TW201812881A - Cutting method of workpiece - Google Patents
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- TW201812881A TW201812881A TW106122724A TW106122724A TW201812881A TW 201812881 A TW201812881 A TW 201812881A TW 106122724 A TW106122724 A TW 106122724A TW 106122724 A TW106122724 A TW 106122724A TW 201812881 A TW201812881 A TW 201812881A
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Abstract
提供可以在短時間高精度控制切削刀對被加工物之切入深度的被加工物之切削方法。 Provides a cutting method for a workpiece that can precisely control the depth of cutting of the workpiece by the cutter in a short time.
一種被加工物之切削方法,包含:保持面資訊記憶步驟,其係以移動單元使安裝用以測量高度之高度測量器之切削單元,和挾盤台做相對性移動,在複數之座標(X,Y)測量挾盤台之保持面之高度(Z),記憶各個座標(X,Y)和高度(Z)之關係作為保持面資訊;厚度資訊記憶步驟,其係測量被加工物之厚度,作為厚度資訊而予以記憶;保持步驟,其係以挾盤台保持記憶厚度資訊之被加工物;算出步驟,其係從保持面資訊和厚度資訊,在任意之座標(X,Y)算出在挾盤台所保持的該被加工物之上面之高度;及切削步驟,其係根據在算出步驟所算出之被加工物之高度,使切削刀切入在挾盤台所保持的被加工物,形成期望之深度的溝部。 A method for cutting a workpiece includes: a step of maintaining surface information memory, which uses a moving unit to move a cutting unit mounted with a height measuring device for measuring height, and moves the disk table relative to each other, and moves the coordinates between a plurality of coordinates (X , Y) measure the height (Z) of the holding surface of the pan table, and memorize the relationship between the coordinates (X, Y) and the height (Z) as the information of the holding surface; the thickness information storage step is to measure the thickness of the workpiece, It is memorized as the thickness information; the holding step is to hold the processed object with the thickness information stored on the pan table; the calculation step is to calculate the thickness information at any coordinates (X, Y) from the holding surface information and thickness information The height above the workpiece held by the disk table; and the cutting step, based on the height of the workpiece calculated in the calculation step, causes the cutter to cut into the workpiece held on the disk table to form a desired depth Groove section.
Description
本發明係關於切削板狀之被加工物之時所使用的被加工物之切削方法。 This invention relates to the cutting method of the to-be-processed object used when cutting a plate-shaped to-be-processed object.
於將代表半導體晶圓之板狀被加工物分割成複數晶片之時,使用例如具備用以保持被加工物之挾盤台,和用以切削被加工物之環狀切削刀的切削裝置。一面使旋轉之切削刀對藉由挾盤台所保持之被加工物切入,一面使切削刀和挾盤台做相對性移動,依此沿著該移動之路徑,切削被加工物。 When a plate-like workpiece representing a semiconductor wafer is divided into a plurality of wafers, a cutting device including, for example, a disk table for holding the workpiece and a ring cutter for cutting the workpiece is used. While rotating the cutting blade into the workpiece held by the disk table, the cutter and the disk table are moved relative to each other, and the workpiece is cut along the path of the movement.
在上述切削裝置中,通常將與被加工物相接之挾盤台之保持面之高度,設定為切削刀之高度的基準(零點)。依此,可以將切削刀之高度對準挾盤台上之被加工物,使切削刀切入至被加工物的期望之深度。 In the above-mentioned cutting device, the height of the holding surface of the pan table that is in contact with the workpiece is usually set as the reference (zero point) of the height of the cutting blade. According to this, the height of the cutter can be aligned with the workpiece on the disk table, and the cutter can be cut to the desired depth of the workpiece.
但是,近年來,增加在被加工物設置被稱為Low-k膜等之介電率低的絕緣膜的機會。因該Low-k膜脆弱,故於切削被加工物之時,有在非預期的區域剝落之情形。於是,研究出事先僅除去重疊在切削預定線(切割道、分割預定線)的Low-k膜之方法等(例如,參照專利 文獻1)。 However, in recent years, there has been an increase in the opportunity to provide an insulating film having a low dielectric constant, such as a Low-k film, on the workpiece. Because the Low-k film is fragile, it may peel off in unexpected areas when cutting the workpiece. Then, a method and the like of removing only the Low-k film superimposed on a predetermined cutting line (cutting line, predetermined dividing line) and the like have been developed (for example, refer to Patent Document 1).
在該方法中,使切削刀切入厚度為數μm左右的Low-k膜,從被加工物僅除去重疊在切削預定線之Low-k膜。另外,在上述挾盤台之保持面,也存在例如數μm以上之高度的偏差。在此情況,由於切削刀對被加工物之切入深度也產生同樣程度的偏差,故無法適當地實施上述方法。 In this method, a cutting blade is cut into a Low-k film having a thickness of about several μm, and only the Low-k film that overlaps the planned cutting line is removed from the workpiece. In addition, the holding surface of the disk table also has a height deviation of, for example, several μm or more. In this case, since the cutting depth of the cutting object with respect to the workpiece also varies by the same degree, the above method cannot be appropriately implemented.
對此,提案有使切削刀切入被加工物之複數位置,以所形成之確認用的溝部(切痕、切口)之長度為基準,確認切削刀之切入深度的方法等(例如,參照專利文獻2)。若使用以該方法所確認出之切入深度,控制切削刀之高度時,即使在挾盤台之保持面具有高度之偏差之情況,亦可以僅切削且除去薄的Low-k膜。 In this regard, a method has been proposed in which a cutter is cut into a plurality of positions of a workpiece, and a depth of a groove (cut, notch) for confirmation is formed as a reference, and a method of confirming a cut depth of the cutter is proposed (for example, refer to Patent Documents) 2). If the cutting depth confirmed by this method is used and the height of the cutter is controlled, even if the holding surface of the pan table has a deviation in height, only the thin Low-k film can be cut and removed.
[專利文件1]日本特開2015-18965號公報 [Patent Document 1] Japanese Patent Laid-Open No. 2015-18965
[專利文獻2]日本特開2015-142022號公報 [Patent Document 2] Japanese Patent Laid-Open No. 2015-142022
但是,在上述方法中,因在被加工物形成複數溝部之後,必須測量其長度,故有至切削完成所需的時間大幅度增長。 However, in the above-mentioned method, since the length of the workpiece must be measured after the plural grooves are formed, the time required until the cutting is completed is greatly increased.
本發明係鑑於如此之問題點而創作出,其目的在於提供可以在短時間高精度地控制切削刀對被加工物之切入深度的被加工物之切削方法。 The present invention has been made in view of such a problem, and an object thereof is to provide a cutting method of a workpiece that can control the depth of cutting of a workpiece with a cutting tool with high accuracy in a short time.
若藉由本發明之一態樣時,提供一種被加工物之切削方法,其係使用切削裝置的被加工物之切削方法,該切削裝置具備:挾盤台,其係在保持面保持板狀之被加工物;切削單元,其係以切削刀加工被保持於該挾盤台之該被加工物;移動單元,其係使該挾盤台和該切削單元在相對於該保持面平行的X軸方向及Y軸方向做相對性移動,該被加工物之切削方法具備:保持面資訊記憶步驟,其係以該移動單元使安裝用以測量高度之高度測量器之該切削單元,和該挾盤台做相對性移動,在複數之座標(X,Y)測量該挾盤台之該保持面之高度(Z),記憶各個座標(X,Y)和高度(Z)之關係作為保持面資訊;厚度資訊記憶步驟,其係測量該被加工物之厚度,作為厚度資訊而予以記憶;保持步驟,其係在該挾盤台保持記憶該厚度資訊之該被加工物;算出步驟,其係從該保持面資訊和該厚度資訊,在任意之座標(X,Y)算出在該挾盤台所保持的該被加工物之上面之高度;及切削步驟,其係根據在該算出步驟算出之該被加工物之高度,使該切削刀切入在該挾盤台所保持的該被加工物,形成期望之深度的溝部。 According to one aspect of the present invention, a method for cutting a workpiece is provided, which is a method for cutting a workpiece using a cutting device. The cutting device is provided with: a disc table which is held on a holding surface to maintain a plate shape A workpiece; a cutting unit for machining the workpiece held on the disk table by a cutter; a moving unit for X-axis parallel to the holding surface of the disk table and the cutting unit Relative movement in the direction and Y-axis direction, the cutting method of the workpiece includes: a step of maintaining surface information memory, which uses the moving unit to install the cutting unit mounted with a height measuring device for measuring height, and the pan The table moves relative. Measure the height (Z) of the holding surface of the pan table at plural coordinates (X, Y), and memorize the relationship between each coordinate (X, Y) and height (Z) as the information of the holding surface; The thickness information memorizing step is to measure the thickness of the workpiece and memorize it as thickness information; the holding step is to keep the workpiece with the thickness information memorized on the pan table; the calculation step is to calculate from Keep face info and The thickness information calculates the height above the workpiece held by the pan table at any coordinates (X, Y); and the cutting step is based on the height of the workpiece calculated in the calculation step, so that The cutter cuts into the workpiece held on the pan table to form a groove portion of a desired depth.
在本發明之一態樣中,進一步具備位置資訊記憶步驟,其係於該算出步驟之前,為了攝像該被加工物,使用被安裝於該切削單元之攝像單元或該高度測量器,檢測出在該挾盤台所保持的該被加工物之外周緣的座標,和被形成該外周緣或該被加工物之上面的標記,記憶位置資訊,在該厚度資訊記憶步驟中,在複數座標(x,y)測量該被加工物之厚度(t),記憶各個座標(x,y)和厚度(t)之關係作為該厚度資訊,在該算出步驟中,從該位置資訊和該保持面資訊和該厚度資訊,在任意之座標(x,y)算出該被加工物之該上面之高度為佳。 In one aspect of the present invention, a position information memory step is further provided, which is before the calculating step. In order to image the workpiece, an imaging unit or the height measuring device mounted on the cutting unit is used to detect The coordinates of the outer periphery of the workpiece held by the pan table and the marks formed on the outer periphery or the workpiece are used to memorize position information. In the thickness information memorization step, the plural coordinates (x, y) Measure the thickness (t) of the workpiece, and memorize the relationship between the coordinates (x, y) and thickness (t) as the thickness information. In the calculation step, from the position information and the holding surface information and the For the thickness information, it is better to calculate the height of the upper surface of the workpiece at any coordinates (x, y).
再者,在本發明之一態樣中,該被加工物具有包含被疊層在一方之面側的機能層的裝置,在該切削步驟中,沿著區劃該裝置之複數切割道以該切削刀形成該溝部為佳。 Furthermore, in one aspect of the present invention, the workpiece includes a device including a functional layer laminated on one surface side, and in the cutting step, the cutting is performed along a plurality of cutting lanes that partition the device. It is preferable that the groove is formed by a knife.
在本發明之一態樣有關之被加工物之切削方法中,因從在複數座標(X,Y)測量挾盤台之保持面之高度(Z)而所取得之保持面資訊,和測量被加工物之厚度而所取得之厚度資訊,在任意之座標(X,Y)算出以在盤台所保持之被加工物之上面的高度,故可以高精度地控制切削刀對被加工物的切入深度。 In the cutting method of a workpiece related to one aspect of the present invention, the holding surface information obtained by measuring the height (Z) of the holding surface of the pan table at a plurality of coordinates (X, Y), and the measurement is performed. The thickness information obtained from the thickness of the workpiece is calculated at any coordinates (X, Y) to the height above the workpiece to be held on the table, so the cutting depth of the workpiece by the cutter can be controlled with high precision .
再者,在與本發明之一態樣有關之被加工物之切削方法中,因不需要在被加工物形成確認用之溝部, 故比起形成確認用之溝部的以往之方法,可以縮短至切削完成所需的時間。如此一來,若藉由與本發明之一態樣有關之被加工物之切削方法時,可以在短時間高精度地控制切削刀對被加工物的切入深度。 Furthermore, in the method for cutting a workpiece related to one aspect of the present invention, since it is not necessary to form a groove portion for confirmation in the workpiece, it can be shortened to a conventional method of forming a groove portion for confirmation. Time required for cutting to complete. In this way, if the cutting method of the workpiece related to one aspect of the present invention is adopted, the cutting depth of the workpiece by the cutting blade can be controlled with high accuracy in a short time.
11‧‧‧被加工物 11‧‧‧Processed
11a‧‧‧表面(一方之面、上面) 11a‧‧‧ surface (one side, top)
11b‧‧‧背面(另一方之面、下面) 11b‧‧‧Back (the other side, below)
11c‧‧‧溝槽 11c‧‧‧Groove
13‧‧‧切削預定線(切割道、分割預定線) 13‧‧‧cut plan line (cut line, split plan line)
15‧‧‧裝置 15‧‧‧ device
21‧‧‧保護構件 21‧‧‧Protective member
21a‧‧‧表面 21a‧‧‧ surface
21b‧‧‧背面 21b‧‧‧Back
31、33‧‧‧測量線 31, 33‧‧‧ measuring line
35‧‧‧視野 35‧‧‧Horizon
37‧‧‧區域(座標) 37‧‧‧ area (coordinates)
2‧‧‧切削裝置 2‧‧‧ cutting device
4‧‧‧基台 4‧‧‧ abutment
4a、4b、4c‧‧‧開口 4a, 4b, 4c‧‧‧ opening
6‧‧‧卡匣支撐台 6‧‧‧ Cassette support
8‧‧‧卡匣 8‧‧‧ Cassette
10‧‧‧X軸移動台 10‧‧‧X-Axis Mobile Stage
12‧‧‧防塵防滴蓋 12‧‧‧Dustproof and drip-proof cover
14‧‧‧挾盤台 14‧‧‧ 挟 台
16‧‧‧保持面 16‧‧‧ keep face
18‧‧‧切削單元 18‧‧‧ cutting unit
20‧‧‧支撐構造 20‧‧‧ supporting structure
22‧‧‧切削單元移動機構 22‧‧‧ cutting unit moving mechanism
24‧‧‧Y軸導軌 24‧‧‧Y-axis guide
26‧‧‧Y軸移動板 26‧‧‧Y-axis moving plate
28‧‧‧Y軸滾珠螺桿 28‧‧‧Y-axis ball screw
30‧‧‧Y軸脈衝馬達 30‧‧‧Y-axis pulse motor
32‧‧‧Z軸導軌 32‧‧‧Z-axis guide
34‧‧‧Z軸移動板 34‧‧‧Z axis moving plate
36‧‧‧Z軸滾珠螺桿 36‧‧‧Z-axis ball screw
38‧‧‧Z軸脈衝馬達 38‧‧‧Z-axis pulse motor
40‧‧‧主軸 40‧‧‧ Spindle
42‧‧‧切削刀 42‧‧‧Cutter
44‧‧‧複合測量單元(高度測量器、攝像單元) 44‧‧‧ composite measuring unit (height measuring device, camera unit)
46‧‧‧洗淨單元 46‧‧‧washing unit
48‧‧‧控制單元 48‧‧‧Control unit
48a‧‧‧記憶部 48a‧‧‧Memory Department
52‧‧‧厚度測量裝置 52‧‧‧Thickness measuring device
54‧‧‧保持台 54‧‧‧holding table
56‧‧‧保持面 56‧‧‧ keep face
58‧‧‧測量器 58‧‧‧Measurer
圖1(A)為示意性地表示被加工物之構成例的斜視圖,圖1(B)為示意性地表示在被加工物黏貼保護構件之樣子的斜視圖。 FIG. 1 (A) is a perspective view schematically showing a configuration example of an object to be processed, and FIG. 1 (B) is a perspective view schematically showing a state where a protective member is adhered to the object to be processed.
圖2為示意性表示切削裝置之構成例的圖示。 FIG. 2 is a diagram schematically showing a configuration example of a cutting device.
圖3(A)為用以說明保持面資訊記憶步驟的側面圖,圖3(B)為示意性地表示測量線之設定例的俯視圖。 FIG. 3 (A) is a side view for explaining a step of holding the surface information, and FIG. 3 (B) is a plan view schematically showing a setting example of a measurement line.
圖4(A)為用以說明厚度資訊記憶步驟的側面圖,圖4(B)為示意性地表示測量線之設定例的俯視圖。 FIG. 4 (A) is a side view for explaining a thickness information memorizing step, and FIG. 4 (B) is a plan view schematically showing a setting example of a measurement line.
圖5(A)為用以說明保持步驟的側面圖,圖5(B)為用以說明位置資訊記憶步驟的俯視圖。 FIG. 5 (A) is a side view for explaining the holding step, and FIG. 5 (B) is a top view for explaining the position information storing step.
圖6(A)為視覺性地表示保持面資訊所示的保持面之高度(Z)的圖示,圖6(B)為視覺性地表示厚度資訊所示的被加工物之厚度(t)的圖示,圖6(C)為視覺性地表示被加工物之表面(上面)之高度的圖示。 FIG. 6 (A) is a diagram showing the height (Z) of the holding surface shown in the holding surface information, and FIG. 6 (B) is a diagram showing the thickness (t) of the workpiece shown in the thickness information. FIG. 6 (C) is a diagram showing the height of the surface (upper surface) of the workpiece visually.
圖7為示意性地表示切削步驟之俯視圖。 Fig. 7 is a plan view schematically showing a cutting step.
參照附件圖面,針對與本發明之一態樣有關的實施型態進行說明。與本實施型態有關之被加工物之切削方法包含保持面資訊記憶步驟(參照圖3(A)及圖3(B))、厚度資訊記憶步驟(參照圖4(A)及圖4(B))、保持步驟(參照圖5(A))、位置資訊記憶步驟(參照圖5(B))、算出步驟(參照圖6(A)、圖6(B)及圖6(C))及切削步驟(參照圖7)。 With reference to the attached drawings, an embodiment related to one aspect of the present invention will be described. The cutting method of the workpiece related to the present embodiment includes a step of storing surface information storage (refer to FIG. 3 (A) and FIG. 3 (B)), and a step of memory of thickness information (refer to FIG. 4 (A) and FIG. 4 (B). )), Holding step (refer to FIG. 5 (A)), position information storage step (refer to FIG. 5 (B)), calculation step (refer to FIG. 6 (A), FIG. 6 (B), and FIG. 6 (C)) and Cutting step (see Fig. 7).
在保持面資訊記憶步驟中,在複數座標(X,Y)測量被設置在切削裝置之挾盤台之保持面之高度(Z),記憶各個座標(X,Y)和高度(Z)之關係作為保持面資訊。在該厚度資訊記憶步驟中,在複數座標(x,y)測量該被加工物之厚度(t),記憶各個座標(x,y)和厚度(t)之關係作為厚度資訊。 In the step of memorizing the information of the holding surface, the height (Z) of the holding surface provided on the cutting table of the cutting device is measured at a plurality of coordinates (X, Y), and the relationship between the coordinates (X, Y) and the height (Z) is memorized. As holding information. In the thickness information storing step, the thickness (t) of the workpiece is measured at a plurality of coordinates (x, y), and the relationship between each coordinate (x, y) and the thickness (t) is memorized as thickness information.
在保持步驟中,係在挾盤台保持被記憶厚度資訊的被加工物。在位置資訊記憶步驟中,檢測出在挾盤台所保持的被加工物之外周緣的座標,和被形成在外周緣的凹槽等之標記(或是被形成在被加工物之上面的標記),記憶位置資訊。在算出步驟中,從位置資訊和保持面資訊和厚度資訊,在任意之座標(X,Y)算出被加工物之上面之高度。 In the holding step, the workpiece to be memorized thickness information is held on the pan table. In the position information storage step, the coordinates of the outer periphery of the workpiece held on the pan table and the marks (or marks formed on the workpiece) formed on the outer periphery are detected, Remember location information. In the calculation step, the height above the workpiece is calculated from the position information, the holding surface information, and the thickness information at arbitrary coordinates (X, Y).
在切削步驟中,根據在算出步驟算出的被加工物之上面之高度,使切削刀切入,在被加工物形成期望之深度的溝部。以下,針對與本實施型態有關之被加工物之切削方法予以詳述。 In the cutting step, based on the height of the upper surface of the workpiece calculated in the calculation step, the cutting blade is cut into and a groove portion having a desired depth is formed in the workpiece. Hereinafter, the cutting method of the workpiece related to this embodiment will be described in detail.
圖1(A)為示意性地表示在本實施型態被切削之被加工物之構成例的斜視圖,圖1(B)為示意性地表示在被加工物黏貼保護構件之樣子的斜視圖。如圖1(A)所示般,本實施型態之被加工物11為例如使用矽等之半導體材料所形成的圓盤狀之晶圓,在其表面(一方之面、上面)11a側,設置成為配線之金屬膜,或絕緣配線間之絕緣膜(包含Low-k膜)等之機能層(無圖示)。 FIG. 1 (A) is a perspective view schematically showing a configuration example of a workpiece to be cut in this embodiment, and FIG. 1 (B) is a perspective view schematically showing a state where a protective member is adhered to the workpiece. . As shown in FIG. 1 (A), the processed object 11 in this embodiment is a disc-shaped wafer formed using, for example, a semiconductor material such as silicon, and on the surface (one side, upper surface) 11a side, A functional layer (not shown) such as a metal film for wiring or an insulating film (including a low-k film) between insulating wirings is provided.
設置該機能層之被加工物11之表面11a側以被配列成格子狀之切削預定線(切割道、分割預定線)13被區劃成複數區域,在各區域,形成IC、LSI等之裝置15。各裝置15包含上述機能層作為構成要素。即是,機能層成為裝置15之一部分。再者,在被加工物11之外周緣,設置有判定被加工物11之方向(例如,結晶方位)之時之標記的凹槽11c(或定向平面)。 On the surface 11a side of the workpiece 11 on which the functional layer is provided, predetermined cutting lines (cutting lines, dividing lines) 13 arranged in a grid pattern are divided into a plurality of areas, and devices such as ICs and LSIs are formed in each area 15 . Each device 15 includes the above-mentioned functional layer as a constituent element. That is, the function layer becomes a part of the device 15. Furthermore, a groove 11c (or an orientation plane) is provided on the outer periphery of the workpiece 11 to mark the direction (for example, the crystal orientation) of the workpiece 11 when it is determined.
另外,在本實施型態中,雖然將以矽等之半導體材料所構成之圓盤狀之晶圓設為被加工物11,但是被加工物11之材質、形狀、構造等不受限制。例如,亦可以使用以陶瓷、金屬、樹脂等之材料所構成之基板作為被加工物11。同樣地,裝置15之種類、數量、配置等也不受限制。 In addition, in this embodiment, although a disc-shaped wafer made of a semiconductor material such as silicon is used as the processed object 11, the material, shape, structure, and the like of the processed object 11 are not limited. For example, a substrate made of a material such as ceramic, metal, or resin may be used as the workpiece 11. Similarly, the type, number, arrangement, etc. of the devices 15 are not limited.
再者,亦可以與上述凹槽11c等一起,或取代凹槽11c等,利用被形成在被加工物11之表面11a側的裝置15之圖案等,作為判定被加工物11之方向之時的標記。在此情況,不一定在被加工物11之外周緣設置凹槽11c等亦 可。 In addition, the pattern of the device 15 formed on the surface 11a side of the workpiece 11 may be used together with or instead of the groove 11c and the like as the time for determining the direction of the workpiece 11 mark. In this case, it is not always necessary to provide the groove 11c or the like at the outer periphery of the workpiece 11.
在被加工物11之背面(另一方之面、下面)11b側,如圖1(B)所示般,黏貼保護構件21。保護構件21係持有與被加工物11同等之直徑的圓形之薄膜(膠帶),在其表面21a側設置具有黏著力之糊層。於在被加工物11黏貼保護構件21之時,使該表面21a側密接於被加工物11之背面11b側。 As shown in FIG. 1 (B), a protective member 21 is adhered to the back surface (the other surface, the lower surface) 11b side of the workpiece 11. The protective member 21 is a circular thin film (tape) having the same diameter as that of the workpiece 11, and a paste layer having an adhesive force is provided on the surface 21a side. When the protection member 21 is adhered to the workpiece 11, the surface 21a side is brought into close contact with the back surface 11b side of the workpiece 11.
另外,在本實施型態中,雖然在被加工物11之背面11b側,黏貼保護構件21,使表面11a側露出,但是即使在從背面11b切削被加工物11之情況等,在表面11a側黏貼保護構件21,使背面11b側露出亦可。即是,在此情況,被加工物11之背面11b成為上面,表面11a成為下面。再者,若被加工物11之破損等不成為問題時,即使不一定在被加工物11之背面11b(或是表面11a)黏貼保護構件21亦可。 In addition, in this embodiment, although the protective member 21 is stuck on the back surface 11b side of the workpiece 11 to expose the surface 11a side, even when the workpiece 11 is cut from the back surface 11b, etc., it is on the surface 11a side. The protective member 21 may be adhered to expose the back surface 11b side. That is, in this case, the back surface 11b of the workpiece 11 becomes the upper surface, and the front surface 11a becomes the lower surface. In addition, as long as the damage or the like of the workpiece 11 is not a problem, the protection member 21 may not necessarily be adhered to the back surface 11b (or the front surface 11a) of the workpiece 11.
再者,如上述般,可以藉由從背面11b側切削被加工物11,一面使表面11a側之機能層殘存,一面在被加工物11之背面11b側形成溝部。依此,與本發明有關之被加工物之切削方法,在欲一面使機能層確實地殘存一面除去被加工物11之其他部分之情況等也有效。 Further, as described above, by cutting the workpiece 11 from the back surface 11b side, the functional layer on the surface 11a side can be left while a groove portion can be formed on the back surface 11b side of the workpiece 11. Accordingly, the method for cutting a workpiece related to the present invention is also effective in a case where the functional layer is to be surely left while other parts of the workpiece 11 are removed.
圖2為示意性地表示在本實施型態中所使用之切削裝置2之構成例的圖示。如圖2所示般,切削裝置2具備支撐各構造的基台4。在基台4之前方之角部,形成矩形之開口4a,在該開口4a內,設置升降的卡匣支撐台6。在 卡匣支撐台6之上面,被裝載可以收容複數被加工物11的卡匣8。另外,在圖1中,為了便於說明,僅表示卡匣8之輪廓。 FIG. 2 is a diagram schematically showing a configuration example of a cutting device 2 used in the embodiment. As shown in FIG. 2, the cutting device 2 includes a base 4 that supports each structure. A rectangular opening 4a is formed at a corner in front of the base table 4, and a raised and lowered cassette support table 6 is provided in the opening 4a. On the cassette support base 6, a cassette 8 capable of accommodating a plurality of workpieces 11 is loaded. In addition, in FIG. 1, for convenience of explanation, only the outline of the cassette 8 is shown.
在卡匣支撐台6之側方,形成X軸方向(前後方向、加工進給方向)長的矩形之開口4b。在該開口4b內,設置X軸移動台10、使X軸移動台10在X軸方向移動之X軸移動機構(移動單元)(無圖示)及覆蓋X軸移動機構的防塵防滴蓋12。 A rectangular opening 4b having a long X-axis direction (front-rear direction, processing feed direction) is formed on the side of the cassette support base 6. In the opening 4b, an X-axis moving table 10, an X-axis moving mechanism (moving unit) (not shown) for moving the X-axis moving table 10 in the X-axis direction, and a dust-proof and drip-proof cover 12 covering the X-axis moving mechanism are provided. .
X軸移動機構具備與X軸方向平行之一對X軸導軌(無圖示),在X軸導軌,X軸移動台10被安裝成能夠滑動。在X軸移動台10之下面側設置有螺帽部(無圖示),該螺帽部被螺合於與X軸導軌平行之X軸滾珠螺桿(無圖示)。 The X-axis moving mechanism includes a pair of X-axis guides (not shown) parallel to the X-axis direction, and the X-axis moving table 10 is mounted on the X-axis guide so as to be slidable. A nut portion (not shown) is provided on the lower side of the X-axis moving table 10, and the nut portion is screwed to an X-axis ball screw (not shown) parallel to the X-axis guide.
在X軸滾珠螺桿之一端部連結有X軸脈衝馬達(無圖示)。藉由以X軸脈衝馬達使X軸滾珠螺桿旋轉,X軸移動台10沿著X軸導軌在X軸方向移動。 An X-axis pulse motor (not shown) is connected to one end of the X-axis ball screw. When the X-axis ball screw is rotated by the X-axis pulse motor, the X-axis moving table 10 moves along the X-axis guide in the X-axis direction.
在X軸移動台10之上方設置有用以保持被加工物11之挾盤台14。挾盤台14被連結於例如馬達等之旋轉驅動源(無圖示),在與Z軸方向(垂直方向)大概平行的旋轉軸之周圍旋轉。再者,挾盤台14係以上述X軸移動機構與X軸移動台10一起朝X軸方向被加工進給。 A disk table 14 is provided above the X-axis moving table 10 to hold the workpiece 11. The disk table 14 is connected to a rotation drive source (not shown) such as a motor, and rotates around a rotation axis substantially parallel to the Z-axis direction (vertical direction). The disk table 14 is processed and fed in the X-axis direction together with the X-axis moving table 10 by the X-axis moving mechanism.
挾盤台14之上面成為吸引、保持被加工物11之保持面16。該保持面16係透過被形成在挾盤台14之內部的吸引路等而被連接於吸引源(無圖示)。 The upper surface of the pan table 14 is a holding surface 16 that attracts and holds the workpiece 11. The holding surface 16 is connected to a suction source (not shown) through a suction path or the like formed inside the pan table 14.
在接近於開口4b之位置,設置有將上述被加工物11搬運至挾盤台14之搬運單元(無圖示)。以搬運單元被搬運的被加工物11係以例如表面11a側露出於上方之方式,被載置於挾盤台14之保持面16。 A transport unit (not shown) for transporting the workpiece 11 to the disk table 14 is provided at a position close to the opening 4b. The workpiece 11 to be transported by the transport unit is placed on the holding surface 16 of the disk table 14 such that the surface 11 a side is exposed above.
在基台4之上面,以跨越開口4b之方式配置有用以支撐2組切削單元18之門型支撐構造20。在支撐構造20之前面上部,設置有使各切削單元18在Y軸方向(左右方向、分度進給方向)及Z軸方向移動之2組切削單元移動機構(移動單元)22。 A gate-shaped support structure 20 for supporting two sets of cutting units 18 is disposed on the base 4 so as to span the opening 4b. Two sets of cutting unit moving mechanisms (moving units) 22 that move each cutting unit 18 in the Y-axis direction (left-right direction, indexing feed direction) and the Z-axis direction are provided on the front surface of the support structure 20.
各切削單元移動機構22共同具備被配置在支撐構造20之前面且與Y軸方向平行的一對Y軸導軌24。在Y軸導軌24,構成各切削單元移動機構22之Y軸移動板26分別被安裝成能夠滑動。 Each of the cutting unit moving mechanisms 22 includes a pair of Y-axis guide rails 24 arranged in front of the support structure 20 and parallel to the Y-axis direction. On the Y-axis guide 24, a Y-axis moving plate 26 constituting each cutting unit moving mechanism 22 is mounted so as to be slidable.
在各Y軸移動板26之背面側(後面側)設置有螺帽部(無圖示),該螺帽部螺合與Y軸導軌24平行之Y軸滾珠螺桿28。在各Y軸滾珠螺桿28之一端部連結有Y軸脈衝馬達30。若以Y軸脈衝馬達30使Y軸滾珠螺桿28旋轉時,Y軸移動板26沿著Y軸導軌24而在Y軸方向移動。 A nut portion (not shown) is provided on the back side (rear side) of each Y-axis moving plate 26, and the nut portion is screwed with a Y-axis ball screw 28 parallel to the Y-axis guide 24. A Y-axis pulse motor 30 is connected to one end of each Y-axis ball screw 28. When the Y-axis ball screw 28 is rotated by the Y-axis pulse motor 30, the Y-axis moving plate 26 moves along the Y-axis guide 24 and moves in the Y-axis direction.
在各Y軸移動板24之表面(前面)設置有與Z軸方向平行之一對Z軸導軌32。在Z軸導軌32,Z軸移動板34被安裝成能夠滑動。 A pair of Z-axis guide rails 32 are provided on the surface (front surface) of each Y-axis moving plate 24 in parallel with the Z-axis direction. On the Z-axis guide rail 32, the Z-axis moving plate 34 is mounted so as to be slidable.
在各Z軸移動板34之背面側(後面側)設置有螺帽部(無圖示),該螺帽部螺合與Z軸導軌32平行之Z軸滾珠螺桿36。在各Z軸滾珠螺桿36之一端部連結有Z軸脈衝 馬達38。若以Z軸脈衝馬達38使Z軸滾珠螺桿36旋轉時,Z軸移動板34沿著Z軸導軌32而在Z軸方向移動。 A nut portion (not shown) is provided on the back side (rear side) of each Z-axis moving plate 34, and the nut portion is screwed with a Z-axis ball screw 36 parallel to the Z-axis guide rail 32. A Z-axis pulse motor 38 is connected to one end of each Z-axis ball screw 36. When the Z-axis ball screw 36 is rotated by the Z-axis pulse motor 38, the Z-axis moving plate 34 moves in the Z-axis direction along the Z-axis guide rail 32.
在各Z軸移動板34之下部設置切削單元18。該切削單元18具備被安裝於成為旋轉軸之主軸40(參照圖7)之一端側的圓環狀之切削板42。再者,在切削單元18,安裝有用以測量挾盤台14之保持面16等之高度的高度測量器(高度測量單元),和用以攝像被加工物11等之攝影機(攝像單元)成為一體的複合測量單元(高度測量器(高度測量單元)、攝影機(攝像單元))44。 A cutting unit 18 is provided below the respective Z-axis moving plates 34. This cutting unit 18 includes an annular cutting plate 42 attached to one end side of a main shaft 40 (see FIG. 7) serving as a rotation axis. Furthermore, a height measuring device (height measuring unit) for measuring the height of the holding surface 16 and the like of the disk table 14 is mounted on the cutting unit 18, and a camera (imaging unit) for imaging the workpiece 11 and the like is integrated. Composite measuring unit (height measuring unit (height measuring unit), camera (camera unit)) 44.
若以各切削單元移動機構22使Y軸移動板26在Y軸方向移動時,切削單元18及複合測量單元44一起在Y軸方向被分度進給。再者,若以各切削單元移動機構22使Z軸移動板34在Z軸方向移動時,切削單元18及複合測量單元44一起升降。 When the Y-axis moving plate 26 is moved in the Y-axis direction by each cutting unit moving mechanism 22, the cutting unit 18 and the composite measurement unit 44 are indexed and fed in the Y-axis direction together. When the Z-axis moving plate 34 is moved in the Z-axis direction by each cutting unit moving mechanism 22, the cutting unit 18 and the composite measuring unit 44 are raised and lowered together.
相對於開口4b,在與開口4a相反側之位置,形成圓形之開口4c。在開口4c內設置用以洗淨切削後之被加工物11等之洗淨單元46。在X軸移動機構、挾盤台14、切削單元18、切削單元移動機構22、複合測量單元42、洗淨單元46等之構成要素,連接著控制單元48。各構成要素藉由該控制單元48被控制。 A circular opening 4c is formed with respect to the opening 4b at a position opposite to the opening 4a. A cleaning unit 46 is provided in the opening 4c for cleaning the processed object 11 and the like after cutting. The control unit 48 is connected to constituent elements such as the X-axis moving mechanism, the disk table 14, the cutting unit 18, the cutting unit moving mechanism 22, the composite measurement unit 42, and the washing unit 46. Each component is controlled by the control unit 48.
在與本實施型態有關之被加工物之切削方法中,首先,進行用以在複數座標(X,Y)測量挾盤台14之保持面16之高度(Z),記憶各個座標(X,Y)和高度(Z)之關係作為保持面資訊的保持面資訊記憶步驟。圖3 (A)為用以說明保持面資訊記憶步驟的側面圖。 In the method for cutting a workpiece related to this embodiment, first, the height (Z) of the holding surface 16 of the disk table 14 is measured at a plurality of coordinates (X, Y), and each coordinate (X, The relationship between Y) and height (Z) is used as a step of memorizing the retained surface information. FIG. 3 (A) is a side view for explaining a step of storing the face information.
如圖3(A)所示般,該保持面資訊記憶步驟係使用被安裝於切削單元18之複合測量單元44之高度測量器而進行。高度測量器係例如使用雷射光束L1而測量對象之位置(高度)的雷射位移計,可以以非接觸測量挾盤台14之保持面16之高度(Z)。 As shown in FIG. 3 (A), the holding surface information storing step is performed using a height measuring device of the composite measuring unit 44 mounted on the cutting unit 18. The height measuring device is, for example, a laser displacement meter that measures the position (height) of the object using the laser beam L1, and can measure the height (Z) of the holding surface 16 of the disk table 14 without contact.
在保持面資訊記憶步驟中,首先,使挾盤台14和複合測量單元44做相對性移動,使複合測量單元44移動至事先設定之保持面16之測量線31(參照圖3(B))之上方。而且,如圖3(A)所示般,一面以複合測量單元44照射測量用之雷射光束L1,一面使挾盤台14和複合測量單元44沿著測量線31做相對性移動。 In the step of memorizing the holding surface information, first, the pan table 14 and the composite measurement unit 44 are moved relative to each other, so that the composite measurement unit 44 is moved to the measurement line 31 of the holding surface 16 set in advance (see FIG. 3 (B)) Above. Moreover, as shown in FIG. 3 (A), while the laser beam L1 for measurement is irradiated with the composite measurement unit 44, the pan table 14 and the composite measurement unit 44 are relatively moved along the measurement line 31.
依此,可以在測量線31上之複數座標(X,Y)測量挾盤台14之保持面16之高度(Z)。藉由複數測量單元44所測量出之高度(Z)和座標(X,Y)之關係,被記憶於控制單元48之記憶部48a作為保持面資訊。當沿著被設定之所有的測量線31測量保持面16之高度(Z),所對應之保持面資訊被記憶於記憶部48a時,保持面資訊記憶步驟結束。 Accordingly, the height (Z) of the holding surface 16 of the disk table 14 can be measured at a plurality of coordinates (X, Y) on the measurement line 31. The relationship between the height (Z) and the coordinates (X, Y) measured by the complex measurement unit 44 is stored in the storage unit 48a of the control unit 48 as the holding surface information. When the height (Z) of the holding surface 16 is measured along all the set measurement lines 31, and the corresponding holding surface information is stored in the storage portion 48a, the holding surface information storing step ends.
圖3(B)為示意性地表示測量線31之設定例的俯視圖。在圖3(B)之設定例中,在例如X座標為X1、X2、X3之位置,分別設定與X軸方向垂直(與Y軸方向平行)之直線狀的測量線31。再者,在Y座標為Y1、Y2、Y3之位置,分別設定與Y軸方向垂直(與X軸方向平行)之 直線狀之測量線31。 FIG. 3 (B) is a plan view schematically showing a setting example of the measurement line 31. In the setting example of FIG. 3 (B), linear measurement lines 31 perpendicular to the X-axis direction (parallel to the Y-axis direction) are respectively set at positions where the X coordinates are X 1 , X 2 , and X 3 . Further, at the positions where the Y coordinates are Y 1 , Y 2 , and Y 3 , linear measurement lines 31 that are perpendicular to the Y-axis direction (parallel to the X-axis direction) are respectively set.
依此,例如,若X座標沿著X1之測量線31測量保持面16之高度(Z)時,可取得相對於測量線31上之複數座標(X1,Y)的高度(Z)資訊。另外,在本實施型態中,雖然在保持面16上設定合計6條的測量線31,但是被設定的測量線31之數量、配置等不受限制。可以因應所要求之切削的精度等,自由地設定測量線31。 So, for example, if the X coordinate holding surface 16 of the height (Z) measured along the 31 measuring 1 X line, may be made with respect to a plurality of coordinates (X 1, the Y) 31 on the measurement line height (Z) Information . In addition, in this embodiment, although a total of six measurement lines 31 are set on the holding surface 16, the number, arrangement, and the like of the measurement lines 31 to be set are not limited. The measurement line 31 can be freely set in accordance with the required cutting accuracy and the like.
再者,在本實施型態中,雖然沿著事先設定的測量線31連續性地測量保持面16之高度(Z),但是即使事先設定複數測量點,在該測量點測量保持面16之高度(Z)亦可。即使在此情況,因應所要求之切削的精度等,可以自由地設定測量點。 Furthermore, in this embodiment, the height (Z) of the holding surface 16 is continuously measured along a measurement line 31 set in advance, but even if a plurality of measurement points are set in advance, the height of the holding surface 16 is measured at the measurement point. (Z) Yes. Even in this case, the measurement point can be freely set in accordance with the required cutting accuracy and the like.
於保持面資訊記憶步驟之後,進行在複數座標(x,y)測量被加工物之厚度(t),記憶各個座標(x,y)和厚度(t)之關係作為厚度資訊的厚度資訊記憶步驟。圖4(A)為用以說明厚度資訊記憶步驟的側面圖。 After the step of maintaining the surface information, the thickness information storage step of measuring the thickness (t) of the workpiece at a plurality of coordinates (x, y), and memorizing the relationship between each coordinate (x, y) and the thickness (t) as the thickness information is performed. . FIG. 4 (A) is a side view for explaining a step of storing thickness information.
如圖4(A)所示般,該厚度資訊記憶步驟係利用被設置在切削裝置2之內部或外部之任意的厚度測量裝置52來進行。厚度測量裝置52具備用以保持被加工物11之保持台54。保持台54之上面成為用以保持被加工物11之保持面56。該保持面56以可以高精度地測量被加工物11之厚度之方式被形成平坦。 As shown in FIG. 4 (A), the thickness information storage step is performed by using an arbitrary thickness measuring device 52 provided inside or outside the cutting device 2. The thickness measuring device 52 includes a holding table 54 for holding the workpiece 11. The upper surface of the holding table 54 is a holding surface 56 for holding the workpiece 11. The holding surface 56 is flat so that the thickness of the workpiece 11 can be measured with high accuracy.
在保持台54之上方配置有測量器58。測量器58係例如使用雷射光束L2而測量對象之位置(高度)的雷 射位移計,可以非接觸地測量被加工物11之表面11a對保持台54之保持面56的高度(即是,包含保護構件21之被加工物11之厚度)。該測量器58被構成可以對保持台54做相對性移動。另外,作為測量器58,即使使用接觸式之測微計等亦可。 A measuring device 58 is disposed above the holding table 54. The measuring device 58 is, for example, a laser displacement meter that measures the position (height) of the object using the laser beam L2, and can measure the height of the surface 11a of the workpiece 11 to the holding surface 56 of the holding table 54 (that is, Thickness of workpiece 11 including protective member 21). The measuring device 58 is configured to be able to move relative to the holding table 54. The measuring device 58 may be a contact type micrometer or the like.
在厚度資訊記憶步驟中,首先以保持台54之保持面56,和被黏貼於被加工物11之保護構件21之背面21b相接之方式,將被加工物11載置於保持台54。依此,在被加工物11係在表面11a側露出於上方之狀態,被保持於保持台54。 In the thickness information memorizing step, the processed object 11 is first placed on the holding table 54 such that the holding surface 56 of the holding table 54 is in contact with the back surface 21 b of the protective member 21 adhered to the processed object 11. As a result, the workpiece 11 is held on the holding table 54 in a state where the workpiece 11 is exposed above on the surface 11 a side.
在以保持台54保持被加工物11之後,使保持台54和測量器58做相對性移動,使測量器58移動至事先設定的被加工物11之測量線33(參照圖4(B))之上方。而且,如圖4(A)所示般,一面以測量器58照射測量用之雷射光束L2,一面使挾盤台14和測量器58沿著測量線33做相對性移動。 After the workpiece 11 is held by the holding table 54, the holding table 54 and the measuring device 58 are moved relative to each other, and the measuring device 58 is moved to the measurement line 33 of the workpiece 11 set in advance (see FIG. 4 (B)). Above. As shown in FIG. 4 (A), the laser beam L2 for measurement is irradiated with the measuring device 58, and the disk table 14 and the measuring device 58 are moved relative to each other along the measuring line 33.
依此,可以在測量線33上之複數座標(x,y)測量被加工物11之厚度(t)。藉由測量器58被測量到的厚度(t)和座標(x,y)之關係,以任意的方式被送至切削裝置2,被記憶在控制單元46之記憶部48a作為厚度資訊。當沿著被設定之所有的測量線33測量被加工物11之厚度(t),所對應之厚度資訊被記憶於記憶部48a時,厚度資訊記憶步驟結束。 Accordingly, the thickness (t) of the workpiece 11 can be measured at a plurality of coordinates (x, y) on the measurement line 33. The relationship between the thickness (t) and the coordinates (x, y) measured by the measuring device 58 is sent to the cutting device 2 in an arbitrary manner, and is stored in the memory portion 48a of the control unit 46 as thickness information. When the thickness (t) of the workpiece 11 is measured along all the set measurement lines 33, and the corresponding thickness information is stored in the storage section 48a, the thickness information storage step ends.
圖4(B)為示意性地表示測量線33之設定例 的俯視圖。另外,在圖4(B)中,被加工物11使用固有的座標系(x座標及y座標)。在圖4(B)之設定例中,在例如x座標為x1、x2、x3之位置,分別設定與x軸方向垂直(與y軸方向平行)之直線狀的測量線33。再者,在y座標為y1、y2、y3之位置,分別設定與y軸方向垂直(與x軸方向平行)之直線狀之測量線33。 FIG. 4 (B) is a plan view schematically showing a setting example of the measurement line 33. In addition, in FIG. 4 (B), the workpiece 11 uses a unique coordinate system (x-coordinate and y-coordinate). In the setting example of FIG. 4 (B), linear measurement lines 33 that are perpendicular to the x-axis direction (parallel to the y-axis direction) are set at positions where the x coordinates are x 1 , x 2 , and x 3 , for example. Further, at positions where the y coordinates are y 1 , y 2 , and y 3 , linear measurement lines 33 that are perpendicular to the y-axis direction (parallel to the x-axis direction) are respectively set.
依此,例如,若x座標沿著x1之測量線33測量被加工物11之厚度(t)時,可取得相對於測量線33上之複數座標(x1,y)的厚度(t)資訊。另外,在本實施型態中,雖然在上述保持面資訊記憶步驟對準被設定在保持面16上之測量線31,在被加工物11之表面11a上設定合計6條之測量線33,但是所設定之測量線33之數量、配置等不受限制。可以因應所要求之切削的精度等,自由地設定測量線33。 So, e.g., when measured along the x coordinate x 1 of the line 33 is measured when the thickness (t) of the workpiece 11, the thickness can be obtained with respect to a plurality of coordinates (x 1, Y) on the measurement line 33 (t) Information. In addition, in this embodiment, the measurement line 31 set on the holding surface 16 is aligned in the above-mentioned holding surface information storage step, and a total of six measurement lines 33 are set on the surface 11a of the workpiece 11. However, The number and arrangement of the measurement lines 33 to be set are not limited. The measurement line 33 can be freely set in accordance with the required cutting accuracy and the like.
再者,在本實施型態中,雖然沿著事先設定的測量線33連續性地測量被加工物11之厚度(t),但是即使事先設定複數測量點,在該測量點測量被加工物11之厚度(t)亦可。即使在此情況,因應所要求之切削的精度等,可以自由地設定測量點。 Furthermore, in this embodiment, although the thickness (t) of the workpiece 11 is continuously measured along a measurement line 33 set in advance, even if a plurality of measurement points are set in advance, the workpiece 11 is measured at the measurement point. The thickness (t) is also acceptable. Even in this case, the measurement point can be freely set in accordance with the required cutting accuracy and the like.
於厚度資訊記憶步驟之後,進行在挾盤台保持被記憶厚度資訊的被加工物11之保持步驟。圖5(A)為用以說明保持步驟的側面圖。在該保持步驟中,以挾盤台14之保持面16,和被黏貼於被加工物11之保護構件21之背面21b相接之方式,將被加工物11載置於挾盤台14。之 後,藉由使吸引源之負壓作用於保持面16,被加工物11在表面11a側露出於上方之狀態下,被吸引、保持於挾盤台14。 After the thickness information storing step, a step of holding the workpiece 11 holding the stored thickness information on the pan table is performed. Fig. 5 (A) is a side view for explaining a holding step. In this holding step, the processing object 11 is placed on the disk table 14 such that the holding surface 16 of the disk table 14 is in contact with the back surface 21 b of the protective member 21 adhered to the processing object 11. Thereafter, the negative pressure of the suction source is applied to the holding surface 16, and the workpiece 11 is sucked and held on the disk table 14 with the surface 11a side exposed above.
於保持步驟之後,進行用以檢測出在挾盤台14所保持之被加工物11之外周緣的座標,和被形成在外周緣的凹槽11c(或是,被形成在被加工物11之表面11a的裝置15之圖案等),記憶位置資訊的位置資訊記憶步驟。圖5(B)為用以說明位置資訊記憶步驟的俯視圖。 After the holding step, the coordinates for detecting the outer periphery of the workpiece 11 held by the disk table 14 and the groove 11c (or, formed on the surface of the workpiece 11) formed on the outer periphery are performed. 11a device 15 pattern, etc.), a location information storage step for storing location information. FIG. 5 (B) is a plan view for explaining a step of memorizing position information.
在位置資訊記憶步驟中,首先將複合測量單元44所具備之攝影機之視野35對準包含被加工物11之外周緣的區域,以攝影機攝像該區域。攝影機所進行的攝像,例如一面使挾盤台14旋轉,一面在不同的複數位置進行。藉由攝像所形成之畫像之資料被送至控制單元48。 In the position information storage step, first, the field of view 35 of the camera provided in the composite measurement unit 44 is aligned with an area including the outer periphery of the processed object 11, and the area is imaged by the camera. For example, the imaging performed by a camera is performed at different plural positions while the pan table 14 is rotated. The data of the image formed by the camera is sent to the control unit 48.
控制單元48係對從攝影機被送出的畫像進行邊緣檢測處理,取得表示被加工物11之外周緣的曲線。之後,控制單元48抽出曲線上之任意的3點A、B、C之座標。3點A、B、C之座標即使從以一次攝像所取得之一個畫像資料被抽出亦可,即使從複數次之攝像所取得之複數畫像資料被抽出亦可。 The control unit 48 performs edge detection processing on the image sent from the camera, and obtains a curve representing the outer periphery of the object 11 to be processed. After that, the control unit 48 extracts the coordinates of any three points A, B, and C on the curve. The coordinates of three points A, B, and C may be extracted from one image data obtained by one imaging, and even if plural image data obtained from multiple imaging are extracted.
接著,控制單元48算出與連結點A及點B之線段垂直之2等分線,和與連結點B及點C之線段垂直之2等分線之交點的座標。該交點之座標相當於被加工物11之中心O的座標。於算出中心O之座標(交點之座標)之後,抽出凹槽11c之座標,算出連結中心O和凹槽11c之直線, 通過中心O,而對與表面11a平行之任意的基準線所構成之角度θ(無圖示)。 Next, the control unit 48 calculates the coordinates of the intersection of the bisector perpendicular to the line segment connecting the points A and B and the bisector perpendicular to the line segment connecting the points B and C. The coordinates of the intersection point correspond to the coordinates of the center O of the workpiece 11. After calculating the coordinates of the center O (coordinates of the intersection point), the coordinates of the groove 11c are extracted, and a straight line connecting the center O and the groove 11c is calculated, and the angle formed by the center O to an arbitrary reference line parallel to the surface 11a is calculated. θ (not shown).
於算出中心O之座標(交點之座標),和角度θ之後,將該些作為被加工物11對挾盤台14之位置資訊而記憶於控制單元48之記憶部48a。藉由使用該位置資訊,可以將在被加工物11以固有之座標系(x座標及y座標)所表示的厚度資訊,變換成挾盤台14(切削裝置2)之座標系(X座標及Y座標)。 After calculating the coordinates of the center O (the coordinates of the intersection point) and the angle θ, these are stored in the storage unit 48 a of the control unit 48 as the position information of the processed object 11 on the disk table 14. By using this position information, it is possible to convert the thickness information indicated by the inherent coordinate system (x coordinate and y coordinate) on the workpiece 11 into the coordinate system (X coordinate and Y coordinate).
於位置資訊記憶步驟之後,實施從位置資訊和保持面資訊和厚度資訊,在任意之座標(X,Y)算出被加工物11之表面11a之高度的算出步驟。圖6(A)為視覺性地表示保持面資訊所示的保持面16之高度(Z)的圖示,圖6(B)為視覺性地表示厚度資訊所示的被加工物11之厚度(t)的圖示,圖6(C)為視覺性地表示被加工物11之表面11a之高度的圖示。 After the position information storage step, a calculation step of calculating the height of the surface 11a of the workpiece 11 from the position information, the holding surface information, and the thickness information is performed at arbitrary coordinates (X, Y). FIG. 6 (A) is a diagram showing the height (Z) of the holding surface 16 shown in the holding surface information, and FIG. 6 (B) is a diagram showing the thickness of the workpiece 11 shown in the thickness information ( t), and FIG. 6 (C) is a view showing the height of the surface 11a of the workpiece 11 visually.
另外,在圖6(B)中,表示變換成挾盤台14之座標系之後的厚度(t)。再者,在圖6(A)、圖6(B)及圖6(C)中,以「0」表示高度或厚度之基準值,使用「+1」「-1」等之數值表示從該基準值偏移的量。 In addition, FIG. 6 (B) shows the thickness (t) after conversion to the coordinate system of the disk table 14. In addition, in FIG. 6 (A), FIG. 6 (B), and FIG. 6 (C), a reference value of height or thickness is represented by "0", and a numerical value such as "+1", "-1", etc. The amount by which the reference value is offset.
例如,如圖6(A)及圖6(B)所示般,在挾盤台14上之區域(座標)37,保持面16之高度為「0」,被加工物11之厚度為「+1」。依此,在該區域37中,如圖6(C)所示般,算出被加工物11之表面11a之高度(t+Z) 為「+1」(即是,僅比基準值「0」高出「1」)。 For example, as shown in FIGS. 6 (A) and 6 (B), in the area (coordinates) 37 on the pan table 14, the height of the holding surface 16 is "0", and the thickness of the workpiece 11 is "+" 1". Accordingly, in this region 37, as shown in FIG. 6 (C), the height (t + Z) of the surface 11a of the workpiece 11 is calculated to be "+1" (that is, only higher than the reference value "0" Higher than "1").
另外,也可預想保持面資訊之座標和厚度資訊之座標不對應之情形。在此情況,例如若使用相對於任意座標之保持面資訊(高度(Z)),最近的座標之厚度資訊(厚度(t)),算出被加工物11之表面11a之高度即可。另外,若適當設定測量線31、33(或測量點)之後,因應在位置資訊記憶步驟所算出之角度θ,使被加工物11對挾盤台14旋轉時,亦可以使保持面資訊之座標和厚度資訊之座標一致。 In addition, it is also conceivable that the coordinates of the surface information and the coordinates of the thickness information do not correspond. In this case, for example, if the holding surface information (height (Z)) relative to an arbitrary coordinate and the thickness information (thickness (t)) of the nearest coordinate are used, the height of the surface 11a of the workpiece 11 may be calculated. In addition, if the measurement lines 31 and 33 (or measurement points) are set appropriately, the coordinates of the surface information can also be maintained when the workpiece 11 is rotated on the disk table 14 according to the angle θ calculated in the position information storage step. Coordinate with thickness information.
於算出步驟之後,進行根據在算出步驟算出的被加工物11之表面11a之高度(t+Z),使旋轉的切削刀42切入至被加工物11,在被加工物11形成期望之深度的溝部之切削步驟。圖7為示意性地表示切削步驟之俯視圖。 After the calculation step, the height (t + Z) of the surface 11a of the workpiece 11 calculated in the calculation step is performed, and the rotating cutting blade 42 is cut into the workpiece 11 to form a desired depth in the workpiece 11 Cutting step of groove. Fig. 7 is a plan view schematically showing a cutting step.
在本實施型態中,因正確地算出被加工物11之表面11a之高度(t+Z),故可以根據該表面11a之高度(t+Z),使切削刀42精度佳地切入。依此,可以從被加工物11之表面11a沿著切削預定線13形成期望之深度的溝部。 In this embodiment, the height (t + Z) of the surface 11a of the workpiece 11 is accurately calculated, so that the cutting blade 42 can be cut with high accuracy based on the height (t + Z) of the surface 11a. Accordingly, a groove portion having a desired depth can be formed from the surface 11 a of the workpiece 11 along the planned cutting line 13.
如上述般,在本實施型態有關之被加工物之切削方法中,因從在複數座標(X,Y)測量挾盤台14之保持面16之高度(Z)而所取得之保持面資訊,和測量被加工物11之厚度(t)而所取得之厚度資訊,在任意之座標(X,Y)算出在挾盤台14所保持之被加工物11之表面(上面)11a的高度,故可以高精度地控制切削刀42對被加工 物11的切入深度。 As described above, in the cutting method of the workpiece related to the present embodiment, the holding surface information obtained by measuring the height (Z) of the holding surface 16 of the disk table 14 at a plurality of coordinates (X, Y) , And the thickness information obtained by measuring the thickness (t) of the processed object 11, calculate the height of the surface (upper surface) 11a of the processed object 11 held on the pan table 14 at an arbitrary coordinate (X, Y), Therefore, the cutting depth of the cutting tool 42 into the workpiece 11 can be controlled with high accuracy.
再者,在與本實施型態有關之被加工物之切削方法中,因不需要在被加工物11形成確認用之溝部,故比起形成確認用之溝部的以往之方法,可以縮短至切削完成所需的時間。 Furthermore, in the method for cutting a workpiece related to this embodiment, since it is not necessary to form a groove portion for confirmation in the workpiece 11, it can be shortened to cutting compared with the conventional method of forming a groove portion for confirmation. The time needed to complete.
另外,本發明並不限制於上述實施型態之記載,能夠做各種變更而加以實施。例如,在上述實施型態之厚度資訊記憶步驟中,雖然在測量線33上之複數座標(x,y)測量被加工物11之厚度(t),但是在被加工物11之厚度偏差非常小的情況等,可以使用被加工物11之1點的厚度(t)作為厚度資訊。在此情況,即使省略位置資訊記憶步驟亦可。 In addition, the present invention is not limited to the description of the above-mentioned embodiments, and can be implemented with various changes. For example, in the thickness information memorizing step of the above implementation mode, although the plurality of coordinates (x, y) on the measurement line 33 measures the thickness (t) of the workpiece 11, the thickness deviation of the workpiece 11 is very small. For example, the thickness (t) of one point of the workpiece 11 can be used as the thickness information. In this case, the position information storage step may be omitted.
再者,在上述實施型態之位置資訊記憶步驟中,使用具備複合測量單元44之攝影機(攝像單元)而檢測出被加工物11之外周緣或凹槽11c等,但是亦可以使用複合測量單元44所具備之高度測量器(高度測量單元)而檢測出被加工物11之外周緣或凹槽11c等。 Furthermore, in the position information storing step of the above embodiment, a camera (imaging unit) provided with the composite measurement unit 44 is used to detect the outer periphery of the workpiece 11 or the groove 11c, etc., but a composite measurement unit may be used. The height measuring device (height measuring unit) included in 44 detects the outer periphery of the workpiece 11 or the groove 11c.
其他,與上述實施型態有關之構造、方法等只要在不脫離本發明之目的的範圍,可以適當變更而加以實施。 In addition, the structures, methods, and the like related to the above-mentioned embodiments can be appropriately modified and implemented as long as they do not depart from the purpose of the present invention.
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| CN107768242A (en) | 2018-03-06 |
| KR20180020889A (en) | 2018-02-28 |
| CN107768242B (en) | 2023-06-02 |
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| JP6727719B2 (en) | 2020-07-22 |
| JP2018027601A (en) | 2018-02-22 |
| KR102271652B1 (en) | 2021-06-30 |
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