[go: up one dir, main page]

TW201621994A - Cutting die bond - Google Patents

Cutting die bond Download PDF

Info

Publication number
TW201621994A
TW201621994A TW104125936A TW104125936A TW201621994A TW 201621994 A TW201621994 A TW 201621994A TW 104125936 A TW104125936 A TW 104125936A TW 104125936 A TW104125936 A TW 104125936A TW 201621994 A TW201621994 A TW 201621994A
Authority
TW
Taiwan
Prior art keywords
adhesive layer
dye
resin
substrate
adhesive
Prior art date
Application number
TW104125936A
Other languages
Chinese (zh)
Other versions
TWI664667B (en
Inventor
吾妻祐一郎
佐伯尙哉
Original Assignee
琳得科股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 琳得科股份有限公司 filed Critical 琳得科股份有限公司
Publication of TW201621994A publication Critical patent/TW201621994A/en
Application granted granted Critical
Publication of TWI664667B publication Critical patent/TWI664667B/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J11/00Features of adhesives not provided for in group C09J9/00, e.g. additives
    • C09J11/02Non-macromolecular additives
    • C09J11/06Non-macromolecular additives organic
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J201/00Adhesives based on unspecified macromolecular compounds
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/20Adhesives in the form of films or foils characterised by their carriers
    • H10W72/071

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Dicing (AREA)
  • Adhesive Tapes (AREA)
  • Die Bonding (AREA)

Abstract

一種切割晶粒接合片,係於基材上具備含有染料之接著劑層,前述接著劑層的前述染料之含有量為8.3質量%以下,前述基材與前述接著劑層之間的L*a*b*色彩系統中的色差為30~53。 A dicing die bonding sheet comprising a dye-containing adhesive layer on a substrate, wherein the content of the dye in the adhesive layer is 8.3% by mass or less, and L*a between the substrate and the adhesive layer The color difference in the *b* color system is 30~53.

Description

切割晶粒接合片 Cutting die bond

本發明係關於一種於基材上具備接著劑層之切割晶粒接合片。 The present invention relates to a diced die bond sheet having an adhesive layer on a substrate.

本申請案係基於2014年12月15日在日本提出申請之日本特願2014-253241號而主張優先權,將該內容援用於本申請案。 The present application claims priority based on Japanese Patent Application No. 2014-253241, filed on Jan.

於基材上具備接著劑層而成之切割晶粒接合片,係使用於自半導體晶圓切割並經過半導體晶片拾取,直至將所拾取之半導體晶片接著於基板、引線框架、其他半導體晶片等為止之步驟。 A dicing die bond sheet having an adhesive layer on a substrate is used for cutting from a semiconductor wafer and picking up through a semiconductor wafer until the picked semiconductor wafer is attached to a substrate, a lead frame, other semiconductor wafers, and the like. The steps.

於上述片材中接著劑層通常為無色透明,因此當對片材進行規格裁剪(precut)加工時或進行半導體晶片的晶粒接合時,難以檢查接著劑層是否處於接著於半導體晶圓或半導體晶片等接著對象之狀態。若接著劑層未接著於所期望部位,則會導致於半導體裝置的製造步驟中發生問題。又,當藉由隱形切割或冷擴展來割斷接著劑層時,由 於接著劑層無色透明,故亦無法容易地確認該接著劑層是否已確實地被割斷,因此導致半導體裝置的製造效率降低。 In the above-mentioned sheet, the adhesive layer is usually colorless and transparent, so when performing precut processing on the sheet or performing die bonding of the semiconductor wafer, it is difficult to check whether the adhesive layer is next to the semiconductor wafer or semiconductor. The state of the object, such as a wafer. If the adhesive layer does not follow the desired portion, a problem occurs in the manufacturing steps of the semiconductor device. Also, when the adhesive layer is cut by stealth cutting or cold expansion, Since the adhesive layer is colorless and transparent, it is not easy to confirm whether or not the adhesive layer has been reliably cut, resulting in a decrease in the manufacturing efficiency of the semiconductor device.

於半導體裝置的製造步驟中,例如使用可檢測290~450nm之波段的光之光學感測器來檢查接著劑層,但由於接著劑層之薄層化,該檢查亦變得困難。 In the manufacturing step of the semiconductor device, for example, an optical sensor capable of detecting light in a wavelength band of 290 to 450 nm is used to inspect the adhesive layer, but this inspection becomes difficult due to thinning of the adhesive layer.

其中,作為容易檢查之接著劑層,已揭示有含有如下顏料之接著劑層,該顏料會吸收或反射波段處於290~450nm之範圍內的光(參照專利文獻1)。 Among them, as an adhesive layer which is easy to inspect, an adhesive layer containing a pigment which absorbs or reflects light having a wavelength in the range of 290 to 450 nm has been disclosed (see Patent Document 1).

此種接著劑層因含有顏料而著色,因此可容易地藉由目視來確認有無該接著劑層。 Since such an adhesive layer is colored by containing a pigment, it can be easily visually confirmed whether or not the adhesive layer is present.

[先前技術文獻] [Previous Technical Literature]

[專利文獻] [Patent Literature]

[專利文獻1]日本特開2009-059917號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. 2009-059917

然而,專利文獻1所記載之接著劑層存在如下問題點:由於含有顏料,故於厚度薄之情形下,有時會產生凝聚物或顏色不均,於最終獲得之半導體封裝中產生裂縫,導致可靠性降低。 However, the adhesive layer described in Patent Document 1 has a problem in that, in the case where the thickness is small, aggregates or color unevenness may occur, and cracks may occur in the finally obtained semiconductor package, resulting in cracks. Reduced reliability.

本發明係鑒於前述情形而成,其課題在於提供一種切割晶粒接合片,係容易確認接著劑層有無存在或狀態,可獲得可靠性高之半導體封裝。 The present invention has been made in view of the above circumstances, and an object of the invention is to provide a diced die bond sheet which is easy to confirm the presence or absence of an adhesive layer, and to obtain a highly reliable semiconductor package.

為了解決前述問題,本發明提供一種切割晶粒接合片,其特徵在於:於基材上具備含有染料之接著劑層,前述接著劑層的前述染料之含有量為8.3質量%以下,前述基材與前述接著劑層之間的L*a*b*色彩系統中的色差為30~53。 In order to solve the above problems, the present invention provides a dicing die bonding sheet comprising a dye-containing adhesive layer on a substrate, wherein the content of the dye in the adhesive layer is 8.3% by mass or less, and the substrate The color difference in the L * a * b * color system with the aforementioned adhesive layer is 30-53.

本發明的切割晶粒接合片中,前述染料亦可為雙偶氮染料。 In the dicing die bond sheet of the present invention, the dye may be a bisazo dye.

本發明的切割晶粒接合片中,前述染料亦可為構造中不包含金屬原子或金屬離子之染料。 In the dicing die bonding sheet of the present invention, the dye may be a dye which does not contain a metal atom or a metal ion in the structure.

根據本發明而提供一種切割晶粒接合片,可容易確認接著劑層之有無存在或狀態,並可獲得可靠性高之半導體封裝。 According to the present invention, there is provided a dicing die bonding sheet which can easily confirm the presence or absence of an adhesive layer and obtain a highly reliable semiconductor package.

<<切割晶粒接合片>> <<Cutting die bonding sheet>>

本實施形態的切割晶粒接合片之特徵在於:於基材上具備含有染料之接著劑層,前述接著劑層的前述染料之含有量為8.3質量%以下,前述基材與前述接著劑層之間的L*a*b*色彩系統中的色差(以下簡記為「△E」)為30~53。 The dicing die-bonding sheet of the present embodiment is characterized in that the base material is provided with a dye-containing adhesive layer, and the content of the dye in the adhesive layer is 8.3% by mass or less, and the substrate and the adhesive layer are The color difference (hereinafter abbreviated as "ΔE") in the L * a * b * color system is 30 to 53.

於本說明書中,根據JISZ8781-4:2013算出前述L*、a*及b*In the present specification, the above L * , a *, and b * are calculated in accordance with JIS Z 8781-4:2013.

前述切割晶粒接合片的接著劑層含有特定量之染料,因此前述色差(△E)於特定範圍內。其結果,可容易地確認切割晶粒接合片是否具備接著劑層。 The adhesive layer of the foregoing diced die bond sheet contains a specific amount of dye, and thus the aforementioned chromatic aberration (ΔE) is within a specific range. As a result, it can be easily confirmed whether or not the dicing die bonding sheet has an adhesive layer.

又,藉由使用前述切割晶粒接合片,當對該切割晶粒接合片進行規格裁剪加工,或對半導體晶片進行拾取、晶粒接合時,可容易地目視確認接著劑層是否為接著於半導體晶圓或半導體晶片等接著對象之狀態,可抑制於半導體裝置的製造步驟中發生問題。 Further, by using the dicing die bonding sheet, when the dicing die bonding sheet is subjected to size cutting, or when the semiconductor wafer is picked up or die-bonded, it is easy to visually confirm whether or not the adhesive layer is followed by the semiconductor. The state of the object to be bonded, such as a wafer or a semiconductor wafer, can be suppressed from occurring in the manufacturing process of a semiconductor device.

又,藉由使用前述切割晶粒接合片,於製造半導體晶片之過程中,即使當進行隱形切割時亦可容易地確認接著劑層是否確實地被割斷之狀態,因此可抑制半導體裝置的製造效率之降低,所謂隱形切割係以雷射照射而於晶圓內部形成脆質部,並對貼附有前述晶圓之切割晶粒接合片進 行擴展而將晶圓及前述片材割斷。 Further, by using the above-described dicing die bonding sheet, in the process of manufacturing a semiconductor wafer, it is possible to easily confirm whether or not the adhesive layer is reliably cut even when performing the stealth dicing, thereby suppressing the manufacturing efficiency of the semiconductor device. The reduction is called invisible cutting, which forms a fragile portion inside the wafer by laser irradiation, and cuts the die-bonding piece to which the wafer is attached. The row is expanded to cut the wafer and the aforementioned sheet.

又,即使當進行所謂之冷擴展,即對以低溫形成脆質部之接著劑層進行擴展而將其割斷時,與進行隱形切割時同樣地可容易地目視確認接著劑層是否已確實地割斷之狀態,因此可抑制半導體裝置的製造效率之降低。 Further, even when the so-called cold expansion is performed, that is, when the adhesive layer which forms the brittle portion at a low temperature is expanded and cut, it is possible to easily visually confirm whether or not the adhesive layer has been reliably cut as in the case of performing the stealth cutting. In this state, it is possible to suppress a decrease in the manufacturing efficiency of the semiconductor device.

通常於進行前述擴展時係藉由目視或利用顯微鏡觀察來確認接著劑層是否已被割斷,但根據本發明而容易目視確認接著劑層,故可於短時間內確認。若接著劑層未被割斷,則於拾取作為目標之晶片時,周邊的晶片亦會同時被抬起,導致發生問題。 Usually, when the above expansion is carried out, it is confirmed whether the adhesive layer has been cut by visual observation or observation by a microscope. However, according to the present invention, it is easy to visually confirm the adhesive layer, and it can be confirmed in a short time. If the adhesive layer is not cut, when the target wafer is picked up, the peripheral wafers are simultaneously lifted, causing problems.

再者,由於接著劑層含有染料,且該染料之含有量為8.3質量%以下,故使用前述切割晶粒接合片而獲得之半導體封裝,係抑制裂縫或接合部之剝離且可靠性高。於接著劑層含有顏料而非染料之情形,當接著劑層的厚度薄時,尤其當厚度為10μm左右以下時,有時會於接著劑層中產生凝聚物或顏色不均,於最終獲得之半導體封裝中產生裂縫,導致可靠性降低。 In addition, since the adhesive layer contains a dye and the content of the dye is 8.3% by mass or less, the semiconductor package obtained by cutting the die-bonding sheet described above suppresses cracking of the crack or the joint portion and has high reliability. In the case where the adhesive layer contains a pigment instead of a dye, when the thickness of the adhesive layer is thin, especially when the thickness is about 10 μm or less, cohesive or color unevenness sometimes occurs in the adhesive layer, and finally obtained. Cracks are generated in the semiconductor package, resulting in reduced reliability.

<基材> <Substrate>

前述基材與接著劑層之間,色差(△E)滿足前述關係。 The color difference (ΔE) between the substrate and the adhesive layer satisfies the aforementioned relationship.

基材的顏色只要不與接著劑層的顏色相同,則並無特別限定,但通常較佳為白色。 The color of the substrate is not particularly limited as long as it is not the same as the color of the adhesive layer, but is usually preferably white.

基材可於表面具備黏著劑層(以下有時簡記為「黏著基材」,將該情形與黏著劑層接觸之基材簡記為「支持基材」),亦可不具備黏著劑層(以下有時簡記為「非黏著基材」)。 The substrate may have an adhesive layer on the surface (hereinafter sometimes referred to simply as "adhesive substrate", and the substrate in contact with the adhesive layer in this case is simply referred to as "support substrate"), or may not have an adhesive layer (hereinafter) The time is simply referred to as "non-adhesive substrate").

基材為前述黏著基材時,只要支持基材及黏著劑層之積層構造為一體,且與接著劑層之間滿足前述色差(△E)的關係即可。 When the base material is the above-mentioned adhesive base material, the laminated structure of the support base material and the pressure-sensitive adhesive layer may be integrated, and the relationship between the color difference (ΔE) and the adhesive layer may be satisfied.

前述非黏著基材及支持基材之材質較佳為各種樹脂,具體而言,可例示聚乙烯(低密度聚乙烯(LDPE)、直鏈低密度聚乙烯(LLDPE)、高密度聚乙烯(HDPE等))、聚丙烯、聚丁烯、聚丁二烯、聚甲基戊烯、聚氯乙烯、氯乙烯共聚物、聚對苯二甲酸乙二酯、聚對苯二甲酸丁二酯、聚胺甲酸乙酯、聚胺甲酸乙酯丙烯酸酯、聚醯亞胺、乙烯乙酸乙烯酯共聚物、離子聚合物樹脂、乙烯/(甲基)丙烯酸共聚物、乙烯/(甲基)丙烯酸酯共聚物、聚苯乙烯、聚碳酸酯、氟樹脂、該等任一種樹脂的氫化物、改質物、交聯物或共聚物等。 The material of the non-adhesive substrate and the support substrate is preferably various resins, and specifically, polyethylene (low density polyethylene (LDPE), linear low density polyethylene (LLDPE), high density polyethylene (HDPE) can be exemplified. Etc)), polypropylene, polybutene, polybutadiene, polymethylpentene, polyvinyl chloride, vinyl chloride copolymer, polyethylene terephthalate, polybutylene terephthalate, poly Ethyl carbamate, polyurethane acrylate, polyimine, ethylene vinyl acetate copolymer, ionic polymer resin, ethylene/(meth)acrylic acid copolymer, ethylene/(meth) acrylate copolymer Polystyrene, polycarbonate, fluororesin, hydride, modified product, crosslinked product or copolymer of any of these resins.

前述非黏著基材及支持基材可包含一層(單層),亦可包含兩層以上的複數層,於包含複數層時,各層之材質可均相同或,可均不同,亦可僅一部分相同。 The non-adhesive substrate and the support substrate may comprise one layer (single layer), or may comprise two or more layers. When multiple layers are included, the materials of the layers may be the same or different, or only a part of the same .

可根據目的而適當地選擇前述非黏著基材及支持基 材的厚度,但該厚度較佳為50~300μm,更佳為60~100μm。 The aforementioned non-adhesive substrate and support base may be appropriately selected according to the purpose. The thickness of the material, but the thickness is preferably 50 to 300 μm, more preferably 60 to 100 μm.

前述非黏著基材及支持基材亦可對表面實施噴砂處理、溶劑處理等之凹凸化處理、或電暈放電處理、電子束照射處理、電漿處理、臭氧/紫外線照射處理、火焰處理、鉻酸處理、熱風處理等氧化處理等,以提高與設置於其上方之層,即與接著劑層或黏著劑層之間的接著性。又,前述非黏著基材及支持基材亦可為表面實施了底塗處理之非黏著基材及支持基材。 The non-adhesive substrate and the support substrate may be subjected to embossing treatment such as blasting treatment or solvent treatment, or corona discharge treatment, electron beam irradiation treatment, plasma treatment, ozone/ultraviolet irradiation treatment, flame treatment, or chromium treatment. Oxidation treatment such as acid treatment, hot air treatment, etc., to improve the adhesion to the layer disposed above it, that is, to the adhesive layer or the adhesive layer. Further, the non-adhesive substrate and the support substrate may be a non-adhesive substrate and a support substrate on which the surface is subjected to a primer treatment.

其中,考慮到抑制切割時因刮刀摩擦而導致之基材斷裂,前述非黏著基材及支持基材尤佳為表面實施電子束照射處理。 Among them, in view of suppressing breakage of the substrate due to friction of the blade at the time of cutting, it is preferable that the non-adhesive substrate and the support substrate are subjected to electron beam irradiation treatment on the surface.

[黏著劑層] [Adhesive layer]

前述黏著劑層可適當地使用公知的黏著劑層。黏著劑層為無色時,前述黏著基材會反映支持基材的顏色,黏著劑層為有色(已著色)時,前述黏著基材會反映黏著劑層的顏色、或支持基材與黏著劑層雙方的顏色。 A well-known adhesive layer can be used suitably for the said adhesive layer. When the adhesive layer is colorless, the adhesive substrate reflects the color of the support substrate, and when the adhesive layer is colored (colored), the adhesive substrate reflects the color of the adhesive layer or the support substrate and the adhesive layer. The color of both sides.

黏著劑層可使用黏著劑組成物而形成,前述黏著劑組成物含有該黏著劑層之各種構成成分。黏著劑組成物中非揮發性成分彼此的含有量比率於黏著劑層中亦相同。 The adhesive layer can be formed using an adhesive composition containing various constituent components of the adhesive layer. The content ratio of the nonvolatile components to each other in the adhesive composition is also the same in the adhesive layer.

前述黏著劑層包含以能量線照射而聚合的成分時,可 藉由照射能量線降低其黏著性,藉此而拾取半導體晶片。例如可使用含有能量線聚合性之丙烯酸聚合物之各種黏著劑組成物而形成此種黏著劑層,該能量線聚合性之丙烯酸聚合物會因能量線照射而聚合。 When the adhesive layer contains a component that is polymerized by irradiation with an energy ray, The semiconductor wafer is picked up by illuminating the energy line to reduce its adhesion. For example, such an adhesive layer can be formed using various adhesive compositions containing an energy ray polymerizable acrylic polymer which is polymerized by energy ray irradiation.

較佳之前述黏著劑組成物,可例示含有前述丙烯酸聚合物與能量線聚合性化合物之黏著劑組成物(黏著劑組成物(i))、含有具有羥基且於支鏈具有聚合性基之丙烯酸聚合物(例如具有羥基且經由胺甲酸乙酯鍵結而於支鏈具有聚合性基之丙烯酸聚合物)與異氰酸酯系交聯劑之黏著劑組成物(黏著劑組成物(ii)),更佳為進一步含有溶媒。 The adhesive composition containing the acrylic polymer and the energy ray-polymerizable compound (adhesive composition (i)), and the polymerization of acrylic acid having a hydroxyl group and having a polymerizable group in a branched chain can be exemplified. An adhesive composition (adhesive composition (ii)) having an amino acid (for example, an acrylic polymer having a hydroxyl group and having a polymerizable group in a branched chain bonded via urethane) and an isocyanate crosslinking agent is more preferably Further containing a solvent.

前述黏著劑組成物除了前述成分以外,可進一步含有光聚合起始劑、或染料、顏料、抗劣化劑、抗靜電劑、阻燃劑、聚矽氧化合物、鏈轉移劑等各種添加劑中的任一種。 The above-mentioned adhesive composition may further contain, in addition to the above components, a photopolymerization initiator, or any of various additives such as a dye, a pigment, an anti-deterioration agent, an antistatic agent, a flame retardant, a polyoxymethylene compound, and a chain transfer agent. One.

可根據目的而適當地選擇黏著劑層的厚度,但該厚度較佳為1~100μm,更佳為1~60μm,尤佳為1~30μm。 The thickness of the adhesive layer can be appropriately selected depending on the purpose, but the thickness is preferably from 1 to 100 μm, more preferably from 1 to 60 μm, still more preferably from 1 to 30 μm.

黏著劑組成物例如係藉由調配丙烯酸聚合物等黏著劑層之各種構成成分而獲得。 The adhesive composition is obtained, for example, by blending various constituent components of an adhesive layer such as an acrylic polymer.

調配各成分時的添加順序並無特別限定,亦可同時添加兩種以上之成分。 The order of addition of each component is not particularly limited, and two or more components may be added at the same time.

調配時混合各成分混合之方法並無特別限定,可適當選擇使攪拌子或攪拌葉等旋轉而混合之方法、使用混合機混合之方法、施加超音波混合之方法等公知方法。 The method of mixing the components at the time of mixing is not particularly limited, and a known method such as a method of rotating and mixing a stirring blade or a stirring blade, a method of mixing using a mixer, and a method of applying ultrasonic mixing may be appropriately selected.

只要不使各調配成分劣化,則添加及混合各成分時的溫度及時間並無特別限定,只要適當地進行調節即可,但溫度較佳為15~30℃。 The temperature and time when the components are added and mixed are not particularly limited as long as the respective components are not deteriorated, and the temperature may be appropriately adjusted, but the temperature is preferably 15 to 30 °C.

使用溶媒時,可藉由將溶媒與溶媒以外的任一種調配成分混合並預先稀釋該調配成分而使用,亦可不預先稀釋溶媒以外的任一種調配成分,而是藉由將溶媒與該等調配成分混合而使用。 When a solvent is used, it may be used by mixing any of the solvent and the solvent, and preliminarily diluting the formulation, or by dissolving any of the components other than the solvent, but by dissolving the solvent and the components. Mix and use.

黏著劑層可藉由將黏著劑組成物塗佈至前述支持基材的表面並乾燥而形成。此時,亦可根據需要而對塗佈之黏著劑組成物進行加熱,藉此使其交聯。 The adhesive layer can be formed by applying an adhesive composition to the surface of the aforementioned support substrate and drying. At this time, the applied adhesive composition may be heated as needed to crosslink it.

加熱條件例如可設為100~130℃、1~5分鐘,但並不限定於此。又,將黏著劑組成物塗佈至剝離材料的剝離層表面並乾燥而形成黏著劑層,亦可藉由將黏著劑層貼合於支持基材的表面且除去前述剝離材料而形成黏著劑層。 The heating conditions can be, for example, 100 to 130 ° C for 1 to 5 minutes, but are not limited thereto. Further, the adhesive composition is applied onto the surface of the release layer of the release material and dried to form an adhesive layer, and the adhesive layer may be formed by bonding the adhesive layer to the surface of the support substrate and removing the release material. .

只要利用公知方法將黏著劑組成物塗佈至支持基材的表面或剝離材料的剝離層表面即可,可例示使用氣刀塗佈機、刮刀塗佈機、桿塗佈機、凹板塗佈機、輥塗佈機、輥刀塗佈機、幕簾塗佈機、模具塗佈機、刀塗佈機、網版塗佈機、線棒塗佈機、接觸式塗佈機等各種塗佈機之方法。 The adhesive composition may be applied to the surface of the support substrate or the surface of the release layer of the release material by a known method, and an air knife coater, a knife coater, a bar coater, or a gravure coat may be exemplified. Various coatings such as machine, roll coater, roll coater, curtain coater, die coater, knife coater, screen coater, bar coater, contact coater, etc. Machine method.

<接著劑層> <Binder layer>

接著劑層含有染料。染料與顏料不同,不易於接著劑層中產生凝聚物,因此前述切割晶粒接合片維持高品質。 The layer of the agent then contains a dye. Unlike the pigment, the dye does not easily form agglomerates in the adhesive layer, and thus the above-mentioned cut grain bonded sheet maintains high quality.

可根據目的而適當地選擇接著劑層的厚度,但該厚度較佳為1~100μm,更佳為5~75μm,尤佳為5~50μm。 The thickness of the adhesive layer can be appropriately selected depending on the purpose, but the thickness is preferably from 1 to 100 μm, more preferably from 5 to 75 μm, still more preferably from 5 to 50 μm.

於本實施形態中,與使用顏料作為著色成分之情形不同,即使於接著劑層的厚度例如薄至10μm左右以下時亦可抑制在接著劑層中產生凝聚物,因此可抑制於最終獲得之半導體封裝中產生裂縫。 In the present embodiment, unlike the case where a pigment is used as the coloring component, even when the thickness of the adhesive layer is, for example, about 10 μm or less, generation of aggregates in the adhesive layer can be suppressed, so that the finally obtained semiconductor can be suppressed. Cracks are formed in the package.

接著劑層的顏色只要不與基材(前述黏著基材及非黏著基材)的顏色相同,則並無特別限定,但通常環狀框架膠帶為黑色,故為了容易與該環狀框架膠帶區別,較佳為黑色以外的顏色。其中,基材為白色時,△E處於較佳之範圍,考慮到之前所說明的容易目視確認接著劑層有無存在及狀態,接著劑層較佳為自短波長側向長波長側之藍色~紅色中的任一種顏色之接著劑層,作為此種接著劑層,可例示L*a*b*色彩系統中的L*(明度)為15~97,a*(色度)為-11~+15,且b*(色度)為-30~+5之接著劑層。其中,接著劑層較佳為藍色。 The color of the subsequent layer is not particularly limited as long as it is not the same as the color of the substrate (the above-mentioned adhesive substrate and non-adhesive substrate). However, since the annular frame tape is usually black, it is easy to distinguish from the annular frame tape. It is preferably a color other than black. Wherein, when the substrate is white, ΔE is in a preferable range, and it is easy to visually confirm the presence or absence of the adhesive layer in consideration of the above-described explanation, and the adhesive layer is preferably blue from the short wavelength side to the long wavelength side. The adhesive layer of any one of red colors, as such an adhesive layer, can be exemplified by L * (lightness) of 15 to 97 and a * (chromaticity) of -11~ in the L * a * b * color system. +15, and b * (chroma) is an adhesive layer of -30 to +5. Among them, the adhesive layer is preferably blue.

接著劑層的前述染料之含有量為8.3質量%以下,較 佳為8.1質量%以下。由於為前述範圍,故可抑制因含有染料而引起之弊端。更具體而言,於使用具備如上所述之接著劑層之切割晶粒接合片來製造半導體封裝時,所獲得之半導體封裝係抑制基板及半導體晶片的接合部產生剝離、或產生裂縫(封裝裂縫),且抑制可靠性之降低。又,將前述黏著基材使用於切割晶粒接合片時,可抑制染料自接著劑層轉移至黏著劑層。 The content of the aforementioned dye in the subsequent layer is 8.3% by mass or less. Good is 8.1% by mass or less. Since it is the said range, the malfunction by containing a dye can be suppressed. More specifically, when a semiconductor package is manufactured using a dicing die bond sheet having an adhesive layer as described above, the obtained semiconductor package suppresses peeling or cracking at a joint portion between the substrate and the semiconductor wafer (package crack) ) and suppress the reduction in reliability. Further, when the adhesive substrate is used for cutting a die bond sheet, transfer of the dye from the adhesive layer to the adhesive layer can be suppressed.

只要後述之△E成為目標值,則接著劑層的前述染料含有量的下限值並無特別限定。然而,考慮到易於將△E調節至較佳之範圍,接著劑層的前述染料含有量較佳為0.05質量%以上,更佳為0.07質量%以上,尤佳為0.10質量%以上。 When the ΔE to be described later becomes the target value, the lower limit of the dye content of the adhesive layer is not particularly limited. However, in view of the fact that it is easy to adjust ΔE to a preferable range, the aforementioned dye content of the adhesive layer is preferably 0.05% by mass or more, more preferably 0.07% by mass or more, and still more preferably 0.10% by mass or more.

前述染料只要為可以前述方式對接著劑層著色之染料,則在不影響本發明效果的範圍內並無特別限定,可適當地使用公知染料。 The dye is not particularly limited as long as it is a dye which can color the adhesive layer in the above-described manner, and a known dye can be suitably used.

染料具體可例示偶氮染料、亞硝基染料、喹啉染料、硫化染料、硝基染料、次甲基染料、聚次甲基染料、胺基酮染料、噻唑染料、酮醇染料、二苯乙烯染料、吲達胺染料、靛酚染料、二苯基甲烷染料、蒽醌染料、三芳基甲烷染料、吖嗪染料、靛類染料、二苯并哌喃染料、噁嗪染料、噻嗪染料、酞青染料、吖啶染料等。 The dye may specifically be exemplified by an azo dye, a nitroso dye, a quinoline dye, a sulfur dye, a nitro dye, a methine dye, a polymethine dye, an aminoketone dye, a thiazole dye, a ketol dye, and a stilbene. Dyes, indamine dyes, indophenol dyes, diphenylmethane dyes, anthraquinone dyes, triarylmethane dyes, azine dyes, anthraquinone dyes, dibenzopyran dyes, oxazine dyes, thiazine dyes, hydrazines Cyan dye, acridine dye, etc.

前述染料亦可為水溶性染料及非水溶性染料中的任一種,但較佳為非水溶性染料,更佳為油溶性染料。 The dye may be any of a water-soluble dye and a water-insoluble dye, but is preferably a water-insoluble dye, more preferably an oil-soluble dye.

考慮到容易獲取且易於將接著劑層調節為目標特性,前述染料較佳為具有偶氮基(-N=N-)之偶氮染料。 The dye is preferably an azo dye having an azo group (-N=N-) in view of easy availability and easy adjustment of the adhesive layer to a target property.

根據一個分子中所具有之偶氮基個數,前述偶氮染料亦可為單偶氮染料、雙偶氮染料、三偶氮染料、四偶氮染料及多偶氮染料(一個分子中所具有之偶氮基的個數為5以上之染料)中的任一種染料,但考慮到易於形成構造較剛直、耐熱性更高且特性良好之接著劑層,較佳為雙偶氮染料。 The azo dye may also be a monoazo dye, a disazo dye, a trisazo dye, a tetrazo dye, and a polyazo dye (based on one molecule) depending on the number of azo groups in a molecule. Any one of the dyes having a number of azo groups of 5 or more is preferable, and a bisazo dye is preferable in view of facilitating formation of an adhesive layer which is relatively rigid in structure, high in heat resistance, and excellent in characteristics.

考慮到進一步提高如上所述之半導體封裝的可靠性且可使接著劑層維持低導電性,前述染料較佳為構造中不包含金屬原子或金屬離子。 In view of further improving the reliability of the semiconductor package as described above and maintaining the adhesive layer with low conductivity, the dye is preferably such that the structure does not contain metal atoms or metal ions.

前述基材與前述接著劑層之間的L*a*b*色彩系統中的色差(△E)為30~53,較佳為31~52,更佳為32~52。 The color difference (ΔE) in the L * a * b * color system between the substrate and the adhesive layer is 30 to 53, preferably 31 to 52, more preferably 32 to 52.

由於△E處於前述範圍內,故容易目視確認之前所說明的接著劑層之有無存在及狀態。 Since ΔE is in the above range, it is easy to visually confirm the presence or absence of the adhesive layer described above.

更具體而言,分別算出基材與接著劑層之L*、a*、b*,並根據下述式(I)算出△E。 More specifically, L * , a * , and b * of the base material and the adhesive layer were respectively calculated, and ΔE was calculated from the following formula (I).

△E=[(L1*-L2*)2+(a1*-a2*)2+(b1*-b2*) 2]1/2‧‧‧‧(I) △E=[(L1 * -L2 * ) 2 +(a1 * -a2 * ) 2 +(b1 * -b2 * ) 2 ] 1/2 ‧‧‧‧(I)

(式中,L1*為基材的L*的值,L2*為接著劑層的L*的值,a1*為基材的a*的值,a2*為接著劑層的a*的值,b1*為基材的b*的值,b2*為接著劑層的b*的值。) (In the formula, L1 * L * value of the substrate, L2 * L * value of the adhesive layer, a1 * is the base value of a *, a2 * is the adhesive layer of a * value, B1 * is the value of b * of the substrate, and b2 * is the value of b * of the adhesive layer.)

接著劑層較佳為具有感壓接著性或加熱硬化性,更佳為同時具有感壓接著性及加熱硬化性。同時具有感壓接著性及加熱硬化性之接著劑層係可於未硬化狀態下藉由輕按而貼附於各種被黏附體。又,接著劑層亦可藉由加熱軟化而貼附於各種被黏附體。接著劑層經由熱硬化而最終成為耐衝擊性高之硬化物,該硬化物的剪切強度優異,即使於嚴格的高溫、高濕度條件下亦可保持充分的接著特性。 The subsequent layer preferably has pressure-sensitive adhesiveness or heat-hardening property, and more preferably has pressure-sensitive adhesiveness and heat curability. At the same time, the adhesive layer having pressure-sensitive adhesiveness and heat-hardening property can be attached to various adherends by light pressing in an uncured state. Further, the adhesive layer may be attached to various adherends by softening by heating. The subsequent agent layer is finally cured into a cured product having high impact resistance by thermal curing, and the cured product is excellent in shear strength, and can maintain sufficient adhesive properties even under severe high temperature and high humidity conditions.

[接著劑組成物] [Binder composition]

可使用含有前述染料等接著劑層之構成成分之接著劑組成物而形成接著劑層,接著劑組成物中的非揮發性成分彼此的含有量比率於接著劑層中亦相同。 The adhesive composition may be formed by using an adhesive composition containing a constituent component of the adhesive layer such as the above-mentioned dye, and the content ratio of the nonvolatile components in the adhesive composition to the adhesive layer is also the same.

接著劑層較佳為使用含有黏合劑樹脂(a)、環氧系熱固性樹脂(b)及前述染料(以下記載為「染料(s)」)之接著劑組成物而形成。 The adhesive layer is preferably formed using an adhesive composition containing a binder resin (a), an epoxy thermosetting resin (b), and the above dye (hereinafter referred to as "dye (s)").

(黏合劑樹脂(a)) (Binder resin (a))

黏合劑樹脂(a)為使接著劑層具有造膜性及可撓性之聚合物化合物。 The binder resin (a) is a polymer compound having a film forming property and flexibility in an adhesive layer.

黏合劑樹脂(a)可單獨使用一種,亦可併用兩種以上。 The binder resin (a) may be used alone or in combination of two or more.

黏合劑樹脂(a)可使用丙烯酸系樹脂、聚酯樹脂、胺甲酸乙酯樹脂、丙烯酸胺甲酸乙酯樹脂、聚矽氧樹脂、橡膠系聚合物、苯氧基樹脂等,較佳為丙烯酸系樹脂。 As the binder resin (a), an acrylic resin, a polyester resin, a urethane resin, an urethane acrylate resin, a polyoxyxylene resin, a rubber-based polymer, a phenoxy resin or the like can be used, and an acrylic resin is preferable. Resin.

前述丙烯酸系樹脂可使用公知的丙烯酸聚合物。 A well-known acrylic polymer can be used for the said acrylic resin.

丙烯酸系樹脂的重量平均分子量(Mw)較佳為10000~2000000,更佳為100000~1500000。若丙烯酸系樹脂的重量平均分子量過小,則接著劑層與黏著劑層之接著力升高,會產生半導體晶片的拾取不良。又,若丙烯酸系樹脂的重量平均分子量過大,則接著劑層無法密貼於被黏附體的凹凸面,而成為產生孔洞等的主因。 The weight average molecular weight (Mw) of the acrylic resin is preferably from 10,000 to 2,000,000, more preferably from 100,000 to 1,500,000. If the weight average molecular weight of the acrylic resin is too small, the adhesion between the adhesive layer and the adhesive layer is increased, and pickup failure of the semiconductor wafer occurs. In addition, when the weight average molecular weight of the acrylic resin is too large, the adhesive layer cannot adhere to the uneven surface of the adherend, and it is a main cause of occurrence of voids and the like.

再者,於本說明書中,只要無特別說明,重量平均分子量係指藉由凝膠滲透層析法(GPC;gel permeation chromatography)法而測定之聚苯乙烯換算值。 In the present specification, the weight average molecular weight means a polystyrene-converted value measured by a gel permeation chromatography (GPC) unless otherwise specified.

丙烯酸系樹脂的玻璃轉移溫度(Tg)較佳為-60~70℃,更佳為-30~50℃。若丙烯酸系樹脂的Tg過低,則接著劑層與黏著劑層之剝離力增大,會引起半導體晶片的拾取不良。又,若丙烯酸系樹脂的Tg過高,則固定半導體晶圓之接著力有不充分之虞。 The glass transition temperature (Tg) of the acrylic resin is preferably -60 to 70 ° C, more preferably -30 to 50 ° C. When the Tg of the acrylic resin is too low, the peeling force of the adhesive layer and the adhesive layer is increased to cause pickup failure of the semiconductor wafer. Moreover, if the Tg of the acrylic resin is too high, the adhesion force for fixing the semiconductor wafer may be insufficient.

構成丙烯酸系樹脂之單體可例示:(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸丙酯、(甲基)丙烯酸丁酯、(甲基)丙烯酸2-乙基己酯等烷基的碳數為1~18之(甲基)丙烯酸烷酯;(甲基)丙烯酸環烷酯、(甲基)丙烯酸苄酯、(甲基)丙烯酸異冰片酯、(甲基)丙烯酸二環戊酯、(甲基)丙烯酸二環戊烯酯、(甲基)丙烯酸二環戊烯氧乙酯、(甲基)丙烯酸醯亞胺酯等具有環狀骨架之(甲基)丙烯酸酯;(甲基)丙烯酸羥甲酯、(甲基)丙烯酸2-羥乙酯、(甲基)丙烯酸2-羥丙酯等含有烴基之(甲基)丙烯酸酯;(甲基)丙烯酸縮水甘油酯等含有縮水甘油基之(甲基)丙烯酸酯等的(甲基)丙烯酸酯。 Examples of the monomer constituting the acrylic resin include methyl (meth)acrylate, ethyl (meth)acrylate, propyl (meth)acrylate, butyl (meth)acrylate, and 2-ethyl (meth)acrylate. An alkyl (meth) acrylate having an alkyl group such as a hexyl hexyl ester; a cycloalkyl (meth) acrylate, a benzyl (meth) acrylate, an isobornyl (meth) acrylate, (a) a group having a cyclic skeleton such as dicyclopentanyl acrylate, dicyclopentenyl (meth) acrylate, dicyclopentenyloxy (meth) acrylate, or urethane (meth) acrylate. Acrylate; hydroxymethyl (meth) acrylate, 2-hydroxyethyl (meth) acrylate, 2-hydroxypropyl (meth) acrylate, etc. (meth) acrylate containing a hydrocarbon group; (meth) acrylate A (meth) acrylate such as a glycidyl group-containing (meth) acrylate such as glycidyl ester.

又,丙烯酸系樹脂亦可為由丙烯酸、甲基丙烯酸、亞甲基丁二酸、乙酸乙烯酯、丙烯腈、苯乙烯、N-羥甲基丙烯醯胺等單體共聚而成之樹脂。 Further, the acrylic resin may be a resin obtained by copolymerizing a monomer such as acrylic acid, methacrylic acid, methylene succinic acid, vinyl acetate, acrylonitrile, styrene or N-methylol acrylamide.

構成丙烯酸系樹脂之單體可僅為一種,亦可為兩種以上。 The monomer constituting the acrylic resin may be one type or two or more types.

再者,於本說明書中,「(甲基)丙烯酸」為包含「丙烯酸」及「甲基丙烯酸」兩者之概念,「(甲基)丙烯酸酯」為包含「丙烯酸酯」及「甲基丙烯酸酯」兩者之概念。 In addition, in the present specification, "(meth)acrylic acid" is a concept including both "acrylic acid" and "methacrylic acid", and "(meth)acrylate" includes "acrylic acid ester" and "methacrylic acid". Ester" the concept of both.

丙烯酸系樹脂亦可具有乙烯基、(甲基)丙烯醯基、胺基、羥基、羧基、異氰酸酯基等可與其他化合物鍵結之官能基。可經由後述之交聯劑(f)而與其他化合物鍵結, 或亦可不經由交聯劑(f)而由前述官能基直接與其他化合物鍵結。丙烯酸系樹脂係藉由前述官能基而進行鍵結,藉此,使用前述切割晶粒接合片之半導體封裝的可靠性有提高之傾向。 The acrylic resin may have a functional group which may be bonded to another compound such as a vinyl group, a (meth) acrylonitrile group, an amine group, a hydroxyl group, a carboxyl group or an isocyanate group. It can be bonded to other compounds via a crosslinking agent (f) described later. Alternatively, the aforementioned functional groups may be directly bonded to other compounds without passing through the crosslinking agent (f). The acrylic resin is bonded by the above-described functional groups, whereby the reliability of the semiconductor package using the above-described diced die bonding sheet tends to be improved.

接著劑組成物的固體成分中,丙烯酸系樹脂之含有量較佳為50質量%以上。藉此,將接著劑層使用於半導體晶片之樹脂密封時的批次硬化製程時,接著劑層成為較佳之性狀。其原因在於:前述製程中,在對半導體晶片進行樹脂密封之前係對晶片進行引線接合(wire bonding),但硬化前的接著劑層暴露於高溫時仍可確保一定程度的硬度,而可在此狀態進行引線接合。即,若接著劑組成物中的丙烯酸系樹脂之含有量較多,則於熱硬化前亦可提高接著劑層的貯藏彈性率。因此,即使於接著劑層未硬化或半硬化之狀態下亦可抑制引線接合時的晶片之振動、移位,故可穩定地進行引線接合。 In the solid content of the composition of the second embodiment, the content of the acrylic resin is preferably 50% by mass or more. Thereby, when the adhesive layer is used in the batch hardening process at the time of resin sealing of a semiconductor wafer, an adhesive layer becomes a preferable property. The reason for this is that in the above process, the wafer is subjected to wire bonding before the semiconductor wafer is resin-sealed, but the adhesive layer before curing is exposed to a high temperature to ensure a certain degree of hardness. The state is wire bonded. That is, when the content of the acrylic resin in the adhesive composition is large, the storage modulus of the adhesive layer can be improved before thermal curing. Therefore, even when the adhesive layer is not cured or semi-hardened, the vibration and displacement of the wafer during wire bonding can be suppressed, so that wire bonding can be stably performed.

而且,接著劑組成物的固體成分中,丙烯酸系樹脂之含有量更佳為50~85質量%。若丙烯酸系樹脂之含有量為前述範圍,則提高半導體晶片的易拾取性。 Further, in the solid content of the adhesive composition, the content of the acrylic resin is more preferably from 50 to 85% by mass. When the content of the acrylic resin is in the above range, the pick-up property of the semiconductor wafer is improved.

於本發明中,為了提高接著劑層的剝離性並提高易拾取性,或藉由使接著劑層密貼於被黏附體的凹凸面而抑制產生孔洞等,(a)黏合劑樹脂可單獨使用丙烯酸系樹脂以外的熱塑性樹脂(以下僅簡記為「熱塑性樹脂」),亦 可與丙烯酸系樹脂一併使用。 In the present invention, in order to improve the peelability of the adhesive layer and to improve the pick-up property, or to prevent the occurrence of voids or the like by adhering the adhesive layer to the uneven surface of the adherend, (a) the adhesive resin may be used alone. A thermoplastic resin other than an acrylic resin (hereinafter simply referred to as "thermoplastic resin"), It can be used together with acrylic resin.

前述熱塑性樹脂較佳係重量平均分子量為1000~100000,更佳係重量平均分子量為3000~80000。 The thermoplastic resin preferably has a weight average molecular weight of from 1,000 to 100,000, more preferably a weight average molecular weight of from 3,000 to 80,000.

前述熱塑性樹脂的玻璃轉移溫度(Tg)較佳為-30~150℃,更佳為-20~120℃。 The glass transition temperature (Tg) of the thermoplastic resin is preferably from -30 to 150 ° C, more preferably from -20 to 120 ° C.

前述熱塑性樹脂可例示聚酯樹脂、胺甲酸乙酯樹脂、苯氧基樹脂、聚丁烯、聚丁二烯、聚苯乙烯等。 The thermoplastic resin may, for example, be a polyester resin, a urethane resin, a phenoxy resin, polybutene, polybutadiene, polystyrene or the like.

前述熱塑性樹脂可單獨使用一種,亦可併用兩種以上。 The above thermoplastic resins may be used alone or in combination of two or more.

藉由使用前述熱塑性樹脂可獲得如上所述之效果,但另一方面,硬化前的接著劑層暴露於高溫時之硬度會降低,在未硬化或半硬化狀態下,接著劑層的引線接合適性有降低之虞。因此,較佳為考慮前述影響之後再設定接著劑組成物的丙烯酸系樹脂之含有量。 The effect as described above can be obtained by using the aforementioned thermoplastic resin, but on the other hand, the hardness of the adhesive layer before curing is lowered at a high temperature, and the wire bonding suitability of the adhesive layer is in an unhardened or semi-hardened state. There is a reduction in ambiguity. Therefore, it is preferable to set the content of the acrylic resin of the adhesive composition after considering the above influence.

(環氧系熱固性樹脂(b)) (epoxy thermosetting resin (b))

環氧系熱固性樹脂(b)包含環氧樹脂及熱硬化劑。 The epoxy thermosetting resin (b) contains an epoxy resin and a thermosetting agent.

環氧系熱固性樹脂(b)可單獨使用一種,亦可併用兩種以上。 The epoxy-based thermosetting resin (b) may be used alone or in combination of two or more.

前述環氧樹脂可列舉公知環氧樹脂,具體而言可例示多官能系環氧樹脂、聯苯化合物、雙酚A二縮水甘油醚及其氫化物、鄰甲酚酚醛清漆環氧樹脂、二環戊二烯型環 氧樹脂、聯苯型環氧樹脂、雙酚A型環氧樹脂、雙酚F型環氧樹脂、伸苯基骨架型環氧樹脂等2官能以上之環氧化合物。 The epoxy resin may, for example, be a known epoxy resin, and specific examples thereof include a polyfunctional epoxy resin, a biphenyl compound, a bisphenol A diglycidyl ether and a hydrogenated product thereof, an o-cresol novolac epoxy resin, and a bicyclic ring. Pentadiene ring A bifunctional or higher epoxy compound such as an oxygen resin, a biphenyl type epoxy resin, a bisphenol A type epoxy resin, a bisphenol F type epoxy resin, or a phenyl skeleton type epoxy resin.

又,前述環氧樹脂亦可使用具有不飽和烴基之環氧樹脂。作為具有不飽和烴基之環氧樹脂,可例示將多官能系環氧樹脂的環氧樹脂一部分改為包含不飽和烴基之基而成的化合物。前述化合物係例如可藉由丙烯酸與環氧基之加成反應來製造。又,作為具有不飽和烴基之環氧樹脂,可例示由包含不飽和烴基之基直接鍵結於構成環氧樹脂之芳香環等而成的化合物等。不飽和烴基為具有聚合性之不飽和基,具體而言可例示乙烯基(vinyl group)、2-丙烯基(丙烯基)、丙烯醯基、甲基丙烯醯基、丙烯醯胺基、甲基丙烯醯胺基等,較佳為丙烯醯基。 Further, as the epoxy resin, an epoxy resin having an unsaturated hydrocarbon group can also be used. The epoxy resin having an unsaturated hydrocarbon group may be a compound obtained by changing a part of the epoxy resin of the polyfunctional epoxy resin to a group containing an unsaturated hydrocarbon group. The above compound can be produced, for example, by an addition reaction of acrylic acid and an epoxy group. In addition, as the epoxy resin having an unsaturated hydrocarbon group, a compound obtained by directly bonding a group containing an unsaturated hydrocarbon group to an aromatic ring constituting an epoxy resin or the like can be exemplified. The unsaturated hydrocarbon group is a polymerizable unsaturated group, and specifically, a vinyl group, a 2-propenyl (propylene group), an acryl fluorenyl group, a methacryl fluorenyl group, an acrylamide group, a methyl group can be exemplified. The acrylamide group or the like is preferably an acrylonitrile group.

與不具有不飽和烴基之環氧樹脂相比,具有不飽和烴基之環氧樹脂與丙烯酸系樹脂之間的相溶性更高。因此,藉由使用包含具有不飽和烴基之環氧樹脂之接著劑組成物,可提高半導體裝置的封裝可靠性。 The compatibility between the epoxy resin having an unsaturated hydrocarbon group and the acrylic resin is higher than that of the epoxy resin having no unsaturated hydrocarbon group. Therefore, the packaging reliability of the semiconductor device can be improved by using an adhesive composition containing an epoxy resin having an unsaturated hydrocarbon group.

考慮到提高易拾取性,前述環氧樹脂較佳係軟化點或玻璃轉移溫度較高。 The epoxy resin is preferably a softening point or a glass transition temperature higher in view of improving the pick-up property.

前述環氧樹脂的數量平均分子量並無特別限定,但從接著劑層的硬化性或硬化後之強度及耐熱性之觀點來 看,較佳為300~30000,更佳為400~10000,尤佳為500~3000。 The number average molecular weight of the epoxy resin is not particularly limited, but from the viewpoints of the hardenability of the adhesive layer or the strength and heat resistance after curing. Look, preferably 300~30000, more preferably 400~10000, especially 500~3000.

前述環氧樹脂的環氧當量較佳為100~1000g/eq,更佳為300~800g/eq。 The epoxy resin preferably has an epoxy equivalent of from 100 to 1000 g/eq, more preferably from 300 to 800 g/eq.

前述環氧樹脂可單獨使用一種,亦可併用兩種以上。 These epoxy resins may be used alone or in combination of two or more.

前述熱硬化劑的功能係環氧樹脂硬化之硬化劑。 The function of the aforementioned heat hardener is a hardener for hardening an epoxy resin.

熱硬化劑可例示一個分子中具有兩個以上可與環氧基反應的官能基之化合物。前述官能基可例示酚性羥基、醇性羥基、胺基、羧基、酸基酐化而成之基等,較佳為酚性羥基、胺基、酸基酐化而成之基,更佳為酚性羥基、胺基,尤佳為酚性羥基。 The thermosetting agent can be exemplified by a compound having two or more functional groups reactive with an epoxy group in one molecule. The functional group may, for example, be a phenolic hydroxyl group, an alcoholic hydroxyl group, an amine group, a carboxyl group or an acid group, and is preferably a phenolic hydroxyl group, an amine group or an acid group. A phenolic hydroxyl group or an amine group is particularly preferably a phenolic hydroxyl group.

前述熱硬化劑中的酚系硬化劑(具有酚性羥基之硬化劑)可例示多官能酚樹脂、聯苯酚、酚醛清漆型酚樹脂、二環戊二烯系酚樹脂、芳烷基酚樹脂等。 The phenolic curing agent (hardener having a phenolic hydroxyl group) in the above-mentioned thermosetting agent may, for example, be a polyfunctional phenol resin, a biphenol, a novolak type phenol resin, a dicyclopentadiene type phenol resin, or an aralkyl phenol resin. .

前述熱硬化劑中的胺系硬化劑(具有胺基之硬化劑)可例示DICY(雙氰胺)等。 The amine-based curing agent (hardening agent having an amine group) in the above-mentioned thermosetting agent can be exemplified by DICY (dicyandiamide) or the like.

前述熱硬化劑亦可具有不飽和烴基。 The aforementioned thermal hardener may also have an unsaturated hydrocarbon group.

作為具有不飽和烴基之熱硬化劑,可例示由包含不飽和烴基之基取代酚樹脂的一部分羥基而成之化合物、由包含不飽和烴基之基直接鍵結於酚樹脂的芳香環而成之化 合物等。熱硬化劑中的不飽和烴基與前述具有不飽和烴基之環氧樹脂中的不飽和烴基相同。 The thermosetting agent having an unsaturated hydrocarbon group may, for example, be a compound obtained by substituting a part of a hydroxyl group of a phenol resin containing a group of an unsaturated hydrocarbon group, or an aromatic ring directly bonded to a phenol resin by a group containing an unsaturated hydrocarbon group. Compounds, etc. The unsaturated hydrocarbon group in the heat hardener is the same as the unsaturated hydrocarbon group in the above epoxy resin having an unsaturated hydrocarbon group.

考慮到提高易拾取性,前述熱硬化劑較佳係軟化點或玻璃轉移溫度較高。 In view of improving the pick-up property, the aforementioned heat hardener is preferably a softening point or a glass transition temperature.

前述熱硬化劑的數量平均分子量較佳為300~30000,更佳為400~10000,尤佳為500~3000。 The number average molecular weight of the above-mentioned thermosetting agent is preferably from 300 to 30,000, more preferably from 400 to 10,000, still more preferably from 500 to 3,000.

前述熱硬化劑可單獨使用一種,亦可併用兩種以上。 These thermosetting agents may be used alone or in combination of two or more.

接著劑組成物的熱硬化劑之含有量相對於前述環氧樹脂之含有量100質量份,較佳為0.1~500質量份,更佳為1~200質量份。若熱硬化劑之含有量過少,則會因硬化不足而無法獲得接著性,若熱硬化劑之含有量過剩,則接著劑層的吸濕率升高而會使封裝可靠性降低。 The content of the thermal curing agent in the composition of the second embodiment is preferably from 0.1 to 500 parts by mass, more preferably from 1 to 200 parts by mass, per 100 parts by mass of the epoxy resin. When the content of the thermosetting agent is too small, the adhesion cannot be obtained due to insufficient curing, and if the content of the thermosetting agent is excessive, the moisture absorption rate of the adhesive layer is increased to lower the package reliability.

接著劑組成物的環氧系熱固性樹脂(b)之含有量(環氧樹脂及熱硬化劑的總含有量)相對於黏合劑樹脂(a)100質量份,較佳為1~100質量份,更佳為1.5~75質量份,尤佳為2~60質量份。由於環氧系熱固性樹脂(b)之含有量為前述範圍,故有維持硬化前的接著劑層的硬度之傾向,未硬化或半硬化狀態之接著劑層的引線接合適性提高。又,半導體晶片的易拾取性提高。 The content of the epoxy-based thermosetting resin (b) (the total content of the epoxy resin and the thermosetting agent) of the adhesive composition is preferably from 1 to 100 parts by mass based on 100 parts by mass of the binder resin (a). More preferably, it is 1.5 to 75 parts by mass, and particularly preferably 2 to 60 parts by mass. Since the content of the epoxy-based thermosetting resin (b) is in the above range, the hardness of the adhesive layer before curing is maintained, and the adhesion of the adhesive layer in the unhardened or semi-cured state is improved. Moreover, the easy pick-up property of the semiconductor wafer is improved.

(染料(s)) (dye(s))

染料(s)係之前所說明。 The dye (s) is as previously described.

接著劑組成物的固體成分中的染料(s)之含有量較佳為與之前所說明的接著劑層的染料之含有量相同。 The content of the dye (s) in the solid content of the subsequent composition is preferably the same as the dye content of the adhesive layer described above.

為了改良接著劑層的各種物性,亦可使用接著劑組成物來形成接著劑層,該接著劑組成物除了含有黏合劑樹脂(a)、環氧系熱固性樹脂(b)及染料(s)以外,更根據需要而含有前述成分以外之其他成分。 In order to improve various physical properties of the adhesive layer, an adhesive composition may be used to form an adhesive layer which contains a binder resin (a), an epoxy thermosetting resin (b), and a dye (s). Further, other ingredients than the aforementioned ingredients are contained as needed.

接著劑組成物所含有的其他成分較佳可例示無機填充材料(c)、硬化促進劑(d)、耦合劑(e)、交聯劑(f)、環氧系熱固性樹脂(b)以外之其他熱固性樹脂(g)、通用添加劑(h)等。 The other components contained in the composition of the second embodiment are preferably an inorganic filler (c), a curing accelerator (d), a coupling agent (e), a crosslinking agent (f), or an epoxy thermosetting resin (b). Other thermosetting resins (g), general additives (h), and the like.

(無機填充材料(c)) (Inorganic Filling Material (c))

接著劑組成物係藉由進一步含有無機填充材料(c)而容易調整其熱膨脹係數,針對半導體晶片或金屬或者有機基板而將硬化後的接著劑層的熱膨脹係數最佳化,藉此可提高封裝可靠性。 The subsequent composition is easy to adjust the thermal expansion coefficient by further containing the inorganic filler (c), and the thermal expansion coefficient of the cured adhesive layer is optimized for the semiconductor wafer or the metal or the organic substrate, thereby improving the package. reliability.

又,接著劑組成物係藉由進一步含有無機填充材料(c)而可減低硬化後接著劑層的吸濕率。 Further, the adhesive composition can reduce the moisture absorption rate of the adhesive layer after curing by further containing the inorganic filler (c).

作為較佳之無機填充材料(c),可例示:二氧化矽、 氧化鋁、滑石、碳酸鈣、鈦白、鐵丹、碳化矽、氮化硼等的粉末;使前述二氧化矽等球形化所得之珠粒;前述二氧化矽等的表面改質物;前述二氧化矽等的單晶纖維;玻璃纖維等。 As a preferred inorganic filler (c), cerium oxide, a powder of alumina, talc, calcium carbonate, titanium white, iron oxide, tantalum carbide, boron nitride or the like; beads obtained by spheroidizing the above-mentioned cerium oxide; surface modification of the above-mentioned cerium oxide; Single crystal fiber such as enamel; glass fiber, and the like.

其中,無機填充材料(c)較佳為二氧化矽填料、氧化鋁填料或該等材料的表面改質物。 Among them, the inorganic filler (c) is preferably a cerium oxide filler, an alumina filler or a surface modification of the materials.

無機填充材料(c)可單獨使用一種,亦可併用兩種以上。 The inorganic filler (c) may be used alone or in combination of two or more.

使用無機填充材料(c)時,接著劑組成物的固體成分中的無機填充材料(c)之含有量較佳為1~80質量%。 When the inorganic filler (c) is used, the content of the inorganic filler (c) in the solid content of the adhesive composition is preferably from 1 to 80% by mass.

(硬化促進劑(d)) (hardening accelerator (d))

硬化促進劑(d)係用於調整接著劑組成物的硬化速度。 The hardening accelerator (d) is used to adjust the hardening speed of the adhesive composition.

較佳之硬化促進劑(d)可例示:三伸乙二胺、苄基二甲胺、三乙醇胺、二甲基胺基乙醇、三(二甲胺甲基)苯酚等三級胺;2-甲基咪唑、2-苯基咪唑、2-苯基-4-甲基咪唑、2-苯基-4,5-二羥基甲基咪唑、2-苯基-4-甲基-5-羥基甲基咪唑等咪唑類(一個以上的氫原子被氫原子以外的基取代而成之咪唑);三丁基膦、二苯基膦、三苯基膦等有機膦(一個以上的氫原子被有機基取代而成之膦);四苯基硼四苯基膦、四苯基硼三苯基膦等四苯基硼鹽等。 Preferred hardening accelerators (d) are exemplified by tertiary amines such as triethylenediamine, benzyldimethylamine, triethanolamine, dimethylaminoethanol, and tris(dimethylaminomethyl)phenol; Imidazole, 2-phenylimidazole, 2-phenyl-4-methylimidazole, 2-phenyl-4,5-dihydroxymethylimidazole, 2-phenyl-4-methyl-5-hydroxymethyl An imidazole such as imidazole (an imidazole in which one or more hydrogen atoms are substituted by a group other than a hydrogen atom); an organic phosphine such as tributylphosphine, diphenylphosphine or triphenylphosphine (one or more hydrogen atoms are replaced by an organic group) a phosphine formed; tetraphenylboron such as tetraphenylboron tetraphenylphosphine or tetraphenylboron triphenylphosphine.

硬化促進劑(d)可單獨使用一種,亦可併用兩種以 上。 The hardening accelerator (d) may be used singly or in combination of two on.

使用硬化促進劑(d)時,接著劑組成物中的硬化促進劑(d)之含有量相對於環氧系熱固性樹脂(b)之含有量100質量份,較佳為0.01~10質量份,更佳為0.1~1質量份。藉由使硬化促進劑(d)之含有量為前述範圍,而接著劑層即使於高溫、高濕度條件下仍具有優異接著特性,即使暴露於嚴格的回焊條件時,仍可達成高封裝可靠性。若硬化促進劑(d)之含有量過少,則無法充分獲得使用硬化促進劑(d)而產生之效果,若硬化促進劑(d)之含有量過剩,則高極性之硬化促進劑(d)於高溫、高濕度條件下會在接著劑層中向與被黏附體之接著界面側移動而偏析,因此使封裝可靠性降低。 When the curing accelerator (d) is used, the content of the curing accelerator (d) in the adhesive composition is preferably 0.01 to 10 parts by mass based on 100 parts by mass of the epoxy-based thermosetting resin (b). More preferably, it is 0.1 to 1 part by mass. By setting the content of the hardening accelerator (d) to the above range, the adhesive layer has excellent adhesion characteristics even under high temperature and high humidity conditions, and high package reliability can be achieved even when exposed to strict reflow conditions. Sex. When the content of the hardening accelerator (d) is too small, the effect of using the curing accelerator (d) cannot be sufficiently obtained, and if the content of the curing accelerator (d) is excessive, the high-polarity hardening accelerator (d) Under high temperature and high humidity conditions, it will be segregated in the adhesive layer toward the interface side of the adherend, thereby deteriorating the package reliability.

(耦合劑(e)) (Coupling agent (e))

耦合劑(e)係具有與無機化合物發生反應之官能基及與有機官能基發生反應之官能基,藉由使用耦合劑(e)可使接著劑層對於被黏附體之接著性及密著性提高。又,藉由使用耦合劑(e)而可使接著劑層硬化所得之硬化物在不損及耐熱性的情況下提高耐水性。 The coupling agent (e) has a functional group reactive with an inorganic compound and a functional group reactive with the organic functional group, and the adhesion and adhesion of the adhesive layer to the adherend can be achieved by using the coupling agent (e). improve. Further, the cured product obtained by curing the adhesive layer by using the coupling agent (e) can improve the water resistance without impairing the heat resistance.

耦合劑(e)較佳為具有與黏合劑樹脂(a)、環氧系熱固性樹脂(b)等所具有官能基反應之官能基之化合物,較佳為矽烷耦合劑。 The coupling agent (e) is preferably a compound having a functional group reactive with a functional group having a binder resin (a) or an epoxy thermosetting resin (b), and is preferably a decane coupling agent.

較佳之前述矽烷耦合劑可例示γ-縮水甘油氧基丙基三甲氧基矽烷、γ-縮水甘油氧基丙基甲基二乙氧基矽烷、β-(3,4-環氧基環己基)乙基三甲氧基矽烷、γ-(甲基丙烯醯氧基丙基)三甲氧基矽烷、γ-胺基丙基三甲氧基矽烷、N-6-(胺乙基)-γ-胺基丙基三甲氧基矽烷、N-6-(胺乙基)-γ-胺基丙基甲基二乙氧基矽烷、N-苯基-γ-胺基丙基三甲氧基矽烷、γ-脲基丙基三乙氧基矽烷、γ-巰基丙基三甲氧基矽烷、γ-巰基丙基甲基二甲氧基矽烷、雙(3-三乙氧基矽基丙基)四硫烷、甲基三甲氧基矽烷、甲基三乙氧基矽烷、乙烯基三甲氧基矽烷、乙烯基三乙醯氧基矽烷、咪唑矽烷等。 Preferably, the aforementioned decane coupling agent is exemplified by γ-glycidoxypropyltrimethoxydecane, γ-glycidoxypropylmethyldiethoxydecane, and β-(3,4-epoxycyclohexyl). Ethyltrimethoxydecane, γ-(methacryloxypropyl)trimethoxydecane, γ-aminopropyltrimethoxydecane, N-6-(aminoethyl)-γ-aminopropyl Trimethoxy decane, N-6-(aminoethyl)-γ-aminopropylmethyldiethoxydecane, N-phenyl-γ-aminopropyltrimethoxydecane, γ-ureido Propyltriethoxydecane, γ-mercaptopropyltrimethoxydecane, γ-mercaptopropylmethyldimethoxydecane, bis(3-triethoxydecylpropyl)tetrasulfane, methyl Trimethoxy decane, methyl triethoxy decane, vinyl trimethoxy decane, vinyl triethoxy decane, imidazolium, and the like.

耦合劑(e)可單獨使用一種,亦可併用兩種以上。 The coupling agent (e) may be used alone or in combination of two or more.

使用耦合劑(e)時,接著劑組成物的耦合劑(e)之含有量相對於黏合劑樹脂(a)及環氧系熱固性樹脂(b)的總含有量100質量份,較佳為0.03~20質量份,更佳為0.05~10質量份,尤佳為0.1~5質量份。若耦合劑(e)之含有量過少,則無法獲得使用耦合劑(e)之前述效果,若耦合劑(e)之含有量過多,則有可能會產生釋氣。 When the coupling agent (e) is used, the content of the coupling agent (e) of the adhesive composition is preferably 100 parts by mass based on 100 parts by mass of the total of the binder resin (a) and the epoxy-based thermosetting resin (b). ~20 parts by mass, more preferably 0.05 to 10 parts by mass, particularly preferably 0.1 to 5 parts by mass. If the content of the coupling agent (e) is too small, the above-described effect of using the coupling agent (e) cannot be obtained, and if the content of the coupling agent (e) is too large, outgassing may occur.

(交聯劑(f)) (crosslinking agent (f))

使用具有異氰酸酯基等可與其他化合物鍵結的官能基之前述丙烯酸系樹脂而作為黏合劑樹脂(a)時,可使用交聯劑(f)來使該官能基與其他化合物鍵結而交聯。 藉由使用交聯劑(f)交聯而可調節接著劑層的初始接著力及凝聚力。 When the acrylic resin having a functional group capable of bonding with another compound such as an isocyanate group is used as the binder resin (a), the crosslinking group (f) can be used to bond and crosslink the functional group with other compounds. . The initial adhesion and cohesive force of the adhesive layer can be adjusted by crosslinking with a crosslinking agent (f).

交聯劑(f)可例示有機多元異氰酸酯化合物、有機多元亞胺化合物等。 The crosslinking agent (f) can be exemplified by an organic polyvalent isocyanate compound, an organic polyimine compound, and the like.

作為前述有機多元異氰酸酯化合物,可例示芳香族多元異氰酸酯化合物、脂肪族多元異氰酸酯化合物、脂環族多元異氰酸酯化合物以及該等化合物的三聚物、異氰尿酸酯化物及加成物(與乙二醇、丙二醇、新戊二醇、三羥甲丙烷或蓖麻油等低分子含活性氫化合物之反應物,例如三羥甲基丙烷加成之二甲苯二異氰酸酯等)、或使有機多元異氰酸酯化合物與多元醇化合物反應而得之末端異氰酸酯胺甲酸乙酯預聚物等。 Examples of the organic polyvalent isocyanate compound include an aromatic polyvalent isocyanate compound, an aliphatic polyisocyanate compound, an alicyclic polyisocyanate compound, and terpolymers, isocyanurate compounds, and adducts of the compounds. a reaction product of a low molecular weight active hydrogen-containing compound such as an alcohol, propylene glycol, neopentyl glycol, trimethylolpropane or castor oil, such as trimethylolpropane-added xylene diisocyanate, or an organic polyisocyanate compound A terminal isocyanate urethane prepolymer obtained by reacting a polyol compound.

前述有機多元異氰酸酯化合物更具體而言可例示2,4-甲苯二異氰酸酯、2,6-甲苯二異氰酸酯、1,3-二甲苯二異氰酸酯、1,4-二甲苯二異氰酸酯、二苯基甲烷-4,4'-二異氰酸酯、二苯基甲烷-2,4'-二異氰酸酯、3-甲基二苯基甲烷二異氰酸酯、六亞甲基二異氰酸酯、異佛爾酮二異氰酸酯、二環己基甲烷-4,4'-二異氰酸酯、二環己基甲烷-2,4'-二異氰酸酯、將甲苯二異氰酸酯或六亞甲基二異氰酸酯加成至三羥甲丙烷等多元醇的全部或部分烴基而成之化合物、離胺酸二異氰酸酯等。 More specifically, the aforementioned organic polyisocyanate compound is exemplified by 2,4-toluene diisocyanate, 2,6-toluene diisocyanate, 1,3-xylene diisocyanate, 1,4-dimethylbenzene diisocyanate, and diphenylmethane- 4,4'-diisocyanate, diphenylmethane-2,4'-diisocyanate, 3-methyldiphenylmethane diisocyanate, hexamethylene diisocyanate, isophorone diisocyanate, dicyclohexylmethane -4,4'-diisocyanate, dicyclohexylmethane-2,4'-diisocyanate, addition of toluene diisocyanate or hexamethylene diisocyanate to all or part of the hydrocarbon group of a polyol such as trimethylolpropane The compound, diazonic acid diisocyanate or the like.

前述有機多元亞胺化合物可例示N,N'-二苯基甲烷-4,4'-雙(1-氮丙啶甲醯胺)、三羥甲丙烷-三-β-氮丙啶基丙酸酯、四羥甲基甲烷-三-β-氮丙啶基丙酸酯、N,N'-甲苯-2,4-雙(1-氮丙啶甲醯胺)三伸乙基三聚氰胺等。 The above organic polyimine compound can be exemplified by N,N'-diphenylmethane-4,4'-bis(1-aziridinecarboxamide), trimethylolpropane-tri-β-aziridine propionic acid. Ester, tetramethylolmethane-tri-β-aziridine propionate, N,N'-toluene-2,4-bis(1-aziridinecarboxamide) tri-ethyl melamine, and the like.

使用異氰酸酯系交聯劑作為交聯劑(f)時,黏合劑樹脂(a)之前述丙烯酸系樹脂較佳為使用含有羥基之聚合物。交聯劑(f)具有異氰酸酯基且丙烯酸系樹脂具有羥基時,藉由交聯劑(f)與丙烯酸系樹脂之反應而可容易地將交聯構造導入至接著劑層。 When an isocyanate type crosslinking agent is used as the crosslinking agent (f), it is preferred to use a polymer having a hydroxyl group as the acrylic resin of the binder resin (a). When the crosslinking agent (f) has an isocyanate group and the acrylic resin has a hydroxyl group, the crosslinking structure can be easily introduced into the adhesive layer by the reaction of the crosslinking agent (f) with the acrylic resin.

使用交聯劑(f)時,接著劑組成物中的交聯劑(f)之含有量相對於黏合劑樹脂(a)之含有量100質量份,較佳為0.01~20質量份,更佳為0.1~10質量份,尤佳為0.5~5質量份。 When the crosslinking agent (f) is used, the content of the crosslinking agent (f) in the adhesive composition is preferably 0.01 to 20 parts by mass, more preferably 0.01 to 20 parts by mass, based on 100 parts by mass of the binder resin (a). It is 0.1 to 10 parts by mass, preferably 0.5 to 5 parts by mass.

(其他熱固性樹脂(g)) (Other thermosetting resins (g))

其他熱固性樹脂(g)只要為環氧系熱固性樹脂(b)中的前述環氧樹脂以外即可,可例示熱固性聚醯亞胺樹脂、聚胺甲酸乙酯樹脂、不飽和聚酯樹脂、聚矽氧樹脂等。 The other thermosetting resin (g) may be other than the epoxy resin in the epoxy thermosetting resin (b), and examples thereof include a thermosetting polyimide resin, a polyurethane resin, an unsaturated polyester resin, and a polyfluorene. Oxygen resin, etc.

(通用添加劑(h)) (General additive (h))

通用添加劑(h)可例示公知的塑化劑、抗靜電劑、抗氧化劑、顏料、染料、吸氣劑等。 The general-purpose additive (h) can be exemplified by a known plasticizer, an antistatic agent, an antioxidant, a pigment, a dye, a getter, and the like.

(溶媒) (solvent)

接著劑組成物係進一步含有溶媒而藉由稀釋使操作性變得良好。 The composition of the subsequent agent further contains a solvent, and the workability is improved by dilution.

接著劑組成物所含有之溶媒並無特別限定,但作為較佳之溶媒可例示:甲苯、二甲苯等烴;甲醇、乙醇、2-丙醇、異丁醇(2-甲基丙烷-1-醇)、1-丁醇等醇;乙酸乙酯等酯;丙酮、丁酮等酮;四氫呋喃等醚;二甲基甲醯胺、N-甲基吡咯烷酮等醯胺(具有醯胺鍵之化合物)等。 The solvent contained in the composition of the second embodiment is not particularly limited, but preferred examples of the solvent include hydrocarbons such as toluene and xylene; methanol, ethanol, 2-propanol and isobutanol (2-methylpropan-1-ol). An alcohol such as 1-butanol; an ester such as ethyl acetate; a ketone such as acetone or methyl ethyl ketone; an ether such as tetrahydrofuran; a decylamine such as dimethylformamide or N-methylpyrrolidone (a compound having a guanamine bond); .

接著劑組成物所含有之溶媒可僅為一種,亦可為兩種以上。 The solvent contained in the subsequent composition may be one type or two or more types.

考慮到均一地混合接著劑組成物所使用之各成分,接著劑組成物所含有之溶媒較佳為丁酮等。 In view of uniformly mixing the components used in the adhesive composition, the solvent contained in the adhesive composition is preferably methyl ethyl ketone or the like.

接著劑組成物係藉由調配染料(s)、以及染料(s)以外的接著劑層構成成分而獲得。 The subsequent composition is obtained by blending a dye (s) and an adhesive layer constituent component other than the dye (s).

調配各成分時的添加順序並無特別限定,亦可同時添加兩種以上之成分。 The order of addition of each component is not particularly limited, and two or more components may be added at the same time.

調配時混合各成分之方法並無特別限定,可適當選擇使攪拌子或攪拌葉等旋轉而混合之方法、使用混合機混合之方法、施加超音波混合之方法等公知方法。 The method of mixing the components at the time of preparation is not particularly limited, and a known method such as a method of rotating and mixing a stirring blade or a stirring blade, a method of mixing using a mixer, and a method of applying ultrasonic mixing may be appropriately selected.

只要不使各調配成分劣化,則添加及混合各成分時的溫度及時間並無特別限定,只要適當地調節即可,但溫度較佳為15~30℃。 The temperature and time when the respective components are added and mixed are not particularly limited as long as the respective components are not deteriorated, and may be appropriately adjusted, but the temperature is preferably 15 to 30 °C.

使用溶媒時,可藉由將溶媒與溶媒以外的任一種調配成分混合並預先稀釋該調配成分而使用,亦可不預先稀釋溶媒以外的任一種調配成分,而藉由混合溶媒與該等調配成分而使用。 When a solvent is used, it may be used by mixing any of the solvent and the solvent, and preliminarily diluting the compounding component, or by mixing the solvent and the compounding component without previously diluting any of the components other than the solvent. use.

接著劑層係可使用接著劑組成物且以與上述於支持基材上形成黏著劑層時相同方法而形成。然而,使用前述黏著基材時,通常難以將接著劑組成物直接塗佈於黏著劑層上。因此,較佳為例如將接著劑組成物塗布於剝離材的剝離層表面並乾燥而形成接著劑層,再將該接著劑層貼合於黏著劑層表面並除去前述剝離材等,先另外形成接著劑再將其貼合於黏著劑層表面的方法。 The subsequent layer can be formed using the adhesive composition and in the same manner as described above for forming the adhesive layer on the support substrate. However, when the aforementioned adhesive substrate is used, it is generally difficult to apply the adhesive composition directly to the adhesive layer. Therefore, for example, the adhesive composition is applied to the surface of the release layer of the release material and dried to form an adhesive layer, and the adhesive layer is bonded to the surface of the adhesive layer to remove the release material or the like. The method of attaching the adhesive to the surface of the adhesive layer.

[實施例] [Examples]

以下根據具體實施例來更詳細說明本發明。然而,本發明不限於以下所示實施例。 The invention will be described in more detail below on the basis of specific examples. However, the invention is not limited to the embodiments shown below.

<切割晶粒接合片的製造> <Manufacture of Cut Grain Bonding Sheet>

[實施例1~6、比較例1~2] [Examples 1 to 6 and Comparative Examples 1 to 2]

(接著劑組成物的製造) (Manufacture of adhesive composition)

以表1所示量而調配各成分,進一步利用丁酮稀釋而獲得接著劑組成物。 Each component was blended in the amounts shown in Table 1, and further diluted with methyl ethyl ketone to obtain an adhesive composition.

表1中各成分的簡碼分別有以下含義。 The short codes of the components in Table 1 have the following meanings, respectively.

‧黏合劑樹脂(a) ‧Binder resin (a)

(a)-1:丙烯酸系樹脂(東洋科美(TOYOCHEM)公司製造,重量平均分子量為500000,玻璃轉移溫度為9℃,由丙烯酸甲酯(95質量份)及丙烯酸2-羥乙酯(5質量份)共聚而成) (a)-1: Acrylic resin (manufactured by TOYOCHEM Co., Ltd., weight average molecular weight: 500,000, glass transition temperature: 9 ° C, methyl acrylate (95 parts by mass) and 2-hydroxyethyl acrylate (5 Mass parts)

‧環氧系熱固性樹脂(b) ‧Epoxy thermosetting resin (b)

(b)-11:具有丙烯醯基之甲酚酚醛清漆型環氧樹脂(日本化藥公司製造的「CNA-147」) (b)-11: a cresol novolac type epoxy resin having an acrylonitrile group ("CNA-147" manufactured by Nippon Kayaku Co., Ltd.)

(b)-21:芳烷基酚樹脂(三井化學公司製造的「MILEX XLC-4L」) (b)-21: Aralkyl phenol resin ("MILEX XLC-4L" manufactured by Mitsui Chemicals, Inc.)

‧填充材料(c) ‧Filling material (c)

(c)-1:甲基丙烯醯基改質填料(ADMATECHS公司製造的「SO-C2」,平均粒徑為0.5μm,二氧化矽的3-甲基丙醯氧基丙基三甲氧基矽烷處理品) (c)-1: methacrylonitrile-based modified filler ("SO-C2" manufactured by ADMATECHS Co., Ltd., average particle diameter of 0.5 μm, 3-methylpropoxypropyltrimethoxydecane of cerium oxide Processing product)

‧耦合劑(e) ‧Coupling agent (e)

(e)-1:矽烷耦合劑(三菱化學公司製造的「MKC Silicate MSEP2」)) (e)-1: decane coupling agent ("MKC Silicate MSEP2" manufactured by Mitsubishi Chemical Corporation))

‧交聯劑(f) ‧ Crosslinking agent (f)

(f)-1:芳香族多元異氰酸酯(日本聚胺甲酸乙酯工業公司製造的「CORONATE L」,三羥甲基丙烷的甲苯二異氰酸酯三聚物加成物) (f)-1: Aromatic polyisocyanate ("CORONATE L" manufactured by Japan Polyurethane Industrial Co., Ltd., toluene diisocyanate trimer adduct of trimethylolpropane)

‧染料(s) ‧Dye (s)

(s)-1:溶劑黑3(東方化學工業公司製造的「OIL Black 860」,油溶性雙偶氮染料) (s)-1: Solvent Black 3 ("OIL Black 860" manufactured by Oriental Chemical Industry Co., Ltd., oil-soluble disazo dye)

(s)-2:.溶劑紅18(中央合成化學公司製造的「Red TR-71」,油溶性雙偶氮染料) (s)-2: Solvent Red 18 ("Red TR-71" manufactured by Central Synthetic Chemical Co., Ltd., oil-soluble disazo dye)

(切割晶粒接合片的製造) (Manufacture of cut die bond sheets)

在聚對苯二甲酸乙二酯製膜的單面進行剝離處理之剝離片的前述剝離處理面,塗佈前述獲得之接著劑組成物,以120℃乾燥3分鐘,藉此形成厚度為5μm或20μm之接著劑層。進一步,將與前述相同的剝離片貼合於接著劑層,製作接著劑層的厚度為5μm、20μm之兩種非載體膜(non carrier film)。 The peeling treatment surface of the release sheet which was subjected to the release treatment on one side of the polyethylene terephthalate film was coated with the obtained adhesive composition, and dried at 120 ° C for 3 minutes, thereby forming a thickness of 5 μm or 20 μm of the adhesive layer. Further, the same release sheet as described above was bonded to the adhesive layer to prepare two non-carrier films having a thickness of the adhesive layer of 5 μm and 20 μm.

接著使用前述非載體膜中接著劑層厚度為20μm之非載體膜,將其中一邊之剝離片剝離,將前述接著劑層轉印至切割膠帶(琳得科(LINTEC)公司製造的「G-562」)的黏著劑層上,獲得切割晶粒接合片。再者,前述切割膠帶的基材為白色且黏著劑層為無色。 Next, a non-carrier film having a thickness of the adhesive layer of 20 μm in the non-carrier film was used, and one of the release sheets was peeled off, and the adhesive layer was transferred to a dicing tape (G-562, manufactured by LINTEC). On the adhesive layer, a cut die bond is obtained. Further, the substrate of the dicing tape is white and the adhesive layer is colorless.

<切割晶粒接合片的評價> <Evaluation of Cutting Grain Bonding Sheet>

對於前述所得之切割晶粒接合片,藉由下述方法評價接著劑層的目視確認性、半導體封裝的可靠性。 With respect to the diced die-bonding sheet obtained as described above, the visibility of the adhesive layer and the reliability of the semiconductor package were evaluated by the following methods.

(基材與接著劑層之間的色差(△E)) (Color difference (ΔE) between the substrate and the adhesive layer)

使用分光光度計(SHIMADZU公司製造的「UV-VIS-NIR SPECTROPHOTOMETER UV-3600」),測定前述切割膠帶(琳得科公司製造的「G-562」)、與 前述所得之厚度為5μm之接著劑層的光透射率。再者,自黏著劑層側測定切割膠帶的光透射率。此時,使用分光光度計所附的大型試料室MPC-3100且未使用內置積分球而進行測定。 The dicing tape ("G-562" manufactured by Linde Co., Ltd.) was measured using a spectrophotometer ("UV-VIS-NIR SPECTROPHOTOMETER UV-3600" manufactured by SHIMADZU Co., Ltd.), and The light transmittance of the adhesive layer having a thickness of 5 μm as described above. Further, the light transmittance of the dicing tape was measured from the side of the adhesive layer. At this time, the measurement was performed using the large sample chamber MPC-3100 attached to the spectrophotometer without using the built-in integrating sphere.

繼而,根據所得之光透射率的測定結果,依照JISZ8781-4:2013分別算出作為基材之切割膠帶與接著劑層之L*、a*、b*,且根據前述式(I)而算出色差(△E)。結果示於表1。於表1中一併表示接著劑層的L*、a*、b*。再者,切割膠帶的L*為46,a*為1.6,b*為-2.9。 Then, based on the measurement results of the obtained light transmittance, L * , a * , and b * of the dicing tape and the adhesive layer as the base material were respectively calculated in accordance with JIS Z 8781-4:2013, and the color difference was calculated according to the above formula (I). (△E). The results are shown in Table 1. The L * , a * , and b * of the adhesive layer are collectively shown in Table 1. Further, the dicing tape had an L * of 46, a * of 1.6, and b * of -2.9.

(接著劑層的目視確認性) (visual confirmation of the adhesive layer)

使用膠帶貼合機(琳得科公司製造的「Adwill RAD2500」),將實施例及比較例的切割晶粒接合片中接著劑層厚度為20μm之切割晶粒接合片經由其接著劑層而貼附於經乾式拋光之矽晶圓(直徑為150mm,厚度為75μm)的研磨面,將該矽晶圓固定於晶圓切割用環狀框架。接著使用切割裝置(DISCO公司製造的「DFD651」)將矽晶圓切割為8mm×8mm之尺寸,而獲得晶片。該切割時係自表面對基材切入20μm。 Using a tape bonding machine ("Adwill RAD 2500" manufactured by Linde Co., Ltd.), the diced die-bonding sheets having a thickness of the adhesive layer of 20 μm in the dicing die-bonding sheets of the examples and the comparative examples were pasted via the adhesive layer thereof. It is attached to a polished surface of a dry-polished silicon wafer (having a diameter of 150 mm and a thickness of 75 μm), and the germanium wafer is fixed to a ring frame for wafer cutting. Next, the wafer was cut into a size of 8 mm × 8 mm using a dicing apparatus ("DFD651" manufactured by DISCO Corporation) to obtain a wafer. This cutting was performed by cutting the substrate into the substrate at a thickness of 20 μm.

自基材一併拾取貼附有切割晶粒接合片之前述晶片、及切割晶粒接合片的接著劑層。繼而,使用在銅箔層合積層板(三菱瓦斯化學公司製造的「CCL-HL830」)的銅箔(厚度為18μm)形成有電路圖案且在該電路圖案上 積層有阻焊劑(太陽油墨公司製造的「PSR-4000 AUS303」)之基板(CHINO GIKEN公司製造的「LN001E-001 PCB(Au)AUS303」),於120℃、2.45N(250gf)、0.5秒之條件下,將前述附有接著劑層之晶片經由該接著劑層而壓接於該基板上。又,使用前述所得之切割晶粒接合片中接著劑層厚度為5μm之切割晶粒接合片,以下依照與前述相同順序而獲得晶片後,自基材一併拾取該晶片及切割晶粒接合片的接著劑層,經由該接著劑層進一步壓接至已壓接於前述基板之晶片上。於該過程中,目視觀察從環狀框架與晶圓之間看到的接著劑層的顏色、與附接著劑層之晶片的拾取部位的顏色,確認是否可藉由目視而明確辨認該等顏色是否彼此不同,即接著劑層是否轉印至晶片。將結果表示於表1。於表1中,「是」表示可藉由目視而明確辨認,「否」表示無法藉由目視而明確辨認。 The wafer to which the dicing die bonding sheet is attached and the adhesive layer dicing the die bonding sheet are collectively picked up from the substrate. Then, a copper foil (thickness: 18 μm) in a copper foil laminated laminate ("CCL-HL830" manufactured by Mitsubishi Gas Chemical Co., Ltd.) was used to form a circuit pattern on the circuit pattern. A substrate with a solder resist ("PSR-4000 AUS303" manufactured by Sun Ink Co., Ltd.) ("LN001E-001 PCB (Au) AUS303" manufactured by CHINO GIKEN) is laminated at 120 ° C, 2.45 N (250 gf), 0.5 second. Under the condition, the wafer with the adhesive layer described above is pressure-bonded to the substrate via the adhesive layer. Further, using the dicing die-bonding sheet having a thickness of the adhesive layer of 5 μm in the dicing die-bonding sheet obtained as described above, after the wafer was obtained in the same order as described above, the wafer and the diced die-bonding sheet were picked up from the substrate. The adhesive layer is further crimped via the adhesive layer to the wafer that has been crimped onto the substrate. In this process, the color of the adhesive layer seen between the annular frame and the wafer and the color of the picked-up portion of the wafer with the adhesive layer are visually observed to confirm whether the colors can be clearly recognized by visual observation. Whether they are different from each other, that is, whether the adhesive layer is transferred to the wafer. The results are shown in Table 1. In Table 1, "Yes" indicates that it can be clearly identified by visual observation, and "No" indicates that it cannot be clearly identified by visual observation.

(半導體封裝的可靠性) (reliability of semiconductor package)

使用烘箱,以175℃對前述評價接著劑層的目視確認性時所製作的前述基板及附接著劑層之晶片的積層物加熱一小時。接著將前述積層物從烘箱取出並冷卻至常溫,使用壓模樹脂(京瓷化學公司製造的「KE-1100AS3」)與密封裝置(APIC YAMADA公司製造的「MPC-06M TriAl Press」),以密封厚成為400μm之方式密封前述積層物,且以175℃加熱5小時,藉此硬化前述壓模樹脂。 接著,將該密封之前述積層物貼附於切割膠帶(琳得科公司製造的「Adwill D-510T」),使用切割裝置(DISCO公司製造的「DFD651」)而切割為8mm×8mm之尺寸,獲得用於評價可靠性之半導體封裝。 The laminate of the substrate and the wafer with the adhesive layer prepared at the time of visual confirmation of the evaluation of the adhesive layer was heated at 175 ° C for one hour using an oven. Then, the laminate was taken out from the oven and cooled to room temperature, and a compression resin ("KE-1100AS3" manufactured by Kyocera Chemical Co., Ltd.) and a sealing device ("MPC-06M TriAl Press" manufactured by APIC YAMADA Co., Ltd.) were used to seal the thickness. The laminate was sealed in a manner of 400 μm, and heated at 175 ° C for 5 hours, whereby the above-mentioned stamper resin was cured. Then, the sealed laminate was attached to a dicing tape ("Adwill D-510T" manufactured by Linde Co., Ltd.), and cut into a size of 8 mm × 8 mm using a cutting device ("DFD651" manufactured by DISCO Corporation). A semiconductor package for evaluating reliability is obtained.

於85℃、相對濕度為60%之條件下,將前述所得之半導體封裝放置168小時,藉此進行吸濕之後,使用回焊爐(相模理工公司製造的「WL-15-20DNX型」),於最高加熱溫度為260℃、加熱時間為一分鐘之條件下,進行3次IR回焊。 The semiconductor package obtained above was placed at 85 ° C and a relative humidity of 60% for 168 hours, and after moisture absorption, a reflow furnace ("WL-15-20DNX type" manufactured by Sagami Polytec Co., Ltd.) was used. Three times of IR reflow was performed under the conditions of a maximum heating temperature of 260 ° C and a heating time of one minute.

接著,對於該進行IR回焊之半導體封裝,自剖面觀察基板及半導體晶片之接合部有無浮起、剝離,將在前述接合部觀察到0.5mm以上剝離之情形判斷為剝離,對於25個半導體封裝計數未剝離之半導體封裝個數。又,對於該進行IR回焊之半導體封裝,使用掃描型超音波探傷裝置(日立建機FINE TECH公司製造的「Hye-Focus」),確認有無產生封裝裂縫。將結果表示於表1。於表1中,「否」表示未產生封裝裂縫,「是」表示產生了封裝裂縫。 Then, in the semiconductor package for IR reflow, whether the joint portion of the cross-section observation substrate and the semiconductor wafer was floated or peeled off, and the peeling was observed at 0.5 mm or more in the joint portion, and the peeling was determined for 25 semiconductor packages. Count the number of unpacked semiconductor packages. In the semiconductor package for IR reflow, a scanning ultrasonic flaw detector ("Hye-Focus" manufactured by Hitachi Construction Machinery FINE TECH Co., Ltd.) was used to confirm the presence or absence of a package crack. The results are shown in Table 1. In Table 1, "No" indicates that no package crack has occurred, and "Yes" indicates that a package crack has occurred.

結果可知,實施例1~6的切割晶粒接合片之接著劑層以0.1~8.3質量%之含有量含有染料,因此△E處於特定範圍內,接著劑層的目視確認性優異,而且獲得之半導體封裝的可靠性亦提高。 As a result, it was found that the adhesive layer of the dicing die-bonding sheets of Examples 1 to 6 contained the dye in an amount of 0.1 to 8.3% by mass. Therefore, ΔE was in a specific range, and the adhesive layer was excellent in visual confirmation and obtained. The reliability of semiconductor packages is also improved.

相對於此,比較例1的切割晶粒接合片之接著劑層不含有染料,因此△E處於特定範圍外,接著劑層的目視確認性不佳。 On the other hand, in the adhesive layer of the diced die-bonding sheet of Comparative Example 1, the dye was not contained, and therefore ΔE was outside the specific range, and the visibility of the adhesive layer was poor.

又,即使比較例2的切割晶粒接合片之接著劑層含有染料,△E亦在特定範圍外,接著劑層的目視確認性不佳。而且,由於接著劑層的染料含有量過多,故於所得半導體封裝的基板及半導體晶片之接合部觀察到大量剝離,亦產生封裝裂縫,係可靠性低。 Further, even if the adhesive layer of the diced die-bonding sheet of Comparative Example 2 contains a dye, ΔE is outside the specific range, and the visibility of the adhesive layer is not good. Further, since the amount of the dye contained in the adhesive layer is too large, a large amount of peeling is observed in the joint portion between the substrate and the semiconductor wafer of the obtained semiconductor package, and a package crack is also generated, which is low in reliability.

[產業上的可利用性] [Industrial availability]

本發明可用於製造半導體晶片等。 The invention can be used to fabricate semiconductor wafers and the like.

Claims (3)

一種切割晶粒接合片,係於基材上具備含有染料之接著劑層;前述接著劑層的前述染料含有量為8.3質量%以下;前述基材與前述接著劑層之間的L*a*b*色彩系統中的色差為30~53。 A dicing die bonding sheet comprising a dye-containing adhesive layer on a substrate; the dye content of the adhesive layer is 8.3% by mass or less; and L * a * between the substrate and the adhesive layer b * The color difference in the color system is 30~53. 如請求項1所記載之切割晶粒接合片,其中前述染料為雙偶氮染料。 The diced die bond sheet of claim 1, wherein the dye is a disazo dye. 如請求項1或2所記載之切割晶粒接合片,其中前述染料之構造中不包含金屬原子或金屬離子。 The diced die bond sheet of claim 1 or 2, wherein the dye has no metal atom or metal ion in its configuration.
TW104125936A 2014-12-15 2015-08-10 Cutting die bond TWI664667B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2014-253241 2014-12-15
JP2014253241A JP6379389B2 (en) 2014-12-15 2014-12-15 Dicing die bonding sheet

Publications (2)

Publication Number Publication Date
TW201621994A true TW201621994A (en) 2016-06-16
TWI664667B TWI664667B (en) 2019-07-01

Family

ID=56126282

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104125936A TWI664667B (en) 2014-12-15 2015-08-10 Cutting die bond

Country Status (5)

Country Link
JP (1) JP6379389B2 (en)
CN (1) CN107004590B (en)
SG (1) SG11201704050PA (en)
TW (1) TWI664667B (en)
WO (1) WO2016098378A1 (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6995505B2 (en) 2017-06-22 2022-01-14 日東電工株式会社 Dicing die bond film
JP7105120B2 (en) 2017-07-04 2022-07-22 日東電工株式会社 Dicing tape, dicing die-bonding film, and semiconductor device manufacturing method
JP7041476B2 (en) 2017-07-04 2022-03-24 日東電工株式会社 Dicing tape and dicing die bond film
JP6978890B2 (en) * 2017-10-16 2021-12-08 リンテック株式会社 Manufacturing method of dicing die bonding sheet and semiconductor chip
JP6405482B1 (en) * 2018-03-27 2018-10-17 タツタ電線株式会社 Carrier film for conductive adhesive layer and bonding film provided therewith
JP7075326B2 (en) 2018-10-05 2022-05-25 日東電工株式会社 Dicing die bond film
JP7176919B2 (en) 2018-10-05 2022-11-22 日東電工株式会社 Dicing die bond film
JP2020164564A (en) * 2019-03-28 2020-10-08 リンテック株式会社 Coating liquid and manufacturing method of adhesive tape using it
JP7224231B2 (en) 2019-04-17 2023-02-17 日東電工株式会社 Dicing die bond film
JP2020178013A (en) 2019-04-17 2020-10-29 日東電工株式会社 Dicing die bond film
JP7260017B1 (en) * 2022-01-31 2023-04-18 大日本印刷株式会社 Adhesive tape for semiconductor processing

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4975564B2 (en) * 2007-08-31 2012-07-11 日東電工株式会社 Adhesive sheet for manufacturing semiconductor device, and method for manufacturing semiconductor device using the same
JP5437111B2 (en) * 2010-03-01 2014-03-12 日東電工株式会社 Die bond film, dicing die bond film and semiconductor device
JP5546985B2 (en) * 2010-07-28 2014-07-09 日東電工株式会社 Semiconductor device manufacturing film, semiconductor device manufacturing film manufacturing method, and semiconductor device manufacturing method.
JP5419226B2 (en) * 2010-07-29 2014-02-19 日東電工株式会社 Flip chip type film for semiconductor back surface and use thereof
JP5121912B2 (en) * 2010-11-24 2013-01-16 富士フイルム株式会社 Colored photosensitive resin composition, pattern forming method, color filter manufacturing method, color filter, and display device including the same
JP5036887B1 (en) * 2011-03-11 2012-09-26 日東電工株式会社 Dicing film with protective film
JP5871428B2 (en) * 2011-03-16 2016-03-01 古河電気工業株式会社 High thermal conductive film adhesive composition, high thermal conductive film adhesive, semiconductor package using the same, and manufacturing method thereof
JP5997506B2 (en) * 2012-05-31 2016-09-28 リンテック株式会社 Dicing die bonding sheet

Also Published As

Publication number Publication date
CN107004590A (en) 2017-08-01
JP6379389B2 (en) 2018-08-29
TWI664667B (en) 2019-07-01
WO2016098378A1 (en) 2016-06-23
CN107004590B (en) 2020-08-25
SG11201704050PA (en) 2017-06-29
JP2016115804A (en) 2016-06-23

Similar Documents

Publication Publication Date Title
TWI664667B (en) Cutting die bond
TWI632217B (en) Semiconductor bonded bonding sheet and method of manufacturing semiconductor device
JP6399665B2 (en) Protective film forming film, protective film forming sheet, protective film forming composite sheet and inspection method
CN107615454B (en) Composite sheet for protective film formation
JP5153597B2 (en) Protective film forming sheet for chip and semiconductor chip with protective film
CN111613564A (en) Protective film forming film, sheet for forming protective film, and inspection method
CN105934811A (en) Protective film forming film, protective film forming sheet, protective film forming composite sheet, and method for producing processed product
TWI836931B (en) Film adhesive and semiconductor processing sheet
TW201544571A (en) Protective film forming film, protective film forming sheet, workpiece or processed product manufacturing method, inspection method, workpiece determined to be a good product, and processed product determined to be a good product
US9953946B2 (en) Die-bonding layer formation film, processed product having die-bonding layer formation film attached thereto, and semiconductor device
JPWO2014155756A1 (en) Adhesive sheet, composite sheet for forming protective film, and method for producing chip with protective film
TW201743385A (en) Film-like adhesive, sheet for semiconductor processing, and method of manufacturing semiconductor device
TWI743361B (en) Resin layer forming film and resin layer forming composite sheet
CN107001876A (en) Sheet for resin film formation and composite sheet for resin film formation
CN111466015B (en) Die bonding film, dicing die bonding sheet, and method for manufacturing semiconductor chip
TW201936824A (en) Film for protective film formation, composite sheet for protective film formation, and method for forming semiconductor chip
CN106415793A (en) Protective membrane forming film
TWI899109B (en) Film for forming protective film, composite sheet for forming protective film, and method for producing segment containing protective film
TWI822962B (en) Method for manufacturing workpiece with first protective film
TWI834820B (en) Thermosetting resin film and first protective film forming sheet
TWI833912B (en) Thermosetting resin film and first protective film forming sheet