TW201326778A - Optical measurement aid with elliptical curved surface structure and optical measurement system - Google Patents

Abstract

The present invention relates to an optical measurement aid having an elliptical curved surface structure and an optical measurement system. The optical measurement system includes the optical measurement aid and an optical measurement instrument. The optical measurement aid adopts the design of a first reflector cavity having an ellipsoidal inner reflecting curved surface therein, or a second reflector cavity connected in series with an ellipsoidal inner reflecting curved surface therein on one end of the first reflector cavity; alternatively, a virtual ellipsoidal inner reflecting curved surface is formed by driving a partial inner reflecting elliptical curved surface of an ellipsoid to rotate. By the adoption of the ellipsoidal reflecting curved surface, the full luminous range of a luminous point may be directly reflected to the optical measurement instrument, such that measurement may be completed rapidly, and total reflection of the light path may be provided when taking measurements without aberration problems; in addition, required optical features of an object to be tested may be measured without the need to adopt motion detection, regardless of the ranges of incident angles of a light source.

Description

Optical measuring aid and optical measuring system with elliptical surface structure

The present invention relates to an optical measurement system, and more particularly to an optical measurement aid having an elliptical curved surface configuration in the optical measurement system and an optical measurement system including the optical measurement aid.

In order to analyze the optical characteristics of an article such as a liquid crystal display device, it must be inspected by an appropriate optical measuring system. For the optical measuring operation, the liquid crystal display device must be fixed to correspond to an optical measuring instrument by using a specific jig. Next, the optical characteristics of the liquid crystal display device at various angles are measured by the optical measuring instrument at various predetermined angles. In order to perform measurement separately at various predetermined angles, the operator needs to change the position of the optical measuring instrument or the liquid crystal display device to different angular positions, so that the liquid crystal display device can be measured at various predetermined angles. Optical properties.

Among the currently known optical measuring systems, the conventional conoscope measuring system is widely used in the field of optical measurement of flat panel displays, which can measure optical characteristics such as brightness, contrast, and viewing angle. Although the lenticular measurement system can obtain measurement data quickly and without complicated mathematical operations, it is necessary to avoid aberrations and large angle incidence to obtain the angle of view in the lens design, so the lens design and processing often It takes a lot of manpower and material costs, and the whole set of machines is not cheap.

Another optical measurement method is mechanical rotation. The method uses the luminance measurement to measure the same position, and then mechanically changes the angle of the object to be measured to obtain data of different viewing angles. For example, the invention patent application of "Adjustable Optical Measuring and Measuring Tool and Measuring Method" of Taiwan Patent Publication No. 200928338, and the invention patent case of "Adjustable Optical Measuring and Measuring Tool for Liquid Crystal Panel" of Taiwan Patent No. 513339 Each of them discloses an adjustable optical measuring fixture for measuring the optical characteristics of the liquid crystal display device.

In the foregoing, the same position is measured by luminance, and the angle is changed by mechanical means to obtain data of different viewing angles. Although this method is simple and inexpensive, it takes too long to measure a panel, and the current output and product specifications are For a wide variety of industries, it has gradually become less economical.

However, the patent application of Taiwan Patent Publication No. 200928338 and the adjustable optical measurement tool of the patent of Taiwan Patent No. 513339 need to adjust the optical measurement in a single measurement operation, that is, when measuring at different angles. The angular position of the fixture or optical measuring instrument, the current specification is about 20 minutes after the completion of the operation, and the operation time is too long.

The main object of the present invention is to provide an optical measuring aid and an optical measuring system having an elliptical curved surface structure, and thereby designing and improving the time-consuming problem of the existing optical measuring operation.

In order to achieve the foregoing object, an optical measuring aid having an elliptical curved surface structure according to the present invention comprises: a rotating reflecting member comprising an inner reflecting elliptical surface, a first focus and a second focus, wherein the inner focus The reflective elliptical surface is a part of the inner curved surface of the elliptical sphere and has a reference central axis; the first focus and the second focus are located on the reference central axis, and the inner reflective elliptical surface is located between the first focus and the second focus, The two ends of the inner reflection elliptical surface with respect to the reference central axis respectively correspond to the first focus and the second focus and have a predetermined distance from the reference central axis; and a rotary drive mechanism including a rotary actuation end and a rotary actuation end connection The rotating reflection member is driven by the rotation driving mechanism to rotate the rotating reflection member centering on the reference central axis, so that the rotating internal reflection elliptical surface forms a virtual elliptical spherical internal reflection curved surface.

The optical measuring system of the present invention comprises: an optical measuring aid as described above; a detector disposed at one of the first focus and the second focus; and an object to be tested disposed at the One of the first focus and the second focus; a laser light source for emitting laser light at an oblique angle with respect to the reference central axis, passing through the object to be tested, and projecting on the inner curved elliptical surface of the rotation And then reflected to the detector; and an analyzing device for measuring and analyzing the data detected by the detector.

Another optical measuring aid having an elliptical curved surface structure according to the present invention comprises a first reflecting cavity, the first reflecting cavity comprising an elliptical spherical inner reflecting surface, a first focus and a second focus, an ellipse The spherical internal reflection curved surface is located inside the first reflective cavity and is located between the first focus and the second focus, and the elliptical spherical internal reflective curved surface of the first reflective cavity has a first central axis passing through the center thereof, the first focus and the second The focus is on the first central axis, one end of the first reflective cavity corresponds to the first focus and has a distance from the first central axis to form a first light entrance, and the other end of the first reflective cavity corresponds to the second The focus and a distance from the first central axis form a first light exit.

Another optical measuring system according to the present invention comprises: an optical measuring aid as described above; a detector disposed at one of the first focus and the second focus; And the other one of the first focus and the second focus; a laser light source for emitting laser light at an oblique angle with respect to the reference central axis, passing through the object to be tested, and projecting on the elliptical spherical internal reflection surface And reflecting to the detector after being reflected; and an analyzing device for measuring and analyzing the data detected by the detector.

The optical measuring aid of the present invention may further include a second reflecting cavity serially connected to one end of the first reflecting cavity, the second reflecting cavity comprising an elliptical spherical inner reflecting surface, a third focus and a first a four-focus, elliptical spherical inner reflection surface located inside the second reflection cavity and located between the third focus and the fourth focus, the elliptical spherical inner reflection surface of the second reflection cavity having a second central axis passing through the center thereof, the third The focus and the fourth focus are located on the second central axis, and one end of the second reflective cavity corresponds to the third focus and has a distance from the second central axis to form a second light entrance, and the other end of the second reflective cavity Corresponding to the fourth focus and having a distance from the second central axis to form a second light exit port, the second light entrance of the second reflective cavity is connected to the first light exit port of the first reflective cavity, and the second reflective cavity The third focus coincides with the second focus of the first reflective cavity, the first central axis being in line with the second central axis.

Another optical measuring system according to the present invention comprises: an optical measuring aid as described above; a detector disposed at the first focus; and a test object disposed at the fourth focus; a laser light source for passing through the object to be tested at the first focus, and then projecting on the elliptical spherical inner reflection surface of the first reflection cavity, and reflecting through the elliptical spherical inner reflection surface of the first reflection cavity And projecting the second reflective cavity by the second focus of the first reflective cavity and the third focus of the second reflective cavity onto the elliptical spherical internal reflection surface of the second reflective cavity The detector of the fourth focus of the body; and an analyzing device for measuring and analyzing the data detected by the detector.

The optical measuring aid and the optical measuring system proposed by the invention mainly adopt an architecture of an ellipsoidal reflecting surface, so that the full-angle light of a light-emitting point can be directly reflected to an optical measuring instrument, and the measuring instrument has high measurement. Accuracy and fast measurement and low cost, the operation time can be completed in about 10 seconds, the operation efficiency is good, and it is economical; and the optical measuring aid of the present invention utilizes its elliptical spherical shape. The structure of the internal reflection surface provides the optical path design for the total reflection of the measurement operation. There is no aberration problem, and no need for motion detection, regardless of the incident angle of the light source, and the optical required for the measurement of the object to be measured characteristic.

As shown in FIGS. 1 and 2, a first preferred embodiment of an optical measuring aid having an elliptical curved surface structure according to the present invention is disclosed. The optical measuring aid having an elliptical curved surface structure includes a rotating reflecting member 1 and a a rotary drive mechanism 2, wherein: the rotating reflective member 1 comprises an inner reflection elliptical surface 10, a first focus 11 and a second focus 12, the inner reflection elliptical surface 10 being part of an inner surface of an elliptical sphere The block has a reference central axis 13 , that is, an elliptical spherical inner curved surface is divided into N pieces (N is a positive integer) with respect to the reference central axis 13 , so that the rotating reflective member 1 has a small volume. The material cost is low, the inner reflection elliptical surface 10 is easy to be surface-treated, and the surface is highly accurate; the first focus 11 and the second focus 12 of the rotating reflection member 1 are located on the reference central axis 13 and the inner reflection elliptical surface 10 is located between the first focus 11 and the second focus 12, and the two ends of the internal reflection elliptical curved surface 10 with respect to the reference central axis 13 respectively correspond to the first focus 11 and the second focus 12 and have a reference central axis 13 A predetermined distance. From the geometrical point of view, the light emitted from one of the focal points of the elliptical spherical inner surface will be concentrated on the other focus of the elliptical spherical inner surface, that is, from the first focus 11 and the second focus 12 One of the emitted light will be concentrated on the other of the first focus 11 and the second focus 12 after being reflected by the internally reflecting elliptical surface.

The rotary drive mechanism 2 includes a rotary actuating end 22, and the rotary actuating end 22 is coupled to the rotary reflection member 1. The rotary drive mechanism 2 can drive the rotary reflection member 1 to rotate about the reference central axis 13 to rotate the internally reflected elliptical curved surface 10 A virtual elliptical spherical internal reflection curved surface 10A is formed.

In the preferred embodiment, the rotary drive mechanism 2 is a combination of a servo motor 20 and a connecting member 21, the servo motor 20 has a rotatable spindle, and the connecting member 21 has a rotary actuating end 22, and The rotation actuating end 22 connects one end of the rotating reflection member 1 adjacent to the first focus 31.

In the first preferred embodiment, when the optical measuring aid having the elliptical curved surface configuration is applied to the optical measuring system, as shown in FIG. 2, the optical measuring system is not limited to the optical measuring aid. The first end point 11 of the optical measuring aid is disposed on the receiving end of the detector 6. The object to be tested 7 is disposed at the second focus 12, and the detector 6 and the object to be tested 7 are also interchangeable. As shown in FIG. 2, when the measurement is performed, the laser light source 5 is projected at an oblique angle with respect to the reference central axis 13 to project the laser beam onto the second focus 12 and pass through the object to be tested, and then project the rotation inner reflection ellipse. The curved surface 10 is reflected and then projected to the receiving end of the detector 6 at the first focus 11, and the detected data is sent by the detector 6 to the analyzing device in the system for measurement analysis.

As shown in FIG. 3, a second preferred embodiment of the optical measuring aid having an elliptical curved surface structure according to the present invention is disclosed. The optical measuring aid includes a first reflecting cavity 3 and a first reflecting cavity. 3 includes an elliptical spherical internal reflection curved surface 30, a first focus 31 and a second focus 32. The elliptical spherical internal reflection curved surface 30 is located inside the first reflective cavity 3 and located between the first focus 31 and the second focus 32. The ellipsoidal inner reflection surface 30 of the first reflection cavity 3 has a first central axis 33 passing through the center thereof, and the first focus 31 and the second focus 32 are located on the first central axis 33, and one end of the first reflection cavity 3 corresponds to Forming a first light entrance opening 34 at a first focus 31 and having a distance from the first central axis 33. The other end of the first reflective cavity 3 corresponds to the second focus 32 and has a distance from the first central axis 33. Forming a first light exit opening 35 such that light emitted from one of the first focus 31 and the second focus 32 is reflected by the elliptical spherical inner reflective surface 30 and then concentrated on the first focus 31 and the first focus Two of the two focus 32.

In the second preferred embodiment, when the optical measuring aid having the elliptical curved surface configuration is applied to the optical measuring system, as shown in FIG. 4, the optical measuring system is not limited to the optical measuring aid. The second focus 32 of the first reflective cavity 3 is disposed on the receiving end of the detector 6. The object to be tested 7 is disposed at the first focus 31 of the first reflective cavity 3, and the detector 6 is to be tested. The object 7 can also be interchanged. When the measurement is performed, the laser light source 5 is emitted at an oblique angle with respect to the first central axis 33, and the laser light is projected onto the second focus 32 and passes through the object 7 to be tested, and is projected into the elliptical sphere of the first reflection cavity 3 The reflective surface 30 is reflected and then projected to the receiving end of the detector 6 at the second focus 32, and the detected data is sent by the detector 6 to the analyzing device in the system for measurement analysis.

As shown in FIG. 5, a third preferred embodiment of the optical measuring aid having an elliptical curved surface structure according to the present invention is disclosed. The optical measuring aid includes a first reflecting cavity 3 and a series connected to the first A second reflecting cavity 4 at one end of the reflecting cavity 3, the first reflecting cavity 3 being substantially identical to the first reflecting cavity 3 described in the second preferred embodiment of the optical measuring aid.

The second reflective cavity 4 includes an elliptical spherical internal reflection curved surface 40, a third focus 41 and a fourth focus 42. The elliptical spherical internal reflection curved surface 40 is located inside the second reflective cavity 4 and located at the third focus 41. Between the fourth focuss 42, the ellipsoidal inner reflection surface 40 of the second reflection cavity 4 has a second central axis 43 passing through the center thereof, and the third focus 41 and the fourth focus 42 are located on the second central axis 43, second One end of the reflective cavity 4 corresponds to the third focus 41 and has a distance from the second central axis 43 to form a second light entrance 44, and the other end of the second reflective cavity 4 corresponds to the fourth focus 42 and The second central axis 43 has a distance to form a second light exit opening 45. The second light entrance opening 44 of the second reflective cavity 4 engages the first light exit opening 34 of the first reflective cavity 3, and the second reflective cavity 4 The third focus 41 coincides with the second focus 32 of the first reflective cavity 3, and the first central axis 33 is in line with the second central axis 43. The light emitted from one of the third focus 41 and the fourth focus 42 is reflected by the elliptical spherical internal reflection curved surface 40 to be concentrated on the other of the third focus 41 and the fourth focus 42.

The first reflective cavity 3 and the second reflective cavity 4 of the present invention may be different types of elliptical cavities, as shown in the third preferred embodiment of FIG. 5, wherein the first reflective cavity 3 is of a short fat type. The cavity, the second reflecting cavity 4 is an elongated cavity.

In the third preferred embodiment, when the optical measuring aid having the elliptical curved surface configuration is applied to the optical measuring system, as shown in FIG. 6, the optical measuring system is not limited to the optical measuring aid. Including placing a test object 7 at the first focus 31 position of the first reflective cavity 3, the test object 7 can be displaced or rotated by an external drive mechanism, and then with a high directivity laser The light source 5 outputs the laser light, which is reflected by the mirror group 8 and then projected onto the elliptical spherical inner reflection surface 30 through the object 7 at the first focus 31 of the first reflection cavity 3, and passes through the first reflection cavity 3 The elliptical spherical internal reflection curved surface 30 is reflected, and the second focus 32 of the first reflective cavity 3 and the third focus 41 of the second reflective cavity 4 are projected to the elliptical spherical internal reflection curved surface 40 of the second reflective cavity 4, After being reflected, the detector 6 is projected at the fourth focus 42 of the second reflecting cavity 4, and the detected data is sent by the detector 6 to the analyzing device 9 in the system for measurement and analysis. .

The invention utilizes the structure of the elliptical spherical internal reflection curved surface, as shown in FIG. 7 , which provides the optical path design of the total reflection of the measurement operation, has no aberration problem, and does not need motion detection regardless of the incident angle of the light source. And can be used to measure the optical properties required for measurement.

1. . . Rotating reflection member

10. . . Internal reflection elliptical surface

10A. . . Virtual elliptical spherical internal reflection surface

11. . . First focus

12. . . Second focus

13. . . Reference center axis

2. . . Rotary drive mechanism

20. . . Servo motor

twenty one. . . Connecting member

twenty two. . . Rotating end

3. . . First reflecting cavity

30. . . Elliptical spherical internal reflection surface

31. . . First focus

32. . . Second focus

33. . . First central axis

34. . . First light inlet

34. . . First light exit

4. . . Second reflecting cavity

40. . . Elliptical spherical internal reflection surface

41. . . Third focus

42. . . Fourth focus

43. . . Second central axis

44. . . Second entrance

45. . . Second light exit

5. . . Laser source

6. . . Detector

7. . . Analyte

8. . . Mirror group

9. . . Analytical device

BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a plan view of a first preferred embodiment of an optical metrology aid having an elliptical curved configuration of the present invention.

2 is a view showing a state of use of the first preferred embodiment of the optical measuring aid shown in FIG. 1 applied to an optical measuring system.

Figure 3 is a plan view of a second preferred embodiment of the optical metrology aid of the present invention having an elliptical curved configuration.

4 is a view showing a state of use of the second preferred embodiment of the optical measuring aid shown in FIG. 3 applied to an optical measuring system.

Fig. 5 is a plan view showing a third preferred embodiment of the optical measuring aid having an elliptical curved surface structure of the present invention.

Fig. 6 is a view showing a state of use of a third preferred embodiment of the optical measuring aid having an elliptical curved surface structure applied to an optical measuring system according to the present invention.

7 is a reference diagram of a state of use of an optical measuring aid having an elliptical curved surface structure according to a third preferred embodiment of the present invention applied to an optical measuring system at different incident angles of light sources.

3. . . First reflecting cavity

30. . . Elliptical spherical internal reflection surface

31. . . First focus

32. . . Second focus

33. . . First central axis

34. . . First light inlet

34. . . First light exit

4. . . Second reflecting cavity

40. . . Elliptical spherical internal reflection surface

41. . . Third focus

42. . . Fourth focus

43. . . Second central axis

44. . . Second entrance

45. . . Second light exit

5. . . Laser source

6. . . Detector

7. . . Analyte

8. . . Mirror group

9. . . Analytical device

Claims (9)

An optical measurement aid having an elliptical curved surface structure, comprising: a rotating reflection member, comprising an internal reflection elliptical surface, a first focus and a second focus, wherein the internal reflection elliptical surface is an elliptical spherical inner surface a portion of the block has a reference center axis, the first focus and the second focus are located on the reference center axis, and the two ends of the inner reflection elliptical surface relative to the reference center axis respectively correspond to the first focus and the second focus and The reference center axis has a predetermined distance, wherein light emitted from one of the first focus and the second focus will be concentrated on the first focus and the second focus after being reflected by the internally reflected elliptical surface And a rotary driving mechanism comprising a rotating actuating end, the rotating actuating end connecting the rotating reflecting member, and the rotating driving mechanism drives the rotating reflecting member to rotate around the reference central axis, so that the rotating internal reflection elliptical surface forms a virtual Elliptical spherical internal reflection surface. An optical measuring aid having an elliptical curved surface structure according to claim 1, wherein the rotary driving mechanism has a servo motor and a connecting member, the servo motor is connected with the connecting member by the mandrel, and the rotating actuating end is located at the connecting member. And connecting the rotating reflective member to an end of the first focus. An optical measuring aid having an elliptical curved surface structure, comprising: a first reflecting cavity, the first reflecting cavity comprising an elliptical spherical inner reflecting surface, a first focus and a second focus, and an elliptical spherical inner reflecting surface Located inside the first reflecting cavity, the elliptical spherical inner reflecting curved surface of the first reflecting cavity has a first central axis passing through the center thereof, the first focus and the second focus are located on the first central axis, and one end of the first reflecting cavity Corresponding to the first focus and having a distance from the first central axis to form a first light entrance opening, the other end of the first reflective cavity corresponding to the second focus and having a distance from the first central axis to form a first a light exiting port, wherein light emitted from one of the first focus and the second focus will be concentrated on the other of the first focus and the second focus after being reflected by the elliptical spherical inner reflective surface. The optical measuring aid according to claim 3, wherein the optical measuring aid further comprises: a second reflecting cavity connected to one end of the first reflecting cavity, and a second reflecting cavity An elliptical spherical internal reflection curved surface, a third focus and a fourth focus, the elliptical spherical inner reflection curved surface is located inside the second reflective cavity, and the elliptical spherical inner reflective curved surface of the second reflective cavity has a second central axis passing through Center, the third focus and the fourth focus are located on the second central axis, and one end of the second reflective cavity corresponds to the third focus and has a distance from the second central axis to form a second light entrance, the second reflective cavity The other end of the body corresponds to the fourth focus and has a distance from the second central axis to form a second light exit port, and the second light entrance of the second reflective cavity engages the first light exit port of the first reflective cavity, a third focus of the two reflective cavity coincides with a second focus of the first reflective cavity, the first central axis being in line with the second central axis, wherein the light emitted from one of the third focus and the fourth focus in The elliptical spherical internal reflection surface is reflected and concentrated on the other of the third focus and the fourth focus. An optical measuring aid having an elliptical curved surface structure as claimed in claim 4, wherein the first reflecting cavity and the second reflecting cavity are different types of elliptical cavities. An optical measurement aid having an elliptical curved surface structure according to claim 5, wherein the first reflective cavity is a short fat cavity, and the second reflective cavity is a narrow cavity. An optical measuring system comprising: the optical measuring aid according to claim 1; a detector disposed in one of the first focus and the second focus; and a test object disposed in the first One of a focus and a second focus; a laser source for emitting laser light at an oblique angle with respect to the reference central axis, passing through the object to be tested, and projecting on the internally curved elliptical surface of the rotation The reflection is re-projected to the detector; and an analysis device is configured to measure and analyze the data detected by the detector. An optical measuring system comprising: the optical measuring aid according to claim 3; a detector disposed in one of the first focus and the second focus; and a test object disposed in the first One of a focus and a second focus; a laser light source for emitting laser light at an oblique angle with respect to the reference central axis, passing through the object to be tested, and projecting on the elliptical spherical internal reflection surface, reflecting Re-projecting to the detector; and an analyzing device for measuring and analyzing the data detected by the detector. An optical measuring system comprising: the optical measuring aid according to claim 4; a detector disposed at the first focus; a test object disposed at the fourth focus; a laser light source And passing through the object to be tested at the first focus, and then projecting on the elliptical spherical internal reflection surface of the first reflection cavity, and reflecting through the elliptical spherical internal reflection surface of the first reflection cavity, and overlapping by The second focus of the first reflective cavity and the third focus of the second reflective cavity are projected onto the elliptical spherical internal reflection surface of the second reflective cavity, and after being reflected, the fourth projection is located in the second reflective cavity The detector of the focus; and an analyzing device for measuring and analyzing the data detected by the detector.