TW201314163A - Thermal interface material and processing method thereof - Google Patents
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
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- F28F13/00—Arrangements for modifying heat-transfer, e.g. increasing, decreasing
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- F28—HEAT EXCHANGE IN GENERAL
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Abstract
提供一種熱界面材料用以填充熱轉移系統中之表面之間的縫隙以在該等表面之間轉移熱量。該熱界面材料包括基材及分散於該基材內之導熱粒子。該熱界面材料經調節及/或經受減壓(例如,在置於該等表面之間的該縫隙中之前、置於該縫隙中的同時、置於該縫隙中之後等),藉此改良該熱界面材料在熱循環期間的工作可靠性及/或耐裂縫形成性。A thermal interface material is provided to fill the gap between the surfaces in the thermal transfer system to transfer heat between the surfaces. The thermal interface material includes a substrate and thermally conductive particles dispersed within the substrate. The thermal interface material is adjusted and/or subjected to reduced pressure (eg, before being placed in the gap between the surfaces, in the gap, after being placed in the gap, etc.), thereby improving the Thermal interface materials have operational reliability and/or resistance to crack formation during thermal cycling.
Description
本申請案主張2011年5月19日申請之美國專利申請案第13/111,735號之優先權。上述申請案之全部揭示內容以引用的方式併入本文中。 The present application claims priority to U.S. Patent Application Serial No. 13/111,735, filed on May 19, 2011. The entire disclosure of the above application is hereby incorporated by reference.
本揭示大體上係關於熱界面材料及其加工方法。 The present disclosure is generally directed to thermal interface materials and methods of processing the same.
本部分提供與本揭示有關之背景資訊,其未必為先前技術。 This section provides background information related to this disclosure, which is not necessarily prior art.
諸如半導體、積體電路包、電晶體等電組件典型地具有使電組件最佳工作之預設計溫度。理想地,預設計溫度近似於周圍空氣之溫度。但工作電組件產生熱量。若不移除熱量,則電組件可能會在顯著高於其正常或理想工作溫度之溫度下工作。該等過高溫度會對電組件之工作特性及相關裝置之工作產生不利影響。 Electrical components such as semiconductors, integrated circuit packages, transistors, etc. typically have pre-design temperatures that optimize the operation of the electrical components. Ideally, the pre-designed temperature approximates the temperature of the surrounding air. But the working electrical components generate heat. Without removing heat, the electrical components may operate at temperatures significantly above their normal or ideal operating temperatures. Such excessive temperatures can adversely affect the operating characteristics of the electrical components and the operation of the associated devices.
為避免或至少降低因生熱引起之不利工作特性,應移除熱量,例如藉由將熱量自工作電組件傳導至散熱片。散熱片接著可藉由習知對流及/或輻射技術來冷卻。在傳導期間,熱量可藉由電組件與散熱片之間的直接表面接觸及/或藉由電組件與散熱片表面經由中間介質或熱界面材料接觸,而自工作電組件傳遞至散熱片。熱界面材料可用於填充熱轉移表面之間的縫隙,以便與以作為相對不良導熱體之空氣填充縫隙相比,增加熱轉移效率。 To avoid or at least reduce adverse operating characteristics due to heat generation, heat should be removed, such as by transferring heat from the working electrical component to the heat sink. The heat sink can then be cooled by conventional convection and/or radiation techniques. During conduction, heat may be transferred from the working electrical component to the heat sink by direct surface contact between the electrical component and the heat sink and/or by contact of the electrical component with the surface of the heat sink via the intermediate medium or thermal interface material. The thermal interface material can be used to fill the gap between the heat transfer surfaces to increase heat transfer efficiency compared to filling the gap with air as a relatively poor thermal conductor.
本部分提供本揭示大體上的摘要,而並非全面揭示其全部範圍或其全部特徵。 This section provides a general summary of the disclosure, and is not a full disclosure of the full scope or all of its features.
本文中揭示關於加工熱界面材料以便當熱界面材料與熱轉移系統一起使用(例如,在系統之熱轉移表面之間轉移熱量等)時在熱循環期間改良其工作可靠性、改良其耐裂縫形成性等的系統及方法的實施例具體實例。亦揭示已根據本揭示加工之熱界面材料之實施例具體實例,包括已經調節及/或經受減壓之熱界面材料。 It is disclosed herein to process thermal interface materials to improve their operational reliability and improve crack formation during thermal cycling when the thermal interface material is used with a thermal transfer system (eg, transferring heat between the heat transfer surfaces of the system, etc.) Specific examples of embodiments of systems and methods of sexuality and the like. Specific examples of embodiments of thermal interface materials that have been processed in accordance with the present disclosure are also disclosed, including thermal interface materials that have been adjusted and/or subjected to reduced pressure.
例示性具體實例揭示適合用以填充至少兩個表面之間的縫隙以在該至少兩個表面之間轉移熱量的熱界面材料。在一例示性具體實例中,熱界面材料一般包括基材及分散於基材內之導熱粒子。熱界面材料可經調節及/或經受減壓,藉此改良熱界面材料在熱循環期間之工作可靠性及/或耐裂縫形成性。 An illustrative embodiment discloses a thermal interface material suitable for filling a gap between at least two surfaces to transfer heat between the at least two surfaces. In an exemplary embodiment, the thermal interface material generally comprises a substrate and thermally conductive particles dispersed within the substrate. The thermal interface material can be adjusted and/or subjected to reduced pressure, thereby improving the operational reliability and/or crack formation resistance of the thermal interface material during thermal cycling.
本揭示之實施例具體實例亦大體上係關於加工熱界面材料以改良熱界面材料用以在至少兩個熱轉移表面之間轉移熱量時之工作可靠性的方法。在一個實施例具體實例中,方法一般包括藉由使熱界面材料經受減壓調節熱界面材料。 Embodiments of the disclosed embodiments are also generally directed to methods of processing thermal interface materials to improve the operational reliability of thermal interface materials for transferring heat between at least two thermal transfer surfaces. In one embodiment, the method generally includes adjusting the thermal interface material by subjecting the thermal interface material to reduced pressure.
以下描述本質上僅為實施例,且決不意欲限制本揭示、應用或用途。 The following description is merely an embodiment in nature and is not intended to limit the disclosure, application, or use.
熱界面材料可用於填充熱轉移系統中之熱轉移表面之 間的縫隙(例如,生熱組件(例如電子裝置、熱水裝置等)之表面及散熱組件(例如散熱片等)之表面等之間)以增加表面之間的熱轉移效率,與具有以空氣填充之縫隙相比,其為相對不良導熱體。熱界面材料一般包括基材(例如聚矽氧基基材等)及分散於(例如,提供、位於等)基材內之導熱粒子(例如陶瓷粒子等)。導熱油灰、導熱潤滑脂及熱縫隙襯墊為可用於填充熱轉移表面之間的該等縫隙的熱界面材料實例類型。 Thermal interface materials can be used to fill the thermal transfer surface in a thermal transfer system Between the gaps (for example, between the surface of the heat generating component (such as an electronic device, a hot water device, etc.) and the surface of the heat dissipating component (such as a heat sink, etc.), etc.) to increase the heat transfer efficiency between the surfaces, and to have air Compared to the gap of the filling, it is a relatively poor thermal conductor. The thermal interface material generally comprises a substrate (eg, a polyoxyl substrate, etc.) and thermally conductive particles (eg, ceramic particles, etc.) dispersed within (eg, provided, positioned, etc.) the substrate. Thermally conductive putty, thermally conductive grease, and thermal gap liners are examples of thermal interface materials that can be used to fill such gaps between thermally transfer surfaces.
正如本文中本發明之發明者認識到的,當熱界面材料經受上述例如約65攝氏度之溫度下的熱循環時(例如當熱界面材料與循環式開啟與關閉且循環式加熱至上述約65攝氏度之溫度且接著冷卻的生熱組件結合使用時等),一些熱界面材料可能具有可靠性問題。舉例而言,在用於表面之間期間,熱界面材料中可形成裂縫,及/或熱界面材料可從熱轉移表面之間的縫隙中汲出(在熱界面材料中留下空隙)。此舉反過來可減少熱轉移表面之間的熱轉移,因為空氣填充之裂縫及/或空隙具有與熱界面材料相比較低之熱導率。 As recognized by the inventors herein, when the thermal interface material is subjected to thermal cycling as described above, for example, at a temperature of about 65 degrees Celsius (eg, when the thermal interface material is cycled on and off and circulated to about 65 degrees Celsius above) Some of the thermal interface materials may have reliability issues when the temperature and then the cooled heat generating components are used in combination. For example, cracks may be formed in the thermal interface material during use between the surfaces, and/or the thermal interface material may be scooped out of the gap between the thermal transfer surfaces (leaving voids in the thermal interface material). This in turn reduces heat transfer between the heat transfer surfaces because the air filled cracks and/or voids have a lower thermal conductivity than the thermal interface material.
作為一實施例,本發明之發明者在本文中已認識到當用於經歷該等溫度循環變化之應用中時(例如,當用以填充熱轉移表面之間的縫隙時等),熱界面材料中時常形成裂縫。在不受理論限制的情況下,本文中本發明之發明者假定該等裂縫係由熱界面材料內夾帶之氣體(例如空氣等)移動而造成。熱界面材料中之溫度變化引起夾帶氣體(連 同熱界面材料之實際基質一起)膨脹與收縮且因此在熱界面材料內移動。隨時間推移,氣體遷移及彙集,且在熱界面材料內在形成裂縫(或裂隙)處形成(例如由於內應力等)弱點。 As an embodiment, the inventors of the present invention have recognized herein that when used in applications undergoing such temperature cycling changes (eg, when used to fill gaps between heat transfer surfaces, etc.), thermal interface materials Cracks often form in the middle. Without being bound by theory, the inventors of the present invention herein assume that the cracks are caused by movement of gases (e.g., air, etc.) entrained within the thermal interface material. Temperature changes in the thermal interface material cause entrained gas (continuous Together with the actual matrix of the thermal interface material, it expands and contracts and thus moves within the thermal interface material. Over time, gases migrate and collect, and weak points are formed (eg, due to internal stress, etc.) at the formation of cracks (or cracks) within the thermal interface material.
本發明之發明者在本文中已出乎意料地發現在儲存、運送、使用等之前,使熱界面材料經受特定時間範圍內之減壓調節(例如,自熱界面材料移除夾帶氣體、減少熱界面材料中之夾帶氣體量等),可有助於改良熱界面材料之工作可靠性(例如熱轉移表面之間熱轉移之相容性等)(與不經類似調節之相同熱界面材料相比)。該調節可例如在將熱界面材料安裝於熱轉移系統中之前、同時或之後(例如在將熱界面材料安置於熱轉移系統中之熱轉移表面之間的縫隙中之前、同時或之後等),或甚至在使用熱界面材料在熱轉移系統之熱轉移表面之間轉移熱量之前或同時進行。 The inventors of the present invention have unexpectedly discovered herein that the thermal interface material is subjected to reduced pressure conditioning over a specified time period prior to storage, shipping, use, etc. (e.g., removal of entrained gas from the thermal interface material, reduction of heat). The amount of entrained gas in the interface material, etc., can help to improve the operational reliability of the thermal interface material (eg, the thermal transfer compatibility between the heat transfer surfaces, etc.) (compared to the same thermal interface material not similarly adjusted) ). The adjustment may be, for example, before, simultaneously or after mounting the thermal interface material in the thermal transfer system (eg, before, during or after the placement of the thermal interface material between the thermal transfer surfaces in the thermal transfer system, etc.), Or even before using heat interface materials to transfer heat between the heat transfer surfaces of the heat transfer system.
舉例而言,本文中本發明之發明者已發現,當在經歷溫度循環變化之應用中用以在熱轉移表面之間轉移熱量時,使熱界面材料(例如熱界面材料之散裝供應品等)經受減壓調節實質上減少熱界面材料中之裂縫形成(例如,藉由改良熱界面材料對熱循環期間裂縫形成之抗性等)(因此,如先前所述改良熱界面材料之工作可靠性)。特定而言,本文中本發明之發明者已發現在使熱界面材料經受減壓調節之後約48小時或小於48小時之內(例如,約24小時或小於24小時之內、約12小時或小於之內、約8小時 或小於8小時之內等)使用熱界面材料(例如在熱轉移表面之間轉移熱量等)實質上減少在熱界面材料之該使用期間熱界面材料中之裂縫形成。本文中本發明之發明者亦已發現在使熱界面材料經受減壓調節之後,在抑制熱界面材料與周圍氣體接觸之條件下(例如,在密封容器中、在減壓下等)進一步儲存經調節熱界面材料(例如,單獨、已塗覆於熱轉移表面等),且接著後來使用經儲存熱界面材料(例如,在熱轉移表面之間轉移熱量等),亦實質上減少當暴露於該使用期間之溫度循環變化時熱界面材料中之裂縫形成。 For example, the inventors herein have discovered that when used to transfer heat between heat transfer surfaces in applications undergoing temperature cycling, thermal interface materials (eg, bulk supplies of thermal interface materials, etc.) Subjecting to reduced pressure regulation substantially reduces crack formation in the thermal interface material (eg, by improving the resistance of the thermal interface material to crack formation during thermal cycling, etc.) (thus, improving the operational reliability of the thermal interface material as previously described) . In particular, the inventors herein have found that within about 48 hours or less than 48 hours or less (e.g., within about 24 hours or less, about 12 hours or less) after subjecting the thermal interface material to reduced pressure conditioning. Within 8 hours Using or less than 8 hours) the use of thermal interface materials (e.g., transferring heat between the heat transfer surfaces, etc.) substantially reduces crack formation in the thermal interface material during use of the thermal interface material. The inventors herein have also discovered that after subjecting the thermal interface material to a reduced pressure adjustment, further storage is carried out under conditions that inhibit contact of the thermal interface material with the surrounding gas (eg, in a sealed container, under reduced pressure, etc.) Adjusting the thermal interface material (eg, alone, applied to the heat transfer surface, etc.), and then using the stored thermal interface material (eg, transferring heat between the heat transfer surfaces, etc.), also substantially reducing exposure to the Crack formation in the thermal interface material during temperature cycling during use.
此外,本文中本發明之發明者已發現與使熱界面材料經受減壓調節有關之該等益處(例如,減少裂縫形成、改良工作可靠性等)隨時間可逆,且如本文中所描述若在使用(例如,在熱轉移表面之間轉移熱量等)或儲存之前經調節熱界面材料隨後暴露於周圍氣體達一段時間(例如,達約8小時或大於8小時等)可事實上消失。但本文中本發明之發明者已發現可藉由在使用熱界面材料之前隨後使熱界面材料經受特定時間範圍內之減壓調節再達成該等益處。就此而論,本文中本發明之發明者已發現用於減壓調節熱界面材料之工作可反覆應用於熱界面材料以無限地維持該等益處。該等再調節可例如在將熱界面材料安裝於熱轉移系統中之前、同時或在之後/或甚至在使用熱界面材料在熱轉移系統之熱轉移表面之間轉移熱量的同時進行。 Moreover, the inventors of the present invention herein have discovered that such benefits (eg, reducing crack formation, improving operational reliability, etc.) associated with subjecting the thermal interface material to reduced pressure regulation are reversible over time, and as described herein. The subsequent exposure of the thermal interface material to the surrounding gas for a period of time (eg, up to about 8 hours or greater than 8 hours, etc.) may actually disappear after use (eg, transferring heat between the heat transfer surfaces, etc.) or prior to storage. However, the inventors herein have discovered that such benefits can be achieved by subsequently subjecting the thermal interface material to reduced pressure regulation over a particular time frame prior to use of the thermal interface material. In this connection, the inventors herein have discovered that the work for depressurizing the thermal interface material can be applied over the thermal interface material to maintain these benefits indefinitely. Such reconditioning can be performed, for example, prior to, simultaneously with, or after/or even after the thermal interface material is installed in the thermal transfer system, using heat interface material to transfer heat between the heat transfer surfaces of the thermal transfer system.
因此,本揭示之實施例具體實例係關於在使用(例如, 用以在熱轉移表面之間轉移熱量等)之特定時間範圍內經受減壓調節的熱界面材料(例如,熱界面材料之散裝供應品等),以及使熱界面材料經受減壓調節之方法及使熱界面材料經受減壓調節之系統(例如為使用作準備等)。舉例而言,一些實施例具體實例包括藉由使熱界面材料(例如單獨、已塗覆於熱轉移表面等)經受減壓調節熱界面材料且接著使用熱界面材料例如在熱轉移系統中之熱轉移表面之間轉移熱量等。該調節可例如在將熱界面材料安裝於熱轉移系統中之前、同時或之後(例如,在將熱界面材料安置於熱轉移表面之間的縫隙中之前、同時或之後等),或甚至在使用熱界面材料轉移熱轉移系統之熱轉移表面之間的熱量之前或同時進行。一些實施例具體實例另外包括將經調節熱界面材料(例如,單獨、已塗覆於熱轉移表面等)封裝於抑制熱界面材料與周圍氣體接觸之條件下之容器(例如密封容器等)中,且按需要維持熱界面材料在該等條件下之容器中(例如,直至熱界面材料被使用、在儲存熱界面材料期間、在運輸熱界面材料期間等),以從而改良熱界面材料在開封及由最終用戶使用時之工作可靠性。 Thus, specific examples of embodiments of the present disclosure are related to use (eg, a thermal interface material (eg, a bulk supply of thermal interface material, etc.) that undergoes reduced pressure regulation over a specified time range for transferring heat between the heat transfer surfaces, and the like, and a method of subjecting the thermal interface material to reduced pressure regulation and A system that subjects the thermal interface material to reduced pressure regulation (eg, for use, etc.). For example, some embodiment specific examples include subjecting a thermal interface material (eg, applied separately to a heat transfer surface, etc.) to a reduced pressure conditioning thermal interface material and then using a thermal interface material such as heat in a thermal transfer system Transfer heat between transfer surfaces, etc. The adjustment may be, for example, before, simultaneously or after mounting the thermal interface material in the thermal transfer system (eg, before, during or after placing the thermal interface material in the gap between the thermal transfer surfaces), or even after use The thermal interface material transfers heat between the heat transfer surfaces of the heat transfer system before or at the same time. Some embodiments specific examples further include encapsulating the conditioned thermal interface material (eg, separately, applied to a heat transfer surface, etc.) in a container (eg, a sealed container, etc.) that inhibits contact of the thermal interface material with ambient gases, And maintaining the thermal interface material in the container under such conditions as needed (eg, until the thermal interface material is used, during storage of the thermal interface material, during transport of the thermal interface material, etc.) to thereby improve the thermal interface material during unsealing and The reliability of the work when used by the end user.
現將參考隨附圖式更充分地描述實施例具體實例。 Embodiment embodiments will now be described more fully with reference to the accompanying drawings.
圖1說明用於根據本揭示加工熱界面材料(例如熱界面材料之散裝供應品等)之實施例方法100的流程圖。例如在用以在經歷溫度循環變化之熱轉移裝置中之組件的熱轉移表面之間轉移熱量時,該加工可有助於抑制裂縫形成 及/或有助於改良熱界面材料之工作可靠性。實施例方法100係與安裝熱界面材料於熱轉移系統中之前加工熱界面材料結合描述。然而,應瞭解實施例方法100亦適用於在熱界面材料安裝至熱轉移系統中的同時加工熱界面材料,以及在熱界面材料已安裝於熱轉移系統之後加工熱界面材料。 1 illustrates a flow diagram of an embodiment method 100 for processing a thermal interface material (e.g., a bulk supply of thermal interface material, etc.) in accordance with the present disclosure. This processing can help to inhibit crack formation, for example, when transferring heat between heat transfer surfaces of components in a heat transfer device undergoing temperature cycling. And/or contribute to improving the operational reliability of the thermal interface material. The embodiment method 100 is described in connection with the processing of the thermal interface material prior to installation of the thermal interface material in the thermal transfer system. However, it should be appreciated that the embodiment method 100 is also applicable to processing the thermal interface material while the thermal interface material is installed into the thermal transfer system, and processing the thermal interface material after the thermal interface material has been installed in the thermal transfer system.
所說明之方法100一般包括例如在將熱界面材料用於熱轉移系統中之前藉由使熱界面材料經受減壓來調節熱界面材料之工作102,及抑制周圍氣體接觸經調節熱界面材料之工作104。方法100可應用於任何尺寸及/或數量之熱界面材料(例如,散裝數量之熱界面材料等)。 The illustrated method 100 generally includes, for example, adjusting the operation of the thermal interface material by subjecting the thermal interface material to reduced pressure prior to use of the thermal interface material in a thermal transfer system, and inhibiting ambient gas from contacting the conditioned thermal interface material. 104. The method 100 can be applied to any size and/or number of thermal interface materials (eg, bulk quantities of thermal interface materials, etc.).
在實施例方法100中,調節熱界面材料之工作102一般包括安置熱界面材料於調節系統中(例如,調節系統之容器部分內等)及減小熱界面材料周圍之壓力,以例如從而自熱界面材料移除夾帶氣體等。調節系統經組態以保持熱界面材料呈大體上密封狀態。此舉使得在熱界面材料周圍之調節系統內達成所需減壓(且接著隨後按需要維持)。調節系統可包括屬於本揭示範圍內之真空室、可氣密密封桶(例如五加侖桶等)、可密封袋(例如塑膠熱封袋等)、至少一個或大於一個分配筒、至少一個或大於一個可密封管、任何適合可密封封裝或容器、圖2中說明之調節系統220、四十加侖混合器等。在其他實施例具體實例中,調節熱界面材料之工作102可包括至少一個或大於一個例如用於自熱界面材料移除夾帶氣體等之其他適合工作。 In the embodiment method 100, the operation 102 of conditioning the thermal interface material generally includes disposing a thermal interface material in the conditioning system (eg, within the container portion of the conditioning system, etc.) and reducing the pressure around the thermal interface material to, for example, self-heat The interface material removes entrained gases and the like. The conditioning system is configured to maintain the thermal interface material in a substantially sealed state. This allows the desired decompression to be achieved within the conditioning system around the thermal interface material (and then subsequently maintained as needed). The conditioning system can include a vacuum chamber within the scope of the present disclosure, a hermetically sealable bucket (eg, a five gallon bucket, etc.), a sealable bag (eg, a plastic heat seal bag, etc.), at least one or more than one dispensing cartridge, at least one or greater than A sealable tube, any suitable sealable package or container, the conditioning system 220 illustrated in Figure 2, a forty gallon mixer, and the like. In other embodiment embodiments, the work 102 of conditioning the thermal interface material may include at least one or more than one other suitable operation, such as for removing entrained gas from the self-heating interface material.
正如剛才所述,減小熱界面材料周圍之壓力可包括使 用適合工作(例如,吸入工作、真空工作、其他密封工作等)自熱界面材料周圍之調節系統內部移除氣體(例如空氣等)。此舉在調節系統中造成熱界面材料周圍之低壓環境(例如中等真空等),其中熱界面材料周圍之壓力小於調節系統外部之周圍壓力(例如周圍空氣壓力等)。舉例而言,熱界面材料周圍之所得壓力可在約1.0%完全真空(約29.5絕對汞柱吋數(inHg abs)、約14.5每平方吋絕對磅數(psia)、約100絕對千帕(kPa abs)或約750托)與約99.999%完全真空(約0.0004 inHg abs、約0.0002 psia、約0.001 kPa abs或約0.01托)之間。 As just described, reducing the pressure around the thermal interface material can include Gas (eg, air, etc.) is removed from the interior of the conditioning system that is suitable for operation (eg, suction work, vacuum work, other sealing operations, etc.) from the self-heating interface material. This causes a low pressure environment (e.g., medium vacuum, etc.) around the thermal interface material in the conditioning system, wherein the pressure around the thermal interface material is less than the ambient pressure outside the conditioning system (e.g., ambient air pressure, etc.). For example, the resulting pressure around the thermal interface material can be at about 1.0% full vacuum (about 29.5 absolute mercury ingots (inHg abs), about 14.5 per square centimeters absolute pounds (psia), about 100 absolute kilopascals (kPa). Abs) or about 750 Torr) is between about 99.999% complete vacuum (about 0.0004 inHg abs, about 0.0002 psia, about 0.001 kPa abs or about 0.01 Torr).
作為一實施例,可將閥口安裝於調節系統,且可經由閥口直接抽取真空至調節系統內部之熱界面材料周圍之減壓(例如自其移除氣體等)。可對熱界面材料施加所需時段之真空來達成調節系統內(及熱界面材料周圍)之所需壓力。所得壓力(例如,減壓、真空等)可實質上在施加真空之後在熱界面材料周圍瞬時達成。作為一實施例,可施加至少約381托(至少約15 inHg abs、至少約7.37 psia或至少約50.8 kPa abs)(錶壓)之真空至安置於調節系統中之熱界面材料達至少約5分鐘以達成所需減壓。 As an embodiment, the valve port can be mounted to the conditioning system and the vacuum can be directly extracted via the valve port to the reduced pressure around the thermal interface material within the conditioning system (eg, gas removal therefrom, etc.). A vacuum of the desired period of time can be applied to the thermal interface material to achieve the desired pressure within the conditioning system (and around the thermal interface material). The resulting pressure (eg, reduced pressure, vacuum, etc.) can be substantially instantaneously achieved around the thermal interface material after application of the vacuum. As an embodiment, a vacuum of at least about 381 Torr (at least about 15 inHg abs, at least about 7.37 psia, or at least about 50.8 kPa abs) can be applied to the thermal interface material disposed in the conditioning system for at least about 5 minutes. In order to achieve the required decompression.
或者,減小熱界面材料周圍之壓力可包括減小熱界面材料周圍調節系統內之氣體溫度同時保持熱界面材料周圍調節系統之體積大體上恆定,或增加熱界面材料周圍調節系統之體積同時保持熱界面材料周圍調節系統內之氣體溫度大體上恆定等。 Alternatively, reducing the pressure around the thermal interface material can include reducing the temperature of the gas within the conditioning system surrounding the thermal interface material while maintaining the volume of the conditioning system surrounding the thermal interface material substantially constant, or increasing the volume of the conditioning system surrounding the thermal interface material while maintaining The temperature of the gas within the conditioning system around the thermal interface material is substantially constant and the like.
作為一實施例,調節系統及其中含有之熱界面材料可經加熱且接著覆蓋以造成熱界面材料周圍之低壓環境。更特定言之,調節系統之容器部分及其中含有之熱界面材料可經加熱至任何所需溫度,且可隨後使用蓋子封閉容器部分同時仍加熱,以從而密封其中之熱界面材料。當熱界面材料冷卻時,容器部分與蓋子之間將形成輕微真空/氣密密封。應瞭解可能僅需要容器部分及/或熱界面材料之溫度稍微升高,以使得隨後封閉具有蓋子之調節系統之容器部分,且使其中之熱界面材料冷卻將造成熱界面材料周圍之輕微真空。然而,視將達成之所需真空度而定,容器部分及/或熱界面材料可加熱至屬於本揭示範圍內之任何所需溫度(例如,大於調節系統及/或調節系統內之熱界面材料周圍之周圍空氣溫度的任何溫度,及至多調節系統之容器部分的限度(例如,對於塑膠容器部分約80攝氏度等)等)。此外,視將達成之所需真空度而定,容器部分及/或熱界面材料可加熱達任何所需時間範圍(例如,達約30秒、達約24小時等)。 As an embodiment, the conditioning system and the thermal interface material contained therein can be heated and then covered to create a low pressure environment around the thermal interface material. More specifically, the container portion of the conditioning system and the thermal interface material contained therein can be heated to any desired temperature, and the container portion can then be closed using a lid while still heating to thereby seal the thermal interface material therein. When the thermal interface material cools, a slight vacuum/airtight seal will form between the container portion and the lid. It will be appreciated that it may only be necessary to have a slight increase in the temperature of the container portion and/or the thermal interface material such that the container portion of the conditioning system having the lid is subsequently closed and the thermal interface material therein is cooled to cause a slight vacuum around the thermal interface material. However, depending on the degree of vacuum desired to be achieved, the container portion and/or the thermal interface material can be heated to any desired temperature within the scope of the present disclosure (eg, greater than the thermal interface material within the conditioning system and/or conditioning system). Any temperature around the ambient air temperature, and at most the limits of the container portion of the conditioning system (eg, about 80 degrees Celsius for plastic container parts, etc.). In addition, depending on the desired degree of vacuum to be achieved, the container portion and/or the thermal interface material can be heated to any desired time range (eg, up to about 30 seconds, up to about 24 hours, etc.).
所說明之方法100之工作104(抑制周圍氣體接觸經調節熱界面材料)一般包括維持經調節熱界面材料呈大體上密封狀態。此舉使經調節之熱界面材料免於暴露於周圍氣體直至需要使用熱界面材料或轉移熱界面材料至另一容器(例如,供封裝、儲存、運輸等)。熱界面材料可隨後按需要保留在大體上密封狀態,例如直至需要使用、供儲存、供運輸至最終用戶等。當以大體上密封狀態運輸至最終用 戶時,最終用戶可開封熱界面材料(暴露熱界面材料於周圍氣體中)且按需要(例如在所需時間範圍內等)安裝熱界面材料。如先前所述,本文中本發明之發明者已出乎意料地發現,若經調節之熱界面材料在熱界面材料開封之後約48小時或小於48小時內安裝用於熱轉移系統中之組件(在工作期間經受溫度循環變化)中,熱界面材料之該調節可有助於抑制在該使用期間熱界面材料中裂縫、空隙等之形成(從而改良熱界面材料之工作可靠性)。 The illustrated operation 104 of method 100 (inhibiting ambient gas contact with the conditioned thermal interface material) generally includes maintaining the conditioned thermal interface material in a substantially sealed state. This protects the conditioned thermal interface material from exposure to ambient gases until the thermal interface material is required or the thermal interface material is transferred to another container (eg, for packaging, storage, transportation, etc.). The thermal interface material can then remain in a substantially sealed state as needed, for example until needed for storage, for storage, for transportation to an end user, and the like. When transported to the final use in a substantially sealed state At the time of the user, the end user can open the thermal interface material (exposing the thermal interface material to the surrounding gas) and install the thermal interface material as needed (eg, within the desired time range, etc.). As previously stated, the inventors herein have unexpectedly discovered that if the conditioned thermal interface material is installed for assembly in a thermal transfer system within about 48 hours or less after the thermal interface material is unsealed ( This adjustment of the thermal interface material can help to inhibit the formation of cracks, voids, etc. in the thermal interface material during the application (and thereby improve the operational reliability of the thermal interface material) during operation to undergo temperature cycling.
維持經調節之熱界面材料呈大體上密封狀態可包括在應用調節操作102之後維持經調節熱界面材料在調節系統內(例如在熱界面材料經調節之調節系統之容器部分內等)。舉例而言,熱界面材料可維持在減壓下(例如在持續真空下等)之調節系統中。或者,可停止真空,且可使用適合工作密封調節系統之用以自熱界面材料周圍移除夾帶氣體之任何開口部分(例如調節系統之容器部分之任何開口部分等),以從而抑制周圍氣體接觸經調節之熱界面材料。熱界面材料可隨後按需要保留在調節系統中(例如在調節系統之容器部分中等),例如直至需要使用、供儲存、供運輸至最終用戶、直至需要轉移熱界面材料至其他容器(例如供封裝等)等。 Maintaining the conditioned thermal interface material in a substantially sealed state can include maintaining the conditioned thermal interface material within the conditioning system after application of the conditioning operation 102 (eg, within a container portion of the thermal interface material conditioned conditioning system, etc.). For example, the thermal interface material can be maintained in a conditioning system under reduced pressure (eg, under continuous vacuum, etc.). Alternatively, the vacuum may be stopped and any open portion of the entrained gas (e.g., any open portion of the container portion of the conditioning system, etc.) suitable for use in the working seal adjustment system to self-heat the interface material may be used to thereby inhibit ambient gas contact. Adjusted thermal interface material. The thermal interface material can then be retained in the conditioning system as needed (eg, in the container portion of the conditioning system), for example until needed for storage, for storage, for transportation to the end user, until the thermal interface material needs to be transferred to other containers (eg, for packaging) and many more.
或者,維持經調節之熱界面材料呈大體上密封狀態可包括自調節系統轉移(例如供封裝等)經調節之熱界面材料至所需可密封容器(例如,氣密密封、氣密封裝等),以從而保持熱界面材料在抑制經調節之熱界面材料與周圍 氣體接觸之條件下。容器可包括屬於本揭示之範圍內的例如可氣密密封桶(例如五加侖桶等)、可密封袋(例如塑膠熱封袋等)、至少一個或大於一個分配筒、至少一個或大於一個可密封管、任何適合可密封封裝或容器等。熱界面材料可隨後按需要保留在密封容器中,例如直至需要使用、供儲存、供運輸至最終用戶等。當在密封容器中運輸至最終用戶時,最終用戶可打開密封容器(使容器中之壓力復原至周圍壓力)且按需要安裝熱界面材料。 Alternatively, maintaining the conditioned thermal interface material in a substantially sealed state can include transferring (eg, for packaging, etc.) the conditioned thermal interface material from the conditioning system to the desired sealable container (eg, hermetic seal, hermetic seal, etc.) To thereby maintain the thermal interface material in inhibiting the conditioned thermal interface material and surrounding Under the conditions of gas contact. The container may include, for example, a hermetically sealable bucket (eg, a five gallon bucket, etc.), a sealable bag (eg, a plastic heat seal bag, etc.), at least one or more than one dispensing cartridge, at least one or more than one that is within the scope of the present disclosure. Sealed tube, any suitable sealable package or container. The thermal interface material can then be retained in the sealed container as needed, for example until needed for storage, for transport to the end user, and the like. When transported to the end user in a sealed container, the end user can open the sealed container (recovering the pressure in the container to ambient pressure) and install the thermal interface material as needed.
當加工熱界面材料時,按需要至少一個或大於一個調節熱界面材料之工作102及抑制周圍氣體接觸經調節熱界面材料之工作104可重複(至少一次或大於一次)。舉例而言,如本文中所大體揭示,若經調節之熱界面材料暴露於周圍氣體但不在該暴露之後約48小時或小於48小時內使用,則在熱界面材料用於再調節熱界面材料之前可重複工作102(及可能選用之工作104),且因此改良工作可靠性。 When processing the thermal interface material, at least one or more operations 102 of conditioning the thermal interface material and the act of inhibiting ambient gas contact with the conditioned thermal interface material may be repeated (at least once or more). For example, as generally disclosed herein, if the conditioned thermal interface material is exposed to ambient gas but is not used within about 48 hours or less after the exposure, then before the thermal interface material is used to re-adjust the thermal interface material Work 102 (and possibly work 104) can be repeated, and thus operational reliability is improved.
圖2說明根據本揭示經組態以調節熱界面材料之實施例系統220。舉例而言,所說明之系統220可與方法100及至少一個或大於一個其工作102及104結合使用。特定而言,系統220經組態以接收其中之熱界面材料(例如,單獨、已安裝至熱轉移表面等)、調節熱界面材料(例如自熱界面材料移除夾帶氣體等)及隨後按需要維持熱界面材料在減壓下。 2 illustrates an embodiment system 220 configured to adjust thermal interface materials in accordance with the present disclosure. For example, the illustrated system 220 can be used in conjunction with the method 100 and at least one or more than one of its operations 102 and 104. In particular, system 220 is configured to receive thermal interface material therein (eg, separately, mounted to a thermal transfer surface, etc.), to adjust thermal interface materials (eg, to remove entrained gases from a self-heating interface material, etc.) and subsequently as needed The thermal interface material is maintained under reduced pressure.
如圖2中所示,所說明之系統220一般包括容器222 及耦合於容器222之第一及第二閥門組合224、226。容器222經組態以接收其中之熱界面材料。且第一及第二閥門組合224、226經組態以控制(結合真空源(圖中未示))氣體流入及/或流出容器222(例如,供減小容器222內之壓力及自容器222內之熱界面材料移除夾帶氣體等)。舉例而言,工作閥門組合224以調節系統220之空氣壓力。且工作閥門組合226以監測經由管線228流向容器222之空氣壓力(經由錶單元226a)及監測容器222內部之真空度(經由錶單元226b)。 As shown in FIG. 2, the illustrated system 220 generally includes a container 222. And first and second valve combinations 224, 226 coupled to the container 222. Container 222 is configured to receive a thermal interface material therein. And the first and second valve combinations 224, 226 are configured to control (in conjunction with a vacuum source (not shown)) gas flow into and/or out of the vessel 222 (eg, to reduce pressure within the vessel 222 and from the vessel 222) The inner thermal interface material removes entrained gas, etc.). For example, the valve combination 224 is operated to regulate the air pressure of the system 220. And the working valve combination 226 monitors the air pressure flowing through the line 228 to the vessel 222 (via the meter unit 226a) and monitors the vacuum inside the vessel 222 (via the meter unit 226b).
容器222包括經組態以容納其中之熱界面材料之基本部分230及經組態以蓋住基本部分230之蓋子232。墊片(不可見)可安置於蓋子232與基本部分230之間以有助於實質上密封容器222中之熱界面材料(當蓋子232蓋住基本部分230安置時)。蓋子232可藉由適合工作(例如機械扣件等)耦合於基本部分230,且可包括透明及/或半透明材料以使得可經由蓋子232觀察容器222中之熱界面材料。所說明之容器222包括大體上圓柱形形狀,但可包括屬於本揭示之範圍內的任何其他適合形狀(例如,立方形、球形等)。此外,容器222可包括任何所需尺寸(例如5加侖等)及/或可由屬於本揭示之範圍內的任何所需材料(例如,金屬材料(例如,鋼、鋁、其組合等)、塑膠材料、其組合等)形成。 The container 222 includes a base portion 230 that is configured to receive the thermal interface material therein and a cover 232 that is configured to cover the base portion 230. A gasket (not visible) can be placed between the lid 232 and the base portion 230 to help substantially seal the thermal interface material in the container 222 (when the lid 232 covers the base portion 230). The cover 232 can be coupled to the base portion 230 by suitable work (eg, mechanical fasteners, etc.) and can include a transparent and/or translucent material such that the thermal interface material in the container 222 can be viewed via the cover 232. The illustrated container 222 includes a generally cylindrical shape, but may include any other suitable shape (eg, cuboid, spherical, etc.) that falls within the scope of the present disclosure. In addition, the container 222 can comprise any desired size (eg, 5 gallons, etc.) and/or can be any desired material within the scope of the present disclosure (eg, metallic materials (eg, steel, aluminum, combinations thereof, etc.), plastic materials) , its combination, etc.) formed.
工作所說明之系統220時,熱界面材料安置於基本部分230中,且蓋子232安置於基本部分230上以實質上密 封容器222中之熱界面材料。接著工作第一及第二閥門組合224、226以在容器222中抽取真空且減小容器222中之熱界面材料周圍的壓力(例如自熱界面材料移除夾帶氣體等)。舉例而言,可工作第一及第二閥門組合224、226以在容器222中抽取至少約381托(約15 inHg abs)之真空至少約5分鐘以減小容器222中之熱界面材料周圍的壓力。在施加真空之後,經調節之熱界面材料可按需要保留於容器222中。或者,如本文中所揭示,熱界面材料可自容器222移除供使用、供後續封裝等。在其他實施例具體實例中,可在系統中抽取小於約381托(約15 inHg abs)之真空以自熱界面材料移除夾帶氣體,及/或可抽取真空小於約5分鐘。 When working with the system 220 illustrated, the thermal interface material is disposed in the base portion 230 and the cover 232 is disposed on the base portion 230 to be substantially dense. The thermal interface material in the container 222 is sealed. The first and second valve combinations 224, 226 are then operated to draw a vacuum in the vessel 222 and reduce the pressure around the thermal interface material in the vessel 222 (e.g., the entrained gas is removed from the thermal interface material, etc.). For example, the first and second valve combinations 224, 226 can be operated to draw a vacuum of at least about 381 Torr (about 15 inHg abs) in the container 222 for at least about 5 minutes to reduce the area around the thermal interface material in the container 222. pressure. After application of the vacuum, the conditioned thermal interface material can remain in the container 222 as needed. Alternatively, as disclosed herein, the thermal interface material can be removed from the container 222 for use, for subsequent packaging, and the like. In other embodiment embodiments, a vacuum of less than about 381 Torr (about 15 inHg abs) may be drawn in the system to remove entrained gas from the thermal interface material, and/or the vacuum may be drawn for less than about 5 minutes.
在本揭示之一些實施例具體實例中,適合地提供熱界面材料用以填充熱轉移系統中之熱轉移表面之間的縫隙。本文中,熱界面材料一般包括基材及分散於基材內之導熱粒子。在使用熱界面材料填充熱轉移系統中之熱轉移表面之間的縫隙之前,或在熱界面材料儲存於抑制周圍氣體接觸經調節熱界面材料的條件下之前的約八小時內,藉由使其經受減壓來調節(例如,在熱界面材料安裝於電組件中之前、同時或之後等)熱界面材料。如本文中所描述,此舉有助於改良熱界面材料在熱轉移表面之間轉移熱量的工作可靠性。在一些實施例具體實例中,熱界面材料經受小於周圍空氣壓力之減壓。且在一些實施例具體實例中,熱界面材料經受約0.01托與約750托之間的減壓。 In some embodiments of the present disclosure, a thermal interface material is suitably provided to fill the gap between the heat transfer surfaces in the heat transfer system. Herein, the thermal interface material generally includes a substrate and thermally conductive particles dispersed in the substrate. Before using the thermal interface material to fill the gap between the heat transfer surfaces in the thermal transfer system, or within about eight hours before the thermal interface material is stored in a condition that inhibits the surrounding gas from contacting the conditioned thermal interface material, The thermal interface material is subjected to reduced pressure to condition (eg, before, at the same time, or after the thermal interface material is installed in the electrical component). As described herein, this helps to improve the operational reliability of the thermal interface material to transfer heat between the heat transfer surfaces. In some embodiment embodiments, the thermal interface material is subjected to a reduced pressure that is less than ambient air pressure. And in some embodiment embodiments, the thermal interface material is subjected to a reduced pressure of between about 0.01 Torr and about 750 Torr.
在本揭示之一些實施例具體實例中,經調節之熱界面材料封裝於所需(例如供儲存、運輸等)容器內(例如,單獨、已安裝於熱轉移表面等)。容器可能夠經氣密密封,其中熱界面材料在抑制周圍氣體接觸經調節之熱界面材料的條件下封裝其中。在一些實施例具體實例中,熱界面材料在氣密密封容器中運送、儲存等。在一些實施例具體實例中,熱界面材料維持在抑制周圍氣體接觸經調節之熱界面材料的條件下至使用(例如在熱轉移表面之間轉移熱量等)之前約48小時或小於48小時。且更特定言之,熱界面材料可維持在該等條件下至使用之前約24小時或小於24小時,或甚至更特定言之至使用之前約12小時或小於12小時,或更特定言之至使用之前約8小時或小於8小時。在一些實施例具體實例中,熱界面材料可自氣密密封容器中移除,且接著隨後按需要(例如,若熱界面材料不在暴露於周圍氣體約48小時或小於48小時內使用等)再調節。 In some embodiments of the present disclosure, the conditioned thermal interface material is packaged in a desired (eg, for storage, transportation, etc.) container (eg, separately, mounted to a heat transfer surface, etc.). The container may be hermetically sealed wherein the thermal interface material is encapsulated therein while inhibiting ambient gas from contacting the conditioned thermal interface material. In some embodiment embodiments, the thermal interface material is shipped, stored, etc. in a hermetically sealed container. In some embodiment embodiments, the thermal interface material is maintained for about 48 hours or less before inhibiting ambient gas contact with the conditioned thermal interface material to use (eg, transferring heat between the heat transfer surfaces, etc.). And more specifically, the thermal interface material can be maintained under such conditions for about 24 hours or less than before use, or even more specifically about 12 hours or less before use, or more specifically until About 8 hours or less than 8 hours before use. In some embodiment embodiments, the thermal interface material can be removed from the hermetic sealed container and then subsequently as needed (eg, if the thermal interface material is not exposed to ambient gas for about 48 hours or less, etc.) Adjustment.
在一些實施例具體實例中,本揭示之熱界面材料在使用其填充熱轉移系統中之熱轉移表面之間的縫隙期間實質上無裂縫形成。舉例而言,熱界面材料在其暴露於約攝氏-20度之溫度與約攝氏160度之溫度之間等的熱循環達至少約10個循環或大於10個循環(例如,10個循環、20個循環、40個循環、50個循環、1,000個循環等)之後可實質上無裂縫。再舉例而言,熱界面材料在其暴露於包含至少約攝氏100度等之溫度變化達至少約10個循環或大於10個循環(例如,10個循環、20個循環、40個循環、50個循環、 1,000個循環等)之後可實質上無裂縫。 In some embodiment embodiments, the thermal interface materials of the present disclosure are substantially free of crack formation during use in filling the gap between the heat transfer surfaces in the heat transfer system. For example, the thermal interface material has a thermal cycle of between at least about 10 cycles or greater than 10 cycles (eg, 10 cycles, 20) between its exposure to a temperature of about -20 degrees Celsius and a temperature of about 160 degrees Celsius. One cycle, 40 cycles, 50 cycles, 1,000 cycles, etc.) may be substantially free of cracks. By way of further example, the thermal interface material is subjected to a temperature change comprising at least about 100 degrees Celsius or the like for at least about 10 cycles or greater than 10 cycles (eg, 10 cycles, 20 cycles, 40 cycles, 50 cycles) cycle, After 1,000 cycles, etc.) there may be substantially no cracks.
在一些實施例具體實例中,本揭示之熱界面材料在暴露於熱循環分析期間實質上無裂縫形成。在一些實施例具體實例中,熱界面材料在其暴露於包含至少約攝氏100度之溫度變化的熱循環期間實質上無裂縫形成。在一些實施例具體實例中,本揭示之熱界面材料在其暴露於約攝氏-20度至約90攝氏度之熱循環期間實質上無裂縫形成。在一些實施例具體實例中,本揭示之熱界面材料在其暴露於約攝氏-20度至約120攝氏度之熱循環期間實質上無裂縫形成。在一些該等實施例具體實例中,本揭示之熱界面材料在其暴露於涉及至少約10個循環或大於10個循環(例如,10個循環、20個循環、40個循環、50個循環、1,000個循環等)之熱循環期間可實質上無裂縫形成。 In some embodiment embodiments, the thermal interface materials of the present disclosure are substantially free of crack formation during exposure to thermal cycling analysis. In some embodiment embodiments, the thermal interface material is substantially free of crack formation during its exposure to a thermal cycle that includes a temperature change of at least about 100 degrees Celsius. In some embodiment embodiments, the thermal interface materials of the present disclosure are substantially free of crack formation during their exposure to thermal cycling from about -20 degrees Celsius to about 90 degrees Celsius. In some embodiment embodiments, the thermal interface materials of the present disclosure are substantially free of crack formation during their exposure to thermal cycling from about -20 degrees Celsius to about 120 degrees Celsius. In some such embodiment embodiments, the thermal interface material of the present disclosure is exposed to at least about 10 cycles or greater than 10 cycles (eg, 10 cycles, 20 cycles, 40 cycles, 50 cycles, There may be substantially no crack formation during the thermal cycle of 1,000 cycles, etc.).
在一個實施例具體實例中,在第一時段,使用熱界面材料填充至少兩個表面之間的縫隙期間在熱界面材料暴露於約攝氏-20度之溫度與約攝氏160度之溫度之間的熱循環達至少約10個循環期間,本揭示之熱界面材料實質上無裂縫形成。然而,在第二時段,熱界面材料(例如相同熱界面材料、取自熱界面材料之相同散裝供應品之樣品等)暴露於周圍空氣達至少約八小時或大於八小時之後,在使用熱界面材料填充至少兩個表面之間的縫隙期間,暴露於約攝氏-20度之溫度與約攝氏160度之溫度之間的熱循環達至少約10個循環之後,熱界面材料顯示裂縫形成。 In one embodiment, during the first time period, the gap between the at least two surfaces is filled with the thermal interface material during exposure of the thermal interface material between a temperature of about -20 degrees Celsius and a temperature of about 160 degrees Celsius. The thermal interface material of the present disclosure is substantially free of crack formation during thermal cycling for at least about 10 cycles. However, during the second time period, the thermal interface material (eg, the same thermal interface material, the sample of the same bulk supply taken from the thermal interface material, etc.) is exposed to ambient air for at least about eight hours or more than eight hours after the thermal interface is used The thermal interface material exhibits crack formation after the material is filled with a gap between at least two surfaces, after exposure to a thermal cycle between a temperature of about -20 degrees Celsius and a temperature of about 160 degrees Celsius for at least about 10 cycles.
根據本揭示適合使用之實施例熱界面材料可包括廣泛 範圍之材料,包括但不限於導熱油灰、導熱潤滑脂、導熱縫隙襯墊、有機(例如聚合)材料(與無機(例如金屬焊料)材料相比)、固化自持或獨立襯墊或薄片(與可塗開糊狀物或可重熔焊料對比)等。 Embodiments of the thermal interface material suitable for use in accordance with the present disclosure may include a wide range of A range of materials including, but not limited to, thermally conductive putty, thermally conductive grease, thermally conductive gap liners, organic (eg, polymeric) materials (compared to inorganic (eg, metal solder) materials), cured self-sustaining or individual liners or sheets (with Spread paste or remeltable solder contrast).
以下實施例本質上為實施例。在不背離本揭示之範圍的情況下,可變化以下實施例。 The following examples are essentially embodiments. The following embodiments may be varied without departing from the scope of the disclosure.
在該實施例中,評估導熱油灰(聚矽氧熱縫隙填料產品)之四個樣品中夾帶氣體之存在。導熱油灰之熱導率為約3瓦特/公尺-開爾文(W/mK),且密度為約2.4公克/立方公分(g/cc)。 In this example, the presence of entrained gas in the four samples of the thermally conductive putty (polyoxygen hot gap filler product) was evaluated. The thermally conductive putty has a thermal conductivity of about 3 watts per meter - Kelvin (W/mK) and a density of about 2.4 grams per cubic centimeter (g/cc).
第一樣品包括暴露於周圍實驗室條件約24小時之導熱油灰散裝球體。接著使樣品浸入透明玻璃罐中之脫氣液體聚矽氧中,且將罐置於真空室(具有透明窗供觀察樣品)內部。在真空室內部抽取逐漸增加之真空,造成室中最終減壓為約127托(約5 inHg abs)(在室中產生約-25 inHg之儀錶讀數)。樣品維持在室中之該減壓下約1小時,觀察結果如下。在約254托(約10 inHg abs)之減壓下,樣品表面開始形成氣泡,且數量持續增加直至約127托(約5 inHg abs)之最終減壓。圖3顯示大概在室中達成約127托(約5 inHg abs)減壓之時的第一樣品(及自其中形成之氣泡)。接著樣品表面上開始形成裂縫,自裂縫中出現氣泡。在約127托(約5 inHg abs)之減壓下約15分鐘後,自樣 品中出現的氣泡減少約50%。此外,在約127托(約5 inHg abs)之減壓下約1小時後,自樣品中仍出現僅小部分氣泡,指示相當百分比之氣體已自樣品移除。 The first sample included a thermally conductive putty bulk sphere exposed to ambient laboratory conditions for approximately 24 hours. The sample was then immersed in a degassed liquid polyfluorene in a clear glass jar and the can was placed inside a vacuum chamber (with a transparent window for viewing the sample). A gradual increase in vacuum is drawn inside the vacuum chamber, resulting in a final reduced pressure in the chamber of about 127 Torr (about 5 inHg abs) (a meter reading of about -25 inHg is produced in the chamber). The sample was maintained at this reduced pressure in the chamber for about 1 hour, and the results were as follows. At a reduced pressure of about 254 Torr (about 10 inHg abs), bubbles began to form on the surface of the sample, and the number continued to increase until a final reduced pressure of about 127 Torr (about 5 inHg abs). Figure 3 shows the first sample (and bubbles formed therefrom) approximately at about 127 Torr (about 5 inHg abs) under reduced pressure in the chamber. Then, cracks begin to form on the surface of the sample, and bubbles appear in the crack. After about 15 minutes under a reduced pressure of about 127 Torr (about 5 inHg abs), The bubbles appearing in the product are reduced by about 50%. In addition, after about 1 hour at a reduced pressure of about 127 Torr (about 5 inHg abs), only a small portion of the bubbles still appeared from the sample, indicating that a significant percentage of the gas had been removed from the sample.
第二樣品包括在約127托(約5 inHg abs)減壓下(儀錶讀數約-25 inHg下)經受初期真空調節操作(根據本揭示)約15分鐘之導熱油灰散裝球體。接著使經真空調節之樣品浸入(在真空調節操作之後立即)透明玻璃罐中之脫氣液體聚矽氣中,且將罐置於真空室(具有透明窗供觀察樣品)內部。以實質上與第一樣品相同之方式在真空室中抽取真空,造成室中約127托(約5 inHg abs)之最終減壓。接著維持樣品在該減壓下約1小時。圖4顯示大概在室中達成約127托(約5 inHg abs)減壓之時的第二樣品。如圖4中所示,與第一樣品相比(圖3),第二樣品顯示其表面之氣泡量明顯減少。特別地,與大概室中達成約127托(約5 inHg abs)減壓之時的第二樣品結合觀察到之氣泡數量與暴露於約127托(約5 inHg abs)之減壓約1小時之後的第一樣品結合觀察到的氣泡數量大致相同。因此,與第二樣品有關之氣泡減少(與第一樣品相比)證明初期真空調節操作有效地自第二樣品移除夾帶氣體。 The second sample included a thermally conductive putty bulk sphere that was subjected to an initial vacuum conditioning operation (according to the present disclosure) for about 15 minutes under a reduced pressure of about 127 Torr (about 5 inHg abs) (a meter reading of about -25 inHg). The vacuum-adjusted sample was then immersed (as soon as after the vacuum conditioning operation) in the degassed liquid polyfluorene in the clear glass jar and the can was placed inside a vacuum chamber (with a transparent window for viewing the sample). The vacuum was drawn in the vacuum chamber in substantially the same manner as the first sample, resulting in a final reduced pressure of about 127 Torr (about 5 inHg abs) in the chamber. The sample was then maintained under the reduced pressure for about 1 hour. Figure 4 shows a second sample approximately when a reduced pressure of about 127 Torr (about 5 inHg abs) is achieved in the chamber. As shown in Figure 4, the second sample showed a significant reduction in the amount of bubbles on its surface compared to the first sample (Figure 3). In particular, the number of bubbles observed in combination with a second sample at about 127 Torr (about 5 inHg abs) decompression in the approximate chamber is about one hour after exposure to a reduced pressure of about 127 Torr (about 5 inHg abs). The first sample combined with the observed number of bubbles is approximately the same. Thus, the bubble reduction associated with the second sample (compared to the first sample) demonstrates that the initial vacuum conditioning operation effectively removes the entrained gas from the second sample.
第三樣品包括在約127托(約5 inHg abs)減壓下經受初期真空調節操作約15分鐘的導熱油灰散裝球。在真空調節操作之後,樣品置於周圍實驗室條件下約12小時。接著使樣品浸入透明玻璃罐中之脫氣液體聚矽氧中,且將罐置於真空室(具有透明窗供觀察樣品)內部。以實質上與第 一樣品相同之方式在真空室中抽取真空,造成室中約127托(約5 inHg abs)之最終減壓。接著樣品維持在該減壓下約1小時。圖5顯示大概在室中達到約127托(約5 inHg abs)減壓之時的第三樣品(及自其中出現之氣泡)。如圖5中所示,以與第一樣品(圖3)相似之方式,大量氣泡自樣品中出現,表明如本文中所描述,若樣品隨後暴露於周圍氣體,則藉由初期真空調節操作移除樣品中之夾帶氣體為可逆的。 The third sample included a thermally conductive putty bulk ball that was subjected to an initial vacuum conditioning operation for about 15 minutes under a reduced pressure of about 127 Torr (about 5 inHg abs). After the vacuum conditioning operation, the samples were placed under ambient laboratory conditions for approximately 12 hours. The sample was then immersed in a degassed liquid polyfluorene in a clear glass jar and the can was placed inside a vacuum chamber (with a transparent window for viewing the sample). In essence A sample draws a vacuum in the vacuum chamber in the same manner, resulting in a final reduced pressure of about 127 Torr (about 5 inHg abs) in the chamber. The sample was then maintained under the reduced pressure for about 1 hour. Figure 5 shows a third sample (and bubbles emerging therefrom) approximately at about 127 Torr (about 5 inHg abs) under reduced pressure in the chamber. As shown in Figure 5, in a manner similar to the first sample (Figure 3), a large number of bubbles emerge from the sample, indicating that as described herein, if the sample is subsequently exposed to ambient gas, the initial vacuum conditioning operation The entrained gas in the sample is removed to be reversible.
第四樣品包括在約127托(約5 inHg abs)減壓下經受初期真空調節操作約15分鐘的導熱油灰散裝球。在該真空調節操作之後,樣品儲存於移除氣體(以有助於抑制樣品與周圍氣體接觸)約1月之密封袋中。接著使樣品浸入透明玻璃罐中之脫氣液體聚矽氧中,且將罐置於真空室(具有透明窗供觀察樣品)內部。以實質上與第一樣品相同之方式在真空室中抽取真空,造成室中約127托(約5 inHg abs)之最終減壓。接著維持樣品在該減壓下約1小時。圖6顯示大概在室中達成約127托(約5 inHg abs)減壓之時的第四樣品(及自其中出現之氣泡)。如圖6中所示,與第一樣品(圖3)及第三樣品(圖5)相比,第四樣品顯示其表面之氣泡量明顯減少,表明在儲存期期間樣品中沒有夾帶顯著數量之氣體。 The fourth sample included a thermally conductive putty bulk ball that was subjected to an initial vacuum conditioning operation for about 15 minutes under a reduced pressure of about 127 Torr (about 5 inHg abs). After this vacuum conditioning operation, the sample is stored in a sealed bag of approximately one month of removal of gas (to help inhibit contact of the sample with ambient gases). The sample was then immersed in a degassed liquid polyfluorene in a clear glass jar and the can was placed inside a vacuum chamber (with a transparent window for viewing the sample). The vacuum was drawn in the vacuum chamber in substantially the same manner as the first sample, resulting in a final reduced pressure of about 127 Torr (about 5 inHg abs) in the chamber. The sample was then maintained under the reduced pressure for about 1 hour. Figure 6 shows a fourth sample (and bubbles emerging therefrom) approximately at about 127 Torr (about 5 inHg abs) under reduced pressure in the chamber. As shown in Figure 6, the fourth sample showed a significant reduction in the amount of bubbles on its surface compared to the first sample (Figure 3) and the third sample (Figure 5), indicating that there was no significant entrainment in the sample during the storage period. Gas.
在該實施例中,在導熱油灰(聚矽氧熱縫隙填料產品)之兩個樣品上進行熱循環分析。導熱油灰之熱導率為約3 W/mk,且密度為約1.5 g/cc。 In this example, thermal cycling analysis was performed on two samples of a thermally conductive putty (polyoxygen hot gap filler product). The thermal conductivity of the heat conductive putty is about 3 W/mk and a density of about 1.5 g/cc.
安置導熱油灰之第一樣品於容器中且經受減壓。特定而言,經由對容器及導熱油灰施加約381托(約15 inHg abs)之真空約5分鐘(以使得第一樣品經真空調節)自容器移除氣體(且自容器中之樣品移除夾帶氣體)。導熱油灰之第二樣品不經受減壓(且因此未經真空調節)。接著立即在第一及第二樣品上進行熱循環分析。各樣品置於一對玻璃板之間,以使得可輕易觀察到熱循環分析之效果。間隔物分隔各對板以使得各樣品具有約40密耳與約60密耳之間(約1毫米與約1.5毫米之間)的實質上恆定之厚度。且使用彈簧夾夾具使各對板結合在一起以有助於保持樣品在該厚度下。接著將各樣品置於經程式化之循環爐中,以使樣品在約攝氏-20度之溫度與約攝氏160度之溫度之間循環約42個循環(其中各循環持續時間為約4小時)。圖7顯示分析之後經真空調節之第一樣品。且圖8顯示分析之後未經調節之第二樣品。藉由比較圖7與圖8可見,分析之後經真空調節之第一樣品(圖7)實質上不包括可見裂縫,而未經調節之第二樣品(圖8)包括大量可見裂縫。 A first sample of the thermally conductive putty is placed in the container and subjected to reduced pressure. In particular, a gas of about 381 Torr (about 15 inHg abs) is applied to the container and the thermally conductive putty for about 5 minutes (to allow the first sample to be vacuum adjusted) to remove gas from the container (and removed from the sample in the container) Entrained gas). The second sample of the thermally conductive putty was not subjected to reduced pressure (and thus was not vacuum regulated). Thermal cycle analysis was then performed on the first and second samples immediately. Each sample was placed between a pair of glass plates so that the effect of the thermal cycle analysis was easily observed. The spacer separates the pairs of plates such that each sample has a substantially constant thickness between about 40 mils and about 60 mils (between about 1 mm and about 1.5 mm). And using a spring clip clamp to bond the pairs of plates together to help keep the sample at this thickness. Each sample is then placed in a programmed circulating oven to cycle the sample between about -20 degrees Celsius and a temperature of about 160 degrees Celsius for about 42 cycles (where each cycle lasts about 4 hours) . Figure 7 shows the first sample that was vacuum adjusted after the analysis. And Figure 8 shows a second sample that was unconditioned after analysis. As can be seen by comparing Figures 7 and 8, the vacuum-conditioned first sample (Figure 7) after analysis does not substantially include visible cracks, while the unadjusted second sample (Figure 8) includes a large number of visible cracks.
在該實施例中,在導熱油灰(聚矽氧熱縫隙填料產品)之兩個樣品上進行熱循環分析。導熱油灰之熱導率為約2 W/mk,且密度為約3.0 g/cc。 In this example, thermal cycling analysis was performed on two samples of a thermally conductive putty (polyoxygen hot gap filler product). The thermal conductive putty has a thermal conductivity of about 2 W/mk and a density of about 3.0 g/cc.
安置導熱油灰之第一樣品於容器中且經受減壓。特定而言,經由對容器及樣品施加約381托(約15 inHg abs) 之真空約5分鐘(以使得第一樣品經真空調節)自容器移除氣體(且自容器中之樣品移除夾帶氣體)。導熱油灰之第二樣品不經受減壓(且因此未經真空調節)。接著立即在第一及第二樣品上進行熱循環分析。各樣品聚矽氧熱縫隙填料產品一對玻璃板之間,以使得可輕易觀察到熱循環分析之效果。間隔物分隔各對板以使得各樣品具有約40密耳與約60密耳之間(約1毫米與約1.5毫米之間)的實質上恆定之厚度。且使用彈簧夾夾具使各對板結合在一起以有助於保持樣品在該厚度下。接著將各樣品置於經程式化之循環爐中,以使樣品在約攝氏-20度之溫度與約攝氏160度之溫度之間循環約42個循環(其中各循環持續時間為約4小時)。圖9顯示分析之後經真空調節之第一樣品。且圖10顯示分析之後未經調節之第二樣品。藉由比較圖9與圖10可見,分析之後經真空調節之第一樣品(圖9)實質上不包括可見裂縫,而未經調節之第二樣品(圖10)包括大量可見裂縫。 A first sample of the thermally conductive putty is placed in the container and subjected to reduced pressure. In particular, approximately 381 Torr (about 15 inHg abs) is applied to the container and sample. The vacuum is removed for about 5 minutes (so that the first sample is vacuum adjusted) and the gas is removed from the vessel (and the entrained gas is removed from the sample in the vessel). The second sample of the thermally conductive putty was not subjected to reduced pressure (and thus was not vacuum regulated). Thermal cycle analysis was then performed on the first and second samples immediately. Each sample was entangled between a pair of glass plates so that the effect of the thermal cycle analysis could be easily observed. The spacer separates the pairs of plates such that each sample has a substantially constant thickness between about 40 mils and about 60 mils (between about 1 mm and about 1.5 mm). And using a spring clip clamp to bond the pairs of plates together to help keep the sample at this thickness. Each sample is then placed in a programmed circulating oven to cycle the sample between about -20 degrees Celsius and a temperature of about 160 degrees Celsius for about 42 cycles (where each cycle lasts about 4 hours) . Figure 9 shows the first sample vacuum adjusted after analysis. And Figure 10 shows a second sample that was unconditioned after analysis. As can be seen by comparing Fig. 9 with Fig. 10, the vacuum-conditioned first sample (Fig. 9) after analysis does not substantially include visible cracks, while the unadjusted second sample (Fig. 10) includes a large number of visible cracks.
在該實施例中,在導熱油灰(聚矽氧熱縫隙填料產品)之兩個樣品上進行熱循環分析。導熱油灰之熱導率為約3 W/mk,且密度為約2.4 g/cc。 In this example, thermal cycling analysis was performed on two samples of a thermally conductive putty (polyoxygen hot gap filler product). The thermal conductive putty has a thermal conductivity of about 3 W/mk and a density of about 2.4 g/cc.
安置導熱油灰之第一樣品於容器中且經受減壓。特定而言,經由對容器及樣品施加約381托(約15 inHg abs)之真空約5分鐘(以使得第一樣品經真空調節)自容器移除氣體(且自容器中之樣品移除夾帶氣體)。導熱油灰之 第二樣品不經受減壓(且因此未經真空調節)。接著立即在第一及第二樣品上進行熱循環分析。各樣品置於一對玻璃板之間,以使得可輕易觀察到熱循環分析之效果。間隔物分隔各對板以使得各樣品具有約40密耳與約60密耳之間(約1毫米與約1.5毫米之間)的實質上恆定之厚度。且使用彈簧夾夾具使各對板結合在一起以有助於保持樣品在該厚度下。接著將各樣品置於經程式化之循環爐中,以使樣品在約攝氏-20度之溫度與約攝氏160度之溫度之間循環約42個循環(其中各循環持續時間為約4小時)。圖11顯示分析之後經真空調節之第一樣品。且圖12顯示分析之後未經調節之第二樣品。藉由比較圖11與圖12可見,分析之後經真空調節之第一樣品(圖11)實質上不包括可見裂縫,而未經調節之第二樣品(圖12)包括大量可見裂縫。 A first sample of the thermally conductive putty is placed in the container and subjected to reduced pressure. In particular, the gas is removed from the container by applying a vacuum of about 381 Torr (about 15 inHg abs) to the container and sample for about 5 minutes (to allow the first sample to be vacuum adjusted) (and removing the entrainment from the sample in the container) gas). Thermal grease The second sample was not subjected to reduced pressure (and therefore was not vacuum adjusted). Thermal cycle analysis was then performed on the first and second samples immediately. Each sample was placed between a pair of glass plates so that the effect of the thermal cycle analysis was easily observed. The spacer separates the pairs of plates such that each sample has a substantially constant thickness between about 40 mils and about 60 mils (between about 1 mm and about 1.5 mm). And using a spring clip clamp to bond the pairs of plates together to help keep the sample at this thickness. Each sample is then placed in a programmed circulating oven to cycle the sample between about -20 degrees Celsius and a temperature of about 160 degrees Celsius for about 42 cycles (where each cycle lasts about 4 hours) . Figure 11 shows the first sample vacuum adjusted after analysis. And Figure 12 shows the second sample that was unconditioned after the analysis. As can be seen by comparing Fig. 11 with Fig. 12, the vacuum-conditioned first sample (Fig. 11) after analysis does not substantially include visible cracks, while the unadjusted second sample (Fig. 12) includes a large number of visible cracks.
在該實施例中,對導熱潤滑脂(具有約3.8 W/mk之熱導率、約2.6 g/cc之密度且適用於高效能計算機處理單元等中之聚矽氧基熱潤滑脂)之兩個樣品進行熱循環分析。安置導熱潤滑脂之第一樣品於容器中且經受減壓。特定而言,經由對容器及樣品施加約381托(約15 inHg abs)之真空約5分鐘(以使得第一樣品經真空調節)自容器移除氣體(且自容器中之樣品移除夾帶氣體)。導熱潤滑脂之第二樣品不經受減壓(且因此未經真空調節)。接著立即對第一及第二樣品進行熱循環分析。各樣品置於一對玻璃板之間,以使得可輕易觀察到熱循環分析之效果。間隔物 分隔各對板以使得各樣品具有約40密耳與約60密耳之間(約1毫米與約1.5毫米之間)的實質上恆定之厚度。此外,使用彈簧夾夾具使各對板結合在一起以有助於保持樣品之該厚度。接著將各樣品置於經程式化之循環爐中,以使樣品在約攝氏-20度之溫度與約攝氏160度之溫度之間循環約42個循環(其中各循環持續時間為約4小時)。圖13顯示分析之後的經真空調節之第一樣品。此外,圖14顯示分析之後的未經調節之第二樣品。藉由比較圖13與圖14可見,經真空調節之第一樣品(圖13)在分析之後包括少數可見裂縫,而未經調節之第二樣品(圖14)包括大量可見裂縫。 In this embodiment, two types of thermally conductive grease (polyoxyl thermal grease having a thermal conductivity of about 3.8 W/mk, a density of about 2.6 g/cc, and suitable for use in a high performance computer processing unit, etc.) One sample was subjected to thermal cycle analysis. A first sample of thermally conductive grease is placed in the container and subjected to reduced pressure. In particular, the gas is removed from the container by applying a vacuum of about 381 Torr (about 15 inHg abs) to the container and sample for about 5 minutes (to allow the first sample to be vacuum adjusted) (and removing the entrainment from the sample in the container) gas). The second sample of thermally conductive grease is not subjected to reduced pressure (and therefore is not vacuum regulated). Immediately thereafter, the first and second samples were subjected to thermal cycle analysis. Each sample was placed between a pair of glass plates so that the effect of the thermal cycle analysis was easily observed. Spacer The pairs of plates are separated such that each sample has a substantially constant thickness between about 40 mils and about 60 mils (between about 1 mm and about 1.5 mm). In addition, spring clip clamps are used to bond the pairs of plates together to help maintain this thickness of the sample. Each sample is then placed in a programmed circulating oven to cycle the sample between about -20 degrees Celsius and a temperature of about 160 degrees Celsius for about 42 cycles (where each cycle lasts about 4 hours) . Figure 13 shows the vacuum-conditioned first sample after analysis. In addition, Figure 14 shows the unadjusted second sample after analysis. As can be seen by comparing Figures 13 and 14, the vacuum-conditioned first sample (Figure 13) included a small number of visible cracks after analysis, while the unconditioned second sample (Figure 14) included a large number of visible cracks.
在該實施例中,在導熱油灰(聚矽氧熱縫隙填料產品)之四個樣品上進行熱循環分析。導熱油灰之熱導率為約3 W/mk,且密度為約2.4 g/cc。 In this example, thermal cycling analysis was performed on four samples of a thermally conductive putty (polyoxygen hot gap filler product). The thermal conductive putty has a thermal conductivity of about 3 W/mk and a density of about 2.4 g/cc.
在分析之前,如下製備各樣品。導熱油灰之第一樣品暴露於周圍實驗室條件中約24小時。導熱油灰之第二樣品在約127托(約5 inHg abs)減壓下經受初期真空調節操作約15分鐘。導熱油灰之第三樣品在約127托(約5 inHg abs)減壓下經受初期真空調節操作約15分鐘,且接著暴露於周圍實驗室條件中約24小時。且導熱油灰之第四樣品在約127托(約5 inHg abs)減壓下經受初期真空調節操作約15分鐘,且接著封裝於真空下之密封容器中(以有助於抑制樣品與周圍氣體接觸)約1月。初期真空調節操作包括安置受試樣品於容器中且接著在容器中抽取約127托(約5 inHg abs)之真空約15分鐘。 Each sample was prepared as follows before analysis. The first sample of the thermally conductive putty was exposed to ambient laboratory conditions for about 24 hours. A second sample of thermally conductive putty was subjected to an initial vacuum conditioning operation for about 15 minutes under a reduced pressure of about 127 Torr (about 5 inHg abs). A third sample of thermally conductive putty was subjected to an initial vacuum conditioning operation for about 15 minutes under a reduced pressure of about 127 Torr (about 5 inHg abs) and then exposed to ambient laboratory conditions for about 24 hours. And the fourth sample of the thermally conductive putty is subjected to an initial vacuum conditioning operation under a reduced pressure of about 127 Torr (about 5 inHg abs) for about 15 minutes, and then encapsulated in a sealed container under vacuum (to help inhibit the sample from contacting the surrounding gas). ) About 1 month. The initial vacuum conditioning operation involves placing the test sample in a container and then extracting about 127 Torr (about 5 inHg) in the container. The vacuum of abs) is about 15 minutes.
樣品製備之後,立即在四個樣品上進行熱循環分析。各樣品置於一對大體上正方形玻璃板之間(具有約2.5吋乘約2.5吋之尺寸及約0.25吋之厚度),以使得可輕易觀察到熱循環分析之效果。間隔物分隔各對板以使得各樣品具有約40密耳與約60密耳之間(約1毫米與約1.5毫米之間)的實質上恆定之厚度。且使用彈簧夾夾具使各對板結合在一起以有助於保持樣品在該厚度下。接著各樣品置於經程式化之循環爐中,以使樣品在約攝氏-20度之溫度與約攝氏160度之溫度之間以每分鐘約1.5攝氏度之速率循環約42個循環(使得各循環具有約4小時之持續時間,且分析持續約7天)。 Thermal cycle analysis was performed on four samples immediately after sample preparation. Each sample was placed between a pair of substantially square glass plates (having a size of about 2.5 inches by about 2.5 inches and a thickness of about 0.25 inches) so that the effect of the thermal cycle analysis can be easily observed. The spacer separates the pairs of plates such that each sample has a substantially constant thickness between about 40 mils and about 60 mils (between about 1 mm and about 1.5 mm). And using a spring clip clamp to bond the pairs of plates together to help keep the sample at this thickness. Each sample is then placed in a programmed circulating oven such that the sample is cycled at a rate of about 1.5 degrees Celsius per minute for about 42 cycles between about -20 degrees Celsius and about 160 degrees Celsius (so that each cycle It has a duration of about 4 hours and the analysis lasts about 7 days).
圖15顯示分析之後的第一樣品,圖16顯示分析之後的第二樣品,圖17顯示分析之後的第三樣品,且圖18顯示分析之後的第四樣品。藉由比較圖15至圖18可見,在分析之約24小時內經受初期真空調節操作之第二及第四樣品(分別圖16及圖18)展示實質上無可見裂縫。然而,分析之前暴露於周圍實驗室條件中約24小時之第一及第三樣品(分別圖15及圖17)展示大量可見裂縫。就此而論,第一樣品(圖15)顯示熱循環對導熱油灰產生有害作用(當初期未經受真空調節操作時)。第二樣品(圖16)顯示真空調節操作應用於導熱油灰時之益處(例如實質上減少表面開裂等)。第三樣品(圖17)顯示真空調節操作施加於導熱油灰時之益處可隨時間逐漸消失,以致於在涉及熱循 環之應用中使用導熱油灰可導致不當之裂縫形成。且第四樣品(圖18)顯示藉由將經真空調節之導熱油灰封裝於真空下之密封容器中以使其免於暴露於周圍氣體,真空調節操作應用於導熱油灰時之益處可隨時間維持。 Figure 15 shows the first sample after the analysis, Figure 16 shows the second sample after the analysis, Figure 17 shows the third sample after the analysis, and Figure 18 shows the fourth sample after the analysis. As can be seen by comparing Figures 15 through 18, the second and fourth samples (Figs. 16 and 18, respectively) subjected to the initial vacuum conditioning operation within about 24 hours of the analysis exhibited substantially no visible cracks. However, the first and third samples (Figures 15 and 17, respectively) exposed to ambient laboratory conditions for approximately 24 hours prior to analysis exhibited a large number of visible cracks. In this connection, the first sample (Fig. 15) shows that the thermal cycle has a detrimental effect on the heat transfer putty (when initially not subjected to vacuum conditioning operation). The second sample (Fig. 16) shows the benefits of applying a vacuum conditioning operation to the heat transfer putty (e.g., substantially reducing surface cracking, etc.). The third sample (Fig. 17) shows that the benefits of the vacuum adjustment operation applied to the heat transfer putty can fade away over time, so that it involves heat cycling. The use of thermally conductive putty in the application of the ring can result in improper crack formation. And the fourth sample (Fig. 18) shows that by encapsulating the vacuum-regulated thermally conductive putty in a sealed container under vacuum to protect it from exposure to ambient gases, the benefits of vacuum conditioning operations applied to thermally conductive putty can be maintained over time. .
因此,本揭示係關於經在減壓(例如減小之大氣壓等)下調節之熱界面材料,及調節熱界面材料之方法。熱界面材料之該調節可在封裝熱界面材料之前;安裝熱界面材料於熱轉移系統中之前、同時或之後;使用熱界面材料在熱轉移系統中之熱轉移表面之間轉移熱量之前或同時等進行。 Accordingly, the present disclosure is directed to a thermal interface material that is conditioned under reduced pressure (e.g., reduced atmospheric pressure, etc.), and a method of modulating the thermal interface material. This adjustment of the thermal interface material may precede the encapsulation of the thermal interface material; before, simultaneously or after the thermal interface material is installed in the thermal transfer system; before or at the same time using the thermal interface material to transfer heat between the thermal transfer surfaces in the thermal transfer system get on.
本文中揭示關於加工熱界面材料以便改良熱界面材料與熱轉移系統一起使用時(例如在系統之熱轉移表面之間轉移熱量等)在熱循環期間之可靠性、可工作性、改良其耐裂縫形成性等,反過來其將改良熱轉移系統在該使用期間、特定言之當該使用期間熱轉移系統經歷溫度循環變化時之可靠性、可工作性等之系統及方法的實施例具體實例。亦揭示已根據本揭示加工之熱界面材料之實施例具體實例,包括已經調節及/或經受減壓之熱界面材料。在該等具體實例中,熱界面材料之調節可在安裝熱界面材料於熱轉移系統中之熱轉移表面之間之前、同時或之後,或甚至在使用熱界面材料在熱轉移系統中之熱轉移表面之間轉移熱量之前或同時進行。在一些實施例具體實例中,經調節之熱界面材料(例如,自熱轉移系統分離、安裝於熱轉移系統中等)可進一步封裝及/或儲存(例如,單獨、與其安 裝其中之熱轉移系統結合等)在抑制經調節之熱界面材料與周圍氣體接觸之條件下。 Disclosed herein is the processing of thermal interface materials to improve the reliability, workability, and crack resistance of thermal interface materials during use with thermal transfer systems (eg, transferring heat between the heat transfer surfaces of the system, etc.) during thermal cycling. Formative, etc., in turn, will exemplify embodiments of embodiments of systems and methods for improving the reliability, workability, etc. of the heat transfer system during use, particularly when the heat transfer system undergoes temperature cycling during the use. Specific examples of embodiments of thermal interface materials that have been processed in accordance with the present disclosure are also disclosed, including thermal interface materials that have been adjusted and/or subjected to reduced pressure. In such specific examples, the adjustment of the thermal interface material can be prior to, during or after the installation of the thermal interface material between the thermal transfer surfaces in the thermal transfer system, or even the thermal transfer of the thermal interface material in the thermal transfer system. Transfer heat between surfaces before or at the same time. In some embodiment embodiments, the conditioned thermal interface material (eg, separated from the heat transfer system, mounted in a heat transfer system, etc.) may be further packaged and/or stored (eg, separately, with its The heat transfer system incorporated therein, etc., is under conditions that inhibit the contact of the conditioned thermal interface material with the surrounding gas.
本揭示之實施例具體實例大體上係有關適用於填充表面之間的縫隙及/或在表面(例如在熱轉移系統中等)之間轉移熱量之熱界面材料。在一個實施例具體實例中,熱界面材料一般包括基材及分散於該基材內之導熱粒子。熱界面材料經組態以使得在第一時段,在使用熱界面材料填充至少兩個表面之間的縫隙期間,熱界面材料暴露於約攝氏-20度之溫度與約攝氏160度之溫度之間的熱循環至少約10個循環之後,熱界面材料為或將為實質上無裂縫。在第二時段,熱界面材料暴露於周圍空氣達至少約八小時之後,在使用熱界面材料填充至少兩個表面之間的縫隙期間,熱界面材料暴露於約攝氏-20度之溫度與約攝氏160度之溫度之間的熱循環達至少約10個循環之後,熱界面材料將展示或展示裂縫形成。 Embodiments of the disclosed embodiments are generally related to thermal interface materials suitable for use in filling gaps between surfaces and/or transferring heat between surfaces (e.g., in heat transfer systems, etc.). In one embodiment, the thermal interface material generally comprises a substrate and thermally conductive particles dispersed within the substrate. The thermal interface material is configured such that during the first time period, during filling of the gap between the at least two surfaces using the thermal interface material, the thermal interface material is exposed between a temperature of about -20 degrees Celsius and a temperature of about 160 degrees Celsius After at least about 10 cycles of thermal cycling, the thermal interface material is or will be substantially crack free. During a second period of time, after the thermal interface material is exposed to ambient air for at least about eight hours, during filling of the gap between the at least two surfaces using the thermal interface material, the thermal interface material is exposed to a temperature of about -20 degrees Celsius and about Celsius After a thermal cycle between temperatures of 160 degrees for at least about 10 cycles, the thermal interface material will exhibit or exhibit crack formation.
在另一實施例具體實例中,熱界面材料一般包括基材及分散於該基材內之導熱粒子。本文中,熱界面材料在減壓下經調節,且在調節熱界面材料約四十八小時或小於四十八小時內,經調節之熱界面材料安置於抑制周圍氣體接觸經調節熱界面材料的容器中,或熱界面材料用於在熱轉移系統之熱轉移表面之間轉移熱量。在該實施例具體實例中,可在安裝熱界面材料於熱轉移系統中之前、同時或之後調節熱界面材料。或者,可在使用熱界面材料在熱轉移系統之熱轉移表面之間轉移熱量之前或同時的任何時間調 節熱界面材料。 In another embodiment, the thermal interface material generally comprises a substrate and thermally conductive particles dispersed within the substrate. Herein, the thermal interface material is adjusted under reduced pressure, and within about forty-eight hours or less than forty-eight hours of adjusting the thermal interface material, the conditioned thermal interface material is disposed in a container that inhibits ambient gas from contacting the conditioned thermal interface material, or Thermal interface materials are used to transfer heat between the heat transfer surfaces of the heat transfer system. In this embodiment embodiment, the thermal interface material can be adjusted before, during or after the installation of the thermal interface material in the thermal transfer system. Alternatively, any time before or during the transfer of heat between the heat transfer surfaces of the heat transfer system using the thermal interface material Thermal interface material.
本揭示之實施例具體實例亦大體上係關於加工熱界面材料以改良熱界面材料用以在至少兩個熱轉移表面之間轉移熱量時之工作可靠性的方法。在一個實施例具體實例中,方法大體上包括在減壓下調節熱界面材料,以使得熱界面材料在暴露於包含至少約攝氏100度之溫度變化的熱循環至少約10個循環之後為或將為實質上無裂縫。 Embodiments of the disclosed embodiments are also generally directed to methods of processing thermal interface materials to improve the operational reliability of thermal interface materials for transferring heat between at least two thermal transfer surfaces. In one embodiment, the method generally includes adjusting the thermal interface material under reduced pressure such that the thermal interface material is or will be exposed to at least about 10 cycles of thermal cycling comprising a temperature change of at least about 100 degrees Celsius It is essentially free of cracks.
本揭示之實施例具體實例可用於調節熱界面材料之散裝供應品。該等散裝供應品可包括任何所需體積之材料。 Specific embodiments of the disclosed embodiments can be used to adjust bulk supplies of thermal interface materials. The bulk supplies may include any desired volume of material.
提供實施例具體實例以使得本揭示將為詳盡的,且將充分地將範圍傳達至熟習此項技術者。闡述許多特定細節,諸如特定組件、系統、裝置及方法之實施例以澈底理解本揭示之具體實例。熟習此項技術者將顯而易知,無需使用特定細節,可以許多不同形式體現實施例具體實例,且亦不應將理解為限制本揭示之範圍。在一些實施例具體實例中,未詳細描述熟知方法、熟知裝置結構及熟知技術。此外,提供用本揭示之一或多種例示性具體實例可達成之優勢及改良僅供說明之目的,而不限制本揭示之範圍,因為本文中揭示之例示性具體實例可提供以上提及之優勢及改良之全部或無一者且仍屬於本揭示之範圍。 The embodiments are provided so that this disclosure will be thorough, and the scope will be fully conveyed to those skilled in the art. Numerous specific details are set forth, such as specific embodiments of the components, systems, devices, and methods. It will be apparent to those skilled in the art that <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; In some embodiments, well-known methods, well-known device structures, and well-known techniques are not described in detail. In addition, the advantages and modifications that may be achieved by one or more exemplary embodiments of the present disclosure are provided for illustrative purposes only, without limiting the scope of the disclosure, as the exemplary embodiments disclosed herein may provide the advantages mentioned above. And all or none of the improvements are still within the scope of the disclosure.
本文中所用術語係僅供描述特定實施例具體實例之目的且並不意欲具限制性。除非上下文另有其他明確指示,否則本文中所用單數形式「一」及「該」可意欲亦包括複數形式。術語「包含」、「包括」及「具有」為包括性的 且因此表示存在所述特徵、整數、步驟、工作、元件及/或組件,但不排除存在或增加一或多種其他特徵、整數、步驟、工作、元件、組件及/或其群。除非特別標識出進行順序,否則本文所述之方法步驟、加工及工作不應理解為必定需要其以所討論或說明之特定順序進行。亦應瞭解可使用其他或替代性步驟。 The terminology used herein is for the purpose of describing particular embodiments of the embodiments and The singular forms "a" and "the" The terms "including", "including" and "having" are inclusive. It is intended that the described features, integers, steps, operations, components and/or components are present, but one or more other features, integers, steps, operations, components, components and/or groups thereof are not excluded. The method steps, processes, and operations described herein are not to be construed as necessarily requiring a particular order in the particular It should also be understood that other or alternative steps may be used.
當元件或層被提及為「在……上」、「嚙合於」、「連接於」或「耦合於」另一元件或層時,其可為直接在其他元件或層上、嚙合、連接或耦合於其他元件或層,或可存在介入元件或層。對比之下,當元件被提及為「直接在……上」、「直接嚙合於」、「直接連接於」或「直接耦合於」另一元件或層時,可不存在介入元件或層。其他用以描述元件之間關係的字語應以類似方式解釋(例如,「在……之間」相較於「直接在……之間」,「相鄰」相較於「直接相鄰」等)。本文中所用術語「及/或」包括一或多個相關所列項目之任何及所有組合。術語「約」當應用於數值時指計算值或量測值允許數值中之一些稍微不精確性(其中一些數值近似於數值精確;大致或相當接近該數值;幾乎為該數值)。若由於某種原因,由「約」提供之不精確性在此項技術中並不理解為具有此一般含義,則本文中所用之「約」至少指由量測或使用該等參數之一般方法可產生之變體。舉例而言,在本文中使用術語「大體上」、「大約」及「實質上」可意謂在製造公差內。 When an element or layer is referred to as "on," "engaged," "connected to," or "coupled" to another element or layer, it can be Or coupled to other elements or layers, or there may be intervening elements or layers. In contrast, when an element is referred to as being "directly on," "directly engaging," "directly connected to" or "directly coupled" to another element or layer, there may be no intervening elements or layers. Other words used to describe the relationship between components should be interpreted in a similar manner (for example, "between" and "directly between" and "adjacent" compared to "directly adjacent" Wait). The term "and/or" as used herein includes any and all combinations of one or more of the associated listed items. The term "about" when applied to a numerical value means that the calculated value or the measured value allows some of the numerical values to be slightly inaccurate (some of which approximate the numerical value; roughly or fairly close to the value; almost this value). If for some reason the imprecision provided by "about" is not to be construed as having this general meaning in the art, the term "about" as used herein means at least the general method of measuring or using the parameters. A variant that can be produced. For example, the terms "substantially", "about" and "substantially" as used herein may mean within the manufacturing tolerances.
儘管術語第一、第二、第三等可在本文中用以描述各 種元件、組件、區域、層及/或區段,但該等元件、組件、區域、層及/或區段不應受該等術語限制。該等術語僅可用以區別一個元件、組件、區域、層或區段與另一區域、層或區段。除非上下文有明確指示,否則術語諸如「第一」、「第二」及其他數字術語當在本文中使用時並不暗示序列或順序。因此,在不背離實施例具體實例之教示的情況下,以下討論之第一元件、組件、區域、層或區段可稱為第二元件、組件、區域、層或區段。 Although the terms first, second, third, etc. may be used herein to describe each The elements, components, regions, layers and/or sections are not limited by the terms. The terms can only be used to distinguish one element, component, region, layer or segment from another region, layer or segment. Terms such as "first," "second," and other numerical terms when used herein do not imply a sequence or order, unless the context clearly indicates otherwise. Thus, a first element, component, region, layer or section that is discussed below may be referred to as a second element, component, region, layer or section, without departing from the teachings of the embodiments.
本文中為便於描述而使用空間相對術語,諸如「內部」、「外部」、「在……之下」、「在……下方」、「較低」、「在……上方」、「上部」及其類似術語,以描述如圖中所說明之一個元件或特徵與另一元件或特徵之關係。空間相對術語可意欲涵蓋除圖中所示位向以外裝置在使用或工作中之不同位向。舉例而言,若翻轉圖中之裝置,則描述為「在」其他元件或特徵「下方」或「在」其他元件或特徵「之下」之元件將被定向為「在」其他元件或特徵「上方」。因此,實例術語「在……下方」可涵蓋在……上方與在……下方兩種位向。裝置可以其他方式定向(旋轉90度或在其他位向下),且本文所用之空間相對描述詞可相應地解釋。 In this paper, spatial relative terms are used for convenience of description, such as "internal", "external", "under", "below", "lower", "above", "upper". And similar terms are used to describe one element or feature as illustrated in the figures. Spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientation shown. For example, elements that are "under" or "under" other elements or features "below" or "under" other elements or features. Above." Therefore, the example term "below" can encompass both orientations above and below. The device may be otherwise oriented (rotated 90 degrees or down at other bits), and the spatially relative descriptors used herein may be interpreted accordingly.
此外,對本文中特定數值(例如,壓力、時間、尺寸等)之揭示並不排除可適用於取決於例如特定經加工熱界面材料、其他因素等之其他實施例具體實例的其他數值。對本文中給定參數之特定數值範圍(例如,時間、壓力、 尺寸等)之揭示並不排除可適用於一或多種本文中揭示之實施例的其他數值及數值範圍。此外,預想用於本文中陳述之特定參數的任何兩個特定值可限定可適用於給定參數之一系列數值之端點。對給定參數之第一數值及第二數值之揭示可解釋為揭示第一數值與第二數值之間的亦可用於給定參數之任何數值。類似地,預想對參數之兩個或兩個以上數值範圍(無論該等範圍為套迭式、重迭式還是互異式)之揭示包含可使用所揭示範圍之端點主張之數值範圍的所有可能組合。 Moreover, disclosures of particular values (e.g., pressure, time, dimensions, etc.) herein do not exclude other values that may be applicable to other embodiment specific examples depending on, for example, a particular processed thermal interface material, other factors, and the like. Specific numerical ranges for the parameters given herein (eg, time, pressure, The disclosure of dimensions and the like does not exclude other numerical and numerical ranges that may be applied to one or more embodiments disclosed herein. Furthermore, any two specific values envisioned for the particular parameters set forth herein may define an endpoint that is applicable to a series of values for a given parameter. The disclosure of the first and second values of a given parameter can be construed to reveal any value between the first value and the second value that can also be used for a given parameter. Similarly, it is envisioned that the disclosure of two or more numerical ranges of the parameters (whether the range is a nested, overlapping, or mutually exclusive) encompasses all of the ranges of values claimed by the endpoints of the disclosed range. May be combined.
出於說明及描述之目的,已提供具體實例之上述描述。其並不意謂詳盡的或意欲限制本揭示。特定具體實例之個別元件或特徵一般不限於該特定具體實例,但即使未特別顯示或描述,在適用時亦可互換且可用於所選具體實例中。其亦可以許多方式變化。該等變化不被視為違背本揭示,且所有該等改進意欲包括於本揭示之範圍內。 The foregoing description of specific examples has been presented for purposes of illustration and description. It is not intended to be exhaustive or to limit the invention. Individual elements or features of a particular embodiment are generally not limited to that particular embodiment, but are not interchangeable and may be used in the particular embodiments selected, if not specifically shown or described. It can also vary in many ways. Such variations are not to be regarded as a departure from the disclosure, and all such modifications are intended to be included within the scope of the disclosure.
100‧‧‧方法 100‧‧‧ method
102‧‧‧調節熱界面材料之工作 102‧‧‧Working on the regulation of thermal interface materials
104‧‧‧抑制周圍氣體接觸經調節之熱界面材料的工作 104‧‧‧Suppressing the contact of ambient gases with conditioned thermal interface materials
220‧‧‧系統 220‧‧‧ system
222‧‧‧容器 222‧‧‧ container
224‧‧‧第一閥門組合 224‧‧‧First valve combination
226‧‧‧第二閥門組合 226‧‧‧Second valve combination
226a及226b‧‧‧錶單元 226a and 226b‧‧‧ table units
228‧‧‧管線 228‧‧‧ pipeline
230‧‧‧基本部分 230‧‧‧Basic
232‧‧‧蓋子 232‧‧‧ cover
本文中所描述之圖式僅為說明所選具體實例而非所有可能實施例之目的,且並不意欲限制本揭示之範圍。 The drawings described herein are for illustrative purposes only and are not intended to limit the scope of the disclosure.
圖1為說明根據本揭示加工熱界面材料之實施例方法之工作的流程圖;圖2為有助於根據本揭示加工熱界面材料之可工作實施例系統的透視圖;圖3為導熱油灰樣品初期暴露於周圍實驗室條件中約24小時,且接著浸入真空室中減壓下之脫氣液體聚矽氧 中,且在大約真空室中達成約127托(約5絕對汞柱吋數(inHg abs))減壓之時於真空室中脫氣液體聚矽氧中顯示之像片;圖4為與圖3相同之導熱油灰樣品根據本揭示在約127托(約5 inHg abs)減壓下調節約15分鐘且接著浸入真空室中減壓下之脫氣液體聚矽氧中,且在大約真空室中達成約127托(約5絕對汞柱吋數(inHg abs))減壓之時於真空室中脫氣液體聚矽氧中顯示之像片;圖5為與圖3相同之導熱油灰樣品根據本揭示在約127托(約5 inHg abs)之減壓下調節約15分鐘,接著暴露於周圍實驗室條件約12小時,且接著浸入真空室中減壓下之脫氣液體聚矽氧中,且在大約真空室中達成約127托(約5 inHg abs)減壓之時於真空室中脫氣液體聚矽氧中顯示之像片;圖6為與圖3相同之導熱油灰樣品根據本揭示在約127托(約5 inHg abs)之減壓下調節約15分鐘,接著儲存於真空下之密封袋中約1月,且接著浸入真空室中減壓下之脫氣液體聚矽氧中,且在大約真空室中達成約127托(約5 inHg abs)減壓之時於真空室中脫氣液體聚矽氧中顯示之像片;圖7為根據本揭示在約381托(約15 inHg abs)減壓下調節約5分鐘且接著經受熱循環分析之導熱油灰樣品的像片;圖8為與圖7相同之導熱油灰樣品未經減壓下調節而 經受與圖7中所示樣品相同之熱循環分析的像片;圖9為根據本揭示在約381托(約15 inHg abs)減壓下調節約5分鐘且接著經熱循環分析之導熱油灰樣品的像片;圖10為與圖9相同之導熱油灰樣品未經減壓下調節而經受與圖9中所示樣品相同之熱循環分析的像片;圖11為根據本揭示在約381托(約15 inHg abs)減壓下調節約5分鐘且接著經熱循環分析之導熱油灰樣品的像片;圖12為與圖11相同之導熱油灰樣品未經減壓下調節而經受與圖11中所示樣品相同之熱循環分析的像片;圖13為根據本揭示在約381托(約15 inHg abs)減壓下調節約5分鐘且接著經熱循環分析之導熱潤滑脂樣品的像片;圖14為與圖13相同之導熱潤滑脂樣品未經減壓下調節而經受與圖13中所示樣品相同之熱循環分析的像片;圖15為暴露於周圍實驗室條件中約24小時且接著經熱循環分析之導熱油灰樣品的像片;圖16為與圖15相同之導熱油灰樣品根據本揭示在約5 inHg abs減壓下調節約15分鐘且接著經熱循環分析的像片;圖17為與圖15相同之導熱油灰樣品根據本揭示在約127托(約5 inHg abs)減壓下調節約15分鐘,接著暴露於周圍實驗室條件中約24小時,且接著經熱循環分析的像 片;及圖18為與圖15相同之導熱油灰樣品根據本揭示在約127托(約5 inHg abs)減壓下調節約15分鐘,接著封裝於真空下之密封容器中約1月,且接著經熱循環分析的像片。 1 is a flow chart illustrating the operation of an embodiment method of processing a thermal interface material in accordance with the present disclosure; FIG. 2 is a perspective view of a working embodiment system that facilitates processing a thermal interface material in accordance with the present disclosure; and FIG. 3 is a thermally conductive putty sample Initially exposed to ambient laboratory conditions for about 24 hours, and then immersed in a vacuum chamber for degassed liquid polyoxane under reduced pressure And the image displayed in the degassed liquid polyfluorene in the vacuum chamber when the pressure is reduced to about 127 Torr (about 5 absolute mercury indium (inHg abs)) in a vacuum chamber; FIG. 4 is a diagram 3 The same thermally conductive putty sample was conditioned under reduced pressure of about 127 Torr (about 5 inHg abs) for about 15 minutes according to the present disclosure and then immersed in a degassed liquid polyoxane under reduced pressure in a vacuum chamber, and was achieved in an approximately vacuum chamber. About 127 Torr (about 5 absolute mercury enthalpy (inHg abs)) The photo shown in the degassed liquid polyfluorene in the vacuum chamber at the time of decompression; FIG. 5 is the same heat conduction putty sample as FIG. 3 according to the present disclosure. Adjusted under a reduced pressure of about 127 Torr (about 5 inHg abs) for about 15 minutes, followed by exposure to ambient laboratory conditions for about 12 hours, and then immersed in a vacuum chamber in a degassed liquid polyoxane under reduced pressure, and at about The image shown in the degassed liquid polyfluorene in the vacuum chamber when the pressure is reduced to about 127 Torr (about 5 inHg abs) in the vacuum chamber; FIG. 6 is the same heat conduction putty sample as in FIG. 3 according to the present disclosure at about 127 Adjust (about 5 inHg abs) under reduced pressure for about 15 minutes, then store in a sealed bag under vacuum for about 1 month, and then immerse a photo of a degassed liquid in a vacuum chamber, in a degassed liquid in a vacuum chamber, and a degassed liquid in a vacuum chamber, in a vacuum chamber, at a pressure of about 127 Torr (about 5 inHg abs). Figure 7 is a photograph of a thermally conductive putty sample adjusted for about 5 minutes under a reduced pressure of about 381 Torr (about 15 inHg abs) according to the present disclosure and then subjected to thermal cycle analysis; Figure 8 is the same heat transfer putty sample as Figure 7 Adjusted under reduced pressure Photographs subjected to the same thermal cycling analysis as the sample shown in Figure 7; Figure 9 is a thermally conductive putty sample that was conditioned at about 381 Torr (about 15 inHgabs) under reduced pressure for about 5 minutes and then analyzed by thermal cycling according to the present disclosure. Fig. 10 is a photo of the same heat conduction putty sample as that of Fig. 9 subjected to the same thermal cycle analysis as the sample shown in Fig. 9 without being reduced under reduced pressure; Fig. 11 is about 381 Torr according to the present disclosure. 15 inHg abs) Photograph of a thermally conductive putty sample adjusted for about 5 minutes under decompression and then subjected to thermal cycling analysis; FIG. 12 is the same as the heat transfer putty sample of FIG. 11 and subjected to the sample shown in FIG. 11 without being adjusted under reduced pressure. Photographs of the same thermal cycle analysis; Figure 13 is a photo of a thermally conductive grease sample that was conditioned at about 381 Torr (about 15 inHg abs) under reduced pressure for about 5 minutes and then analyzed by thermal cycling in accordance with the present disclosure; The same thermal grease sample of Figure 13 was subjected to the same thermal cycle analysis as the sample shown in Figure 13 without adjustment under reduced pressure; Figure 15 is exposed to ambient laboratory conditions for about 24 hours and then subjected to thermal cycling. Analysis of the photo of the thermally conductive putty sample; Figure 16 and Figure 15 The thermally conductive putty sample was conditioned at about 5 inHg abs under reduced pressure for about 15 minutes and then subjected to thermal cycling analysis according to the present disclosure; FIG. 17 is the same thermally conductive putty sample as FIG. 15 at about 127 Torr (about 5 according to the present disclosure). inHg abs) adjusted for about 15 minutes under reduced pressure, followed by exposure to ambient laboratory conditions for about 24 hours, and then analyzed by thermal cycling And FIG. 18 is the same as the heat transfer putty sample of FIG. 15 adjusted according to the present disclosure under a reduced pressure of about 127 Torr (about 5 inHg abs) for about 15 minutes, and then packaged in a sealed container under vacuum for about 1 month, and then Photographs of thermal cycling analysis.
在圖式之若干視圖通篇中,對應參考數字指示對應部分。 Corresponding reference numerals indicate corresponding parts throughout the drawings.
220‧‧‧系統 220‧‧‧ system
222‧‧‧容器 222‧‧‧ container
224‧‧‧第一閥門組合 224‧‧‧First valve combination
226‧‧‧第二閥門組合 226‧‧‧Second valve combination
226a‧‧‧錶單元 226a‧‧‧ table unit
226b‧‧‧錶單元 226b‧‧‧ table unit
228‧‧‧管線 228‧‧‧ pipeline
230‧‧‧基本部分 230‧‧‧Basic
232‧‧‧蓋子 232‧‧‧ cover
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| TW200914371A (en) * | 2007-06-01 | 2009-04-01 | Gt Solar Inc | Processing of fine silicon powder to produce bulk silicon |
| CN102066488A (en) * | 2008-04-21 | 2011-05-18 | 霍尼韦尔国际公司 | Thermal interconnect and interface materials, methods of production and uses thereof |
| JP5177089B2 (en) * | 2008-07-30 | 2013-04-03 | 東レ株式会社 | Polyarylene sulfide resin composition, polyarylene sulfide resin composition tablet and molded product obtained therefrom |
| JP5161745B2 (en) * | 2008-12-03 | 2013-03-13 | パナソニック株式会社 | LED unit manufacturing method |
| CN101906288B (en) * | 2009-06-02 | 2013-08-21 | 清华大学 | Thermal interface material, electronic device with same and preparation method |
| JP2011040565A (en) * | 2009-08-11 | 2011-02-24 | Fuji Electric Systems Co Ltd | Thermal conductive sheet, semiconductor device using the same, and method of manufacturing the same |
-
2011
- 2011-05-19 US US13/111,735 patent/US20120292005A1/en not_active Abandoned
-
2012
- 2012-05-08 TW TW101116324A patent/TWI499753B/en active
- 2012-05-17 CN CN201280024408.1A patent/CN103548123A/en active Pending
- 2012-05-17 WO PCT/US2012/038280 patent/WO2012158876A2/en not_active Ceased
- 2012-05-17 KR KR1020137030681A patent/KR101523009B1/en not_active Expired - Fee Related
- 2012-05-17 EP EP12785480.0A patent/EP2710628A4/en not_active Withdrawn
- 2012-05-17 JP JP2014502705A patent/JP2014514755A/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| EP2710628A2 (en) | 2014-03-26 |
| KR101523009B1 (en) | 2015-05-26 |
| KR20140021668A (en) | 2014-02-20 |
| TWI499753B (en) | 2015-09-11 |
| JP2014514755A (en) | 2014-06-19 |
| EP2710628A4 (en) | 2015-04-08 |
| WO2012158876A3 (en) | 2013-03-21 |
| WO2012158876A2 (en) | 2012-11-22 |
| US20120292005A1 (en) | 2012-11-22 |
| CN103548123A (en) | 2014-01-29 |
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