TW201405145A - Test system and method for ports with multi functions - Google Patents

Abstract

A test system for ports with multi functions includes a to-be-tested device and a tester. The to-be-tested device installs a testing software and includes a to-be-tested port, which includes a first set of pins and a second set of pins. The tester includes a connector, a switch module, a storage module and a control unit. The connector includes a third set of pins and a fourth set of pins. The third set and the first set of pins are under a first communication standard, and the fourth set and the second set of pins are under a second communication standard. The switch module is for switching the third set of pins and the fourth set of pins. The storage module is coupled to the switch module. The control unit controls the switch when the connector is connected to the to-be-tested port, so that the to-be-tested port is electrically connected to the switch module and the storage module via the first set and the third set of pins, or the second set and the fourth set of pins for testing.

Description

Composite function interface test system and method

The present invention relates to a composite functional interface test system and method.

Modern electronic products usually provide multiple composite functional interfaces, such as an external serial ATA (E-SATA) interface or a universal serial bus (USB) 3.0 interface. Manufacturers must perform repetitive plugging and unplugging and verifying the composite function with different devices. In terms of E-SATA interface, manufacturers must verify USB and SATA functions; in terms of USB 3.0 interface, vendors must verify USB 2.0 and USB 3.0 functions. Existing verification processes are cumbersome and inefficient.

The disclosure relates to a composite function interface test system and method, which can effectively verify the function of the composite function interface.

According to a first aspect of the present disclosure, a composite functional interface test system is provided, including a device to be tested and a test device. The device to be tested is installed with a test software and includes an interface to be tested. The interface to be tested includes a first set of pins and a second set of pins. The testing device includes a connector, a switching module, a storage module and a control unit. The connector includes a third group of pins and a fourth group of pins, the third group of pins and the first group of pins belong to a first communication standard, and the fourth group of feet and the second group of pins belong to a second Communication standard. The switching module is used to switch the third group of pins and the fourth group of pins. The storage module is coupled to the switching module. The control unit is used when the connector is connected to the interface to be tested The switching module is controlled such that the interface to be tested is electrically connected to the switching module and the storage module through the first group of pins and the third group of pins, or the second group of pins and the fourth group of pins for testing.

According to a second aspect of the present disclosure, a composite function interface test method is proposed, which is applied to a device to be tested and a test device. The device to be tested is installed with a test software and includes an interface to be tested. The interface to be tested includes a first set of pins and a second set of pins. The testing device includes a connector, a switching module, a storage module and a control unit. The composite function interface test method includes the following steps. When the connector is connected to the interface to be tested, the control unit controls the switching module to switch one of the third group of pins or the fourth group of pins, and the third group of pins and the first group of pins belong to the first The communication standard, the fourth group of pins and the second group of pins belong to a second communication standard. The storage module is tested by using the interface to be tested through the first group of pins and the third group of pins, or the second group of pins and the fourth group of pins for electrically connecting to the switching module.

In order to better understand the above and other aspects of the present disclosure, an embodiment will be described hereinafter with reference to the accompanying drawings.

The composite function interface test system and method proposed by the present disclosure can effectively verify the function of the composite function interface by using the switching module to switch between the pins of different communication standards, and save the test cost.

Please refer to FIG. 1 , which illustrates a schematic diagram of a composite function interface test system according to an embodiment. The composite functional interface test system 10 includes a device under test 100 and a test device 200. The device under test 100 is installed with a test software and includes a plurality of interfaces to be tested 110_1~110_n. Every stay The measurement interfaces 110_1~110_n include a first set of pins and a second set of pins. The testing device 200 includes a plurality of connectors 210_1~210_n, a plurality of switching modules 220_1~220_n, a storage module 230, a control unit 240, and a switching unit 250. Each of the connectors 210_1~210_n includes a third group of pins and a fourth group of pins, the third group of pins and the first group of pins belong to a first communication standard, and the fourth group of feet and the second group of feet The bits belong to a second communication standard.

Each of the switching modules 220_1~220_n includes a switch 1 and a switch 2 for switching the third set of pins and the fourth set of pins to the corresponding connectors 210_1~210_n. The storage module 230 is coupled to the switching modules 220_1 220 220_n through the switching unit 250. The switching unit 250 is substantially used to control the sequence of testing, for example, testing a plurality of interfaces to be tested 110_1~110_n sequentially, or testing a plurality of interfaces 110_1~110_n to be tested simultaneously. When the connectors 210_1~210_n are connected to the interfaces to be tested 110_1~110_n, the test software of the device under test 100 controls the switching modules 220_1~220_n through the control unit 240, so that the interfaces to be tested 110_1~110_n pass through the first group of pins. The third group of pins, or the second group of pins and the fourth group of pins are electrically connected to the corresponding switching modules 220_1~220_n, the switching unit 250 and the storage module 230 for testing. The control unit 240 can be a separate component of the test device 200, and can also be implemented by one of a plurality of connectors without limitation.

Next, the first communication standard is a universal serial bus (USB) 2.0 communication standard, and the second communication standard is a USB 3.0 communication standard as an example, but is not limited thereto. In this embodiment, the interfaces to be tested 110_1~110_n and the connectors 210_1~210_n Essentially all USB 3.0 connectors, as shown in Figure 2, which include the first set of pins and the third set of pins (VBUS, D-, D+ and GND) belonging to the USB 2.0 communication standard, and belong to USB The second set of pins of the 3.0 communication standard and the fourth set of pins (SSRX-, SSRX+, SSTX-, SSTX+, and GND). Among them, the pin VBUS is the bus voltage pin. The storage module 230 includes, for example, a serial ATA (SATA) hard disk and a USB to SATA controller for reading/writing/transmission testing.

Please refer to FIG. 3A and FIG. 3B , which are flowcharts illustrating a composite function interface testing method according to an embodiment. In the 3A and 3B drawings, the switching unit 220_1 and the connector 210_1 to the storage module 230 are connected by the switching unit 250 as an example. In step S300, the connector 210_1 is connected to the interface to be tested 110_1 by a cable, such as a USB 3.0 cable. At this time, the first group of pins of the interface to be tested 110_1 is docked with the third group of pins of the connector 210_1, and the second group of pins of the interface to be tested 110_1 is docked with the fourth group of pins of the connector 210_1. In step S310, the device under test 100 is powered by the interface to be tested 110_1 and the bus bar voltage VBUS connected to the connector 210_1 to the storage module 230.

Steps S320 and S330 in FIG. 3B may actually be performed separately or successively, and the execution order is not limited. In step S322, the switch 1 in the switching module 220_1 is controlled by the controller 240 to electrically connect the third group of pins of the connector 210_1 to the storage module 230. In step S324, the test software of the device under test 100 determines whether the storage module 230 is detected through the first set of pins and the third set of pins. If the storage module 230 is not detected, then in step S340, the test software determines that the first set of pins is a pin abnormality, that is, the USB 2.0 pin is abnormal. When the storage module 230 is detected, In step S326, the test software performs a read/write/transfer test on the storage module 230. In step S328, the test software determines whether the read/write/transmission test passes, and the transmission test determines whether the transmission rate through the first pin reaches the USB 2.0 standard. When the test software determines that the read/write/transmission test fails, in step S350, the test software determines that the first set of pins is abnormal, that is, the USB 2.0 function is abnormal.

In step S332, the controller 2 is used to control the switch 2 in the switching module 220_1 to switch the fourth group of pins of the connector 210_1 to electrically connect to the storage module 230. In step S334, the test software determines whether the storage module 230 is detected through the second set of pins and the fourth set of pins. If the storage module 230 is not detected, then in step S340, the test software determines that the second set of pins is a pin abnormality, that is, the USB 3.0 pin is abnormal. When the storage module 230 is detected, the test software performs a read/write/transmission test on the storage module 230 in step S336. In step S338, the test software determines whether the read/write/transmission test passes, and the transmission test determines whether the transmission rate through the first pin reaches the USB 3.0 standard. When the test software determines that the read/write/transmission test fails, in step S350, the test software determines that the second set of pins is abnormal, that is, the USB 3.0 function is abnormal.

After the read/write/transfer test corresponding to the USB 2.0 communication standard and the USB 3.0 communication standard is completed, in step S360, the electrical connection between the bus voltage pin VBUS and the storage module 230 is disconnected.

In the above-mentioned 3A and 3B, the testing device 200 is tested with the test interface 110_1 as an example for illustration. Further, the switching unit 250 can sequentially connect the switching modules 220_2~220_n to the storage module 230 to sequentially test the interface to be tested through the connectors 210_2~210_n. 110_2~110_n until all the interfaces to be tested are tested. In addition, when the storage module 230 includes a plurality of SATA hard disks, the switching unit 250 can simultaneously connect the switching modules 220_1 220 220_n to the storage module 230 to simultaneously test all the interfaces to be tested through the connectors 210_1 210 210_n. 110_1~110_n.

The composite function interface test system and method disclosed in the foregoing embodiments are used, and the switching module of the test device is used to switch between the pins of different communication standards of the connector, and no need to perform repeated insertion and removal or different tests. The device can effectively verify the composite function of the interface to be tested of the device under test and save test cost.

In the above, the present invention has been disclosed in the above embodiments, but it is not intended to limit the present invention. A person skilled in the art can make various changes and modifications without departing from the spirit and scope of the invention. Therefore, the scope of the invention is defined by the scope of the appended claims.

10‧‧‧Composite Functional Interface Test System

100‧‧‧Device under test

110_1~110_n‧‧‧Determination interface

200‧‧‧Testing device

210_1~210_n‧‧‧Connector

220_1~220_n‧‧‧Switch Module

230‧‧‧ storage module

240‧‧‧Control unit

250‧‧‧Switch unit

FIG. 1 is a schematic diagram of a composite function interface test system according to an embodiment.

FIG. 2 is a schematic diagram showing the position of the interface/connector to be tested according to an embodiment.

3A and 3B are flowcharts of a composite function interface testing method according to an embodiment.

10‧‧‧Composite Functional Interface Test System

100‧‧‧Device under test

110_1~110_n‧‧‧Determination interface

200‧‧‧Testing device

210_1~210_n‧‧‧Connector

220_1~220_n‧‧‧Switch Module

230‧‧‧ storage module

240‧‧‧Control unit

250‧‧‧Switch unit

Claims (12)

A composite function interface test system includes: a device to be tested, a test software installed and including an interface to be tested, the interface to be tested includes a first set of pins and a second set of pins; and a test device, including a connector comprising a third set of pins and a fourth set of pins, the third set of pins and the first set of pins belonging to a first communication standard, the fourth set of feet and the second The group of pins belongs to a second communication standard; a switching module is configured to switch the third group of pins and the fourth group of feet; a storage module is coupled to the switching module; and a control unit, Controlling the switching module when the connector is connected to the interface to be tested, so that the interface to be tested passes the first group of pins and the third group of pins, or the second group of pins and the fourth The set of pins is electrically connected to the switching module and the storage module for testing. The composite functional interface test system according to claim 1, wherein the first communication standard is a universal serial bus (USB) 2.0 communication standard, and the second communication standard is a USB 3.0 communication standard. . The composite functional interface test system of claim 1, wherein the first set of pins includes a bus voltage pin, the third set includes another bus voltage pin, and when the connection When the device is connected to the interface to be tested, the device under test transmits power to the storage module through the bus pin voltage pin electrically connected to the other bus bar voltage pin. Compound function interface test as described in item 3 of the patent application scope a system, wherein when the connector is connected to the interface to be tested through a cable, the controller controls the switching module to switch the third group of pins to electrically connect the storage module; when the test software passes the first The storage module is not detected by the set of pins and the third set of pins, and the test software determines that the first set of pins is a pin abnormality; when the test software detects the storage module, the test software The storage module is read/write/transmitted; when the test software determines that the read/write/transmission test fails, the test software determines that the first set of pins is functionally abnormal. The composite function interface test system of claim 3, wherein when the connector is connected to the interface to be tested through a cable, the controller controls the switching module to switch the fourth group of pins. The storage module is connected to the storage module; when the test software does not detect the storage module through the second set of pins and the fourth set of feet, the test software determines that the second set of pins is an abnormal pin; The test software detects the storage module, and the test software performs a read/write/transfer test on the storage module; when the test software determines that the read/write/transfer test fails, the test software determines that the second set of pins is Abnormal function. The composite function interface test system of claim 1, wherein the device to be tested further comprises a plurality of the interfaces to be tested, and the test device further comprises a plurality of the connectors and the plurality of interfaces corresponding to the interfaces to be tested. The switching module and a switching unit, the switching unit is connected to the switching modules and the Switching between the storage modules to switch the switching modules to the storage module. A composite function interface test method is applied to a device to be tested and a test device. The device to be tested is installed with a test software and includes an interface to be tested. The interface to be tested includes a first set of pins and a second set of pins. The test device includes a connector, a switch module, a storage module, and a control unit. The composite function interface test method includes: when the connector is connected to the interface to be tested, using the control unit to control the switch The module switches one of the third group of pins or the fourth group of pins, the third group of pins and the first group of pins belong to a first communication standard, and the fourth group of feet and the first The two sets of pins belong to a second communication standard; and the interface to be tested is electrically connected to the third set of pins, or the second set of pins and the fourth set of pins by the interface to be tested The switching module tests the storage module. The composite function interface test method as described in claim 7, wherein the first communication standard is a universal serial bus (USB) 2.0 communication standard, and the second communication standard is a USB 3.0 communication standard. . The composite function interface test method of claim 7, wherein the first group of pins comprises a bus voltage pin, and the third pin comprises another bus voltage pin, the composite function interface The testing method further includes: when the connector is connected to the interface to be tested, the busbar voltage pin and the other busbar voltage pin are electrically supplied to the storage module by using the device under test. The method for testing a composite function interface according to claim 9 , further comprising: connecting the connector to the interface to be tested by using a cable, and controlling the switching module by using the controller to switch the third group The test module is electrically connected to the storage module; when the test software does not detect the storage module through the first set of pins and the third set of feet, the test software determines that the first set of pins is a pin Abnormal; when the test software detects the storage module, the test software performs a read/write/transfer test on the storage module; and when the test software determines that the read/write/transmission test fails, the test software determines the first The group pin is abnormal. The method for testing a composite function interface according to claim 9, further comprising: connecting the connector to the interface to be tested by using a cable, and controlling the switching module by using the controller to switch the fourth group The test module is electrically connected to the storage module; when the test software does not detect the storage module through the second set of pins and the fourth set of feet, the test software determines that the second set of pins is a pin An abnormality; when the test software detects the storage module, the test software performs a read/write/transfer test on the storage module; and when the test software determines that the read/write/transmission test fails, the test software determines the second The group pin is abnormal. Compound function interface test as described in item 9 of the patent application scope The method, wherein the device to be tested further comprises a plurality of the interfaces to be tested, the testing device further comprises a plurality of the connectors corresponding to the interfaces to be tested, a plurality of the switching modules and a switching unit, and the composite function interface test The method further includes: using the switching unit to switch the switching modules to the storage module.