TW201907225A - Mask, producing method of the same and mother plate - Google Patents
Mask, producing method of the same and mother plate Download PDFInfo
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- TW201907225A TW201907225A TW107122128A TW107122128A TW201907225A TW 201907225 A TW201907225 A TW 201907225A TW 107122128 A TW107122128 A TW 107122128A TW 107122128 A TW107122128 A TW 107122128A TW 201907225 A TW201907225 A TW 201907225A
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K99/00—Subject matter not provided for in other groups of this subclass
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D1/00—Electroforming
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D1/00—Electroforming
- C25D1/10—Moulds; Masks; Masterforms
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D1/00—Electroforming
- C25D1/20—Separation of the formed objects from the electrodes with no destruction of said electrodes
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Abstract
Description
發明領域 本發明是有關於遮罩、其製造方法以及母板,更詳而言之,有關於一種可於絕緣部之隧道空間進行鍍敷而形成微細圖案的遮罩、其製造方法以及母板。FIELD OF THE INVENTION The present invention relates to a mask, a method of manufacturing the same, and a mother board, and more particularly to a mask that can be plated in a tunnel space of an insulating portion to form a fine pattern, a method of manufacturing the same, and a mother board .
背景技術 最近在薄板製造中進行有關電鑄鍍敷(Electroforming)方法之研究。電鑄鍍敷方法係將陽極體、陰極體浸漬於電解液中,並施加電源而使金屬薄板電附著於陰極體之表面上,因此,是一種可以製造極薄板並期待量產的方法。Background Art Recently, research on electroforming plating has been conducted in the manufacture of thin sheets. In the electroforming plating method, the anode body and the cathode body are immersed in an electrolytic solution, and a power source is applied to electrically attach the metal thin plate to the surface of the cathode body. Therefore, it is a method capable of producing an extremely thin sheet and expecting mass production.
另一方面,作為在OLED製造步驟中形成像素之技術,主要是運用FMM(精密金屬遮罩,Fine Metal Mask)法,其係使薄膜之金屬遮罩(陰影遮罩,Shadow Mask)與基板密接,並將有機物蒸鍍於所期望位置。On the other hand, as a technique for forming a pixel in an OLED manufacturing step, a FMM (Fine Metal Mask) method is mainly used, in which a metal mask (Shadow Mask) of a film is closely attached to a substrate. And the organic matter is evaporated to the desired position.
圖1是顯示習知像素形成步驟之示意圖。FIG. 1 is a schematic diagram showing a conventional pixel forming step.
參照圖1(a),為了使用FMM法的像素形成步驟,首先,使基板10與業已形成圖案的陰影遮罩13以最大限度密接。又,透過料源供給機構15,蒸鍍有機物、低分子等料源17。一邊對準(alignment)陰影遮罩13,一邊依序蒸鍍R、G、B料源17而形成像素18。然而,如圖1(a),若垂直地形成陰影遮罩13之圖案(PP’),則會藉由料源17之蒸鍍路徑被圖案壁遮蔽的陰影效應(Shadow Effect),產生無法準確地蒸鍍成與像素圖案(F)一致的問題。依此,目前已提出以下方法:如圖1(b),將陰影遮罩13’之圖案(PP)傾斜形成為錐形(Taper)狀(S),並將誤差最小化。除此之外,於FMM法中,為了提升圖案精度,會考慮陰影遮罩13之厚度、基板10與陰影遮罩13之間隔、陰影遮罩13之排列等。Referring to Fig. 1(a), in order to use the pixel formation step of the FMM method, first, the substrate 10 and the patterned shadow mask 13 are adhered to each other to the maximum extent. Further, a material source 17 such as an organic substance or a low molecule is vapor-deposited through the material supply mechanism 15. The pixels 18 are sequentially deposited by sequentially depositing the R, G, and B source 17 while aligning the shadow mask 13. However, as shown in FIG. 1(a), if the pattern (PP') of the shadow mask 13 is formed vertically, the shadow effect which is blocked by the pattern wall by the evaporation path of the material source 17 may not be accurate. The problem of vapor deposition is consistent with the pixel pattern (F). Accordingly, the following method has been proposed: as shown in Fig. 1(b), the pattern (PP) of the shadow mask 13' is obliquely formed into a taper shape (S), and the error is minimized. In addition, in the FMM method, in order to improve the pattern accuracy, the thickness of the shadow mask 13, the interval between the substrate 10 and the shadow mask 13, the arrangement of the shadow mask 13, and the like are considered.
圖2是顯示習知高解析度之OLED形成用陰影遮罩13’之示意圖。Fig. 2 is a schematic view showing a conventional high-resolution shadow mask 13' for OLED formation.
為了具體實現高解析度之OLED,圖案之尺寸會減小。如圖2,為了具體實現高解析度之像素18,於陰影遮罩13’中必須減小像素間隔及像素尺寸等。像素尺寸可藉由減小陰影遮罩13’之圖案(PP)寬度來達成。然而,減小像素間隔卻有所界限。雖然可將像素18間隔以P→P’來減小,然而,若考慮陰影遮罩13’之厚度與錐形狀(S),則無法比具有P’尺寸寬度的陰影遮罩13’’更進一步地減小寬度。即,P’之尺寸會有受限於P’=2T/tanθ(T為陰影遮罩之厚度,θ為錐形角度)的問題。又,在厚度大約30~50μm左右的陰影遮罩13’上傾斜形成(S)圖案之過程中,由於不易進行配合微細之像素間隔及像素尺寸的圖案化13’’,因此,會有加工步驟中產率變差的問題。In order to achieve a high resolution OLED, the size of the pattern is reduced. As shown in Fig. 2, in order to specifically realize the high-resolution pixel 18, it is necessary to reduce the pixel interval, the pixel size, and the like in the shadow mask 13'. The pixel size can be achieved by reducing the pattern (PP) width of the shadow mask 13'. However, there is a limit to reducing the pixel spacing. Although the pixels 18 can be spaced apart by P→P', however, considering the thickness of the shadow mask 13' and the tapered shape (S), it is not possible to go further than the shadow mask 13'' having a P' size width. Ground to reduce the width. That is, the size of P' may be limited by P' = 2T / tan θ (T is the thickness of the shadow mask, and θ is the taper angle). Further, in the process of forming the (S) pattern obliquely on the shadow mask 13' having a thickness of about 30 to 50 μm, since the patterning 13'' of the pixel pitch and the pixel size is difficult to be performed, there is a processing step. The problem of poor productivity.
發明概要 發明欲解決之課題 本發明之目的在提供一種可微細地形成遮罩圖案而具體實現超高畫質之OLED的遮罩、其製造方法以及母板。Disclosure of the Invention Problems to be Solved by the Invention An object of the present invention is to provide a mask, a method of manufacturing the same, and a mother board which can form a mask pattern finely and realize an ultra-high-quality OLED.
又,本發明之目的在提供一種可於絕緣部間之下部空間進行電鑄鍍敷而構成遮罩圖案的遮罩、其製造方法以及母板。Further, an object of the present invention is to provide a mask which can be electroformed and plated in a space between lower portions of an insulating portion to form a mask pattern, a method for producing the same, and a mother board.
用以解決課題之手段 本發明之前述目的可藉由下述遮罩來達成:其藉由電鑄鍍敷來製造,又,包含有遮罩本體及複數個遮罩圖案,遮罩本體包含有複數個遮蔽單元,且遮蔽單元中心部之厚度比遮蔽單元框架部之厚度厚。Means for Solving the Problems The foregoing object of the present invention can be achieved by a mask which is manufactured by electroforming plating, and further includes a mask body and a plurality of mask patterns, and the mask body includes A plurality of shielding units, and a thickness of a central portion of the shielding unit is thicker than a thickness of the shielding unit frame portion.
於預定遮罩圖案與最靠近其而鄰接的遮罩圖案間之空間可形成連結部,遮蔽單元透過連結部與鄰接的遮蔽單元一體地連結。A space is formed between the predetermined mask pattern and the mask pattern adjacent to the mask pattern, and the shielding unit is integrally coupled to the adjacent shielding unit through the connecting portion.
連結部可為遮罩本體中形成為最薄的部分。The joint portion may be the thinnest portion formed in the mask body.
連結部之側截面形狀可為三角形,或是邊、稜中至少一者為圓弧形狀之三角形。The side cross-sectional shape of the connecting portion may be a triangle, or at least one of the side and the rib may be a circular arc shape.
於預定遮罩圖案與第二靠近其而鄰接的遮罩圖案間之空間可形成遮蔽單元。A shielding unit may be formed in a space between the predetermined mask pattern and the second mask pattern adjacent thereto.
遮蔽單元之中心部可為遮罩本體中形成為最厚的部分。The central portion of the shielding unit may be the thickest portion formed in the mask body.
遮罩可為不變鋼(Invar)或超恆範鋼(Super Invar)材質。The mask can be made of Invar or Super Invar.
又,本發明之前述目的可藉由下述遮罩之製造方法來達成:其係藉由電鑄鍍敷製造遮罩的方法,包含有以下步驟:(a)步驟,其提供陰極體,該陰極體含有導電性基材,以及於基材之一面上形成為具有圖案的複數個絕緣部;(b)步驟,其將陰極體以及與陰極體分隔配置的陽極體(Anode Body)之至少一部分浸漬於鍍敷液中,並於陰極體與陽極體間施加電場;及(c)步驟,其於陰極體之表面形成鍍敷膜而構成包含有複數個遮蔽單元的遮罩本體,且於絕緣部之表面防止鍍敷膜之形成而構成複數個遮罩圖案;遮蔽單元之框架部之至少一部分於絕緣部之隧道空間受到鍍敷,並形成為比遮蔽單元之中心部更薄的厚度。Moreover, the above object of the present invention can be attained by the following method for manufacturing a mask: a method for manufacturing a mask by electroforming plating, comprising the following steps: (a) a step of providing a cathode body, The cathode body includes a conductive substrate, and a plurality of insulating portions formed on one surface of the substrate as a pattern; and (b) a step of at least a part of the cathode body and the anode body (Anode body) disposed apart from the cathode body Immersed in a plating solution to apply an electric field between the cathode body and the anode body; and (c) a step of forming a plating film on the surface of the cathode body to form a mask body including a plurality of shielding units, and insulating The surface of the portion prevents the formation of the plating film to form a plurality of mask patterns; at least a part of the frame portion of the shielding unit is plated in the tunnel space of the insulating portion, and is formed to have a thickness thinner than the central portion of the shielding unit.
隧道空間係預定絕緣部與最靠近其而鄰接的絕緣部之至少上部重疊而形成。The tunnel space is formed by overlapping at least an upper portion of the insulating portion adjacent to the nearest insulating portion.
於隧道空間形成的鍍敷膜可構成一體地連結遮蔽單元間的連結部。The plating film formed in the tunnel space can constitute a joint portion that integrally connects the shielding units.
於(c)步驟中,在已於隧道空間形成鍍敷膜後,更進行鍍敷而可形成遮蔽單元。In the step (c), after the plating film has been formed in the tunnel space, plating is further performed to form a shielding unit.
預定絕緣部與第二靠近其而鄰接的絕緣部可分隔配置而無重疊部分,且於該分隔空間形成的鍍敷膜構成遮蔽單元。The predetermined insulating portion and the second insulating portion adjacent thereto are disposed apart from each other without overlapping portions, and the plating film formed in the partition space constitutes a shielding unit.
又,本發明之前述目的可藉由下述母板(Mother Plate)來達成:其係藉由電鑄鍍敷製造遮罩時所使用,包含有:導電性基材;及複數個絕緣部,其於導電性基材之一面上配置成構成圖案;絕緣部具有寬度自上部朝下部逐漸變窄的形狀,且預定絕緣部及與其鄰接的絕緣部之至少上部連結。Moreover, the above object of the present invention can be achieved by a mother plate which is used for manufacturing a mask by electroforming plating, comprising: a conductive substrate; and a plurality of insulating portions, The insulating portion is disposed on one surface of the conductive substrate to form a pattern, and the insulating portion has a shape in which the width gradually decreases from the upper portion toward the lower portion, and the predetermined insulating portion and at least an upper portion of the insulating portion adjacent thereto are coupled to each other.
預定絕緣部及與其鄰接的絕緣部之至少下部未連結,並可形成隧道空間。At least a lower portion of the predetermined insulating portion and the insulating portion adjacent thereto is not connected, and a tunnel space can be formed.
絕緣部及與其鄰接的絕緣部係上部之稜部分重疊,或是上部之稜頂點部分重疊。The insulating portion and the upper portion of the insulating portion adjacent thereto are partially overlapped, or the apex portion of the upper portion is partially overlapped.
導電性基材可為經摻雜之單晶矽材質。The conductive substrate may be a doped single crystal germanium material.
摻雜至少進行1019 cm-3 以上。The doping is performed at least 10 19 cm -3 or more.
母板於電鑄鍍敷中使用作為陰極體(Cathode Body)。The mother board is used as a cathode body in electroforming plating.
發明效果 若藉由依前述而構成的本發明,則可微細地形成遮罩圖案而具體實現超高畫質之OLED。Advantageous Effects of Invention According to the present invention configured as described above, an OLED having a super high image quality can be specifically formed by forming a mask pattern finely.
又,若藉由本發明,則可於絕緣部間之下部空間進行電鑄鍍敷而構成遮罩圖案。Moreover, according to the present invention, the mask pattern can be formed by electroforming plating in the lower space between the insulating portions.
用以實施發明之形態 後述本發明之詳細說明乃參照以圖式來例示可實施本發明之特定實施形態之附圖。為了讓該發明所屬技術領域中具有通常知識者可充分地實施本發明,詳細說明該等實施形態。應理解本發明之各種實施形態雖互為不同,但無須相互排他。舉例言之,在此所記載的特定形狀、構造及特性與一實施形態有關,可於未脫離本發明精神及範圍下作成其他實施形態具體實現。又,應理解各自所揭示實施形態內的個別構成要素之位置或配置,可於未脫離本發明精神及範圍下加以變更。故,後述詳細說明並非採取限定之意,只要能適切地說明,本發明之範圍係與和該請求項主張者均等的所有範圍一同僅受限於添附之請求項。圖式中類似的參照符號是在各種方面具有相同或類似之機能,長度、面積及厚度等與其形態方便上有時亦會誇張表現。MODE FOR CARRYING OUT THE INVENTION The detailed description of the present invention will be described with reference to the accompanying drawings. The embodiments are described in detail to enable those skilled in the art to practice the invention. It should be understood that the various embodiments of the invention are different from each other, but are not necessarily mutually exclusive. For example, the specific shapes, structures, and characteristics described herein may be embodied in other embodiments without departing from the spirit and scope of the invention. In addition, it is to be understood that the position and arrangement of the individual components in the embodiments disclosed herein may be modified without departing from the spirit and scope of the invention. Therefore, the detailed description is not intended to be limiting, and the scope of the present invention is limited only by the appended claims and the scope of the claims. Similar reference symbols in the drawings have the same or similar functions in various aspects, and the length, the area, the thickness, and the like are convenient and sometimes exaggerated.
以下,為了讓該發明所屬技術領域中具有通常知識者可輕易地實施本發明,參照附圖詳細說明有關本發明之較佳實施形態。The preferred embodiments of the present invention are described in detail below with reference to the accompanying drawings.
圖3是顯示使用FMM100的OLED像素蒸鍍裝置200之示意圖。圖4是顯示遮罩之示意圖。FIG. 3 is a schematic diagram showing an OLED pixel evaporation apparatus 200 using the FMM 100. Figure 4 is a schematic view showing a mask.
參照圖3,一般而言,OLED像素蒸鍍裝置200包含有:磁板300,其收納磁鐵310,並配設有冷卻水管線350;及蒸鍍源供給部500,其自磁板300之下部供給有機物源600。Referring to FIG. 3, in general, the OLED pixel vapor deposition apparatus 200 includes a magnetic plate 300 that houses a magnet 310 and is provided with a cooling water line 350, and a vapor deposition source supply unit 500 that is self-contained from the lower portion of the magnetic plate 300. An organic source 600 is supplied.
於磁板300與蒸鍍源供給部500之間,可夾雜蒸鍍有機物源600的玻璃等對象基板900。依像素別蒸鍍有機物源600的FMM100與對象基板900密接,或是配置成非常靠近。磁鐵310會產生磁場,藉由磁場所致引力,FMM100可與對象基板900密接。A target substrate 900 such as glass on which the organic material source 600 is vapor-deposited may be interposed between the magnetic plate 300 and the vapor deposition source supply unit 500. The FMM 100 that evaporates the organic material source 600 according to the pixel is in close contact with the target substrate 900 or is disposed in close proximity. The magnet 310 generates a magnetic field, and the FMM 100 can be in close contact with the target substrate 900 by the attraction force caused by the magnetic field.
遮罩100(參照圖4)與對象基板900密接前必須對準。一個遮罩或複數個遮罩可與框架800結合。框架800固設於OLED像素蒸鍍裝置200內,遮罩經由另外的附著、焊接步驟與框架800結合。The mask 100 (see FIG. 4) must be aligned before being in close contact with the target substrate 900. A mask or a plurality of masks can be combined with the frame 800. The frame 800 is fixed in the OLED pixel evaporation device 200, and the mask is combined with the frame 800 via an additional attachment and soldering step.
蒸鍍源供給部500往返左右路徑,並供給有機物源600,自蒸鍍源供給部500供給的有機物源600可通過業已形成於FMM遮罩100的圖案(PP),蒸鍍於對象基板900之一側。通過FMM遮罩100之圖案所蒸鍍的有機物源600具有作為OLED之像素700的作用。The vapor deposition source supply unit 500 reciprocates the left and right paths and supplies the organic material source 600. The organic material source 600 supplied from the vapor deposition source supply unit 500 can be vapor-deposited on the target substrate 900 by the pattern (PP) which has been formed in the FMM mask 100. One side. The organic source 600 evaporated by the pattern of the FMM mask 100 functions as a pixel 700 of the OLED.
為了防止陰影效應所致像素700之不均勻蒸鍍,FMM遮罩100之圖案(PP)可傾斜形成(S)(或形成為錐形狀(S))。沿著傾斜面朝對角線方向通過圖案(PP)的有機物源600亦可有助於像素700之形成,因此,像素700可全體以均勻之厚度蒸鍍。In order to prevent uneven evaporation of the pixel 700 due to the shadow effect, the pattern (PP) of the FMM mask 100 may be obliquely formed (S) (or formed into a tapered shape (S)). The organic matter source 600 passing through the pattern (PP) along the inclined surface in the diagonal direction can also contribute to the formation of the pixel 700, and therefore, the pixel 700 can be entirely vapor-deposited with a uniform thickness.
參照圖4,於遮罩100之本體(Body)可形成複數個顯示器圖案(DP)。顯示器圖案(DP)為對應於一個智慧型手機等之顯示器的圖案。若將顯示器圖案(DP)放大,則可確認對應於R、G、B的複數個像素圖案(PP)。像素圖案(PP)可具有側部傾斜之形狀、錐形狀或倒錐形狀等(參照圖6)。各種像素圖案(PP)群聚而構成一個顯示器圖案(DP),複數個顯示器圖案(DP)可形成於遮罩100。Referring to FIG. 4, a plurality of display patterns (DP) may be formed on the body of the mask 100. The display pattern (DP) is a pattern corresponding to a display of a smart phone or the like. When the display pattern (DP) is enlarged, a plurality of pixel patterns (PP) corresponding to R, G, and B can be confirmed. The pixel pattern (PP) may have a side inclined shape, a tapered shape, an inverted tapered shape, or the like (refer to FIG. 6). Various pixel patterns (PP) are grouped to form one display pattern (DP), and a plurality of display patterns (DP) may be formed on the mask 100.
即,於本說明書中,顯示器圖案(DP)並非表示一個圖案的概念,應理解成對應於一個顯示器的複數個像素圖案(PP)群聚的概念。以下,將像素圖案(PP)與遮罩圖案(PP)混用。That is, in the present specification, the display pattern (DP) is not a concept of representing one pattern, and should be understood as a concept corresponding to a plurality of pixel patterns (PP) clustering of one display. Hereinafter, the pixel pattern (PP) is mixed with the mask pattern (PP).
圖5為依據本發明一實施形態的遮罩之放大圖。圖6為圖5之A-A’、B-B’、C-C’側截面圖。Fig. 5 is an enlarged view of a mask according to an embodiment of the present invention. Fig. 6 is a side cross-sectional view taken along line A-A', B-B', and C-C' of Fig. 5.
參照圖5及圖6,遮罩100之本體可包含有複數個遮蔽單元110。遮蔽單元110被視為構成遮罩100本體的單位構成要素,依照遮罩圖案(PP)之不同,可具有其他形態。於圖5中,四角形之遮罩圖案(PP)4個(PP1~PP4)構成一組而反覆配置,並將遮罩圖案(PP)間的空間之遮罩100部分想成遮蔽單元110來說明。又,以下,將連結遮蔽單元110與鄰接的遮蔽單元110之連結部115,以有別於遮蔽單元110的用語進行區分來說明,然而,遮蔽單元110並非是物理上與連結部115嚴格區分的要素,應明白屬於連結部115包含於遮蔽單元110的概念。即,連結部115為包含於遮蔽單元110的遮蔽單元110之框架部、稜部之一部分或全部,且連結部115與遮蔽單元110之中心部111一體地連結,群聚成矩陣狀者可稱為遮罩100。Referring to FIGS. 5 and 6, the body of the mask 100 may include a plurality of shielding units 110. The shielding unit 110 is regarded as a unit constituent element constituting the main body of the mask 100, and may have other forms depending on the mask pattern (PP). In FIG. 5, four rectangular mask patterns (PP) (PP1 to PP4) are arranged one after another, and the mask 100 portion of the space between the mask patterns (PP) is considered as the shielding unit 110. . In the following description, the connection portion 115 connecting the shielding unit 110 and the adjacent shielding unit 110 is distinguished by the term different from the shielding unit 110. However, the shielding unit 110 is not physically distinguished from the connection portion 115. The element should be understood to belong to the concept that the connecting portion 115 is included in the shielding unit 110. In other words, the connecting portion 115 is a part or all of the frame portion and the rib portion of the shielding unit 110 included in the shielding unit 110, and the connecting portion 115 is integrally connected to the central portion 111 of the shielding unit 110, and the grouping is a matrix. For mask 100.
本發明之遮罩100之特徵在於:遮蔽單元110之中心部111之厚度比遮蔽單元框架部115之厚度厚。框架部115應理解成皆包含遮蔽單元110之框架、稜或該等之一部分或全部的概念。框架部115亦稱作連結部115。The mask 100 of the present invention is characterized in that the thickness of the central portion 111 of the shielding unit 110 is thicker than the thickness of the shielding unit frame portion 115. The frame portion 115 should be understood to include the concept of a frame, an rib, or a portion or all of the shielding unit 110. The frame portion 115 is also referred to as a joint portion 115.
參照圖5之A-A’及圖6(a),於預定遮罩圖案(PP)與第二靠近其而鄰接的遮罩圖案(PP)間之空間可形成遮蔽單元110(中心部111)。舉例言之,與遮罩圖案PP1最靠近而鄰接的遮罩圖案為PP2、PP4,第二靠近而鄰接的遮罩圖案為PP3。於遮罩圖案PP1與遮罩圖案PP3間形成遮蔽單元110(中心部111),且可形成為厚度T1。厚度T1被視為遮罩100之厚度,可以說是在遮罩100本體中最厚的厚度。即,遮蔽單元110之中心部111可為遮罩100本體中形成為最厚的部分。Referring to AA' and FIG. 6(a) of FIG. 5, a space between a predetermined mask pattern (PP) and a mask pattern (PP) adjacent to the second mask may be formed to form a shielding unit 110 (center portion 111). . For example, the mask patterns that are closest to the mask pattern PP1 and are adjacent to each other are PP2 and PP4, and the mask pattern that is adjacent to the second and adjacent is PP3. A shielding unit 110 (center portion 111) is formed between the mask pattern PP1 and the mask pattern PP3, and may be formed to have a thickness T1. The thickness T1 is regarded as the thickness of the mask 100, which can be said to be the thickest thickness in the body of the mask 100. That is, the central portion 111 of the shielding unit 110 may be the portion that is formed to be the thickest in the body of the mask 100.
A-A’側截面下遮蔽單元110(中心部111)之形態可顯示錐形狀或倒錐形狀(翻過來看之情形)。A-A’側截面下遮罩100之圖案(PP)之形態與一般錐形狀之遮罩圖案類似。The shape of the shielding unit 110 (center portion 111) in the A-A' side section may be a tapered shape or an inverted tapered shape (in the case of turning over). The pattern (PP) of the mask 100 under the A-A' side section is similar to the general pyramid shape mask pattern.
參照圖5之B-B’及圖6(b),於預定遮罩圖案(PP)與最靠近其而鄰接的遮罩圖案(PP)間之空間可形成連結部115(或遮蔽單元110之稜)。舉例言之,與遮罩圖案PP1最靠近而鄰接的遮罩圖案為PP2、PP4,第二靠近而鄰接的遮罩圖案為PP3。於遮罩圖案PP1與遮罩圖案PP2、遮罩圖案PP1與遮罩圖案PP4間形成連結部115,且可形成為厚度T2。厚度T2具有小於T1之值,可以說是在遮罩100本體中最薄的厚度。即,遮蔽單元110之連結部115(框架部、稜部)可為遮罩100本體中形成為最薄的部分。加以整理,遮罩100在遮蔽單元110之中心部111可具有最厚的T1之厚度,在連結部115(框架部、稜部)可具有最薄的T2之厚度。Referring to B-B' and FIG. 6(b) of FIG. 5, a space between the predetermined mask pattern (PP) and the mask pattern (PP) adjacent thereto may be formed to form the joint portion 115 (or the shield unit 110). edge). For example, the mask patterns that are closest to the mask pattern PP1 and are adjacent to each other are PP2 and PP4, and the mask pattern that is adjacent to the second and adjacent is PP3. The joint portion 115 is formed between the mask pattern PP1 and the mask pattern PP2, the mask pattern PP1, and the mask pattern PP4, and may be formed to have a thickness T2. The thickness T2 has a value smaller than T1, which can be said to be the thinnest thickness in the body of the mask 100. That is, the coupling portion 115 (frame portion, rib portion) of the shielding unit 110 may be the portion that is formed to be the thinnest in the body of the mask 100. To be finished, the mask 100 may have a thickness of the thickest T1 at the central portion 111 of the shielding unit 110, and may have the thinnest thickness of T2 at the joint portion 115 (frame portion, rib portion).
遮蔽單元110可透過連結部115與鄰接的遮蔽單元110一體地連結。換言之,遮蔽單元110包含有連結部115,且可透過連結部115與鄰接的遮蔽單元110一體地連結。再換言之,一對遮蔽單元110之中心部111可透過連結部115相互一體地連結。The shielding unit 110 is integrally coupled to the adjacent shielding unit 110 through the connecting portion 115. In other words, the shielding unit 110 includes the connecting portion 115 and is integrally coupled to the adjacent shielding unit 110 through the connecting portion 115. In other words, the central portion 111 of the pair of shielding units 110 can be integrally coupled to each other through the connecting portion 115.
參照圖5之C-C’及圖6(c),扣除遮罩圖案(PP),可以確認只有遮蔽單元110部分。遮蔽單元110交互地配置寬度(R1)所示之中心部111與寬度(R2)所示之連結部115。Referring to C-C' and Fig. 6(c) of Fig. 5, it is confirmed that only the mask unit 110 is removed by subtracting the mask pattern (PP). The shielding unit 110 alternately arranges the central portion 111 indicated by the width (R1) and the connecting portion 115 indicated by the width (R2).
連結部115之側截面形狀可具有三角形。三角形亦包含邊、稜中至少一者圓弧形化且全體為三角形者。其係如後述,利用本發明母板40的一對絕緣部51、52之上部局部重疊(OR),且於下部產生的隧道空間(TR)形成鍍敷膜之結果(參照圖10(c2))。The side cross-sectional shape of the joint portion 115 may have a triangular shape. The triangle also includes at least one of the sides and the ribs, and all of them are triangular. As will be described later, the upper portion of the pair of insulating portions 51 and 52 of the mother substrate 40 of the present invention is partially overlapped (OR), and the tunnel space (TR) generated at the lower portion is formed as a plating film (see FIG. 10 (c2)). ).
圖6中所示遮罩100可翻轉而於遮罩圖案(PP)顯示錐形狀之狀態下與對象基板900密接(參照圖3)。連結部115具有比遮罩100之厚度T1薄的T2之厚度,且具有非錐形狀之三角形,因此,可進一步地縮短遮罩圖案(PP)間之間隔,並以該程度縮短OLED像素700之間隔。若以圖6(a)中遮罩圖案(PP)間之間隔(P)對應於遮蔽單元110(中心部111)之寬度,另一方面,圖6(b)中遮罩圖案(PP)間之間隔(P’’)對應於連結部115之寬度來看,則可輕易地確認以何種程度縮短OLED像素700之間隔。OLED像素700是藉由已通過遮罩圖案(PP)所蒸鍍的有機物源600來形成,因此,遮罩圖案(PP)之間隔可直接對應於OLED像素700之間隔。The mask 100 shown in FIG. 6 is invertible and is in close contact with the target substrate 900 in a state in which the mask pattern (PP) is displayed in a tapered shape (refer to FIG. 3). The connecting portion 115 has a thickness T2 thinner than the thickness T1 of the mask 100 and has a non-tapered triangular shape. Therefore, the interval between the mask patterns (PP) can be further shortened, and the OLED pixel 700 can be shortened to such an extent. interval. The gap (P) between the mask patterns (PP) in FIG. 6(a) corresponds to the width of the shielding unit 110 (the center portion 111), and on the other hand, the mask pattern (PP) in FIG. 6(b). The interval (P'') corresponds to the width of the connecting portion 115, and it can be easily confirmed to what extent the interval of the OLED pixels 700 is shortened. The OLED pixel 700 is formed by an organic source 600 that has been evaporated by a mask pattern (PP), and thus, the spacing of the mask patterns (PP) may directly correspond to the spacing of the OLED pixels 700.
如透過圖2所前述,以往無法調節形成遮罩圖案(PP)之部分的遮罩之厚度,因此,會有像素間隔受限於P’=2✽T/tanθ(在此,T為遮罩之厚度,θ為錐形角度)的問題。於本發明中,可依照減低連結部115之厚度(T2)的程度,大幅地減小像素間隔P’’=2✽T2/tanθ(在此,T為遮罩之厚度,θ為錐形角度)。若連結部115之厚度(T2)相較於中心部111之厚度(T1)為50%位階,則相較於習知像素間隔而將像素間隔(P’’)縮短為一半,因此,具有解析度上升為其平方的4倍之效果。依照絕緣部51、52之上部重疊(OR)的厚度,連結部115之厚度(T2)亦可相較於中心部111之厚度(T1)調節為50%以下,因此,解析度可與減少的厚度平方成比例大幅地上升。As described above with reference to FIG. 2, the thickness of the mask forming the portion of the mask pattern (PP) cannot be adjusted in the past, and therefore, the pixel interval is limited by P'=2✽T/tan θ (here, T is a mask). The thickness, θ is the angle of the cone). In the present invention, the pixel interval P''=2✽T2/tanθ can be greatly reduced in accordance with the degree of reducing the thickness (T2) of the joint portion 115 (here, T is the thickness of the mask, and θ is the taper angle). ). If the thickness (T2) of the connecting portion 115 is 50% larger than the thickness (T1) of the central portion 111, the pixel interval (P'') is shortened to half compared to the conventional pixel interval, and therefore, the analysis is performed. The degree rises to 4 times its square effect. The thickness (T2) of the connecting portion 115 can be adjusted to 50% or less in comparison with the thickness (T1) of the central portion 111 in accordance with the thickness of the upper portion (OR) of the insulating portions 51 and 52. Therefore, the resolution can be reduced. The square of the thickness increases sharply.
故,本發明之遮罩100具有可更微細地形成遮罩圖案(PP)而具體實現超高畫質之OLED的效果。本發明可超越500~600PPI(每英寸像素,pixel per inch)且像素尺寸到達大約30~50μm的QHD之畫質,具體實現具有~860PPI、~1600PPI等解析度的4K UHD、8K UHD之超高畫質,或是比其更高的畫質。Therefore, the mask 100 of the present invention has an effect of forming a mask pattern (PP) more finely and realizing an OLED of ultra-high quality. The invention can exceed the image quality of 500~600PPI (pixel per inch) and the pixel size reaches about 30~50μm, and realizes the ultra-high 4K UHD and 8K UHD with resolutions of ~860PPI and ~1600PPI. Quality, or higher quality.
另一方面,於圖5中,為了比較遮蔽單元110之中心部111與連結部115以及存在於其間的遮罩圖案(PP),例示皆包含A-A’側截面、B-B’側截面2種形態的遮罩100來說明。然而,為了進一步具體實現超高畫質,亦可使遮罩圖案(PP)皆以像是B-B’側截面之形態顯示而使所有絕緣部51、52之上部重疊(OR),且於其下部空間(隧道空間(TR))形成鍍敷膜,藉此完成遮罩100之製造(參照圖9)。此時,於遮罩100的所有部分,遮罩100本體之側截面形狀可具有三角形。即,遮罩100並未具備錐形狀之中心部111,所有遮罩100之本體部分具有像是連結部115之形狀。On the other hand, in FIG. 5, in order to compare the central portion 111 of the shielding unit 110 with the connecting portion 115 and the mask pattern (PP) present therebetween, the illustration includes both the A-A' side section and the B-B' side section. Two types of masks 100 are described. However, in order to further achieve ultra-high image quality, the mask pattern (PP) may be displayed in the form of a B-B' side cross section so that the upper portions of all the insulating portions 51, 52 overlap (OR), and The lower space (tunnel space (TR)) forms a plating film, thereby completing the manufacture of the mask 100 (refer to FIG. 9). At this time, in all portions of the mask 100, the side cross-sectional shape of the body of the mask 100 may have a triangular shape. That is, the mask 100 does not have the tapered central portion 111, and the body portion of all the masks 100 has a shape like the connecting portion 115.
再度參照圖5,作為一例,於一個遮蔽單元110之周邊配置有4個遮罩圖案(PP1~PP4),遮罩圖案(PP)之稜、遮蔽單元110之稜可形成為圓弧形狀。又,遮罩圖案(PP)與遮蔽單元110交互配置成格子狀。可具有所謂P排列(pentile)構造。Referring again to FIG. 5, as an example, four mask patterns (PP1 to PP4) are disposed around one of the shielding units 110, and the edge of the mask pattern (PP) and the edge of the shielding unit 110 may be formed in an arc shape. Further, the mask pattern (PP) and the shielding unit 110 are alternately arranged in a lattice shape. There may be a so-called Ppentile configuration.
圖7為依據本發明一實施形態的遮罩之電子顯微鏡照片。圖7(a)顯示交互配置成格子狀的遮罩圖案(PP)與遮蔽單元110,圖7(b)放大顯示一個遮蔽單元110,圖7(c)則顯示遮蔽單元110之側截面形狀。Fig. 7 is an electron micrograph of a mask according to an embodiment of the present invention. Fig. 7(a) shows a mask pattern (PP) and a shielding unit 110 which are alternately arranged in a lattice shape, Fig. 7(b) shows an enlarged shielding unit 110, and Fig. 7(c) shows a side sectional shape of the shielding unit 110.
參照圖7(a),可確認遮蔽單元110之中心部111厚厚地形成,連結部115(稜部、框架部)則薄薄地形成。又,參照圖7(b),可確認連結部115之截面具有三角形,且隔著連結部115,2個遮罩圖案(PP)之間隔形成為非常靠近。又,參照圖7(c),可確認中心部111顯示大約45°之錐形角度。Referring to Fig. 7(a), it is confirmed that the center portion 111 of the shielding unit 110 is formed thickly, and the connecting portion 115 (edge portion, frame portion) is formed thin. Moreover, referring to FIG. 7(b), it can be confirmed that the cross section of the connecting portion 115 has a triangular shape, and the interval between the two mask patterns (PP) is formed to be very close to each other via the connecting portion 115. Further, referring to Fig. 7(c), it can be confirmed that the center portion 111 displays a taper angle of about 45°.
圖8為依據本發明各種實施形態的母板40、40’之透視圖。圖8為誇張表現母板40、40’之一部分,應明白並不限於圖8所示形態。Figure 8 is a perspective view of a motherboard 40, 40' in accordance with various embodiments of the present invention. Fig. 8 is an exaggerated representation of a portion of the mother board 40, 40', which is understood to be not limited to the configuration shown in Fig. 8.
參照圖8,依據本發明一實施形態的母板40可包含有導電性基材41及複數個絕緣部50。Referring to Fig. 8, a mother board 40 according to an embodiment of the present invention may include a conductive substrate 41 and a plurality of insulating portions 50.
母板40於電鑄鍍敷中使用作為陰極體。為了進行電鑄鍍敷,母板40宜含有導電性基材41。The mother board 40 is used as a cathode body in electroforming plating. In order to perform electroforming plating, the mother substrate 40 preferably contains a conductive substrate 41.
作為導電性材質,於金屬之情形時,有時亦會於表面生成金屬氧化物,且於金屬製造過程中流入雜質,於多晶矽基材之情形時,則存在有夾雜物或晶界(Grain Boundary),於導電性高分子基材之情形時,含有雜質的可能性高,強度、耐酸性等脆弱。將像是金屬氧化物、雜質、夾雜物、晶界般妨礙母板40之表面均勻地形成電場的要素稱作「缺陷」(Defect)。由於缺陷,前述材質之陰極體無法施加均勻之電場,鍍敷膜100之一部分可能不均勻地形成。又,於多晶基板素材之情形時,藉由用以減少電鑄鍍敷膜之熱膨脹係數的熱處理步驟,因晶粒間不均勻之特性,形成於遮罩的圖案之位置改變,此有牽涉到像素蒸鍍位置之變更的問題。As a conductive material, in the case of a metal, a metal oxide may be formed on the surface, and an impurity may flow in the metal production process. In the case of a polycrystalline germanium substrate, there may be inclusions or grain boundaries (Grain Boundary). In the case of a conductive polymer substrate, there is a high possibility of containing impurities, and the strength, acid resistance, and the like are weak. An element that uniformly forms an electric field on the surface of the mother substrate 40 like a metal oxide, an impurity, an inclusion, or a grain boundary is called a "defect". Due to the defect, the cathode body of the above material cannot apply a uniform electric field, and a part of the plating film 100 may be unevenly formed. Moreover, in the case of the polycrystalline substrate material, the heat treatment step for reducing the thermal expansion coefficient of the electroformed plating film changes the position of the pattern formed on the mask due to the unevenness between the crystal grains, which involves The problem of changing the position of the pixel evaporation.
在具體實現UHD級以上的超高畫質像素時,鍍敷膜100及鍍敷膜圖案(PP)之不均勻可能會對像素之形成帶來不良影響。FMM、陰影遮罩之圖案(PP)寬度可能形成為數~數十μm之尺寸,較為理想的是小於40μm之尺寸,因此,即便連數μm尺寸之缺陷,亦為在遮罩之圖案尺寸中佔據大幅比重之尺寸。When the ultra-high-quality pixels of the UHD level or higher are specifically realized, the unevenness of the plating film 100 and the plating film pattern (PP) may adversely affect the formation of the pixels. The pattern of the FMM and the shadow mask (PP) may be formed in a size of several to several tens of μm, and desirably, a size of less than 40 μm, so that even a defect of a size of several μm is occupied in the pattern size of the mask. The size of the large proportion.
又,為了除去在前述材質之陰極體之缺陷,進行用以除去金屬氧化物、雜質等的追加步驟,於該過程中蝕刻陰極體材料等,有時亦會進一步地引發其他缺陷。Further, in order to remove the defects of the cathode body of the above-mentioned material, an additional step for removing metal oxides, impurities, and the like is performed, and in the process, the cathode material or the like is etched, and other defects may be further caused.
故,本發明可使用單晶矽材質之基材41。為了具有導電性,基材41會進行1019 以上的高濃度摻雜。摻雜可於基材41之全體進行,亦可僅於基材41之表面部分進行。Therefore, the substrate 41 of a single crystal germanium material can be used in the present invention. In order to have conductivity, the substrate 41 is doped at a high concentration of 10 19 or more. The doping may be performed on the entire substrate 41 or only on the surface portion of the substrate 41.
複數個絕緣部50(51、52、…)可形成於導電性基材41之至少一面上。絕緣部50是(藉由凸版印刷)形成為於基材41之一面上突出的部分,為了防止鍍敷膜100之生成,可具有絕緣特性。藉此,絕緣部50可藉由光阻材料、氧化矽、氮化矽中任一者之材質來形成。絕緣部50亦可藉由蒸鍍等方法於基材41上形成氧化矽、氮化矽,並以基材41為基底而使用熱氧化(Thermal Oxidation)、熱氮化(Thermal Nitiridation)方法。亦可使用印刷方法等而形成光阻材料。使用光阻材料而形成圖案時,可使用多重曝光方法、每個區域使曝光強度不同的方法等。絕緣部50可以比鍍敷膜100更厚而具有大約5μm~20μm之厚度。A plurality of insulating portions 50 (51, 52, ...) may be formed on at least one surface of the conductive substrate 41. The insulating portion 50 is formed to protrude from one surface of the substrate 41 (by letterpress printing), and may have insulating properties in order to prevent the formation of the plating film 100. Thereby, the insulating portion 50 can be formed of a material of any one of a photoresist material, yttrium oxide, and tantalum nitride. The insulating portion 50 may be formed of ruthenium oxide or tantalum nitride on the substrate 41 by a method such as vapor deposition, and a thermal oxidation (Thermal Oxidation) or a thermal nitridation method may be used on the substrate 41 as a base. A photoresist material can also be formed using a printing method or the like. When a pattern is formed using a photoresist material, a multiple exposure method, a method in which the exposure intensity is different for each region, and the like can be used. The insulating portion 50 may be thicker than the plating film 100 and have a thickness of about 5 μm to 20 μm.
各個絕緣部50可具有寬度自上部朝下部逐漸變窄的形狀。舉例言之,絕緣部50之垂直側截面可具有倒錐形狀。Each of the insulating portions 50 may have a shape in which the width gradually narrows from the upper portion toward the lower portion. For example, the vertical side section of the insulating portion 50 may have an inverted tapered shape.
絕緣部50可於導電性基材41上形成為具有圖案。即,絕緣部50於導電性基材41上佔有的區域具有圖案,絕緣部50佔有的區域可對應於遮罩圖案(PP)。於後述電鑄鍍敷過程中自基材41露出之表面形成鍍敷膜100,在配置有絕緣部50的區域則防止鍍敷膜100之生成而可形成圖案(PP)。母板40在鍍敷膜100的生成過程中連圖案皆可形成,因此,與模、陰極體合併記載來運用。The insulating portion 50 can be formed to have a pattern on the conductive substrate 41. That is, the region occupied by the insulating portion 50 on the conductive substrate 41 has a pattern, and the region occupied by the insulating portion 50 can correspond to the mask pattern (PP). The plating film 100 is formed on the surface exposed from the substrate 41 in the electroforming plating process to be described later, and the pattern (PP) can be formed in the region where the insulating portion 50 is disposed to prevent the formation of the plating film 100. Since the mother board 40 can form a pattern even during the formation of the plating film 100, it is described in combination with the mold and the cathode body.
本發明之母板40之特徵在於:絕緣部50具有寬度自上部朝下部逐漸變窄的形狀,任意之絕緣部51及與其鄰接的絕緣部52之至少上部51a、52a連結(OR)。即,相互鄰接的絕緣部51、52之上部51a、52a連結,下部51b、52b則未連結。在此,所謂上部51a、52a連結(OR),應理解成皆包含以下形態之意:於絕緣部51、52之上部更夾雜有相同材質的絕緣部而連結2個絕緣部51、52之形態,或者藉由狹窄地形成相同形態的絕緣部51、52之間隔,使上部51a、52a重疊之形態。依此,亦將上部51a、52a連結、重疊(OR)之部分稱作「橋(bridge)」。圖8(a)被視為上部51a、52a重疊(OR)之形態,圖8(b)則視為重疊(OR)程度更小且接近絕緣部51’、52’之上部間連結之形態。The mother board 40 of the present invention is characterized in that the insulating portion 50 has a shape in which the width gradually narrows from the upper portion toward the lower portion, and any of the insulating portions 51 and at least the upper portions 51a and 52a of the insulating portion 52 adjacent thereto are connected (OR). That is, the upper portions 51a and 52a of the insulating portions 51 and 52 adjacent to each other are connected, and the lower portions 51b and 52b are not connected. Here, the upper portions 51a and 52a are connected to each other (OR), and it is understood that the upper portions of the insulating portions 51 and 52 are further provided with an insulating portion of the same material and the two insulating portions 51 and 52 are connected. Alternatively, the upper portions 51a and 52a are overlapped by forming a space in which the insulating portions 51 and 52 having the same shape are formed in a narrow manner. Accordingly, the portion in which the upper portions 51a and 52a are connected and overlapped (OR) is also referred to as a "bridge". Fig. 8(a) is regarded as a form in which the upper portions 51a and 52a are overlapped (OR), and Fig. 8(b) is considered to have a smaller degree of overlap (OR) and is close to the upper portion of the insulating portions 51' and 52'.
進一步參照圖8,任意之絕緣部51及與其鄰接的絕緣部52之下部51b、52b未連結,並可形成空隙空間(TR)。在此,亦將空隙空間(TR)稱作「隧道空間」(TR)。Further, referring to Fig. 8, the insulating portion 51 and the lower portions 51b and 52b of the insulating portion 52 adjacent thereto are not connected, and a void space (TR) can be formed. Here, the void space (TR) is also referred to as "tunnel space" (TR).
隧道空間(TR)之高度、寬度、尺寸等可藉由絕緣部50(51、52、…)之(倒)錐形角度、連結/重疊(OR)的上部51a、52a之厚度等進行變更。故,可將像素間隔進行各種控制。The height, width, size, and the like of the tunnel space (TR) can be changed by the (reverse) taper angle of the insulating portions 50 (51, 52, ...), the thickness of the upper portions 51a, 52a of the joint/overlap (OR), and the like. Therefore, the pixel interval can be variously controlled.
於電鑄鍍敷過程中,在絕緣部50上防止鍍敷膜100之形成,而鍍敷膜100具有圖案(PP),且鍍敷膜100可於隧道空間(TR)內形成。故,控制隧道空間(TR)之高度、寬度、尺寸等可對應於控制鍍敷膜100(遮罩100)之遮罩圖案(PP)尺寸,遮罩圖案(PP)尺寸之控制則對應於像素間隔之控制。作為一例,遮罩圖案(PP)之寬度可能形成為小於40μm之尺寸,因此,隧道空間(TR)與鄰接的隧道空間(TR)之距離宜形成為小於40μm之尺寸。In the electroforming plating process, the formation of the plating film 100 is prevented on the insulating portion 50, and the plating film 100 has a pattern (PP), and the plating film 100 can be formed in the tunnel space (TR). Therefore, the height, width, size, and the like of the control tunnel space (TR) may correspond to the size of the mask pattern (PP) for controlling the plating film 100 (mask 100), and the control of the mask pattern (PP) size corresponds to the pixel. Control of the interval. As an example, the width of the mask pattern (PP) may be formed to a size smaller than 40 μm, and therefore, the distance between the tunnel space (TR) and the adjacent tunnel space (TR) is preferably formed to be smaller than 40 μm.
當然,隧道空間(TR)之高度形成為小於絕緣部50之高度。當絕緣部50為倒錐形狀時,隧道空間(TR)之垂直側截面形狀可具有三角形。三角形亦包含邊、角圓弧形化且全體為三角形者。Of course, the height of the tunnel space (TR) is formed to be smaller than the height of the insulating portion 50. When the insulating portion 50 has an inverted tapered shape, the vertical side sectional shape of the tunnel space (TR) may have a triangular shape. The triangle also includes edges and corners that are rounded and all triangular.
圖8(a)顯示在上部與下部大致呈四角形之平面且具有倒錐形狀的絕緣部50中,任意之絕緣部51及與其鄰接的絕緣部52之上部51a、52a稜部分重疊(OR)。複數個絕緣部50於相互重疊(OR)之狀態下沿著一方向配置。在此,顯現隧道空間(TR)於一方向開通之形態。Fig. 8(a) shows an insulating portion 50 having an inverted quadrangular shape on the upper and lower substantially quadrangular shapes, and an arbitrary insulating portion 51 and an upper portion 51a, 52a of the insulating portion 52 adjacent thereto are partially overlapped (OR). The plurality of insulating portions 50 are arranged in one direction in a state of being overlapped (OR). Here, the form in which the tunnel space (TR) is opened in one direction is revealed.
圖8(b)顯示在上部與下部大致呈四角形之平面且具有倒錐形狀的絕緣部50’中,任意之絕緣部51’及與其鄰接的絕緣部52’之上部稜頂點部分連結(OR’)(或重疊(OR))。複數個絕緣部50於相互連結(OR’)之狀態下沿著2個方向(作為一例,X、Y軸方向)配置。在此,顯現隧道空間(TR’)於2個方向開通之形態。Fig. 8(b) shows an insulating portion 50' having an inverted quadrangular shape in a substantially quadrangular upper portion and a lower portion, and an arbitrary insulating portion 51' and an upper portion of the insulating portion 52' adjacent thereto are connected to the apex portion (OR' ) (or overlap (OR)). The plurality of insulating portions 50 are arranged in two directions (for example, X and Y axis directions) in a state of being connected to each other (OR'). Here, the tunnel space (TR') is opened in two directions.
圖9是顯示依據本發明各種實施形態的絕緣部之形態之電子顯微鏡照片。Fig. 9 is an electron micrograph showing the form of an insulating portion according to various embodiments of the present invention.
圖9(a)顯示習知母板40’’。其為母板40’’之電子顯微鏡照片,該母板40’’包含有絕緣部50’’並未相互連結/重疊且未形成隧道空間(TR)的一般倒錐形狀之絕緣部50’’。Fig. 9(a) shows a conventional mother board 40''. It is an electron micrograph of the mother board 40 ′′, and the mother board 40 ′′ includes an insulating portion 50 ′′ of a general inverted tapered shape in which the insulating portions 50 ′′ are not connected or overlapped with each other and the tunnel space (TR) is not formed. .
圖9(b)為母板40之電子顯微鏡照片,該母板40沿著圖8(a)所示之一方向配置複數個絕緣部50,且絕緣部50之上部重疊,並於下部形成隧道空間(TR)。Fig. 9(b) is an electron micrograph of the mother board 40. The mother board 40 is provided with a plurality of insulating portions 50 in one direction shown in Fig. 8(a), and the upper portion of the insulating portion 50 is overlapped, and a tunnel is formed at the lower portion. Space (TR).
圖9(c)及圖9(d)為母板40’之電子顯微鏡照片,該母板40’沿著圖8(b)所示之2個方向配置複數個絕緣部50’,且絕緣部50’之上部重疊(OR’),並於下部形成隧道空間(TR’)。9(c) and 9(d) are electron micrographs of the mother board 40'. The mother board 40' is provided with a plurality of insulating portions 50' along the two directions shown in Fig. 8(b), and the insulating portion The upper portion of the 50' overlaps (OR') and forms a tunnel space (TR') at the lower portion.
如前述,本發明之母板40、40’可以僅於隧道空間(TR、TR’)形成鍍敷膜而製造遮罩100,且於遮罩100的所有部分,側截面形狀具有三角形。即,若使用該母板40、40’而進行電鑄鍍敷,則遮罩100並未具備錐形狀之中心部111(參照圖5),所有遮罩100之部分具有像是連結部115(參照圖5)之形狀。使用此種母板40、40’,可進一步地具體實現超高畫質之OLED。As described above, the mother board 40, 40' of the present invention can form the mask 100 only by forming a plating film in the tunnel space (TR, TR'), and the side cross-sectional shape has a triangular shape in all portions of the mask 100. That is, when the mother board 40, 40' is used for electroforming plating, the mask 100 does not have the tapered center portion 111 (see FIG. 5), and all of the masks 100 have the connection portion 115 ( Refer to the shape of Figure 5). With such a mother board 40, 40', an ultra-high quality OLED can be further realized.
圖10是顯示依據本發明一實施形態的遮罩100之製造過程之示意圖。以下,說明使用圖8(a)之母板40,製造皆包含圖5之A-A’側截面、B-B’側截面2種形態的遮罩100之過程。A-A’側截面形態之形成過程圖示於(b1)、(c1)、(d1),B-B’側截面形態之形成過程圖示於(b2)、(c2)、(d2)。Figure 10 is a schematic view showing the manufacturing process of the mask 100 according to an embodiment of the present invention. Hereinafter, a process of manufacturing the mask 100 including the A-A' side section and the B-B' side section of Fig. 5 using the mother board 40 of Fig. 8(a) will be described. The formation process of the A-A' side cross-sectional shape is shown in (b1), (c1), (d1), and the formation process of the B-B' side cross-sectional form is shown in (b2), (c2), and (d2).
首先,參照圖10(a),為了進行電鑄鍍敷,準備導電性基材41。含有導電性基材41的母板40於電鑄鍍敷中使用作為陰極體。導電性基材41可使用單晶矽者已於前述。First, referring to Fig. 10 (a), a conductive substrate 41 is prepared for electroforming plating. The mother substrate 40 containing the conductive substrate 41 is used as a cathode body in electroforming plating. The conductive substrate 41 can be used as described above.
其次,參照圖10(b1)及圖10(b2),於基材41之至少一面上可形成絕緣部50。絕緣部50宜具有倒錐形狀。另一方面,參照圖10(b2),複數個絕緣部50(51、52、…)之至少上部51a、52a可連結(OR)(或重疊(OR))。即,預定絕緣部51與最靠近其而鄰接的絕緣部52之至少上部51a、52a連結(OR)(或重疊(OR))而形成橋,且下部51b、52b未重疊而可形成空隙空間(TR)、隧道空間(TR)。Next, referring to FIG. 10 (b1) and FIG. 10 (b2), the insulating portion 50 can be formed on at least one surface of the substrate 41. The insulating portion 50 preferably has an inverted tapered shape. On the other hand, referring to Fig. 10 (b2), at least the upper portions 51a, 52a of the plurality of insulating portions 50 (51, 52, ...) can be connected (OR) (or overlapped (OR)). That is, the predetermined insulating portion 51 is connected (OR) (or overlapped (OR)) with at least the upper portions 51a, 52a of the insulating portion 52 adjacent thereto to form a bridge, and the lower portions 51b, 52b are not overlapped to form a void space ( TR), tunnel space (TR).
其次,參照圖10(c1)及圖10(c2),準備與母板40(或陰極體40)相對向的陽極體(未圖示)。陽極體(未圖示)浸漬於鍍敷液(未圖示)中,母板40則是全部或一部分浸漬於鍍敷液(未圖示)中。藉由於母板40(或陰極體40)與相對向的陽極體間所形成電場,可於母板40之表面電附著、生成鍍敷膜100。不過,僅於導電性基材41露出之表面生成鍍敷膜100,於絕緣部50之表面則未生成鍍敷膜100,因此,可於鍍敷膜100上形成圖案(PP)。Next, referring to Fig. 10 (c1) and Fig. 10 (c2), an anode body (not shown) facing the mother board 40 (or the cathode body 40) is prepared. The anode body (not shown) is immersed in a plating solution (not shown), and the mother board 40 is immersed in a plating solution (not shown) in whole or in part. The plating film 100 can be electrically deposited on the surface of the mother substrate 40 by an electric field formed between the mother substrate 40 (or the cathode body 40) and the opposing anode body. However, the plating film 100 is formed only on the surface on which the conductive substrate 41 is exposed, and the plating film 100 is not formed on the surface of the insulating portion 50. Therefore, the pattern (PP) can be formed on the plating film 100.
鍍敷液為電解液,可成為構成遮罩100的鍍敷膜100之材料。作為一實施形態,當製造屬於鐵鎳合金的不變鋼薄板作為鍍敷膜100時,可使用含有Ni離子之溶液及含有Fe離子之溶液的混合液作為鍍敷液。作為其他實施形態,當製造屬於鐵鎳鈷合金的超恆範鋼薄板作為鍍敷膜20時,亦可使用含有Ni離子之溶液、含有Fe離子之溶液及含有Co離子之溶液的混合液作為鍍敷液。不變鋼薄板、超恆範鋼薄板於OLED之製造中使用作為FMM、陰影遮罩(Shadow Mask)。又,不變鋼薄板之熱膨脹係數大約1.0×10-6 /℃,超恆範鋼薄板之熱膨脹係數大約1.0×10-7 /℃左右而非常低,因此,遮罩之圖案形狀因熱能而變形之虞小,主要運用在高解析度之OLED製造中。除此之外,亦可無限制地使用相對於所期望鍍敷膜100的鍍敷液,於本說明書中,假想製造不變鋼薄板作為主要例子來說明。The plating solution is an electrolyte solution and can be used as a material for the plating film 100 constituting the mask 100. As an embodiment, when a constant steel sheet belonging to an iron-nickel alloy is produced as the plating film 100, a mixed solution of a solution containing Ni ions and a solution containing Fe ions can be used as the plating solution. In another embodiment, when a super-constant steel sheet belonging to an iron-nickel-cobalt alloy is produced as the plating film 20, a mixture of a solution containing Ni ions, a solution containing Fe ions, and a solution containing Co ions may be used as plating. Apply fluid. Invariant steel sheets and super-constant steel sheets are used in the manufacture of OLEDs as FMMs and shadow masks. Moreover, the thermal expansion coefficient of the invariable steel sheet is about 1.0×10 -6 /°C, and the thermal expansion coefficient of the ultra-Huangfan steel sheet is about 1.0×10 -7 /°C, which is very low. Therefore, the pattern shape of the mask is deformed by thermal energy. It is small and is mainly used in high-resolution OLED manufacturing. In addition to this, the plating solution with respect to the desired plating film 100 can also be used without limitation. In the present specification, assuming that a constant steel sheet is manufactured as a main example.
由於一邊自基材41之表面電附著鍍敷膜100一邊增厚,因此,宜僅將鍍敷膜100形成至超過絕緣部50之上端之前。即,相較於絕緣部50之厚度,鍍敷膜100之厚度更小。由於鍍敷膜100填滿、電附著於絕緣部50之圖案空間,因此,可生成為具有與絕緣部50之圖案逆相的錐形狀(參照圖10(c1))。Since the plating film 100 is thickly adhered from the surface of the substrate 41, it is preferable to form the plating film 100 only before the upper end of the insulating portion 50. That is, the thickness of the plating film 100 is smaller than the thickness of the insulating portion 50. Since the plating film 100 is filled and electrically adhered to the pattern space of the insulating portion 50, it can be formed into a tapered shape having a reverse phase with the pattern of the insulating portion 50 (see FIG. 10 (c1)).
由於絕緣部50具有絕緣特性,因此,於絕緣部50與陽極體間並未形成電場,或是僅形成不易進行鍍敷之程度的微弱電場。故,母板40上對應於未生成鍍敷膜100之絕緣部50的部分會構成鍍敷膜100之圖案、孔穴(Hole)等。換言之,絕緣部50分別可形成對應於遮罩100本體之R、G、B的遮罩圖案(PP)。遮罩圖案(PP)之側截面形狀可形成為傾斜成大致呈錐形狀,傾斜角度(錐形角度)可為大約45°~65°。Since the insulating portion 50 has an insulating property, no electric field is formed between the insulating portion 50 and the anode body, or only a weak electric field which is hard to be plated is formed. Therefore, the portion of the mother board 40 corresponding to the insulating portion 50 where the plating film 100 is not formed may constitute a pattern, a hole, or the like of the plating film 100. In other words, the insulating portion 50 can respectively form a mask pattern (PP) corresponding to R, G, and B of the body of the mask 100. The side cross-sectional shape of the mask pattern (PP) may be formed to be inclined to be substantially tapered, and the inclination angle (taper angle) may be about 45 to 65 degrees.
於圖10(c1)中,於絕緣部50間可電附著、生成具有錐形狀之側截面形狀的遮蔽單元110(中心部111)。遮蔽單元110可形成為不超過絕緣部50的厚度(T1)。In FIG. 10 (c1), the shielding unit 110 (center portion 111) having a tapered side cross-sectional shape is electrically connected to the insulating portion 50. The shielding unit 110 may be formed not to exceed the thickness (T1) of the insulating portion 50.
另一方面,於圖10(c2)中,於隧道空間(TR)內可電附著、生成具有三角形或是邊、稜中至少一者為圓弧形狀之三角形之側截面形狀的遮蔽單元110(連結部115)。遮蔽單元110(連結部115)可形成為不超過隧道空間(TR)的厚度(T2)。將於隧道空間(TR)內進行電鑄鍍敷的方式稱作「隧道鍍敷」,並將隧道空間(TR)內鍍敷的遮罩稱作「隧道遮罩」。即,連結部115亦可稱為隧道遮罩。On the other hand, in FIG. 10(c2), the shielding unit 110 having a side cross-sectional shape of a triangle having at least one of a triangle or a side and an edge of an arc shape can be electrically attached to the tunnel space (TR) ( Connection portion 115). The shielding unit 110 (the joint portion 115) may be formed not to exceed the thickness (T2) of the tunnel space (TR). The method of electroforming plating in the tunnel space (TR) is called "tunnel plating", and the mask plated in the tunnel space (TR) is called "tunnel mask". That is, the connecting portion 115 may also be referred to as a tunnel mask.
於隧道空間(TR)形成的鍍敷膜可構成一體地連結遮蔽單元110(中心部111)間的連結部115。由於在電鑄鍍敷過程中自導電性基材41之表面生成鍍敷膜100,因此,在厚度薄(高度低)的隧道空間(TR)先形成鍍敷膜而構成連結部115,接著,若進行電鑄鍍敷使鍍敷膜100進一步地變厚,則可形成遮蔽單元110(中心部111)。The plating film formed in the tunnel space (TR) can integrally connect the connection portion 115 between the shielding units 110 (the center portion 111). Since the plating film 100 is formed on the surface of the conductive substrate 41 during the electroforming plating, the plating film is formed in the tunnel space (TR) having a small thickness (low height) to form the connecting portion 115, and then, When electroforming plating is performed to further thicken the plating film 100, the shielding unit 110 (center portion 111) can be formed.
另一方面,在形成鍍敷膜100後,可對鍍敷膜100進行熱處理。熱處理可於300℃~800℃之溫度下進行。一般而言,相較於藉由壓延所生成不變鋼薄板,藉由電鑄鍍敷所生成不變鋼薄板的熱膨脹係數高。依此,藉由對不變鋼薄板進行熱處理,可降低熱膨脹係數,然而,於該熱處理過程中不變鋼薄板可能會產生若干變形。故,若於母板40(或基材41)與遮罩100接著的狀態下進行熱處理,則形成於母板40之絕緣部50所佔空間部分的遮罩圖案(PP)之形態可保持一定,具有可防止熱處理所致微細變形之優點。又,自鍍敷膜100分離母板40(或基材41)後,即使對具有遮罩圖案(PP)的遮罩100進行熱處理,亦具有降低不變鋼薄板之熱膨脹係數的效果。On the other hand, after the plating film 100 is formed, the plating film 100 can be heat-treated. The heat treatment can be carried out at a temperature of from 300 ° C to 800 ° C. In general, the constant thermal steel sheet produced by electroforming plating has a high coefficient of thermal expansion as compared with the invariable steel sheet produced by calendering. Accordingly, the thermal expansion coefficient can be lowered by heat-treating the invariable steel sheet, however, the constant steel sheet may undergo some deformation during the heat treatment. Therefore, when the mother board 40 (or the substrate 41) is heat-treated in a state in which the mask 100 is next, the form of the mask pattern (PP) formed in the space portion of the insulating portion 50 of the mother board 40 can be kept constant. It has the advantage of preventing micro-deformation caused by heat treatment. Further, after the mother substrate 40 (or the substrate 41) is separated from the plating film 100, even if the mask 100 having the mask pattern (PP) is subjected to heat treatment, the thermal expansion coefficient of the constant steel sheet is lowered.
故,藉由進一步地降低遮罩100之熱膨脹係數,可防止μm尺度的圖案(PP)之變形,具有能製造可蒸鍍超高畫質OLED像素的遮罩100之優點。Therefore, by further reducing the thermal expansion coefficient of the mask 100, deformation of the μm-scale pattern (PP) can be prevented, and there is an advantage that a mask 100 capable of evaporating ultra-high-quality OLED pixels can be manufactured.
其次,參照圖10(d1)及圖10(d2),將母板40(或陰極體40)舉起至鍍敷液(未圖示)外後,將鍍敷膜100與母板40分離。亦可於鍍敷膜100與母板40之分離前進一地進行除去絕緣部50之步驟。若於鍍敷液外將鍍敷膜100與母板40分離,則生成鍍敷膜100的部分可構成遮罩100(或遮罩本體),未生成鍍敷膜100的部分則構成遮罩圖案(PP)。Next, referring to FIG. 10 (d1) and FIG. 10 (d2), the mother substrate 40 (or the cathode body 40) is lifted up to the outside of the plating liquid (not shown), and then the plating film 100 is separated from the mother board 40. The step of removing the insulating portion 50 may be performed by separating the plating film 100 from the mother substrate 40. When the plating film 100 is separated from the mother substrate 40 outside the plating solution, the portion where the plating film 100 is formed may constitute the mask 100 (or the mask body), and the portion where the plating film 100 is not formed may constitute the mask pattern. (PP).
圖9是顯示依據本發明各種實施形態的絕緣部之形態之電子顯微鏡照片。Fig. 9 is an electron micrograph showing the form of an insulating portion according to various embodiments of the present invention.
圖9(a)顯示母板40’’,該母板40’’包含有未形成隧道空間(TR)的一般倒錐形狀之絕緣部50,圖9(b)則顯示母板40,該母板40沿著一條線使絕緣部50之上部重疊,並於下部形成隧道空間(TR)。Fig. 9(a) shows a mother board 40'' which includes a general inverted cone-shaped insulating portion 50 which does not form a tunnel space (TR), and Fig. 9(b) shows a mother board 40, the mother board The plate 40 overlaps the upper portion of the insulating portion 50 along a line and forms a tunnel space (TR) at the lower portion.
又,圖9(c)及圖9(d)係使遮罩圖案(PP)皆僅以像是圖5之B-B’側截面或圖6(b)之形態表示,使所有絕緣部50之上部重疊(OR)。此時,僅於隧道空間(TR)形成鍍敷膜而製造遮罩100,且於遮罩100的所有部分,側截面形狀可具有三角形。即,若使用該母板40而進行電鑄鍍敷,則遮罩100並未具備錐形狀之中心部111,所有遮罩100之部分具有像是連結部115之形狀。使用此種母板,可進一步地具體實現超高畫質之OLED。Further, in FIGS. 9(c) and 9(d), the mask pattern (PP) is represented only by the side of the BB' side of FIG. 5 or the form of FIG. 6(b), so that all the insulating portions 50 are provided. The upper part overlaps (OR). At this time, the mask 100 is formed only by forming a plating film in the tunnel space (TR), and the side cross-sectional shape may have a triangular shape in all portions of the mask 100. That is, when the mother board 40 is used for electroforming plating, the mask 100 does not have the tapered center portion 111, and all of the masks 100 have a shape like the connecting portion 115. With such a mother board, an ultra-high quality OLED can be further realized.
如前述,本發明具有可於絕緣部50間之下部空間(TR)進行電鑄鍍敷而微細地形成遮罩圖案(PP)的效果。藉此,具有可具體實現在既有方法中無法完成的超高畫質之OLED的效果。As described above, the present invention has an effect of performing electroforming plating in the lower space (TR) between the insulating portions 50 to form the mask pattern (PP) finely. Thereby, there is an effect of an ultra-high quality OLED which can be realized in an existing method.
如前述,本發明列舉較佳實施形態而圖示說明,惟並不限於前述實施形態,在未脫離本發明精神之範圍內,該發明所屬技術領域中具有通常知識者可進行各種變形與變更。應理解此種變形例及變更例屬於本發明與添附申請專利範圍之範圍內。As described above, the present invention has been described with reference to the preferred embodiments. However, the present invention is not limited thereto, and various modifications and changes can be made without departing from the spirit and scope of the invention. It is to be understood that such modifications and variations are within the scope of the invention and the scope of the appended claims.
產業上之可利用性 本發明可應用在遮罩、其製造方法及母板相關的領域中。Industrial Applicability The present invention can be applied to a field related to a mask, a method of manufacturing the same, and a mother board.
10‧‧‧基板10‧‧‧Substrate
13、13’、13’’‧‧‧陰影遮罩13, 13’, 13’’‧‧‧ shadow masks
15‧‧‧料源供給機構15‧‧‧Source supply mechanism
17‧‧‧料源17‧‧‧ source
18、700‧‧‧像素18,700‧‧‧ pixels
40、40’、40’’‧‧‧母板40, 40’, 40’’‧‧‧ Motherboard
41‧‧‧導電性基材41‧‧‧Electrically conductive substrate
50、50’、51、51’、52、52’‧‧‧絕緣部50, 50', 51, 51', 52, 52' ‧ ‧ insulation
51a、52a‧‧‧上部51a, 52a‧‧‧ upper
51b、52b‧‧‧下部51b, 52b‧‧‧ lower
100‧‧‧遮罩、陰影遮罩、FMM100‧‧‧Mask, shadow mask, FMM
110‧‧‧遮蔽單元110‧‧‧Shielding unit
111‧‧‧中心部111‧‧‧ Central Department
115‧‧‧連結部、框架部、稜部115‧‧‧Connection, frame, ridge
200‧‧‧OLED像素蒸鍍裝置200‧‧‧OLED pixel evaporation device
300‧‧‧磁板300‧‧‧ magnetic board
310‧‧‧磁鐵310‧‧‧ magnet
350‧‧‧冷卻水管線350‧‧‧Cooling water pipeline
500‧‧‧蒸鍍源供給部500‧‧‧Decanting source supply department
600‧‧‧有機物源600‧‧‧Organic source
800‧‧‧框架800‧‧‧Frame
900‧‧‧對象基板900‧‧‧Object substrate
DP‧‧‧顯示器圖案DP‧‧‧ display pattern
F、PP、PP’、PP1~PP4‧‧‧像素圖案、遮罩圖案F, PP, PP', PP1~PP4‧‧‧ pixel pattern, mask pattern
OR、OR’‧‧‧絕緣部上部重疊區域OR, OR’‧‧‧Insulation upper overlap area
P、P’、P’’‧‧‧間隔P, P’, P’’‧‧‧ interval
R1、R2‧‧‧寬度R1, R2‧‧‧ width
S‧‧‧錐形狀S‧‧‧ cone shape
T1‧‧‧中心部之厚度Thickness of the central part of T1‧‧
T2‧‧‧連結部之厚度Thickness of T2‧‧‧ joints
TR、TR’‧‧‧下部空間、隧道空間、空隙空間TR, TR’‧‧‧low space, tunnel space, void space
圖1是顯示習知像素形成步驟之示意圖。 圖2是顯示習知高解析度之OLED形成用陰影遮罩13’之示意圖。 圖3是顯示使用FMM的OLED像素蒸鍍裝置之示意圖。 圖4是顯示遮罩之示意圖。 圖5為依據本發明一實施形態的遮罩之放大圖。 圖6為圖5之A-A’、B-B’、C-C’側截面圖。 圖7為依據本發明一實施形態的遮罩之電子顯微鏡照片。 圖8為依據本發明各種實施形態的母板之透視圖。 圖9是顯示依據本發明各種實施形態的絕緣部之形態之電子顯微鏡照片。 圖10是顯示依據本發明一實施形態的遮罩之製造過程之示意圖。FIG. 1 is a schematic diagram showing a conventional pixel forming step. Fig. 2 is a schematic view showing a conventional high-resolution shadow mask 13' for OLED formation. 3 is a schematic view showing an OLED pixel evaporation apparatus using an FMM. Figure 4 is a schematic view showing a mask. Fig. 5 is an enlarged view of a mask according to an embodiment of the present invention. Fig. 6 is a side cross-sectional view taken along line A-A', B-B', and C-C' of Fig. 5. Fig. 7 is an electron micrograph of a mask according to an embodiment of the present invention. Figure 8 is a perspective view of a motherboard in accordance with various embodiments of the present invention. Fig. 9 is an electron micrograph showing the form of an insulating portion according to various embodiments of the present invention. Figure 10 is a schematic view showing a manufacturing process of a mask in accordance with an embodiment of the present invention.
Claims (17)
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| ??10-2017-0084768 | 2017-07-04 | ||
| KR1020170084768A KR102246536B1 (en) | 2017-07-04 | 2017-07-04 | Mask same, and producing method of the same |
| KR1020170093634A KR102055405B1 (en) | 2017-07-24 | 2017-07-24 | Mother plate and producing method thereof |
| ??10-2017-0093634 | 2017-07-24 |
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| WO (1) | WO2019009526A1 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020192339A1 (en) * | 2019-03-27 | 2020-10-01 | 京东方科技集团股份有限公司 | Mask and manufacturing method thereof |
| CN114086220A (en) * | 2021-07-30 | 2022-02-25 | 达运精密工业股份有限公司 | Manufacturing method of metal mask and electroforming motherboard |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN110578112B (en) * | 2019-08-09 | 2020-09-01 | 武汉华星光电半导体显示技术有限公司 | Mask and pixel structure |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3878061A (en) * | 1974-02-26 | 1975-04-15 | Rca Corp | Master matrix for making multiple copies |
| JP2005154879A (en) * | 2003-11-28 | 2005-06-16 | Canon Components Inc | Metal mask for vapor deposition, and method of producing vapor deposition pattern using the same |
| JP2009167523A (en) * | 2007-12-18 | 2009-07-30 | Hitachi Chem Co Ltd | Conductive substrate for plating, method for manufacturing the same, conductive layer pattern using the same, and method for manufacturing substrate with conductive layer pattern, substrate with conductive layer pattern, and translucent electromagnetic wave shielding member |
| JP2010065297A (en) * | 2008-09-12 | 2010-03-25 | Seiko Epson Corp | Method of manufacturing mask |
| KR20140130913A (en) * | 2013-05-02 | 2014-11-12 | 주식회사 티지오테크 | Mask and a Method for Manufacturing the Same |
-
2018
- 2018-06-07 WO PCT/KR2018/006457 patent/WO2019009526A1/en not_active Ceased
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020192339A1 (en) * | 2019-03-27 | 2020-10-01 | 京东方科技集团股份有限公司 | Mask and manufacturing method thereof |
| CN114086220A (en) * | 2021-07-30 | 2022-02-25 | 达运精密工业股份有限公司 | Manufacturing method of metal mask and electroforming motherboard |
| CN114086220B (en) * | 2021-07-30 | 2023-11-14 | 达运精密工业股份有限公司 | Manufacturing method of metal mask and electroformed mother board |
| TWI826810B (en) * | 2021-07-30 | 2023-12-21 | 達運精密工業股份有限公司 | Method for manufacturing metal mask and electroforming plate |
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