TW201508464A - Filtration method for abnormal sensing data of monitoring chip - Google Patents

Abstract

A filtration method for an abnormal sensing data of a monitoring chip is disclosed. A sensing data is gotten from a sensor real-time monitoring the sensed object. The monitoring chip receives the sensing data from the sensor every sensing time interval. A time of the monitoring chip receiving continuously a plurality of abnormal sensing data extends as long as to a setting time, the monitoring chip puts to use the latest receiving one of the plurality of abnormal sensing data and indicates the sensed object as abnormal. A time of the monitoring chip receiving continuously a plurality of abnormal sensing data does not extend as long as to a setting time, the monitoring chip puts to use the last receiving one sensing data before the plurality of abnormal sensing data not the plurality of abnormal sensing data.

Description

Monitoring method for filtering abnormal data of the wafer

The present invention relates to a filtering method, and more particularly to a filtering method for monitoring a wafer for sensing data of anomalies.

In a general electronic device (such as a computer), a serial communication bus (such as I ² C) directly connected to a main system circuit (such as a motherboard) is too long, causing data to be subjected to current during transmission. Or interference from other factors, resulting in changes in the transmitted data, the monitoring chip will receive abnormal sensing data, and make a wrong judgment on the state of the power supply, although the state of the power supply is actually normal, but Because the monitoring chip receives the abnormal sensing data, the main system circuit turns on the self-protection mechanism and automatically shuts down, which causes inconvenience in the use of the electronic device.

The current monitoring chips simply receive data to transmit signals to other system modules. Although the relevant system modules can perform corresponding protection measures when receiving abnormal data, they cannot judge the correctness of the received data. Therefore, how to enable the monitoring chip to filter the received data and make the main system circuit operate stably is a major research One of the issues has also become a target for improvement in the relevant fields.

One aspect of the present invention is to provide a filtering method for monitoring wafer sensing data for anomalies to solve the problems of the prior art.

In one embodiment, the method for filtering the abnormality sensing data of the monitoring chip provided by the present invention is obtained by the sensor monitoring the monitored object in real time, and the monitoring chip is received once every detection time interval from the sensing. The sensing data of the device includes: when the monitoring chip continuously receives the plurality of abnormal sensing data for a set time, the last received sensing data of the plurality of abnormal sensing data is used and the indication is The monitoring object is abnormal; when the monitoring chip continuously receives the plurality of abnormal sensing data for less than the set time, the sensing data received before the abnormal sensing data is used instead of the multiple abnormal sensing. data.

In one embodiment, the monitor wafer is recorded with record data corresponding to the sensor, and the record data is updated according to the sensed data.

In an embodiment, the last received sensing data in the plurality of abnormal sensing data is used to update the last received sensing data among the plurality of abnormal sensing data.

In an embodiment, the sensing data received last time before the plurality of abnormal sensing data is used refers to the sensing data updated with the last received sensing data before using the plurality of abnormal sensing data.

In an embodiment, the difference between the received sensing data and the corresponding recorded data when the sensing data is received reaches a preset abnormality range. When it is around, the sensed data is abnormal sensed data.

In an embodiment, when the difference between the received sensing data and the corresponding recorded data when the sensing data is received does not reach a preset abnormal range, the recorded data is updated using the sensing data.

In one embodiment, the monitor wafer in the filtering method is a substrate management controller (BMC).

In an embodiment, the sensor in the filtering method is a temperature sensor for detecting the temperature of the object to be monitored.

In one embodiment, the temperature sensor is electrically coupled to the monitor wafer.

In an embodiment, the monitored object is a power controller.

In summary, the technical solution of the present invention has obvious advantages and beneficial effects compared with the prior art. With the above technical solution, considerable technological progress can be achieved, and the industrial use value is widely used. The advantage is that the monitoring chip can filter the received data, so that the main system circuit can operate stably.

100, 200, 210, 220, 221~223‧‧ steps

The above and other objects, features, advantages and embodiments of the present invention will become more <RTIgt; <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; Flow chart of the filtering method.

In order to make the description of the present invention more detailed and complete, reference may be made to the accompanying The figures and the various embodiments described below, the same numbers in the drawings represent the same or similar elements. On the other hand, well-known elements and steps are not described in the embodiments to avoid unnecessarily limiting the invention.

The monitoring chip in the device monitors changes in the internal environmental factors of the device (such as the temperature at which the power supply operates) to provide information such as hardware (such as CPU) or firmware (such as BIOS). The corresponding processing, if the internal environmental factors of the device exceed the critical value, or the system components fail, the monitoring chip will record abnormal conditions or data for inquiry, issue a warning to remind the device manager, or activate the device itself. Protection mechanisms (eg, shutdown) to avoid damage to the device caused by excessive changes in environmental factors.

1 is a flow chart of a method for filtering a wafer for sensing abnormal data according to an embodiment of the invention. The monitoring chip in the device continuously receives the sensing data from the sensor in the device, and monitors the sensing data. As shown in FIG. 1 , in step 100, the monitoring chip is detected at intervals of one detection interval (eg, : 1 second) will receive the sensing data from the sensor, the device manager can set the interval detection time in the sensor program, so that the sensor will sense the data every interval of detection time. Transfer to the monitor chip, or the device manager can set the interval between the sensor to transmit the sensed data through the system program in the device.

During the process of transmitting the sensing data to the monitoring chip, sometimes the sensing data changes due to some interference factors (such as current, noise), and the sensing data cannot be faithfully transmitted to the monitoring chip; when sensing After the data is transferred to the monitoring chip, the monitoring chip will immediately calculate the sensing data and from the sensing Before the data difference between the sensed data, under normal conditions, the sensed data obtained by the monitor wafer before and after the interval detection time does not change greatly. If the change is large, it may be caused by the following two conditions: The first is that the sensed data is indeed interfered by the noise, causing the sensed data to be abnormal. The second is that the sensor's sensed data faithfully reflects the abnormal change of the internal environment of the device. This situation is indeed the function of the monitor chip. However, if the first situation occurs, it will cause the monitoring chip to misjudge the sensing data, so that the abnormal sensing data is recorded, and even the device itself initiates the self-protection mechanism, causing trouble to the device manager, so when monitoring After receiving the sensing data, the wafer does not immediately update the recorded data in the monitoring wafer according to the sensing data of the sensor, and the monitoring chip first calculates the sensing data and the corresponding recording data when the sensing data is received. The difference is then judged.

In step 200, the monitor chip calculates the sensed data and receives it. Whether the difference between the corresponding recorded data reaches the preset abnormal range when the data is sensed, where the difference between the sensed data and the recorded data corresponding to the received sensed data is called a data difference, when the data is different When the preset abnormal range is reached, the device will initiate a self-protection mechanism to avoid damage to the device caused by excessive changes in environmental factors, and the device manager can set the abnormal range in the program for monitoring the wafer, or through the system in the device. The program sets the abnormal range in the monitoring chip; when the data difference reaches the preset abnormal range, it is not necessarily caused by the excessive change of the internal environmental factors of the device, or the sensing data may be distorted by the interference factor, and the distortion is sensed. The data causes the data difference to reach a preset abnormal range, and in order to determine the reason that the data difference reaches the abnormal range, in step 220 When the data difference between the sensed data and the record data corresponding to the received sensed data reaches a preset abnormal range, the sensed data received last time is retained as normal data, thereby using the normal data. As a reference, the sensing data received by the monitoring wafer is monitored, and the reason why the data difference reaches the preset abnormal range is determined, so that the device performs the corresponding processing based on the reason.

The monitoring chip receives the data difference to reach the preset After the abnormal range of sensing data, the plurality of sensing data from the sensor are continuously received. At this time, the monitoring chip calculates the data difference between the subsequent plurality of sensing data and the normal data by using the normal data as a reference. Therefore, the duration of the situation in which the data difference reaches the preset abnormal range is known, and the duration is called the hold time, and it is determined whether the hold time exceeds the set time, wherein the device manager can set the program in the monitor chip. The time is set, or the set time is set on the monitoring chip through the system program in the device, and the setting time depends on the length of time the device itself can endure the abnormality; in step 221, the sensing data is calculated and received on the monitoring chip. When the data is sensed, the difference between the corresponding recorded data reaches a preset abnormal range, and whether the holding time of the plurality of abnormal sensed data is continuously received reaches the set time.

When the hold time does not reach the set time, the monitor chip will be multiple The abnormal sensing data is regarded as a temporary environmental factor interference, or the internal environment of the device is a transient abnormality, and the duration of the abnormality is tolerable by the device itself; in step 222, when the holding time does not reach the setting At the time of the time, the monitoring chip will use the sensing data before receiving multiple abnormalities. The received sensing data is received at one time without using a plurality of abnormal sensing data, and the recorded data in the monitoring wafer is updated with the last sensing data before the abnormal sensing data.

In an embodiment, when the hold time reaches the set time, the monitoring chip regards the abnormal sensed data as a continuous environmental factor interference, or the internal environment of the device is abnormal, and the abnormality continues. The time may affect the operation of the device itself; in step 223, when the hold time reaches the set time, the monitor chip uses the last received sensed data among the plurality of abnormal sensed data, in the plurality of abnormal sensed data. The last abnormal sensed data updates the recorded data in the monitor wafer and indicates that the monitored object is abnormal. Abnormal sensing data can be used by the device manager to track or correct the internal environment anomalies of the device, or to activate the self-protection mechanism of the device itself to avoid damage to the device caused by abnormal internal environment.

In an embodiment, the sensed data is used because it is normal data. It is retained in the monitor chip and used as the reference data to calculate the data difference between the sensed data and the subsequent sensed data. Therefore, after the sensed data is transmitted to the monitor wafer, the monitor wafer calculates the sensed data and the previous sensed data. Obtaining data difference, if the data difference calculated by the monitoring chip does not reach the preset abnormal range, the representative sensing data is normal data, so the normal sensing data can be directly updated; in step 210, when receiving When the difference between the sensed data and the record data corresponding to the time when the sensed data is received does not reach a predetermined abnormal range, the record data in the monitor wafer is updated using the sensed data.

In one embodiment, the monitor wafer in the filtering method is a substrate management controller. The baseboard management controller is included in the Intelligent Platform Management Interface (IPMI) and is a main controller in the intelligent platform management interface. It is connected to the other system modules also included in the smart platform management interface through the bus. Groups (eg, south bridge, hardware monitoring, power supply, sensors, chipset, peripheral interconnect slots, etc.) controllers transmit signals to monitor and record other system modules in the smart platform management interface Controller data.

In an embodiment, the sensor in the filtering method is a temperature sensor for detecting the temperature of the object to be monitored. The temperature sensor can be electrically connected to the object to be monitored to detect the temperature of the object to be monitored, or can be a temperature sensor in the form of a hard body or a firmware that has been incorporated into the object to be monitored.

In an embodiment, the monitored object in the filtering method is a power controller, which may be a power controller that provides the overall power of the device in the device, or a power controller of the power supply module in the smart platform management interface.

In one embodiment, the temperature sensor is electrically connected to the monitor wafer. The monitoring chip instantly updates the temperature sensor to detect the temperature from the power controller; for example, the monitoring chip receives the instantaneous temperature sensing data from the temperature sensor detecting the power controller operation every 1 second interval, and monitors the chip. The data difference between the temperature sensing data and the temperature sensing data received in the previous 1 second is calculated. When the comparison data difference reaches the abnormal range, the abnormal range is preset at 10 degrees Celsius, and under normal conditions, the stable operation is performed. The temperature of the power controller should not differ to 10 degrees Celsius within 1 second, so if this temperature sensing data and the temperature sensing received in the previous 1 second The data is within 10 degrees Celsius, and the monitoring chip will update the temperature sensing data. However, the temperature sensing data and the temperature sensing data received in the previous 1 second are more than 10 degrees Celsius, so they are retained. The temperature sensing data received in the previous 1 second is set as normal temperature sensing data.

The monitoring chip continuously monitors the plurality of temperature sensing data continuously received in the last one second or the second few seconds, and calculates the data difference between the plurality of temperature sensing data and the normal temperature sensing data received after one second or two seconds later. If the data retention time exceeds the abnormal range and the hold time does not reach the set time (for example, the set time is preset to 10 seconds), the monitoring chip considers the abnormal temperature change of the power controller as temporary, and monitors The wafer deletes the temperature sensing data and the plurality of temperature sensing data received in the last one second or the last few seconds, and updates the normal temperature sensing data.

However, if the data difference continues to reach the abnormal range and the retention time has reached 10 seconds, the monitoring chip updates the last received temperature sensing data of the plurality of abnormal sensing data to the recorded data in the monitoring wafer, and indicates The power controller is abnormal.

Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention, and the present invention can be modified and modified without departing from the spirit and scope of the present invention. The scope is subject to the definition of the scope of the patent application attached.

100, 200, 210, 220, 221~223‧‧ steps

Claims (10)

A filtering method for monitoring an abnormal sensing data of a wafer, wherein the sensing data is obtained by a sensor in real time monitoring a monitored object, and the monitoring chip receives the sensing data from the sensor every interval of detection time, The method includes: when the monitoring chip continuously receives the sensing data of the plurality of abnormalities for a set time, adopting the last received sensing data in the plurality of abnormal sensing data and indicating that the monitored object is abnormal; and monitoring the wafer continuous When the time when the sensing data of the plurality of abnormalities is received does not reach the set time, the sensing data that was received last time before the sensing data of the plurality of abnormalities is used instead of the sensing data of the plurality of abnormalities. The filtering method of claim 1, wherein the monitoring chip records a record data corresponding to the sensor, the record data being updated according to the sensed data. The filtering method of claim 2, wherein the last received sensing data of the abnormal sensing data is used to update the recorded data using the last received sensing data of the abnormal sensing data. The filtering method of claim 2, wherein the sensing data received last time before the abnormal sensing data is used refers to updating the recording number of the last received sensing data before using the abnormal sensing data. according to. The filtering method of claim 2, wherein when the difference between the received sensing data and the recorded data corresponding to the received sensing data reaches a preset abnormal range, the sensing data is Abnormal sensed data. The filtering method of claim 5, wherein the sensing is used when the difference between the received sensing data and the recorded data corresponding to the received sensing data does not reach a preset abnormal range. The data is updated with the recorded data. The filtering method of claim 1, wherein the monitoring chip is a substrate management controller (BMC). The filtering method of claim 1, wherein the sensor is a temperature sensor for detecting the temperature of the monitored object. The filtering method of claim 8, wherein the temperature sensor is electrically connected to the monitoring wafer. The filtering method of claim 1, wherein the monitored object is a power controller.