TW201630129A - Heat sink device with increased pulling force - Google Patents
Heat sink device with increased pulling force Download PDFInfo
- Publication number
- TW201630129A TW201630129A TW104104448A TW104104448A TW201630129A TW 201630129 A TW201630129 A TW 201630129A TW 104104448 A TW104104448 A TW 104104448A TW 104104448 A TW104104448 A TW 104104448A TW 201630129 A TW201630129 A TW 201630129A
- Authority
- TW
- Taiwan
- Prior art keywords
- opening
- heat sink
- sink device
- hole
- disposed
- Prior art date
Links
Classifications
-
- H10W72/877—
-
- H10W74/15—
-
- H10W90/724—
Landscapes
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Cooling Or The Like Of Electrical Apparatus (AREA)
Abstract
一種具有增加拉拔力之散熱片裝置,適用於使用一黏著劑黏貼於一基板上,並包含一第一主體單元,及複數第一拉拔單元。該第一主體單元包括一第一主體。每一第一拉拔單元包括一貫穿該第一主體的第一通孔、一設置於該第一通孔上方之第一上開口、一設置於該第一通孔下方之第一下開口,及一連接該第一上開口與該第一下開口之第一環繞壁,該第一上開口的開口面積大於該第一下開口,當該第一主體之第一下表面黏貼於該基板時,該黏著劑可由該第一下開口進入該第一通孔後凝固,並與該第一環繞壁形成一拉拔力,以使該第一主體單元不易自該基板脫落。 A heat sink device having an increased pulling force is suitable for being adhered to a substrate by using an adhesive, and comprises a first body unit and a plurality of first drawing units. The first body unit includes a first body. Each of the first drawing units includes a first through hole penetrating the first body, a first upper opening disposed above the first through hole, and a first lower opening disposed below the first through hole. And a first surrounding wall connecting the first upper opening and the first lower opening, the first upper opening has an opening area larger than the first lower opening, when the first lower surface of the first body is adhered to the substrate The adhesive can be solidified after entering the first through hole by the first lower opening, and forms a pulling force with the first surrounding wall, so that the first body unit is not easily detached from the substrate.
Description
本發明是有關於一種散熱片裝置,特別是指一種具有增加拉拔力之散熱片裝置。 The present invention relates to a heat sink device, and more particularly to a heat sink device having an increased pulling force.
隨著半導體製程的日新月異,現有的半導體元件整體之體積逐漸縮小且效能逐漸提升,其半導體元件運作時所產生的熱量會因效能提升而增加,為了避免半導體元件因熱量無法排除而導致半導體元件燒壞,半導體元件的上方會黏貼金屬材質散熱片來提升半導體元件的散熱效果。 With the ever-changing semiconductor manufacturing process, the size of the existing semiconductor components is gradually reduced and the efficiency is gradually improved. The heat generated by the operation of the semiconductor components is increased due to the improvement of the performance. In order to avoid the semiconductor components being burned due to heat, the semiconductor components are burned. Bad, a metal heat sink is adhered to the top of the semiconductor component to improve the heat dissipation of the semiconductor component.
參閱圖1,為一傳統散熱片10使用一黏著劑11與一基板12連接在一起,且使用一導熱材質13與一半導體晶片14連貼在一起,用以將該半導體晶片14運作時所產生的熱量經由該散熱片10傳導至外界散熱,以維持半導體晶片14工作時的溫度不會太高,避免高溫造成該半導體晶片14因此燒壞。 Referring to FIG. 1, a conventional heat sink 10 is bonded to a substrate 12 by using an adhesive 11 and is bonded to a semiconductor wafer 14 by using a heat conductive material 13 for generating the semiconductor wafer 14 during operation. The heat is conducted to the outside through the heat sink 10 to dissipate heat, so that the temperature at which the semiconductor wafer 14 is operated is not too high, and the high temperature is prevented from causing the semiconductor wafer 14 to burn out.
此外,國際汽車推動小組(IATF)和有關國家汽車工業協會(ANFIA、AIAG、CCFA、FIEV、SMMT和VDA-QMC)為將來汽車業的品質管理系統驗證建立全球統一的標準,於1999年3月制定了ISO/TS16949的技術規範,其目的在於為全球的汽車工業尋求一種統一的供應商品質管理系統。ISO/TS16949的技術規範適用於整個汽車供應鏈製造商,其該技術規範包括了使用於車輛中電子產品的規範範疇。 In addition, the International Automobile Promotion Group (IATF) and the relevant National Automobile Industry Associations (ANFIA, AIAG, CCFA, FIEV, SMMT and VDA-QMC) establish globally uniform standards for future quality management system validation in the automotive industry, in March 1999. The ISO/TS16949 technical specification was developed to seek a unified supplier quality management system for the global automotive industry. The technical specifications of ISO/TS16949 apply to the entire automotive supply chain manufacturer, which covers the scope of the specification for electronic products used in vehicles.
續上所述,由於汽車會使用於許多環境中,包含極熱、極凍、極乾燥與極潮濕等極端氣候,以及極端的氣候變化,因此ISO/TS16949之技術規範了汽車上使用 的所有零件,其必須比一般產品中所使用的零件標準更高以抵抗嚴苛的環境變化,包含著電子零件中與散熱片的黏著技術規範,導致一般半導體散熱片黏貼製程技術所製造的電子產品無法通過高標準ISO/TS16949的技術範疇。 As mentioned above, the ISO/TS16949 technology regulates the use of automobiles because the car will be used in many environments, including extremely hot, extremely cold, extremely dry and extremely humid extreme climates, as well as extreme climate changes. All parts must be higher than the standard parts used in general products to withstand harsh environmental changes, including the adhesion specifications of the electronic parts to the heat sink, resulting in the general semiconductor heat sink adhesion process technology Products cannot pass the technical standards of the high standard ISO/TS16949.
因此,如何提升散熱片與半導體之間的黏著力與拉拔力,以符合高標準技術規範,使黏貼於電子產品上的散熱片可以對抗嚴苛的環境變化與外力的拉拔而不易自半導體晶片上剝落,便成為相關業者亟需努力之目標。 Therefore, how to improve the adhesion and pull-out force between the heat sink and the semiconductor to meet the high standard technical specifications, so that the heat sink attached to the electronic product can resist the harsh environmental changes and the pull of the external force is not easy to self-semiconductor Peeling off the wafer has become an urgent need for the industry.
有鑑於此,本發明之目的是提供一種具有增加拉拔力之散熱片裝置,適用於使用一黏著劑黏貼於一基板上,並包含一第一主體單元,及一複數第一拉拔單元。該第一主體單元包括一具有一第一上表面及一第一下表面之第一主體。 In view of the above, an object of the present invention is to provide a heat sink device having an increased pulling force, which is suitable for being adhered to a substrate by using an adhesive, and comprising a first body unit and a plurality of first drawing units. The first body unit includes a first body having a first upper surface and a first lower surface.
該複數第一拉拔單元分散的設置於該第一主體中,每一第一拉拔單元包括一貫穿該第一主體的第一通孔、一設置於該第一上表面之第一上開口、一設置於該第一下表面之第一下開口,及一連接該第一上開口與該第一下開口之第一環繞壁,且該第一上開口的開口面積大於該第一下開口,當該第一主體之第一下表面黏貼於該基板時,該黏著劑可由該第一下開口進入該第一通孔後凝固,並與該第一環繞壁形成一拉拔力,以使該第一主體單元不易自該基板脫落。 The plurality of first drawing units are dispersedly disposed in the first body, each of the first drawing units includes a first through hole penetrating the first body, and a first upper opening disposed on the first upper surface a first lower opening disposed on the first lower surface, and a first surrounding wall connecting the first upper opening and the first lower opening, and an opening area of the first upper opening is larger than the first lower opening When the first lower surface of the first body is adhered to the substrate, the adhesive may be solidified by the first lower opening into the first through hole, and form a pulling force with the first surrounding wall, so that The first body unit is not easily detached from the substrate.
本發明的又一技術手段,是在於上述之第一環繞壁的周緣是由該第一下開口向該第一上開口漸大。 According to still another aspect of the present invention, the circumference of the first surrounding wall is gradually increased from the first lower opening toward the first upper opening.
本發明的另一技術手段,是在於上述之每一第一拉拔單元更包括一設置於該第一環繞壁上之粗糙面。 Another technical means of the present invention is that each of the first drawing units further includes a rough surface disposed on the first surrounding wall.
本發明之再一技術手段,是在於上述之第一通孔具有一連接該第一上開口之大孔徑部、一連接該第一下開口之小孔徑部,及一介於該大孔徑部與該小孔徑部間 的肩部。 According to still another aspect of the present invention, the first through hole has a large aperture portion connecting the first upper opening, a small aperture portion connecting the first lower opening, and a large aperture portion and the Small aperture Shoulder.
本發明的又一技術手段,是在於上述之第一通孔更具有一自該肩部往該第一通孔中心線凸伸之防拉凸垣。 According to still another aspect of the present invention, the first through hole further has a pull-tab protruding from the shoulder toward the center line of the first through hole.
本發明的另一技術手段,是在於上述之第一主體單元更包括一設置於該第一主體中並貫穿該第一上表面與該第一下表面之大開放孔。 Another technical means of the present invention is that the first body unit further includes a large opening hole disposed in the first body and extending through the first upper surface and the first lower surface.
本發明的再一技術手段,是在於上述之第一主體之第一下表面形成一容置槽,而該複數第一拉拔單元是圍繞該容置槽設置。 According to still another aspect of the present invention, the first lower surface of the first body is formed with a receiving groove, and the plurality of first drawing units are disposed around the receiving groove.
本發明的又一技術手段,是在於上述之具有增加拉拔力之散熱片裝置更包含一第二主體單元,包括間隔一設置於該第一主體上方並具有一第二上表面及一第二下表面的第二主體,以及一連接該第二下表面與該第一上表面之連接層,且該第一主體及該第二主體之外周緣切齊。 Another technical means of the present invention is that the heat sink device having the increased pulling force further comprises a second body unit, wherein the spacer body is disposed above the first body and has a second upper surface and a second a second body of the lower surface, and a connecting layer connecting the second lower surface and the first upper surface, and the outer periphery of the first body and the second body are aligned.
本發明的另一技術手段,是在於上述之具有增加拉拔力之散熱片裝置更包含複數第二拉拔單元,其分散的設置於該第二主體中,每一第二拉拔單元包括一貫穿該第二主體的第二通孔、一設置於該第二上表面之第二上開口、一設置於該第二下表面之第二下開口,及一連接該第二上開口及該第二下開口之第二環繞壁,該第二上開口的開口面積大於該第二下開口。 Another technical means of the present invention is that the heat sink device having the increased pulling force further includes a plurality of second drawing units, which are dispersedly disposed in the second body, and each of the second drawing units includes a a second through hole penetrating the second body, a second upper opening disposed on the second upper surface, a second lower opening disposed on the second lower surface, and a second upper opening and the first opening a second surrounding wall of the second lower opening, the second upper opening having an opening area larger than the second lower opening.
本發明的再一技術手段,是在於上述之具有增加拉拔力之散熱片裝置更包含一第三主體單元,包括一間隔設置於該第一主體上方之第三主體,及一自該第三主體周緣往該基板方向延伸並與該第一主體連接的連接段,該第三主體之外周緣不大於該大開放孔。 A further technical means of the present invention is that the heat sink device having the increased pulling force further comprises a third body unit, comprising a third body spaced apart from the first body, and a third body a connecting section extending from the periphery of the body toward the substrate and connected to the first body, and the outer periphery of the third body is not larger than the large opening.
本發明之有益功效在於具有散熱功效之第一主體中設置了複數第一拉拔單元,當在進行半導體散熱片黏貼製程時,該黏著劑不僅可將該第一主體與該基板黏 貼在一起,該黏著劑還會經由該第一下開口進入該第一通孔中與該第一環繞壁黏貼在一起,可以增加該第一主體及該基板之間的黏著力,並且,每一第一拉拔單元之第一上開口的面積大於第一下開口,使的凝固於該第一通孔中的黏著劑與該第一環繞壁相互產生拉拔力,能讓設置有該複數第一拉拔單元之第一主體能緊緊的黏貼於該基板上而不易掉落,用以對抗外界嚴苛的環境變化及拉拔的力量。 The beneficial effect of the invention is that a plurality of first drawing units are disposed in the first body having heat dissipation effect, and the adhesive not only adheres the first body to the substrate when performing the semiconductor heat sink bonding process Sticking together, the adhesive also enters the first through hole through the first lower opening and adheres to the first surrounding wall, thereby increasing the adhesion between the first body and the substrate, and each The first upper opening of the first drawing unit has an area larger than the first lower opening, so that the adhesive solidified in the first through hole and the first surrounding wall mutually generate a pulling force, so that the plural number can be set The first body of the first drawing unit can be tightly adhered to the substrate and is not easily dropped to resist the harsh environmental changes and the pulling force of the outside.
A‧‧‧黏著劑 A‧‧‧Adhesive
B‧‧‧基板 B‧‧‧Substrate
3‧‧‧第一主體單元 3‧‧‧First main unit
31‧‧‧第一主體 31‧‧‧First subject
311‧‧‧第一上表面 311‧‧‧ first upper surface
312‧‧‧第一下表面 312‧‧‧ First lower surface
313‧‧‧容置槽 313‧‧‧ accommodating slots
32‧‧‧大開放孔 32‧‧‧ large open hole
4‧‧‧第一拉拔單元 4‧‧‧First pull unit
41‧‧‧第一通孔 41‧‧‧First through hole
410‧‧‧中心線 410‧‧‧ center line
411‧‧‧大孔徑部 411‧‧‧ Large aperture
412‧‧‧小孔徑部 412‧‧‧Small aperture
413‧‧‧肩部 413‧‧‧ Shoulder
414‧‧‧防拉凸垣 414‧‧‧Protruding
42‧‧‧第一上開口 42‧‧‧First opening
43‧‧‧第一下開口 43‧‧‧First opening
44‧‧‧第一環繞壁 44‧‧‧First Surrounding Wall
45‧‧‧粗糙面 45‧‧‧Rough surface
5‧‧‧第二主體單元 5‧‧‧Second main unit
51‧‧‧第二主體 51‧‧‧Second subject
511‧‧‧第二上表面 511‧‧‧Second upper surface
512‧‧‧第二下表面 512‧‧‧Second lower surface
52‧‧‧連接層 52‧‧‧Connection layer
6‧‧‧第二拉拔單元 6‧‧‧Second drawing unit
61‧‧‧第二通孔 61‧‧‧Second through hole
62‧‧‧第二上開口 62‧‧‧Second upper opening
63‧‧‧第二下開口 63‧‧‧Second opening
64‧‧‧第二環繞壁 64‧‧‧Second surround wall
7‧‧‧第三主體單元 7‧‧‧ Third main unit
71‧‧‧第三主體 71‧‧‧ third subject
72‧‧‧連接段 72‧‧‧ Connection section
圖1是一示意圖,說明現有的散熱片黏貼於一基板之態樣;圖2是一裝置示意圖,說明本發明具有增加拉拔力之散熱片裝置的一第一較佳實施例;圖3是一局部剖視圖,說明該第一較佳實施例之一第一拉拔單元;圖4是一裝置示意圖,說明本發明具有增加拉拔力之散熱片裝置的一第二較佳實施例;圖5是一剖視示意圖,說明該第二較佳實施例之第一拉拔單元;圖6是一裝置示意圖,說明本發明具有增加拉拔力之散熱片裝置的一第三較佳實施例;圖7是一示意圖,說明該第三較佳實施例的實施態樣;圖8是一局部剖視圖,說明本發明具有增加拉拔力之散熱片裝置的一第四較佳實施例;圖9是一示意圖,說明該第四較佳實施例的實施態樣;圖10是一裝置示意圖,說明本發明具有增加拉拔力之散熱片裝置的一第五較佳實施例;圖11是一局部剖視圖,說明該第五較佳實施例之第一拉拔單元;及圖12是一示意圖,說明該第五較佳實施例的實施態 樣。 1 is a schematic view showing a state in which a conventional heat sink is adhered to a substrate; FIG. 2 is a schematic view showing a first preferred embodiment of the heat sink device having an increased drawing force according to the present invention; A partial cross-sectional view illustrating a first drawing unit of the first preferred embodiment; and FIG. 4 is a schematic view of the device, illustrating a second preferred embodiment of the heat sink device with increased pulling force of the present invention; Is a schematic cross-sectional view showing the first drawing unit of the second preferred embodiment; FIG. 6 is a schematic view of the device, illustrating a third preferred embodiment of the heat sink device with increased pulling force of the present invention; 7 is a schematic view showing an embodiment of the third preferred embodiment; and FIG. 8 is a partial cross-sectional view showing a fourth preferred embodiment of the heat sink device with increased pulling force of the present invention; FIG. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 10 is a schematic view showing a fifth preferred embodiment of the present invention having a heat sink device for increasing the drawing force; FIG. 11 is a partial cross-sectional view. Explain the fifth preferred embodiment The first drawing unit of the example; and FIG. 12 is a schematic diagram illustrating the embodiment of the fifth preferred embodiment kind.
有關於本發明之相關申請專利特色與技術內容,在以下配合參考圖式之五個較佳實施例的詳細說明中,將可清楚的呈現。 The details of the related patents and the technical contents of the present invention will be apparent from the following detailed description of the preferred embodiments of the accompanying drawings.
在進行詳細說明前應注意的是,類似的元件是以相同的編號來作表示。並且,說明書內容所提及半導體封裝製程可用於覆晶封裝(Flip Chip Package,FC)、銲球陣列封裝(Plastic Ball Grid Array Package,PBGA)、球閘陣列封裝(Ball Grid Array,BGA)、四方扁平封裝(Quad Flat Package,QFP)、四方扁平無引腳封裝(Quad Flat No-lead Package,QFN),及晶片級封裝(Chip Scale Package,CSP)等多種半導體封裝技術。 It should be noted that, before the detailed description, similar elements are denoted by the same reference numerals. Moreover, the semiconductor packaging process mentioned in the specification can be used for Flip Chip Package (FC), Plastic Ball Grid Array Package (PBGA), Ball Grid Array (BGA), Quartet A variety of semiconductor packaging technologies, such as Quad Flat Package (QFP), Quad Flat No-lead Package (QFN), and Chip Scale Package (CSP).
參閱圖2、3,為本發明具有增加拉拔力之散熱片裝置的第一較佳實施例,適用於使用一黏著劑A黏貼於一基板B上,並可將該基板B上方的晶片所產生的熱量傳導至外界,其圖中切線a-a為該第一較佳實施例之剖面線。該散熱片裝置包含一第一主體單元3,及複數第一拉拔單元4。該第一主體單元3包括一具有一第一上表面311及一第一下表面312之第一主體31。 Referring to Figures 2 and 3, there is shown a first preferred embodiment of a heat sink device having an increased pulling force, which is suitable for bonding to a substrate B using an adhesive A, and the wafer above the substrate B. The generated heat is conducted to the outside, and the tangent line aa in the figure is the hatching of the first preferred embodiment. The heat sink device includes a first body unit 3 and a plurality of first drawing units 4. The first body unit 3 includes a first body 31 having a first upper surface 311 and a first lower surface 312.
該複數第一拉拔單元4分散的設置於該第一主體31中,每一第一拉拔單元4包括一貫穿該第一主體31的第一通孔41、一設置於該第一上表面311之第一上開口42、一設置於該第一下表面312之第一下開口43,及一連接該第一上開口42及該第一下開口43之第一環繞壁44,且該第一上開口42的開口面積大於該第一下開口43,且該第一環繞壁44的周緣是由該第一下開口43向該第一上開口42漸大。 The first first drawing unit 4 is disposed in the first body 31, and each of the first drawing units 4 includes a first through hole 41 extending through the first body 31 and a first upper surface. a first upper opening 42 of the 311, a first lower opening 43 disposed on the first lower surface 312, and a first surrounding wall 44 connecting the first upper opening 42 and the first lower opening 43, and the first The opening area of the upper opening 42 is larger than the first lower opening 43, and the circumference of the first surrounding wall 44 is gradually enlarged from the first lower opening 43 toward the first upper opening 42.
在該第一較佳實施例中,該複數第一拉拔單元4是以兩兩相對之排列方式沿著該第一主體31的周緣內 側框圍成一圈,以使該第一主體31黏貼於該基板B上時,該第一主體31之第一下表面312可與該晶片的上表面黏貼在一起,以使該晶片所產生的熱量傳導至外界,實際實施時,該複數第一拉拔單元4可依照實際狀況來設置,不應以此為限。 In the first preferred embodiment, the plurality of first drawing units 4 are arranged in a pairwise arrangement along the circumference of the first body 31. When the side frame is formed in a circle so that the first body 31 is adhered to the substrate B, the first lower surface 312 of the first body 31 can be adhered to the upper surface of the wafer to generate the wafer. The heat is transmitted to the outside. In actual implementation, the plurality of first drawing units 4 can be set according to actual conditions, and should not be limited thereto.
續上所述,當該第一主體31之第一下表面312黏貼於該基板B時,該黏著劑A可經由該第一下開口43進入該第一通孔41後凝固,並與該第一環繞壁44形成一拉拔力,以使該第一主體單元3不易自該基板B上脫落。 As described above, when the first lower surface 312 of the first body 31 is adhered to the substrate B, the adhesive A can enter the first through hole 41 via the first lower opening 43 and solidify, and A surrounding force is formed around the wall 44 so that the first body unit 3 does not easily come off the substrate B.
值得一提的是,與該第一環繞壁44黏貼在一起的黏著劑A不僅可以增加與該第一主體31的黏著面積來提升黏著力,再加上該第一通孔41之周緣是由該第一下開口43向該第一上開口42漸大的特點,使凝固於該第一通孔41中之黏著劑A與該第一環繞壁44形成一拉拔力,使凝固的黏著劑A不易自該第一下開口43中脫落,比起傳統的散熱片單使用一平面與該基板B的黏貼方式,本發明確實可達到提升黏著力及增加拉拔力的功效。 It is worth mentioning that the adhesive A adhered to the first surrounding wall 44 can not only increase the adhesion area with the first body 31 to increase the adhesion, but also the circumference of the first through hole 41 is The feature that the first lower opening 43 is gradually enlarged toward the first upper opening 42 is such that the adhesive A solidified in the first through hole 41 forms a pulling force with the first surrounding wall 44, so that the solidified adhesive is solidified. A is not easily detached from the first lower opening 43. Compared with the conventional heat sink, the surface of the conventional heat sink is adhered to the substrate B, and the present invention can achieve the effects of improving the adhesion and increasing the pulling force.
參閱圖4、5,為本發明具有增加拉拔力之散熱片裝置的第二較佳實施例,該第二較佳實施例與該第一較佳實施例大致相同,相同之處於此不再贅述,不同之處在於該第一主體單元3更包括一設置於該第一主體31中並貫穿該第一上表面311與該第一下表面312之大開放孔32,且每一第一拉拔單元4更包括一設置於該第一環繞壁44上之粗糙面45。 Referring to Figures 4 and 5, there is shown a second preferred embodiment of the heat sink device having a drawing force in accordance with the present invention. The second preferred embodiment is substantially identical to the first preferred embodiment, and the same is no longer the same. The first main body unit 3 further includes a large opening 32 disposed in the first body 31 and extending through the first upper surface 311 and the first lower surface 312, and each first pull The drawing unit 4 further includes a rough surface 45 disposed on the first surrounding wall 44.
在該第二較佳實施例中,該複數第一拉拔單元4是以分散的方式設置於該第一主體31中,當該第一主體單元3黏貼於該基板B上時,該大開放孔32可容置該基板B上方的晶片。此外,該第二較佳實施例之第一拉拔單元4不僅可以保留相同於該第一較佳實施例的黏貼效果,設置於該第一環繞壁44上的粗糙面45還可以再增加 該黏著劑A與該第一主體31的黏貼面積,用以將該第一主體31與該基板B中的黏著力及拉拔力更向上進一步的提升。 In the second preferred embodiment, the plurality of first drawing units 4 are disposed in the first body 31 in a dispersed manner. When the first body unit 3 is adhered to the substrate B, the large opening is The hole 32 can accommodate the wafer above the substrate B. In addition, the first drawing unit 4 of the second preferred embodiment can not only retain the same adhesive effect as the first preferred embodiment, but the rough surface 45 disposed on the first surrounding wall 44 can be further increased. The adhesion area of the adhesive A and the first body 31 is used to further enhance the adhesion and the pulling force in the first body 31 and the substrate B.
參閱圖6、7,為本發明具有增加拉拔力之散熱片裝置的第三較佳實施例,其圖中切線b-b為該第三較佳實施例之剖面線,該第三較佳實施例與該第一較佳實施例大致相同,相同之處於此不再贅述,不同之處在於該第一主體31之第一下表面312形成一容置槽313,使該第一主體31之剖面形狀形成ㄇ型,而該複數第一拉拔單元4是圍繞該容置槽313所設置,較佳地,該複數第一拉拔單元4是以單一排列的方式框圍於該第一主體31中,實際實施時,該複數第一拉拔單元4可依照實際狀況來設置,不應以此為限。 Referring to FIG. 6 and FIG. 7 , a third preferred embodiment of the heat sink device with increased pull force is shown in the figure. The tangent line bb is a cross-sectional line of the third preferred embodiment. The third preferred embodiment The first preferred embodiment is substantially the same as the first preferred embodiment. The first lower surface 312 of the first body 31 defines a receiving groove 313 for making the cross-sectional shape of the first body 31. The plurality of first drawing units 4 are disposed around the receiving groove 313. Preferably, the plurality of first drawing units 4 are framed in the first body 31 in a single arrangement. In actual implementation, the plurality of first drawing units 4 can be set according to actual conditions, and should not be limited thereto.
當該第三較佳實施例黏貼於該基板B上時,該黏著劑A將該容置槽313外側之第一下表面312與該基板B之上表面黏貼在一起時,該黏著劑A會經由該第一下開口43進入該第一通孔41後凝固,並與該第一環繞壁44相互產生黏著力及拉拔力,以使該第一主體單元3不易自該基板B上脫落,且該基板B上方的晶片是容置於該容置槽313中,該晶片之上表面與該容置槽313中的第一下表面312黏貼在一起,用以將該晶片所產生的熱量傳導至外界。 When the third preferred embodiment is adhered to the substrate B, the adhesive A will adhere the first lower surface 312 outside the receiving groove 313 to the upper surface of the substrate B, and the adhesive A will The first through hole 43 enters the first through hole 41 and solidifies, and generates an adhesive force and a pulling force with the first surrounding wall 44 to prevent the first body unit 3 from falling off from the substrate B. The upper surface of the substrate is adhered to the first lower surface 312 of the receiving groove 313 for conducting heat of the wafer. To the outside world.
參閱圖8、9,為本發明具有增加拉拔力之散熱片裝置的第四較佳實施例,該第四較佳實施例與該第二較佳實施例大致相同,相同之處於此不再贅述,不同之處在於該散熱片裝置更包含一第二主體單元5,及複數第二拉拔單元6。 Referring to Figures 8 and 9, a fourth preferred embodiment of the heat sink device with increased pull force is provided. The fourth preferred embodiment is substantially the same as the second preferred embodiment, and the same is no longer the same. The difference is that the heat sink device further includes a second body unit 5 and a plurality of second drawing units 6.
該第二主體單元5包括一間隔設置於該第一主體31上方並具有一第二上表面511及一第二下表面512的第二主體51,以及一連接該第二下表面512與該第一上 表面311之連接層52,且該第一主體31及該第二主體51之外周緣切齊,較佳地,該連接層52之材質及特性與該黏著劑A相同。 The second body unit 5 includes a second body 51 spaced apart from the first body 31 and having a second upper surface 511 and a second lower surface 512, and a second lower surface 512 and the first One on The connecting layer 52 of the surface 311 and the outer periphery of the first body 31 and the second body 51 are aligned. Preferably, the material and characteristics of the connecting layer 52 are the same as those of the adhesive A.
複數第二拉拔單元6分散的設置於該第二主體51中,每一第二拉拔單元6包括一貫穿該第二主體51的第二通孔61、一設置於該第二上表面511之第二上開口62、一設置於該第二下表面512之第二下開口63,及一連接該第二上開口62及該第二下開口63之第二環繞壁64,該第二上開口62的開口面積大於該第二下開口63,且該第二環繞壁64的周緣是由該第二下開口63向該第二上開口62漸大。 The plurality of second drawing units 6 are disposed in the second body 51. Each of the second drawing units 6 includes a second through hole 61 extending through the second body 51 and a second upper surface 511. a second upper opening 62, a second lower opening 63 disposed on the second lower surface 512, and a second surrounding wall 64 connecting the second upper opening 62 and the second lower opening 63. The opening area of the opening 62 is larger than the second lower opening 63, and the circumference of the second surrounding wall 64 is gradually increased from the second lower opening 63 toward the second upper opening 62.
當該四較佳實施例黏貼於該基板B上時,該第一主體單元3之大開放孔32可容置該基板B上方的晶片,而凝固於該第一通孔41中的黏著劑A不僅可以增加與該第一主體31的黏貼面積來增加黏著力,再加上該第一環繞壁44的周緣是由該第一下開口43向該第一上開口42漸大的特點,使凝固於該第一通孔41中之黏著劑A產生拉拔力而不易由該第一下開口43中脫落。 When the four preferred embodiments are adhered to the substrate B, the large opening 32 of the first body unit 3 can accommodate the wafer above the substrate B, and the adhesive A solidified in the first through hole 41 Not only the adhesion area with the first body 31 can be increased to increase the adhesion, but also the circumference of the first surrounding wall 44 is enlarged by the first lower opening 43 toward the first upper opening 42 to solidify. The adhesive A in the first through hole 41 generates a pulling force and is not easily peeled off from the first lower opening 43.
此外,該複數第二拉拔單元6也具有與該第一拉拔單元4相同的功效,當該第二主體51藉由該連接層52與該第一主體31黏貼在一起時,該連接層52之材質可經由該第二下開口63進入該第二通孔61中凝固,並與該第二環繞壁64形成黏著力及拉拔力,在加上該連接層52之材質可與該第一通孔41中之黏著劑A接觸並互相黏貼在一起,以使該第二主體單元5緊緊的與該第一主體單元3黏貼在一起而不易脫落。 In addition, the plurality of second drawing units 6 also have the same function as the first drawing unit 4, when the second body 51 is adhered to the first body 31 by the connecting layer 52, the connecting layer The material of the 52 can be solidified into the second through hole 61 through the second lower opening 63, and form an adhesive force and a pulling force with the second surrounding wall 64. The material of the connecting layer 52 can be combined with the material. The adhesives A in the through holes 41 are in contact with each other and adhered to each other so that the second main body unit 5 is tightly adhered to the first main body unit 3 without being easily detached.
在該第四較佳實施例中,該複數第一、二拉拔單元4、6分別以兩兩相對之排列方式沿著該第一、二主體31、51的周緣內側框圍成一圈,實際實施時,該複數第一、二拉拔單元4、6可依照實際狀況來設置,不應以此為 限。當該第一、二主體31、51黏貼於該基板B上時,該第二主體51之第二下表面512可與該晶片的上表面黏貼在一起,以使該晶片所產生的熱量傳導至外界。 In the fourth preferred embodiment, the plurality of first and second drawing units 4, 6 are respectively arranged in a circle along the inner side of the circumference of the first and second bodies 31, 51 in a pairwise arrangement. In actual implementation, the first and second drawing units 4 and 6 can be set according to actual conditions, and should not be used as limit. When the first and second bodies 31, 51 are adhered to the substrate B, the second lower surface 512 of the second body 51 can be adhered to the upper surface of the wafer to conduct heat generated by the wafer to external.
參閱圖10、11、12,為本發明具有增加拉拔力之散熱片裝置的第五較佳實施例,其圖中切線c-c為該第三較佳實施例之剖面線,該第五較佳實施例與該第二較佳實施例大致相同,相同之處於此不再贅述,不同之處在於該散熱片裝置更包含一第三主體單元7。 Referring to Figures 10, 11, and 12, a fifth preferred embodiment of the heat sink device having a pull-out force according to the present invention is shown. The tangent line cc is the hatching of the third preferred embodiment. The embodiment is substantially the same as the second preferred embodiment, and the same details are not described herein except that the heat sink device further includes a third body unit 7.
該第三主體單元7包括一間隔設置於該第一主體31上方之第三主體71,及一自該第三主體71周緣往該基板B方向延伸並與該第一主體31連接的連接段72,該第三主體71之外周緣不大於該大開放孔32,較佳地,該第一主體單元3與該第三主體單元7使用金屬材質所製做且兩者一體成型,當該第一主體31黏貼於該基板B時,該第三主體71之下表面與該晶片之上表面黏貼在一起,以使該晶片所產生的熱量可藉由該第三主體71傳導至外界。 The third body unit 7 includes a third body 71 spaced apart from the first body 31, and a connecting portion 72 extending from the periphery of the third body 71 toward the substrate B and connected to the first body 31. The outer periphery of the third body 71 is not larger than the large opening 32. Preferably, the first body unit 3 and the third body unit 7 are made of a metal material and are integrally formed as the first body. When the main body 31 is adhered to the substrate B, the lower surface of the third main body 71 is adhered to the upper surface of the wafer so that the heat generated by the wafer can be conducted to the outside through the third main body 71.
該第一通孔41具有一連接該第一上開口42之大孔徑部411、一連接該第一下開口43之小孔徑部412、一介於該大孔徑部411與該小孔徑部412間的肩部413,及一自該肩部413往該第一通孔41中心線410凸伸之防拉凸垣414。 The first through hole 41 has a large aperture portion 411 connected to the first upper opening 42 , a small aperture portion 412 connected to the first lower opening 43 , and a gap between the large aperture portion 411 and the small aperture portion 412 . The shoulder 413 and a pull-tab 414 protruding from the shoulder 413 toward the center line 410 of the first through hole 41.
在此發明人要敘明的是,當該第一主體31之第一下表面312黏貼於該基板B上時,該黏著劑A可由該第一下開口43進入該第一通孔41中,不僅可與該第一環繞壁44互相黏貼形成黏著力,還能藉由該大孔徑部411、該小孔徑部412及該肩部413的設置,使凝固於該第一通孔41中的黏著劑A能與該肩部413產生拉拔力,再配合該黏著劑A可以環繞住該防拉凸垣414凝固的黏貼起來,能使該黏著劑A與該第一主體單元3產生最大的黏著力及拉拔力,將該散熱片裝置與該基板B可以緊緊的黏貼 在一起,不但能對抗外界嚴苛的環境變化而不會脫落,還能對抗外界拉拔的力量而不會分離。 The inventors will clarify that when the first lower surface 312 of the first body 31 is adhered to the substrate B, the adhesive A can enter the first through hole 41 through the first lower opening 43. The adhesion between the first surrounding wall 44 and the first surrounding wall 44 can be formed, and the adhesion of the large through-hole portion 411, the small aperture portion 412 and the shoulder portion 413 can be adhered to the first through hole 41. The agent A can generate a pulling force with the shoulder 413, and the adhesive A can be adhered to the solidification of the anti-sliding ridge 414, so that the adhesive A and the first main body unit 3 can be maximally adhered. Force and drawing force, the heat sink device and the substrate B can be closely adhered Together, not only can it resist the harsh environmental changes of the outside world, it will not fall off, and it can also resist the forces of drawing from the outside without separating.
由上述說明可知,本發明具有增加拉拔力之散熱片裝置確實包含以下優點: As can be seen from the above description, the heat sink device of the present invention having an increased pulling force does include the following advantages:
一、提升黏著力 First, improve adhesion
本發明於半導體散熱片黏貼製程中,該黏著劑A不僅可以將該第一下表面312與該基板B之上表面黏貼在一起,還可以經由該複數第一拉拔單元4之第一下開口43進入該第一通孔41中與該第一環繞壁44黏貼在一起,用以增加黏著面積來提升該第一主體31與該基板B彼此間的黏著力。 In the semiconductor heat sink bonding process, the adhesive A can not only adhere the first lower surface 312 to the upper surface of the substrate B, but also can pass through the first lower opening of the plurality of first drawing units 4. The first through hole 41 is adhered to the first surrounding wall 44 to increase the adhesion area to enhance the adhesion between the first body 31 and the substrate B.
二、增加拉拔力 Second, increase the pulling force
本發明藉由每一第一拉拔單元4之第一上開口42的周緣大於該第一下開口43的特點,當該黏著劑A經由該第一下開口43進入該第一通孔41中凝固時,凝固的黏著劑A會與該第一環繞壁44或是該肩部413相互抵固而增加拉拔力,使該第一主體31能對抗外界的拉拔而不會分離。 The first aspect of the first upper opening 42 of each first drawing unit 4 is larger than the first lower opening 43 , and the adhesive A enters the first through hole 41 via the first lower opening 43 . When solidified, the solidified adhesive A will abut against the first surrounding wall 44 or the shoulder 413 to increase the pulling force, so that the first body 31 can resist drawing from the outside without being separated.
三、符合高規格的產品規範 Third, in line with high specifications of product specifications
承上所述,設置有該複數第一拉拔單元4之第一主體單元3確實可提升與該基板B間的黏著力及拉拔力,使本發明可以對抗外界嚴苛的環境變化及拉拔力道,緊緊的黏貼於該基板B上不易脫落,可以符合高規格的產品規範。 As described above, the first body unit 3 provided with the plurality of first drawing units 4 can enhance the adhesion and the pulling force between the substrate B and the substrate B, so that the present invention can resist the harsh environmental changes and pull of the outside world. The pull-out road is tightly adhered to the substrate B and is not easy to fall off, and can meet the high specification product specifications.
綜上所述,本發明具有增加拉拔力之散熱片裝置的第一主體31中設置該複數第一拉拔單元4,當該第一主體31與該基板B黏貼在一起時,該黏著劑A不僅可 將該第一下表面312與該基板B之上表面黏貼在一起,還會經由該第一下開口43進入該第一通孔41中與該第一環繞壁44黏貼在一起以增加貼黏面積來提升黏著力,再藉由每一第一拉拔單元4之第一下開口43的面積小於第一上開口42的特點,使凝固於該第一通孔41中之黏著劑A能與該第一環繞壁44相互抵固並產生拉拔力,讓該散熱片裝置能與該基板B緊緊的黏貼在一起,不但可抵抗外界嚴苛的環境變化而不會脫落,還能對抗外界拉拔的力量而不會分離,使本發明可以合乎高規格產品的技術範疇,故確實能夠達到本發明之目的。 In summary, the first first drawing unit 4 is disposed in the first body 31 of the heat sink device with increased pulling force, and the adhesive is applied when the first body 31 and the substrate B are adhered together. A can not only The first lower surface 312 is adhered to the upper surface of the substrate B, and is also inserted into the first through hole 41 through the first lower opening 43 to adhere to the first surrounding wall 44 to increase the adhesion area. To improve the adhesion, and by the feature that the area of the first lower opening 43 of each of the first drawing units 4 is smaller than that of the first upper opening 42, the adhesive A solidified in the first through hole 41 can The first surrounding walls 44 are mutually abutted and generate a pulling force, so that the heat sink device can be closely adhered to the substrate B, and can not only resist the harsh environmental changes of the outside world, but also can not fall off, and can also resist external pulling. The strength of the pull is not separated, so that the present invention can meet the technical scope of the high specification product, so that the object of the present invention can be achieved.
惟以上所述者,僅為本發明之五個較佳實施例而已,當不能以此限定本發明實施之範圍,即大凡依本發明申請專利範圍及發明說明內容所作之簡單的等效變化與修飾,皆仍屬本發明專利涵蓋之範圍內。 However, the above is only the five preferred embodiments of the present invention, and the scope of the invention is not limited thereto, that is, the simple equivalent changes made by the scope of the invention and the description of the invention are Modifications are still within the scope of the invention.
3‧‧‧第一主體單元 3‧‧‧First main unit
31‧‧‧第一主體 31‧‧‧First subject
311‧‧‧第一上表面 311‧‧‧ first upper surface
312‧‧‧第一下表面 312‧‧‧ First lower surface
4‧‧‧第一拉拔單元 4‧‧‧First pull unit
41‧‧‧第一通孔 41‧‧‧First through hole
410‧‧‧中心線 410‧‧‧ center line
411‧‧‧大孔徑部 411‧‧‧ Large aperture
412‧‧‧小孔徑部 412‧‧‧Small aperture
413‧‧‧肩部 413‧‧‧ Shoulder
414‧‧‧防拉凸垣 414‧‧‧Protruding
42‧‧‧第一上開口 42‧‧‧First opening
43‧‧‧第一下開口 43‧‧‧First opening
7‧‧‧第三主體單元 7‧‧‧ Third main unit
71‧‧‧第三主體 71‧‧‧ third subject
72‧‧‧連接段 72‧‧‧ Connection section
Claims (10)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW104104448A TWI665767B (en) | 2015-02-10 | 2015-02-10 | Heat sink device with increased pulling force |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW104104448A TWI665767B (en) | 2015-02-10 | 2015-02-10 | Heat sink device with increased pulling force |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201630129A true TW201630129A (en) | 2016-08-16 |
| TWI665767B TWI665767B (en) | 2019-07-11 |
Family
ID=57182235
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW104104448A TWI665767B (en) | 2015-02-10 | 2015-02-10 | Heat sink device with increased pulling force |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI665767B (en) |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200428623A (en) * | 2003-06-11 | 2004-12-16 | Siliconware Precision Industries Co Ltd | Semiconductor package with heat sink |
| TWI242862B (en) * | 2003-08-21 | 2005-11-01 | Siliconware Precision Industries Co Ltd | Semiconductor package with heat sink |
| TWI247395B (en) * | 2004-03-09 | 2006-01-11 | Siliconware Precision Industries Co Ltd | Semiconductor package with heatsink and method for fabricating the same and stiffener |
-
2015
- 2015-02-10 TW TW104104448A patent/TWI665767B/en active
Also Published As
| Publication number | Publication date |
|---|---|
| TWI665767B (en) | 2019-07-11 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR100630741B1 (en) | Multilayer Molding Semiconductor Package and Manufacturing Method Thereof | |
| CN203456452U (en) | Integrated circuit packaging piece | |
| US7608915B2 (en) | Heat dissipation semiconductor package | |
| CN103066032A (en) | Packages and methods for forming same | |
| TWI772243B (en) | Power module and a power device | |
| CN104241218A (en) | Flip chip plastic packaging structure with heat dissipation structure and manufacturing method | |
| JP2002231881A (en) | Semiconductor chip package | |
| US9029203B2 (en) | Method of fabricating semiconductor package | |
| CN106158783B (en) | Radiating fin device with glue overflow preventing structure | |
| CN1319163C (en) | Semiconductor package with heat sink | |
| JP2010050262A (en) | Semiconductor device and manufacturing method thereof | |
| CN202996814U (en) | Heat-dissipation type semiconductor packaging structure | |
| TW201630129A (en) | Heat sink device with increased pulling force | |
| KR100800475B1 (en) | Multilayer semiconductor package and manufacturing method thereof | |
| CN102347303B (en) | The packaging body of multi-chip stacking and manufacture method thereof | |
| CN103811359B (en) | Manufacturing method of semiconductor package | |
| TWI424549B (en) | Improved wire diode package and manufacturing method thereof | |
| CN104051373A (en) | Heat dissipation structure, semiconductor package and manufacturing method thereof | |
| TW201546971A (en) | Semiconductor package and its manufacturing method | |
| JP2012174734A (en) | Heat sink and semiconductor package provided with heat sink | |
| CN102543910A (en) | Chip packaging component and manufacturing method thereof | |
| CN103441106A (en) | Chip flip-mounting BGA encapsulating structure | |
| JP2014138119A (en) | Semiconductor device and semiconductor device manufacturing method | |
| CN201946585U (en) | Packaging structure for semiconductor power device | |
| CN101308832B (en) | Lead frame for leadless package, package structure thereof and manufacturing method thereof |