TW201427089A - Light-emitting chip and method of manufacturing same - Google Patents
Light-emitting chip and method of manufacturing same Download PDFInfo
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- 238000004519 manufacturing process Methods 0.000 title claims abstract description 8
- 239000004065 semiconductor Substances 0.000 claims abstract description 82
- 239000000758 substrate Substances 0.000 claims abstract description 37
- 238000000034 method Methods 0.000 claims description 4
- 230000017525 heat dissipation Effects 0.000 abstract description 3
- 235000012431 wafers Nutrition 0.000 description 31
- 229910052751 metal Inorganic materials 0.000 description 7
- 239000002184 metal Substances 0.000 description 7
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 5
- 238000005530 etching Methods 0.000 description 2
- 239000011265 semifinished product Substances 0.000 description 2
- 229910002601 GaN Inorganic materials 0.000 description 1
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 1
- 229910000420 cerium oxide Inorganic materials 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 238000001020 plasma etching Methods 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/813—Bodies having a plurality of light-emitting regions, e.g. multi-junction LEDs or light-emitting devices having photoluminescent regions within the bodies
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/819—Bodies characterised by their shape, e.g. curved or truncated substrates
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/858—Means for heat extraction or cooling
- H10H20/8582—Means for heat extraction or cooling characterised by their shape
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/036—Manufacture or treatment of packages
- H10H20/0365—Manufacture or treatment of packages of means for heat extraction or cooling
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/83—Electrodes
- H10H20/832—Electrodes characterised by their material
- H10H20/833—Transparent materials
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/882—Scattering means
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Abstract
一種發光晶片,包括基板及依次堆疊於基板上的第一半導體層、發光層、第二半導體層及電極,發光晶片開設從第二半導體頂部至少延伸至第一半導體層頂部的溝槽,發光層側面發出的光線經由溝槽射出發光晶片外。此發光晶片可兼顧散熱及出光效率,從而適於產業上的應用。本發明還提供一種製造發光晶片組合的方法。An illuminating chip includes a substrate and a first semiconductor layer, a luminescent layer, a second semiconductor layer and an electrode sequentially stacked on the substrate, and the luminescent wafer opens a trench extending from the top of the second semiconductor to at least the top of the first semiconductor layer, the luminescent layer The light emitted from the side is emitted outside the light-emitting chip via the groove. The light-emitting chip can meet the heat dissipation and light-emitting efficiency, and is suitable for industrial applications. The present invention also provides a method of making a light emitting wafer combination.
Description
本發明涉及一種晶片,特別是指一種發光晶片及其製造方法。The present invention relates to a wafer, and more particularly to an illuminating wafer and a method of manufacturing the same.
發光二極體作為新興的光源,已被廣泛地應用於各種用途當中。發光二極體通常包括基座、安裝於基座上的晶片及覆蓋晶片的封裝體。晶片由基板及依次生長於基板上的N型半導體層、發光層及P型半導體層組成。晶片還分別在其N型半導體層及P型半導體層上形成P電極及N電極,以與基座電連接,從而將電流引入晶片內以驅動發光層發光。As an emerging light source, light-emitting diodes have been widely used in various applications. The light emitting diode generally includes a susceptor, a wafer mounted on the pedestal, and a package covering the wafer. The wafer is composed of a substrate and an N-type semiconductor layer, a light-emitting layer, and a P-type semiconductor layer which are sequentially grown on the substrate. The wafer also forms a P electrode and an N electrode on the N-type semiconductor layer and the P-type semiconductor layer, respectively, to be electrically connected to the pedestal, thereby introducing a current into the wafer to drive the luminescent layer to emit light.
然而,發光晶片在工作時會產生熱量。晶片的面積越大,電流所流經的面積就越多,導致產生的熱量也就越多,因而晶片的發光效率也會隨之降低。如果減小晶片面積,雖然發熱量減少,但相應的出光也會減少,同樣也會影響到晶片的發光效率。However, the luminescent wafer generates heat when it is in operation. The larger the area of the wafer, the more the area through which the current flows, resulting in more heat generated, and the luminous efficiency of the wafer is also reduced. If the wafer area is reduced, although the amount of heat generation is reduced, the corresponding light output is also reduced, which also affects the luminous efficiency of the wafer.
因此,有必要提供一種兼顧出光及散熱的發光晶片及其製造方法。Therefore, it is necessary to provide a light-emitting wafer that combines light emission and heat dissipation and a method of manufacturing the same.
一種發光晶片,包括基板及依次堆疊於基板上的第一半導體層、發光層、第二半導體層及電極,發光晶片開設從第二半導體頂部至少延伸至第一半導體層頂部的溝槽,發光層側面發出的光線經由溝槽射出發光晶片外。An illuminating chip includes a substrate and a first semiconductor layer, a luminescent layer, a second semiconductor layer and an electrode sequentially stacked on the substrate, and the luminescent wafer opens a trench extending from the top of the second semiconductor to at least the top of the first semiconductor layer, the luminescent layer The light emitted from the side is emitted outside the light-emitting chip via the groove.
一種發光晶片的製造方法,包括步驟:提供接合有基板的半導體結構,半導體結構包括依次堆疊的第一半導體層、發光層及第二半導體層;在半導體結構上開設開槽,開槽從第二半導體層頂面至少延伸至第一半導體層頂面,發光層側面發出的光線經由開槽射出發光晶片外。A method of manufacturing an illuminating wafer, comprising the steps of: providing a semiconductor structure bonded with a substrate, the semiconductor structure comprising a first semiconductor layer, a luminescent layer and a second semiconductor layer stacked in sequence; forming a groove in the semiconductor structure, and grooving from the second The top surface of the semiconductor layer extends at least to the top surface of the first semiconductor layer, and the light emitted from the side of the light-emitting layer is emitted outside the light-emitting chip through the opening.
由於通過在發光晶片上開設溝槽,使電流流經發光晶片的面積減少,從而降低發光晶片工作時所產生的熱量。並且,由於溝槽貫穿發光層而延伸至第一半導體層,因此發光層的側面所發出的光線可經由凹槽射出發光晶片外,從而在一定程度上抵消由於溝槽的開設導致發光層的面積較少所帶來的出光減少的情況。因此,發光晶片可同時兼顧到散熱及出光效率,適於產業上的推廣應用。Since the area through which the current flows through the light-emitting wafer is reduced by forming a trench on the light-emitting wafer, the heat generated when the light-emitting wafer is operated is reduced. Moreover, since the trench extends through the light emitting layer to the first semiconductor layer, the light emitted from the side surface of the light emitting layer can be emitted outside the light emitting chip via the groove, thereby offset the area of the light emitting layer due to the opening of the trench to some extent. Less of the reduction in light output. Therefore, the light-emitting chip can simultaneously take into consideration heat dissipation and light-emitting efficiency, and is suitable for industrial promotion and application.
請參閱圖1-6,示出了本發明一實施例的發光晶片90製造方法,其主要包括如下步驟:Referring to FIG. 1-6, a method for fabricating an illuminating wafer 90 according to an embodiment of the present invention is shown, which mainly includes the following steps:
如圖1-2所示,先提供一種接合有基板10的半導體結構20。半導體結構20包括依次堆疊於基板10上的第一半導體層30、發光層40及第二半導體層50。第一半導體層30、第二半導體層50及發光層40均由氮化鎵等材料製造。本實施例中,第一半導體層30為P型半導體層,第二半導體層50為N型半導體層,基板10為金屬基板。半導體結構20的製造過程是先將第二半導體層50、發光層40及第一半導體層30先依次生長在一臨時基板(如藍寶石基板,圖未示)上,然後在第一半導體層30上接合金屬基板10,最後再剝離臨時基板。金屬基板10在接合至第一半導體層30之前預先開設有多個開槽100。這些開槽100可通過蝕刻的方式形成於基板10內。這些開槽100包括複數貫穿金屬基板10頂面及底面的第一開槽102及第二開槽104。每一第一開槽102的截面均呈十字形,每一第二開槽104的截面均呈矩形。這些第一開槽102陣列排布於基板10的中部區域,第二開槽104環繞第一開槽102而排布於基板10的邊緣位置。各相鄰的第一開槽102及第二開槽104共同將基板10隔設為多個呈正方形的島區106。這些島區106呈陣列排布,且相鄰的島區106之間通過連接段108進行連接。連接段108的寬度遠小於島區106的寬度,長度大致為島區106長度的一半。As shown in FIGS. 1-2, a semiconductor structure 20 to which a substrate 10 is bonded is provided. The semiconductor structure 20 includes a first semiconductor layer 30, a light emitting layer 40, and a second semiconductor layer 50 which are sequentially stacked on a substrate 10. The first semiconductor layer 30, the second semiconductor layer 50, and the light-emitting layer 40 are each made of a material such as gallium nitride. In the present embodiment, the first semiconductor layer 30 is a P-type semiconductor layer, the second semiconductor layer 50 is an N-type semiconductor layer, and the substrate 10 is a metal substrate. The semiconductor structure 20 is formed by sequentially growing the second semiconductor layer 50, the light emitting layer 40, and the first semiconductor layer 30 on a temporary substrate (such as a sapphire substrate, not shown), and then on the first semiconductor layer 30. The metal substrate 10 is bonded, and finally the temporary substrate is peeled off. The metal substrate 10 is preliminarily provided with a plurality of slits 100 before being bonded to the first semiconductor layer 30. These slots 100 can be formed in the substrate 10 by etching. The slots 100 include a plurality of first slots 102 and second slots 104 extending through the top and bottom surfaces of the metal substrate 10. Each of the first slots 102 has a cross section, and each of the second slots 104 has a rectangular cross section. The array of the first slots 102 is arranged in a central portion of the substrate 10, and the second slots 104 are arranged around the first slots 102 at the edge of the substrate 10. Each of the adjacent first slots 102 and second slots 104 collectively partitions the substrate 10 into a plurality of square island regions 106. These island areas 106 are arranged in an array, and adjacent island areas 106 are connected by a connecting section 108. The width of the connecting section 108 is much smaller than the width of the island area 106 and is approximately half the length of the island area 106.
再如圖3-4所示,在第一半導體層30、發光層40及第二半導體層50所組成的半導體結構20上形成與基板10的開槽100結構相同的開槽200。這些開槽200可通過等離子蝕刻的方式形成。這些開槽200也貫穿半導體結構20的頂面及底面而與基板10的開槽100連通。這些開槽200也包括複數第一開槽202及第二開槽204。半導體結構20的第一開槽202及第二開槽204的結構及分佈與基板10的第一開槽102及第二開槽104的結構及分佈均相同。半導體結構20被第一開槽202及第二開槽204分隔為多個島區206。這些島區206呈陣列排布,且相鄰島區206之間通過連接段208連接。Further, as shown in FIG. 3-4, a trench 200 having the same structure as that of the trench 100 of the substrate 10 is formed on the semiconductor structure 20 composed of the first semiconductor layer 30, the light-emitting layer 40, and the second semiconductor layer 50. These slots 200 can be formed by plasma etching. These slots 200 also penetrate the top and bottom surfaces of the semiconductor structure 20 to communicate with the slots 100 of the substrate 10. These slots 200 also include a plurality of first slots 202 and second slots 204. The structure and distribution of the first slot 202 and the second slot 204 of the semiconductor structure 20 are the same as those of the first slot 102 and the second slot 104 of the substrate 10. The semiconductor structure 20 is separated into a plurality of island regions 206 by a first trench 202 and a second trench 204. These island regions 206 are arranged in an array, and adjacent island regions 206 are connected by a connecting segment 208.
最後,如圖5-6所示,在開槽100、200內注入透明絕緣層60。透明絕緣層60從基板10的底面延伸至第二半導體層50的頂面而完全填滿各開槽100、200,從而對在開槽200內暴露出的半導體結構20側面起到保護作用。本實施例中,透明絕緣層60由二氧化矽製造。透明絕緣層60的頂面與第二半導體層50的頂面齊平。之後,再在第二半導體層50的頂面及透明絕緣層60的頂面通過濺鍍形成一透明導電層70,並在透明導電層70上通過蒸鍍形成一電極80,從而形成發光晶片90。該透明導電層70覆蓋並連接所有島區206頂部,以將從電極80引入的電流均勻擴散至每個島區206內。本實施例中,透明導電層70優選採用氧化銦錫製造,電極80優選採用金屬材料製造。Finally, as shown in FIGS. 5-6, a transparent insulating layer 60 is implanted into the grooves 100, 200. The transparent insulating layer 60 extends from the bottom surface of the substrate 10 to the top surface of the second semiconductor layer 50 to completely fill the respective trenches 100, 200, thereby protecting the side surface of the semiconductor structure 20 exposed in the trench 200. In the present embodiment, the transparent insulating layer 60 is made of cerium oxide. The top surface of the transparent insulating layer 60 is flush with the top surface of the second semiconductor layer 50. Thereafter, a transparent conductive layer 70 is formed on the top surface of the second semiconductor layer 50 and the top surface of the transparent insulating layer 60 by sputtering, and an electrode 80 is formed on the transparent conductive layer 70 by evaporation to form the light-emitting wafer 90. . The transparent conductive layer 70 covers and connects the tops of all of the island regions 206 to evenly diffuse current drawn from the electrodes 80 into each of the island regions 206. In the present embodiment, the transparent conductive layer 70 is preferably made of indium tin oxide, and the electrode 80 is preferably made of a metal material.
工作時,該發光晶片90置於一金屬基座(圖未示)上,使其基板10直接與金屬基座接觸。電流從金屬基座引入發光晶片90內。電流依次流經基板10、第一半導體層30、發光層40、第二半導體層50及透明導電層70,並最終經由電極80引出發光晶片90。由於採用開槽200將半導體結構20分成多個島區206,電流所需流經發光晶片90的面積減少,因此可降低發光晶片90所發出的熱量。並且,由於各島區206的發光層40側面均暴露在開槽內200,因此發光層40側面所發出的光線可經由透明絕緣層60及透明導電層70傳輸至發光晶片90外,從而在一定程度上抵消由於發光層40面積減小而導致出光減少的問題。此外,透明導電層70連接每個島區206的頂部,因此可將電流均勻地散佈在每個島區206內,使出光更為均勻。In operation, the luminescent wafer 90 is placed on a metal pedestal (not shown) such that the substrate 10 is in direct contact with the metal pedestal. Current is introduced into the luminescent wafer 90 from the metal pedestal. The current sequentially flows through the substrate 10, the first semiconductor layer 30, the light-emitting layer 40, the second semiconductor layer 50, and the transparent conductive layer 70, and finally the light-emitting wafer 90 is taken out via the electrode 80. Since the semiconductor structure 20 is divided into a plurality of island regions 206 by using the slits 200, the area of the current required to flow through the light-emitting wafers 90 is reduced, so that the heat emitted from the light-emitting wafers 90 can be reduced. Moreover, since the sides of the light-emitting layer 40 of each of the island regions 206 are exposed in the slot 200, the light emitted from the side of the light-emitting layer 40 can be transmitted to the outside of the light-emitting chip 90 via the transparent insulating layer 60 and the transparent conductive layer 70, thereby To the extent that the reduction in light emission due to the reduction in the area of the light-emitting layer 40 is offset. In addition, a transparent conductive layer 70 is connected to the top of each of the island regions 206 so that current can be evenly distributed throughout each of the island regions 206 to make the light more uniform.
可以理解地,半導體結構20上所開設的開槽200並不一定要貫通第一半導體層30,其也可僅延伸至第一半導體層30頂面而使發光層40的側面暴露出來。此時,發光層40側面所發出的光線同樣可從填在開槽200內的透明絕緣層60以及覆蓋半導體結構20的透明導電層70出射。此種情況下,基板10就不需要形成開槽100而可保留完整的結構。It can be understood that the slot 200 formed on the semiconductor structure 20 does not have to penetrate the first semiconductor layer 30, and may extend only to the top surface of the first semiconductor layer 30 to expose the side surface of the light-emitting layer 40. At this time, the light emitted from the side surface of the light-emitting layer 40 can also be emitted from the transparent insulating layer 60 filled in the slit 200 and the transparent conductive layer 70 covering the semiconductor structure 20. In this case, the substrate 10 does not need to form the slot 100 to retain the complete structure.
還可以理解地,半導體結構20上所開設的開槽200並不一定要包括第一開槽202及第二開槽204,也可僅包括其中的一種,或者是不同於第一開槽202及第二開槽204的其他的形狀的開槽(圖未示)。相應地,各島區206也不限於是正方形,其可以根據開槽200的形狀變化成其他的形狀。It is also understood that the slot 200 formed on the semiconductor structure 20 does not necessarily include the first slot 202 and the second slot 204, and may include only one of them, or may be different from the first slot 202 and The other slots of the second slot 204 are slotted (not shown). Accordingly, each island region 206 is not limited to being a square, and may be changed to other shapes depending on the shape of the slot 200.
還可以理解地,在極端情況下,各第一開槽202還可與相鄰的第一開槽202或者第二開槽204連通,從而消除半導體結構20的相鄰島區206之間的連接段208,以將相鄰的島區206徹底隔開。此種情況下基板10不形成對應的開槽100而保持完整的頂面,以對分離的島區206起到支撐作用,方便後續填注透明絕緣層60的過程。此時,相鄰的島區206之間並無直接連接關係,因而各自僅能通過透明導電層70與電極80導通,因此電流的分佈將更加均勻。It will also be appreciated that, in extreme cases, each of the first slots 202 may also be in communication with an adjacent first slot 202 or second slot 204 to eliminate connections between adjacent island regions 206 of the semiconductor structure 20. Segment 208 is to completely separate adjacent island regions 206. In this case, the substrate 10 does not form a corresponding slot 100 to maintain a complete top surface to support the separated island region 206, facilitating the subsequent filling of the transparent insulating layer 60. At this time, there is no direct connection between the adjacent island regions 206, and thus each can only be electrically connected to the electrode 80 through the transparent conductive layer 70, so that the current distribution will be more uniform.
還可以理解地,半導體結構20的第一開槽202及第二開槽204內側周面上還可進一步通過蝕刻形成粗糙面(圖未示)。因此,光線從發光層40側面出射的幾率將變大,從而使發光晶片90的亮度得到提升。It can also be understood that the first groove 202 of the semiconductor structure 20 and the inner circumferential surface of the second groove 204 may further be roughened by etching (not shown). Therefore, the probability that light rays are emitted from the side of the light-emitting layer 40 becomes large, so that the brightness of the light-emitting wafer 90 is improved.
綜上所述,本發明符合發明專利要件,爰依法提出專利申請。惟,以上所述者僅為本發明之較佳實施例,舉凡熟悉本案技藝之人士,在爰依本發明精神所作之等效修飾或變化,皆應涵蓋於以下之申請專利範圍內。In summary, the present invention complies with the requirements of the invention patent and submits a patent application according to law. The above description is only the preferred embodiment of the present invention, and equivalent modifications or variations made by those skilled in the art will be included in the following claims.
10...基板10. . . Substrate
100...開槽100. . . Slotting
102...第一開槽102. . . First slot
104...第二開槽104. . . Second slot
106...島區106. . . Island area
108...連接段108. . . Connection segment
20...半導體結構20. . . Semiconductor structure
200...開槽200. . . Slotting
202...第一開槽202. . . First slot
204...第二開槽204. . . Second slot
206...島區206. . . Island area
208...連接段208. . . Connection segment
30...第一半導體層30. . . First semiconductor layer
40...發光層40. . . Luminous layer
50...第二半導體層50. . . Second semiconductor layer
60...透明絕緣層60. . . Transparent insulation
70...透明導電層70. . . Transparent conductive layer
80...電極80. . . electrode
90...晶片90. . . Wafer
圖1示出本發明一實施例的發光晶片製造方法的第一個步驟。1 shows a first step of a method of fabricating an illuminating wafer according to an embodiment of the present invention.
圖2為經過圖1步驟之後所得半成品中基板的俯視圖。2 is a plan view of the substrate in the semi-finished product obtained after the step of FIG. 1.
圖3示出發光晶片製造方法的第二個步驟。Figure 3 shows the second step of the method of fabricating an illuminating wafer.
圖4示出經過圖3步驟之後所得半成品的俯視圖。Figure 4 shows a top view of the semifinished product obtained after the step of Figure 3.
圖5示出製造完成的發光晶片。Figure 5 shows a finished luminescent wafer.
圖6示出製造完成的發光晶片的俯視圖。Figure 6 shows a top view of a fabricated luminescent wafer.
10...基板10. . . Substrate
100...開槽100. . . Slotting
20...半導體結構20. . . Semiconductor structure
30...第一半導體層30. . . First semiconductor layer
40...發光層40. . . Luminous layer
50...第二半導體層50. . . Second semiconductor layer
200...開槽200. . . Slotting
Claims (10)
提供接合有基板的半導體結構,半導體結構包括依次堆疊的第一半導體層、發光層及第二半導體層;
在半導體結構上開設開槽,開槽從第二半導體層頂面貫穿發光層並至少延伸至第一半導體層頂面,發光層側面發出的光線經由開槽射出發光晶片外。A method of manufacturing a light-emitting wafer, comprising the steps of:
Providing a semiconductor structure bonded with a substrate, the semiconductor structure comprising a first semiconductor layer, a light emitting layer and a second semiconductor layer stacked in sequence;
A slot is formed in the semiconductor structure, the slot extends from the top surface of the second semiconductor layer through the light emitting layer and extends to at least the top surface of the first semiconductor layer, and the light emitted from the side of the light emitting layer is emitted outside the light emitting chip through the slot.
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW101149100A TWI563686B (en) | 2012-12-21 | 2012-12-21 | Led chip and method manufacturing the same |
| US13/921,215 US8987766B2 (en) | 2012-12-21 | 2013-06-19 | LED chip with groove and method for manufacturing the same |
| US14/621,393 US9356186B2 (en) | 2012-12-21 | 2015-02-13 | Method for manufacturing LED chip with groove |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW101149100A TWI563686B (en) | 2012-12-21 | 2012-12-21 | Led chip and method manufacturing the same |
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| TW201427089A true TW201427089A (en) | 2014-07-01 |
| TWI563686B TWI563686B (en) | 2016-12-21 |
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| TW101149100A TWI563686B (en) | 2012-12-21 | 2012-12-21 | Led chip and method manufacturing the same |
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| US (2) | US8987766B2 (en) |
| TW (1) | TWI563686B (en) |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7697584B2 (en) * | 2006-10-02 | 2010-04-13 | Philips Lumileds Lighting Company, Llc | Light emitting device including arrayed emitters defined by a photonic crystal |
| JP4765916B2 (en) * | 2006-12-04 | 2011-09-07 | サンケン電気株式会社 | Semiconductor light emitting device |
| JP5123573B2 (en) * | 2007-06-13 | 2013-01-23 | ローム株式会社 | Semiconductor light emitting device and manufacturing method thereof |
| JP5075786B2 (en) * | 2008-10-06 | 2012-11-21 | 株式会社東芝 | Light emitting device and manufacturing method thereof |
| TWI420704B (en) * | 2010-12-07 | 2013-12-21 | Advanced Optoelectronic Tech | Method for manufacturing light-emitting semiconductor chip |
| US8860059B2 (en) * | 2011-06-20 | 2014-10-14 | Xiamen Sanan Optoelectronics Technology Co., Ltd. | Light emitting devices, systems, and methods of manufacturing |
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2012
- 2012-12-21 TW TW101149100A patent/TWI563686B/en not_active IP Right Cessation
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2013
- 2013-06-19 US US13/921,215 patent/US8987766B2/en not_active Expired - Fee Related
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Also Published As
| Publication number | Publication date |
|---|---|
| US9356186B2 (en) | 2016-05-31 |
| US20140175497A1 (en) | 2014-06-26 |
| US8987766B2 (en) | 2015-03-24 |
| TWI563686B (en) | 2016-12-21 |
| US20150162491A1 (en) | 2015-06-11 |
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