TW201401559A - Light emitting semiconductor structure and fabricating method thereof - Google Patents
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Abstract
Description
本案係為一種半導體結構及其製造方法,尤其應用於覆晶式半導體發光結構及其製造方法。 The present invention is a semiconductor structure and a method of fabricating the same, and is particularly applicable to a flip-chip semiconductor light-emitting structure and a method of fabricating the same.
發光二極體(light emitting diode,LED)可將電信號轉變為光信號,逐漸普及於顯示板、指示燈、照明等用途,與傳統光源相比,具有節能、效率較高、反應速度較快、壽命較長、較不易破損等優點。 Light emitting diode (LED) can convert electrical signals into optical signals, and is gradually popularized in display panels, indicator lights, illumination, etc. Compared with traditional light sources, it has energy saving, high efficiency and fast response speed. Long life and less damage.
發光二極體發光原理係利用磊晶結構中P型半導體與N型半導體相接,再於發光二極體的正負兩端施予電壓,當電流通過時,使電子電洞結合,結合的能量以光的形式發出,不過,結合時所產生的熱,對於發光二極體之特性、壽命及可靠度都有不良的影響,因此,習知技術透過覆晶式的封裝方式嘗試解決散熱問題。 The principle of light-emitting diode illumination is that the P-type semiconductor is connected to the N-type semiconductor in the epitaxial structure, and then the voltage is applied to the positive and negative ends of the light-emitting diode. When the current passes, the electron holes are combined and the combined energy is combined. It is emitted in the form of light. However, the heat generated during bonding has an adverse effect on the characteristics, life and reliability of the light-emitting diode. Therefore, the conventional technology attempts to solve the heat dissipation problem by flip-chip packaging.
請參見圖1,圖1係習知覆晶式(flip)發光二極體10側面示意圖,習知技術在覆晶式發光二極體元件與電路板17連線時,係利用發光二極體元件之導體16a、16b與電路板17之電極17a、17b電性耦合,兩導體16a、16b之一端各自垂直配置於磊晶結構12之不同電性摻雜層上,另一端則各自與電極17a、17b相接。 Referring to FIG. 1 , FIG. 1 is a schematic side view of a conventional flip-chip light-emitting diode 10 . The conventional technology utilizes a light-emitting diode when the flip-chip light-emitting diode element is connected to the circuit board 17 . The conductors 16a and 16b of the device are electrically coupled to the electrodes 17a and 17b of the circuit board 17, and one ends of the two conductors 16a and 16b are vertically disposed on different electrically doped layers of the epitaxial structure 12, and the other ends are respectively connected to the electrodes 17a. 17b meets.
據此,於覆晶式發光二極體元件耦接至電路板17後,彼此間仍存有許多空隙,為鞏固結構,利用毛細作用將絕緣膠N進行底部填充(underfill)該些空隙,然而,毛細作用無法均勻 填滿空隙,而且發光二極體之磊晶結構12厚度d很小,再加上與電路板17之間未填滿之空隙,使整體結構更加薄弱,於雷射剝離基板或有其他輕微外力撞擊時,皆容易造成磊晶結構12破裂(cracking)。再者,發明人發現以絕緣膠N進行底部填充空隙,散熱的效率並不佳。 Accordingly, after the flip-chip light-emitting diode elements are coupled to the circuit board 17, there are still many gaps between each other. To consolidate the structure, the insulating glue N is underfilled by the capillary action. , capillary action can not be uniform Filling the gap, and the thickness d of the epitaxial structure 12 of the light-emitting diode is small, and the gap between the unfilled circuit board 17 and the circuit board 17 makes the overall structure weaker, and the laser peels off the substrate or has other slight external force. When the impact occurs, the epitaxial structure 12 is easily cracked. Furthermore, the inventors have found that underfill voids with insulating glue N, the heat dissipation efficiency is not good.
有鑑於此,如何使磊晶結構不易受外力影響而破裂,提高發光二極體之可靠度,及增強散熱效率以提高其效能,係為發展本發明之主要目的。 In view of this, how to make the epitaxial structure less susceptible to cracking by external force, improve the reliability of the light emitting diode, and enhance the heat dissipation efficiency to improve its efficiency are the main purposes of developing the present invention.
本發明之一目的在於提供一種半導體發光結構,以達保護磊晶結構,提高其可靠度,及增強散熱效率以提高其效能之目的。為達前述目的,半導體發光結構包含磊晶結構、第一絕緣結構、第一導體結構、第二絕緣結構、第二導體結構。其中磊晶結構具有第一接觸及第二接觸,其中第一接觸及第二接觸位於磊晶結構的同一側;第一絕緣結構覆蓋部分第一接觸及部分第二接觸;第一導體結構覆蓋部分第一絕緣結構,並電性耦合第一接觸;第二絕緣結構覆蓋部分第一導體結構及部分第一絕緣層;第二導體結構覆蓋部分第二絕緣結構,並電性耦合第二接觸。 An object of the present invention is to provide a semiconductor light emitting structure for the purpose of protecting an epitaxial structure, improving its reliability, and enhancing heat dissipation efficiency to improve its performance. To achieve the foregoing objective, the semiconductor light emitting structure includes an epitaxial structure, a first insulating structure, a first conductor structure, a second insulating structure, and a second conductor structure. The epitaxial structure has a first contact and a second contact, wherein the first contact and the second contact are located on the same side of the epitaxial structure; the first insulating structure covers a portion of the first contact and a portion of the second contact; and the first conductor structure covers the portion The first insulating structure electrically couples the first contact; the second insulating structure covers a portion of the first conductor structure and a portion of the first insulating layer; and the second conductor structure covers a portion of the second insulating structure and electrically couples the second contact.
於本發明之一實施例中,上述之半導體發光結構中,第一導體結構具有第一支撐部,第二導體結構具有第二支撐部,第二絕緣結構具有第二水平部,第一支撐部、第二支撐部及第二水平部皆平行於磊晶結構之延伸表面,第二水平部位於第一支撐部及第二支撐部之間。 In an embodiment of the invention, in the semiconductor light emitting structure, the first conductor structure has a first support portion, the second conductor structure has a second support portion, and the second insulation structure has a second horizontal portion, the first support portion The second support portion and the second horizontal portion are both parallel to the extended surface of the epitaxial structure, and the second horizontal portion is located between the first support portion and the second support portion.
於本發明之一實施例中,上述之半導體發光結構之磊晶結 構包括第一摻雜層、第二摻雜層及發光層。其中,第一摻雜層與第一接觸電性耦合;第二摻雜層與第二接觸電性耦合,其中第二摻雜層與第一摻雜層的電性相反;發光層位於第一摻雜層與第二摻雜層之間。 In an embodiment of the invention, the epitaxial junction of the semiconductor light emitting structure The structure includes a first doped layer, a second doped layer, and a light emitting layer. The first doped layer is electrically coupled to the first contact; the second doped layer is electrically coupled to the second contact, wherein the second doped layer is electrically opposite to the first doped layer; the luminescent layer is located at the first Between the doped layer and the second doped layer.
於本發明之一實施例中,上述之半導體發光結構中,第一絕緣結構具有第一水平部,第一水平部平行於該等接觸之延伸表面,第一水平部位於第二接觸及第一支撐部之間。 In an embodiment of the invention, in the semiconductor light emitting structure, the first insulating structure has a first horizontal portion, the first horizontal portion is parallel to the extending surfaces of the contacts, and the first horizontal portion is located at the second contact and the first Between the support parts.
於本發明之一實施例中,上述之半導體發光結構之磊晶結構包括第一摻雜層、第二摻雜層及發光層。其中,第一摻雜層,與第二接觸電性耦合;第二摻雜層,與第一接觸電性耦合,其中第二摻雜層與第一摻雜層的電性相反;發光層位於第一摻雜層及第二摻雜層之間。 In an embodiment of the invention, the epitaxial structure of the semiconductor light emitting structure includes a first doped layer, a second doped layer, and a light emitting layer. The first doped layer is electrically coupled to the second contact; the second doped layer is electrically coupled to the first contact, wherein the second doped layer is electrically opposite to the first doped layer; the luminescent layer is located Between the first doped layer and the second doped layer.
於本發明之一實施例中,上述之第一支撐部位於第一接觸及第二水平部之間。 In an embodiment of the invention, the first support portion is located between the first contact and the second horizontal portion.
於本發明之一實施例中,上述之半導體發光結構之磊晶結構包括至少兩組磊晶單元,兩組磊晶單元之間具有穿隧接面,磊晶單元包括第一摻雜層、第二摻雜層、發光層。其中,第二摻雜層與第一摻雜層電性相反;發光層,位於第一摻雜層及第二摻雜層中間,發光層包含至少一量子井結構。 In an embodiment of the present invention, the epitaxial structure of the semiconductor light emitting structure includes at least two sets of epitaxial cells, the two sets of epitaxial cells have tunneling junctions, and the epitaxial cells include a first doped layer, Two doped layers, luminescent layers. The second doped layer is electrically opposite to the first doped layer; the luminescent layer is located between the first doped layer and the second doped layer, and the luminescent layer comprises at least one quantum well structure.
於本發明之一實施例中,上述之半導體發光結構之第一絕緣結構及第二絕緣結構之材料包含透明氧化物;第一導體結構及第二導體結構之材料包含金屬。 In an embodiment of the invention, the material of the first insulating structure and the second insulating structure of the semiconductor light emitting structure comprises a transparent oxide; and the material of the first conductive structure and the second conductive structure comprises a metal.
於本發明之一實施例中,上述之半導體發光結構更包括電路板,電路板上具有第一電極及第二電極,第一電極與第一導體結構電性耦合,且第二電極與第二導體結構電性耦合。 In an embodiment of the invention, the semiconductor light emitting structure further includes a circuit board having a first electrode and a second electrode, the first electrode electrically coupled to the first conductor structure, and the second electrode and the second electrode The conductor structure is electrically coupled.
本發明之一目的在於提供半導體發光結構製造方法,以達 保護磊晶結構,提高其可靠度,及增強散熱效率以提高其效能之目的。為達前述目的,半導體發光結構製造方法之步驟包括提供磊晶結構;於磊晶結構上形成第一接觸及第二接觸,其中第一接觸及第二接觸位於磊晶結構的同一側;形成第一絕緣結構,用以覆蓋部分第一接觸及部分第二接觸;於第一絕緣結構上形成第一導體結構,其中第一導體結構電性耦合第一接觸;於部分第一導體結構上形成第二絕緣結構,且第二絕緣結構覆蓋部分第一絕緣結構;以及於第二絕緣結構上形成第二導體結構,其中第二導體結構電性耦合第二接觸。 An object of the present invention is to provide a method for fabricating a semiconductor light emitting structure Protect the epitaxial structure, improve its reliability, and enhance heat dissipation efficiency to improve its performance. To achieve the foregoing objective, the method of fabricating a semiconductor light emitting structure comprises the steps of: providing an epitaxial structure; forming a first contact and a second contact on the epitaxial structure, wherein the first contact and the second contact are located on the same side of the epitaxial structure; An insulating structure for covering a portion of the first contact and a portion of the second contact; forming a first conductor structure on the first insulating structure, wherein the first conductor structure is electrically coupled to the first contact; and forming a portion of the first conductor structure a second insulating structure, and the second insulating structure covers a portion of the first insulating structure; and a second conductive structure is formed on the second insulating structure, wherein the second conductive structure is electrically coupled to the second contact.
於本發明之一實施例中,上述之半導體發光結構製造方法,其步驟更包括提供電路板,且電路板上具有第一電極及第二電極;以及將第一電極電性耦合至第一導體結構,及將第二電極電性耦合至第二導體結構。 In an embodiment of the present invention, the method for fabricating a semiconductor light emitting structure, the method further comprising: providing a circuit board having a first electrode and a second electrode; and electrically coupling the first electrode to the first conductor Structure, and electrically coupling the second electrode to the second conductor structure.
於本發明之一實施例中,上述之半導體發光結構製造方法中,磊晶結構之形成步驟包括提供基板;於基板上形成第一摻雜層;於第一摻雜層上形成發光層;於發光層上形成與第一摻雜層電性相反之第二摻雜層;以及蝕刻部分第二摻雜層及部分發光層,用以露出部分第一摻雜層。 In an embodiment of the present invention, in the method for fabricating a semiconductor light emitting structure, the step of forming an epitaxial structure includes providing a substrate; forming a first doped layer on the substrate; forming a light emitting layer on the first doped layer; Forming a second doped layer electrically opposite to the first doped layer on the light emitting layer; and etching a portion of the second doped layer and the portion of the light emitting layer to expose a portion of the first doped layer.
於本發明之一實施例中,上述之半導體發光結構製造方法,其中於第一摻雜層之露出部分上形成第一接觸,於第二摻雜層上形成第二接觸。 In an embodiment of the invention, the method for fabricating a semiconductor light emitting structure, wherein a first contact is formed on an exposed portion of the first doped layer, and a second contact is formed on the second doped layer.
於本發明之一實施例中,上述之半導體發光結構製造方法,其中於第一摻雜層之露出部分上形成第二接觸,於第二摻雜層上形成第一接觸。 In an embodiment of the invention, the method for fabricating a semiconductor light emitting structure, wherein a second contact is formed on an exposed portion of the first doped layer, and a first contact is formed on the second doped layer.
於本發明之一實施例中,上述之半導體發光結構製造方法,其中形成第一導體結構及第二導體結構之方法包括進行電 鍍製程。 In an embodiment of the invention, the method for fabricating a semiconductor light emitting structure, wherein the method of forming the first conductor structure and the second conductor structure comprises performing electricity Plating process.
於本發明之一實施例中,上述之半導體發光結構製造方法,其中基板為不透明基板,則上述步驟更包括移除基板,以曝露磊晶結構。 In an embodiment of the invention, the semiconductor light emitting structure manufacturing method, wherein the substrate is an opaque substrate, the step further comprises removing the substrate to expose the epitaxial structure.
為讓本發明之上述和其他目的、特徵和優點能更明顯易懂,下文特舉較佳實施例,並配合所附圖式,作詳細說明如下。 The above and other objects, features and advantages of the present invention will become more <RTIgt;
本發明技術適於應用在半導體發光結構,尤其是覆晶式半導體發光結構。請參見圖2A,圖2A係本發明之一實施例關於半導體發光結構之側面示意圖。首先,提供基板21,其材料可為矽、碳化矽、鋁、氧化鋁、氮化鎵、氮化銦、氮化鋁、氧化鋅、藍寶石、玻璃、石英或其組合,但不限定於此。此外,基板包括極化(polar)基板、半極化(semi-polar)基板或非極化(non-polar)基板。 The technique of the present invention is suitable for use in semiconductor light emitting structures, particularly flip chip semiconductor light emitting structures. Referring to FIG. 2A, FIG. 2A is a schematic side view of a semiconductor light emitting structure according to an embodiment of the present invention. First, the substrate 21 is provided, and the material thereof may be tantalum, tantalum carbide, aluminum, aluminum oxide, gallium nitride, indium nitride, aluminum nitride, zinc oxide, sapphire, glass, quartz or a combination thereof, but is not limited thereto. Further, the substrate includes a polar substrate, a semi-polar substrate, or a non-polar substrate.
接著,於基板21上形成磊晶結構22,磊晶結構22之第一側22a相對於基板21,磊晶結構22之第一摻雜層221位於基板21上,其第二摻雜層223形成於第一摻雜層221上,而兩摻雜層221、223之間具有發光層222,其可為單層量子井結構或多重量子井結構。另外,兩摻雜層221、223之電性相反,例如,第一摻雜層221可為N型摻雜層,而第二摻雜層223可為P型摻雜層,當然,兩摻雜層221、223之電性亦可互相置換。磊晶結構22的材料可為三族氮化物,例如氮化銦(InN)、氮化鎵(GaN)、氮化鋁(AlN)、氮化銦鎵(InGaN)、氮化銦鋁鎵(InAlGaN)等,但不限定於上述。 Next, an epitaxial structure 22 is formed on the substrate 21. The first side 22a of the epitaxial structure 22 is opposite to the substrate 21. The first doped layer 221 of the epitaxial structure 22 is on the substrate 21, and the second doped layer 223 is formed. On the first doped layer 221, there is a light-emitting layer 222 between the two doped layers 221, 223, which may be a single-layer quantum well structure or a multiple quantum well structure. In addition, the electrical properties of the two doped layers 221, 223 are opposite. For example, the first doped layer 221 may be an N-type doped layer, and the second doped layer 223 may be a P-type doped layer. The electrical properties of the layers 221, 223 can also be replaced with each other. The material of the epitaxial structure 22 may be a group III nitride such as indium nitride (InN), gallium nitride (GaN), aluminum nitride (AlN), indium gallium nitride (InGaN), indium aluminum gallium nitride (InAlGaN). ), etc., but not limited to the above.
於磊晶結構22上相對第一側22a之另一側上進行蝕刻製 程,蝕刻掉部分的第二摻雜層223及發光層222,以露出部分的第一摻雜層221之表面2211,及露出第二摻雜層223與發光層222之側壁2231,留下未被蝕刻掉的第二摻雜層223之表面2232。接著,於第二摻雜層223之表面2232上形成第二接觸24。 Etching on the other side of the epitaxial structure 22 opposite the first side 22a a portion of the second doped layer 223 and the light emitting layer 222 are etched away to expose a portion of the surface 2211 of the first doped layer 221 and expose the second doped layer 223 and the sidewall 2231 of the light emitting layer 222, leaving no The surface 2232 of the second doped layer 223 is etched away. Next, a second contact 24 is formed on the surface 2232 of the second doped layer 223.
於本實施例中,接著形成第一絕緣結構25a,用於覆蓋第二摻雜層223與發光層222之側壁2231,以及大部分的第二接觸24,第一絕緣結構25a中覆蓋側壁2231以及部分的第一摻雜層221之表面2211,並且第一絕緣結構25a具有一第一水平部251,第一水平部251平行於磊晶結構22之延伸表面而覆蓋第二接觸24。接著,於第一摻雜層221之表面2211上形成第一接觸23,並與第一絕緣結構25a相鄰,且因第一絕緣結構25a而與第二摻雜層223及發光層222絕緣。 In this embodiment, a first insulating structure 25a is formed to cover the sidewalls 2231 of the second doping layer 223 and the light emitting layer 222, and a majority of the second contacts 24, and the sidewalls 2231 are covered in the first insulating structure 25a. A portion of the first doped layer 221 has a surface 2211, and the first insulating structure 25a has a first horizontal portion 251 that covers the second contact 24 parallel to the extended surface of the epitaxial structure 22. Next, a first contact 23 is formed on the surface 2211 of the first doped layer 221, adjacent to the first insulating structure 25a, and insulated from the second doped layer 223 and the light emitting layer 222 by the first insulating structure 25a.
若第一摻雜層221為N型摻雜層,則與之相鄰的第一接觸23材料可由鈦、鋁、鉻、鉑、金所構成群組之一或其組合,例如鉻/鉑/金(Cr/Pt/Au)、鈦/鋁/鉑/金(Ti/Al/Pt/Au)或鈦/鉑/金(Ti/Pt/Au);若第二摻雜層223為P型摻雜層,則與之相鄰的第二接觸24的材料可由鎳、鉑、銀、氧化銦錫所構成群組之一或其組合,例如鎳/銀(Ni/Ag)、鎳/鉑/銀(Ni/Pt/Ag)或氧化銦錫/銀(ITO/Ag)。若第一摻雜層221及第二摻雜層223之電性相互置換,而第一接觸23與第二接觸24之材料亦相互置換。 If the first doped layer 221 is an N-type doped layer, the first contact 23 material adjacent thereto may be one of a group consisting of titanium, aluminum, chromium, platinum, gold or a combination thereof, such as chromium/platinum/ Gold (Cr/Pt/Au), titanium/aluminum/platinum/gold (Ti/Al/Pt/Au) or titanium/platinum/gold (Ti/Pt/Au); if the second doped layer 223 is P-type doped The impurity layer, the material of the second contact 24 adjacent thereto may be one of or a combination of nickel, platinum, silver, indium tin oxide, such as nickel/silver (Ni/Ag), nickel/platinum/silver (Ni/Pt/Ag) or indium tin oxide/silver (ITO/Ag). If the electrical properties of the first doped layer 221 and the second doped layer 223 are mutually replaced, the materials of the first contact 23 and the second contact 24 are also replaced with each other.
接著,利用電鍍製程於第一接觸23上形成第一導體結構26a,且第一導體結構26a與第一接觸23電性耦合。第一導體結構26a沿著與磊晶結構22表面,也就是第二摻雜區223之表面2232平行之方向延伸形成一第一支撐部261,第一支撐部261覆蓋大部分的第一絕緣結構25a。藉由第一絕緣結構25a 使第一導體結構26a與第二接觸24絕緣。 Next, a first conductor structure 26a is formed on the first contact 23 by an electroplating process, and the first conductor structure 26a is electrically coupled to the first contact 23. The first conductor structure 26a extends along a surface parallel to the surface of the epitaxial structure 22, that is, the surface 2232 of the second doping region 223, to form a first supporting portion 261. The first supporting portion 261 covers most of the first insulating structure. 25a. By the first insulating structure 25a The first conductor structure 26a is insulated from the second contact 24.
接下來,形成第二絕緣結構25b,用以覆蓋部分第一水平部251,且第二絕緣結構25b具有一第二水平部252。第二水平部252包覆大部分的第一支撐部261,但需曝露部分第一支撐部261之表面261S。進一步,再利用電鍍製程於第二接觸24上形成第二導體結構26b,且第二導體結構26b與第二接觸24電性耦合。第二導體結構26b沿著與磊晶結構表面,也就是第二摻雜區223之表面2232平行之方向延伸形成一第二支撐部262。藉由第二絕緣結構25b使第一導體結構26a與第二導體結構26b絕緣。 Next, a second insulating structure 25b is formed to cover a portion of the first horizontal portion 251, and the second insulating structure 25b has a second horizontal portion 252. The second horizontal portion 252 covers most of the first support portion 261, but exposes a portion 261S of the first support portion 261. Further, a second conductor structure 26b is formed on the second contact 24 by an electroplating process, and the second conductor structure 26b is electrically coupled to the second contact 24. The second conductor structure 26b extends along a surface parallel to the surface of the epitaxial structure, that is, the surface 2232 of the second doped region 223, to form a second support portion 262. The first conductor structure 26a is insulated from the second conductor structure 26b by the second insulating structure 25b.
值得注意的是,於本實施例中,第二水平部252位於第一支撐部261及第二支撐部262之間,利用該些導體結構26a、26b與該些絕緣結構25a、25b交錯相疊,形成如圖2A所示之具有結構穩固特性的半導體發光結構20,可達保護磊晶結構22之目的。再者,該些導體結構26a及26b具有一定厚度dm,總厚度2dm範圍可為20微米至50微米,足以增強對磊晶結構22之保護。據此,則不需再透過底部填充絕緣膠N的方式來穩固磊晶結構22,致使改善習知技術填充不均勻之缺失。 It should be noted that, in this embodiment, the second horizontal portion 252 is located between the first supporting portion 261 and the second supporting portion 262, and the conductive structures 25a, 26b are alternately stacked with the insulating structures 25a, 25b. The semiconductor light emitting structure 20 having the structurally stable characteristics as shown in FIG. 2A is formed to achieve the purpose of protecting the epitaxial structure 22. Further, the plurality of conductive structures 26a and 26b having a thickness d m, the total thickness of 2d m may range from 20 to 50 microns, sufficient to enhance the protection of the epitaxial structure 22. Accordingly, it is no longer necessary to stabilize the epitaxial structure 22 by filling the underfill rubber N, resulting in improvement of the lack of uniform filling of the prior art.
請參見圖2A與2B,圖2B係本發明之一實施例關於覆晶式半導體發光結構之側面示意圖。接著,將圖2A所示之半導體發光結構20翻轉(flip)180度,與電路板27做連線,將電路板27之第一電極271對應至第一導體結構26a未被覆蓋住的表面261S即可,使兩者電性耦合;以及將電路板27之第二電極272對應至第二導體結構26b之第二支撐部262之表面任一處,使兩者電性耦合。值得注意的是,上述半導體發光結構20之結構設計,致使電路板27方便與之連線,完成本實施例 之覆晶式半導體發光結構20’,並改善習知技術中,如兩導體16a、16b與兩電極17a、17b不易相互對準之缺失。 2A and 2B, FIG. 2B is a schematic side view of a flip-chip semiconductor light emitting structure according to an embodiment of the present invention. Next, the semiconductor light emitting structure 20 shown in FIG. 2A is flipped by 180 degrees, and is connected to the circuit board 27, and the first electrode 271 of the circuit board 27 is corresponding to the uncovered surface 261S of the first conductor structure 26a. That is, the two are electrically coupled; and the second electrode 272 of the circuit board 27 is corresponding to any surface of the second support portion 262 of the second conductor structure 26b to electrically couple the two. It should be noted that the structural design of the semiconductor light emitting structure 20 is such that the circuit board 27 is conveniently connected thereto, and the embodiment is completed. The flip-chip semiconductor light-emitting structure 20' is improved in the prior art, such as the absence of misalignment between the two conductors 16a, 16b and the two electrodes 17a, 17b.
關於電路板的材質可為金屬基印刷電路板、銅箔印刷式電路板、陶瓷基板或矽基板。另外,該些絕緣結構25a、25b之材料包含透明的氧化物,例如二氧化矽(SiO2)、氮化矽(Si3N4)、二氧化鈦(TiO2)、氧化鉭(Tantalum pentoxide,Ta2O5)等。而該些導體結構26a、26b之材料可為金屬,而金屬材質有助於覆晶式半導體發光結構20’散熱,藉此改善習知技術散熱效能不彰的問題。 The material of the circuit board may be a metal-based printed circuit board, a copper foil printed circuit board, a ceramic substrate or a germanium substrate. Further, the plurality of insulating structure 25a, 25b of material comprises a transparent oxide such as silicon dioxide (SiO 2), silicon nitride (Si 3 N 4), titanium oxide (TiO 2), tantalum oxide (Tantalum pentoxide, Ta 2 O 5 ) and so on. The materials of the conductor structures 26a, 26b may be metal, and the metal material helps the heat dissipation of the flip-chip semiconductor light-emitting structure 20', thereby improving the problem of poor heat dissipation performance of the prior art.
因此,對覆晶式半導體發光結構20’加入順方向電壓,使少數的電子電洞載體分別注入P型摻雜層及N型摻雜層,於P型摻雜層中,多數的電洞與被注入的少數電子再結合;而於N型摻雜層中,多數的電子與被注入的少數電洞再結合,於發光層中結合時即產生光。若第一摻雜層221為N型摻雜層,而第二摻雜層223為P型摻雜層,則第一電極271則應為負極,第二電極272則為正極,用以對PN接面施以順方向電壓。若該些摻雜層221、223之電性互換,則該些電極271、272之正負極亦互換。在一實施例中,基板21係為透明基板,可供由發光層所發出的光射向磊晶結構22之第一側22a,並穿過透明基板21射出。在另一實施例中,基板21為一不透明基板,則需移除不透明基板21,以曝露磊晶結構22。 Therefore, a forward voltage is applied to the flip-chip semiconductor light emitting structure 20', and a small number of electron hole carriers are respectively implanted into the P-type doped layer and the N-type doped layer. In the P-type doped layer, most of the holes are A small number of electrons to be injected are recombined; and in the N-type doped layer, most of the electrons are recombined with a small number of holes to be implanted, and light is generated when combined in the light-emitting layer. If the first doped layer 221 is an N-type doped layer and the second doped layer 223 is a P-type doped layer, the first electrode 271 should be a negative electrode and the second electrode 272 be a positive electrode for a PN. The junction is applied with a forward voltage. If the doping layers 221 and 223 are electrically exchanged, the positive and negative electrodes of the electrodes 271 and 272 are also interchanged. In one embodiment, the substrate 21 is a transparent substrate through which light emitted by the luminescent layer is directed toward the first side 22a of the epitaxial structure 22 and exits through the transparent substrate 21. In another embodiment, the substrate 21 is an opaque substrate, and the opaque substrate 21 is removed to expose the epitaxial structure 22.
請參見圖3,圖3為本發明第二實施例關於覆晶式半導體發光結構之側面示意圖,與前一實施例相同之特徵在於,利用導體結構與絕緣結構交錯相疊,據以保護磊晶結構22免受外力破壞。於覆晶式半導體發光結構30中,第一接觸33與第二摻雜層223之表面2232相鄰,且與之電性耦合;而第二接觸 34與第一摻雜層221之露出表面2211相鄰,且與之電性耦合。 Referring to FIG. 3, FIG. 3 is a schematic side view of a flip-chip semiconductor light-emitting structure according to a second embodiment of the present invention. The same feature as the previous embodiment is that the conductor structure and the insulating structure are alternately stacked to protect the epitaxial layer. Structure 22 is protected from external forces. In the flip-chip semiconductor light emitting structure 30, the first contact 33 is adjacent to and electrically coupled to the surface 2232 of the second doped layer 223; and the second contact 34 is adjacent to and electrically coupled to the exposed surface 2211 of the first doped layer 221.
於本實施例中,第一絕緣結構35a覆蓋側壁2231、部分的第一摻雜層221之表面2211以及少部分之第一接觸33,並與第二接觸34相鄰。接著,於第一接觸33上進行電鍍製程以形成第一導體結構36a,並與第一接觸33電性耦合。第一導體結構36a沿著第二摻雜區223之表面2232平行之方向延伸形成第一支撐部361,其覆蓋大部分的第一接觸33。 In the present embodiment, the first insulating structure 35a covers the surface 2211 of the sidewall 2231, a portion of the first doped layer 221, and a portion of the first contact 33, and is adjacent to the second contact 34. Next, an electroplating process is performed on the first contact 33 to form the first conductor structure 36a and electrically coupled to the first contact 33. The first conductor structure 36a extends along a direction parallel to the surface 2232 of the second doped region 223 to form a first support portion 361 that covers most of the first contact 33.
另外,為使第一導體結構36a與後續形成的第二導體結構36b絕緣,第二絕緣結構35b於第一絕緣結構35a上沿著第二摻雜區223之表面2232平行之方向延伸形成第二水平部352,第二水平部352包覆第一支撐部361,不過,仍保留少部分第一支撐部361之表面361S,留予電路板作電性耦合。接著,於第二接觸34上進行電鍍製程以形成第二導體結構36b,其與第二接觸34電性耦合,並具有沿著與第二摻雜層223之側壁2231平行方向形成的第二支撐部362。第二支撐部362覆蓋部分之第一絕緣結構35a,以及大部分的第二絕緣結構35b。 In addition, in order to insulate the first conductor structure 36a from the subsequently formed second conductor structure 36b, the second insulating structure 35b extends on the first insulating structure 35a along the parallel direction of the surface 2232 of the second doping region 223 to form a second The horizontal portion 352 covers the first support portion 361. However, a small portion of the surface 361S of the first support portion 361 remains, leaving the circuit board electrically coupled. Next, an electroplating process is performed on the second contact 34 to form a second conductor structure 36b electrically coupled to the second contact 34 and having a second support formed in a direction parallel to the sidewall 2231 of the second doped layer 223. Part 362. The second support portion 362 covers a portion of the first insulating structure 35a, and a majority of the second insulating structure 35b.
最後,將電路板37之第一電極371對應至第一導體結構36a未被覆蓋住的表面361S即可,使兩者電性耦合;以及將電路板37之第二電極372對應至第二導體結構36b之第二支撐部362之表面任一處,使兩者電性耦合。據此形成本實施例之覆晶式半導體發光結構30,藉由該些導體結構36a、36b及該些絕緣結構35a、35b相互交錯堆疊,以達穩固整體結構,保護磊晶結構不易受外力破壞,以及增加散熱效果之本案目的。 Finally, the first electrode 371 of the circuit board 37 is corresponding to the uncovered surface 361S of the first conductor structure 36a, so that the two are electrically coupled; and the second electrode 372 of the circuit board 37 is corresponding to the second conductor. Either at the surface of the second support portion 362 of the structure 36b, the two are electrically coupled. Thus, the flip-chip semiconductor light-emitting structure 30 of the present embodiment is formed, and the conductor structures 36a, 36b and the insulating structures 35a, 35b are alternately stacked to achieve a stable overall structure, and the epitaxial structure is protected from external force damage. And the purpose of the case to increase the heat dissipation effect.
於另一實施例中,可將前述製程稍做改良,以串聯至少兩 個如圖2B之覆晶式半導體發光結構,請參見圖4,圖4為本發明第三實施例關於覆晶式半導體發光結構串聯側面示意圖。於本實施例中,於同一製程形成結構相同的半導體發光結構20(1)及20(2),惟與前述製程不同之處在於,於形成第一絕緣結構25a(1)、25a(2)時,同時形成第三絕緣結構25c於兩個半導體發光結構20(1)、20(2)之間,用以使第一接觸23(1)與第二接觸24(2)絕緣。另外,於形成第二導體結構26b(2)時,使其與第一導體結構26a(1)電性耦合。 In another embodiment, the foregoing process may be slightly modified to connect at least two in series. As shown in FIG. 2B, FIG. 4 is a schematic side view of a series connection of a flip chip type semiconductor light emitting structure according to a third embodiment of the present invention. In the present embodiment, the semiconductor light emitting structures 20(1) and 20(2) having the same structure are formed in the same process, except that the foregoing processes are different in forming the first insulating structures 25a(1), 25a(2). At the same time, a third insulating structure 25c is formed between the two semiconductor light emitting structures 20(1), 20(2) to insulate the first contact 23(1) from the second contact 24(2). Further, when the second conductor structure 26b(2) is formed, it is electrically coupled to the first conductor structure 26a(1).
接著,將兩個半導體發光結構20(1)、20(2)翻轉180度(如圖4所示),使半導體發光結構20(1)之第一導體結構26a(1)與半導體發光結構20(2)之第二導體結構26b(2)電性耦合,再將電路板47之第一電極471電性耦合至半導體發光結構20(2)之第一導體結構26a(2),並將電路板47之第二電極472電性耦合至半導體發光結構20(1)之第二導體結構26b(1),用以與電路板47作電性耦合,完成覆晶式半導體發光結構之串聯結構40。 Next, the two semiconductor light emitting structures 20(1), 20(2) are flipped by 180 degrees (as shown in FIG. 4) to make the first conductor structure 26a(1) of the semiconductor light emitting structure 20(1) and the semiconductor light emitting structure 20 The second conductor structure 26b(2) of (2) is electrically coupled, and then electrically couples the first electrode 471 of the circuit board 47 to the first conductor structure 26a(2) of the semiconductor light emitting structure 20(2), and the circuit The second electrode 472 of the board 47 is electrically coupled to the second conductor structure 26b(1) of the semiconductor light emitting structure 20(1) for electrically coupling with the circuit board 47 to complete the series structure 40 of the flip chip semiconductor light emitting structure. .
請參見圖5,圖5係本發明第四實施例關於覆晶式半導體發光結構並聯之側面示意圖。同樣地將前述製程稍做改良,改變光罩圖案,用以形成兩個結構相同但左右對稱之半導體發光結構20(1)、20(2),並使兩個第一導體結構26a(1)、26a(2)電性耦合,再將電路板57之第一電極571與第一導體結構26a(1)/26a(2)電性耦合,以及將其第二電極572與第二導體結構26b(1)、26b(2)電性耦合,用以完成至少兩個覆晶式半導體發光結構之並聯結構50。 Referring to FIG. 5, FIG. 5 is a schematic side view showing a parallel connection of a flip chip type semiconductor light emitting structure according to a fourth embodiment of the present invention. Similarly, the foregoing process is slightly modified to change the mask pattern to form two identical but bilaterally symmetric semiconductor light emitting structures 20(1), 20(2), and to make the two first conductor structures 26a(1) 26a (2) electrically coupled, and electrically coupling the first electrode 571 of the circuit board 57 with the first conductor structure 26a (1) / 26a (2), and the second electrode 572 and the second conductor structure 26b (1), 26b (2) electrically coupled to complete the parallel structure 50 of at least two flip-chip semiconductor light emitting structures.
請參見圖6,圖6係本發明第五實施例關於磊晶結構之側面示意圖。如圖6所示,磊晶結構22可包含複數個磊晶單元, 以兩組磊晶單元22(a)、22(b)為例:磊晶單元22(a)包含第一摻雜層221(a)、第二摻雜層223(a),及位於兩個摻雜層中間的發光層(圖未示),且兩摻雜層221(a)、223(a)之電性相反;磊晶單元22(b)包含第一摻雜層221(b)、第二摻雜層223(b),及位於兩個摻雜層中間的發光層(圖未示),且兩摻雜層221(b)、223(b)之電性相反。藉由穿隧接面(tunnel junction)224來堆疊兩磊晶單元22(a)、22(b)而形成磊晶結構22。另補充說明,可藉由改變磊晶結構之材料種類,以改變發光層之能係值,也就能改變出射光的波長,而發出不同顏色的光。 Please refer to FIG. 6. FIG. 6 is a schematic side view showing the epitaxial structure according to the fifth embodiment of the present invention. As shown in FIG. 6, the epitaxial structure 22 can include a plurality of epitaxial cells. Taking two sets of epitaxial units 22(a), 22(b) as an example: the epitaxial unit 22(a) includes a first doped layer 221(a), a second doped layer 223(a), and two a light-emitting layer (not shown) in the middle of the doped layer, and the two doped layers 221 (a), 223 (a) are electrically opposite; the epitaxial cell 22 (b) comprises a first doped layer 221 (b), The second doped layer 223(b), and a light emitting layer (not shown) located between the two doped layers, and the two doped layers 221(b), 223(b) are electrically opposite. The epitaxial structure 22 is formed by stacking the two epitaxial cells 22(a), 22(b) by a tunnel junction 224. In addition, by changing the material type of the epitaxial structure to change the energy value of the light-emitting layer, the wavelength of the emitted light can be changed to emit light of different colors.
綜上所述,藉由該些絕緣結構及導體結構交錯堆疊,達到增強結構穩固性、保護磊晶結構,且避免底部填充絕緣膠所致填充不均勻之缺失,以及提升半導體發光結構散熱效果之目的。 In summary, the insulating structure and the conductor structure are staggered and stacked to achieve enhanced structural stability, protect the epitaxial structure, avoid the lack of filling unevenness caused by the underfill insulating rubber, and improve the heat dissipation effect of the semiconductor light emitting structure. purpose.
雖然本發明已以較佳實施例揭露如上,然其並非用以限定本發明,任何熟習此技藝者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。 While the present invention has been described in its preferred embodiments, the present invention is not intended to limit the invention, and the present invention may be modified and modified without departing from the spirit and scope of the invention. The scope of protection is subject to the definition of the scope of the patent application.
10‧‧‧覆晶式發光二極體 10‧‧‧Flip-chip light-emitting diode
12‧‧‧磊晶結構 12‧‧‧ Epitaxial structure
16a、16b‧‧‧導體 16a, 16b‧‧‧ conductor
17‧‧‧電路板 17‧‧‧Circuit board
17a、17b‧‧‧電極 17a, 17b‧‧‧ electrodes
20、20(1)、20(2)‧‧‧半導體發光結構 20, 20 (1), 20 (2) ‧ ‧ semiconductor light-emitting structure
20’、30‧‧‧覆晶式半導體發光結構 20', 30‧‧‧ flip-chip semiconductor light-emitting structure
21‧‧‧基板 21‧‧‧Substrate
22‧‧‧磊晶結構 22‧‧‧ epitaxial structure
22a‧‧‧第一側 22a‧‧‧ first side
221、221(a)、221(b)‧‧‧第一摻雜層 221, 221 (a), 221 (b) ‧ ‧ first doped layer
223、223(a)、223(b)‧‧‧第二摻雜層 223, 223 (a), 223 (b) ‧ ‧ second doped layer
2211、2232、261S、361S‧‧‧表面 2211, 2232, 261S, 361S‧‧‧ surface
222‧‧‧發光層 222‧‧‧Lighting layer
2231‧‧‧側壁 2231‧‧‧ side wall
22(a)、22(b)‧‧‧磊晶單元 22(a), 22(b)‧‧‧ Epitaxial unit
224‧‧‧穿隧接面 224‧‧‧ Tunneling junction
23、23(1)、33‧‧‧第一接觸 23, 23 (1), 33‧ ‧ first contact
24、24(2)、34‧‧‧第二接觸 24, 24 (2), 34‧ ‧ second contact
25a、35a、25a(1)、25a(2)‧‧‧第一絕緣結構 25a, 35a, 25a (1), 25a (2) ‧ ‧ first insulation structure
25b、35b‧‧‧第二絕緣結構 25b, 35b‧‧‧second insulation structure
25c‧‧‧第三絕緣結構 25c‧‧‧third insulation structure
251‧‧‧第一水平部 251‧‧‧ first horizontal department
252、352‧‧‧第二水平部 252, 352‧‧‧ second horizontal department
26a、36a、26a(1)、26a(2)‧‧‧第一導體結構 26a, 36a, 26a (1), 26a (2) ‧ ‧ first conductor structure
26b、36b、26b(1)、26b(2)‧‧‧第二導體結構 26b, 36b, 26b (1), 26b (2) ‧ ‧ second conductor structure
261、361‧‧‧第一支撐部 261, 361‧‧‧ first support
262、362‧‧‧第二支撐部 262, 362‧‧‧second support
271、272、371、372、471、472、571、572‧‧‧電極 271, 272, 371, 372, 471, 472, 571, 572 ‧ ‧ electrodes
27、37、47、57‧‧‧電路板 27, 37, 47, 57‧‧‧ circuit boards
40‧‧‧覆晶式半導體發光結構之串聯結構 40‧‧‧ series structure of flip-chip semiconductor light-emitting structures
50‧‧‧覆晶式半導體發光結構之並聯結構 50‧‧‧Parallel structure of flip-chip semiconductor light-emitting structure
N‧‧‧絕緣膠 N‧‧‧Insulating adhesive
d、dm‧‧‧厚度 d, d m ‧‧‧ thickness
圖1係習知覆晶式發光二極體10側面示意圖。 FIG. 1 is a schematic side view of a conventional flip-chip light-emitting diode 10.
圖2A係本發明之第一實施例關於半導體發光結構之側面示意圖。 2A is a side view showing a semiconductor light emitting structure according to a first embodiment of the present invention.
圖2B係本發明之第一實施例關於覆晶式半導體發光結構之側面示意圖。 2B is a side view showing a flip-chip semiconductor light-emitting structure according to a first embodiment of the present invention.
圖3為本發明第二實施例關於覆晶式半導體發光結構之側面示意圖。 3 is a side view showing a flip-chip semiconductor light emitting structure according to a second embodiment of the present invention.
圖4為本發明第三實施例關於覆晶式半導體發光結構串聯側面示意圖。 4 is a schematic side view showing a series connection of a flip chip type semiconductor light emitting structure according to a third embodiment of the present invention.
圖5係本發明第四實施例關於覆晶式半導體發光結構並聯之側面示意圖。 FIG. 5 is a side view showing a parallel connection of a flip chip type semiconductor light emitting structure according to a fourth embodiment of the present invention.
圖6係本發明第五實施例關於磊晶結構之側面示意圖。 Figure 6 is a side elevational view showing the epitaxial structure of the fifth embodiment of the present invention.
20‧‧‧半導體發光結構 20‧‧‧Semiconductor light-emitting structure
21‧‧‧基板 21‧‧‧Substrate
22‧‧‧磊晶結構 22‧‧‧ epitaxial structure
22a‧‧‧第一側 22a‧‧‧ first side
221‧‧‧第一摻雜層 221‧‧‧First doped layer
223‧‧‧第二摻雜層 223‧‧‧Second doped layer
2211、2232、261S‧‧‧表面 2211, 2232, 261S‧‧‧ surface
222‧‧‧發光層 222‧‧‧Lighting layer
2231‧‧‧側壁 2231‧‧‧ side wall
23‧‧‧第一接觸 23‧‧‧First contact
24‧‧‧第二接觸 24‧‧‧second contact
25a‧‧‧第一絕緣結構 25a‧‧‧First insulation structure
25b‧‧‧第二絕緣結構 25b‧‧‧Second insulation structure
251‧‧‧第一水平部 251‧‧‧ first horizontal department
252‧‧‧第二水平部 252‧‧‧Second level
26a‧‧‧第一導體結構 26a‧‧‧First conductor structure
26b‧‧‧第二導體結構 26b‧‧‧Second conductor structure
261‧‧‧第一支撐部 261‧‧‧First support
262‧‧‧第二支撐部 262‧‧‧Second support
dm‧‧‧厚度 d m ‧‧‧thickness
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