TW201900284A - Nozzle unit, atmosphere exchanging device with nozzle unit, and atmosphere exchanging method capable of promptly providing suitable thrust to the nozzle for replacing atmosphere according to the receiving condition of received object in the container - Google Patents
Nozzle unit, atmosphere exchanging device with nozzle unit, and atmosphere exchanging method capable of promptly providing suitable thrust to the nozzle for replacing atmosphere according to the receiving condition of received object in the container Download PDFInfo
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本發明係關於一種環境氣體置換裝置,其係對於可密閉的容器,將容器內部之環境氣體置換為惰性氣體等之環境氣體,及關於此環境氣體置換裝置所具備的噴嘴單元、暨環境氣體置換方法,該可密閉的容器,係使用於對半導體晶圓、液晶面板、有機EL顯示器面板等薄板狀之基板進行處理的步驟間之搬送。 The present invention relates to an environmental gas replacement device that replaces an ambient gas inside a container with an environmental gas such as an inert gas in a container that can be sealed, and a nozzle unit and an environmental gas replacement device provided in the environmental gas replacement device. In the method, the closable container is used for transporting between thin-plate substrates such as semiconductor wafers, liquid crystal panels, and organic EL display panels.
以往,於對半導體晶圓等薄板狀的基板進行成膜、蝕刻等各式各樣之處理的處理裝置、進行基板之移載的EFEM(Equipment Front End Module;設備前端模組)、或讀取批號(lot)且進行篩選之被稱為分類機(sort)的裝置中,為了防止浮游於空氣中之塵粒(particle)附著於薄板狀基板上,在藉由設為被稱作微環境(mini-environment)方式的高度清潔化之微小空間而較廉價地保持高清潔度上,下足了工夫,其中該微環境方式係用以高清潔地保持曝露有基板之裝置內部的環境氣體。 In the past, a processing apparatus for performing various processes such as film formation and etching on a thin plate-shaped substrate such as a semiconductor wafer, and an EFEM (Equipment Front End Module) for reading a substrate, or reading In order to prevent dust particles floating in the air from adhering to the thin plate-like substrate, the lottery is selected as a micro-environment (referred to as a micro-environment). The mini-environment method is highly clean and has a high degree of cleanliness, and the micro-environment is used to maintain the ambient gas inside the device exposed to the substrate with high cleanliness.
然而,近年來伴隨半導體電路線寬之設計規則的細微化,10nm以下之生產也越來越帶有現實的感覺。其結果,出現了僅利用習知的微環境方式之高清潔化將會無法應對的問題。亦即,於藉由處理裝置處理之後,有可能在被搬送於容器內部的基板之表面,與空氣中的氧或水分反應而生成在自然氧化膜等之各種處理步驟上不希望形成的膜。此外,除了空氣中的氧或水分外,處理裝置內使用的汙染物質,也有可能在附著於薄板狀基板上的狀態下被搬送於容器內,此汙染物質甚至可能汙染至被密閉的容器內之其他薄板狀基板,進而可能對接下來之處理步驟產生不良影響而招致良率的惡化。 However, in recent years, with the miniaturization of the design rule of the semiconductor circuit line width, production below 10 nm has become more and more realistic. As a result, there has been a problem that it is impossible to cope with the high cleanliness of the conventional micro-environment method. That is, after being processed by the processing apparatus, there is a possibility that a surface of the substrate conveyed inside the container reacts with oxygen or moisture in the air to form a film which is undesirably formed in various processing steps such as a natural oxide film. Further, in addition to oxygen or moisture in the air, the contaminant used in the treatment device may be transported into the container while being attached to the thin plate-like substrate, and the contaminant may even be contaminated into the sealed container. Other thin plate-like substrates may further adversely affect the subsequent processing steps and cause a deterioration in yield.
作為用以解決這些問題的方法,想到了以下之各式各樣的方法:藉由以自外部供給的惰性氣體除去進入容器內之空氣或汙染物質,且以惰性氣體充滿容器的收容空間,防止被收容之薄板狀基板表面的氧化。 As a method for solving these problems, various methods have been conceived in which the air or contaminant entering the container is removed by an inert gas supplied from the outside, and the container accommodating space is filled with an inert gas to prevent Oxidation of the surface of the thin plate substrate that is contained.
作為用來以惰性氣體對FOUP(Front Opening Unified Pod;前開式晶圓傳送盒)即在內部空間收容半導體晶圓之能密閉的容器之一者,置換FOUP之內部環境氣體的環境氣體置換用連接埠,其具備朝FOUP內部的空間注入惰性氣體之注入埠、及用以排出殘留於FOUP內部的含有氧化性氣體之空氣(atmosphere)的排出埠。此外,載置FOUP且具有開閉此FOUP所具備的前開門片(door)之機構的被稱為晶圓載入機(load port)之裝置,係被形成為可在載置FOUP的平台部裝設有經由此注入埠及排出埠而用以置換FOUP內部的環境氣體之注入噴嘴及排出噴嘴的構造。 An environmental gas replacement connection for replacing the internal environmental gas of the FOUP as one of the airtight containers for the FOUP (Front Opening Unified Pod), that is, the semiconductor wafer in the internal space. In other words, it has an injection port for injecting an inert gas into a space inside the FOUP, and a discharge port for discharging an atmosphere containing an oxidizing gas remaining inside the FOUP. Further, a device called a wafer loader that mounts a FOUP and has a mechanism for opening and closing a front door provided in the FOUP is formed to be mountable on a platform portion on which the FOUP is placed. The injection nozzle and the discharge nozzle for replacing the atmosphere of the inside of the FOUP through the injection port and the discharge port are provided.
此外,於將被搬運而至的FOUP載置於平台上、或將載置於平台上之FOUP朝下一步驟運出之作業時,為了防止注入噴嘴或排出噴嘴與FOUP碰撞,於晶圓載入機設置有可藉由驅動機構使注入噴嘴及排出噴嘴升降的構造。這是以當不需要對FOUP內部進行置換時使各噴嘴朝平台下部移動而於不干涉FOUP的搬送之位置待機,當以惰性氣體等置換FOUP內部的環境氣體時,藉由驅動機構使各噴嘴朝FOUP的底面突出而與配置於FOUP底面的注入埠及排出埠接觸,進行FOUP內部的環境氣體置換處理之方式構成者。 In addition, when the FOUP to be transported is placed on the platform or the FOUP placed on the platform is transported to the next step, in order to prevent the injection nozzle or the discharge nozzle from colliding with the FOUP, the wafer is loaded on the wafer. The inlet is provided with a structure in which the injection nozzle and the discharge nozzle can be raised and lowered by the drive mechanism. This is to wait for the nozzles to move toward the lower portion of the platform and to prevent the FOUP from being transported when it is not necessary to replace the inside of the FOUP. When the ambient gas inside the FOUP is replaced with an inert gas or the like, the nozzles are driven by the drive mechanism. It protrudes from the bottom surface of the FOUP, and is placed in contact with the injection port and the discharge port disposed on the bottom surface of the FOUP, and is configured to perform environmental gas replacement treatment inside the FOUP.
專利文獻1 日本特開2011-187539號公報 Patent Document 1 Japanese Patent Laid-Open Publication No. 2011-187539
專利文獻2 日本特開2015-088500號公報 Patent Document 2 Japanese Patent Publication No. 2015-088500
專利文獻1揭示之噴嘴升降驅動單元,係配置於載置FOUP之平台的下部,且作為驅動源具備氣動缸。藉由以電磁閥等開放或關斷被供給於此氣動缸之壓縮空氣,而使注入噴嘴及排出噴嘴升降移動。 The nozzle lifting/lowering driving unit disclosed in Patent Document 1 is disposed at a lower portion of a platform on which a FOUP is placed, and is provided with a pneumatic cylinder as a driving source. The injection nozzle and the discharge nozzle are moved up and down by opening or closing the compressed air supplied to the pneumatic cylinder with a solenoid valve or the like.
藉由設為上述構成,當不進行環境氣體置換處理時,可使各噴嘴退避至退避位置。然而,於此文獻1揭示的構成中,只能以一定的力使噴嘴上升或下降。為了於短時間內對FOUP內進行置換,需要供給大流量 的沖洗氣體(purge gas)。此時,為了防止沖洗氣體自注入用噴嘴與FOUP底面之間朝外部漏出,需要以一定程度的強力將注入噴嘴按壓於FOUP底面。此外,FOUP整體之重量係根據收容於內部的基板片數之不同而增減,因此,若以與最重之滿載狀態的FOUP對應的按壓力將噴嘴按壓於輕量之狀態的FOUP的底面,則載置於平台上的FOUP有可能會浮起。若FOUP浮起,則檢測FOUP的載置狀態之感測器變成斷路(off)狀態,且因此原因而造成裝置整體停止,進而可能產生大幅之步驟延遲。 With the above configuration, when the ambient gas replacement process is not performed, each nozzle can be retracted to the retracted position. However, in the configuration disclosed in this document 1, the nozzle can only be raised or lowered with a certain force. In order to replace the inside of the FOUP in a short time, it is necessary to supply a large flow of purge gas. At this time, in order to prevent the flushing gas from leaking outward from the injection nozzle and the FOUP bottom surface, it is necessary to press the injection nozzle to the bottom surface of the FOUP with a certain degree of strength. In addition, the weight of the entire FOUP is increased or decreased depending on the number of substrates accommodated in the inside. Therefore, the nozzle is pressed against the bottom surface of the FOUP in a lightweight state by the pressing force corresponding to the FOUP of the heaviest full load state. The FOUP placed on the platform may float. If the FOUP floats, the sensor that detects the placed state of the FOUP becomes an off state, and as a result, the entire device is stopped, which may cause a large step delay.
專利文獻2揭示之氣體供給排出機構,具備:氣體流通噴嘴,其供給惰性氣體;及外殼部,其於此氣體流通噴嘴之下方,藉由供給之氣體的壓力使氣體流通噴嘴上升。氣體流通噴嘴,於未供給氣體時被收容於外殼部內,但當供給氣體時,藉由充滿於形成在外殼部的第1壓力調整室內之氣體的壓力被朝上方頂出,與FOUP底面的供給埠抵接。然後,充滿於外殼部內的氣體,經由形成於氣體流通噴嘴之開口被朝FOUP內部導入。並且,於外殼部的第1壓力調整室之上方形成有第2壓力調整室,且藉由將此第2壓力調整室的內壓調節為負壓或正壓,對氣體流通噴嘴的上升或下降移動賦予勢能。 The gas supply and discharge mechanism disclosed in Patent Document 2 includes a gas flow nozzle that supplies an inert gas, and a case portion that is opened below the gas flow nozzle by the pressure of the supplied gas. The gas circulation nozzle is housed in the outer casing when the gas is not supplied. However, when the gas is supplied, the pressure of the gas filled in the first pressure adjustment chamber formed in the outer casing portion is pushed upward, and the supply of the FOUP bottom surface is provided.埠 Abut. Then, the gas filled in the outer casing portion is introduced into the inside of the FOUP through the opening formed in the gas circulation nozzle. Further, a second pressure adjustment chamber is formed above the first pressure adjustment chamber of the outer casing portion, and the internal pressure of the second pressure adjustment chamber is adjusted to a negative pressure or a positive pressure to raise or lower the gas flow nozzle. Movement gives potential energy.
藉由設為上述構成,雖可使藉由供給的沖洗氣體之流量而推頂沖洗用噴嘴的力變化,但以置換FOUP內部的氣體直接使噴嘴上升移動,會產生的新的問題。亦即,因噴嘴在外殼部內升降移動,噴嘴會沿外殼部的 內壁滑動,進而產生微小的塵埃。此塵埃與沖洗氣體一同侵入FOUP之內部空間且附著在被收容於FOUP內部的基板表面,其結果,有可能在形成於基板的極微小之電子電路產生圖案斷線等的不良,進而造成產品的良率惡化。 With the above configuration, the force of the flushing nozzle can be changed by the flow rate of the supplied flushing gas. However, a new problem arises by replacing the gas inside the FOUP and directly moving the nozzle. That is, as the nozzle moves up and down in the outer casing portion, the nozzle slides along the inner wall of the outer casing portion, thereby generating minute dust. This dust intrudes into the internal space of the FOUP together with the flushing gas and adheres to the surface of the substrate housed in the inside of the FOUP. As a result, there is a possibility that a pattern such as a broken line is formed in a very small electronic circuit formed on the substrate, thereby causing a product. The yield is deteriorating.
本發明係鑑於上述問題而完成者,其主要目的,在於提供一種噴嘴單元、及具備噴嘴單元的環境氣體置換裝置,該噴嘴單元係可與容器內部之基板的收容狀況對應,以最適當的推力將沖洗用噴嘴壓抵於形成在容器之沖洗埠,且可朝容器之內部空間供給清潔的沖洗氣體。 The present invention has been made in view of the above problems, and a main object thereof is to provide a nozzle unit and an environmental gas replacement device including a nozzle unit that can correspond to a housing state of a substrate inside the container, with an optimum thrust The rinsing nozzle is pressed against the rinsing bowl formed in the container, and the clean rinsing gas can be supplied toward the internal space of the container.
為了達成上述目的,本發明之一實施形態的噴嘴單元,係用以經由設置於能密閉的容器之環境氣體置換用連接埠而將上述容器內部置換為既定的環境氣體,該噴嘴單元之特徵在於具備:噴嘴本體,其形成有供沖洗氣體通過的流路;噴嘴驅動部,其具備電磁鐵,且利用藉由上述電磁鐵產生的磁場,使上述噴嘴本體相對於上述環境氣體置換用連接埠進退移動;永久磁鐵,其藉由上述電磁鐵產生的磁場而進退移動;電源部,其朝上述噴嘴驅動手段供給電力;及控制部,其調節自上述電源部供給的電流值且供給於上述電磁鐵。 In order to achieve the above object, a nozzle unit according to an embodiment of the present invention is configured to replace a container inside a container with a predetermined atmosphere by a connection port for environmental gas replacement provided in a sealable container, wherein the nozzle unit is characterized in that the nozzle unit is characterized in that The nozzle body includes a flow path through which the flushing gas passes, and the nozzle drive unit includes an electromagnet, and the nozzle body is moved forward and backward with respect to the environmental gas replacement port by a magnetic field generated by the electromagnet a permanent magnet that moves forward and backward by a magnetic field generated by the electromagnet; a power supply unit that supplies electric power to the nozzle driving means; and a control unit that adjusts a current value supplied from the power supply unit and supplies the electromagnet .
藉由設為上述構成,控制部可調節自電源部供給的電流值且供給於電磁鐵。並且,由於使噴嘴本體進退移動的驅動部之驅動源係電磁鐵,因此,來自可動 部分的塵埃不會侵入供沖洗氣體通過之流路內,從而可將清潔的沖洗氣體供給於容器內部。 With the above configuration, the control unit can adjust the current value supplied from the power supply unit and supply it to the electromagnet. Further, since the driving source of the driving unit that moves the nozzle body forward and backward moves, the dust from the movable portion does not enter the flow path through which the flushing gas passes, and the clean flushing gas can be supplied to the inside of the container.
此外,本發明之一實施形態的噴嘴單元具備之控制部,其特徵在於,根據收容於容器內的被收容物之收容狀況,調節供給於電磁鐵之電流值。藉此,可與因收容於容器內的被收容物之增減而產生的容器的重量變化對應,將適當之值的電流供給於電磁鐵。並且,控制部係被預先設為藉由接收自上游的控制裝置傳送之環境氣體置換開始信號,而使來自電源部的電流開始朝電磁鐵供給,藉此,可縮短噴嘴本體與容器抵接的時間,可防止噴嘴單元的磨耗或變形。 Moreover, the control unit provided in the nozzle unit according to the embodiment of the present invention is characterized in that the current value supplied to the electromagnet is adjusted in accordance with the storage state of the object to be stored in the container. Thereby, an appropriate value of current can be supplied to the electromagnet in accordance with the change in the weight of the container caused by the increase or decrease of the stored contents contained in the container. Further, the control unit is configured to start the supply of the ambient gas replacement start signal transmitted from the upstream control device, and the current from the power supply unit is started to be supplied to the electromagnet, thereby shortening the nozzle body and the container. Time to prevent wear or deformation of the nozzle unit.
此外,藉由將電磁鐵作為空心線圈且以永久磁鐵被配置於空心線圈之空心部分的方式構成,可將在空心線圈之空心區域產生的磁場作為推力,使永久磁鐵朝既定的方向移動。並且,可將永久磁鐵配置於被配置在空心線圈之空心區域的噴嘴本體。藉此,相較於個別配置空心線圈及噴嘴本體,可有效地利用空間。 Further, by forming the electromagnet as an air-core coil and disposing the permanent magnet in the hollow portion of the air-core coil, the magnetic field generated in the hollow region of the air-core coil can be used as a thrust to move the permanent magnet in a predetermined direction. Further, the permanent magnet can be disposed in the nozzle body disposed in the hollow region of the air-core coil. Thereby, the space can be effectively utilized compared to the individual configuration of the air-core coil and the nozzle body.
此外,藉由於電磁鐵與永久磁鐵之間具備限制永久磁鐵的橫向移動之限制構件,可防止因永久磁鐵與電磁鐵的接觸而引起之故障,其中該限制構件係由摩擦阻力小的非磁性構件構成。並且,藉由於永久磁鐵具備軛鐵,可使自永久磁鐵放射的磁場集中,因此可獲得更大的推力。並且,為了防止電磁鐵產生的磁場對其他之電性構件產生不良影響,還可將電磁鐵收納於由磁性材料構成的殼體內。 Further, since the electromagnet and the permanent magnet are provided with a restricting member that restricts the lateral movement of the permanent magnet, the malfunction caused by the contact of the permanent magnet with the electromagnet can be prevented, wherein the restricting member is a non-magnetic member having a small frictional resistance. Composition. Further, since the permanent magnet is provided with the yoke, the magnetic field radiated from the permanent magnet can be concentrated, so that a larger thrust can be obtained. Further, in order to prevent the magnetic field generated by the electromagnet from adversely affecting other electrical components, the electromagnet may be housed in a casing made of a magnetic material.
此外,藉由構成為於載置容器之平台具備本發明之一實施形態的噴嘴單元,且於平台配置檢測此容器之載置狀態的感測器,噴嘴單元可於檢測出載置有容器的定時後,開始進行朝電磁鐵之電流的通電。此外,控制部可藉由分析複數個感測器的各檢測信號,掌握容器的載置狀態,因此可即時朝電磁鐵供給適當的電流量。 Further, by providing a nozzle unit according to an embodiment of the present invention on a platform on which the container is placed, and a sensor for detecting the placed state of the container on the stage, the nozzle unit can detect that the container is placed. After the timing, energization of the current to the electromagnet is started. Further, the control unit can grasp the state in which the container is placed by analyzing the respective detection signals of the plurality of sensors, so that an appropriate amount of current can be immediately supplied to the electromagnet.
根據本發明,可與容器內部之基板的收容狀況對應,以最適當的推力將沖洗用噴嘴壓抵於形成在容器之沖洗埠。此外,由於可將產生推力的驅動部與沖洗氣體的配管完全分離,因此可朝容器之內部空間供給清潔的沖洗氣體。 According to the present invention, the rinsing nozzle can be pressed against the rinsing bowl formed in the container with the most appropriate thrust in accordance with the storage state of the substrate inside the container. Further, since the driving portion for generating the thrust can be completely separated from the piping for the flushing gas, the clean flushing gas can be supplied to the internal space of the container.
1‧‧‧處理裝置 1‧‧‧Processing device
2‧‧‧晶圓載入機 2‧‧‧ wafer loader
3‧‧‧EFEM 3‧‧‧EFEM
4‧‧‧搬送機器人 4‧‧‧Transfer robot
5‧‧‧風機過濾單元 5‧‧‧Fan filter unit
6‧‧‧搬送室 6‧‧‧Transport room
7‧‧‧處理室 7‧‧‧Processing room
8‧‧‧風扇 8‧‧‧fan
9,39‧‧‧過濾器 9,39‧‧‧Filter
10‧‧‧地板 10‧‧‧floor
11‧‧‧埠開口部 11‧‧‧埠 opening
12‧‧‧FIMS門 12‧‧‧FIMS door
13‧‧‧FOUP(容器) 13‧‧‧FOUP (container)
13a‧‧‧FOUP本體 13a‧‧‧FOUP ontology
13b‧‧‧蓋體 13b‧‧‧ cover
14‧‧‧平台 14‧‧‧ platform
15‧‧‧卡止鉤 15‧‧‧Clock hook
16‧‧‧定位槽 16‧‧‧ positioning slot
17,17a,17b,17c‧‧‧檢測感測器 17,17a, 17b, 17c‧‧‧Detector
18,19,18',18"‧‧‧噴嘴單元 18,19,18',18"‧‧‧ nozzle unit
18a‧‧‧注入用噴嘴單元 18a‧‧‧Injection nozzle unit
18b‧‧‧排出用噴嘴單元 18b‧‧‧Discharge nozzle unit
20‧‧‧卡合部 20‧‧‧Clock Department
21‧‧‧注入用埠(環境氣體置換用連接埠) 21‧‧‧Injection 埠 (interface for environmental gas replacement)
21a‧‧‧注入口 21a‧‧‧Injection
21b,22b‧‧‧止回閥 21b, 22b‧‧‧ check valve
22‧‧‧排出用埠(環境氣體置換用連接埠) 22‧‧‧Exhaustion 埠 (interface for environmental gas replacement)
22a‧‧‧排出口 22a‧‧‧Export
23,23',23",48‧‧‧噴嘴本體 23,23',23",48‧‧‧ nozzle body
24,24',49,59,60‧‧‧電磁鐵 24,24',49,59,60‧‧‧electromagnet
25,25',25",50‧‧‧噴嘴驅動部 25,25',25",50‧‧‧Nozzle Drive Department
26‧‧‧電源部 26‧‧‧Power Supply Department
27,27',51‧‧‧流路 27,27', 51‧‧‧ flow path
28,28'‧‧‧筒狀構件 28,28'‧‧‧Cylinder components
28a‧‧‧下構件 28a‧‧‧lower components
28b‧‧‧上構件 28b‧‧‧Upper components
29‧‧‧抵接構件 29‧‧‧Abutment components
30,30',52,58‧‧‧永久磁鐵 30, 30', 52, 58‧‧‧ permanent magnets
31,31',31",53‧‧‧殼體 31,31',31",53‧‧‧shell
32,32',32"‧‧‧底板 32,32',32"‧‧‧ bottom plate
33,61‧‧‧上板 33,61‧‧‧Upper board
34‧‧‧接頭 34‧‧‧Connectors
35‧‧‧供給源 35‧‧‧Supply source
36‧‧‧氣體供給用配管 36‧‧‧Gas supply piping
37‧‧‧控制部 37‧‧‧Control Department
38‧‧‧開閉閥 38‧‧‧Opening and closing valve
40‧‧‧平台驅動機構 40‧‧‧ platform drive mechanism
40a‧‧‧馬達 40a‧‧‧Motor
40b‧‧‧進給螺桿 40b‧‧‧feed screw
41‧‧‧定位銷 41‧‧‧Locating pin
41a,41b,41c‧‧‧檢測感測器(檢測信號) 41a, 41b, 41c‧‧‧Detector (detection signal)
42‧‧‧定位感測器 42‧‧‧ Positioning Sensor
43‧‧‧感測器安裝部 43‧‧‧Sensor Installation Department
44,44',55‧‧‧限制構件 44,44', 55‧‧‧Restricted components
45‧‧‧間隔件 45‧‧‧ spacers
46‧‧‧鐵心 46‧‧‧ iron core
47‧‧‧屏蔽外殼 47‧‧‧Shielded enclosure
54‧‧‧連結構件 54‧‧‧Connected components
56‧‧‧圓柱狀構件 56‧‧‧Cylindrical members
57‧‧‧支架 57‧‧‧ bracket
62,63‧‧‧軛鐵 62,63‧‧‧ yoke
64‧‧‧螺絲 64‧‧‧ screws
65‧‧‧移動子 65‧‧‧Moving child
圖1為顯示應用本發明之處理裝置1之立體圖。 1 is a perspective view showing a processing apparatus 1 to which the present invention is applied.
圖2為顯示此處理裝置1之截面的圖。 FIG. 2 is a view showing a cross section of the processing apparatus 1.
圖3為顯示能密閉的容器即FOUP 13之概略圖。 Fig. 3 is a schematic view showing the FOUP 13 which is a container which can be sealed.
圖4為顯示本發明之一實施形態的晶圓載入機2之概要的剖視圖。 Fig. 4 is a cross-sectional view showing the outline of a wafer loading machine 2 according to an embodiment of the present invention.
圖5為顯示本發明之晶圓載入機2具備的平台14之俯視圖。 Fig. 5 is a plan view showing the stage 14 provided in the wafer loader 2 of the present invention.
圖6為顯示本發明之一實施形態的噴嘴單元18之剖視圖。 Fig. 6 is a cross-sectional view showing a nozzle unit 18 according to an embodiment of the present invention.
圖7為顯示圖6所示之噴嘴單元18的A-A截面之圖。 Fig. 7 is a view showing a cross section taken along line A-A of the nozzle unit 18 shown in Fig. 6.
圖8為顯示載置於平台14上之FOUP 13的載置姿勢之圖。 FIG. 8 is a view showing a mounting posture of the FOUP 13 placed on the stage 14.
圖9為顯示本發明之一實施形態的噴嘴單元19之剖視圖。 Fig. 9 is a cross-sectional view showing a nozzle unit 19 according to an embodiment of the present invention.
圖10為顯示本發明之一實施形態的噴嘴單元18'之圖。 Fig. 10 is a view showing a nozzle unit 18' according to an embodiment of the present invention.
圖11為顯示圖10所示之噴嘴單元18'的B-B截面之圖。 Fig. 11 is a view showing a B-B section of the nozzle unit 18' shown in Fig. 10.
圖12為顯示本發明之一實施形態的噴嘴單元18"之圖。 Fig. 12 is a view showing a nozzle unit 18" according to an embodiment of the present invention.
圖13為顯示本發明之一實施形態的噴嘴單元18"之作用之概略圖。 Fig. 13 is a schematic view showing the action of the nozzle unit 18" according to an embodiment of the present invention.
以下,對圖示本發明之實施形態詳細地進行說明。圖1為顯示處理裝置1之立體圖,圖2為其剖視圖。處理裝置1係設置於環境氣體被清潔地管理之被稱為無塵室之工廠內。處理裝置1主要具備晶圓載入機2及搬送機器人4,且係由在清潔的環境氣體中移送晶圓W之EFEM 3、對晶圓W表面實施既定的處理之處理室7、及在EFEM 3與處理室7之間交接晶圓W的搬送室6構成。EFEM 3係設置有框架、壁面及風機過濾單元(Fan Filter Unit)5,該壁面係被固定於框架且用以與外部環境氣體隔離,該風機過濾單元係作為一高清潔空氣導入手段,在將來自外部的空氣淨化為高清潔的空氣之後,作為降流導入EFEM 3之內部空間。風機過濾單元5係設 置於EFEM 3之天花板上,且由向下朝EFEM 3內部輸送空氣的風扇8、及除去存在於被輸送而至的空氣中之塵埃或有機物等汙染物質之過濾器9構成。此外,EFEM 3之地板10係使用具有既定的排放效率之可供空氣流通的構件。 Hereinafter, embodiments of the present invention will be described in detail. 1 is a perspective view showing the processing apparatus 1, and FIG. 2 is a cross-sectional view thereof. The processing apparatus 1 is installed in a factory called a clean room in which the ambient gas is cleanly managed. The processing device 1 mainly includes a wafer loader 2 and a transfer robot 4, and is an EFEM 3 that transfers a wafer W in a clean ambient gas, a processing chamber 7 that performs a predetermined process on the surface of the wafer W, and an EFEM. 3 is constituted by a transfer chamber 6 that transfers the wafer W to and from the processing chamber 7. The EFEM 3 is provided with a frame, a wall and a fan filter unit 5, which is fixed to the frame and is isolated from external ambient gas. The fan filter unit is used as a high clean air introduction means. After the air from the outside is purified as highly clean air, it is introduced into the internal space of the EFEM 3 as a downflow. The fan filter unit 5 is disposed on the ceiling of the EFEM 3, and is composed of a fan 8 that conveys air toward the inside of the EFEM 3, and a filter 9 that removes pollutants such as dust or organic substances present in the air to be transported. . In addition, the floor 10 of EFEM 3 uses air permeable components having a defined discharge efficiency.
藉由這些構成,藉由風機過濾單元5供給於內部的清潔空氣,時常向下流動於EFEM 3之內部空間,且被自地板10朝裝置外部排出,以使EFEM 3內保持為高清潔之環境。搬送機器人4係於被稱作為FOUP的容器13與處理室7之間搬送薄板狀基板的1種即晶圓W者,機器人4之活動臂部分,係藉由設為磁性流體密封等的防止起塵之密封構造,在抑制因起塵而對晶圓W產生不良影響上,下足了工夫。藉此,晶圓W可在表面不會附著塵埃之狀態下藉由搬送機器人4在高清潔的環境氣體內進行搬送。此外,EFEM 3之晶圓W的搬送區域即內部的氣壓,係被維持在較EFEM 3之外部高的壓力「正壓」,典型之情況下被維持為具有1.5Pa左右的差壓。如此,藉由防止來自外部之汙染物質或塵埃的侵入,EFEM 3內部的清潔度,可維持0.5μm的微塵且等級1以上的高清潔度。此外,於EFEM 3具備未圖示的控制裝置,該控制裝置係根據沿預先記憶的程式自晶圓載入機2及搬送機器人4傳送而至的資訊,對晶圓載入機2及搬送機器人4傳送動作的指令。 With these configurations, the clean air supplied to the inside by the fan filter unit 5 constantly flows downward into the internal space of the EFEM 3 and is discharged from the floor 10 toward the outside of the apparatus to maintain the environment in the EFEM 3 in a high clean environment. . The transport robot 4 is a type of wafer W that transports a thin plate-shaped substrate between the container 13 called the FOUP and the processing chamber 7, and the movable arm portion of the robot 4 is protected by a magnetic fluid seal or the like. The dust seal structure has a lot of work to prevent the wafer W from being adversely affected by dusting. Thereby, the wafer W can be transported by the transfer robot 4 in a highly clean atmosphere in a state where dust does not adhere to the surface. Further, the internal air pressure in the transport region of the wafer W of the EFEM 3 is maintained at a pressure "positive pressure" higher than that outside the EFEM 3, and is typically maintained at a differential pressure of about 1.5 Pa. In this way, by preventing the intrusion of pollutants or dust from the outside, the cleanliness inside the EFEM 3 can maintain a fine dust of 0.5 μm and a high cleanliness of a level of 1 or higher. Further, the EFEM 3 includes a control device (not shown) that transmits information to and from the wafer loader 2 and the transfer robot 4 in accordance with a program stored in advance, to the wafer loader 2 and the transfer robot. 4 instructions for transmitting actions.
其次,參照圖1及圖4對本發明之一實施形態的晶圓載入機2進行說明。圖4為顯示本發明之一實 施形態的晶圓載入機2之概要的剖視圖。晶圓載入機2具備:平台14,其將能密閉的容器之一形態即FOUP 13載置於既定位置;平台驅動機構40,其於鉛垂方向支撐平台14,且使平台14前進及後退動作;埠開口部11,其用以供搬送機器人4進行FOUP 13內的晶圓W之搬出及/或搬入;FIMS門(door)12,其可於堵塞埠開口部11之位置與開放埠開口部11的位置之間移動,且與用以密閉FOUP 13之內部的蓋體13b形成一體;及未圖示的FIMS門升降機構,其使此FIMS門12進行升降動作。 Next, a wafer loader 2 according to an embodiment of the present invention will be described with reference to Figs. 1 and 4 . Fig. 4 is a cross-sectional view showing the outline of a wafer loading machine 2 according to an embodiment of the present invention. The wafer loader 2 is provided with a platform 14 that mounts the FOUP 13 in a form of one of the airtight containers in a predetermined position, and a platform driving mechanism 40 that supports the platform 14 in the vertical direction and advances and retracts the platform 14 The opening portion 11 is configured to allow the transport robot 4 to carry out the loading and/or loading of the wafer W in the FOUP 13; the FIMS door 12 is capable of blocking the opening of the opening portion 11 and opening the opening The position of the portion 11 moves between and is integrated with the lid body 13b for sealing the inside of the FOUP 13, and an FIMS door lifting mechanism (not shown) that moves the FIMS door 12 up and down.
FIMS門12之門開閉動作係藉由設置一開閉手段、或藉由平台驅動機構40而進行,其中該開閉手段係使與蓋體13b一體化的FIMS門12在相對於FOUP 13而分離的位置之間往返動作,該平台驅動機構40係使載置FOUP 13的平台14在相對於與蓋體13b一體化之FIMS門12而分離的位置之間往返動作。於後者之情況下,平台驅動機構40,還擔負開閉手段的功能。再者,這些機構係與藉由半導體製造之國際規格即SEMI規格(Semiconductor Equipment and Materials International Standards;國際半導體設備暨材料產業協會)規定的FIMS(Front-opening Interface Mechanical Standard;前開介面機械標準)系統對應。 The door opening and closing operation of the FIMS door 12 is performed by providing an opening and closing means or by the platform driving mechanism 40, wherein the opening and closing means separates the FIMS door 12 integrated with the cover 13b with respect to the FOUP 13. In the reciprocating motion, the platform driving mechanism 40 reciprocates between the platform 14 on which the FOUP 13 is placed and the position separated from the FIMS door 12 integrated with the lid 13b. In the latter case, the platform drive mechanism 40 also functions as an opening and closing means. Furthermore, these institutions are FIMS (Front-opening Interface Mechanical Standard) systems specified by the SEMI specification (Semiconductor Equipment and Materials International Standards). correspond.
本實施形態之晶圓載入機2具備的平台驅動機構40,具備驅動源即馬達40a、及進給螺桿40b,且被構成為可將馬達40a之旋轉傳遞至進給螺桿40b,使被固定於進給螺桿40b之平台14移動至任意之位置。再 者,也可取代馬達40a及進給螺桿40b,使用利用氣壓或油壓等流體壓力的缸。 The stage drive mechanism 40 included in the wafer loading machine 2 of the present embodiment includes a motor 40a as a drive source and a feed screw 40b, and is configured to transmit the rotation of the motor 40a to the feed screw 40b so as to be fixed. The platform 14 of the feed screw 40b is moved to an arbitrary position. Further, instead of the motor 40a and the feed screw 40b, a cylinder using fluid pressure such as air pressure or oil pressure may be used.
平台14係將FOUP 13正確地定位於既定的位置,且支撐FOUP 13之鉛垂方向的負載。於平台14之上面,以俯視時描畫成等腰三角形的方式立設有三根被稱為活動銷之圓柱狀的定位銷41。此定位銷41具有頂部為大致半球狀的形狀,且藉由此定位銷41之頂部、與形成在與FOUP 13之底部的定位銷41對應之位置的具有V字狀截面的定位槽16卡合,可將FOUP 13朝平台14上的既定位置導引。此外,於本實施形態之晶圓載入機2上,且於各定位銷41之附近以自平台14之表面突出的方式至少配置有3個檢測感測器17,該檢測感測器17係用以檢測FOUP 13是否被載置於平台14上的正規位置。全部之檢測感測器17係被構成為以若FOUP 13被正常地載置則作出反應的方式調整上下方向的位置,例如,於FOUP 13被傾斜載置之情況下,這些檢測感測器17之任一者不檢測FOUP 13。檢測感測器17係與晶圓載入機2具備的控制部37電性連接,控制部37係被構成為可根據自各檢測感測器17傳送的信號,識別FOUP 13是否被正常地載置於平台14上。 The platform 14 properly positions the FOUP 13 at a predetermined location and supports the vertical load of the FOUP 13. On the upper surface of the platform 14, three cylindrical positioning pins 41 called movable pins are placed in a plan view in the form of an isosceles triangle. The positioning pin 41 has a substantially hemispherical shape at the top, and is engaged with the positioning groove 16 having a V-shaped cross section formed at a position corresponding to the positioning pin 41 at the bottom of the FOUP 13 by the top of the positioning pin 41. The FOUP 13 can be directed toward a predetermined position on the platform 14. Further, in the wafer loader 2 of the present embodiment, at least three detection sensors 17 are disposed so as to protrude from the surface of the stage 14 in the vicinity of each of the positioning pins 41, and the detection sensor 17 is provided. A normal position for detecting whether the FOUP 13 is placed on the platform 14. All of the detection sensors 17 are configured to adjust the position in the vertical direction so that the FOUP 13 is normally placed, for example, in the case where the FOUP 13 is placed obliquely, the detection sensors 17 Either one does not detect FOUP 13. The detection sensor 17 is electrically connected to the control unit 37 included in the wafer loader 2, and the control unit 37 is configured to recognize whether or not the FOUP 13 is normally placed based on a signal transmitted from each detection sensor 17. On the platform 14.
若FOUP 13被正常地載置於平台14上,則FOUP 13藉由卡止鉤15卡止。卡止鉤15具備未圖示之氣動缸作為驅動源,藉由朝此氣動缸供給壓縮空氣而使氣動缸作動,卡止鉤15將FOUP 13與平台14卡止。此外,藉由釋放被供給的壓縮空氣,解除FOUP 13之卡止。 壓縮空氣之朝氣壓缸的供給及釋放,係藉由晶圓載入機2具備的未圖示之電磁閥而被切換。電磁閥係設置於連通壓縮空氣之供給源與氣動缸的配管之途中,且藉由自控制部37傳送的信號,進行作動之控制。 If the FOUP 13 is normally placed on the platform 14, the FOUP 13 is locked by the locking hook 15. The locking hook 15 is provided with a pneumatic cylinder (not shown) as a driving source, and the pneumatic cylinder is actuated by supplying compressed air to the pneumatic cylinder, and the locking hook 15 locks the FOUP 13 and the platform 14. Further, the release of the FOUP 13 is released by releasing the supplied compressed air. The supply and release of the compressed air to the pneumatic cylinder are switched by a solenoid valve (not shown) provided in the wafer loader 2. The solenoid valve is provided in the middle of the pipe connecting the supply source of the compressed air and the pneumatic cylinder, and is controlled by the signal transmitted from the control unit 37.
除了上述構成之外,還於晶圓載入機2具備定位感測器(mapping sensor)42,該定位感測器42係對晶圓W是否被載置於形成在FOUP 13內部的各棚架進行檢測。於圖4中,定位感測器42係使用具有與載置晶圓W的表面平行之光軸的透射型感測器,且被安裝於以圍繞晶圓W之水平面上的周緣之方式隔開間隔的大致ㄇ字形狀之感測器安裝部43上。此外,感測器安裝部43之兩端係安裝於未圖示的感測器驅動機構。作為感測器驅動機構的驅動源係馬達或旋轉式致動器,藉由這些驅動源進行動作,感測器安裝部43以驅動源之軸作為中心進行轉動,從而可使被安裝於上部之定位感測器42,相對於FOUP本體13a內部進入及退出。 In addition to the above configuration, the wafer loader 2 is provided with a positioning sensor 42 that is used to mount the wafer W on each of the scaffolds formed inside the FOUP 13. Test. In FIG. 4, the positioning sensor 42 uses a transmissive type sensor having an optical axis parallel to the surface on which the wafer W is placed, and is mounted to be spaced apart around the circumference of the horizontal surface of the wafer W. The sensor mounting portion 43 is formed in a substantially U-shaped space. Further, both ends of the sensor mounting portion 43 are attached to a sensor driving mechanism (not shown). The drive source motor or the rotary actuator as the sensor drive mechanism is operated by these drive sources, and the sensor mounting portion 43 is rotated about the axis of the drive source so that it can be mounted on the upper portion. The position sensor 42 is moved in and out with respect to the inside of the FOUP body 13a.
感測器驅動機構係被固定於支架上,且可與未圖示之FIMS門升降機構的動作連動而進行升降動作,藉此,可檢測關於容器13內的全部棚架之晶圓W的有無或載置狀況。再者,朝各驅動機構之輸出信號或感測器等的輸入信號,係藉由控制部37所控制。 The sensor drive mechanism is fixed to the bracket and can be moved up and down in conjunction with the operation of the FIMS door lift mechanism (not shown), thereby detecting the presence or absence of the wafer W of all the scaffolds in the container 13. Or placement status. Further, the output signal to each drive mechanism or the input signal of the sensor or the like is controlled by the control unit 37.
接著,對收容晶圓W之容器即FOUP 13進行說明。參照圖3(a),FOUP 13係一種由FOUP本體13a、及蓋體13b構成之能密閉的容器,該FOUP本體13a係用以於上下方向隔開間隔而形成之棚板上載置且收容晶 圓W,該蓋體13b係可藉由閂鎖機構而與FIMS門12一體化,且藉由與FOUP本體13a卡合而可氣密性地封閉FOUP 13內部。 Next, the FOUP 13 which is a container for accommodating the wafer W will be described. Referring to Fig. 3(a), the FOUP 13 is a closable container composed of a FOUP main body 13a and a lid body 13b. The FOUP main body 13a is used for placing a slab formed at intervals in the vertical direction and accommodating the crystal. In the circle W, the cover 13b can be integrated with the FIMS door 12 by a latch mechanism, and the inside of the FOUP 13 can be hermetically sealed by being engaged with the FOUP body 13a.
圖3(b)為顯示FOUP 13之底部的圖。於FOUP 13之底部形成有與定位銷41卡合且規定FOUP 13之相對於平台14的相對位置之定位槽16。此外,形成有卡合部20,該卡合部20係藉由被卡止於卡止鉤15而將FOUP 13固定於平台14。並且,於FOUP 13之底部的既定位置配置有注入用埠21及排出用埠22,該注入用埠21係用以將環境氣體置換時被供給的沖洗氣體注入FOUP 13之內部,該排出用埠22係用以將殘留於FOUP 13內的氣體朝FOUP 13外部排出。 Fig. 3(b) is a view showing the bottom of the FOUP 13. A positioning groove 16 is formed at the bottom of the FOUP 13 to engage with the positioning pin 41 and to define the relative position of the FOUP 13 relative to the platform 14. Further, an engaging portion 20 is formed, and the engaging portion 20 is fixed to the platform 14 by being locked to the locking hook 15. Further, the injection port 21 and the discharge port 22 for injecting the flushing gas supplied when the ambient gas is replaced into the inside of the FOUP 13 are disposed at a predetermined position at the bottom of the FOUP 13, and the discharge port is used for the discharge. The 22 system is for discharging the gas remaining in the FOUP 13 toward the outside of the FOUP 13.
於注入用埠21及排出用埠22形成有連通FOUP 13之內部環境與外部的注入口21a及排出口22a,且於這些注入口21a及排出口22a設置有限制氣體的流通之止回閥21b,22b。設置於注入用埠21之止回閥21b,係容許以規定的壓力以上之壓力注入的沖洗氣體朝FOUP 13內部的流入,但不容許以規定的壓力以下之壓力注入的沖洗氣體、或逆向流動之氣體流通的閥。此外,於注入用埠21設置有過濾器21c,該過濾器21c係用以捕集自止回閥21b產生的塵埃或被供給之氣體中含有的塵埃,防止朝FOUP 13內部之侵入。設置於排出用埠22的止回閥22b,係容許以規定的壓力以上之壓力排出的沖洗氣體或大氣朝FOUP 13外部的流出,但不容許以規定的壓力以下之壓力排出的氣體或逆向流動的氣體流通 之閥。藉由具備止回閥21b,22b,供給於FOUP 13之內部的沖洗氣體不會漏出於FOUP 13的外部,此外,外部的普通空氣,也不會滲入FOUP 13內部,從而可維持FOUP 13之內部的低氧環境。再者,也可於排出用埠22設置過濾器22c,該過濾器22c係用以防止自止回閥22b產生的塵埃滲入FOUP 13內部。 The injection port 21 and the discharge port 22 are formed with an injection port 21a and a discharge port 22a that communicate with the internal environment of the FOUP 13 and the outside, and a check valve 21b that restricts the flow of the gas is provided in the injection port 21a and the discharge port 22a. , 22b. The check valve 21b provided in the injection port 21 allows the flushing gas injected at a pressure equal to or higher than a predetermined pressure to flow into the inside of the FOUP 13, but the flushing gas injected at a pressure equal to or lower than a predetermined pressure or the reverse flow is not allowed. The valve through which the gas flows. Further, the injection port 21 is provided with a filter 21c for collecting dust generated in the check valve 21b or dust contained in the supplied gas to prevent intrusion into the inside of the FOUP 13. The check valve 22b provided in the discharge port 22 allows the flushing gas or the atmosphere discharged at a pressure equal to or higher than a predetermined pressure to flow out of the outside of the FOUP 13, but does not allow gas discharged at a pressure equal to or lower than a predetermined pressure or reverse flow. The valve for gas circulation. By providing the check valves 21b, 22b, the flushing gas supplied to the inside of the FOUP 13 does not leak outside the FOUP 13, and the external normal air does not penetrate into the inside of the FOUP 13, thereby maintaining the inside of the FOUP 13. Low oxygen environment. Further, a filter 22c for preventing dust generated from the check valve 22b from infiltrating into the inside of the FOUP 13 may be provided in the discharge port 22.
圖5為自上方觀察本實施形態之晶圓載入機2具備的平台14之俯視圖。於平台14且與FOUP 13之底面對應的位置配置有定位銷41(41a,41b,41c)、檢測感測器17(17a,17b,17c)、及卡止鉤15。並且,於本實施形態之晶圓載入機2具備的平台14上配置有本發明的噴嘴單元18,該噴嘴單元18係用以經由注入用埠21及排出用埠22且以既定的氣體置換FOUP 13之內部環境氣體。 Fig. 5 is a plan view of the stage 14 provided in the wafer loading machine 2 of the embodiment as seen from above. Positioning pins 41 (41a, 41b, 41c), detection sensors 17 (17a, 17b, 17c), and locking hooks 15 are disposed on the platform 14 at positions corresponding to the bottom surface of the FOUP 13. Further, in the stage 14 provided in the wafer loading machine 2 of the present embodiment, the nozzle unit 18 of the present invention is disposed, and the nozzle unit 18 is replaced by a predetermined gas via the injection crucible 21 and the discharge crucible 22. The internal ambient gas of FOUP 13.
本實施形態之晶圓載入機2,係於平台14之後部即自FIMS門12分離之側、及平台14之前方即與FIMS門12對向之側分別配置有一對噴嘴單元18,該一對噴嘴單元18係由注入用噴嘴單元18a及排出用噴嘴單元18b構成,該注入用噴嘴單元18a係用以經由注入用埠21朝FOUP 13內部注入既定的氣體,該排出用噴嘴單元18b係用以經由排出用埠22將殘留於FOUP 13內部的氣體排出。此外,各噴嘴單元18係被配置於形成平台14之基板的下面、且與各環境氣體置換用連接埠21,22對應之位置,各環境氣體置換用連接埠21,22係被配置於固定在平台14上的正規位置之FOUP 13之底面。再者,注入用噴嘴單元18a及排出用噴嘴單元18b之配 置,可與使用之FOUP 13的注入用埠21及排出用埠22之配置對應而適宜地變更,例如,使用配置於4個部位的噴嘴單元18中的3個部位作為注入用噴嘴單元18a,且使用剩餘的1個部位作為排出用噴嘴單元18b之情形,也充分可能。並且,也可僅使用4個部位中的2個。在此,將注入用埠21及排出用埠22統稱為環境氣體置換用連接埠。 In the wafer loader 2 of the present embodiment, a pair of nozzle units 18 are disposed on the side separated from the FIMS door 12 at the rear of the platform 14, and on the side opposite to the platform 14 and the FIMS door 12, respectively. The nozzle unit 18 is composed of an injection nozzle unit 18a for injecting a predetermined gas into the inside of the FOUP 13 via the injection nozzle 21, and a discharge nozzle unit 18a for use in the discharge nozzle unit 18b. The gas remaining inside the FOUP 13 is discharged through the discharge port 22 . In addition, each of the nozzle units 18 is disposed on the lower surface of the substrate on which the stage 14 is formed, and is disposed at a position corresponding to each of the environmental gas replacement ports 21 and 22, and the respective environmental gas replacement ports 21 and 22 are disposed and fixed. The bottom surface of the FOUP 13 at the regular position on the platform 14. In addition, the arrangement of the injection nozzle unit 18a and the discharge nozzle unit 18b can be appropriately changed in accordance with the arrangement of the injection cassette 21 and the discharge cassette 22 of the FOUP 13 to be used, and for example, it is used in four places. It is also possible that three of the nozzle units 18 are used as the injection nozzle unit 18a, and the remaining one portion is used as the discharge nozzle unit 18b. Also, only two of the four locations may be used. Here, the injection crucible 21 and the discharge crucible 22 are collectively referred to as an environmental gas replacement connection crucible.
接著,對本發明之一實施形態的噴嘴單元18進行說明。圖6為顯示本實施形態之噴嘴單元18的概略剖視圖,圖7為自圖6所示的A-A線觀察之剖視圖。如圖6所示,本實施形態之噴嘴單元18係由形成有供沖洗氣體流通之流路的噴嘴本體23、具備電磁鐵24且朝相對於環境氣體置換用連接埠21,22而作進退的方向驅動噴嘴本體23之噴嘴驅動部25、及調節自處理裝置1具備之電源部26供給於電磁鐵24的電流之控制部37所構成。 Next, a nozzle unit 18 according to an embodiment of the present invention will be described. Fig. 6 is a schematic cross-sectional view showing the nozzle unit 18 of the embodiment, and Fig. 7 is a cross-sectional view taken along line A-A of Fig. 6. As shown in Fig. 6, the nozzle unit 18 of the present embodiment is provided with a nozzle body 23 in which a flow path through which a flushing gas flows, and an electromagnet 24 are provided, which are advanced and retracted with respect to the environmental gas replacement ports 21, 22. The nozzle drive unit 25 that drives the nozzle body 23 in the direction and the control unit 37 that regulates the current supplied from the power supply unit 26 of the processing device 1 to the electromagnet 24 are configured.
本實施形態之噴嘴單元18具備的噴嘴本體23係由筒狀構件28、圓環狀構件即抵接構件29、及永久磁鐵30所構成,該筒狀構件28係形成有可流通氣體之流路27且作成大致圓筒形狀,該抵接構件29係配置於筒狀構件28之前端且與環境氣體置換用連接埠21,22抵接,及該永久磁鐵30係配置於筒狀構件28之外周緣上。筒狀構件28係由下構件28a及上構件28b構成。下構件28a係被構成為上側區域的外徑較下側區域之外徑小的具有台階之截面形狀,且在永久磁鐵30被嵌入此小 的外徑之圓筒部分的狀態下與上構件28b接合。此外,於下構件28a的底部安裝有接頭34,接頭34係與連接於沖洗氣體之供給源35的氣體供給用配管36之一端連接。並且,於氣體供給用配管36之途中設置有未圖示的調整閥、開閉閥38及過濾器39,該調整閥係用以調整沖洗氣體的流量,該開閉閥38係藉由控制部37之指令進行沖洗氣體的供給及關斷,及該過濾器39係用以除去沖洗氣體中含有的微小塵埃。再者,為了除去藉由調節閥或開閉閥38之作動而產生的塵埃,較佳為,過濾器39係配置於被配置在氣體供給用的配管36之路徑的各要素中離噴嘴本體23最近之位置。此外,較佳為,氣體供給用之配管36的材質係不鏽鋼等之金屬製、或氟樹脂等的材質,本實施形態之晶圓載入機2具備的氣體供給用配管36係使用氟樹脂製的配管。 The nozzle body 23 included in the nozzle unit 18 of the present embodiment is composed of a tubular member 28, an annular member, that is, a contact member 29, and a permanent magnet 30, and the tubular member 28 is formed with a flow path through which a gas can flow. In addition, the abutting member 29 is disposed at the front end of the tubular member 28 and is in contact with the environmental gas replacement ports 21, 22, and the permanent magnet 30 is disposed outside the cylindrical member 28. On the edge. The tubular member 28 is composed of a lower member 28a and an upper member 28b. The lower member 28a is configured to have a stepped cross-sectional shape in which the outer diameter of the upper side region is smaller than the outer diameter of the lower side region, and the upper member 28b is in a state where the permanent magnet 30 is fitted into the cylindrical portion of the small outer diameter. Engage. Further, a joint 34 is attached to the bottom of the lower member 28a, and the joint 34 is connected to one end of the gas supply pipe 36 connected to the supply source 35 of the flushing gas. Further, in the middle of the gas supply pipe 36, an adjustment valve (not shown), an opening/closing valve 38 for adjusting the flow rate of the flushing gas, and a filter 39 for controlling the flow rate of the flushing valve 38 are provided. The supply and shutdown of the flushing gas are commanded, and the filter 39 is used to remove minute dust contained in the flushing gas. Further, in order to remove dust generated by the operation of the regulating valve or the opening and closing valve 38, it is preferable that the filter 39 is disposed in the respective elements of the path of the gas supply pipe 36, which is closest to the nozzle body 23. The location. In addition, the material of the gas supply pipe 36 is made of a metal such as stainless steel or a fluororesin, and the gas supply pipe 36 included in the wafer loading machine 2 of the present embodiment is made of fluororesin. Piping.
永久磁鐵30係被構成為具有與筒狀構件28的外徑尺寸相同之外徑尺寸的圓筒形狀,且被嵌合配置於下構件28a。再者,於本實施形態之噴嘴本體23中,作為永久磁鐵30係使用具有強力的磁力之釹磁鐵,且以磁化方向成為圖示之上下方向的方式被磁化。再者,較佳為,筒狀構件28係由軟磁性材料形成,本實施形態之筒狀構件28係以鐵形成。抵接構件29係與環境氣體置換用連接埠21,22抵接的構件,且為於中央部分形成有沖洗氣體之流通口的圓環狀之構件。本實施形態之抵接構件29係使用機械強度優異、摩擦阻力小且起塵少的PFA(聚四氟乙烯),但也可適宜地變更為其他的構件。此 外,為了提高與環境氣體置換用連接埠21,22的氣密性,也可於抵接構件29之埠抵接面設置O形環或墊圈等之密封構件。 The permanent magnet 30 is configured to have a cylindrical shape having an outer diameter dimension equal to the outer diameter of the tubular member 28, and is fitted and disposed on the lower member 28a. In the nozzle body 23 of the present embodiment, a neodymium magnet having a strong magnetic force is used as the permanent magnet 30, and the magnetization direction is magnetized so as to be in the upward and downward directions. Further, it is preferable that the tubular member 28 is formed of a soft magnetic material, and the tubular member 28 of the present embodiment is formed of iron. The abutting member 29 is a member that abuts against the environmental gas replacement ports 21, 22, and is an annular member in which a flow port of the flushing gas is formed in the center portion. In the contact member 29 of the present embodiment, PFA (polytetrafluoroethylene) having excellent mechanical strength, low frictional resistance, and little dust generation is used, but may be appropriately changed to another member. Further, in order to improve the airtightness of the ports 21, 22 for environmental gas replacement, a sealing member such as an O-ring or a gasket may be provided on the abutting surface of the abutting member 29.
本實施形態之噴嘴驅動部25係由電磁鐵24、收容電磁鐵24之殼體31、配置於此殼體31之下面的底板32、及配置於殼體31上面的上板33構成,該電磁鐵24係與電源部26連接且產生作為使永久磁鐵30升降移動的推力之磁場。本實施形態中使用之電磁鐵24係空心線圈,其中央的空心區域,具有可收容噴嘴本體23的尺寸。此外,電磁鐵24係以完全覆蓋永久磁鐵30所移動之上下方向的可動範圍的方式,以捲繞於捲線軸的狀態配置。 The nozzle driving unit 25 of the present embodiment is composed of an electromagnet 24, a casing 31 accommodating the electromagnet 24, a bottom plate 32 disposed on the lower surface of the casing 31, and an upper plate 33 disposed on the upper surface of the casing 31. The iron 24 is connected to the power supply unit 26 and generates a magnetic field as a thrust for moving the permanent magnet 30 up and down. The electromagnet 24 used in the present embodiment is an air-core coil, and the hollow portion in the center has a size in which the nozzle body 23 can be accommodated. Further, the electromagnet 24 is disposed so as to be wound around the bobbin so as to completely cover the movable range in which the permanent magnet 30 moves in the up-down direction.
電磁鐵24及配置於電磁鐵24之空心區域的噴嘴本體23係收容於圓筒狀之殼體31內。殼體31係藉由具磁性的材料形成,且具有作為使電磁鐵24產生的磁性有效集中之軛鐵的功能。此外,於殼體31之下部安裝有底板32,且於上部安裝有上板33。於底板32之中央部形成有圓形的孔,此孔係供接頭34及配管36插通。於上板33之中央部分形成有圓形的孔,噴嘴本體23通過此孔而相對於環境氣體置換用連接埠21,22進退移動。再者,底板32之孔的直徑係以較噴嘴本體23之直徑小的方式形成,具有作為限制噴嘴本體23之移動範圍的止動器之功能。再者,較佳為,底板32及上板33係藉由具有磁性的構件形成,藉此,不會使電磁鐵24產生的磁性漏出而可有效地集中。 The electromagnet 24 and the nozzle body 23 disposed in the hollow region of the electromagnet 24 are housed in the cylindrical casing 31. The casing 31 is formed of a magnetic material and has a function as a yoke for effectively concentrating the magnetism generated by the electromagnet 24. Further, a bottom plate 32 is attached to the lower portion of the casing 31, and an upper plate 33 is attached to the upper portion. A circular hole is formed in a central portion of the bottom plate 32, and the hole is inserted through the joint 34 and the pipe 36. A circular hole is formed in a central portion of the upper plate 33, and the nozzle body 23 moves forward and backward with respect to the environmental gas replacement ports 21, 22 through the hole. Further, the diameter of the hole of the bottom plate 32 is formed to be smaller than the diameter of the nozzle body 23, and has a function as a stopper for restricting the movement range of the nozzle body 23. Further, it is preferable that the bottom plate 32 and the upper plate 33 are formed of a member having magnetic properties, whereby the magnetic force generated by the electromagnet 24 can be prevented from being effectively concentrated.
於噴嘴本體23與以包圍噴嘴本體23之周圍的方式配置之空心狀的電磁鐵24之間,配置有圓筒狀的限制構件44。限制構件44係限制進退移動之噴嘴本體23的水平方向之位置偏移,且防止噴嘴本體23之側面與電磁鐵24的內壁面的接觸。由於限制構件44係與進行進退移動的噴嘴本體23接觸之構件,因此較佳以低摩擦體成形。再者,本實施形態之噴嘴驅動部25具有的限制構件44係PFA(聚四氟乙烯)製。此外,參照圖7,本實施形態之噴嘴本體23與電磁鐵24、及限制構件44,皆具有大致圓筒狀的形狀,且分別被配置於以共同的中心軸C作為中心之同軸上。 A cylindrical restricting member 44 is disposed between the nozzle body 23 and the hollow electromagnet 24 disposed so as to surround the periphery of the nozzle body 23. The restricting member 44 restricts the positional deviation of the nozzle body 23 in the forward and backward movement in the horizontal direction, and prevents the side surface of the nozzle body 23 from coming into contact with the inner wall surface of the electromagnet 24. Since the restricting member 44 is a member that comes into contact with the nozzle body 23 that moves forward and backward, it is preferably formed with a low friction body. Further, the restricting member 44 of the nozzle driving unit 25 of the present embodiment is made of PFA (polytetrafluoroethylene). Further, referring to Fig. 7, the nozzle body 23, the electromagnet 24, and the regulating member 44 of the present embodiment each have a substantially cylindrical shape, and are disposed coaxially with the common central axis C as a center.
自電源部26供給於噴嘴驅動部25的直流電流的流動方向之切換、及供給之電流的調節,係由控制部37進行。控制部37係安裝於本實施形態之晶圓載入機2,接收自配置於晶圓載入機2的各種感測器或上游的控制裝置傳送的信號,且將信號朝各動力源或上游的控制裝置傳送。控制部37具備記憶動作程式或預先教示的教示資料之記憶裝置、及於動作程式上演算處理接收的信號或資料之運算裝置。藉此,可根據接收的信號,遵循預先記憶的程式控制各驅動部之動作。 The switching of the flow direction of the direct current supplied from the power supply unit 26 to the nozzle drive unit 25 and the adjustment of the supply current are performed by the control unit 37. The control unit 37 is mounted on the wafer loader 2 of the present embodiment, and receives signals transmitted from various sensors or upstream control devices disposed in the wafer loader 2, and directs signals to the respective power sources or upstream. The control device transmits. The control unit 37 includes a memory device that memorizes the operation program or the teaching material that is taught in advance, and an arithmetic device that processes the received signal or data on the operation program. Thereby, the operation of each drive unit can be controlled according to the received signal and following a pre-programmed program.
根據上述構成,使藉由控制部37調節的直流電流朝電磁鐵24通電,於電磁鐵24之中空部分產生與中心軸C平行的磁場。此磁場係構成使噴嘴本體23具備的永久磁鐵30朝圖示的上下之方向即與中心軸C平行的方向進退移動之推力。此外,藉由將通電之直流電流的 流動設為逆向,可使此電磁鐵24之磁場朝向反方向,從而可使噴嘴本體23逆向移動。並且,藉由控制部37調節自電源部26供給之直流電流的值,可調節施加於噴嘴本體23的推力。 According to the above configuration, the direct current adjusted by the control unit 37 is energized to the electromagnet 24, and a magnetic field parallel to the central axis C is generated in the hollow portion of the electromagnet 24. This magnetic field constitutes a thrust force for moving the permanent magnet 30 provided in the nozzle body 23 forward and backward in a direction parallel to the center axis C in the vertical direction of the drawing. Further, by making the flow of the energized direct current reverse, the magnetic field of the electromagnet 24 can be directed in the opposite direction, so that the nozzle body 23 can be moved in the reverse direction. Further, the control unit 37 adjusts the value of the direct current supplied from the power supply unit 26 to adjust the thrust applied to the nozzle body 23.
此外,也可於本實施形態之噴嘴單元18設置賦能構件,該賦能構件係朝使噴嘴本體23相對於FOUP 13前進的方向賦予勢能。藉此,可減少於使噴嘴本體23朝FOUP 13前進時對電磁鐵24通電的直流電流。再者,較佳為,賦能構件係使用螺旋彈簧或板彈簧之彈簧構件。 Further, the nozzle unit 18 of the present embodiment may be provided with an energizing member that imparts potential energy to the direction in which the nozzle body 23 advances with respect to the FOUP 13. Thereby, the direct current which energizes the electromagnet 24 when the nozzle body 23 advances toward the FOUP 13 can be reduced. Further, it is preferable that the energizing member is a spring member of a coil spring or a leaf spring.
接著,對本發明之噴嘴單元18、及具備噴嘴單元18的晶圓載入機2之動作詳細地進行說明。FOUP 13係利用鋪設在工廠內之OHT(Overhead Hist Transfer;懸掛式搬運系統)或以手動,自前步驟被載置於晶圓載入機2之平台14上。此時,參照圖6(a),為了防止上面與FOUP 13接觸,噴嘴單元18之噴嘴本體23係於較以SEMI規格規定的FOUP 13之HDP(Horizontal Datum Plane:水平基準面)靠下方、且與配置在FOUP 13之底面的環境氣體置換用連接埠21,22不接觸之待機位置上待機。當FOUP 13被載置於平台14上時,藉由定位銷41與FOUP 13之定位槽16的作用,FOUP 13被定位載置於平台14上的既定位置。此時,控制部37根據自檢測感測器17傳送的檢測信號,檢測FOUP 13被正常地載置於平台14上的既定位置之情況。 Next, the operation of the nozzle unit 18 of the present invention and the wafer loader 2 including the nozzle unit 18 will be described in detail. The FOUP 13 is placed on the platform 14 of the wafer loader 2 by an OHT (Overhead Hist Transfer) placed in the factory or manually. At this time, referring to FIG. 6(a), in order to prevent the upper surface from coming into contact with the FOUP 13, the nozzle body 23 of the nozzle unit 18 is positioned below the HDP (Horizontal Datum Plane) of the FOUP 13 which is defined by the SEMI standard, and Standby at a standby position that is not in contact with the environmental gas replacement ports 21, 22 disposed on the bottom surface of the FOUP 13. When the FOUP 13 is placed on the platform 14, the FOUP 13 is positioned to be placed at a predetermined position on the platform 14 by the action of the positioning pin 41 and the positioning groove 16 of the FOUP 13. At this time, the control unit 37 detects that the FOUP 13 is normally placed on a predetermined position on the stage 14 based on the detection signal transmitted from the detection sensor 17.
接著,自控制OHT的動作之控制裝置接收到FOUP 13之載置完成信號的控制部37,使卡止鉤15之 驅動源作動,將FOUP 13固定於平台14。於卡止鉤15具備檢測驅動源的動作之未圖示的感測器,若卡止鉤15正常地進行動作,控制部37傳送卡止動作完成的信號。再者,於操作者手動將FOUP 13載置於平台14上之情況下,操作者按下晶圓載入機2具備的啟動開關。此啟動開關的信號係與來自控制裝置的載置完成信號同等的信號,接收到此信號之控制部37,開始卡止鉤15之卡止動作。此外,只要FOUP 13處於被正常地載置於平台14上的狀態,則控制部37可以既定的定時朝噴嘴單元18傳送沖洗開始信號。較佳為,控制部37傳送沖洗開始信號的定時,可遵循預先記憶的控制程式進行、或藉由控制部37接收自上游的控制裝置傳送之沖洗開始信號而進行。 Next, the control unit 37 that receives the completion signal of the FOUP 13 from the control device that controls the operation of the OHT, activates the drive source of the lock hook 15, and fixes the FOUP 13 to the stage 14. The locking hook 15 is provided with a sensor (not shown) for detecting the operation of the driving source. When the locking hook 15 is normally operated, the control unit 37 transmits a signal indicating that the locking operation is completed. Furthermore, when the operator manually places the FOUP 13 on the platform 14, the operator presses the start switch provided in the wafer loader 2. The signal of the start switch is equivalent to the signal from the control device, and the control unit 37 that has received the signal starts the locking operation of the hook 15. Further, as long as the FOUP 13 is in a state of being normally placed on the stage 14, the control portion 37 can transmit a flushing start signal to the nozzle unit 18 at a predetermined timing. Preferably, the timing at which the control unit 37 transmits the flushing start signal is performed in accordance with a pre-memorized control program or by the control unit 37 receiving the flushing start signal transmitted from the upstream control device.
接著,控制部37使晶圓載入機2之各驅動機構動作,將FOUP本體13a與蓋13b分離,且藉由定位感測器42進行把握被收容於FOUP本體13a內的晶圓W之載置狀態的定位動作。藉由進行此定位動作,控制部37接收定位感測器42之檢測信號。藉由將此接收的定位檢測信號與記憶於記憶裝置的資料對照,控制部37可取得晶圓W之對FOUP本體13a的各棚架之載置資訊。然後,控制部37根據此晶圓W的載置資訊,調節對電磁鐵24通電的電流值。 Next, the control unit 37 operates the drive mechanisms of the wafer loader 2 to separate the FOUP main body 13a from the cover 13b, and grasps the wafer W accommodated in the FOUP main body 13a by the positioning sensor 42. Set the positioning action of the state. By performing this positioning operation, the control unit 37 receives the detection signal of the positioning sensor 42. By comparing the received positioning detection signal with the data stored in the memory device, the control unit 37 can acquire the placement information of the wafer W on each scaffold of the FOUP body 13a. Then, the control unit 37 adjusts the current value for energizing the electromagnet 24 based on the placement information of the wafer W.
當藉由晶圓載入機2進行之FOUP 13的開門動作結束後,收容於FOUP 13的晶圓W,被朝處理裝置1移送且實施完既定的處理之後,被自處理裝置1朝 FOUP 13移送。此時,晶圓W不必一定要被返回原來的FOUP 13,有時也可根據接著進行的處理步驟、或對晶圓W實施的表面處理之完成度,移送至與收容的FOUP 13不同的其他FOUP 13。即使於此情況下,由於各晶圓載入機2具備的控制部37,接收來自EFEM 3具有的控制裝置之晶圓W的移送資訊,因此仍可把握自處理裝置1搬送至FOUP 13內的晶圓W之數量、及搬送機器人4將晶圓W載置於哪一個棚架等FOUP 13內的載置資訊。控制部37根據此即時的載置資訊,隨時調節對噴嘴單元18之電磁鐵通電的電流值。 After the opening operation of the FOUP 13 by the wafer loader 2 is completed, the wafer W accommodated in the FOUP 13 is transferred to the processing apparatus 1 and after the predetermined processing is completed, the processing apparatus 1 is directed to the FOUP 13 Transfer. At this time, the wafer W does not have to be returned to the original FOUP 13, and may be transferred to the FOUP 13 different from the contained FOUP 13 according to the subsequent processing steps or the completion degree of the surface treatment performed on the wafer W. FOUP 13. In this case, since the control unit 37 included in each wafer loading machine 2 receives the transfer information of the wafer W from the control device of the EFEM 3, it is possible to grasp that the self-processing device 1 is transported to the FOUP 13 The number of wafers W and the placement information in the FOUP 13 such as which scaffolding the transfer robot 4 places on the scaffold. The control unit 37 adjusts the current value for energizing the electromagnet of the nozzle unit 18 at any time based on the instantaneous placement information.
於上述一系列的步驟中,控制部37係遵循預先記憶的程式且以既定的定時使噴嘴單元18作動而進行沖洗動作、或藉由接收來自上游的控制裝置之沖洗開始信號,使噴嘴單元18作動而開始沖洗動作。再者,本發明之噴嘴單元18開始沖洗動作的時機,並無特別限制。只要有需要,也可於藉由卡止鉤15將FOUP 13固定在平台14上之前開始沖洗動作。於此情況下,控制部37也可把握FOUP 13之總重量,因此可以最適的推力推頂噴嘴本體23。此外,較佳為,噴嘴本體23在沖洗開始前一直在待機位置待機。這是因為若於載置有FOUP 13的時刻使噴嘴本體23接觸於FOUP 13的底面,則會因藉由此後的各驅動機構之動作而產生的微振動,致使噴嘴單元18之抵接構件29與FOUP 13的底面相互摩擦而產生微小之間隙,以致不能維持充分的氣密性。 In the series of steps described above, the control unit 37 causes the nozzle unit 18 to follow the pre-programmed program and to operate the nozzle unit 18 at a predetermined timing to perform the flushing operation or to receive the flushing start signal from the upstream control device. Start the flushing action. Further, the timing at which the nozzle unit 18 of the present invention starts the flushing operation is not particularly limited. The flushing action can also be initiated before the FOUP 13 is secured to the platform 14 by the latching hooks 15 as needed. In this case, the control unit 37 can also grasp the total weight of the FOUP 13, so that the nozzle body 23 can be pushed up with an optimum thrust. Further, it is preferable that the nozzle body 23 stands by at the standby position until the flushing starts. This is because when the nozzle body 23 is brought into contact with the bottom surface of the FOUP 13 at the time when the FOUP 13 is placed, the abutment member 29 of the nozzle unit 18 is caused by the microvibration generated by the operation of the subsequent drive mechanisms. Friction with the bottom surface of the FOUP 13 creates a slight gap so that sufficient airtightness cannot be maintained.
接著,對本發明之一實施形態的噴嘴單元18之沖洗順序進行說明。自控制裝置接收到沖洗開始信號的控制部37,首先使本身具備的電子迴路作動,對噴嘴驅動部25進行既定的直流電流之通電。藉此,於電磁鐵24之空心部分產生使噴嘴單元18朝FOUP 13的環境氣體置換用連接埠21,22前進移動的磁場。藉此,噴嘴本體23之抵接構件29抵接於環境氣體置換用連接埠21,22。 Next, the rinsing procedure of the nozzle unit 18 according to an embodiment of the present invention will be described. The control unit 37 that has received the flush start signal from the control device first activates the electronic circuit provided by itself, and energizes the nozzle drive unit 25 with a predetermined DC current. Thereby, a magnetic field that moves the nozzle unit 18 toward the environmental gas replacement ports 21, 22 of the FOUP 13 is generated in the hollow portion of the electromagnet 24. Thereby, the contact member 29 of the nozzle body 23 abuts against the environmental gas replacement ports 21, 22.
當噴嘴本體23抵接於環境氣體置換用連接埠21,22後,控制部37使開閉閥38作動,經由注入用噴嘴單元18a將貯存於供給源35的沖洗氣體供給於FOUP 13內部。再者,作為沖洗氣體,較佳可使用氮氣或氬氣等惰性氣體、或被除濕的清潔空氣即CDA(Clean Dry Air)。此外,沖洗氣體的供給量,可藉由設置於配管36上的未圖示之流量調節閥來調節。較佳為,沖洗氣體的供給量係被設定為不會自抵接構件29與各環境氣體置換用連接埠21,22的接觸面之間漏出沖洗氣體的流量。 When the nozzle body 23 abuts against the environmental gas replacement ports 21 and 22, the control unit 37 activates the opening and closing valve 38, and supplies the flushing gas stored in the supply source 35 to the inside of the FOUP 13 via the injection nozzle unit 18a. Further, as the flushing gas, an inert gas such as nitrogen or argon or CDA (Clean Dry Air) which is dehumidified clean air is preferably used. Further, the supply amount of the flushing gas can be adjusted by a flow regulating valve (not shown) provided on the pipe 36. Preferably, the supply amount of the flushing gas is set so as not to leak the flow rate of the flushing gas between the contact faces of the abutting members 29 and the respective environmental gas replacement ports 21, 22.
為了盡可能地增大沖洗氣體的流量,需要預先把握將噴嘴本體23按壓於環境氣體置換用連接埠21,22的推力。此外,為了對噴嘴本體23施加適當的推力,需要預先把握收容於FOUP 13內部的晶圓W的片數。這是因為若未把握FOUP 13的重量而將強大的推力施加於噴嘴本體23,則有可能因噴嘴本體23之上升移動而造成FOUP 13傾斜,進而變成故障而使得裝置整體暫時停止。構成本發明的噴嘴單元18之控制部37,可 根據來自上游的控制裝置及定位感測器之信號,適時地把握收容於FOUP 13內部之晶圓W的數量。並且,控制部37藉由調節供給於電磁鐵24的電流值,可調節作為噴嘴單元18之推力的磁場之強度。藉此,控制部37可將根據FOUP 13之重量的適當推力施加於噴嘴本體23。並且,藉由以可根據來自控制部37的信號對調節沖洗氣體的流量之未圖示的流量調節閥進行調節之方式構成,可根據噴嘴驅動部25驅動噴嘴本體23之推力的變化,將適當的氣體量供給於FOUP 13內部。 In order to increase the flow rate of the flushing gas as much as possible, it is necessary to grasp the thrust of pressing the nozzle body 23 against the environmental gas replacement ports 21, 22. Further, in order to apply an appropriate thrust to the nozzle body 23, it is necessary to grasp the number of wafers W accommodated inside the FOUP 13 in advance. This is because if a strong thrust is applied to the nozzle body 23 without grasping the weight of the FOUP 13, the FOUP 13 may be tilted due to the upward movement of the nozzle body 23, and the failure may cause the entire apparatus to be temporarily stopped. The control unit 37 constituting the nozzle unit 18 of the present invention can timely grasp the number of wafers W accommodated inside the FOUP 13 based on signals from the upstream control device and the positioning sensor. Further, the control unit 37 can adjust the intensity of the magnetic field which is the thrust of the nozzle unit 18 by adjusting the current value supplied to the electromagnet 24. Thereby, the control unit 37 can apply an appropriate thrust according to the weight of the FOUP 13 to the nozzle body 23. Further, the flow rate adjusting valve (not shown) that adjusts the flow rate of the flushing gas according to the signal from the control unit 37 is configured, and the nozzle driving unit 25 can drive the change in the thrust of the nozzle body 23 to be appropriate. The amount of gas is supplied to the inside of the FOUP 13.
沖洗動作之結束順序,係藉由上游的控制裝置將沖洗停止信號傳送至控制部37而被開始。接收到沖洗停止信號之控制部37,使開閉閥38作動,停止來自供給源35的沖洗氣體之供給。接著,控制部37使本身具備的電性迴路作動,將供給於電磁鐵24的電流關斷。然後,朝電磁鐵24供給與迄此為止供給的電流逆向流動之電流。藉此,於電磁鐵24之空心部分產生使噴嘴本體23自FOUP 13分離的方向之磁場,噴嘴本體23藉由此磁場後退移動至待機位置。暫時後退至待機位置之噴嘴本體23,仍維持靜止於待機位置之狀態不變,因此控制部37停止朝電磁鐵24之電流的供給。藉由以上說明,完成沖洗結束動作。 The end sequence of the flushing operation is started by the upstream control device transmitting the flushing stop signal to the control unit 37. The control unit 37 that has received the flushing stop signal operates the opening and closing valve 38 to stop the supply of the flushing gas from the supply source 35. Next, the control unit 37 activates the electric circuit provided in itself, and turns off the current supplied to the electromagnet 24. Then, a current that flows in the opposite direction to the current supplied so far is supplied to the electromagnet 24. Thereby, a magnetic field in a direction in which the nozzle body 23 is separated from the FOUP 13 is generated in the hollow portion of the electromagnet 24, and the nozzle body 23 is moved back to the standby position by the magnetic field. Since the nozzle body 23 temporarily retracted to the standby position remains in the state of being in the standby position, the control unit 37 stops the supply of the current to the electromagnet 24. With the above description, the flushing end operation is completed.
再者,被供給於本發明之噴嘴單元18具備的電磁鐵24的電流之方向、及噴嘴本體23具備之永久磁鐵30的磁極的方向、電磁鐵24之捲線方向,可適宜地調整。並且,捲繞於捲線軸上的導線的卷數,係根據預 估之將噴嘴本體23按壓於各埠21,22之電磁鐵24的推力而決定。此外,將噴嘴本體23按壓於各埠21,22的推力的大小,係根據FOUP 13本身的重量、或收容於FOUP 13內部之晶圓W的片數而被適宜設定。 In addition, the direction of the current supplied to the electromagnet 24 provided in the nozzle unit 18 of the present invention, the direction of the magnetic pole of the permanent magnet 30 included in the nozzle body 23, and the winding direction of the electromagnet 24 can be appropriately adjusted. Further, the number of windings of the wire wound around the bobbin is determined based on the estimated thrust of the electromagnet 24 that presses the nozzle body 23 against each of the turns 21, 22. Further, the magnitude of the thrust of pressing the nozzle body 23 to each of the weirs 21, 22 is appropriately set depending on the weight of the FOUP 13 itself or the number of wafers W accommodated in the inside of the FOUP 13.
接著,參照圖8,對控制部37不能取得來自上游的控制裝置之晶圓W的搬送資訊或來自定位感測器42的定位資訊,朝噴嘴驅動部25供給適當的電流之方法進行說明。此方法係一種不是在被連接於EFEM 3的晶圓載入機2上,而是於例如不具備FOUP 13之蓋體13b且被單獨設置的環境氣體置換裝置中有效的方法。圖8(a)為顯示FOUP 13正常地載置在平台14上的狀態之概略圖。配置於平台14上的檢測感測器17a,17b,17c,藉由FOUP 13之底面被壓下後,控制部37檢測檢測導通信號。在此,控制部37對噴嘴驅動部25供給既定的電流而使噴嘴本體23上升移動。此時,在供給於噴嘴驅動部25的電流值較推頂FOUP 13之力弱的情況下,檢測感測器17c維持藉由FOUP 13之底面而被壓下之狀態不變,檢測感測器17c依然持續地朝控制部37傳送導通信號。 Next, a method in which the control unit 37 cannot acquire the conveyance information of the wafer W from the upstream control device or the positioning information from the positioning sensor 42 and supply an appropriate current to the nozzle drive unit 25 will be described with reference to FIG. This method is a method that is not effective on the wafer loader 2 that is connected to the EFEM 3, but is, for example, an environmental gas replacement device that is provided separately from the cover 13b of the FOUP 13. Fig. 8(a) is a schematic view showing a state in which the FOUP 13 is normally placed on the stage 14. The detection sensors 17a, 17b, 17c disposed on the stage 14 are pressed by the bottom surface of the FOUP 13, and the control unit 37 detects the detection of the on-signal. Here, the control unit 37 supplies a predetermined current to the nozzle driving unit 25 to cause the nozzle body 23 to move upward. At this time, when the current value supplied to the nozzle driving unit 25 is weaker than the force of the top FOUP 13, the detecting sensor 17c is maintained in a state of being pressed by the bottom surface of the FOUP 13, and the detecting sensor is detected. The 17c continues to transmit the conduction signal to the control unit 37.
因此,控制部37將更大的電流源供給於噴嘴驅動部25。在此,參照圖8(b),若FOUP 13藉由噴嘴本體23而被推頂底部,則FOUP 13以定位銷41a,41b之前端部分作為支點,朝配置有蓋體13b的一側傾斜。此時,FOUP 13之底部,成為自配置於在後方指示FOUP 13的定位銷41c之附近的檢測感測器17c分離之狀態。控制部37藉由接收檢測感測器41a,41b的導通信號,且接收 檢測感測器41c的截止信號,識別FOUP 13之後方已浮起。在此,控制部37將在FOUP 13剛浮起前供給的電流值確定為是可供給於噴嘴驅動部25的適當電流值。然後,參照圖8(c),再一次將此適當的電流供給於噴嘴驅動部25而使噴嘴本體23抵接於環境氣體置換用連接埠21,22之後,將沖洗氣體供給於FOUP 13之內部。上述說明的動作,藉由使根據檢測信號41a,41b的檢測狀態調節供給於電磁鐵24之電流值的程式預先記憶於控制部37而變為可能。 Therefore, the control unit 37 supplies a larger current source to the nozzle driving unit 25. Here, referring to Fig. 8(b), when the FOUP 13 is pushed up by the nozzle body 23, the FOUP 13 is inclined toward the side where the lid body 13b is disposed with the front end portions of the positioning pins 41a, 41b as fulcrums. At this time, the bottom of the FOUP 13 is in a state of being separated from the detection sensor 17c disposed in the vicinity of the positioning pin 41c of the FOUP 13 at the rear. The control unit 37 receives the ON signal of the detection sensors 41a, 41b and receives the OFF signal of the detection sensor 41c, and recognizes that the FOUP 13 has floated. Here, the control unit 37 determines the current value supplied immediately before the FOUP 13 is floated to be an appropriate current value that can be supplied to the nozzle driving unit 25. Then, referring to FIG. 8(c), the appropriate current is supplied to the nozzle driving unit 25 again, and the nozzle body 23 is brought into contact with the environmental gas replacement ports 21 and 22, and then the flushing gas is supplied to the inside of the FOUP 13. . The above-described operation is made possible by preliminarily storing the current value supplied to the electromagnet 24 based on the detection state of the detection signals 41a and 41b in the control unit 37.
於本發明之第一實施形態的噴嘴單元18中,其被構成為於形成在電磁鐵24之中央部分的內部區域配置噴嘴本體23,且藉由使電磁鐵24流通正向或反向的電流,而使電磁鐵24之內部空間產生既定的磁場,藉由此磁場的推力,使噴嘴本體23與噴嘴本體23具備的永久磁鐵30一同進退移動。其次,對在噴嘴本體48之下方設置電磁鐵49,且利用在永久磁鐵52與電磁鐵49之間產生的排斥力、及吸附力的實施形態進行說明。於本發明之第二實施形態中,其係設定為將永久磁鐵52固定於噴嘴本體48之下部,且於永久磁鐵52的下方配置電磁鐵49的構成。電磁鐵49係於中心部配置有鐵心46的鐵心電磁鐵,且被構成為藉由朝電磁鐵49供給正向或反向的電流,切換鐵心46之磁極而使噴嘴本體48進退移動。本實施形態中,藉由設定為不在噴嘴本體48之外側的周面而是於下方設置電磁鐵49的構成,可減小噴嘴單元19之橫向尺寸,從而可有效地利用有限的平台14內的面積。 In the nozzle unit 18 according to the first embodiment of the present invention, the nozzle body 23 is disposed in an inner region formed in a central portion of the electromagnet 24, and the electromagnet 24 is caused to flow in a forward or reverse current. The internal space of the electromagnet 24 generates a predetermined magnetic field, and the nozzle body 23 moves forward and backward together with the permanent magnet 30 of the nozzle body 23 by the thrust of the magnetic field. Next, an embodiment in which the electromagnet 49 is provided below the nozzle body 48 and the repulsive force and the adsorption force generated between the permanent magnet 52 and the electromagnet 49 are used will be described. In the second embodiment of the present invention, the permanent magnet 52 is fixed to the lower portion of the nozzle body 48, and the electromagnet 49 is disposed below the permanent magnet 52. The electromagnet 49 is a core electromagnet in which the core 46 is disposed at the center, and is configured to supply a forward or reverse current to the electromagnet 49, and to switch the magnetic pole of the core 46 to move the nozzle body 48 forward and backward. In the present embodiment, by providing the configuration in which the electromagnet 49 is not disposed on the outer surface of the nozzle body 48 but below, the lateral dimension of the nozzle unit 19 can be reduced, and the limited use of the platform 14 can be utilized effectively. area.
圖9為顯示本實施形態之噴嘴單元19的剖視圖,圖中對與第一實施形態共同的構件,賦予相同的符號。噴嘴單元19具備的噴嘴本體48係形成為圓柱狀的構件,且於中央部分形成有可供沖洗氣體流通的流路51。流路51係於噴嘴本體48之中心部附近朝圖示之上方朝下方穿設而成。惟,流路51並不在上下方向貫通噴嘴本體48,而是於途中朝向側壁改變方向穿設而成。於流路51之基端部安裝有接頭34,此接頭34係與被連接於沖洗氣體的供給源35之氣體供給用配管36的一端連接。再者,自接頭34至沖洗氣體之供給源35的構成係與第一實施形態相同,故而在此省略說明。 Fig. 9 is a cross-sectional view showing the nozzle unit 19 of the embodiment, and the same members as those of the first embodiment are denoted by the same reference numerals. The nozzle body 48 provided in the nozzle unit 19 is formed into a columnar member, and a flow path 51 through which a flushing gas flows is formed in a central portion. The flow path 51 is formed to be laid downward toward the lower side in the vicinity of the center of the nozzle body 48. However, the flow path 51 does not penetrate the nozzle body 48 in the vertical direction, but is formed to be displaced toward the side wall in the middle. A joint 34 is attached to the base end of the flow path 51, and the joint 34 is connected to one end of the gas supply pipe 36 connected to the supply source 35 of the flushing gas. The configuration of the supply source 35 from the joint 34 to the flushing gas is the same as that of the first embodiment, and thus the description thereof will be omitted.
噴嘴本體48,於底面固定有圓盤狀之永久磁鐵52,且可進退自如地配置於被固定在平台14的大致圓筒形狀的殼體53內。較佳為,殼體53係非磁性體且摩擦阻力小的樹脂製。於噴嘴本體48之下方,將經由捲線軸被捲繞於鐵心46的電磁鐵49固定於殼體53。此外,電磁鐵49及鐵心46之周圍係由屏蔽外殼47圍繞。屏蔽外殼47係鐵鎳合金製的箱狀構件,且是為了使電磁鐵49產生的磁場噪音不會對電子零件產生不良影響而設置。再者,屏蔽外殼47除了鐵鎳製合金外,也可設為導磁率較高的鐵等之金屬製。此外,與第一的實施形態同樣,電磁鐵49經由控制部37而與電源部26連接。 The nozzle body 48 has a disk-shaped permanent magnet 52 fixed to the bottom surface thereof, and is detachably disposed in a substantially cylindrical casing 53 fixed to the stage 14. Preferably, the casing 53 is made of a non-magnetic material and has a small frictional resistance. Below the nozzle body 48, an electromagnet 49 wound around the core 46 via a bobbin is fixed to the casing 53. Further, the periphery of the electromagnet 49 and the core 46 is surrounded by the shield case 47. The shield case 47 is a box-shaped member made of an iron-nickel alloy, and is provided in order to prevent the magnetic field noise generated by the electromagnet 49 from adversely affecting the electronic component. Further, the shield case 47 may be made of a metal such as iron having a high magnetic permeability, in addition to an alloy made of iron or nickel. Further, similarly to the first embodiment, the electromagnet 49 is connected to the power supply unit 26 via the control unit 37.
藉由上述構成,以鐵心46之與永久磁鐵52對向的面之磁極、與永久磁鐵52之與鐵心46對向的面之磁極成為同極的方式,朝電磁鐵49供給既定的直流電 流,以使鐵心46與永久磁鐵52彼此的磁場變成排斥。此排斥力即成為使噴嘴本體48具備的永久磁鐵52朝圖示之上方向移動的推力。此外,藉由將自電源部26供給於電磁鐵49的直流電流之流動方向設為逆向,電磁鐵49與鐵心46相互磁性吸引,於是此磁性吸附力成為使噴嘴本體48朝圖示之下方向移動的推力。並且,與第一實施形態同樣,可於本實施形態之噴嘴單元19的噴嘴本體48設置賦能構件,該賦能構件係朝相對於FOUP 13而前進的方向賦予勢能。再者,與第一實施形態同樣,切換自電源部26供給於噴嘴驅動部50的直流電流之流動方向、或調節被供給的直流電流值之動作,係藉由控制部37進行。 According to the above configuration, the magnetic pole of the surface of the core 46 facing the permanent magnet 52 and the magnetic pole of the surface of the permanent magnet 52 opposed to the core 46 are of the same polarity, and a predetermined direct current is supplied to the electromagnet 49. The magnetic field between the core 46 and the permanent magnet 52 is made to repel. This repulsive force is a thrust force that moves the permanent magnet 52 provided in the nozzle body 48 in the upward direction of the drawing. Further, the flow direction of the direct current supplied from the power supply unit 26 to the electromagnet 49 is reversed, and the electromagnet 49 and the core 46 are magnetically attracted to each other, so that the magnetic attraction force causes the nozzle body 48 to face downward. The thrust of the move. Further, similarly to the first embodiment, the energizing member can be provided in the nozzle body 48 of the nozzle unit 19 of the present embodiment, and the energizing member imparts potential energy in a direction in which the FOUP 13 advances. Further, similarly to the first embodiment, the operation of switching the direct current flow supplied from the power supply unit 26 to the nozzle drive unit 50 or adjusting the supplied direct current value is performed by the control unit 37.
其次,於上述第一實施形態及第二實施形態中,各永久磁鐵30,52係被設置於噴嘴本體23,48,但也可於平台14上分離配置噴嘴本體23,48與永久磁鐵30,52。 Next, in the first embodiment and the second embodiment, the permanent magnets 30 and 52 are provided in the nozzle bodies 23 and 48. However, the nozzle bodies 23 and 48 and the permanent magnet 30 may be disposed separately on the stage 14. 52.
圖10為自側面觀察本發明之第三實施形態的噴嘴單元18'之剖視圖,圖11為沿圖10中之B-B線之剖視圖。本實施形態之噴嘴單元18'係於平台14之既定的位置沿水平方向排列固定有噴嘴本體23'及噴嘴驅動部25',此噴嘴驅動部25'的可動部分與噴嘴本體23'係藉由連結構件54所連結。藉由此連結構件54,噴嘴本體23'成為可與噴嘴驅動部25'進行的進退動作連動而進行進退動作的構成。噴嘴本體23'係與第一實施形態相同,由圓筒狀的構件即筒狀構件28'、及圓環狀的構件即抵接 構件29構成,該筒狀構件28'係於中心部分形成有流路27',及該抵接構件29係被配置於筒狀構件28'之前端,且與FOUP 13所配置的環境氣體置換用連接埠21,22抵接。並且,於噴嘴本體23'的周緣部配置有限制噴嘴本體23'之水平方向的移動的限制構件55,限制構件55係被固定於平台14。限制構件55係以摩擦阻力小的氟樹脂形成之圓筒狀構件,此限制構件55之內徑,具有較圓筒形狀的筒狀構件28'之外徑略大的尺寸,噴嘴本體23'係可上下移動自如地被插入此限制構件55之內部空間。 Fig. 10 is a cross-sectional view of the nozzle unit 18' according to the third embodiment of the present invention as seen from the side, and Fig. 11 is a cross-sectional view taken along line B-B of Fig. 10. In the nozzle unit 18' of the present embodiment, the nozzle body 23' and the nozzle driving portion 25' are arranged and fixed in a horizontal direction at a predetermined position of the stage 14, and the movable portion of the nozzle driving portion 25' and the nozzle body 23' are The connecting member 54 is coupled. By the connecting member 54, the nozzle body 23' is configured to be movable forward and backward in conjunction with the forward and backward movement of the nozzle driving unit 25'. The nozzle body 23' is the same as the first embodiment, and is composed of a cylindrical member 28' which is a cylindrical member and a contact member 29 which is an annular member. The cylindrical member 28' is formed in the center portion. The flow path 27' and the abutting member 29 are disposed at the front end of the tubular member 28', and are in contact with the environmental gas replacement ports 21, 22 disposed on the FOUP 13. Further, a restriction member 55 that restricts the movement of the nozzle body 23' in the horizontal direction is disposed on the peripheral portion of the nozzle body 23', and the restriction member 55 is fixed to the stage 14. The restricting member 55 is a cylindrical member formed of a fluororesin having a small frictional resistance, and the inner diameter of the restricting member 55 has a size slightly larger than the outer diameter of the cylindrical tubular member 28', and the nozzle body 23' is The inner space of the restricting member 55 can be inserted up and down freely.
本實施形態之噴嘴驅動部25'係由電磁鐵24'、可收容電磁鐵24'的殼體31'、及配置於此殼體31'的下面之底板32構成,該電磁鐵24'係一空心線圈,且具有可於空心區域收容圓筒狀的永久磁鐵30'的內徑尺寸。電磁鐵24'係在與永久磁鐵30'對向的位置,被捲繞配置於於捲線軸。殼體31'係可收容水平配置的電磁鐵24'之圓筒狀的構件,且由具磁性的構件形成,具有使藉由電磁鐵24'而產生的磁力有效地集中之軛鐵的功能。於殼體31'之下部安裝有底板32'。於底板32'之中央部形成有圓形的孔,於此孔內插通有被固定於圓筒狀之永久磁鐵30'的圓柱狀構件56。 The nozzle driving unit 25' of the present embodiment is composed of an electromagnet 24', a casing 31' accommodating the electromagnet 24', and a bottom plate 32 disposed on the lower surface of the casing 31'. The electromagnet 24' is a The air-core coil has an inner diameter dimension that can accommodate the cylindrical permanent magnet 30' in the hollow region. The electromagnet 24' is wound around the bobbin at a position opposed to the permanent magnet 30'. The casing 31' is a cylindrical member that can accommodate the horizontally disposed electromagnets 24', and is formed of a magnetic member, and has a function of effectively concentrating the yoke by the magnetic force generated by the electromagnet 24'. A bottom plate 32' is mounted below the housing 31'. A circular hole is formed in a central portion of the bottom plate 32', and a cylindrical member 56 fixed to the cylindrical permanent magnet 30' is inserted into the hole.
此外,於圓柱狀的永久磁鐵30'與以圍繞其周圍之方式疊層配置的中空狀之電磁鐵24'之間,配置有圓筒狀的限制構件44'。與第一的實施形態同樣,限制構件44'係限制往返移動的永久磁鐵30'之水平方向的移動,防止永久磁鐵30'之側面與電磁鐵24'的內壁之接觸。由 於限制構件44'係與進行進退移動的噴嘴本體23接觸之構件,因此較佳以低摩擦體成形。於永久磁鐵30'之內側的空間,固接有圓柱狀構件56之一端部。此圓柱狀構件56係以貫通形成於底板32'之圓形的孔的方式配置,且於其另一端部固定有連結構件54之一端。根據上述構成,藉由將自電源部供給的既定的直流電流供給於電磁鐵24',而作為使永久磁鐵30'朝圖示之上下方向移動的推力。此永久磁鐵30'之上下方向的移動,經由圓柱狀構件56及連結構件54被朝噴嘴本體23'傳遞,噴嘴本體23'相對於配置在FOUP 13之底部的環境氣體置換用連接埠21,22而進退移動,該FOUP 13係被載置於平台14上。再者,本實施形態之連結構件54係藉由螺釘被固定於筒狀構件28'及圓柱狀構件56。 Further, a cylindrical restricting member 44' is disposed between the cylindrical permanent magnet 30' and the hollow electromagnet 24' which is laminated so as to surround the periphery thereof. Similarly to the first embodiment, the restricting member 44' restricts the horizontal movement of the reciprocating permanent magnet 30' and prevents the side surface of the permanent magnet 30' from coming into contact with the inner wall of the electromagnet 24'. Since the restricting member 44' is a member that comes into contact with the nozzle body 23 that moves forward and backward, it is preferably formed in a low friction body. One end of the cylindrical member 56 is fixed to a space inside the permanent magnet 30'. The columnar member 56 is disposed so as to penetrate through a circular hole formed in the bottom plate 32', and one end of the coupling member 54 is fixed to the other end portion thereof. According to the above configuration, the predetermined direct current supplied from the power supply unit is supplied to the electromagnet 24' as the thrust force for moving the permanent magnet 30' in the upward and downward directions of the drawing. The movement of the permanent magnet 30' in the vertical direction is transmitted to the nozzle body 23' via the columnar member 56 and the coupling member 54, and the nozzle body 23' is connected to the atmosphere gas replacement port 21, 22 disposed at the bottom of the FOUP 13. While moving forward and backward, the FOUP 13 is placed on the platform 14. Further, the connecting member 54 of the present embodiment is fixed to the tubular member 28' and the cylindrical member 56 by screws.
本實施形態之噴嘴單元18'係將噴嘴驅動部25'及噴嘴本體23分離配置。藉此,可抑制噴嘴單元18'之高度方向的尺寸,並且,由於不需要在噴嘴本體23設置永久磁鐵30',因此還可產生藉由噴嘴本體23之構造變得簡單以提高保養性之功效。 The nozzle unit 18' of this embodiment separates the nozzle driving unit 25' and the nozzle body 23. Thereby, the size of the nozzle unit 18' in the height direction can be suppressed, and since it is not necessary to provide the permanent magnet 30' in the nozzle body 23, the configuration of the nozzle body 23 can be simplified to improve the maintenance property. .
接著,對同時利用噴嘴驅動部藉由彼此不同的磁極而產生之吸附力及相同磁極產生的排斥力之二個力的第四實施形態進行說明。圖12為自側面觀察本發明之第四實施形態的噴嘴單元18"之剖視圖。本實施形態之噴嘴單元18"係與第三實施形態同樣,於平台14之既定的位置沿水平方向並列配置有噴嘴本體23"及噴嘴驅動部25",並且,此噴嘴驅動部25"之可動部分與噴嘴本體23"係藉由連結構件54所連結。 Next, a fourth embodiment in which two forces of the adsorption force generated by the different magnetic poles of the nozzle driving portion and the repulsive force generated by the same magnetic pole are simultaneously used will be described. 12 is a cross-sectional view of the nozzle unit 18 according to the fourth embodiment of the present invention. The nozzle unit 18 of the present embodiment is arranged in parallel with each other at a predetermined position of the stage 14 in the same manner as in the third embodiment. The nozzle body 23" and the nozzle driving portion 25", and the movable portion of the nozzle driving portion 25" and the nozzle body 23" are coupled by the connecting member 54.
此外,第三實施形態之噴嘴驅動部25'係構成為將殼體31'之上部固定於平台14的形態,但於第四實施形態中,其構成為將殼體31"之下部固定於被安裝在平台14的支架57之形態。再者,將殼體31',31"之上部或下部的哪一者固定於平台14,可根據平台14之內部的構成零件的配置而適宜變更。 Further, the nozzle driving unit 25' of the third embodiment is configured to fix the upper portion of the casing 31' to the platform 14. However, in the fourth embodiment, the lower portion of the casing 31" is fixed to the lower portion. The bracket 57 is attached to the platform 14. Further, which of the upper or lower portions of the casings 31', 31" is fixed to the platform 14 can be appropriately changed according to the arrangement of the components inside the platform 14.
本實施形態之噴嘴本體23"係與第三實施形態相同,由圓筒狀的構件即筒狀構件28'、及圓環狀之構件即抵接構件29構成,該筒狀構件28'係於中心部分形成有流路27',及該抵接構件29係配置於筒狀構件28'之前端且與FOUP 13所配置的環境氣體置換用連接埠21,22抵接。此外,於噴嘴本體23'的周緣部,限制噴嘴本體23'之水平方向的移動的限制構件55係被固定於平台14。限制構件55係以摩擦阻力小的氟樹脂形成之圓筒狀的構件,且此限制構件55之內徑係較圓筒形狀的筒狀構件28'之外徑略大的尺寸,噴嘴本體23'以可滑動自如地插入此限制構件55之內部空間的狀態設置於平台14之點,也為與第三實施形態為相同之構成。 The nozzle body 23" of the present embodiment is the same as the third embodiment, and is composed of a cylindrical member, that is, a cylindrical member 28', and an annular member, that is, a contact member 29, which is attached to the tubular member 28'. A flow path 27' is formed in the center portion, and the contact member 29 is disposed at the front end of the tubular member 28' and is in contact with the environmental gas replacement ports 21, 22 disposed on the FOUP 13. Further, the nozzle body 23 is provided. The peripheral portion of the 'limit portion 55 that restricts the movement of the nozzle body 23' in the horizontal direction is fixed to the stage 14. The restricting member 55 is a cylindrical member formed of a fluororesin having a small frictional resistance, and the restricting member 55 The inner diameter is slightly larger than the outer diameter of the cylindrical tubular member 28', and the nozzle body 23' is slidably inserted into the inner space of the restricting member 55 at the point of the platform 14, also The configuration is the same as that of the third embodiment.
本實施形態之噴嘴驅動部25"係由2個電磁鐵59,60、可收容2個電磁鐵59,60的殼體31'、配置於此殼體31'的下面之底板32"、及配置於殼體31'之上面的上板61構成,該2個電磁鐵59,60係空心線圈且具有可於空心區域收容圓筒狀的永久磁鐵58之內徑尺寸。本實施形態之電磁鐵59,60係在與永久磁鐵58之移動範圍對向的位置,被捲繞配置在捲線軸。此外,電磁鐵59,60 係於上下方向隔開既定之間隔而配置,且於此2個電磁鐵59,60之間配置有樹脂製的間隔件45。再者,殼體31'係與第三的實施形態同樣,可收容以水平之姿勢配置的電磁鐵59,60之圓筒狀的構件,且藉由具磁性的構件形成,具有使藉由電磁鐵59,60而產生的磁力有效地集中之軛鐵的功能。 The nozzle driving unit 25 of the present embodiment is composed of two electromagnets 59 and 60, a casing 31' accommodating the two electromagnets 59 and 60, and a bottom plate 32" disposed on the lower surface of the casing 31'. The upper plate 61 on the upper surface of the casing 31' is configured such that the two electromagnets 59 and 60 are hollow coils and have an inner diameter which can accommodate the cylindrical permanent magnet 58 in the hollow region. The electromagnets 59, 60 of the present embodiment are wound around the winding shaft at a position opposed to the moving range of the permanent magnets 58. Further, the electromagnets 59, 60 are arranged at a predetermined interval in the vertical direction, and a resin spacer 45 is disposed between the two electromagnets 59, 60. Further, the casing 31' is similar to the third embodiment, and can accommodate a cylindrical member of the electromagnets 59, 60 arranged in a horizontal position, and is formed of a magnetic member to be electromagnetically The magnetic force generated by the irons 59, 60 effectively concentrates the function of the yoke.
於殼體31'之下部安裝有底板32",且於上部安裝有上板61。底板32"係板狀的構件,殼體31'的下面,藉由此底板32"閉塞。此外,於上板61之中央部形成有圓形的孔,於此孔內插通有被固定於圓筒狀之永久磁鐵58的圓柱狀構件56'。 A bottom plate 32" is attached to the lower portion of the casing 31', and an upper plate 61 is attached to the upper portion. The bottom plate 32" is a plate-like member, and the lower surface of the casing 31' is closed by the bottom plate 32. A circular hole is formed in a central portion of the plate 61, and a cylindrical member 56' fixed to the cylindrical permanent magnet 58 is inserted into the hole.
本實施形態之永久磁鐵58係被形成為圓柱狀,且被配置於在上下方向隔開間隙而配置的中空形狀之電磁鐵59,60的空心區域。再者,永久磁鐵58係以磁場的方向成為圖示之上下方向的方式被磁化處理。並且,於永久磁鐵58之上面及下面設置有軛鐵62,63,這些軛鐵62,63係用以使永久磁鐵58之各磁極具有的吸附力集中。本實施形態具有的軛鐵62,63係軟鐵製的圓盤狀構件,且具有與永久磁鐵58相同的外徑尺寸。此外,永久磁鐵58及軛鐵62,63係配置在以中心軸C作為中心的同軸上。並且,於永久磁鐵58及軛鐵62,63之中心部形成有同軸狀的孔,永久磁鐵58及軛鐵62,63,藉由貫通此孔設置的螺絲64而被固定於圓柱狀構件56'。藉此,永久磁鐵58、軛鐵62,63及圓柱狀構件56',藉由電磁鐵59,60產生的磁場,而作為移動子65一體地移動。 The permanent magnets 58 of the present embodiment are formed in a columnar shape, and are disposed in a hollow region of the hollow electromagnets 59, 60 which are disposed with a gap in the vertical direction. Further, the permanent magnet 58 is magnetized so that the direction of the magnetic field becomes the upper and lower directions in the drawing. Further, yokes 62, 63 are provided on the upper surface and the lower surface of the permanent magnet 58, and these yokes 62, 63 are used to concentrate the adsorption force of the magnetic poles of the permanent magnet 58. The yokes 62 and 63 of the present embodiment are disc-shaped members made of soft iron and have the same outer diameter as the permanent magnets 58. Further, the permanent magnet 58 and the yokes 62, 63 are disposed coaxially with the central axis C as a center. Further, a coaxial hole is formed in a central portion of the permanent magnet 58 and the yokes 62, 63, and the permanent magnet 58 and the yokes 62, 63 are fixed to the cylindrical member 56' by a screw 64 provided through the hole. . Thereby, the permanent magnet 58, the yokes 62, 63, and the columnar member 56' are integrally moved as the mover 65 by the magnetic field generated by the electromagnets 59, 60.
於移動子65與中空的電磁鐵59,60之間,與其他的實施形態同樣,配置有以低摩擦體成形的圓筒狀之限制構件44',限制構件44'係限制移動子65之水平方向的移動,防止與電磁鐵59,60之內壁的接觸。藉由此構成,移動子65可藉由電磁鐵59,60產生的磁力,在限制構件44'所限制的空間內朝上下方向移動。此外,藉由此移動子65上下移動,由連結構件54連結的噴嘴本體23",也可進行上下移動。 Between the movable element 65 and the hollow electromagnets 59, 60, as in the other embodiments, a cylindrical restricting member 44' formed by a low friction body is disposed, and the restricting member 44' restricts the level of the moving member 65. The movement of the direction prevents contact with the inner walls of the electromagnets 59, 60. With this configuration, the movable member 65 can be moved in the vertical direction by the magnetic force generated by the electromagnets 59, 60 in the space restricted by the regulating member 44'. Further, the nozzle body 23" coupled by the connecting member 54 can be moved up and down by the movement of the moving member 65 up and down.
接著,對藉由本實施形態具備的電磁鐵59,60之作用而進行的永久磁鐵58之上下移動進行說明。圖13為顯示本實施形態之噴嘴驅動部25"具有的電磁鐵59,60與移動子65之位置關係的概略圖。本實施形態之噴嘴驅動部25係為了使移動子65朝既定的方向移動,進行使各電磁鐵59,60之各者個別地產生磁場的控制。圖13(a)為顯示移動子65下降至最下方的待機位置之狀態的圖。此圖中,連結於移動子65的噴嘴本體23",也移動至相對於FOUP 13而最分離的待機位置。再者,本實施形態之移動子65之永久磁鐵58係以圖示之上側成為S極、下側成為N極的方式被磁化,使配置在永久磁鐵58之上側的軛鐵62成為S極,配置在永久磁鐵58之下側的軛鐵63成為N極。 Next, the movement of the permanent magnet 58 by the action of the electromagnets 59 and 60 provided in the present embodiment will be described. Fig. 13 is a schematic view showing the positional relationship between the electromagnets 59, 60 and the mover 65 of the nozzle drive unit 25 of the present embodiment. The nozzle drive unit 25 of the present embodiment moves the mover 65 in a predetermined direction. The control for generating a magnetic field by each of the electromagnets 59, 60 is performed. Fig. 13(a) is a view showing a state in which the mover 65 is lowered to the lowest standby position. In this figure, the mover 65 is connected. The nozzle body 23" also moves to the standby position that is most separated from the FOUP 13. In addition, the permanent magnet 58 of the movable element 65 of the present embodiment is magnetized so that the upper side thereof becomes the S pole and the lower side becomes the N pole, and the yoke 62 disposed on the upper side of the permanent magnet 58 becomes the S pole. The yoke 63 disposed on the lower side of the permanent magnet 58 becomes an N pole.
控制部37係以上側成S極且下側成為N極之方式使自電源部26供給的電流對配置於下方的電磁鐵59進行通電,且以上側成為N極且下側成為S極的方式使自電源部26供給的電流對配置於上方的電磁鐵 60進行通電。當使電流對各電磁鐵59,60進行通電之後,藉由電磁鐵59之上側具有S極的磁性,於是永久磁鐵58之下側與軛鐵63具有之N極的磁性變得相互吸引。此外,藉由電磁鐵60之下側具有S極的磁性,於是永久磁鐵58之上側與軛鐵62具有的S極之磁性,變得相互排斥。藉此,下側之電磁鐵59產生的吸引力、與上側之電磁鐵60產生的排斥力之二個力變成推力,如以箭頭所圖示,移動子65朝下方移動。此外,朝下方移動的移動子65,藉由螺絲64之頭部與底板32"抵接而停止。 The control unit 37 is configured such that the current supplied from the power supply unit 26 is energized to the lower electromagnet 59 so that the upper side becomes the S pole and the lower side becomes the S pole. The current supplied from the power supply unit 26 is energized to the electromagnet 60 disposed above. When the current is applied to each of the electromagnets 59, 60, the magnet of the S pole is provided on the upper side of the electromagnet 59, so that the magnetic properties of the N pole of the lower side of the permanent magnet 58 and the yoke 63 become attracted to each other. Further, the magnetic field of the S pole is provided on the lower side of the electromagnet 60, so that the magnetic properties of the S pole of the upper side of the permanent magnet 58 and the yoke 62 become mutually exclusive. Thereby, the two forces of the attraction force generated by the lower electromagnet 59 and the repulsive force generated by the upper electromagnet 60 become the thrust, and the mover 65 moves downward as indicated by the arrow. Further, the moving member 65 that moves downward is stopped by the head of the screw 64 abutting against the bottom plate 32".
接著,對移動子65之上升動作進行說明。圖13(b)顯示移動子65上升至沖洗位置的狀態。此時,參照圖12(b),連結於移動子65的噴嘴本體23"係上升至與配置在FOUP 13的環境氣體置換用連接埠21,22抵接的位置之狀態。控制部37係以上側成為N極且下側成為S極的方式使自電源部26供給的電流對配置於下方的電磁鐵59進行通電,且以上側成為S極且下側成為N極的方式使自電源部26供給的電流對配置於上方的電磁鐵60進行通電。當使電流對各電磁鐵59,60通電之後,藉由電磁鐵60之下側具有N極的磁性,於是永久磁鐵58之上側與軛鐵62具有之S極的磁性變得相互吸引。 Next, the rising operation of the mover 65 will be described. Fig. 13 (b) shows a state in which the mover 65 is raised to the flush position. At this time, referring to FIG. 12(b), the nozzle body 23 connected to the movable member 65 is raised to a position in contact with the environmental gas replacement ports 21, 22 disposed in the FOUP 13, and the control unit 37 is or more. The current supplied from the power supply unit 26 is energized to the lower electromagnet 59 while the upper side is the N pole and the lower side is the S pole. The upper side is the S pole and the lower side is the N pole. The supplied current energizes the electromagnet 60 disposed above. When the current is applied to each of the electromagnets 59, 60, the magnetic field of the N pole is provided on the lower side of the electromagnet 60, so that the upper side of the permanent magnet 58 and the yoke The magnetism of the S pole having 62 becomes attractive to each other.
此外,藉由電磁鐵59之上側也具有N極的磁性,永久磁鐵58之下側與軛鐵63具有的N極之磁性相互變成排斥。藉此,下側之電磁鐵59產生的排斥力、與上側之電磁鐵60產生的吸引力之二個力變成推力,如箭頭所圖示,移動子65朝上方移動。此外,藉由移動子 65之移動,經由連結構件54而被連接於移動子65的噴嘴本體23",也朝上方移動。朝下方移動的移動子65及噴嘴本體23",藉由噴嘴本體"之抵接構件29與配置在FOUP 13底面的環境氣體置換用連接埠21,22抵接而停止。然後,控制部37使開閉閥38作動,自供給源35朝FOUP 13內部供給沖洗氣體。此時,控制部37持續地朝電磁鐵59,60供給電流,噴嘴本體23"係被朝環境氣體置換用連接埠21,22賦予勢能的狀態。再者,即使假設以未載置有FOUP 13的狀態使移動子65及噴嘴本體23"朝上方移動,藉由電磁鐵60之上方產生的S極的磁力及S極的磁力在永久磁鐵58上面進行排斥的作用,仍不會有永久磁鐵58朝較配置有電磁鐵60的位置上方凸出之情形。 Further, the upper side of the electromagnet 59 also has magnetic properties of the N pole, and the magnetic properties of the N pole of the lower side of the permanent magnet 58 and the yoke 63 become mutually repulsive. Thereby, the two forces of the repulsive force generated by the lower electromagnet 59 and the attractive force generated by the upper electromagnet 60 become the thrust, and the mover 65 moves upward as indicated by the arrow. Further, the nozzle body 23" connected to the moving member 65 via the connecting member 54 is moved upward by the movement of the moving member 65. The moving member 65 and the nozzle body 23" which move downward are provided by the nozzle body" The abutting member 29 is stopped by the environmental gas replacement ports 21, 22 disposed on the bottom surface of the FOUP 13, and the control unit 37 activates the opening and closing valve 38 to supply the flushing gas from the supply source 35 to the inside of the FOUP 13. At this time, the control unit 37 continuously supplies current to the electromagnets 59 and 60, and the nozzle body 23 is in a state in which potential energy is applied to the environmental gas replacement ports 21 and 22. Further, even if the moving member 65 and the nozzle body 23 are moved upward in a state in which the FOUP 13 is not placed, the magnetic force of the S pole generated above the electromagnet 60 and the magnetic force of the S pole are above the permanent magnet 58. The repulsion does not cause the permanent magnet 58 to protrude above the position where the electromagnet 60 is disposed.
順便一提,樹脂製的FOUP 13,因塵埃或在處理步驟中使用的雜質會滯留於內部,因而被定期地以溫水清洗之後而再利用。藉由重複地進行此溫水清洗,FOUP 13慢慢地變形,平台14之相對於環境氣體置換埠21,22的位置也有可能逐漸地傾斜。若環境氣體置換埠21,22發生傾斜,則會在與抵接構件29之間形成間隙,進而產生沖洗氣體可能自此間隙漏出的故障。因此,於本發明之各實施形態中,可設置賦能構件,利用賦能構件朝使噴嘴本體23,23',23"相對於FOUP 13而前進的方向賦予勢能。藉由設置賦能構件,即使於配置在FOUP 13的環境氣體置換埠21,22相對於抵接構件29而略微傾斜之情況下,抵接構件29與環境氣體置換埠21,22,仍可 氣密性地抵接。再者,較佳為,賦能構件係使用線圈彈簧或板彈簧彈等彈簧構件。具備此賦能構件之情況,也可應用於前述的任一實施形態。 Incidentally, the FOUP 13 made of resin is retained in the interior due to dust or impurities used in the treatment step, and is periodically reused after washing with warm water. By repeatedly performing this warm water washing, the FOUP 13 is slowly deformed, and the position of the platform 14 with respect to the environmental gas replacement ports 21, 22 is also likely to be gradually inclined. When the ambient gas displacement ports 21, 22 are inclined, a gap is formed between the ambient gas replacement ports 21 and the abutting member 29, thereby causing a malfunction that the flushing gas may leak from the gap. Therefore, in each of the embodiments of the present invention, an energizing member may be provided, and the energizing member may apply a potential energy to a direction in which the nozzle bodies 23, 23', 23" advance with respect to the FOUP 13. By providing an energizing member, Even when the ambient gas replacement ports 21, 22 disposed in the FOUP 13 are slightly inclined with respect to the abutting member 29, the abutting member 29 and the ambient gas replacement ports 21, 22 can be airtightly abutted. Preferably, the energizing member is a spring member such as a coil spring or a leaf spring. If the energizing member is provided, it can be applied to any of the above embodiments.
以上,對將本發明的噴嘴單元裝設於晶圓載入機2的實施形態進行了說明,但本發明不限於被裝設在晶圓載入機2者。例如,也可裝設於維持將晶圓W收容於FOUP 13內之狀態不變下而保管的自動倉儲(stocker)的各FOUP載置台,並且,也可安裝於不具備FOUP 13之開閉機構,且專用於進行FOUP 13之內部的環境氣體置換的被稱為沖洗機構之裝置。此外,於本實施形態中以FOUP 13作為對象進行了說明,但不限於如FOUP 13那樣在底面具備環境氣體置換用連接埠21,22的容器,例如,也可應用於在容器的側面或上面具備用以環境氣體置換的埠之容器。本發明只要是對收容被收容物的可密閉之收容容器之內部環境氣體進行置換的用途,即可應用於任何之容器。 Although the embodiment in which the nozzle unit of the present invention is mounted on the wafer loader 2 has been described above, the present invention is not limited to being mounted on the wafer loader 2. For example, it may be mounted on each FOUP mounting table that maintains an automatic stocker that is stored in a state in which the wafer W is stored in the FOUP 13, and may be attached to an opening/closing mechanism that does not have the FOUP 13. And a device called a flushing mechanism dedicated to the replacement of the ambient gas inside the FOUP 13. In the present embodiment, the FOUP 13 has been described as an object. However, the container is not limited to the FOUP 13 and includes the environmental gas replacement ports 21 and 22 on the bottom surface. For example, the container may be applied to the side or the top of the container. A container for crucibles that are replaced with ambient gases. The present invention can be applied to any container as long as it is used for replacing the internal environment gas of the storable storage container in which the object is stored.
Claims (13)
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| CN110983676A (en) * | 2019-12-23 | 2020-04-10 | 湖州金牛纺织印染实业有限公司 | Printing and dyeing spraying device with fixed-point spraying and calibrating functions |
| CN114378047A (en) * | 2020-10-22 | 2022-04-22 | 南亚科技股份有限公司 | Gas purging device and gas purging method |
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| JP2011187539A (en) * | 2010-03-05 | 2011-09-22 | Sinfonia Technology Co Ltd | Gas charging apparatus, gas discharging apparatus, gas charging method, and gas discharging method |
| US10196845B2 (en) * | 2015-05-22 | 2019-02-05 | Applied Materials, Inc. | Substrate carrier door assemblies, substrate carriers, and methods including magnetic door seal |
| CN105298629B (en) * | 2015-12-04 | 2016-08-17 | 湖南大学 | A kind of aerator |
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| CN110983676A (en) * | 2019-12-23 | 2020-04-10 | 湖州金牛纺织印染实业有限公司 | Printing and dyeing spraying device with fixed-point spraying and calibrating functions |
| CN114378047A (en) * | 2020-10-22 | 2022-04-22 | 南亚科技股份有限公司 | Gas purging device and gas purging method |
| CN114378047B (en) * | 2020-10-22 | 2023-12-08 | 南亚科技股份有限公司 | Gas flushing device and gas flushing method |
| US12027399B2 (en) | 2020-10-22 | 2024-07-02 | Nanya Technology Corporation | Gas purge device and gas purging method |
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