TW201802854A - Current fuse - Google Patents
Current fuse Download PDFInfo
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- TW201802854A TW201802854A TW106105067A TW106105067A TW201802854A TW 201802854 A TW201802854 A TW 201802854A TW 106105067 A TW106105067 A TW 106105067A TW 106105067 A TW106105067 A TW 106105067A TW 201802854 A TW201802854 A TW 201802854A
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- Prior art keywords
- melting
- point metal
- low
- melting point
- current fuse
- Prior art date
Links
- 239000002184 metal Substances 0.000 claims abstract description 248
- 229910052751 metal Inorganic materials 0.000 claims abstract description 248
- 238000002844 melting Methods 0.000 claims abstract description 163
- 239000004020 conductor Substances 0.000 claims abstract description 134
- 230000008018 melting Effects 0.000 claims abstract description 125
- 239000002245 particle Substances 0.000 claims description 46
- 229910000679 solder Inorganic materials 0.000 claims description 30
- 229910045601 alloy Inorganic materials 0.000 claims description 15
- 239000000956 alloy Substances 0.000 claims description 15
- 229910052802 copper Inorganic materials 0.000 claims description 10
- 238000003825 pressing Methods 0.000 claims description 8
- 229910052709 silver Inorganic materials 0.000 claims description 7
- 238000010030 laminating Methods 0.000 claims description 6
- 238000003466 welding Methods 0.000 claims description 3
- 238000002156 mixing Methods 0.000 claims description 2
- 229910001316 Ag alloy Inorganic materials 0.000 claims 1
- 229910000881 Cu alloy Inorganic materials 0.000 claims 1
- 238000013021 overheating Methods 0.000 abstract description 6
- 230000002159 abnormal effect Effects 0.000 abstract description 2
- 239000000463 material Substances 0.000 description 27
- 238000010438 heat treatment Methods 0.000 description 17
- 239000010949 copper Substances 0.000 description 14
- 239000010410 layer Substances 0.000 description 13
- 238000007747 plating Methods 0.000 description 11
- 238000013467 fragmentation Methods 0.000 description 7
- 238000006062 fragmentation reaction Methods 0.000 description 7
- 230000000694 effects Effects 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 6
- 150000002739 metals Chemical class 0.000 description 6
- 238000000034 method Methods 0.000 description 6
- 230000003064 anti-oxidating effect Effects 0.000 description 5
- 238000009713 electroplating Methods 0.000 description 5
- 239000010408 film Substances 0.000 description 5
- 239000011888 foil Substances 0.000 description 5
- 239000003870 refractory metal Substances 0.000 description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 4
- 229910000978 Pb alloy Inorganic materials 0.000 description 4
- 230000007613 environmental effect Effects 0.000 description 4
- 230000000903 blocking effect Effects 0.000 description 3
- 238000005520 cutting process Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000000149 penetrating effect Effects 0.000 description 3
- 238000005476 soldering Methods 0.000 description 3
- 229910052718 tin Inorganic materials 0.000 description 3
- 229910001128 Sn alloy Inorganic materials 0.000 description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 2
- 229910001297 Zn alloy Inorganic materials 0.000 description 2
- 230000004931 aggregating effect Effects 0.000 description 2
- 238000005452 bending Methods 0.000 description 2
- 229910052797 bismuth Inorganic materials 0.000 description 2
- 229910052793 cadmium Inorganic materials 0.000 description 2
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- 230000003628 erosive effect Effects 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 229910052738 indium Inorganic materials 0.000 description 2
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 2
- 229910052753 mercury Inorganic materials 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 230000008961 swelling Effects 0.000 description 2
- 229910052725 zinc Inorganic materials 0.000 description 2
- 239000011701 zinc Substances 0.000 description 2
- 229910000570 Cupronickel Inorganic materials 0.000 description 1
- 229910020830 Sn-Bi Inorganic materials 0.000 description 1
- 229910018728 Sn—Bi Inorganic materials 0.000 description 1
- 238000002679 ablation Methods 0.000 description 1
- 238000005275 alloying Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- YOCUPQPZWBBYIX-UHFFFAOYSA-N copper nickel Chemical compound [Ni].[Cu] YOCUPQPZWBBYIX-UHFFFAOYSA-N 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000002500 effect on skin Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000003912 environmental pollution Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 229910000743 fusible alloy Inorganic materials 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- PXHVJJICTQNCMI-UHFFFAOYSA-N nickel Substances [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
- 239000010944 silver (metal) Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 238000005728 strengthening Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 239000011366 tin-based material Substances 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H85/00—Protective devices in which the current flows through a part of fusible material and this current is interrupted by displacement of the fusible material when this current becomes excessive
- H01H85/02—Details
- H01H85/04—Fuses, i.e. expendable parts of the protective device, e.g. cartridges
- H01H85/05—Component parts thereof
- H01H85/055—Fusible members
- H01H85/06—Fusible members characterised by the fusible material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H85/00—Protective devices in which the current flows through a part of fusible material and this current is interrupted by displacement of the fusible material when this current becomes excessive
- H01H85/02—Details
- H01H85/04—Fuses, i.e. expendable parts of the protective device, e.g. cartridges
- H01H85/05—Component parts thereof
- H01H85/055—Fusible members
- H01H85/08—Fusible members characterised by the shape or form of the fusible member
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H85/00—Protective devices in which the current flows through a part of fusible material and this current is interrupted by displacement of the fusible material when this current becomes excessive
- H01H85/02—Details
- H01H85/04—Fuses, i.e. expendable parts of the protective device, e.g. cartridges
- H01H85/05—Component parts thereof
- H01H85/143—Electrical contacts; Fastening fusible members to such contacts
- H01H85/157—Ferrule-end contacts
Landscapes
- Fuses (AREA)
Abstract
Description
本發明係關於一種安裝於電流路徑上、因流過超過額定值之電流時之自發熱而熔斷且遮斷電流路徑的電流熔絲。本申請案係以2016年2月19日於日本申請之日本專利申請號特願2016-030512為基礎且主張優先權,且該申請案以參照之形式沿用於本申請案中。 The present invention relates to a current fuse which is installed on a current path and cuts off and blocks the current path due to self-heating when a current exceeding a rated value flows. This application is based on and claims priority from Japanese Patent Application No. 2016-030512 filed in Japan on February 19, 2016, and the application is used in the present application by reference.
以往,作為電子.電氣機器等之電性電路之安全裝置,採用如圖16(A)、(B)示、稱為所謂帶扣熔絲的、藉由焊料等連接媒體93利用線狀或帶狀熔斷部92將一對扣型端子91、91間連接而成的電流熔絲90。再者,圖16(A)係表示先前之電流熔絲之一例的俯視圖,圖16(B)係圖16(A)之A-A’剖面圖。 In the past, as electronics. The safety device for electrical circuits such as electrical equipment uses so-called buckle fuses as shown in Figs. 16 (A) and 16 (B). Connection media 93 such as solder are used by wire or ribbon fuses 92. A current fuse 90 is connected between a pair of button terminals 91 and 91. 16 (A) is a plan view showing an example of a conventional current fuse, and FIG. 16 (B) is a sectional view taken along the line A-A 'of FIG. 16 (A).
關於此種電流熔絲90,作為扣型端子91,一般採用銅端子,作為熔斷部92,一般採用由鉛中加有少量Sn、Ag等之線狀或帶狀的易熔之合金構成的熔斷構件,當該電性電路流過既定容量以上之過電流時熔斷部92會瞬間熔斷從而確保機器之安全性。 Regarding this type of current fuse 90, a copper terminal is generally used as the buckle terminal 91, and a fuse made of a wire or ribbon-like fusible alloy with a small amount of Sn, Ag and the like is generally used as the fuse portion 92. As for the component, when the electric circuit passes an overcurrent exceeding a predetermined capacity, the fuse section 92 will instantly fuse to ensure the safety of the machine.
先前技術文獻 Prior art literature
專利文獻 Patent literature
專利文獻1:日本特開2002-352686號公報 Patent Document 1: Japanese Patent Application Laid-Open No. 2002-352686
以往之帶扣熔絲係於使用鉛合金等作為熔斷構件之熔斷部92之兩端連接有扣型端子91者,或者藉由鋅合金一體成形熔斷部92及扣型端子91者。然而,鉛合金係環境負荷大的有害金屬,與鎘、水銀或其等之合金等同樣要求強力削減。 Conventional buckle fuses are those in which lead terminals 91 are connected to both ends of a fuse portion 92 using a lead alloy or the like as a fuse member, or the fuse portion 92 and the button terminals 91 are integrally formed by a zinc alloy. However, lead alloys, which are harmful metals with a large environmental load, require strong reductions similar to those of cadmium, mercury, or their alloys.
作為鉛替代材料之Sn合金,於與扣型端子91之連接中,焊接時Sn合金會熔融,故而,難以用作熔斷構件。而且,鋅合金之熔點約為400℃,較之鉛合金將近高100℃,比電阻約為6μΩ.cm,較之鉛合金之約21μΩ.cm低1/3以上,故而,熔斷時之扣型端子91之溫度成為高溫,有對帶扣熔絲所連接之電路基板之端子部等周邊構件、機器本體或使用者造成熱影響的風險。故而,需要使熔斷部92局部變細等加工,但有電阻值升高從而難以應對較高之電流額定值的傾向。 The Sn alloy, which is a lead replacement material, is difficult to be used as a fusible member because the Sn alloy is melted during soldering in connection with the buckle terminal 91. Moreover, the melting point of zinc alloy is about 400 ℃, which is nearly 100 ℃ higher than that of lead alloy, and the specific resistance is about 6μΩ. cm, compared to about 21μΩ of lead alloy. cm is lower than 1/3. Therefore, the temperature of the buckle terminal 91 at the time of fusing becomes high temperature, and there is a risk of causing thermal influence on peripheral components such as the terminal portion of the circuit board to which the buckle fuse is connected, the machine body or the user. For this reason, it is necessary to perform processing such as thinning the fuse portion 92 locally, but the resistance value tends to increase and it is difficult to cope with a higher current rating.
故而,本發明之目的在於提供一種能改善對端子部之連接性,能提高電流額定值而不會導致電阻值上升,且能抑制熔斷時端子部之異常過熱的電流熔絲。 Therefore, an object of the present invention is to provide a current fuse which can improve the connection to the terminal portion, can increase the current rating without increasing the resistance value, and can suppress abnormal overheating of the terminal portion at the time of fusing.
而且,另外,本發明之目的還在於提供一種亦能應對環境限制之強化的無鉛電流熔絲。 Furthermore, it is another object of the present invention to provide a lead-free current fuse that can also be enhanced to cope with environmental restrictions.
為了解決上述問題,本發明之電流熔絲中,具有兩個卡合端子部、及設於上述卡合端子部間之熔斷部,上述熔斷部係由積層有低熔點金屬、及熔點高於上述低熔點金屬之第1高熔點金屬的可溶導體形成。 In order to solve the above problems, the current fuse of the present invention has two engagement terminal portions and a fuse portion provided between the engagement terminal portions. The fuse portion is formed by laminating a low melting point metal and a melting point higher than the above. The first high-melting metal soluble conductor of the low-melting metal is formed.
而且,本發明之電流熔絲中,上述低熔點金屬係sn或主成分為Sn之合金,上述第1高熔點金屬係Ag、Cu或主成分為Ag或Cu之合金。 Further, in the current fuse of the present invention, the low-melting-point metal-based sn or an alloy whose main component is Sn, and the first high-melting-point metal-based Ag or Cu or an alloy whose main component is Ag or Cu.
根據本發明,可溶導體係積層有低熔點金屬與第1高熔點金屬之積層體,故而,於對卡合端子部進行焊料連接時等低熔點金屬已熔融的情況下,因被第1高熔點金屬覆蓋,故不會熔斷,能進行焊料連接。 According to the present invention, the soluble conductive system is laminated with a laminate of a low-melting-point metal and a first high-melting-point metal. Therefore, when the low-melting-point metal has melted, such as when soldering the engaging terminal portion, the first high It is covered with a melting point metal, so it does not melt and solder connection is possible.
而且,可溶導體中積層有熔點低於第1高熔點金屬之低熔點金屬,故而,因過電流產生之自發熱而自低熔點金屬之熔點起開始熔融,開始侵蝕第1高熔點金屬,第1高熔點金屬於低於自身熔點之溫度下熔融。故而,根據本發明,能防止卡合端子部之過熱,利用低熔點金屬對第1高熔點金屬之熔蝕作用而使可溶導體迅速熔斷從而遮斷電流路徑。 In addition, the soluble conductor is laminated with a low-melting-point metal having a melting point lower than that of the first high-melting-point metal. Therefore, the self-heating caused by the overcurrent starts to melt from the melting point of the low-melting-point metal and begins to erode the first high-melting-point metal. 1 High-melting metals melt at temperatures below their own melting points. Therefore, according to the present invention, it is possible to prevent overheating of the engaging terminal portion, and use the melting effect of the low-melting-point metal on the first high-melting-point metal to quickly melt the soluble conductor to block the current path.
1‧‧‧電流熔絲 1‧‧‧current fuse
2‧‧‧卡合端子部 2‧‧‧ Engagement terminal
3‧‧‧熔斷部 3‧‧‧Fuse
4‧‧‧低熔點金屬 4‧‧‧ low melting point metal
5‧‧‧第1高熔點金屬 5‧‧‧ the first high melting point metal
6‧‧‧可溶導體 6‧‧‧ soluble conductor
7‧‧‧連接材 7‧‧‧Connecting material
9‧‧‧變形限制部 9‧‧‧Deformation limitation section
10‧‧‧孔 10‧‧‧hole
10a‧‧‧側面 10a‧‧‧ side
10b‧‧‧底面 10b‧‧‧ Underside
11‧‧‧第2高熔點金屬 11‧‧‧ 2nd high melting point metal
13‧‧‧第1高熔點粒子 13‧‧‧ the first high melting point particle
15‧‧‧第2高熔點粒子 15‧‧‧ 2nd high melting point particle
16‧‧‧凸緣部 16‧‧‧ flange
17‧‧‧凹槽 17‧‧‧ groove
20‧‧‧電流熔絲 20‧‧‧Current Fuse
圖1(A)係應用本發明之電流熔絲之俯視圖,圖1(B)係圖1(A)之A-A’剖面圖。 Fig. 1 (A) is a top view of a current fuse to which the present invention is applied, and Fig. 1 (B) is a cross-sectional view taken along A-A 'of Fig. 1 (A).
圖2(A)係於熔斷部設有變形限制部之電流熔絲之俯視圖,圖2(B)係圖2(A)之A-A’剖面圖。 Fig. 2 (A) is a top view of a current fuse provided with a deformation limiting portion in a fuse portion, and Fig. 2 (B) is a cross-sectional view taken along A-A 'of Fig. 2 (A).
圖3(A)係形成有非貫通孔之可溶導體於加熱前之剖面圖,圖3(B)係圖3(A)所示之可溶導體於加熱後之剖面圖。 FIG. 3 (A) is a cross-sectional view of a soluble conductor with non-through holes formed before heating, and FIG. 3 (B) is a cross-sectional view of a soluble conductor shown in FIG. 3 (A) after heating.
圖4(A)係表示貫通孔內由第2高熔點金屬充填之可溶導體的剖面圖,圖4(B)係表示非貫通孔內由第2高熔點金屬充填之可溶導體的剖面圖。 Fig. 4 (A) is a cross-sectional view showing a soluble conductor filled with a second high-melting-point metal in a through-hole, and Fig. 4 (B) is a cross-sectional view showing a soluble conductor filled with a second high-melting-point metal in a non-through-hole. .
圖5(A)係表示設有剖面為矩形狀之貫通孔的可溶導體之剖面圖,圖5(B)係表示設有剖面為矩形狀之非貫通孔的可溶導體之剖面圖。 FIG. 5 (A) is a cross-sectional view of a soluble conductor provided with a through-hole having a rectangular cross-section, and FIG. 5 (B) is a cross-sectional view of a soluble conductor provided with a non-through-hole having a rectangular cross-section.
圖6係表示設有第2高熔點金屬直至孔之開口端側之上側的可溶導體之剖面圖。 6 is a cross-sectional view showing a soluble conductor provided with a second refractory metal up to the opening end side of the hole.
圖7(A)係表示對向地形成有非貫通孔之可溶導體的剖面圖,圖7(B)係表示非對向地形成有非貫通孔之可溶導體的剖面圖。 FIG. 7 (A) is a cross-sectional view showing a soluble conductor having non-through holes formed in opposite directions, and FIG. 7 (B) is a cross-sectional view showing a soluble conductor having non-through holes formed in opposite directions.
圖8係表示低熔點金屬中配合有第1高熔點粒子之可溶導體的剖面圖。 FIG. 8 is a cross-sectional view showing a soluble conductor in which a first high-melting-point particle is incorporated in a low-melting-point metal.
圖9(A)係表示低熔點金屬中配合有粒徑小於低熔點金屬之厚度之第1高熔點粒子的可溶導體於加熱前之剖面圖,圖9(B)係表示圖9(A)所示之可溶導體於加熱後之剖面圖。 FIG. 9 (A) is a cross-sectional view of a soluble conductor mixed with first high-melting-point particles having a particle size smaller than the thickness of the low-melting metal in a low-melting metal before heating, and FIG. 9 (B) is a view showing FIG. 9 (A) The cross section of the soluble conductor shown after heating.
圖10係表示第2高熔點粒子壓入至低熔點金屬之可溶導體的剖面圖。 FIG. 10 is a cross-sectional view showing a soluble conductor in which second high-melting-point particles are pressed into a low-melting-point metal.
圖11係表示第2高熔點粒子壓入至第1高熔點金屬及低熔點金屬之可溶導體的剖面圖。 11 is a cross-sectional view showing a soluble conductor in which the second high-melting-point particles are pressed into the first high-melting-point metal and the low-melting-point metal.
圖12係表示於第2高熔點粒子之兩端形成有凸緣部之可溶導體的剖面圖。 12 is a cross-sectional view showing a soluble conductor having flange portions formed on both ends of the second high-melting-point particles.
圖13(A)係設有於熔斷部形成有凹槽之變形限制部的電流熔絲於加熱前之俯視圖,圖13(B)係圖13(A)之A-A’剖面圖。 Fig. 13 (A) is a plan view of a current fuse provided with a deformation limiting portion having a groove formed in the fuse portion before heating, and Fig. 13 (B) is a cross-sectional view taken along the line A-A 'of Fig. 13 (A).
圖14(A)係表示藉由可溶導體形成卡合端子部及熔斷部之電流熔絲的俯視圖,圖14(B)係圖14(A)之A-A’剖面圖。 Fig. 14 (A) is a plan view showing a current fuse in which an engaging terminal portion and a fuse portion are formed by a soluble conductor, and Fig. 14 (B) is a cross-sectional view taken along A-A 'of Fig. 14 (A).
圖15(A)係表示藉由設有變形限制部之可溶導體形成卡合端子部及熔斷部的電流熔絲之俯視圖,圖15(B)係圖15(A)之A-A’剖面圖。 FIG. 15 (A) is a plan view showing a current fuse in which an engaging terminal portion and a fuse portion are formed by a soluble conductor provided with a deformation restricting portion, and FIG. 15 (B) is an AA ′ section of FIG. 15 (A) Illustration.
圖16(A)係表示以往之電流熔絲之一例的俯視圖,圖16(B)係圖16(A)之 A-A’剖面圖。 FIG. 16 (A) is a plan view showing an example of a conventional current fuse, and FIG. 16 (B) is a view of FIG. 16 (A) A-A 'sectional view.
以下,參照圖式,詳細說明應用本發明之電流熔絲。再者,本發明並不僅限於以下之實施形態,當然可於未脫離本發明要旨之範圍內進行各種變更。而且,圖式係示意性者,各尺寸之比例等有時與實際不同。具體的尺寸等應參考以下說明而判斷。而且,當然各個圖式間亦包含彼此之尺寸之關係或比例不同之部分。 Hereinafter, a current fuse to which the present invention is applied will be described in detail with reference to the drawings. The present invention is not limited to the following embodiments, and various changes can be made without departing from the scope of the present invention. In addition, the drawings are schematic, and the ratios and the like of the dimensions may be different from the actual ones. Specific dimensions and the like should be determined with reference to the following description. Moreover, it is a matter of course that the respective drawings also include portions having different dimensional relationships or ratios.
[電流熔絲] [Current fuse]
如圖1所示,應用本發明之電流熔絲1具有兩個卡合端子部2、及設於卡合端子部2間之熔斷部3。電流熔絲1中,兩個卡合端子部2卡合於電性電路之端子部間且得以螺固等,藉此,組裝至該電性電路之電流路徑上。並且,電流熔絲1係當其電性電路流過既定容量以上之過電流時使熔斷部3瞬間熔斷而遮斷一對卡合端子部2間之電流路徑,從而確保機器之安全性。 As shown in FIG. 1, the current fuse 1 to which the present invention is applied has two engaging terminal portions 2 and a fuse portion 3 provided between the engaging terminal portions 2. In the current fuse 1, the two engaging terminal portions 2 are engaged between the terminal portions of the electrical circuit and are screwed or the like, thereby being assembled to the current path of the electrical circuit. In addition, the current fuse 1 causes the fuse circuit 3 to be instantaneously blown when the electrical circuit flows an overcurrent exceeding a predetermined capacity, thereby blocking the current path between the pair of engaging terminal portions 2 to ensure the safety of the machine.
[卡合端子部] [Engagement terminal part]
卡合端子部2具有一部分開放之扣形狀或中央開口之大致圓盤形狀等、可卡合於未圖示之電性電路之端子部的公知之形狀,且例如藉由螺栓或螺釘等可自由裝卸地接合。作為卡合端子部2之材質,只要具有適度之剛性且導電性良好,則無特別限定,適宜使用銅、銅-鎳合金等。 The engaging terminal portion 2 has a known open shape such as a partially open buckle shape or a substantially disc shape with a central opening, and can be engaged with a terminal portion of an electrical circuit (not shown). Removably engaged. The material of the engagement terminal portion 2 is not particularly limited as long as it has moderate rigidity and good electrical conductivity, and copper, copper-nickel alloy, and the like are suitably used.
電流熔絲1中,於一對卡合端子部2間,藉由焊料等連接材7連接有熔斷部3,且經由熔斷部3而導通。再者,連接材7並不限於焊料,可使用能導通連接卡合端子部2與熔斷部3之任一種材料。 In the current fuse 1, a fuse portion 3 is connected between a pair of engaging terminal portions 2 by a connecting material 7 such as solder, and is conducted through the fuse portion 3. In addition, the connecting material 7 is not limited to solder, and any material that can conduct the connection between the engaging terminal portion 2 and the fuse portion 3 may be used.
[熔斷部] [Fuse section]
熔斷部3係當流過既定容量以上之過電流時熔斷,從而遮斷跨及一對卡合端子部2間之電流路徑。熔斷部3係由積層有低熔點金屬4、及熔點高於低熔點金屬4之第1高熔點金屬5的可溶導體6形成。 The fuse section 3 is fused when an overcurrent exceeding a predetermined capacity is passed, thereby blocking the current path across the pair of engaging terminal sections 2. The fusing portion 3 is formed by laminating a soluble conductor 6 having a low melting point metal 4 and a first high melting point metal 5 having a higher melting point than the low melting point metal 4.
第1高熔點金屬5適宜採用例如Ag、Cu或主成分為Ag或Cu之合金,且具有當連接於卡合端子部2時或將電流熔絲1焊料安裝於電路基板之端子部時的加熱溫度下亦不會熔融的高熔點。而且,第1高熔點金屬5較佳為,當含有鉛時亦將含有率設為RoHS指令之1000ppm以下。 The first high melting point metal 5 is preferably Ag, Cu, or an alloy containing Ag or Cu as a main component, and has heating when connected to the engaging terminal portion 2 or when soldering a current fuse 1 to a terminal portion of a circuit board. High melting point that does not melt at temperature. The first high-melting-point metal 5 preferably has a content rate of 1,000 ppm or less of the RoHS directive when it contains lead.
低熔點金屬4只要為以當因過電流而使溫度上升而達到既定之溫度時會熔斷的溫度作為熔點的金屬,則無特別限定,適宜使用例如Sn或主成分為Sn之合金等一般稱為「無Pb焊料」之材料。低熔點金屬4之熔點未必要高於焊料連接之溫度,亦可於200℃左右熔融。而且,低熔點金屬4亦可使用會於更低之120℃~140℃左右熔融之Bi、In或含Bi或In之合金。低熔點金屬4可藉由該等金屬之選擇或使其等以既定之比例合金化而自由地設定所需之熔點溫度。而且,低熔點金屬4較佳為於含有鉛時亦將含有率設為RoHS指令之1000ppm以下。 The low-melting-point metal 4 is not particularly limited as long as it has a melting point as a melting point when the temperature rises to a predetermined temperature due to an overcurrent. For example, Sn or an alloy containing Sn as a main component is suitably used. "Pb-free solder" material. The melting point of the low melting point metal 4 is not necessarily higher than the temperature of the solder connection, and it can be melted at about 200 ° C. In addition, the low-melting-point metal 4 can also be made of Bi, In or an alloy containing Bi or In, which will melt at a lower temperature of about 120 ° C to 140 ° C. The low melting point metal 4 can be freely set to a desired melting point temperature by selecting these metals or alloying them in a predetermined ratio. In addition, when the low-melting-point metal 4 contains lead, the content rate is preferably set to 1000 ppm or less of the RoHS directive.
可溶導體6係至少於低熔點金屬4之表背兩面積層有第1高熔點金屬5之積層體,較佳為,具有低熔點金屬4構成內層、第1高熔點金屬5構成外層之積層構造。因此,可溶導體6於當焊料連接於卡合端子部2時等低熔點金屬4熔融的情況下,因被第1高熔點金屬5覆蓋,故不會熔斷,而可進行焊料連接,可由與以往相同之步驟製造。 The soluble conductor 6 is a layered body having a first high melting point metal 5 at least on the front and back surfaces of the low melting point metal 4, preferably, a low melting point metal 4 forming an inner layer and a first high melting point metal 5 forming an outer layer. structure. Therefore, when the low-melting-point metal 4 is melted, such as when the solder is connected to the engaging terminal portion 2, the soluble conductor 6 is covered with the first high-melting-point metal 5, so that it does not melt, and solder connection can be performed. Manufactured in the same manner as before.
而且,可溶導體6中積層有熔點低於第1高熔點金屬5之低熔點金屬4,故而,因過電流產生之自發熱而自低熔點金屬4之熔點起開始 熔融,開始侵蝕第1高熔點金屬5。例如,於低熔點金屬4由Sn-Bi系合金或In-Sn系合金等構成時,可溶導體6自140℃或120℃左右之低溫度開始熔融。並且,電流熔絲1利用低熔點金屬4對第1高熔點金屬5之侵蝕作用(焊料侵蝕),而使第1高熔點金屬5於低於自身熔點之溫度熔融。因此,可溶導體6能防止卡合端子部2之過熱,且能利用低熔點金屬4對第1高熔點金屬5之熔蝕作用而迅速熔斷從而遮斷電流路徑。 Furthermore, the soluble conductor 6 is laminated with a low-melting-point metal 4 having a melting point lower than that of the first high-melting-point metal 5. Therefore, self-heating due to an overcurrent starts from the melting point of the low-melting-point metal 4. Melt and begin to attack the first high melting point metal 5. For example, when the low-melting-point metal 4 is composed of an Sn-Bi-based alloy or an In-Sn-based alloy, the soluble conductor 6 starts to melt from a low temperature of about 140 ° C or 120 ° C. In addition, the current fuse 1 uses the erosion effect (solder erosion) of the low melting point metal 4 on the first high melting point metal 5 to melt the first high melting point metal 5 at a temperature lower than its own melting point. Therefore, the soluble conductor 6 can prevent overheating of the engaging terminal portion 2, and can quickly fuse by using the melting effect of the low-melting-point metal 4 on the first high-melting-point metal 5 to block the current path.
而且,可溶導體6係以高熔點金屬覆蓋,從而,較之以往之由Cu等高熔點金屬構成之電流熔絲,能大幅降低熔斷溫度,故而,亦無需使熔斷部局部變細等加工,能提高額定值而應對大電流。而且,與以往之使用鉛系高熔點焊料之可溶導體相比,能大幅降低導體電阻,與同一尺寸之以往之電流熔絲等相比,能大幅提高電流額定值。而且,較之具有相同電流額定值之以往之電流熔絲相比,能實現小型化、薄型化。 In addition, the soluble conductor 6 is covered with a high-melting-point metal, so that the melting temperature can be greatly reduced compared to the conventional current fuse composed of a high-melting-point metal such as Cu. Therefore, there is no need to locally thin the fuse portion. Can increase the rated value to cope with large current. In addition, compared with the conventional soluble conductors using lead-based high melting point solder, the conductor resistance can be greatly reduced, and the current rating can be greatly increased compared with the conventional current fuses and the like of the same size. In addition, compared with conventional current fuses having the same current rating, it is possible to reduce the size and thickness.
再者,可溶導體6能提高對於向組裝有電流熔絲1之電性系統瞬間施加異常高之電壓的突波的耐性(耐脈衝性)。即,可溶導體6於例如甚至流過100A之電流數msec時亦不會熔斷。關於此點,因於極短時間流過之大電流會流經導體之表層(表皮效應),故可溶導體6中設有電阻值較低之鍍Ag等之第1高熔點金屬5作為外層,故而,容易流有藉由突波而施加之電流,能防止自發熱所致之熔斷。因此,可溶導體6較之以往之由焊料合金構成之熔絲,更能提高對突波之耐性。 In addition, the soluble conductor 6 can improve the resistance (pulse resistance) to a sudden surge of an abnormally high voltage applied to the electrical system in which the current fuse 1 is incorporated. That is, the soluble conductor 6 does not melt even when a current of 100 A flows for several milliseconds, for example. In this regard, since a large current flowing in a very short time will flow through the surface layer (skin effect) of the conductor, the soluble conductor 6 is provided with a first high-melting-point metal 5 having a low resistance value such as Ag plating as the outer layer Therefore, it is easy to flow a current applied by a surge, which can prevent melting due to self-heating. Therefore, the soluble conductor 6 is more resistant to surges than a conventional fuse made of a solder alloy.
再者,考慮到環境污染,作為可溶導體6中使用之材料,希望儘量控制鉛或鎘、水銀或其等之合金等有害金屬之使用。目前之帶扣熔絲中,可溶導體係依據電氣用品安全法所既定的材料(鉛、錫、鋅或以其 等作為主成分之合金)。如上所述,錫系材料之熔融溫度低故而缺陷在於與銅端子之焊料連接性,而鋅系材料具有相對較高之熔點故而存在熔斷時之熱影響之問題。另外,鉛系材料雖然容易解決該等問題,且當前並非環境限制(改正RoHS指令)對象,但將來可能會根據社會需求而成為削減對象。 Furthermore, in consideration of environmental pollution, it is desirable to control the use of harmful metals such as lead or cadmium, mercury, or alloys thereof as much as possible as the material used in the soluble conductor 6. In current buckle fuses, the soluble guidance system is based on materials (lead, tin, zinc, or other materials Etc. as the main component of the alloy). As mentioned above, the low melting temperature of tin-based materials has a defect in solder connectivity with copper terminals, while zinc-based materials have a relatively high melting point, so there is a problem of thermal effects during melting. In addition, although lead-based materials can easily solve these problems and are not currently subject to environmental restrictions (correction of the RoHS directive), they may be targeted for reduction in the future in accordance with social needs.
關於此點,根據應用本發明之電流熔絲1,藉由不使用鉛系之有害金屬而形成可溶導體6,亦能應對環境限制之強化。而且,如上所述,使可溶導體6成為低熔點金屬4構成內層、第1高熔點金屬5構成外層之積層構造,藉此,於焊料連接於銅的卡合端子部2時亦能維持形狀,且熔斷時,亦會以較低之溫度熔融,能防止卡合端子部2過熱,且能迅速熔斷從而遮斷電流路徑。 In this regard, according to the current fuse 1 to which the present invention is applied, by forming a soluble conductor 6 without using a lead-based harmful metal, it is also possible to cope with the strengthening of environmental restrictions. Furthermore, as described above, the soluble conductor 6 is a laminated structure in which the low-melting-point metal 4 constitutes the inner layer and the first high-melting-point metal 5 constitutes the outer layer, thereby maintaining the solder connection to the engagement terminal portion 2 of the copper. Shape, and when melted, it will melt at a lower temperature, which can prevent the engaging terminal portion 2 from overheating, and can be quickly melted to block the current path.
可溶導體6可藉由於低熔點金屬4之表面採用電解鍍敷法等成膜技術形成第1高熔點金屬5而製造。例如,可溶導體6可藉由對已成形為既定形狀之焊料箔之表面實施Ag鍍敷而高效率地製造。並且,藉由焊料等連接材7連接於卡合端子部2。 The soluble conductor 6 can be produced by forming the first high-melting-point metal 5 on the surface of the low-melting-point metal 4 by using a film-forming technique such as electrolytic plating. For example, the soluble conductor 6 can be efficiently manufactured by applying Ag plating to the surface of a solder foil that has been formed into a predetermined shape. The connection terminal 7 is connected to the engagement terminal portion 2 by a connection material 7 such as solder.
再者,可溶導體6可藉由熔接而連接於卡合端子部2。藉此,亦可將一對卡合端子部2經由可溶導體6而電性連接。 In addition, the soluble conductor 6 can be connected to the engaging terminal portion 2 by welding. Thereby, the pair of engaging terminal portions 2 can also be electrically connected via the soluble conductor 6.
而且,可溶導體6較佳為將低熔點金屬4之體積形成為大於第1高熔點金屬5之體積。可溶導體6能藉由利用自發熱使低熔點金屬4熔融而使第1高熔點金屬5熔蝕,從而迅速熔融、熔斷。因此,可溶導體6能藉由使低熔點金屬4之體積形成為大於第1高熔點金屬5之體積而促進該熔蝕作用,從而迅速遮斷一對卡合端子部2間。 In addition, the soluble conductor 6 is preferably formed such that the volume of the low-melting metal 4 is larger than the volume of the first high-melting metal 5. The soluble conductor 6 can melt the low-melting-point metal 4 by self-heating to cause the first high-melting-point metal 5 to be eroded, thereby rapidly melting and melting. Therefore, the soluble conductor 6 can accelerate the ablation effect by forming the volume of the low-melting-point metal 4 to be larger than the volume of the first high-melting-point metal 5, thereby quickly blocking the space between the pair of engaging terminal portions 2.
[變形限制部] [Deformation restriction part]
而且,可溶導體6亦可形成抑制當焊料連接時等熔融之低熔點金屬4之流動且限制變形的變形限制部9。 Further, the soluble conductor 6 may form a deformation restricting portion 9 that suppresses the flow of the low-melting-point metal 4 that melts during solder connection and the like, and restricts deformation.
如圖2所示,變形限制部9中,設於低熔點金屬4之一個或複數個孔10之側面10a之至少一部分被與第1高熔點金屬5連續之第2高熔點金屬11覆蓋。孔10可藉由例如將針等尖銳體刺入低熔點金屬4、或使用模具對低熔點金屬4實施壓製加工等而形成。而且,孔10係以既定之圖案、例如四方格子狀或六方格子狀遍及低熔點金屬4之整面而均等地形成。 As shown in FIG. 2, in the deformation restricting portion 9, at least a part of the side surface 10 a of the low melting point metal 4 or the plurality of holes 10 is covered with a second high melting point metal 11 continuous with the first high melting point metal 5. The hole 10 can be formed by, for example, piercing a sharp body such as a needle into the low-melting-point metal 4, or performing a pressing process on the low-melting-point metal 4 using a mold. Further, the holes 10 are uniformly formed over the entire surface of the low-melting metal 4 in a predetermined pattern, for example, a square lattice shape or a hexagonal lattice shape.
第2高熔點金屬11之構成材料係與第1高熔點金屬5之構成材料同樣,具有於焊料連接溫度下不會熔融之高熔點。而且,第2高熔點金屬11係由與第1高熔點金屬5相同的材料、於第1高熔點金屬5之形成步驟中一併形成,此方面於製造效率上較佳。 The constituent material of the second high melting point metal 11 is the same as the constituent material of the first high melting point metal 5 and has a high melting point that does not melt at the solder connection temperature. In addition, the second high-melting-point metal 11 is formed from the same material as the first high-melting-point metal 5 in the step of forming the first high-melting-point metal 5 together, which is preferable in terms of manufacturing efficiency.
如圖2所示,上述可溶導體6經由焊料等連接材7、或藉由熔接而連接於一對卡合端子部2間。此時,可溶導體6中,於低熔點金屬4積層有於連接溫度下亦不會熔融之第1高熔點金屬5作為外層且設置變形限制部9,從而,於暴露於高溫環境下的情況下,亦能將可溶導體6之變形控制於可抑制熔斷特性之不均的一定範圍內。因此,可溶導體6於大面積化時亦能抑制熔斷特性之變動,且容易提高電流熔絲1之額定值。 As shown in FIG. 2, the soluble conductor 6 is connected between a pair of engagement terminal portions 2 through a connection material 7 such as solder or by welding. At this time, in the soluble conductor 6, the first high-melting-point metal 5 that is not melted at the connection temperature is laminated on the low-melting-point metal 4 as the outer layer and the deformation restricting portion 9 is provided, thereby being exposed to a high-temperature environment. Then, the deformation of the soluble conductor 6 can be controlled within a certain range that can suppress the unevenness of the fusing characteristics. Therefore, the soluble conductor 6 can suppress the variation of the fusing characteristic even when the area is increased, and it is easy to increase the rating of the current fuse 1.
即,可溶導體6中,藉由於低熔點金屬4開設孔10,且具備利用第2高熔點金屬11覆蓋孔10之側面10a的變形限制部9,從而,於藉由焊料連接等外部熱源而短時間暴露於低熔點金屬4之熔點以上之高熱環境中時,亦可藉由覆蓋孔10之側面10a之第2高熔點金屬11,而支撐可抑制已熔融之低熔點金屬4之流動且構成外層的第1高熔點金屬5。因此, 可溶導體6能抑制熔融之低熔點金屬4因張力而凝集且膨脹,或熔融之低熔點金屬4流出而薄,從而發射局部破碎或鼓起的情況。 That is, in the soluble conductor 6, the hole 10 is opened by the low-melting-point metal 4, and the deformation-restricting portion 9 covering the side surface 10a of the hole 10 with the second high-melting-point metal 11 is provided. When exposed to a high-temperature environment above the melting point of the low-melting-point metal 4 for a short time, the second high-melting-point metal 11 covering the side surface 10a of the hole 10 can be supported to suppress the flow of the molten low-melting-point metal 4 and constitute The first high-melting metal 5 in the outer layer. therefore, The soluble conductor 6 can suppress the molten low-melting-point metal 4 from aggregating and expanding due to tension, or the molten low-melting-point metal 4 flowing out and being thin, thereby emitting a situation of partial fragmentation or bulging.
藉此,可溶導體6能防止於焊料連接時等之溫度下伴隨局部破碎或鼓起等變形而產生的電阻值之變動,且能維持於既定之溫度或電流下在既定之時間內熔斷的熔斷特性。而且,作為可溶導體6,於在電流熔絲1所搭載之電路基板上回流焊安裝有其他表面安裝零件、或電路基板進而回流焊安裝於其他電路基板上等、重複暴露於回流焊溫度下時,亦可藉由變形限制部9能抑制變形、使熔斷特性穩定化,且能提高安裝效率。 Thereby, the soluble conductor 6 can prevent the resistance value from changing due to local crushing or bulging at the temperature such as solder connection, and can be maintained at a predetermined temperature or current for a predetermined period of time. Fusing characteristics. Further, as the soluble conductor 6, other surface-mounted components are reflow-mounted on the circuit board mounted on the current fuse 1, or the circuit board is reflow-mounted on another circuit board, etc., and repeatedly exposed to the reflow temperature. In this case, the deformation restricting portion 9 can suppress deformation, stabilize the fusing characteristic, and improve the mounting efficiency.
而且,如下文所述,於自大塊片狀元件切取而製造出可溶導體6時,低熔點金屬4自可溶導體6之側面露出,且該側面經由焊料等連接材7而接觸卡合端子部2。此情況下,可溶導體6亦藉由變形限制部9而抑制熔融之低熔點金屬4之流動,故而,亦不會因自該側面吸入熔融之焊料等連接材7而令低熔點金屬4之體積增加從而使電阻值局部下降。 In addition, as described below, when the soluble conductor 6 is manufactured by cutting out from a large piece of chip, the low-melting metal 4 is exposed from the side surface of the soluble conductor 6, and the side surface contacts and engages through the connecting material 7 such as solder. Terminal 部 2. In this case, the soluble conductor 6 also suppresses the flow of the molten low-melting-point metal 4 by the deformation restricting portion 9; therefore, the melting point of the low-melting-point metal 4 will not be caused by drawing in the connecting material 7 such as molten solder from the side. The increase in volume causes a local decrease in resistance.
而且,可溶導體6具備變形限制部9,藉此,能抑制過電流下之模組熱發熱之初的低熔點金屬4於熔融階段之非既定的變形。因此,可溶導體6能藉由變形限制部9而抑制發熱中之變形,使熔斷特性穩定化。 In addition, the soluble conductor 6 includes a deformation restricting portion 9, thereby suppressing undesired deformation of the low-melting-point metal 4 at the beginning of the module's thermal heating under an overcurrent during the melting stage. Therefore, the soluble conductor 6 can suppress deformation during heat generation by the deformation restricting portion 9 and stabilize the fusing characteristic.
[貫通孔.非貫通孔] [Through holes. Non-through hole]
此處,孔10亦可如圖2(B)所示形成為於厚度方向貫通低熔點金屬4之貫通孔,或亦可如圖3(A)、(B)所示形成為非貫通孔。當孔10形成為貫通孔時,覆蓋孔10之側面10a之第2高熔點金屬11係與積層於低熔點金屬4之表背面之第1高熔點金屬5連續。再者,孔10之形狀並無特別限定,除了圓形之外,亦可為楕圓形、角部呈弧形之長方形或方形。 Here, the hole 10 may be formed as a through hole penetrating the low melting point metal 4 in the thickness direction as shown in FIG. 2 (B), or may be formed as a non-through hole as shown in FIGS. 3 (A) and (B). When the hole 10 is formed as a through-hole, the second high-melting-point metal 11 covering the side surface 10 a of the hole 10 is continuous with the first high-melting-point metal 5 laminated on the front and back surfaces of the low-melting-point metal 4. In addition, the shape of the hole 10 is not particularly limited. In addition to a circle, the hole 10 may be a round shape, a rectangular shape or a square shape with corners curved.
而且,當孔10形成為非貫通孔時,如圖3(A)所示,孔10較佳為由第2高熔點金屬11覆蓋至底面10b。可溶導體6於使孔10形成為非貫通孔、且藉由加熱而使低熔點金屬4流動的情況下,亦可藉由覆蓋孔10之側面10a之第2高熔點金屬11而支撐可抑制流動且構成外層的第1高熔點金屬5,故而,如圖3(B)所示,可溶導體6之厚度之變動係輕微的,且熔斷特性不會變動。 When the hole 10 is formed as a non-through hole, as shown in FIG. 3 (A), the hole 10 is preferably covered with the second high-melting-point metal 11 to the bottom surface 10b. In the case where the soluble conductor 6 is formed as a non-through hole and the low-melting-point metal 4 is caused to flow by heating, the soluble conductor 6 can also be supported by the second high-melting-point metal 11 covering the side surface 10 a of the hole 10 and suppressed. Since the first high melting point metal 5 that flows and constitutes the outer layer, as shown in FIG. 3 (B), the thickness of the soluble conductor 6 varies slightly, and the fusing characteristics do not change.
[局熔點金屬之充填] [Filling of local melting point metals]
而且,孔10亦可如圖4(A)、(B)所示由第2高熔點金屬11充填。藉由以第2高熔點金屬11充填孔10,從而,可溶導體6中,能提高支撐構成外層之第1高熔點金屬5的變形限制部9之強度且進一步抑制可溶導體6之變形,且能藉由低電阻化而提高額定值。 Moreover, the hole 10 may be filled with the second high melting point metal 11 as shown in FIGS. 4 (A) and 4 (B). By filling the holes 10 with the second high melting point metal 11, the soluble conductor 6 can increase the strength of the deformation restricting portion 9 supporting the first high melting point metal 5 constituting the outer layer, and further suppress the deformation of the soluble conductor 6, In addition, the rating can be increased by reducing the resistance.
如下文所述,第2高熔點金屬11可於藉由例如在開設有孔10之低熔點金屬4利用電解鍍敷等形成第1高熔點金屬5時同時形成,且可藉由調整孔徑或鍍敷條件而利用第2高熔點金屬11填埋孔10內。 As described below, the second high-melting-point metal 11 can be simultaneously formed when the first high-melting-point metal 5 is formed by electrolytic plating or the like, for example, the low-melting-point metal 4 provided with holes 10, and can be adjusted by aperture or plating. The second high-melting-point metal 11 is used to fill the hole 10 under the conditions.
[剖面形狀] [Section shape]
而且,如圖2(B)或圖3、圖4所示,孔10亦可形成為剖面錐狀。孔10可藉由例如將針等尖銳體刺入低熔點金屬4而形成開口,從而根據該尖銳體之形狀形成為剖面錐狀。而且,如圖5(A)、(B)所示,孔10亦可形成為剖面矩形狀。可溶導體6可藉由例如使用對應於剖面矩形狀之孔10之模具對低熔點金屬4進行壓製加工等而開設剖面矩形狀之孔10。 Further, as shown in FIG. 2 (B) or FIGS. 3 and 4, the hole 10 may be formed in a tapered cross section. The hole 10 can be formed by, for example, piercing a sharp body such as a needle into the low-melting-point metal 4 to form a tapered cross-section according to the shape of the sharp body. Further, as shown in FIGS. 5 (A) and (B), the hole 10 may be formed in a rectangular cross section. The soluble conductor 6 can be formed with a rectangular cross-section hole 10 by, for example, pressing the low-melting-point metal 4 using a mold corresponding to the rectangular cross-section hole 10.
[高熔點金屬之局部覆蓋] [Partial coverage of high melting point metals]
再者,就變形限制部9而言,只要孔10之側面10a之至少一部分被與 第1高熔點金屬5連續之第2高熔點金屬11覆蓋即可,如圖6所示,亦可藉由第2高熔點金屬11覆蓋至側面10a之上側。而且,變形限制部9亦可為於形成低熔點金屬4與第1高熔點金屬5之積層體之後,藉由使尖銳體自第1高熔點金屬5之上刺入而開設或貫通有孔10,且藉由將第1高熔點金屬5之一部分推入至孔10之側面10a而作為第2高熔點金屬11。 Furthermore, in the case of the deformation restricting portion 9, as long as at least a part of the side surface 10a of the hole 10 is contacted with The first high-melting-point metal 5 may be continuously covered by the second high-melting-point metal 11. As shown in FIG. 6, the second high-melting-point metal 11 may be covered on the upper side of the side surface 10 a. Further, the deformation restricting portion 9 may be formed or penetrated by forming a laminated body of the low-melting-point metal 4 and the first high-melting-point metal 5 by penetrating the sharp body from the first high-melting-point metal 5. In addition, a part of the first high-melting-point metal 5 is pushed into the side surface 10 a of the hole 10 to serve as the second high-melting-point metal 11.
如圖6所示,藉由於孔10之側面10a之開口端側之一部分積層與第1高熔點金屬5連續之第2高熔點金屬11,亦能利用積層於孔10之側面10a之第2高熔點金屬11來抑制熔融之低熔點金屬4之流動,且能支撐開口端側之第1高熔點金屬5,從而能抑制可溶導體6之局部破碎或膨脹之發生。 As shown in FIG. 6, the second high-melting metal 11 that is continuous with the first high-melting metal 5 is partially laminated with a part of the open end side of the side 10 a of the hole 10, and the second high-melting metal 11 can also be used for the second high The melting point metal 11 suppresses the flow of the molten low melting point metal 4 and can support the first high melting point metal 5 on the open end side, thereby suppressing the occurrence of local fragmentation or expansion of the soluble conductor 6.
而且,如圖7(A)所示,變形限制部9亦可使孔10形成為非貫通孔,且彼此對向地形成於低熔點金屬4之一面及另一面。而且,如圖7(B)所示,變形限制部亦可使孔10形成為非貫通孔,且彼此不對向地形成於低熔點金屬4之一面及另一面。藉由使非貫通之孔10彼此對向或非對向地形成於低熔點金屬4之兩面,亦能藉由覆蓋各孔10之側面10a之第2高熔點金屬11來抑制熔融之低熔點金屬4之流動,且支撐構成外層之第1高熔點金屬5。因此,可溶導體6能抑制熔融之低熔點金屬4因張力而凝集且膨脹,或熔融之低熔點金屬4流出而變薄,從而發生局部破碎或鼓起的情況。 Further, as shown in FIG. 7 (A), the deformation restricting portion 9 may form the hole 10 as a non-through hole and be formed on one surface and the other surface of the low-melting metal 4 so as to face each other. Further, as shown in FIG. 7 (B), the deformation restricting portion may also form the hole 10 as a non-through hole, and may be formed on one surface and the other surface of the low-melting metal 4 so as not to face each other. By forming the non-penetrating holes 10 on the two sides of the low-melting metal 4 or facing each other, the molten low-melting metal can also be suppressed by the second high-melting metal 11 covering the side surface 10 a of each hole 10. 4 flows and supports the first refractory metal 5 constituting the outer layer. Therefore, the soluble conductor 6 can suppress the molten low-melting-point metal 4 from aggregating and expanding due to tension, or the molten low-melting-point metal 4 flowing out and becoming thin, thereby causing local fragmentation or bulging.
再者,變形限制部9具備可供鍍敷液流入以藉由電解鍍敷而使第2高熔點金屬11覆蓋於孔10之側面10a的孔徑,此方面於製造效率上較佳,例如孔之最小徑設為50μm以上,更佳為設為70~80μm。再者, 孔10之最大徑可考慮到與第2高熔點金屬11之鍍敷界限或可溶導體6之厚度等的關係而適當設定,但若孔徑較大則有初始電阻值上升之傾向。 Furthermore, the deformation restricting portion 9 is provided with a hole diameter through which the plating solution can flow in so that the second high-melting-point metal 11 covers the side surface 10a of the hole 10 by electrolytic plating. This aspect is preferable in terms of manufacturing efficiency. The minimum diameter is 50 μm or more, and more preferably 70 to 80 μm. Furthermore, The maximum diameter of the hole 10 can be appropriately set in consideration of the relationship with the plating limit of the second high-melting metal 11 and the thickness of the soluble conductor 6, but if the hole diameter is large, the initial resistance value tends to increase.
而且,變形限制部9較佳為將孔10之深度設為低熔點金屬4之厚度的50%以上。若孔10之深度比上述值淺,則無法抑制熔融之低熔點金屬4之流動,隨著可溶導體6之變形,可能會導致熔斷特性之變動。 In addition, it is preferable that the depth of the deformation restricting portion 9 is 50% or more of the thickness of the low-melting-point metal 4. If the depth of the hole 10 is shallower than the above value, the flow of the molten low-melting metal 4 cannot be suppressed, and the melting characteristics may be changed as the soluble conductor 6 is deformed.
而且,變形限制部9較佳為使形成於低熔點金屬4之孔10以既定之密度、例如每15×15mm為1個以上之密度形成。 In addition, the deformation restricting portion 9 is preferably formed so that the holes 10 formed in the low-melting-point metal 4 have a predetermined density, for example, a density of 1 or more per 15 × 15 mm.
而且,變形限制部9較佳為使孔10形成於當過電流時可溶導體6熔斷之部位。可溶導體6之熔斷部位並不由電流熔絲1之一對卡合端子部2支撐,而是剛性相對較低之部位,故而,於該部位容易因低熔點金屬4之流動而產生變形。故而,藉由於可溶導體6之熔斷部位開設孔10且利用第2高熔點金屬11覆蓋側面10a,能抑制熔斷部位之低熔點金屬4之流動從而防止變形。 Further, it is preferable that the deformation restricting portion 9 is such that the hole 10 is formed at a portion where the soluble conductor 6 is fused when an overcurrent is generated. The fused portion of the soluble conductor 6 is not supported by one of the current fuses 1 to the engaging terminal portion 2 but a relatively low rigidity portion. Therefore, the portion is likely to be deformed by the flow of the low-melting metal 4 at this portion. Therefore, by opening holes 10 in the fusible portion of the soluble conductor 6 and covering the side surface 10a with the second high melting point metal 11, the flow of the low melting point metal 4 in the fused portion can be suppressed and deformation can be prevented.
而且,變形限制部9較佳為將孔10至少設於可溶導體6之中央部。可溶導體6之兩端部由一對卡合端子部2支撐,距外周距離最遠之中央部的剛性最低,故容易產生變形。故而,藉由於可溶導體6之該中央部設置側面10a被第2高熔點金屬11覆蓋的孔10,能提高該中央部之剛性,從而能有效防止變形。 In addition, it is preferable that the deformation restricting portion 9 is provided with the hole 10 at least in a central portion of the soluble conductor 6. Both ends of the soluble conductor 6 are supported by a pair of engaging terminal portions 2. The central portion, which is the farthest away from the outer periphery, has the lowest rigidity, so it is easy to deform. Therefore, since the central portion of the soluble conductor 6 is provided with the hole 10 whose side surface 10a is covered by the second high-melting-point metal 11, the rigidity of the central portion can be improved, and deformation can be effectively prevented.
而且,變形限制部9亦可將穿過可溶導體6之中心之線兩側的孔10之數量差或者密度差設為50%以下。即,變形限制部9係將複數個孔10分散配置於可溶導體6,且使變形限制部9之效果大致均等地作用於可溶導體6之整面,故而使穿過可溶導體6之中心之線兩側的數量差或密 度差成為50%以內。例如,當以由3點支撐而獲取平衡之方式將3個孔10均等地配置於可溶導體6之整面時,穿過可溶導體6之中心之線兩側的孔10之數量差或者密度差成為50%。藉由使穿過熔絲元件之中心之線兩側的孔10之數量差或者密度差為50%以下,亦能提高可溶導體6整體之剛性,從而有效防止變形。 In addition, the deformation restricting portion 9 may set the number difference or density difference of the holes 10 on both sides of the line passing through the center of the soluble conductor 6 to 50% or less. That is, the deformation restricting portion 9 is a plurality of holes 10 dispersedly arranged in the soluble conductor 6, and the effect of the deformation restricting portion 9 is applied to the entire surface of the soluble conductor 6 approximately uniformly. The number of sides of the center line is different or dense The degree difference is within 50%. For example, when the three holes 10 are evenly arranged on the entire surface of the soluble conductor 6 in a manner of being balanced by 3 points of support, the number of holes 10 passing through the center of the soluble conductor 6 on both sides is different, or The density difference becomes 50%. By making the number difference or density difference of the holes 10 on both sides of the line passing through the center of the fuse element 50% or less, the rigidity of the soluble conductor 6 as a whole can be improved, thereby effectively preventing deformation.
[可溶導體之製造方法] [Manufacturing method of soluble conductor]
可溶導體6可藉由於低熔點金屬4開設構成變形限制部9之孔10後、於低熔點金屬4使用鍍敷技術成膜高熔點金屬而製造。可溶導體6係藉由例如於長條狀之焊料箔開設既定之孔10後、於表面實施Ag鍍敷而製造帶狀元件,當使用時,可藉由根據尺寸切斷而高效率地製造,且容易使用。 The soluble conductor 6 can be manufactured by forming a hole 10 constituting the deformation restricting portion 9 by the low-melting-point metal 4 and forming a high-melting-point metal on the low-melting-point metal 4 using a plating technique. The soluble conductor 6 is manufactured by, for example, opening a predetermined hole 10 in a long solder foil, and then performing Ag plating on the surface to produce a strip-shaped element. When used, it can be efficiently manufactured by cutting according to size. And easy to use.
此處,於以往之僅由低熔點金屬與高熔點金屬之積層構造構成的可溶導體中,因有焊料等連接材7自切斷面之流入或低熔點金屬4之流出之虞,故而,為了避免切斷面與連接材7之接觸,亦須研究使兩端部彎曲等加工,從而會產生製造工時之增加、或阻礙電流熔絲1之小型化等不良現象。 Here, in the conventional soluble conductor composed only of a laminated structure of a low melting point metal and a high melting point metal, the connection material 7 such as solder may flow in from a cut surface or the low melting point metal 4 may flow out. In order to avoid the contact between the cut surface and the connecting material 7, it is necessary to study processing such as bending both ends, which may result in an increase in manufacturing man-hours or hinder the miniaturization of the current fuse 1.
關於此點,就可溶導體6而言,即便自切斷面露出低熔點金屬4,亦可藉由變形限制部9抑制熔融之低熔點金屬4之流動,故而,能抑制連接材7自切斷面之流入或低熔點金屬4之流出,從而能防止伴隨厚度之變動而產生的電阻值之不均及熔斷特性之變動。因此,亦無須使切斷面露出之兩端部彎曲這一加工,從而能實現製造效率之提高或電流熔絲1之小型化。 In this regard, as for the soluble conductor 6, even if the low-melting-point metal 4 is exposed from the cut surface, the flow of the molten low-melting-point metal 4 can be suppressed by the deformation restricting portion 9, and thus the self-cutting of the connecting material 7 can be suppressed. The inflow of the cross section or the outflow of the low-melting-point metal 4 can prevent variations in the resistance value and variations in the fusing characteristics caused by variations in thickness. Therefore, it is not necessary to perform the process of bending both exposed ends of the cut surface, so that it is possible to improve the manufacturing efficiency or miniaturize the current fuse 1.
另外,關於可溶導體6,藉由使用蒸鍍等薄膜形成技術、或 其他周知積層技術,亦可形成積層有低熔點金屬4與第1高熔點金屬5之可溶導體6。 The soluble conductor 6 is formed by using a thin film forming technique such as vapor deposition, or Other well-known lamination techniques can also form a soluble conductor 6 laminated with a low melting point metal 4 and a first high melting point metal 5.
再者,可溶導體6亦可於構成外層之第1高熔點金屬5之表面形成未圖示之防氧化膜。可溶導體6之外層之第1高熔點金屬5進而被防氧化膜覆蓋,藉此,於例如作為第1高熔點金屬5形成有Cu鍍敷層時,亦能防止Cu之氧化。因此,可溶導體6能防止因Cu之氧化而令熔斷時間變長的現象,從而能以短時間熔斷。 In addition, the soluble conductor 6 may form an anti-oxidation film (not shown) on the surface of the first refractory metal 5 constituting the outer layer. The first high-melting-point metal 5 in the outer layer of the soluble conductor 6 is further covered with an anti-oxidation film, thereby preventing the oxidation of Cu even when a Cu plating layer is formed as the first high-melting-point metal 5, for example. Therefore, the soluble conductor 6 can prevent the melting time from being increased due to the oxidation of Cu, and can be melted in a short time.
而且,可溶導體6中,作為第1高熔點金屬5,可使用Cu等雖經濟但易氧化之金屬,可不採用Ag等高價材料而形成。 In the soluble conductor 6, as the first high-melting-point metal 5, a metal that is economical but easily oxidizable, such as Cu, can be used, and can be formed without using an expensive material such as Ag.
第1高熔點金屬5之防氧化膜可採用與低熔點金屬4相同的材料,例如可採用主成分為Sn之無Pb焊料。而且,防氧化膜可藉由於第1高熔點金屬5之表面實施鍍錫而形成。另外,防氧化膜亦可藉由Au鍍敷或預焊劑形成。 The anti-oxidation film of the first high-melting-point metal 5 can be made of the same material as the low-melting-point metal 4, for example, a Pb-free solder whose main component is Sn can be used. Further, the anti-oxidation film can be formed by performing tin plating on the surface of the first refractory metal 5. In addition, the anti-oxidation film may be formed by Au plating or pre-flux.
[片狀元件] [Flaky element]
而且,可溶導體6亦可自大塊片狀元件以所需之尺寸切出。即,亦可形成由遍及整個面均等地形成有變形限制部9之低熔點金屬4與第1高熔點金屬5的積層體構成之大塊片狀元件,切出複數個任意尺寸之可溶導體6,從而形成可溶導體6。自片狀元件切出之可溶導體6中,變形限制部9係遍及整個面均等地形成,故而即便自切斷面露出低熔點金屬4,亦可藉由變形限制部9而抑制熔融之低熔點金屬4之流動,故而,能抑制焊料等連接材7自切斷面之流入或低熔點金屬4之流出,從而能防止伴隨厚度之變動而產生的電阻值之不均及熔斷特性之變動。 Moreover, the soluble conductor 6 can also be cut out from a large sheet-like element in a desired size. That is, it is also possible to form a large sheet-like element composed of a laminate of a low-melting-point metal 4 and a first high-melting-point metal 5 in which deformation restricting portions 9 are formed uniformly over the entire surface, and a plurality of soluble conductors of any size can be cut out 6, thereby forming a soluble conductor 6. In the soluble conductor 6 cut out from the sheet-like element, the deformation restricting portion 9 is formed uniformly over the entire surface. Therefore, even if the low melting point metal 4 is exposed from the cut surface, the deformation restricting portion 9 can suppress the low melting. The flow of the melting point metal 4 can prevent the inflow of the connecting material 7 such as solder from the cut surface or the outflow of the low melting point metal 4, and can prevent variations in the resistance value and variations in the melting characteristics due to thickness variations.
而且,於在上述長條狀之焊料箔開設既定之孔10後、於表面實施電解鍍敷、藉此製造帶狀元件且將其以既定之長度切斷的製法中,可溶導體6之尺寸係既定為帶狀元件之寬度,須按照每個尺寸來製造帶狀元件。 In addition, after the predetermined holes 10 are formed in the long-shaped solder foil, electrolytic plating is performed on the surface to manufacture a strip-shaped element and cut it to a predetermined length. The size of the soluble conductor 6 It is the width of the band-shaped element, and the band-shaped element must be manufactured according to each size.
然而,藉由形成大塊片狀元件,可以所需之尺寸切出可溶導體6,從而使尺寸之自由度提高。 However, by forming a large sheet-like element, the soluble conductor 6 can be cut out in a desired size, thereby increasing the degree of freedom in size.
而且,若於長條狀之焊料箔實施電解鍍敷,則於電場集中之長度方向上之側緣部會較厚地鍍敷第1高熔點金屬5,從而難以獲得厚度均勻之可溶導體6。故而,電流熔絲1中,熔斷特性會因可溶導體6之該厚壁部位之配置而改變,故而配置上亦產生制約。 In addition, if electrolytic plating is performed on the long-shaped solder foil, the first high-melting-point metal 5 is thickly plated on the side edge portion in the longitudinal direction where the electric field is concentrated, and it is difficult to obtain the soluble conductor 6 having a uniform thickness. Therefore, in the current fuse 1, the fusing characteristic is changed due to the arrangement of the thick-walled portion of the soluble conductor 6, and therefore, the arrangement is also restricted.
然而,藉由形成大塊片狀元件,能避開該厚壁部位而切出可溶導體6,且能獲得整個面為均勻厚度之可溶導體6。因此,自片狀元件切出之可溶導體6之熔斷特性不會根據配置而改變,配置之自由度高,能實現熔斷特性之穩定化。 However, by forming a large sheet-like element, the soluble conductor 6 can be cut away from the thick-walled portion, and the soluble conductor 6 having a uniform thickness over the entire surface can be obtained. Therefore, the fusing characteristic of the soluble conductor 6 cut out from the sheet-shaped element does not change according to the configuration, and the degree of freedom of the configuration is high, so that the fusing characteristic can be stabilized.
[高熔點粒子] [High melting point particles]
而且,可溶導體6亦可如圖8所示,藉由使熔點高於低熔點金屬4之第1高熔點粒子13配合於低熔點金屬4而形成變形限制部9。第1高熔點粒子13係採用具有於焊料接合溫度下亦不會熔融之高熔點的物質,可使用例如Cu、Ag、Ni等金屬或由含有其等之合金構成之粒子、玻璃粒子、陶瓷粒子等。而且,第1高熔點粒子13可為球狀、鱗片狀等任意形狀。再者,作為第1高熔點粒子13,當使用金屬或合金等時,因比重大於玻璃或陶瓷,故適應性良好且分散性優良。 In addition, as shown in FIG. 8, the soluble conductor 6 may include the first high-melting-point particle 13 having a melting point higher than that of the low-melting metal 4 and the low-melting metal 4 to form a deformation restricting portion 9. The first high-melting-point particle 13 is a substance having a high melting point that does not melt even at the solder joint temperature. For example, a metal such as Cu, Ag, Ni, or an alloy containing these particles, glass particles, or ceramic particles can be used. Wait. The first high-melting-point particles 13 may have any shape such as a spherical shape and a scaly shape. In addition, when the first high-melting-point particle 13 is made of a metal or an alloy, the specific gravity is higher than that of glass or ceramic, so it has good adaptability and excellent dispersibility.
變形限制部9可藉由如下方式形成,即,於低熔點金屬材料配合第1高熔點粒子13後,藉由成型為帶狀等而形成以單層分散配置有第1高熔點粒子13之低熔點金屬4,此後積層第1高熔點金屬5。而且,變形限制部9亦可藉由於第1高熔點金屬5之積層後在厚度方向對可溶導體6進行壓製,而使第1高熔點粒子13密接於第1高熔點金屬5。藉此,變形限制部9中,第1高熔點金屬5由第1高熔點粒子13支撐,當低熔點金屬4因加熱而熔融時,亦能藉由第1高熔點粒子13抑制低熔點金屬4之流動且支撐第1高熔點金屬5,從而能抑制可溶導體6之局部破碎或膨脹之發生。 The deformation restricting portion 9 can be formed by mixing the first high-melting-point particles 13 with a low-melting-point metal material, and then forming the ribbon into a band-like shape to form a low level in which the first high-melting-point particles 13 are dispersedly arranged in a single layer. The melting point metal 4 is then laminated with the first refractory metal 5. In addition, the deformation restricting portion 9 may press the soluble conductor 6 in the thickness direction after laminating the first high-melting-point metal 5, so that the first high-melting-point particles 13 are in close contact with the first high-melting-point metal 5. Accordingly, in the deformation restricting portion 9, the first high-melting-point metal 5 is supported by the first high-melting-point particles 13. When the low-melting-point metal 4 is melted by heating, the first high-melting-point particles 13 can also be suppressed by the first high-melting point particles 13. It flows and supports the first high-melting-point metal 5, so that the occurrence of local fragmentation or expansion of the soluble conductor 6 can be suppressed.
而且,變形限制部9亦可如圖9(A)所示,將小於低熔點金屬4之厚度之粒徑的第1高熔點粒子13配合於低熔點金屬4。該情況下,如圖9(B)所示,變形限制部9亦能藉由第1高熔點粒子13而抑制熔融之低熔點金屬4之流動且支撐第1高熔點金屬5,從而能抑制可溶導體6之局部破碎或膨脹之發生。 Moreover, as shown in FIG. 9 (A), the deformation restricting portion 9 may mix the first high-melting-point particles 13 having a particle diameter smaller than the thickness of the low-melting-point metal 4 to the low-melting-point metal 4. In this case, as shown in FIG. 9 (B), the deformation restricting portion 9 can also suppress the flow of the molten low-melting metal 4 and support the first high-melting metal 5 by the first high-melting particles 13, thereby suppressing the Partial fragmentation or swelling of the molten conductor 6 occurs.
而且,可溶導體6亦可如圖10所示,藉由將熔點高於低熔點金屬4之第2高熔點粒子15壓入至低熔點金屬4而形成變形限制部9。第2高熔點粒子15可使用與上述第1高熔點粒子13相同之物質。 In addition, as shown in FIG. 10, the soluble conductor 6 may press the second high melting point particles 15 having a higher melting point than the low melting point metal 4 into the low melting point metal 4 to form the deformation restricting portion 9. As the second high-melting-point particle 15, the same material as the first high-melting-point particle 13 can be used.
變形限制部9藉由將第2高熔點粒子15壓入至低熔點金屬4而進行填埋、此後積層第1高熔點金屬5而形成。此時,第2高熔點粒子15較佳為於厚度方向貫通於低熔點金屬4。藉此,變形限制部9中,第1高熔點金屬5由第2高熔點粒子15支撐,於低熔點金屬4藉由加熱而熔融時,亦能藉由第2高熔點粒子15而抑制低熔點金屬4之流動且支撐第1高熔點金屬5,從而能抑制可溶導體6之局部破碎或膨脹之發生。 The deformation restricting portion 9 is formed by pressing the second high-melting-point particles 15 into the low-melting-point metal 4 and then laminating the first high-melting-point metal 5. At this time, it is preferable that the second high melting point particles 15 penetrate the low melting point metal 4 in the thickness direction. With this, in the deformation restricting portion 9, the first high-melting-point metal 5 is supported by the second high-melting-point particles 15, and when the low-melting-point metal 4 is melted by heating, the low-melting-point can be suppressed by the second high-melting-point particles 15. The flow of the metal 4 supports the first high-melting-point metal 5, so that the local breakage or expansion of the soluble conductor 6 can be suppressed.
而且,可溶導體6亦可如圖11所示,藉由將熔點高於低熔點金屬4之第2高熔點粒子15壓入至第1高熔點金屬5與低熔點金屬4而形成變形限制部9。 In addition, as shown in FIG. 11, the soluble conductor 6 may be formed by pressing the second high melting point particles 15 having a higher melting point than the low melting point metal 4 into the first high melting point metal 5 and the low melting point metal 4 to form a deformation restricting portion. 9.
變形限制部9可藉由將第2高熔點粒子15壓入至低熔點金屬4與第1高熔點金屬5之積層體且填埋至低熔點金屬4內而形成。此時,第2高熔點粒子15較佳為沿厚度方向貫通於低熔點金屬4及第1高熔點金屬5。藉此,變形限制部9中,第1高熔點金屬5由第2高熔點粒子15支撐,於低熔點金屬4由加熱熔融時,亦能藉由第2高熔點粒子15抑制低熔點金屬4之流動且支撐第1高熔點金屬5,從而能抑制可溶導體6之局部破碎或膨脹之發生。 The deformation restricting portion 9 can be formed by pressing the second high-melting-point particles 15 into a laminate of the low-melting-point metal 4 and the first high-melting-point metal 5 and burying them in the low-melting-point metal 4. At this time, it is preferable that the second high melting point particles 15 penetrate the low melting point metal 4 and the first high melting point metal 5 in the thickness direction. With this, in the deformation restricting portion 9, the first high-melting metal 5 is supported by the second high-melting particles 15, and when the low-melting metal 4 is melted by heating, the second high-melting particles 15 can also suppress the low-melting metal 4 The first high-melting-point metal 5 flows and supports, so that the occurrence of local fragmentation or expansion of the soluble conductor 6 can be suppressed.
再者,變形限制部9亦可為,於低熔點金屬4形成孔10,且積層第2高熔點金屬11,進而將第2高熔點粒子15插入至該孔10內。 In addition, the deformation restricting portion 9 may be formed by forming a hole 10 in the low-melting metal 4 and laminating the second high-melting metal 11, and further inserting the second high-melting particle 15 into the hole 10.
而且,變形限制部9亦可如圖12所示,於第2高熔點粒子15設置接合於第1高熔點金屬5之凸緣部16。凸緣部16可藉由例如將第1高熔點粒子13壓入至第1高熔點金屬5與低熔點金屬4後,於厚度方向對可溶導體6進行壓製,且使第2高熔點粒子15之兩端熔毀而形成。藉此,變形限制部9中,第1高熔點金屬5藉由與第2高熔點粒子15之凸緣部16接合而得以強固支撐,於低熔點金屬4因加熱而熔融時,亦能藉由第2高熔點粒子15而抑制低熔點金屬4之流動,且藉由凸緣部16支撐第1高熔點金屬5,從而能進一步抑制可溶導體6局部破碎或膨脹之發生。 Further, as shown in FIG. 12, the deformation restricting portion 9 may be provided with a flange portion 16 bonded to the first high melting point metal 5 on the second high melting point particles 15. The flange portion 16 can, for example, press the first high-melting-point particles 13 into the first high-melting-point metal 5 and the low-melting-point metal 4, and then press the soluble conductor 6 in the thickness direction to make the second high-melting point particles 15. The two ends melted and formed. This allows the first high-melting-point metal 5 to be strongly supported by joining with the flange portion 16 of the second high-melting-point particle 15 in the deformation restricting portion 9. When the low-melting-point metal 4 is melted by heating, the The second high-melting-point particles 15 suppress the flow of the low-melting-point metal 4, and the first high-melting-point metal 5 is supported by the flange portion 16, so that the soluble conductor 6 can be further suppressed. Local fragmentation or swelling occurs.
[變形例1] [Modification 1]
再者,上述變形限制部9亦可如圖13(A)、(B)所示,於低熔點金屬4設 置一個或複數個凹槽17,且使該凹槽17之側面17a之至少一部分由與第1高熔點金屬5連續之第2高熔點金屬11覆蓋。凹槽17可藉由例如使用模具對低熔點金屬4進行壓製加工等而形成。而且,凹槽17可如圖13(A)所示沿可溶導體6之通電方向形成,或亦可沿與通電方向正交或斜交之方向形成。 In addition, as shown in FIGS. 13 (A) and (B), the deformation restricting portion 9 may be provided on the low-melting-point metal 4. One or a plurality of grooves 17 are provided, and at least a part of the side surface 17 a of the groove 17 is covered with a second high-melting metal 11 continuous with the first high-melting metal 5. The groove 17 can be formed by, for example, pressing the low-melting-point metal 4 using a mold. Further, the grooves 17 may be formed along the current-carrying direction of the soluble conductor 6 as shown in FIG. 13 (A), or may be formed along a direction orthogonal or oblique to the current-carrying direction.
利用由被第2高熔點金屬11覆蓋之凹槽17構成的變形限制部9,亦能抑制熔融之低熔點金屬4之流動,防止可溶導體6之局部破碎或鼓起,從而使熔斷特性穩定化。 The deformation restricting portion 9 formed by the groove 17 covered by the second high-melting-point metal 11 can also suppress the flow of the molten low-melting-point metal 4 and prevent the local conductor 6 from being broken or bulged, thereby stabilizing the melting characteristics. Into.
[變形例2] [Modification 2]
再者,上述電流熔絲1中,係藉由構成熔斷部3之可溶導體6形成,且使該可溶導體6連接於卡合端子部2間,但應用本發明之電流熔絲亦可如圖14(A)、(B)所示,由可溶導體6形成一對卡合端子部2及熔斷部3。圖14所示之電流熔絲20可藉由如下方式形成,即,例如衝壓成藉由焊料箔等低熔點金屬4而一體形成一對卡合端子部2及熔斷部3的形狀,此後實施Ag鍍敷。 The current fuse 1 is formed by the soluble conductor 6 constituting the fuse portion 3, and the soluble conductor 6 is connected between the engaging terminal portions 2. However, the current fuse of the present invention may also be applied. As shown in FIGS. 14 (A) and 14 (B), a pair of the engagement terminal portion 2 and the fuse portion 3 are formed by the soluble conductor 6. The current fuse 20 shown in FIG. 14 can be formed by, for example, pressing a low-melting-point metal 4 such as a solder foil to integrally form a pair of engaging terminal portions 2 and a fuse portion 3, and thereafter implementing Ag Plating.
電流熔絲20之卡合端子部2卡合於電性電路之端子部,且例如藉由螺栓或螺釘等接合,藉此,較之熔斷部3相對地更低電阻化,且藉由對於電性電路之端子部之散熱而使卡合端子部2冷卻,故而若流有過電流則熔斷部3會熔斷。 The engaging terminal portion 2 of the current fuse 20 is engaged with the terminal portion of the electrical circuit, and is joined by, for example, a bolt or a screw, thereby making the resistance lower than that of the fuse portion 3 and reducing the electrical resistance. Due to the heat dissipation of the terminal portion of the electrical circuit, the engaging terminal portion 2 is cooled. Therefore, if an overcurrent flows, the fuse portion 3 will blow.
而且,如圖15(A)、(B)所示,電流熔絲20亦可於可溶導體6設置上述變形限制部9。設於電流熔絲20之變形限制部9係與形成於上述電流熔絲1之變形限制部9同樣包含各種變形例。由設有變形限制部9之 可溶導體6形成卡合端子部2,藉此,於卡合端子部2利用螺栓或螺釘等接合於電路基板時,亦能抑制螺釘緊固壓力所致的變形,能抑制電阻值或熔斷時間之變動,且能使熔斷特性穩定化。 Further, as shown in FIGS. 15 (A) and (B), the current fuse 20 may be provided with the above-mentioned deformation restricting portion 9 on the soluble conductor 6. The deformation restricting portion 9 provided in the current fuse 20 includes various modification examples similar to the deformation restricting portion 9 formed in the current fuse 1. By providing the deformation restricting portion 9 The soluble conductor 6 forms the engaging terminal portion 2. When the engaging terminal portion 2 is connected to the circuit board by a bolt or a screw, the deformation due to the screw tightening pressure can be suppressed, and the resistance value or the melting time can be suppressed. Changes, and can stabilize the fusing characteristics.
而且,電流熔絲20中,藉由可溶導體6而一體成形卡合端子部2及熔斷部3,故可溶導體6之熔融溫度較低,例如為300℃左右,故而,能將熔融時之卡合端子部2之溫度抑制得較低,且亦無須使熔斷部3局部狹小化以作為卡合端子部2之過熱對策,低電阻化下之大電流之應對亦變得容易。再者,就電流熔絲20而言,亦能為了調整電阻值而調整熔斷部之寬度。 In addition, in the current fuse 20, the engagement terminal portion 2 and the fuse portion 3 are integrally formed by the soluble conductor 6. Therefore, the melting temperature of the soluble conductor 6 is relatively low, for example, about 300 ° C. The temperature of the engaging terminal portion 2 is suppressed to be low, and it is not necessary to locally narrow the fuse portion 3 as a countermeasure against the overheating of the engaging terminal portion 2, and it is easy to cope with a large current under a low resistance. Furthermore, in the current fuse 20, the width of the fuse portion can be adjusted in order to adjust the resistance value.
再者,電流熔絲20可藉由於形成低熔點金屬4與第1高熔點金屬5之積層體後,衝壓成圖14或圖15所示之既定之熔絲形狀而形成,但因低熔點金屬4會自切斷面露出,故而,就其施工方法而言,較佳為如圖15所示地形成變形限制部9。 Furthermore, the current fuse 20 can be formed by forming a laminated body of the low-melting-point metal 4 and the first high-melting-point metal 5 and then punching it into a predetermined fuse shape as shown in FIG. 14 or FIG. 15. 4 is exposed from the cut surface. Therefore, in terms of the construction method, it is preferable to form the deformation restricting portion 9 as shown in FIG. 15.
1‧‧‧電流熔絲 1‧‧‧current fuse
2‧‧‧卡合端子部 2‧‧‧ Engagement terminal
3‧‧‧熔斷部 3‧‧‧Fuse
4‧‧‧無鉛低熔點金屬 4‧‧‧Lead-free low melting point metal
5‧‧‧無鉛第1高熔點金屬 5‧‧‧Lead-free first high melting point metal
6‧‧‧可溶導體 6‧‧‧ soluble conductor
7‧‧‧連接材 7‧‧‧Connecting material
Claims (18)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP2016-030512 | 2016-02-19 | ||
| JP2016030512A JP6756490B2 (en) | 2016-02-19 | 2016-02-19 | Current fuse |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201802854A true TW201802854A (en) | 2018-01-16 |
| TWI713696B TWI713696B (en) | 2020-12-21 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW106105067A TWI713696B (en) | 2016-02-19 | 2017-02-16 | Current fuse |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JP6756490B2 (en) |
| KR (2) | KR102302143B1 (en) |
| CN (1) | CN108604519B (en) |
| TW (1) | TWI713696B (en) |
| WO (1) | WO2017141675A1 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI838498B (en) * | 2019-03-28 | 2024-04-11 | 日商迪睿合股份有限公司 | Protection element |
| TWI867029B (en) * | 2019-08-23 | 2024-12-21 | 日商迪睿合股份有限公司 | Fuse element, fuse device and protective element |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7003816B2 (en) * | 2018-04-04 | 2022-02-04 | 日本電信電話株式会社 | Fuse with frequency separation function |
| JP7304371B2 (en) * | 2021-01-13 | 2023-07-06 | プライムプラネットエナジー&ソリューションズ株式会社 | Terminal parts and secondary batteries |
| JP7518786B2 (en) * | 2021-03-09 | 2024-07-18 | デクセリアルズ株式会社 | Fuse elements, fuse elements and protective elements |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54153341U (en) * | 1978-04-19 | 1979-10-25 | ||
| JPS5622754U (en) * | 1979-07-30 | 1981-02-28 | ||
| JPH064522Y2 (en) * | 1985-12-25 | 1994-02-02 | 内橋エステック株式会社 | Fuse element |
| JPH02182848A (en) * | 1989-01-10 | 1990-07-17 | Sumitomo Electric Ind Ltd | fuse |
| JP2002352686A (en) * | 2001-05-24 | 2002-12-06 | Hitachi Cable Ltd | Thermal fuse |
| DE102007014334A1 (en) * | 2007-03-26 | 2008-10-02 | Robert Bosch Gmbh | Fusible alloy element, thermal fuse with a fusible alloy element and method for producing a thermal fuse |
| JP6249600B2 (en) * | 2012-03-29 | 2017-12-20 | デクセリアルズ株式会社 | Protective element |
| JP6336240B2 (en) * | 2012-12-28 | 2018-06-06 | Littelfuseジャパン合同会社 | Protective element |
| WO2014109097A1 (en) * | 2013-01-11 | 2014-07-17 | 株式会社村田製作所 | Fuse |
| JP6420053B2 (en) * | 2013-03-28 | 2018-11-07 | デクセリアルズ株式会社 | Fuse element and fuse element |
| JP6214318B2 (en) * | 2013-10-09 | 2017-10-18 | デクセリアルズ株式会社 | Current fuse |
-
2016
- 2016-02-19 JP JP2016030512A patent/JP6756490B2/en active Active
-
2017
- 2017-01-30 WO PCT/JP2017/003144 patent/WO2017141675A1/en not_active Ceased
- 2017-01-30 KR KR1020207005666A patent/KR102302143B1/en active Active
- 2017-01-30 CN CN201780009949.XA patent/CN108604519B/en active Active
- 2017-01-30 KR KR1020187022315A patent/KR102084188B1/en active Active
- 2017-02-16 TW TW106105067A patent/TWI713696B/en active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI838498B (en) * | 2019-03-28 | 2024-04-11 | 日商迪睿合股份有限公司 | Protection element |
| US12288660B2 (en) | 2019-03-28 | 2025-04-29 | Dexerials Corporation | Protective element |
| TWI867029B (en) * | 2019-08-23 | 2024-12-21 | 日商迪睿合股份有限公司 | Fuse element, fuse device and protective element |
| US12488955B2 (en) | 2019-08-23 | 2025-12-02 | Dexerials Corporation | Fuse element, fuse device, and protection device |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20200023542A (en) | 2020-03-04 |
| KR102302143B1 (en) | 2021-09-15 |
| CN108604519A (en) | 2018-09-28 |
| JP6756490B2 (en) | 2020-09-16 |
| KR102084188B1 (en) | 2020-03-03 |
| CN108604519B (en) | 2020-09-29 |
| JP2017147210A (en) | 2017-08-24 |
| TWI713696B (en) | 2020-12-21 |
| KR20180098670A (en) | 2018-09-04 |
| WO2017141675A1 (en) | 2017-08-24 |
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