TW201826889A - High-frequency acceleration device in circular accelerator and circular accelerator - Google Patents
High-frequency acceleration device in circular accelerator and circular accelerator Download PDFInfo
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- 230000001133 acceleration Effects 0.000 title claims abstract description 145
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H13/00—Magnetic resonance accelerators; Cyclotrons
- H05H13/02—Synchrocyclotrons, i.e. frequency modulated cyclotrons
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Abstract
Description
本發明係關於一種粒子束治療用圓形加速器的領域,尤其係有關於在同步迴旋加速器(synchro cyclotron)中之藉由共振頻率變更而對應複數個能量而將荷電粒子加速的高頻加速裝置者。 The present invention relates to the field of a circular accelerator for particle beam therapy, and more particularly to a high frequency acceleration device for accelerating charged particles by a plurality of energies by a resonance frequency change in a synchro cyclotron. .
同步迴旋加速器係一種圓形加速器,該圓形加速器係在屬於偏向電磁鐵之相對向之磁極之間隙的磁極間距(gap)中,一面使荷電粒子以描繪螺旋軌道之方式旋繞一面加速至高能量的圓形加速器。荷電粒子係從同步迴旋加速器的中心入射至磁極間距,藉由經由偏向電磁鐵及磁極所形成的磁場,在磁極間距中旋繞運動。高頻加速裝置係在電極部形成與荷電粒子之旋繞頻率同步後的電場,對荷電粒子提供能量。荷電粒子的旋繞頻率會隨著能量的增大而降低,因此為了使形成於電極部之電場的頻率與荷電粒子的旋繞頻率同步降低,必須使對於電極部供給電力之高頻加速裝置的共振頻率隨著荷電粒子的加速而降低。 荷電粒子的旋繞頻率,係依照從同步迴旋加速器射出的射出能量、及同步迴旋加速器之偏向電磁鐵的磁場分布而決定。 A synchrocyclotron is a circular accelerator that is in the gap between the poles belonging to the gap of the opposite poles of the electromagnet, and accelerates the charged particles to a high energy by rotating the charged particles in a manner of drawing a spiral orbit. Round accelerator. The charged particles are incident from the center of the synchrocyclotron to the magnetic pole pitch, and are wound in a magnetic pole pitch by a magnetic field formed by biasing the electromagnet and the magnetic pole. The high-frequency acceleration device generates an electric field to the charged particles by forming an electric field in the electrode portion in synchronization with the winding frequency of the charged particles. The winding frequency of the charged particles decreases as the energy increases. Therefore, in order to reduce the frequency of the electric field formed in the electrode portion and the winding frequency of the charged particles, it is necessary to make the resonance frequency of the high-frequency acceleration device that supplies electric power to the electrode portion. Decreased as the charged particles accelerate. The winding frequency of the charged particles is determined according to the emission energy emitted from the synchrocyclotron and the magnetic field distribution of the electromagnet of the synchrocyclotron.
高頻加速裝置的共振頻率係依照高頻加速裝置的靜電電容與電感(inductance)來決定。高頻加速裝置係例如藉由屬於形成電場之電極部的D型電極、將電力傳遞至D型電極的傳送線路、及使共振頻率變化的旋轉電容器(condenser)等而構成。在專利文獻1中,係揭示一種相當於高頻加速裝置的RF構造體,該RF構造體係將高頻(RF)電壓施加於同步迴旋加速器的D型電極。專利文獻1的高頻加速裝置,係包括2個調整共振頻率的可變電抗(reactance)元件(可變電容性電抗元件)。第一可變電抗元件係為旋轉電容器,第二可變電抗元件係為藉由內導體及與該內導體相對向的極板(plate)所形成的電容器。此極板係局部變更高頻加速裝置的內導體與外導體的距離,以調整靜電電容。如此,在專利文獻1的高頻加速裝置中,係為了要變更藉由旋轉電容器而成的共振頻率帶域,乃使用了調整高頻加速裝置之靜電電容的極板。 The resonance frequency of the high-frequency acceleration device is determined in accordance with the capacitance and inductance of the high-frequency acceleration device. The high-frequency acceleration device is configured by, for example, a D-type electrode that belongs to an electrode portion that forms an electric field, a transmission line that transmits power to the D-type electrode, and a rotating capacitor that changes a resonance frequency. Patent Document 1 discloses an RF structure corresponding to a high-frequency acceleration device that applies a high-frequency (RF) voltage to a D-type electrode of a synchrocyclotron. The high-frequency acceleration device of Patent Document 1 includes two variable reactance elements (variable capacitive reactance elements) for adjusting a resonance frequency. The first variable reactance element is a rotating capacitor, and the second variable reactance element is a capacitor formed by an inner conductor and a plate facing the inner conductor. The plate partially changes the distance between the inner conductor and the outer conductor of the high-frequency acceleration device to adjust the electrostatic capacitance. As described above, in the high-frequency acceleration device of Patent Document 1, in order to change the resonance frequency band by the rotation of the capacitor, an electrode plate for adjusting the capacitance of the high-frequency acceleration device is used.
在專利文獻2中,係揭示一種共振頻率調整機構,該共振頻率調整機構係為了防止在屬於圓形加速器之迴旋加速器中的D型電極與共振腔(加速腔)之靜電電容的增大,而包括了與D型電極相對向的結合電容器體、連接於結合電容器體的內導體、包圍D型電極與內導體的外導體、及以可滑動之方式設於內導體與外導體之間的短 路板。專利文獻2的共振頻率調整機構,係藉由變更短路板的位置,而調整了串聯連接於結合電容器體與D型電極之靜電電容的電感(inductance),以調整了共振電路的共振頻率。 Patent Document 2 discloses a resonance frequency adjustment mechanism for preventing an increase in electrostatic capacitance of a D-type electrode and a resonance cavity (acceleration cavity) in a cyclotron belonging to a circular accelerator. The invention includes a bonded capacitor body opposite to the D-type electrode, an inner conductor connected to the combined capacitor body, an outer conductor surrounding the D-type electrode and the inner conductor, and a short slidably disposed between the inner conductor and the outer conductor Road board. The resonance frequency adjustment mechanism of Patent Document 2 adjusts the inductance of the capacitance connected in series with the capacitance of the junction capacitor body and the D-type electrode by changing the position of the short-circuit plate to adjust the resonance frequency of the resonance circuit.
專利文獻1:日本特表2015-532509號公報(0135至0138段路、第27圖) Patent Document 1: Japanese Laid-Open Patent Publication No. 2015-532509 (paragraphs 0135 to 0138, paragraph 27)
專利文獻2:日本特開平11-354299號公報(0033至0036段落、第11圖) Patent Document 2: Japanese Laid-Open Patent Publication No. Hei 11-354299 (paragraphs 0033 to 0036, and FIG. 11)
在用於粒子束治療的同步迴旋加速器中,為了取出適於治療部位之能量的荷電粒子射束,必須變更從同步迴旋加速器射出之射出射束的能量。在要變更從同步迴旋加速器射出之射出射束的能量時,必須大幅變更共振頻率。在專利文獻1的高頻加速裝置中,當要變更射出射束的能量之際將藉由極板而成的靜電電容增大時,藉由旋轉電容器調整靜電電容的幅度就會相對變小,高頻加速裝置的頻率調整幅度會狹帶域化。結果,將難以擴增射出射束的能量變更幅度。亦即,專利文獻1之具有高頻加速裝置的同步迴旋加速器,難以取出適於距離皮膚之深度範圍較大之治療部位等之能量的荷電粒子射束。 In a synchrocyclotron for particle beam therapy, in order to extract a charged particle beam suitable for the energy of a treatment site, it is necessary to change the energy of the emitted beam emitted from the synchrocyclotron. When the energy of the outgoing beam emitted from the synchrocyclotron is to be changed, the resonance frequency must be greatly changed. In the high-frequency acceleration device of Patent Document 1, when the capacitance of the output beam is to be increased, the capacitance of the electrostatic capacitance is increased by the rotation of the rotating capacitor, and the amplitude of the electrostatic capacitance is relatively small. The frequency adjustment range of the high-frequency acceleration device is narrowed. As a result, it will be difficult to amplify the energy change range of the outgoing beam. In other words, in the synchrocyclotron having the high-frequency acceleration device of Patent Document 1, it is difficult to take out a charged particle beam suitable for energy such as a treatment site having a large depth range from the skin.
此外,專利文獻2的共振頻率調整機構,由於與迴旋加速器之D型電極相對向的結合電容器體設於共振腔(加速腔),因此專利文獻2的迴旋加速器係配置成連接於結合電容器體的內導體,朝與荷電粒子旋繞於包圍共振腔(加速腔)之磁極及磁軛(yoke)之軌道面垂直的方向貫通。因此,專利文獻2的迴旋加速器,會有在共振腔(加速腔)形成磁場的磁極及磁軛的形狀變得複雜的問題。要將專利文獻2之共振頻率調整機構應用於同步迴旋加速器時,也會有在共振腔(加速腔)形成磁場的磁極及磁軛的形狀變得複雜的問題。 Further, in the resonance frequency adjusting mechanism of Patent Document 2, since the coupling capacitor body facing the D-type electrode of the cyclotron is provided in the resonance cavity (acceleration cavity), the cyclotron of Patent Document 2 is configured to be connected to the capacitor body. The inner conductor penetrates in a direction perpendicular to the orbital surface of the magnetic pole and the yoke surrounding the resonant cavity (acceleration cavity). Therefore, in the cyclotron of Patent Document 2, there is a problem that the shape of the magnetic pole and the yoke which form a magnetic field in the resonant cavity (acceleration cavity) becomes complicated. When the resonance frequency adjustment mechanism of Patent Document 2 is applied to a synchrocyclotron, there is a problem that the shape of the magnetic pole and the yoke which form a magnetic field in the resonance cavity (acceleration cavity) becomes complicated.
本發明之目的為獲得一種不會使磁極及磁軛的形狀複雜化,而可將對應靜電電容調整幅度而變化之共振頻率的調整帶域變更為寬帶域之圓形加速器的高頻加速裝置。 An object of the present invention is to obtain a high-frequency acceleration device that can change a tuning band of a resonance frequency that changes in accordance with a capacitance adjustment range to a wide-band circular accelerator without complicating the shape of the magnetic pole and the yoke.
本發明之圓形加速器的高頻加速裝置,係一種將高頻電場施加於因為由圓形加速器的偏向電磁鐵所形成的偏向磁場而沿著螺旋軌道旋繞的荷電粒子,而將該荷電粒子加速的圓形加速器的高頻加速裝置。圓形加速器的高頻加速裝置係包括:電極,係施加高頻電場於荷電粒子;傳送線路,係具有內導體及包圍內導體的外導體,且將高頻電力傳送至電極;加速腔,係藉由傳送線路與電極而構成;以及可變電容性電抗元件及頻率調整機構,係變更加速腔的共振頻率。圓形加速器之高頻加速裝置的頻率 調整機構係包括:調整機構內導體,係連接於傳送線路的內導體,而且朝從內導體離開的方向延伸;調整機構外導體,係連接於傳送線路的外導體,而且包住調整機構內導體;可動短路板,係由導體所構成,且電性連接調整機構內導體與調整機構外導體,而且配置成可變更與調整機構內導體及調整機構外導體的連接位置。 The high-frequency acceleration device of the circular accelerator of the present invention is a method in which a high-frequency electric field is applied to charged particles which are spirally orbited by a bias magnetic field formed by a biasing electromagnet of a circular accelerator, and the charged particles are accelerated. A high-frequency acceleration device for a circular accelerator. The high-frequency acceleration device of the circular accelerator includes: an electrode that applies a high-frequency electric field to the charged particles; and a transmission line that has an inner conductor and an outer conductor surrounding the inner conductor, and transmits high-frequency power to the electrode; The transmission line and the electrode are configured; and the variable capacitance reactance element and the frequency adjustment mechanism change the resonance frequency of the acceleration cavity. Frequency of high-frequency acceleration device of circular accelerator The adjusting mechanism comprises: an inner conductor of the adjusting mechanism, which is connected to the inner conductor of the transmission line, and extends away from the inner conductor; the outer conductor of the adjusting mechanism is connected to the outer conductor of the transmission line, and encloses the inner conductor of the adjusting mechanism The movable short-circuiting plate is composed of a conductor, and is electrically connected to the inner conductor of the adjusting mechanism and the outer conductor of the adjusting mechanism, and is arranged to change the connection position with the inner conductor of the adjusting mechanism and the outer conductor of the adjusting mechanism.
本發明之圓形加速器的高頻加速裝置係包括變更加速腔之共振頻率的可變電容性電抗元件及頻率調整機構,頻率調整機構的調整機構內導體係連接於傳送線路的內導體,而且朝從內導體離開的方向延伸,頻率調整機構的可動短路板係電性連接調整機構內導體與調整機構外導體,而且配置成可變更與調整機構內導體及調整機構外導體的連接位置,因此可大幅變更對應靜電電容調整幅度而變化之共振頻率的調整帶域,而不會使之狹帶域化。 The high-frequency acceleration device of the circular accelerator of the present invention includes a variable capacitive reactance element and a frequency adjustment mechanism that change the resonance frequency of the acceleration cavity, and the internal conduction system of the adjustment mechanism of the frequency adjustment mechanism is connected to the inner conductor of the transmission line, and The movable short-circuiting plate of the frequency adjusting mechanism is electrically connected to the inner conductor of the adjusting mechanism and the outer conductor of the adjusting mechanism, and is arranged to change the connection position with the inner conductor of the adjusting mechanism and the outer conductor of the adjusting mechanism. The adjustment band of the resonance frequency that changes according to the capacitance adjustment range is drastically changed without narrowing the band.
1‧‧‧同步迴旋加速器(圓形加速器) 1‧‧‧Synchronous cyclotron (circular accelerator)
2‧‧‧高頻加速裝置 2‧‧‧High frequency acceleration device
3a、3b‧‧‧電性線圈 3a, 3b‧‧‧Electrical coil
4a、4b‧‧‧磁軛 4a, 4b‧‧‧ yoke
5‧‧‧離子源 5‧‧‧Ion source
6‧‧‧D型電極(電極) 6‧‧‧D type electrode (electrode)
7‧‧‧虛設D型電極(電極) 7‧‧‧Dummy D-type electrode (electrode)
8‧‧‧傳送線路 8‧‧‧Transmission line
9‧‧‧輸入端口 9‧‧‧Input port
10‧‧‧輸入耦合器 10‧‧‧Input coupler
11‧‧‧旋轉電容器(可變電容性電抗元件) 11‧‧‧Rotating Capacitor (Variable Capacitive Reactive Component)
12‧‧‧調整機構內導體 12‧‧‧Adjusting the inner conductor of the mechanism
13‧‧‧可動短路板 13‧‧‧ movable short circuit board
14‧‧‧調整機構外導體 14‧‧‧Adjusting the outer conductor of the mechanism
14A‧‧‧外導體凹部 14A‧‧‧Outer conductor recess
14B‧‧‧外導體凸部 14B‧‧‧Outer conductor projection
15‧‧‧射出導管 15‧‧‧Injection catheter
16‧‧‧外導體 16‧‧‧Outer conductor
16A‧‧‧磁極側外導體 16A‧‧‧magnetic side outer conductor
16B‧‧‧第一傳送外導體 16B‧‧‧First transmission outer conductor
16C‧‧‧第二傳送外導體 16C‧‧‧Second transmission outer conductor
16D‧‧‧第三傳送外導體 16D‧‧‧Third transmission outer conductor
16E‧‧‧第四傳送外導體 16E‧‧‧fourth transmission outer conductor
17‧‧‧內導體 17‧‧‧ Inner conductor
17A‧‧‧第一傳送內導體 17A‧‧‧First transmission inner conductor
17B‧‧‧第二傳送內導體 17B‧‧‧Second transfer inner conductor
18‧‧‧旋轉電容器軸 18‧‧‧Rotating capacitor shaft
19‧‧‧固定葉片 19‧‧‧Fixed blades
20‧‧‧旋轉葉片 20‧‧‧Rotating blades
21‧‧‧旋轉電容器外周圍導體 21‧‧‧Rotating capacitor outer peripheral conductor
22‧‧‧荷電粒子射束 22‧‧‧charged particle beam
30‧‧‧加速間距 30‧‧‧Acceleration spacing
31‧‧‧粒子軌道 31‧‧‧ Particle Orbit
32a、32b‧‧‧磁極 32a, 32b‧‧‧ magnetic pole
33‧‧‧軌道面 33‧‧‧Track surface
41‧‧‧偏向電磁鐵 41‧‧‧ biased electromagnet
42‧‧‧加速腔 42‧‧‧Acceleration chamber
43‧‧‧頻率調整機構 43‧‧‧frequency adjustment mechanism
44‧‧‧電源 44‧‧‧Power supply
45‧‧‧驅動裝置 45‧‧‧ drive
46‧‧‧旋轉棒 46‧‧‧Rotating rod
47‧‧‧驅動裝置 47‧‧‧ drive
48‧‧‧移動棒 48‧‧‧Mobile stick
51至54‧‧‧旋繞頻率特性 51 to 54‧‧‧ gyro frequency characteristics
55至58‧‧‧共振頻率特性 55 to 58‧‧‧Resonance frequency characteristics
61a至61f‧‧‧虛線 61a to 61f‧‧‧ dotted line
62a至62c‧‧‧虛線 62a to 62c‧‧‧ dotted line
63a、63b‧‧‧虛線 63a, 63b‧‧‧ dotted line
71‧‧‧外導體凸部 71‧‧‧Outer conductor projection
a、b‧‧‧直徑 a, b‧‧‧ diameter
B‧‧‧磁場 B‧‧‧ Magnetic field
c‧‧‧光速 c‧‧‧Light speed
C1、C2‧‧‧電容 C 1 , C 2 ‧‧‧ capacitor
d‧‧‧電感設定距離 d‧‧‧Inductance setting distance
Da‧‧‧可移動距離 Da‧‧‧ movable distance
Db‧‧‧可移動距離 Db‧‧‧ movable distance
ε‧‧‧介電常數 Ε‧‧‧ dielectric constant
f1‧‧‧旋繞頻率 F1‧‧‧screw frequency
L‧‧‧電感 L‧‧‧Inductance
m‧‧‧質量 m‧‧‧Quality
q‧‧‧電荷 q‧‧‧Charge
r‧‧‧半徑 R‧‧‧ Radius
γ‧‧‧勞侖茲因子 γ‧‧‧Lorrentz factor
t1、t2‧‧‧加速時間 T1, t2‧‧‧ acceleration time
v‧‧‧速度 V‧‧‧speed
WFB1、WFB2‧‧‧共振頻率帶域 WFB1, WFB2‧‧‧ resonance frequency band
WFB3、WFB4‧‧‧共振頻率帶域 WFB3, WFB4‧‧‧ resonance frequency band
Z、ZL‧‧‧合成阻抗 Z, Z L ‧‧‧ synthetic impedance
Z0、Z1、Z2‧‧‧特性阻抗 Z 0 , Z 1 , Z 2 ‧‧‧ Characteristic impedance
Zc、Zdee‧‧‧特性阻抗 Zc, Z dee ‧‧‧ Characteristic impedance
Zs‧‧‧阻抗 Zs‧‧‧ impedance
第1圖係為顯示本發明之實施形態1之圓形加速器之概略構成圖的剖面示意圖。 Fig. 1 is a schematic cross-sectional view showing a schematic configuration of a circular accelerator according to a first embodiment of the present invention.
第2圖係為顯示本發明之實施形態1之圓形加速器之概略構成圖之第1圖之A1-A1剖面的剖面示意圖。 Fig. 2 is a cross-sectional view showing a cross section taken along the line A1-A1 of Fig. 1 showing a schematic configuration diagram of the circular accelerator according to the first embodiment of the present invention.
第3圖係為顯示第2圖之高頻加速裝置之概略構成圖的剖面示意圖。 Fig. 3 is a schematic cross-sectional view showing a schematic configuration diagram of the high-frequency acceleration device of Fig. 2.
第4圖係為第3圖之調整機構的放大圖。 Fig. 4 is an enlarged view of the adjustment mechanism of Fig. 3.
第5圖係為第4圖之A3-A3剖面之旋轉電容器的剖面圖。 Fig. 5 is a cross-sectional view showing the rotary capacitor of the A3-A3 cross section of Fig. 4.
第6圖係為顯示本發明之實施形態1之圓形加速器中之旋繞頻率的上限值及下限值之例的圖。 Fig. 6 is a view showing an example of an upper limit value and a lower limit value of a winding frequency in a circular accelerator according to the first embodiment of the present invention.
第7圖係為顯示藉由第2圖之頻率調整機構而成之旋繞頻率之變更例的圖。 Fig. 7 is a view showing a modified example of the winding frequency obtained by the frequency adjusting mechanism of Fig. 2.
第8圖係為顯示第2圖之高頻加速裝置之特性阻抗(impedance)之分布例的圖。 Fig. 8 is a view showing an example of distribution of characteristic impedance of the high-frequency acceleration device of Fig. 2;
第9圖係為第4圖之A4-A4剖面之調整機構的剖面圖。 Fig. 9 is a cross-sectional view showing the adjustment mechanism of the A4-A4 cross section of Fig. 4.
第10圖係為說明第4圖之外導體凸部之必要性的圖。 Fig. 10 is a view for explaining the necessity of the conductor projections in Fig. 4;
第11圖係為顯示本發明之實施形態1之高頻加速裝置之共振頻率特性的圖。 Fig. 11 is a view showing the resonance frequency characteristics of the high-frequency acceleration device according to the first embodiment of the present invention.
第12圖係為顯示比較例之高頻加速裝置之共振頻率特性的圖。 Fig. 12 is a view showing the resonance frequency characteristics of the high-frequency acceleration device of the comparative example.
(實施形態1) (Embodiment 1)
第1圖係為顯示本發明之實施形態1之圓形加速器之概略構成圖的剖面示意圖。第2圖係為顯示本發明之實施形態1之圓形加速器之概略構成圖之第1圖之A1-A1剖面的剖面示意圖。第3圖係為顯示第2圖之高頻加速裝置之概略構成圖的剖面示意圖。第4圖係為第3圖之調整機構的放大圖。第5圖係為第4圖之A3-A3剖面之旋轉電容器的剖面圖。第6圖係為顯示本發明之實施形態1之圓形加速器中之旋繞頻率的上限值及下限值之例的圖。第7圖係 為顯示藉由第2圖之頻率調整機構而成之旋繞頻率之變更例的圖。第8圖係為顯示第2圖之高頻加速裝置之特性阻抗之分布例的圖。第9圖係為第4圖之A4-A4剖面之調整機構的剖面圖。第10圖係為說明第4圖之外導體凸部之必要性的圖。第11圖係為顯示本發明之實施形態1之高頻加速裝置之共振頻率特性的圖。第12圖係為顯示比較例之高頻加速裝置之共振頻率特性的圖。屬於圓形加速器的同步迴旋加速器1係包括:偏向電磁鐵41;設置於偏向電磁鐵41之中央的離子(ion)源5;將從離子源5所射入的荷電粒子予以加速的高頻加速裝置2;將加速後的荷電粒子取出至加速器外的射出導管(duct)15。另外,適宜將荷電粒子簡稱為粒子。 Fig. 1 is a schematic cross-sectional view showing a schematic configuration of a circular accelerator according to a first embodiment of the present invention. Fig. 2 is a cross-sectional view showing a cross section taken along the line A1-A1 of Fig. 1 showing a schematic configuration diagram of the circular accelerator according to the first embodiment of the present invention. Fig. 3 is a schematic cross-sectional view showing a schematic configuration diagram of the high-frequency acceleration device of Fig. 2. Fig. 4 is an enlarged view of the adjustment mechanism of Fig. 3. Fig. 5 is a cross-sectional view showing the rotary capacitor of the A3-A3 cross section of Fig. 4. Fig. 6 is a view showing an example of an upper limit value and a lower limit value of a winding frequency in a circular accelerator according to the first embodiment of the present invention. Figure 7 A diagram showing a modified example of the winding frequency obtained by the frequency adjustment mechanism of Fig. 2 . Fig. 8 is a view showing an example of distribution of characteristic impedances of the high-frequency acceleration device of Fig. 2; Fig. 9 is a cross-sectional view showing the adjustment mechanism of the A4-A4 cross section of Fig. 4. Fig. 10 is a view for explaining the necessity of the conductor projections in Fig. 4; Fig. 11 is a view showing the resonance frequency characteristics of the high-frequency acceleration device according to the first embodiment of the present invention. Fig. 12 is a view showing the resonance frequency characteristics of the high-frequency acceleration device of the comparative example. The synchrocyclotron 1 belonging to the circular accelerator includes a deflecting electromagnet 41, an ion source 5 disposed at the center of the deflecting electromagnet 41, and a high-frequency acceleration for accelerating the charged particles incident from the ion source 5. Device 2: The accelerated charged particles are taken out to an exit duct 15 outside the accelerator. Further, the charged particles are preferably referred to simply as particles.
偏向電磁鐵41係包括:隔開間隙而配置的2個電性線圈3a、3b;及彼此相對向的2個磁軛(yoke)4a、4b,分別具有被該等電性線圈3a、3b激磁的磁極32a、32b。高頻加速裝置2係包括:D型電極6,配置於磁極32a與磁極32b的間隙(磁極間距);虛設(dummy)D型電極7;傳送線路8,將電力傳送至D型電極6及虛設D型電極7;加速腔42,藉由傳送線路8、D型電極6及虛設D型電極7所構成;輸入端口(port)9,將電力輸入至加速腔42;輸入耦合器(coupler)10;以及可變電容性電抗元件(旋轉電容器11)及頻率調整機構43,變更加速腔42的共振頻率。可變電容性電抗元件係例如為旋轉電容器11。頻率調整機構43係包括調整機構內導體12、由導體所構成的可動短路板 13及調整機構外導體14,以調整藉由可變電容性電抗元件變更之共振頻率之可變更的帶域,亦即共振頻率帶域。 The deflecting electromagnet 41 includes two electric coils 3a and 3b disposed with a gap therebetween, and two yokes 4a and 4b opposed to each other, respectively excited by the electric coils 3a and 3b. Magnetic poles 32a, 32b. The high-frequency acceleration device 2 includes a D-type electrode 6, a gap (magnetic pole pitch) disposed between the magnetic pole 32a and the magnetic pole 32b, a dummy D-type electrode 7, and a transmission line 8 for transmitting power to the D-type electrode 6 and dummy D-type electrode 7; acceleration chamber 42 is constituted by transmission line 8, D-type electrode 6 and dummy D-type electrode 7; input port 9 inputs power to acceleration chamber 42; input coupler 10 And a variable capacitive reactance element (rotating capacitor 11) and a frequency adjusting mechanism 43 that change the resonant frequency of the acceleration chamber 42. The variable capacitive reactance element is, for example, a rotary capacitor 11 . The frequency adjustment mechanism 43 includes an adjustment mechanism inner conductor 12 and a movable short circuit plate composed of a conductor. 13 and adjusting the mechanism outer conductor 14 to adjust the variable band of the resonant frequency changed by the variable capacitive reactance element, that is, the resonant frequency band.
高頻加速裝置2係為同軸構造,具有外導體16與內導體17。高頻加速裝置2的外導體16係具有5個區域,高頻加速裝置2的內導體17係具有2個區域。5個區域中的外導體16係分別為磁極側外導體16A、第一傳送外導體16B、第二傳送外導體16C、第三傳送外導體16D、及第四傳送外導體16E。磁極側外導體16A係為虛線61a與虛線61b之間之區域中的外導體16,第一傳送外導體16B係為虛線61b與虛線61c之間之區域中的外導體16。第二傳送外導體16C係為虛線61c與虛線61d之間之區域中的外導體16,第三傳送外導體16D係為虛線61d與虛線61e之間之區域中的外導體16,第四傳送外導體16E係為虛線61e與虛線61f之間之區域中的外導體16。2個區域中的內導體17,係分別為第一傳送內導體17A、第二傳送內導體17B。第一傳送內導體17A係為虛線62a與虛線62b之間之區域中的內導體17,第二傳送內導體17B係為虛線62b與虛線62c之間之區域中的內導體17。 The high-frequency acceleration device 2 has a coaxial structure and has an outer conductor 16 and an inner conductor 17. The outer conductor 16 of the high-frequency acceleration device 2 has five regions, and the inner conductor 17 of the high-frequency acceleration device 2 has two regions. The outer conductors 16 in the five regions are a magnetic pole side outer conductor 16A, a first transmitting outer conductor 16B, a second transmitting outer conductor 16C, a third transmitting outer conductor 16D, and a fourth transmitting outer conductor 16E, respectively. The magnetic pole side outer conductor 16A is the outer conductor 16 in the region between the broken line 61a and the broken line 61b, and the first transmission outer conductor 16B is the outer conductor 16 in the region between the broken line 61b and the broken line 61c. The second transfer outer conductor 16C is the outer conductor 16 in the region between the broken line 61c and the broken line 61d, and the third transfer outer conductor 16D is the outer conductor 16 in the region between the broken line 61d and the broken line 61e, the fourth transfer outer The conductor 16E is the outer conductor 16 in the region between the broken line 61e and the broken line 61f. The inner conductor 17 in the two regions is the first transfer inner conductor 17A and the second transfer inner conductor 17B, respectively. The first transfer inner conductor 17A is the inner conductor 17 in the region between the broken line 62a and the broken line 62b, and the second transfer inner conductor 17B is the inner conductor 17 in the region between the broken line 62b and the broken line 62c.
傳送線路8中的內導體17係在虛線62a的位置連接於D型電極6,外導體16係在虛線61a的位置連接於虛設D型電極7。來自電源44的電力係從輸入端口9輸入,透過電容式與傳送線路8結合的輸入耦合器10而供電至高頻加速裝置2。在此,係顯示輸入耦合器10電容式結合於內導體17之第二傳送內導體17B之例。頻率調整 機構43係配置於外導體16的第三傳送外導體16D、及與該第三傳送外導體16D相對向之內導體17的第二傳送內導體17B。調整機構內導體12係與內導體17的第三傳送外導體16D連接,且相對於內導體17之第三傳送外導體16D垂直地配置。可動短路板13係為了使內導體17與外導體16在調整機構內導體12的位置短路,亦即將其電性連接而使用,可達成沿著調整機構內導體12而調整其位置。如第3圖所示,以氣缸(air cylinder)等驅動裝置47來驅動移動棒48,該移動棒48係連接於可動短路板13,即可藉此將可動短路板13移動至任意的位置。 The inner conductor 17 in the transmission line 8 is connected to the D-type electrode 6 at the position of the broken line 62a, and the outer conductor 16 is connected to the dummy D-type electrode 7 at the position of the broken line 61a. The electric power from the power source 44 is input from the input port 9, and is supplied to the high-frequency acceleration device 2 through the input coupler 10 that is capacitively coupled to the transmission line 8. Here, an example in which the input coupler 10 is capacitively coupled to the second transfer inner conductor 17B of the inner conductor 17 is shown. Frequency adjustment The mechanism 43 is disposed on the third transmitting outer conductor 16D of the outer conductor 16 and the second transmitting inner conductor 17B of the inner conductor 17 facing the third transmitting outer conductor 16D. The adjustment mechanism inner conductor 12 is connected to the third transfer outer conductor 16D of the inner conductor 17, and is vertically disposed with respect to the third transfer outer conductor 16D of the inner conductor 17. The movable short-circuiting plate 13 is used to electrically connect the inner conductor 17 and the outer conductor 16 at the position of the inner conductor 12 of the adjustment mechanism, that is, to electrically connect them, and the position of the inner conductor 17 along the adjustment mechanism can be adjusted. As shown in Fig. 3, the moving rod 48 is driven by a driving device 47 such as an air cylinder, and the moving rod 48 is connected to the movable short-circuiting plate 13, whereby the movable short-circuiting plate 13 can be moved to an arbitrary position.
頻率調整機構43的調整機構外導體14係具有:外導體凹部14A,從第二傳送外導體16C及第四傳送外導體16E愈往內導體17靠近就愈狹窄;及外導體凸部14B,以從外導體凹部14A之底部(內導體側的面)朝外側離開之方式延伸。調整機構內導體12與外導體凸部14B係同軸構造。 The adjustment mechanism outer conductor 14 of the frequency adjustment mechanism 43 has an outer conductor recess 14A which becomes narrower as the second transfer outer conductor 16C and the fourth transfer outer conductor 16E approach the inner conductor 17; and the outer conductor projection 14B It extends from the bottom (the surface on the inner conductor side) of the outer conductor recess 14A toward the outside. The adjustment mechanism inner conductor 12 and the outer conductor convex portion 14B are coaxially constructed.
如第4圖及第5圖所示,旋轉電容器11係包括旋轉電容器外周圍導體21、旋轉葉片(blade)20、旋轉電容器軸18、及固定葉片19。旋轉電容器外周圍導體21係可旋轉地與傳送線路8中的外導體16連接。旋轉葉片20係連接於旋轉電容器外周圍導體21,固定葉片19係連接於與內導體17連接的旋轉電容器軸18。旋轉電容器外周圍導體21係如第3圖所示連接於旋轉棒46,旋轉棒46係連接於馬達(motor)等的驅動裝置45。旋轉葉片20係與 旋轉電容器外周圍導體21一同藉由驅動裝置45以旋轉電容器軸18為中心來旋轉。旋轉電容器11係藉由旋轉葉片20的旋轉,隨著旋轉葉片20與固定葉片19咬合(重疊)而增加靜電電容。反之,旋轉電容器11係隨著2個葉片(固定葉片19、旋轉葉片20)不再咬合,而降低靜電電容。旋轉葉片20及固定葉片19的形狀,係以滿足所需之靜電電容的時間依存性而被機械式地加工。 As shown in FIGS. 4 and 5, the rotary capacitor 11 includes a rotating capacitor outer peripheral conductor 21, a rotary blade 20, a rotary capacitor shaft 18, and a fixed vane 19. The outer peripheral conductor 21 of the rotary capacitor is rotatably coupled to the outer conductor 16 in the transmission line 8. The rotary vane 20 is connected to the outer peripheral conductor 21 of the rotary capacitor, and the fixed vane 19 is connected to the rotary capacitor shaft 18 connected to the inner conductor 17. The outer circumference conductor 21 of the rotary capacitor is connected to the rotating rod 46 as shown in Fig. 3, and the rotating rod 46 is connected to a driving device 45 such as a motor. Rotating blade 20 series The outer circumference conductor 21 of the rotary capacitor is rotated together with the drive unit 45 around the rotary capacitor shaft 18. The rotary capacitor 11 is increased in electrostatic capacitance by the rotation of the rotary vane 20 as the rotary vane 20 is engaged (overlapped) with the fixed vane 19. On the other hand, the rotary capacitor 11 reduces the electrostatic capacitance as the two blades (the fixed blade 19 and the rotary blade 20) are no longer engaged. The shape of the rotating blade 20 and the stationary blade 19 is mechanically processed to meet the time dependence of the required electrostatic capacitance.
接著說明實施形態1之同步迴旋加速器1的動作。藉由第1圖、第2圖所示的偏向電磁鐵41而朝第1圖的紙面垂直方向形成預定的偏向磁場。藉由此偏向磁場,使從離子源5所射入的粒子在磁極32a與磁極32b之間隙的軌道面33,亦即在磁極間距之間的軌道面33如粒子軌道31般地旋繞運動。進行旋繞運動的粒子,係以到達由D型電極6與虛設D型電極7之間隙所構成的加速間距30的時序(timing),在加速間距30形成加速電場。粒子每逢通過加速間距30就被加速電場加速,而使能量上升。隨著能量的上升,粒子的旋繞軌道會擴大。當粒子到達預定的能量時就會到達射出導管15,而射出至同步迴旋加速器1的外部。已到達預定能量的複數個粒子係作為荷電粒子射束22而被取出。加速間距30係為第1圖所記載之虛線63a與虛線63b之間的間隙(間距)。另外,第1圖之虛線63a所示的位置,係相當於第3圖之虛線61a所示的位置。 Next, the operation of the synchrocyclotron 1 of the first embodiment will be described. A predetermined deflecting magnetic field is formed in the vertical direction of the paper surface of the first drawing by the deflecting electromagnet 41 shown in Figs. 1 and 2 . By this biasing of the magnetic field, the particles incident from the ion source 5 are orbitally moved like the particle track 31 on the track surface 33 of the gap between the magnetic pole 32a and the magnetic pole 32b, that is, the track surface 33 between the magnetic pole pitches. The particles that perform the winding motion form an acceleration electric field at the acceleration pitch 30 by the timing of reaching the acceleration pitch 30 formed by the gap between the D-type electrode 6 and the dummy D-type electrode 7. The particles are accelerated by the accelerating electric field every time they pass the acceleration interval 30, and the energy is increased. As the energy rises, the orbital trajectory of the particles expands. When the particles reach a predetermined energy, they reach the injection duct 15 and are emitted to the outside of the synchrocyclotron 1. A plurality of particles that have reached the predetermined energy are taken out as the charged particle beam 22. The acceleration pitch 30 is a gap (pitch) between the broken line 63a and the broken line 63b described in Fig. 1 . Further, the position indicated by the broken line 63a in Fig. 1 corresponds to the position indicated by the broken line 61a in Fig. 3 .
隨著粒子在加速間距30被加速,粒子的實效性質量會因為相對論效應而增加,而旋繞頻率則降低。 為了使粒子在加速間距30持續加速,必須要形成配合旋繞頻率降低的加速電場。為此之故,要使高頻加速裝置2的共振頻率與從電源44所供給之電力的頻率,與降低之粒子的旋繞頻率一致,且從電源44透過傳送線路8而傳送已變更至加速間距30之頻率的電力。共振頻率係由高頻加速裝置2的電感與靜電電容所決定。由於粒子射入至同步迴旋加速器1後直到射出為止的時間係為ms程度,因此高頻加速裝置2的可變電容性電抗元件,係適用可達成使靜電電容高速變化之旋轉電容器11等可變電容性電抗元件。 As the particles are accelerated at the acceleration spacing 30, the effective mass of the particles increases due to the relativistic effect, while the winding frequency decreases. In order for the particles to continue to accelerate at the acceleration interval 30, it is necessary to form an accelerating electric field that reduces the frequency of the winding. For this reason, the resonance frequency of the high-frequency acceleration device 2 and the frequency of the power supplied from the power source 44 are matched with the winding frequency of the reduced particles, and the transmission from the power source 44 through the transmission line 8 is changed to the acceleration interval. 30 times the frequency of electricity. The resonance frequency is determined by the inductance and electrostatic capacitance of the high-frequency acceleration device 2. Since the time until the particles are incident on the synchrocyclotron 1 until the emission is about ms, the variable capacitance reactance element of the high-frequency acceleration device 2 is adapted to be variable in the rotary capacitor 11 such that the electrostatic capacitance can be changed at a high speed. Capacitive reactance components.
茲說明粒子之旋繞頻率的變化。為了簡單預估粒子之旋繞頻率的變化,乃考慮例如由偏向電磁鐵41所形成之磁場的強度相對於半徑方向(從中心往外周圍方向)設為固定的6T,以荷電粒子之例而言係將質子加速至235MeV。粒子的旋繞頻率f1,係以偏向電磁鐵41的磁場B、粒子的電荷q、粒子的質量m、粒子的勞侖茲因子(Lorentz factor)γ,藉由下述算式(1)來決定。 The change in the frequency of the winding of the particles is illustrated. In order to simply estimate the change in the winding frequency of the particles, it is considered that, for example, the intensity of the magnetic field formed by the deflection electromagnet 41 is fixed to 6T with respect to the radial direction (from the center to the outer circumferential direction), in the case of charged particles. Protons were accelerated to 235 MeV. The winding frequency f1 of the particles is determined by the following formula (1) by the magnetic field B of the electromagnet 41, the charge q of the particles, the mass m of the particles, and the Lorentz factor γ of the particles.
f1=qB/(2πγm)‧‧‧(1)惟,粒子的勞侖茲因子γ係使用粒子的速度v、光速c而藉由下述的算式(2)來決定。 F1=qB/(2πγm) ‧ ‧ (1) However, the Lorentz factor γ of the particle is determined by the following formula (2) using the velocity v and the speed of light c of the particle.
質子的初始旋繞頻率係將1代入算式(1)的γ而求出為91.4MHz。另一方面,由於射出時對應於質子之能量235MeV的勞侖茲因子γ為1.25,因此射出時之質子的旋繞頻率係從算式(1)求出為73.2MHz。如此,從加速 的初期至加速的完成為止,旋繞頻率會降低20%左右。為了獲得與該頻率降低一致的共振頻率,而藉由旋轉電容器11高速地變更高頻加速裝置2的靜電電容。 The initial winding frequency of the proton is obtained by substituting γ into the γ of the formula (1) to obtain 91.4 MHz. On the other hand, since the Lorentz factor γ of 235 MeV corresponding to protons at the time of emission is 1.25, the proton winding frequency at the time of emission is 73.2 MHz from the equation (1). So, from acceleration From the initial stage to the completion of the acceleration, the winding frequency is reduced by about 20%. In order to obtain a resonance frequency that matches the frequency drop, the electrostatic capacitance of the high-frequency acceleration device 2 is changed at a high speed by the rotary capacitor 11.
此外,取決於粒子之勞侖茲因子γ與磁場B之粒子的軌道半徑r係藉由下述算式(3)來決定。另外,軌道半徑r適宜簡稱為半徑r。 Further, the orbital radius r of the particles depending on the Lorentz factor γ of the particles and the magnetic field B is determined by the following formula (3). In addition, the track radius r is suitably referred to simply as the radius r.
r=γmv/qB‧‧‧(3) r=γmv/qB‧‧‧(3)
此時,藉由算式(3)從同步迴旋加速器1將屬於荷電粒子射束22的質子線取出的位置,會是以離子源5為中心之半徑r為0.29m的位置。第1圖所示的射出導管15係被設置成沿著可供被加速至所期望的能量且加速已完成的粒子通過的軌道。 At this time, the position at which the proton beam belonging to the charged particle beam 22 is taken out from the synchrocyclotron 1 by the equation (3) is a position at which the radius r around the ion source 5 is 0.29 m. The injection duct 15 shown in Fig. 1 is arranged along a track that can be accelerated to a desired energy and accelerate the passage of completed particles.
接著在已變更射出能量的情形下,亦著眼於使用相同的射出導管15,考慮藉由調整磁場B的強度來變更粒子的射出能量。第6圖係顯示了將射出位置設於0.29m之半徑r之位置時,相對於磁場B之強度之粒子的射出能量、粒子之旋繞頻率的上限值及下限值。粒子之旋繞頻率的上限值及下限值,係分別為加速初期的旋繞頻率及射出時的旋繞頻率。 Next, in the case where the emission energy has been changed, attention is also paid to the use of the same injection duct 15, and it is considered that the emission energy of the particles is changed by adjusting the intensity of the magnetic field B. Fig. 6 is a view showing the emission energy of the particles with respect to the intensity of the magnetic field B, the upper limit value and the lower limit value of the winding frequency of the particles when the emission position is set to the position of the radius r of 0.29 m. The upper limit and the lower limit of the winding frequency of the particles are the winding frequency at the initial stage of acceleration and the winding frequency at the time of emission.
使用第6圖可得知,為了將射出能量例如從235MeV變化至68.5MeV,必須使高頻加速裝置2的共振頻率變化為從最大值的91.4MHz至最小值的42.6MHz的廣帶域。此時之共振頻率的範圍,係大致成為平均值(中心值)之67.0MHz中的±40%的範圍。因此,可得知必須使 共振頻率變化為廣帶域而成為大致平均值(中心值)之±40%的範圍。 As can be seen from Fig. 6, in order to change the emission energy from, for example, 235 MeV to 68.5 MeV, it is necessary to change the resonance frequency of the high-frequency acceleration device 2 to a wide band of 42.6 MHz from the maximum value of 91.4 MHz to the minimum value. The range of the resonance frequency at this time is approximately ±40% of the average value (center value) of 67.0 MHz. Therefore, it can be known that it must be made The resonance frequency changes to a wide band and becomes a range of ±40% of the approximate average value (center value).
在實施形態1的同步迴旋加速器1中,係對應粒子的射出能量而藉由頻率調整機構43來變更高頻加速裝置2的電感L。在變更高頻加速裝置2的電感L時,係調整從可動短路板13至調整機構外導體14之外導體凹部14A為止的距離d(參照第9圖),以變更共振頻率、及藉由可變電容性電抗(旋轉電容器11)調整的共振頻率帶域。由於第9圖的距離d係為設定高頻加速裝置2之電感L的距離,因此適宜將第9圖的距離稱為電感設定距離。茲使用第7圖、第9圖來說明變更共振頻率及共振頻率帶域的基本概念。第7圖的橫軸係為粒子的加速時間,縱軸係為粒子的旋繞頻率。加速時間t1係為旋繞頻率成為上限值之加速初期的時間。加速時間t2係為旋繞頻率成為下限值之射出時的時間。 In the synchrocyclotron 1 of the first embodiment, the inductance L of the high-frequency acceleration device 2 is changed by the frequency adjustment mechanism 43 in accordance with the emission energy of the particles. When the inductance L of the high-frequency acceleration device 2 is changed, the distance d from the movable short-circuiting plate 13 to the outer conductor recess 14A of the adjustment mechanism outer conductor 14 is adjusted (see FIG. 9) to change the resonance frequency and The resonant frequency band adjusted by the variable capacitive reactance (rotating capacitor 11). Since the distance d in FIG. 9 is the distance between the inductance L of the high-frequency acceleration device 2, the distance in the ninth diagram is preferably referred to as the inductance setting distance. The basic concepts of changing the resonant frequency and the resonant frequency band will be described using Figs. 7 and 9. The horizontal axis of Fig. 7 is the acceleration time of the particles, and the vertical axis is the winding frequency of the particles. The acceleration time t1 is the time at which the winding frequency becomes the initial stage of the acceleration of the upper limit value. The acceleration time t2 is the time when the winding frequency is the lower limit value.
在第7圖中係顯示了4個旋繞頻率特性,亦即旋繞頻率特性51、52、53、54。旋繞頻率特性51係粒子的射出能量為235MeV,電感設定距離d為第9圖之d1時的特性。旋繞頻率特性52係粒子的射出能量為170MeV,電感設定距離d為第9圖之d2時的特性。旋繞頻率特性53係粒子的射出能量為114MeV,電感設定距離d為第9圖之d3時的特性。旋繞頻率特性54係粒子的射出能量為68.5MeV,電感設定距離d為第9圖之d4時的特性。第7圖所示之4個旋繞頻率特性51、52、53、54,係 分別顯示了對應第6圖所示之4個射出能量之例。 In Fig. 7, four winding frequency characteristics, i.e., winding frequency characteristics 51, 52, 53, 54 are shown. The winding frequency characteristic 51 is that the emission energy of the particles is 235 MeV, and the inductance setting distance d is the characteristic at d1 of the ninth graph. The winding frequency characteristic 52 is a characteristic in which the emission energy of the particles is 170 MeV and the inductance setting distance d is d2 in the ninth graph. The winding frequency characteristic 53 is such that the emission energy of the particles is 114 MeV, and the inductance setting distance d is the characteristic at d3 of the ninth graph. The winding frequency characteristic 54 is such that the emission energy of the particles is 68.5 MeV, and the inductance setting distance d is d4 of the ninth graph. The four winding frequency characteristics 51, 52, 53, 54 shown in Fig. 7 are An example of the four emission energies shown in Fig. 6 is shown separately.
當粒子的射出能量較高時,由於共振頻率帶域的上限頻率及下限頻率亦會成為較高的頻率,因此將可動短路板13至調整機構外導體14之外導體凹部14A之間的距離d保持得較短,將電感設定為較低。反之,當粒子的射出能量較低時,由於共振頻率帶域的上限頻率及下限頻率亦會成為較低的頻率,因此將可動短路板13至調整機構外導體14之外導體凹部14A之間的距離d保持得為較長,將電感設定為較高。第7圖、第9圖中之距離d的關係,係為d1<d2<d3<d4。 When the emission energy of the particles is high, since the upper limit frequency and the lower limit frequency of the resonance frequency band also become higher frequencies, the distance d between the movable short-circuit plate 13 and the outer conductor recess 14A of the adjustment mechanism outer conductor 14 is set. Keep it short and set the inductance to low. On the other hand, when the emission energy of the particles is low, since the upper limit frequency and the lower limit frequency of the resonance frequency band also become lower frequencies, the movable short circuit plate 13 is disposed between the outer conductor recess 14A of the adjustment mechanism outer conductor 14. The distance d is kept longer and the inductance is set higher. The relationship of the distance d in Fig. 7 and Fig. 9 is d1 < d2 < d3 < d4.
第8圖係顯示了高頻加速裝置2中之特性阻抗的分布例。一般而言,為了藉由旋轉電容器11將加速腔42的共振頻率變更為廣帶域,高頻加速裝置2的特性阻抗,係具有在高頻加速裝置2的中央部(第一傳送外導體16B、第一傳送內導體17A的部分)較低,隨著朝向兩端(磁極側外導體16A的部分與旋轉電容器11側的部分)而變高的分布。第8圖中的電容C1、C2係分別為加速間距30的電容、旋轉電容器11的電容。第8圖所示的虛線61a、62a、62b、62c係與第3圖所示的虛線61a、62a、62b、62c相同。第8圖的特性阻抗Zdee,係為磁極側外導體16A之部分的特性阻抗。特性阻抗Z1係為第一傳送內導體17A之部分的特性阻抗,特性阻抗Z2係為第二傳送內導體17B之部分的特性阻抗。在第8圖中,係顯示了特性阻抗Zdee、Z1、Z2分別為20Ω、5Ω、30Ω之例。 Fig. 8 shows an example of the distribution of the characteristic impedance in the high-frequency acceleration device 2. In general, in order to change the resonance frequency of the acceleration chamber 42 to the wide band by the rotation capacitor 11, the characteristic impedance of the high-frequency acceleration device 2 is in the central portion of the high-frequency acceleration device 2 (the first transmission outer conductor 16B) The portion of the first transfer inner conductor 17A is low, and becomes higher as it goes toward both ends (the portion of the magnetic pole side outer conductor 16A and the portion on the side of the rotary capacitor 11). The capacitors C 1 and C 2 in Fig. 8 are the capacitance of the acceleration pitch 30 and the capacitance of the rotating capacitor 11, respectively. The broken lines 61a, 62a, 62b, and 62c shown in Fig. 8 are the same as the broken lines 61a, 62a, 62b, and 62c shown in Fig. 3 . The characteristic impedance Z dee of Fig. 8 is the characteristic impedance of a portion of the magnetic pole side outer conductor 16A. The characteristic impedance Z 1 is a characteristic impedance of a portion of the first transmission inner conductor 17A, and the characteristic impedance Z 2 is a characteristic impedance of a portion of the second transmission inner conductor 17B. In Fig. 8, the characteristic impedances Z dee , Z 1 , and Z 2 are shown as 20 Ω, 5 Ω, and 30 Ω, respectively.
為了藉由頻率調整機構43大幅變更加速腔42的共振頻率,亦即高頻加速裝置2之共振頻率的調整帶域,係在從頻率調整機構43觀看D型電極側(D型電極6之側)時之合成阻抗ZL為較高的位置配置頻率調整機構43。此係因為在將頻率調整機構43的阻抗設為Zs時,包含了頻率調整機構43的合成阻抗Z要藉由下述算式(4)求出之故。換言之,為了將合成阻抗ZL設為較高,係以包含特性阻抗較高的區域為具有功效。因此,頻率調整機構43係以配置在最接近旋轉電容器11之特性阻抗較高部分的傳送線路8,亦即第二傳送內導體17B的部分為理想。 In order to greatly change the resonance frequency of the acceleration chamber 42 by the frequency adjustment mechanism 43, that is, the adjustment band of the resonance frequency of the high-frequency acceleration device 2, the D-type electrode side (the side of the D-type electrode 6) is viewed from the frequency adjustment mechanism 43. The frequency adjustment mechanism 43 is disposed at a higher position when the combined impedance Z L is higher. In this case, when the impedance of the frequency adjustment mechanism 43 is set to Zs, the combined impedance Z including the frequency adjustment mechanism 43 is obtained by the following formula (4). In other words, in order to set the combined impedance Z L to be high, it is effective to include a region having a high characteristic impedance. Therefore, the frequency adjustment mechanism 43 is preferably a portion of the transmission line 8 disposed closest to the characteristic impedance of the rotary capacitor 11, that is, the portion of the second transmission inner conductor 17B.
Z=ZsZL/(Zs+ZL)‧‧‧(4)惟,頻率調整機構43的阻抗Zs係使用特性阻抗Zc、從可動短路板13至外導體凹部14A之間的距離d、波數(傳遞常數)β而藉由下述算式(5)來決定。 Z=ZsZ L / (Zs + Z L ) ‧ ‧ (4) However, the impedance Zs of the frequency adjustment mechanism 43 is the characteristic impedance Zc, the distance d from the movable short-circuit plate 13 to the outer conductor concave portion 14A, and the wave number The (transfer constant) β is determined by the following formula (5).
Zs=iZc×tan(βd)‧‧‧(5)其中i為虛數單位。 Zs=iZc×tan(βd)‧‧‧(5) where i is an imaginary unit.
在頻率調整機構43中,係使用與傳送線路8之內導體17直接連接的調整機構內導體12,藉此可提升製作性,而且降低調整機構內導體12與傳送線路8之內導體17之交界面的熱損耗。在配置頻率調整機構43之傳送線路8中之特性阻抗較高的部分,亦即第二傳送內導體17B的部分,係傳送線路8之外導體16的直徑明顯地大於 內導體17的直徑。此係由於當例如以圓筒同軸管為例時,特性阻抗Z0係使用外導體16的直徑a與內導體17的直徑b、介電常數ε而藉由下述算式(6)來決定之故。亦即,為了增大傳送線路8之第二傳送內導體17B之部分中的特性阻抗,係以將傳送線路8之第二傳送內導體17B之部分中之外導體16的直徑a相對於內導體17的直徑b的比a/b,較傳送線路8之第一傳送內導體17A之部分中之外導體16的直徑a相對於內導體17的直徑b的比a/b更為增大之方式設計了外導體16及內導體17。另外,用以計算比a/b的直徑a、b係可為直徑亦可為半徑。 In the frequency adjustment mechanism 43, the adjustment mechanism inner conductor 12 directly connected to the inner conductor 17 of the transmission line 8 is used, whereby the manufacturability can be improved, and the intersection of the inner conductor 12 of the adjustment mechanism and the inner conductor 17 of the transmission line 8 can be reduced. Heat loss from the interface. The portion of the transmission line 8 in which the frequency adjustment mechanism 43 is disposed has a higher characteristic impedance, that is, the portion of the second transmission inner conductor 17B, and the diameter of the conductor 16 outside the transmission line 8 is significantly larger than the diameter of the inner conductor 17. This is because, for example, when a cylindrical coaxial tube is taken as an example, the characteristic impedance Z 0 is determined by the following formula (6) using the diameter a of the outer conductor 16 and the diameter b of the inner conductor 17 and the dielectric constant ε. Therefore. That is, in order to increase the characteristic impedance in the portion of the second transfer inner conductor 17B of the transmission line 8, the diameter a of the outer conductor 16 in the portion of the second transfer inner conductor 17B of the transmission line 8 is relative to the inner conductor. The ratio a/b of the diameter b of 17 is larger than the ratio a/b of the diameter a of the conductor 16 to the diameter b of the inner conductor 17 in the portion of the first transmission inner conductor 17A of the transmission line 8. The outer conductor 16 and the inner conductor 17 are designed. In addition, the diameter a and b used to calculate the ratio a/b may be a diameter or a radius.
例如,為了在介電常數1的真空中達成30Ω的特性阻抗,可依據算式(6)將a/b設為1.18。當將外導體16的直徑設為例如400mm時,內導體17的直徑係成為339mm,內導體17與外導體16的間隔係成為30.5mm。茲使用第10圖之例,考慮在內導體17與外導體16之間隔成為30.5mm的部分中,利用調整機構內導體12與可動短路板13變更電感的情形。第10圖中係顯示了調整機構內導體12之長度相同時之比較例的頻率調整機構。第10圖的外導體凸部71係為從外導體16延伸的凸部,相當於實施形態1的調整機構外導體14。在第10圖中係於30.5mm的間隙,亦即在較外導體凸部71更內側儘管插入有調整機構內導體12,但屬於從外導體凸部71的端部至外導體16 之距離的可移動距離Db係成為電感可變更的可移動距離,即使可動短路板13從該30.5mm的間隙更往內側移動,亦無法變更電感。在第10圖的比較例中,係利用調整機構內導體12與可動短路板13變更電感時,會產生在調整機構內導體12中無法調整的較長延伸部區域,亦即較外導體16更內側的區域。此延伸部區域會顯著地限制要藉由可動短路板13變更的共振頻率帶域。 For example, in order to achieve a characteristic impedance of 30 Ω in a vacuum of a dielectric constant 1, a/b can be set to 1.18 according to the formula (6). When the diameter of the outer conductor 16 is set to, for example, 400 mm, the diameter of the inner conductor 17 is 339 mm, and the interval between the inner conductor 17 and the outer conductor 16 is 30.5 mm. In the example of Fig. 10, in the portion where the distance between the inner conductor 17 and the outer conductor 16 is 30.5 mm, the inductance is changed by the adjustment mechanism inner conductor 12 and the movable short-circuiting plate 13. Fig. 10 shows a frequency adjustment mechanism of a comparative example in which the lengths of the inner conductors 12 of the adjustment mechanism are the same. The outer conductor convex portion 71 of Fig. 10 is a convex portion extending from the outer conductor 16, and corresponds to the adjustment mechanism outer conductor 14 of the first embodiment. In Fig. 10, the gap is 30.5 mm, that is, on the inner side of the outer conductor convex portion 71, although the adjustment mechanism inner conductor 12 is inserted, it belongs to the end portion from the outer conductor convex portion 71 to the outer conductor 16 The movable distance Db of the distance is a movable distance that can be changed by the inductance, and the inductance cannot be changed even if the movable short-circuiting plate 13 moves further inside from the 30.5 mm gap. In the comparative example of Fig. 10, when the inductance is changed by the adjustment mechanism inner conductor 12 and the movable short-circuiting plate 13, a long extension portion which cannot be adjusted in the inner conductor 12 of the adjustment mechanism is generated, that is, the outer conductor 16 is more The area inside. This extension region significantly limits the resonant frequency band to be changed by the movable shorting plate 13.
因此,在實施形態1的頻率調整機構43中,係在調整機構內導體12的周圍設置調整機構外導體14的外導體凹部14A。第9圖之調整機構外導體14中之剖面圖所示的距離D係相當於可供可動短路板13移動之調整機構內導體12的最短距離。藉由調整機構內導體12及外導體凸部14B而成的電感,係隨著從內導體17至可動短路板13之間的距離變長而增大。因此,為了縮短距離D,減少無法藉由可動短路板13調整的電感,在實施形態1的頻率調整機構43中係設置了調整機構外導體14。第10圖中係以虛線顯示了相當於實施形態1之頻率調整機構43之外導體凸部14B及從外導體凸部14B至外導體16為止之外導體凹部14A的部分。在比較例的頻率調整機構中,電感可進行調整的距離,亦即可動短路板13可進行移動的可移動距離係為Db。相對於此,在實施形態1的頻率調整機構43中,電感可進行調整的距離係為可移動距離Da,可動短路板13可進行移動的可移動距離Da係較比較例之可移動距離Db為長,因此可擴大電感的變更範圍。 Therefore, in the frequency adjustment mechanism 43 of the first embodiment, the outer conductor concave portion 14A of the adjustment mechanism outer conductor 14 is provided around the adjustment mechanism inner conductor 12. The distance D shown in the cross-sectional view of the outer conductor 14 of the adjusting mechanism of Fig. 9 corresponds to the shortest distance of the inner conductor 12 of the adjusting mechanism for moving the movable short-circuiting plate 13. The inductance by adjusting the mechanism inner conductor 12 and the outer conductor convex portion 14B increases as the distance from the inner conductor 17 to the movable short-circuiting plate 13 becomes longer. Therefore, in order to shorten the distance D and reduce the inductance that cannot be adjusted by the movable short-circuiting plate 13, the adjustment mechanism outer conductor 14 is provided in the frequency adjustment mechanism 43 of the first embodiment. In Fig. 10, a portion corresponding to the outer conductor convex portion 14B of the frequency adjusting mechanism 43 of the first embodiment and the outer conductor concave portion 14A from the outer conductor convex portion 14B to the outer conductor 16 is shown by a broken line. In the frequency adjustment mechanism of the comparative example, the distance over which the inductance can be adjusted, that is, the movable distance at which the movable short-circuiting plate 13 can move is Db. On the other hand, in the frequency adjustment mechanism 43 of the first embodiment, the distance at which the inductance can be adjusted is the movable distance Da, and the movable distance Da at which the movable short-circuiting plate 13 can move is compared with the movable distance Db of the comparative example. It is long, so it can expand the range of inductance change.
另外,在第10圖中,雖比較了包括具有外導體凹部14A之調整機構外導體14的頻率調整機構43、及調整機構內導體12之相同長度的比較例,惟即使是不包括外導體凹部14A的頻率調整機構43,亦可適用將調整機構內導體12之長度增長後的頻率調整機構43。即使是不包括外導體凹部14A,而是將調整機構內導體12的長度增長後的頻率調整機構43,亦可大幅地變更對應靜電電容調整幅度而變化之共振頻率的調整帶域而不會使之狹帶域化。此時,頻率調整機構43的長度雖會變長,但會有頻率調整機構43中的調整機構外導體14僅成為外導體凸部14B,構造被簡化的優點。另一方面,在包括具有外導體凹部14A之調整機構外導體14的頻率調整機構43中,則有頻率調整機構43之長度變短的優點。使用了包括具有外導體凹部14A之調整機構外導體14之頻率調整機構43的高頻加速裝置2,係可縮短屬於朝D型電極6之延伸方向垂直之方向之周圍方向的長度。D型電極6的延伸方向係為第3圖的橫方向,周圍方向係為第3圖的縱方向。 Further, in Fig. 10, a comparative example of the same length including the frequency adjusting mechanism 43 of the adjusting mechanism outer conductor 14 having the outer conductor recess 14A and the adjusting mechanism inner conductor 12 is compared, even if the outer conductor recess is not included. The frequency adjustment mechanism 43 of the 14A may be applied to the frequency adjustment mechanism 43 in which the length of the inner conductor 12 of the adjustment mechanism is increased. Even if the frequency adjustment mechanism 43 in which the length of the inner conductor 12 of the adjustment mechanism is increased without including the outer conductor recess 14A, the adjustment band of the resonance frequency which changes depending on the capacitance adjustment range can be largely changed without The narrow band is localized. At this time, although the length of the frequency adjustment mechanism 43 is long, the adjustment mechanism outer conductor 14 in the frequency adjustment mechanism 43 is only the outer conductor convex portion 14B, and the structure is simplified. On the other hand, in the frequency adjustment mechanism 43 including the adjustment mechanism outer conductor 14 having the outer conductor recess 14A, there is an advantage that the length of the frequency adjustment mechanism 43 is shortened. The high-frequency acceleration device 2 including the frequency adjustment mechanism 43 including the adjustment mechanism outer conductor 14 having the outer conductor recess 14A is used to shorten the length in the circumferential direction belonging to the direction perpendicular to the extending direction of the D-type electrode 6. The extending direction of the D-type electrode 6 is the horizontal direction of Fig. 3, and the peripheral direction is the longitudinal direction of Fig. 3.
茲使用第11圖、第12圖來說明實施形態1之高頻加速裝置2的效果。第11圖係顯示了實施形態1之高頻加速裝置2的共振頻率特性。為了進行比較,第12圖中顯示應用了專利文獻1之高頻加速裝置中所示之藉由極板而成之高頻調整機構時的結果。在第11圖、第12圖中,橫軸係為旋轉電容器的靜電電容,縱軸係為高頻加速裝置的共振頻率。使用於第11圖、第12圖之特性計算上 之高頻加速裝置的特性阻抗分布係相同。第11圖所示的共振頻率特性55、56係分別為將電感設定距離d設為3cm、9cm時之共振頻率的分布。可得知藉由將電感設定距離d增長為從3cm至9cm,即可達成既維持分布形狀,又使共振頻率降低20MHz左右。共振頻率特性55、56中之相對於100pF至300pF之旋轉電容器靜電電容的共振頻率帶域,係分別為共振頻率帶域WFB1、WFB2。共振頻率帶域WFB1係為33MHz,共振頻率帶域WFB2係為27MHz。共振頻率帶域WFB2係為共振頻率帶域WFB1的82%,共振頻率特性56的分布形狀係充分維持共振頻率特性55的分布形狀,並未狹帶域化。 The effects of the high-frequency acceleration device 2 of the first embodiment will be described with reference to Figs. 11 and 12 . Fig. 11 is a view showing the resonance frequency characteristics of the high-frequency acceleration device 2 of the first embodiment. For comparison, FIG. 12 shows the results when the high-frequency adjustment mechanism by the electrode plate shown in the high-frequency acceleration device of Patent Document 1 is applied. In FIGS. 11 and 12, the horizontal axis represents the capacitance of the rotary capacitor, and the vertical axis represents the resonance frequency of the high-frequency acceleration device. Used in the calculation of the characteristics of Figure 11 and Figure 12 The characteristic impedance distribution of the high frequency acceleration device is the same. The resonance frequency characteristics 55 and 56 shown in Fig. 11 are distributions of resonance frequencies when the inductance setting distance d is set to 3 cm and 9 cm, respectively. It can be seen that by increasing the inductance setting distance d from 3 cm to 9 cm, it is possible to maintain the distribution shape while reducing the resonance frequency by about 20 MHz. The resonant frequency bands of the resonant capacitors 55, 56 with respect to the electrostatic capacitance of the rotating capacitor of 100 pF to 300 pF are the resonant frequency bands WFB1, WFB2, respectively. The resonant frequency band WFB1 is 33 MHz, and the resonant frequency band WFB2 is 27 MHz. The resonance frequency band WFB2 is 82% of the resonance frequency band WFB1, and the distribution shape of the resonance frequency characteristic 56 sufficiently maintains the distribution shape of the resonance frequency characteristic 55, and is not narrowed.
第12圖所示的共振頻率特性57、58係分別為將藉由極板而成的靜電電容設為0pF、300pF時之共振頻率的分布。藉由極板將靜電電容設得較大為從0pF至300pF,共振頻率的調整帶域雖會降低,但其分布形狀會較極板的靜電電容為0pF時更為狹帶域化。具體而言,當靜電電容範圍在100至300pF,極板的靜電電容為0pF時的共振頻率帶域WFB3係為23MHz,相對於此,將極板的靜電電容設為300pF時的共振頻率帶域WFB4係成為3MHz。如此,共振頻率帶域WFB4係為共振頻率帶域WFB3的13%,在藉由極板的調整機構中,係在變更高頻加速裝置的共振頻率帶域時狹帶域化。相對於此,在實施形態1的頻率調整機構43中,係在變更高頻加速裝置2的共振頻率帶域時,可將共振頻率帶域充分地維持在廣帶域。因此, 在要變更同步迴旋加速器中之粒子的射出能量時,係以實施形態1的頻率調整機構43較為有利。 The resonance frequency characteristics 57 and 58 shown in Fig. 12 are distributions of resonance frequencies when the capacitance obtained by the electrode plates is 0 pF or 300 pF, respectively. The electrostatic capacitance is set to be from 0pF to 300pF by the plate, and the adjustment band of the resonance frequency is reduced, but the distribution shape is narrower than when the electrostatic capacitance of the plate is 0pF. Specifically, when the electrostatic capacitance ranges from 100 to 300 pF and the electrostatic capacitance of the plate is 0 pF, the resonant frequency band WFB3 is 23 MHz. In contrast, the electrostatic capacitance of the plate is set to 300 pF. The WFB4 system is 3MHz. As described above, the resonance frequency band WFB4 is 13% of the resonance frequency band WFB3, and is narrowed in the resonance frequency band of the high-frequency acceleration device by the adjustment mechanism of the electrode plate. On the other hand, in the frequency adjustment mechanism 43 of the first embodiment, when the resonance frequency band of the high-frequency acceleration device 2 is changed, the resonance frequency band can be sufficiently maintained in the wide band. therefore, When the emission energy of the particles in the synchrocyclotron is to be changed, the frequency adjustment mechanism 43 of the first embodiment is advantageous.
綜上所述,實施形態1的高頻加速裝置2,係可藉由設於頻率調整機構43內之可動短路板13的位置,而變更在變更粒子之射出能量時會使之變化的共振頻率帶域,而不會將共振頻率帶域狹帶域化。 As described above, in the high-frequency acceleration device 2 of the first embodiment, the resonance frequency which changes when the energy of the particles is changed can be changed by the position of the movable short-circuiting plate 13 provided in the frequency adjustment mechanism 43. Bands are not narrowed to the resonant frequency band.
實施形態1的高頻加速裝置2,係在使共振頻率帶域上升時將頻率調整機構43的電感設定距離d設為較短,而在使共振頻率帶域降低時將電感設定距離d設為較長。實施形態1的高頻加速裝置2,其頻率調整機構43之調整機構內導體12的配置位置,係配置在較高頻加速裝置2的中心更靠可變電容性電抗元件(旋轉電容器11)之側。因此,可提高包含有頻率調整機構43的合成阻抗Z,而可大幅改變高頻加速裝置2之共振頻率的調整帶域。此外,實施形態1的高頻加速裝置2,其頻率調整機構43之調整機構內導體12的配置位置,係配置在可變電容性電抗元件(旋轉電容器11)之側,因此不同於專利文獻2之共振頻率調整機構配置於緊鄰於加速腔,磁極及磁軛的形狀會變得複雜的情形,不會使同步迴旋加速器1的磁極及磁軛的形狀變得複雜,而可將高頻加速裝置2搭載於同步迴旋加速器1。實施形態1的高頻加速裝置2,其頻率調整機構43之調整機構內導體12的配置位置,係配置在遠離加速腔42的位置,因此不同於專利文獻2的共振頻率調整機構,可易於達成使可動短路板13移動之驅動裝置47的設 置,而且可提高驅動裝置47之設置位置的彈性。 In the high-frequency acceleration device 2 of the first embodiment, the inductance setting distance d of the frequency adjustment mechanism 43 is made shorter when the resonance frequency band is increased, and the inductance setting distance d is set when the resonance frequency band is lowered. Longer. In the high-frequency acceleration device 2 of the first embodiment, the arrangement position of the inner conductor 12 of the adjustment mechanism of the frequency adjustment mechanism 43 is disposed at the center of the higher-frequency acceleration device 2, and is further variable-capacitive reactance element (rotary capacitor 11). side. Therefore, the combined impedance Z including the frequency adjustment mechanism 43 can be increased, and the adjustment band of the resonance frequency of the high-frequency acceleration device 2 can be greatly changed. Further, in the high-frequency acceleration device 2 of the first embodiment, the arrangement position of the inner conductor 12 of the adjustment mechanism of the frequency adjustment mechanism 43 is disposed on the side of the variable capacitive reactance element (the rotary capacitor 11), and thus is different from Patent Document 2 The resonance frequency adjusting mechanism is disposed in the vicinity of the acceleration cavity, and the shape of the magnetic pole and the yoke becomes complicated, and the shape of the magnetic pole and the yoke of the synchrocyclotron 1 is not complicated, and the high frequency acceleration device can be 2 is mounted on the synchrocyclotron 1. In the high-frequency acceleration device 2 of the first embodiment, the position of the inner conductor 12 of the adjustment mechanism of the frequency adjustment mechanism 43 is disposed at a position away from the acceleration chamber 42. Therefore, unlike the resonance frequency adjustment mechanism of Patent Document 2, it is easy to achieve The driving device 47 for moving the movable short-circuiting plate 13 The elasticity of the setting position of the driving device 47 can be improved.
實施形態1的高頻加速裝置2,係在中心值的±40%的範圍藉由頻率調整機構43而變更要藉由可變電容性電抗(旋轉電容器11)調整的共振頻率帶域,藉此即可將要藉由同步迴旋加速器1加速之粒子的能量,變更為例如從235MeV至68.5MeV的廣範圍。在第6圖、第7圖所示之例中,係顯示在中心值的+36%至中心值的-38%的範圍變更共振頻率帶域之例,惟若將可將電感設定距離d設為較最長的d4更長的調整機構內導體12採用於頻率調整機構43中,則可在中心值的±40%的範圍變更共振頻率帶域。 In the high-frequency acceleration device 2 of the first embodiment, the frequency adjustment mechanism 43 changes the resonance frequency band to be adjusted by the variable capacitive reactance (rotational capacitor 11) in the range of ±40% of the center value. The energy of the particles to be accelerated by the synchrocyclotron 1 can be changed to, for example, a wide range from 235 MeV to 68.5 MeV. In the examples shown in Fig. 6 and Fig. 7, an example is shown in which the resonance frequency band is changed from +36% of the center value to -38% of the center value, but if the inductance can be set to the distance d The adjustment inner conductor 12, which is longer than the longest d4, is used in the frequency adjustment mechanism 43, and the resonance frequency band can be changed within a range of ±40% of the center value.
實施形態1的高頻加速裝置2係包括頻率調整機構43直接連接於內導體17的調整機構內導體12、可動短路板13及調整機構外導體14,因此可使調整機構內導體12的製作性提升,且可降低調整機構內導體12與傳送線路8之內導體之交界面的熱損耗。 The high-frequency acceleration device 2 according to the first embodiment includes the adjustment mechanism inner conductor 12, the movable short-circuiting plate 13, and the adjustment mechanism outer conductor 14 that are directly connected to the inner conductor 17 by the frequency adjustment mechanism 43, so that the manufacturing mechanism of the inner conductor 12 of the adjustment mechanism can be made. The lifting and the heat loss at the interface between the inner conductor 12 of the adjusting mechanism and the inner conductor of the transmission line 8 can be reduced.
接著考慮將實施形態1的高頻加速裝置2應用於粒子束治療裝置的情形,亦即應用於粒子束治療用圓形加速器的情形。在將實施形態1的高頻加速裝置2應用於粒子束治療裝置時,係預先決定複數個要從同步迴旋加速器1取出的粒子的能量。對應該等能量的電感設定距離d也要預先決定。進行治療時,要從預先決定的能量群(複數個能量)選擇對於每一個患部最佳的能量。為了設定為對應所選擇之能量的電感設定距離d,在治療開始前,藉由氣缸等的驅動裝置47從外部將頻率調整機構43的可 動短路板13設定於適當的位置。 Next, a case where the high-frequency acceleration device 2 of the first embodiment is applied to a particle beam therapy device, that is, a case where it is applied to a circular accelerator for particle beam therapy. When the high-frequency acceleration device 2 of the first embodiment is applied to a particle beam therapy device, the energy of a plurality of particles to be taken out from the synchrocyclotron 1 is determined in advance. The distance d corresponding to the inductance of the equal energy should also be determined in advance. When performing treatment, the energy of the best for each affected part is selected from a predetermined energy group (a plurality of energies). In order to set the distance d corresponding to the inductance of the selected energy, the frequency adjustment mechanism 43 can be externally driven by a driving device 47 such as a cylinder before the start of treatment. The short circuit plate 13 is set at an appropriate position.
綜上所述,實施形態1的高頻加速裝置2,係為將高頻電場施加於因為由圓形加速器(同步迴旋加速器1)之偏向電磁鐵41所形成的偏向磁場而沿著螺旋軌道旋繞的荷電粒子,而將該荷電粒子加速的圓形加速器的高頻加速裝置。實施形態1的高頻加速裝置2之特徵為包括:電極(D型電極6、虛設D型電極7),係施加高頻電場於荷電粒子;傳送線路8,係具有內導體17及包圍內導體17的外導體16,且將高頻電力傳送至電極(D型電極6、虛設D型電極7);加速腔42,係藉由傳送線路8與電極(D型電極6、虛設D型電極7)而構成;以及可變電容性電抗元件(旋轉電容器11)及頻率調整機構43,係變更加速腔42的共振頻率。實施形態1之高頻加速裝置2的頻率調整機構43之特徵為包括:調整機構內導體12,係連接於傳送線路8的內導體17,而且朝從內導體17離開的方向延伸;調整機構外導體14,係連接於傳送線路8的外導體16,而且包住調整機構內導體12;及可動短路板13,係由導體構成,且電性連接調整機構內導體12與調整機構外導體14,而且配置成可變更與調整機構內導體12及調整機構外導體14的連接位置。實施形態1的高頻加速裝置2係藉由上述特徵,可大幅變更對應靜電電容調整幅度而變化之共振頻率的調整帶域,而不會使之狹帶域化。 As described above, the high-frequency acceleration device 2 of the first embodiment is configured to apply a high-frequency electric field to a spiral orbital due to a bias magnetic field formed by the deflection of the electromagnet 41 by the circular accelerator (synchronous cyclotron 1). The charged particles, and the high-frequency acceleration device of the circular accelerator that accelerates the charged particles. The high-frequency acceleration device 2 according to the first embodiment includes an electrode (D-type electrode 6, dummy D-type electrode 7) for applying a high-frequency electric field to the charged particles, and a transmission line 8 having an inner conductor 17 and an inner conductor. The outer conductor 16 of the 17 and transmits high frequency power to the electrodes (D-type electrode 6, dummy D-type electrode 7); the acceleration chamber 42 is connected to the electrode by the transmission line 8 (D-type electrode 6, dummy D-type electrode 7) And the variable capacitance capacitive element (rotating capacitor 11) and the frequency adjusting mechanism 43 change the resonance frequency of the acceleration chamber 42. The frequency adjustment mechanism 43 of the high-frequency acceleration device 2 of the first embodiment is characterized in that the adjustment mechanism inner conductor 12 is connected to the inner conductor 17 of the transmission line 8 and extends in a direction away from the inner conductor 17; The conductor 14 is connected to the outer conductor 16 of the transmission line 8 and encloses the adjustment mechanism inner conductor 12; and the movable short-circuiting plate 13 is composed of a conductor, and electrically connects the adjustment mechanism inner conductor 12 and the adjustment mechanism outer conductor 14, Further, it is arranged to change the connection position with the adjustment mechanism inner conductor 12 and the adjustment mechanism outer conductor 14. According to the high-frequency acceleration device 2 of the first embodiment, the adjustment band of the resonance frequency that changes in accordance with the capacitance adjustment range can be greatly changed without narrowing the band.
實施形態1的圓形加速器(同步迴旋加速器1)係為藉由偏向磁場使從離子源5射入至中心的荷電粒子 一面沿著螺旋軌道旋繞,一面藉由高頻電場加速的圓形加速器。實施形態1的圓形加速器(同步迴旋加速器1)之特徵為包括:形成偏向磁場的偏向電磁鐵41、將荷電粒子加速的高頻加速裝置2、以及將加速過的荷電粒子射出至該圓形加速器外的射出導管15,而高頻加速裝置2之特徵為包括:電極(D型電極6、虛設D型電極7),係施加高頻電場於荷電粒子;傳送線路8,係具有內導體17及包圍內導體17的外導體16,且將高頻電力傳送至電極(D型電極6、虛設D型電極7);加速腔42,係藉由傳送線路8與電極(D型電極6、虛設D型電極7)而構成;以及可變電容性電抗元件(旋轉電容器11)及頻率調整機構43,係變更加速腔42的共振頻率。實施形態1之高頻加速裝置2的頻率調整機構43之特徵為包括:調整機構內導體12,係連接於傳送線路8的內導體17,而且朝從內導體17離開的方向延伸;調整機構外導體14,係連接於傳送線路8的外導體16,而且包住調整機構內導體12;及可動短路板13,係由導體構成,且電性連接調整機構內導體12與調整機構外導體14,而且配置成可變更與調整機構內導體12及調整機構外導體14的連接位置。實施形態1的圓形加速器(同步迴旋加速器1)係藉由上述特徵,可藉由高頻加速裝置2大幅變更對應靜電電容調整幅度而變化之共振頻率的調整帶域,而不會使之狹帶域化,而可射出適於屬於粒子束治療對象之患部之能量的荷電粒子射束22。 The circular accelerator (synchronous cyclotron 1) of the first embodiment is a charged particle that is incident from the ion source 5 to the center by a biasing magnetic field. A circular accelerator that is wound along a spiral orbit and accelerated by a high-frequency electric field. The circular accelerator (synchronous cyclotron 1) according to the first embodiment includes a deflecting electromagnet 41 that forms a biasing magnetic field, a high-frequency acceleration device 2 that accelerates the charged particles, and an accelerated charged particle to the circular shape. The injection duct 15 outside the accelerator, and the high-frequency acceleration device 2 is characterized by comprising: an electrode (D-type electrode 6, a dummy D-type electrode 7) applying a high-frequency electric field to the charged particles; and a transmission line 8 having an inner conductor 17 And surrounding the outer conductor 16 of the inner conductor 17, and transmitting high frequency power to the electrodes (D-type electrode 6, dummy D-type electrode 7); the acceleration chamber 42 is connected by the transmission line 8 and the electrode (D-type electrode 6, dummy The D-type electrode 7) is configured, and the variable capacitance reactance element (the rotating capacitor 11) and the frequency adjustment mechanism 43 change the resonance frequency of the acceleration chamber 42. The frequency adjustment mechanism 43 of the high-frequency acceleration device 2 of the first embodiment is characterized in that the adjustment mechanism inner conductor 12 is connected to the inner conductor 17 of the transmission line 8 and extends in a direction away from the inner conductor 17; The conductor 14 is connected to the outer conductor 16 of the transmission line 8 and encloses the adjustment mechanism inner conductor 12; and the movable short-circuiting plate 13 is composed of a conductor, and electrically connects the adjustment mechanism inner conductor 12 and the adjustment mechanism outer conductor 14, Further, it is arranged to change the connection position with the adjustment mechanism inner conductor 12 and the adjustment mechanism outer conductor 14. According to the above-described feature, the circular accelerator (synchronous cyclotron 1) of the first embodiment can greatly change the adjustment band of the resonance frequency which changes depending on the capacitance adjustment range by the high-frequency acceleration device 2, without being narrow. The banding is performed to emit a charged particle beam 22 suitable for the energy of the affected part belonging to the particle beam treatment subject.
迄今為止雖已說明了將實施形態1的高頻 加速裝置2應用於同步迴旋加速器之例,但實施形態1的高頻加速裝置2亦可應用於迴旋加速器。在迴旋加速器中,高頻加速裝置2的共振頻率係為固定。然而,在迴旋加速器中,當共振頻率的固定值因為某種原因而偏離時要進行微調。在迴旋加速器中,在該共振頻率的微調上,一般係進行高頻加速裝置全長的調整,因此必須要有大型的調整機構。然而,在本發明之實施形態1的高頻加速裝置2中,如前所述係為小型的頻率調整機構43,僅藉由調整可動短路板13的位置就可變更共振頻率。例如從第7圖之加速時間t1中的特性51、52、53、54可得知,即使旋轉電容器11的靜電電容在特性51、52、53、54中皆相同,僅變更頻率調整機構43的距離d就變更了要經由共振頻率決定的旋繞頻率。因此,將本發明之實施形態1之高頻加速裝置2應用於迴旋加速器,本發明之實施形態1的高頻加速裝置2亦只要調整可動短路板13的位置就可變更共振頻率。 The high frequency of Embodiment 1 has been described so far. The acceleration device 2 is applied to an example of a synchrocyclotron, but the high-frequency acceleration device 2 of the first embodiment can also be applied to a cyclotron. In the cyclotron, the resonance frequency of the high-frequency acceleration device 2 is fixed. However, in the cyclotron, fine adjustment is performed when a fixed value of the resonance frequency deviates for some reason. In the cyclotron, in the fine adjustment of the resonance frequency, the entire length of the high-frequency acceleration device is generally adjusted, so that a large adjustment mechanism is necessary. However, in the high-frequency acceleration device 2 according to the first embodiment of the present invention, as described above, the small-sized frequency adjustment mechanism 43 can change the resonance frequency only by adjusting the position of the movable short-circuiting plate 13. For example, it can be seen from the characteristics 51, 52, 53, 54 in the acceleration time t1 of FIG. 7 that even if the electrostatic capacitance of the rotary capacitor 11 is the same in the characteristics 51, 52, 53, 54, only the frequency adjustment mechanism 43 is changed. The distance d changes the winding frequency to be determined by the resonance frequency. Therefore, the high-frequency acceleration device 2 according to the first embodiment of the present invention is applied to the cyclotron. The high-frequency acceleration device 2 according to the first embodiment of the present invention can also change the resonance frequency by adjusting the position of the movable short-circuiting plate 13.
另外,本發明係可在相容的範圍內,自由組合各實施形態,且可適當變更、省略各實施形態。 Further, in the present invention, the respective embodiments can be freely combined within a compatible range, and the respective embodiments can be appropriately changed or omitted.
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| PCT/JP2017/029589 WO2018127990A1 (en) | 2017-01-05 | 2017-08-18 | High-frequency accelerating device for circular accelerator and circular accelerator |
| ??PCT/JP2017/029589 | 2017-08-18 |
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| ES2720574T3 (en) * | 2004-07-21 | 2019-07-23 | Mevion Medical Systems Inc | Programmable radio frequency waveform generator for a synchrocycle |
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