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TW201436062A - Grain selection method and die selection device for implementing the method - Google Patents

Grain selection method and die selection device for implementing the method Download PDF

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Publication number
TW201436062A
TW201436062A TW102109351A TW102109351A TW201436062A TW 201436062 A TW201436062 A TW 201436062A TW 102109351 A TW102109351 A TW 102109351A TW 102109351 A TW102109351 A TW 102109351A TW 201436062 A TW201436062 A TW 201436062A
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Taiwan
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die
film
adhesive film
adhesive
pushing
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TW102109351A
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Chinese (zh)
Inventor
廖惇材
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旺矽科技股份有限公司
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Priority to TW102109351A priority Critical patent/TW201436062A/en
Priority to CN201310177197.1A priority patent/CN104043594A/en
Publication of TW201436062A publication Critical patent/TW201436062A/en

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    • H10W72/0711

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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Laminated Bodies (AREA)

Abstract

一種晶粒選取設備及方法,該設備包含有一用以黏設複數晶粒之軟性薄膜、一與該軟性薄膜相對且可透光之黏性薄膜、一能隔著該黏性薄膜而拍攝該等晶粒之影像擷取裝置,以及一能隔著該軟性薄膜頂推各該晶粒之頂推裝置;該方法係先利用該影像擷取裝置對該等晶粒進行定位,再利用該頂推裝置隔著該軟性薄膜頂推一待轉黏至該黏性薄膜之晶粒,以使該受頂推之晶粒接觸該黏性薄膜,再利用該影像擷取裝置檢測前述受頂推之晶粒是否黏附於該黏性薄膜;藉此,該晶粒選取設備及方法可即時檢測到晶粒轉黏失誤之情況,以便即時再度進行轉黏動作。A die selection device and method, the device comprising a flexible film for bonding a plurality of crystal grains, a viscous film which is opposite to the flexible film and transparent to light, and capable of being photographed through the viscous film An image capturing device for the die, and a pushing device capable of pushing the respective die through the flexible film; the method firstly positioning the die by using the image capturing device, and then using the pushing The device pushes the die to be adhered to the die of the adhesive film via the flexible film, so that the pushed die contacts the adhesive film, and the image picking device is used to detect the topped crystal. Whether the granule adheres to the viscous film; thereby, the die selecting device and method can instantly detect the grain transfer error, so as to perform the transfer operation again.

Description

晶粒選取方法以及用以實施該方法的晶粒選取設備 Grain selection method and die selection device for implementing the method

本發明係與晶粒選取製程有關,特別是關於一種用以挑檢不良晶粒或者按晶粒分類等級挑選晶粒之晶粒選取設方法及用以實施前述方法的晶粒選取設備。 The present invention relates to a die selection process, and more particularly to a die selection method for picking out defective grains or selecting grains according to a grain classification level, and a die selection device for implementing the foregoing method.

在晶粒之壞晶(bad die)選取或分類選取製程中,晶圓(wafer)係先黏貼於俗稱藍膜(blue tape)的軟性薄膜上,再被切割成多數晶粒(die)。然後,就壞晶選取作業而言,可利用影像擷取裝置(例如CCD camera)檢測晶粒外觀進行晶粒良莠判斷及位置確認,再將不良品自軟性薄膜上挑除,最後,可將剩餘之晶粒同時自軟性薄膜取下,以便進一步進行諸如封裝之類的後續製程。其次,就晶粒分類選取作業而言,可利用影像擷取裝置對已經分類的晶粒進行位置確認,並利用選取置放裝置(pick-and-place arm)將該等晶粒依據其規格或等級分別取下並分類放置。 In the bad die selection or sorting process of the die, the wafer is first adhered to a soft film commonly known as blue tape, and then cut into a plurality of die. Then, in the case of the bad crystal selection operation, the image capturing device (for example, a CCD camera) can be used to detect the appearance of the crystal grain to perform the grain good judgment and the position confirmation, and then the defective product is removed from the soft film, and finally, The remaining grains are simultaneously removed from the flexible film for further processing such as packaging. Secondly, in the case of the die sorting operation, the image picking device can be used to confirm the position of the classified crystal grains, and the picking-and-place arm is used to select the crystal grains according to the specifications or Levels are removed and sorted separately.

請參閱我國第M386595號新型專利案,該專利提供一種半導體晶粒檢測脫離結構,係用以進行如前述之晶粒檢測及挑除不良品之程序。詳而言之,該結構在利用影像擷取裝置檢測晶粒之後,係利用一頂針單元由下而上地隔著軟性薄膜將晶粒不良品頂高,並利用一設置於晶粒上方之黏性薄膜黏取被頂高之晶粒,同時亦可利用一輔助頂針隔著該黏性薄膜頂抵晶粒,以使晶粒更確實地轉黏至黏性薄膜。 Please refer to our new patent No. M386595, which provides a semiconductor die detection and detachment structure for performing the above-described process of detecting and picking up defective products. In detail, after detecting the crystal grains by the image capturing device, the structure uses a thimble unit to raise the die defect product from bottom to top through a soft film, and utilizes a paste disposed above the die. The film is adhered to the top of the grain, and an auxiliary thimble can be used to abut the die through the viscous film to make the grain more reliably adhere to the viscous film.

然而,前述結構在進行頂高並轉黏晶粒之後,晶粒可能仍黏附在該軟性薄膜而非該黏性薄膜,但該結構卻無法即時檢知轉黏失誤之情況,而需等到該軟性薄膜上所有待轉黏至該黏性薄膜之晶粒皆已進行轉黏之後,才能將該軟性薄膜移至另一影像擷取裝置下方,以檢測該軟性薄膜上是否有未成功轉黏至該黏性薄膜之晶粒,若檢測出有未轉黏成功之晶粒,則必須再次對該晶粒進行轉黏動作,此舉係相當繁複且耗時。 However, after the above structure is subjected to the topping and the transfer of the crystal grains, the crystal grains may still adhere to the soft film instead of the adhesive film, but the structure cannot immediately detect the transfer failure, and the softness needs to be waited for. After all the crystal grains on the film to be bonded to the adhesive film have been transferred, the soft film can be moved under the other image capturing device to detect whether the soft film is unsuccessfully transferred to the film. If the crystal grains of the viscous film are detected to have untransformed crystal grains, the grain must be transferred again, which is quite complicated and time consuming.

有鑑於上述缺失,本發明之主要目的在於提供一種晶粒選取方法,可對晶粒是否轉黏成功進行即時檢測。 In view of the above-mentioned deficiencies, the main object of the present invention is to provide a method for selecting a crystal grain, which can perform on-the-spot detection on whether or not the crystal grain is transferred.

為達成上述目的,本發明所提供之晶粒選取方法包含有下列步驟:a)提供一黏設有複數晶粒之軟性薄膜、一與該軟性薄膜相對且可透光之黏性薄膜、一能隔著該黏性薄膜而拍攝該等晶粒之影像擷取裝置,以及一能隔著該軟性薄膜頂推各該晶粒之頂推裝置;b)利用該影像擷取裝置對該等晶粒進行定位;c)利用該頂推裝置之一頂推件隔著該軟性薄膜頂推一待轉黏至該黏性薄膜之該晶粒,以使該受頂推之晶粒接觸該黏性薄膜;以及d)利用該影像擷取裝置檢測在步驟c)中受頂推之晶粒是否黏附於該黏性薄膜。 In order to achieve the above object, the method for selecting a crystal grain provided by the present invention comprises the following steps: a) providing a flexible film with a plurality of crystal grains, a viscous film opposite to the flexible film, and capable of transmitting light; An image capturing device for capturing the crystal grains through the adhesive film, and a pushing device capable of pushing each of the crystal grains through the flexible film; b) using the image capturing device for the crystal grains Positioning; c) pushing the die to be adhered to the viscous film through the soft film by using one of the pushing devices, so that the pushed die contacts the adhesive film And d) using the image capturing device to detect whether the die pushed in step c) adheres to the adhesive film.

由於該黏性薄膜係可透光,使得該影像擷取裝置可隔著該黏性薄膜而拍攝該等晶粒,因此,不需等到所有待轉黏之晶粒皆完成轉黏動作才檢測該軟性薄膜是否留有轉黏 失誤之晶粒。換言之,該晶粒選取設備及方法可對晶粒是否轉黏成功進行即時檢測,以便在該黏性薄膜仍與該軟性薄膜相對時對轉黏失誤之晶粒再度進行轉黏動作。 Since the viscous film is permeable to light, the image capturing device can capture the dies through the viscous film. Therefore, it is not necessary to wait until all the dies to be transferred have completed the transfer operation. Whether the soft film remains sticky The grain of the mistake. In other words, the die selection device and method can perform on-the-spot detection on whether the die is transferred or not, so that the die that has been transferred to the wrong film is re-adhesively moved when the adhesive film is still opposite to the flexible film.

本發明之另一目的在於提供一種用以實施上述晶粒選取方法的晶粒選取設備。 Another object of the present invention is to provide a die selection apparatus for implementing the above-described die selection method.

本發明所提供之晶粒選取設備包含有一軟性薄膜、一黏性薄膜、一影像擷取裝置,以及一頂推裝置。該軟性薄膜具有朝向相反方向之一第一表面及一第二表面,該第一表面係用以黏設複數晶粒;該黏性薄膜係可透光且具有一黏貼面,該黏貼面係面對該軟性薄膜之第一表面;該影像擷取裝置係設置於能隔著該黏性薄膜而拍攝該等晶粒的位置;該頂推裝置具有一與該軟性薄膜之第二表面相對的頂推件,用以藉由該頂推件隔著該軟性薄膜頂推一該晶粒,進而使該受頂推之晶粒黏附於該黏性薄膜之黏貼面。 The die selection device provided by the present invention comprises a flexible film, a viscous film, an image capturing device, and a pushing device. The flexible film has a first surface facing the opposite direction and a second surface, wherein the first surface is used to adhere a plurality of crystal grains; the adhesive film is light transmissive and has an adhesive surface, the adhesive surface is a first surface of the flexible film; the image capturing device is disposed at a position where the crystal grains can be imaged through the adhesive film; the pushing device has a top opposite to the second surface of the flexible film The pushing member is configured to push the die by pushing the die through the soft film, thereby adhering the pushed die to the adhesive surface of the adhesive film.

有關本發明所提供之晶粒選取設備及方法的詳細構造、特點、組裝或使用方式,將於後續的實施方式詳細說明中予以描述。然而,在本發明領域中具有通常知識者應能瞭解,該等詳細說明以及實施本發明所列舉的特定實施例,僅係用於說明本發明,並非用以限制本發明之專利申請範圍。 Detailed construction, features, assembly or use of the die selection apparatus and method provided by the present invention will be described in the detailed description of the subsequent embodiments. However, it should be understood by those of ordinary skill in the art that the present invention is not limited by the scope of the invention.

申請人首先在此說明,在以下將要介紹之實施例以及圖式中,相同之參考號碼,表示相同或類似之元件或其結構特徵,且X、Y、Z軸係皆相互垂直。 The Applicant firstly stipulates in the following embodiments and the drawings, wherein the same reference numerals indicate the same or similar elements or structural features thereof, and the X, Y, and Z axis systems are perpendicular to each other.

請參閱第一圖到第四圖,第一圖為本發明一第一較佳實施例所提供之晶粒選取設備及多數晶粒之示意圖,係顯示該晶粒選取設備待選取晶粒之態樣;第二圖係類同於第一圖,惟顯示本發明該第一較佳實施例所提供之晶粒選取設備在轉黏晶粒之態樣;第三圖係類同於第一圖,惟顯示本發明該第一較佳實施例所提供之晶粒選取設備在進行定位之態樣;第四圖係類同於第三圖,惟顯示本發明該第一較佳實施例所提供之晶粒選取設備在進行即時檢測之態樣。 Referring to the first to fourth figures, the first figure is a schematic diagram of a die selection device and a plurality of dies provided by a first preferred embodiment of the present invention, which is a state in which the die selection device is to be selected. The second figure is similar to the first figure, but shows the aspect of the die selection device provided by the first preferred embodiment of the present invention in the form of a transfer die; the third figure is similar to the first figure. The first embodiment of the present invention is similar to the third embodiment, but the first preferred embodiment of the present invention is provided. The die selection device is in the form of instant detection.

請參閱第一圖,本發明一第一較佳實施例所提供之晶粒選取設備10主要包含有一軟性薄膜14、一黏性薄膜16、一頂推裝置18、一影像擷取裝置20,以及一支撐裝置22。 Referring to the first embodiment, a die selection device 10 according to a first preferred embodiment of the present invention mainly includes a flexible film 14, a viscous film 16, a pushing device 18, an image capturing device 20, and A support device 22.

該軟性薄膜14及該黏性薄膜16可為習用之藍膜(blue tape),該軟性薄膜14具有朝向相反方向之一第一表面141及一第二表面142,該第一表面141係用以黏設複數晶粒30;該黏性薄膜16具有朝向相反方向之一黏貼面161及一抵靠面162,該黏貼面161係間隔固定之距離地面對該軟性薄膜14之第一表面141。 The flexible film 14 and the adhesive film 16 may be a conventional blue tape having a first surface 141 and a second surface 142 facing in opposite directions, the first surface 141 being used for The plurality of crystal grains 30 are adhered; the adhesive film 16 has an adhesive surface 161 facing the opposite direction and an abutting surface 162. The adhesive surface 161 is fixed to the first surface 141 of the flexible film 14 at a fixed distance.

事實上,該軟性薄膜14係受一可產生雙軸向(X、Y軸)往復位移動作之位移裝置(圖中未示)帶動,進而同時帶動該等晶粒30位移,該黏性薄膜16能與該軟性薄膜14相對固定而同步位移,亦可受一捲動機構(圖中未示)捲動。然而,前述位移裝置及捲動機構屬於習知技術 且並非本發明之技術特徵所在,因此容申請人在此不贅述其詳細結構並將其於圖式中隱藏。 In fact, the flexible film 14 is driven by a displacement device (not shown) capable of generating a biaxial (X, Y-axis) reciprocating displacement action, thereby simultaneously driving the displacement of the crystal grains 30. The adhesive film 16 The flexible film 14 can be relatively fixed and displaced in synchronization, and can also be rolled by a scroll mechanism (not shown). However, the aforementioned displacement device and scrolling mechanism belong to the prior art It is not the technical features of the present invention, and therefore the applicant does not repeat the detailed structure and hide it in the drawings.

該頂推裝置18包含有一驅動單元182(例如氣壓缸或液壓缸)以及一與該軟性薄膜14之第二表面142相對之頂推件184(例如頂針),該頂推件184能受該驅動單元182驅動而沿Z軸移動,藉以隔著該軟性薄膜14頂推一該晶粒30,進而使該受頂推之晶粒30黏附於該黏性薄膜16之黏貼面161(如第二圖所示)。值得一提的是,該頂推件184亦可固定不動,而由該二薄膜14、16同步地沿Z軸移動,以達成前述之頂推並轉黏晶粒30之動作。 The pushing device 18 includes a driving unit 182 (such as a pneumatic cylinder or a hydraulic cylinder) and a pushing member 184 (for example, a thimble) opposite to the second surface 142 of the flexible film 14, and the pushing member 184 can be driven by the driving device 184. The unit 182 is driven to move along the Z axis, thereby pushing the die 30 through the soft film 14 to adhere the die 30 to the adhesive surface 161 of the adhesive film 16 (as shown in the second figure). Shown). It is worth mentioning that the pushing member 184 can also be fixed, and the two films 14, 16 are synchronously moved along the Z axis to achieve the aforementioned pushing and transferring the die 30.

該影像擷取裝置20可為習用之電荷耦合元件攝影機(CCD camera),或者其他種類的攝影機。在本實施例中,該影像擷取裝置20係設置於與該頂推件184相對應之位置,並朝該頂推件184之方向拍攝,且該二薄膜14、16係位於該影像擷取裝置20與該頂推件184之間;然而,該影像擷取裝置20之設置位置並不以此為限,只要設置於能隔著該黏性薄膜16而拍攝該等晶粒30的位置即可,例如,該影像擷取裝置20可設置於該支撐裝置22對面並藉由分光鏡轉折其拍攝方向而間接地朝該頂推裝置18之方向拍攝。 The image capture device 20 can be a conventional CCD camera or other type of camera. In this embodiment, the image capturing device 20 is disposed at a position corresponding to the pushing member 184, and is photographed in the direction of the pushing member 184, and the two films 14, 16 are located in the image capturing device. Between the device 20 and the pushing member 184; however, the position of the image capturing device 20 is not limited thereto, as long as it is disposed at a position where the crystal grains 30 can be imaged through the adhesive film 16. For example, the image capturing device 20 can be disposed opposite the supporting device 22 and indirectly in the direction of the pushing device 18 by the beam splitting mirror.

值得一提的是,該軟性薄膜14及該黏性薄膜16皆不以藍膜為限,該軟性薄膜14只要能供該等晶粒30黏附且能受頂推而彈性變形即可,而該黏性薄膜16只要其黏貼面161具有黏性且可透光以使該影像擷取裝置20能拍攝 到晶粒30即可。 It should be noted that the flexible film 14 and the adhesive film 16 are not limited to the blue film, and the flexible film 14 can be elastically deformed if the die 30 is adhered and can be pushed by the push. The adhesive film 16 is viscous and permeable to the adhesive surface 161 so that the image capturing device 20 can capture It is sufficient to the die 30.

該支撐裝置22包含有一能沿Z軸移動之座體222、一設置於該座體222並能繞Z軸擺動之擺臂224,以及一設置於該擺臂224並能被該擺臂224帶動至一作用位置P1之支撐件226。事實上,該座體222係由一可產生單軸向(Z軸)線性往復位移動作之位移裝置(圖中未示)所帶動,該擺臂224則由一設置於該座體222之馬達(圖中未示)所帶動,然而,前述位移裝置及馬達常見於一般自動化機械中且並非本發明之技術特徵所在,因此容申請人在此不贅述其詳細結構並將其於圖式中隱藏。 The support device 22 includes a seat body 222 that can move along the Z axis, a swing arm 224 that is disposed on the seat body 222 and swings about the Z axis, and is disposed on the swing arm 224 and can be driven by the swing arm 224. To a support member 226 at a position P1. In fact, the seat body 222 is driven by a displacement device (not shown) that generates a uniaxial (Z-axis) linear reciprocating displacement action, and the swing arm 224 is provided by a motor disposed on the seat body 222. (not shown), however, the aforementioned displacement device and motor are common in general automation machinery and are not the technical features of the present invention, so the applicant will not repeat the detailed structure and hide it in the drawing. .

如第一圖所示,該支撐件226位於該作用位置P1時係與該黏性薄膜16之抵靠面162相對且對應於該頂推件184,此時,該座體222能帶動該擺臂224及該支撐件226朝向該黏性薄膜16移動,直到該支撐件226接觸到該抵靠面162(如第二圖所示),使得受該頂推件184頂推的晶粒30能隔著該黏性薄膜16抵靠於該支撐件226,進而使該晶粒30更確實地黏附於該黏性薄膜16之黏貼面161。該支撐件226具有一軟性部226a,其主要為矽膠或橡膠製成,受該頂推件184頂推的晶粒30係隔著該黏性薄膜16抵靠於該軟性部226a,藉以避免該支撐件226傷害晶粒30表面,該軟性部226a的較佳硬度為蕭氏硬度A50~A70,但不以此為限。 As shown in the first figure, the supporting member 226 is located at the working position P1 opposite to the abutting surface 162 of the adhesive film 16 and corresponds to the pushing member 184. At this time, the seat body 222 can drive the pendulum. The arm 224 and the support member 226 are moved toward the adhesive film 16 until the support member 226 contacts the abutting surface 162 (as shown in the second figure), so that the die 30 pushed by the pushing member 184 can The viscous film 16 is abutted against the support member 226, and the die 30 is more reliably adhered to the adhesive surface 161 of the adhesive film 16. The support member 226 has a soft portion 226a, which is mainly made of silicone or rubber. The die 30 pushed by the pushing member 184 abuts against the soft portion 226a via the adhesive film 16 to avoid the The support member 226 damages the surface of the die 30, and the soft portion 226a preferably has a hardness of A50 to A70, but is not limited thereto.

此外,該支撐件226可以加設連接至一真空壓力源之一真空通道,且該真空通道係延伸至該軟性部226a,以 在該軟性部226a接觸到該抵靠面162時,藉由真空吸引方式而固定該黏性薄膜16。 In addition, the support member 226 may be coupled to a vacuum channel of a vacuum pressure source, and the vacuum channel extends to the flexible portion 226a to When the soft portion 226a comes into contact with the abutting surface 162, the viscous film 16 is fixed by a vacuum suction method.

以下將以該晶粒選取設備10為例說明本發明所提供之晶粒選取方法,同時進一步說明該晶粒選取設備之作動方式。該晶粒選取方法包含有下列步驟: Hereinafter, the die selection device 10 will be taken as an example to illustrate the die selection method provided by the present invention, and the operation mode of the die selection device will be further described. The die selection method includes the following steps:

a)提供黏設有複數晶粒30之軟性薄膜14、與該軟性薄膜14相對且可透光之黏性薄膜16、能隔著該黏性薄膜16而拍攝該等晶粒30之影像擷取裝置20,以及能隔著該軟性薄膜14頂推各該晶粒30之頂推裝置18。在本實施例中,此步驟更提供該支撐裝置22,但該支撐裝置22係用以輔助轉黏晶粒30,而非本發明之必要技術特徵。 a) providing a flexible film 14 having a plurality of crystal grains 30 adhered thereto, an adhesive film 16 which is transparent to the flexible film 14 and capable of transmitting light, and an image capturing film capable of capturing the crystal grains 30 via the adhesive film 16 The device 20, and the pushing device 18 capable of pushing each of the crystal grains 30 across the flexible film 14. In the present embodiment, this step further provides the support device 22, but the support device 22 is used to assist in the transfer of the die 30, rather than the necessary technical features of the present invention.

b)利用該影像擷取裝置20對該等晶粒30進行定位。由於該黏性薄膜16係可透光,因此該影像擷取裝置20可藉由隔著該黏性薄膜16拍攝該等晶粒30,進而對該等晶粒30進行定位。在本實施例中,該支撐件226在此步驟進行時係被該擺臂224擺動至一非位於該影像擷取裝置20與該等晶粒30之間的非作用位置P2(例如第三圖所示之位置),以避免阻礙該影像擷取裝置20拍攝該等晶粒30。 b) Positioning the dies 30 by the image capture device 20. Since the viscous film 16 is permeable to light, the image capturing device 20 can image the dies 30 by interposing the dies 30 through the viscous film 16. In this embodiment, the support member 226 is swung by the swing arm 224 to an inactive position P2 between the image capturing device 20 and the die 30 during the step (for example, the third figure). The position shown) to avoid obstructing the image capture device 20 from capturing the dies 30.

c)利用該頂推裝置18隔著該軟性薄膜14頂推一待轉黏至該黏性薄膜16之晶粒30,以使該受頂推之晶粒30接觸該黏性薄膜16(如第二圖所示)。在本實施例中,該支撐件226在此步驟進行時係被該擺臂224擺動至該作用位置P1,以使該受頂推之晶粒30因隔著該黏性薄膜16 抵靠於該支撐件226而更確實地黏附於該黏性薄膜16。 c) using the pushing device 18 to push the die 30 to be bonded to the adhesive film 16 via the flexible film 14 so that the pushed die 30 contacts the adhesive film 16 (eg, Figure 2). In this embodiment, the support member 226 is swung by the swing arm 224 to the active position P1 during the step, so that the pushed die 30 is separated by the adhesive film 16 . The viscous film 16 is more reliably adhered to the support member 226.

在此需說明的是,本發明所提供之晶粒選取設備及方法主要係用以將該軟性薄膜14上被檢測出為不良品之晶粒30挑除,在此狀況下,前述之待轉黏至該黏性薄膜16之晶粒30即為被判定為不良品之晶粒30。然而,本發明所提供之晶粒選取設備及方法亦可用以將通過檢測之晶粒30依據其規格或等級而分類,在此狀況下,該等通過檢測之晶粒30皆為待轉黏至該黏性薄膜16之晶粒30,且該等晶粒30之類別會決定其進行轉黏之順序及其轉黏到該黏性薄膜16之位置。換言之,在步驟a)中黏設於該軟性薄膜14之晶粒30可能全都為待轉黏至該黏性薄膜16之晶粒,亦可能僅有其中之一或少數晶粒30係待轉黏至該黏性薄膜16。 It should be noted that the die selection device and method provided by the present invention are mainly used to remove the die 30 on the flexible film 14 which is detected as a defective product. In this case, the foregoing is to be rotated. The crystal grains 30 adhered to the adhesive film 16 are the crystal grains 30 judged to be defective. However, the die selection apparatus and method provided by the present invention can also be used to classify the die 30 that are inspected according to their specifications or grades. In this case, the die 30 that has passed the detection are all to be bonded to The crystal grains 30 of the adhesive film 16 and the types of the crystal grains 30 determine the order in which they are transferred and are transferred to the position of the adhesive film 16. In other words, the crystal grains 30 adhered to the flexible film 14 in the step a) may all be the crystal grains to be transferred to the adhesive film 16, and only one or a few of the crystal grains 30 may be to be transferred. To the viscous film 16.

d)利用該影像擷取裝置20檢測在步驟c)中受頂推之晶粒30是否黏附於該黏性薄膜16。由於該黏性薄膜16係可透光,因此該影像擷取裝置20可隔著該黏性薄膜16而對該受頂推之晶粒30進行檢測。如第四圖所示,在本實施例中,該支撐件226在此步驟進行時再度被該擺臂224擺動至該非作用位置P2,以避免阻礙該影像擷取裝置20拍攝該晶粒30。 d) Using the image capturing device 20 to detect whether the die 30 pushed in the step c) adheres to the adhesive film 16. Since the adhesive film 16 is transparent to light, the image capturing device 20 can detect the pushed die 30 via the adhesive film 16 . As shown in the fourth figure, in the embodiment, the support member 226 is again swung by the swing arm 224 to the inactive position P2 during the step to prevent the image capturing device 20 from capturing the die 30.

值得一提的是,該影像擷取裝置20可藉由晶粒30的影像色差判斷晶粒30係黏附於該軟性薄膜14或該黏性薄膜16。該晶粒選取設備10亦可更設有一與該軟性薄膜14之第二表面142相對之照明裝置24,使得晶粒30在該步 驟d)進行時更容易被辨識,在此狀況下,該軟性薄膜14必須可透光。 It is to be noted that the image capturing device 20 can determine that the die 30 is adhered to the flexible film 14 or the adhesive film 16 by the image color difference of the die 30. The die selection device 10 can further be provided with a lighting device 24 opposite to the second surface 142 of the flexible film 14, so that the die 30 is at this step. The step d) is easier to recognize when it is performed, and in this case, the flexible film 14 must be transparent.

該步驟d)之後,若黏附於該軟性薄膜14之晶粒30中仍有待轉黏至該黏性薄膜16之晶粒,則使該軟性薄膜14與該等晶粒30同步地相對該頂推裝置18位移,以使一該待轉黏至該黏性薄膜16之晶粒30位於對應於該頂推件184之位置,並使該黏性薄膜16亦相對該頂推裝置18位移,以使該頂推件184對應於該黏性薄膜16未受晶粒30黏附之區塊,然後再重複一次步驟c)及步驟d)。 After the step d), if the crystal grains 30 adhered to the flexible film 14 still have to be transferred to the crystal grains of the adhesive film 16, the soft film 14 is synchronously opposed to the crystal grains 30. The device 18 is displaced such that a die 30 to be bonded to the adhesive film 16 is located at a position corresponding to the pushing member 184, and the adhesive film 16 is also displaced relative to the pushing device 18, so that The pushing member 184 corresponds to the block in which the adhesive film 16 is not adhered by the die 30, and then the steps c) and d) are repeated one more time.

換言之,在對一該晶粒30進行如步驟c)之轉黏程序後,即馬上進行如步驟d)之檢測程序,然後才對另一該晶粒30進行轉黏及檢測;如此一來,當檢測出有轉黏失誤之情況發生,即可在該未轉黏成功之晶粒30仍對應於該頂推件184時再一次進行轉黏動作,此舉相較於習用之晶粒選取設備及方法,係相當簡便及省時。 In other words, after performing a transposition process as in step c) on a die 30, the detection process as in step d) is performed immediately, and then the other die 30 is transferred and detected; thus, When the occurrence of the viscous error is detected, the viscous action can be performed again when the unbonded successful die 30 still corresponds to the ejector 184, which is compared with the conventional die selection device. And methods are quite simple and time-saving.

請參閱第五圖到第十圖,第五圖為本發明一第二較佳實施例所提供之晶粒選取設備及多數晶粒之示意圖,係顯示該晶粒選取設備待選取晶粒之態樣;第六圖係類同於第五圖,惟顯示本發明該第二較佳實施例所提供之晶粒選取設備在轉黏晶粒之態樣;第七圖係類同於第六圖,惟顯示本發明該第二較佳實施例所提供之晶粒選取設備在進行即時檢測之態樣;第八圖至第十圖為本發明該第二較佳實施例所提供之晶粒選取設備在將其一黏性薄膜黏附之晶粒轉貼至一轉貼薄膜之過程的示意圖。 Referring to FIG. 5 to FIG. 10 , FIG. 5 is a schematic diagram of a die selection device and a plurality of dies according to a second preferred embodiment of the present invention, showing a state in which the die selection device is to be selected. The sixth figure is similar to the fifth figure, but shows the aspect of the die-selecting device provided by the second preferred embodiment of the present invention in the case of the transfer-adhesive grain; the seventh figure is similar to the sixth figure. However, the die selection device provided by the second preferred embodiment of the present invention is in the form of instant detection; and the eighth to tenth views are the die selection provided by the second preferred embodiment of the present invention. A schematic diagram of the process of transferring a die adhered by a viscous film to a transfer film.

請參閱第五圖,本發明一第二較佳實施例所提供之晶粒選取設備40與前述該晶粒選取設備10之差異在於,該晶粒選取設備40之黏性薄膜16的抵靠面162係固定於一支撐座42,且如第六圖所示,受該頂推裝置18隔著該軟性薄膜14頂推之晶粒30,係隔著該黏性薄膜16而抵靠於該支撐座42,藉以更確實地黏附於該黏性薄膜16之黏貼面161。 Referring to FIG. 5, the die selection device 40 provided by the second preferred embodiment of the present invention is different from the die selection device 10 described above in that the abutment surface of the adhesive film 16 of the die selection device 40 is The 162 is fixed to a support base 42 and, as shown in FIG. 6 , the die 30 pushed up by the pushing device 18 via the flexible film 14 is abutted against the support by the adhesive film 16 . The seat 42 is thereby more firmly adhered to the adhesive surface 161 of the adhesive film 16.

詳而言之,該支撐座42包含有一座體422,以及一設於該座體422與該黏性薄膜16之間的軟墊424。該黏性薄膜16可藉由真空吸引方式、電磁鐵或其他適合方式而固定於該座體422,藉以使該黏性薄膜16設置地相當平整,進而使轉黏晶粒30之效果更好。該座體422可由透明壓克力、石英玻璃,或者其他可透光且硬度較大之材料製成,該軟墊424可由矽膠、橡膠,或者其他可透光且具有彈性之材料製成,其較佳硬度為蕭氏硬度A50~A70,但不以此為限;藉此,該支撐座42不但可供受頂推之晶粒30抵靠,更可提供緩衝效果,以避免晶粒30損壞。然而,若本實施例的晶粒選取設備40係用來選取不良晶粒,則該支撐座42亦可不設置前述軟墊424。其次,更重要的是,該座體422及該軟墊424係可透光,致使該影像擷取裝置20能隔著該支撐座42及該黏性薄膜16而拍攝該等晶粒30,以檢測晶粒30是否成功轉黏至該黏性薄膜(如第七圖所示)。 In detail, the support base 42 includes a body 422 and a cushion 424 disposed between the base 422 and the adhesive film 16. The adhesive film 16 can be fixed to the base 422 by vacuum suction, electromagnet or other suitable means, so that the adhesive film 16 is relatively flat, and the effect of the adhesive die 30 is better. The seat body 422 can be made of transparent acrylic, quartz glass, or other material that is transparent and harder. The cushion 424 can be made of silicone, rubber, or other materials that are transparent and elastic. The preferred hardness is the Shore hardness A50~A70, but not limited thereto; thereby, the support base 42 can not only be used for the pushed-up die 30, but also provides a buffering effect to avoid damage to the die 30. . However, if the die selection device 40 of the present embodiment is used to select a defective die, the support pad 42 may not be provided with the aforementioned pad 424. Secondly, more importantly, the body 422 and the cushion 424 are transparent, so that the image capturing device 20 can image the crystal grains 30 through the support base 42 and the adhesive film 16 to It is detected whether the die 30 is successfully transferred to the viscous film (as shown in the seventh figure).

此外,當前述該晶粒選取設備40係用以將通過檢測 之晶粒30進行分類時,更有助於晶粒30分類之後的檢測程序。詳而言之,該等晶粒30在藉由上述之晶粒選取方法進行分類之後,需再進行電性檢測,但晶粒30之檢測面係被黏貼於該黏性薄膜16,因此,在該晶粒選取方法的步驟d)之後,若黏附於該軟性薄膜14之晶粒30中已無待轉黏至該黏性薄膜16之晶粒,則可使一轉貼薄膜44與該黏性薄膜16相互靠近,進而將黏附於該黏性薄膜16之晶粒30轉貼至該轉貼薄膜44(如第八圖至第十圖所示),藉以將各該晶粒30原本黏貼於該黏性薄膜16之表面顯露出來,以進行後續之檢測程序。 In addition, when the foregoing die selection device 40 is used to pass the detection When the crystal grains 30 are classified, the detection procedure after the classification of the crystal grains 30 is further facilitated. In detail, after the dies 30 are classified by the above-described die selection method, electrical detection is required, but the detection surface of the die 30 is adhered to the viscous film 16, and thus, After the step d) of the die selection method, if the die 30 adhered to the flexible film 14 has not been transferred to the die of the adhesive film 16, a transfer film 44 and the adhesive film can be used. 16 is adjacent to each other, and the die 30 adhered to the adhesive film 16 is transferred to the transfer film 44 (as shown in the eighth to the tenth drawings), whereby the crystal grains 30 are originally adhered to the adhesive film. The surface of 16 is revealed for subsequent testing procedures.

該晶粒選取設備40之黏性薄膜16能直接連同該支撐座42一起位移至對應於該轉貼薄膜44之位置,以便藉由該支撐座42之支撐及緩衝效果而將該等晶粒30安全且確實地轉貼至該轉貼薄膜44;而且,該支撐座42及該黏性薄膜16此時可位於該轉貼薄膜44與另一影像擷取裝置46之間,如此一來,該影像擷取裝置46可隔著該支撐座42及該黏性薄膜16而檢測該等晶粒30是否全都黏附於該轉貼薄膜44。再者,該黏性薄膜16及該支撐座42可重複使用,以轉黏另一軟性薄膜14上的晶粒30。 The adhesive film 16 of the die selecting device 40 can be directly displaced together with the support base 42 to a position corresponding to the transfer film 44, so that the die 30 is secured by the support and buffering effect of the support base 42. And the adhesive film 44 and the adhesive film 16 can be located between the transfer film 44 and the other image capturing device 46. Thus, the image capturing device The spacers 42 and the adhesive film 16 can be used to detect whether the crystal grains 30 are all adhered to the transfer film 44. Furthermore, the adhesive film 16 and the support base 42 can be reused to transfer the crystal grains 30 on the other flexible film 14.

最後,必須再次說明,本發明於前揭實施例中所揭露的構成元件,僅為舉例說明,並非用來限制本案之範圍,其他等效元件的替代或變化,亦應為本案之申請專利範圍所涵蓋。 Finally, it is to be noted that the constituent elements disclosed in the foregoing embodiments are merely illustrative and are not intended to limit the scope of the present invention, and alternative or variations of other equivalent elements should also be the scope of the patent application of the present application. Covered.

10‧‧‧晶粒選取設備 10‧‧‧ die selection equipment

14‧‧‧軟性薄膜 14‧‧‧Soft film

141‧‧‧第一表面 141‧‧‧ first surface

142‧‧‧第二表面 142‧‧‧ second surface

16‧‧‧黏性薄膜 16‧‧‧Adhesive film

161‧‧‧黏貼面 161‧‧‧Adhesive surface

162‧‧‧抵靠面 162‧‧‧Abutment

18‧‧‧頂推裝置 18‧‧‧Pushing device

182‧‧‧驅動單元 182‧‧‧ drive unit

184‧‧‧頂推件 184‧‧‧Pushing pieces

20‧‧‧影像擷取裝置 20‧‧‧Image capture device

22‧‧‧支撐裝置 22‧‧‧Support device

222‧‧‧座體 222‧‧‧ body

224‧‧‧擺臂 224‧‧‧ swing arm

226‧‧‧支撐件 226‧‧‧Support

226a‧‧‧軟性部 226a‧‧‧Soft Department

P1‧‧‧作用位置 P1‧‧‧ position

P2‧‧‧非作用位置 P2‧‧‧Inactive position

24‧‧‧照明裝置 24‧‧‧Lighting device

30‧‧‧晶粒 30‧‧‧ grain

40‧‧‧晶粒選取設備 40‧‧‧ die selection equipment

42‧‧‧支撐座 42‧‧‧ Support

422‧‧‧座體 422‧‧‧ body

424‧‧‧軟墊 424‧‧‧A cushion

44‧‧‧轉貼薄膜 44‧‧‧Transfer film

46‧‧‧影像擷取裝置 46‧‧‧Image capture device

第一圖為本發明一第一較佳實施例所提供之晶粒選取設備及多數晶粒之示意圖,係顯示該晶粒選取設備待選取晶粒之態樣;第二圖係類同於第一圖,惟顯示本發明該第一較佳實施例所提供之晶粒選取設備在轉黏晶粒之態樣;第三圖係類同於第一圖,惟顯示本發明該第一較佳實施例所提供之晶粒選取設備在進行定位之態樣;第四圖係類同於第三圖,惟顯示本發明該第一較佳實施例所提供之晶粒選取設備在進行即時檢測之態樣;第五圖為本發明一第二較佳實施例所提供之晶粒選取設備及多數晶粒之示意圖,係顯示該晶粒選取設備待選取晶粒之態樣;第六圖係類同於第五圖,惟顯示本發明該第二較佳實施例所提供之晶粒選取設備在轉黏晶粒之態樣;第七圖係類同於第六圖,惟顯示本發明該第二較佳實施例所提供之晶粒選取設備在進行即時檢測之態樣;以及第八圖至第十圖為本發明該第二較佳實施例所提供之晶粒選取設備在將其一黏性薄膜黏附之晶粒轉貼至一轉貼薄膜之過程的示意圖。 The first figure is a schematic diagram of a die selection device and a plurality of dies provided by a first preferred embodiment of the present invention, which shows a state in which the die selection device is to be selected; the second figure is similar to the first 1 is a view showing the aspect of the die-removing die provided by the first preferred embodiment of the present invention in the form of a transfer die; the third figure is similar to the first figure, but shows the first preferred embodiment of the present invention. The die selection device provided by the embodiment is in the position of positioning; the fourth figure is similar to the third figure, but the die selection device provided by the first preferred embodiment of the present invention is in the instant detection. The fifth figure is a schematic diagram of a die selection device and a plurality of dies provided by a second preferred embodiment of the present invention, showing a state in which the die selection device is to be selected; Similar to the fifth figure, the second embodiment of the present invention is shown in the aspect of the transfer die. The seventh figure is similar to the sixth figure, but shows the first aspect of the present invention. The die selection device provided by the second preferred embodiment is in the form of instant detection; FIG eighth to tenth picture shows the second preferred die according to the present invention is provided by selecting embodiment schematic view of one die adhesive film adhesion process to posted in a posted film of the device.

10‧‧‧晶粒選取設備 10‧‧‧ die selection equipment

14‧‧‧軟性薄膜 14‧‧‧Soft film

141‧‧‧第一表面 141‧‧‧ first surface

142‧‧‧第二表面 142‧‧‧ second surface

16‧‧‧黏性薄膜 16‧‧‧Adhesive film

161‧‧‧黏貼面 161‧‧‧Adhesive surface

162‧‧‧抵靠面 162‧‧‧Abutment

18‧‧‧頂推裝置 18‧‧‧Pushing device

182‧‧‧驅動單元 182‧‧‧ drive unit

184‧‧‧頂推件 184‧‧‧Pushing pieces

20‧‧‧影像擷取裝置 20‧‧‧Image capture device

22‧‧‧支撐裝置 22‧‧‧Support device

222‧‧‧座體 222‧‧‧ body

224‧‧‧擺臂 224‧‧‧ swing arm

226‧‧‧支撐件 226‧‧‧Support

226a‧‧‧軟性部 226a‧‧‧Soft Department

P1‧‧‧作用位置 P1‧‧‧ position

24‧‧‧照明裝置 24‧‧‧Lighting device

30‧‧‧晶粒 30‧‧‧ grain

Claims (16)

一種晶粒選取方法,包含有下列步驟:a)提供一黏設有複數晶粒之軟性薄膜、一與該軟性薄膜相對且可透光之黏性薄膜、一能隔著該黏性薄膜而拍攝該等晶粒之影像擷取裝置,以及一能隔著該軟性薄膜頂推各該晶粒之頂推裝置;b)利用該影像擷取裝置對該等晶粒進行定位;c)利用該頂推裝置之一頂推件隔著該軟性薄膜頂推一待轉黏至該黏性薄膜之該晶粒,以使該受頂推之晶粒接觸該黏性薄膜;以及d)利用該影像擷取裝置檢測在步驟c)中受頂推之晶粒是否黏附於該黏性薄膜。 A method for selecting a crystal grain comprises the steps of: a) providing a flexible film with a plurality of crystal grains, a viscous film which is opposite to the flexible film and transparent to light, and capable of being photographed through the viscous film An image capturing device for the dies, and a pushing device capable of pushing each of the dies through the flexible film; b) positioning the dies by the image capturing device; c) utilizing the top Pushing a pushing device through the soft film to push the die to be bonded to the die of the adhesive film, so that the pushed die contacts the adhesive film; and d) using the image The picking device detects whether the die pushed in step c) adheres to the adhesive film. 如申請專利範圍第1項所述之晶粒選取方法,其中該步驟d)之後,若黏附於該軟性薄膜之晶粒中仍有待轉黏至該黏性薄膜之晶粒,則使該軟性薄膜與該等晶粒同步地相對該頂推裝置位移,以使一該待轉黏至該黏性薄膜之晶粒位於對應於該頂推件之位置,並使該黏性薄膜亦相對該頂推裝置位移,以使該頂推件對應於該黏性薄膜未受晶粒黏附之區塊,然後再重複一次步驟c)及步驟d)。 The method for selecting a crystal according to claim 1, wherein after the step d), if the crystal grains adhered to the soft film still have to be transferred to the crystal grains of the adhesive film, the soft film is used. Displaced relative to the ejector device in synchronization with the dies, such that a die to be transferred to the viscous film is located at a position corresponding to the urging member, and the viscous film is also pushed against the ejector The device is displaced such that the pushing member corresponds to the block in which the adhesive film is not subjected to die adhesion, and then steps c) and d) are repeated one more time. 如申請專利範圍第1項所述之晶粒選取方法,其中該步驟a)更提供一支撐裝置,該支撐裝置具有一能擺動之擺臂,以及一設置於該擺臂之支撐件;該支撐件在該步驟c)進行時係被擺動至對應於該頂推件之位置,且該受頂推之晶粒係隔著該黏性薄膜抵靠於該支撐件;該支撐件在 該步驟b)及該步驟d)進行時係被擺動至非位於該影像擷取裝置與該等晶粒之間的位置,以避免阻礙該影像擷取裝置拍攝該等晶粒。 The method for selecting a die according to claim 1, wherein the step a) further provides a supporting device, the supporting device has a swinging arm, and a support member disposed on the swing arm; the support When the step c) is performed, the piece is swung to a position corresponding to the pushing member, and the pushed die is abutted against the supporting member via the adhesive film; the supporting member is at When the step b) and the step d) are performed, the device is swung to a position not between the image capturing device and the dies to prevent the image capturing device from capturing the dies. 如申請專利範圍第1項所述之晶粒選取方法,其中該步驟a)更提供一可透光之支撐座,該黏性薄膜係固定於該支撐座,該影像擷取裝置係隔著該支撐座拍攝該等晶粒;在該步驟c)進行時,該受頂推之晶粒係隔著該黏性薄膜抵靠於該支撐座。 The method for selecting a die according to the first aspect of the invention, wherein the step a) further provides a light-permeable support, the adhesive film is fixed to the support, and the image capturing device is separated by the The support base captures the crystal grains; when the step c) is performed, the pushed-up crystal grains are abutted against the support base via the adhesive film. 如申請專利範圍第4項所述之晶粒選取方法,其中該黏性薄膜係藉由真空吸引方式而固定於該支撐座。 The method for selecting a crystal according to claim 4, wherein the adhesive film is fixed to the support by vacuum suction. 如申請專利範圍第1項所述之晶粒選取方法,其中該等晶粒係被分類地轉黏至該黏性薄膜。 The method for selecting a crystal grain according to claim 1, wherein the crystal grains are classified and transferred to the adhesive film. 如申請專利範圍第1項所述之晶粒選取方法,其中該步驟d)之後,更包含有使一轉貼薄膜與該黏性薄膜相互靠近,進而將黏附於該黏性薄膜之晶粒轉貼至該轉貼薄膜之步驟。 The method for selecting a crystal grain according to claim 1, wherein after the step d), the method further comprises: bringing a transfer film and the adhesive film closer to each other, and then transferring the die adhered to the adhesive film to the die The step of transferring the film. 一種用以實施如申請專利範圍第1項所述之晶粒選取方法的晶粒選取設備,包含有:一軟性薄膜,具有朝向相反方向之一第一表面及一第二表面,該第一表面係用以黏設複數晶粒;一黏性薄膜,係可透光且具有一黏貼面,該黏貼面係面對該軟性薄膜之第一表面;一影像擷取裝置,係設置於能隔著該黏性薄膜而拍攝該等晶粒的位置;以及 一頂推裝置,具有一與該軟性薄膜之第二表面相對的頂推件,用以藉由該頂推件隔著該軟性薄膜頂推一該晶粒,進而使該受頂推之晶粒黏附於該黏性薄膜之黏貼面。 A die selection device for performing the die selection method according to claim 1, comprising: a flexible film having a first surface facing the opposite direction and a second surface, the first surface The utility model is characterized in that a plurality of crystal grains are adhered; a viscous film is permeable to light and has an adhesive surface facing the first surface of the soft film; an image capturing device is disposed at a distance The viscous film and the position of the crystal grains; and a pushing device having a pushing member opposite to the second surface of the flexible film for pushing the die through the soft film by the pushing member, thereby pushing the topped die Adhesive to the adhesive surface of the adhesive film. 如申請專利範圍第8項所述之晶粒選取設備,其中該軟性薄膜與該黏性薄膜係以相對固定不動之方式彼此間隔設置。 The die selection device of claim 8, wherein the flexible film and the adhesive film are spaced apart from each other in a relatively fixed manner. 如申請專利範圍第9項所述之晶粒選取設備,更包含有一支撐裝置,該支撐裝置具有一能擺動之擺臂,以及一設置於該擺臂並能被該擺臂帶動至一作用位置之支撐件,該支撐件位於該作用位置時係與該黏性薄膜之一與該黏貼面朝向相反方向之抵靠面相對且對應於該頂推件,藉以供受該頂推件頂推的晶粒隔著該黏性薄膜抵靠於該支撐件。 The die selection device of claim 9, further comprising a support device having a swingable swing arm, and a swing arm disposed on the swing arm and capable of being driven to the active position by the swing arm a support member, the support member is located at the active position opposite to an abutting surface of the adhesive film opposite to the adhesive surface and corresponding to the pushing member, thereby being pushed by the pushing member The die abuts against the support member via the viscous film. 如申請專利範圍第10項所述之晶粒選取設備,其中該支撐件具有一軟性部,該軟性部之材質為矽膠或橡膠。 The die selection device of claim 10, wherein the support member has a soft portion, and the soft portion is made of silicone or rubber. 如申請專利範圍第8項所述之晶粒選取設備,其中該軟性薄膜與該黏性薄膜係以可相對移動之方式彼此間隔設置。 The die selection device of claim 8, wherein the flexible film and the adhesive film are spaced apart from each other in a relatively movable manner. 如申請專利範圍第8或12項所述之晶粒選取設備,更包含有一可透光之支撐座,該黏性薄膜具有一與該黏貼面朝向相反方向之抵靠面,該抵靠面係固定於該支撐座,藉以供受該頂推件頂推的晶粒隔著該黏性薄膜抵靠於該支撐座。 The die selection device of claim 8 or 12, further comprising a permeable support, the adhesive film having an abutting surface opposite to the adhesive surface, the abutting surface Fixed to the support base, so that the die pushed by the pusher abuts against the support through the adhesive film. 如申請專利範圍第13項所述之晶粒選取設備,其中該支撐座包含有一座體,以及一設於該座體與該黏性薄膜之間的軟墊,其中該支撐座之座體之材質為透明壓克力或石英玻璃,該支撐座之軟墊之材質為矽膠或橡膠。 The die selection device of claim 13, wherein the support base comprises a body, and a cushion disposed between the base body and the adhesive film, wherein the seat of the support base The material is transparent acrylic or quartz glass, and the cushion of the support is made of silicone or rubber. 如申請專利範圍第8項所述之晶粒選取設備,更包含有一與該軟性薄膜之第二表面相對之照明裝置,且該軟性薄膜係可透光。 The die selection device of claim 8, further comprising an illumination device opposite to the second surface of the flexible film, wherein the flexible film is transparent. 如申請專利範圍第10項所述之晶粒選取設備,其中該支撐件具有一真空通道,該真空通道係連接至一真空壓力源。 The die selection device of claim 10, wherein the support member has a vacuum passage connected to a vacuum pressure source.
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