TW201422858A - Single-crystal manufacturing device - Google Patents
Single-crystal manufacturing device Download PDFInfo
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- TW201422858A TW201422858A TW102138293A TW102138293A TW201422858A TW 201422858 A TW201422858 A TW 201422858A TW 102138293 A TW102138293 A TW 102138293A TW 102138293 A TW102138293 A TW 102138293A TW 201422858 A TW201422858 A TW 201422858A
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- single crystal
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- melting point
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- 239000013078 crystal Substances 0.000 title claims abstract description 70
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 46
- 239000000463 material Substances 0.000 claims abstract description 68
- 238000002844 melting Methods 0.000 claims abstract description 33
- 230000008018 melting Effects 0.000 claims abstract description 33
- 229910052751 metal Inorganic materials 0.000 claims abstract description 30
- 239000002184 metal Substances 0.000 claims abstract description 30
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 29
- 229910002804 graphite Inorganic materials 0.000 claims abstract description 25
- 239000010439 graphite Substances 0.000 claims abstract description 25
- 238000000034 method Methods 0.000 claims abstract description 17
- 238000010438 heat treatment Methods 0.000 claims abstract description 9
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims description 20
- 229910052750 molybdenum Inorganic materials 0.000 claims description 20
- 239000011733 molybdenum Substances 0.000 claims description 20
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 19
- 229910052721 tungsten Inorganic materials 0.000 claims description 19
- 239000010937 tungsten Substances 0.000 claims description 19
- 239000002994 raw material Substances 0.000 claims description 10
- 229910052702 rhenium Inorganic materials 0.000 claims description 9
- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 claims description 9
- 229910052594 sapphire Inorganic materials 0.000 claims description 9
- 239000010980 sapphire Substances 0.000 claims description 9
- 239000000155 melt Substances 0.000 claims description 4
- 239000007788 liquid Substances 0.000 abstract 1
- 239000007789 gas Substances 0.000 description 15
- 230000006866 deterioration Effects 0.000 description 14
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 6
- 229910052707 ruthenium Inorganic materials 0.000 description 6
- 230000000052 comparative effect Effects 0.000 description 5
- 229910052799 carbon Inorganic materials 0.000 description 4
- 238000003763 carbonization Methods 0.000 description 4
- 239000007770 graphite material Substances 0.000 description 4
- 238000005336 cracking Methods 0.000 description 3
- 238000002425 crystallisation Methods 0.000 description 3
- 230000008025 crystallization Effects 0.000 description 3
- 239000011810 insulating material Substances 0.000 description 3
- 229910052758 niobium Inorganic materials 0.000 description 3
- 239000010955 niobium Substances 0.000 description 3
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 3
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000006698 induction Effects 0.000 description 2
- 239000012774 insulation material Substances 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- 241001674044 Blattodea Species 0.000 description 1
- 229910052684 Cerium Inorganic materials 0.000 description 1
- 238000005231 Edge Defined Film Fed Growth Methods 0.000 description 1
- 238000007696 Kjeldahl method Methods 0.000 description 1
- GWXLDORMOJMVQZ-UHFFFAOYSA-N cerium Chemical compound [Ce] GWXLDORMOJMVQZ-UHFFFAOYSA-N 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000002109 crystal growth method Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 230000005764 inhibitory process Effects 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/10—Crucibles or containers for supporting the melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/16—Oxides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/16—Oxides
- C30B29/20—Aluminium oxides
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
本發明關於一種單晶製造裝置,該單晶製造裝置是在藉由切克勞斯基(Czochralski,CZ)法來製造藍寶石單晶等氧化物單晶時使用。 The present invention relates to a single crystal manufacturing apparatus which is used in the production of an oxide single crystal such as a sapphire single crystal by a Czochralski (CZ) method.
於作為LED基板而需求旺盛的藍寶石單晶的製造中,使用多種多樣的生長方法,例如限邊薄片續填生長法(導模法,edge-defined film-fed growth method)、布里奇曼法(Bridgman method)及凱氏長晶法(Kyropoulos method)等。 In the manufacture of sapphire single crystals which are demanding as LED substrates, various growth methods are used, such as edge-defined film-fed growth method, Bridgman method. (Bridgman method) and Kyropoulos method.
於最近成為主流的凱氏長晶法中,是使用高熔點金屬(鎢、鉬等)的坩堝來使藍寶石單晶生長,但存在以下問題:無法獲得LED基板所需要的c軸結晶,在利用此方法製作a軸結晶之後,需要自直角方向挖通結晶來獲得c軸結晶之步驟,而使生產性與產率非常差。 In the recently developed Kjeldahl method, a sapphire single crystal is grown using a high melting point metal (tungsten, molybdenum, etc.), but the following problems occur: the c-axis crystal required for the LED substrate cannot be obtained, and is utilized. After the method of producing the a-axis crystallization, it is necessary to dig the crystal from the right angle to obtain the c-axis crystallization, and the productivity and the yield are very poor.
因此,最近,切克勞斯基法(CZ法)由於可使c軸結晶生長而備受注目,使用高頻感應加熱和電阻加熱方式,並嘗試各種結晶生長方法。於使用高頻感應加熱法之CZ法中,由銥坩堝與氧化鋯製隔熱材料構成生長爐來進行結晶生長,但由於銥的價格非常高,因此成為妨礙降低結晶成本的 因素。因此,期待利用比銥低廉且具有通用性之高熔點金屬(鎢、鉬等)來製作坩堝,並藉由反復使用以降低成本。 Therefore, recently, the Czochralski method (CZ method) has attracted attention due to the crystal growth of the c-axis, and high-frequency induction heating and resistance heating have been used, and various crystal growth methods have been tried. In the CZ method using a high-frequency induction heating method, a growth furnace is formed of a heat insulating material made of cerium and zirconia to carry out crystal growth, but since the price of ruthenium is very high, it is a hindrance to reduce the crystallization cost. factor. Therefore, it is expected to produce niobium using a high melting point metal (tungsten, molybdenum, etc.) which is inexpensive and versatile, and to reduce the cost by repeated use.
專利文獻1:日本特開2008-7353號公報 Patent Document 1: Japanese Patent Laid-Open Publication No. 2008-7353
於專利文獻1中,揭示出一種方法,其隔著鉬或鎢的隔片,藉由銥製的坩堝來支持鉬製或鎢製的坩堝。然而,由於使用高價的銥製坩堝,因此,對降低成本而言較為有限。 Patent Document 1 discloses a method in which a crucible made of molybdenum or tungsten is supported by a crucible made of tantalum or tungsten. However, due to the use of high-priced tanning, it is limited in terms of cost reduction.
因此,於單晶製造裝置中,爐內構成零件使用石墨材料,尤其是利用石墨材料來保持高熔點金屬坩堝,於降低成本和導熱性方面,較為有利。 Therefore, in the single crystal manufacturing apparatus, a graphite material is used as a component in the furnace, and in particular, a graphite material is used to hold the high melting point metal crucible, which is advantageous in terms of cost reduction and thermal conductivity.
然而,本發明人發現於此種裝置中存在以下問題:由於高熔點金屬材料在氧化鋁等原料的熔點以下,將會進行碳化(滲碳),因此,坩堝發生明顯的劣化和變形,導致壽命降低。 However, the inventors have found that there is a problem in such a device that since the high-melting-point metal material is carbonized (carburized) below the melting point of a raw material such as alumina, significant deterioration and deformation of the crucible occur, resulting in longevity. reduce.
鎢在850℃~1600℃的範圍內吸收碳而碳化,鉬在1100℃以上碳化。因此,即便是低於原料亦即氧化鋁的熔點2050℃之溫度,亦不能避免由於碳化所導致的脆化和變形等。 Tungsten absorbs carbon in the range of 850 ° C to 1600 ° C and carbonizes, and molybdenum is carbonized at 1100 ° C or higher. Therefore, even at a temperature lower than the raw material, that is, the melting point of alumina of 2050 ° C, embrittlement and deformation due to carbonization cannot be avoided.
高熔點金屬坩堝是由脆性材料製作,於高溫下,與石墨材料的接觸部因碳化而使脆化加速,龜裂等劣化變得顯著。因此,坩堝的使用次數顯著降低,而使生產成本顯著提高。 The high-melting-point metal ruthenium is made of a brittle material, and at a high temperature, the contact portion with the graphite material accelerates embrittlement due to carbonization, and deterioration such as cracking becomes remarkable. Therefore, the number of uses of ruthenium is significantly reduced, and the production cost is significantly increased.
本發明是鑒於上述問題點而完成,其目的在於提供一種單晶製造裝置,該裝置即便使用石墨製的坩堝保持器,亦可提高坩堝的壽命。 The present invention has been made in view of the above problems, and an object thereof is to provide a single crystal manufacturing apparatus which can improve the life of a crucible even if a crucible holder made of graphite is used.
為了達成上述目的,本發明提供一種單晶製造裝置,其藉由CZ法,由在坩堝內將原料加熱熔融而得的熔液來製造氧化物單晶,該單晶製造裝置的特徵在於:具備加熱器與主腔室,該加熱器對前述坩堝內的原料進行加熱,該主腔室配置有前述坩堝;並且,前述坩堝是藉由石墨製保持器隔著高熔點金屬的犧牲材料而被保持。 In order to achieve the above object, the present invention provides a single crystal manufacturing apparatus which produces an oxide single crystal by a melt obtained by heating and melting a raw material in a crucible by a CZ method, and the single crystal manufacturing apparatus is characterized in that: a heater and a main chamber for heating the raw material in the crucible, wherein the main chamber is provided with the crucible; and the crucible is held by a graphite holder through a sacrificial material of a high melting point metal .
如此一來,若坩堝是藉由石墨製保持器隔著高熔點金屬的犧牲材料來保持,由於坩堝不會直接接觸石墨製保持器,因此,可抑制由坩堝的碳化所導致的龜裂等劣化,而可提高坩堝的壽命。進一步,藉由使用石墨製保持器,可降低成本。因此,裝置可同時達成成本的降低、與坩堝壽命的提高。 In this way, if the crucible is held by the graphite retainer via the sacrificial material of the high melting point metal, since the crucible does not directly contact the graphite retainer, it is possible to suppress cracks and the like due to carbonization of the crucible. , can improve the life of the cockroach. Further, by using a graphite holder, the cost can be reduced. Therefore, the device can achieve both a reduction in cost and an increase in the life of the crucible.
此時,較佳為:前述坩堝的材質是以鎢、鉬、鉭中的至少1種為主要成分。 In this case, it is preferable that the material of the crucible is at least one of tungsten, molybdenum, and rhenium as a main component.
若為此種坩堝,則由於材質較為低廉,而成為一種可進一步降低成本之裝置。 If it is such a flaw, it is a device that can further reduce the cost because the material is relatively low.
此時,較佳為:前述加熱器為電阻加熱器。 In this case, it is preferable that the heater is a resistance heater.
於本發明的裝置中,可使用此種電阻加熱器。 In the apparatus of the present invention, such an electric resistance heater can be used.
此時,較佳為:前述高熔點金屬的犧牲材料是以鎢、鉬、鉭中的至少1種為主要成分。 In this case, it is preferable that the sacrificial material of the high melting point metal contains at least one of tungsten, molybdenum and rhenium as a main component.
若為此種犧牲材料,則裝置的犧牲材料即便於高溫中亦不會熔化,且成為一種不存在污染熔液之虞之裝置。 In the case of such a sacrificial material, the sacrificial material of the device does not melt even at a high temperature, and becomes a device which does not contaminate the melt.
此時,較佳為:前述氧化物單晶為藍寶石單晶。 In this case, it is preferred that the oxide single crystal is a sapphire single crystal.
本發明的裝置可作為用以製造藍寶石單晶之裝置。 The apparatus of the present invention can be used as a device for manufacturing a sapphire single crystal.
此時,較佳為:前述高熔點金屬的犧牲材料的厚度為2mm以上。 In this case, it is preferable that the thickness of the sacrificial material of the high melting point metal is 2 mm or more.
若為此種厚度,則可確實防止對坩堝的滲碳,成為一種可更有效地抑制坩堝的劣化之裝置。 With such a thickness, it is possible to surely prevent carburization of the crucible, and it is a device which can more effectively suppress the deterioration of the crucible.
如上所述,依據本發明,可同時達成坩堝壽命的提高與裝置成本的降低。 As described above, according to the present invention, it is possible to simultaneously achieve an increase in the life of the crucible and a reduction in the cost of the apparatus.
10‧‧‧單晶製造裝置 10‧‧‧Single crystal manufacturing equipment
11‧‧‧主腔室 11‧‧‧ main chamber
12‧‧‧閘閥 12‧‧‧ gate valve
13‧‧‧副腔室 13‧‧‧Sub-chamber
14‧‧‧坩堝 14‧‧‧坩埚
15‧‧‧熔液 15‧‧‧ melt
16‧‧‧隔熱材料 16‧‧‧Insulation materials
17‧‧‧單晶 17‧‧‧ single crystal
18‧‧‧保持器 18‧‧‧ Keeper
19‧‧‧坩堝支持軸 19‧‧‧坩埚 Support shaft
20‧‧‧提拉軸 20‧‧‧Tip shaft
21‧‧‧晶種固持架 21‧‧‧ seed crystal holder
22‧‧‧加熱器 22‧‧‧heater
23‧‧‧犧牲材料 23‧‧‧Sacrificial materials
25‧‧‧氣體導入管 25‧‧‧ gas introduction tube
26‧‧‧氣體排出管 26‧‧‧ gas discharge pipe
27‧‧‧真空泵 27‧‧‧Vacuum pump
28‧‧‧氣體排出管 28‧‧‧ gas discharge pipe
第1圖是繪示本發明的單晶製造裝置的一例之示意圖。 Fig. 1 is a schematic view showing an example of a single crystal production apparatus of the present invention.
第2圖是觀察坩堝底部的劣化狀況之圖。 Fig. 2 is a view showing the deterioration state of the bottom of the crucible.
以下,針對本發明,作為實施態樣的一例,一邊參照圖式一邊詳細地說明,但本發明並不限定於此實施態樣。 Hereinafter, the present invention will be described in detail with reference to the drawings as an example of the embodiment, but the present invention is not limited to the embodiment.
第1圖是本發明的單晶製造裝置的示意圖。 Fig. 1 is a schematic view of a single crystal production apparatus of the present invention.
第1圖的本發明的單晶製造裝置10,是藉由CZ法,由在坩堝14內將原料加熱熔融而得的熔液15,提拉並製造藍寶石單晶等氧化物單晶17之裝置。 The single crystal manufacturing apparatus 10 of the present invention in the first embodiment is a device for pulling up and producing an oxide single crystal 17 such as a sapphire single crystal by a melt 15 obtained by heating and melting a raw material in a crucible 14 by a CZ method. .
單晶製造裝置10,具備:加熱器22,其對坩堝14內的原料進行加熱;主腔室11,其配置有坩堝14;及,副腔室(提 拉腔室,pull chamber)13,其以可利用閘閥12隔開的方式連接於該主腔室11上。 The single crystal manufacturing apparatus 10 includes a heater 22 that heats a raw material in the crucible 14 , a main chamber 11 in which a crucible 14 is disposed, and a sub chamber (lifting) A pull chamber 13 is attached to the main chamber 11 in such a manner as to be separable by the gate valve 12.
又,如第1圖所示,裝置10具有氣體導入管25與氣體排出管26,例如在單晶生長時等的一般情況下,可經由氣體導入管25,自副腔室13的上方向爐內導入惰性氣體等,並藉由真空泵27等,由主腔室11的底部的氣體排出管26將此導入的氣體排出至爐外。另一方面,當添加原料等時,將閘閥12關閉,並在副腔室13內進行原料添加等操作,之後,可使用副腔室用的氣體排出管28與氣體導入管25,使副室13內實施氣體交換。 Further, as shown in Fig. 1, the apparatus 10 includes a gas introduction pipe 25 and a gas discharge pipe 26, and for example, in the case of single crystal growth, the gas can be introduced from the upper side of the sub-chamber 13 via the gas introduction pipe 25. An inert gas or the like is introduced thereinto, and the introduced gas is discharged to the outside of the furnace by the gas discharge pipe 26 at the bottom of the main chamber 11 by a vacuum pump 27 or the like. On the other hand, when a raw material or the like is added, the gate valve 12 is closed, and an operation such as adding a raw material is performed in the sub-chamber 13, and thereafter, the gas discharge pipe 28 for the sub-chamber and the gas introduction pipe 25 can be used to make the sub-chamber Gas exchange is carried out within 13.
又,裝置10,具備:石墨系毛氈材料等的隔熱材料16,其包圍坩堝14和加熱器22;提拉軸20,其用於提拉單晶17;晶種固持架21,其保持晶種;石墨製保持器18,其支撐坩堝14;及,坩堝支持軸19,其隔著石墨製保持器18來支持坩堝14。 Further, the apparatus 10 includes a heat insulating material 16 such as a graphite-based felt material, which surrounds the crucible 14 and the heater 22, a pulling shaft 20 for pulling up the single crystal 17, and a seed crystal holder 21 which holds the crystal A graphite holder 18 supporting the crucible 14 and a crucible support shaft 19 supporting the crucible 14 via a graphite holder 18.
於本發明的裝置10中,坩堝14是藉由石墨製保持器18隔著高熔點金屬的犧牲材料23而被保持。例如,於坩堝14的底部與石墨製保持器18的上表面之間,插入並設置犧牲材料23。 In the apparatus 10 of the present invention, the crucible 14 is held by the graphite holder 18 via the sacrificial material 23 of the high melting point metal. For example, between the bottom of the crucible 14 and the upper surface of the graphite holder 18, the sacrificial material 23 is inserted and disposed.
如此一來,若坩堝14是藉由石墨製保持器18隔著高熔點金屬的犧牲材料23來保持,則坩堝14是以不接觸石墨製保持器18之狀態而被保持,可防止由坩堝14的碳化所導致的龜裂等劣化,而可有效地提高坩堝14的壽命。進一步,藉由使保持坩堝14之保持器18由使用石墨材料和碳複合材料 等之石墨製成,則導熱性良好,並且可降低成本。因此,可同時達成成本的降低、與坩堝14壽命的提高。此處,當石墨製保持器18是以包圍至坩堝14的側面之方式來支持坩堝14時,藉由犧牲材料23,以坩堝14的底面、以及側面均不與石墨製保持器18直接接觸之方式而保持。 In this way, if the crucible 14 is held by the graphite holder 18 via the sacrificial material 23 of the high melting point metal, the crucible 14 is held in a state where it does not contact the graphite holder 18, and the crucible 14 can be prevented. The cracking or the like caused by the carbonization deteriorates, and the life of the crucible 14 can be effectively improved. Further, by using the graphite material and the carbon composite material for the holder 18 holding the crucible 14 When made of graphite, the thermal conductivity is good and the cost can be reduced. Therefore, it is possible to achieve both a reduction in cost and an increase in the life of the crucible 14 at the same time. Here, when the graphite holder 18 supports the crucible 14 in such a manner as to surround the side surface of the crucible 14, the bottom surface of the crucible 14 and the side surface are not in direct contact with the graphite holder 18 by the sacrificial material 23. Keep it in the way.
於第2圖中,繪示出高溫下與石墨製保持器接觸之情況下的坩堝的劣化狀況的圖像。如第2圖(a)所示,當使坩堝直接保持於石墨製保持器上時,坩堝底面產生龜裂,而難以反復使用。又,如第2圖(b)所示,當石墨製保持器接觸坩堝的側面時,發生反應,膨脹並變形。於本發明中,可有效地防止此種坩堝的劣化。 In Fig. 2, an image showing the deterioration state of ruthenium in the case of contact with a graphite holder at a high temperature is shown. As shown in Fig. 2(a), when the crucible is directly held on the graphite holder, the bottom surface of the crucible is cracked and it is difficult to use it repeatedly. Further, as shown in Fig. 2(b), when the graphite retainer contacts the side surface of the crucible, a reaction occurs, which expands and deforms. In the present invention, deterioration of such defects can be effectively prevented.
又,較佳為:將加熱器22設為電阻加熱器,坩堝14的材質,設為以鎢、鉬、鉭中的至少1種為主要成分之金屬坩堝。 Moreover, it is preferable that the heater 22 is a resistance heater, and the material of the crucible 14 is a metal crucible containing at least one of tungsten, molybdenum, and rhenium as a main component.
作為本發明的裝置10的加熱器22,亦可使用高頻加熱器,作為坩堝14,亦可使用銥坩堝,但於本發明中,較佳為使用以低廉的鎢、鉬、鉭為主要成分之坩堝。此時,由於耐氧化性低於銥,因此,使用碳製的隔熱材料16;由於碳為良導體,因此,若為高頻加熱方式則熱效率較差,而較佳為使用電阻加熱器。藉此,可進一步降低成本。 As the heater 22 of the apparatus 10 of the present invention, a high-frequency heater can be used, and ruthenium 14 can also be used. However, in the present invention, it is preferable to use inexpensive tungsten, molybdenum, and niobium as main components. After that. At this time, since the oxidation resistance is lower than that of ruthenium, the carbon heat insulating material 16 is used; since carbon is a good conductor, if the high frequency heating method is used, the thermal efficiency is inferior, and it is preferable to use a resistance heater. Thereby, the cost can be further reduced.
較佳為:高熔點金屬的犧牲材料23是以鎢、鉬、鉭中的至少1種為主要成分。 Preferably, the sacrificial material 23 of the high melting point metal is composed of at least one of tungsten, molybdenum and rhenium.
若為此種犧牲材料23,則即便於高溫中亦不熔化,且不存在污染熔液15之虞。此時,更佳為將犧牲材料23的材質 設為與坩堝14的材質不相同。若為相同材質,則由於可能會因擴散焊接現象而使犧牲材料23熔敷(擴散熔接)於坩堝底,因此,使坩堝和犧牲材料彼此為不同材質,可進一步提高坩堝14的壽命,並且犧牲材料23亦可反復使用。 If such a sacrificial material 23 is used, it does not melt even at a high temperature, and there is no contamination of the molten metal 15 . At this time, it is better to sacrifice the material of the material 23 Set to be different from the material of 坩埚14. If it is the same material, the sacrificial material 23 may be welded (diffused and welded) to the bottom of the crucible due to the diffusion welding phenomenon, so that the crucible and the sacrificial material are made of different materials, which can further improve the life of the crucible 14 and sacrifice Material 23 can also be used repeatedly.
高熔點金屬的犧牲材料23,可為例如圓板狀,並且厚度較佳為2mm以上,尤其是3mm以上。 The sacrificial material 23 of the high melting point metal may be, for example, a disk shape, and preferably has a thickness of 2 mm or more, particularly 3 mm or more.
若為此種厚度,可確實防止對坩堝14的滲碳,更有效地抑制坩堝14的劣化。此時,犧牲材料23的厚度的上限並無特別限定,但由於需要觀察劣化情況而更換犧牲材料23,因此,例如藉由使厚度為20mm以下,則容易操作,亦可將由更換所導致的成本的上升抑制為較低。 With such a thickness, carburization of the crucible 14 can be surely prevented, and deterioration of the crucible 14 can be more effectively suppressed. In this case, the upper limit of the thickness of the sacrificial material 23 is not particularly limited. However, since the sacrificial material 23 needs to be replaced when the deterioration is observed, for example, when the thickness is 20 mm or less, the operation is easy, and the cost due to replacement may be used. The rise inhibition is lower.
藉由使用如上所述的本發明的單晶製造裝置,來製造藍寶石單晶等氧化物單晶,由於可反復使用坩堝,因此,可降低裝置成本,有助於降低氧化物單晶的製造成本。 By using the single crystal manufacturing apparatus of the present invention as described above, an oxide single crystal such as a sapphire single crystal can be produced, and since helium can be repeatedly used, the cost of the apparatus can be reduced, and the manufacturing cost of the oxide single crystal can be reduced. .
以下,示出實施例和比較例來更具體地說明本發明,但本發明並不限定於該等實施例。 Hereinafter, the present invention will be more specifically described by way of examples and comparative examples, but the invention is not limited to the examples.
(實施例、比較例) (Examples, Comparative Examples)
使用第1圖所示的本發明的單晶製造裝置,來進行藍寶石單晶製造。 The sapphire single crystal production was carried out using the single crystal production apparatus of the present invention shown in Fig. 1.
作為實施例,將鎢製和鉬製圓板(厚度2mm)插入並設置於鎢製坩堝的底部與石墨製保持器之間,將鉬製和鎢製圓板(厚度2mm)插入並設置於鉬製坩堝的底部與石墨製保持器之間,確認以上兩種情況下的坩堝的劣化。 As an example, a tungsten and molybdenum disc (thickness: 2 mm) was inserted and placed between the bottom of the tungsten crucible and the graphite holder, and a molybdenum and tungsten disc (thickness: 2 mm) was inserted and placed in the molybdenum. The deterioration of the crucible in the above two cases was confirmed between the bottom of the crucible and the graphite holder.
又,作為比較例,利用石墨製保持器直接保持鎢製和鉬製坩堝,除此以外,與實施例相同地進行單晶製造,並確認坩堝的劣化。 In addition, as a comparative example, the single crystal was produced in the same manner as in the Example except that the tungsten and the molybdenum were directly held by the graphite holder, and the deterioration of the crucible was confirmed.
此時,將坩堝的尺寸設為外徑250mm、坩堝底平面部直徑170mm、高度200mm,將犧牲材料亦即圓板的尺寸設為外徑160mm、厚度2mm。又,在考慮到同心性的前提下,將圓板插入至坩堝底與石墨製保持器之間。 At this time, the size of the crucible was set to an outer diameter of 250 mm, a bottom plane portion diameter of 170 mm, and a height of 200 mm, and the size of the disc, that is, the disc, was set to have an outer diameter of 160 mm and a thickness of 2 mm. Further, the circular plate is inserted between the bottom of the crucible and the graphite holder in consideration of concentricity.
表1是在實施例中確認坩堝的材質與圓板(犧牲材料)的材質的每種組合下的坩堝底的劣化狀況之結果、以及比較例中確認坩堝底的劣化狀況之結果。 Table 1 is a result of confirming the deterioration state of the base of each of the materials of the crucible and the material of the disc (sacrificial material) in the examples, and the results of confirming the deterioration of the bottom of the crucible in the comparative example.
在隔著圓板進行保持之實施例的情況下,觀察提拉結束後的坩堝底的狀態,並未發現坩堝底的劣化。 In the case of the embodiment in which the holding was carried out through the circular plate, the state of the bottom of the bottom after the completion of the pulling was observed, and the deterioration of the bottom was not observed.
在未鋪墊圓板之比較例的情況下,即使是在1批中,坩堝底面的變化亦較大,發現龜裂、變形等劣化。 In the case of the comparative example of the unpaved disc, even in one batch, the change in the bottom surface of the crucible was large, and cracking, deformation, and the like were found to be deteriorated.
又,在對鉬坩堝插入鉬製的圓板之情況下,未發現坩堝的劣化,但亦可能會因擴散焊接現象而使圓板熔敷於坩堝底。因此得知使坩堝與圓板(犧牲材料)為不同材質,則可穩定地使用。 Further, in the case where a molybdenum crucible was inserted into a disc made of molybdenum, no deterioration of niobium was observed, but the disc may be welded to the bottom of the crucible due to the diffusion welding phenomenon. Therefore, it is known that the crucible and the disc (sacrificial material) are made of different materials, and it can be used stably.
另外,本發明並非限定於上述實施形態。上述實施 形態為例示,具有與本發明的申請專利範圍中所述的技術思想實質相同的結構、並發揮相同作用效果之技術方案,均包含在本發明的技術範圍內。 Further, the present invention is not limited to the above embodiment. Implementation above The embodiment is substantially the same as the technical idea described in the claims of the present invention, and the technical effects of the same effects are all included in the technical scope of the present invention.
10‧‧‧單晶製造裝置 10‧‧‧Single crystal manufacturing equipment
11‧‧‧主腔室 11‧‧‧ main chamber
12‧‧‧閘閥 12‧‧‧ gate valve
13‧‧‧副腔室 13‧‧‧Sub-chamber
14‧‧‧坩堝 14‧‧‧坩埚
15‧‧‧熔液 15‧‧‧ melt
16‧‧‧隔熱材料 16‧‧‧Insulation materials
17‧‧‧單晶 17‧‧‧ single crystal
18‧‧‧保持器 18‧‧‧ Keeper
19‧‧‧坩堝支持軸 19‧‧‧坩埚 Support shaft
20‧‧‧提拉軸 20‧‧‧Tip shaft
21‧‧‧晶種固持架 21‧‧‧ seed crystal holder
22‧‧‧加熱器 22‧‧‧heater
23‧‧‧犧牲材料 23‧‧‧Sacrificial materials
25‧‧‧氣體導入管 25‧‧‧ gas introduction tube
26‧‧‧氣體排出管 26‧‧‧ gas discharge pipe
27‧‧‧真空泵 27‧‧‧Vacuum pump
28‧‧‧氣體排出管 28‧‧‧ gas discharge pipe
Claims (19)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012244780A JP2014091670A (en) | 2012-11-06 | 2012-11-06 | Manufacturing apparatus of single crystal |
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| Publication Number | Publication Date |
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| TW201422858A true TW201422858A (en) | 2014-06-16 |
Family
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW102138293A TW201422858A (en) | 2012-11-06 | 2013-10-23 | Single-crystal manufacturing device |
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| JP (1) | JP2014091670A (en) |
| TW (1) | TW201422858A (en) |
| WO (1) | WO2014073163A1 (en) |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61247683A (en) * | 1985-04-23 | 1986-11-04 | Seiko Epson Corp | Single crystal sapphire pulling device |
| JP2005001934A (en) * | 2003-06-11 | 2005-01-06 | Daiichi Kiden:Kk | Sapphire single crystal pulling growth equipment |
| JP2011105575A (en) * | 2009-11-20 | 2011-06-02 | Showa Denko Kk | Single crystal pulling apparatus |
| JP2011126738A (en) * | 2009-12-17 | 2011-06-30 | Showa Denko Kk | Apparatus for pulling single crystal, and method for pulling single crystal |
| JP5459004B2 (en) * | 2010-03-24 | 2014-04-02 | 住友金属鉱山株式会社 | Method for producing sapphire single crystal |
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| JP2014091670A (en) | 2014-05-19 |
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