TW201408811A - 多流向原子層沈積系統 - Google Patents
多流向原子層沈積系統 Download PDFInfo
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
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Abstract
本創作以多流向原子層沈積系統取代一般單流向技術,主要是在原子層沈積過程中,藉由調整前驅物的流向,使前驅物能均勻分佈到工件表面,達到鍍膜品質穩定與均勻性;本創作主要作法是在原子層沈積系統的真空腔體內,設置四組前驅物進排氣孔及氣體檢測感應器,藉由進排氣孔的順序控制,以精密控制前驅物的流向,使前驅物能均勻分佈在工件表面,並監控前驅物排氣情形,以求達到良好鍍膜品質外,還可減少排氣孔堵塞,及有效節省材料。另本創作設計一可分離式角錐形外罩,當需3D立體元件鍍膜時,可快速更換外罩進行3D立體元件鍍膜。本創作經由改變管線設計配置,及修改製程腔體結構,增加多流向設計與3D立體元件鍍膜功能,將有效提升產品穩定、方便及實用性,並增加設備附加價值。
Description
本創作為原子層沈積系統的創新結構,將多流向設計與3D立體鍍膜功能做結合,以提升產品穩定、方便及實用性。主要做法為在四角方形真空腔體角落,各增設一組進排氣孔,且於進排氣孔附近各裝設氣體檢測感應器,使原子層沈積過程中,其前驅物的流動達到多流向的功效,還可監控前驅物排氣情形,以求達到良好鍍膜品質外,亦可減少排氣孔堵塞,並對進氣量進行警告與自動控制,可有效節省材料。本創作另有一可分離式角錐形外罩,於罩頂內設置一組前驅物進氣孔,當需要進行3D立體元件鍍膜時,可換上角錐形外罩,並連接預備之前驅物進氣管線,與原先下方的4組進排氣管線合併工作,產生由上而下的前驅物垂直流場,以便完成3D立體元件鍍膜,此創作有效提升產品穩定、方便及實用性,並增加設備附加價值。
原子層沈積(Atomic layer deposition,ALD)薄膜技術隨著半導體和面板產業的發展而進步神速,為因應產業的需求,開發出許多國產的原子層沈積系統,許多產品已愈來愈具國際競爭力。雖然我國在原子層沈積薄膜技術的發展,仍有許多瓶頸有待突破,尤其是真空技術方面,仍需要投入更多的研發。然而由於產業的群聚效應,使得原子層沈積系統蓬勃發展,極有
機會成為我國重要的精密設備產業。
水平式原子層沈積系統,如圖1所示,腔體內具備進氣與排氣孔,進氣孔1位於腔體上方,主要負責提供前驅物和高純度氮氣清潔;排氣孔2位於腔體下方,主要負責排除多餘前驅物。當前驅物氣體從進氣孔進入後,和試片進行化學吸附反應完後,再由排氣孔將多餘的前驅物排出,接著由進氣孔噴入高純度氮氣清潔腔體後,再進行下一個反應,如此不斷的循環累積,以達到鍍膜的效果。
此種水平式原子層沈積系統,經實驗結果發現,雖已達到良好鍍膜品質,但因僅有一進氣一排氣之單一流場方向,如圖2所示。此單一流場方向鍍膜均勻度仍有些微的差異,尤其是對於非對稱形狀的待鍍物件,差異更為明顯,且不適合用於立體物件鍍膜;而單一排氣孔的設計,有時會因為操作不慎,而通入過多的前驅物,結果抽出的前驅物於排氣閥門上反應鍍膜,造成閥門堵塞,失去排氣功能。故若能改變管線設計配置,及修改製程腔體結構,增加多流向設計和3D立體元件鍍膜功用,將能大幅提升原子層沈積系統於非對稱形狀的鍍膜效果和3D立體鍍膜的能力。
查專利201002854號「高速原子層沈積裝置及方法」,以及專利540093號「原子層沈積系統以及方法」等專利前案,係採用一進氣一排氣,或多進氣一排氣的流場方式沈積薄膜,而非本創作所提出的多流向3D原子層沈積系統。
為了讓原子層沈積系統達到多流向與3D立體鍍膜之功能,本創作於四角方形真空腔體角落各增設一組進排氣孔,且於各進排氣孔附近,裝設氣體檢測感應器,使其達到多流向原子層沈積功效,還可監控前驅物排氣情形,以求達到良好鍍膜品質外,還可減少排氣孔堵塞,並有效節省材料。本創作另有一可分離式角錐形外罩,於罩頂內設置一前驅物進氣孔,當需進行3D立體元件鍍膜時,可換上角錐形外罩,並連接預備之前驅物進氣管線,與原先下方的4組進排氣管線合併工作,產生由上而下的前驅物垂直流場,以便完成3D立體元件鍍膜。此創作有效提升產品穩定、方便及實用性,並增加設備附加價值。各結構設計功能如下:
(1)四角方形真空腔體:於腔體的4個角落分別各開設1組進排氣孔,以多流向進排氣控制,改良原子層沈積系統鍍膜品質,並可增加非對稱性試片的鍍膜均勻性。另於各進排氣孔附近安裝氣體檢測感應器,可監控前驅物排氣情形,並對進氣量進行警告與自動控制,可有效減少前驅物浪費和避免排氣閥門堵塞。
(2)分離式角錐形外罩:於罩頂內另設置一前驅物進氣孔,當需要進行3D立體元件鍍膜時,可換上角錐形外罩,並連接預備之前驅物進氣管線,與原先下方的4組進排氣管線合併工作,產生由上而下的前驅物垂直流場,以便完成3D立體
元件鍍膜。此創作可提升產品穩定、方便及實用性,並增加設備附加價值。
經由本創作的實施,將基本的水平式原子層沈積系統,擴充改良成可多流向控制、自動調整前驅物供應量,和具備3D立體元件鍍膜的原子層沈積功能結合為一系統,可大大提升設備的附加價值。本創作主要可以達到:
(1)多流向原子層沈積:多流向前驅物進排氣,可改良原子層沈積系統鍍膜品質,並增加非對稱性試片的鍍膜均勻性,操作與維護簡單、方便、迅速,適合一般廠商或小型實驗室進行研究發展與量產使用。
(2)減少前驅物浪費:於排氣口附近安裝氣體檢測感應器,監控前驅物排氣情形,對前驅物進氣量進行警告與自動控制,可有效減少前驅物浪費和避免排氣閥門堵塞。
(3)3D立體元件原子層沈積:可方便更換分離式角錐形外罩,且安裝過程簡易,僅需連接預備之前驅物進氣管線,與原先下方的4組進排氣管線合併工作,產生由上而下的前驅物垂直流場,以便完成3D立體元件鍍膜。此創作可提升產品穩定、方便及實用性,並增加設備附加價值。
以下結合附圖及實施例對本創作進一步詳細說明。請參閱圖3本實施例之多流向原子層沈積系統示意圖,包括控制面板3;該面板包括腔體溫度控制器31、管路溫度控制器32、前驅
物控制器33及緊急按鈕34,如圖4所示,原子層沈積系統控制面板4,和四角方形真空腔體5;該腔體5包括一載台50,用於放置試片51;及四組進排氣孔,分別是左上進氣孔52與左上排氣孔53、左下進氣孔54與左下排氣孔55、右上進氣孔56與右上排氣孔57,右下進氣孔58與右下排氣孔59,用於多流向前驅物進氣與排氣;和氣體檢測感應器6,用於監控前驅物排氣情形,結構圖如圖5所示。本創作另有一可分離式角錐形外罩7,於罩頂內另設置一角錐外罩之前驅物進氣孔8,如圖6所示,當需要進行3D立體元件鍍膜時,可換上角錐形外罩,並連接預備之前驅物進氣管線,與原先下方的4組進排氣管線合併工作,產生由上而下的垂直流場,以便完成3D立體元件鍍膜。各前驅物流場方向詳細實施情形和執行步驟如下:
(1)如圖7所示,將試片51放置載台50,由左上進氣孔52通入前驅物,與試片51反應後,於右下排氣孔59將多餘的前驅物排出,產生左上進右下出的前驅物流場1。
(2)如圖8所示,由右上進氣孔56通入前驅物,與試片51反應後,於左下排氣孔55將多餘的前驅物排出,產生右上進左下出的前驅物流場2。
(3)如圖9所示,由右下進氣孔58通入前驅物,與試片51反應後,於左上排氣孔53將多餘的前驅物排出,產生右下進左上出的前驅物流場3。
(4)如圖10所示,由左下進氣孔54通入前驅物,與試片51反應後,於右上排氣孔57將多餘的前驅物排出,產生左下進右上
出的前驅物流場4。
(5)如此不斷的持續進行原子層沈積週期循環,累積鍍膜至所需要的厚度後停止。
(6)如圖11所示,若待鍍物試片51為3D立體元件時,可換上角錐形外罩7,並連接預備之前驅物進氣管線,與原先下方的4組進排氣管線合併工作,產生由上而下的前驅物垂直流場,如圖12所示,以便完成3D立體元件鍍膜,
本創作的另一實施例如下,於四角方形真空腔體5四個角落各增設一組進排氣孔,當腔體通入前驅物與試片反應後,將形成前驅物流場1、前驅物流場2、前驅物流場3、前驅物流場4,共四組流場,如圖7~10所示。此多流向前驅物進排氣功用,可改良原子層沈積系統鍍膜品質,並增加非對稱性試片的鍍膜均勻性,操作與維護簡單、方便、迅速,適合一般廠商或小型實驗室進行研究發展與量產使用。
本創作的另一實施例如下,於四組進排氣孔附近各裝設氣體檢測感應器6,監控前驅物排氣情形,對前驅物進氣量進行警告與自動控制,可有效減少前驅物浪費和避免排氣閥門堵塞,因此本創作可大大節省材料與能源。
本創作又另一實施例如下,可分離式角錐形外罩7,於罩頂內另設置一前驅物進氣孔8,如圖6所示,當需要進行3D立體元件鍍膜時,可換上角錐形外罩,並連接預備之前驅物進氣管線,與原先下方的4組進排氣管線合併工作,產生由上而下
的前驅物垂直流場,如圖12所示,以便完成3D立體元件鍍膜,此創作可有效提升產品方便與實用性,並增加設備附加價值。
綜上所述,本創作可有效提升原子層沈積系統的附加功能,達到多流向和3D立體鍍膜。本創作於四角方形真空腔體四個角落各增設一組進排氣孔,當腔體通入前驅物與試片反應後,將形成前驅物流場1、前驅物流場2、前驅物流場3、前驅物流場4,共四組流場,如圖7~10所示。此多流向前驅物進排氣功用,可改良原子層沈積系統鍍膜品質,並增加非對稱性試片的鍍膜均勻性,操作與維護簡單、方便、迅速,適合一般廠商或小型實驗室進行研究發展與量產使用。而本創作於四組進排氣孔附近各別裝設氣體檢測感應器6,監控前驅物排氣情形,對前驅物進氣量進行警告與自動控制,可有效減少前驅物浪費和避免排氣閥門堵塞,因此本創作可大大節省材料與能源。本創作另有一可分離式角錐形外罩7,於罩頂內另設置一前驅物進氣孔8,當需要進行3D立體元件鍍膜時,可換上角錐形外罩,並連接預備之前驅物進氣管線,與原先下方的4組進排氣管線合併工作,產生由上而下的前驅物垂直流場,如圖12所示,以便完成3D立體元件鍍膜,此創作可有效提升產品穩定、方便及實用性,並增加設備附加價值,皆未曾見於各種文獻或成品中,具有新穎性。因此,本創作實已符合專利要件,特此提出專利申請。
1‧‧‧進氣孔
2‧‧‧排氣孔
3‧‧‧控制面板
31‧‧‧腔體溫度控制器
32‧‧‧管路溫度控制器
33‧‧‧前驅物控制器
34‧‧‧緊急按鈕
4‧‧‧原子沈積系統控制面板
5‧‧‧四角方形真空腔體
50‧‧‧載台
51‧‧‧試片
52‧‧‧左上進氣孔
53‧‧‧左上排氣孔
54‧‧‧左下進氣孔
55‧‧‧左下排氣孔
56‧‧‧右上進氣孔
57‧‧‧右上排氣孔
58‧‧‧右下進氣孔
59‧‧‧右下排氣孔
6‧‧‧氣體檢測感應器
7‧‧‧分離式角錐形外罩
8‧‧‧角錐形外罩之前驅物進氣孔
圖1:水平式原子層沈積系統示意圖。
圖2:單一流場示意圖。
圖3:多流向原子層沈積系統示意圖。
圖4:控制面板示意圖。
圖5:製程真空腔體內部結構示意圖。
圖6:可分離式角錐外罩示意圖。
圖7:左上進右下出-前驅物流場1示意圖。
圖8:右上進左下出-前驅物流場2示意圖。
圖9:右下進左上出-前驅物流場3示意圖。
圖10:左下進右上出-前驅物流場4示意圖。
圖11:3D立體鍍膜之可分離式角錐外罩示意圖。
圖12:垂直式流場示意圖。
1‧‧‧進氣孔
2‧‧‧排氣孔
3‧‧‧控制面板
31‧‧‧腔體溫度控制器
32‧‧‧管路溫度控制器
33‧‧‧前驅物控制器
34‧‧‧緊急按鈕
4‧‧‧原子沈積系統控制面板
5‧‧‧四角方形真空腔體
50‧‧‧載台
51‧‧‧試片
52‧‧‧左上進氣孔
53‧‧‧左上排氣孔
54‧‧‧左下進氣孔
55‧‧‧左下排氣孔
56‧‧‧右上進氣孔
57‧‧‧右上排氣孔
58‧‧‧右下進氣孔
59‧‧‧右下排氣孔
6‧‧‧氣體檢測感應器
7‧‧‧分離式角錐形外罩
8‧‧‧角錐形外罩之前驅物進氣孔
Claims (2)
- 一種多流向原子層沈積系統,包含:一四角方形真空腔體,內部含有四組進排氣孔,進行多流向進排氣控制,改良原子層沈積系統鍍膜品質,並可增加非對稱性試片的鍍膜均勻性;多組氣體檢測感應器,可監控前驅物排氣情形,對前驅物進氣量進行警告與自動控制,減少排氣孔堵塞;一分離式角錐形外罩,於罩頂內另設置一前驅物進氣孔,當需要進行3D立體元件鍍膜時,可換上角錐形外罩,並連接預備之前驅物進氣管線,與原先下方的四組進排氣管線合併工作,產生由上而下的前驅物垂直流場,以便完成立體元件鍍膜。
- 如申請專利範圍第1項所述之多流向原子層沈積系統,其進排氣孔的數量可視需求予以增加或減少,且其真空腔體的形狀可隨進排氣孔的配置而不同。
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW101131292A TW201408811A (zh) | 2012-08-28 | 2012-08-28 | 多流向原子層沈積系統 |
| US13/937,276 US20140060431A1 (en) | 2012-08-28 | 2013-07-09 | Atomic Layer Deposition System with Multiple Flows |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW101131292A TW201408811A (zh) | 2012-08-28 | 2012-08-28 | 多流向原子層沈積系統 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW201408811A true TW201408811A (zh) | 2014-03-01 |
Family
ID=50185656
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW101131292A TW201408811A (zh) | 2012-08-28 | 2012-08-28 | 多流向原子層沈積系統 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US20140060431A1 (zh) |
| TW (1) | TW201408811A (zh) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107626528A (zh) * | 2017-09-12 | 2018-01-26 | 扬州德芬迪智能装备有限公司 | 一种智能真空灌胶机 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2888253B2 (ja) * | 1989-07-20 | 1999-05-10 | 富士通株式会社 | 化学気相成長法およびその実施のための装置 |
| JP3354747B2 (ja) * | 1995-05-22 | 2002-12-09 | 株式会社フジクラ | Cvd反応装置および酸化物超電導導体の製造方法 |
| US6291800B1 (en) * | 1998-02-20 | 2001-09-18 | Tokyo Electron Limited | Heat treatment apparatus and substrate processing system |
| US6530342B1 (en) * | 1998-12-30 | 2003-03-11 | Tokyo Electron Limited | Large area plasma source |
| WO2007001301A2 (en) * | 2004-06-28 | 2007-01-04 | Cambridge Nanotech Inc. | Atomic layer deposition (ald) system and method |
| FI123322B (fi) * | 2007-12-17 | 2013-02-28 | Beneq Oy | Menetelmä ja laitteisto plasman muodostamiseksi |
| US9512520B2 (en) * | 2011-04-25 | 2016-12-06 | Applied Materials, Inc. | Semiconductor substrate processing system |
-
2012
- 2012-08-28 TW TW101131292A patent/TW201408811A/zh unknown
-
2013
- 2013-07-09 US US13/937,276 patent/US20140060431A1/en not_active Abandoned
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107626528A (zh) * | 2017-09-12 | 2018-01-26 | 扬州德芬迪智能装备有限公司 | 一种智能真空灌胶机 |
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| US20140060431A1 (en) | 2014-03-06 |
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