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TW201341119A - Method for producing glass substrate - Google Patents

Method for producing glass substrate Download PDF

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Publication number
TW201341119A
TW201341119A TW101137730A TW101137730A TW201341119A TW 201341119 A TW201341119 A TW 201341119A TW 101137730 A TW101137730 A TW 101137730A TW 101137730 A TW101137730 A TW 101137730A TW 201341119 A TW201341119 A TW 201341119A
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Taiwan
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chemical polishing
glass
base material
glass substrate
main surface
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TW101137730A
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Chinese (zh)
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TWI601600B (en
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Sakae Nishiyama
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Nsc Co Ltd
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    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C15/00Surface treatment of glass, not in the form of fibres or filaments, by etching

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  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Surface Treatment Of Glass (AREA)
  • Re-Forming, After-Treatment, Cutting And Transporting Of Glass Products (AREA)

Abstract

To provide a method for producing glass substrates, whereby, in a sheet-fed chemical polishing device, it is possible to divide a glass base material of a single sheet form into a plurality of glass substrates. The present invention is a method for producing glass substrates, for application in a chemical polishing device constituted to carry out chemical polishing treatment on a plurality of continuously conveyed glass substrates. The chemical polishing device is equipped at least with a conveying section and a polishing treatment section. In the chemical polishing device, the amount of chemical polishing solution sprayed onto the glass base material from the upper side, and the amount of chemical polishing solution sprayed onto the glass base material from the lower side, are respectively adjusted, thereby causing partitioning slots formed on a first principal surface and partitioning slots formed on a second principal surface to penetrate at locations shifted by predetermined amounts from the center of the glass base material in the thickness direction.

Description

玻璃基板之製造方法 Method for manufacturing glass substrate

本發明,係有關被適用在構成為對於被連續性搬送之複數的玻璃基板而進行化學研磨處理之化學研磨裝置中的玻璃基板之製造方法。 The present invention relates to a method for producing a glass substrate to be applied to a chemical polishing apparatus configured to perform a chemical polishing treatment on a plurality of glass substrates that are continuously conveyed.

為了將玻璃基板薄型化,一般而言,係有必要使用包含氟酸之化學研磨液來對於玻璃基板進行化學研磨處理。作為此種化學研磨處理,係可列舉出:將應處理之玻璃基板以特定時間而浸漬在裝入有化學研磨液之槽中的批次式化學研磨、以及將應處理之玻璃基板藉由搬送滾輪來依序搬送並且對其噴射化學研磨液之單片式化學研磨。 In order to reduce the thickness of the glass substrate, it is generally necessary to chemically polish the glass substrate using a chemical polishing liquid containing hydrofluoric acid. As such a chemical polishing treatment, a batch type chemical polishing in which a glass substrate to be treated is immersed in a tank in which a chemical polishing liquid is placed, and a glass substrate to be processed are transported by a predetermined time The rollers are used to transport and spray a single piece of chemical polishing of the chemical slurry.

在此些之化學研磨的方式中,批次方式之研磨,係為藉由將應處理之玻璃基板在研磨液浴槽中浸漬特定之時間,來將玻璃基板薄板化為所期望之板厚者,而有著能夠一次處理多量之玻璃基板的優點。然而,批次方式之研磨,係至少存在有下述之問題點。 In the chemical polishing method, the batch method is performed by immersing the glass substrate to be treated in a polishing bath for a specific period of time to thin the glass substrate to a desired thickness. There is an advantage that a large amount of glass substrate can be processed at one time. However, the grinding of the batch method has at least the following problems.

首先,在批次方式之研磨中,由於研磨液浴槽係成為相對於上方而作了開放的構造,因此,係有著研磨液浴槽之周圍會成為高濃度之氟酸氛圍的問題。特別是,在對於研磨液浴槽之研磨液而進行起泡處理的情況時,係有著氣體狀之氟酸容易朝向周圍而擴散的問題。在此種氟酸氛圍中而進行作業的作業員,若是並未著用有適當之保護裝備 並進行作業,則會有對於健康造成損害之虞。因此,分發給作業員之保護裝備的成本係會變高。 First, in the batch type polishing, since the polishing liquid bath is open to the upper side, there is a problem that the periphery of the polishing liquid bath becomes a high-concentration hydrofluoric acid atmosphere. In particular, when the foaming treatment is performed on the polishing liquid in the polishing bath, there is a problem in that the gaseous fluoric acid is easily diffused toward the surroundings. An operator who works in such a fluoric acid atmosphere does not have proper protective equipment. And doing work, there will be damage to health. Therefore, the cost of the protective equipment distributed to the operator will become higher.

又,在批次式之研磨中,為了消除研磨液浴槽之周圍的高濃度之氟酸氛圍,係成為需要強力的洗氣器(Scrubber)等之排氣設備,而會使設備成本增加。進而,由於係會起因於氟酸氣體而成為容易發生設備之腐蝕,因此,係亦有著為了施加適當之防蝕處理而耗費成本或者是由於設備之交換頻度增多而耗費成本的問題。 Further, in the batch type polishing, in order to eliminate the high-concentration hydrofluoric acid atmosphere around the polishing liquid bath, it is an exhaust device that requires a strong scrubber or the like, and the equipment cost increases. Further, since the corrosion of the equipment is likely to occur due to the hydrofluoric acid gas, there is a problem in that it is costly to apply an appropriate anti-corrosion treatment or is costly due to an increase in the frequency of exchange of equipment.

因此,近年來,係使用有單片方式之化學研磨處理。例如,在先前技術中,係存在有平面面板顯示器玻璃基板蝕刻裝置,其係構成為:藉由能夠使玻璃基板作附著之治具,來將玻璃基板以縱向作支持,並一面搬送此治具一面對於玻璃基板而噴射化學研磨液(例如,參考專利文獻1)。 Therefore, in recent years, a chemical polishing treatment using a one-piece method has been used. For example, in the prior art, there is a flat panel display glass substrate etching apparatus which is configured to support a glass substrate by supporting a glass substrate in a longitudinal direction and transport the jig The chemical polishing liquid is sprayed on the glass substrate (for example, refer to Patent Document 1).

[先前技術文獻] [Previous Technical Literature]

[專利文獻] [Patent Literature]

[專利文獻1]日本特開2008-266135號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. 2008-266135

然而,在專利文獻1所記載之技術中,由於係構成為將玻璃基板以垂直狀態來支持並進行處理,因此,針對玻璃基板之薄型化,雖然係能夠適當地實行,但是相反的,對於像是將1枚之薄片狀的玻璃母材分割成複數之玻璃基 板一般的處理而言,則係存在有問題。其理由係在於:在將玻璃基板配置為垂直狀態的情況下,若是將玻璃分割成複數的小片,則被作了分割的小片會由於重力而落下之故。因此,係並無法將專利文獻1中所記載之技術,使用在像是從大型之玻璃母材而採取複數枚之玻璃基板一般的處理中。 However, in the technique described in Patent Document 1, since the glass substrate is supported and processed in a vertical state, the thinning of the glass substrate can be appropriately performed, but the image is reversed. It is to divide one sheet of glass base material into a plurality of glass bases. In the general processing of the board, there is a problem. The reason for this is that when the glass substrate is placed in a vertical state, if the glass is divided into a plurality of small pieces, the divided small pieces are dropped by gravity. Therefore, the technique described in Patent Document 1 cannot be used in a process such as a glass substrate in which a plurality of glass substrates are taken from a large glass base material.

本發明,係為有鑑於上述之課題而進行者,其目的,係在於提供一種:在單片方式之化學研磨裝置中,而能夠將1枚之薄片狀的玻璃母材分割成複數之玻璃基板的玻璃基板之製造方法。 The present invention has been made in view of the above-described problems, and an object of the invention is to provide a single-piece chemical polishing apparatus capable of dividing a sheet-shaped glass base material into a plurality of glass substrates. A method of manufacturing a glass substrate.

本發明,係為一種被適用在構成為對於被連續性搬送之複數的玻璃基板而進行化學研磨處理之化學研磨裝置中的玻璃基板之製造方法。化學研磨裝置,係至少具備有搬送部以及研磨處理部。搬送部,係具備有橫跨身為應切斷之位置之區劃線並構成為將在第1主面以及第2主面上被形成有光阻層之玻璃母材朝向水平方向作搬送的複數之搬送滾輪。研磨處理部,係構成為對於藉由搬送部所被搬送之玻璃母材而從上下方向噴射化學研磨液並蝕刻玻璃母材之區劃線。 The present invention relates to a method for producing a glass substrate which is applied to a chemical polishing apparatus configured to perform a chemical polishing treatment on a plurality of glass substrates that are continuously conveyed. The chemical polishing apparatus includes at least a conveying unit and a polishing unit. The conveyance unit is provided with a scribe line that spans the position to be cut, and is configured to convey the glass base material on which the photoresist layer is formed on the first main surface and the second main surface in the horizontal direction. The transfer roller. The polishing processing unit is configured to eject the chemical polishing liquid from the vertical direction on the glass base material conveyed by the conveying unit, and to etch the area line of the glass base material.

在此種化學研磨裝置中,係藉由對於從上側所噴射至玻璃母材之化學研磨液的量和從下側所噴射至玻璃母材之化學研磨液的量分別進行調整,而使被形成在第1主面上 之區劃溝以及被形成在第2主面上之區劃溝,在從玻璃母材之厚度方向的中心起而作了特定量之偏移的位置處作貫通。 In such a chemical polishing apparatus, the amount of the chemical polishing liquid sprayed from the upper side to the glass base material and the amount of the chemical polishing liquid sprayed from the lower side to the glass base material are respectively adjusted to be formed. On the first main surface The division groove and the division groove formed on the second main surface are penetrated at a position shifted by a specific amount from the center in the thickness direction of the glass base material.

在此構成中,係防止被形成在第1主面上之區劃溝以及被形成在第2主面上之區劃溝在玻璃母材之厚度方向的中心位置處而相貫通。因此,係成為就算是在玻璃母材預先被進行有化學強化處理等之強化處理的情況時,亦能夠並不產生碎裂等地而將玻璃母材分割成複數之玻璃基板。又,由於係成為能夠藉由單片式之化學研磨裝置來進行此種處理,因此作業之安全性係提昇。 In this configuration, the division groove formed on the first main surface and the division groove formed on the second main surface are prevented from penetrating at the center position in the thickness direction of the glass base material. Therefore, even when the glass base material is subjected to a strengthening treatment such as chemical strengthening treatment in advance, the glass base material can be divided into a plurality of glass substrates without causing cracking or the like. Further, since such a treatment can be performed by a one-piece chemical polishing apparatus, the safety of the work is improved.

若依據上述之本發明,則係成為能夠在單片方式之化學研磨裝置中,而將1枚之薄片狀的玻璃母材分割成複數之玻璃基板。 According to the present invention described above, it is possible to divide one sheet of glass base material into a plurality of glass substrates in a single-piece chemical polishing apparatus.

圖1,係為對於本發明之實施形態的其中一例之單片式化學研磨裝置10之外觀作展示的圖。又,圖2以及圖3,係為對化學研磨裝置10之概略構成作展示的圖。如圖1~圖3中所示一般,化學研磨裝置10,係具備有:搬入部12、和前置處理腔14、和第1處理腔16、和第2處理腔18、和第3處理腔20、和第4處理腔22、和第1中繼部28、和第2中繼部30、和第3中繼部32、和水洗腔 24、和搬出部26、和處理液收容部42、和處理液供給部44、以及水供給部46。 Fig. 1 is a view showing the appearance of a one-piece chemical polishing apparatus 10 as an example of an embodiment of the present invention. 2 and 3 are views showing a schematic configuration of the chemical polishing apparatus 10. As shown in FIGS. 1 to 3, the chemical polishing apparatus 10 is generally provided with a loading unit 12, a pre-processing chamber 14, and a first processing chamber 16, a second processing chamber 18, and a third processing chamber. 20. The fourth processing chamber 22, the first relay portion 28, the second relay portion 30, the third relay portion 32, and the water washing chamber 24. The carry-out unit 26, the processing liquid storage unit 42, the processing liquid supply unit 44, and the water supply unit 46.

搬入部12,係構成為能夠接納藉由作業員所進行之手動作業或者是機器人等所進行之自動作業而搬入的應進行薄型化處理之玻璃基板100。前置處理腔14,係構成為能夠接納從搬入部12所搬送而來之玻璃基板100。第1處理腔16,係構成為對於玻璃基板100之上下面噴射化學研磨液並將玻璃基板薄型化。第2處理腔18、第3處理腔20以及第4處理腔22,係構成為分別對於玻璃基板之上下面而噴射與第1處理腔16相同組成之化學研磨液以將玻璃基板更進一步薄型化。第1中繼部28、第2中繼部30以及第3中繼部32,係分別構成為將複數之處理腔作連結。水洗腔24,係構成為對於經過了第4處理腔22之玻璃基板100進行水洗。搬出部26,係構成為能夠將經過了化學研磨處理以及水洗處理之玻璃基板100取出。到達了搬出部26處之玻璃基板100,係藉由作業員所進行之手動作業或者是機器人等所進行之自動作業,而被從化學研磨裝置10中取出並回收。之後,玻璃基板100,當需要進行更進一步之薄型化的情況時,係再度被導入至化學研磨裝置10中,另一方面,當並不需要進行更進一步之薄型化的情況時,則係被移行至成膜工程等之後段的工程處。 The loading unit 12 is configured to be capable of accepting a glass substrate 100 to be subjected to a thinning process by a manual operation by an operator or an automatic operation performed by a robot or the like. The pre-processing chamber 14 is configured to be able to receive the glass substrate 100 conveyed from the loading unit 12. The first processing chamber 16 is configured to eject a chemical polishing liquid onto the upper and lower surfaces of the glass substrate 100 to reduce the thickness of the glass substrate. The second processing chamber 18, the third processing chamber 20, and the fourth processing chamber 22 are configured to eject a chemical polishing liquid having the same composition as that of the first processing chamber 16 on the upper and lower surfaces of the glass substrate to further reduce the thickness of the glass substrate. . The first relay unit 28, the second relay unit 30, and the third relay unit 32 are each configured to connect a plurality of processing chambers. The water washing chamber 24 is configured to wash the glass substrate 100 that has passed through the fourth processing chamber 22. The carry-out unit 26 is configured to take out the glass substrate 100 subjected to the chemical polishing treatment and the water washing treatment. The glass substrate 100 that has reached the carry-out unit 26 is taken out from the chemical polishing apparatus 10 and collected by a manual operation by an operator or an automatic operation by a robot or the like. After that, when the glass substrate 100 needs to be further thinned, it is introduced into the chemical polishing apparatus 10 again. On the other hand, when it is not necessary to further reduce the thickness, it is Move to the engineering office in the latter part of the film forming project.

處理液收容部42,係經由回收管線420,而與第1處理腔16、第2處理腔18、第3處理腔20、第4處理腔22作連接。處理液供給部44,係經由供液管線440,而被與 第1處理腔16、第2處理腔18、第3處理腔20、第4處理腔22、第1中繼部28、第2中繼部30以及第3中繼部32作連接。水供給部46,係經由供水管線460而被與前置處理腔14以及水洗腔24作連接。另外,在圖1中,關於化學研磨裝置10之回收管線420、供液管線440以及洗淨水之供水管線460,係省略圖示。 The processing liquid storage unit 42 is connected to the first processing chamber 16, the second processing chamber 18, the third processing chamber 20, and the fourth processing chamber 22 via the recovery line 420. The treatment liquid supply unit 44 is connected to the liquid supply line 440. The first processing chamber 16 , the second processing chamber 18 , the third processing chamber 20 , the fourth processing chamber 22 , the first relay unit 28 , the second relay unit 30 , and the third relay unit 32 are connected. The water supply unit 46 is connected to the pre-treatment chamber 14 and the water washing chamber 24 via the water supply line 460. In addition, in FIG. 1, the collection line 420 of the chemical polishing apparatus 10, the liquid supply line 440, and the water supply line 460 of the washing water are abbreviate|omitted.

在上述之化學研磨裝置10中,除了對於前置處理腔14之導入口200、從水洗腔24而來之導出口300、以及後述之曲柄機構36之一部分的作業空間以外,前置處理腔14、第1處理腔16、第2處理腔18、第3處理腔20、第4處理腔22、第1中繼部28、第2中繼部30、第3中繼部32以及水洗腔24,係作為全體而被氣密性且水密性地作閉塞。導入口200以及導出口300,係呈現相較於玻璃基板100之板厚而更略高並且相較於玻璃基板100之橫寬幅而更略廣的細縫形狀。又,係貫通各部,而於同一平面上配置有多數之搬送滾輪50。各搬送滾輪50,係構成將玻璃基板100之底面作支持並且朝向圖示之右方向而搬送之搬送路徑。 In the chemical polishing apparatus 10 described above, the pre-processing chamber 14 is provided in addition to the working space for the inlet port 200 of the pre-treatment chamber 14, the outlet port 300 from the water washing chamber 24, and a portion of the crank mechanism 36 to be described later. The first processing chamber 16, the second processing chamber 18, the third processing chamber 20, the fourth processing chamber 22, the first relay portion 28, the second relay portion 30, the third relay portion 32, and the water washing chamber 24, It is airtight and watertight as the whole. The inlet 200 and the outlet 300 are slightly larger than the thickness of the glass substrate 100 and are slightly wider than the width of the glass substrate 100. Further, a plurality of conveying rollers 50 are disposed on the same plane through the respective portions. Each of the transport rollers 50 constitutes a transport path for supporting the bottom surface of the glass substrate 100 and transporting it in the right direction of the drawing.

於此,搬送速度,係以設定為100~800mm/分鐘為理想,更理想,係設定為300~550mm/分鐘。而,在第1處理腔16、第2處理腔18、第3處理腔20以及第4處理腔22中之處理時間,於本實施形態中,係設定為合計20分鐘程度,但是,係並不被限定於此。若是超過上述之範圍而使得搬送速度變得過慢,則不僅是會使生產效率變差, 並且化學研磨液亦容易滯留在玻璃基板100上,而對於均一之化學研磨造成阻礙,在最糟糕的情況時,還會有導致玻璃基板100之碎裂之虞。另一方面,若是在相同之裝置規模下而提高搬送速度,則為了實現此所需要的液組成之最適化係為困難,其結果,係難以實現均質性之化學研磨。 Here, the transport speed is preferably set to 100 to 800 mm/min, and more preferably set to 300 to 550 mm/min. The processing time in the first processing chamber 16, the second processing chamber 18, the third processing chamber 20, and the fourth processing chamber 22 is set to a total of 20 minutes in this embodiment, but it is not It is limited to this. If the above-mentioned range is exceeded and the conveyance speed becomes too slow, not only the production efficiency will be deteriorated, Moreover, the chemical polishing liquid is also liable to remain on the glass substrate 100, which hinders uniform chemical polishing, and in the worst case, causes cracking of the glass substrate 100. On the other hand, if the conveyance speed is increased at the same apparatus scale, it is difficult to optimize the liquid composition required for this, and as a result, it is difficult to achieve homogenization chemical polishing.

藉由化學研磨裝置10而進行薄型化處理之玻璃基板100,係並未特別作限定,但是,係以就算是針對G8尺寸之方形切割(1080×1230mm)以及G6尺寸(1500×1800mm)等的大型玻璃基板以能夠將其之上下兩面均質地研磨的方式,來構成化學研磨裝置10。又,化學研磨裝置10,係構成為並不使用治具或載具地來將玻璃基板100直接性地藉由搬送滾輪50來作搬送。 The glass substrate 100 which is thinned by the chemical polishing apparatus 10 is not particularly limited, but is even a square cut (1080×1230 mm) and a G6 size (1500×1800 mm) for a G8 size. The large-sized glass substrate constitutes the chemical polishing apparatus 10 so that the upper and lower surfaces thereof can be uniformly ground. Further, the chemical polishing apparatus 10 is configured such that the glass substrate 100 is directly transported by the transport roller 50 without using a jig or a carrier.

如同上述一般,第1處理腔16、第2處理腔18、第3處理腔20、第4處理腔22、第1中繼部28、第2中繼部30、以及第3中繼部32,係經由供液管線440,而與被作了溫度管理之處理液供給部44相通連,處理液供給部44之化學研磨液,係成為以40~42℃程度而被供給至各腔處。於此,化學研磨液之組成,較理想,係為氟酸1~20重量%、鹽酸0~10重量%、其餘為水的液組成。 As described above, the first processing chamber 16, the second processing chamber 18, the third processing chamber 20, the fourth processing chamber 22, the first relay unit 28, the second relay unit 30, and the third relay unit 32, The chemical polishing liquid of the processing liquid supply unit 44 is supplied to the respective chambers at a temperature of 40 to 42 ° C via the liquid supply line 440 in communication with the temperature-treated processing liquid supply unit 44. Here, the composition of the chemical polishing liquid is preferably a liquid composition of 1 to 20% by weight of hydrofluoric acid, 0 to 10% by weight of hydrochloric acid, and the balance being water.

又,前置處理腔14以及水洗腔24,係經由供水管線460而與水供給部46相通連,洗淨水係成為被供給至各腔處。另外,從前置處理腔14和水洗腔24所排出之洗淨排水,係被排出至廢水處理設備處。 Further, the pretreatment chamber 14 and the water washing chamber 24 are connected to the water supply unit 46 via the water supply line 460, and the washing water is supplied to the respective chambers. Further, the washing drainage discharged from the pre-treatment chamber 14 and the washing chamber 24 is discharged to the wastewater treatment facility.

另一方面,如同上述一般,第1處理腔16、第2處理腔18、第3處理腔20以及第4處理腔22之底部,係經由回收管線420而與處理液收容部42相通連,並成為使研磨處理水被作回收。第1中繼部28、第2中繼部30以及第3中繼部32之底部,由於係分別具備有朝向相鄰接之處理腔而傾斜之底部,因此,第1中繼部28、第2中繼部30以及第3中繼部32內之處理液,係順暢地被導引至相鄰接之處理腔中。另外,被作了回收的研磨處理水,係在經過了反應生成物之沈澱以及其他處理之後,若是身為能夠作再利用的狀態,則係被送至處理液供給部44處,另一方面,若是身為無法再利用的狀態,則係作為高濃度廢液而被移行至廢液處理工程。 On the other hand, as described above, the bottoms of the first processing chamber 16, the second processing chamber 18, the third processing chamber 20, and the fourth processing chamber 22 are connected to the processing liquid storage portion 42 via the recovery line 420, and It is made that the water to be treated is recovered. The bottoms of the first relay unit 28, the second relay unit 30, and the third relay unit 32 are each provided with a bottom portion that is inclined toward the adjacent processing chamber. Therefore, the first relay unit 28 and the The processing liquids in the relay unit 30 and the third relay unit 32 are smoothly guided to the adjacent processing chambers. In addition, the polishing water to be recovered is sent to the treatment liquid supply unit 44 if it is in a state capable of being reused after being subjected to precipitation and other treatment of the reaction product. If it is in a state where it cannot be reused, it is transferred to the waste liquid treatment project as a high-concentration waste liquid.

又,如圖3中所示一般,前置處理腔14、第1處理腔16、第2處理腔18、第3處理腔20、第4處理腔22、以及水洗腔24,係經由排氣管線340而與排氣部34相通連,並成為使各腔之內部氣體被吸引至排氣部34中。於此,由於排氣管線340係恆常性地發揮作用,因此,朝向前置處理腔14之導入口200、從水洗腔24而來之導出口300、被形成於曲柄機構36之一部分處的開口,係成為被維持於負壓狀態,而不會有處理氣體通過此些之開口而漏出的情形。 Further, as shown in FIG. 3, the pre-processing chamber 14, the first processing chamber 16, the second processing chamber 18, the third processing chamber 20, the fourth processing chamber 22, and the water washing chamber 24 are generally via an exhaust line. 340 is connected to the exhaust portion 34, and the internal gas of each chamber is attracted to the exhaust portion 34. Here, since the exhaust line 340 functions constantly, the inlet port 200 toward the pretreatment chamber 14 and the outlet port 300 from the water washing chamber 24 are formed at a portion of the crank mechanism 36. The opening is maintained in a negative pressure state without a process gas leaking through the openings.

如同圖4以及圖5中所示一般,在第1處理腔16、第2處理腔18、第3處理腔20、第4處理腔22以及水洗腔24中,係在搬送滾輪50之上下位置處,分別被配置有在 玻璃基板100之搬送方向上而延伸之一群(10根)的噴射管444(444U、444L)。各噴射管444,係為由氯化乙烯或teflon(登記商標)所成之中空的樹脂管,在一根的噴射管處,係被形成有一列之複數個的噴射噴嘴446。而後,係從被配置在上側處之上側噴射管444U而對於玻璃基板100之上面噴射化學研磨液,並從被配置在下側處之下側噴射管444L而對於玻璃基板100之底面噴射化學研磨液。另一方面,係從被配置在水洗腔24處之上側噴射管242U而對於玻璃基板100之上面噴射洗淨水,並從下側噴射管242L而對於玻璃基板100之底面噴射洗淨水。進而,在第1中繼部28、第2中繼部30以及第3中繼部32處,係分別被設置有噴射管282(282U、282L)、噴射管302(302U、302L)以及噴射管322(322U、322L),並將與第1~第4處理腔18、20、22、24相同組成之化學研磨液噴射至玻璃基板100之上面以及底面處。 As shown in FIG. 4 and FIG. 5, in the first processing chamber 16, the second processing chamber 18, the third processing chamber 20, the fourth processing chamber 22, and the water washing chamber 24, the upper and lower positions of the conveying roller 50 are provided. Are configured separately One group (10) of injection tubes 444 (444U, 444L) extend in the transport direction of the glass substrate 100. Each of the injection pipes 444 is a hollow resin pipe made of vinyl chloride or teflon (registered trademark), and a plurality of injection nozzles 446 are formed at one injection pipe. Then, the chemical polishing liquid is sprayed from the upper side spray pipe 444U disposed at the upper side, and the chemical polishing liquid is sprayed on the lower surface of the glass substrate 100 from the lower side spray tube 444L disposed at the lower side. . On the other hand, the washing water is sprayed from the upper side spray pipe 242U disposed at the water washing chamber 24, and the washing water is sprayed from the lower side spray pipe 242L to the bottom surface of the glass substrate 100. Further, the first relay unit 28, the second relay unit 30, and the third relay unit 32 are provided with injection pipes 282 (282U, 282L), injection pipes 302 (302U, 302L), and injection pipes, respectively. 322 (322U, 322L), and a chemical polishing liquid having the same composition as that of the first to fourth processing chambers 18, 20, 22, and 24 is sprayed onto the upper surface and the bottom surface of the glass substrate 100.

被配置在第1中繼部28、第2中繼部30以及第3中繼部32處之噴射管282(282U、282L)、噴射管302(302U、302L)以及噴射管322(322U、322L),還有被配置在水洗腔24處之噴射管(242U、242L),係被保持為固定狀態。另一方面,被配置在第1處理腔16、第2處理腔18、第3處理腔20、第4處理腔22處之各噴射管444,係構成為藉由曲柄機構36而作搖動。 Injection tubes 282 (282U, 282L), injection tubes 302 (302U, 302L), and injection tubes 322 (322U, 322L) disposed in the first relay unit 28, the second relay unit 30, and the third relay unit 32. Further, the injection pipes (242U, 242L) disposed at the water washing chamber 24 are maintained in a fixed state. On the other hand, each of the injection pipes 444 disposed in the first processing chamber 16, the second processing chamber 18, the third processing chamber 20, and the fourth processing chamber 22 is configured to be rocked by the crank mechanism 36.

如同圖5(A)以及圖5(B)中所示一般,在本實施形態中,第1處理腔16、第2處理腔18、第3處理腔20、 以及第4處理腔22,係在玻璃基板100之上側以及下側處,分別配置有10根的噴射管444(444U、444L)。圖5(A),係為噴射管444(444U、444L)之平面圖,在各噴射管444(444U、444L)處,例如係被形成有8個的噴射噴嘴446。 As shown in FIG. 5(A) and FIG. 5(B), in the present embodiment, the first processing chamber 16, the second processing chamber 18, and the third processing chamber 20 are Further, in the fourth processing chamber 22, ten injection tubes 444 (444U, 444L) are disposed on the upper side and the lower side of the glass substrate 100, respectively. Fig. 5(A) is a plan view of the injection pipe 444 (444U, 444L), and at each of the injection pipes 444 (444U, 444L), for example, eight injection nozzles 446 are formed.

各噴射管444(444U、444L),係使其之前端側(圖示之下側)閉塞,另一方面,在其之基端側處,係被設置有液壓控制部。液壓控制部,係藉由與噴射管444(444U、444L)相同數量(10個)之開閉閥442(442U、442L)所構成,並成為能夠藉由對於各開閉閥442(442U、442L)之開度作調整,來任意設定被供給至各噴射管444(444U、444L)處之化學研磨液的液壓。例如,係能夠在上側噴射管444U和下側噴射管444L之液壓間設有液壓差,或者是能夠在中央之噴射管444(444U、444L)和端部之噴射管444(444U、444L)之間設有液壓差。另外,被供給至各噴射管444(444U、444L)處之化學研磨液的液壓,係能夠藉由被配置在化學研磨裝置10之上面處的計器38來作確認。 Each of the injection pipes 444 (444U, 444L) is closed on the front end side (lower side in the drawing), and on the other hand, a hydraulic pressure control portion is provided at the base end side thereof. The hydraulic control unit is constituted by the same number (10) of opening and closing valves 442 (442U, 442L) as the injection pipes 444 (444U, 444L), and can be used for each of the opening and closing valves 442 (442U, 442L). The opening degree is adjusted to arbitrarily set the hydraulic pressure of the chemical polishing liquid supplied to each of the injection pipes 444 (444U, 444L). For example, it is possible to provide a hydraulic pressure difference between the hydraulic pressures of the upper side injection pipe 444U and the lower side injection pipe 444L, or the injection pipe 444 (444U, 444L) at the center and the injection pipe 444 (444U, 444L) at the end. There is a hydraulic difference between the two. Further, the hydraulic pressure of the chemical polishing liquid supplied to each of the injection pipes 444 (444U, 444L) can be confirmed by the gauge 38 disposed on the upper surface of the chemical polishing apparatus 10.

在本實施例中,相較於周邊位置之噴射管444(444U、444L),中央位置之噴射管444(444U、444L)之液壓係被設定為更些許大,對於玻璃基板100之中央位置的接觸壓和噴射量,係被設定為較對於玻璃基板100之周邊位置的接觸壓和噴射量更些許高。因此,被噴射至玻璃基板100之中央位置處的化學研磨液,係成為朝向玻璃基板之周邊位 置而順暢地移動,化學研磨液係成為難以滯留在玻璃基板100之上面。其結果,係成為對於玻璃基板100之全面而使略等量之化學研磨液一起作用,而成為易於使玻璃基板100之全面被均一地研磨。另外,當就算是並不使噴射管444(444U、444L)之液壓在寬幅方向上作改變,化學研磨液也不會滯留在玻璃基板100之上面的情況時,則並不需要特地使噴射管444(444U、444L)之液壓在寬幅方向上作改變,而能夠將全部的噴射管444(444U、444L)之液壓設定為均一。 In the present embodiment, the hydraulic pressure of the injection pipe 444 (444U, 444L) at the center position is set to be somewhat larger than that of the injection pipe 444 (444U, 444L) at the peripheral position, for the center position of the glass substrate 100. The contact pressure and the ejection amount are set to be slightly higher than the contact pressure and the ejection amount to the peripheral position of the glass substrate 100. Therefore, the chemical polishing liquid sprayed to the central position of the glass substrate 100 is oriented toward the periphery of the glass substrate. By moving smoothly, the chemical polishing liquid becomes difficult to stay on the glass substrate 100. As a result, a slight amount of the chemical polishing liquid acts on the entire surface of the glass substrate 100, and it is easy to uniformly polish the entire glass substrate 100. Further, even if the hydraulic pressure of the injection pipe 444 (444U, 444L) is not changed in the wide direction and the chemical polishing liquid does not remain on the glass substrate 100, it is not necessary to specifically spray. The hydraulic pressure of the tubes 444 (444U, 444L) is changed in the width direction, and the hydraulic pressures of all the injection tubes 444 (444U, 444L) can be set to be uniform.

又,各噴射管444(444U、444L),係藉由將其之兩端以軸承等來可旋轉地作軸支持,來構成為會藉由曲柄機構36而作約±30°之搖動(oscillation)(參考圖5(B))。另外,圖5(B),係為對於搖動角度作展示者,而並非為對於化學研磨液之噴射範圍作展示者。亦即是,由於化學研磨液係從噴射管444之噴射噴嘴446而以喇叭狀噴出,因此其之噴射範圍係較搖動角度更廣。 Further, each of the injection pipes 444 (444U, 444L) is rotatably supported by a shaft or the like as a shaft, and is configured to be shaken by about 30° by the crank mechanism 36 (oscillation). ) (Refer to Figure 5 (B)). In addition, FIG. 5(B) is a display for the shaking angle, and is not intended to be a display for the range of the chemical polishing liquid. That is, since the chemical polishing liquid is ejected in a flared manner from the injection nozzle 446 of the injection pipe 444, the injection range thereof is wider than the shaking angle.

曲柄機構36,係如同圖6(A)以及圖6(B)中所示一般,具備有驅動馬達362、和以將驅動馬達362之旋轉力變換為使噴射管444(444U、444L)搖動之力並傳導至噴射管444(444U、444L)處的方式所構成的傳導機構部364。驅動馬達362之旋轉力,係經由傳導臂,而作為使搖動臂366搖動之力來傳導至搖動臂366處。搖動臂366,係在被設置於化學研磨裝置10之內壁部上的支持部368處,以可轉動的狀態而被作支持。 The crank mechanism 36 is provided with a drive motor 362 as shown in Figs. 6(A) and 6(B), and is configured to convert the rotational force of the drive motor 362 to swing the spray pipe 444 (444U, 444L). The force is transmitted to the conduction mechanism portion 364 formed by the manner of the injection tube 444 (444U, 444L). The rotational force of the drive motor 362 is transmitted to the swing arm 366 as a force for rocking the swing arm 366 via the conductive arm. The swing arm 366 is supported in a rotatable state at a support portion 368 provided on the inner wall portion of the chemical polishing apparatus 10.

另一方面,各噴射管444(444U、444L)之端部,係貫通處理腔之隔壁,在位置於處理腔之外側的部份處,係被安裝有用以將在噴射管444(444U、444L)之搖動中所需要的轉矩作傳導的轉矩傳導臂372、376。轉矩傳導臂372、376,係分別以可轉動的狀態而被支持於保持臂370、374處。保持臂370、374,係以可轉動並且可滑動的狀態,而被連結於搖動臂366處。 On the other hand, the end portions of the respective injection pipes 444 (444U, 444L) pass through the partition wall of the processing chamber, and are installed at the portion on the outer side of the processing chamber to be used in the injection pipe 444 (444U, 444L). The torque required in the shaking is the conducted torque conducting arms 372, 376. The torque transmitting arms 372, 376 are respectively supported by the holding arms 370, 374 in a rotatable state. The retaining arms 370, 374 are coupled to the rocker arm 366 in a rotatable and slidable condition.

若是藉由驅動馬達362之旋轉力而使搖動臂366搖動,則保持臂370、374係與搖動臂366相連動地而如圖中之箭頭所示一般地來進行搖動。從保持臂370而來之力,係經由傳導臂372而作為轉矩來傳導至上側噴射管444U處。又,從保持臂374而來之力,係經由傳導臂376而作為轉矩來傳導至下側噴射管444L處。其結果,如圖6(A)以及圖6(B)中所示一般,上側噴射管444U以及下側噴射管444L,係成為朝向與玻璃基板100之搬送方向相正交的方向且互為相反的方向,而作約±30°之旋轉。另外,驅動馬達362之旋轉數,係對於噴射管444(444U、444L)之搖動次數作規定,在本實施例中,係將驅動馬達之旋轉數設定為10~30rpm的程度。 If the swing arm 366 is shaken by the rotational force of the drive motor 362, the retaining arms 370, 374 are oscillated in conjunction with the swing arm 366 and are generally rocked as indicated by the arrows in the figure. The force from the holding arm 370 is transmitted to the upper injection pipe 444U as a torque via the conduction arm 372. Further, the force from the holding arm 374 is transmitted to the lower injection pipe 444L as a torque via the conduction arm 376. As a result, as shown in FIG. 6(A) and FIG. 6(B), the upper injection tube 444U and the lower injection tube 444L are oriented in a direction orthogonal to the conveyance direction of the glass substrate 100 and are opposite to each other. The direction is rotated by about ±30°. Further, the number of rotations of the drive motor 362 is defined by the number of times of the swing of the injection pipe 444 (444U, 444L). In the present embodiment, the number of rotations of the drive motor is set to be about 10 to 30 rpm.

在上側之噴射管444U處,係於其之下面而被形成有噴射噴嘴446U,在下側之噴射管444L處,係於其之上面而被形成有噴射噴嘴446L,因此,各噴射噴嘴,係成為一面作約±30°之旋轉,一面將化學研磨液朝向玻璃基板之上下面作噴射(參考圖5(B))。 An injection nozzle 446U is formed on the lower side of the injection pipe 444U, and an injection nozzle 446L is formed on the lower side of the injection pipe 444L. Therefore, each injection nozzle is formed. The chemical polishing liquid was sprayed toward the upper and lower sides of the glass substrate while rotating about ±30° (refer to Fig. 5(B)).

另外,在本實施形態中,係將藉由相同之液組成來實行同樣之化學研磨的第1處理腔16、第2處理腔18、第3處理腔20以及第4處理腔22,特地相互分割地作設置。其理由,係在於為了抑制噴射管444(444U、444L)之長度,並防止噴射管444(444U、444L)之彎折,並且使噴射管444(444U、444L)順暢地作搖動之故。又,係在於為了將由於噴射管444(444U、444L)之熱膨脹所導致的影響抑制為更小之故。藉由採用此種構成,係成為能夠將噴射管444(444U、444L)和玻璃基板100之間的距離維持為均一,而成為易於對噴射至玻璃基板100處之化學研磨液的液壓作調整。又,藉由使噴射管444(444U、444L)順暢地作搖動,由於係能夠使化學研磨液從玻璃基板100之上面而順暢地流下,因此,化學研磨液係成為難以滯留在玻璃基板100之上面。另外,噴射管444(444U、444L)之長度,雖然係亦與管徑(送液量)有所關連,但是,一般而言,係以2.5m以下為理想,更理想,係抑制於2m以下。 Further, in the present embodiment, the first processing chamber 16, the second processing chamber 18, the third processing chamber 20, and the fourth processing chamber 22, which perform the same chemical polishing by the same liquid composition, are specifically divided into each other. Set the ground. The reason for this is to prevent the length of the injection pipe 444 (444U, 444L) from being bent, and to prevent the injection pipe 444 (444U, 444L) from being bent, and to make the injection pipe 444 (444U, 444L) smoothly shake. Further, in order to suppress the influence due to thermal expansion of the injection pipe 444 (444U, 444L) to be smaller. By adopting such a configuration, the distance between the ejection tubes 444 (444U, 444L) and the glass substrate 100 can be maintained uniform, and the hydraulic pressure of the chemical polishing liquid sprayed on the glass substrate 100 can be easily adjusted. Further, by smoothly oscillating the ejecting tubes 444 (444U, 444L), the chemical polishing liquid can smoothly flow from the upper surface of the glass substrate 100, so that the chemical polishing liquid becomes difficult to stay in the glass substrate 100. Above. In addition, although the length of the injection pipe 444 (444U, 444L) is related to the pipe diameter (liquid supply amount), it is preferably 2.5 m or less, and more preferably 2 m or less. .

為了以高速來對於玻璃基板100進行化學研磨,係有必要將加溫狀態之化學研磨液的送液量增加,藉由將噴射管444(444U、444L)之長度抑制為適當之長度,並不需要將驅動馬達362過於大型化,並且能夠藉由簡單的機構,來使複數之噴射管444(444U、444L)順暢地搖動。 In order to chemically polish the glass substrate 100 at a high speed, it is necessary to increase the liquid supply amount of the chemical polishing liquid in the heated state, and to suppress the length of the injection pipe 444 (444U, 444L) to an appropriate length, and It is necessary to increase the size of the drive motor 362, and it is possible to smoothly swing the plurality of injection pipes 444 (444U, 444L) by a simple mechanism.

接下來,使用圖7(A)~圖7(C),針對前置處理腔14之構成作說明。如同前述一般,在前置處理腔14處,係近接於第1處理腔16,而配置有使噴射管444(444U、 444L)搖動之曲柄機構36。除了上述構成以外,在前置處理腔14處,係於朝向第1處理腔16之玻璃基板100的導入口處,配置有接收玻璃基板100之對向滾輪146、和對於玻璃基板100之上下面而噴射水之水洗噴嘴142、144。水洗噴嘴142、144,係涵蓋與玻璃基板100之搬送方向相正交的方向(寬幅方向)之全區域,而以特定之間隔來作複數之配備。於此,係設定有使玻璃基板100會被輕柔地保持在對向滾輪146和搬送滾輪50處並導入至第1處理腔16中一般之接觸壓。 Next, the configuration of the pre-processing chamber 14 will be described with reference to FIGS. 7(A) to 7(C). As in the foregoing, at the pre-processing chamber 14, it is closely adjacent to the first processing chamber 16, and is disposed with the injection tube 444 (444U, 444L) The crank mechanism 36 that is rocked. In addition to the above configuration, in the pre-processing chamber 14, at the introduction port of the glass substrate 100 facing the first processing chamber 16, the opposite roller 146 for receiving the glass substrate 100 and the upper and lower surfaces for the glass substrate 100 are disposed. The nozzles 142, 144 are sprayed with water. The water washing nozzles 142 and 144 cover the entire area in the direction (wide direction) orthogonal to the conveying direction of the glass substrate 100, and are provided in plural at specific intervals. Here, a general contact pressure is set in which the glass substrate 100 is gently held by the opposing roller 146 and the conveying roller 50 and introduced into the first processing chamber 16.

又,水洗噴嘴142、144,係被設定為朝向玻璃基板100之對於第1處理腔16的導入口來噴射水。因此,被導入至第1處理腔16中之玻璃基板100,係成為充分地浸濕了的狀態,而對於非均質性之初期蝕刻有所防止。亦即是,由於第1處理腔16係身為氟酸氣體氛圍,因此若是玻璃基板100之表面係為乾燥狀態,則會有被氟酸氣體進行非均質之侵蝕的危險,但是,在本實施形態中,由於玻璃基板100之表面係被水所保護,因此,在之後,會在第1處理腔16中而開始均質性之蝕刻。 Further, the water washing nozzles 142 and 144 are set to spray water toward the inlet port of the glass substrate 100 to the first processing chamber 16. Therefore, the glass substrate 100 introduced into the first processing chamber 16 is sufficiently wetted, and the initial etching for the heterogeneity is prevented. In other words, since the first processing chamber 16 is in a fluoric acid gas atmosphere, if the surface of the glass substrate 100 is in a dry state, there is a risk of heterogeneous corrosion by the hydrofluoric acid gas. In the form, since the surface of the glass substrate 100 is protected by water, the homogenization etching is started in the first processing chamber 16 thereafter.

在本實施形態中,如同圖7(A)~圖7(C)中所示一般,水洗噴嘴142係構成為朝向正下方而噴射水,另一方面,水洗噴嘴144係構成為朝向上方且朝向玻璃基板100之搬送路徑的上游側,來傾斜地噴射水。由於係將水洗噴嘴144構成為朝向斜上方而噴射水,其結果,當玻璃基板100接近水洗噴嘴142、144時,如同圖7(A)以及圖7(B) 中所示一般,係成為能夠從水洗噴嘴144來對於玻璃基板100之上面供給水。因此,係成為能夠迅速地在玻璃基板100之上面形成用以保護其免於受到氟酸氣體之侵蝕的水膜。另外,若是使玻璃基板100接近水洗噴嘴144,則由於從水洗噴嘴144所噴射之水會成為噴到玻璃基板100之底面,因此,係能夠藉由水洗噴嘴144來將玻璃基板100之底面作適當的洗淨,並且適當地使其浸濕。 In the present embodiment, as shown in Figs. 7(A) to 7(C), the water washing nozzle 142 is configured to spray water directly downward, and the water washing nozzle 144 is configured to face upward and toward Water is sprayed obliquely on the upstream side of the conveyance path of the glass substrate 100. Since the water washing nozzle 144 is configured to spray water obliquely upward, as a result, when the glass substrate 100 approaches the water washing nozzles 142, 144, as in FIGS. 7(A) and 7(B). Generally, it is shown that water can be supplied from the water washing nozzle 144 to the upper surface of the glass substrate 100. Therefore, it is possible to form a water film which can be quickly formed on the glass substrate 100 to protect it from the attack by the hydrofluoric acid gas. Further, if the glass substrate 100 is brought close to the water washing nozzle 144, the water sprayed from the water washing nozzle 144 is sprayed onto the bottom surface of the glass substrate 100. Therefore, the bottom surface of the glass substrate 100 can be appropriately prepared by the water washing nozzle 144. Wash and soak it properly.

如同上述一般,藉由在前置處理腔14處設置水洗噴嘴142、144,係能夠防止乾燥狀態之玻璃基板100暴露在氟酸氣體中並被不均一地蝕刻的情況。又,由於係防止玻璃基板100以乾燥狀態而被挾持於對向滾輪146以及搬送滾輪50之間的情況,因此,係能夠防止玻璃基板100在通過對向滾輪146以及搬送滾輪50之間時而發生損傷或者是對玻璃基板100造成污損的情形。 As described above, by providing the water washing nozzles 142, 144 at the pre-processing chamber 14, it is possible to prevent the glass substrate 100 in a dry state from being exposed to the hydrofluoric acid gas and being unevenly etched. In addition, since the glass substrate 100 is prevented from being held between the opposing roller 146 and the transport roller 50 in a dry state, it is possible to prevent the glass substrate 100 from passing between the opposing roller 146 and the transport roller 50. The damage is caused or the glass substrate 100 is stained.

接著,針對第1中繼部28、第2中繼部30以及第3中繼部32作說明。在第1中繼部28、第2中繼部30以及第3中繼部32處,係分別在搬送路徑之上下位置處,被配置有固定狀態之噴射管282、噴射管302以及噴射管322。又,係從噴射管282、噴射管302、噴射管322而對於玻璃基板100之上下面噴射化學研磨液。在本實施形態中,噴射管282、噴射管302以及噴射管322,係分別構成本發明之研磨液噴射手段。 Next, the first relay unit 28, the second relay unit 30, and the third relay unit 32 will be described. In the first relay unit 28, the second relay unit 30, and the third relay unit 32, the injection pipe 282, the injection pipe 302, and the injection pipe 322 in a fixed state are disposed at the upper and lower positions of the conveyance path. . Further, a chemical polishing liquid is sprayed onto the upper and lower surfaces of the glass substrate 100 from the injection pipe 282, the injection pipe 302, and the injection pipe 322. In the present embodiment, the injection pipe 282, the injection pipe 302, and the injection pipe 322 constitute the polishing liquid injection means of the present invention.

於此,雖然亦可考慮將第1中繼部28、第2中繼部30以及第3中繼部32,設為在玻璃研磨處理中之空白空 間,但是,在本實施形態中,係特地從此些之第1中繼部28、第2中繼部30以及第3中繼部32而亦將相同組成之化學研磨液朝向玻璃基板100作噴射。因此,係不會有在通過第1中繼部28、第2中繼部30以及第3中繼部32時而化學研磨液在玻璃基板上滯留、或者是相反地在通過第1中繼部28、第2中繼部30以及第3中繼部32時而玻璃基板100變得乾燥之虞,而能夠實現高品質之玻璃研磨。另外,第1中繼部28、第2中繼部30以及第3中繼部32之噴射管282、噴射管302以及噴射管322,係為固定狀態,但是,係亦可並非為固定式,而採用搖動式之構成。 Here, it is also conceivable that the first relay unit 28, the second relay unit 30, and the third relay unit 32 are blank spaces in the glass polishing process. In the present embodiment, the chemical polishing liquid having the same composition is also sprayed toward the glass substrate 100 from the first relay unit 28, the second relay unit 30, and the third relay unit 32. . Therefore, there is no possibility that the chemical polishing liquid stays on the glass substrate when passing through the first relay unit 28, the second relay unit 30, and the third relay unit 32, or vice versa. 28. When the second relay unit 30 and the third relay unit 32 are dried, the glass substrate 100 is dried, and high-quality glass polishing can be realized. In addition, the injection pipe 282, the injection pipe 302, and the injection pipe 322 of the first relay unit 28, the second relay unit 30, and the third relay unit 32 are in a fixed state, but they may not be fixed. It uses a rocking structure.

玻璃基板100,係依序通過第1處理腔16、第2處理腔18、第3處理腔20、第4處理腔22、第1中繼部28、第2中繼部30以及第3中繼部32,並依序被進行化學研磨。之後,結束了複數階段之化學研磨的玻璃基板100,係在藉由被配置於第4處理腔之出口處的氣刀244而進行了上面之去液處理之後,藉由從被配置在水洗腔24處之一群的噴射管242所受到之洗淨水而被作洗淨。洗淨用之噴射管242,雖係為固定狀態,但是,亦可採用使其作搖動之構成。 The glass substrate 100 sequentially passes through the first processing chamber 16, the second processing chamber 18, the third processing chamber 20, the fourth processing chamber 22, the first relay unit 28, the second relay unit 30, and the third relay. Part 32 is chemically ground in sequence. Thereafter, the glass substrate 100 subjected to the chemical polishing in the plurality of stages is subjected to the liquid removal treatment by the air knife 244 disposed at the exit of the fourth processing chamber, and then disposed in the water washing chamber. The spray pipe 242 of one of the 24 groups is washed by the washing water received by the spray pipe 242. Although the spray pipe 242 for washing is in a fixed state, it may be configured to be rocked.

不論如何,在洗淨處理之最終段處,均係被配置有上下一對之氣刀246,並藉由從該處所噴射之空氣,來使玻璃基板100之上下面迅速地乾燥。而後,從水洗腔24之導出口300所排出的玻璃基板,係由在搬出部26處而待命之作業員來取出,並結束一連串之加工處理。如此這 般,藉由在上下一對之氣刀246的前端處另外配置其他的氣刀244,由於係成為能夠從玻璃基板100之上面而將化學研磨液迅速的除去,因此,係成為能夠有效的防止玻璃基板100之上面被不均一地蝕刻的情況。 In any case, at the final stage of the washing process, a pair of upper and lower air knives 246 are disposed, and the air jetted from the space is used to rapidly dry the upper and lower surfaces of the glass substrate 100. Then, the glass substrate discharged from the outlet port 300 of the washing chamber 24 is taken out by the worker who stands by at the carry-out portion 26, and the series of processing is ended. So this In general, by arranging another air knife 244 at the tip end of the pair of upper and lower air knives 246, the chemical polishing liquid can be quickly removed from the upper surface of the glass substrate 100, so that it can be effectively prevented. The upper surface of the glass substrate 100 is etched unevenly.

如同上述一般,若依據本實施形態之化學研磨裝置10,則由於係在作了閉塞的空間中進行化學研磨,並將在裝置內所產生的氟酸氣體等之有毒的氣體藉由洗氣器等之排氣機構來略全量地回收,因此,在化學研磨裝置10之周圍處,氟酸氣體係幾乎不會擴散。其結果,相較於批次式化學研磨處理的情況,化學研磨裝置10周圍之作業環境係大幅度的改善。故而,係成為不需要對於作業員之健康的惡化有所擔憂,並且亦成為不需要在保護裝備上花費成本。 As described above, according to the chemical polishing apparatus 10 of the present embodiment, chemical polishing is performed in a space where the occlusion is performed, and a toxic gas such as a hydrofluoric acid gas generated in the apparatus is used by the scrubber. The exhaust mechanism is recovered in a slight amount, and therefore, the fluorinated acid gas system hardly spreads around the chemical polishing apparatus 10. As a result, the working environment around the chemical polishing apparatus 10 is greatly improved as compared with the case of the batch type chemical polishing treatment. Therefore, there is no need to worry about the deterioration of the health of the worker, and it is also unnecessary to cost the protective equipment.

進而,由於係能夠防止化學研磨裝置10之周圍的設備被氟酸氣體所侵蝕,因此係亦能夠對於設備之維護費用作抑制。亦即是,可以說係存在有「能夠以低價之維護費用來對於作業員而提供良好的作業環境」之重大的優點。 Further, since it is possible to prevent the equipment around the chemical polishing apparatus 10 from being corroded by the hydrofluoric acid gas, it is possible to suppress the maintenance cost of the equipment. In other words, it can be said that there is a significant advantage of being able to provide a good working environment for the operator at a low maintenance cost.

進而,在使用單片方式之化學研磨裝置10的情況時,相較於批次方式之研磨處理,亦有著能夠使作業效率和製品之品質提昇的優點。進而,若依據化學研磨裝置10,則由於板厚之精確度係提昇,因此係能夠安定的預測切劃時之產率。又,關於切斷面之平面強度,相較於批次方式之研磨處理,亦成為能夠更加增強。進而,由於係並不存在有起因於起泡處理所導致的氟酸之損耗,因此亦能 夠期待有15%程度的氟酸成本之削減。 Further, in the case of using the one-piece chemical polishing apparatus 10, there is an advantage that the work efficiency and the quality of the product can be improved compared to the batch type polishing treatment. Further, according to the chemical polishing apparatus 10, since the accuracy of the sheet thickness is improved, it is possible to stably predict the yield at the time of the cut. Further, the plane strength of the cut surface can be further enhanced as compared with the batch type polishing treatment. Further, since there is no loss of hydrofluoric acid caused by the foaming treatment, it is also possible We are looking forward to a 15% reduction in the cost of fluoric acid.

接著,針對使用化學研磨裝置10來將1枚之薄片狀的玻璃母材切斷並分割成複數之玻璃基板的處理作說明。圖8(A)以及圖8(B),係為對於在化學研磨裝置10處而被作處理之玻璃母材102的概觀作展示。玻璃母材102,例如,係藉由將聚氯乙烯等之具有耐氟酸性之構件構成為格子狀所成的第1玻璃支持具70以及第2支持具72來作支持,並導入至化學研磨裝置10中。作為玻璃母材102之素材之例,係可列舉出板厚被薄型化至0.5mm~1.2mm程度之鋁矽酸鹽玻璃。玻璃母材102,係在350~450℃程度之硝酸鉀溶融鹽中被進行化學強化處理。 Next, a description will be given of a process in which one sheet of the glass base material is cut and divided into a plurality of glass substrates by using the chemical polishing apparatus 10. 8(A) and 8(B) show an overview of the glass base material 102 treated at the chemical polishing apparatus 10. The glass base material 102 is supported by, for example, a first glass holder 70 and a second holder 72 formed of a member having a fluorine-resistant acidity such as polyvinyl chloride, and is introduced into the chemical polishing. In device 10. An example of the material of the glass base material 102 is an aluminosilicate glass whose thickness is reduced to about 0.5 mm to 1.2 mm. The glass base material 102 is chemically strengthened in a potassium nitrate molten salt of about 350 to 450 °C.

玻璃母材,係在被作了化學強化處理之後,於第1主面側處,被形成有具備觸控面板用之感測元件等的複數之晶片區域(使用區域)以及對晶片區域作保護之覆蓋層,之後,更進而在第1主面以及第2主面處被形成有耐酸性之抗蝕層。抗蝕層,係以橫跨用以對於上述晶片區域作區劃之線寬幅1mm~5mm程度之區劃區域的方式,而被形成。關於在抗蝕層中所使用之耐氟酸抗蝕劑,係可使用各種之物,但是,例如,在本實施形態中,係使用NIPPON PAINT股份有限公司製之OPUTO(音譯,登記商標)。 The glass base material is subjected to a chemical strengthening treatment, and a plurality of wafer regions (use regions) including a sensing element for a touch panel and the like are formed on the first main surface side, and the wafer region is protected. The coating layer is formed with an acid-resistant resist layer on the first main surface and the second main surface. The resist layer is formed so as to straddle a region of about 1 mm to 5 mm wide for the line region of the wafer region. For the fluororesin resist to be used in the resist layer, various materials can be used. For example, in the present embodiment, OPUTO (transliteration, registered trademark) manufactured by NIPPON PAINT Co., Ltd. is used.

藉由第1玻璃支持具70以及第2支持具72來挾持玻璃母材102,並導入至搬入部12中,藉由此,玻璃母材102,係經由前置處理腔14、第1~第4處理腔16、18、20、22以及水洗腔24,而一直被導引至排出部26處。假 設當玻璃母材102並非為已完成強化之玻璃的情況時,藉由對於玻璃母材102之第1主面以及第2主面而施加相同之化學研磨處理,係能夠將玻璃母材102在區劃區域處而適當地作切斷。 The glass base material 102 is held by the first glass holder 70 and the second holder 72 and introduced into the loading unit 12, whereby the glass base material 102 passes through the pre-processing chamber 14 and the first to the first The processing chambers 16, 18, 20, 22 and the water washing chamber 24 are always guided to the discharge portion 26. false When the glass base material 102 is not a glass that has been reinforced, the same chemical polishing treatment is applied to the first main surface and the second main surface of the glass base material 102, whereby the glass base material 102 can be placed. The division area is appropriately cut off.

然而,當玻璃母材102為已完成化學強化之玻璃的情況時,若是對於第1主面以及第2主面而施加相同之化學研磨處理,則會由於化學研磨而使得第1主面以及第2主面之區劃溝深化,在此些作了貫通時,會有在玻璃母材102處產生碎裂的可能性。關於其之理由,雖然尚未正確的清楚理解,但是,根據多數之實驗的結果,係可以推測有以下之理由。亦即是,通常,當對於玻璃母材102處之第1主面以及第2主面而同時進行了蝕刻的情況時,區劃溝會在玻璃母材102之厚度方向的中心處而貫通。 However, when the glass base material 102 is a glass which has been chemically strengthened, if the same chemical polishing treatment is applied to the first main surface and the second main surface, the first main surface and the first main surface are caused by chemical polishing. 2 The area of the main surface is deepened, and when it is made through this, there is a possibility that cracks may occur at the glass base material 102. Although the reason for this is not clearly understood clearly, based on the results of most experiments, the following reasons can be speculated. In other words, when the first main surface and the second main surface of the glass base material 102 are simultaneously etched, the division groove penetrates at the center in the thickness direction of the glass base material 102.

於此,在化學強化玻璃中,由於係在厚度方向之兩端部(表面)處形成有壓縮應力層,而另一方面,在厚度方向之中央部(內部)係被形成有拉張應力層,因此,可以推測到,在厚度方向之中心處,拉張應力係變得最強。若是在此拉張應力變得最強的場所處而區劃溝作了貫通,則與貫通同時產生的內部應力之變化,係會巨大化,而可以預想到玻璃母材102會碎裂。 Here, in the chemically strengthened glass, a compressive stress layer is formed at both end portions (surfaces) in the thickness direction, and on the other hand, a tensile stress layer is formed in the central portion (inside) in the thickness direction. Therefore, it can be inferred that the tensile stress becomes the strongest at the center of the thickness direction. In the place where the tensile stress is the strongest and the division groove is penetrated, the change in the internal stress generated at the same time as the penetration is large, and it is expected that the glass base material 102 will be broken.

於此,係利用化學研磨裝置10之功能,而如同圖9(A)以及圖9(B)中所示一般,設為使區劃溝在從拉張應力成為最強之中心線105而作了特定之偏移量106之偏移的位置處作貫通。此偏移量106,係經由實驗而明顯得知 了:原則上,當將σc設為壓縮應力[MPa]、將DOL設為化學強化層之厚度[μm]、將T設為板厚[μm]、以及將σT設為CT值(Calculated Tensile Stress)[MPa]時,係有必要以隨著身為藉由下式所計算出之σT之值的CT值之變高而增大的方式,來設定偏移量106。 Here, the function of the chemical polishing apparatus 10 is utilized, and as shown in FIG. 9(A) and FIG. 9(B), it is assumed that the division groove is made to be the center line 105 which becomes the strongest from the tensile stress. The offset of the offset 106 is made to pass through. This offset amount 106 is clearly known through experiments: in principle, when σ c is set to compressive stress [MPa], DOL is set to thickness of chemical strengthening layer [μm], and T is set to plate thickness [ μm], and when the set CT value σ T (calculated Tensile Stress) [MPa] , it is necessary to train as by being a value calculated from the formula σ T becomes the high CT values increased The way to set the offset 106.

其理由,可以推測到,係由於若是偏移量106變得越大而越從中心線遠離,玻璃母材102之內部的拉張應力係會越降低之故。另一方面,當將偏移量106增大至必要以上的情況時,由於會有使強度或設計性降低的可能性,因此,偏移量106,可以說係以在能夠防止玻璃母材102之碎裂的產生之範圍內而盡可能地設定為更小為理想。例如,若是玻璃母材102之板厚為0.5mm~1.2mm程度而CT值為最大30程度,則藉由將偏移量106設定為50μm~100μm,係能夠防止玻璃母材102之碎裂。 The reason for this is that the tensile stress in the glass base material 102 is lowered as the offset amount 106 becomes larger as it goes away from the center line. On the other hand, when the offset amount 106 is increased to more than necessary, since there is a possibility that the strength or the design property is lowered, the offset amount 106 can be said to prevent the glass base material 102 from being prevented. It is desirable to set as small as possible within the range in which the fragmentation occurs. For example, when the thickness of the glass base material 102 is about 0.5 mm to 1.2 mm and the CT value is at most 30, the offset of the glass base material 102 can be prevented by setting the offset amount 106 to 50 μm to 100 μm.

在化學研磨裝置10處,為了對於上述之偏移量106作調整,例如,係只要對於上側噴射管444U和下側噴射管444L之液壓差的大小作調整,或者是以藉由下側噴射管444L來僅在下面處而使區劃溝進行相當於偏移量106之量的深化的方式來進行化學研磨處理即可。也就是說, 藉由對於構成液壓控制部之各開閉閥442(442U、442L)的開度作調整,係成為能夠防止玻璃母材102之第1主面的區劃溝以及第2主面的區劃溝在玻璃母材102之厚度方向的中心處而貫通的情況。 At the chemical polishing apparatus 10, in order to adjust the above-described offset amount 106, for example, it is necessary to adjust the magnitude of the hydraulic pressure difference between the upper side injection pipe 444U and the lower side injection pipe 444L, or by the lower side injection pipe. 444L may be subjected to a chemical polishing treatment in such a manner that the division groove is deepened by an amount corresponding to the offset amount 106 only in the lower portion. That is, By adjusting the opening degree of each of the opening and closing valves 442 (442U, 442L) constituting the hydraulic pressure control unit, it is possible to prevent the division groove of the first main surface of the glass base material 102 and the division groove of the second main surface from being in the glass mother. The material 102 is penetrated at the center of the thickness direction.

結束了端面處理之玻璃基板,係被浸漬在裝入有苛性鈉或TMAH(氫氧化四甲基銨)以及DMI(1,3-二甲基-2-咪唑啉酮)之混合液等的鹼性剝離液之剝離槽中,而使抗蝕層剝離。藉由進行以上之處理,如圖9(C)中所示一般,係成為能夠從完成了化學強化之玻璃母材而安定且有效率地得到複數之玻璃基板104。 The glass substrate which has been subjected to the end surface treatment is immersed in a base containing a caustic soda or a mixture of TMAH (tetramethylammonium hydroxide) and DMI (1,3-dimethyl-2-imidazolidinone). In the stripping bath of the stripping solution, the resist layer is peeled off. By performing the above processing, as shown in FIG. 9(C), generally, a glass substrate 104 which can be stably and efficiently obtained from the glass base material which has been chemically strengthened is obtained.

接著,使用圖10,針對在化學研磨裝置10處而將1枚之薄片狀的玻璃母材102切斷並分割成複數之玻璃基板104的處理之實施形態的其他例子作說明。在此實施形態中,係並不使用第1玻璃支持具70以及第2支持具72。首先,係將玻璃母材102直接性地放置在搬送滾輪50處並對於第1主面以及第2面之兩面進行化學研磨處理。之後,在使第1主面之區劃溝以及第2主面之區劃溝作了所期望之量的深化之階段中,將耐酸性薄膜64貼附在與搬送滾輪50作接觸之側的面上。之後,在將貼附有耐酸性薄膜64之主面朝向下側的狀態下,將玻璃母材102載置在搬送滾輪50上。 Next, another example of the embodiment of the process of cutting and dividing the sheet-like glass base material 102 into a plurality of glass substrates 104 in the chemical polishing apparatus 10 will be described with reference to FIG. In this embodiment, the first glass holder 70 and the second holder 72 are not used. First, the glass base material 102 is directly placed on the transfer roller 50, and the first main surface and the second surface are chemically polished. Thereafter, the acid-resistant film 64 is attached to the surface on the side in contact with the conveying roller 50 in a stage in which the groove of the first main surface and the groove of the second main surface are deepened by a desired amount. . After that, the glass base material 102 is placed on the transport roller 50 in a state in which the main surface to which the acid-resistant film 64 is attached is directed downward.

耐酸性薄膜64,較理想,係以並不使空氣混入至其與玻璃母材之間的方式來作貼附。在此實施形態中,雖係使用玻璃層壓機來進行耐酸性薄膜之貼附,但是,係並不被 限定於此。又,於此,作為耐酸性薄膜64,雖係使用厚度50~150μm程度之由PET(聚對苯二甲酸乙二酯)所成的樹脂薄膜,但是,係亦可使用其他之素材的薄膜。在貼附有耐酸性薄膜64之主面上,由於就算是更進而進行研磨液之噴射也不會引起區劃溝之深化,因此,在第1主面之區劃溝以及第2主面之區劃溝的深度之間,係產生有差異。另外,在貼附了耐酸性薄膜64之後,雖然就算是從上下之雙方而均進行化學研磨液之噴射也不會有問題,但是,從減少使用液量之觀點來看,係以僅從上側來進行化學研磨液之噴射為理想。 The acid-resistant film 64 is preferably attached in such a manner that air is not mixed between it and the glass base material. In this embodiment, although a glass laminator is used for attaching an acid-resistant film, it is not Limited to this. In addition, as the acid-resistant film 64, a resin film made of PET (polyethylene terephthalate) having a thickness of about 50 to 150 μm is used. However, a film of another material may be used. On the main surface to which the acid-resistant film 64 is attached, even if the polishing liquid is sprayed, the division groove is not deepened. Therefore, the groove of the first main surface and the groove of the second main surface are formed. There is a difference between the depths of the system. Further, after the acid-resistant film 64 is attached, there is no problem even if the chemical polishing liquid is sprayed from both the upper and lower sides, but from the viewpoint of reducing the amount of liquid used, it is only from the upper side. It is desirable to carry out the injection of a chemical polishing liquid.

若依據此實施形態,則係成為能夠適當地防止第1主面之區劃溝以及第2主面之區劃溝在玻璃母材102之厚度方向的中心處而相貫通的情況。因此,當第1主面之區劃溝以及第2主面之區劃溝作了貫通時,係能夠防止在玻璃母材102處而發生碎裂的情況。又,由於就算是在將玻璃母材102分割成複數之玻璃基板104之後,各玻璃基板104亦係附著在耐酸性薄膜64上,而可視為1枚之薄片來進行處理,因此,從化學研磨裝置10所排出之玻璃基板104的處理係變得容易。另外,在此實施形態中所使用之耐酸性薄膜64,係以盡可能的使用具有韌性者為理想。其理由係在於,當耐酸性薄膜64之韌性為弱的情況時,在搬送滾輪50上之耐酸性薄膜64會彎折,而有著使複數之玻璃基板散開的擔憂之故。當耐酸性薄膜64之韌性為弱的情況時,亦可在耐酸性薄膜64上貼附用以對韌性作補 強之平板或框架等。 According to this embodiment, it is possible to appropriately prevent the division groove of the first main surface and the division groove of the second main surface from penetrating in the center of the thickness direction of the glass base material 102. Therefore, when the division groove of the first main surface and the division groove of the second main surface are penetrated, it is possible to prevent the occurrence of chipping at the glass base material 102. In addition, even after the glass base material 102 is divided into a plurality of glass substrates 104, the glass substrates 104 are adhered to the acid-resistant film 64, and can be treated as one sheet. Therefore, chemical polishing is performed. The processing of the glass substrate 104 discharged from the device 10 is easy. Moreover, it is preferable that the acid-resistant film 64 used in this embodiment is toughness as much as possible. The reason for this is that when the toughness of the acid-resistant film 64 is weak, the acid-resistant film 64 on the conveying roller 50 is bent, and there is a concern that a plurality of glass substrates are scattered. When the toughness of the acid-resistant film 64 is weak, it may be attached to the acid-resistant film 64 to compensate for the toughness. Strong tablet or frame, etc.

進而,使用圖11~圖15,針對在化學研磨裝置10處而將1枚之薄片狀的玻璃母材102切斷並分割成複數之玻璃基板104的處理之實施形態的其他例子作說明。在此實施形態中,對於玻璃母材102,最初係將玻璃母材102直接性地放置在搬送滾輪50處並對於第1主面以及第2面之兩面進行化學研磨處理,關於此點,係與前述之實施形態相同。在此實施形態中,亦同樣的,在使第1主面之區劃溝以及第2主面之區劃溝作了所期望之量的深化之階段中,將耐酸性薄膜64貼附在第1主面或第2主面上。 Furthermore, another example of the embodiment of the process of cutting and dividing the sheet-like glass base material 102 into a plurality of glass substrates 104 in the chemical polishing apparatus 10 will be described with reference to FIG. 11 to FIG. In the embodiment, in the glass base material 102, the glass base material 102 is directly placed on the transport roller 50, and the first main surface and the second surface are chemically polished. The same as the above embodiment. In this embodiment, in the same manner, the acid-resistant film 64 is attached to the first main body in a stage where the division of the first main surface and the division of the second main surface are performed in a desired amount. Face or 2nd main face.

進而,在此實施形態中,係使用有以從下方來支持玻璃母材102的方式所構成的玻璃托盤60。玻璃托盤60,係由具有耐酸性之樹脂素材(在此實施形態中,係為聚氯乙烯)所成,並具備有以收容玻璃母材102的方式所構成之本體600、和被固定在本體600處之尖端部604。本體600,係具備有底板部、以及從此底板部之周緣起而立起設置之側板部。側板部,係構成為具備有玻璃母材102之厚度的2~5倍程度之高度,並概略涵蓋底板之周緣的全區域地做配置,但是,係於一部分處被設置有切缺部602。尖端部604,係被安裝在本體600之其中一側面處,並呈現隨著從本體600遠離而逐漸使前端變細一般的形狀。尖端部604,係在搬送滾輪和以與搬送滾輪50相對向之方式所配置的對向滾輪等之間,而發揮使玻璃托盤60順暢地通過的功能。 Further, in this embodiment, a glass tray 60 configured to support the glass base material 102 from below is used. The glass tray 60 is made of a resin material having acid resistance (in this embodiment, polyvinyl chloride), and includes a main body 600 configured to house the glass base material 102, and is fixed to the main body. The tip end portion 604 at 600. The main body 600 includes a bottom plate portion and a side plate portion that is erected from the periphery of the bottom plate portion. The side plate portion is formed to have a height of about 2 to 5 times the thickness of the glass base material 102, and is generally arranged to cover the entire circumference of the bottom plate. However, the cutout portion 602 is provided at a part thereof. The tip end portion 604 is mounted at one of the sides of the body 600 and assumes a shape that gradually tapers the front end as it moves away from the body 600. The tip end portion 604 functions between the conveying roller and the opposing roller disposed so as to face the conveying roller 50, and the glass tray 60 is smoothly passed.

如同上述一般,玻璃母材102,係在使第1主面之區劃溝以及第2主面之區劃溝作了所期望之量之深化的階段中,在第1主面或第2主面上貼附耐酸性薄膜64,但是,如圖12(A)中所示一般,被貼附有此耐酸性薄膜64之玻璃母材102,係以使耐酸性薄膜64側之面與玻璃托盤60相接的方式,來載置在玻璃托盤60之本體600處。之後,玻璃母材102,係藉由耐酸性膠帶62來固定在玻璃托盤60之本體600處。之後,將玻璃母材102作了收容之玻璃托盤60,係如圖12(B)中所示一般,以使尖端部604朝向搬送方向之下游的狀態,來載置於搬送滾輪50之上。 As described above, the glass base material 102 is on the first main surface or the second main surface in a stage where the division groove of the first main surface and the division of the second main surface are deepened by a desired amount. The acid-resistant film 64 is attached. However, as shown in FIG. 12(A), the glass base material 102 to which the acid-resistant film 64 is attached is formed so that the surface of the acid-resistant film 64 side faces the glass tray 60. The manner of connection is placed on the body 600 of the glass tray 60. Thereafter, the glass base material 102 is fixed to the body 600 of the glass tray 60 by the acid resistant tape 62. Then, the glass tray 60 in which the glass base material 102 is accommodated is placed on the transport roller 50 in a state where the tip end portion 604 is directed downstream of the transport direction as shown in FIG. 12(B).

玻璃托盤60,係成為依序通過搬入部12、前置處理腔14、第1處理腔16、第2處理腔18、第3處理腔20、第4處理腔22、第1中繼部28、第2中繼部30、第3中繼部32、水洗腔24、搬出部26、處理液收容部42、處理液供給部44、水供給部46,但是,在各處理腔以及各中繼部處而從上側所供給而來之化學研磨液,係會積留在本體600中。因此,玻璃托盤60上之玻璃母材102,係如圖13(A)以及圖13(B)中所示一般,被浸漬在積留於本體600處的化學研磨液中。此時,在本體600處,由於係恆常從上方而被供給有化學研磨液,因此,本體600內之化學研磨液的一部分係會超過側板部之上方而溢出,並且經由切缺部602而流出至外部。其結果,由於本體600內之化學研磨液係恆常被新供給而來者所置換,因此,係成為易於恆常地將化學研磨液中之氟酸濃度安定化,而保證一定之 研磨速度。另外,在此實施形態中,雖然並未在本體600之底面部處設置有孔,但是,亦可藉由在本體600之底面部處設置1個或複數之小孔,來促進化學研磨液之循環。 The glass tray 60 passes through the loading unit 12, the pre-processing chamber 14, the first processing chamber 16, the second processing chamber 18, the third processing chamber 20, the fourth processing chamber 22, and the first relay unit 28 in order. The second relay unit 30, the third relay unit 32, the water washing chamber 24, the carry-out unit 26, the processing liquid storage unit 42, the processing liquid supply unit 44, and the water supply unit 46 are provided in each processing chamber and each relay unit. The chemical polishing liquid supplied from the upper side is accumulated in the body 600. Therefore, the glass base material 102 on the glass tray 60 is immersed in the chemical polishing liquid accumulated in the body 600 as shown in FIG. 13(A) and FIG. 13(B). At this time, in the main body 600, since the chemical polishing liquid is constantly supplied from above, a part of the chemical polishing liquid in the main body 600 overflows beyond the side plate portion, and passes through the cutout portion 602. Flow out to the outside. As a result, since the chemical polishing liquid in the main body 600 is constantly replaced by a new one, it is easy to stabilize the concentration of the hydrofluoric acid in the chemical polishing liquid, and to ensure a certain degree. Grinding speed. Further, in this embodiment, although the hole is not provided in the bottom surface portion of the main body 600, the chemical polishing liquid may be promoted by providing one or a plurality of small holes at the bottom surface portion of the main body 600. cycle.

進而,在玻璃母材102被浸漬於本體600處所積留之化學研磨液中的狀態下,由於第1主面之區劃溝以及第2主面之區劃溝係貫通,因此,相較於在將化學研磨液作了噴射的狀態下而使第1主面之區劃溝以及第2主面之區劃溝作貫通的情況,貫通場所係不易變得尖銳。又,藉由在第1主面之區劃溝以及第2主面之區劃溝作了貫通之後亦仍將玻璃母材102浸漬在本體600處所積留之化學研磨液中,係成為能夠對於貫通場所之變得尖銳的情況作抑制,而使玻璃基板104之端部接近於剖面觀察時呈圓弧狀。 Further, in a state in which the glass base material 102 is immersed in the chemical polishing liquid accumulated in the main body 600, since the division groove of the first main surface and the division groove of the second main surface are penetrated, compared with When the chemical polishing liquid is sprayed, the division groove of the first main surface and the division groove of the second main surface are penetrated, and the penetration place is less likely to be sharp. In addition, the glass base material 102 is immersed in the chemical polishing liquid accumulated in the main body 600 after the division groove of the first main surface and the division groove of the second main surface are penetrated, thereby enabling the penetration of the glass base material. When the sharpness is suppressed, the end portion of the glass substrate 104 has an arc shape when it is close to the cross section.

接著,使用圖14(A)~圖14(D)以及圖15(A)~圖15(D),對於在藉由此實施形態來進行處理的情況時之玻璃母材102或玻璃基板104的形狀之變化作說明。首先,如同圖14(A)~圖14(C)中所示一般,玻璃母材102,係藉由從上下所噴射而來之化學研磨液,而使得在第1主面以及第2主面處之並未被形成有抗蝕層的區劃溝被蝕刻並深化。在使第1主面以及第2主面之區劃溝作了所期望之量的深化之階段中,係如圖14(D)中所示一般,將耐酸性薄膜64貼附在第1主面或第2主面之其中一主面上。 Next, the glass base material 102 or the glass substrate 104 in the case of being processed by the embodiment will be described with reference to FIGS. 14(A) to 14(D) and FIGS. 15(A) to 15(D). The change in shape is explained. First, as shown in FIGS. 14(A) to 14(C), the glass base material 102 is made of a chemical polishing liquid sprayed from above and below, so that the first main surface and the second main surface are formed. The division groove which is not formed with the resist layer is etched and deepened. In a stage where the first main surface and the second main surface are grooved to have a desired amount of deepening, the acid-resistant film 64 is attached to the first main surface as shown in Fig. 14(D). Or one of the main faces of the second main face.

進而,如圖15(A)中所示一般,將被貼附有耐酸性薄膜64之主面設為下側,並將玻璃母材102收容在玻璃托盤60中,而接續實行化學研磨處理。此時,如同上述一 般,由於玻璃母材102係被浸漬在化學研磨液中,因此,如圖15(B)中所示一般,僅有並未貼附耐酸性薄膜64之上側的主面之區劃溝會逐漸深化。 Further, as shown in FIG. 15(A), the main surface to which the acid-resistant film 64 is attached is generally placed on the lower side, and the glass base material 102 is housed in the glass tray 60, and the chemical polishing treatment is continued. At this time, like the above one In general, since the glass base material 102 is immersed in the chemical polishing liquid, as shown in Fig. 15(B), only the division groove which is not attached to the upper surface of the upper side of the acid-resistant film 64 is gradually deepened. .

而,若依據此實施形態,則如圖15(C)中所示一般,由於係能夠避開玻璃母材102之厚度方向的中心之拉張應力變得最大之點,而使區劃溝作貫通,因此,在區劃溝之貫通時,係能夠防止玻璃母材102碎裂的情況。進而,藉由在使區劃溝作了貫通之後而仍將玻璃母材102浸漬在玻璃托盤60之本體600的化學研磨液中,如圖15(D)中所示一般,在區劃溝之貫通時所產生的尖銳部分係被除去,而成為能夠使各玻璃基板之端面接近於剖面觀察時呈圓弧狀。 According to this embodiment, as shown in FIG. 15(C), it is possible to prevent the tensile stress at the center of the thickness direction of the glass base material 102 from becoming the largest. Therefore, it is possible to prevent the glass base material 102 from being broken when the partition groove is penetrated. Further, the glass base material 102 is still immersed in the chemical polishing liquid of the body 600 of the glass tray 60 after the division groove is penetrated, as shown in Fig. 15(D), generally, when the division groove is penetrated. The sharp portion thus produced is removed, and the end surface of each glass substrate can be made into an arc shape when it is close to the cross section.

藉由上述之製造方法所得到的玻璃基板,係可作為構成觸控面板一體型之液晶顯示器的使用者側之玻璃基板來使用之。又,係亦可作為行動電話之液晶顯示器的覆蓋玻璃來使用。 The glass substrate obtained by the above-described manufacturing method can be used as a glass substrate constituting a user side of a touch panel integrated liquid crystal display. Moreover, it can also be used as a cover glass for a liquid crystal display of a mobile phone.

被設置在晶片區域處之感測元件,由於一般而言熱耐性係為差,因此,對於形成有晶片區域之玻璃而進行化學強化處理一事係為困難,但是,若依據上述之實施形態,則由於係能夠將被形成有晶片區域之已完成化學強化的大型玻璃母材104安定地切斷並得到複數的玻璃基板,因此,特別是在搭載有觸控面板用之感測元件的玻璃基板的情況時,係成為能夠將生產性作顯著的提升。 Since the sensing element provided in the wafer region is generally inferior in thermal resistance, it is difficult to perform chemical strengthening treatment on the glass in which the wafer region is formed. However, according to the above embodiment, Since the large-sized glass base material 104 in which the chemical strengthening of the wafer region is formed is stably cut and a plurality of glass substrates can be obtained, in particular, the glass substrate on which the sensing element for the touch panel is mounted is used. In the case of the situation, it is possible to make a significant improvement in productivity.

上述之實施形態的說明,係全部僅為例示,而不應將 其視為限制性的記載。本發明之範圍,係並非為上述之實施形態所界定,而是藉由申請專利範圍來表現。進而,在本發明之範圍中,係亦包含有落於與申請專利範圍均等之意義以及範圍內的所有之變更。 The description of the above embodiments is merely illustrative and should not be It is considered to be a restrictive record. The scope of the present invention is not defined by the above-described embodiments, but is expressed by the scope of the patent application. Further, all changes that come within the meaning and range of equivalence of the scope of the invention are included in the scope of the invention.

10‧‧‧化學研磨裝置 10‧‧‧Chemical grinding device

12‧‧‧搬入部 12‧‧‧Moving Department

14‧‧‧前置處理腔 14‧‧‧Pre-treatment chamber

16‧‧‧第1處理腔 16‧‧‧1st treatment chamber

18‧‧‧第2處理腔 18‧‧‧2nd processing chamber

20‧‧‧第3處理腔 20‧‧‧3rd processing chamber

22‧‧‧第4處理腔 22‧‧‧4th processing chamber

24‧‧‧水洗腔 24‧‧‧washing chamber

26‧‧‧搬出部 26‧‧‧ Moving out

28‧‧‧第1中繼部 28‧‧‧1st relay unit

30‧‧‧第2中繼部 30‧‧‧2nd relay

32‧‧‧第3中繼部 32‧‧‧3rd relay department

60‧‧‧玻璃托盤 60‧‧‧ glass tray

102‧‧‧玻璃母材 102‧‧‧Glass base metal

104‧‧‧玻璃基板 104‧‧‧ glass substrate

[圖1]對於本發明之實施形態的單片式化學研磨裝置之外觀作展示的圖。 Fig. 1 is a view showing the appearance of a one-piece chemical polishing apparatus according to an embodiment of the present invention.

[圖2]對於單片式化學研磨裝置之概略構成作展示的圖。 Fig. 2 is a view showing a schematic configuration of a one-piece chemical polishing apparatus.

[圖3]對於單片式化學研磨裝置之概略構成作展示的圖。 Fig. 3 is a view showing a schematic configuration of a one-piece chemical polishing apparatus.

[圖4]對於第1處理腔之概略構成作展示的圖。 Fig. 4 is a view showing a schematic configuration of a first processing chamber.

[圖5]對於處理液供給機構之概略構成作展示的圖。 Fig. 5 is a view showing a schematic configuration of a processing liquid supply mechanism.

[圖6]對於曲柄機構之概略構成作展示的圖。 Fig. 6 is a view showing a schematic configuration of a crank mechanism.

[圖7]對於在前置處理腔處之處理作說明的圖。 [Fig. 7] A diagram for explaining processing at a pre-processing chamber.

[圖8]對於藉由化學研磨裝置而被作了切斷處理之玻璃母材的概觀之其中一例作展示的圖。 Fig. 8 is a view showing an example of an overview of a glass base material which has been subjected to a cutting treatment by a chemical polishing apparatus.

[圖9]對於藉由化學研磨裝置而被作了切斷處理之玻璃母材的概觀之其中一例作展示的圖。 Fig. 9 is a view showing an example of an overview of a glass base material which has been subjected to a cutting treatment by a chemical polishing apparatus.

[圖10]對於藉由化學研磨裝置而被作了切斷處理之玻璃母材的概觀之其他例作展示的圖。 Fig. 10 is a view showing another example of an overview of a glass base material which has been subjected to a cutting treatment by a chemical polishing apparatus.

[圖11]對於在玻璃基板之製造方法的實施形態中所被使用之玻璃托盤的例子作展示之圖。 Fig. 11 is a view showing an example of a glass tray used in an embodiment of a method for producing a glass substrate.

[圖12]對於藉由玻璃托盤而將玻璃母材作了收容的狀態作展示之圖。 Fig. 12 is a view showing a state in which a glass base material is housed by a glass tray.

[圖13]對於收容有玻璃母材之玻璃托盤的被作搬送之狀態作展示之圖。 Fig. 13 is a view showing a state in which a glass tray containing a glass base material is transported.

[圖14]對於玻璃母材之主面的區劃溝加深化之狀態作展示之圖。 [Fig. 14] A view showing a state in which the division groove of the main surface of the glass base material is deepened.

[圖15]對於玻璃母材之主面的區劃溝加深化之狀態作展示之圖。 Fig. 15 is a view showing a state in which the division groove of the main surface of the glass base material is deepened.

10‧‧‧化學研磨裝置 10‧‧‧Chemical grinding device

12‧‧‧搬入部 12‧‧‧Moving Department

14‧‧‧前置處理腔 14‧‧‧Pre-treatment chamber

16‧‧‧第1處理腔 16‧‧‧1st treatment chamber

18‧‧‧第2處理腔 18‧‧‧2nd processing chamber

20‧‧‧第3處理腔 20‧‧‧3rd processing chamber

22‧‧‧第4處理腔 22‧‧‧4th processing chamber

24‧‧‧水洗腔 24‧‧‧washing chamber

26‧‧‧搬出部 26‧‧‧ Moving out

28‧‧‧第1中繼部 28‧‧‧1st relay unit

30‧‧‧第2中繼部 30‧‧‧2nd relay

32‧‧‧第3中繼部 32‧‧‧3rd relay department

36‧‧‧曲柄機構 36‧‧‧Crank mechanism

42‧‧‧處理液收容部 42‧‧‧Processing liquid containment department

44‧‧‧處理液供給部 44‧‧‧Processing liquid supply department

46‧‧‧水供給部 46‧‧‧Water Supply Department

50‧‧‧搬送滾輪 50‧‧‧Transport roller

100‧‧‧玻璃基板 100‧‧‧ glass substrate

200‧‧‧導入口 200‧‧‧Import

242U‧‧‧上側噴射管 242U‧‧‧Upper jet pipe

242L‧‧‧下側噴射管 242L‧‧‧Bottom injection tube

244‧‧‧氣刀 244‧‧‧ air knife

246‧‧‧氣刀 246‧‧‧ Air knife

282U‧‧‧上側噴射管 282U‧‧‧Upper jet pipe

282L‧‧‧下側噴射管 282L‧‧‧Bottom injection tube

300‧‧‧導出口 300‧‧‧export

302U‧‧‧上側噴射管 302U‧‧‧Upper jet pipe

302L‧‧‧下側噴射管 302L‧‧‧Bottom injection tube

322U‧‧‧上側噴射管 322U‧‧‧Upper jet pipe

322L‧‧‧下側噴射管 322L‧‧‧Bottom injection tube

362‧‧‧驅動馬達 362‧‧‧Drive motor

364‧‧‧傳導機構部 364‧‧‧Transmission Department

420‧‧‧回收管線 420‧‧‧Recycling pipeline

440‧‧‧供液管線 440‧‧‧liquid supply pipeline

444U‧‧‧上側噴射管 444U‧‧‧Upper jet pipe

444L‧‧‧下側噴射管 444L‧‧‧Bottom injection tube

446U‧‧‧上側噴射噴嘴 446U‧‧‧upside spray nozzle

446L‧‧‧下側噴射噴嘴 446L‧‧‧Bottom spray nozzle

460‧‧‧供水管線 460‧‧‧Water supply pipeline

Claims (3)

一種玻璃基板之製造方法,係為被適用在單片式之化學研磨裝置中的玻璃基板之製造方法,該單片式之化學研磨裝置,係為構成為對於被連續性搬送之複數的玻璃基板而進行化學研磨處理之化學研磨裝置,並具備有:搬送部,係具備有橫跨身為應切斷之位置之區劃線並構成為將在第1主面以及第2主面上被形成有光阻層之玻璃母材朝向水平方向作搬送的複數之搬送滾輪;和研磨處理部,係構成為對於藉由前述搬送部所被搬送之玻璃母材而從上下方向噴射化學研磨液並蝕刻玻璃母材之區劃線,該玻璃基板之製造方法,其特徵為:藉由對於從上側所噴射至玻璃母材之化學研磨液的量和從下側所噴射至玻璃母材之化學研磨液的量分別進行調整,而使被形成在第1主面上之區劃溝以及被形成在第2主面上之區劃溝,在從玻璃母材之厚度方向的中心起而作了特定量之偏移的位置處作貫通。 A method for producing a glass substrate is a method for producing a glass substrate to be applied to a one-piece chemical polishing apparatus, wherein the one-piece chemical polishing apparatus is configured to be a plurality of glass substrates that are continuously conveyed In the chemical polishing apparatus that performs the chemical polishing treatment, the conveying unit includes a scribe line having a position at which the traverse is to be cut, and is configured to be formed on the first main surface and the second main surface. a plurality of transport rollers that transport the glass base material of the photoresist layer in the horizontal direction; and the polishing processing unit is configured to eject the chemical polishing liquid from the vertical direction and etch the glass with respect to the glass base material conveyed by the transport unit. The method for producing a glass substrate is characterized in that the amount of the chemical polishing liquid sprayed from the upper side to the glass base material and the amount of the chemical polishing liquid sprayed from the lower side to the glass base material are characterized by The adjustment is performed separately, and the division groove formed on the first main surface and the division groove formed on the second main surface are made to have a specific amount from the center in the thickness direction of the glass base material. The position of the offset is made to pass through. 如申請專利範圍第1項所記載之玻璃基板之製造方法,其中,係包含有:對於第1主面以及第2主面之雙方而施加化學研磨處理之第1化學研磨步驟;和僅對於第1主面而施加特定之單面研磨量的化學研磨處理之第2化學研磨步驟。 The method for producing a glass substrate according to the first aspect of the invention, further comprising: a first chemical polishing step of applying a chemical polishing treatment to both the first main surface and the second main surface; and A second chemical polishing step of a chemical polishing treatment in which a specific single-side polishing amount is applied to the main surface. 如申請專利範圍第1項或第2項所記載之玻璃基板之製造方法,其中,在前述第2化學研磨步驟中,係使用具備有可收容玻璃母材之本體和構成為隨著朝向搬送方向之下游側而前端逐漸變細的尖端部之玻璃托盤,而搬送將前述玻璃母材作了載置之前述玻璃托盤。 The method for producing a glass substrate according to the first or second aspect of the invention, wherein the second chemical polishing step is configured to include a main body capable of accommodating a glass base material and configured to face the conveying direction The glass tray of the tip end portion which is tapered on the downstream side and the tip end is conveyed, and the glass tray on which the glass base material is placed is conveyed.
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