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TW201927452A - Laser machining method and method for manufacturing mask assembly - Google Patents

Laser machining method and method for manufacturing mask assembly Download PDF

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Publication number
TW201927452A
TW201927452A TW107140679A TW107140679A TW201927452A TW 201927452 A TW201927452 A TW 201927452A TW 107140679 A TW107140679 A TW 107140679A TW 107140679 A TW107140679 A TW 107140679A TW 201927452 A TW201927452 A TW 201927452A
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Taiwan
Prior art keywords
workpiece
unit processing
laser beam
axis direction
laser
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TW107140679A
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Chinese (zh)
Inventor
成棟永
崔在萬
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南韓商Ap系統股份有限公司
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Publication of TW201927452A publication Critical patent/TW201927452A/en

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B21MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21DWORKING OR PROCESSING OF SHEET METAL OR METAL TUBES, RODS OR PROFILES WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21D31/00Other methods for working sheet metal, metal tubes, metal profiles
    • B21D31/04Expanding other than provided for in groups B21D1/00 - B21D28/00, e.g. for making expanded metal
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/06Shaping the laser beam, e.g. by masks or multi-focusing
    • B23K26/073Shaping the laser spot
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/08Devices involving relative movement between laser beam and workpiece
    • B23K26/0869Devices involving movement of the laser head in at least one axial direction
    • B23K26/0876Devices involving movement of the laser head in at least one axial direction in at least two axial directions
    • B23K26/0884Devices involving movement of the laser head in at least one axial direction in at least two axial directions in at least in three axial directions, e.g. manipulators, robots
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/36Removing material
    • B23K26/38Removing material by boring or cutting
    • B23K26/382Removing material by boring or cutting by boring
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K37/00Auxiliary devices or processes, not specially adapted for a procedure covered by only one of the other main groups of this subclass
    • B23K37/04Auxiliary devices or processes, not specially adapted for a procedure covered by only one of the other main groups of this subclass for holding or positioning work
    • B23K37/0408Auxiliary devices or processes, not specially adapted for a procedure covered by only one of the other main groups of this subclass for holding or positioning work for planar work

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Mechanical Engineering (AREA)
  • Plasma & Fusion (AREA)
  • Robotics (AREA)
  • Laser Beam Processing (AREA)

Abstract

The present disclosure relates to a laser machining method and a method for manufacturing a mask assembly, the laser machining method including: setting a plurality of guide lines including curved lines on a plate-shaped workpiece in a first axis direction of the workpiece; setting a plurality of unit machining regions disposed on the workpiece so as to be spaced apart from each other along the plurality of guide lines; and irradiating the plurality of unit machining regions with a laser beam while moving an irradiation position of the laser beam.

Description

雷射切割方法以及製造遮罩組件的方法Laser cutting method and method for manufacturing mask assembly

本發明涉及一種雷射加工方法以及一種製造掩模總成的方法,且更具體來說涉及一種在拉伸工件時補償形狀改變的雷射加工方法及一種製造掩模總成的方法。The invention relates to a laser processing method and a method for manufacturing a mask assembly, and more particularly, to a laser processing method for compensating a shape change when a workpiece is stretched and a method for manufacturing a mask assembly.

當製造有源矩陣有機發光二極體(active matrix organic light-emitting diode,AMOLED)時,執行真空沉積工藝以沉積數層有機材料,且應針對RGB(紅色、綠色及藍色)圖元中的每一者沉積不同的有機材料。在此,精細金屬掩模(fine metal mask,FMM)用作遮罩掩模,以使有機材料僅沉積到所期望的圖元上而不會沉積到其他區上。When manufacturing an active matrix organic light-emitting diode (AMOLED), a vacuum deposition process is performed to deposit several layers of organic materials, and the RGB (red, green, and blue) graphics Each deposits a different organic material. Here, a fine metal mask (FMM) is used as a mask mask so that the organic material is deposited only on the desired picture elements and not on other regions.

通常,製造精細金屬掩模總成,以使得被製造為分離掩模的多個掩模棒中的每一者皆受到拉伸,並透過焊接等固定到框架。當拉伸掩模棒以將所述掩模棒固定到框架時,掩模棒在拉伸方向上擴張且在與拉伸方向垂直的方向上收縮,因此形成在掩模棒中的孔的形狀、大小及位置會發生改變。因此,當形成掩模棒的孔時,如果所有孔的形狀及間距皆被製作成相同,則在拉伸掩模棒時,孔的形狀、大小及位置會發生改變,且因此例如位置精確度、形狀、大小等每一孔的標準或規格無法得到滿足。In general, a fine metal mask assembly is manufactured such that each of a plurality of mask bars manufactured as a separate mask is stretched and fixed to a frame by welding or the like. When the mask rod is stretched to fix the mask rod to the frame, the mask rod expands in the stretching direction and contracts in a direction perpendicular to the stretching direction, thus forming a shape of a hole in the mask rod , Size, and position will change. Therefore, when the holes of the mask stick are formed, if the shapes and pitches of all the holes are made the same, the shape, size, and position of the holes will change when the mask stick is stretched, and therefore, for example, the position accuracy The standards or specifications of each hole such as, shape, size, etc. cannot be met.

具體來說,在相關技術中,當對掩模棒的孔進行雷射加工時,雷射光束僅在x軸線及y軸線上受到二維的控制,且僅可在直線方向上(或在直線上)加工孔的形狀。因此,難以在對孔進行加工的同時補償在拉伸掩模棒時發生的形狀、大小及位置的改變。Specifically, in the related art, when laser processing is performed on the hole of the mask rod, the laser beam is controlled only two-dimensionally on the x-axis and the y-axis, and only in a straight direction (or in a straight line). Top) Shape of the machined hole. Therefore, it is difficult to compensate for changes in shape, size, and position that occur when the mask rod is stretched while the holes are being processed.

相關技術文件
專利文件:韓國專利公開案第10-2015-0111349號
Related technical documents Patent Documents: Korean Patent Publication No. 10-2015-0111349

本發明提供一種雷射加工方法及一種製造掩模總成的方法,當拉伸工件時,所述兩種方法能夠透過加工位置受包括曲線在內的多條引導線引導的多個單元加工區來補償形狀改變。The invention provides a laser processing method and a method for manufacturing a mask assembly. When a workpiece is stretched, the two methods can pass through a plurality of unit processing areas guided by a plurality of guide lines including a curve through a processing position. To compensate for shape changes.

根據示例性實施例,一種雷射加工方法包括:在板形的工件的第一軸線方向上在所述工件上設置多條引導線,所述多條引導線包括曲線;將安置在所述工件上的多個單元加工區設置成沿所述多條引導線彼此間隔開;以及使用雷射光束在移動所述雷射光束的照射位置的同時照射所述多個單元加工區。According to an exemplary embodiment, a laser processing method includes: providing a plurality of guide lines on a workpiece in a first axis direction of a plate-shaped workpiece, the plurality of guide lines including a curve; and positioning the workpiece on the workpiece. A plurality of unit processing areas on the plurality of unit processing areas are arranged to be spaced apart from each other along the plurality of guide lines; and a plurality of unit processing areas are irradiated with a laser beam while moving an irradiation position of the laser beam.

所述多條引導線中彼此相鄰的兩條引導線具有不同的曲率。Two guide lines adjacent to each other among the plurality of guide lines have different curvatures.

所述多條引導線中的彎曲的引導線朝向遠離所述工件在所述第一軸線方向上的中心線的一側形成弧,且所述引導線距所述工件在所述第一軸線方向上的所述中心線越遠,所述引導線的曲率可越大。The curved guide line of the plurality of guide lines forms an arc toward a side far from a center line of the workpiece in the first axis direction, and the guide line is spaced from the workpiece in the first axis direction. The farther the centerline is on, the greater the curvature of the guideline may be.

在所述使用雷射光束照射所述多個單元加工區的過程中,在移動對所述引導線中的每一條引導線發出所述雷射光束的雷射頭的同時,可使用所述雷射光束照射所述多個被加工區。During the process of irradiating the plurality of unit processing areas with a laser beam, the laser can be used while moving a laser head that emits the laser beam to each of the guide lines. A radiation beam illuminates the plurality of processed regions.

在所述使用雷射光束照射所述多個單元加工區的過程中,可在所述引導線中的每一條引導線上以恒定速率移動所述雷射頭。During the process of irradiating the plurality of unit processing areas with a laser beam, the laser head may be moved at a constant rate on each of the guide lines.

在所述使用雷射光束照射所述多個單元加工區的過程中,可在與所述單元加工區中的每一單元加工區的大小對應地改變所述雷射光束的大小的同時,沿所述引導線中的每一條引導線移動所述雷射光束的所述照射位置。In the process of irradiating the plurality of unit processing areas with a laser beam, the size of the laser beam may be changed along with the size of each unit processing area in the unit processing area while changing the size of the laser beam. Each of the guide lines moves the irradiation position of the laser beam.

在所述使用雷射光束照射所述多個單元加工區的過程中,可透過調整所述雷射頭的高度來改變所述雷射光束的所述大小。In the process of irradiating the plurality of unit processing regions with a laser beam, the size of the laser beam may be changed by adjusting a height of the laser head.

在所述使用雷射光束照射所述多個單元加工區的過程中,可在透過依序改變所述雷射頭的三維座標值來移動所述雷射光束的所述照射位置的同時,改變所述雷射光束的所述大小。In the process of irradiating the plurality of unit processing regions with a laser beam, the irradiation position of the laser beam may be changed while sequentially changing the three-dimensional coordinate value of the laser head while changing the irradiation position of the laser beam. The size of the laser beam.

在設置所述多個單元加工區的過程中,可將所述引導線中的每一條引導線中的中心部分中的單元加工區設置成大於位於兩個端部部分上的單元加工區。In the process of setting the plurality of unit processing areas, the unit processing area in the center portion in each of the guide lines may be set larger than the unit processing areas located on both end portions.

在所述設置所述多個單元加工區的過程中,所述單元加工區距所述工件在所述第一軸線方向上的所述中心線越遠,所述引導線中的每一條引導線中的所述中心部分中的所述單元加工區可被設置得越大。In the process of setting the plurality of unit processing areas, the farther the unit processing area is from the center line of the workpiece in the first axis direction, each of the guide lines The unit processing area in the center portion may be set larger.

在所述設置所述多個單元加工區的過程中,所述單元加工區距所述工件在所述第一軸線方向上的所述中心線越遠,所述引導線中的每一條引導線中的所述中心部分中的所述單元加工區可以恒定的比率被設置得越大,且所述恒定的比率可根據所述工件的應變來確定。In the process of setting the plurality of unit processing areas, the farther the unit processing area is from the center line of the workpiece in the first axis direction, each of the guide lines The unit processing area in the center portion may be set larger at a constant ratio, and the constant ratio may be determined according to the strain of the workpiece.

在所述設置所述多個單元加工區的過程中,位於所述多條引導線的兩端上的單元加工區可被設置成恒定的大小。In the process of setting the plurality of unit processing regions, the unit processing regions located on both ends of the plurality of guide lines may be set to a constant size.

根據另一示例性實施例,一種製造掩模總成的方法包括:透過根據示例性實施例的雷射加工方法來加工工件,並提供掩模棒,在所述掩模棒中所述多個單元加工區形成有多個加工孔;以及在所述第一軸線方向上拉伸所述掩模棒並將所述掩模棒固定到具有開口部分的框架。According to another exemplary embodiment, a method of manufacturing a mask assembly includes processing a workpiece through a laser processing method according to an exemplary embodiment, and providing a mask rod in which the plurality of A unit processing area is formed with a plurality of processing holes; and the mask rod is stretched in the first axis direction and the mask rod is fixed to a frame having an opening portion.

在在所述第一軸線方向上拉伸所述掩模棒固定所述掩模棒的過程中,可朝向所述掩模棒的在所述第一軸向方向上的兩側對引導線中的每一條引導線的兩端施加平行的拉伸力。In the process of stretching the mask rod in the first axis direction to fix the mask rod, the guide rod may be aligned in the guide line toward both sides of the mask rod in the first axial direction. A parallel tensile force is applied to both ends of each guide wire.

在在所述第一軸線方向上拉伸所述掩模棒固定所述掩模棒的過程中,所述多個加工孔可被以二維方式排列成直線,且所述多個加工孔的大小可被製作成均勻的。In the process of stretching the mask rod in the first axis direction to fix the mask rod, the plurality of processing holes may be arranged in a two-dimensional manner in a straight line, and The size can be made uniform.

在下文,將參考附圖更詳細地闡述示例性實施例。然而,本發明可體現為不同的形式且不應被視為僅限於本文中所述的實施例。相反,提供這些實施例以使本發明詳盡且完整,且將本發明的範圍充分傳達給所屬領域的技術人員。在說明中,相似的參考編號指代相似的配置,圖可被部分地放大以清晰地說明示例性實施例,且在圖中相似的參考編號指代相似的元件。Hereinafter, exemplary embodiments will be explained in more detail with reference to the accompanying drawings. However, the invention may be embodied in different forms and should not be construed as limited to the embodiments described herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art. In the description, similar reference numbers refer to similar configurations, the drawings may be partially enlarged to clearly illustrate exemplary embodiments, and similar reference numbers refer to similar elements in the drawings.

圖1是說明根據示例性實施例的雷射加工方法的流程圖,且圖2是闡述根據示例性實施例的引導線及單元加工區的設置的概念圖。FIG. 1 is a flowchart illustrating a laser processing method according to an exemplary embodiment, and FIG. 2 is a conceptual diagram illustrating the setting of a guide line and a unit processing area according to an exemplary embodiment.

參考圖1及圖2,根據示例性實施例的雷射加工方法可包括:在板形的工件100的第一軸線方向上在工件100上設置多條引導線11,所述多條引導線11包括曲線(步驟S100);沿工件100上的所述多條引導線11設置多個單元加工區110,所述多個單元加工區110被安置成彼此間隔開(步驟S120);使用雷射光束10在移動雷射光束10的照射位置的同時照射所述多個單元加工區110。1 and 2, a laser processing method according to an exemplary embodiment may include: providing a plurality of guide lines 11 on the workpiece 100 in a first axis direction of the plate-shaped workpiece 100, the plurality of guide lines 11 Including a curve (step S100); setting a plurality of unit processing regions 110 along the plurality of guide lines 11 on the workpiece 100, the plurality of unit processing regions 110 being disposed spaced apart from each other (step S120); using a laser beam 10 irradiate the plurality of unit processing regions 110 while moving the irradiation position of the laser beam 10.

在示例性實施例中,工件100可以是在製造有機電致發光(electroluminescence,EL)元件或有機半導體元件時用於進行真空沉積工藝的精細金屬掩模(FMM)的掩模棒,但也將可以是任何物體,只要所述物體可使用雷射來加工即可。具體來說,在封裝半導體元件時,可在各種情形中使用所述雷射加工方法,例如當在印刷電路板(printed circuit board,PCB)中設置通孔或在半導體襯底的特定區中設置加工圖案時。In an exemplary embodiment, the workpiece 100 may be a mask rod of a fine metal mask (FMM) used to perform a vacuum deposition process when manufacturing an organic electroluminescence (EL) element or an organic semiconductor element, but will also It can be any object as long as the object can be processed using laser. Specifically, when packaging a semiconductor element, the laser processing method may be used in various situations, such as when a through hole is provided in a printed circuit board (PCB) or a specific area of a semiconductor substrate When processing a pattern.

首先,沿板形的工件100的第一軸線方向21在工件100上設置所述多條引導線11,所述多條引導線11包括曲線(步驟S100)。所述多條引導線11可被設置為工件100上的虛擬線,可沿工件100的第一軸線方向21設置,且可包括至少一條曲線。此時,所述多條引導線11可引導將被設置多個單元加工區110的位置,且工件100的第一軸線方向21可以是工件100的縱向方向(或長度方向),且當長軸線與短軸線無差異時,第一軸線方向可以是工件被拉伸的方向。在此,措辭「沿工件的第一軸線方向」的含義包含直線形狀及曲線形狀,且可不僅包含「平行於工件的第一軸線伸展」而且包含「不平行於工件的第一軸線伸展」。即,所述多條引導線11中的每一條引導線在工件100的第一軸線方向21上具有組成部分且每一條引導線在第一軸線方向21上從工件100的一端延伸到另一端,如此足矣。First, the plurality of guide lines 11 are provided on the workpiece 100 along the first axis direction 21 of the plate-shaped workpiece 100, and the plurality of guide lines 11 includes a curve (step S100). The plurality of guide lines 11 may be provided as virtual lines on the workpiece 100, may be provided along the first axis direction 21 of the workpiece 100, and may include at least one curve. At this time, the plurality of guide lines 11 can guide the positions where a plurality of unit processing areas 110 are to be set, and the first axis direction 21 of the workpiece 100 may be the longitudinal direction (or length direction) of the workpiece 100, and when the long axis When there is no difference from the short axis, the first axis direction may be the direction in which the workpiece is stretched. Here, the meaning of the phrase “along the first axis direction of the workpiece” includes straight and curved shapes, and may include not only “stretching parallel to the first axis of the workpiece” but also “stretching not parallel to the first axis of the workpiece”. That is, each of the plurality of guide lines 11 has a component in the first axis direction 21 of the workpiece 100 and each guide line extends from one end to the other end of the workpiece 100 in the first axis direction 21, So sufficient.

接下來,設置多個單元加工區110,所述多個單元加工區110安置在工件100上以沿所述多條引導線11彼此間隔開(步驟S120)。所述多個單元加工區110可沿引導線11中的每一條引導線彼此間隔開,且可被設置為工件100上的虛擬區。此時,所述多個單元加工區110可被設置成每一單元加工區110的中心位於每一條引導線11上。在此,當每一單元加工區110的形狀是具有方向的形狀時,引導線11可引導單元加工區110的形成方向。Next, a plurality of unit processing areas 110 are provided, which are disposed on the workpiece 100 to be spaced apart from each other along the plurality of guide lines 11 (step S120). The plurality of unit processing areas 110 may be spaced apart from each other along each of the guide lines 11 and may be set as a virtual area on the workpiece 100. At this time, the plurality of unit processing regions 110 may be set such that the center of each unit processing region 110 is located on each guide line 11. Here, when the shape of each unit processing area 110 is a shape having a direction, the guide line 11 may guide the formation direction of the unit processing area 110.

當拉伸工件100時,所述工件在拉伸方向上擴張且在與拉伸方向垂直的方向上收縮,因此加工物體110a(在加工物體110a中,加工單元加工區110)的形狀及位置會發生改變。因此,在示例性實施例中,對加工物體110a的形狀及位置的這些改變進行補償,設置單元加工區110,且加工體現出形狀及位置的改變的單元加工區110,且因此當拉伸工件100時,加工物體110a的形狀及位置的改變可得到補償。When the workpiece 100 is stretched, the workpiece expands in the stretching direction and shrinks in a direction perpendicular to the stretching direction, so the shape and position of the processing object 110a (in the processing object 110a, the processing unit processing area 110) will be changes happened. Therefore, in the exemplary embodiment, these changes in the shape and position of the processing object 110a are compensated, the unit processing area 110 is set, and the unit processing area 110 that reflects the change in shape and position is processed, and therefore when the workpiece is stretched At 100 hours, changes in the shape and position of the processed object 110a can be compensated.

通常,製造掩模總成,以使被製造為分離掩模的多個掩模棒中的每一者皆受到拉伸,並透過焊接等固定到框架。當拉伸掩模棒以將掩模棒固定到框架時,掩模棒在拉伸方向上擴張且在與拉伸方向垂直的方向上收縮,因此形成在掩模棒中的加工孔的形狀、大小及位置會發生改變。因此,當在掩模棒中形成加工孔時,如果所有孔的形狀及間距皆被製作成相同,則在拉伸掩模棒時,加工孔的形狀、大小及位置會發生改變,且因此例如位置精確度、形狀、大小等每一孔的標準或規格無法得到滿足。Generally, a mask assembly is manufactured so that each of a plurality of mask sticks manufactured as a separate mask is stretched and fixed to a frame by welding or the like. When the mask rod is stretched to fix the mask rod to the frame, the mask rod expands in the stretching direction and contracts in the direction perpendicular to the stretching direction, so the shape of the processing hole formed in the mask rod, Size and position will change. Therefore, when forming a processing hole in a mask rod, if the shape and pitch of all holes are made the same, the shape, size, and position of the processing hole will change when the mask rod is stretched, and therefore, for example The standards or specifications of each hole, such as position accuracy, shape, and size, cannot be met.

然而,透過示例性實施例的雷射加工方法,加工物體110a的形狀及位置的這些改變(即,加工孔的形狀及位置的改變)會得到補償,且單元加工區110被加工。因此,當在掩模棒中形成加工孔時,且當掩模棒被拉伸並被固定到框架時,位置、大小及形狀的改變會得到補償(或更正),以使得例如位置精確度、大小、形狀等標準或規格可得以滿足。However, through the laser processing method of the exemplary embodiment, these changes in the shape and position of the processing object 110a (that is, changes in the shape and position of the processing hole) are compensated, and the unit processing area 110 is processed. Therefore, when a processing hole is formed in the mask rod, and when the mask rod is stretched and fixed to the frame, changes in position, size, and shape are compensated (or corrected) such that, for example, position accuracy, Standards or specifications such as size and shape can be met.

在所述多條引導線11中彼此相鄰的兩條引導線11可具有彼此不同的曲率或彎曲方向。在此,曲率包括正負號,且具有不同正負號的曲率也可以是不同的曲率。此時,曲率的正負號是根據彎曲方向來確定。彎曲方向意指曲線彎曲的方向,且向上凸的彎曲方向可為「+」方向(或「+」號)且凹彎曲方向可為「-」方向(或「-」號)。在圖2中,相對於在工件100的第一軸線方向21上的中心線(或在所述多條引導線中位於中心處的線)來說,上側可為「+」方向,且下側可為「-」方向。在此,工件100的在第一軸線21上的中心線可意指在第一軸線方向21上平行延伸的線中位於中心處的線,且當在所述多條引導線11中不存在中心線時所述中心線可以是虛擬線。與此同時,在所述多條引導線11中,與工件100在第一軸線方向21上的中心線重合的中心線可具有曲率「0」且不是曲線,且因此可不存在彎曲方向(或曲率的正負號)。在此,所存在的彎曲方向也可能是不同的彎曲方向。Two guide lines 11 adjacent to each other among the plurality of guide lines 11 may have different curvatures or bending directions from each other. Here, the curvature includes a sign, and a curvature having a different sign may be a different curvature. At this time, the sign of the curvature is determined according to the bending direction. The bending direction means a direction in which the curve is bent, and the upward bending direction may be a "+" direction (or a "+" sign) and the concave bending direction may be a "-" direction (or a "-" sign). In FIG. 2, with respect to a center line in the first axis direction 21 of the workpiece 100 (or a line at the center among the plurality of guide lines), the upper side may be a “+” direction, and the lower side Can be "-" direction. Here, the center line of the workpiece 100 on the first axis 21 may mean a line located at the center among lines extending parallel in the first axis direction 21, and when there is no center in the plurality of guide lines 11 When the line is centered, the center line may be a virtual line. At the same time, among the plurality of guide lines 11, the center line that coincides with the center line of the workpiece 100 in the first axis direction 21 may have a curvature "0" and is not a curve, and thus there may be no bending direction (or curvature) Sign). Here, the bending directions that exist may also be different bending directions.

根據工件100的位置,由於在拉伸工件100時的拉力(即,在拉伸方向上是擴張力且在與拉伸方向垂直的方向上是收縮力),可根據對每一位置施加的拉力來確定單元加工區110的設置位置。在此,所述多條引導線11的曲率或彎曲方向可有所不同,以引導這些單元加工區110的設置位置。According to the position of the workpiece 100, since the tensile force when the workpiece 100 is stretched (that is, the expansion force in the stretching direction and the contraction force in the direction perpendicular to the stretching direction), the pulling force applied to each position To determine the setting position of the unit processing area 110. Here, the curvatures or bending directions of the plurality of guide lines 11 may be different to guide the setting positions of the unit processing areas 110.

由於所述多條引導線11可被設置到彼此不同的位置,因此針對所述多個單元加工區110被設置到的每一條引導線11而施加的拉力可有所不同。因此,可根據每一條引導線11的位置處的拉力來確定引導線11的曲率,且可根據每一條引導線11的位置處的拉力的方向來確定彎曲方向。因此,在所述多條引導線11中彼此相鄰的兩條引導線11可具有彼此不同的曲率或彎曲方向。Since the plurality of guide lines 11 can be set to different positions from each other, the pulling force applied to each of the guide lines 11 to which the plurality of unit processing areas 110 are set can be different. Therefore, the curvature of the guide wire 11 may be determined according to the pulling force at the position of each guide wire 11, and the bending direction may be determined according to the direction of the pulling force at the position of each guide wire 11. Therefore, two guide lines 11 adjacent to each other among the plurality of guide lines 11 may have different curvatures or bending directions from each other.

舉例來說,由於與工件100在第一軸線方向21上的中心線對應的直線形引導線11的曲率是「0」,因此所述曲率不同於相鄰的彎曲的引導線11所具有的曲率。另外,由於具有曲率的其他引導線11可因對每一位置所施加的拉力存在差異而具有不同的曲率,因此彼此相鄰的彎曲的引導線11可具有彼此不同的曲率。For example, since the curvature of the linear guide line 11 corresponding to the center line of the workpiece 100 in the first axis direction 21 is "0", the curvature is different from the curvature of the adjacent curved guide line 11 . In addition, since the other guide wires 11 having a curvature may have different curvatures due to differences in the pulling force applied to each position, the curved guide wires 11 adjacent to each other may have different curvatures from each other.

另外,在所述多條引導線11中彎曲的(或曲線形狀的)引導線11可朝向遠離工件100在第一軸線方向21上的中心線的一側形成弧,且彎曲的引導線距工件100在第一軸線方向21上的中心線越遠,彎曲的引導線的曲率越大。In addition, the curved (or curved) guide line 11 among the plurality of guide lines 11 may form an arc toward a side far from the center line of the workpiece 100 in the first axis direction 21, and the curved guide line may be spaced from the workpiece. The farther the centerline of 100 in the first axis direction 21 is, the larger the curvature of the curved guide line is.

在所述多條引導線11中彎曲的引導線11可形成弦與工件100的第一軸線(或工件在第一軸線方向上的中心線)平行的弧。此時,弧可朝向遠離工件100在第一軸線方向21上的中心線的一側(或朝向工件的第二軸線方向上的兩側)形成。在此,工件100的第二軸線方向22可以是工件100的短軸線方向(或寬度方向),且可以是與工件100的第一軸線方向21相交(或垂直)的方向。當在第一軸線方向21上拉伸工件100時,工件100在工件100的第一軸線方向21上擴張且在工件100的第二方向22上收縮。因此,可透過形成朝向遠離工件100在第一軸線方向21上的中心線的一側的弧來在工件100在第一軸線方向21上被拉伸時補償加工物體110a的位置改變。另外,只有在對曲線的兩端施加相同的拉力時,才可將曲線拉伸成直線。因此,形成弦與工件100在第一軸線方向21上的軸線平行的弧,且當以曲線形狀排列在彎曲的引導線11上的多個加工物體110a在工件100的第一軸線方向21上被拉伸時,可將加工物體110a排列成一條線(或排列成直線形狀)。The guide line 11 bent in the plurality of guide lines 11 may form an arc with a chord parallel to a first axis of the workpiece 100 (or a center line of the workpiece in the first axis direction). At this time, the arc may be formed toward one side (or toward both sides in the second axis direction of the workpiece) away from the center line of the workpiece 100 in the first axis direction 21. Here, the second axis direction 22 of the workpiece 100 may be a short axis direction (or width direction) of the workpiece 100, and may be a direction that intersects (or is perpendicular to) the first axis direction 21 of the workpiece 100. When the workpiece 100 is stretched in the first axis direction 21, the workpiece 100 expands in the first axis direction 21 of the workpiece 100 and contracts in the second direction 22 of the workpiece 100. Therefore, it is possible to compensate for a change in the position of the processing object 110 a when the workpiece 100 is stretched in the first axis direction 21 by forming an arc facing one side away from the center line of the workpiece 100 in the first axis direction 21. In addition, the curve can be stretched into a straight line only when the same tension is applied to both ends of the curve. Therefore, an arc having a chord parallel to the axis of the workpiece 100 in the first axis direction 21 is formed, and when a plurality of processing objects 110 a arranged in a curved shape on the curved guide line 11 are aligned in the first axis direction 21 of the workpiece 100 During stretching, the processed objects 110a may be arranged in a line (or in a linear shape).

彎曲的引導線11距工件100在第一軸線方向21上的中心線越遠,所述彎曲的引導線的曲率越大。此時,工件100在第二軸線方向22上的兩個周邊側(其在第二軸線方向22上被施加最強收縮力)可具有最大曲率,且距工件100中在第二軸線方向22上的中心部分(其在第二軸線方向22上被施加最強收縮力)越近,曲率可越小。就在第一軸線方向21上拉伸工件100來說,工件100在第二軸線方向22上的收縮力是從工件100在第二軸線方向22上的兩個周邊側朝向工件100在第二軸線方向22上的中心而施加。因此,在第二軸線方向22上,工件100的兩個周邊側上的收縮力最強,且工件100的中心上的收縮力最弱。因此,距工件100在第一軸線方向21上的中心線越遠,曲率可越大。此時,可根據工件100的應變及對工件100的兩端施加的拉力來確定每一條引導線11的曲率。另外,可透過考量工件100的厚度、工件100的材料、每一單元加工區110的形狀、大小、位置以及由所述多個單元加工區110形成的圖案的大小這些因素中的至少一個因素來確定每一條引導線11的曲率。The farther the curved guide line 11 is from the center line of the workpiece 100 in the first axis direction 21, the greater the curvature of the curved guide line. At this time, the two peripheral sides of the workpiece 100 in the second axis direction 22 (which is subjected to the strongest contraction force in the second axis direction 22) may have a maximum curvature and be away from the workpiece 100 in the second axis direction 22 The closer the central portion (which is subjected to the strongest contraction force in the second axis direction 22), the smaller the curvature may be. As far as the workpiece 100 is stretched in the first axis direction 21, the contraction force of the workpiece 100 in the second axis direction 22 is from the two peripheral sides of the workpiece 100 in the second axis direction 22 toward the workpiece 100 in the second axis. Applied in the center in the direction 22. Therefore, in the second axis direction 22, the contraction force on the two peripheral sides of the workpiece 100 is the strongest, and the contraction force on the center of the workpiece 100 is the weakest. Therefore, the farther from the center line of the workpiece 100 in the first axis direction 21, the larger the curvature may be. At this time, the curvature of each guide wire 11 can be determined according to the strain of the workpiece 100 and the tensile force applied to both ends of the workpiece 100. In addition, at least one of factors such as the thickness of the workpiece 100, the material of the workpiece 100, the shape, size, and position of each unit processing area 110, and the size of a pattern formed by the plurality of unit processing areas 110 can be considered. The curvature of each guide line 11 is determined.

與此同時,所述多個單元加工區110可被安置成關於工件100在第一軸線方向21上的中心線及在第二軸線方向22上的中心線對稱。舉例來說,單元加工區可被安置成關於所述多條引導線11中的中心直線對稱。在此種情形中,在第一軸線方向21上拉伸工件100的拉力以預定的模式均勻地傳遞到工件100的整個區,當在第一軸線方向21上拉伸時工件100每一加工物體110a的位置精確度可得以提高,可在工件100的中心部分處形成準確的二維圖案。At the same time, the plurality of unit processing regions 110 may be disposed symmetrically with respect to a center line of the workpiece 100 in the first axis direction 21 and a center line in the second axis direction 22. For example, the unit processing area may be arranged to be linearly symmetrical with respect to the center of the plurality of guide lines 11. In this case, the pulling force that stretches the workpiece 100 in the first axis direction 21 is uniformly transmitted to the entire area of the workpiece 100 in a predetermined pattern, and each processed object of the workpiece 100 when stretched in the first axis direction 21 The position accuracy of 110 a can be improved, and an accurate two-dimensional pattern can be formed at the center portion of the workpiece 100.

隨後,使用雷射光束10在移動雷射光束10的照射位置的同時照射所述多個單元加工區110(步驟S130)。在此,可透過移動工件100的位置或雷射頭50的位置來移動雷射光束10的照射位置。此時,僅在所述多個單元加工區110,才可使用雷射光束10來照射工件100。即僅在所述多個單元加工區110中,才可接通雷射光束10,且在不需要被雷射光束10加工的其他區中,可關閉雷射光束10。另外,當啟用(被接通)雷射光束10時,在不需要由雷射光束10加工的區中,借助阻擋部件(未示出)等來阻擋雷射光束10,且僅所述多個加工區110才可被雷射光束10照射。Subsequently, the plurality of unit processing regions 110 are irradiated with the laser beam 10 while moving the irradiation position of the laser beam 10 (step S130). Here, the irradiation position of the laser beam 10 can be moved by moving the position of the workpiece 100 or the position of the laser head 50. At this time, the laser beam 10 can be used to irradiate the workpiece 100 only in the plurality of unit processing regions 110. That is, the laser beam 10 can be turned on only in the plurality of unit processing regions 110, and the laser beam 10 can be turned off in other regions that do not need to be processed by the laser beam 10. In addition, when the laser beam 10 is enabled (turned on), the laser beam 10 is blocked by a blocking member (not shown) or the like in a region that does not need to be processed by the laser beam 10, and only the plurality of Only the processing area 110 can be illuminated by the laser beam 10.

舉例來說,在使用雷射光束10照射所述多個單元加工區110的過程中,在改變雷射光束10的座標值的同時,可移動雷射光束10的照射位置。即,透過改變雷射光束10的座標值來將雷射光束10的照射位置移動到與所述多個單元加工區110對應的座標,且因此,所述多個單元加工區110可被雷射光束10照射。在此種情形中,可在與所述多個單元加工區11對應的座標處啟用(接通)雷射光束10。另外,可易於使用雷射光束10來僅照射並加工所述多個單元加工區110,且也可易於將雷射光束10的照射位置移動到所述多個單元加工區110。For example, during the process of irradiating the plurality of unit processing regions 110 with the laser beam 10, the irradiation position of the laser beam 10 can be moved while changing the coordinate value of the laser beam 10. That is, the irradiation position of the laser beam 10 is moved to the coordinates corresponding to the plurality of unit processing regions 110 by changing the coordinate values of the laser beam 10, and therefore, the plurality of unit processing regions 110 can be lasered. The light beam 10 is irradiated. In this case, the laser beam 10 may be enabled (turned on) at the coordinates corresponding to the plurality of unit processing regions 11. In addition, it is easy to use the laser beam 10 to irradiate and process only the plurality of unit processing regions 110, and it is also easy to move the irradiation position of the laser beam 10 to the plurality of unit processing regions 110.

圖3是用於闡述根據示例性實施例的雷射頭的移動的概念圖,圖3的(a)是用於闡述雷射頭的水準移動的概念圖,且圖3的(b)是用於闡述雷射頭的垂直移動的概念圖。FIG. 3 is a conceptual diagram for explaining the movement of the laser head according to an exemplary embodiment, FIG. 3 (a) is a conceptual diagram for explaining the horizontal movement of the laser head, and FIG. 3 (b) is used for A conceptual diagram for explaining the vertical movement of the laser head.

參考圖3,在使用雷射光束10照射所述多個單元加工區110的過程中(步驟S130),可在移動對每一條引導線11發出雷射光束10的雷射頭50的同時,使用雷射光束10來照射所述多個單元加工區110。可參照每一條引導線11不斷地移動雷射頭50。舉例來說,可沿每一條引導線11移動雷射頭,且在啟用(或接通)並移動雷射光束10時,僅在所述多個加工區110中才可加工所述多個加工區110。在此,當沿彎曲的引導線11移動雷射頭時,可使用微線性向量的組合以與曲線類似的方式移動雷射頭,且措辭「沿引導線」的含義可不僅包含與引導線11相同的移動,而且包含與引導線11類似的移動。此時,可沿單條引導線11執行多次掃描(或往復)。當沿單一引導線11執行多次掃描時,如果使用大小小於單元加工區110的大小的雷射光束10照射每一單元加工區110,則可沿單條引導線11執行所述多次掃描直到使用雷射光束10完全掃描每一單元加工區110為止,此時在引導線11的曲率維持不變的情況下,在引導線11的一端及/或另一端處在第二軸線方向22上移動雷射頭達等於或小於雷射光束10在第二軸線方向上的寬度的距離,以使得可在每一單元加工區110中改變雷射光束10的照射位置。此時,可以時間分割方式或以空間分割方式移動雷射光束10的照射位置。可參照每一條引導線11移動雷射光束10的照射位置。舉例來說,可參照每一條引導線11以時間分割方式移動雷射光束10的照射位置,或也可參照多條引導線11以空間分割方式移動雷射光束10的照射位置。Referring to FIG. 3, in the process of irradiating the plurality of unit processing areas 110 with the laser beam 10 (step S130), the laser head 50 which emits the laser beam 10 to each guide line 11 can be used while moving, A laser beam 10 illuminates the plurality of unit processing regions 110. The laser head 50 may be continuously moved with reference to each guide line 11. For example, the laser head can be moved along each guide line 11, and when the laser beam 10 is enabled (or turned on) and moved, the plurality of processes can be processed only in the plurality of processing areas 110 District 110. Here, when the laser head is moved along the curved guide line 11, a combination of micro-linear vectors may be used to move the laser head in a similar manner to a curve, and the meaning of the word "along the guide line" may include not only the guide line 11 The same movement, and includes movement similar to the guide line 11. At this time, multiple scans (or reciprocations) may be performed along a single guide line 11. When multiple scans are performed along a single guide line 11, if each unit processing area 110 is irradiated with a laser beam 10 having a size smaller than the size of the unit processing area 110, the multiple scans may be performed along a single guide line 11 until use The laser beam 10 completely scans each unit processing area 110. At this time, while the curvature of the guide wire 11 is maintained, one end of the guide wire 11 and / or the other end is moved in the second axis direction 22 The head is a distance equal to or smaller than the width of the laser beam 10 in the second axis direction, so that the irradiation position of the laser beam 10 can be changed in each unit processing area 110. At this time, the irradiation position of the laser beam 10 may be moved in a time division manner or a space division manner. The irradiation position of the laser beam 10 can be moved with reference to each guide line 11. For example, the irradiation position of the laser beam 10 may be moved in a time division manner with reference to each guide line 11, or the irradiation position of the laser beam 10 may be moved in a space division manner with reference to a plurality of guide lines 11.

使用雷射光束10照射多個單元加工區110(步驟S130)可包括:使用雷射光束10依序照射所述多條引導線11中第一引導線110a中的單元加工區110(步驟S131);及使用雷射光束10照射與第一引導線11a相鄰的第二引導線11b的單元加工區110。Using the laser beam 10 to illuminate a plurality of unit processing areas 110 (step S130) may include: using the laser beam 10 to sequentially illuminate the unit processing areas 110 in a first guide line 110a of the plurality of guide lines 11 (step S131) And irradiate the unit processing region 110 of the second guide line 11b adjacent to the first guide line 11a with the laser beam 10.

透過依序照射第一引導線11a中的單元加工區110來執行(或完成)對排列在第一引導線11a中的單元加工區110的加工,且透過依序照射第二引導線11b中的單元加工區110來執行(或完成)對排列在第二引導線11b中的單元加工區110的加工,以使得可參考每一條引導線11加工單元加工區110。由於拉力是根據對應位置被施加到每一條引導線11的兩端,因此對每一條引導線11施加相同的拉力。因此,當未在相同的條件下參照每一條引導線加工單元加工區110時,不可能從每一條引導線11的所述多個單元加工區110獲得具有均勻品質的圖案。The processing of the unit processing regions 110 arranged in the first guide line 11a is performed (or completed) by sequentially irradiating the unit processing areas 110 in the first guide line 11a, and the processing of the unit processing areas 110 in the second guide line 11b is sequentially irradiated. The unit processing area 110 performs (or completes) the processing of the unit processing areas 110 arranged in the second guide line 11 b so that the unit processing area 110 can be processed with reference to each guide line 11. Since a pulling force is applied to both ends of each guide wire 11 according to a corresponding position, the same pulling force is applied to each guide wire 11. Therefore, when each guide line processing unit processing area 110 is not referred to under the same conditions, it is impossible to obtain a pattern with uniform quality from the plurality of unit processing areas 110 of each guide line 11.

因此,為從每一條引導線11的所述多個單元加工區110獲得具有均勻品質的圖案,應在相同的條件下參照每一條引導線11對單元加工區110執行加工。在此,當不參照每一條引導線11對單元加工區110執行加工時,難以針對每一條引導線11形成相同的條件,且應不斷地改變條件。因此,可參照每一條引導線11執行單元加工區110。因此,可從每一條引導線11的所述多個單元加工區110獲得具有均勻品質的圖案。Therefore, in order to obtain a pattern with uniform quality from the plurality of unit processing areas 110 of each guide line 11, processing should be performed on the unit processing area 110 with reference to each guide line 11 under the same conditions. Here, when processing is performed on the unit processing area 110 without referring to each guide line 11, it is difficult to form the same conditions for each guide line 11, and the conditions should be constantly changed. Therefore, the unit processing area 110 can be executed with reference to each guide line 11. Therefore, a pattern having a uniform quality can be obtained from the plurality of unit processing regions 110 of each guide line 11.

在使用雷射光束10照射所述多個加工區110的過程中,可在與每一單元加工區110的大小對應地改變雷射光束10的大小的同時,沿每一條引導線11移動雷射光束10的照射位置。在此,雷射光束10的大小也可被改變成與每一單元加工區110的大小相同,或儘管小於每一單元加工區110的大小,但也可被改變成與每一單元加工區110的大小成比例。另外,當雷射光束10的大小小於每一單元加工區110的大小時,可參照每一條引導線11沿引導線11執行多次掃描。為減小(最小化)雷射光束10的照射位置的移動距離且雷射光束10在每一單元加工區110中的移動速率(或移動速度)恒定,可沿引導線11移動雷射光束10的照射位置。當雷射光束10的照射位置沿引導線11時,雷射光束10的照射位置是線性移動的且移動區段的曲率是均勻的,且因此可易於每一單元加工區110中維持速率(或速度)且可易於接通/關閉雷射光束10。In the process of using the laser beam 10 to illuminate the plurality of processing regions 110, the laser beam can be moved along each guide line 11 while changing the size of the laser beam 10 corresponding to the size of each unit processing region 110 The irradiation position of the light beam 10. Here, the size of the laser beam 10 can also be changed to be the same as the size of each unit processing area 110 or, although smaller than the size of each unit processing area 110, it can also be changed to be the same as each unit processing area 110. The size is proportional. In addition, when the size of the laser beam 10 is smaller than the size of each unit processing area 110, multiple scans can be performed along the guide line 11 with reference to each guide line 11. In order to reduce (minimize) the moving distance of the irradiation position of the laser beam 10 and the moving rate (or moving speed) of the laser beam 10 in each unit processing area 110 is constant, the laser beam 10 may be moved along the guide line 11 Irradiation position. When the irradiation position of the laser beam 10 is along the guide line 11, the irradiation position of the laser beam 10 is linearly moved and the curvature of the moving section is uniform, and therefore it is easy to maintain the rate (or Speed) and the laser beam 10 can be easily switched on / off.

此時,可根據單元加工區110的大小來改變雷射光束10的大小且為參照每一條引導線11加工具有各種大小的單元加工區110,可移動雷射光束10的照射位置且可同時改變雷射光束10的大小。即,可透過改變雷射光束10的大小來調整被加工大小(或面積),且可根據單元加工區110的大小來改變雷射光束10的大小。At this time, the size of the laser beam 10 can be changed according to the size of the unit processing area 110. To process each unit processing area 110 having various sizes with reference to each guide line 11, the irradiation position of the laser beam 10 can be moved and can be changed at the same time The size of the laser beam 10. That is, the size (or area) to be processed can be adjusted by changing the size of the laser beam 10, and the size of the laser beam 10 can be changed according to the size of the unit processing area 110.

舉例來說,在使用雷射光束10依序照射第一引導線11a的單元加工區110的過程中(步驟S131),在沿第一引導線11a從第一引導線11a的一端到另一端移動雷射光束10的照射位置的同時,可使用雷射光束10照射第一引導線11a的單元加工區110。另外,在使用雷射光束10依序照射第二引導線11b的單元加工區110的過程中(步驟S132),在沿第二引導線11b從第二引導線11b的一端到另一端移動雷射光束10的照射位置的同時,可使用雷射光束10照射第二引導線11b的單元加工區110。在此種情形中,當使用雷射光束10照射了所述多個單元加工區110的全部時(或當完全掃描了工件的一個表面時),移動雷射光束10的照射的距離可被最小化,且使用雷射光束10照射每一單元加工區110的次數(或重複次數)可相同。For example, in the process of sequentially irradiating the unit processing area 110 of the first guide line 11a with the laser beam 10 (step S131), the first guide line 11a is moved from one end to the other end along the first guide line 11a. At the same time as the irradiation position of the laser beam 10, the unit processing region 110 of the first guide line 11 a may be irradiated with the laser beam 10. In addition, while the unit processing area 110 of the second guide line 11b is sequentially irradiated with the laser beam 10 (step S132), the laser is moved along the second guide line 11b from one end of the second guide line 11b to the other end. At the same time as the irradiation position of the light beam 10, the unit processing area 110 of the second guide line 11 b may be irradiated with the laser beam 10. In this case, when all of the plurality of unit processing areas 110 are irradiated with the laser beam 10 (or when one surface of the workpiece is completely scanned), the irradiation distance of the moving laser beam 10 can be minimized And the number of times (or the number of repetitions) of irradiating each unit processing area 110 with the laser beam 10 may be the same.

此時,可透過在工件100的第二軸線方向22(或步進方向)上移動雷射光束10來將雷射光束10的照射位置從第一引導線11a的另一端移動到第二引導線11b的另一端,且在所述多個引導線11中、在工件100的在第二軸線方向22上的引導線11之間的移動距離可為恒定的。即,位於每一條引導線11的兩端的單元加工區110可在引導線11之間具有恒定的間隔,且在此種情形中,當在第一軸線方向21上拉伸工件100時,可獲得具有恒定間隔的圖案。At this time, the irradiation position of the laser beam 10 can be moved from the other end of the first guide line 11 a to the second guide line by moving the laser beam 10 in the second axis direction 22 (or step direction) of the workpiece 100. The other end of 11b and the moving distance between the plurality of guide lines 11 between the guide lines 11 of the workpiece 100 in the second axis direction 22 may be constant. That is, the unit processing areas 110 located at both ends of each guide line 11 may have a constant interval between the guide lines 11, and in this case, when the workpiece 100 is stretched in the first axis direction 21, it may be obtained A pattern with a constant interval.

當使用雷射光束10在沿每一條引導線11移動雷射光束10的照射位置的同時照射所述多個單元加工區110時,可減小副作用(例如,熱影響或每一單元加工區110中出現毛刺等),可縮短加工所述多個單元加工區110的時間,且可易於控制雷射頭50的移動方向、移動速率等。When the laser beam 10 is used to irradiate the plurality of unit processing regions 110 while moving the irradiation position of the laser beam 10 along each guide line 11, side effects such as thermal effects or each unit processing region 110 can be reduced. Burrs, etc.), can shorten the processing time of the plurality of unit processing areas 110, and can easily control the moving direction, moving speed, etc. of the laser head 50.

舉例來說,當在使用雷射光束10照射每一單元加工區110的同時不移動而是停止所述雷射光束時,熱量會積聚在每一單元加工區110中且加工物體110a的形狀可由於所積聚的熱量而發生變形,且可能會在加工物體110a的周邊形成毛刺。另外,當單元加工區110的數目巨大(例如,數百個)時,完成對數百個單元加工區110的加工會花費很長的時間。For example, when the laser beam 10 is used to irradiate each unit processing area 110 while not moving but stopping the laser beam, heat will be accumulated in each unit processing area 110 and the shape of the processing object 110a may be Deformation occurs due to the accumulated heat, and burrs may be formed around the processed object 110a. In addition, when the number of the unit processing areas 110 is large (for example, hundreds), it may take a long time to complete the processing of the hundreds of unit processing areas 110.

然而,如在示例性實施例中,當使用雷射光束10在沿每一條引導線11移動雷射光束10的照射位置的同時照射所述多個單元加工區110時,由於在工件100上被雷射光束10照射的位置不斷地發生改變,因此可防止熱量積聚在單元加工區110中,且因此可防止產生熱變形或毛刺。另外,由於在每一單元加工區110中,僅需要調整沿每一條引導線11移動過程中的掃描次數(或重複次數)而無需等待加工完成,因此可縮短加工所述多個單元加工區110的時間,且也可減小掃描所述多個單元加工區110的掃描距離。However, as in the exemplary embodiment, when the laser beam 10 is used to irradiate the plurality of unit processing regions 110 while moving the irradiation position of the laser beam 10 along each guide line 11, since The position at which the laser beam 10 is irradiated is continuously changed, so that heat can be prevented from being accumulated in the unit processing area 110, and thus thermal deformation or burrs can be prevented from occurring. In addition, since in each unit processing area 110, it is only necessary to adjust the number of scans (or repetitions) during the movement along each guide line 11 without waiting for processing to be completed, the processing of the plurality of unit processing areas 110 can be shortened Time, and the scanning distance for scanning the plurality of unit processing regions 110 can also be reduced.

與此同時,當使用雷射光束10在任意方向上移動雷射頭50的同時照射所述多個單元加工區110時,雷射頭50的移動方向可突然發生改變,且在第一軸線方向21與第二軸線方向21上的改變速率並不恒定。因此,由於雷射頭50的移動突然發生改變,因此不僅不易於對雷射頭50的移動進行控制,而且可產生對單元加工區110的加工錯誤。然而,當使用雷射光束10在沿每一條引導線11移動雷射頭50的同時照射所述多個單元加工區110時,雷射頭50的移動方向可以恒定的模式(或依序)平滑地改變,且在第一軸線方向與第二軸線方向上的改變速率可以是恒定的,且因此可易於對雷射頭50的移動進行控制。At the same time, when the laser beam 10 is used to move the laser head 50 in an arbitrary direction while irradiating the plurality of unit processing regions 110, the moving direction of the laser head 50 may suddenly change and be in the first axis direction The rate of change between 21 and the second axis direction 21 is not constant. Therefore, since the movement of the laser head 50 suddenly changes, it is not only difficult to control the movement of the laser head 50, but a machining error of the unit processing area 110 may be generated. However, when the laser beam 10 is used to irradiate the plurality of unit processing regions 110 while moving the laser head 50 along each guide line 11, the moving direction of the laser head 50 may be smoothed in a constant pattern (or sequentially). Ground, and the rate of change in the first axis direction and the second axis direction may be constant, and thus the movement of the laser head 50 may be easily controlled.

在使用雷射光束10照射所述多個單元加工區110的過程中(步驟S130),可透過調整雷射頭50的高度來改變雷射光束10的大小。雷射頭50可發出雷射光束10,且可透過調整雷射頭50的高度(或在z軸線方向上的位置)來改變雷射光束10的大小。舉例來說,當雷射頭50的高度降低時(或當雷射頭靠近工件時),雷射光束10的大小可增大,且當雷射頭50的高度升高時(或當雷射頭移動遠離工件時),雷射光束10的大小可減小。During the process of irradiating the plurality of unit processing regions 110 with the laser beam 10 (step S130), the size of the laser beam 10 can be changed by adjusting the height of the laser head 50. The laser head 50 can emit a laser beam 10, and the size of the laser beam 10 can be changed by adjusting the height (or the position in the z-axis direction) of the laser head 50. For example, when the height of the laser head 50 is lowered (or when the laser head is close to the workpiece), the size of the laser beam 10 may be increased, and when the height of the laser head 50 is raised (or when the laser head is raised) When the head is moved away from the workpiece), the size of the laser beam 10 can be reduced.

為在工件100的整個區之上均勻地加工所述多個單元加工區110,應使用具有相同的能量的雷射光束來加工每一單元加工區110。此時,當調整雷射頭50的高度以改變雷射光束10的大小時,可獲得具有相同的大小同時具有相同的能量的雷射光束10。因此,可使用具有相同的能量的雷射光束10來加工所述多個單元加工區110,且可以相同的深度加工單元加工區110,以使掃描所述多個單元加工區110的次數可相同。因此,可使用相同的能量及相同的掃描次數來加工所述多個單元加工區110,以使得可在工件的整個區之上形成均勻加工的物體110a。To uniformly process the plurality of unit processing regions 110 over the entire region of the workpiece 100, each unit processing region 110 should be processed using a laser beam having the same energy. At this time, when the height of the laser head 50 is adjusted to change the size of the laser beam 10, the laser beam 10 having the same size and the same energy can be obtained. Therefore, the plurality of unit processing regions 110 may be processed using the laser beam 10 having the same energy, and the unit processing regions 110 may be processed at the same depth so that the number of times the plurality of unit processing regions 110 are scanned is the same. . Therefore, the plurality of unit processing regions 110 can be processed using the same energy and the same number of scans, so that a uniformly processed object 110a can be formed over the entire region of the workpiece.

在使用雷射光束10照射所述多個單元加工區110的過程中(步驟S130),可在透過依序改變雷射頭50的三維座標值來移動雷射光束10的照射位置的同時,改變雷射光束10的大小。此時,第一軸線方向21的值(例如,x軸線值)、第二軸線方向22的值(例如,y軸線值)及高度方向23的值(例如,z軸線值)可被設定為三維值。During the process of irradiating the plurality of unit processing areas 110 with the laser beam 10 (step S130), the irradiation position of the laser beam 10 can be changed by sequentially changing the three-dimensional coordinate value of the laser head 50 while changing the irradiation position of the laser beam 10. The size of the laser beam 10. At this time, the value in the first axis direction 21 (for example, the x-axis value), the value in the second axis direction 22 (for example, the y-axis value), and the value in the height direction 23 (for example, the z-axis value) can be set to three-dimensional value.

在相關技術中,在雷射加工期間,透過在直線上線性地控制x軸線及y軸線(即二維)來加工出形狀,且當在第一軸線方向21上拉伸工件100時,由於在直線方向上的加工而不可對加工物體的形狀及位置的改變做出補償。即在相關技術中,可在雷射加工掩模棒狀態中滿足例如位置精確度、大小及形狀等標準或規格,但當在第一軸線方向21上拉伸掩模棒時,加工孔的標準或規格可因在拉伸方向上的擴張及在與拉伸方向垂直的方向上的收縮而無法得到滿足。In the related art, during laser processing, the shape is processed by linearly controlling the x-axis and y-axis (that is, two-dimensional) on a straight line, and when the workpiece 100 is stretched in the first axis direction 21, since Processing in a straight direction cannot compensate for changes in the shape and position of the processed object. That is, in the related art, standards or specifications such as position accuracy, size, and shape can be satisfied in a laser processing mask rod state, but when the mask rod is stretched in the first axis direction 21, the hole processing standard Or specifications cannot be satisfied due to expansion in the stretching direction and contraction in the direction perpendicular to the stretching direction.

然而,在示例性實施例中,不僅可依序改變雷射頭50的三維座標值且可沿引導線11在曲線方向上執行加工,而且也可在高度方向(或z軸線方向)上改變雷射頭50的位置,以使得在維持雷射光束10的恒定的能量的同時也可改變雷射光束10的大小。因此,當在第一軸線方向21上拉伸工件100(例如,拉伸掩模棒並將掩模棒固定到框架)時,所期望的加工物體110a的形狀及位置精確度可得以保證。However, in the exemplary embodiment, not only the three-dimensional coordinate value of the laser head 50 may be sequentially changed and processing may be performed in a curved direction along the guide line 11, but also the laser may be changed in a height direction (or a z-axis direction). The position of the head 50 is such that the size of the laser beam 10 can be changed while maintaining the constant energy of the laser beam 10. Therefore, when the workpiece 100 is stretched in the first axis direction 21 (for example, the mask rod is stretched and the mask rod is fixed to the frame), the desired shape and position accuracy of the processing object 110a can be ensured.

在使用雷射光束照射所述多個單元加工區110的過程中(步驟S130),可在每一條引導線11上以恒定速率移動雷射頭50。為從每一條引導線11的所述多個單元加工區110獲得具有均勻品質的圖案,應參照每一條引導線11以恒定速率對單元加工區110執行加工。此時,當設定三維座標值時,第一軸線方向、第二軸線方向及高度方向上的速率值也被設定,以使雷射頭50可沿每一條引導線11以恒定速率移動,且透過雷射頭50的三維移動,雷射光束10的大小可在雷射頭50沿每一條引導線11移動的同時得到調整。因此,可從每一條引導線11的所述多個單元加工區110獲得具有均勻品質的圖案。During the process of irradiating the plurality of unit processing regions 110 with a laser beam (step S130), the laser head 50 may be moved at a constant rate on each guide line 11. In order to obtain a pattern with uniform quality from the plurality of unit processing areas 110 of each guide line 11, processing should be performed on the unit processing area 110 at a constant rate with reference to each guide line 11. At this time, when the three-dimensional coordinate value is set, the velocity values in the first axis direction, the second axis direction, and the height direction are also set so that the laser head 50 can move at a constant rate along each guide line 11 and pass through The three-dimensional movement of the laser head 50, the size of the laser beam 10 can be adjusted while the laser head 50 moves along each guide line 11. Therefore, a pattern having a uniform quality can be obtained from the plurality of unit processing regions 110 of each guide line 11.

舉例來說,可透過使用數值控制(numerical control,NC)方法來移動雷射頭50。在此,可對數值控制(NC)方法應用納米尺度。在數值控制方法中,按照微單位來執行在每一方向上的線性移動,且因此可與曲線移動實質上相同地執行所述線性移動。更具體來說,在曲線移動期間獲得在x軸線、y軸線及z軸線上的軌跡,且同時,移動雷射頭50的三條軸線(或在三軸線方向上),以使得可使用雷射光束10來加工單元加工區。由於可透過引導線11預先計算出關於三維座標值的資料,因此當這些座標被轉換成G代碼且使用NC裝置時,可更易於執行精確的控制來補償加工物體110a的形狀的改變。在此,G代碼是數值控制(NC)中所使用的程式設計語言或標準格式,且可輸入在x軸線、y軸線及z軸線上的三維座標及每一軸線的速率,且因此可透過每一軸線的速率輸入使雷射頭50在每一條引導線上以恒定速率移動。For example, the laser head 50 may be moved by using a numerical control (NC) method. Here, nanoscale can be applied to numerical control (NC) methods. In the numerical control method, the linear movement in each direction is performed in micro units, and thus the linear movement can be performed substantially the same as the curved movement. More specifically, the trajectories on the x-axis, y-axis, and z-axis are obtained during the curve movement, and at the same time, the three axes (or in the three-axis direction) of the laser head 50 are moved so that the laser beam can be used 10 to processing unit processing area. Since the information about the three-dimensional coordinate values can be calculated in advance through the guide line 11, when these coordinates are converted into G codes and an NC device is used, it is easier to perform accurate control to compensate for the change in the shape of the processed object 110a. Here, the G code is a programming language or standard format used in numerical control (NC), and can input the three-dimensional coordinates on the x-axis, y-axis, and z-axis and the velocity of each axis, and therefore can pass through each An axis of velocity input causes the laser head 50 to move at a constant rate on each guide line.

與此同時,在第一軸線方向21上的速率(例如,在x軸線方向上的速率)在所有引導線11上可皆相同,且根據每一條引導線11的曲率,在第二軸線方向上的速率(例如,在y軸線方向上的速率)可隨著曲率增大而增大。舉例來說,可調整雷射頭50的移動速率以使在x軸線方向及y軸線方向上的所得速率向量(所得速率)是恒定的。此時,相較於在x軸線方向及y軸線方向上的移動,在z軸線方向上的移動可相對小。然而,由於應改變雷射光束10的大小以適應根據每一條引導線11的曲率而以恒定速率增大或減小的所述多個單元加工區110,因此可有利的操作是調整雷射頭50的移動速率以使在x軸線方向、y軸線方向及z軸線方向上的所得速率向量恒定。At the same time, the velocity in the first axis direction 21 (for example, the velocity in the x-axis direction) may be the same on all guide lines 11 and according to the curvature of each guide line 11 in the second axis direction The velocity (for example, velocity in the y-axis direction) may increase as the curvature increases. For example, the moving speed of the laser head 50 may be adjusted so that the resulting velocity vector (obtained velocity) in the x-axis direction and the y-axis direction is constant. At this time, the movement in the z-axis direction can be relatively small compared to the movement in the x-axis direction and the y-axis direction. However, since the size of the laser beam 10 should be changed to accommodate the plurality of unit processing regions 110 that increase or decrease at a constant rate according to the curvature of each guide line 11, it may be advantageous to adjust the laser head The rate of movement of 50 is such that the resulting velocity vectors in the x-axis direction, y-axis direction, and z-axis direction are constant.

另外,使雷射頭50通過(或掃描)每一條引導線11的時間恒定,以使得可針對所有的所述多個單元加工區110獲得具有均勻品質的圖案。In addition, the time during which the laser head 50 passes (or scans) each guide line 11 is constant, so that a pattern with uniform quality can be obtained for all of the plurality of unit processing regions 110.

在設置所述多個單元加工區110的過程中(步驟S120),可將每一條引導線11中的中心單元加工區110設置成大於位於引導線的兩個端部部分上的單元加工區110。由於在拉伸工件100時所施加的拉力根據單元加工區110的位置而變化,因此可根據施加在每一位置處的拉力來確定單元加工區110的大小。由在第一軸線方向21上拉伸工件100所產生的第一軸線方向21上的擴張力可在第一軸線方向21上從工件100的兩個端部部分在第一軸線方向21上被施加到工件100的中心部分。因此,在第一軸線方向21上工件100的兩端處擴張力可最大,且在第一軸線方向21上工件100的中心處擴張力可最小。因此,引導線11的擴張得相對少的中心部分的單元加工區110可被設置成大於在引導線11上擴張地相對多的兩個端部部分上的單元加工區110。另外,相較於工件100在第一軸線方向21上的兩個端部部分,工件100在第一軸線方向21上的中心部分可接收更多的工件100在第二軸線方向22上的收縮力。此可為每一條引導線11上的中心單元加工區110被設置成大於位於兩個端部部分上的單元加工區110的原因(或因素)。In the process of setting the plurality of unit processing areas 110 (step S120), the central unit processing area 110 in each guide line 11 may be set larger than the unit processing areas 110 located on both end portions of the guide line. . Since the pulling force applied when the workpiece 100 is stretched varies according to the position of the unit processing area 110, the size of the unit processing area 110 can be determined according to the pulling force applied at each position. The expansion force in the first axis direction 21 generated by stretching the workpiece 100 in the first axis direction 21 may be applied in the first axis direction 21 from both end portions of the workpiece 100 in the first axis direction 21 To the center of the workpiece 100. Therefore, the expansion force at the two ends of the workpiece 100 in the first axis direction 21 may be the largest, and the expansion force at the center of the workpiece 100 in the first axis direction 21 may be the smallest. Therefore, the unit processing region 110 of the central portion where the guide wire 11 is expanded relatively little may be set larger than the unit processing region 110 on the two end portions which are relatively expanded on the guide wire 11. In addition, compared to the two end portions of the workpiece 100 in the first axis direction 21, the central portion of the workpiece 100 in the first axis direction 21 can receive more contraction force of the workpiece 100 in the second axis direction 22 . This may be the reason (or factor) that the central unit processing area 110 on each guide line 11 is set larger than the unit processing area 110 located on both end portions.

在設置所述多個單元加工區110的過程中(步驟S120),可將位於每一條引導線11的中心處的單元加工區110設置成距工件100在第一軸線方向21上的中心線越遠,單元加工區110越大。由在第一軸線方向21上拉伸工件100所產生的第二軸線方向22上的擴張力可從工件100在第二軸線方向22上的兩側被施加到工件100在第一軸線方向21上的中心線。因此,就工件100在第一軸線方向21上的中心線來說,在工件100在第二軸線方向22上的兩側上收縮力可最強,且在工件100在第一軸線方向21上的中心線處收縮力可最弱。因此,引導線11的在工件100中位於第二軸線方向22上的兩側上的單元加工區110(收縮得相對多)可被設置成大於引導線11的在工件100中位於與在第一軸線方向21上的中心線相鄰處的單元加工區110(收縮得相對少)。另外,相較於工件100在第一軸線方向21上的中心線,工件100在第二軸線方向22上的兩側可在工件100的第一軸線方向21上接收更多擴張力。此可為將引導線11的在工件100中位於第二軸線方向22上的兩側上的單元加工區110設置成大於引導線11的在工件100中位於與在第一軸線方向21上的中心線相鄰處的單元加工區110的一個原因。因此,位於每一條引導線11的中心部分處的單元加工區110也可被設置成距工件100在第一軸線方向21上的中心線越遠,單元加工區110越大。In the process of setting the plurality of unit processing areas 110 (step S120), the unit processing area 110 located at the center of each guide line 11 may be set to a distance from the center line of the workpiece 100 in the first axis direction 21. The farther, the unit processing area 110 is larger. The expansion force in the second axis direction 22 generated by stretching the workpiece 100 in the first axis direction 21 may be applied to the workpiece 100 in the first axis direction 21 from both sides of the workpiece 100 in the second axis direction 22. Center line. Therefore, as far as the centerline of the workpiece 100 in the first axis direction 21 is concerned, the contraction force can be strongest on both sides of the workpiece 100 in the second axis direction 22 and at the center of the workpiece 100 in the first axis direction 21 The shrinkage force at the line can be the weakest. Therefore, the unit processing areas 110 (relatively contracted) of the guide line 11 on both sides of the workpiece 100 in the second axis direction 22 may be set to be larger than the guide line 11 located in the workpiece 100 and in the first The unit processing area 110 (relatively shrunk) adjacent to the center line in the axial direction 21. In addition, compared to the centerline of the workpiece 100 in the first axis direction 21, both sides of the workpiece 100 in the second axis direction 22 can receive more expansion force in the first axis direction 21 of the workpiece 100. This may be to set the unit processing areas 110 of the guide line 11 on both sides of the workpiece 100 in the second axis direction 22 larger than the center of the guide line 11 in the workpiece 100 and in the first axis direction 21 One reason for the unit processing area 110 adjacent to the line. Therefore, the unit processing area 110 located at the center portion of each guide line 11 can also be set to be farther from the center line of the workpiece 100 in the first axis direction 21, the larger the unit processing area 110 is.

在設置所述多個單元加工區110的過程中(步驟S120),可將位於每一條引導線11的中心部分處的單元加工區110設置成距工件100在第一軸線方向21上的中心線越遠,單元加工區110以恒定的比率增大,且所述恒定的比率可以根據工件100的應變來確定。In the process of setting the plurality of unit processing areas 110 (step S120), the unit processing area 110 located at the center portion of each guide line 11 may be set to a center line in the first axis direction 21 from the workpiece 100. The further away, the unit processing area 110 increases at a constant ratio, and the constant ratio can be determined according to the strain of the workpiece 100.

由於在拉伸工件100時所施加的拉力是根據單元加工區110的位置而變化,因此可根據施加在每一位置處的拉力來確定單元加工區110的大小。此時,施加在每一位置處的拉力可與從工件100在第一軸線方向21上的中心線到所述位置的距離成比例。因此,可將位於每一條引導線11的中心部分處的單元加工區110設置成距工件100在第一軸線方向21上的中心線越遠,單元加工區110以恒定的比率增大。因此,當在第一軸線方向21上拉伸工件100時,所述多個加工物體110a可被更正(或補償)成恒定的大小。Since the pulling force applied when the workpiece 100 is stretched is changed according to the position of the unit processing area 110, the size of the unit processing area 110 can be determined according to the pulling force applied at each position. At this time, the pulling force applied at each position may be proportional to the distance from the center line of the workpiece 100 in the first axis direction 21 to the position. Therefore, the unit processing area 110 located at the center portion of each guide line 11 can be set so that the farther away from the center line of the workpiece 100 in the first axis direction 21, the unit processing area 110 increases at a constant rate. Therefore, when the workpiece 100 is stretched in the first axis direction 21, the plurality of processing objects 110a may be corrected (or compensated) to a constant size.

可根據工件100的應變及對工件100在第一軸線方向21上的兩端施加的拉力來確定恒定的比率。此時,根據工件100的應變及對工件100在第一軸線方向21上的兩端施加的拉力,可計算出單元加工區110在每一位置處的大小。The constant ratio may be determined according to the strain of the workpiece 100 and the pulling force applied to both ends of the workpiece 100 in the first axis direction 21. At this time, according to the strain of the workpiece 100 and the pulling force applied to both ends of the workpiece 100 in the first axis direction 21, the size of the unit processing area 110 at each position can be calculated.

由於拉力被施加到工件100在第一軸線方向21上的兩端,因此工件100在第二方向22上的中心部分的兩側上會產生壓縮應力,且因此,工件發生收縮。此時,根據對工件100在第一軸線方向21上的兩端施加的拉力的強度,收縮程度會有所不同。當在第一軸線方向21上拉伸工件100時,會形成所述多個加工物體110a的圖案的實際上所期望形狀,以使位於工件100在第二軸線方向22上的兩側處的引導線11以及沿引導線排列的加工物體110a收縮,以合乎於對工件100在第一軸線方向21上的兩端施加的拉力,且引導線11及加工物體110a變得水準。因此,根據對工件100在第一軸線方向21上的兩端施加的拉力的強度來在工件100在第二軸線方向22上的中心部分的兩側上計算(或測量)工件100在第一軸線方向21上的收縮量(或收縮力),且可依照所計算出的量(或大小)來更正(或補償)單元加工區110的形狀(或大小)。Since a tensile force is applied to both ends of the workpiece 100 in the first axis direction 21, compressive stress is generated on both sides of the center portion of the workpiece 100 in the second direction 22, and therefore, the workpiece shrinks. At this time, the degree of contraction varies depending on the strength of the tensile force applied to both ends of the workpiece 100 in the first axis direction 21. When the workpiece 100 is stretched in the first axis direction 21, the actually desired shape of the pattern of the plurality of processing objects 110a is formed so that the guides at the two sides of the workpiece 100 in the second axis direction 22 are guided The line 11 and the processing objects 110a arranged along the guide line are contracted to conform to the pulling force applied to both ends of the workpiece 100 in the first axis direction 21, and the guide line 11 and the processing object 110a become level. Therefore, the workpiece 100 is calculated (or measured) on the first axis on both sides of the center portion of the workpiece 100 in the second axis direction 22 according to the strength of the pulling force applied to both ends of the workpiece 100 in the first axis direction 21. A contraction amount (or contraction force) in the direction 21, and the shape (or size) of the unit processing area 110 may be corrected (or compensated) according to the calculated amount (or size).

在此種情形中,位於工件100在第二軸線方向22上的兩側上的引導線11形成為曲線形狀,每一條引導線11的中心部分的單元加工區110大於兩個端部部分上的單元加工區110,且距工件100在第一方向21上的中心線越遠,位於每一條引導線11的中心部分處的單元加工區110可越大。此時,可依據連接引導線的兩端的直線(即,弦)與引導線11的中心之間的距離來計算引導線11的曲率(或曲率半徑),且可透過根據每一條引導線11上的剛性(stiffness)對每一位置施加收縮量來確定連接引導線11的兩端的直線的長度及每一位置的單元加工區110的形狀(或大小)。In this case, the guide lines 11 on both sides of the workpiece 100 in the second axis direction 22 are formed into a curved shape, and the unit processing area 110 of the central portion of each guide line 11 is larger than that on the two end portions. The further the unit processing area 110 is from the center line of the workpiece 100 in the first direction 21, the larger the unit processing area 110 at the center portion of each guide line 11 may be. At this time, the curvature (or radius of curvature) of the guide line 11 can be calculated according to the distance between the straight line (ie, the chord) connecting the two ends of the guide line and the center of the guide line 11, and can be calculated according to A stiffness is applied to each position to determine the length of a straight line connecting the two ends of the guide wire 11 and the shape (or size) of the unit processing area 110 at each position.

另外,根據由工件100的剛性等確定的應變,每一位置的收縮量(或施加拉力)會有所不同。因此,可透過考量工件100的應變來確定恒定的比率。另外,在拉伸工件100時也可考量工件100的厚度、工件100的材料、由所述多個加工區110形成的圖案的大小及加工物體110a應具有的大小中的至少一個因素。In addition, depending on the strain determined by the rigidity of the workpiece 100 or the like, the amount of shrinkage (or the application of a tensile force) varies at each position. Therefore, a constant ratio can be determined by considering the strain of the workpiece 100. In addition, at least one factor of the thickness of the workpiece 100, the material of the workpiece 100, the size of the pattern formed by the plurality of processing regions 110, and the size of the processing object 110a may be considered when the workpiece 100 is stretched.

在設置所述多個單元加工區110的過程中(步驟S120),可將所述多條引導線11的兩端上的單元加工區110設置為恒定的大小。此時,所述多條引導線11可具有連接引導線11的兩端的直線且具有相同的長度,且連接引導線11的兩端的直線的間隔可為恒定的。即,位於所述多條引導線11的兩端上的單元加工區110可安置在相同的線上,以在工件100的第二軸線方向22上彼此間隔開。In the process of setting the plurality of unit processing regions 110 (step S120), the unit processing regions 110 on both ends of the plurality of guide lines 11 may be set to a constant size. At this time, the plurality of guide lines 11 may have straight lines connecting the two ends of the guide line 11 and have the same length, and the interval between the straight lines connecting the two ends of the guide line 11 may be constant. That is, the unit processing regions 110 located on both ends of the plurality of guide lines 11 may be disposed on the same line so as to be spaced apart from each other in the second axis direction 22 of the workpiece 100.

由於平行的拉力被施加到工件100在第一軸線方向21上的兩端,因此當在第一軸線方向21上拉伸工件100時,位於所述多條引導線11的兩端上的加工物體110a可具有相同的位置改變。另外,由於距工件100在第一方向21上的兩端的距離是相同的,且因此工件在第一方向21上的擴張可以是相同的,且由於不處於工件100的中心部分中,因此工件100在第二軸線方向22上的兩側上可幾乎不存在收縮力。因此,可將位於所述多條引導線11的兩端處的單元加工區110設置成恒定的大小。因此,當在第一軸線方向21上拉伸工件100時,加工物體110a的大小可相同,且可獲得具有均勻的大小及間隔的圖案。Since parallel tensile forces are applied to both ends of the workpiece 100 in the first axis direction 21, when the workpiece 100 is stretched in the first axis direction 21, the processing objects located on both ends of the plurality of guide lines 11 110a may have the same position change. In addition, since the distance from both ends of the workpiece 100 in the first direction 21 is the same, and therefore the expansion of the workpiece in the first direction 21 can be the same, and since it is not in the center portion of the workpiece 100, the workpiece 100 There may be little contraction force on both sides in the second axis direction 22. Therefore, the unit processing regions 110 located at both ends of the plurality of guide lines 11 can be set to a constant size. Therefore, when the workpiece 100 is stretched in the first axis direction 21, the sizes of the processing objects 110a may be the same, and a pattern having a uniform size and interval may be obtained.

如此,在示例性實施例中,可在工件100上設置具有根據工件100的應變及對工件100施加的拉力而計算出的曲率的所述多條引導線11,以使得可將多個單元加工區110設置到由拉伸所致的位置改變會得到補償的位置。另外,透過工件100的應變及對工件100施加的拉力來計算被加工形狀根據單元加工區110的位置而發生的改變,且因此可確定每一單元加工區110的大小。因此,當拉伸工件100時,位置改變及加工物體110a的被加工形狀的改變可得到補償。As such, in the exemplary embodiment, the plurality of guide lines 11 having a curvature calculated according to the strain of the workpiece 100 and the tensile force applied to the workpiece 100 may be provided on the workpiece 100 so that a plurality of units can be processed The region 110 is set to a position where a change in position due to stretching is compensated. In addition, the change of the processed shape according to the position of the unit processing area 110 is calculated through the strain of the workpiece 100 and the tensile force applied to the workpiece 100, and thus the size of each unit processing area 110 can be determined. Therefore, when the workpiece 100 is stretched, a change in position and a change in the shape of the processed object 110a can be compensated.

圖4是說明根據另一示例性實施例的透過製造掩模總成的方法製成的掩模總成的視圖。FIG. 4 is a view illustrating a mask assembly made through a method of manufacturing a mask assembly according to another exemplary embodiment.

參考圖4,將更詳細地闡述根據另一示例性實施例的用於製造掩模總成的方法,且將省略與上文所闡述的關於根據示例性實施例的雷射加工方法相關的部分重複的內容。Referring to FIG. 4, a method for manufacturing a mask assembly according to another exemplary embodiment will be explained in more detail, and portions related to the laser processing method according to the exemplary embodiment explained above will be omitted. Duplicate content.

一種根據另一示例性實施例的製造掩模總成的方法可包括:提供掩模棒210,在掩模棒210中的每一者中透過根據示例性實施例的雷射加工方法來加工工件100且根據多個單元加工區110形成有多個加工孔211(步驟S210);以及在第一軸線方向21上拉伸掩模棒210並將掩模棒210固定到具有開口的框架(步驟S220)。A method of manufacturing a mask assembly according to another exemplary embodiment may include providing a mask bar 210 in which a workpiece is processed through a laser processing method according to an exemplary embodiment in each of the mask bars 210. 100 and a plurality of processing holes 211 are formed according to a plurality of unit processing areas 110 (step S210); and the mask rod 210 is stretched in the first axis direction 21 and the mask rod 210 is fixed to a frame having an opening (step S220) ).

首先,提供掩模棒210,在掩模棒210中的每一者中透過根據示例性實施例的雷射加工方法來加工工件100且根據多個單元加工區110形成有多個加工孔211(步驟S210)。可透過根據示例性實施例的雷射加工方法加工工件100來提供掩模棒210。此時,可根據多個單元加工區110形成多個加工孔211,且多個加工物體110a(在所述多個加工物體110a中,所述多個單元加工區110被加工)可為所述多個加工孔211。在拉伸掩模棒之前,為將掩模棒固定到框架220,可將所述多個加工孔211排列成沿包括曲線在內的多條引導線11彼此間隔開,且因此可形成圖案。另外,根據所述多條引導線11的形狀(或形式),從圖案在第一軸線方向21上的兩個端部部分開始,距中心部分越近,圖案在與第一軸線方向21垂直的方向上(即第二軸線方向)的寬度可越大。First, a mask rod 210 is provided, in each of which a workpiece 100 is processed through a laser processing method according to an exemplary embodiment, and a plurality of processing holes 211 are formed according to a plurality of unit processing regions 110 ( Step S210). The mask rod 210 may be provided by processing the workpiece 100 by a laser processing method according to an exemplary embodiment. At this time, a plurality of processing holes 211 may be formed according to a plurality of unit processing regions 110, and a plurality of processing objects 110a (in the plurality of processing objects 110a, the plurality of unit processing regions 110 are processed) may be the A plurality of processed holes 211. Before the mask stick is stretched, in order to fix the mask stick to the frame 220, the plurality of processing holes 211 may be arranged to be spaced apart from each other along a plurality of guide lines 11 including a curve, and thus a pattern may be formed. In addition, according to the shape (or form) of the plurality of guide lines 11, starting from the two end portions of the pattern in the first axis direction 21, the closer to the center portion, the pattern is perpendicular to the first axis direction 21 The width in the direction (ie, the direction of the second axis) can be larger.

可透過聚集多個掩模棒210來形成掩模總成200,且掩模總成200可由至少兩個掩模棒210構成,且儘管圖4中示出四個掩模棒210,但此僅是實例,且示例性實施例並不僅限於此。The mask assembly 200 may be formed by aggregating a plurality of mask rods 210, and the mask assembly 200 may be composed of at least two mask rods 210, and although four mask rods 210 are shown in FIG. Are examples, and the exemplary embodiments are not limited thereto.

另外,掩模棒210中的每一者可具有薄的矩形板形狀,所述多個加工孔211可在第一軸線方向21上按照預定的規則間距而形成,且阻擋區可形成在由所述多個加工孔211形成的圖案周圍。另外,如圖4中所示,由所述多個加工孔211形成的圖案的形狀以及所述多個加工孔211的形狀在將掩模棒210固定到框架220之前與之後是不同的。此將在下文更詳細地闡述。In addition, each of the mask sticks 210 may have a thin rectangular plate shape, the plurality of processing holes 211 may be formed at a predetermined regular pitch in the first axis direction 21, and the blocking region may be formed at the substrate. The periphery of the pattern formed by the plurality of processing holes 211 is described. In addition, as shown in FIG. 4, the shape of the pattern formed by the plurality of processed holes 211 and the shape of the plurality of processed holes 211 are different before and after fixing the mask bar 210 to the frame 220. This will be explained in more detail below.

舉例來說,掩模棒中的每一者可以是磁性薄板,且可由鎳或鎳合金構成,或可透過使用鎳鈷合金來形成,所述鎳鈷合金可易於形成精細圖案且具有極佳的表面粗糙度。For example, each of the mask rods may be a magnetic thin plate, and may be composed of nickel or a nickel alloy, or may be formed by using a nickel-cobalt alloy that can be easily formed into a fine pattern and has excellent properties. Surface roughness.

接下來,在第一軸線方向21上(或在在第一軸線方向上延伸的長度方向上)拉伸掩模棒210並將掩模棒210固定到具有開口部分的框架220(步驟S220)。框架220可具有開口部分,是由彈性材料形成,但實施例並不僅限於此。另外,由於在拉伸狀態中掩模棒210是由框架220支撐,因此框架220可足夠堅硬以穩定地支撐掩模棒210。另外,可將一種結構用於框架220,只要當被沉積物體與掩模總成200在所述結構中緊密接觸時,這二者不干擾彼此即可。Next, the mask rod 210 is stretched in the first axis direction 21 (or in a length direction extending in the first axis direction) and fixed to the frame 220 having an opening portion (step S220). The frame 220 may have an opening portion and is formed of an elastic material, but the embodiment is not limited thereto. In addition, since the mask bar 210 is supported by the frame 220 in a stretched state, the frame 220 may be sufficiently rigid to stably support the mask bar 210. In addition, a structure may be used for the frame 220 as long as the deposited object and the mask assembly 200 are in close contact in the structure, and the two do not interfere with each other.

可將掩模棒210在第一軸線方向21上的兩端固定到框架220,同時在第一軸線方向21(或長度方向)上對掩模棒210施加預定的拉力。此時,掩模棒210的所述多個加工孔211全部位於開口部分內。在此,可應用各種方法(例如,雷射焊接或電阻加熱焊接)作為固定方法,但考慮到精確度的改變等,可使用雷射焊接方法。另外,可排列並焊接掩模棒210以在掩模棒210之間形成預定的間隙。Both ends of the mask rod 210 in the first axis direction 21 may be fixed to the frame 220 while applying a predetermined pulling force to the mask rod 210 in the first axis direction 21 (or the length direction). At this time, the plurality of processing holes 211 of the mask bar 210 are all located in the opening portion. Here, various methods (for example, laser welding or resistance heating welding) may be applied as the fixing method, but in consideration of a change in accuracy, etc., a laser welding method may be used. In addition, the mask bars 210 may be arranged and welded to form a predetermined gap between the mask bars 210.

根據示例性實施例,由所述多個加工孔211形成的圖案的形狀及所述多個加工孔211的形狀在將掩模棒210固定到框架之前與之後是不同的。According to an exemplary embodiment, the shape of the pattern formed by the plurality of processed holes 211 and the shape of the plurality of processed holes 211 are different before and after fixing the mask bar 210 to the frame.

圖5是闡述根據示例性實施例透過拉伸掩模棒來對加工孔做出形狀補償的概念圖,圖5的(a)說明拉伸之前的掩模棒,且圖5的(b)說明拉伸之後的掩模棒。5 is a conceptual diagram illustrating shape compensation of a processed hole by stretching a mask rod according to an exemplary embodiment, FIG. 5 (a) illustrates a mask rod before stretching, and FIG. 5 (b) illustrates Mask stick after stretching.

參考圖5,在在第一軸線方向21上拉伸掩模棒210並固定掩模棒的過程中(步驟S220),可朝向掩模棒210的在第一軸線方向21上的兩側對每一條引導線11的兩端施加平行的拉伸力。Referring to FIG. 5, in the process of stretching the mask rod 210 in the first axis direction 21 and fixing the mask rod 210 (step S220), each side of the mask rod 210 in the first axis direction 21 may face each other. Both ends of a guide wire 11 apply a parallel tensile force.

通常,當將集成型掩模固定到框架時,在四個方向上拉伸掩模並將所述掩模固定到框架。然而,如在示例性實施例中,可透過僅在掩模棒210的第一軸線方向21上拉伸每一分離掩模棒210來將由多個掩模棒210配置而成的掩模總成200固定到框架220。在此種情形中,掩模棒210可會因在掩模棒210的拉伸方向(即第一軸線方向)上產生的拉伸力而在與拉伸方向垂直的方向(即第二軸線方向)上收縮。Generally, when an integrated mask is fixed to a frame, the mask is stretched in four directions and the mask is fixed to the frame. However, as in the exemplary embodiment, a mask assembly configured from a plurality of mask bars 210 may be configured by stretching each of the separate mask bars 210 only in the first axis direction 21 of the mask bars 210. 200 is fixed to the frame 220. In this case, the mask rod 210 may be in a direction perpendicular to the stretching direction (that is, the second axis direction) due to the tensile force generated in the stretching direction of the mask rod 210 (that is, the first axis direction). ) Shrink.

在此,由於僅當對每一條引導線11的兩端施加相同的拉伸力時曲線才可被拉伸成直線,因此可朝向掩模棒210在第一軸線方向21上的兩側對每一條引導線11的兩端施加相同的拉伸力。因此,當在第一軸線方向21上拉伸掩模棒210時,可將在彎曲的引導線11上排列成曲線形狀的所述多個加工孔211排列成一條線(或排列成直線形狀)。另外,僅當朝向掩模棒210在第一軸線方向21上的兩側對所述多條引導線11的兩端施加平行的拉伸力時,才可在於第一軸線方向21上拉伸掩模棒210時將所述多個加工孔211排列成平行的(或並排)。Here, since the curve can be stretched into a straight line only when the same stretching force is applied to both ends of each guide wire 11, the two sides of the mask rod 210 in the first axis direction 21 can face each other. The same tensile force is applied to both ends of one guide wire 11. Therefore, when the mask stick 210 is stretched in the first axis direction 21, the plurality of processing holes 211 arranged in a curved shape on the curved guide line 11 may be arranged in a line (or in a linear shape). . In addition, the mask can be stretched in the first axis direction 21 only when parallel stretching forces are applied to both ends of the plurality of guide wires 11 toward the two sides of the mask rod 210 in the first axis direction 21. In the mold bar 210, the plurality of processing holes 211 are arranged in parallel (or side by side).

此時,可透過掩模棒210的厚度或材料或者所述多個加工孔211的形狀、大小、位置等來確定掩模棒210在貫軸方向(或垂直方向)上的應變對掩模棒210在拉伸方向上的應變的比率(即,泊松比(Poisson ratio))。At this time, the strain of the mask rod 210 in the transaxial direction (or vertical direction) on the mask rod can be determined through the thickness or material of the mask rod 210 or the shape, size, position, etc. of the plurality of processed holes 211. The ratio of 210 strain in the tensile direction (ie, Poisson ratio).

圖5的(a)中所示的掩模棒210說明透過考慮會影響到上述泊松比的所有因素來進行補償及設計的實例。The mask bar 210 shown in (a) of FIG. 5 illustrates an example of compensation and design by considering all factors that affect the above-mentioned Poisson's ratio.

在在第一軸線方向21上拉伸掩模棒210並固定掩模棒的過程中(步驟S220),所述多個加工孔211可被以二維方式排列成直線(或排列成網格形狀),且所述多個加工孔211的大小可為均勻的。在此,用語「均勻」不僅可包括相同,而且可包括處於預定容差內的實質上相同。參考圖5的(b),在在第一軸線方向21上拉伸掩模棒的兩端並將所述掩模棒固定到框架220之後,由所述多個加工孔211形成的圖案在與第一軸線方向21垂直的方向上可具有相同的寬度。即所述多個加工孔211可被以二維方式排列成直線,所述多個加工孔211的大小可為均勻的,且所有間隔及陣列可被均勻排列。因此,穿過所述多個經排列加工孔211並被沉積的有機材料可準確無誤地沉積到所期望的位置上。During the process of stretching the mask rod 210 in the first axis direction 21 and fixing the mask rod 210 (step S220), the plurality of processing holes 211 may be arranged in a two-dimensional manner in a straight line (or in a grid shape). ), And the sizes of the plurality of processing holes 211 may be uniform. Here, the term "uniform" may include not only the same, but also substantially the same within a predetermined tolerance. Referring to FIG. 5 (b), after stretching both ends of the mask rod in the first axis direction 21 and fixing the mask rod to the frame 220, a pattern formed by the plurality of processing holes 211 The first axis direction 21 may have the same width in a direction perpendicular to the first axis direction 21. That is, the plurality of processing holes 211 may be arranged in a two-dimensional manner in a straight line, the sizes of the plurality of processing holes 211 may be uniform, and all the intervals and arrays may be uniformly arranged. Therefore, the organic material deposited through the plurality of aligned processing holes 211 and deposited can be accurately deposited on a desired position.

如此,在示例性實施例中,在板形工件的第一軸線方向上在工件上設置多條引導線,所述多條引導線包括曲線,且加工多個單元加工區,所述多個單元加工區的位置由所述多條引導線引導,且因此當拉伸工件時,被加工形狀及位置的改變可得到補償。即,在工件上設置根據所述工件的應變而被計算好曲率的多條引導線,以使得可將單元加工區設置在位置改變會得到補償的位置處。另外,根據單元加工區的位置透過工件的應變來計算被加工形狀的改變,且可確定每一單元加工區的大小。因此,當拉伸工件時,位置改變及被加工形狀的改變可得到補償。因此,當形成工件已被加工且加工孔已形成的掩模棒時,加工孔的位置、大小及形狀的差異得到補償,且例如每一加工孔的位置精確度、大小及形狀等標準或規格可得以滿足。另外,在沿每一條引導線移動雷射光束的照射位置的同時加工多個單元加工區,且因此可參照每一條引導線以恒定速率加工多個單元加工區。因此,可憑藉每一單元加工區獲得具有均勻品質的加工物體。另外,根據單元加工區的大小的改變調整雷射頭的高度並調整雷射光束的大小,且因此可使用具有均勻能量的雷射光束照射在每一位置處具有不同的大小的多個單元加工區。因此,可以恒定的重複次數加工工件,且可在工件的整個區之上執行均勻的加工。As such, in the exemplary embodiment, a plurality of guide lines are provided on the workpiece in a first axis direction of the plate-shaped workpiece, the plurality of guide lines includes a curve, and a plurality of unit processing areas are processed, the plurality of units The position of the processing area is guided by the plurality of guide lines, and thus when the workpiece is stretched, changes in the shape and position of the processed part can be compensated. That is, a plurality of guide lines whose curvature is calculated according to the strain of the workpiece are provided on the workpiece, so that the unit processing area can be set at a position where the position change can be compensated. In addition, according to the position of the unit processing area, the change of the processed shape is calculated through the strain of the workpiece, and the size of each unit processing area can be determined. Therefore, when the workpiece is stretched, the change in position and the shape of the machined part can be compensated. Therefore, when forming a mask bar in which a workpiece has been processed and a processing hole has been formed, differences in the position, size, and shape of the processing hole are compensated, and standards or specifications such as position accuracy, size, and shape of each processing hole are formed. Available. In addition, a plurality of unit processing areas are processed while moving the irradiation position of the laser beam along each guide line, and therefore, a plurality of unit processing areas can be processed at a constant rate with reference to each guide line. Therefore, a machining object with uniform quality can be obtained with each unit processing area. In addition, the height of the laser head is adjusted and the size of the laser beam is adjusted according to the change in the size of the unit processing area, and therefore, a plurality of units having different sizes at each position can be irradiated with a laser beam having a uniform energy. Area. Therefore, the workpiece can be processed with a constant number of repetitions, and uniform processing can be performed over the entire area of the workpiece.

在根據示例性實施例的雷射加工方法中,在板形工件的第一軸線方向上在工件上設置多條引導線,所述多條引導線包括曲線,且加工多個單元加工區,所述多個單元加工區的位置由所述多條引導線引導,且因此當拉伸工件時,被加工形狀及位置的改變可得到補償。即,在工件上設置根據所述工件的應變而被計算好曲率的多條引導線,可將單元加工區設置在位置改變會得到補償的位置處。另外,由於可透過考量根據單元加工區的位置而計算出的被加工形狀的改變來確定每一單元加工區的大小,因此當拉伸工件時,位置改變及被加工形狀的改變可得到補償。In the laser processing method according to an exemplary embodiment, a plurality of guide lines are provided on the workpiece in a first axis direction of the plate-shaped workpiece, the plurality of guide lines includes a curve, and a plurality of unit processing areas are processed, so The positions of the plurality of unit processing areas are guided by the plurality of guide lines, and thus when the workpiece is stretched, changes in the shape and position of the processed can be compensated. That is, by providing a plurality of guide lines whose curvature is calculated according to the strain of the workpiece on the workpiece, the unit processing area can be set at a position where the position change can be compensated. In addition, since the size of each unit processing area can be determined by considering the change of the processed shape calculated according to the position of the unit processing area, when the workpiece is stretched, the position change and the change of the processed shape can be compensated.

因此,當透過示例性實施例的雷射加工方法在掩模棒中形成加工孔時,加工孔的位置、大小及形狀的差異在拉伸掩模棒並將所述掩模棒固定到框架時得到補償,例如每一加工孔的位置精確度、大小及形狀等標準或規格可得以滿足。Therefore, when forming a processing hole in a mask rod through the laser processing method of the exemplary embodiment, the difference in the position, size, and shape of the processing hole is when the mask rod is stretched and the mask rod is fixed to the frame Compensated, such as the location accuracy, size, and shape of each machined hole can be met.

另外,在沿每一條引導線移動雷射光束的照射位置的同時加工多個單元加工區,且因此可參照每一條引導線以恒定速率加工多個單元加工區。因此,可憑藉每一單元加工區獲得具有均勻品質的加工物體。In addition, a plurality of unit processing areas are processed while moving the irradiation position of the laser beam along each guide line, and therefore, a plurality of unit processing areas can be processed at a constant rate with reference to each guide line. Therefore, a machining object with uniform quality can be obtained with each unit processing area.

另外,根據單元加工區的大小的改變調整雷射頭的高度,進而調整雷射光束的大小,且因此可使用具有均勻能量的雷射光束照射在每一位置處具有不同的大小的多個單元加工區。因此,可以恒定的重複次數加工工件,且可在工件的整個區之上執行均勻的加工。In addition, the height of the laser head is adjusted according to the change in the size of the unit processing area, thereby adjusting the size of the laser beam, and therefore, a plurality of cells having different sizes at each position can be irradiated with a laser beam having uniform energy Processing Zone. Therefore, the workpiece can be processed with a constant number of repetitions, and uniform processing can be performed over the entire area of the workpiece.

以上說明中所使用的用語「在…上」的含義包含直接接觸的情形以及被定位成面向上部分或下部分但不直接接觸所述部分的情形,可不僅包含被定位成部分地面向整個上表面或下表面的情形而且包含被定位成部分地面向所述表面的情形,且被用作在與所述表面間隔開或與所述表面直接接觸的位置中面向上表面或下表面的含義。因此,用語「在工件上」可指代工件的表面(上表面或下表面),且也可以是沉積在工件的表面上的膜的表面。The meaning of the term "on" used in the above description includes a case of direct contact and a case of being positioned facing the upper part or the lower part but not directly touching the part, and may include not only being positioned partially facing the entire top The case of a surface or a lower surface also includes a case that is positioned to partially face the surface, and is used as a meaning of facing the upper or lower surface in a position spaced from or in direct contact with the surface. Therefore, the term "on the workpiece" may refer to the surface (upper or lower surface) of the workpiece, and may also be the surface of a film deposited on the surface of the workpiece.

目前為止,已參考附圖更詳細地闡述了較佳的實施例。然而,本發明並不僅限於上文所闡述的實施例,且本發明所屬領域的技術人員應理解,可在不背離本發明的主題的情況下進行各種修改及形成其他等效實施例。因此,應由隨附權利要求書的技術範圍來確定本發明的受保護範圍。So far, preferred embodiments have been explained in more detail with reference to the drawings. However, the present invention is not limited to the embodiments described above, and those skilled in the art to which the present invention pertains should understand that various modifications and other equivalent embodiments can be made without departing from the subject matter of the present invention. Therefore, the protection scope of the present invention should be determined by the technical scope of the appended claims.

10‧‧‧雷射光束10‧‧‧laser beam

11‧‧‧引導線 11‧‧‧Guidelines

21‧‧‧第一軸線方向/第一軸線/第一方向 21‧‧‧first axis direction / first axis / first direction

22‧‧‧第二軸線方向/第二方向 22‧‧‧second axis direction / second direction

23‧‧‧高度方向 23‧‧‧ height direction

50‧‧‧雷射頭 50‧‧‧laser head

100‧‧‧工件/板形工件 100‧‧‧Workpieces / Flat Workpieces

110‧‧‧單元加工區/加工區/中心單元加工區 110‧‧‧Unit processing area / processing area / central unit processing area

110a‧‧‧加工物體/均勻加工的物體 110a‧‧‧processed object / uniformly processed object

200‧‧‧掩模總成 200‧‧‧Mask assembly

210‧‧‧掩模棒 210‧‧‧Mask stick

211‧‧‧加工孔/經排列加工孔 211‧‧‧machined hole / arranged machined hole

220‧‧‧框架 220‧‧‧Frame

S110、S120、S130‧‧‧步驟 S110, S120, S130‧‧‧ steps

A-A’‧‧‧線段 A-A’‧‧‧ line segment

結合附圖閱讀以下說明,可更詳細地理解示例性實施例,在附圖中:Exemplary embodiments can be understood in more detail by reading the following description in conjunction with the accompanying drawings, in which:

圖1是說明根據示例性實施例的雷射加工方法的流程圖。 FIG. 1 is a flowchart illustrating a laser processing method according to an exemplary embodiment.

圖2是用於闡述根據示例性實施例的引導線及單元加工區的設置的概念圖。 FIG. 2 is a conceptual diagram for explaining the setting of a guide line and a unit processing area according to an exemplary embodiment.

圖3是用於闡述根據示例性實施例的雷射頭的移動的概念圖。 FIG. 3 is a conceptual diagram for explaining movement of a laser head according to an exemplary embodiment.

圖4是說明透過根據另一示例性實施例的製造掩模總成的方法製造而成的掩模總成的視圖。 FIG. 4 is a view illustrating a mask assembly manufactured by a method of manufacturing a mask assembly according to another exemplary embodiment.

圖5是闡述根據另一示例性實施例透過拉伸掩模棒來對加工孔做出形狀補償的概念圖。 FIG. 5 is a conceptual diagram illustrating shape compensation of a processed hole by stretching a mask rod according to another exemplary embodiment.

Claims (15)

一種雷射加工方法,包括: 在板形的工件的第一軸線方向上在所述工件上設置多條引導線,所述多條引導線包括曲線; 將安置在所述工件上的多個單元加工區設置成沿所述多條引導線彼此間隔開;以及 使用雷射光束在移動所述雷射光束的照射位置的同時照射所述多個單元加工區。A laser processing method includes: Providing a plurality of guide lines on the workpiece in a first axis direction of the plate-shaped workpiece, the plurality of guide lines including a curve; Setting a plurality of unit processing areas disposed on the workpiece so as to be spaced apart from each other along the plurality of guide lines; and A laser beam is used to irradiate the plurality of unit processing regions while moving the irradiation position of the laser beam. 如申請專利範圍第1項所述的雷射加工方法,其中所述多條引導線中彼此相鄰的兩條引導線具有不同的曲率。The laser processing method according to item 1 of the scope of patent application, wherein two guide lines adjacent to each other among the plurality of guide lines have different curvatures. 如申請專利範圍第1項所述的雷射加工方法,其中 所述多條引導線中的彎曲的引導線朝向遠離所述工件在所述第一軸線方向上的中心線的一側形成弧,且 距所述工件在所述第一軸線方向上的所述中心線越遠,所述引導線的曲率越大。The laser processing method according to item 1 of the patent application scope, wherein The curved guide line of the plurality of guide lines forms an arc toward a side far from a center line of the workpiece in the first axis direction, and The farther from the center line of the workpiece in the first axis direction, the greater the curvature of the guide line. 如申請專利範圍第1項所述的雷射加工方法,其中在所述使用雷射光束照射所述多個單元加工區的過程中,在移動對所述引導線中的每一條引導線發出所述雷射光束的雷射頭的同時,使用所述雷射光束照射所述多個被加工區。The laser processing method according to item 1 of the scope of patent application, wherein in the process of irradiating the plurality of unit processing areas with a laser beam, each guide line of the guide lines is emitted while moving. At the same time as the laser head of the laser beam, the plurality of processed regions are irradiated with the laser beam. 如申請專利範圍第4項所述的雷射加工方法,其中在所述使用雷射光束照射所述多個單元加工區的過程中,在所述引導線中的每一條引導線上以恒定速率移動所述雷射頭。The laser processing method according to item 4 of the scope of patent application, wherein in the process of irradiating the plurality of unit processing areas with a laser beam, each of the guide lines is moved at a constant rate The laser head. 如申請專利範圍第1項所述的雷射加工方法,其中在所述使用雷射光束照射所述多個單元加工區的過程中,在與所述單元加工區中的每一個單元加工區的大小對應地改變所述雷射光束的大小的同時,沿所述引導線中的每一條引導線移動所述雷射光束的所述照射位置。The laser processing method according to item 1 of the scope of patent application, wherein, in the process of irradiating the plurality of unit processing regions with a laser beam, the laser processing method The size changes the size of the laser beam correspondingly while moving the irradiation position of the laser beam along each of the guide lines. 如申請專利範圍第6項所述的雷射加工方法,其中在所述使用雷射光束照射所述多個單元加工區的過程中,透過調整所述雷射頭的高度來改變所述雷射光束的所述大小。The laser processing method according to item 6 of the patent application scope, wherein in the process of irradiating the plurality of unit processing regions with a laser beam, the laser is changed by adjusting a height of the laser head The size of the beam. 如申請專利範圍第7項所述的雷射加工方法,其中在所述使用雷射光束照射所述多個單元加工區的過程中,在透過依序改變所述雷射頭的三維座標值來移動所述雷射光束的所述照射位置的同時,改變所述雷射光束的所述大小。The laser processing method according to item 7 of the scope of patent application, wherein in the process of irradiating the plurality of unit processing regions with a laser beam, the three-dimensional coordinate values of the laser head are sequentially changed by While moving the irradiation position of the laser beam, the size of the laser beam is changed. 如申請專利範圍第1項所述的雷射加工方法,其中在設置所述多個單元加工區的過程中,將所述引導線中的每一條引導線中的中心部分中的單元加工區設置成大於位於兩個端部部分上的單元加工區。The laser processing method according to item 1 of the scope of patent application, wherein in the process of setting the plurality of unit processing areas, a unit processing area in a central portion of each of the guide lines is set It is larger than the unit processing area on the two end portions. 如申請專利範圍第1項所述的雷射加工方法,其中在所述設置所述多個單元加工區的過程中,所述單元加工區距所述工件在所述第一軸線方向上的所述中心線越遠,所述引導線中的每一條引導線中的所述中心部分中的所述單元加工區被設置得越大。The laser processing method according to item 1 of the patent application scope, wherein in the process of setting the plurality of unit processing regions, the unit processing regions are spaced from the workpiece in a direction of the first axis. The farther the center line is, the larger the unit processing area in the center portion in each of the guide lines is set. 如申請專利範圍第10項所述的雷射加工方法,其中 在所述設置所述多個單元加工區的過程中,所述單元加工區距所述工件在所述第一軸線方向上的所述中心線越遠,所述引導線中的每一條引導線中的所述中心部分中的所述單元加工區以恒定的比率被設置得越大,且 所述恒定的比率是根據所述工件的應變來確定。The laser processing method according to item 10 of the patent application scope, wherein In the process of setting the plurality of unit processing areas, the farther the unit processing area is from the center line of the workpiece in the first axis direction, each of the guide lines The unit processing area in the center portion in is set larger at a constant ratio, and The constant ratio is determined based on the strain of the workpiece. 如申請專利範圍第1項所述的雷射加工方法,其中在所述設置所述多個單元加工區的過程中,位於所述多條引導線的兩端上的單元加工區被設置成恒定的大小。The laser processing method according to item 1 of the patent application scope, wherein during the setting of the plurality of unit processing regions, the unit processing regions located on both ends of the plurality of guide lines are set to be constant the size of. 一種製造掩模總成的方法,包括: 透過根據權利要求1到權利要求12中任一項所述的雷射加工方法來加工工件,並提供掩模棒,在所述掩模棒中根據所述多個單元加工區形成有多個加工孔;以及 在所述第一軸線方向上拉伸所述掩模棒並將所述掩模棒固定到具有開口部分的框架。A method of manufacturing a mask assembly includes: A workpiece is processed by the laser processing method according to any one of claims 1 to 12, and a mask bar is provided, and a plurality of processes are formed according to the plurality of unit processing areas in the mask bar. Holes; and The mask rod is stretched in the first axis direction and the mask rod is fixed to a frame having an opening portion. 如申請專利範圍第13項所述的製造掩模總成的方法,其中在在所述第一軸線方向上拉伸所述掩模棒固定所述掩模棒的過程中,朝向所述掩模棒的在所述第一軸向方向上的兩側對所述引導線中的每一條引導線的兩端施加平行的拉伸力。The method for manufacturing a mask assembly according to item 13 of the scope of patent application, wherein in the process of stretching the mask rod in the first axis direction to fix the mask rod, the mask rod is directed toward the mask. Both sides of the rod in the first axial direction apply parallel tensile forces to both ends of each of the guide wires. 如申請專利範圍第13項所述的製造掩模總成的方法,其中在在所述第一軸線方向上拉伸所述掩模棒固定所述掩模棒的過程中,所述多個加工孔被以二維方式排列成直線,且所述多個加工孔的大小被製作成均勻的。The method for manufacturing a mask assembly according to item 13 of the scope of patent application, wherein in the process of stretching the mask rod in the first axis direction to fix the mask rod, the plurality of processing The holes are arranged in a two-dimensional manner in a straight line, and the sizes of the plurality of processed holes are made uniform.
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KR102901988B1 (en) * 2020-03-25 2025-12-18 삼성디스플레이 주식회사 Mask assembly, apparatus for manufacturing a display apparatus, and method for manufacturing a display apparatus
CN113543477B (en) * 2020-04-17 2022-11-01 珠海方正科技高密电子有限公司 Method for processing laser hole of circuit board and circuit board with laser hole
KR102188249B1 (en) * 2020-06-12 2020-12-09 임서현 Metal case and modifying method thereof
DE102022204688B3 (en) * 2022-05-13 2023-09-07 Carl Zeiss Smt Gmbh Device for focusing a beam of photons into a material, corresponding method and computer program

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6078747B2 (en) 2013-01-28 2017-02-15 株式会社ブイ・テクノロジー Vapor deposition mask manufacturing method and laser processing apparatus

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