TW201602528A - Photometry measurement device - Google Patents
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Abstract
Description
本發明是有關於一種測量裝置，且特別是有關於一種光度(photometry)測量裝置。 The present invention relates to a measuring device, and more particularly to a photometric measuring device.
近年來，光學照明在學術界及產業界的應用日益劇增。如發光二極體(Light emitting diode,LED)等新一世代的照明元件也逐漸普及於各個生活層面。這些光學元件在製造、販賣以及使用時，為符合消費者需求及品質控管，皆需要由測量儀器來對產品做光學參數上的測量。因此，在今日的產學界，舉凡各式的光學測量儀器，在測量的精準度以及量產的品質控管上比起過去幾年都有跳躍性的成長，愈來愈多的公司以及研究機構投入這個發展成熟的領域。 In recent years, the application of optical lighting in academia and industry has increased dramatically. New generations of lighting components such as light emitting diodes (LEDs) are also becoming more common in every aspect of life. In order to meet consumer demand and quality control, these optical components are manufactured, sold, and used. It is necessary to measure the optical parameters of the product by measuring instruments. Therefore, in today's industry and academia, there are more and more companies and research institutions in the measurement precision and quality control of the mass production than in the past few years. Invest in this mature field.
在光學照明元件的測量中，以常見的發光二極體為例，光通量(luminous flux)與色度(chromaticity)為非常重要的兩個光學參數。由於光通量與照明的面積有關，傳統上以積分球來測量。積分球收集打入球內的光，並在球殼內部形成反射效果，達到均勻光效應。在經過套在積分球球殼上的光偵測器可進行光度，例 如是光通量的測量。 In the measurement of optical lighting elements, in the case of common light-emitting diodes, luminous flux and chromaticity are two important optical parameters. Since the luminous flux is related to the area of the illumination, it is conventionally measured by an integrating sphere. The integrating sphere collects the light that is struck into the ball and creates a reflection effect inside the spherical shell to achieve a uniform light effect. The luminosity can be performed on a photodetector that is placed over the sphere ball shell. Such as the measurement of luminous flux.
然而，積分球不止成本高，體積也過於龐大而不易攜帶，對於需要隨時檢測照明元件的使用者或工程師極為不便。因此，發展低成本，可隨身攜帶的手持式光度測量裝置，尤其是能測量光通量的測量裝置是當前的迫切課題。 However, the integrating sphere is not only costly, but also bulky and not easy to carry, which is extremely inconvenient for users or engineers who need to detect lighting components at any time. Therefore, the development of a low-cost portable photometric device that can be carried around, especially a measuring device capable of measuring luminous flux, is an urgent issue at present.
本發明提供一種光度測量裝置，可用以量測待測光之與投射面積相關的光度。 The present invention provides a photometric measuring device that can be used to measure the luminosity associated with a projected area of a light to be measured.
本發明的實施例的光度測量裝置用以偵測一待測物，且包括一光偵測單元及一處理單元。光偵測單元用以偵測來自待測物的一待測光的一第一光度。處理單元電性連接至光偵測單元，用以根據待測物與光偵測單元的距離及待測物的發光角度計算出待測光的一投射面積，且用以根據投射面積與第一光度計算出與投射面積相關的一第二光度。 The photometric measuring device of the embodiment of the present invention is configured to detect an object to be tested, and includes a light detecting unit and a processing unit. The light detecting unit is configured to detect a first illuminance of a light to be measured from the object to be tested. The processing unit is electrically connected to the light detecting unit, and is configured to calculate a projected area of the light to be measured according to the distance between the object to be tested and the light detecting unit and the light emitting angle of the object to be tested, and is used according to the projected area and the first photometric A second luminosity associated with the projected area is calculated.
在本發明的一實施例中，第一光度為照度或輻照度，且第二光度為光通量或輻射通量。 In an embodiment of the invention, the first illuminance is illuminance or irradiance and the second luminosity is luminous flux or radiant flux.
在本發明的一實施例中，光偵測單元位於投射面積中的一個位置上。 In an embodiment of the invention, the light detecting unit is located at a position in the projected area.
在本發明的一實施例中，光度測量裝置更包括一使用者介面，電性連接至處理單元，且用以讓一使用者輸入距離與發光角度。 In an embodiment of the invention, the photometric device further includes a user interface electrically connected to the processing unit and configured to allow a user to input a distance and an illumination angle.
在本發明的一實施例中，光偵測單元為照度計或光譜儀。 In an embodiment of the invention, the light detecting unit is an illuminometer or a spectrometer.
在本發明的一實施例中，處理單元用以將投射面積與第一光度相乘，以得到第二光度。 In an embodiment of the invention, the processing unit is configured to multiply the projected area by the first illuminance to obtain the second luminosity.
在本發明的一實施例中，發光角度為一發光立體角，且處理單元將距離的平方乘以發光立體角，以得到投射面積。 In an embodiment of the invention, the illumination angle is an illumination solid angle, and the processing unit multiplies the square of the distance by the illumination solid angle to obtain a projected area.
在本發明的一實施例中，光度測量裝置的體積小於2200立方公分。 In an embodiment of the invention, the photometric measuring device has a volume of less than 2200 cubic centimeters.
在本發明的一實施例中，光度測量裝置更包括一顯示單元，電性連接至該處理單元，且用以顯示第二光度的數值。 In an embodiment of the invention, the photometric measuring device further includes a display unit electrically connected to the processing unit and configured to display a value of the second luminosity.
在本發明的實施例的光度測量裝置中，處理單元可根據待測物與光偵測單元的距離及待測物的發光角度計算出待測光的一投射面積，且根據投射面積與第一光度計算出與投射面積相關的一第二光度。因此，使用者可以採用本發明的實施例之光度測量裝置來獲得與投射面積相關的第二光度之光學參數，而可以不使用體積龐大且昂貴的積分球來獲得此類參數。所以，本發明的實施例之光度測量裝置可以增進使用的便利性與測量的效率。 In the photometric measuring device of the embodiment of the present invention, the processing unit may calculate a projected area of the light to be measured according to the distance between the object to be tested and the light detecting unit and the light emitting angle of the object to be tested, and according to the projected area and the first photometric A second luminosity associated with the projected area is calculated. Thus, the user can employ the photometric device of an embodiment of the present invention to obtain optical parameters of the second illuminance associated with the projected area, while such parameters can be obtained without the use of bulky and expensive integrating spheres. Therefore, the photometric measuring apparatus of the embodiment of the present invention can improve the convenience of use and the efficiency of measurement.
為讓本發明的上述特徵和優點能更明顯易懂，下文特舉實施例，並配合所附圖式作詳細說明如下。 The above described features and advantages of the invention will be apparent from the following description.
100、100b‧‧‧光度測量裝置 100, 100b‧‧‧photometric measuring device
102‧‧‧開口 102‧‧‧ openings
105‧‧‧殼體 105‧‧‧Shell
110、110b‧‧‧光偵測單元 110, 110b‧‧‧Light detection unit
110b2‧‧‧分光單元 110b2‧‧ ‧ Splitting unit
110b4‧‧‧影像感測器 110b4‧‧‧Image Sensor
120‧‧‧處理單元 120‧‧‧Processing unit
130‧‧‧使用者介面 130‧‧‧User interface
132‧‧‧輸入區塊 132‧‧‧Input block
140‧‧‧顯示單元 140‧‧‧Display unit
O、O2‧‧‧待測物 O, O2‧‧‧ test object
L‧‧‧待測光 L‧‧‧Measured light
L1‧‧‧第一光度 L1‧‧‧First luminosity
L2‧‧‧第二光度 L2‧‧‧second luminosity
E1‧‧‧第一電訊號 E1‧‧‧First Telecommunications
E2‧‧‧第二電訊號 E2‧‧‧second telecommunication number
D‧‧‧距離 D‧‧‧Distance
A‧‧‧角度 A‧‧‧ angle
S、S2‧‧‧面積 S, S2‧‧‧ area
P‧‧‧位置 P‧‧‧ position
圖1是依照本發明的一實施例的光度測量裝置的示意圖。 1 is a schematic diagram of a photometric measuring apparatus in accordance with an embodiment of the present invention.
圖2A是依照本發明的一實施例的光度測量裝置於測量發光二極體的光度時的側視示意圖。 2A is a side elevational view of a photometric measuring device for measuring the illuminance of a light emitting diode, in accordance with an embodiment of the present invention.
圖2B是依照本發明的一實施例的光度測量裝置於測量發光二極體的光度時的立體示意圖。 2B is a perspective view of a photometric measuring device for measuring the illuminance of a light emitting diode according to an embodiment of the invention.
圖3是依照本發明的一實施例的光度測量裝置於測量一待測物的光度的側視示意圖。 3 is a side elevational view of a photometric measuring device for measuring the luminosity of an object to be tested, in accordance with an embodiment of the present invention.
圖4是依照本發明的另一實施例的光度測量裝置的示意圖。 4 is a schematic diagram of a photometric measuring apparatus in accordance with another embodiment of the present invention.
圖1是依照本發明的一實施例的光度測量裝置的示意圖。圖2A是依照本實施例的光度測量裝置於測量發光二極體的光度時的側視示意圖。圖2B是依照本實施例的光度測量裝置於測量發光二極體的光度時的立體示意圖。請參考圖1、圖2A及圖2B，本實施例的光度測量裝置100用以偵測一待測物O。光度偵測裝置100包括一光偵測單元110及一處理單元120。在本實施例中，光度測量裝置100更包括一殼體105，殼體105具有一個開口102，用以讓待測光L進入光度測量裝置100內。光偵測單元110與處理單元120配置於殼體105內。光偵測單元110用以偵測來自待測物O的待測光L的一第一光度L1。在本實施例中，光偵測單元110例如是照度計，其可偵測來自待測物O的待測光L的第一光度L1，其中第一光度L1可以是照度(illuminance)或輻照度(irradiance)。 1 is a schematic diagram of a photometric measuring apparatus in accordance with an embodiment of the present invention. 2A is a side elevational view showing the photometric measuring device according to the present embodiment when measuring the illuminance of the light-emitting diode. 2B is a schematic perspective view of the photometric measuring device according to the embodiment for measuring the illuminance of the light emitting diode. Referring to FIG. 1 , FIG. 2A and FIG. 2B , the photometric measuring apparatus 100 of the embodiment is configured to detect an object to be tested O. The photometric detecting device 100 includes a photo detecting unit 110 and a processing unit 120. In the present embodiment, the photometric measuring device 100 further includes a housing 105 having an opening 102 for allowing the light to be measured L to enter the photometric measuring device 100. The light detecting unit 110 and the processing unit 120 are disposed in the housing 105. The light detecting unit 110 is configured to detect a first illuminance L1 of the light to be measured L from the object to be tested O. In this embodiment, the light detecting unit 110 is, for example, an illuminometer capable of detecting the first illuminance L1 of the light to be measured L from the object to be tested O, wherein the first illuminance L1 may be illuminance or irradiance ( Irradiance).
經由光偵測單元110得到的第一光度L1在光偵測單元110中轉換為第一電訊號E1。處理單元120電性連接至光偵測單元110，用以根據待測物O與光偵測單元110的距離D及待測物O的發光角度A計算出待測光L的一投射面積S，且用以根據投射面積S與第一光度L1計算出與投射面積S相關的一第二光度L2。在本實施例中，光偵測單元110將攜帶有第一光度L1的資訊的第一電訊號E1傳輸給處理單元120，且光度測量裝置100更包括一使用者介面130，電性連接至處理單元，且用以讓使用者輸入距離D與發光角度A的數值。然而，在其他實施例中，距離D與發光角度A亦可以是預設值而無須輸入，且光度測量裝置100則是用以量測特定種類的光源(例如特定種類的發光二極體)的光度測量裝置100。 The first illuminance L1 obtained by the light detecting unit 110 is converted into the first electrical signal E1 in the light detecting unit 110. The processing unit 120 is electrically connected to the light detecting unit 110 for calculating a projected area S of the light to be measured L according to the distance D between the object to be detected O and the light detecting unit 110 and the light emitting angle A of the object to be tested O, and A second illuminance L2 associated with the projected area S is calculated from the projected area S and the first illuminance L1. In this embodiment, the photo detecting unit 110 transmits the first electrical signal E1 carrying the information of the first illuminance L1 to the processing unit 120, and the photometric measuring device 100 further includes a user interface 130, which is electrically connected to the processing. The unit is used to allow the user to input the value of the distance D and the illumination angle A. However, in other embodiments, the distance D and the illumination angle A may also be preset values without input, and the photometric measuring device 100 is used to measure a specific kind of light source (for example, a specific kind of light emitting diode). Photometric measuring device 100.
具體而言，在本實施例中，處理單元120接收到對應於第一光度L1的第一電訊號E1後，結合使用者在使用者介面130上的輸入區塊132所輸入的待測物O(本實施例為發光二極體)的發光角度A及待測物O與光偵測單元110的距離D，可計算出投射面積S，其中投射面積S如圖2B所示為待測光L的波前的曲面面積，其中光偵測單元110位於投射面積S中的一個位置P上。更詳細的說，發光角度A為一立體角，處理單元120將使用者所輸入的距離D的平方乘以發光角度A(發光立體角)，得到投射面積S，亦即：(距離D)2×發光立體角A=面積S Specifically, in the embodiment, after the processing unit 120 receives the first electrical signal E1 corresponding to the first illuminance L1, the processing object 120 is input in conjunction with the input block 132 of the user on the user interface 130. The light-emitting angle A of the light-emitting diode (the light-emitting diode) and the distance D between the object to be tested O and the light detecting unit 110 can calculate the projected area S, wherein the projected area S is the light to be measured L as shown in FIG. 2B. The surface area of the wavefront, wherein the light detecting unit 110 is located at a position P in the projected area S. In more detail, the illumination angle A is a solid angle, and the processing unit 120 multiplies the square of the distance D input by the user by the illumination angle A (lighting solid angle) to obtain a projection area S, that is, (distance D) 2 ×Lighting solid angle A=area S
立體角是物體在一個觀測點為球心的球的投影面積與球的半徑的平方的比。此球心在本實施例中可以是待測物O。 The solid angle is the ratio of the projected area of the ball of the object at a point of observation to the square of the radius of the ball. This center of the sphere may be the object to be tested O in this embodiment.
在本實施例中，處理單元120更利用上述的投射面積S與第一光度L1計算出與投射面積S相關的第二光度L2，其中第二光度L2可以是光通量或輻射通量。光通量與輻射通量的物理意義已在前面提及，在此不再贅述。更詳細的說，處理單元120將投射面積S與第一光度L1相乘，得到第二光度L2，亦即：投射面積S×第一光度L1=第二光度L2 In the present embodiment, the processing unit 120 further calculates the second illuminance L2 related to the projected area S by using the above-described projected area S and the first illuminance L1, wherein the second illuminance L2 may be a luminous flux or a radiant flux. The physical meaning of luminous flux and radiant flux has been mentioned above and will not be described here. In more detail, the processing unit 120 multiplies the projection area S by the first illuminance L1 to obtain a second luminosity L2, that is, a projection area S×first illuminance L1=second luminosity L2
在本實施例中，處理單元120將攜帶有第二光度L2資訊的第二電訊號E2傳遞至處理單元120的顯示單元140，而顯示單元140用以顯示第二光度L2的數值，其中第二電訊號E2例如為一顯示訊號。顯示單元140例如是液晶顯示器、發光二極體顯示器、有機發光二極體顯示器或其他適當的顯示器。顯示單元140所顯示的第二光度L2的數值可以是光通量或輻射通量。上述的配合方式僅用於說明本實施例，而本發明不以此為限。 In this embodiment, the processing unit 120 transmits the second electrical signal E2 carrying the second luminosity L2 information to the display unit 140 of the processing unit 120, and the display unit 140 is configured to display the value of the second illuminance L2, wherein the second The electrical signal E2 is, for example, a display signal. Display unit 140 is, for example, a liquid crystal display, a light emitting diode display, an organic light emitting diode display, or other suitable display. The value of the second illuminance L2 displayed by the display unit 140 may be a luminous flux or a radiant flux. The foregoing cooperation manner is only used to describe the embodiment, and the present invention is not limited thereto.
在本實施例的光度測量裝置100中，處理單元120可根據待測物O與光偵測單元110的距離D及待測物O的發光角度A計算出待測光L的投射面積S，且根據投射面積S與第一光度L1計算出與投射面積S相關的第二光度L2。因此，使用者可以採用本實施例之光度測量裝置100來獲得與投射面積S相關的第二光度L2之光學參數，而可以不使用體積龐大且昂貴的積分球來獲得此類參數。所以，本實施例之光度測量裝置100可以增進使用的 便利性與測量的效率。 In the photometric measuring device 100 of the present embodiment, the processing unit 120 can calculate the projected area S of the light to be measured L according to the distance D between the object to be detected O and the light detecting unit 110 and the light emitting angle A of the object to be tested O, and according to The projected area S and the first illuminance L1 calculate the second illuminance L2 associated with the projected area S. Therefore, the user can use the photometric measuring device 100 of the present embodiment to obtain the optical parameters of the second illuminance L2 associated with the projected area S, and such parameters can be obtained without using a bulky and expensive integrating sphere. Therefore, the photometric measuring device 100 of the embodiment can be used for promotion. Convenience and measurement efficiency.
此外，上述之投射面積S是以投射於球面上的面積為例，但本發明不以此為限。在其他實施例中，投射面積S亦可以是投射於平面上的面積或投射於其他形狀的面上的面積，只要在投射面積S中的不同位置上的第一光度L1是均勻的，都可以將第一光度L1乘以投射面積S以得到第二光度L2。 In addition, the above-mentioned projected area S is an example of an area projected on the spherical surface, but the invention is not limited thereto. In other embodiments, the projected area S may also be an area projected on a plane or an area projected on a surface of other shapes, as long as the first illuminance L1 at different positions in the projected area S is uniform. The first illuminance L1 is multiplied by the projection area S to obtain a second luminosity L2.
圖3為圖1之光度測量裝置於測量另一種待測物的光度時的側視示意圖。請參考圖3，在本實施例中，待測物O2可以是發光角度A(發光立體角)為4π的光源，例如是一般常見的白熾燈泡。在此情形下，使用者可輸入發光角度為4π以及待測物O與光度測量裝置100的距離D即可得到對應於待測物O的光通量或輻射通量的數值。在本實施例中，投射面積S2的數值為待測物O與光度測量裝置100的距離D的平方乘以立體角(=4π)的圓球面面積，即習知的4πD2(4π乘以圓球的半徑的平方)。如此一來，本實施例之光度偵測裝置100便可以量測出光積分球所能量測到的4π立體角的光通量。上述的配合方式僅用於說明本實施例，而本發明不以此為限。 3 is a side elevational view of the photometric measuring device of FIG. 1 when measuring the luminosity of another object to be tested. Referring to FIG. 3, in the embodiment, the object to be tested O2 may be a light source having an illumination angle A (lighting solid angle) of 4π, such as a generally common incandescent bulb. In this case, the user can input a light-emitting angle of 4π and a distance D between the object to be tested O and the photometric device 100 to obtain a value corresponding to the luminous flux or the radiation flux of the object to be tested O. In the present embodiment, the value of the projected area S2 is the square of the distance D of the object to be measured O and the photometric measuring device 100 multiplied by the solid angle (= 4π), that is, the conventional 4πD 2 (4π times the circle) The square of the radius of the ball). In this way, the photometric detecting device 100 of the embodiment can measure the luminous flux of the 4π solid angle measured by the energy of the light integrating sphere. The foregoing cooperation manner is only used to describe the embodiment, and the present invention is not limited thereto.
圖4為本發明的另一實施例的光度測量裝置的示意圖。請參照圖1與圖4，本實施例之光度測量裝置100b與圖1之光度測量裝置100類似，而兩者的差異如下所述。在本實施例中，光偵測單元110b為光譜儀，例如是能夠測量照度的照度型的光譜儀110b。光偵測單元110b包括分光單元110b2及影像感測器110b4。 分光單元110b2例如是繞射光柵(diffraction grating)或分光鏡(spectroscope)。繞射光柵可以是透射式的光柵或反射式的光柵，而本實施例中以反射式光柵為例。在本實施例中，由待測物O所發出的待測光L透過開口102進入光偵測單元110b。光偵測單元110b中的分光單元110b2將待測光L中不同波長的成分在空間中分離，這些不同波長的成分照射於影像感測器110b4(例如一維影像感測器)上的不同位置，影像感測器110b4便可偵測到不同波長所對應的光度，亦即是得到一個光譜。處理單元120將光譜曲線下的面積積分，以得到待測光L的總光度(即上述之第一光度L1)。然後，如同圖1之實施例，處理單元120可根據待測物O的發光角度A及待測物與光度測量裝置100b的距離D及第一光度L1，而計算出第二光度L2，並使第二光度L2的數值顯示於顯示單元140，其中第二光度L2可以是光通量或輻射通量。光偵測單元110、處理單元120、使用者介面130及顯示單元140的運算及操作過程已於先前的實施例詳述，在此不再贅述。上述的配合方式僅用於說明本實施例，而本發明不以此為限。 4 is a schematic diagram of a photometric measuring apparatus according to another embodiment of the present invention. Referring to FIG. 1 and FIG. 4, the photometric measuring device 100b of the present embodiment is similar to the photometric measuring device 100 of FIG. 1, and the difference between the two is as follows. In the present embodiment, the photodetecting unit 110b is a spectrometer, for example, an illuminance type spectrometer 110b capable of measuring illuminance. The light detecting unit 110b includes a beam splitting unit 110b2 and an image sensor 110b4. The light splitting unit 110b2 is, for example, a diffraction grating or a spectroscope. The diffraction grating may be a transmissive grating or a reflective grating, and in this embodiment, a reflective grating is taken as an example. In this embodiment, the light to be detected L emitted by the object to be tested O passes through the opening 102 and enters the light detecting unit 110b. The light splitting unit 110b2 in the light detecting unit 110b separates components of different wavelengths in the light to be measured L in space, and the components of the different wavelengths are irradiated to different positions on the image sensor 110b4 (for example, a one-dimensional image sensor). The image sensor 110b4 can detect the luminosity corresponding to different wavelengths, that is, obtain a spectrum. The processing unit 120 integrates the area under the spectral curve to obtain the total luminosity of the light to be measured L (ie, the first illuminance L1 described above). Then, as in the embodiment of FIG. 1, the processing unit 120 can calculate the second illuminance L2 according to the illuminating angle A of the object to be tested O and the distance D between the object to be measured and the photometric device 100b and the first illuminance L1, and The value of the second luminosity L2 is displayed on the display unit 140, wherein the second luminosity L2 may be a luminous flux or a radiant flux. The operations and operations of the light detecting unit 110, the processing unit 120, the user interface 130, and the display unit 140 have been described in detail in the previous embodiments, and are not described herein again. The foregoing cooperation manner is only used to describe the embodiment, and the present invention is not limited thereto.
值得一提的是，上述所有關於本發明的實施例的光度測量裝置100、100b的體積皆可小於2200立方公分(cm3)，使得光度測量裝置100、100b可以作為手持式的可攜帶裝置。另外，處理單元120可以利用軟體、韌體或硬體的方式來實現上述功能。當處理單元120是以軟體的方式來實現時，處理單元120包括處理器(例如微處理器)、電性連接至處理器的隨機存取記憶體及電性 連接至隨機存取記憶體的儲存單元(例如為快閃記憶體、唯讀記憶體或硬碟)。當處理單元120運作時，儲存單元中的程式指令(例如程式碼)會先被載入隨機存取記憶體，然後隨機存取記憶體中的程式指令再被載入於處理器中，使處理器執行上述功能。另一方面，當處理單元120是以硬體的方式來實現時，處理單元120可以是數位邏輯電路。此外，本實施例之光度測量裝置100、100b亦可被整合至行動裝置(例如智慧型手機、平板電腦或數位相機)中，而處理器即為行動裝置的中央處理器(CPU)，而程式指令是以行動裝置的應用程式的方式來撰寫。 It is worth mentioning that all of the above photometric measuring devices 100, 100b according to embodiments of the present invention may have a volume of less than 2200 cubic centimeters (cm 3 ), so that the photometric measuring devices 100, 100b can be used as a hand-held portable device. In addition, the processing unit 120 can implement the above functions by means of software, firmware or hardware. When the processing unit 120 is implemented in a software manner, the processing unit 120 includes a processor (eg, a microprocessor), a random access memory electrically connected to the processor, and a storage electrically connected to the random access memory. Unit (for example, flash memory, read-only memory, or hard drive). When the processing unit 120 is in operation, the program instructions (such as the code) in the storage unit are first loaded into the random access memory, and then the program instructions in the random access memory are loaded into the processor for processing. The above functions are performed. On the other hand, when the processing unit 120 is implemented in a hardware manner, the processing unit 120 can be a digital logic circuit. In addition, the photometric measuring apparatus 100, 100b of the embodiment can also be integrated into a mobile device (such as a smart phone, a tablet or a digital camera), and the processor is a central processing unit (CPU) of the mobile device, and the program The instructions are written in the form of an application for the mobile device.
綜上所述，本發明的實施例藉著由軟體、韌體或硬體方式所呈現的處理單元，藉由使用者輸入的待測物的發光角度及待測物與光度測量裝置的距離而計算出投射面積，再結合光偵測單元所偵測到的待測物的第一光度，例如是照度及輻照度，得以計算出待測物的第二光度，例如是光通量及輻射通量。相較於傳統使用大型積分球的方法，本發明的光度測量裝置不止體積減小至掌上型尺寸，花費成本也降低許多，對光學測量，尤其是發光元件的品質控管及採購篩選是一大突破與貢獻。 In summary, the embodiment of the present invention uses the processing unit presented by the software, the firmware or the hardware to obtain the illumination angle of the object to be tested and the distance between the object to be tested and the photometric device. Calculating the projected area, combined with the first illuminance of the object to be detected detected by the light detecting unit, such as illuminance and irradiance, can calculate the second illuminance of the object to be tested, such as luminous flux and radiant flux. Compared with the traditional method of using a large integrating sphere, the photometric measuring device of the invention not only reduces the volume to the size of the palm-size, but also reduces the cost, and is a major measure for optical measurement, especially for the quality control and procurement of the light-emitting components. Breakthrough and contribution.
雖然本發明已以實施例揭露如上，然其並非用以限定本發明，任何所屬技術領域中具有通常知識者，在不脫離本發明的精神和範圍內，當可作些許的更動與潤飾，故本發明的保護範圍當視後附的申請專利範圍所界定者為準。 Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention, and any one of ordinary skill in the art can make some changes and refinements without departing from the spirit and scope of the present invention. The scope of the invention is defined by the scope of the appended claims.
100‧‧‧光度測量裝置 100‧‧‧Photometric measuring device
102‧‧‧開口 102‧‧‧ openings
105‧‧‧殼體 105‧‧‧Shell
110‧‧‧光偵測單元 110‧‧‧Light detection unit
120‧‧‧處理單元 120‧‧‧Processing unit
130‧‧‧使用者介面 130‧‧‧User interface
132‧‧‧輸入區塊 132‧‧‧Input block
140‧‧‧顯示單元 140‧‧‧Display unit
L‧‧‧待測光 L‧‧‧Measured light
E1‧‧‧第一電訊號 E1‧‧‧First Telecommunications
E2‧‧‧第二電訊號 E2‧‧‧second telecommunication number
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| CN201410478225.8A CN105318967A (en) | 2014-07-07 | 2014-09-18 | Photometric measuring device |
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| JP2009150791A (en) * | 2007-12-21 | 2009-07-09 | Oputo System:Kk | Photometric device for illuminant |
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| US8786847B2 (en) * | 2011-01-12 | 2014-07-22 | Underwriters Laboratories, Inc. | Light measuring meter apparatus |
| CN102213615B (en) * | 2011-04-01 | 2013-05-08 | 中国兵器工业第二〇五研究所 | LED optical parameter comprehensive testing device |
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| CN202274926U (en) * | 2011-10-13 | 2012-06-13 | 中华人民共和国镇江出入境检验检疫局 | Citopic vision luminous flux measurement device |
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