表面積而得。
(C) The specific surface area of the inorganic filler is preferably 1 m 2 / g or more, more preferably 3 m 2 / g or more, and more preferably 5 m 2 / g or more, from the viewpoint that the desired effect of the present invention can be significantly obtained. Although the upper limit is not particularly limited, it is preferably 30 m 2 / g or less, more preferably 20 m 2 / g or less, and even more preferably 10 m 2 / g or less.
The specific surface area was obtained by adsorbing nitrogen on the surface of the sample using a specific surface area measuring device (Macsorb HM-1210 manufactured by Mountech) according to the BET method, and calculating the specific surface area by the BET multipoint method.

(C)無機填充材由提高耐濕性及分散性之觀點來看,可由表面處理劑進行表面處理。作為表面處理劑,例如可舉出胺基矽烷系偶合劑、環氧矽烷系偶合劑、巰基矽烷系偶合劑、矽烷系偶合劑、烷氧基矽烷、有機矽氮烷化合物、鈦酸鹽系偶合劑等。作為表面處理劑的市售品,例如可舉出信越化學工業公司製「KBM403」(3-環氧丙氧基丙基三甲氧基矽烷)、信越化學工業公司製「KBM803」(3-巰基丙基三甲氧基矽烷)、信越化學工業公司製「KBE903」(3-胺基丙基三乙氧基矽烷)、信越化學工業公司製「KBM573」(N-苯基-3-胺基丙基三甲氧基矽烷)、信越化學工業公司製「SZ-31」(六甲基二矽氮烷)、信越化學工業公司製「KBM103」(苯基三甲氧基矽烷)、信越化學工業公司製「KBM-4803」(長鏈環氧型矽烷偶合劑)、信越化學工業公司製「KBM-7103」(3,3,3-三氟丙基三甲氧基矽烷)等。表面處理劑可單獨使用1種,亦可組合2種以上後使用。(C) From the viewpoint of improving moisture resistance and dispersibility, the inorganic filler can be surface-treated with a surface-treating agent. Examples of the surface treatment agent include an aminosilane-based coupling agent, an epoxysilane-based coupling agent, a mercaptosilane-based coupling agent, a silane-based coupling agent, an alkoxysilane, an organic silazane compound, and a titanate-based coupling agent. Mixture and so on. Examples of commercially available surface treatment agents include "KBM403" (3-glycidoxypropyltrimethoxysilane) manufactured by Shin-Etsu Chemical Industry Co., Ltd., and "KBM803" (3-mercaptopropyl) manufactured by Shin-Etsu Chemical Industry Co., Ltd. Trimethoxysilane), "KBE903" (3-aminopropyltriethoxysilane) manufactured by Shin-Etsu Chemical Industries, "KBM573" (N-phenyl-3-aminopropyltrimethyl) manufactured by Shin-Etsu Chemical Industries, Ltd. Oxysilane), Shin-Etsu Chemical Industry Co., Ltd. "SZ-31" (hexamethyldisilazane), Shin-Etsu Chemical Industry Co., Ltd. "KBM103" (phenyltrimethoxysilane), Shin-Etsu Chemical Industry Co., Ltd. "KBM- 4803 "(long-chain epoxy-type silane coupling agent)," KBM-7103 "(3,3,3-trifluoropropyltrimethoxysilane) manufactured by Shin-Etsu Chemical Co., Ltd., and the like. The surface treatment agent may be used singly or in combination of two or more kinds.

藉由表面處理劑之表面處理的程度可藉由(C)無機填充材之每單位表面積的碳量進行評估。(C)無機填充材之每單位表面積的碳量由(C)無機填充材之分散性提高觀點來看,以0.02mg/m2 以上為佳,以0.1mg/m2 以上為較佳,以0.2mg/m2 以上為更佳。另一方面,由抑制樹脂塗漆之熔融黏度及在薄片形態下的熔融黏度之上昇的觀點下,以1mg/m2 以下為佳,以0.8mg/m2 以下為較佳,以0.5mg/m2 以下為更佳。The degree of surface treatment by the surface treatment agent can be evaluated by the amount of carbon per unit surface area of the (C) inorganic filler. (C) The carbon content per unit surface area of the inorganic filler is preferably 0.02 mg / m 2 or more, more preferably 0.1 mg / m 2 or more, from the viewpoint of improving the dispersibility of the inorganic filler (C). It is more preferably 0.2 mg / m 2 or more. On the other hand, from the viewpoint of suppressing an increase in the melt viscosity of the resin paint and the melt viscosity in the form of a sheet, it is preferably 1 mg / m 2 or less, more preferably 0.8 mg / m 2 or less, and 0.5 mg / m 2 . It is more preferably m 2 or less.

(C)無機填充材的每單位表面積之碳量係可將表面處理後的(C)無機填充材藉由溶劑(例如甲基乙基酮(MEK))進行洗淨處理後而測定。具體為將作為溶劑而充分量之MEK添加於以表面處理劑進行表面處理的(C)無機填充材中,在25℃下進行5分鐘超音波洗淨。除去上澄液,乾燥固體成分後,使用碳分析計可測定(C)無機填充材之每單位表面積的碳量。作為碳分析計,可使用堀場製作所公司製「EMIA-320V」等。The carbon content per unit surface area of the (C) inorganic filler can be measured after the surface-treated (C) inorganic filler is washed with a solvent (for example, methyl ethyl ketone (MEK)). Specifically, a sufficient amount of MEK as a solvent was added to the (C) inorganic filler surface-treated with a surface-treating agent, and ultrasonic cleaning was performed at 25 ° C for 5 minutes. After removing the upper liquid and drying the solid content, the carbon content per unit surface area of the (C) inorganic filler can be measured using a carbon analyzer. As a carbon analyzer, "EMIA-320V" manufactured by Horiba, Ltd. can be used.

<(D)活性酯化合物>
對於一實施形態,樹脂組成物為含有(D)活性酯化合物。已知若使用活性酯化合物,通常會使污跡除去性變差。但本發明之樹脂組成物的硬化物因具有優良的污跡除去性,故即使使用活性酯化合物亦不會使污跡除去性變差。
<(D) Active ester compound>
In one embodiment, the resin composition contains (D) an active ester compound. It is known that when an active ester compound is used, stain removability is generally deteriorated. However, since the cured product of the resin composition of the present invention has excellent stain removal properties, the stain removal properties are not deteriorated even when the active ester compound is used.

作為活性酯化合物,並無特別限制,一般以使用酚酯類、硫代酚酯類、N-羥基胺酯類、雜環羥基化合物之酯類等於1分子中具有2個以上反應活性高之酯基的化合物為佳。該活性酯化合物以藉由羧酸化合物及/或硫代羧酸化合物與羥基化合物及/或硫醇化合物的縮合反應而得者為佳。特別由耐熱性提高觀點來看,以由羧酸化合物與羥基化合物所得之活性酯化合物為佳,以由羧酸化合物與酚化合物及/或萘酚化合物所得之活性酯化合物為較佳。作為羧酸化合物,例如可舉出安息香酸、乙酸、琥珀酸、馬來酸、衣康酸、鄰苯二甲酸、間苯二甲酸、對苯二甲酸、苯四酸等。作為酚化合物或萘酚化合物,例如可舉出氫醌、間苯二酚、雙酚A、雙酚F、雙酚S、酚酞嗪、甲基化雙酚A、甲基化雙酚F、甲基化雙酚S、酚、o-甲酚、m-甲酚、p-甲酚、鄰苯二酚、α-萘酚、β-萘酚、1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二羥基二苯甲酮、三羥基二苯甲酮、四羥基二苯甲酮、間苯三酚、苯三醇、二環戊二烯型二酚化合物、酚酚醛清漆等。其中所謂「二環戊二烯型二酚化合物」為於二環戊二烯1分子中酚2分子經縮合所得之二酚化合物。The active ester compound is not particularly limited. Generally, esters using phenolic esters, thiophenolic esters, N-hydroxyamine esters, and heterocyclic hydroxy compounds are equal to two or more highly reactive esters in one molecule. Compounds based on radicals are preferred. The active ester compound is preferably obtained by a condensation reaction of a carboxylic acid compound and / or a thiocarboxylic acid compound with a hydroxy compound and / or a thiol compound. In particular, from the viewpoint of improving heat resistance, an active ester compound obtained from a carboxylic acid compound and a hydroxy compound is preferable, and an active ester compound obtained from a carboxylic acid compound and a phenol compound and / or a naphthol compound is more preferable. Examples of the carboxylic acid compound include benzoic acid, acetic acid, succinic acid, maleic acid, itaconic acid, phthalic acid, isophthalic acid, terephthalic acid, and pyromellitic acid. Examples of the phenol compound or naphthol compound include hydroquinone, resorcinol, bisphenol A, bisphenol F, bisphenol S, phenolphthalazine, methylated bisphenol A, methylated bisphenol F, and methylformate. Bisphenol S, phenol, o-cresol, m-cresol, p-cresol, catechol, α-naphthol, β-naphthol, 1,5-dihydroxynaphthalene, 1,6- Dihydroxynaphthalene, 2,6-dihydroxynaphthalene, dihydroxybenzophenone, trihydroxybenzophenone, tetrahydroxybenzophenone, resorcinol, benzenetriol, dicyclopentadiene type diphenol Compounds, phenol novolacs, etc. The so-called "dicyclopentadiene-type diphenol compound" is a diphenol compound obtained by condensing two molecules of phenol in one molecule of dicyclopentadiene.

具體以含有二環戊二烯型二酚結構之活性酯化合物、含有萘結構的活性酯化合物、含有酚酚醛清漆之乙醯化物的活性酯化合物、含有酚酚醛清漆的苯甲醯基化物之活性酯化合物為佳,其中亦以含有萘結構之活性酯化合物、含有二環戊二烯型二酚結構之活性酯化合物為較佳。所謂「二環戊二烯型二酚結構」表示由伸苯基-二環伸戊基-伸苯基所成的2價結構單位。Specifically, the active ester compound containing a dicyclopentadiene-type diphenol structure, the active ester compound containing a naphthalene structure, the active ester compound containing an acetic acid compound of a phenol novolac, and the activity of a benzamidine compound containing a phenol novolac An ester compound is preferable, and an active ester compound containing a naphthalene structure and an active ester compound containing a dicyclopentadiene type diphenol structure are also preferable. The "dicyclopentadiene-type diphenol structure" means a divalent structural unit formed of phenylene-bicyclopentyl-phenylene.

作為活性酯化合物之市售品的含有二環戊二烯型二酚結構之活性酯化合物,可舉出「EXB9451」、「EXB9460」、「EXB9460S」、「HPC-8000-65T」、「HPC-8000H-65TM」、「EXB8000L-65TM」、「EXB8150-65T」(DIC公司製),作為含有萘結構之活性酯化合物,可舉出「EXB9416-70BK」(DIC公司製),作為含有酚酚醛清漆的乙醯化物之活性酯化合物,可舉出「DC808」(三菱化學公司製),作為含有酚酚醛清漆之苯甲醯基化物的活性酯化合物,可舉出「YLH1026」(三菱化學公司製),作為酚酚醛清漆之乙醯化物的活性酯化合物,可舉出「DC808」(三菱化學公司製),作為酚酚醛清漆之苯甲醯基化物的活性酯化合物,可舉出「YLH1026」(三菱化學公司製)、「YLH1030」(三菱化學公司製)、「YLH1048」(三菱化學公司製)等。Examples of commercially available active ester compounds containing a dicyclopentadiene-type diphenol structure include "EXB9451", "EXB9460", "EXB9460S", "HPC-8000-65T", and "HPC- 8000H-65TM "," EXB8000L-65TM "," EXB8150-65T "(manufactured by DIC Corporation), as the active ester compound containing a naphthalene structure," EXB9416-70BK "(manufactured by DIC Corporation), and phenol novolac Examples of the active ester compound of acetamate include "DC808" (manufactured by Mitsubishi Chemical Corporation), and as the active ester compound of benzophenone containing phenol novolac, "YLH1026" (made by Mitsubishi Chemical Corporation) Examples of the active ester compound of the acetic acid compound of phenol novolac include "DC808" (manufactured by Mitsubishi Chemical Corporation), and the example of the active ester compound of the benzoic acid compound of phenol novolac includes "YLH1026" (Mitsubishi Chemical company), "YLH1030" (manufactured by Mitsubishi Chemical Corporation), "YLH1048" (manufactured by Mitsubishi Chemical Corporation), etc.

樹脂組成物為含有(D)活性酯化合物時,環氧樹脂與活性酯化合物之量比在[環氧樹脂之環氧基的合計數]:[活性酯化合物之反應基的合計數]的比率下,以1:0.01~1:5的範圍為佳,以1:0.05~1:3為較佳,以1:0.1~1:1.5為更佳。其中,所謂活性酯化合物之反應基為活性酯基。又,所謂環氧樹脂之環氧基的合計數,其表示各環氧樹脂的固體成分質量除以環氧當量所得之值對於所有環氧樹脂進行總計的值,所謂活性酯化合物之反應基的合計數,其表示將各活性酯化合物之固體成分質量除以反應基當量所得之值對於所有活性酯化合物進行總計的值。藉由將環氧樹脂與活性酯化合物的量比在該範圍下,可進一步提高樹脂組成物之硬化物的耐熱性。When the resin composition contains (D) an active ester compound, the ratio of the amount of the epoxy resin to the active ester compound is the ratio of [total number of epoxy groups of the epoxy resin]: [total number of reactive groups of the active ester compound]. In the following, a range of 1: 0.01 to 1: 5 is preferable, 1: 0.05 to 1: 3 is more preferable, and 1: 0.1 to 1: 1.5 is more preferable. Among them, the reactive group of the active ester compound is an active ester group. The total number of epoxy groups of the epoxy resin is a value obtained by dividing the solid content mass of each epoxy resin by the epoxy equivalent. The total value is calculated for all epoxy resins. The total count is a value obtained by dividing the solid content mass of each active ester compound by the reactive group equivalent for all active ester compounds. When the amount ratio of the epoxy resin to the active ester compound is within this range, the heat resistance of the cured product of the resin composition can be further improved.

樹脂組成物為含有(D)活性酯化合物時,(D)成分的含有量在將樹脂組成物中之不揮發成分作為100質量%時,以1質量%以上為佳,較佳為2質量%以上,更佳為3質量%以上。又,上限以20質量%以下為佳,較佳為15質量%以下,更佳為10質量%以下。藉由使(D)成分的含有量設定在該範圍內,可提高環境試驗前後之剝離強度。When the resin composition contains the (D) active ester compound, when the content of the (D) component is 100% by mass of the nonvolatile component in the resin composition, it is preferably 1% by mass or more, and more preferably 2% by mass. The above is more preferably 3% by mass or more. The upper limit is preferably 20% by mass or less, more preferably 15% by mass or less, and even more preferably 10% by mass or less. By setting the content of the (D) component within this range, the peel strength before and after the environmental test can be improved.

<(E)硬化劑>
對於一實施形態,樹脂組成物為含有(E)硬化劑。但,(D)活性酯化合物未含於(E)硬化劑。作為(E)硬化劑,若可具有硬化(A)成分者即可,並無特別限定,例如可舉出酚系硬化劑、萘酚系硬化劑、氰酸酯酯系硬化劑及碳二亞胺系硬化劑等。其中亦由提高絕緣信賴性之觀點來看,(E)硬化劑以酚系硬化劑、萘酚系硬化劑、氰酸酯酯系硬化劑及碳二亞胺系硬化劑中任1種以上者為佳,以含有酚系硬化劑者為較佳。硬化劑可單獨使用1種,或亦可併用2種以上。
< (E) Hardener >
In one embodiment, the resin composition contains a (E) hardener. However, (D) the active ester compound is not contained in (E) the hardener. The (E) curing agent is not particularly limited as long as it can have the component (A), and examples thereof include a phenol-based curing agent, a naphthol-based curing agent, a cyanate ester-based curing agent, and a carbodiimide. Amine-based hardeners, etc. Among them, from the viewpoint of improving insulation reliability, the (E) hardener is any one or more of a phenol-based hardener, a naphthol-based hardener, a cyanate-based hardener, and a carbodiimide-based hardener. Preferably, a phenolic hardener is included. The hardener may be used alone or in combination of two or more.

作為酚系硬化劑及萘酚系硬化劑,由耐熱性及耐水性之觀點來看,具有酚醛清漆結構的酚系硬化劑,或具有酚醛清漆結構的萘酚系硬化劑為佳。又,由與導體層的密著性之觀點來看,以含氮酚系硬化劑為佳,以三嗪骨架含有酚系硬化劑為較佳。As the phenol-based hardener and naphthol-based hardener, from the viewpoints of heat resistance and water resistance, a phenol-based hardener having a novolac structure or a naphthol-based hardener having a novolac structure is preferred. From the viewpoint of adhesion with the conductor layer, a nitrogen-containing phenol-based hardener is preferred, and a triazine skeleton contains a phenol-based hardener.

作為酚系硬化劑及萘酚系硬化劑之具體例子,例如可舉出明和化成公司製的「MEH-7700」、「MEH-7810」、「MEH-7851」、日本化藥公司製的「NHN」、「CBN」、「GPH」、新日鐵住金化學公司製的「SN170」、「SN180」、「SN190」、「SN475」、「SN485」、「SN495」、「SN-495V」、「SN375」、「SN395」、DIC公司製的「TD-2090」、「LA-7052」、「LA-7054」、「LA-1356」、「LA-3018-50P」、「EXB-9500」等。Specific examples of the phenol-based hardener and the naphthol-based hardener include, for example, "MEH-7700", "MEH-7810", "MEH-7851", manufactured by Meiwa Kasei Corporation, and "NHN" manufactured by Nippon Kayaku Co., Ltd. "," CBN "," GPH "," SN170 "," SN180 "," SN190 "," SN475 "," SN485 "," SN495 "," SN-495V "," SN375 " "," SN395 "," TD-2090 "," LA-7052 "," LA-7054 "," LA-1356 "," LA-3018-50P "," EXB-9500 ", etc. manufactured by DIC Corporation.

作為氰酸酯酯系硬化劑,例如可舉出雙酚A二氰酸酯、聚酚氰酸酯、寡(3-伸甲基-1,5-伸苯基氰酸酯)、4,4’-伸甲基雙(2,6-二甲基苯基氰酸酯)、4,4’-亞乙基二苯基二氰酸酯、六氟雙酚A二氰酸酯、2,2-雙(4-氰酸酯)苯基丙烷、1,1-雙(4-氰酸酯苯基甲烷)、雙(4-氰酸酯-3,5-二甲基苯基)甲烷、1,3-雙(4-氰酸酯苯基-1-(甲基亞乙基))苯、雙(4-氰酸酯苯基)硫代醚及雙(4-氰酸酯苯基)醚等自2官能氰酸酯樹脂、酚酚醛清漆及甲酚酚醛清漆等所衍生來的多官能氰酸酯樹脂、這些氰酸酯樹脂的一部分經三嗪化之預聚物等。作為氰酸酯酯系硬化劑的具體例子,可舉出Lonza Japan公司製的「PT30」及「PT60」(酚酚醛清漆型多官能氰酸酯酯樹脂)、「ULL-950S」(多官能氰酸酯酯樹脂)、「BA230」、「BA230S75」(雙酚A二氰酸酯的一部分或全部經三嗪化後成為三聚物的預聚物)等。Examples of the cyanate ester-based hardener include bisphenol A dicyanate, polyphenol cyanate, oligo (3-methylene-1,5-phenylphenyl cyanate), 4,4 '-Methylenebis (2,6-dimethylphenylcyanate), 4,4'-ethylenediphenyldicyanate, hexafluorobisphenol A dicyanate, 2,2 -Bis (4-cyanate) phenylpropane, 1,1-bis (4-cyanatephenylmethane), bis (4-cyanate-3,5-dimethylphenyl) methane, 1 , 3-bis (4-cyanatephenyl-1- (methylethylene)) benzene, bis (4-cyanatephenyl) thioether and bis (4-cyanatephenyl) ether Polyfunctional cyanate resins derived from bifunctional cyanate resins, phenol novolacs, cresol novolacs, etc., and triazinated prepolymers are part of these cyanate resins. Specific examples of the cyanate ester-based hardener include "PT30" and "PT60" (phenol novolac-type polyfunctional cyanate ester resin) and "ULL-950S" (polyfunctional cyanide resin) manufactured by Lonza Japan. Acid ester resin), "BA230", "BA230S75" (prepolymers in which a part or all of the bisphenol A dicyanate is triazinated to become a trimer).

作為碳二亞胺系硬化劑的具體例子,可舉出日清紡化學公司製的「V-03」、「V-07」等。Specific examples of the carbodiimide-based hardener include "V-03" and "V-07" manufactured by Nisshinbo Chemical Co., Ltd.

樹脂組成物為含有(E)硬化劑時,環氧樹脂與硬化劑的量比在[環氧樹脂的環氧基之合計數]:[硬化劑的反應基之合計數]的比率下,以1:0.01~1:2的範圍為佳,以1:0.03~1:3為較佳,以1:0.05~1:1.5為更佳。其中,所謂硬化劑的反應基為活性羥基等,依據硬化劑的種類而相異。又,所謂環氧樹脂的環氧基之合計數,表示各環氧樹脂之固體成分質量除以環氧當量所得的值對於所有環氧樹脂之總計值,所謂硬化劑的反應基之合計數,表示各硬化劑的固體成分質量除以反應基當量所得的值對於硬化劑進行總計的值。藉由將環氧樹脂與硬化劑的量比設定在此範圍時,可進一步提高樹脂組成物之硬化物的耐熱性。When the resin composition contains (E) a hardener, the amount ratio of the epoxy resin to the hardener is at a ratio of [total number of epoxy groups of epoxy resin]: [total number of reactive groups of hardener], and The range of 1: 0.01 ~ 1: 2 is preferable, 1: 0.03 ~ 1: 3 is preferable, and 1: 0.05 ~ 1: 1.5 is more preferable. Among them, the reactive group of the hardener is an active hydroxyl group or the like, and it varies depending on the type of the hardener. In addition, the total number of epoxy groups of the epoxy resin means the value obtained by dividing the solid content mass of each epoxy resin by the epoxy equivalent with respect to the total value of all epoxy resins. The value obtained by dividing the solid content mass of each hardener by the reactive group equivalent is the total value of the hardeners. By setting the amount ratio of the epoxy resin to the hardener within this range, the heat resistance of the hardened product of the resin composition can be further improved.

樹脂組成物為含有(D)活性酯化合物及(E)硬化劑時,環氧樹脂與活性酯化合物的量比在[環氧樹脂的環氧基之合計數]:[(D)及(E)成分的反應基之合計數]之比率下,以1:0.01~1:5的範圍為佳,以1:0.05~1:3為較佳,以1:0.1~1:1.5為更佳。藉由將環氧樹脂與(D)成分及(E)成分的量比設定在該範圍時,可進一步提高樹脂組成物之硬化物的耐熱性。When the resin composition contains (D) an active ester compound and (E) a hardener, the amount ratio of the epoxy resin to the active ester compound is [total number of epoxy groups of the epoxy resin]: [(D) and (E ) The ratio of the total number of reaction groups of the components] is preferably in the range of 1: 0.01 to 1: 5, more preferably 1: 0.05 to 1: 3, and more preferably 1: 0.1 to 1: 1.5. When the amount ratio of the epoxy resin to the (D) component and the (E) component is set within this range, the heat resistance of the cured product of the resin composition can be further improved.

樹脂組成物為含有(E)硬化劑時,(E)硬化劑的含有量在將樹脂組成物中之不揮發成分作為100質量%時,以0.1質量%以上為佳,更佳為0.3質量%以上,較佳為0.5質量%以上。上限以5質量%以下為佳,較佳為3質量%以下,更佳為1質量%以下。藉由將(E)硬化劑的含有量設定在該範圍內時,可提高絕緣層與導體層之密著性。When the resin composition contains the (E) hardener, the content of the (E) hardener is preferably 0.1% by mass or more, and more preferably 0.3% by mass when the nonvolatile content in the resin composition is 100% by mass. The above is preferably 0.5% by mass or more. The upper limit is preferably 5 mass% or less, more preferably 3 mass% or less, and even more preferably 1 mass% or less. When the content of the (E) hardener is within this range, the adhesion between the insulating layer and the conductor layer can be improved.

<(F)硬化促進劑>
對於一實施形態,樹脂組成物為含有(F)硬化促進劑。作為硬化促進劑,例如可舉出磷系硬化促進劑、胺系硬化促進劑、咪唑系硬化促進劑、胍系硬化促進劑、金屬系硬化促進劑等,以磷系硬化促進劑、胺系硬化促進劑、咪唑系硬化促進劑、金屬系硬化促進劑為佳,以胺系硬化促進劑為較佳。硬化促進劑可單獨使用1種,亦可組合2種以上後使用。
< (F) Hardening accelerator >
In one embodiment, the resin composition contains (F) a hardening accelerator. Examples of the hardening accelerator include phosphorus-based hardening accelerators, amine-based hardening accelerators, imidazole-based hardening accelerators, guanidine-based hardening accelerators, and metal-based hardening accelerators. Phosphorus-based hardening accelerators and amine-based hardening agents are mentioned. Accelerators, imidazole-based hardening accelerators, and metal-based hardening accelerators are preferred, and amine-based hardening accelerators are more preferred. A hardening accelerator may be used individually by 1 type, and may be used in combination of 2 or more type.

作為磷系硬化促進劑,例如可舉出三苯基膦、鏻硼酸鹽化合物、四苯基鏻四苯基硼酸鹽、n-丁基鏻四苯基硼酸鹽、四丁基鏻癸烷酸鹽、(4-甲基苯基)三苯基鏻硫代氰酸酯、四苯基鏻硫代氰酸酯、丁基三苯基鏻硫代氰酸酯等,以三苯基膦、四丁基鏻癸烷酸鹽為佳。Examples of the phosphorus-based hardening accelerator include triphenylphosphine, osmium borate compounds, tetraphenylphosphonium tetraphenylborate, n-butylphosphonium tetraphenylborate, and tetrabutylphosphonium decanoate. (4-methylphenyl) triphenylphosphonium thiocyanate, tetraphenylphosphonium thiocyanate, butyltriphenylphosphonium thiocyanate, etc., with triphenylphosphine, tetrabutyl Phenyl decanoate is preferred.

作為胺系硬化促進劑,例如可舉出三乙基胺、三丁基胺等三烷基胺、4-二甲基胺基吡啶、苯甲基二甲基胺、2,4,6,-參(二甲基胺基甲基)酚、1,8-二氮雜雙環(5,4,0)-十一碳烯等,以4-二甲基胺基吡啶、1,8-二氮雜雙環(5,4,0)-十一碳烯為佳。Examples of the amine-based hardening accelerator include trialkylamines such as triethylamine and tributylamine, 4-dimethylaminopyridine, benzyldimethylamine, 2,4,6,- Ginseng (dimethylaminomethyl) phenol, 1,8-diazabicyclo (5,4,0) -undecene, etc., 4-dimethylaminopyridine, 1,8-diaza Heterobicyclic (5,4,0) -undecene is preferred.

作為咪唑系硬化促進劑,例如可舉出2-甲基咪唑、2-十一烷基咪唑、2-十七烷基咪唑、1,2-二甲基咪唑、2-乙基-4-甲基咪唑、1,2-二甲基咪唑、2-乙基-4-甲基咪唑、2-苯基咪唑、2-苯基-4-甲基咪唑、1-苯甲基-2-甲基咪唑、1-苯甲基-2-苯基咪唑、1-氰基乙基-2-甲基咪唑、1-氰基乙基-2-十一烷基咪唑、1-氰基乙基-2-乙基-4-甲基咪唑、1-氰基乙基-2-苯基咪唑、1-氰基乙基-2-十一烷基咪唑鎓偏苯三酸酯、1-氰基乙基-2-苯基咪唑鎓偏苯三酸酯、2,4-二胺基-6-[2’-甲基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-十一烷基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-乙基-4’-甲基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-甲基咪唑基-(1’)]-乙基-s-三嗪異氰脲酸加成物、2-苯基咪唑異氰脲酸加成物、2-苯基-4,5-二羥基甲基咪唑、2-苯基-4-甲基-5-羥基甲基咪唑、2,3-二氫-1H-吡咯並[1,2-a]苯並咪唑、1-十二烷基-2-甲基-3-苯甲基咪唑鎓氯化物、2-甲基咪唑啉、2-苯基咪唑啉等咪唑化合物及咪唑化合物與環氧樹脂的加成物,以2-乙基-4-甲基咪唑、1-苯甲基-2-苯基咪唑為佳。Examples of the imidazole-based hardening accelerator include 2-methylimidazole, 2-undecylimidazole, 2-heptadecylimidazole, 1,2-dimethylimidazole, and 2-ethyl-4-methyl Imidazole, 1,2-dimethylimidazole, 2-ethyl-4-methylimidazole, 2-phenylimidazole, 2-phenyl-4-methylimidazole, 1-benzyl-2-methyl Imidazole, 1-benzyl-2-phenylimidazole, 1-cyanoethyl-2-methylimidazole, 1-cyanoethyl-2-undecylimidazole, 1-cyanoethyl-2 -Ethyl-4-methylimidazole, 1-cyanoethyl-2-phenylimidazole, 1-cyanoethyl-2-undecylimidazolium trimellitate, 1-cyanoethyl 2-phenylimidazolium trimellitate, 2,4-diamino-6- [2'-methylimidazolyl- (1 ')]-ethyl-s-triazine, 2,4- Diamino-6- [2'-undecylimidazolyl- (1 ')]-ethyl-s-triazine, 2,4-diamino-6- [2'-ethyl-4' -Methylimidazolyl- (1 ')]-ethyl-s-triazine, 2,4-diamino-6- [2'-methylimidazolyl- (1')]-ethyl-s- Triazine isocyanurate adduct, 2-phenylimidazole isocyanurate adduct, 2-phenyl-4,5-dihydroxymethylimidazole, 2-phenyl-4-methyl-5- Hydroxymethylimidazole, 2,3-dihydro-1H-pyrrolo [1,2-a] Imidazole compounds such as imidazole, 1-dodecyl-2-methyl-3-benzylimidazolium chloride, 2-methylimidazoline, 2-phenylimidazoline, and the addition of imidazole compounds and epoxy resins The product is preferably 2-ethyl-4-methylimidazole or 1-benzyl-2-phenylimidazole.

作為咪唑系硬化促進劑,可使用市售品,例如可舉出三菱化學公司製的「P200-H50」等。As the imidazole-based hardening accelerator, a commercially available product can be used, and examples thereof include "P200-H50" manufactured by Mitsubishi Chemical Corporation.

作為胍系硬化促進劑,例如可舉出二氰二胺、1-甲基胍、1-乙基胍、1-環己基胍、1-苯基胍、1-(o-甲苯基)胍、二甲基胍、二苯基胍、三甲基胍、四甲基胍、五甲基胍、1,5,7-三氮雜聯環[4.4.0]癸-5-烯、7-甲基-1,5,7-三氮雜聯環[4.4.0]癸-5-烯、1-甲基雙胍、1-乙基雙胍、1-n-丁基雙胍、1-n-十八烷基雙胍、1,1-二甲基雙胍、1,1-二乙基雙胍、1-環己基雙胍、1-烯丙基雙胍、1-苯基雙胍、1-(o-甲苯基)雙胍等,以二氰二胺、1,5,7-三氮雜聯環[4.4.0]癸-5-烯為佳。Examples of the guanidine-based hardening accelerator include dicyandiamine, 1-methylguanidine, 1-ethylguanidine, 1-cyclohexylguanidine, 1-phenylguanidine, 1- (o-tolyl) guanidine, Dimethylguanidine, diphenylguanidine, trimethylguanidine, tetramethylguanidine, pentamethylguanidine, 1,5,7-triazabicyclo [4.4.0] dec-5-ene, 7-methyl -1,5,7-triazabicyclo [4.4.0] dec-5-ene, 1-methyl biguanide, 1-ethyl biguanide, 1-n-butyl biguanide, 1-n-octadecyl Alkyl biguanide, 1,1-dimethyl biguanide, 1,1-diethyl biguanide, 1-cyclohexyl biguanide, 1-allyl biguanide, 1-phenyl biguanide, 1- (o-tolyl) biguanide Etc. Preferably, dicyandiamine, 1,5,7-triazabicyclo [4.4.0] dec-5-ene is preferred.

作為金屬系硬化促進劑,例如可舉出鈷、銅、鋅、鐵、鎳、錳、錫等金屬的有機金屬錯體或有機金屬鹽。作為有機金屬錯體的具體例子,可舉出鈷(II)乙醯丙酮酸酯、鈷(III)乙醯丙酮酸酯等有機鈷錯體、銅(II)乙醯丙酮酸酯等有機銅錯體、鋅(II)乙醯丙酮酸酯等有機鋅錯體、鐵(III)乙醯丙酮酸酯等有機鐵錯體、鎳(II)乙醯丙酮酸酯等有機鎳錯體、錳(II)乙醯丙酮酸酯等有機錳錯體等。作為有機金屬鹽,例如可舉出辛基酸鋅、辛基酸錫、環烷烴酸鋅、環烷烴酸鈷、硬脂酸錫、硬脂酸鋅等。Examples of the metal-based hardening accelerator include organometallic complexes or organometallic salts of metals such as cobalt, copper, zinc, iron, nickel, manganese, and tin. Specific examples of the organometallic complex include organic cobalt complexes such as cobalt (II) acetopyruvate and cobalt (III) acetopyruvate, and organic copper complexes such as copper (II) acetopyruvate Body, organic zinc complexes such as zinc (II) acetam pyruvate, organic iron complexes such as iron (III) acetam pyruvate, organic nickel complexes such as nickel (II) acetam pyruvate, and manganese (II ) Organomanganese complexes such as acetamidine pyruvate and the like. Examples of the organic metal salt include zinc octanoate, tin octanoate, zinc naphthenate, cobalt naphthenate, tin stearate, and zinc stearate.

樹脂組成物為含有(F)硬化促進劑時,硬化促進劑的含有量在將樹脂組成物中之不揮發成分作為100質量%時,以0.01質量%以上為佳,較佳為0.05質量%以上,更佳為0.1質量%以上。上限以3質量%以下為佳,較佳為2質量%以下,更佳為1質量%以下。藉由將硬化促進劑的含有量設定在該範圍內時,可使用使用大量無機填充材時的高溫高濕環境下之環境試驗後的密著力特別優良的硬化物。When the resin composition contains (F) a hardening accelerator, the content of the hardening accelerator is preferably 0.01% by mass or more, and more preferably 0.05% by mass or more, when the nonvolatile component in the resin composition is 100% by mass. And more preferably 0.1% by mass or more. The upper limit is preferably 3% by mass or less, more preferably 2% by mass or less, and even more preferably 1% by mass or less. When the content of the hardening accelerator is set within this range, a hardened product having particularly excellent adhesion after an environmental test under a high temperature and high humidity environment when a large amount of inorganic filler is used can be used.

<(G)熱塑性樹脂>
對於一實施形態,樹脂組成物為含有(G)熱塑性樹脂。作為(G)熱塑性樹脂,例如可舉出苯氧基樹脂、聚乙烯縮醛樹脂、聚烯烴樹脂、聚丁二烯樹脂、聚醯亞胺樹脂、聚醯胺醯亞胺樹脂、聚醚醯亞胺樹脂、聚碸樹脂、聚迷碸樹脂、聚伸苯基醚樹脂、聚碳酸酯樹脂、聚醚醚酮樹脂、聚酯樹脂等,以苯氧基樹脂為佳。熱塑性樹脂可單獨使用1種,或可組合2種以上後使用。
< (G) Thermoplastic resin >
In one embodiment, the resin composition is a thermoplastic resin containing (G). Examples of (G) thermoplastic resin include phenoxy resin, polyvinyl acetal resin, polyolefin resin, polybutadiene resin, polyimide resin, polyimide resin, and polyetherimide. Amine resins, polyfluorene resins, polymethylene resins, polyphenylene ether resins, polycarbonate resins, polyetheretherketone resins, polyester resins, and the like are preferably phenoxy resins. The thermoplastic resin may be used singly or in combination of two or more kinds.

(G)熱塑性樹脂的聚苯乙烯換算之重量平均分子量,以38000以上為佳,較佳為40000以上,更佳為42000以上。上限以100000以下為佳,較佳為70000以下,更佳為60000以下。(G)熱塑性樹脂的聚苯乙烯換算之重量平均分子量可由凝膠滲透層析法(GPC)法所測定。具體而言,(G)熱塑性樹脂的聚苯乙烯換算之重量平均分子量為,作為測定裝置使用島津製作所公司製LC-9A/RID-6A,作為管柱使用昭和電工公司製Shodex K-800P/K-804L/K-804L,作為移動相使用氯仿等,將管柱溫度設定在40℃下測定,使用標準聚苯乙烯之標準曲線而算出。(G) The polystyrene equivalent weight average molecular weight of the thermoplastic resin is preferably 38,000 or more, more preferably 40,000 or more, and even more preferably 42,000 or more. The upper limit is preferably 100,000 or less, more preferably 70,000 or less, and even more preferably 60,000 or less. (G) The polystyrene-equivalent weight average molecular weight of the thermoplastic resin can be measured by a gel permeation chromatography (GPC) method. Specifically, the weight average molecular weight in terms of polystyrene in terms of (G) thermoplastic resin is that LC-9A / RID-6A manufactured by Shimadzu Corporation is used as a measuring device, and Shodex K-800P / K manufactured by Showa Denko Corporation is used as a column. -804L / K-804L, using chloroform or the like as a mobile phase, measuring the column temperature at 40 ° C, and calculating using a standard polystyrene calibration curve.

作為苯氧基樹脂,例如可舉出具有選自由雙酚A骨架、雙酚F骨架、雙酚S骨架、雙酚苯乙酮骨架、酚醛清漆骨架、聯苯基骨架、芴骨架、二環戊二烯骨架、降冰片烯骨架、萘骨架、蒽骨架、金剛烷骨架、萜烯骨架及三甲基環己烷骨架所成群的1種以上骨架之苯氧基樹脂。苯氧基樹脂的末端可為酚性羥基、環氧基等中任一種官能基。苯氧基樹脂可單獨使用1種,亦可組合2種以上後使用。作為苯氧基樹脂的具體例子,可舉出三菱化學公司製的「1256」及「4250」(皆為含有雙酚A骨架的苯氧基樹脂)、「YX8100」(含有雙酚S骨架的苯氧基樹脂)及「YX6954」(含有雙酚苯乙酮骨架的苯氧基樹脂),其他亦可舉出新日鐵住金化學公司製的「FX280」及「FX293」、三菱化學公司製的「YL7500BH30」、「YX6954BH30」、「YX7553」、「YX7553BH30」、「YL7769BH30」、「YL6794」、「YL7213」、「YL7290」及「YL7482」等。Examples of the phenoxy resin include those having a structure selected from the group consisting of a bisphenol A skeleton, a bisphenol F skeleton, a bisphenol S skeleton, a bisphenol acetophenone skeleton, a novolac skeleton, a biphenyl skeleton, a fluorene skeleton, and dicyclopentane. One or more types of phenoxy resins composed of a diene skeleton, a norbornene skeleton, a naphthalene skeleton, an anthracene skeleton, an adamantane skeleton, a terpene skeleton, and a trimethylcyclohexane skeleton. The terminal of the phenoxy resin may be any functional group such as a phenolic hydroxyl group or an epoxy group. The phenoxy resin may be used singly or in combination of two or more kinds. Specific examples of the phenoxy resin include "1256" and "4250" (both are phenoxy resins containing a bisphenol A skeleton) and "YX8100" (benzenes containing a bisphenol S skeleton) manufactured by Mitsubishi Chemical Corporation. Oxyresin) and "YX6954" (phenoxy resin containing bisphenol acetophenone skeleton), and other examples include "FX280" and "FX293" manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd., and "FX293" manufactured by Mitsubishi Chemical Corporation "YL7500BH30", "YX6954BH30", "YX7553", "YX7553BH30", "YL7769BH30", "YL6794", "YL7213", "YL7290" and "YL7482", etc.

作為聚乙烯縮醛樹脂,例如可舉出聚乙烯甲醛樹脂、聚乙烯縮丁醛樹脂,以聚乙烯縮丁醛樹脂為佳。作為聚乙烯縮醛樹脂的具體例子,例如可舉出電氣化學工業公司製的「電化縮丁醛4000-2」、「電化縮丁醛5000-A」、「電化縮丁醛6000-C」、「電化縮丁醛6000-EP」、積水化學工業公司製的S-LECBH系列、BX系列(例如BX-5Z)、KS系列(例如KS-1)、BL系列、BM系列等。Examples of the polyvinyl acetal resin include polyvinyl formaldehyde resin and polyvinyl butyral resin, and polyvinyl butyral resin is preferred. Specific examples of the polyvinyl acetal resin include, for example, "Electrobutyral 4000-2", "Electrobutyral 5000-A", "Electrobutyral 6000-C", manufactured by Denki Kogyo Co., Ltd., "Electrochemical butyral 6000-EP", S-LECBH series, BX series (such as BX-5Z), KS series (such as KS-1), BL series, BM series, etc. manufactured by Sekisui Chemical Industry Co., Ltd.

作為聚醯亞胺樹脂的具體例子,可舉出新日本理化公司製的「RIKACOATSN20」及「RIKACOATPN20」。作為聚醯亞胺樹脂的具體例子,可舉出將2官能性羥基末端聚丁二烯、二異氰酸酯化合物及四價酸酐進行反應所得的線狀聚醯亞胺(特開2006-37083號公報記載的聚醯亞胺)、聚矽氧烷骨架含有聚醯亞胺(特開2002-12667號公報及特開2000-319386號公報等所記載的聚醯亞胺)等變性聚醯亞胺。Specific examples of the polyimide resin include "RIKACOATSN20" and "RIKACOATPN20" manufactured by Shinnippon Chemical Co., Ltd. Specific examples of the polyfluorene imide resin include a linear polyfluorene imide obtained by reacting a bifunctional hydroxyl-terminated polybutadiene, a diisocyanate compound, and a tetravalent acid anhydride (described in Japanese Patent Application Laid-Open No. 2006-37083). Polyimide), and a polysiloxane skeleton containing modified polyimide (polyimide described in JP 2002-12667 and JP 2000-319386, etc.).

作為聚醯胺醯亞胺樹脂的具體例子,可舉出東洋紡績公司製的「VylomaxHR11NN」及「VylomaxHR16NN」。作為聚醯胺醯亞胺樹脂的具體例子,可舉出日立化成工業公司製的「KS9100」、「KS9300」(含有聚矽氧烷骨架的聚醯胺醯亞胺)等變性聚醯胺醯亞胺。Specific examples of the polyamidamine / imide resin include "VylomaxHR11NN" and "VylomaxHR16NN" manufactured by Toyobo Corporation. Specific examples of the polyimide resin include denatured polyimide resins such as "KS9100" and "KS9300" (polysiloxane imide containing a polysiloxane skeleton) manufactured by Hitachi Chemical Industries, Ltd. amine.

作為聚迷碸樹脂的具體例子,可舉出住友化學公司製的「PES5003P」等。作為聚伸苯基醚樹脂的具體例子,可舉出三菱瓦斯化學公司製的寡伸苯基醚・苯乙烯樹脂「OPE-2St 1200」等。Specific examples of the polymetamidine resin include "PES5003P" manufactured by Sumitomo Chemical Co., Ltd. and the like. Specific examples of the polyphenylene ether resin include oligophenylene ether styrene resin "OPE-2St 1200" manufactured by Mitsubishi Gas Chemical Company.

作為聚碸樹脂的具體例子,可舉出Solvay Advanced Polymers公司製的聚碸「P1700」、「P3500」等。Specific examples of the polyfluorene resin include polyfluorene "P1700" and "P3500" manufactured by Solvay Advanced Polymers.

其中,作為(G)熱塑性樹脂,以苯氧基樹脂、聚乙烯縮醛樹脂為佳。因次,對於較佳的一實施形態,熱塑性樹脂含有選自由苯氧基樹脂及聚乙烯縮醛樹脂所成群的1種以上。其中作為熱塑性樹脂,以苯氧基樹脂為佳,以重量平均分子量為40,000以上的苯氧基樹脂為特佳。Among them, as the (G) thermoplastic resin, a phenoxy resin and a polyvinyl acetal resin are preferred. Therefore, in a preferred embodiment, the thermoplastic resin contains one or more members selected from the group consisting of a phenoxy resin and a polyvinyl acetal resin. Among them, as the thermoplastic resin, a phenoxy resin is preferable, and a phenoxy resin having a weight average molecular weight of 40,000 or more is particularly preferable.

樹脂組成物為含有(G)熱塑性樹脂時,(G)熱塑性樹脂的含有量在將樹脂組成物之不揮發成分作為100質量%時,以0.1質量%以上為佳,較佳為0.2質量%以上,更佳為0.3質量%以上。上限以5質量%以下為佳,較佳為3質量%以下,更佳為1質量%以下。若將(G)熱塑性樹脂的含有量設定在該範圍內時,可得到使用大量無機填充材時的高溫高濕環境下之環境試驗後的密著力為特優的硬化物。When the resin composition contains a (G) thermoplastic resin, the content of the (G) thermoplastic resin is preferably 0.1% by mass or more, and more preferably 0.2% by mass or more, when the nonvolatile content of the resin composition is 100% by mass. And more preferably 0.3% by mass or more. The upper limit is preferably 5 mass% or less, more preferably 3 mass% or less, and even more preferably 1 mass% or less. When the content of the (G) thermoplastic resin is set within this range, a cured product having particularly excellent adhesion after an environmental test under a high temperature and high humidity environment when a large amount of inorganic filler is used can be obtained.

<(H)任意之添加劑>
對於一實施形態,樹脂組成物為進一步配合所需,可含有其他添加劑,作為該其他添加劑,例如可舉出難燃劑、有機填充材、有機銅化合物、有機鋅化合物及有機鈷化合物等有機金屬化合物,以及增黏劑、消泡劑、塗平劑、密著性賦予劑及著色劑等樹脂添加劑等。
< (H) Any additive >
In one embodiment, the resin composition may contain other additives for further blending. Examples of the other additives include organic metals such as flame retardants, organic fillers, organic copper compounds, organic zinc compounds, and organic cobalt compounds. Compounds, and resin additives such as tackifiers, defoamers, leveling agents, adhesion imparting agents, and coloring agents.

作為難燃劑,例如可舉出磷腈化合物、有機磷系難燃劑、有機系氮含有磷化合物、氮化合物、聚矽氧系難燃劑、金屬氫氧化物等。作為磷腈化合物的具體例子,例如可舉出大塚化學公司製的「SPH-100」、「SPS-100」、「SPB-100」「SPE-100」、伏見製藥所公司製的「FP-100」、「FP-110」、「FP-300」、「FP-400」等,作為磷腈化合物以外的難燃劑,可使用市售品,例如可舉出三光公司製的「HCA-HQ」、大八化學工業公司製的「PX-200」等。Examples of the flame retardant include a phosphazene compound, an organic phosphorus-based flame retardant, an organic nitrogen-containing phosphorus compound, a nitrogen compound, a polysiloxane flame retardant, and a metal hydroxide. Specific examples of the phosphazene compound include "SPH-100", "SPS-100", "SPB-100", "SPE-100" manufactured by Otsuka Chemical Corporation, and "FP-100" manufactured by Fushimi Pharmaceutical Co., Ltd. "", "FP-110", "FP-300", "FP-400", etc., as flame retardants other than phosphazene compounds, commercially available products can be used, for example, "HCA-HQ" manufactured by Sanko Corporation , "PX-200" manufactured by Big Eight Chemical Industries, etc.

作為有機填充材,可使用在形成印刷電路板的絕緣層時所使用的任意有機填充材,例如可舉出橡膠粒子、聚醯胺微粒子、聚矽氧粒子等。作為橡膠粒子,可使用市售品,例如可舉出陶氏・化學日本公司製的「EXL2655」、艾卡工業公司製的「AC3401N」、「AC3816N」等。As the organic filler, any organic filler used when forming an insulating layer of a printed circuit board can be used, and examples thereof include rubber particles, polyamide fine particles, and polysiloxane particles. As the rubber particles, commercially available products can be used, and examples thereof include "EXL2655" manufactured by Dow Chemical Japan, "AC3401N" and "AC3816N" manufactured by Aika Industries.

<樹脂組成物之物性、用途>
將樹脂組成物在100℃進行30分鐘,在170℃進行30分鐘,其後在200℃進行90分鐘的熱硬化之硬化物,通常顯示環境試驗(HAST試驗)前的銅箔拉剝強度(剝離強度)優良的特性。即,得到環境試驗前之密著性優良的絕緣層。作為環境試驗前之剝離強度,以0.5kgf/cm以上為佳,較佳為0.55kgf/cm以上,更佳為0.6kgf/cm以上。上限雖無特別限定,可得到10kgf/cm以下等。環境試驗前的銅箔拉剝強度可藉由如後述實施例所記載的方法進行測定。
<Physical properties and uses of resin composition>
The resin composition was cured at 100 ° C. for 30 minutes, at 170 ° C. for 30 minutes, and then at 200 ° C. for 90 minutes. The cured product usually showed the copper foil peel strength (peeling) before the environmental test (HAST test). Strength) Excellent characteristics. That is, an insulating layer having excellent adhesion before the environmental test was obtained. The peel strength before the environmental test is preferably 0.5 kgf / cm or more, more preferably 0.55 kgf / cm or more, and still more preferably 0.6 kgf / cm or more. Although the upper limit is not particularly limited, 10 kgf / cm or less can be obtained. The copper foil peeling strength before the environmental test can be measured by the method described in Examples described later.

將樹脂組成物在100℃進行30分鐘,在170℃進行30分鐘,其後在200℃進行90分鐘熱硬化的硬化物,通常顯示環境試驗後的銅箔拉剝強度(剝離強度)優良之特性。即,可得到環境試驗後之密著性優良,經過長期間可發揮高密著性之絕緣層。作為環境試驗後的剝離強度,以0.15kgf/cm以上為佳,較佳為0.2kgf/cm以上,更佳為0.25kgf/cm以上。上限雖無特別限定,可得到10kgf/cm以下等。環境試驗後的剝離強度可藉由後述實施例所記載的方法進行測定。The resin composition is cured at 100 ° C. for 30 minutes, at 170 ° C. for 30 minutes, and then at 200 ° C. for 90 minutes. The cured product usually exhibits excellent copper foil tensile strength (peel strength) after environmental testing. . That is, an insulating layer having excellent adhesion after an environmental test and exhibiting high adhesion over a long period of time can be obtained. The peel strength after the environmental test is preferably 0.15 kgf / cm or more, more preferably 0.2 kgf / cm or more, and even more preferably 0.25 kgf / cm or more. Although the upper limit is not particularly limited, 10 kgf / cm or less can be obtained. The peel strength after the environmental test can be measured by a method described in Examples described later.

將樹脂組成物在100℃進行30分鐘,其後在170℃進行30分鐘熱硬化的硬化物,通常顯示優良的污跡除去性之特性。即,於前述硬化物中即使形成貫通孔,會得到貫通孔底部之最大污跡長為5μm以下的絕緣層。污跡除去性藉由後述實施例所記載的方法進行測定。The hardened | cured material which heat-cured the resin composition at 100 degreeC for 30 minutes, and 170 degreeC for 30 minutes after that normally shows the characteristic of the outstanding stain | stain removal property. That is, even if a through-hole is formed in the hardened material, an insulating layer having a maximum stain length of 5 μm or less at the bottom of the through-hole is obtained. The stain removal property was measured by the method described in Examples described later.

本發明之樹脂組成物具有優良薄膜絕緣性,且在高溫高濕環境下的環境試驗後,可得到可維持與導體層之間的密著性之絕緣層。因此,本發明之樹脂組成物適合作為絕緣用途的樹脂組成物使用。具體為欲形成在絕緣層上所形成的導體層(含有再配線層)之該絕緣層在形成時使用的樹脂組成物(使用於形成導體層的絕緣層形成用樹脂組成物),可適合作為欲形成印刷電路板的絕緣層之樹脂組成物(印刷電路板之絕緣層用樹脂組成物)使用,可適合作為欲形成印刷電路板的層間絕緣層之樹脂組成物(印刷電路板之層間絕緣層用樹脂組成物)使用。又,本發明之樹脂組成物因可達成零件嵌入性良好的絕緣層,故亦可適合作為印刷電路板為零件內藏迴路板時使用。
又,例如經由以下(1)~(6)步驟製造半導體晶片封裝時,本發明之樹脂組成物可適合作為欲形成再配線層之絕緣層的再配線形成層用之樹脂組成物(再配線形成層形成用之樹脂組成物),及欲封住半導體晶片的樹脂組成物(半導體晶片封止用之樹脂組成物)使用。製造半導體晶片封裝時,於封止層上可進一步形成再配線層。
(1)於基材層合臨時固定薄膜之步驟、
(2)將半導體晶片臨時固定於臨時固定薄膜上的步驟、
(3)於半導體晶片上形成封止層的步驟、
(4)將基材及臨時固定薄膜自半導體晶片進行剝離的步驟、
(5)半導體晶片的基材及於剝離臨時固定薄膜的面上,形成作為絕緣層的再配線形成層的步驟,及
(6)於再配線形成層上作為導體層形成再配線層的步驟。
The resin composition of the present invention has excellent thin-film insulation properties, and after an environmental test under a high-temperature and high-humidity environment, an insulation layer capable of maintaining adhesion with the conductor layer can be obtained. Therefore, the resin composition of the present invention is suitable for use as a resin composition for insulation applications. Specifically, it is a resin composition (a resin composition for forming an insulating layer used to form a conductor layer) used when the insulating layer to be formed on the conductive layer (including a redistribution layer) to be formed is suitable for use as an insulating layer. A resin composition (resin composition for an insulating layer of a printed circuit board) to be used for forming an insulating layer of a printed circuit board, and is suitable as a resin composition (interlayer insulation layer of a printed circuit board) to be used for forming an interlayer insulation layer of a printed circuit board. Use resin composition). In addition, the resin composition of the present invention can be suitably used when the printed circuit board is a circuit board with built-in parts because it can achieve an insulating layer with good part embedding properties.
In addition, for example, when manufacturing a semiconductor wafer package through the following steps (1) to (6), the resin composition of the present invention can be suitably used as a resin composition (rewiring formation) for a rewiring formation layer in which an insulating layer of the rewiring layer is to be formed. A resin composition for forming a layer), and a resin composition for sealing a semiconductor wafer (resin composition for sealing a semiconductor wafer). When manufacturing a semiconductor chip package, a redistribution layer may be further formed on the sealing layer.
(1) the step of laminating a temporary fixing film on a substrate,
(2) a step of temporarily fixing a semiconductor wafer to a temporary fixing film,
(3) a step of forming a sealing layer on a semiconductor wafer,
(4) a step of peeling the substrate and the temporary fixing film from the semiconductor wafer,
(5) a step of forming a rewiring forming layer as an insulating layer on the substrate of the semiconductor wafer and the surface on which the temporary fixing film is peeled, and
(6) A step of forming a redistribution layer as a conductor layer on the redistribution forming layer.

[樹脂薄片]
本發明之樹脂薄片含有支持體,與設置於該支持體上的由本發明之樹脂組成物所形成的樹脂組成物層。
[Resin sheet]
The resin sheet of the present invention includes a support and a resin composition layer formed on the support and formed from the resin composition of the present invention.

樹脂組成物層之厚度由印刷電路板之薄型化,及即使為薄膜亦可提高優良絕緣性的硬化物之觀點來看,以15μm以下為佳,較佳為13μm以下,更佳為10μm以下或8μm以下。樹脂組成物層的厚度之下限雖無特別限定,通常為1μm以上,1.5μm以上,2μm以上等。The thickness of the resin composition layer is preferably 15 μm or less, more preferably 13 μm or less, and more preferably 10 μm or less from the viewpoint of reducing the thickness of the printed circuit board and a cured material that can improve the insulation even with a thin film. 8 μm or less. Although the lower limit of the thickness of the resin composition layer is not particularly limited, it is usually 1 μm or more, 1.5 μm or more, 2 μm or more, and the like.

作為支持體,例如可舉出由塑質材料所成的薄膜、金屬箔、離型紙、由塑質材料所成的薄膜、金屬箔為佳。Examples of the support include a film made of a plastic material, a metal foil, a release paper, a film made of a plastic material, and a metal foil.

作為支持體使用由塑質材料所成的薄膜時,作為塑質材料,例如可舉出聚乙烯對苯二甲酸乙二醇酯(以下有時簡稱為「PET」)、聚乙烯萘二甲酸酯(以下有時簡稱為「PEN」)等聚酯、聚碳酸酯(以下有時簡稱為「PC」)、聚甲基甲基丙烯酸酯(PMMA)等丙烯酸、環狀聚烯烴、三乙醯纖維素(TAC)、聚醚硫化物(PES)、聚醚酮、聚醯亞胺等。其中亦以聚乙烯對苯二甲酸乙二醇酯、聚乙烯萘二甲酸酯為佳,以便宜的聚乙烯對苯二甲酸乙二醇酯為特佳。When a film made of a plastic material is used as a support, examples of the plastic material include polyethylene terephthalate (hereinafter sometimes referred to as "PET") and polyethylene naphthalate Polyesters such as esters (hereinafter sometimes referred to simply as "PEN"), acrylics such as polymethylmethacrylate (PMMA), cyclic polyolefins, and triethylpyrene Cellulose (TAC), polyether sulfide (PES), polyetherketone, polyimide and the like. Among them, polyethylene terephthalate and polyethylene naphthalate are preferred, and cheap polyethylene terephthalate is particularly preferred.

作為支持體使用金屬箔時,作為金屬箔,例如可舉出銅箔、鋁箔等,以銅箔為佳。作為銅箔,可使用由銅的單一金屬所成的箔,亦可使用由銅與其他金屬(例如錫、鉻、銀、鎂、鎳、鋯、矽、鈦等)之合金所成的箔。When a metal foil is used as a support, examples of the metal foil include copper foil and aluminum foil, and copper foil is preferred. As the copper foil, a foil made of a single metal of copper may be used, or a foil made of an alloy of copper and other metals (for example, tin, chromium, silver, magnesium, nickel, zirconium, silicon, titanium, etc.) may be used.

支持體為在與樹脂組成物層接合的面上可施予消光處理、電暈處理、帶電防止處理。The support is such that a matting treatment, a corona treatment, or a charge prevention treatment can be applied to the surface bonded to the resin composition layer.

又,作為支持體,於與樹脂組成物層接合的面上可使用具有離型層的附有離型層之支持體。作為使用於附有離型層之支持體的離型層之離型劑,例如可舉出選自由醇酸樹脂、聚烯烴樹脂、胺基甲酸酯樹脂及聚矽氧樹脂所成群的1種以上離型劑。附有離型層的支持體可使用市售品,例如可舉出具有將醇酸樹脂系離型劑作為主成分的離型層之PET薄膜的Lintec公司製的「SK-1」、「AL-5」、「AL-7」、Toray公司製的「Lumirror T60」、帝人公司製的「Purex」、Unitika公司製的「Unipiel」等。As the support, a support having a release layer and a release layer having a release layer can be used on the surface bonded to the resin composition layer. Examples of the release agent used in the release layer of a support provided with a release layer include 1 selected from the group consisting of alkyd resins, polyolefin resins, urethane resins, and silicone resins. More than one release agent. A commercially available product can be used as the support with a release layer, and examples thereof include "SK-1" and "AL" made by Lintec Corporation, which are PET films having a release layer containing an alkyd resin-based release agent as a main component. -5 "," AL-7 "," Lumirror T60 "manufactured by Toray Corporation," Purex "manufactured by Teijin Corporation," Unipiel "manufactured by Unitika Corporation, etc.

作為支持體的厚度,雖無特別限定,以5μm~75μm的範圍為佳,以10μm~60μm的範圍為較佳。且,使用附有離型層的支持體時,附有離型層的支持體全體厚度設定在上述範圍者為佳。The thickness of the support is not particularly limited, but is preferably in the range of 5 to 75 μm, and more preferably in the range of 10 to 60 μm. When a support with a release layer is used, the thickness of the entire support with a release layer is preferably set to the above range.

對於一實施形態,樹脂薄片中視必要可進一步含有其他層。作為該其他層,例如可舉出設置於不與樹脂組成物層的支持體接合之面(即,與支持體為反對側的面)上的以支持體為準的保護薄膜等。保護薄膜的厚度並非特別限定者,例如為1μm~40μm。藉由層合保護薄膜,可抑制對樹脂組成物層表面的垃圾等附著或刮痕。In one embodiment, the resin sheet may further include other layers as necessary. Examples of the other layer include a protective film based on a support provided on a surface that is not bonded to the support of the resin composition layer (that is, a surface on the opposite side to the support). The thickness of the protective film is not particularly limited, and is, for example, 1 μm to 40 μm. By laminating the protective film, adhesion or scratches on the surface of the resin composition layer can be suppressed.

樹脂薄片例如可藉由於有機溶劑溶解樹脂組成物後調製出樹脂塗漆,將該樹脂塗漆使用模具塗布等塗布於支持體上,進一步乾燥後形成樹脂組成物層而製造。The resin sheet can be produced by, for example, dissolving a resin composition with an organic solvent to prepare a resin varnish, applying the resin varnish to a support using a mold coating, and then drying the resin composition to form a resin composition layer.

作為有機溶劑,例如可舉出丙酮、甲基乙基酮(MEK)及環己酮等酮類;乙酸乙酯、乙酸丁酯、溶纖劑乙酸酯、丙二醇單甲基醚乙酸酯及卡必醇乙酸酯等乙酸酯類;溶纖劑及丁基卡必醇等卡必醇類;甲苯及二甲苯等的芳香族烴類;二甲基甲醯胺、二甲基乙醯胺(DMAc)及N-甲基吡咯啶酮等醯胺系溶劑等。有機溶劑可單獨使用1種,亦可組合2種以上後使用。Examples of the organic solvent include ketones such as acetone, methyl ethyl ketone (MEK), and cyclohexanone; ethyl acetate, butyl acetate, cellosolve acetate, propylene glycol monomethyl ether acetate, and Carbitol acetate and other acetates; Cellulosics and carbitol such as butyl carbitol; Aromatic hydrocarbons such as toluene and xylene; dimethylformamide and dimethylacetamide (DMAc) and ammonium solvents such as N-methylpyrrolidone and the like. An organic solvent may be used individually by 1 type, and may be used in combination of 2 or more type.

乾燥為可藉由加熱、吹熱風等公知方法實施。乾燥條件雖無特別限定,樹脂組成物層中之有機溶劑的含有量為10質量%以下,乾燥成5質量%以下者為佳。雖依據樹脂塗漆中之有機溶劑的沸點而相異,例如使用含有30質量%~60質量%的有機溶劑之樹脂塗漆時,藉由在50℃~150℃進行3分鐘~10分鐘乾燥後,可形成樹脂組成物層。Drying can be performed by a known method such as heating and blowing hot air. Although the drying conditions are not particularly limited, the content of the organic solvent in the resin composition layer is preferably 10% by mass or less, and it is preferable that the content is dried to 5% by mass or less. Although it varies depending on the boiling point of the organic solvent in the resin coating, for example, when using a resin coating containing 30% to 60% by mass of an organic solvent, drying is performed at 50 ° C to 150 ° C for 3 minutes to 10 minutes. , Can form a resin composition layer.

樹脂薄片可捲成滾筒狀後保存。樹脂薄片為具有保護薄膜時,可藉由剝落保護薄膜後使用。The resin sheet can be rolled into a roll and stored. When the resin sheet has a protective film, it can be used after peeling off the protective film.

本發明之樹脂薄片為在薄膜絕緣性及高溫高濕環境下的環境試驗後,可到維持與導體層之間的密著性之絕緣層(樹脂組成物層的硬化物)。因此,本發明之樹脂薄片可適合作為欲形成印刷電路板的絕緣層(印刷電路板的絕緣層形成用)之樹脂薄片使用,可更適合作為欲形成印刷電路板的層間絕緣層之樹脂薄片(印刷電路板之層間絕緣層用樹脂薄片)使用。又,例如對於含有第1導體層、第2導體層、於第1導體層及第2導體層之間所形成的絕緣層之印刷電路板,藉由以本發明之樹脂薄片而形成絕緣層,將與第1及第2導體層的間隔(第1及第2導體層間的絕緣層厚度)設定在6μm以下(以5.5μm以下為佳,較佳為5μm以下)但成為具有優良的薄膜絕緣性者。The resin sheet of the present invention is an insulating layer (hardened product of a resin composition layer) capable of maintaining adhesion to a conductor layer after an environmental test under a thin film insulation property and a high temperature and high humidity environment. Therefore, the resin sheet of the present invention can be suitably used as a resin sheet for forming an insulating layer of a printed circuit board (for forming an insulating layer of a printed circuit board), and can be more suitably used as a resin sheet for forming an interlayer insulating layer of a printed circuit board ( A resin sheet for an interlayer insulating layer of a printed circuit board). In addition, for a printed wiring board including a first conductor layer, a second conductor layer, and an insulating layer formed between the first conductor layer and the second conductor layer, an insulating layer is formed by the resin sheet of the present invention, The distance from the first and second conductor layers (the thickness of the insulating layer between the first and second conductor layers) is set to 6 μm or less (preferably 5.5 μm or less, and preferably 5 μm or less), but it has excellent film insulation By.

[印刷電路板]
本發明之印刷電路板為含有藉由本發明之樹脂組成物的硬化物所形成的絕緣層、第1導體層及第2導體層。絕緣層為設置於第1導體層與第2導體層之間,第1導體層與第2導體層設定為絕緣(導體層有時稱為配線層)。
[A printed circuit board]
The printed circuit board of the present invention includes an insulating layer, a first conductor layer, and a second conductor layer formed of a cured product of the resin composition of the present invention. The insulating layer is provided between the first conductor layer and the second conductor layer, and the first conductor layer and the second conductor layer are provided as insulation (the conductor layer is sometimes referred to as a wiring layer).

絕緣層因可藉由本發明之樹脂組成物的硬化物形成,故具有優良的薄膜絕緣性。因此,第1及第2導體層間的絕緣層厚度以6μm以下為佳,較佳為5.5μm以下,更佳為5μm以下。雖對於下限並無特別限定,但可設定為0.1μm以上等。所謂第1導體層與第2導體層的間隔(第1及第2導體層間的絕緣層厚度),如圖1所示一例子,其為第1導體層1的主面11與第2導體層2的主面21間之絕緣層3的厚度t1而言。第1及第2導體層為隔著絕緣層而鄰接的導體層,主面11及主面21為彼此面對面。Since the insulating layer can be formed from the cured product of the resin composition of the present invention, it has excellent thin film insulation properties. Therefore, the thickness of the insulating layer between the first and second conductor layers is preferably 6 μm or less, more preferably 5.5 μm or less, and even more preferably 5 μm or less. Although the lower limit is not particularly limited, it may be set to 0.1 μm or more. The distance between the first conductor layer and the second conductor layer (the thickness of the insulating layer between the first and second conductor layers) is an example shown in FIG. 1, which is the main surface 11 of the first conductor layer 1 and the second conductor layer. In terms of the thickness t1 of the insulating layer 3 between the main surfaces 21 of 2. The first and second conductor layers are conductor layers adjacent to each other via an insulating layer, and the main surface 11 and the main surface 21 face each other.

且,絕緣層全體的厚度t2以15μm以下為佳,較佳為13μm以下,更佳為10μm以下。雖對下限並無特別限定,通常為1μm以上、1.5μm以上、2μm以上等。The thickness t2 of the entire insulating layer is preferably 15 μm or less, more preferably 13 μm or less, and even more preferably 10 μm or less. Although the lower limit is not particularly limited, it is usually 1 μm or more, 1.5 μm or more, 2 μm or more, and the like.

印刷電路板為使用上述樹脂薄片,可藉由含有下述(I)及(II)的步驟之方法而製造。
(I)於內層基板上層合使樹脂薄片的樹脂組成物層與內層基板接合之步驟
(II)將樹脂組成物層進行熱硬化後形成絕緣層的步驟
The printed circuit board uses the resin sheet described above, and can be produced by a method including the following steps (I) and (II).
(I) a step of laminating the resin composition layer of the resin sheet and the inner substrate on the inner substrate
(II) A step of forming an insulating layer by thermally curing the resin composition layer

所謂在步驟(I)所使用的「內層基板」為成為印刷電路板的基板之構件,例如可舉出玻璃環氧基板、金屬基板、聚酯基板、聚醯亞胺基板、BT樹脂基板、熱硬化型聚伸苯基醚基板等。又,該基板為該單面或雙面上可具有導體層,該導體層亦可經圖型加工。於基板的單面或雙面上所形成的導體層(迴路)之內層基板有時稱為「內層迴路基板」。又,於製造印刷電路板時,進一步形成絕緣層及/或導體層的中間製造物亦含於本發明中所謂的「內層基板」。印刷電路板為零件內藏迴路板時,使用內藏零件的內層基板。The "inner substrate" used in step (I) is a member that becomes a substrate of a printed circuit board, and examples thereof include a glass epoxy substrate, a metal substrate, a polyester substrate, a polyimide substrate, a BT resin substrate, Thermosetting polyphenylene ether substrate, etc. In addition, the substrate may have a conductor layer on one or both sides, and the conductor layer may also be subjected to pattern processing. The inner layer substrate of the conductor layer (circuit) formed on one or both sides of the substrate is sometimes referred to as an "inner layer circuit substrate". Moreover, in the manufacture of a printed wiring board, an intermediate product which further forms an insulating layer and / or a conductor layer is also included in the so-called "inner layer substrate" in the present invention. When the printed circuit board is a component-embedded circuit board, an internal substrate with built-in components is used.

內層基板與樹脂薄片的層合,例可藉由自支持體側將樹脂薄片於內層基板進行加熱壓著而進行。將樹脂薄片作為於內層基板進行加熱壓著的構件(以下亦稱為「加熱壓著構件」),例如可舉出經加熱的金屬板(SUS鏡板等)或金屬滾筒(SUS滾筒)等。且,並非將加熱壓著構件於樹脂薄片進行直接加壓,於內層基板的表面凹凸上欲使樹脂薄片能充分的追隨,隔著耐熱橡膠等彈性材進行加壓者為佳。The lamination of the inner substrate and the resin sheet can be performed, for example, by heating and pressing the resin sheet on the inner substrate from the support side. The resin sheet is used as a member which is heat-pressed on the inner substrate (hereinafter also referred to as “heat-pressed member”), and examples thereof include a heated metal plate (SUS mirror plate, etc.), a metal roller (SUS roller), and the like. In addition, instead of directly pressing the heating and pressing member on the resin sheet, it is preferable that the resin sheet can sufficiently follow the unevenness on the surface of the inner substrate, and it is preferable to press through an elastic material such as a heat-resistant rubber.

內層基板與樹脂薄片之層合可藉由真空層合法而實施。對於真空層合法,加熱壓著溫度以60℃~160℃為佳,較佳為80℃~140℃的範圍,加熱壓著壓力以0.098MPa~1.77MPa為佳,較佳為0.29MPa~1.47MPa的範圍,加熱壓著時間以20秒~400秒為佳,較佳為30秒~300秒的範圍。層合以壓力26.7hPa以下的減壓條件下實施。The lamination of the inner substrate and the resin sheet can be performed by vacuum lamination. For the vacuum layer method, the heating and pressing temperature is preferably 60 ° C to 160 ° C, preferably in the range of 80 ° C to 140 ° C, and the heating and pressing pressure is preferably 0.098MPa to 1.77MPa, and preferably 0.29MPa to 1.47MPa. The range of the heating and pressing time is preferably 20 seconds to 400 seconds, and more preferably 30 seconds to 300 seconds. Lamination is carried out under reduced pressure at a pressure of 26.7 hPa or less.

層合可藉由市售真空層合體而進行。作為市售的真空層合體,例如可舉出名機製作所公司製的真空加壓式層合體、Nikko・Materials公司製的真空施放器、分批式真空加壓層合體等。Lamination can be performed by a commercially available vacuum laminate. Examples of commercially available vacuum laminates include vacuum pressurized laminates made by Meiki Seisakusho, vacuum applicators made by Nikko Materials Corporation, and batch vacuum pressurized laminates.

於層合後,常壓下(大氣壓下),例如藉由將加熱壓著構件自支持體側進行加壓,亦可進行經層合的樹脂薄片之平滑化處理。平滑化處理的加壓條件可設定為與上述層合的加熱壓著條件之相同條件。平滑化處理可藉由市售層合體而進行。且,層合與平滑化處理可使用上述市售的真空層合體以連續方式進行。After lamination, under normal pressure (atmospheric pressure), for example, by pressing the heating and pressing member from the support side, the laminated resin sheet may be smoothed. The pressing conditions for the smoothing treatment can be set to the same conditions as the heating and pressing conditions for the lamination described above. The smoothing treatment can be performed by a commercially available laminate. The lamination and smoothing treatment can be performed in a continuous manner using the commercially available vacuum laminate.

支持體可在步驟(I)與步驟(II)之間除去,亦可在步驟(II)之後除去。The support may be removed between step (I) and step (II), or may be removed after step (II).

對於步驟(II),熱硬化樹脂組成物層而形成絕緣層。In step (II), the resin composition layer is thermoset to form an insulating layer.

樹脂組成物層的熱硬化條件並無特別限定,欲形成印刷電路板之絕緣層時可使用一般採用的條件。The conditions for the thermosetting of the resin composition layer are not particularly limited, and when forming an insulating layer of a printed circuit board, generally used conditions can be used.

例如樹脂組成物層的熱硬化條件即使依據樹脂組成物的種類等而相異,但硬化溫度以120℃~240℃為佳,較佳為150℃~220℃,更佳為170℃~200℃。硬化時間以5分鐘~120分鐘為佳,較佳為10分鐘~100分鐘,更佳為15分鐘~90分鐘。For example, the thermal curing conditions of the resin composition layer are different depending on the type of the resin composition, but the curing temperature is preferably 120 ° C to 240 ° C, preferably 150 ° C to 220 ° C, and more preferably 170 ° C to 200 ° C. . The hardening time is preferably 5 minutes to 120 minutes, more preferably 10 minutes to 100 minutes, and even more preferably 15 minutes to 90 minutes.

於熱硬化樹脂組成物層前,可將樹脂組成物層以比硬化溫度更低溫度下進行預備加熱。例如先使樹脂組成物層熱硬化,在50℃以上且未達120℃(以60℃以上115℃以下為佳,較佳為70℃以上110℃以下)的溫度下,將樹脂組成物層進行5分鐘以上(以5分鐘~150分鐘為佳,較佳為15分鐘~120分鐘,更佳為15分鐘~100分鐘)預備加熱。Before the thermosetting resin composition layer, the resin composition layer may be pre-heated at a lower temperature than the curing temperature. For example, the resin composition layer is first thermally cured at a temperature of 50 ° C to 120 ° C (preferably 60 ° C to 115 ° C, preferably 70 ° C to 110 ° C). 5 minutes or more (preferably 5 minutes to 150 minutes, preferably 15 minutes to 120 minutes, and more preferably 15 minutes to 100 minutes) preheating.

製造印刷電路板時,可進一步實施(III)於絕緣層打洞的步驟、(IV)使絕緣層進行粗化處理的步驟、(V)形成導體層的步驟。這些步驟(III)至步驟(V)可藉由使用於印刷電路板的製造上之斯業者依據公知的各種方法而實施。且,將支持體在步驟(II)之後除去時,該支持體的除去可於步驟(II)與步驟(III)之間、步驟(III)與步驟(IV)之間或步驟(IV)與步驟(V)之間實施。又,視必要可重複實施步驟(II)~步驟(V)的絕緣層及導體層之形成,亦可形成多層配線板。此時,各導體層間之絕緣層的厚度(圖1之t1)以在上述範圍內者為佳。When manufacturing a printed circuit board, (III) a step of punching an insulating layer, (IV) a step of roughening the insulating layer, and (V) a step of forming a conductive layer may be further performed. These steps (III) to (V) can be carried out by various methods known to those skilled in the art of manufacturing printed circuit boards. Moreover, when the support is removed after step (II), the support may be removed between step (II) and step (III), between step (III) and step (IV), or between step (IV) and Implemented between steps (V). In addition, if necessary, the formation of the insulating layer and the conductor layer in steps (II) to (V) can be repeatedly performed, and a multilayer wiring board can also be formed. At this time, the thickness of the insulating layer (t1 in FIG. 1) between the conductor layers is preferably within the above range.

步驟(III)為於絕緣層打洞的步驟,藉此於絕緣層可形成貫通孔、通孔等洞。步驟(III)為配合使用於絕緣層的形成之樹脂組成物的組成等,例如可使用鑽頭、雷射、電漿等而實施。洞的尺寸或形狀可配合印刷電路板之設計而適宜決定。Step (III) is a step of drilling holes in the insulating layer, thereby forming holes such as through holes and through holes in the insulating layer. Step (III) is a combination of the composition of the resin composition used for the formation of the insulating layer, and can be carried out using, for example, a drill, a laser, or a plasma. The size or shape of the hole can be appropriately determined according to the design of the printed circuit board.

步驟(IV)為粗化處理絕緣層的步驟。粗化處理的程序、條件並無特別限定,可採用在形成印刷電路板的絕緣層時一般使用的公知程序、條件。例如可以藉由膨潤液之膨潤處理、藉由氧化劑的粗化處理、藉由中和液的中和處理的順序實施而粗化處理絕緣層。作為使用於粗化處理的膨潤液並無特別限定,可舉出鹼溶液、界面活性劑溶液等,以鹼溶液為佳,作為該鹼溶液以氫氧化鈉溶液、氫氧化鉀溶液為較佳。作為被販賣的膨潤液,例如可舉出Atotech Japan公司製的「Swelling Dip security Gans P」、「Swelling Dip security Gans SBU」等。藉由膨潤液的膨潤處理並無特別限定,例如可藉由於30℃~90℃的膨潤液浸漬絕緣層1分鐘~20分鐘而進行。由可將絕緣層的樹脂之膨潤壓抑至適度水準的觀點來看,以於40℃~80℃的膨潤液浸漬絕緣層5分鐘~15分鐘者為佳。作為使用於粗化處理的氧化劑,並無特別限定,但例如可舉出於氫氧化鈉的水溶液溶解過錳酸鉀或過錳酸鈉的鹼性過錳酸溶液。藉由鹼性過錳酸溶液等氧化劑的粗化處理以於加熱60℃~80℃的氧化劑溶液中浸漬絕緣層10分鐘~30分鐘者為佳。又,於鹼性過錳酸溶液中之過錳酸鹽的濃度以5質量%~10質量%為佳。作為被販賣的氧化劑,例如可舉出Atotech Japan公司製的「Concentrate・Compact CP」、「Dosing solution security Gans P」等鹼性過錳酸溶液。又,作為使用於粗化處理的中和液,以酸性的水溶液為佳,作為市售品,例如可舉出Atotech Japan公司製的「Reduction solutions security GansP」。經由中和液的處理,可藉由將以氧化劑進行粗化處理的處理面以30℃~80℃的中和液浸漬5分鐘~30分鐘而進行。由作業性等觀點來看,將藉由氧化劑進行粗化處理之對象物在40℃~70℃的中和液浸漬5分鐘~20分鐘浸漬的方法為佳。Step (IV) is a step of roughening the insulating layer. The procedure and conditions for the roughening treatment are not particularly limited, and known procedures and conditions generally used when forming an insulating layer of a printed circuit board can be adopted. For example, the insulating layer may be roughened by a swelling treatment of a swelling liquid, a roughening treatment by an oxidizing agent, and a neutralization treatment by a neutralizing solution. The swelling liquid used for the roughening treatment is not particularly limited, and examples thereof include an alkali solution and a surfactant solution. An alkali solution is preferred, and a sodium hydroxide solution and a potassium hydroxide solution are more preferred as the alkali solution. Examples of the sold swelling liquid include "Swelling Dip security Gans P" and "Swelling Dip security Gans SBU" manufactured by Atotech Japan. The swelling treatment with the swelling liquid is not particularly limited, and it can be performed, for example, by impregnating the insulating layer with the swelling liquid at 30 ° C. to 90 ° C. for 1 to 20 minutes. From the viewpoint of suppressing the swelling of the resin of the insulating layer to an appropriate level, it is preferable that the insulating layer is immersed in a swelling liquid at 40 ° C to 80 ° C for 5 to 15 minutes. The oxidizing agent used for the roughening treatment is not particularly limited, but examples thereof include an alkaline permanganic acid solution in which potassium permanganate or sodium permanganate is dissolved in an aqueous solution of sodium hydroxide. The roughening treatment of an oxidant such as an alkaline permanganic acid solution is preferably performed by immersing the insulating layer in the oxidant solution heated at 60 ° C to 80 ° C for 10 to 30 minutes. The concentration of the permanganate in the alkaline permanganic acid solution is preferably 5 mass% to 10 mass%. Examples of the oxidant to be sold include alkaline permanganic acid solutions such as "Concentrate Compact CP" and "Dosing solution security Gans P" manufactured by Atotech Japan. The neutralizing solution used for the roughening treatment is preferably an acidic aqueous solution. As a commercially available product, for example, "Reduction solutions security GansP" manufactured by Atotech Japan is mentioned. The treatment with the neutralizing solution can be performed by immersing the treated surface roughened with an oxidizing agent in a neutralizing solution at 30 ° C to 80 ° C for 5 to 30 minutes. From the viewpoints of workability and the like, a method of immersing an object subjected to a roughening treatment with an oxidizing agent in a neutralizing solution at 40 ° C to 70 ° C for 5 to 20 minutes is preferable.

對於一實施形態,粗化處理後的絕緣層表面之算術平均粗度(Ra)以400nm以下為佳,較佳為350nm以下,更佳為300nm以下。雖對於下限並無特別限定,以0.5nm以上為佳,較佳為1nm以上。又,粗化處理後的絕緣層表面之二乘平均平方根粗度(Rq),以400nm以下為佳,較佳為350nm以下,更佳為300nm以下。對於下限並無特別限定,以0.5nm以上為佳,較佳為1nm以上等。絕緣層表面的算術平均粗度(Ra)及二乘平均平方根粗度(Rq)可使用非接觸型表面粗度計測定。In one embodiment, the arithmetic average roughness (Ra) of the surface of the insulating layer after the roughening treatment is preferably 400 nm or less, more preferably 350 nm or less, and even more preferably 300 nm or less. Although the lower limit is not particularly limited, it is preferably 0.5 nm or more, and more preferably 1 nm or more. In addition, the doubled average square root roughness (Rq) of the surface of the insulating layer after the roughening treatment is preferably 400 nm or less, more preferably 350 nm or less, and even more preferably 300 nm or less. The lower limit is not particularly limited, but is preferably 0.5 nm or more, and more preferably 1 nm or more. The arithmetic average roughness (Ra) and square root mean square root roughness (Rq) of the surface of the insulating layer can be measured using a non-contact surface roughness meter.

步驟(V)為形成導體層的步驟。於內層基板未形成導體層時,步驟(V)為形成第1導體層的步驟,於內層基板形成導體層時,該導體層為第1導體層,步驟(V)為形成第2導體層的步驟。Step (V) is a step of forming a conductor layer. When the conductor layer is not formed on the inner substrate, step (V) is a step of forming a first conductor layer. When the conductor layer is formed on the inner substrate, the conductor layer is a first conductor layer, and step (V) is a second conductor. Steps.

使用於導體層的導體材料並無特別限定。較佳實施形態中,導體層為含有選自由金、鉑、鈀、銀、銅、鋁、鈷、鉻、鋅、鎳、鈦、鎢、鐵、錫及銦所成群的1種以上金屬。導體層可為單獨金屬層,亦可為合金層,作為合金層,例如可舉出由選自由上述群的2種以上金屬之合金(例如鎳・鉻合金、銅・鎳合金及銅・鈦合金)所形成的層。其中,由導體層形成之泛用性、成本、製圖的容易性等觀點來看,以鉻、鎳、鈦、鋁、鋅、金、鈀、銀或者銅的單獨金屬層、或鎳・鉻合金、銅・鎳合金、銅・鈦合金的合金層為佳,以鉻、鎳、鈦、鋁、鋅、金、鈀、銀或者銅的單獨金屬層或鎳・鉻合金的合金層為較佳,以銅的單獨金屬層為更佳。The conductive material used for the conductive layer is not particularly limited. In a preferred embodiment, the conductive layer contains one or more metals selected from the group consisting of gold, platinum, palladium, silver, copper, aluminum, cobalt, chromium, zinc, nickel, titanium, tungsten, iron, tin, and indium. The conductor layer may be a single metal layer or an alloy layer. Examples of the alloy layer include an alloy of two or more metals selected from the group (for example, nickel-chromium alloy, copper-nickel alloy, and copper-titanium alloy). ). Among them, from the viewpoints of versatility, cost, and ease of drawing made of a conductor layer, a separate metal layer of chromium, nickel, titanium, aluminum, zinc, gold, palladium, silver, or copper, or a nickel-chromium alloy The alloy layers of copper, nickel-copper alloy and copper-titanium alloy are preferred. Separate metal layers of chromium, nickel, titanium, aluminum, zinc, gold, palladium, silver or copper or alloy layers of nickel-chromium alloy are preferred. A separate metal layer of copper is more preferred.

導體層可為單層結構,亦可為相異種類的金屬或者由合金所成的單金屬層或亦可為合金層以2層以上進行層合的複層結構。導體層為複數層結構時,與絕緣層銜接的層以鉻、鋅或者鈦的單獨金屬層或鎳・鉻合金的合金層者為佳。The conductor layer may be a single-layer structure, or may be a single metal layer made of dissimilar metals or alloys, or may be a multi-layer structure in which an alloy layer is laminated in two or more layers. When the conductor layer has a multiple-layer structure, the layer connected to the insulating layer is preferably a separate metal layer of chromium, zinc, or titanium or an alloy layer of a nickel-chromium alloy.

導體層的厚度由所望印刷電路板的設計來看一般為3μm~35μm,以5μm~30μm為佳。The thickness of the conductor layer is generally from 3 μm to 35 μm, and preferably from 5 μm to 30 μm, depending on the design of the desired printed circuit board.

對於一實施形態,導體層可藉由鍍敷而形成。例如藉由半添加法、全添加法等過去公知技術對於絕緣層表面進行鍍敷,可形成具有所望配線圖型的導體層,由製造的簡便性之觀點來看,以藉由半添加法所形成者為佳。以下表示將導體層藉由半添加法所形成的例子。In one embodiment, the conductive layer can be formed by plating. For example, a conventionally known technique such as semi-additive method and full-additive method can be used to plate the surface of an insulating layer to form a conductor layer having a desired wiring pattern. The former is better. An example in which a conductive layer is formed by a semi-additive method is shown below.

首先,於絕緣層表面上藉由無電解鍍敷形成鍍敷種層。其次,於所形成的鍍敷種層上,形成對應所望配線圖型而露出鍍敷種層的一部分之光罩圖型。於露出的鍍敷種層上,藉由電解鍍敷形成金屬層後,除去光罩圖型。其後將不要的鍍敷種層藉由蝕刻等除去,可形成具有所望配線圖型的導體層。First, a plating seed layer is formed on the surface of the insulating layer by electroless plating. Next, a mask pattern is formed on the formed plating seed layer to expose a part of the plating seed layer corresponding to a desired wiring pattern. After the metal layer is formed by electrolytic plating on the exposed plating seed layer, the photomask pattern is removed. Thereafter, the unnecessary plating seed layer is removed by etching or the like to form a conductor layer having a desired wiring pattern.

本發明之樹脂薄片因可得到零件嵌入性亦良好的絕緣層,故印刷電路板在零件內藏迴路板之情況下亦可適合使用。零件內藏迴路板可藉由公知製造方法而製作。Since the resin sheet of the present invention can obtain an insulating layer with good part embedding, the printed circuit board can also be suitably used when a circuit board is built in the part. The component-embedded circuit board can be manufactured by a known manufacturing method.

使用本發明之樹脂薄片所製造的印刷電路板亦可為具備樹脂薄片之樹脂組成物層的硬化物之絕緣層、嵌入絕緣層的嵌入型配線層的態樣。The printed wiring board manufactured using the resin sheet of the present invention may also be in the form of an insulating layer including a cured product of a resin composition layer of the resin sheet, and an embedded wiring layer embedded in the insulating layer.

[半導體裝置]
本發明之半導體裝置為含有本發明之印刷電路板。本發明之半導體裝置可使用本發明之印刷電路板而製造。
[Semiconductor device]
The semiconductor device of the present invention is a printed circuit board containing the present invention. The semiconductor device of the present invention can be manufactured using the printed circuit board of the present invention.

作為半導體裝置,可舉出電器製品(例如電腦、手機、數位照相機及電視等)及交通工具(例如自動二輪車、汽車、電車、船舶及航空機等)等各種半導體裝置。Examples of the semiconductor device include various semiconductor devices such as electric appliances (for example, computers, mobile phones, digital cameras, and televisions) and vehicles (for example, motorcycles, automobiles, trams, ships, and aircraft).

本發明之半導體裝置可藉由於印刷電路板的導通處安裝零件(半導體晶片)而製造。所謂「導通位置」為「於印刷電路板中之傳達電信號的位置」,其場所可為表面,亦可嵌入位置。又,半導體晶片僅為將半導體作為材料的電迴路元件者即可並無特別限定。The semiconductor device of the present invention can be manufactured by mounting a component (semiconductor wafer) at a conductive position of a printed circuit board. The so-called "conducting position" is "a position for transmitting an electric signal in a printed circuit board", and its place may be a surface or an embedded position. The semiconductor wafer is not particularly limited as long as it is only an electric circuit element using a semiconductor as a material.

製造半導體裝置時的半導體晶片之安裝方法若為可使半導體晶片有效地發揮其功能者即可,並無特別限定,具體可舉出引線鍵合安裝方法、倒裝晶片安裝方法、藉由無顛簸累積層合(BBUL)的安裝方法、藉由各向異性導電薄膜(ACF)的安裝方法、藉由非導電性薄膜(NCF)的安裝方法等。其中所謂「藉由無顛簸的累積層合(BBUL)的安裝方法」表示「將半導體晶片直接嵌入印刷電路板的凹部,連接半導體晶片與印刷電路板上的配線之安裝方法」。

[實施例]
The method for mounting a semiconductor wafer when manufacturing a semiconductor device is not particularly limited as long as it enables the semiconductor wafer to effectively perform its functions. Specific examples include a wire bond mounting method, a flip chip mounting method, and no bumps. Installation method of cumulative lamination (BBUL), installation method by anisotropic conductive film (ACF), installation method by non-conductive film (NCF), and the like. The so-called "mounting method by bumpless accumulation lamination (BBUL)" means "mounting method of directly embedding a semiconductor wafer into a recessed portion of a printed circuit board and connecting the semiconductor wafer and the wiring on the printed circuit board".

[Example]

以下將本發明藉由實施例做具體說明。本發明並非僅限定於這些實施例者。且,如以下所示,表示量的「份」及「%」若無另外說明,各表示「質量份」及「質量%」。The present invention will be specifically described below through examples. The present invention is not limited to these examples. In addition, as shown below, the "parts" and "%" indicating the amount unless otherwise indicated, each indicates "mass part" and "mass%".

[實施例1]
將雙酚型環氧樹脂(新日鐵住金化學公司製「ZX1059」、雙酚A型與雙酚F型之1:1混合品、環氧當量169)10份及萘酚型環氧樹脂(新日鐵住金化學公司製「ESN475V」、環氧當量約330)50份於溶劑石腦油40份下一邊攪拌一邊使其加熱溶解。將此冷卻至室溫,調製出(A)環氧樹脂的溶解組成物。又,將苯並噁嗪化合物(JFE化學公司製「JBZ-OP100D」)5份於MEK5份中一邊攪拌一邊使其加熱溶解,進一步將此冷卻至室溫,調製出(B)苯並噁嗪化合物的溶液。
[Example 1]
10 parts of a bisphenol type epoxy resin ("ZX1059" manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd., a 1: 1 mixture of bisphenol A type and bisphenol F type, epoxy equivalent 169) and naphthol type epoxy resin ( 50 parts of "ESN475V" manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd. (equivalent to about 330) and 40 parts of solvent naphtha are stirred and heated to dissolve. This was cooled to room temperature to prepare a dissolved composition of the epoxy resin (A). In addition, 5 parts of a benzoxazine compound ("JBZ-OP100D" manufactured by JFE Chemical Co., Ltd.) was heated and dissolved while stirring in 5 parts of MEK, and this was further cooled to room temperature to prepare (B) benzoxazine Compound solution.

於該(A)環氧樹脂的溶解組成物中混合苯氧基樹脂(三菱化學公司製「YX7553BH30」、固體成分30質量%的MEK與環己酮之1:1溶液)5份、具有三嗪骨架及酚醛清漆結構的酚系硬化劑(DIC公司製「LA-3018-50P」、活性基當量約151、固體成分50%的2-甲氧基丙醇溶液)5份、活性酯化合物(DIC公司製「HPC-8000-65T」、活性基當量約223、固體成分65質量%的甲苯溶液)50份、硬化促進劑(1-苯甲基-2-苯基咪唑(1B2PZ)、固體成分10質量%的MEK溶液)5份、以胺系烷氧基矽烷化合物(信越化學工業公司製「KBM573」)進行表面處理的球形二氧化矽(平均粒徑0.77μm、比表面積5.9m2 /g、Admatechs公司製「SO-C2」)250份及(B)苯並噁嗪化合物的溶液10份,以高速轉動混合器均勻地分散後製作出樹脂塗漆。5 parts of a phenoxy resin ("YX7553BH30" manufactured by Mitsubishi Chemical Corporation, a 1: 1 solution of MEK and cyclohexanone with a solid content of 30% by mass) was mixed with the dissolved composition of this (A) epoxy resin, and triazine 5 parts of phenolic hardener ("LA-3018-50P" manufactured by DIC Corporation, approximately 151 active group equivalent, 2-methoxypropanol solution with 50% solids content), active ester compound (DIC "HPC-8000-65T" manufactured by the company, active ingredient equivalent of about 223, solid content 65% by weight toluene solution) 50 parts, hardening accelerator (1-benzyl-2-phenylimidazole (1B2PZ), solid content 10 5 parts by mass of MEK solution), spherical silica (average particle size 0.77 μm, specific surface area 5.9 m 2 / g, surface-treated silica) with amine-based alkoxysilane compound ("KBM573" manufactured by Shin-Etsu Chemical Industry Co., Ltd.), 250 parts of "SO-C2" (manufactured by Admatechs) and 10 parts of (B) benzoxazine compound solution were uniformly dispersed by a high-speed rotating mixer to produce a resin paint.

作為支持體,準備具備離型層的聚乙烯對苯二甲酸乙二醇酯薄膜(Lintec公司製「AL5」,厚度38μm)。於該支持體之離型層上,將前述樹脂塗漆均勻地塗布置乾燥後的樹脂組成物層之厚度成為25μm。其後將樹脂塗漆在80℃~120℃(平均100℃)下進行4分鐘乾燥後得到含有支持體及樹脂組成物層之樹脂薄片。As a support, a polyethylene terephthalate film ("AL5" manufactured by Lintec Corporation, thickness: 38 µm) was prepared with a release layer. The thickness of the resin composition layer after the aforementioned resin coating was uniformly applied to the release layer of the support was 25 μm. Thereafter, the resin paint was dried at 80 ° C. to 120 ° C. (average 100 ° C.) for 4 minutes to obtain a resin sheet containing a support and a resin composition layer.

<無機填充材的平均粒徑之測定>
秤重出無機填充材100mg、分散劑(Sannopco公司製「SN9228」)0.1g、甲基乙基酮10g並放於樣品瓶中,以超音波使其進行20分鐘分散。使用雷射衍射式粒徑分布測定裝置(島津製作所公司製「SALD-2200」),以批量單位方式測定粒徑分布,算出作為中位數徑之平均粒徑。
<Measurement of average particle diameter of inorganic filler>
100 mg of the inorganic filler, 0.1 g of a dispersant ("SN9228" manufactured by Sannopco), and 10 g of methyl ethyl ketone were weighed out and placed in a sample bottle, and dispersed for 20 minutes by ultrasonic waves. Using a laser diffraction particle size distribution measuring device ("SALD-2200" manufactured by Shimadzu Corporation), the particle size distribution was measured in a batch unit method, and the average particle size as a median diameter was calculated.

[實施例2]
對於實施例1,將活性酯化合物(DIC公司製「HPC-8000-65T」、活性基當量約223、固體成分65質量%的甲苯溶液)50份變更為活性酯化合物(DIC公司製「EXB8000L-65TM」、活性基當量220、固體成分65%的甲苯・MEK混合溶液)50份。除以上事項以外其他與實施例1相同下,製作出樹脂塗漆及樹脂薄片。
[Example 2]
In Example 1, 50 parts of an active ester compound ("HPC-8000-65T" manufactured by DIC Corporation, an active group equivalent of about 223, and a 65% by mass solid solution in toluene) was changed to an active ester compound ("EXB8000L- manufactured by DIC Corporation"). "65TM", active group equivalent 220, solid solution 65% toluene ・ MEK mixed solution) 50 parts. Except for the above matters, a resin paint and a resin sheet were produced in the same manner as in Example 1.

[實施例3]
對於實施例1,將活性酯化合物(DIC公司製「HPC-8000-65T」、活性基當量約223、固體成分65質量%的甲苯溶液)50份變更為活性酯化合物(DIC公司製「EXB8150-60T」、活性基當量230、固體成分60%的甲苯溶液)55份。除以上事項以外其他與實施例1相同下,製作出樹脂塗漆及樹脂薄片。
[Example 3]
In Example 1, 50 parts of an active ester compound ("HPC-8000-65T" manufactured by DIC Corporation, an active group equivalent of about 223, and a 65% by mass solid content toluene solution) were changed to an active ester compound ("EXB8150- manufactured by DIC Corporation" 60T ", active group equivalent 230, solid solution 60% toluene solution) 55 parts. Except for the above matters, a resin paint and a resin sheet were produced in the same manner as in Example 1.

[比較例1]
對於實施例1,將以胺系烷氧基矽烷化合物(信越化學工業公司製「KBM573」)進行表面處理的球形二氧化矽(平均粒徑0.77μm、Admatechs公司製「SO-C2」)之量由250份改為240份,未使用苯並噁嗪化合物(JFE化學公司製「JBZ-OP100D」)。除以上事項以外其他與實施例1相同下,製作出樹脂塗漆及樹脂薄片。
[Comparative Example 1]
In Example 1, the amount of spherical silica (average particle size 0.77 μm, "SO-C2" manufactured by Admatechs) was surface-treated with an amine-based alkoxysilane compound ("KBM573" manufactured by Shin-Etsu Chemical Industry Co., Ltd.). From 250 parts to 240 parts, benzoxazine compounds ("JBZ-OP100D" manufactured by JFE Chemical Co., Ltd.) were not used. Except for the above matters, a resin paint and a resin sheet were produced in the same manner as in Example 1.

[比較例2]
對於實施例2,以胺系烷氧基矽烷化合物(信越化學工業公司製「KBM573」)進行表面處理的球形二氧化矽(平均粒徑0.77μm、Admatechs公司製「SO-C2」)之量由250份改為240份,未使用苯並噁嗪化合物(JFE化學公司製「JBZ-OP100D」)。除以上事項以外其他與實施例1相同下,製作出樹脂塗漆及樹脂薄片。
[Comparative Example 2]
In Example 2, the amount of spherical silica (average particle diameter 0.77 μm, "SO-C2" manufactured by Admatechs) was surface-treated with an amine-based alkoxysilane compound ("KBM573" manufactured by Shin-Etsu Chemical Industry Co., Ltd.). 250 parts were changed to 240 parts, and the benzoxazine compound ("JBZ-OP100D" by JFE Chemical Co., Ltd.) was not used. Except for the above matters, a resin paint and a resin sheet were produced in the same manner as in Example 1.

[比較例3]
對於實施例3,以胺系烷氧基矽烷化合物(信越化學工業公司製「KBM573」)進行表面處理的球形二氧化矽(平均粒徑0.77μm、Admatechs公司製「SO-C2」)之量由250份改為240份,未使用苯並噁嗪化合物(JFE化學公司製「JBZ-OP100D」)。除以上事項以外其他與實施例1相同下,製作出樹脂塗漆及樹脂薄片。
[Comparative Example 3]
In Example 3, the amount of spherical silica (average particle diameter 0.77 μm, "SO-C2" manufactured by Admatechs) was subjected to surface treatment with an amine-based alkoxysilane compound ("KBM573" manufactured by Shin-Etsu Chemical Industry Co., Ltd.) 250 parts were changed to 240 parts, and the benzoxazine compound ("JBZ-OP100D" by JFE Chemical Co., Ltd.) was not used. Except for the above matters, a resin paint and a resin sheet were produced in the same manner as in Example 1.

[評估方法]
將由上述實施例及比較例所得之樹脂薄片藉由下述方法進行評估。
[assessment method]
The resin sheets obtained in the above examples and comparative examples were evaluated by the following methods.

<剝離強度之測定>
(評估用基板之製作)
(1)內裝基板之基礎處理:
作為內層基板,準備於表面具有銅箔的玻璃布基材環氧樹脂雙面貼銅層合板(銅箔厚度18μm、基板厚度0.8mm、Panasonic公司製「R1515A」)。將該內層基板表面的銅箔皆進行蝕刻而除去。其後在190℃進行30分鐘乾燥。
< Measurement of peeling strength >
(Fabrication of Evaluation Board)
(1) Basic processing of built-in substrate:
As the inner substrate, a double-sided copper-clad laminate with epoxy resin on a glass cloth substrate having a copper foil on the surface (copper foil thickness of 18 μm, substrate thickness of 0.8 mm, and “R1515A” manufactured by Panasonic Corporation) was prepared. All the copper foils on the surface of the inner substrate were removed by etching. Then, it dried at 190 degreeC for 30 minutes.

(2)樹脂薄片之層合:
將在上述實施例及比較例所得的樹脂薄片,使用分批式真空加壓層合體(Nikko・Materials公司製2階段累積層合體「CVP700」),欲使樹脂組成物層與前述內層基板銜接下層合於內層基板雙面。該層合為,將30秒減壓的氣壓設定在13hPa以下後,藉由以溫度100℃,壓力0.74MPa的30秒壓著而實施。
其次,將經層合的樹脂薄片在大氣壓下,以100℃,壓力0.5MPa下進行60秒的熱壓而使其平滑化。其後剝離支持體,得到以樹脂組成物層、內層基板及樹脂組成物層的順序而含有的「中間複層體I」。
(2) Lamination of resin sheet:
The resin sheets obtained in the above examples and comparative examples were batch-type vacuum-pressed laminates (two-stage cumulative laminates "CVP700" manufactured by Nikko Materials Co., Ltd.), and the resin composition layer was to be connected to the aforementioned inner substrate. The lower layer is laminated on both sides of the inner substrate. This lamination was carried out by setting the pressure of the depressurization for 30 seconds to 13 hPa or less, and then performing the pressing for 30 seconds at a temperature of 100 ° C and a pressure of 0.74 MPa.
Next, the laminated resin sheet was smoothed by hot pressing at 100 ° C. and a pressure of 0.5 MPa for 60 seconds under atmospheric pressure. Thereafter, the support was peeled off to obtain "intermediate laminate I" contained in the order of the resin composition layer, the inner substrate, and the resin composition layer.

另外,準備具有光澤面的銅箔(厚度35μm,三井金屬公司製「3EC-III」)。將該銅箔之光澤面使用微蝕刻劑(MEC公司製「CZ8101」),以銅蝕刻量1μm進行蝕刻,進行粗化處理。將如此所得之銅箔稱為「粗化銅箔」。In addition, a copper foil having a glossy surface (35 μm in thickness, “3EC-III” manufactured by Mitsui Metals Co., Ltd.) was prepared. The glossy surface of this copper foil was etched using a micro-etching agent ("CZ8101" manufactured by MEC Corporation) at a copper etching amount of 1 m, and roughened. The copper foil thus obtained is called "roughened copper foil".

將該粗化銅箔層合於中間複層體I的雙面,使其銜接於施予該粗化銅箔的粗化處理之中間複層體I的樹脂組成物層。該層合係與前述對於內層基板的樹脂薄片之層合的相同條件下進行。藉此,得到以粗化銅箔、樹脂組成物層、內層基板、樹脂組成物層及粗化銅箔的順序含有的「中間複層體II」。The roughened copper foil is laminated on both sides of the intermediate multilayer body I, and is connected to the resin composition layer of the intermediate multilayer body I to which the roughened copper foil is subjected to a roughening treatment. This lamination is performed under the same conditions as the aforementioned lamination of the resin sheet for the inner substrate. Thereby, the "intermediate multilayer body II" contained in the order of roughened copper foil, a resin composition layer, an inner-layer substrate, a resin composition layer, and a roughened copper foil was obtained.

將該中間複層體I投入於100℃的烤箱中進行30分鐘加熱,其次再移轉至170℃的烤箱中進行30分鐘加熱。其次,將中間複層體II由烤箱中取出,使其成為室溫環境後,再投入200℃的烤箱中進行90分鐘的追加加熱。藉此,進行樹脂組成物層的熱硬化,得到以粗化銅箔、作為樹脂組成物層的硬化物之絕緣層、內層基板、作為樹脂組成物層的硬化物之絕緣層及粗化銅箔的順序含有的「評估基板A」。對於該評估基材A,粗化銅箔相當於導體層。This intermediate multilayer body I was put into an oven at 100 ° C for 30 minutes for heating, and then transferred to an oven at 170 ° C for 30 minutes for heating. Next, the intermediate multilayer body II was taken out of the oven to make it a room temperature environment, and then put into a 200 ° C oven for additional heating for 90 minutes. Thereby, the resin composition layer is thermally cured to obtain a roughened copper foil, an insulation layer as a hardened material of the resin composition layer, an inner substrate, an insulation layer as a hardened material of the resin composition layer, and roughened copper. "Evaluation substrate A" contained in the order of the foil. In this evaluation substrate A, the roughened copper foil corresponds to a conductor layer.

(環境試驗(HAST試驗)前的剝離強度之測定)
使用前述評估基板A,進行粗化銅箔與絕緣層之剝離強度的測定。該剝離強度之測定依據JIS C6481進行。具體藉由下述操作進行剝離強度的測定。
(Measurement of peel strength before environmental test (HAST test))
Using the aforementioned evaluation substrate A, the peel strength of the roughened copper foil and the insulating layer was measured. The measurement of the peeling strength is performed in accordance with JIS C6481. Specifically, the peeling strength was measured by the following operation.

對於評估基板A的粗化銅箔切出包圍寬度10mm,長度100mm之矩形部分。剝開該矩形部分之一端,以夾具(T S E 公司製的Autocom型試驗機「AC-50C-SL」)捉住。於垂直方向拉剝前述矩形部分的長度35mm的範圍,將該拉剝時的負載(kgf/cm)作為HAST試驗前之剝離強度做測定。前述拉剝係在室溫中以50mm/分鐘速度進行。For the roughened copper foil of the evaluation substrate A, a rectangular portion with a width of 10 mm and a length of 100 mm was cut out. One end of the rectangular portion was peeled off, and it was caught with a jig (Autocom type testing machine "AC-50C-SL" manufactured by TSEE). The rectangular portion having a length of 35 mm was peeled in a vertical direction, and the load (kgf / cm) during the peeling was measured as the peel strength before the HAST test. The aforementioned peeling is performed at a speed of 50 mm / min at room temperature.

(環境試驗(HAST試驗)後的剝離強度之測定)
其後,將評估基板A在溫度130℃且濕度85%RH之環境下放置100小時而進行HAST試驗。進行該HAST試驗後,藉由與HAST試驗前之相同方法,進行評估基板A的粗化銅箔與絕緣層之剝離強度的測定。
(Measurement of peel strength after environmental test (HAST test))
Thereafter, the evaluation substrate A was left for 100 hours under an environment of a temperature of 130 ° C. and a humidity of 85% RH to perform a HAST test. After the HAST test was performed, the evaluation of the peel strength of the roughened copper foil and the insulating layer of the substrate A was measured by the same method as before the HAST test.

<污跡除去性之評估>
(1)內裝基板之基礎處理:
作為內層基板,準備於表面具有銅箔的玻璃布基材環氧樹脂雙面貼銅層合板(銅箔之厚度18μm,基板厚度0.8mm,Panasonic公司製「R1515A」)。將該內層基板的表面銅箔,使用微蝕刻劑(MEC公司製「CZ8101」),以銅蝕刻量1μm進行蝕刻,進行粗化處理。其後在190℃進行30分鐘的乾燥。
<Evaluation of Smudge Removability>
(1) Basic processing of built-in substrate:
As the inner substrate, a double-sided copper-clad laminate with epoxy resin on a glass cloth substrate having a copper foil on the surface was prepared (the thickness of the copper foil was 18 μm, the thickness of the substrate was 0.8 mm, and “R1515A” manufactured by Panasonic Corporation) was prepared. The copper foil on the surface of this inner layer substrate was etched with a micro-etching agent ("CZ8101" manufactured by MEC Corporation) at a copper etching amount of 1 m, and roughened. Thereafter, it was dried at 190 ° C for 30 minutes.

(2)樹脂薄片之層合・硬化:
將在上述實施例及比較例所得之樹脂薄片,使用分批式真空加壓層合體(Nikko・Materials公司製2階段累積層合體「CVP700」),層合於內層基板的雙面使樹脂組成物層與前述內層基板接合。該層合進行30秒減壓後將氣壓設定在13hPa以下,藉由溫度100℃且壓力0.74MPa的30秒壓著而實施。
(2) Lamination and hardening of resin sheet:
The resin sheets obtained in the above examples and comparative examples were laminated on both sides of an inner layer substrate using a batch type vacuum pressurized laminate (a two-stage cumulative laminate "CVP700" manufactured by Nikko Materials Corporation). The physical layer is bonded to the aforementioned inner substrate. This lamination was decompressed for 30 seconds, and the air pressure was set to 13 hPa or less. The lamination was carried out by pressing for 30 seconds at a temperature of 100 ° C and a pressure of 0.74 MPa.

其次,將經層合的樹脂薄片在大氣壓下且100℃下於壓力0.5MPa進行60秒的熱壓而使其平滑化。進一步再將此投入於100℃的烤箱中進行30分鐘加熱,其次轉移至170℃的烤箱中進行30分鐘加熱。Next, the laminated resin sheet was hot-pressed at a pressure of 0.5 MPa for 60 seconds at 100 ° C. under atmospheric pressure to smooth it. This was further put into an oven at 100 ° C for 30 minutes, and then transferred to an oven at 170 ° C for 30 minutes.

(3)貫通孔形成:
使用Viamechanics公司製CO2 雷射加工機(LK-2K212/ 2C),在頻率數2000Hz下以脈衝幅3μ秒,輸入0.95W,打擊數3的條件下加工絕緣層,形成在絕緣層表面上的頂徑(直徑)為50μm,於絕緣層底面中之直徑為40μm的貫通孔。其後進一步剝離支持體而得到迴路基板。
(3) Formation of through holes:
A CO 2 laser processing machine (LK-2K212 / 2C) manufactured by Viamechanics was used to process the insulating layer at a frequency of 2000 Hz with a pulse width of 3 μs, input of 0.95 W, and a strike number of 3 to form an insulating layer on the surface of the insulating layer. A through hole having a top diameter (diameter) of 50 μm and a diameter of 40 μm in the bottom surface of the insulating layer. Thereafter, the support was further peeled to obtain a circuit board.

(4)粗化處理:
將迴路基板的絕緣層表面以膨潤液之Atotech Japan公司製的Swelling Dip security GansP於60℃浸漬10分鐘。其次將迴路基板的絕緣層表面於粗化液的Atotech Japan公司製的Concentrate・CompactP(KMnO4 :60g/L、NaOH:40 g/L的水溶液)在80℃下浸漬25分鐘。最後將迴路基板的絕緣層表面於中和液的Atotech Japan公司製的Reduction solutions security GansP在40℃下浸漬5分鐘。
(4) Roughening:
The surface of the insulation layer of the circuit board was immersed in a swelling solution of Swelling Dip security GansP manufactured by Atotech Japan at 60 ° C for 10 minutes. Next, the surface of the insulation layer of the circuit board was immersed in a roughened solution of Concentrate · CompactP (KMnO 4 : 60 g / L, NaOH: 40 g / L aqueous solution) manufactured by Atotech Japan Co., Ltd. at 80 ° C. for 25 minutes. Finally, the surface of the insulation layer of the circuit substrate was immersed in a neutralization solution of Reduction solutions Security GansP manufactured by Atotech Japan for 5 minutes at 40 ° C.

(5)貫通孔底部之殘渣評估:
將貫通孔的底部周圍以掃描電子顯微鏡(SEM)進行觀察,由所得之圖像測定自貫通孔底部的壁面的最大污跡長度,以以下基準進行評估。
○:最大污跡長未達5μm
×:最大污跡長為5μm以上
(5) Evaluation of the residue at the bottom of the through hole:
The periphery of the bottom of the through-hole was observed with a scanning electron microscope (SEM), and the maximum stain length from the wall surface of the bottom of the through-hole was measured from the obtained image, and evaluated based on the following criteria.
○: The maximum stain length is less than 5 μm
×: The maximum smear length is 5 μm or more

[結果]
將上述實施例及比較例的結果以下述表表示。對於下述表,各成分的量以不揮發成分換算量表示。
[result]
The results of the above examples and comparative examples are shown in the following table. In the following table, the amount of each component is expressed as a non-volatile component conversion amount.

對於實施例1~3,即使未含(D)~(F)成分,雖有某程度的差異,但可確認歸屬於與上述實施例的相同結果。In Examples 1 to 3, even if the components (D) to (F) were not contained, there was a certain degree of difference, but it was confirmed that the results were the same as those in the above examples.

1‧‧‧第1導體層1‧‧‧ the first conductor layer

11‧‧‧第1導體層的主面 11‧‧‧ Main surface of the first conductor layer

2‧‧‧第2導體層 2‧‧‧ 2nd conductor layer

21‧‧‧第2導體層的主面 21‧‧‧ The main surface of the second conductor layer

3‧‧‧絕緣層 3‧‧‧ Insulation

t1‧‧‧第1導體層與第2導體層的間隔(第1及第2導體層間之絕緣層厚度) t1‧‧‧The distance between the first conductor layer and the second conductor layer (the thickness of the insulation layer between the first and second conductor layers)

t2‧‧‧絕緣層全體厚度 t2‧‧‧All thickness of insulation layer

[圖1]圖1表示將印刷電路板的一例子作為模式之一部份截面圖。[FIG. 1] FIG. 1 is a partial cross-sectional view showing an example of a printed circuit board as a pattern.

Claims (13)

一種樹脂組成物,其為含有(A)環氧樹脂、(B)苯並噁嗪化合物及(C)無機填充劑的樹脂組成物,其特徵為 (B)成分以下述一般式(B-1)表示, (C)成分的含有量係將樹脂組成物中之不揮發成分作為100質量%時為67質量%以上; 式(B-1)中,R1 表示含有氧原子的n價基,R2 各獨立表示鹵素原子、烷基或芳基;n表示2~4的整數,m表示0~4的整數。A resin composition is a resin composition containing (A) an epoxy resin, (B) a benzoxazine compound, and (C) an inorganic filler, wherein the (B) component is represented by the following general formula (B-1) ) Indicates that the content of the component (C) is 67% by mass or more when the nonvolatile component in the resin composition is 100% by mass; In the formula (B-1), R 1 represents an n-valent group containing an oxygen atom, R 2 each independently represents a halogen atom, an alkyl group, or an aryl group; n represents an integer of 2 to 4; and m represents an integer of 0 to 4. 如請求項1之樹脂組成物,其中(B)成分的含有量係將樹脂組成物中之不揮發成分作為100質量%時,其為0.1質量%以上10質量%以下。For example, if the content of the component (B) in the resin composition of claim 1 is set to 100% by mass of the nonvolatile component in the resin composition, it is 0.1% by mass to 10% by mass. 如請求項1之樹脂組成物,其中進一步含有(D)活性酯化合物。The resin composition according to claim 1, further comprising (D) an active ester compound. 如請求項3之樹脂組成物,其中(D)成分的含有量係將樹脂組成物中之不揮發成分作為100質量%時,其為5質量%以上。For example, in the resin composition of claim 3, when the content of the (D) component is 100% by mass of the nonvolatile component in the resin composition, it is 5% by mass or more. 如請求項1之樹脂組成物,其中(C)無機填充材的平均粒徑為0.5μm以上。The resin composition according to claim 1, wherein the average particle diameter of the (C) inorganic filler is 0.5 μm or more. 如請求項1之樹脂組成物,其中一般式(B-1)中,R1 係由氧原子與伸芳基之組合所成的n價基。For example, the resin composition of claim 1, wherein in the general formula (B-1), R 1 is an n-valent group formed by a combination of an oxygen atom and an arylene group. 如請求項1之樹脂組成物,其中一般式(B-1)中,m表示0。The resin composition according to claim 1, wherein m represents 0 in the general formula (B-1). 如請求項1之樹脂組成物,其為使用於印刷電路板的絕緣層形成上。The resin composition according to claim 1, which is used for forming an insulating layer of a printed circuit board. 如請求項1之樹脂組成物,其為使用於印刷電路板的層間絕緣層形成上。The resin composition according to claim 1, which is used for forming an interlayer insulation layer of a printed circuit board. 一種樹脂薄片,其特徵為含有支持體與設置於該支持體上的以如請求項1之樹脂組成物所形成的樹脂組成物層。A resin sheet comprising a support and a resin composition layer formed on the support with a resin composition as claimed in claim 1. 如請求項10之樹脂薄片,其中樹脂組成物層的厚度為25μm以下。The resin sheet according to claim 10, wherein the thickness of the resin composition layer is 25 μm or less. 一種印刷電路板,其為含有第1導體層、第2導體層及於第1導體層與第2導體層之間所形成的絕緣層者,其特徵為該絕緣層為如請求項1~9中任1項之樹脂組成物的硬化物。A printed circuit board comprising a first conductor layer, a second conductor layer, and an insulation layer formed between the first conductor layer and the second conductor layer, characterized in that the insulation layer is as described in claims 1 to 9 A cured product of any one of the resin compositions. 一種半導體裝置,其特徵為含有如請求項12之印刷電路板。A semiconductor device comprising a printed circuit board as claimed in claim 12.
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