TW201611670A - Printed circuit board resin laminate for forming fine via hole, and multilayer printed circuit board having fine via hole in resin insulating layer and method for manufacturing same - Google Patents
Printed circuit board resin laminate for forming fine via hole, and multilayer printed circuit board having fine via hole in resin insulating layer and method for manufacturing same Download PDFInfo
- Publication number
- TW201611670A TW201611670A TW104117710A TW104117710A TW201611670A TW 201611670 A TW201611670 A TW 201611670A TW 104117710 A TW104117710 A TW 104117710A TW 104117710 A TW104117710 A TW 104117710A TW 201611670 A TW201611670 A TW 201611670A
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- Prior art keywords
- resin
- insulating layer
- circuit board
- via hole
- laser
- Prior art date
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Classifications
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- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/06—Layered products comprising a layer of synthetic resin as the main or only constituent of a layer, which is next to another layer of the same or of a different material
- B32B27/08—Layered products comprising a layer of synthetic resin as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/38—Removing material by boring or cutting
- B23K26/382—Removing material by boring or cutting by boring
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/36—Layered products comprising a layer of synthetic resin comprising polyesters
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/38—Layered products comprising a layer of synthetic resin comprising epoxy resins
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/0313—Organic insulating material
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0011—Working of insulating substrates or insulating layers
- H05K3/0017—Etching of the substrate by chemical or physical means
- H05K3/0026—Etching of the substrate by chemical or physical means by laser ablation
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/42—Plated through-holes or plated via connections
- H05K3/429—Plated through-holes specially for multilayer circuits, e.g. having connections to inner circuit layers
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/46—Manufacturing multilayer circuits
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/46—Manufacturing multilayer circuits
- H05K3/4644—Manufacturing multilayer circuits by building the multilayer layer by layer, i.e. build-up multilayer circuits
- H05K3/4652—Adding a circuit layer by laminating a metal foil or a preformed metal foil pattern
- H05K3/4655—Adding a circuit layer by laminating a metal foil or a preformed metal foil pattern by using a laminate characterized by the insulating layer
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2307/00—Properties of the layers or laminate
- B32B2307/20—Properties of the layers or laminate having particular electrical or magnetic properties, e.g. piezoelectric
- B32B2307/206—Insulating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2457/00—Electrical equipment
- B32B2457/08—PCBs, i.e. printed circuit boards
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/18—Layered products comprising a layer of synthetic resin characterised by the use of special additives
- B32B27/20—Layered products comprising a layer of synthetic resin characterised by the use of special additives using fillers, pigments, thixotroping agents
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
- Laminated Bodies (AREA)
- Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
- Non-Metallic Protective Coatings For Printed Circuits (AREA)
- Compositions Of Macromolecular Compounds (AREA)
Abstract
Description
本發明係關於用以形成微細介層孔之印刷電路板用樹脂疊層體、及在樹脂絕緣層具有微細介層孔之多層印刷電路板及其製造方法。The present invention relates to a resin laminate for a printed wiring board for forming fine via holes, and a multilayer printed wiring board having fine via holes in a resin insulating layer and a method for producing the same.
近年來電子設備小型化、高性能化進展,多層印刷電路板為了使電子零件之安裝密度提高,導體配線之微細化進展,尋求配線形成技術。作為在絕緣層上形成高密度之微細配線之方法,已知有以下方法:只以無電解鍍敷形成導體層之加成法(additive method)、利用無電解鍍敷在全面形成薄薄的銅層後以電解鍍敷形成導體層,之後再將薄銅層進行快速蝕刻之半加成法等。In recent years, in order to increase the mounting density of electronic components and to improve the miniaturization of the conductor wiring, the multilayer printed circuit board has been developed to reduce the size of the electronic device. As a method of forming a high-density fine wiring on an insulating layer, there is known a method in which an additive method is used to form a conductor layer only by electroless plating, and a thin copper is formed entirely by electroless plating. After the layer, a conductor layer is formed by electrolytic plating, and then the thin copper layer is subjected to a rapid etching half-addition method or the like.
對於印刷電路板之層間連接為必要的介層孔(through hole)、盲通孔係利用雷射加工、鑽孔加工形成。作為利用雷射加工形成盲通孔之方法,已知有使用UV-YAG雷射之方法、及使用二氧化碳雷射之方法。UV-YAG雷射雖然對於小徑孔的加工性良好,但考量成本、加工速度之觀點,並非令人滿意。而二氧化碳雷射雖於成本、加工速度方面優良,但是波長長,點徑大,故小徑孔之加工性比起波長短且點徑小的UV-YAG雷射還差。於以二氧化碳雷射形成小徑之盲通孔時,須以低加工能量進行加工,所以底部直徑相較於頂部直徑為較小,成為強推拔之形狀,為使盲通孔之導通可靠性降低之原因。A through hole and a blind via hole which are necessary for interlayer connection of a printed circuit board are formed by laser processing or drilling. As a method of forming a blind via hole by laser processing, a method using a UV-YAG laser and a method using a carbon dioxide laser are known. Although the UV-YAG laser has good workability for small diameter holes, it is not satisfactory from the viewpoint of cost and processing speed. The carbon dioxide laser is excellent in cost and processing speed, but has a long wavelength and a large spot diameter. Therefore, the processing of the small diameter hole is worse than that of the UV-YAG laser having a short wavelength and a small spot diameter. When forming blind vias with small diameters by carbon dioxide laser, it must be processed with low processing energy, so the diameter of the bottom is smaller than that of the top, which becomes a strong push-pull shape, so that the conduction reliability of the blind vias is made. The reason for the decrease.
專利文獻1~3記載使用了黏著薄膜之多層印刷電路板之製造方法,專利文獻1揭示:使用由具脫模層之支持基膜與由熱硬化性樹脂組成物構成之黏著薄膜,在核基板疊層該黏著薄膜,並以附有支持基膜之狀態熱硬化後,維持附有支持基膜之狀態或剝離後利用雷射或鑽頭開孔之工法。又,專利文獻2揭示在金屬箔單面疊層絕緣層,並進一步於此絕緣層表面疊層能夠剝離的有機薄膜,從有機薄膜面側進行雷射加工之工法。又,專利文獻3揭示:在含有多量無機填充材之絕緣層使用二氧化碳雷射形成盲通孔時,為了於通孔周邊之絕緣層表面不形成大凹凸,形成頂部直徑與通孔底部直徑之差小的良好孔形成之盲通孔,而對於已疊層塑膠薄膜之絕緣層使用二氧化碳雷射。專利文獻1及2係關於頂部直徑100μm以上之介層孔之形成,專利文獻3記載頂部直徑為100μm以下,較佳為90μm以下,更佳為80μm以下。因此該等文獻並未提及關於具有30μm以下之頂部直徑之微細介層孔之形成。 ﹝先前技術文獻﹞ ﹝專利文獻﹞Patent Documents 1 to 3 describe a method of manufacturing a multilayer printed wiring board using an adhesive film, and Patent Document 1 discloses that an adhesive film composed of a supporting base film having a release layer and a thermosetting resin composition is used in a core substrate. The adhesive film is laminated and thermally cured in a state in which a supporting base film is attached, and the method of attaching the supporting base film or peeling and then opening the hole by a laser or a drill is maintained. Further, Patent Document 2 discloses a method in which an insulating layer is laminated on one surface of a metal foil, and an organic film which can be peeled off is laminated on the surface of the insulating layer, and laser processing is performed from the surface side of the organic film. Further, Patent Document 3 discloses that when a blind via hole is formed using a carbon dioxide laser in an insulating layer containing a large amount of inorganic filler, the difference between the diameter of the top portion and the diameter of the bottom of the via hole is formed so that no large unevenness is formed on the surface of the insulating layer around the via hole. A small well-formed blind via is formed, and a carbon dioxide laser is used for the insulating layer of the laminated plastic film. Patent Documents 1 and 2 relate to the formation of a mesopores having a top diameter of 100 μm or more, and Patent Document 3 discloses that the top diameter is 100 μm or less, preferably 90 μm or less, and more preferably 80 μm or less. Therefore, these documents do not mention the formation of fine interbed pores having a top diameter of 30 μm or less. [Prior Technical Literature] [Patent Literature]
﹝專利文獻1﹞日本特開2001-196743號公報 ﹝專利文獻2﹞日本專利第3899544號公報 ﹝專利文獻3﹞國際公開第2009/066759號[Patent Document 1] JP-A-2001-196743 [Patent Document 2] Japanese Patent No. 3899544 (Patent Document 3) International Publication No. 2009/066759
﹝發明欲解決之課題﹞[The subject to be solved by the invention]
當於印刷電路板使用之樹脂絕緣層形成介層孔時,為了達成介層孔之小徑化而使二氧化碳雷射之輸出能量降低的話,頂部直徑向底部直徑成為推拔強的形狀,會有頂部直徑與底部直徑之差增大的問題。因此仍然希望能夠有能形成頂部直徑小徑化且頂部直徑與底部直徑之差小之介層孔的印刷電路板之加工或製造方法、及此方法使用之樹脂疊層體。 ﹝解決課題之方式﹞When a via hole is formed in a resin insulating layer used for a printed circuit board, the output diameter of the carbon dioxide laser is lowered in order to reduce the diameter of the via hole, and the diameter of the top diameter becomes a strong push-out shape. The problem of the difference between the top diameter and the bottom diameter increases. Therefore, it is still desired to have a method of processing or manufacturing a printed circuit board capable of forming a via hole having a small diameter at the top and a small difference between the top diameter and the bottom diameter, and a resin laminate used in the method. [Method of solving the problem]
本案發明人等針對以雷射(較佳為二氧化碳雷射)形成頂部直徑小且頂部直徑與底部直徑之差小之介層孔的方法努力研究,發現:當設疊層於樹脂絕緣層之雷射衰減用之脫模薄膜之厚度為超過50μm~180μm以下時,能形成頂部直徑為30μm以下且頂部直徑與底部直徑之差為10μm以下之微細介層孔,乃完成本發明。The inventors of the present invention have made an effort to study a method of forming a via hole having a small top diameter and a small difference between a top diameter and a bottom diameter by a laser (preferably a carbon dioxide laser), and found that when a layer laminated on a resin insulating layer is provided When the thickness of the release film for radiation attenuation is more than 50 μm to 180 μm or less, fine mesopores having a top diameter of 30 μm or less and a difference between the top diameter and the bottom diameter of 10 μm or less can be formed, and the present invention has been completed.
因此本發明係關於以下: [1] 一種樹脂疊層體,係含有微細介層孔形成用之樹脂絕緣層、及疊層於該樹脂絕緣層之雷射衰減用之脫模薄膜的印刷電路板用樹脂疊層體,脫模薄膜之厚度超過50μm且為180μm以下。 [2] 如[1]之樹脂疊層體,其中,該雷射衰減用之脫模薄膜係由聚酯形成。 [3] 如[2]之樹脂疊層體,其中,該聚酯係選自於由聚對苯二甲酸乙二醇酯(PET)、聚萘二甲酸乙二醇酯(PEN)、聚萘二甲酸丁二醇酯(PBN)、聚對苯二甲酸丁二醇酯(PBT)、及聚對苯二甲酸丙二醇酯(PTT)構成之群組中之1種或2種以上。 [4] 如[1]至[3]中任一項之疊層體,其中,形成於該樹脂絕緣層之介層孔之頂部直徑為30μm以下,且頂部直徑與底部直徑之差為10μm以下。 [5] 如[1]至[4]中任一項之樹脂疊層體,其中,該樹脂絕緣層之厚度為3~50μm。 [6] 如[1]至[5]中任一項之樹脂疊層體,其中,該樹脂絕緣層係由熱硬化性樹脂組成物形成。 [7] 如[6]之樹脂疊層體,其中,該熱硬化性樹脂組成物含有環氧樹脂、氰酸酯化合物、及無機填充材。 [8] 如[6]或[7]之樹脂疊層體,係使該熱硬化性樹脂組成物半硬化而成。 [9] 如[1]至[8]中任一項之樹脂疊層體,其中,該樹脂絕緣層之鍍敷剝離強度為0.4kN/m以上。 [10] 一種多層印刷電路板之製造方法,包含以下步驟: 在具有基材及形成於基材上之導電電路的電路基板,將如[1]至[9]中任一項之樹脂疊層體予以疊層成使該電路基板之該導電電路與該樹脂疊層體之該樹脂絕緣層為面對面, 利用雷射形成從該樹脂疊層體之該雷射衰減用之脫模薄膜側貫穿到該樹脂絕緣層之介層孔, 將該脫模薄膜從該樹脂絕緣層剝離。 [11] 如[10]之多層印刷電路板之製造方法,其中,該樹脂疊層體為如[8]之樹脂疊層體,且 將該電路基板與該樹脂疊層體疊層後,於介層孔形成前更包含使半硬化狀態之該樹脂絕緣層全硬化之步驟。 [12] 如[10]或[11]之多層印刷電路板之製造方法,其中,雷射為二氧化碳雷射。 [13] 如[12]之多層印刷電路板之製造方法,其中,雷射的能量為0.3mJ~5mJ。 [14] 如[10]至[13]中任一項之多層印刷電路板之製造方法,其中,形成於樹脂絕緣層之介層孔之頂部直徑為30μm以下,且頂部直徑與底部直徑之差為10μm以下。 [15] 如[10]至[14]中任一項之多層印刷電路板之製造方法,其中,於將該脫模薄膜剝離後,更包含以下步驟: 將該樹脂絕緣層之表面予以粗糙化,並於粗糙化表面利用鍍敷形成導體層,將導體層予以圖案化而形成電路。 [16] 一種多層印刷電路板,係利用如[10]至[15]中任一項之多層印刷電路板之製造方法獲得。 [17] 一種多層印刷電路板,包含具有基材與形成於該基材上之導電電路之電路基板、及疊層於該電路基板之如[1]至[9]中任一項之樹脂疊層體之樹脂絕緣層,該樹脂絕緣層具有利用雷射形成之介層孔,而且該介層孔之頂部直徑為30μm以下,頂部直徑與底部直徑之差為10μm以下。 ﹝發明之效果﹞Therefore, the present invention relates to the following: [1] A resin laminate comprising a resin insulating layer for forming fine via holes and a printed circuit board for releasing a release film for laser lightening of the resin insulating layer. With the resin laminate, the thickness of the release film exceeds 50 μm and is 180 μm or less. [2] The resin laminate according to [1], wherein the release film for laser attenuation is formed of polyester. [3] The resin laminate according to [2], wherein the polyester is selected from the group consisting of polyethylene terephthalate (PET), polyethylene naphthalate (PEN), and polynaphthalene. One or more of the group consisting of butylene glycol dicarboxylate (PBN), polybutylene terephthalate (PBT), and polytrimethylene terephthalate (PTT). [4] The laminate according to any one of [1] to [3] wherein the diameter of the top of the via hole formed in the resin insulating layer is 30 μm or less, and the difference between the top diameter and the bottom diameter is 10 μm or less. . [5] The resin laminate according to any one of [1] to [4] wherein the resin insulating layer has a thickness of 3 to 50 μm. [6] The resin laminate according to any one of [1] to [5] wherein the resin insulating layer is formed of a thermosetting resin composition. [7] The resin laminate according to [6], wherein the thermosetting resin composition contains an epoxy resin, a cyanate compound, and an inorganic filler. [8] The resin laminate according to [6] or [7], wherein the thermosetting resin composition is semi-hardened. [9] The resin laminate according to any one of [1] to [8] wherein the resin insulating layer has a plating peel strength of 0.4 kN/m or more. [10] A method of manufacturing a multilayer printed circuit board, comprising the steps of: laminating a resin according to any one of [1] to [9], in a circuit substrate having a substrate and a conductive circuit formed on the substrate The body is laminated such that the conductive circuit of the circuit substrate faces the surface of the resin insulating layer of the resin laminate, and is formed by laser to form a side of the release film for laser attenuation from the resin laminate. The via hole of the resin insulating layer peels the release film from the resin insulating layer. [11] The method for producing a multilayer printed circuit board according to [10], wherein the resin laminate is a resin laminate of [8], and the circuit substrate is laminated with the resin laminate, Before the formation of the via hole, the step of fully hardening the resin insulating layer in a semi-hardened state is further included. [12] The method of manufacturing a multilayer printed circuit board according to [10] or [11], wherein the laser is a carbon dioxide laser. [13] The method of manufacturing a multilayer printed circuit board according to [12], wherein the energy of the laser is 0.3 mJ to 5 mJ. [14] The method of manufacturing a multilayer printed circuit board according to any one of [10] to [13] wherein the diameter of the top of the via hole formed in the resin insulating layer is 30 μm or less, and the difference between the top diameter and the bottom diameter It is 10 μm or less. [15] The method for producing a multilayer printed circuit board according to any one of [10] to [14] wherein, after the release film is peeled off, the method further comprises the steps of: roughening the surface of the resin insulating layer The conductor layer is formed by plating on the roughened surface, and the conductor layer is patterned to form an electric circuit. [16] A multilayer printed circuit board obtained by the method of manufacturing a multilayer printed circuit board according to any one of [10] to [15]. [17] A multilayer printed circuit board comprising: a circuit substrate having a substrate and a conductive circuit formed on the substrate; and a resin stack laminated to the circuit substrate according to any one of [1] to [9] The resin insulating layer of the layered body has a via hole formed by laser, and the top diameter of the via hole is 30 μm or less, and the difference between the top diameter and the bottom diameter is 10 μm or less. [Effects of the Invention]
若選擇適當的輸出能量,於本發明之樹脂疊層體,於附有雷射衰減用之脫模薄膜之狀態,從該脫模薄膜之側以雷射形成介層孔,則能藉由雷射衰減用之脫模薄膜使低能量強度之雷射予以衰減或截斷。藉此,樹脂絕緣層能形成頂部直徑小且頂部直徑與底部直徑之差小的介層孔。因此藉由將本發明之樹脂疊層體疊層於電路基板並形成介層孔,能形成包括小徑且導電可靠性高之介層孔的多層印刷電路板。When the appropriate output energy is selected, the resin laminate of the present invention can be formed by a laser from the side of the release film in the state of the release film for laser attenuation. The release film for attenuation is attenuated or cut off by a laser of low energy intensity. Thereby, the resin insulating layer can form a via hole having a small top diameter and a small difference between the top diameter and the bottom diameter. Therefore, by laminating the resin laminate of the present invention on a circuit board and forming a via hole, a multilayer printed wiring board including a via hole having a small diameter and high electrical conductivity reliability can be formed.
本發明之一態樣係關於包括微細介層孔形成用之樹脂絕緣層、與疊層於前述樹脂絕緣層之雷射衰減用之脫模薄膜的印刷電路板用樹脂疊層體,在此,脫模薄膜之厚度為超過50μm且為180μm以下。One aspect of the present invention relates to a resin laminate for a printed circuit board including a resin insulating layer for forming fine via holes and a release film for laser light reduction laminated on the resin insulating layer. The thickness of the release film is more than 50 μm and is not more than 180 μm.
本發明之樹脂疊層體中之構成樹脂絕緣層之樹脂種類,只要是印刷電路板之製造可使用之樹脂且能藉由使用雷射(較佳為二氧化碳雷射)而能形成微細介層孔之絕緣性樹脂即可,可以為任意樹脂。樹脂組成通常對於使用雷射時形成之孔之大小無重大影響。The resin constituting the resin insulating layer in the resin laminate of the present invention can be a resin which can be used for the production of a printed circuit board and can form a fine via hole by using a laser (preferably a carbon dioxide laser). The insulating resin may be any resin. The resin composition generally does not have a significant effect on the size of the pores formed when using a laser.
本發明中,形成於樹脂絕緣層之微細介層孔係指介層孔之頂部直徑為30μm以下且頂部直徑與底部直徑之差為10μm以下的介層孔。從提高導電可靠性之觀點,頂部直徑與底部直徑之差愈小愈好,更佳為8μm以下,又更佳為5μm以下。考量導體配線微細化之觀點,頂部直徑愈小愈好,例如30μm以下,更佳為27μm以下,又更佳為25μm以下。另一方面,從提高導電可靠性之觀點,頂部直徑通常為15μm以上較佳。In the present invention, the fine via hole formed in the resin insulating layer means a via hole having a top diameter of the via hole of 30 μm or less and a difference between the top diameter and the bottom diameter of 10 μm or less. From the viewpoint of improving the electrical conductivity reliability, the smaller the difference between the top diameter and the bottom diameter, the better, more preferably 8 μm or less, and still more preferably 5 μm or less. From the viewpoint of miniaturization of the conductor wiring, the smaller the top diameter, the better, for example, 30 μm or less, more preferably 27 μm or less, and still more preferably 25 μm or less. On the other hand, from the viewpoint of improving the electrical conductivity reliability, the top diameter is usually preferably 15 μm or more.
樹脂絕緣層之厚度可以於能達成上述規定之介層孔之頂部直徑、及介層孔之頂部直徑與底部直徑之差之範圍內選擇任意厚度。樹脂絕緣層之厚度之上限,考量形成頂部直徑與底部直徑之差為10μm以下之介層孔之觀點,宜為50μm以下較理想,更佳為30μm以下,又更佳為20μm以下。另一方面,絕緣層之厚度之下限,考量絕緣層之絕緣可靠性之觀點,宜為3μm以上較理想,更佳為5μm以上,又更佳為10μm以上。The thickness of the resin insulating layer may be selected to be any thickness within a range in which the diameter of the top of the via hole and the difference between the top diameter and the bottom diameter of the via hole can be achieved. The upper limit of the thickness of the resin insulating layer is preferably 50 μm or less, more preferably 30 μm or less, still more preferably 20 μm or less, from the viewpoint of forming a via hole having a difference between the top diameter and the bottom diameter of 10 μm or less. On the other hand, the lower limit of the thickness of the insulating layer, from the viewpoint of the insulation reliability of the insulating layer, is preferably 3 μm or more, more preferably 5 μm or more, and still more preferably 10 μm or more.
在印刷電路板之層間連接時必要之介層孔之大小,由於配線之微細化與高密度化,故希望能更微細。使用了微細介層孔之印刷電路板,要求在配線板上形成之配線本身也微細化。作為形成高密度之微細配線之方法,為人所熟知的有加成法、半加成法,該等方法係以無電解鍍敷、電解鍍敷形成微細配線。但是將配線微細化時,因為絕緣層與配線之密合面積減小,會發生配線易剝離這樣的問題。因此,考量配線微細化與高密度化之觀點,當形成更微細的介層孔時,希望樹脂絕緣層有更高的鍍敷剝離強度。The size of the via hole necessary for connection between the layers of the printed circuit board is desirably finer because of the miniaturization and high density of the wiring. A printed circuit board using a fine via hole requires the wiring itself formed on the wiring board to be fine. As a method of forming a high-density fine wiring, there are an additive method and a semi-additive method which are known to form fine wiring by electroless plating or electrolytic plating. However, when the wiring is made fine, the adhesion area between the insulating layer and the wiring is reduced, and there is a problem that the wiring is easily peeled off. Therefore, from the viewpoint of miniaturization and high density of wiring, it is desirable that the resin insulating layer have a higher plating peeling strength when forming a finer via hole.
在製造印刷電路板時,考量防止在樹脂絕緣層形成之鍍敷剝離之觀點,樹脂絕緣層之鍍敷剝離強度宜為0.4kN/m以上較佳,更佳為0.5kN/m以上。鍍敷剝離強度會因應樹脂絕緣層之表面粗糙度而改變。於上述記載之鍍敷剝離之範圍可為粗糙化處理前或粗糙化處理後之任一鍍敷剝離強度之範圍,但較佳為指粗糙化處理後之鍍敷剝離強度之範圍。In the production of a printed circuit board, the plating peeling strength of the resin insulating layer is preferably 0.4 kN/m or more, more preferably 0.5 kN/m or more, from the viewpoint of preventing peeling of the plating formed in the resin insulating layer. The peel strength of the plating varies depending on the surface roughness of the resin insulating layer. The range of the plating peeling described above may be any range of the plating peeling strength before the roughening treatment or after the roughening treatment, but preferably refers to the range of the plating peel strength after the roughening treatment.
[脫模薄膜] 以往,脫模薄膜通常使用在將樹脂絕緣層疊層於有導電電路之電路基板並加熱加壓時防止對於加壓手段黏著之用途。於此情形,當樹脂疊層體黏著於電路基板後,將脫模薄膜剝離,再對於樹脂絕緣層實施表面之粗糙化處理,在粗糙化表面利用鍍敷形成導體層,並將導體層予以圖案化而形成電路。另一方面,本發明之態樣中,脫模薄膜除了防止對於加壓手段黏著之用途以外,尚有雷射衰減用途。[Release film] Conventionally, a release film is generally used for preventing adhesion to a pressurizing means when a resin insulating layer is laminated on a circuit board having a conductive circuit and heated and pressurized. In this case, after the resin laminate is adhered to the circuit board, the release film is peeled off, and the surface of the resin insulating layer is roughened, the conductor layer is formed by plating on the roughened surface, and the conductor layer is patterned. Form the circuit. On the other hand, in the aspect of the invention, the release film has a laser attenuation application in addition to the use for preventing adhesion to a pressurizing means.
本發明中,雷射衰減係指將據認為雷射之雷射強度之分布中成為樹脂絕緣層之孔剖面之推拔之原因的低強度雷射予以遮斷或衰減。雷射之強度分布通常為高斯(Gaussian)分布(圖1),但當經由使束徑減細之遮罩(小孔)時,光會干涉並出現干涉條紋。即使是相當於含有如此之干涉條紋之部分的低強度分布的雷射也會將樹脂絕緣層部分削去而成為形成推拔之原因(圖2A)。因此本發明之雷射衰減用之脫模薄膜不意欲限於理論,例如藉由將雷射強度之分布中包括干涉條紋之部分之低強度分布之雷射予以衰減或遮斷而能將樹脂絕緣層形成之孔之推拔予以最小限度化。被遮斷或衰減之雷射強度會因應雷射衰減用之脫模薄膜之厚度而改變,若為該技術領域中有通常知識者,可適當選擇適於微細介層孔形成之雷射衰減用脫模薄膜之厚度。In the present invention, the laser attenuation means that the low-intensity laser which is the cause of the hole profile which becomes the resin insulating layer in the distribution of the laser intensity of the laser is blocked or attenuated. The intensity distribution of the laser is usually a Gaussian distribution (Fig. 1), but when the mask (small hole) is thinned by the beam diameter, the light interferes and interference fringes appear. Even a laser having a low-intensity distribution corresponding to a portion containing such interference fringes partially cuts off the resin insulating layer to cause the push-out (Fig. 2A). Therefore, the release film for laser attenuation of the present invention is not intended to be limited to the theory, for example, by attenuating or blocking the laser of a low intensity distribution including a portion of the interference fringe in the distribution of the laser intensity. The pushing of the formed holes is minimized. The intensity of the laser that is blocked or attenuated varies depending on the thickness of the release film for laser attenuation. If it is generally known in the art, the laser attenuation suitable for the formation of fine via holes can be appropriately selected. The thickness of the release film.
本發明之雷射衰減用之脫模薄膜並不意欲限於理論,但藉由防止由於雷射強度分布當中在低強度側擴開分布之雷射所致之樹脂絕緣層之陷凹而能減少於樹脂絕緣層形成之孔之推拔。因此本發明之雷射衰減用之脫模薄膜須要為了防止雷射強度分布當中之低強度雷射所致樹脂絕緣層陷凹的充分厚度,此厚度當考量達成理想之雷射遮斷或衰減之觀點,宜超過50μm較佳。更佳為超過60μm,又更佳為超過70μm。另一方面,若厚度增厚,為了形成貫通孔之雷射輸出須提高,於此情形,孔之頂部直徑會增大,故不理想,從此觀點,脫模薄膜之厚度之上限宜為180μm以下,更佳為150μm以下,又更佳為100μm以下。The release film for laser attenuation of the present invention is not intended to be limited to the theory, but can be reduced by preventing the recess of the resin insulating layer due to the laser spread on the low-intensity side of the laser intensity distribution. Pushing out the hole formed by the resin insulating layer. Therefore, the release film for laser attenuation of the present invention is required to prevent a sufficient thickness of the resin insulating layer from being recessed due to low-intensity laser light in the laser intensity distribution, and this thickness is considered to achieve an ideal laser interception or attenuation. The viewpoint is preferably more than 50 μm. More preferably, it is more than 60 μm, and more preferably more than 70 μm. On the other hand, if the thickness is increased, the laser output for forming the through hole must be increased. In this case, the diameter of the top of the hole is increased, which is not preferable. From this point of view, the upper limit of the thickness of the release film is preferably 180 μm or less. More preferably, it is 150 μm or less, and more preferably 100 μm or less.
雷射衰減用之脫模薄膜只要是雷射能衰減、樹脂絕緣層熱硬化後能剝離則可為任意薄膜,例如聚酯、聚碳酸酯(以下簡稱「PC」)、聚甲基丙烯酸甲酯(PMMA)等丙烯酸系樹脂、環狀聚烯烴、三乙醯基纖維素(TAC)、聚醚硫醚(PES)、聚醚酮、聚醯亞胺等。其中,聚酯較理想,尤佳為聚萘二甲酸乙二醇酯(以下有時簡稱「PEN」)、聚對苯二甲酸乙二醇酯(PET)、聚萘二甲酸丁二醇酯(PBN)、聚對苯二甲酸丁二醇酯(PBT)、及聚對苯二甲酸丙二醇酯(PTT)。又,雷射衰減用之脫模薄膜也可使用含有碳煙等雷射吸收性成分者。又,脫模薄膜中,為了使熱硬化性樹脂組成物層加熱硬化後能夠將脫模薄膜剝離,也可於此熱硬化性樹脂組成物層之被形成面設置脫模層。作為脫模層使用之脫模劑,只要是熱硬化性樹脂組成物層熱硬化後能將脫模薄膜者剝離者即可,並不特別限定,例如:矽酮系脫模劑、醇酸樹脂系脫模劑等。The release film for laser attenuation may be any film as long as it is attenuated by laser energy and can be peeled off after thermal curing of the resin insulating layer, for example, polyester, polycarbonate (hereinafter referred to as "PC"), polymethyl methacrylate. An acrylic resin such as (PMMA), a cyclic polyolefin, triethylenesulfonyl cellulose (TAC), polyether sulfide (PES), polyether ketone, or polyimine. Among them, polyester is preferred, and polyethylene naphthalate (hereinafter sometimes referred to as "PEN"), polyethylene terephthalate (PET), and polybutylene naphthalate (preferably referred to as "PEN"). PBN), polybutylene terephthalate (PBT), and polytrimethylene terephthalate (PTT). Further, as the release film for laser attenuation, a laser absorbing component such as soot may be used. In addition, in the release film, a release layer may be provided on the surface to be formed of the thermosetting resin composition layer in order to peel off the release film after heat-hardening the thermosetting resin composition layer. The release agent to be used as the mold release layer is not particularly limited as long as it can be peeled off after the thermosetting resin composition layer is thermally cured, and is, for example, an anthrone-based release agent or an alkyd resin. It is a release agent and the like.
本發明之樹脂疊層體可以利用該技術領域中有通常知識者公知之方法製造,例如可製備於有機溶劑溶有熱硬化性樹脂組成物之樹脂清漆,將此樹脂清漆使用模塗機等塗佈在支持薄膜上,利用加熱或熱風吹送等使有機溶劑乾燥並形成樹脂組成物層以製造。樹脂疊層體係疊層於電路基板後使其硬化,故以半硬化狀態較佳。The resin laminate of the present invention can be produced by a method known to those skilled in the art, for example, a resin varnish in which an organic solvent is dissolved in a thermosetting resin composition, and the resin varnish is coated with a die coater or the like. The cloth is produced on the support film by drying the organic solvent by heating or hot air blowing to form a resin composition layer. Since the resin laminated system is laminated on the circuit board and then cured, it is preferably semi-hardened.
[樹脂絕緣層] 本發明之樹脂絕緣層使用之樹脂,只要是在印刷電路板之絕緣層可使用之樹脂即可,並不特別限定,考量耐熱性、絕緣性、鍍敷密合性之觀點,熱硬化性樹脂較佳。 熱硬化性樹脂之具體例可列舉環氧樹脂、氰酸酯樹脂、雙馬來醯亞胺樹脂、醯亞胺樹脂、苯酚樹脂、雙鍵加成聚伸苯醚樹脂、不飽和聚酯樹脂等。此等可以單獨使用1種也可將2種以上以任意之組合及比率使用。 其中,就提供有優良剝離強度之樹脂絕緣層之觀點,環氧樹脂與氰酸酯樹脂之混合物較理想,但宜更添加雙馬來醯亞胺樹脂較佳。 本發明之樹脂絕緣層使用之樹脂組成物中,例如為了實施環氧樹脂之硬化,宜使用硬化劑較佳。 又,在使用硬化劑時為了視須要適當調整硬化速度,也可以併用硬化促進劑。 再者,考量低熱膨脹之觀點,本發明之絕緣層使用之樹脂組成物中宜於不損及期待特性之範圍內含有無機填充材較佳。[Resin Insulation Layer] The resin used in the resin insulating layer of the present invention is not particularly limited as long as it is a resin that can be used for the insulating layer of the printed circuit board, and the viewpoint of heat resistance, insulation, and plating adhesion is considered. A thermosetting resin is preferred. Specific examples of the thermosetting resin include an epoxy resin, a cyanate resin, a bismaleimide resin, a quinone imine resin, a phenol resin, a double bond addition polyphenylene ether resin, an unsaturated polyester resin, and the like. . These may be used alone or in combination of two or more kinds in any combination. Among them, from the viewpoint of providing a resin insulating layer having excellent peel strength, a mixture of an epoxy resin and a cyanate resin is preferable, but a bismaleimide resin is preferably added. In the resin composition used for the resin insulating layer of the present invention, for example, in order to carry out curing of the epoxy resin, it is preferred to use a curing agent. Further, in the case of using a curing agent, a curing accelerator may be used in combination in order to appropriately adjust the curing rate. Further, from the viewpoint of low thermal expansion, it is preferred that the resin composition used in the insulating layer of the present invention contains an inorganic filler in a range that does not impair the desired properties.
[環氧樹脂] 作為當作前述樹脂絕緣層之熱硬化性樹脂使用的環氧樹脂,只要是1分子中有2個以上環氧基者即可,其種類不限定,可使用以往公知之任意環氧樹脂。環氧樹脂例如可列舉:聯苯芳烷基型環氧樹脂、萘4官能型環氧樹脂、二甲苯型環氧樹脂、萘酚芳烷基型環氧樹脂、雙酚A型環氧樹脂、雙酚F型環氧樹脂、樹脂、雙酚A酚醛清漆型環氧樹脂、3官能苯酚型環氧樹脂、4官能苯酚型環氧樹脂、萘型環氧樹脂、聯苯型環氧樹脂、芳烷基酚醛清漆型環氧樹脂、脂環族環氧樹脂、多元醇型環氧樹脂、環氧丙胺、環氧丙酯、將丁二烯等的雙鍵環氧化而得之化合物、含羥基之矽酮樹脂類與表氯醇反應而得之化合物等。該等之中,尤其從鍍敷銅附著性與阻燃性之觀點,聯苯芳烷基型環氧樹脂、萘4官能型環氧樹脂、二甲苯型環氧樹脂、萘酚芳烷基型環氧樹脂尤佳。該等環氧樹脂可使用1種或將2種以上適當混合後使用。[Epoxy resin] The epoxy resin used as the thermosetting resin as the resin insulating layer may be any one of two or more epoxy groups in one molecule, and the type thereof is not limited, and any conventionally known one can be used. Epoxy resin. Examples of the epoxy resin include a biphenyl aralkyl type epoxy resin, a naphthalene 4-functional epoxy resin, a xylene type epoxy resin, a naphthol aralkyl type epoxy resin, and a bisphenol A type epoxy resin. Bisphenol F type epoxy resin, resin, bisphenol A novolak type epoxy resin, trifunctional phenol type epoxy resin, tetrafunctional phenol type epoxy resin, naphthalene type epoxy resin, biphenyl type epoxy resin, aromatic Alkyl novolac type epoxy resin, alicyclic epoxy resin, polyol type epoxy resin, glycidylamine, glycidyl ester, compound obtained by epoxidizing a double bond such as butadiene, and a hydroxyl group-containing compound A compound obtained by reacting an anthrone resin with epichlorohydrin. Among these, in particular, from the viewpoint of adhesion of copper plating and flame retardancy, a biphenyl aralkyl type epoxy resin, a naphthalene 4-functional epoxy resin, a xylene type epoxy resin, a naphthol aralkyl type Epoxy resin is especially preferred. These epoxy resins may be used alone or in combination of two or more.
聯苯芳烷基型環氧樹脂例如有式(1)表示之結構者,萘4官能型環氧樹脂例如有式(2)表示之結構者,二甲苯型環氧樹脂例如有式(3)表示之結構者,萘酚芳烷基型環氧樹脂有例如式(4)表示之結構者。The biphenyl aralkyl type epoxy resin is, for example, a structure represented by the formula (1), the naphthalene 4 functional type epoxy resin is, for example, a structure represented by the formula (2), and the xylene type epoxy resin is, for example, the formula (3). The structure represented by the formula, the naphthol aralkyl type epoxy resin has a structure represented by the formula (4), for example.
【化1】(式中,n1表示1以上之整數。)【化1】 (wherein n1 represents an integer of 1 or more.)
【化2】 [Chemical 2]
【化3】(式中,n2表示1以上之整數。)[化3] (wherein n2 represents an integer of 1 or more.)
【化4】(n3代表平均値,為1~6之數,X表示環氧丙基或碳數1~8之烴基,烴基/環氧丙基之比率為0.05~2.0。)【化4】 (n3 represents the average enthalpy, which is a number from 1 to 6, and X represents a glycidyl group or a hydrocarbon group having 1 to 8 carbon atoms, and the ratio of the hydrocarbon group to the epoxy group is 0.05 to 2.0.)
環氧樹脂之重量平均分子量(Mw)無限制,但考量展現硬化樹脂之靱性之觀點,通常為250以上,其中300以上較佳,又,考量使未硬化樹脂之塗佈性及硬化樹脂之耐熱性改善之觀點,通常為5000以下,其中3000以下較佳。The weight average molecular weight (Mw) of the epoxy resin is not limited, but the viewpoint of exhibiting the flexibility of the cured resin is usually 250 or more, of which 300 or more is preferable, and the coating property of the uncured resin and the heat resistance of the hardened resin are considered. The viewpoint of improving the sex is usually 5,000 or less, and preferably 3,000 or less.
本發明之樹脂絕緣層使用之樹脂組成物中,環氧化合物之含量不特別限定,考量耐熱性及硬化性之觀點,佔樹脂組成物中之樹脂固體成分中的20~80質量%之範圍較理想,30~70質量%之範圍特別理想。In the resin composition used for the resin insulating layer of the present invention, the content of the epoxy compound is not particularly limited, and from the viewpoint of heat resistance and hardenability, it accounts for 20 to 80% by mass of the resin solid content in the resin composition. Ideally, the range of 30 to 70% by mass is particularly desirable.
[馬來醯亞胺化合物] 可以將有馬來醯亞胺基之馬來醯亞胺化合物,例如:雙(4-馬來醯亞胺苯基)甲烷、2,2-雙{4-(4-馬來醯亞胺苯氧基)-苯基}丙烷、雙(3,5-二甲基-4-馬來醯亞胺苯基)甲烷、雙(3-乙基-5-甲基-4-馬來醯亞胺苯基)甲烷、雙(3,5-二乙基-4-馬來醯亞胺苯基)甲烷、聚苯基甲烷馬來醯亞胺作為其他成分,使用在構成樹脂絕緣層之樹脂組成物,該等馬來醯亞胺化合物能使絕緣層之吸濕耐熱性改善。又,能以此等馬來醯亞胺化合物之預聚物、或馬來醯亞胺化合物與胺化合物之預聚物等的形式摻合,可使用1種或將2種以上適當混合使用。[Malayimine compound] A maleic imine compound having a maleidino group, for example, bis(4-maleimidophenyl)methane, 2,2-double {4-(4) -Malyleneimine phenoxy)-phenyl}propane, bis(3,5-dimethyl-4-maleimidophenyl)methane, bis(3-ethyl-5-methyl- 4-maleimide phenyl)methane, bis(3,5-diethyl-4-maleimidophenyl)methane, polyphenylmethane maleimide as other components, used in the composition A resin composition of a resin insulating layer which can improve the moisture absorption heat resistance of the insulating layer. In addition, one type of the prepolymer of the maleic imine compound or the prepolymer of the maleimide compound and the prepolymer of the amine compound may be used, and one type or two or more types may be used as appropriate.
[硬化劑] 硬化劑只要是通常使用於作為上述熱硬化性樹脂之硬化劑者即可,無特殊限定。例子可列舉苯酚化合物、聚苯酚化合物、氰酸酯化合物、活性酯化合物、二氰二醯胺、羧酸醯胺、胺化合物、各種酸酐、路易士酸錯合物等。此等可以單獨使用1種也可將2種以上以任意組及比率使用。當使用硬化劑時,其使用比率無限定,例如相對於熱硬化性樹脂之樹脂固體成分100質量份,通常使用1質量份以上,其中5質量份以上,又,通常使用100質量份以下,其中70質量份以下較佳。又,熱硬化性樹脂與硬化劑之使用比率取決於熱硬化性樹脂及硬化劑之種類而異,例如以熱硬化性樹脂之反應性基(將其以RF1代表)與和其反應之硬化劑之反應性基數(將其以RF2代表)之比(RF2/RF1)通常為0.3以上,其中0.7以上,又,通常為3以下,較佳為2.5以下的比率使用較佳。[Curing Agent] The curing agent is not particularly limited as long as it is generally used as a curing agent for the thermosetting resin. Examples thereof include a phenol compound, a polyphenol compound, a cyanate compound, an active ester compound, dicyandiamide, a carboxylic acid guanamine, an amine compound, various acid anhydrides, and a Lewis acid complex. These may be used alone or in combination of two or more kinds in any group and ratio. When a curing agent is used, the ratio of use thereof is not limited. For example, it is usually used in an amount of 1 part by mass or more, more than 5 parts by mass, and usually 100 parts by mass or less, based on 100 parts by mass of the resin solid content of the thermosetting resin. 70 parts by mass or less is preferred. Further, the ratio of use of the thermosetting resin to the curing agent varies depending on the type of the thermosetting resin and the curing agent, for example, a reactive group of the thermosetting resin (represented by RF1) and a curing agent reactive therewith The ratio (RF2/RF1) of the reactivity group (represented by RF2) is usually 0.3 or more, and 0.7 or more, and usually 3 or less, preferably 2.5 or less is preferably used.
作為硬化劑使用之氰酸酯化合物,因為有耐藥品性、黏著性等優異之特性且能利用此優良的耐藥品性形成均勻的粗糙化面,所以適合使用於作為本發明中之樹脂組成物之成分。氰酸酯化合物可使用一般公知者,例如式(5)表示之萘酚芳烷基型氰酸酯化合物、式(6)表示之酚醛清漆型氰酸酯、式(7)表示之聯苯芳烷基型氰酸酯、1,3-二氰氧基苯、1,4-二氰氧基苯、1,3,5-三氰氧基苯、雙(3,5-二甲基4-氰氧基苯基)甲烷、1,3-二氰氧基萘、1,4-二氰氧基萘、1,6-二氰氧基萘、1,8-二氰氧基萘、2,6-二氰氧基萘、2,7-二氰氧基萘、1,3,6-三氰氧基萘、4,4’-二氰氧基聯苯、雙(4-氰氧基苯基)甲烷、雙(4-氰氧基苯基)丙烷、雙(4-氰氧基苯基)醚、雙(4-氰氧基苯基)硫醚、雙(4-氰氧基苯基)碸、2,2’-雙(4-氰氧基苯基)丙烷、雙(3、5-二甲基、4-氰氧基苯基)甲烷等。The cyanate compound which is used as a curing agent is excellent in chemical resistance, adhesiveness, and the like, and can form a uniform roughened surface by using such excellent chemical resistance. Therefore, it is suitably used as a resin composition in the present invention. The ingredients. As the cyanate ester compound, a naphthol aralkyl type cyanate compound represented by the formula (5), a novolac type cyanate represented by the formula (6), and a biphenyl aryl group represented by the formula (7) can be used. Alkyl type cyanate, 1,3-dicyanooxybenzene, 1,4-dicyanooxybenzene, 1,3,5-tricyanooxybenzene, bis(3,5-dimethyl 4- Cyanooxyphenyl)methane, 1,3-dicyanooxynaphthalene, 1,4-dicyanooxynaphthalene, 1,6-dicyanooxynaphthalene, 1,8-dicyanooxynaphthalene, 2, 6-Dicyanooxynaphthalene, 2,7-dicyanooxynaphthalene, 1,3,6-tricyanooxynaphthalene, 4,4'-dicyanoxybiphenyl, bis(4-cyanooxybenzene) Methane, bis(4-cyanooxyphenyl)propane, bis(4-cyanooxyphenyl)ether, bis(4-cyanooxyphenyl) sulfide, bis(4-cyanooxyphenyl)碸, 2,2'-bis(4-cyanooxyphenyl)propane, bis(3,5-dimethyl, 4-cyanooxyphenyl)methane, and the like.
其中,式(5)表示之萘酚芳烷基型氰酸酯化合物、式(6)表示之酚醛清漆型氰酸酯、式(7)表示之聯苯芳烷基型氰酸酯的阻燃性優異、硬化性高,且硬化物之熱膨脹係數低,故特別理想。 【化5】(式中,R1代表氫原子或甲基,n4表示1以上之整數。)Among them, the naphthol aralkyl type cyanate compound represented by the formula (5), the novolak type cyanate represented by the formula (6), and the biphenyl aralkyl type cyanate represented by the formula (7) are flame retarded. It is particularly preferable because it has excellent properties, high hardenability, and low thermal expansion coefficient of the cured product. 【化5】 (wherein R1 represents a hydrogen atom or a methyl group, and n4 represents an integer of 1 or more.)
【化6】(式中,R2表示氫原子或甲基,n5表示1以上之整數。)【化6】 (wherein R2 represents a hydrogen atom or a methyl group, and n5 represents an integer of 1 or more.)
【化7】(式中,R3表示氫原子或甲基,n6表示1以上之整數。)【化7】 (wherein R3 represents a hydrogen atom or a methyl group, and n6 represents an integer of 1 or more.)
作為硬化劑使用之活性酯化合物,具有低介電率、低介電正切、低吸水率、低熱膨脹率、高玻璃轉移溫度等優異之特性,且電特性及高玻璃轉移溫度優良,所以適合作為本發明之樹脂組成物之成分使用。能使用一般公知品,但可列舉EPICLON HPC-8000(DIC(股)公司)、EPICLON HPC-8000-65T(DIC(股)公司)等為理想例。The active ester compound used as a curing agent has excellent characteristics such as low dielectric constant, low dielectric tangent, low water absorption, low thermal expansion coefficient, high glass transition temperature, and excellent electrical properties and high glass transition temperature, so it is suitable as The component of the resin composition of the present invention is used. A generally known product can be used, but EPICLON HPC-8000 (DIC) and EPICLON HPC-8000-65T (DIC) are preferred examples.
[無機填充材] 無機填充材只要是該技術領域通常使用者均可,無特殊限制。再者,可使用1種、或多種無機填充材。無機填充材,例如:氫氧化鎂、氧化鎂、天然二氧化矽、熔融二氧化矽、非晶二氧化矽、中空二氧化矽等二氧化矽類、軟水鋁石、氧化鉬、鉬酸鋅等鉬化合物、氧化鋁、滑石、煅燒滑石、雲母、玻璃短纖維、球狀玻璃(E玻璃、T玻璃、D玻璃等玻璃微粉末類)等。 尤其,從提供有理想之鍍敷剝離性之樹脂絕緣層之樹脂結構體之觀點,宜為可溶於酸之無機填充材較佳。藉由含有可溶於酸之無機填充材,能在絕緣層表面形成低粗糙度的粗糙化面,可獲得於該粗糙化面形成了金屬鍍敷時之鍍敷密合性優異之樹脂絕緣層。此效果不限於理論,但據推測是因為可溶於酸之無機填充材在去膠渣處理步驟時利用鹼性之氧化劑所為之粗糙化步驟不中不溶解,而於利用酸性還原劑所為之中和步驟溶解,而且於使用氰酸酯化合物能提供具高耐藥品性之樹脂結構體,藉此即使在利用鹼性氧化劑所為之粗糙化步驟也有可溶於酸之無機填充材不脱落之效果所獲致。[Inorganic Filler] The inorganic filler is not particularly limited as long as it is generally used by the user in the technical field. Further, one type or a plurality of inorganic fillers may be used. Inorganic fillers such as magnesium hydroxide, magnesium oxide, natural cerium oxide, molten cerium oxide, amorphous cerium oxide, hollow cerium oxide, cerium oxide, boehmite, molybdenum oxide, zinc molybdate, etc. Molybdenum compound, alumina, talc, calcined talc, mica, glass short fiber, spherical glass (glass micropowder such as E glass, T glass, D glass), and the like. In particular, from the viewpoint of providing a resin structural body having a resin insulating layer having a desired plating releasability, an acid-soluble inorganic filler is preferred. By containing an acid-soluble inorganic filler, a roughened surface having a low roughness can be formed on the surface of the insulating layer, and a resin insulating layer excellent in plating adhesion when metal plating is formed on the roughened surface can be obtained. . This effect is not limited to theory, but it is presumed that the acid-soluble inorganic filler is insoluble in the roughening step by the alkaline oxidizing agent in the desmear treatment step, and is in the middle of using the acidic reducing agent. And the step of dissolving, and the use of the cyanate ester compound can provide a resin structure having high chemical resistance, whereby the effect of the acid-soluble inorganic filler does not fall off even in the roughening step using the alkaline oxidizing agent Earned.
本發明使用之可溶於酸之無機填充材,可列舉氫氧化鎂、氧化鎂。此等材料有在絕緣層表面之去膠渣處理中溶於到中和液,形成均勻的粗糙化面並改善鍍敷剝離強度的效果。具體而言,就氫氧化鎂而言,可列舉Tateho 化學工業(股)製之Ecomag Z-10、Ecomag PZ-1、神島化學工業(股)製之Magseeds N、Magseeds S、Magseeds EP、Magseeds EP2-A、堺化學工業(股)製之MGZ-1、MGZ-3、MGZ-6R、協和化學工業(股)製之Kisuma 5、Kisuma 5A、Kisuma 5P等。就氧化鎂而言可列舉Tateho 化學工業(股)製之FNM-G、堺化學工業(股)製之SMO、SMO-0.1、SMO-S-0.5等。The inorganic filler which is soluble in acid used in the present invention may, for example, be magnesium hydroxide or magnesium oxide. These materials have the effect of dissolving in the desizing treatment on the surface of the insulating layer to form a uniform roughened surface and improving the peeling strength of the plating. Specifically, as the magnesium hydroxide, Ecomag Z-10, Ecomag PZ-1 manufactured by Tateho Chemical Industry Co., Ltd., Magseeds N, Magseeds S, Magseeds EP, Magseeds EP2 manufactured by Shendao Chemical Industry Co., Ltd. -A, MGZ-1, MGZ-3, MGZ-6R, manufactured by 堺Chemical Industries Co., Ltd., Kisuma 5, Kisuma 5A, Kisuma 5P, etc., manufactured by Kyowa Chemical Industry Co., Ltd. Examples of the magnesium oxide include FNM-G manufactured by Tateho Chemical Industry Co., Ltd., SMO, SMO-0.1, SMO-S-0.5 manufactured by Nippon Chemical Industry Co., Ltd., and the like.
前述可溶於酸之無機填充材之平均粒徑,考量去膠渣處理後獲得均勻的表面粗糙度之觀點,宜為0.1~2.0μm較佳。在此,平均粒徑是指中位徑(median diameter),係當測得之粉體之粒度分布分成2部分時,較大側之個數或質量與較側之質量佔全部粉體的50%時的粒徑,一般以濕式雷射繞射・散射法測定。The average particle diameter of the above-mentioned acid-soluble inorganic filler is preferably from 0.1 to 2.0 μm from the viewpoint of obtaining a uniform surface roughness after the desmear treatment. Here, the average particle diameter refers to the median diameter. When the particle size distribution of the measured powder is divided into two parts, the number of the larger side or the mass of the side and the mass of the side are 50 of the total powder. The particle size at % is generally measured by a wet laser diffraction/scattering method.
本發明之樹脂絕緣層使用之樹脂組成物中,前述可溶於酸之無機填充材之含量相對於樹脂組成物中之樹脂固體成分100質量份為5~150質量份的話,從絕緣層表面之粗糙度之觀點較理想。In the resin composition used for the resin insulating layer of the present invention, the content of the acid-soluble inorganic filler is from 5 to 150 parts by mass based on 100 parts by mass of the resin solid content in the resin composition, from the surface of the insulating layer. The viewpoint of roughness is ideal.
又,前述可溶於酸之無機填充材為經表面處理者的話,從吸濕耐熱性、耐藥品性之觀點較理想。具體而言,宜實施矽烷偶聯劑所為之矽烷偶聯處理、KBM-403處理、KBM-3063處理較佳。Moreover, when the acid-soluble inorganic filler is surface-treated, it is preferable from the viewpoints of moisture absorption heat resistance and chemical resistance. Specifically, it is preferred to carry out the decane coupling treatment, the KBM-403 treatment, and the KBM-3063 treatment for the decane coupling agent.
前述矽烷偶聯劑只要是一般使用在無機物之表面處理的矽烷偶聯劑即可,無特殊限定。具體例可列舉γ-胺基丙基三乙氧基矽烷、N-β-(胺基乙基)-γ-胺基丙基三甲氧基矽烷等胺基矽烷系、γ-環氧丙氧基丙基三甲氧基矽烷等環氧矽烷系、γ-甲基丙烯醯氧丙基三甲氧基矽烷等乙烯基矽烷系、N-β-(N-乙烯基苄胺基乙基)-γ-胺基丙基三甲氧基矽烷鹽酸鹽等陽離子矽烷系、苯基矽烷系等,可使用1種或將2種以上適當組合使用。又,濕潤分散劑只要是使用在塗料用途的分散安定劑即可,無特殊限定。例如BYK Japan (股)製之Disperbyk-110、111、180、161、BYK-W996、W9010、W903等濕潤分散劑。The decane coupling agent is not particularly limited as long as it is a decane coupling agent which is generally used for the surface treatment of an inorganic material. Specific examples thereof include γ-aminopropyltriethoxydecane, N-β-(aminoethyl)-γ-aminopropyltrimethoxydecane, and the like, and an oxane-glycidyloxy group. Ethylene decane such as propyltrimethoxydecane, vinyl decane such as γ-methyl propylene oxypropyltrimethoxy decane, or N-β-(N-vinylbenzylaminoethyl)-γ-amine A cationic decane type or a phenyl decane type, such as a propyl trimethoxy decane hydrochloride, may be used alone or in combination of two or more kinds as appropriate. Further, the wetting dispersant is not particularly limited as long as it is a dispersion stabilizer used for coating applications. For example, a wet dispersant such as Disperbyk-110, 111, 180, 161, BYK-W996, W9010, W903 manufactured by BYK Japan Co., Ltd.
[硬化促進劑] 硬化促進劑為任意成分,因應必要為了適當調整硬化速度,可添加到樹脂組成物。此等只要是就氰酸酯化合物、環氧樹脂之硬化促進劑而言為公知且一般使用者即可,無特殊限定。該等之具體例可列舉銅、鋅、鈷、鎳等有機金屬鹽類、咪唑類及其衍生物、二甲胺基吡啶、三級胺等。該等硬化促進劑可單獨使用1種,也可以將2種以上以任意組合及比率使用。[Curing accelerator] The hardening accelerator is an optional component, and may be added to the resin composition in order to appropriately adjust the curing rate. These are not particularly limited as long as they are known as a curing accelerator for a cyanate compound or an epoxy resin. Specific examples thereof include organic metal salts such as copper, zinc, cobalt, and nickel, imidazoles and derivatives thereof, dimethylaminopyridine, and tertiary amines. These hardening accelerators may be used singly or in combination of two or more kinds in any combination.
[其他成分] 硬化性樹脂組成物在不脫離本發明之主旨之範圍內也可含有其他成分。可併用作為該其他成分之例如其他熱硬化性樹脂、熱塑性樹脂及其寡聚物、彈性體類等各種高分子化合物、其他阻燃性化合物、添加劑等。此等只要是一般使用者即可,並無特殊限定。例如:阻燃性化合物可列舉磷酸酯、磷酸三聚氰胺、含磷之環氧樹脂、三聚氰胺、苯胍胺等氮化合物、含 環之化合物、矽酮系化合物等。可因應所望將作為添加劑之紫外線吸收劑、抗氧化劑、光聚合起始劑、螢光增白劑、光增感劑、染料、顏料、增黏劑、潤滑劑、消泡劑、分散劑、塗平劑、光澤劑等予以適當組合使用使用。[Other Components] The curable resin composition may contain other components as long as it does not deviate from the gist of the present invention. Other polymer compounds such as other thermosetting resins, thermoplastic resins, oligomers thereof, and elastomers, other flame retardant compounds, additives, and the like can be used in combination as the other components. As long as it is a general user, there is no particular limitation. For example, the flame retardant compound may be a nitrogen compound such as a phosphate ester, a melamine phosphate, a phosphorus-containing epoxy resin, a melamine or a benzoguanamine, or the like. a compound of a ring, an anthrone-based compound, or the like. It can be used as an additive for UV absorbers, antioxidants, photopolymerization initiators, fluorescent brighteners, photosensitizers, dyes, pigments, tackifiers, lubricants, defoamers, dispersants, and coatings. Flat agents, brighteners, and the like are used in an appropriate combination.
也可併用作為其他成分之其他熱硬化性樹脂、熱塑性樹脂及其寡聚物、彈性體類等各種高分子化合物、其他阻燃性化合物、添加劑等。再者,可列舉玻璃纖維、碳纖維、石墨纖維、芳香族聚醯胺纖維、硼纖維、氧化鋁纖維、碳化矽纖維等的切股或粉碎纖維、消泡劑、流變性調整劑、阻燃劑、填充材、聚合抑制劑、顏料、染料、偶聯劑、離子捕捉劑、脫模劑等。此等其他成分可以單獨使用1種也可將2種以上以任意組合及比率使用。Other polymer compounds such as other thermosetting resins, thermoplastic resins, oligomers thereof, and elastomers, other flame retardant compounds, additives, and the like may be used in combination. Further, examples thereof include diced or pulverized fibers such as glass fibers, carbon fibers, graphite fibers, aromatic polyamide fibers, boron fibers, alumina fibers, and cerium carbide fibers, defoaming agents, rheology modifiers, and flame retardants. , fillers, polymerization inhibitors, pigments, dyes, coupling agents, ion trapping agents, mold release agents, and the like. These other components may be used singly or in combination of two or more kinds in any combination.
[各成分之使用比率] 製造本發明之樹脂疊層體時,各成分之使用比率不限定,例如以下所示。[Use Ratio of Each Component] When the resin laminate of the present invention is produced, the use ratio of each component is not limited, and is as follows, for example.
硬化劑使用氰酸酯化合物時,氰酸酯化合物與環氧樹脂以以樹脂組成物中之氰酸酯化合物之氰酸酯基數與環氧樹脂之環氧基數之比(CN/Ep)成為0.7~2.5的方式摻合較佳。CN/Ep若為0.7~2.5之範圍內,能獲得良好阻燃性與硬化性。When the cyanate compound is used as the curing agent, the ratio of the cyanate group number of the cyanate compound to the epoxy group of the epoxy resin in the resin composition (CN/Ep) is 0.7. The blending of ~2.5 is preferred. If the CN/Ep is in the range of 0.7 to 2.5, good flame retardancy and hardenability can be obtained.
[樹脂結構體之製法] 本發明之樹脂結構體係藉由包括以下步驟的製法製造:製備包含環氧樹脂、硬化劑、視須要的無機填充材、視須要的硬化促進劑、視須要的其他成分之硬化性樹脂組成物,使該硬化性樹脂組成物硬化而形成樹脂硬化物後,對於獲得之樹脂硬化物之至少一表面施以表面粗糙化處理。[Method for Producing Resin Structure] The resin structure system of the present invention is produced by a process comprising the steps of: preparing an epoxy resin, a hardener, an optional inorganic filler, an optional hardening accelerator, and other optional components as necessary. In the curable resin composition, after the curable resin composition is cured to form a cured resin, at least one surface of the obtained cured resin is subjected to surface roughening treatment.
製備硬化性樹脂組成物之方法無限制,只要是能將環氧樹脂、硬化劑、視須要之無機填充材、視須要之硬化促進劑、視須要之其他成分予以均勻混合之方法即可,可以利用任意方法。可列舉如下例。The method for preparing the curable resin composition is not limited, as long as it can uniformly mix the epoxy resin, the hardener, the inorganic filler as needed, the hardening accelerator as needed, and other components as necessary. Use any method. The following examples can be cited.
(i)將環氧樹脂導入到反應器內,於環氧樹脂為固體時,以適當溫度加熱使成為液體,於其中視須要添加無機填充材使其完全溶解,於其中加入硬化劑並視需要加入硬化促進劑,使其以液體狀均勻地混合,再視需要進行脱泡處理,以製備硬化性樹脂組成物之方法。 (ii)使用混合器等,將環氧樹脂、硬化劑、視需要無機填充材、及視需要添加之硬化促進劑、其他成分混合均勻後,使用熱輥、雙軸擠壓機、捏合機等進行熔融混練,以製備成硬化性樹脂組成物之方法。(i) introducing an epoxy resin into the reactor. When the epoxy resin is a solid, it is heated at a suitable temperature to become a liquid, in which an inorganic filler is added as needed to completely dissolve the hardener, and a hardener is added thereto as needed. A method of preparing a curable resin composition by adding a hardening accelerator, uniformly mixing it in a liquid state, and performing a defoaming treatment as needed. (ii) using a mixer, etc., using an epoxy resin, a curing agent, an optional inorganic filler, and a hardening accelerator and other components to be added as needed, and then using a hot roll, a twin-screw extruder, a kneader, etc. A method of performing melt-kneading to prepare a curable resin composition.
(iii)將環氧樹脂、硬化劑、視需要無機填充材及視需要添加之硬化促進劑、其他成分溶於例如甲乙酮、丙酮、甲苯等溶劑,以製備成清漆狀之硬化性樹脂組成物之方法。(iii) an epoxy resin, a curing agent, an optional inorganic filler, and optionally a hardening accelerator, and other components are dissolved in a solvent such as methyl ethyl ketone, acetone, or toluene to prepare a varnish-like curable resin composition. method.
又,若於環氧樹脂與視需要之無機填充材之混合物中添加硬化劑,則硬化反應會開始,所以於硬化劑添加後之步驟宜儘可能短時間且迅速地進行較佳。Further, when a curing agent is added to a mixture of an epoxy resin and an optional inorganic filler, the curing reaction starts. Therefore, the step after the addition of the curing agent is preferably carried out as short as possible and rapidly.
使硬化性樹脂組成物硬化而形成樹脂硬化物之方法亦無限制,可以任意選用自以往採用的環氧樹脂組成物的硬化方法。作為該硬化方法,例如熱硬化法、能量射線硬化法(電子束硬化法、紫外線硬化法等)、濕氣硬化法等,熱硬化法為較佳。The method of curing the curable resin composition to form a cured resin is not limited, and a curing method of the epoxy resin composition conventionally used can be arbitrarily selected. As the curing method, for example, a thermosetting method, an energy ray hardening method (electron beam curing method, ultraviolet curing method, etc.), a moisture curing method, or the like, a thermal curing method is preferable.
具體而言,於硬化性樹脂組成物在常溫為固體狀時,可藉由例如粉碎、打錠後利用轉移成形、壓縮成形、射出成形等以往公知之成形方法進行硬化成形以製造樹脂硬化物(硬化之成形品)。Specifically, when the curable resin composition is solid at normal temperature, it can be cured by a conventionally known molding method such as pulverization or tableting, followed by transfer molding, compression molding, or injection molding to produce a cured resin ( Hardened molded article).
另一方面,硬化性樹脂組成物於常溫呈液狀、清漆狀時,可藉由施用例如將硬化性樹脂組成物注入到模具(成形)、注入到容器(裝填等)、塗佈在基材上(疊層)、含浸於纖維(纖絲)等(filament wetting等)等適當方法後,使其加熱硬化之等方法而獲得樹脂硬化物。又,於常溫為液狀、清漆狀之硬化性樹脂組成物,若有必要,當實施注模、裝填、塗佈、向纖維之含浸等後,若實施加熱、乾燥而使其成為半硬化狀態(B階段),則黏性減低,能使作業性改善。又,呈清漆狀之本發明之硬化性樹脂組成物也可藉由缺角輪塗佈機(comma coater)、模塗機、凹版印刷塗佈機等塗佈裝置塗佈在鑄塑薄膜,乾燥,成形為硬化之薄膜狀,也可真空脱泡後使用。On the other hand, when the curable resin composition is in the form of a liquid or a varnish at normal temperature, for example, a curable resin composition can be injected into a mold (forming), injected into a container (filling, etc.), and coated on a substrate. After hardening (stacking), impregnation with a fiber (fibril) or the like (such as filament wetting), the method is followed by heating and hardening to obtain a cured resin. In addition, it is a liquid or varnish-like curable resin composition at normal temperature, and if necessary, it is subjected to injection molding, charging, coating, impregnation with fibers, etc., and then heated and dried to be semi-hardened. (Phase B), the viscosity is reduced, and the workability is improved. Further, the curable resin composition of the present invention in the form of a varnish may be applied to a cast film by a coating device such as a comma coater, a die coater or a gravure coater, and dried. It is formed into a hardened film or can be used after vacuum defoaming.
使硬化性樹脂組成物硬化時,硬化溫度及硬化時間因應環氧樹脂、硬化劑之種類等可能不同,例如可以採用硬化溫度20~250℃、硬化時間1~24小時之條件等。When the curable resin composition is cured, the curing temperature and the curing time may vary depending on the type of the epoxy resin or the curing agent, and for example, a curing temperature of 20 to 250 ° C and a curing time of 1 to 24 hours may be employed.
[保護薄膜] 本發明之樹脂疊層體可包含於樹脂絕緣層上之雷射衰減用薄膜之相反側疊層之保護薄膜。保護薄膜於直到向電路基板疊層為止之期間,在樹脂疊層體流通過程中能防止塵埃、污垢附著而且防止樹脂絕緣層之表面受到物理性損傷並且保護樹脂絕緣層。作為如此的保護薄膜,可以列舉聚乙烯、聚丙烯、聚氯乙烯等聚烯烴、PET、PEN等聚酯、PC、聚醯亞胺等薄膜。又,也可以對於保護薄膜施以MAD處理、電暈處理,此外也可施以脫模處理。保護薄膜之厚度可為任意,例如5~30μm之範圍。為了和雷射衰減用之脫模薄膜區別,保護薄膜可著色,也可有註明為保護薄膜之記載。[Protective Film] The resin laminate of the present invention may comprise a protective film laminated on the opposite side of the laser attenuating film on the resin insulating layer. The protective film prevents dust and dirt from adhering during the flow of the resin laminate until the resin film is laminated, and prevents the surface of the resin insulating layer from being physically damaged and protects the resin insulating layer. Examples of such a protective film include polyolefins such as polyethylene, polypropylene, and polyvinyl chloride, polyesters such as PET and PEN, and films such as PC and polyimide. Further, the protective film may be subjected to MAD treatment or corona treatment, or a mold release treatment may be applied. The thickness of the protective film may be any, for example, in the range of 5 to 30 μm. In order to distinguish it from the release film for laser attenuation, the protective film may be colored, and may also be described as a protective film.
[印刷電路板之製造方法] 本發明之另一態樣係關於製造使用了本發明之樹脂疊層體之多層印刷電路板之方法。此方法包括以下步驟:於具有基材及形成在基材上之導電電路之電路基板,將本發明之樹脂疊層體疊層成使前述電路基板之前述導電電路和前述樹脂疊層體之樹脂絕緣層成為面對面。當使用半硬化狀態之樹脂疊層體時,也可於疊層後包括全硬化步驟。將由熱硬化性樹脂構成之樹脂絕緣層熱硬化之作業可依習知方法實施。例如:在電路基板之單面或兩面重疊樹脂疊層體使樹脂絕緣層和電路基板面對面,使用SUS鏡板等金屬板進行加熱及加壓並進行疊層壓擠,使其全硬化亦可。此時之條件只要是在本發明所屬之技術領域一般使用且能使熱硬化性樹脂硬化之條件即可,可於例如5~40kgf/cm2 之壓力、120~180℃之溫度、20~100分鐘之壓擠時間進行。加熱及加壓可利用將已加熱之SUS鏡板等將金屬板從塑膠薄膜側進行壓製以進行,但宜不是將金屬板直接壓擠,而是介隔黏著片能充分服貼於電路基板之電路凹凸的耐熱橡膠等彈性材進行壓擠較佳。疊層步驟也可使用真空層合機進行。於此情形,係將樹脂疊層體於減壓下進行加熱及加壓,並於電路基板層合樹脂疊層體。層合之條件可為該領域一般使用之條件,可於例如70~140℃之溫度、1~11kgf/cm2 之範圍之壓力、及20mmHg(26.7hPa)以下之減壓下進行。層合步驟後,可利用金屬板進行熱壓擠而使已層合之黏著薄膜平滑化。上述層合步驟及平滑化步驟可以利用市售之真空層合機連續進行。層合步驟後、或平滑化步驟後,可實施熱硬化步驟。熱硬化步驟係將樹脂組成物予以熱硬化並形成絕緣層。熱硬化條件取決於熱硬化性樹脂組成物之種類等而異,但一般而言,硬化溫度為170~190℃、硬化時間為15~60分鐘。[Manufacturing Method of Printed Circuit Board] Another aspect of the present invention relates to a method of manufacturing a multilayer printed wiring board using the resin laminate of the present invention. The method includes the steps of laminating the resin laminate of the present invention into a resin substrate having the substrate and the conductive circuit formed on the substrate, and the resin of the conductive substrate and the resin laminate of the circuit substrate The insulating layer becomes face to face. When a resin laminate in a semi-hardened state is used, a full hardening step may be included after lamination. The work of thermally hardening the resin insulating layer made of a thermosetting resin can be carried out by a conventional method. For example, a resin laminate is placed on one surface or both surfaces of a circuit board so that the resin insulating layer and the circuit board face each other, and the metal plate such as a SUS mirror plate is heated and pressurized, and laminated and pressed to be fully cured. The conditions at this time may be any conditions generally used in the technical field to which the present invention pertains and which can cure the thermosetting resin, and can be, for example, a pressure of 5 to 40 kgf/cm 2 , a temperature of 120 to 180 ° C, and a temperature of 20 to 100. The squeeze time of minutes is carried out. Heating and pressurization may be performed by pressing a metal plate from the side of the plastic film with a heated SUS mirror plate or the like, but it is preferable not to directly press the metal plate, but to separate the circuit board from the circuit board. It is preferable that the elastic material such as the uneven heat-resistant rubber is pressed. The lamination step can also be carried out using a vacuum laminator. In this case, the resin laminate is heated and pressurized under reduced pressure, and the resin laminate is laminated on the circuit board. The conditions for lamination may be those generally used in the field, and may be carried out, for example, at a temperature of 70 to 140 ° C, a pressure in the range of 1 to 11 kgf/cm 2 , and a reduced pressure of 20 mmHg (26.7 hPa) or less. After the laminating step, the laminated film can be smoothed by hot pressing using a metal plate. The lamination step and the smoothing step described above can be carried out continuously using a commercially available vacuum laminator. After the lamination step or after the smoothing step, a thermal hardening step can be performed. The heat hardening step thermally hardens the resin composition and forms an insulating layer. The thermosetting conditions vary depending on the type of the thermosetting resin composition, etc., but generally, the curing temperature is 170 to 190 ° C, and the curing time is 15 to 60 minutes.
又,本發明之多層印刷電路板之製造方法包括如下步驟:對於已疊層之電路基板及樹脂疊層體,從樹脂疊層體之雷射衰減用之脫模薄膜側照射雷射。藉由照射雷射,能形成貫穿樹脂絕緣層之微細介層孔。此微細之介層孔之大小較佳為介層孔之頂部直徑為30μm以下且頂部直徑與底部直徑之差為10μm以下。Moreover, the method for producing a multilayer printed wiring board according to the present invention includes the step of irradiating a laser beam from the side of the release film for laser attenuation of the resin laminate on the laminated circuit board and the resin laminate. By irradiating the laser, a fine via hole penetrating the resin insulating layer can be formed. The size of the fine via hole is preferably such that the top diameter of the via hole is 30 μm or less and the difference between the top diameter and the bottom diameter is 10 μm or less.
照射雷射之種類無限制。例如二氧化碳雷射、YAG雷射、準分子雷射等。其中二氧化碳雷射為較佳。 照射之二氧化碳雷射一般使用波長9.2~10.8μm之雷射。又,發射數可為1次或多次,為了發揮雷射衰減用之脫模薄膜之雷射衰減效果,較佳為1次,即使進行多次,也宜為在第2次以後輸出減小的清潔發射較佳。關於二氧化碳雷射之輸出能量,可由該技術領域中有通常知識者因應樹脂絕緣層之厚度、雷射衰減用之脫模薄膜之厚度、及所望孔徑適當設定。通常,樹脂絕緣層之厚度及雷射衰減用之脫模薄膜之厚度愈厚,則必要之二氧化碳雷射之輸出能量愈高。另一方面,二氧化碳雷射之能量若太低,因為加工性下降,會造成底部直徑比頂部直徑還小之強推拔形狀。因此,考量使用厚度超過50μm之雷射衰減用脫模薄膜之觀點及/或頂部直徑與底部直徑之差為10μm以下之觀點,輸出能量例如為0.3mJ以上,更佳為超過0.6mJ,又更佳為0.8mJ以上。另一方面,考量壓抑頂部直徑為30μm以下之觀點,輸出能量為5mJ以下,更佳為3mJ以下。二氧化碳雷射之脈波寬不特別限定,可直到約0.5μs~100μs之脈波的廣範圍內選擇,但考量壓抑頂部直徑為30μm以下之觀點,上限宜為30μs以下較理想,更佳為15μs以下。There is no limit to the type of laser exposure. For example, carbon dioxide laser, YAG laser, excimer laser, and the like. Among them, carbon dioxide laser is preferred. The irradiated carbon dioxide laser generally uses a laser having a wavelength of 9.2 to 10.8 μm. Further, the number of shots may be one or more times, and the laser attenuation effect of the release film for laser attenuation is preferably one time, and even if it is performed a plurality of times, it is preferable to reduce the output after the second time. The cleaning emission is better. The output energy of the carbon dioxide laser can be appropriately set by a person skilled in the art in view of the thickness of the resin insulating layer, the thickness of the release film for laser attenuation, and the desired aperture. Generally, the thicker the thickness of the resin insulating layer and the thickness of the release film for laser attenuation, the higher the output energy of the necessary carbon dioxide laser. On the other hand, if the energy of the carbon dioxide laser is too low, the workability is lowered, and the bottom diameter is smaller than the top diameter. Therefore, the viewpoint of using a release film for laser attenuation having a thickness of more than 50 μm and/or the difference between the top diameter and the bottom diameter is 10 μm or less, and the output energy is, for example, 0.3 mJ or more, more preferably more than 0.6 mJ, and more. Good is 0.8mJ or more. On the other hand, from the viewpoint of suppressing the top diameter of 30 μm or less, the output energy is 5 mJ or less, and more preferably 3 mJ or less. The pulse width of the carbon dioxide laser is not particularly limited, and can be selected in a wide range of pulse waves of about 0.5 μs to 100 μs, but the viewpoint of suppressing the top diameter of 30 μm or less is preferable, and the upper limit is preferably 30 μs or less, more preferably 15 μs. the following.
製造本發明之多層印刷電路板之方法可在利用雷射照射形成介層孔後,進一步包括將脫模薄膜從樹脂層剝離之步驟。脫模薄膜剝離後,可以對於樹脂絕緣層表面實施進行粗糙化之粗糙化處理步驟。表面粗糙化處理之方法也無限制,可因應環氧樹脂、及視需要無機填充材之種類適當選擇,可列舉紫外線照射處理、電漿處理、溶劑處理等。此等任一種可以單獨實施,也可以將二種以上以任意組合實施。The method of manufacturing the multilayer printed circuit board of the present invention may further comprise the step of peeling the release film from the resin layer after forming the via hole by laser irradiation. After the release film is peeled off, a roughening treatment step of roughening the surface of the resin insulating layer may be performed. The surface roughening treatment method is not limited, and may be appropriately selected depending on the type of the epoxy resin and the inorganic filler to be used, and examples thereof include ultraviolet irradiation treatment, plasma treatment, and solvent treatment. Any of these may be implemented singly or in combination of two or more kinds.
紫外線照射處理係對於樹脂硬化物之表面照射紫外線而實施。紫外線之波長不限定,通常為20nm以上,較佳為50nm以上,更佳為100nm以上、又,通常為400nm以下,較佳為350nm以下,更佳為300nm以下之範圍。紫外線之照射時間也無限定,通常2分鐘以上,更佳為5分鐘以上,又,通常為240分鐘以下,120分鐘以下更佳。The ultraviolet irradiation treatment is performed by irradiating the surface of the cured resin with ultraviolet rays. The wavelength of the ultraviolet light is not particularly limited, but is usually 20 nm or more, preferably 50 nm or more, more preferably 100 nm or more, and usually 400 nm or less, preferably 350 nm or less, and more preferably 300 nm or less. The irradiation time of the ultraviolet rays is not limited, and is usually 2 minutes or longer, more preferably 5 minutes or longer, and usually 240 minutes or shorter, and more preferably 120 minutes or shorter.
電漿處理係對於樹脂硬化物的表面照射電漿進行。電漿為任意種類。例如氧(氧電漿)、氬(氬電漿)、空氣(空氣電漿)、氮(氮電漿)等電漿。此等的任一種可單獨使用,也可將二種以上以任意組合及比率使用。電漿之照射時間也無限定,通常為2分鐘以上,較佳為5分鐘以上,又,通常為240分鐘以下,又以120分鐘以下較佳。The plasma treatment is performed by irradiating a surface of the cured resin with a plasma. The plasma is of any kind. For example, oxygen (oxygen plasma), argon (argon plasma), air (air plasma), nitrogen (nitrogen plasma) and other plasma. Any of these may be used singly or in combination of two or more kinds in any combination. The irradiation time of the plasma is not limited, but is usually 2 minutes or longer, preferably 5 minutes or longer, and usually 240 minutes or shorter, and preferably 120 minutes or shorter.
溶劑處理無限定,例如利用酸性溶劑所為之氧化處理、利用鹼性溶劑所為之還原處理等。其中,溶劑處理宜實施包括了膨潤步驟、表面粗糙化及膠渣溶解步驟、及中和步驟之溶劑處理較佳。The solvent treatment is not limited, and examples thereof include an oxidation treatment using an acidic solvent, a reduction treatment using an alkaline solvent, and the like. Among them, the solvent treatment is preferably carried out by a solvent treatment including a swelling step, a surface roughening and a sludge dissolution step, and a neutralization step.
膨潤步驟係使用膨潤劑使表面絕緣層膨潤以進行。膨潤劑只要是能改善表面絕緣層之透濕性,且使表面絕緣層膨潤直到下一表面粗糙化及膠渣溶解步驟中之氧化分解會被促進之程度者即可,並無限制。例如鹼溶液、界面活性劑溶液等。The swelling step is carried out by swelling the surface insulating layer with a swelling agent. The swelling agent is not limited as long as it can improve the moisture permeability of the surface insulating layer and swell the surface insulating layer until the next surface is roughened and the oxidative decomposition in the slag-dissolving step is promoted. For example, an alkali solution, a surfactant solution, and the like.
表面粗糙化及膠渣溶解步驟係使用氧化劑進行。氧化劑,例如過錳酸鹽溶液等,理想的具體例可以列舉過錳酸鉀水溶液、過錳酸鈉水溶液等。該氧化劑處理稱為濕式去膠渣,但也可以除了該濕式去膠渣也將利用電漿處理、UV處理所為之乾式去膠渣、利用擦光輪(buff)等所為之機械研磨、砂磨等其他公知粗糙化處理適當予以組合並實施。The surface roughening and the sludge dissolution step are carried out using an oxidizing agent. The oxidizing agent, for example, a permanganate solution or the like, is preferably a potassium permanganate aqueous solution or a sodium permanganate aqueous solution. The oxidant treatment is referred to as wet desmearing, but in addition to the wet degumming, it is also treated by plasma treatment, UV treatment for dry desmear, mechanical polishing with a buff, etc. Other known roughening treatments such as grinding are suitably combined and carried out.
中和步驟係將前步驟使用之氧化劑利用還原劑予以中和的步驟。還原劑可以列舉胺系還原劑,理想的具體例可列舉羥胺硫酸鹽水溶液、乙二胺四乙酸水溶液、氮基三乙酸水溶液等酸性還原劑。The neutralization step is a step of neutralizing the oxidizing agent used in the previous step with a reducing agent. The reducing agent may, for example, be an amine-based reducing agent, and a specific example thereof may be an acidic reducing agent such as a hydroxylamine sulfate aqueous solution, an ethylenediaminetetraacetic acid aqueous solution or a nitrogen-based triacetic acid aqueous solution.
製造本發明之多層印刷電路板之方法,也可以於粗糙化處理後或不進行粗糙化處理,更包括在樹脂絕緣層之表面利用鍍敷形成導體層之鍍敷步驟、及於形成之導體層形成電路之電路形成(圖案化)步驟。該等步驟可依多層印刷電路板之製造使用之以往公知之各種方法進行。The method for manufacturing the multilayer printed circuit board of the present invention may be performed after the roughening treatment or without roughening treatment, and further includes a plating step of forming a conductor layer by plating on the surface of the resin insulating layer, and a conductor layer formed thereon A circuit forming (patterning) step of forming a circuit. These steps can be carried out in accordance with various conventionally known methods of manufacturing multilayer printed circuit boards.
鍍敷步驟可以藉由例如在以粗糙化處理形成了凸凹之絕緣層表面以組合無電解鍍敷與電解鍍敷之方法形成導體層、或是只以無電解鍍敷形成導體層以進行。導體層能以銅、鋁、鎳、銀、金等金屬或此等金屬之合金等形成,尤其銅為較佳。銅鍍敷層可以用組合無電解銅鍍敷與電解銅鍍敷之方法、或形成和導體層為相反圖案之鍍敷阻劑並只以無電解銅鍍敷形成導體層。The plating step can be performed by, for example, forming a conductor layer by a combination of electroless plating and electrolytic plating in a surface of an insulating layer formed by roughening treatment, or forming a conductor layer only by electroless plating. The conductor layer can be formed of a metal such as copper, aluminum, nickel, silver or gold or an alloy of such metals, and in particular copper is preferred. The copper plating layer may be formed by a combination of electroless copper plating and electrolytic copper plating, or a plating resist having a pattern opposite to that of the conductor layer, and plating only with electroless copper.
電路形成步驟可列舉半加成法、全加成法、減去法等。其中,考量形成微細配線圖案之觀點,半加成法為較佳。The circuit forming step may be a semi-additive method, a full additive method, a subtractive method, or the like. Among them, a semi-additive method is preferable in view of the viewpoint of forming a fine wiring pattern.
以半加成法形成圖案之方法,例如在絕緣層表面利用無電解鍍敷等形成薄的導體層後,使用鍍敷阻劑選擇性地施以電解鍍敷(圖案鍍敷),之後將鍍敷阻劑剝離,並將全體予以適量蝕刻而形成配線圖案之方法。A method of forming a pattern by a semi-additive method, for example, after forming a thin conductor layer on the surface of an insulating layer by electroless plating or the like, selectively applying electrolytic plating (pattern plating) using a plating resist, and then plating A method in which a resist is peeled off and an entire amount is etched to form a wiring pattern.
以全加成法形成圖案之方法,例如在絕緣層表面使用鍍敷阻劑預先形成圖案,選擇性地使無電解鍍敷等附著以形成配線圖案之方法。A method of forming a pattern by a full-addition method, for example, a method of forming a pattern by using a plating resist on a surface of an insulating layer, and selectively attaching an electroless plating or the like to form a wiring pattern.
以減去法形成圖案之方法,例如在絕緣層表面利用鍍敷形成導體層後,使用蝕刻阻劑選擇性地去除導體層以形成配線圖案之方法。A method of forming a pattern by subtraction, for example, after forming a conductor layer by plating on the surface of the insulating layer, using a etch resist to selectively remove the conductor layer to form a wiring pattern.
利用鍍敷形成配線圖案時,考量使絕緣層與導體層之密合強度提高的觀點,宜於鍍敷後實施乾燥步驟較佳。利用半加成法形成圖案時係組合無電解鍍敷與電解鍍敷,但此時,宜於無電解鍍敷之後、及電解鍍敷之後分別實施乾燥較佳。無電解後之乾燥例如宜於80~180℃費時10~120分鐘進行較佳,電解鍍敷後之乾燥例如宜於130~220℃費時10~120分鐘進行較佳。When the wiring pattern is formed by plating, it is preferable to carry out the drying step after plating, from the viewpoint of improving the adhesion strength between the insulating layer and the conductor layer. When the pattern is formed by the semi-additive method, electroless plating and electrolytic plating are combined. However, in this case, it is preferred to perform drying after electroless plating and after electrolytic plating, respectively. The drying after electroless plating is preferably carried out at 80 to 180 ° C for 10 to 120 minutes, and the drying after electrolytic plating is preferably carried out at 130 to 220 ° C for 10 to 120 minutes.
本發明之多層印刷電路板之製造時使用之電路基板,主要指在玻璃環氧基板、金屬基板、聚酯基板、聚醯亞胺基板、BT樹脂基板、熱硬化型聚伸苯醚基板等基板的單面或兩面形成有施行了圖案加工的導體層(電路)的基板。又,製造多層印刷電路板時,進一步待形成絕緣層及/或導體層之中間製造物之內層電路基板也包括在本發明所指之電路基板。又,導體層(電路)表面利用黑化處理等而預先施以粗糙化處理者,在考量絕緣層向電路基板之密合性之觀點為較理想。 ﹝實施例﹞The circuit board used in the manufacture of the multilayer printed circuit board of the present invention mainly refers to a substrate such as a glass epoxy substrate, a metal substrate, a polyester substrate, a polyimide substrate, a BT resin substrate, or a thermosetting polyphenylene ether substrate. A substrate on which a patterned conductor layer (circuit) is formed on one or both sides. Further, when manufacturing a multilayer printed circuit board, the inner layer circuit substrate further forming an intermediate layer of the insulating layer and/or the conductor layer is also included in the circuit substrate of the present invention. Moreover, the surface of the conductor layer (circuit) is roughened beforehand by blackening treatment or the like, and it is preferable from the viewpoint of the adhesion of the insulating layer to the circuit board. [Examples]
[氰酸酯化合物之製造] ・合成例1 α-萘酚芳烷基型氰酸酯化合物(式(8)之化合物)之合成: 【化8】(式中,n之平均値為3~4。)[Production of Cyanate Compound] Synthesis Example 1 Synthesis of α-naphthol aralkyl type cyanate compound (compound of formula (8)): [Chemical 8] (In the formula, the average 値 of n is 3~4.)
將安裝有溫度計、攪拌器、滴加漏斗及回流冷卻器之反應器預先以食鹽水冷卻到0~5℃,於其中加入氯化氰7.47g(0.122mol)、35%鹽酸9.75g(0.0935mol)、水76ml、及二氯甲烷44ml。The reactor equipped with a thermometer, a stirrer, a dropping funnel and a reflux cooler was previously cooled to 0 to 5 ° C with brine, and 7.47 g (0.122 mol) of cyanogen chloride and 9.75 g of hydrochloric acid of 35% (0.0935 mol) were added thereto. ), 76 ml of water, and 44 ml of dichloromethane.
保持此反應器內之溫度為-5~+5℃、pH為1以下,於攪拌狀態費時1小時以滴加漏斗滴加將下式(8’)表示之α-萘酚芳烷基樹脂(SN485、OH基當量:214g/eq.軟化點:86℃、新日鐵化學(股)製)20g(0.0935mol)、及三乙胺14.16g(0.14mol)溶於二氯甲烷92ml而得之溶液,滴加結束後再費時15分鐘滴加三乙胺4.72g(0.047mol)。 【化9】(式中,n之平均値為3~4。)The temperature in the reactor was maintained at -5 to +5 ° C, the pH was 1 or less, and the α-naphthol aralkyl resin represented by the following formula (8') was added dropwise with a dropping funnel over 1 hour under stirring (SN485). , OH group equivalent: 214g / eq. Softening point: 86 ° C, Nippon Steel Chemical Co., Ltd.) 20g (0.0935mol), and triethylamine 14.16g (0.14mol) dissolved in dichloromethane 92ml solution After the completion of the dropwise addition, 4.72 g (0.047 mol) of triethylamine was added dropwise over 15 minutes. 【化9】 (In the formula, the average 値 of n is 3~4.)
滴加結束後於同溫度攪拌15分鐘,之後將反應液分液並分取有機層。將獲得之有機層以水100ml洗滌2次後以蒸發器於減壓下餾去二氯甲烷,最後於80℃使其進行1小時濃縮乾固,獲得上式(8)表示之α-萘酚芳烷基樹脂之氰酸酯化合物(α-萘酚芳烷基型氰酸酯化合物)23.5g。After completion of the dropwise addition, the mixture was stirred at the same temperature for 15 minutes, and then the reaction liquid was separated and the organic layer was separated. The obtained organic layer was washed twice with 100 ml of water, and then the dichloromethane was evaporated under reduced pressure using an evaporator, and then concentrated and dried at 80 ° C for 1 hour to obtain α-naphthol represented by the above formula (8). A cyanate compound (α-naphthol aralkyl type cyanate compound) of an aralkyl resin was 23.5 g.
[樹脂組成物之製作] 使作為環氧樹脂之式(1)表示之聯苯芳烷基型環氧樹脂(NC-3000-H、日本化藥(股)製)47.5質量份、及作為第2環氧樹脂之萘型環氧樹脂(HP4710、DIC(股)製)12.7質量份、作為氰酸酯化合物之於合成例1獲得之式(8)表示之α-萘酚芳烷基型氰酸酯化合物(氰酸酯當量:261g/eq.)之甲乙酮(以下有時簡稱「MEK」)溶液(不揮發成分50質量%)51.4質量份(就不揮發成分換算為25.7質量份)、作為馬來醯亞胺化合物之式(9)表示之馬來醯亞胺化合物(BMI-2300,大和化成(股)製)11.1質量份、作為硬化促進劑之2,4,5-三苯基咪唑(和光純藥製)之PMA溶液(不揮發成分1質量%)300質量份(就不揮發成分換算為3.0質量份)及辛酸鋅之MEK溶液(不揮發成分1質量%)7質量份(就不揮發成分換算為0.07質量份)溶於或分散於MEK。再者,添加作為無機填充材之氧化鎂(SMO-0.4、堺化學工業(股)製,平均粒徑0.4μm)125質量份,使用高速攪拌裝置攪拌30分鐘,獲得清漆(包括環氧樹脂、氰酸酯樹脂、馬來醯亞胺化合物、無機填充材之樹脂組成物之溶液)。 【化10】(式中,R1~4 各自獨立地表示氫原子或甲基,n就平均値而言為1~10之範圍。)[Production of a resin composition] 47.5 parts by mass of a biphenyl aralkyl type epoxy resin (NC-3000-H, manufactured by Nippon Kayaku Co., Ltd.) represented by the formula (1) as an epoxy resin, and (22.7 parts by mass of epoxy resin naphthalene type epoxy resin (made by HP4710, DIC), and α-naphthol aralkyl type cyan represented by the formula (8) obtained as the cyanate compound in Synthesis Example 1. 51.4 parts by mass of a solution of a methyl ester (cyanate equivalent: 261 g/eq.) of methyl ester (cyanate equivalent: 261 g/eq.) (nonvolatile content: 50% by mass) (in terms of nonvolatile content: 25.7 parts by mass) The maleic imine compound (BMI-2300, manufactured by Daiwa Kasei Co., Ltd.) represented by the formula (9) of the maleic imine compound, 11.1 parts by mass, 2,4,5-triphenylimidazole as a hardening accelerator 300 parts by mass of PMA solution (manufactured by Wako Pure Chemical Industries, Ltd.) (3.0 parts by mass of nonvolatile matter) and MEK solution of zinc octoate (1% by mass of nonvolatile matter) 7 parts by mass The nonvolatile content was converted to 0.07 parts by mass in terms of dissolved or dispersed in MEK. Further, 125 parts by mass of magnesium oxide (SMO-0.4, manufactured by Seiko Chemical Co., Ltd., average particle diameter: 0.4 μm) as an inorganic filler was added, and stirred for 30 minutes using a high-speed stirring device to obtain a varnish (including an epoxy resin, A solution of a cyanate resin, a maleimide compound, or a resin composition of an inorganic filler. 【化10】 (wherein R 1 to 4 each independently represent a hydrogen atom or a methyl group, and n is in the range of 1 to 10 in terms of an average enthalpy.)
[樹脂疊層體之製作] 將獲得之清漆以模塗機均勻地塗在附有脫模層之PET薄膜之脫模面,使乾燥後之樹脂組成物層之厚度成為8μm或20μm,於150~180℃進行3分鐘乾燥。然後,將厚度15μm之聚丙烯薄膜邊貼合在樹脂組成物層之表面邊捲繞成輥狀。將輥狀的黏著薄膜裁成寬507mm,獲得尺寸為507×336mm的片狀黏著薄膜。[Production of Resin Laminate] The obtained varnish was uniformly applied to a release surface of a PET film having a release layer by a die coater so that the thickness of the dried resin composition layer became 8 μm or 20 μm at 150 Dry at ~180 ° C for 3 minutes. Then, a polypropylene film having a thickness of 15 μm was wound into a roll shape while being bonded to the surface of the resin composition layer. The roll-shaped adhesive film was cut to a width of 507 mm to obtain a sheet-like adhesive film having a size of 507 × 336 mm.
[於樹脂絕緣層形成介層孔] 將黏著薄膜暫時貼附在已形成電路(電路導體厚18μm)之尺寸510×340mm、厚度0.2mm之覆銅疊層板的兩面,利用Nichigo Morton(股)製真空層合機於溫度130℃、壓力10kgf/cm2 、氣壓5mmHg以下的條件層合在兩面,再連續地於溫度180℃、壓力10kgf/cm2 之條件實施利用SUS鏡板所為之熱壓製。其次,於附有附設脫模層之PET薄膜的狀態以180℃、30分之條件使其熱硬化,於電路基板兩面形成絕緣層。冷卻至室溫後,不將附脫模層之PET薄膜剝離,而是從其上利用三菱電機(股)製二氧化碳雷射裝置(ML605GTWIII-H-5200U)進行開孔,形成盲通孔(假定頂部直徑20~30μm)。又,因假定頂部直徑20~30μm,故於黏有本例之附脫模層之PET薄膜之狀態時,開孔時的遮罩直徑使用0.6mm。[Formation of via hole in resin insulating layer] The adhesive film was temporarily attached to both sides of a copper clad laminate having a size of 510 × 340 mm and a thickness of 0.2 mm which was formed into a circuit (circuit conductor thickness: 18 μm), and Nichigo Morton (share) was used. The vacuum laminator was laminated on both surfaces under the conditions of a temperature of 130 ° C, a pressure of 10 kgf/cm 2 , and a gas pressure of 5 mmHg or less, and was continuously subjected to hot pressing by a SUS mirror plate under the conditions of a temperature of 180 ° C and a pressure of 10 kgf / cm 2 . Next, the PET film with the release layer attached thereto was thermally cured at 180 ° C for 30 minutes to form an insulating layer on both surfaces of the circuit board. After cooling to room temperature, the PET film with the release layer was not peeled off, but a carbon dioxide laser device (ML605GTWIII-H-5200U) made of Mitsubishi Electric Co., Ltd. was used for opening to form a blind via hole (assuming The top diameter is 20~30μm). Further, since the top diameter is assumed to be 20 to 30 μm, when the PET film with the release layer of this example is adhered, the diameter of the mask at the time of opening is 0.6 mm.
實施例1:總厚度75μm之附脫模層之PET薄膜之使用 使用總厚度75μm之附脫模層之PET薄膜作為雷射衰減用之脫模薄膜,塗佈均勻使乾燥後之樹脂組成物層之厚度成為20μm,以表1之實施例1之欄記載之加工能量實施開孔。Example 1: Use of a PET film with a release layer of a total thickness of 75 μm A PET film having a release layer of a total thickness of 75 μm was used as a release film for laser attenuation, and uniformly coated to form a resin composition layer after drying. The thickness was 20 μm, and the opening was performed by the processing energy described in the column of Example 1 of Table 1.
實施例2:總厚度100μm之附脫模層之PET薄膜之使用 使用總厚度100μm之附脫模層之PET薄膜作為雷射衰減用之脫模薄膜,塗佈均勻使乾燥後之樹脂組成物層之厚度成為20μm,以表1之實施例2之欄記載之加工能量實施開孔。Example 2: Use of a PET film with a release layer of a total thickness of 100 μm A PET film having a release layer of a total thickness of 100 μm was used as a release film for laser attenuation, and uniformly coated to form a resin composition layer after drying. The thickness was 20 μm, and the opening was performed by the processing energy described in the column of Example 2 of Table 1.
實施例3:總厚度125μm之附脫模層之PET薄膜之使用 使用總厚度125μm之附脫模層之PET薄膜作為雷射衰減用之脫模薄膜,塗佈均勻使乾燥後之樹脂組成物層之厚度成為20μm,以表1之實施例3之欄記載之加工能量實施開孔。Example 3: Use of a PET film with a release layer of a total thickness of 125 μm A PET film having a release layer of a total thickness of 125 μm was used as a release film for laser attenuation, and uniformly coated to form a resin composition layer after drying. The thickness was 20 μm, and the opening was performed by the processing energy described in the column of Example 3 of Table 1.
實施例4:總厚度100μm之附脫模層之PET薄膜之使用 使用總厚度100μm之附脫模層之PET薄膜作為雷射衰減用之脫模薄膜,塗佈均勻使乾燥後之樹脂組成物層之厚度成為8μm,以表1之實施例4之欄記載之加工能量實施開孔。Example 4: Use of a PET film with a release layer of a total thickness of 100 μm A PET film having a release layer of a total thickness of 100 μm was used as a release film for laser attenuation, and uniformly coated to form a resin composition layer after drying. The thickness was 8 μm, and the opening was performed by the processing energy described in the column of Example 1 of Table 1.
實施例5:總厚度100μm之附脫模層之PEN薄膜之使用 使用總厚度100μm之附脫模層之PEN薄膜作為雷射衰減用之脫模薄膜,塗佈均勻使乾燥後之樹脂組成物層之厚度成為20μm,以表1之實施例5之欄記載之加工能量實施開孔。Example 5: Use of a PEN film with a release layer of a total thickness of 100 μm A PEN film having a release layer of a total thickness of 100 μm was used as a release film for laser attenuation, and uniformly coated to form a resin composition layer after drying. The thickness was 20 μm, and the opening was performed by the processing energy described in the column of Example 5 of Table 1.
實施例6:併用氧化鎂與二氧化矽作為無機填充材 將氧化鎂75質量份(SMO-0.4、堺化學工業(股)製、平均粒徑0.4μm)、二氧化矽(SFP-130MC)50質量份摻合於清漆以作為無機填充材,除此以外和前述樹脂組成物同樣進行,獲得清漆(樹脂組成物之溶液)。 使用獲得之清漆,並使用總厚度100μm之附脫模層之PET薄膜作為雷射衰減用之脫模薄膜,塗佈均勻使乾燥後之樹脂組成物層之厚度成為20μm,以表1之實施例6之欄記載之加工能量實施開孔。Example 6: Magnesium oxide and cerium oxide were used as an inorganic filler in an amount of 75 parts by mass of magnesium oxide (SMO-0.4, manufactured by Seiko Chemical Co., Ltd., average particle diameter: 0.4 μm), and cerium oxide (SFP-130MC) 50. A varnish (a solution of a resin composition) was obtained in the same manner as the above-described resin composition, except that the varnish was blended as a varnish. The obtained varnish was used, and a PET film having a release layer of 100 μm in total thickness was used as a release film for laser attenuation, and the coating was uniformly applied so that the thickness of the dried resin composition layer became 20 μm, and the example of Table 1 was used. The processing energy described in column 6 is used to perform the opening.
比較例1:總厚度38μm之附脫模層之PET薄膜之使用 使用總厚度38μm之附脫模層之PET薄膜作為雷射衰減用之脫模薄膜,塗佈均勻使乾燥後之樹脂組成物層之厚度成為20μm,以表1之比較例1之欄記載之加工能量實施開孔。(遮罩直徑0.4mm)。Comparative Example 1: Use of a PET film with a release layer of a total thickness of 38 μm A PET film having a release layer of a total thickness of 38 μm was used as a release film for laser attenuation, and uniformly coated to form a resin composition layer after drying. The thickness was 20 μm, and the opening was performed by the processing energy described in the column of Comparative Example 1 of Table 1. (Mask diameter 0.4mm).
比較例2:總厚度50μm之附脫模層之PET薄膜之使用 使用總厚度50μm之附脫模層之PET薄膜作為雷射衰減用之脫模薄膜,塗佈均勻使乾燥後之樹脂組成物層之厚度成為20μm,以表1之比較例2之欄記載之加工能量實施開孔。(遮罩直徑0.4mm)。Comparative Example 2: Use of a PET film with a release layer of a total thickness of 50 μm A PET film having a release layer of a total thickness of 50 μm was used as a release film for laser attenuation, and uniformly coated to form a resin composition layer after drying. The thickness was 20 μm, and the opening was performed by the processing energy described in the column of Comparative Example 2 of Table 1. (Mask diameter 0.4mm).
比較例3:總厚度188μm之附脫模層之PET薄膜之使用 使用總厚度188μm之附脫模層之PET薄膜作為雷射衰減用之脫模薄膜,塗佈均勻使乾燥後之樹脂組成物層之厚度成為20μm,以表1之比較例3之欄記載之加工能量實施開孔。Comparative Example 3: A PET film having a release layer of a total thickness of 188 μm was used. A PET film having a release layer of a total thickness of 188 μm was used as a release film for laser attenuation, and uniformly coated to form a resin composition layer after drying. The thickness was 20 μm, and the opening was performed by the processing energy described in the column of Comparative Example 3 of Table 1.
比較例4:總厚度38μm之附脫模層之PET薄膜之使用 使用總厚度38μm之附脫模層之PET薄膜作為雷射衰減用之脫模薄膜,塗佈均勻使乾燥後之樹脂組成物層之厚度成為8μm,以表1之比較例4之欄記載之加工能量實施開孔(遮罩直徑0.4mm)。Comparative Example 4: Use of a PET film with a release layer of a total thickness of 38 μm A PET film having a release layer of a total thickness of 38 μm was used as a release film for laser attenuation, and uniformly coated to form a resin composition layer after drying. The thickness was 8 μm, and the opening was performed by the processing energy described in the column of Comparative Example 4 of Table 1 (mask diameter: 0.4 mm).
比較例5:使用鍍敷剝離強度低之樹脂組成物作為樹脂組成物 就環氧樹脂而言,將聯苯芳烷基型環氧樹脂(NC-3000-H、日本化藥(股)製)、及萘型環氧樹脂(HP4710、DIC(股)製)改為使用雙酚A型環氧樹脂(EPIKOTE 1001、三菱化學(股)製)60.2質量份,且不摻合無機填充材,除此以外和前述樹脂組成物同樣進行,獲得清漆(樹脂組成物之溶液)。 使用獲得之清漆,並使用總厚度75μm之附脫模層之PET薄膜作為雷射衰減用之脫模薄膜,塗佈均勻使乾燥後之樹脂組成物層之厚度成為20μm,以表1之比較例5之欄記載之加工能量實施開孔。Comparative Example 5: A resin composition having a low peeling strength as a resin composition, and a biphenyl aralkyl type epoxy resin (NC-3000-H, manufactured by Nippon Kayaku Co., Ltd.) And naphthalene type epoxy resin (made by HP4710, DIC) to 60.2 parts by mass of bisphenol A type epoxy resin (EPIKOTE 1001, manufactured by Mitsubishi Chemical Corporation), and without inorganic filler, Other than the above resin composition, a varnish (a solution of a resin composition) was obtained. The obtained varnish was used, and a PET film having a release layer of 75 μm in total thickness was used as a release film for laser attenuation, and the coating was uniformly applied so that the thickness of the dried resin composition layer became 20 μm, and the comparative example of Table 1 was used. The processing energy described in column 5 is used to perform the opening.
(濕式粗糙化處理與導體層鍍敷) 於實施例1~6及比較例1~5進行雷射開孔後將附脫模層之PET薄膜剝離,實施兼為去膠渣處理之絕緣層之表面處理。表面處理係以上村工業製之去膠渣處理進行處理(膨潤:Appdes MDS-37、粗糙化:Appdes MDE-40及Appdes ELC-SH、中和:Appdes MDN-62),通過膨潤60℃×5分鐘、粗糙化70℃×20分鐘、中和35℃×5分鐘的步驟以進行。以上村工業製之無電解銅鍍敷處理(使用藥液名:MCD-PL、MDP-2、MAT-SP、MAB-4-C、MEL-3-APEA ver.2)實施約0.5μm之無電解銅鍍敷,於130℃進行1小時之乾燥。比較例5於乾燥後在無電解銅鍍敷層出現膨起,故無法實施之後之評價。然後實施電解銅鍍敷使鍍敷銅之厚度成為18μm,於180℃實施1小時之乾燥。(Wet Roughening Treatment and Conductor Layer Plating) After performing laser opening in Examples 1 to 6 and Comparative Examples 1 to 5, the PET film with the release layer was peeled off, and an insulating layer which was also subjected to desmear treatment was performed. Surface treatment. The surface treatment is treated by the above-mentioned village industrial degumming treatment (swelling: Appdes MDS-37, roughening: Appdes MDE-40 and Appdes ELC-SH, neutralization: Appdes MDN-62), by swelling 60 ° C × 5 The procedure of minute, roughening 70 ° C × 20 minutes, neutralization 35 ° C × 5 minutes was carried out. The electroless copper plating treatment (using the chemical liquid name: MCD-PL, MDP-2, MAT-SP, MAB-4-C, MEL-3-APEA ver. 2) manufactured by the above-mentioned village industry is implemented to be about 0.5 μm. Electrolytic copper plating was carried out at 130 ° C for 1 hour. In Comparative Example 5, swelling occurred in the electroless copper plating layer after drying, and the subsequent evaluation could not be performed. Then, electrolytic copper plating was carried out so that the thickness of the plated copper became 18 μm, and drying was performed at 180 ° C for 1 hour.
(測定方法) 1)通孔之頂部直徑、底部直徑測定 以數位顯微鏡(Keyence製VHX-2000)觀察盲通孔,就通孔之頂部直徑及底部直徑,以3點近似圓之直徑測定10處並求平均値。結果示於表1。 2)鍍敷銅黏著力 準備已施以鍍敷銅之疊層板,依JIS C6481測定3次並求平均值以作為鍍敷銅之黏著力。關於於電解銅鍍敷後之乾燥時膨起的樣本,使用未膨起的部分進行評價。結果示於表1。 【表1】
針對實施例2與比較例1,於介層孔形成後將樹脂疊層體切斷,拍攝介層孔之切斷剖面。結果示於圖2A(比較例1)及B(實施例2)。In Example 2 and Comparative Example 1, after the formation of the via hole, the resin laminate was cut, and the cut-off cross section of the via hole was taken. The results are shown in Fig. 2A (Comparative Example 1) and B (Example 2).
1‧‧‧樹脂絕緣層
2‧‧‧雷射衰減用之脫模薄膜
3‧‧‧介層孔
4‧‧‧頂部直徑
5‧‧‧底部直徑
6‧‧‧推拔1‧‧‧Resin insulation
2‧‧‧Release film for laser attenuation
3‧‧‧Interlayer hole
4‧‧‧ top diameter
5‧‧‧ bottom diameter
6‧‧‧ Push
圖1係顯示二氧化碳雷射之雷射強度分布之示意圖。 圖2中,圖2A係顯示對於由厚度20μm之樹脂絕緣層構成之樹脂板進行雷射加工後之樹脂板之剖面圖。圖2B顯示對於包括厚度20μm之樹脂絕緣層與厚度100μm之脫模薄膜的樹脂疊層體,從脫模薄膜側進行雷射加工後之樹脂疊層體之剖面圖。Figure 1 is a schematic diagram showing the laser intensity distribution of a carbon dioxide laser. In Fig. 2, Fig. 2A is a cross-sectional view showing a resin sheet subjected to laser processing on a resin sheet composed of a resin insulating layer having a thickness of 20 μm. 2B is a cross-sectional view showing the resin laminate after laser processing from the release film side for a resin laminate including a resin insulating layer having a thickness of 20 μm and a release film having a thickness of 100 μm.
無no
1‧‧‧樹脂絕緣層 1‧‧‧Resin insulation
2‧‧‧雷射衰減用之脫模薄膜 2‧‧‧Release film for laser attenuation
3‧‧‧介層孔 3‧‧‧Interlayer hole
4‧‧‧頂部直徑 4‧‧‧ top diameter
5‧‧‧底部直徑 5‧‧‧ bottom diameter
6‧‧‧推拔 6‧‧‧ Push
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| WO2020105957A1 (en) | 2018-11-21 | 2020-05-28 | 엘지이노텍 주식회사 | Jig for via-hole processing, via-hole processing device, and via-hole processing method using same |
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| US5584956A (en) * | 1992-12-09 | 1996-12-17 | University Of Iowa Research Foundation | Method for producing conductive or insulating feedthroughs in a substrate |
| JP3899544B2 (en) | 1996-03-06 | 2007-03-28 | 日立化成工業株式会社 | Manufacturing method of multilayer wiring board |
| JPH11140275A (en) * | 1997-11-11 | 1999-05-25 | Sumitomo Chem Co Ltd | Polyfunctional cyanate resin composition and printed wiring board |
| JPH11186719A (en) * | 1997-12-19 | 1999-07-09 | Hitachi Chem Co Ltd | Manufacturing multilayered wiring board |
| JPH11330667A (en) * | 1998-05-12 | 1999-11-30 | Mitsubishi Gas Chem Co Inc | Auxiliary material for carbon dioxide laser drilling |
| JPH11342492A (en) * | 1998-05-29 | 1999-12-14 | Mitsubishi Gas Chem Co Inc | Auxiliary sheet for carbon dioxide laser drilling |
| JP3670487B2 (en) * | 1998-06-30 | 2005-07-13 | 京セラ株式会社 | Wiring board manufacturing method |
| JP2001007535A (en) * | 1999-06-17 | 2001-01-12 | Mitsubishi Gas Chem Co Inc | Method for manufacturing multilayer printed wiring board having through hole with excellent reliability |
| JP4300687B2 (en) | 1999-10-28 | 2009-07-22 | 味の素株式会社 | Manufacturing method of multilayer printed wiring board using adhesive film |
| JP2002313914A (en) * | 2001-04-18 | 2002-10-25 | Sony Corp | Wiring forming method, element arranging method using the same, and method of manufacturing image display device |
| JP4683758B2 (en) * | 2001-04-26 | 2011-05-18 | 京セラ株式会社 | Wiring board manufacturing method |
| ATE311736T1 (en) * | 2001-09-01 | 2005-12-15 | Trumpf Lasertechnik Gmbh | METHOD FOR MAKING HOLES IN A MULTI-LAYER CIRCUIT BOARD |
| JP4707289B2 (en) * | 2001-09-27 | 2011-06-22 | 京セラ株式会社 | Manufacturing method of multilayer wiring board |
| KR100443375B1 (en) * | 2001-12-28 | 2004-08-09 | 삼성전기주식회사 | Method for preparing multilayer printed circuit board by build-up process |
| JP2003231762A (en) * | 2002-02-13 | 2003-08-19 | Mitsubishi Gas Chem Co Inc | Prepreg and laminate |
| JP2005005283A (en) * | 2003-06-09 | 2005-01-06 | Mitsubishi Gas Chem Co Inc | Laser drilling assist sheet |
| KR20080088670A (en) * | 2004-02-04 | 2008-10-02 | 이비덴 가부시키가이샤 | Multilayer printed wiring board |
| JP4817733B2 (en) * | 2005-07-06 | 2011-11-16 | 富士通株式会社 | Metal surface treatment liquid, laminate and method for producing laminate |
| JP2007307599A (en) * | 2006-05-20 | 2007-11-29 | Sumitomo Electric Ind Ltd | Through-hole molded body and laser processing method |
| TWI432122B (en) * | 2007-11-22 | 2014-03-21 | Ajinomoto Kk | Manufacturing method of multilayer printed circuit board |
| US9758876B2 (en) * | 2012-11-29 | 2017-09-12 | Corning Incorporated | Sacrificial cover layers for laser drilling substrates and methods thereof |
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