[go: up one dir, main page]

TW201721120A - Detection target plate, optical detection device and optical detection method - Google Patents

Detection target plate, optical detection device and optical detection method Download PDF

Info

Publication number
TW201721120A
TW201721120A TW104141824A TW104141824A TW201721120A TW 201721120 A TW201721120 A TW 201721120A TW 104141824 A TW104141824 A TW 104141824A TW 104141824 A TW104141824 A TW 104141824A TW 201721120 A TW201721120 A TW 201721120A
Authority
TW
Taiwan
Prior art keywords
detection
linear direction
image sensor
sub
detecting
Prior art date
Application number
TW104141824A
Other languages
Chinese (zh)
Other versions
TWI582400B (en
Inventor
蔡和霖
黃鼎名
Original Assignee
財團法人國家實驗研究院
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 財團法人國家實驗研究院 filed Critical 財團法人國家實驗研究院
Priority to TW104141824A priority Critical patent/TWI582400B/en
Application granted granted Critical
Publication of TWI582400B publication Critical patent/TWI582400B/en
Publication of TW201721120A publication Critical patent/TW201721120A/en

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)

Abstract

本發明提出一種檢測靶板,該檢測靶板用於檢測一影像感測器所感測之一線性方向之一影像,包含:一基板;以及一檢測圖案,設置於該基板上,且具一彎折條紋,其中該彎折條紋相對於該線性方向的一垂直方向呈對稱狀態,且具二對稱子條紋,俾當該檢測靶板與該線性方向對齊時,該二對稱子條紋與該線性方向所具有之二夾角相等。The present invention provides a detection target for detecting an image in one linear direction sensed by an image sensor, comprising: a substrate; and a detection pattern disposed on the substrate and having a bend a folded stripe, wherein the bent stripe is symmetrical with respect to a vertical direction of the linear direction and has two symmetric sub-stripes, and when the detecting target is aligned with the linear direction, the two-symmetric sub-stripes and the linear direction The two angles are equal.

Description

檢測靶板、光學檢測裝置及光學檢測方法 Detection target plate, optical detection device and optical detection method

本發明係關於一種光學檢測圖案、光學檢測裝置及光學檢測方法,特別是關於一種用於檢測影像感測器的調變轉換函數(MTF)的光學檢測圖案、光學檢測裝置及光學檢測方法。 The present invention relates to an optical detection pattern, an optical detection apparatus, and an optical detection method, and more particularly to an optical detection pattern, an optical detection apparatus, and an optical detection method for detecting a modulation transfer function (MTF) of an image sensor.

以往,藉由檢測光學元件如攝影軟片、掃瞄器、印表機、數位輸出等的的MTF,來獲得光學元件的解像力。例如,在特定空間頻率,光學取像裝置所具備的光學鏡頭與影像感測器有各自的MTF值,而光學取像裝置的MTF值為光學鏡頭MTF值與影像感測器MTF值的乘積。在檢測時,若其中一個MTF值已知,另一個MTF值可經由檢測光學檢測裝置而得。 Conventionally, the resolution of an optical element has been obtained by detecting an MTF of an optical element such as a photographic film, a scanner, a printer, a digital output, or the like. For example, at a specific spatial frequency, the optical lens and the image sensor provided in the optical image capturing device have respective MTF values, and the MTF value of the optical image capturing device is the product of the optical lens MTF value and the image sensor MTF value. At the time of detection, if one of the MTF values is known, another MTF value can be obtained by detecting the optical detecting means.

這種檢測光學元件的方法又分為直接檢測與間接檢測。直接檢測方法是以一個單一頻率的正弦函數的光柵,經由聚焦鏡進行成像,量測成像明暗對比,直接計算出此空間頻率下的MTF值。其他空間頻率的MTF值則透過另一個正弦函數的光柵量測。如此一點一點量測描繪出MTF曲線。 This method of detecting optical components is further divided into direct detection and indirect detection. The direct detection method is to use a sinusoidal function of a single frequency to image through a focusing mirror, measure the contrast of the image, and directly calculate the MTF value at this spatial frequency. The MTF values of other spatial frequencies are measured by the grating of another sinusoidal function. Such a little bit of measurement depicts the MTF curve.

間接檢測方法是利用人造圖案,對於例如狹縫、刀口等投射光,使成像系統成像,利用傅氏轉換將成像結果分析成各空間頻率MTF值,一次量測出MTF曲線。 The indirect detection method utilizes an artificial pattern to image an imaging system for projection light such as a slit or a knife edge, and analyzes the imaging result into MTF values of respective spatial frequencies by Fourier transform, and measures the MTF curve at a time.

當光學鏡頭與影像感測器一起檢測時,因影像感測器為離散取樣的關係,MTF檢測時會產生取樣不足的情況發生。對於此情況,可透過次畫素掃描的方式提高取樣頻率,然而這種掃描需要時間與精準的控制 才能正確測量。或者是,透過具有傾斜邊界的刀口圖案提高取樣頻率並縮短檢測時間,然而,利用具有傾斜邊界的刀口圖案進行檢測時,檢測結果與傾斜角度有關,傾斜角度必須與設計值一致才可得致正確檢測結果。 When the optical lens is detected together with the image sensor, due to the discrete sampling relationship of the image sensor, under-sampling occurs when the MTF detects. In this case, the sampling frequency can be increased by means of sub-pixel scanning, but this scanning requires time and precise control. In order to measure correctly. Alternatively, the sampling frequency is increased by the edge pattern having the inclined boundary and the detection time is shortened. However, when the detection is performed by the knife edge pattern having the inclined boundary, the detection result is related to the inclination angle, and the inclination angle must be consistent with the design value to obtain the correct angle. Test results.

爰是之故,申請人有鑑於習知技術之缺失,發明出本案「檢測靶板、光學檢測裝置及光學檢測方法」,以改善上述缺失。 For this reason, the applicant invented the "detection target, optical detection device and optical detection method" in view of the lack of the prior art to improve the above-mentioned deficiency.

為了能更快速地檢測影像感測器,本發明之一實施形態提供一種光學檢測裝置,用於檢測一影像感測器所感測之一線性方向之一影像,包括:一光源裝置,提供一均勻光束;一圖案調整裝置,配置一檢測靶板於該均勻光束的一光路上,其中該檢測靶板所包含之一檢測圖案,具一彎折條紋,該彎折條紋相對於該線性方向的一垂直方向呈對稱狀態,且具二對稱子條紋;一移動裝置,配置成可移動該影像感測器;一聚焦鏡,位於該移動裝置與該檢測靶板之間,將該檢測靶板投射於該影像感測器;以及一電子計算機,連接於該影像感測器,接收來自該影像感測器的一檢測結果,根據該檢測結果,藉由該圖案調整裝置調整該檢測靶板,使該二對稱子條紋與該線性方向之二夾角為相等。 In order to detect the image sensor more quickly, an embodiment of the present invention provides an optical detecting device for detecting one of the linear directions sensed by an image sensor, including: a light source device, providing a uniformity a pattern adjustment device configured to detect a target plate on a light path of the uniform beam, wherein the detection target includes a detection pattern having a bending stripe, the bending stripe being opposite to the linear direction The vertical direction is symmetrical and has two symmetrical sub-stripes; a moving device is configured to move the image sensor; a focusing mirror is located between the moving device and the detecting target, and the detecting target is projected on The image sensor is connected to the image sensor and receives a detection result from the image sensor. According to the detection result, the detection target is adjusted by the pattern adjustment device. The two symmetrical sub-stripes are equal to the two angles of the linear direction.

本發明之另一實施形態係提供一種光學檢測方法,用於檢測一影像感測器所感測之一線性方向之一影像,其步驟包括:提供一檢測靶板,其中該檢測靶板所包含之一檢測圖案,具一彎折條紋,該彎折條紋相對於該線性方向的一垂直方向呈對稱狀態,且具二對稱子條紋;將該檢測靶板投射至該影像感測器;以及根據該影像感測器輸出之一檢測結果,調整該檢測靶板,使該二對稱子條紋與該線性方向之二夾角為相等。 Another embodiment of the present invention provides an optical detecting method for detecting an image in one of linear directions sensed by an image sensor, the method comprising: providing a detecting target, wherein the detecting target comprises a detection pattern having a bent stripe symmetrical with respect to a vertical direction of the linear direction and having two symmetric sub-stripes; projecting the detection target to the image sensor; The detection result of one of the image sensor outputs is adjusted, and the detection target is adjusted such that the angle between the two symmetrical sub-stripes and the linear direction is equal.

本發明之又一實施形態係提供一種檢測靶板,用於檢測一影像感測器所感測之一線性方向之一影像,包含:一基板;以及一檢測圖案,設置於該基板上,且具一彎折條紋,其中該彎折條紋相對於該線性方向的一垂直方向呈對稱狀態,且具二對稱子條紋,俾當該檢測靶板與該線性方向對齊時,該二對稱子條紋與該線性方向所具有之二夾角相等。 A further embodiment of the present invention provides a detection target for detecting one of the linear directions sensed by an image sensor, comprising: a substrate; and a detection pattern disposed on the substrate and having a bent stripe, wherein the bent stripe is symmetrical with respect to a vertical direction of the linear direction, and has two symmetric sub-stripes, and when the detecting target is aligned with the linear direction, the two-symmetric sub-stripes The linear direction has the same angle.

本發明之又一實施形態係提供一種檢測靶板,用於檢測一影 像感測器所感測之一線性方向之一影像,包含:一基板;以及一檢測圖案,設置於該基板上,且具二對稱子線段,其中各該對稱子線段不相連,且相對於該線性方向的一垂直方向呈對稱狀態,俾當該檢測靶板與該線性方向對齊時,該二對稱子線段與該線性方向所具有之二夾角相等。 Yet another embodiment of the present invention provides a detection target for detecting a shadow An image of one of the linear directions sensed by the sensor, comprising: a substrate; and a detection pattern disposed on the substrate and having two symmetric sub-line segments, wherein the symmetric sub-line segments are not connected, and relative to the A vertical direction of the linear direction is symmetrical, and when the detecting target is aligned with the linear direction, the two symmetric sub-segments have the same angle with the linear direction.

本發明之又一實施形態係提供一種光學檢測方法,係用於檢測一影像感測器所感測之一線性方向之影像,包含:提供二對稱子線段,使該二對稱子線段相對於該線性方向的一垂直方向呈對稱狀態,其中各該對稱子線段不相連;以及調整該檢測靶板與該線性方向之位置關係,使該二對稱子線段與該線性方向所具有之二夾角相等。 A further embodiment of the present invention provides an optical detecting method for detecting an image in a linear direction sensed by an image sensor, comprising: providing a second symmetric sub-line segment, wherein the two symmetric sub-line segments are relative to the linear A vertical direction of the direction is symmetrical, wherein each of the symmetric sub-line segments is not connected; and the positional relationship between the detection target plate and the linear direction is adjusted such that the two symmetric sub-line segments have the same angle with the linear direction.

1‧‧‧光學檢測裝置 1‧‧‧Optical inspection device

10‧‧‧光源裝置 10‧‧‧Light source device

11‧‧‧濾光器 11‧‧‧ Filter

12‧‧‧積分球 12 ‧ ‧ integral ball

20‧‧‧檢測靶板 20‧‧‧Detection target

21‧‧‧垂直方向 21‧‧‧Vertical direction

22a、22b‧‧‧對稱子條紋 22a, 22b‧‧‧symmetric substripes

30‧‧‧聚焦鏡 30‧‧‧ Focusing mirror

40‧‧‧影像感測器 40‧‧‧Image Sensor

41‧‧‧三軸移動裝置 41‧‧‧Three-axis mobile device

42‧‧‧線性方向 42‧‧‧Linear direction

50‧‧‧電子計算機 50‧‧‧Electronic computer

α、β‧‧‧夾角 α, β‧‧‧ angle

第一圖表示本發明的一實施形態的光學檢測裝置的示意圖。 The first figure shows a schematic view of an optical detecting device according to an embodiment of the present invention.

第二圖表示調整檢測靶板的檢測圖案的步驟示意圖,在(a)階段表示調整檢測靶板前,對稱子條紋與線性方向的兩夾角不相等,在(b)階段表示調整檢測靶板後,對稱子條紋與線性方向的兩夾角相等。 The second figure shows a schematic diagram of the steps of adjusting the detection pattern of the detection target plate. In the stage (a), the angle between the symmetrical sub-stripes and the linear direction is not equal before the adjustment of the detection target plate, and after the adjustment of the detection target plate in the (b) stage, The symmetrical sub-stripes are equal to the two angles in the linear direction.

第三圖表示本發明的一實施形態的以刀口演算法所算出的(a)線擴展函數;(b)邊擴展函數;以及(c)調變轉換函數的曲線圖。 The third diagram shows a graph of the (a) line spread function calculated by the knife edge algorithm, (b) the side spread function, and (c) the modulation transfer function according to an embodiment of the present invention.

本發明之實施例的詳細描述係如下所述,然而,除了該等詳細描述之外,本發明還可以廣泛地以其他的實施例來施行。亦即,本發明的範圍並不受已提出之實施例所限制,而應以本發明提出之申請專利範圍為準。 The detailed description of the embodiments of the present invention is set forth below, however, in addition to the detailed description, the invention may be That is, the scope of the present invention is not limited by the embodiments which have been proposed, and the scope of the claims of the present invention shall prevail.

請參閱第一圖。第一圖表示本發明的一實施形態的光學檢測裝置1的示意圖。光學檢測裝置1包括:光源裝置10、濾光器11、積分球(integrating sphere)12、檢測靶板20、聚焦鏡30、影像感測器40、三軸移動裝置41以及電子計算機50。光源裝置10出射一光束(可見光或紅外光)至濾光器11,該光束經濾光器11過濾後進入積分球12,在積分球12內漫反射後,產生一均勻光束。該均勻光束經過檢測靶板20與聚焦鏡30, 將檢測圖案投射並聚焦至影像感測器40。影像感測器40被配置於三軸移動裝置41上,使得三軸移動裝置41可自由移動影像感測器40,藉此檢測影像感測器40的各部分。當檢測靶板20的檢測圖案被投射聚焦至影像感測器40,則影像感測器輸出成像波形資料至電子計算機50。電子計算機50將成像波形資料以刀口演算法計算,產生調變轉換函數(Modulation transfer function,MTF)。 Please refer to the first figure. The first figure shows a schematic view of an optical detecting device 1 according to an embodiment of the present invention. The optical detecting device 1 includes a light source device 10, a filter 11, an integrating sphere 12, a detecting target 20, a focusing mirror 30, an image sensor 40, a three-axis moving device 41, and an electronic computer 50. The light source device 10 emits a light beam (visible light or infrared light) to the filter 11, which is filtered by the filter 11 and enters the integrating sphere 12, and after diffusing reflection in the integrating sphere 12, a uniform beam is generated. The uniform beam passes through the detection target 20 and the focusing mirror 30, The detection pattern is projected and focused to the image sensor 40. The image sensor 40 is disposed on the three-axis moving device 41 such that the three-axis moving device 41 can freely move the image sensor 40, thereby detecting portions of the image sensor 40. When the detection pattern of the detection target 20 is projected and focused to the image sensor 40, the image sensor outputs the imaging waveform data to the electronic computer 50. The computer 50 calculates the imaging waveform data as a knife-edge algorithm to generate a modulation transfer function (MTF).

本發明的一實施形態的光源裝置10、濾光器11以及積分球12,是用來產生均勻光束的裝置,換句話說,只要能產生均勻光束的光源元件(例如準直儀)都屬於本發明申請專利範圍之「光源裝置」或其一部份。本發明的一實施形態的影像感測器40可為線性影像感測器或平面影像感測器,本發明的實施形態中採用線性影像感測器所感測的線性方向影像來檢測,但也可以取用平面影像感測器所感測的線性方向影像來檢測。本發明的一實施形態的電子計算機50更包括一顯示器,以顯示調變轉換函數曲線圖。 The light source device 10, the optical filter 11, and the integrating sphere 12 according to an embodiment of the present invention are means for generating a uniform light beam, in other words, a light source element (for example, a collimator) capable of generating a uniform light beam belongs to the present invention. A "light source device" or a part thereof of the scope of the invention. The image sensor 40 of the embodiment of the present invention may be a linear image sensor or a planar image sensor. In the embodiment of the present invention, the linear direction image sensed by the linear image sensor is used for detection, but The linear direction image sensed by the planar image sensor is used for detection. The electronic computer 50 according to an embodiment of the present invention further includes a display to display a modulation transfer function graph.

請參閱第二圖,第二圖表示調整檢測靶板20的檢測圖案的步驟示意圖。在第二圖中,本發明之一實施形態之檢測靶板20係感測線性方向42的影像,包含:一基板以及一檢測圖案。該基板為透明基板。該檢測圖案是以一不透光塗層形成於該檢測圖案於該基板上。該檢測圖案具一彎折條紋,其中該彎折條紋相對於線性方向42的一垂直方向21呈對稱狀態,且具二對稱子條紋22a、22b,俾當檢測靶板20與線性方向42對齊時,二對稱子條紋22a、22b與線性方向42所具有之二夾角α、β相等。換句話說,檢測靶板20在沿著垂直於線性方向42的垂直方向21具有對稱之二傾斜條紋22a、22b,傾斜條紋22a、22b與線性方向42間夾有二夾角α、β。如第二(a)圖所示,當電子計算機50將影像感測器40輸出之成像波形資料,以刀口演算法計算並產生調變轉換函數,可得知二對稱子條紋22a、22b與線性方向42間的夾角α、β是否相等。當夾角α、β不相等(通常進行檢測時,檢測靶板20的二對稱子條紋22a、22b與線性方向42間的二角度不可能剛好相等)時,可藉由一圖案調整裝置(圖未顯示)調整檢測靶板20,使該二傾斜條紋與該線性方向之二夾角α、β相等。之後,再 次以刀口演算法計算並產生調變轉換函數,即可獲得最準確的MTF檢測結果。 Please refer to the second figure, which shows a schematic diagram of the steps of adjusting the detection pattern of the detection target 20 . In the second figure, the detection target 20 of an embodiment of the present invention senses an image in the linear direction 42 and includes a substrate and a detection pattern. The substrate is a transparent substrate. The detection pattern is formed on the substrate by the opaque coating on the detection pattern. The detection pattern has a bent stripe, wherein the bent stripe is symmetrical with respect to a vertical direction 21 of the linear direction 42 and has two symmetric sub-stripes 22a, 22b, when the detection target 20 is aligned with the linear direction 42. The two symmetrical sub-stripes 22a, 22b are equal to the two angles α, β of the linear direction 42. In other words, the detection target 20 has two symmetrical oblique stripes 22a, 22b in a vertical direction 21 perpendicular to the linear direction 42, and the oblique stripes 22a, 22b and the linear direction 42 have two angles α, β interposed therebetween. As shown in the second (a) figure, when the electronic computer 50 calculates the imaging waveform data output by the image sensor 40, and calculates the modulation conversion function by the knife edge algorithm, the two symmetric sub-stripe 22a, 22b and the linearity can be known. Whether the angles α and β between the directions 42 are equal. When the angles α and β are not equal (usually detecting, when the two angles between the two symmetric sub-stripe 22a, 22b of the target plate 20 and the linear direction 42 are not exactly equal), a pattern adjusting device can be used. The detection target 20 is adjusted such that the two oblique stripes are equal to the two angles α and β of the linear direction. After that, then The most accurate MTF test results can be obtained by calculating and generating the modulation transfer function by the knife-edge algorithm.

再者,檢測靶板20的對稱子條紋22a、22b係透光與不透光相間而成的條紋圖案。對稱子條紋22a、22b與線性方向42間的二夾角α、β較佳為2214度,更佳為2~10度,但並不受限於此。在本發明的一實施形態中,雖然以三軸移動裝置41為例來說明,但也可以使用二軸移動裝置或單軸移動裝置來移動影像感測器40。 Further, the symmetrical sub-stripe 22a, 22b of the detection target 20 is a stripe pattern formed by transmitting light and opaque. The two angles α and β between the symmetrical sub-stripes 22a and 22b and the linear direction 42 are preferably 2214 degrees, more preferably 2 to 10 degrees, but are not limited thereto. In one embodiment of the present invention, the three-axis moving device 41 is taken as an example. However, the image sensor 40 may be moved using a two-axis moving device or a single-axis moving device.

在此需要特別指出,對稱子條紋22a、22b的寬度並沒有特別限制,且對稱子條紋22a、22b的透光部與不透光部也不一定要相同寬度。極端地來說,即使對稱子條紋22a、22b的不透光部的寬度小到成趨近於一線段,只要能夠使影像感測器明確感測出黑、白、黑(即不透光、透光、不透光)的影像即可。或者是,極端地來說,即使對稱子條紋22a、22b的不透光部的寬度大到僅一條紋就幾乎佔了大部分的檢測靶板20的表面,只要能夠使線性感測器明確感測出黑、白、黑的影像即可。再者,雖然在第二圖中,對稱子條紋22a的一端與對稱子條紋22b的一端相連接成該彎折條紋,但各對稱子條紋22a、22b也可以彼此不相連,只要成對稱配置並能使影像感測器測量出黑、白、黑的影像即可。因此,彼此不相連接的對稱子條紋22a、22b也可以不構成彎折條紋,且各對稱子條紋22a、22b也可以成一線段彼此對稱而成二對稱子線段,此類變更皆依感測影像與檢測MTF之需求而定。 It is to be noted here that the widths of the symmetrical sub-stripes 22a and 22b are not particularly limited, and the light transmitting portions and the opaque portions of the symmetrical sub-stripes 22a and 22b do not necessarily have the same width. In an extreme, even if the width of the opaque portion of the symmetrical sub-stripes 22a, 22b is so small that it is close to a line segment, as long as the image sensor can clearly sense black, white, and black (ie, opaque, The image of light transmission and opacity can be used. Or, in other words, even if the width of the opaque portion of the symmetrical sub-stripes 22a, 22b is as large as only one stripe, it occupies most of the surface of the detecting target 20, as long as the line sensor can be made clear. Black, white, and black images can be measured. Furthermore, although in the second figure, one end of the symmetric sub-stripes 22a is connected to one end of the symmetric sub-stripes 22b to form the bent stripes, the symmetric sub-strips 22a, 22b may not be connected to each other as long as they are symmetrically arranged. It can make the image sensor measure black, white and black images. Therefore, the symmetric sub-stripes 22a, 22b that are not connected to each other may not constitute the bending stripe, and each of the symmetric sub-stripes 22a, 22b may be symmetric with each other to form a two-symmetric sub-line segment, and such changes are sensed. Image and test demand for MTF.

以刀口演算法計算出調變轉換函數的過程請參照第三圖。第三圖表示本發明的一實施形態的以刀口演算法所算出的(a)線擴展函數;(b)邊擴展函數;以及(c)調變轉換函數的曲線圖。如第三圖所示,電子計算機50根據來自影像感測器40所感測之影像,獲得線性方向42與對稱子條紋22a、22b(邊界)的邊擴展函數(Edge Spread Function,ESF)(參照第三圖(a)縱座標為灰階值),對此邊擴展函數微分(dESF/dx)以獲得一線擴展函數(Line Spread Function,LSF)(參照第三圖(b)),再對此線擴展函數進行傅利葉轉換(Fourier Transform)以獲得一空間頻率響應(Spatial Frequency Response,SFR),即可產生MTF曲線圖(參照第三圖 (c))。此外,由於本案所感測者為對稱圖案,因此檢測時,若角度α、β不相等,則在上述第三圖(a)~(c)中會分別出現二條曲線,若角度α、β相等,則在上述第三圖(a)~(c)中會分別出現重合的一條曲線。也就是說,當經過檢測產生MTF曲線圖時,可藉由曲線圖來判斷角度α、β是否需要進一步調整。 Please refer to the third figure for the process of calculating the modulation transfer function by the knife-edge algorithm. The third diagram shows a graph of the (a) line spread function calculated by the knife edge algorithm, (b) the side spread function, and (c) the modulation transfer function according to an embodiment of the present invention. As shown in the third figure, the electronic computer 50 obtains an edge spread function (ESF) of the linear direction 42 and the symmetric sub-stripe 22a, 22b (boundary) based on the image sensed by the image sensor 40 (refer to In the three figures (a), the ordinate is the gray scale value), and the extension function is differentiated (dESF/dx) to obtain the line spread function (LSF) (refer to the third figure (b)), and then the line The extension function performs Fourier Transform to obtain a spatial frequency response (SFR), which can generate an MTF graph (refer to the third diagram). (c)). In addition, since the sensor in this case is a symmetrical pattern, if the angles α and β are not equal during the detection, two curves appear in the third graphs (a) to (c), respectively. If the angles α and β are equal, Then, in the third graph (a) to (c) above, a coincident curve appears. That is to say, when the MTF graph is generated through the detection, it can be judged by the graph whether the angles α, β need further adjustment.

實施例 Example

1.一種光學檢測裝置,用於檢測一影像感測器所感測之一線性方向之一影像,包括:一光源裝置,提供一均勻光束;一圖案調整裝置,配置一檢測靶板於該均勻光束的一光路上,其中該檢測靶板所包含之一檢測圖案,具一彎折條紋,該彎折條紋相對於該線性方向的一垂直方向呈對稱狀態,且具二對稱子條紋;一移動裝置,配置成可移動該影像感測器;一聚焦鏡,位於該移動裝置與該檢測靶板之間,將該檢測靶板投射於該影像感測器;以及一電子計算機,連接於該影像感測器,接收來自該影像感測器的一檢測結果,根據該檢測結果,藉由該圖案調整裝置調整該檢測靶板,使該二對稱子條紋與該線性方向之二夾角為相等。 An optical detecting device for detecting an image in one of linear directions sensed by an image sensor, comprising: a light source device for providing a uniform light beam; and a pattern adjusting device configured to detect a target plate at the uniform light beam An optical path, wherein the detection target comprises a detection pattern having a bending stripe, the bending stripe being symmetrical with respect to a vertical direction of the linear direction, and having two symmetric sub-stripes; a mobile device Configuring to move the image sensor; a focusing mirror between the mobile device and the detecting target, projecting the detecting target to the image sensor; and an electronic computer connected to the image sense The detector receives a detection result from the image sensor, and according to the detection result, the detection target plate is adjusted by the pattern adjustment device so that the angle between the two symmetrical sub-stripes and the linear direction is equal.

2.如實施例1所述之光學檢測裝置,其中各該對稱子條紋係透光與不透光相間,且該二夾角為2~14度,該均勻光束為一紅外光及一可見光其中之一,該影像感測器為一線性感測器及一平面感測器其中之一,該光源裝置更包括一積分球及一準直儀其中之一,該移動裝置為一單軸移動裝置、一二軸移動裝置及一三軸移動裝置其中之一,該電子計算機以一刀口演算法產生一調變轉換函數(MTF),來獲得該檢測結果,根據該檢測結果判斷該二角度是否一致,當該二角度不相等時,調整該檢測靶板使該二角度為相等,並再計算該調變轉換函數。 2. The optical detecting device of embodiment 1, wherein each of the symmetrical sub-strips is between light and opaque, and the two angles are between 2 and 14 degrees, and the uniform beam is an infrared light and a visible light. The image sensor is one of a line sensor and a plane sensor. The light source device further includes one of an integrating sphere and a collimator. The moving device is a single axis moving device. One of a two-axis moving device and a three-axis moving device, the electronic computer generates a modulation transfer function (MTF) by a knife-edge algorithm to obtain the detection result, and according to the detection result, whether the two angles are consistent, when the When the two angles are not equal, the detection target is adjusted so that the two angles are equal, and the modulation conversion function is recalculated.

3.一種光學檢測方法,用於檢測一影像感測器所感測之一線性方向之一影像,其步驟包括:提供一檢測靶板,其中該檢測靶板所包含之一檢測圖案,具一彎折條紋,該彎折條紋相對於該線性方向的一垂直方向呈對稱狀態,且具二對稱子條紋;將該檢測靶板投射至該影像感測器;以及根據該影像感測器輸出之一檢測結果,調整該檢測靶板,使該二對稱子條紋與該線性方向之二夾角為相等。 3. An optical detection method for detecting one of the linear directions sensed by an image sensor, the method comprising: providing a detection target, wherein the detection target comprises a detection pattern having a bend a folded stripe symmetrical with respect to a vertical direction of the linear direction and having two symmetric sub-stripes; projecting the detection target to the image sensor; and according to one of the image sensor outputs As a result of the detection, the detection target is adjusted such that the angle between the two symmetrical sub-stripes and the linear direction is equal.

4.如實施例3所述之光學檢測方法,其中各該對稱子條紋係透光與不透光相間,且該二夾角為2~14度,該影像感測器為一線性感測器及一平面感測器其中之一。 4. The optical detection method of embodiment 3, wherein each of the symmetrical sub-strips is between light and opaque, and the two angles are between 2 and 14 degrees. The image sensor is a line sensor and a sensor. One of the flat sensors.

5.如實施例3所述之光學檢測方法,其步驟更包括:以一刀口演算法產生一調變轉換函數(MTF),來獲得該檢測結果,根據該檢測結果判斷該二角度是否相等,當該二角度不相等時,調整該檢測靶板使該二角度為相等,並再計算該調變轉換函數。 5. The optical detection method of embodiment 3, the method further comprising: generating a modulation transfer function (MTF) by a knife-edge algorithm to obtain the detection result, and determining whether the two angles are equal according to the detection result; When the two angles are not equal, the detection target is adjusted such that the two angles are equal, and the modulation conversion function is recalculated.

6.一種檢測靶板,用於檢測一影像感測器所感測之一線性方向之一影像,包含:一基板;以及一檢測圖案,設置於該基板上,且具一彎折條紋,其中該彎折條紋相對於該線性方向的一垂直方向呈對稱狀態,且具二對稱子條紋,俾當該檢測靶板與該線性方向對齊時,該二對稱子條紋與該線性方向所具有之二夾角相等。 A detection target for detecting one of the linear directions sensed by an image sensor, comprising: a substrate; and a detection pattern disposed on the substrate and having a bent stripe, wherein the target The bending stripe is symmetrical with respect to a vertical direction of the linear direction and has two symmetrical sub-stripes. When the detecting target is aligned with the linear direction, the two symmetrical sub-stripe has an angle with the linear direction. equal.

7.如實施例6所述之檢測靶板,其中該檢測靶板用於產生一調變轉換函數(MTF),各該對稱子條紋係透光與不透光相間,且該二夾角為2~14度。 7. The detection target plate according to embodiment 6, wherein the detection target plate is used to generate a modulation transfer function (MTF), each of the symmetrical sub-stripes being light-transmissive and opaque, and the two angles are 2 ~14 degrees.

8.一種光學檢測方法,係用於檢測一影像感測器所感測之一線性方向之影像,包含:提供一彎折條紋;使該彎折條紋相對於該線性方向的一垂直方向呈對稱狀態,其中該彎折條紋具二對稱子條紋;以及調整該檢測靶板與該線性方向之位置關係,使該二對稱子條紋與該線性方向所具有之二夾角相等。 8. An optical detection method for detecting an image in a linear direction sensed by an image sensor, comprising: providing a bending stripe; and causing the bending stripe to be symmetrical with respect to a vertical direction of the linear direction The bent stripe has two symmetric sub-stripes; and adjusting a positional relationship between the detecting target and the linear direction such that the two symmetric sub-stripe has the same angle as the linear direction.

9.一種檢測靶板,用於檢測一影像感測器所感測之一線性方向之一影像,包含:一基板;以及一檢測圖案,設置於該基板上,且具二對稱子線段,其中各該對稱子線段不相連,且相對於該線性方向的一垂直方向呈對稱狀態,俾當該檢測靶板與該線性方向對齊時,該二對稱子線段與該線性方向所具有之二夾角相等。 A detection target for detecting an image in one of linear directions sensed by an image sensor, comprising: a substrate; and a detection pattern disposed on the substrate and having two symmetric sub-line segments, wherein each The symmetrical sub-line segments are not connected, and are symmetric with respect to a vertical direction of the linear direction. When the detecting target plate is aligned with the linear direction, the two symmetrical sub-segment segments have the same angle with the linear direction.

10.一種光學檢測方法,係用於檢測一影像感測器所感測之一線性方向之影像,包含:提供二對稱子線段,使該二對稱子線段相對於該線性方向的一垂直方向呈對稱狀態,其中各該對稱子線段不相連;以及調整該檢測靶板與該線性方向之位置關係,使該二對稱子線段與該線性方向所具有之二夾 角相等。 10. An optical detection method for detecting an image in a linear direction sensed by an image sensor, comprising: providing a second symmetric sub-line segment such that the two symmetric sub-line segments are symmetric with respect to a vertical direction of the linear direction a state in which each of the symmetric sub-line segments is not connected; and adjusting a positional relationship between the detection target plate and the linear direction, so that the two symmetric sub-segment segments and the linear direction have two clips The angles are equal.

本發明以較佳之實施例說明如上,僅用於藉以幫助了解本發明之實施,非用以限定本發明之精神,而熟悉此領域技藝者於領悟本發明之精神後,在不脫離本發明之精神範圍內,當可作些許更動潤飾及等同之變化替換,其專利保護範圍當視後附之申請專利範圍及其等同領域而定。 The present invention has been described above with reference to the preferred embodiments of the present invention, and is not intended to limit the scope of the present invention, and those skilled in the art can understand the spirit of the present invention without departing from the invention. Within the scope of the spirit, when there are some changes and replacements, the scope of patent protection depends on the scope of the patent application and its equivalent.

20‧‧‧檢測靶板 20‧‧‧Detection target

21‧‧‧垂直方向 21‧‧‧Vertical direction

22a、22b‧‧‧對稱子條紋 22a, 22b‧‧‧symmetric substripes

42‧‧‧線性方向 42‧‧‧Linear direction

α、β‧‧‧夾角 α, β‧‧‧ angle

Claims (10)

一種光學檢測裝置,用於檢測一影像感測器所感測之一線性方向之一影像,包括:一光源裝置,提供一均勻光束;一圖案調整裝置,配置一檢測靶板於該均勻光束的一光路上,其中該檢測靶板所包含之一檢測圖案,具一彎折條紋,該彎折條紋相對於該線性方向的一垂直方向呈對稱狀態,且具二對稱子條紋;一移動裝置,配置成可移動該影像感測器;一聚焦鏡,位於該移動裝置與該檢測靶板之間,將該檢測靶板投射於該影像感測器;以及一電子計算機,連接於該影像感測器,接收來自該影像感測器的一檢測結果,根據該檢測結果,藉由該圖案調整裝置調整該檢測靶板,使該二對稱子條紋與該線性方向之二夾角為相等。 An optical detecting device for detecting one of the linear directions sensed by an image sensor comprises: a light source device providing a uniform light beam; a pattern adjusting device configured to detect a target plate in the uniform light beam An optical path, wherein the detection target comprises a detection pattern having a bending stripe, the bending stripe being symmetrical with respect to a vertical direction of the linear direction, and having two symmetric sub-stripes; a mobile device, configured The image sensor is movable; a focusing mirror is disposed between the moving device and the detecting target, and the detecting target is projected on the image sensor; and an electronic computer is connected to the image sensor Receiving a detection result from the image sensor, and adjusting the detection target by the pattern adjustment device according to the detection result, so that the angle between the two symmetrical sub-stripes and the linear direction is equal. 如申請專利範圍第1項所述之光學檢測裝置,其中各該對稱子條紋係透光與不透光相間,且該二夾角為2~14度,該均勻光束為一紅外光及一可見光其中之一,該影像感測器為一線性感測器及一平面感測器其中之一,該光源裝置更包括一積分球及一準直儀其中之一,該移動裝置為一單軸移動裝置、一二軸移動裝置及一三軸移動裝置其中之一,該電子計算機以一刀口演算法產生一調變轉換函數(MTF),來獲得該檢測結果,根據該檢測結果判斷該二角度是否一致,當該二角度不相等時,調整該檢測靶板使該二角度為相等,並再計算該調變轉換函數。 The optical detecting device of claim 1, wherein each of the symmetrical sub-strips is transparent and opaque, and the two angles are 2 to 14 degrees, and the uniform beam is an infrared light and a visible light. In one aspect, the image sensor is one of a line sensor and a plane sensor, and the light source device further comprises one of an integrating sphere and a collimator, the moving device is a single axis moving device, One of a two-axis moving device and a three-axis moving device, the electronic computer generates a modulation transfer function (MTF) by a knife-edge algorithm to obtain the detection result, and according to the detection result, whether the two angles are consistent, when When the two angles are not equal, the detection target is adjusted such that the two angles are equal, and the modulation conversion function is recalculated. 一種光學檢測方法,用於檢測一影像感測器所感測之一線性方向之一 影像,其步驟包括:提供一檢測靶板,其中該檢測靶板所包含之一檢測圖案,具一彎折條紋,該彎折條紋相對於該線性方向的一垂直方向呈對稱狀態,且具二對稱子條紋;將該檢測靶板投射至該影像感測器;以及根據該影像感測器輸出之一檢測結果,調整該檢測靶板,使該二對稱子條紋與該線性方向之二夾角為相等。 An optical detecting method for detecting one of linear directions sensed by an image sensor And the step of providing a detection target, wherein the detection target comprises a detection pattern having a bending stripe, the bending stripe being symmetrical with respect to a vertical direction of the linear direction, and having two a symmetric sub-strip; projecting the detection target to the image sensor; and adjusting the detection target according to a detection result of the image sensor output, so that the angle between the two symmetrical sub-stripes and the linear direction is equal. 如申請專利範圍第3項所述之光學檢測方法,其中各該對稱子條紋係透光與不透光相間,且該二夾角為2~14度,該影像感測器為一線性感測器及一平面感測器其中之一。 The optical detection method of claim 3, wherein each of the symmetrical sub-strips is transparent and opaque, and the two angles are 2 to 14 degrees, and the image sensor is a line sensor and One of a planar sensors. 如申請專利範圍第3項所述之光學檢測方法,其步驟更包括:以一刀口演算法產生一調變轉換函數(MTF),來獲得該檢測結果,根據該檢測結果判斷該二角度是否相等,當該二角度不相等時,調整該檢測靶板使該二角度為相等,並再計算該調變轉換函數。 The optical detection method according to claim 3, wherein the step further comprises: generating a modulation transfer function (MTF) by a knife-edge algorithm to obtain the detection result, and determining whether the two angles are equal according to the detection result, When the two angles are not equal, the detection target is adjusted such that the two angles are equal, and the modulation conversion function is recalculated. 一種檢測靶板,用於檢測一影像感測器所感測之一線性方向之一影像,包含:一基板;以及一檢測圖案,設置於該基板上,且具一彎折條紋,其中該彎折條紋相對於該線性方向的一垂直方向呈對稱狀態,且具二對稱子條紋,俾當該檢測靶板與該線性方向對齊時,該二對稱子條紋與該線性方向所具有之二夾角相等。 a detection target for detecting one of the linear directions sensed by an image sensor, comprising: a substrate; and a detection pattern disposed on the substrate and having a bent stripe, wherein the bending The stripe is symmetrical with respect to a vertical direction of the linear direction and has two symmetrical sub-stripes. When the detecting target is aligned with the linear direction, the two symmetrical sub-stripe has the same angle as the linear direction. 如申請專利範圍第6項所述之檢測靶板,其中該檢測靶板用於產生一 調變轉換函數(MTF),各該對稱子條紋係透光與不透光相間,且該二夾角為2~14度。 The detection target of claim 6, wherein the detection target is used to generate a The modulation transfer function (MTF), each of the symmetrical sub-strips is between light and opaque, and the two angles are 2 to 14 degrees. 一種光學檢測方法,係用於檢測一影像感測器所感測之一線性方向之影像,包含:提供一彎折條紋;使該彎折條紋相對於該線性方向的一垂直方向呈對稱狀態,其中該彎折條紋具二對稱子條紋;以及調整該檢測靶板與該線性方向之位置關係,使該二對稱子條紋與該線性方向所具有之二夾角相等。 An optical detection method for detecting an image in a linear direction sensed by an image sensor, comprising: providing a bending stripe; and causing the bending stripe to be symmetrical with respect to a vertical direction of the linear direction, wherein The bending stripe has two symmetrical sub-stripes; and adjusting a positional relationship between the detecting target and the linear direction such that the two symmetrical sub-stripe has the same angle as the linear direction. 一種檢測靶板,用於檢測一影像感測器所感測之一線性方向之一影像,包含:一基板;以及一檢測圖案,設置於該基板上,且具二對稱子線段,其中各該對稱子線段不相連,且相對於該線性方向的一垂直方向呈對稱狀態,俾當該檢測靶板與該線性方向對齊時,該二對稱子線段與該線性方向所具有之二夾角相等。 a detection target for detecting one of the linear directions sensed by an image sensor, comprising: a substrate; and a detection pattern disposed on the substrate and having two symmetric sub-line segments, wherein each of the symmetry The sub-line segments are not connected, and are symmetric with respect to a vertical direction of the linear direction. When the detecting target plate is aligned with the linear direction, the two symmetric sub-line segments have the same angle with the linear direction. 一種光學檢測方法,係用於檢測一影像感測器所感測之一線性方向之影像,包含:提供二對稱子線段,使該二對稱子線段相對於該線性方向的一垂直方向呈對稱狀態,其中各該對稱子線段不相連;以及調整該檢測靶板與該線性方向之位置關係,使該二對稱子線段與該線性方向所具有之二夾角相等。 An optical detection method for detecting an image in a linear direction sensed by an image sensor, comprising: providing a second symmetric sub-line segment, wherein the two symmetric sub-line segments are symmetric with respect to a vertical direction of the linear direction, Each of the symmetric sub-line segments is not connected; and the positional relationship between the detection target and the linear direction is adjusted such that the two symmetric sub-line segments have the same angle with the linear direction.
TW104141824A 2015-12-11 2015-12-11 Detection target plate, optical detection device and optical detection method TWI582400B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW104141824A TWI582400B (en) 2015-12-11 2015-12-11 Detection target plate, optical detection device and optical detection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW104141824A TWI582400B (en) 2015-12-11 2015-12-11 Detection target plate, optical detection device and optical detection method

Publications (2)

Publication Number Publication Date
TWI582400B TWI582400B (en) 2017-05-11
TW201721120A true TW201721120A (en) 2017-06-16

Family

ID=59367330

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104141824A TWI582400B (en) 2015-12-11 2015-12-11 Detection target plate, optical detection device and optical detection method

Country Status (1)

Country Link
TW (1) TWI582400B (en)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105814492B (en) * 2013-12-13 2018-06-15 Asml荷兰有限公司 Check device and method, lithography system and device making method

Also Published As

Publication number Publication date
TWI582400B (en) 2017-05-11

Similar Documents

Publication Publication Date Title
KR102549058B1 (en) Optical measurement apparatus and optical measurement method
JP7504189B2 (en) Film thickness measuring device and film thickness measuring method
KR102461481B1 (en) Projection of structured light for a mirror surface
US10277790B2 (en) Full-range image detecting system and method thereof
CN105974427A (en) Structural light distance measurement device and method
CN105466359B (en) A kind of precision surface type measurement device
US20140354797A1 (en) Calibration block for measuring warpage, warpage measuring apparatus using the same, and method thereof
JP2001281049A (en) Apparatus and method for measuring viewing angle dependence and location dependence of luminance
CN103676487A (en) Workpiece height measuring device and correcting method thereof
CN108507492A (en) The high-precision wide-dynamic-range measurement method and measuring system on a kind of plane surface transmissive element surface
JP2015108582A (en) Three-dimensional measurement method and device
TWI582400B (en) Detection target plate, optical detection device and optical detection method
CN207515908U (en) A kind of multi-pass self calibration polarization detecting device and system
US11825070B1 (en) Intrinsic parameter calibration system
JP7219034B2 (en) Three-dimensional shape measuring device and three-dimensional shape measuring method
CN109813531A (en) The debugging apparatus and its adjustment method of optical system
CN106358037B (en) lens detection method
CN109073371B (en) Apparatus and method for tilt detection
CN107870522B (en) Imaging optical path device and detection control method of imaging optical path device
JP2008170282A (en) Shape measuring device
CN112556992B (en) Method and system for measuring optical parameters of small field of view projection module
KR102475140B1 (en) Resolution test chart of the lens module and the resolution test device including the same
CN109307987A (en) Exposure apparatus and article manufacturing method
JP2010112819A (en) Method of correcting measurement sensitivity in oblique incidence interferometer
TWI546528B (en) Method for testing a lens

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees