TW201316461A - Method for fabricating a ceramic substrate - Google Patents
Method for fabricating a ceramic substrate Download PDFInfo
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- TW201316461A TW201316461A TW100136007A TW100136007A TW201316461A TW 201316461 A TW201316461 A TW 201316461A TW 100136007 A TW100136007 A TW 100136007A TW 100136007 A TW100136007 A TW 100136007A TW 201316461 A TW201316461 A TW 201316461A
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- 239000000758 substrate Substances 0.000 title claims abstract description 93
- 239000000919 ceramic Substances 0.000 title claims abstract description 89
- 238000000034 method Methods 0.000 title claims abstract description 45
- 239000000126 substance Substances 0.000 claims abstract description 24
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 42
- 229910052802 copper Inorganic materials 0.000 claims description 42
- 239000010949 copper Substances 0.000 claims description 42
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 23
- 229920002120 photoresistant polymer Polymers 0.000 claims description 18
- 229910000914 Mn alloy Inorganic materials 0.000 claims description 10
- PCEXQRKSUSSDFT-UHFFFAOYSA-N [Mn].[Mo] Chemical compound [Mn].[Mo] PCEXQRKSUSSDFT-UHFFFAOYSA-N 0.000 claims description 10
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 8
- 229910052709 silver Inorganic materials 0.000 claims description 8
- 239000004332 silver Substances 0.000 claims description 8
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 claims description 4
- 238000009713 electroplating Methods 0.000 claims description 4
- 239000002253 acid Substances 0.000 claims description 3
- 239000003054 catalyst Substances 0.000 claims description 3
- 229910052751 metal Inorganic materials 0.000 claims description 3
- 239000002184 metal Substances 0.000 claims description 3
- 229910052763 palladium Inorganic materials 0.000 claims description 2
- 230000003213 activating effect Effects 0.000 claims 1
- 239000011248 coating agent Substances 0.000 claims 1
- 238000000576 coating method Methods 0.000 claims 1
- 238000002791 soaking Methods 0.000 claims 1
- 238000003672 processing method Methods 0.000 description 19
- 239000007769 metal material Substances 0.000 description 5
- 238000010344 co-firing Methods 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 238000007650 screen-printing Methods 0.000 description 2
- 230000004913 activation Effects 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 238000007772 electroless plating Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000007888 film coating Substances 0.000 description 1
- 238000009501 film coating Methods 0.000 description 1
- 238000007731 hot pressing Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- WPBNNNQJVZRUHP-UHFFFAOYSA-L manganese(2+);methyl n-[[2-(methoxycarbonylcarbamothioylamino)phenyl]carbamothioyl]carbamate;n-[2-(sulfidocarbothioylamino)ethyl]carbamodithioate Chemical compound [Mn+2].[S-]C(=S)NCCNC([S-])=S.COC(=O)NC(=S)NC1=CC=CC=C1NC(=S)NC(=O)OC WPBNNNQJVZRUHP-UHFFFAOYSA-L 0.000 description 1
- KJLLKLRVCJAFRY-UHFFFAOYSA-N mebutizide Chemical compound ClC1=C(S(N)(=O)=O)C=C2S(=O)(=O)NC(C(C)C(C)CC)NC2=C1 KJLLKLRVCJAFRY-UHFFFAOYSA-N 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 239000013557 residual solvent Substances 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
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Abstract
Description
本發明為一種基板的加工方法,特別是指一種應用於陶瓷基板的加工方法。The invention relates to a processing method of a substrate, in particular to a processing method applied to a ceramic substrate.
隨著電子元件的微型化及輕型化的發展,習知利用鋁板作為基板的技術已逐漸被質量較輕的陶瓷基板所取代,陶瓷基板具有高度的絕緣性、優良的化學安定性、硬度高、耐高溫等特性,使得陶瓷基板比鋁板更具有良好的基板適性。With the development of miniaturization and light weight of electronic components, the technology of using an aluminum plate as a substrate has been gradually replaced by a light-weight ceramic substrate having a high degree of insulation, excellent chemical stability, and high hardness. The characteristics such as high temperature resistance make the ceramic substrate have better substrate suitability than the aluminum plate.
一般慣用於在陶瓷基板上加工的方法不外乎:熱壓合或是高溫共燒等方式。但若使用熱壓合的方式將金屬材質成型於陶瓷基板之上時,若金屬材質過厚,則會使接合面氧化以及整體的熱阻上升等缺點;若金屬材質過薄,則使金屬材質易於剝離或產生龜裂,降低整體的良率。因此,熱壓合的方式常囿限於技術的問題。The methods commonly used for processing on ceramic substrates are nothing more than: hot pressing or high temperature co-firing. However, if a metal material is formed on a ceramic substrate by thermocompression bonding, if the metal material is too thick, the joint surface is oxidized and the overall thermal resistance is increased. If the metal material is too thin, the metal material is made thin. Easy to peel or crack, reducing overall yield. Therefore, the way of thermocompression is often limited to technical problems.
另一方面,高溫共燒的方式,則是受限於須使用高熔點的金屬材質,例如鎢、錳等金屬,此類金屬不但提高了整體的電路電阻,且成品的性能亦不佳。另外,利用高溫共燒的方式更提高了整體製程的成本。雖近年亦改良成低溫共燒的方式加工陶瓷基板,但步驟依然繁複,亦無法有效的大幅降低成本。On the other hand, the method of co-firing at a high temperature is limited by the use of a metal material having a high melting point, such as a metal such as tungsten or manganese, which not only improves the overall circuit resistance, but also has poor performance of the finished product. In addition, the use of high temperature co-firing improves the cost of the overall process. Although the ceramic substrate has been processed in a low-temperature co-firing process in recent years, the steps are still complicated, and the cost cannot be effectively reduced.
有鑑於此,本發明提供一種可改善上述缺點的陶瓷基板的加工方法,以解決此業界亟待解決的問題。In view of the above, the present invention provides a method for processing a ceramic substrate which can improve the above disadvantages, so as to solve the problems to be solved in the industry.
本發明之一目的在於提供一種陶瓷基板的加工方法,其可使加工後的陶瓷基板的表面易於被一電路結構牢固貼附於其上。SUMMARY OF THE INVENTION An object of the present invention is to provide a method of processing a ceramic substrate which can easily attach a surface of a processed ceramic substrate to a circuit structure.
本發明的又一目的在於提供一種較低成本的陶瓷基板的加工方法。It is still another object of the present invention to provide a method of processing a lower cost ceramic substrate.
為了達到上述目的,本發明之加工方法至少包含以下步驟,首先 浸泡一陶瓷基板於一化學溶液之中,使得該陶瓷基板的一表面被該化學溶液蝕刻,且該化學溶液可為一複合酸,當該化學溶液將陶瓷基板表面蝕刻至適當可作為後續一電路結構貼覆或製成的程度,即取出該陶瓷基板,並且將殘留在該陶瓷基板上的該化學溶液清除。該陶瓷基板浸泡於該化學溶液的時間實質為兩分鐘,且操作溫度為室溫。In order to achieve the above object, the processing method of the present invention comprises at least the steps of first immersing a ceramic substrate in a chemical solution such that a surface of the ceramic substrate is etched by the chemical solution, and the chemical solution can be a complex acid. When the chemical solution etches the surface of the ceramic substrate to the extent that it can be attached or fabricated as a subsequent circuit structure, the ceramic substrate is taken out and the chemical solution remaining on the ceramic substrate is removed. The time during which the ceramic substrate is immersed in the chemical solution is substantially two minutes, and the operating temperature is room temperature.
為了讓上述的目的、技術特徵和優點能夠更為本領域之人士所知悉並應用,下文係以本發明之數個較佳實施例以及附圖進行詳細的說明。The above objects, technical features and advantages will be apparent to those skilled in the art, and the following detailed description of the preferred embodiments of the invention.
本發明為一種在陶瓷基板的加工方法,其中第1圖顯示本發明的加工方法的第一較佳實施例,也是本發明的加工方法的基本架構,而第2圖、第3圖、第5圖及第7圖則顯示根基於第1圖所示的基本架構所衍伸的其他可能實施態樣。The present invention is a method for processing a ceramic substrate, wherein FIG. 1 shows a first preferred embodiment of the processing method of the present invention, and is also a basic structure of the processing method of the present invention, and FIG. 2, FIG. 3, and FIG. The figure and Figure 7 show other possible implementations based on the basic architecture shown in Figure 1.
請先參考第1圖,該陶瓷基板的加工方法可包含四步驟,步驟S1,浸泡一陶瓷基板於一化學溶液之中,使得該陶瓷基板的一表面會與該化學溶液產生化學反應,並被該化學溶液蝕刻。在本實施例中,此化學溶液可為一濃度百分之百的複合酸。Referring to FIG. 1 , the method for processing the ceramic substrate may include four steps. In step S1, a ceramic substrate is immersed in a chemical solution, so that a surface of the ceramic substrate chemically reacts with the chemical solution and is The chemical solution is etched. In this embodiment, the chemical solution can be a concentration of one hundred percent complex acid.
當該陶瓷基板表面被蝕刻至適當可作為後續一電路結構貼覆或製成的程度後,即進入步驟S2,取出該陶瓷基板並清洗殘留在該表面之化學溶液。在本實施例施行時,較佳的陶瓷基板浸泡於化學溶液的時間實質的為兩分鐘,且可容許的修正時間為正負十秒鐘,而整體操作溫度為室溫(例如24、25度左右)。When the surface of the ceramic substrate is etched to the extent that it can be attached or fabricated as a subsequent circuit structure, the process proceeds to step S2, the ceramic substrate is taken out and the chemical solution remaining on the surface is washed. In the embodiment, the preferred ceramic substrate is immersed in the chemical solution for a period of two minutes, and the allowable correction time is plus or minus ten seconds, and the overall operating temperature is room temperature (for example, about 24 or 25 degrees). ).
蝕刻後的陶瓷基板的表面可有一較佳的粗糙度,以使之後形成於該表面上的電路結構可較牢固地貼附於該表面上。The surface of the etched ceramic substrate may have a preferred roughness such that the circuit structure formed on the surface thereafter can be more firmly attached to the surface.
為了使後續的電路結構可更加的牢靠貼附於該陶瓷基板之該表面上(至少在加熱至400度,電路結構依然不會剝落),步驟S3為活化該陶瓷基板的該表面,活化的方式可利用含有鈀金屬的一催化劑,活化該陶瓷基板的表面,並增加後續電路基板可貼附的表面積。最後,步驟S4形成一電路結構於活化後的該陶瓷基板之該表面上。In order to make the subsequent circuit structure more firmly attached to the surface of the ceramic substrate (at least when heated to 400 degrees, the circuit structure still does not peel off), step S3 is to activate the surface of the ceramic substrate, the way of activation A catalyst containing palladium metal can be used to activate the surface of the ceramic substrate and increase the surface area to which the subsequent circuit substrate can be attached. Finally, step S4 forms a circuit structure on the surface of the activated ceramic substrate.
須說明的是,為了精簡流程以及使一般通常知識之人易於理解本發明的核心技術內容,在步驟間去除殘留的溶劑或是作為提升整體良率的基本步驟,諸如水洗、打磨、烘乾等等,亦不贅述於本說明書之中。It should be noted that in order to streamline the process and make the general technical knowledge easy to understand the core technical content of the present invention, the residual solvent is removed between steps or as a basic step to improve the overall yield, such as washing, polishing, drying, etc. Etc., and are not described in this specification.
接著請參考第2圖,為本發明的陶瓷基板之加工方法的第二較佳實施方式的流程圖,其中步驟S1至步驟S3與前述相似,因此不再此贅述。而第二實施例的加工方法的電路結構形成步驟(S4)係使用正片製程的方式來為之。Next, please refer to FIG. 2, which is a flowchart of a second preferred embodiment of the method for processing a ceramic substrate of the present invention, wherein steps S1 to S3 are similar to the foregoing, and thus are not described again. The circuit structure forming step (S4) of the processing method of the second embodiment is performed by using a positive film process.
詳言之,在使用正片製程的加工方式中,形成一電路結構的步驟S4可進一步包含步驟S411至步驟415。步驟S411為在一活化後的該陶瓷基板之該表面上形成一銅層。該銅層可進一步包含了第一銅層與第二銅層,先利用化學方式(例如無電電鍍,electroless plating)形成一第一銅層於活化後的該陶瓷基板之該表面上,接著利用電鍍的方式形成一第二銅層於該第一銅層上。In detail, in the processing method using the positive film process, the step S4 of forming a circuit structure may further include steps S411 to 415. Step S411 is to form a copper layer on the surface of the activated ceramic substrate. The copper layer may further include a first copper layer and a second copper layer. First, a first copper layer is formed on the surface of the activated ceramic substrate by chemical means (for example, electroless plating), followed by electroplating. The method forms a second copper layer on the first copper layer.
接著,步驟S412,形成一錫層於該銅層上後,再形成一圖案化光阻層於該錫層上(步驟S413),形成圖案化光阻層的方法可為網印、光罩或是濕膜塗佈的方法。曝光顯影後,進入步驟S414,移除未被該圖案化光阻層覆蓋之該銅層及該錫層。Next, in step S412, a tin layer is formed on the copper layer, and then a patterned photoresist layer is formed on the tin layer (step S413). The method for forming the patterned photoresist layer may be screen printing, a photomask or It is a method of wet film coating. After the exposure and development, the process proceeds to step S414 to remove the copper layer and the tin layer not covered by the patterned photoresist layer.
請參閱第4圖所示,其為第二實施例或第三實施例的加工方法所製成的陶瓷基板的結構示意圖。該電路結構2分別依序包含由步驟S411及步驟S412所形成的第一銅層21、第二銅層22及錫層23,其中,錫層23更具有保護及避免第一銅層21和第二銅層22氧化之功用。Referring to FIG. 4, it is a schematic structural view of a ceramic substrate produced by the processing method of the second embodiment or the third embodiment. The circuit structure 2 includes the first copper layer 21, the second copper layer 22 and the tin layer 23 formed by the steps S411 and S412, respectively, wherein the tin layer 23 further protects and avoids the first copper layer 21 and The function of the oxidation of the two copper layers 22 is.
接著請參考第3圖,為本發明的陶瓷基板之加工方法的第三較佳實施方式的流程圖。相較於第2圖所示的加工方法,而第三實施例的加工方法的電路結構形成步驟(S4)係使用負片製程的方式來為之,而使用負片製程產生的電路結構也會如第4圖所繪製。Next, please refer to FIG. 3, which is a flow chart of a third preferred embodiment of the method for processing a ceramic substrate of the present invention. Compared with the processing method shown in FIG. 2, the circuit structure forming step (S4) of the processing method of the third embodiment is performed by using a negative chip process, and the circuit structure generated by using the negative chip process is also the same. 4 is drawn.
詳細而言,第三實施例的電路結構形成步驟(S4)包含:步驟421,形成一第一銅層於活化後的該陶瓷基板之該表面上。接著,步驟422,在該第一銅層上再形成一圖案化光阻層。接著,依序形成一第二銅層及一錫層於未被該圖案化光阻層覆蓋之該第一銅層上(步驟423)。並在步驟424中移除於步驟422中形成的圖案化光阻層。接著再移除未被該第二銅層及該錫層覆蓋的該第一銅層。其各層間的工法已前面述明,因此不再贅述。In detail, the circuit structure forming step (S4) of the third embodiment includes: step 421, forming a first copper layer on the surface of the activated ceramic substrate. Next, in step 422, a patterned photoresist layer is further formed on the first copper layer. Then, a second copper layer and a tin layer are sequentially formed on the first copper layer not covered by the patterned photoresist layer (step 423). The patterned photoresist layer formed in step 422 is removed in step 424. The first copper layer not covered by the second copper layer and the tin layer is then removed. The method of construction between the various layers has been described above, so it will not be described again.
接著請參考第5圖,為本發明的陶瓷基板之加工方法的第四較佳實施方式的流程圖。第四實施例的加工方法與前述幾種方法不同的點在於,步驟S4形成一電路結構於陶瓷基板之前並不需要如第1至3圖所示的步驟S3來活化該陶瓷基板的該表面。Next, please refer to FIG. 5, which is a flow chart of a fourth preferred embodiment of the method for processing a ceramic substrate of the present invention. The processing method of the fourth embodiment is different from the foregoing several methods in that step S4 does not require step S3 as shown in FIGS. 1 to 3 to activate the surface of the ceramic substrate before forming a circuit structure in the ceramic substrate.
詳言之,清洗該陶瓷基板後,直接於陶瓷基板表面塗佈一銀膏(步驟S431)。接著,步驟S432,利用燒結等方式固化該銀膏,最後再利用化學方式形成一錫層於該銀膏之上(步驟S433)。請一併參考第6圖,為第四實施例的加工方法所製成的陶瓷基板的結構示意圖。此陶瓷基板1上的電路結構2包含一銀膏24和一錫層23。In detail, after the ceramic substrate is cleaned, a silver paste is applied directly to the surface of the ceramic substrate (step S431). Next, in step S432, the silver paste is cured by sintering or the like, and finally a tin layer is chemically formed on the silver paste (step S433). Please refer to FIG. 6 together for a schematic structural view of a ceramic substrate produced by the processing method of the fourth embodiment. The circuit structure 2 on the ceramic substrate 1 includes a silver paste 24 and a tin layer 23.
請參考第7圖,為本發明的陶瓷基板之加工方法的第五較佳實施方式的流程圖。第五較實施例的加工方法與第四實施例的相似,亦不需要在陶瓷基板上先活化該表面,但第五較佳實施例的加工方法係使用燒結鉬錳合金來製作電路結構。Please refer to FIG. 7 , which is a flow chart of a fifth preferred embodiment of the method for processing a ceramic substrate of the present invention. The processing method of the fifth comparative embodiment is similar to that of the fourth embodiment, and it is not necessary to first activate the surface on the ceramic substrate, but the processing method of the fifth preferred embodiment uses a sintered molybdenum-manganese alloy to fabricate the circuit structure.
詳言之,清洗完陶瓷基板後(S2),步驟S441直接網印一鉬錳合金層形成於該表面上,並在網印後先燒結該鉬錳合金層。接著,在步驟S442,使用電鍍的方式,形成一銅層於該鉬錳合金層上。步驟S443,可使用化學或是電鍍的方式,形成一錫層於該銅層上。並在步驟S444中,將一圖案化的光阻層形成於該錫層上。曝光顯影後,於步驟S445中,移除未被該圖案化光阻層覆蓋之該銅層、該錫層及該鉬錳合金層。最後再移除該圖案化光阻層。In detail, after the ceramic substrate is cleaned (S2), a molybdenum-manganese alloy layer is directly screen-printed on the surface in step S441, and the molybdenum-manganese alloy layer is first sintered after screen printing. Next, in step S442, a copper layer is formed on the molybdenum-manganese alloy layer by electroplating. In step S443, a tin layer may be formed on the copper layer by chemical or electroplating. And in step S444, a patterned photoresist layer is formed on the tin layer. After the exposure and development, in step S445, the copper layer, the tin layer and the molybdenum-manganese alloy layer not covered by the patterned photoresist layer are removed. Finally, the patterned photoresist layer is removed.
請參考第8圖,其為第五實施例的加工方法所製成的陶瓷基板的結構示意圖。該陶瓷基板1上的電路結構2依序包含一鉬錳合金層25、一銅層21及一錫層23。Please refer to FIG. 8 , which is a schematic structural view of a ceramic substrate produced by the processing method of the fifth embodiment. The circuit structure 2 on the ceramic substrate 1 sequentially includes a molybdenum-manganese alloy layer 25, a copper layer 21, and a tin layer 23.
綜上所述,本發明為一種在陶瓷基板上的加工方法,其將陶瓷基板浸泡在化學溶液中,得到適宜一可使電路結構牢固地形成於上的表面狀態(表面粗糙度),即可取出該陶瓷基板並清洗之。本發明即可用一種較少的步驟達到在陶瓷基板上形成一電路結構的目的In summary, the present invention is a processing method on a ceramic substrate, which immerses the ceramic substrate in a chemical solution to obtain a surface state (surface roughness) suitable for the circuit structure to be firmly formed thereon. The ceramic substrate was taken out and washed. The invention can achieve the purpose of forming a circuit structure on a ceramic substrate in a lesser step.
上述之實施例僅用來例舉本發明之實施態樣,以及闡釋本發明之技術特徵,並非用來限制本發明之保護範疇。任何熟悉此技術者可輕易完成之改變或均等性之安排均屬於本發明所主張之範圍,本發明之權利保護範圍應以申請專利範圍為準。The embodiments described above are only intended to illustrate the embodiments of the present invention, and to explain the technical features of the present invention, and are not intended to limit the scope of protection of the present invention. Any changes or equivalents that can be easily made by those skilled in the art are within the scope of the invention. The scope of the invention should be determined by the scope of the claims.
1...陶瓷基板1. . . Ceramic substrate
2...電路結構2. . . Circuit configuration
21...第一銅層/銅層twenty one. . . First copper layer / copper layer
22...第二銅層twenty two. . . Second copper layer
23...錫層twenty three. . . Tin layer
24...銀膏twenty four. . . Silver paste
25...鉬錳合金層25. . . Molybdenum manganese alloy layer
S1至S4...為步驟流程S1 to S4. . . Step process
第1圖為本發明之陶瓷基板的加工方法的第一較佳實施例之流程圖;1 is a flow chart of a first preferred embodiment of a method of processing a ceramic substrate of the present invention;
第2圖為本發明之陶瓷基板的加工方法的第二較佳實施例之流程圖;2 is a flow chart of a second preferred embodiment of a method for processing a ceramic substrate of the present invention;
第3圖為本發明之陶瓷基板的加工方法的第三較佳實施例之流程圖;3 is a flow chart of a third preferred embodiment of a method for processing a ceramic substrate of the present invention;
第4圖為第2或3圖所示的加工方法所製成的陶瓷基板的結構示意圖;Figure 4 is a schematic view showing the structure of a ceramic substrate produced by the processing method shown in Fig. 2 or 3;
第5圖為本發明之陶瓷基板的加工方法的第四較佳實施例之流程圖;Figure 5 is a flow chart showing a fourth preferred embodiment of the method for processing a ceramic substrate of the present invention;
第6圖為第5圖所示的加工方法所製成的陶瓷基板的結構示意圖;Figure 6 is a schematic view showing the structure of a ceramic substrate produced by the processing method shown in Figure 5;
第7圖為本發明之陶瓷基板的加工方法的第五較佳實施例之流程圖;以及Figure 7 is a flow chart showing a fifth preferred embodiment of the method for processing a ceramic substrate of the present invention;
第8圖為第7圖所示的加工方法所製成的陶瓷基板的結構示意圖。Fig. 8 is a schematic view showing the structure of a ceramic substrate produced by the processing method shown in Fig. 7.
S1至S4...為步驟流程S1 to S4. . . Step process
Claims (11)
浸泡一陶瓷基板於一化學溶液之中,使得該陶瓷基板的一表面被該化學溶液蝕刻;以及
取出該陶瓷基板,並且將殘留在該陶瓷基板上的該化學溶液清除;
其中該陶瓷基板浸泡於該化學溶液的時間實質為兩分鐘,且操作溫度為室溫。A method for processing a ceramic substrate, comprising:
Soaking a ceramic substrate in a chemical solution such that a surface of the ceramic substrate is etched by the chemical solution; and removing the ceramic substrate, and removing the chemical solution remaining on the ceramic substrate;
The time during which the ceramic substrate is immersed in the chemical solution is substantially two minutes, and the operating temperature is room temperature.
形成一銅層於活化後的該陶瓷基板之該表面上;
形成一錫層於該銅層上;
形成一圖案化光阻層於該錫層上;
移除未被該圖案化光阻層覆蓋之該銅層及該錫層;以及
移除該圖案化光阻層。The method of processing a ceramic substrate according to claim 5, wherein the step of forming the circuit structure further comprises:
Forming a copper layer on the surface of the activated ceramic substrate;
Forming a tin layer on the copper layer;
Forming a patterned photoresist layer on the tin layer;
Removing the copper layer and the tin layer not covered by the patterned photoresist layer; and removing the patterned photoresist layer.
利用化學方式形成一第一銅層於活化後的該陶瓷基板之該表面上;以及
利用電鍍的方式形成一第二銅層於該第一銅層上。The method of processing a ceramic substrate according to claim 6, wherein the step of forming the copper layer further comprises:
Forming a first copper layer on the surface of the activated ceramic substrate by chemical means; and forming a second copper layer on the first copper layer by electroplating.
形成一第一銅層於活化後的該陶瓷基板之該表面上;
形成一圖案化光阻層於該第一銅層上;
依序形成一第二銅層及一錫層於未被該圖案化光阻層覆蓋之該第一銅層上;
移除該圖案化光阻層;以及
移除未被該第二銅層及該錫層覆蓋的該第一銅層。The method of processing a ceramic substrate according to claim 5, wherein the step of forming the circuit structure further comprises:
Forming a first copper layer on the surface of the activated ceramic substrate;
Forming a patterned photoresist layer on the first copper layer;
Forming a second copper layer and a tin layer on the first copper layer not covered by the patterned photoresist layer;
Removing the patterned photoresist layer; and removing the first copper layer not covered by the second copper layer and the tin layer.
塗佈一銀膏於該陶瓷基板之該表面上;
固化該銀膏;以及
形成一錫層於固化後的該銀膏上。The method of processing a ceramic substrate according to claim 9, wherein the step of forming the circuit structure further comprises:
Coating a silver paste on the surface of the ceramic substrate;
The silver paste is cured; and a tin layer is formed on the cured silver paste.
形成一鉬錳合金層於該陶瓷基板之該表面上;
形成一銅層於該鉬錳合金層上;
形成一錫層於該銅層上;
形成一圖案化光阻層於該錫層上;
移除未被該圖案化光阻層覆蓋之該銅層、該錫層及該鉬錳合金層;以及
移除該圖案化光阻層。The method of processing a ceramic substrate according to claim 9, wherein the step of forming the circuit structure further comprises:
Forming a molybdenum-manganese alloy layer on the surface of the ceramic substrate;
Forming a copper layer on the molybdenum-manganese alloy layer;
Forming a tin layer on the copper layer;
Forming a patterned photoresist layer on the tin layer;
Removing the copper layer, the tin layer, and the molybdenum-manganese alloy layer that are not covered by the patterned photoresist layer; and removing the patterned photoresist layer.
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| CN2011103310612A CN103030439A (en) | 2011-10-05 | 2011-10-27 | Method for processing ceramic substrate |
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| TW100136007A TW201316461A (en) | 2011-10-05 | 2011-10-05 | Method for fabricating a ceramic substrate |
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| WO2017187930A1 (en) * | 2016-04-26 | 2017-11-02 | 株式会社村田製作所 | Method for producing ceramic electronic component |
| CN108511349B (en) * | 2018-03-27 | 2020-03-27 | 北京大学东莞光电研究院 | Metallization method of ceramic substrate |
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| EP2217043B1 (en) * | 2007-11-06 | 2019-01-30 | Mitsubishi Materials Corporation | Method for producing a substrate for power module |
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