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TW201307855A - Power efficient capacitive detection - Google Patents

Power efficient capacitive detection Download PDF

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TW201307855A
TW201307855A TW101128622A TW101128622A TW201307855A TW 201307855 A TW201307855 A TW 201307855A TW 101128622 A TW101128622 A TW 101128622A TW 101128622 A TW101128622 A TW 101128622A TW 201307855 A TW201307855 A TW 201307855A
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Taiwan
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sensor
sensors
charging
discharging
clock
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TW101128622A
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Chinese (zh)
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Nir Tasher
Vladimir Abramov
Yehezkel Hezi Friedman
Einat Nosovitsky
Mark Lukoyanichev
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Winbond Electronics Corp
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Priority to TW101128622A priority Critical patent/TW201307855A/en
Publication of TW201307855A publication Critical patent/TW201307855A/en

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Abstract

Capacitive detection systems, modules, and methods. In one embodiment, a power saving mode is implemented when deemed appropriate, based on an analysis of previous detection or non-detection of the presence and/or position of an object near a capacitive sensing area.

Description

功率有效電容偵測 Power effective capacitance detection

本發明是關於電容感測器。 This invention relates to capacitive sensors.

存在用於電子系統之許多可用的輸入設備。此等輸入設備之實例包括:鍵盤、操縱桿、觸摸式螢幕、機械滑鼠、光學滑鼠、觸敏(touch)感測器等。 There are many available input devices for electronic systems. Examples of such input devices include: a keyboard, a joystick, a touch screen, a mechanical mouse, an optical mouse, a touch sensor, and the like.

觸敏感測器依不同技術而定包括阻抗薄膜位置感測器、表面聲波感測器、高感度壓電式感測器、光學感測器,或電容感測器。在先前技術中論述了各種技術的優點以及缺點,然而,讀者應注意,通常,當前認為電容感測器具有高敏感度以及可靠度。通常亦認為電容感測器具有較長產品壽命且節約成本。 The touch sensitive sensor includes an impedance film position sensor, a surface acoustic wave sensor, a high sensitivity piezoelectric sensor, an optical sensor, or a capacitive sensor depending on different technologies. The advantages and disadvantages of various techniques are discussed in the prior art, however, the reader should note that in general, capacitive sensors are currently considered to have high sensitivity and reliability. Capacitive sensors are also generally considered to have a long product life and cost savings.

根據本發明,提供一種產生為電容感測器之電容之單調函數的時間間隔量測結果的方法,方法包含:引起電容感測器上之電壓改變至少一次;以及藉由量測至少一時間間隔來產生為電容感測器之電容的單調函數之時間間隔量測結果,在至少一時間間隔之每一者期間,感測器上之改變的電壓在兩個預定值間變動,其中若藉由量測至少兩個時間間隔來產生時間間隔量測結果,則量測為累積的,且 其中對應於至少一時間間隔中之至少一者之預定值均為非零的。 According to the present invention, there is provided a method of generating a time interval measurement result of a monotonic function of a capacitance of a capacitive sensor, the method comprising: causing a voltage change on the capacitive sensor to change at least once; and measuring at least one time interval Generating a time interval measurement of the monotonic function of the capacitance of the capacitive sensor, during each of the at least one time interval, the changed voltage across the sensor varies between two predetermined values, wherein Measuring at least two time intervals to produce a time interval measurement result, the measurement is cumulative, and The predetermined value corresponding to at least one of the at least one time interval is non-zero.

根據本發明,亦提供一種用於產生為電容感測器之電容之單調函數之時間間隔量測結果的模組,模組包含:用於引起電容感測器上之電壓改變至少一次的構件;以及用於產生為電容感測器之電容之單調函數之時間間隔量測結果的構件,其包括用於量測感測器上之改變的電壓在兩個預定值間變動之時間間隔的構件,或用於累積量測至少兩個時間間隔的構件,在至少兩個時間間隔之每一者期間,感測器上之改變的電壓在兩個預定值間變動,其中對應於至少一量測時間間隔之預定值均為非零的。 According to the present invention, there is also provided a module for generating a time interval measurement result of a monotonic function of a capacitance of a capacitance sensor, the module comprising: means for causing a voltage change on the capacitance sensor to change at least once; And means for generating a time interval measurement result of a monotonic function of the capacitance of the capacitive sensor, comprising means for measuring a time interval at which the changed voltage across the sensor varies between two predetermined values, Or means for cumulatively measuring at least two time intervals, during each of the at least two time intervals, the changed voltage on the sensor varies between two predetermined values, wherein the at least one measurement time corresponds to The predetermined values of the intervals are all non-zero.

根據本發明,進一步提供一種電容偵測方法,電容偵測方法包含:引起電容感測區域中之至少一電容感測器上之每一電壓改變至少一次;針對至少一電容感測器中的每一者,藉由量測至少一時間間隔來產生為電容感測器之電容的單調函數之時間間隔量測結果,在至少一時間間隔之每一者期間,感測器上之改變的電壓在兩個非零的預定值間變動,其中若藉由量測至少兩個時間間隔來產生時間間隔量測結果,則量測為累積的;以及分析對應於至少一電容感測器之至少一產生的時間間隔量測結果,以偵測到或未偵測到接近電容感測區域之物件的存在。 According to the present invention, a capacitance detecting method includes: causing each voltage on at least one of the capacitive sensing regions to change at least once; for each of the at least one capacitive sensor In one case, by measuring at least one time interval to generate a time interval measurement result of a monotonic function of the capacitance of the capacitive sensor, during each of the at least one time interval, the changed voltage on the sensor is a change between two non-zero predetermined values, wherein if the time interval measurement result is generated by measuring at least two time intervals, the measurement is cumulative; and the analyzing corresponds to at least one generation of the at least one capacitive sensor The time interval measurement results to detect or not detect the presence of an object near the capacitive sensing region.

根據本發明,更進一步提供一種電容偵測系統,電容偵測系統包含:電容感測區域,其包含至少一電容感測器;電容測定模組,其經組態以引起電容感測區域中之至少一 感測器上之每一電壓改變至少一次,且經組態以針對電壓被改變之至少一感測器中的每一者產生為電容感測器之電容的單調函數之時間間隔量測結果,測定模組包括至少一計數器,其中每一計數器對應於一感測器,且經組態以量測對應感測器上之改變的電壓在兩個非零的預定值間變動之時間間隔,或經組態以累積量測至少兩個時間間隔,在至少兩個時間間隔之每一者期間,對應感測器上之改變的電壓在兩個非零的預定值間變動;以及控制器模組,其經組態以分析對應於至少一電壓被改變之至少一感測器的至少一產生的時間間隔量測結果,以偵測到或未偵測到接近電容感測區域之物件的存在。 According to the present invention, a capacitance detecting system further includes: a capacitive sensing region including at least one capacitive sensor; and a capacitance measuring module configured to cause a capacitive sensing region At least one Each voltage on the sensor changes at least once and is configured to generate a time interval measurement of a monotonic function of the capacitance of the capacitive sensor for each of the at least one sensor whose voltage is changed, The assay module includes at least one counter, wherein each counter corresponds to a sensor and is configured to measure a time interval at which the changed voltage on the corresponding sensor varies between two non-zero predetermined values, or Configuring to cumulatively measure at least two time intervals, during each of the at least two time intervals, the changed voltage on the corresponding sensor varies between two non-zero predetermined values; and the controller module And configured to analyze a time interval measurement corresponding to at least one of the at least one sensor whose voltage is changed to detect or not detect the presence of an object proximate to the capacitive sensing region.

本文描述使用一或多個電容感測器偵測物件之存在及/或位置之本發明的實施例。 Embodiments of the invention that use one or more capacitive sensors to detect the presence and/or location of an object are described herein.

本說明書中對“一實施例”、“實施例”、“一些實施例”、“另一實施例”、“其他實施例”、“各種實施例”或其變化的提及意謂結合所述實施例所描述之特定特徵、結構或特性包括於本發明之至少一實施例中。從而,短語“一個實施例”、“一實施例”、“一些實施例”、“另一實施例”、“其他實施例”、“各種實施例”或其變化的出現未必參照所述相同實施例。 References in the specification to "an embodiment", "an embodiment", "an embodiment", "another embodiment", "another embodiment", "a variety of embodiments" or variations thereof mean The specific features, structures, or characteristics described in the embodiments are included in at least one embodiment of the invention. Thus, appearances of the phrases "in one embodiment", "an embodiment", "an embodiment", "another embodiment", "another embodiment", "a variety of embodiments" or variations thereof are not necessarily referring to the same Example.

應瞭解,為了清晰起見描述於個別實施例之上下文中之本發明之一些特徵亦可在單一實施例中組合而提供。相 反地,為了簡短起見而描述於單一實施例之上下文中之本發明的各種特徵亦可分別地或以任何適當的子(sub)組合來提供。 It will be appreciated that some features of the invention described in the context of a particular embodiment may be combined in a single embodiment. phase Conversely, various features of the invention that are described in the context of a single embodiment for the sake of brevity may be provided separately or in any suitable sub combinations.

參照參照 Reference

圖1、3、4、5、8以及16為根據本發明之各種實施例之電容偵測系統100及/或系統100之元件的方塊圖。應理解提供電容偵測系統100及/或系統100之元件之功能性至特定方塊圖中之區塊中的劃分,以有助於讀者理解且因此不應認為此劃分具約束性。在本發明之一些實施例中,系統100及/或系統100之元件可包含比本文圖中所說明之區塊少、多,及/或與其不同的區塊。在本發明之一些實施例中,可將系統100及/或系統100之元件的功能性不同地劃分至本文圖中所說明之區塊中。在本發明之一些實施例中,可將系統100及/或系統100之元件的功能性劃分至比本文圖中所示之區塊少、多,及/或與其不同的區塊中。在本發明之一些實施例中,系統100及/或系統100之元件可包括額外的功能性、比本文所描述之功能性少的功能性,及/或與其不同之功能性。在本發明之一些實施例中,表示為本文圖中之區塊的一或多個元件可具有比本文所描述之功能性更多、更少及/或與其不同之功能性。視實施例而定,表示為本文任何圖中所示之區塊的元件可被集中或相對於彼此而分散。 1, 3, 4, 5, 8, and 16 are block diagrams of elements of capacitance detecting system 100 and/or system 100 in accordance with various embodiments of the present invention. It should be understood that the functionality of the components of the capacitance detection system 100 and/or system 100 is provided to partitions in blocks in a particular block diagram to aid the reader in understanding and therefore should not be considered as limiting. In some embodiments of the invention, elements of system 100 and/or system 100 may include fewer, more, and/or different blocks than those illustrated in the figures herein. In some embodiments of the invention, the functionality of elements of system 100 and/or system 100 may be divided differently into the blocks illustrated in the figures herein. In some embodiments of the invention, the functionality of elements of system 100 and/or system 100 may be partitioned into fewer, more, and/or different blocks than those shown in the figures herein. In some embodiments of the invention, elements of system 100 and/or system 100 may include additional functionality, functionality less than the functionality described herein, and/or functionality different therefrom. In some embodiments of the invention, one or more of the elements represented as blocks in the figures herein may have more functionality, less and/or different functionality than those described herein. Depending on the embodiment, the elements represented as blocks shown in any of the figures herein may be concentrated or dispersed relative to one another.

圖1為根據本發明之實施例之電容偵測系統100的最高階層方塊圖。在說明之實施例中,如下文將較詳細闡釋地,可將電容偵測系統100用於存在的偵測及/或位置的偵測。在說明之實施例中,系統100包括電容感測區域模組115、電容測定模組105(其包括例如感測器介面模組125以及邏輯模組135),以及控制器模組145。在說明之實施例中,控制器介面155提供測定模組105與控制器模組145間的介面。 1 is a block diagram of the highest level of a capacitance detection system 100 in accordance with an embodiment of the present invention. In the illustrated embodiment, as will be explained in greater detail below, the capacitance detection system 100 can be used for detection of presence and/or detection of position. In the illustrated embodiment, the system 100 includes a capacitive sensing area module 115, a capacitance measuring module 105 (including, for example, a sensor interface module 125 and a logic module 135), and a controller module 145. In the illustrated embodiment, the controller interface 155 provides an interface between the assay module 105 and the controller module 145.

模組105以及145中的每一者可由能夠執行如本文所定義以及闡釋之功能之軟體、硬體及/或韌體的任何組合所組成。電容偵測系統100之模組115、105以及145可被集中或相對於彼此而分散。舉例而言,假定觸控板或鍵作為輸入設備,則在一實施例中,控制器模組145可連同電容感測區域模組115以及測定模組105而包括於觸控板或鍵中,而在另一實施例中,控制器模組145可定位於觸控板或鍵外部。 Each of modules 105 and 145 can be comprised of any combination of software, hardware, and/or firmware capable of performing the functions as defined and illustrated herein. The modules 115, 105, and 145 of the capacitance detecting system 100 can be concentrated or dispersed relative to each other. For example, a touch panel or a key is used as an input device. In an embodiment, the controller module 145 can be included in the touch panel or the key together with the capacitive sensing area module 115 and the measuring module 105. In another embodiment, the controller module 145 can be positioned outside the touchpad or key.

在一實施例中,電容感測區域115中的每一電容感測器具有由介電材料所分離之兩個導體,其中大多數能量發現於導體間。接近特定電容感測器之指狀物或任何其他物件改變所述特定電容感測器的電容。(指狀物或任何其他物件可接近電容感測區域模組115,例如,觸摸至少包括電容感測區域115之諸如觸控板或鍵之輸入設備的覆蓋層)。 In one embodiment, each of the capacitive sensing regions 115 has two conductors separated by a dielectric material, with most of the energy found between the conductors. A finger or any other object proximate to a particular capacitive sensor changes the capacitance of the particular capacitive sensor. (Fingers or any other object may access the capacitive sensing area module 115, for example, by touching a cover layer of an input device such as a touch pad or key that includes at least the capacitive sensing area 115).

在一些實施例中,測定模組105尤其經組態以在每一累積循環期間對電容感測區域115中之電容感測器充電/放電一次或多次,且產生可由控制器模組145用以偵測指狀物或其他物件之存在及/或位置的資料。在下文中,自電容測定模組105提供至控制器模組145之資料在一些實施例中稱作“測定資料”。假定n>1(亦即,在電容感測區域115中存在一個以上之感測器)之實施例,電容感測區域115中之多個感測器視實施例而定可劃分成或可不劃分成與不同軸相關聯的感測器。舉例而言,在一些情形中,多個感測器110當需要關於一個以上之維度偵測指狀物或其他物件之位置時可劃分成與不同軸相關聯的感測器,且當不需要偵測位置或僅需要關於一維度偵測位置時可不劃分成與不同軸相關聯的感測器。 In some embodiments, the assay module 105 is specifically configured to charge/discharge the capacitive sensor in the capacitive sensing region 115 one or more times during each accumulation cycle, and is generated by the controller module 145 To detect the presence and/or location of a finger or other object. In the following, the information provided by the self-capacitance assay module 105 to the controller module 145 is referred to as "assay data" in some embodiments. Assuming an embodiment where n > 1 (i.e., more than one sensor is present in the capacitive sensing region 115), the plurality of sensors in the capacitive sensing region 115 may or may not be divided depending on the embodiment. A sensor associated with a different axis. For example, in some cases, multiple sensors 110 may be divided into sensors associated with different axes when needed to detect the position of more than one dimension of the finger or other object, and when not needed The detection of the position or the need to detect the position with respect to one dimension may not be divided into sensors associated with different axes.

在一實施例中,電容感測區域模組115中之多個電容感測器的佈局類似於美國專利第4,550,221號中所描述之佈局,所述美國專利以引用方式併入本文中。為了讀者之便利起見,圖2A說明電容感測區域模組115中之電容感測器之佈局的一實施例,其類似於在美國專利第4,550,221號中所說明以及描述之電容感測器的佈局。 In one embodiment, the layout of the plurality of capacitive sensors in the capacitive sensing region module 115 is similar to that described in U.S. Patent No. 4,550,221, the disclosure of which is incorporated herein by reference. For the convenience of the reader, FIG. 2A illustrates an embodiment of the layout of the capacitive sensor in the capacitive sensing region module 115, which is similar to the capacitive sensor illustrated and described in US Pat. No. 4,550,221. layout.

如在圖2A之實施例中所展示地,電容感測區域模組115包括基板228,例如,印刷電路板(PCB),其支撐導電板230之第一以及第二交錯緊密間隔的陣列。導電板230例如由作為覆蓋層之絕緣薄層覆蓋。舉例而言,導電板230可為沈積於基板228之頂部表面上的導電金屬薄板。以行 以及列來排列第一陣列之板。作為非限制性實例,在圖2A中,以十三行以及十二列來排列第一陣列之板(在下文中稱作X感測器)。舉例而言,感測器236以及238為X感測器的實例。第二陣列由亦以行以及列所排列之板組成。作為非限制性實例,在圖2A中,以十二行以及十三列來排列第二陣列之板(在下文中稱作Y感測器)。舉例而言,感測器232以及234為Y感測器的實例。在一實施例中,選擇列Y1-Y12以及行X1-X12之板230之尺寸以及間隔,使得當指狀物或另一物件置放於感測器附近(例如,接觸絕緣層)時,指狀物或其他物件的存在改變周圍大地(ambient ground)與列Y1-Y12中之至少一者(亦即,Y感測器中之至少一者中的電容改變)以及行X1-X12中之至少一者(亦即,X感測器中之至少一者中的電容改變)之板之間的電容。 As shown in the embodiment of FIG. 2A, the capacitive sensing area module 115 includes a substrate 228, such as a printed circuit board (PCB), that supports the first and second interleaved closely spaced arrays of conductive plates 230. The conductive plate 230 is covered, for example, by an insulating thin layer as a cover layer. For example, the conductive plate 230 may be a conductive metal thin plate deposited on the top surface of the substrate 228. Take the line And a column to arrange the plates of the first array. As a non-limiting example, in FIG. 2A, the plates of the first array (hereinafter referred to as X sensors) are arranged in thirteen rows and twelve columns. For example, sensors 236 and 238 are examples of X sensors. The second array consists of plates that are also arranged in rows and columns. As a non-limiting example, in FIG. 2A, the plates of the second array (hereinafter referred to as Y sensors) are arranged in twelve rows and thirteen columns. For example, sensors 232 and 234 are examples of Y sensors. In one embodiment, the dimensions and spacing of the columns 230 of columns Y1-Y12 and rows X1-X12 are selected such that when the fingers or another object is placed adjacent to the sensor (eg, in contact with the insulating layer), The presence of the object or other item changes at least one of the ambient ground and the columns Y1-Y12 (ie, the capacitance change in at least one of the Y sensors) and at least one of the rows X1-X12 The capacitance between the plates of one (ie, the capacitance change in at least one of the X sensors).

儘管在圖2A中感測器展示佈局於柵格中,但可使用任何適當佈局。舉例而言,圖2B說明根據本發明之另一實施例之模組115中之十個電容感測器(2B1至2B10)的佈局。儘管在圖2A中Y感測器以及X感測器展示為鑽石形,但在其他實施例中可代替地使用允許感測器適當地間隔開之任何形狀(例如,圓形、正方形等)。舉例而言,圖2C展示四個感測器,2C1至2C4具有不同形狀。儘管在圖2A中展示十二個X感測器以及十二個Y感測器,但X感測器以及Y感測器之數目並不由本發明限於圖2A中所出 現的數目。舉例而言,在一實施例中,可存在十二個X感測器以及十五個Y感測器。 Although the sensor display layout is in the grid in Figure 2A, any suitable layout can be used. For example, Figure 2B illustrates the layout of ten capacitive sensors (2B1 through 2B10) in module 115 in accordance with another embodiment of the present invention. Although the Y sensor and the X sensor are shown in diamond shape in FIG. 2A, any shape (eg, circular, square, etc.) that allows the sensors to be properly spaced may alternatively be used in other embodiments. For example, Figure 2C shows four sensors, 2C1 through 2C4 having different shapes. Although twelve X sensors and twelve Y sensors are shown in FIG. 2A, the number of X sensors and Y sensors is not limited by the present invention to that shown in FIG. 2A. The current number. For example, in one embodiment, there may be twelve X sensors and fifteen Y sensors.

視實施例而定,可在任何適當座標系統中使用任何適當數目之維度來表示接近電容感測區域115之物件的位置偵測。座標系統之實例包括笛卡爾座標系統、極座標系統、圓柱座標系統、球座標系統、地理座標系統等。 Depending on the embodiment, any suitable number of dimensions may be used in any suitable coordinate system to indicate position detection of an object proximate to the capacitive sensing region 115. Examples of coordinate systems include Cartesian coordinate systems, polar coordinate systems, cylindrical coordinate systems, ball coordinate systems, geographic coordinate systems, and the like.

再次參看圖1的實施例,其中感測器介面模組125以及邏輯模組135展示為測定模組105之分離區塊。應顯而易見在本發明之一些實施例中,可由單一區塊來表示感測器介面模組125以及邏輯模組135的功能性,及/或可將感測器介面模組125以及邏輯模組135中之任一者或每一者之功能性劃分至多個區塊中。 Referring again to the embodiment of FIG. 1, sensor interface module 125 and logic module 135 are shown as separate blocks of assay module 105. It should be apparent that in some embodiments of the present invention, the functionality of the sensor interface module 125 and the logic module 135 may be represented by a single block, and/or the sensor interface module 125 and the logic module 135 may be The functionality of either or each of the functions is divided into multiple blocks.

圖3說明根據本發明的實施例之電容偵測系統100,其中感測器介面125以及邏輯模組135各自劃分至子區塊中。在圖3中所說明之實施例中,感測器介面模組125包括比較器模組310以及充電/放電模組320,而邏輯模組135包括計數器模組330以及時脈模組340。模組310、320、330以及340中的每一者可由能夠執行如本文所定義以及闡釋之功能之軟體、硬體及/或韌體的任何組合所組成。 3 illustrates a capacitance detection system 100 in which a sensor interface 125 and a logic module 135 are each partitioned into sub-blocks in accordance with an embodiment of the present invention. In the embodiment illustrated in FIG. 3 , the sensor interface module 125 includes a comparator module 310 and a charging/discharging module 320 , and the logic module 135 includes a counter module 330 and a clock module 340 . Each of the modules 310, 320, 330, and 340 can be comprised of any combination of software, hardware, and/or firmware capable of performing the functions as defined and illustrated herein.

在圖3中所說明之實施例中,輸入時脈375經提供至時脈模組340,且輸入時脈375之源並不受本發明限制。舉例而言,輸入時脈375可為電容偵測系統100的系統時脈、包含電容偵測系統100之系統的系統時脈、由控制器145提供、由模組105內部產生等。時脈模組340尤其經 組態以將充電/放電控制指示360提供至充電/放電模組320。充電/放電模組320尤其經組態以基於接收之充電/放電控制指令360來對電容感測區域模組115中之電容感測器充電及/或放電。比較器模組310尤其經組態以基於充電的電容感測器及/或放電的電容感測器上的電壓來將計數器啟用指令380提供至計數器模組330。計數器模組330尤其經組態以在啟用時執行,從而,量測反映充電及/或放電的電容感測器之電容的時間間隔。量測之時間間隔337(其為測定資料之實例)經由控制器介面155提供至控制器145,及/或可提供至電容偵測系統100中或包括電容偵測系統100之系統中的任何其他模組。 In the embodiment illustrated in FIG. 3, input clock 375 is provided to clock module 340, and the source of input clock 375 is not limited by the present invention. For example, the input clock 375 can be the system clock of the capacitance detecting system 100, the system clock of the system including the capacitance detecting system 100, provided by the controller 145, generated internally by the module 105, and the like. The clock module 340 is especially The configuration is provided to provide a charge/discharge control indication 360 to the charge/discharge module 320. The charge/discharge module 320 is specifically configured to charge and/or discharge the capacitive sensors in the capacitive sensing region module 115 based on the received charge/discharge control commands 360. The comparator module 310 is specifically configured to provide a counter enable command 380 to the counter module 330 based on the voltage on the charged capacitive sensor and/or the discharged capacitive sensor. The counter module 330 is especially configured to be executed when enabled, thereby measuring the time interval of the capacitance of the capacitive sensor reflecting the charging and/or discharging. The time interval 337 of the measurement (which is an example of the measured data) is provided to the controller 145 via the controller interface 155 and/or any other that may be provided to the capacitance detection system 100 or the system including the capacitance detection system 100 Module.

注意,時間間隔可為電容感測器之電容之函數,且因此時間間隔(例如,與感測器相關聯之量測的時間間隔337)之量測可在一些情形中替代量測感測器的電容。因此,現提供電容與時間之間的關係的簡短闡釋。 Note that the time interval can be a function of the capacitance of the capacitive sensor, and thus the measurement of the time interval (eg, the time interval 337 of the measurement associated with the sensor) can replace the measurement sensor in some cases. Capacitance. Therefore, a brief explanation of the relationship between capacitance and time is now provided.

如此項技術中所熟知地,流過電容器之電流i由以下方程式給出: As is well known in the art, the current i flowing through the capacitor is given by the following equation:

其中C為電容器之電容,且為電容器上之隨時間推移之電壓的改變。 Where C is the capacitance of the capacitor, and It is the change in voltage over time on the capacitor.

重排列方程式可得到: Rearrange the equations to get:

重排列之方程式說明電容器上之電壓之改變速率(導數)的倒數(亦即,電容器上之電壓改變的時間間隔)等於電容器之電容除以流過電容器的電流。電容器上之電壓改變之時間間隔為電容器之電容的單調函數,因為時間間隔在較大電容下比在較小電容下大。舉例而言,在累積量測電壓在電容器上改變之一個以上之時間間隔的情形中,可認為表示一個以上之時間間隔之量測結果是電容器之電容的單調函數,因為量測結果為電容器之平均電容之單調函數,其在較大平均電容下比在較小平均電容下還大。 The rearrangement equation illustrates the reciprocal of the rate of change (derivative) of the voltage across the capacitor (i.e., the time interval at which the voltage across the capacitor changes) equals the capacitance of the capacitor divided by the current flowing through the capacitor. The time interval at which the voltage across the capacitor changes is a monotonic function of the capacitance of the capacitor because the time interval is greater at larger capacitances than at smaller capacitances. For example, in the case where the cumulative measurement voltage is changed over one or more time intervals on the capacitor, it can be considered that the measurement result indicating more than one time interval is a monotonic function of the capacitance of the capacitor because the measurement result is a capacitor The monotonic function of the average capacitance, which is larger at larger average capacitance than at smaller average capacitance.

再次參看圖1以及3。在一實施例中,測定模組105可包括與感測模組115中之每一電容感測器相關聯的個別功能性。在另一實施例中,額外地,測定模組105中之功能性可與一個以上之電容感測器相關聯(假定在電容感測區域115中存在多個電容感測器)。在一些實施例中(其中在電容感測區域模組115中存在多個電容感測器),模組310、320、330以及340中的每一者可包括或可不包括與電容感測器中之一個以上者相關聯的功能性。 See Figures 1 and 3 again. In an embodiment, the assay module 105 can include individual functionality associated with each of the capacitive sensors 115. In another embodiment, additionally, the functionality in the assay module 105 can be associated with more than one capacitive sensor (assuming there are multiple capacitive sensors in the capacitive sensing region 115). In some embodiments (wherein multiple capacitive sensors are present in the capacitive sensing area module 115), each of the modules 310, 320, 330, and 340 may or may not be included with the capacitive sensor The functionality associated with one or more of them.

為了圖3之一些實施例之進一步說明,假定比較器模組310中的每一相異元件包括m個複本(copies)(m1)、充電/放電模組320中之每一相異元件包括1個複本(l1)、計數器模組330中之每一相異元件包括k個複本(k1),且時脈模組340中的每一相異元件包括j個複本(j1)。 視實施例而定,j、k、l以及m中之任兩者可為相同數目或可不為相同數目,且j、k、l以及m中之每一者可等於n或可不等於n(其中n為如以上所闡釋之模組115中之電容感測器的數目)。舉例而言,假定j、k、l及/或m小於n且n大於1之實施例,則在此等實施例中之一些實施例中,可允許與一個以上之電容感測器相關聯的特定複本關於相關聯之感測器中的至少兩者來並行操作,而在其他實施例中,可能需要特定複本在非重疊時間下關於不同感測器來操作。繼續所述實例,在一些情形中,特定複本可經組態以在某一時間下關於(一或多個)X感測器以及不同(非重疊)時間下關於(一或多個)Y感測器來操作。仍繼續所述實例,特定模組310、320、330或340可在一些情形中包括每一者經允許關於至少兩個感測器並行操作的複本、每一者經強制在非重疊時間下關於不同感測器操作之複本,及/或每一者僅與一感測器相關聯之複本。作為另一實例,在一些實施例中,j、k、l及/或m可等於1,其中n>1,其意謂具有一複本的每一元件可關於電容感測區域模組115中之所有感測器來操作(例如,對於至少兩個感測器並行地操作,或例如,關於不同感測器非並行地操作)。作為另一實例,j、k、l及/或m可等於n,且因此,具有n個複本之每一元件可使每一複本與不同電容感測器相關聯。 For further explanation of some embodiments of FIG. 3, it is assumed that each distinct component in comparator module 310 includes m copies (m 1) Each of the different components in the charging/discharging module 320 includes one copy (l 1) Each of the different components in the counter module 330 includes k replicas (k 1), and each distinct component in the clock module 340 includes j replicas (j 1). Depending on the embodiment, either of j, k, l, and m may be the same number or may not be the same number, and each of j, k, l, and m may be equal to n or may not be equal to n (where n is the number of capacitive sensors in the module 115 as explained above). For example, assuming that embodiments in which j, k, l, and/or m are less than n and n is greater than 1, in some embodiments of these embodiments, one or more capacitive sensors may be allowed to be associated A particular replica operates in parallel with respect to at least two of the associated sensors, while in other embodiments, it may be desirable for a particular replica to operate with respect to different sensors at non-overlapping times. Continuing with the example, in some cases, a particular replica can be configured to have a sense of (one or more) Y(s) with respect to (one or more) X sensors and different (non-overlapping) times at a time The detector is operated. Continuing with the example, the particular module 310, 320, 330, or 340 can, in some cases, include replicas that each allow for parallel operation with respect to at least two sensors, each forced to be at non-overlapping time A copy of the different sensor operations, and/or each of which is associated with only one replica of the sensor. As another example, in some embodiments, j, k, l, and/or m can be equal to 1, where n > 1, which means that each component having a replica can be associated with the capacitive sensing region module 115. All sensors operate (eg, operate in parallel for at least two sensors, or, for example, operate non-parallel with respect to different sensors). As another example, j, k, l, and/or m can be equal to n, and thus, each element having n replicas can associate each replica with a different capacitive sensor.

圖4為根據本發明之實施例之電容偵測系統100的方塊圖。在圖4中所說明之實施例中,假定存在多個電容感 測器。在說明之實施例中,時脈模組340包括各自具有一與電容感測區域模組115中之所有電容感測器相關聯之複本的元件(亦即,在圖4之說明實施例中j=1),但比較器模組310、充電放電模組320以及計數器模組330包括各自針對電容感測區域模組115中之每一電容感測器具有個別複本的元件(亦即,在圖4之說明實施例中k、l以及m各自等於n)。應顯而易見在其他實施例中,j、k、l及/或m可與圖4之實施例中所示之數目不同。 4 is a block diagram of a capacitance detection system 100 in accordance with an embodiment of the present invention. In the embodiment illustrated in Figure 4, it is assumed that there are multiple senses of capacitance Detector. In the illustrated embodiment, the clock module 340 includes elements each having a replica associated with all of the capacitive sensors in the capacitive sensing region module 115 (i.e., in the illustrated embodiment of FIG. 4) =1), but the comparator module 310, the charging and discharging module 320, and the counter module 330 include components each having a separate replica for each of the capacitive sensing region modules 115 (ie, in the figure) In the illustrated embodiment, k, l, and m are each equal to n). It should be apparent that in other embodiments, j, k, l, and/or m may differ from the numbers shown in the embodiment of FIG.

在圖4中所說明的實施例中,時脈模組340包括時脈產生器模組444以及儲存模組(“暫存器”),所述儲存模組用於儲存影響測定模組105及/或控制器模組145之操作的一或多個可組態的操作參數。為了易於讀者理解,將(組態)暫存器劃分成模式暫存器448、控制暫存器450、抖動產生器暫存器452,以及狀態設定暫存器454,然而,不應將此劃分闡釋為具約束性。模組444、448、450及/或452中之每一者可由能夠執行如本文所定義以及闡釋之功能之軟體、硬體及/或韌體的任何組合所組成。下文進一步提供關於時脈產生器模組444以及暫存器448、450、452或454的較多細節。在一實施例中,可如下文將進一步較詳細地描述由控制器145及/或測定模組105來組態與暫存器448、450、452或454中之任一者相關聯的操作參數。儘管在圖4中所說明之實施例中假定j=1(亦即,時脈模組340中之暫存器444、448、450以及452中的每一者與電容感測區域模組115中之所有感測器相關聯),但此未必暗 示暫存器444、448、450以及452中之每一操作參數都組構了關於所有感測器之操作(如下文將較詳細闡釋者)。 In the embodiment illustrated in FIG. 4, the clock module 340 includes a clock generator module 444 and a storage module ("storage register"), and the storage module is configured to store the influence measurement module 105 and One or more configurable operational parameters of the operation of controller module 145. For ease of understanding by the reader, the (configuration) register is divided into a mode register 448, a control register 450, a jitter generator register 452, and a state setting register 454, however, this should not be divided. Interpretation is binding. Each of modules 444, 448, 450, and/or 452 can be comprised of any combination of software, hardware, and/or firmware capable of performing the functions as defined and illustrated herein. Further details regarding the clock generator module 444 and the registers 448, 450, 452 or 454 are provided further below. In an embodiment, the operational parameters associated with any of the registers 448, 450, 452, or 454 can be configured by the controller 145 and/or the assay module 105 as described in further detail below. . Although j=1 is assumed in the embodiment illustrated in FIG. 4 (ie, each of the registers 444, 448, 450, and 452 in the clock module 340 and the capacitive sensing area module 115 All sensors are associated), but this may not be dark Each of the operational parameters of the display registers 444, 448, 450, and 452 are organized with respect to the operation of all of the sensors (as explained in greater detail below).

在一些實施例中,可存在包括於時脈模組340中的較多、較少及/或不同的功能性,且/或可將由時脈模組340所提供之功能性劃分至比圖4中所示之模組更少、更多及/或與其不同的模組中。在一些實施例中,可額外地由暫存器448、450、452或454中之另一者來提供下文中描述為屬於特定暫存器448、450、452或454之功能性。在一些實施例中,可存在暫存器448、450、452及/或454的一個以上之複本,其中特定暫存器之每一複本具有與一或多個不同感測器相關聯的可組態的參數。在一些實施例中,可存在較少、較多及/或不同的暫存器,其提供如本文針對暫存器448、450、452或454所描述之相同、增強或降級之功能性。在一些實施例中,本文描述為可經由暫存器448、450、452及/或454中之任一者來組態之操作參數中的一些操作參數可不為可組態的,例如,一些參數可經建構(例如,硬編碼、硬連線等)及/或基於其他可組態及/或不可組態的參數。在一些實施例中,可存在比本文所描述之操作參數少、多及/或與其不同之影響測定模組105及/或控制器模組145之操作的操作參數。 In some embodiments, there may be more, less, and/or different functionality included in the clock module 340, and/or the functionality provided by the clock module 340 may be partitioned into FIG. 4 The modules shown are fewer, more, and/or different from the modules. In some embodiments, the functionality described below as belonging to a particular register 448, 450, 452, or 454 may additionally be provided by the other of the registers 448, 450, 452, or 454. In some embodiments, there may be more than one copy of the registers 448, 450, 452, and/or 454, wherein each copy of the particular register has a group that is associated with one or more different sensors State parameters. In some embodiments, there may be fewer, more, and/or different registers that provide the same, enhanced, or degraded functionality as described herein for the registers 448, 450, 452, or 454. In some embodiments, some of the operational parameters described herein as configurable via any of the registers 448, 450, 452, and/or 454 may not be configurable, for example, some parameters It can be constructed (eg, hard coded, hardwired, etc.) and/or based on other configurable and/or non-configurable parameters. In some embodiments, there may be fewer, more, and/or different operational parameters that affect the operation of assay module 105 and/or controller module 145 than those described herein.

在圖4中所說明之實施例中,假定電容感測區域115中之n個電容感測器包括h個X感測器以及i個Y感測器(h、i1且h+i=n)。亦假定在圖4中所說明的實施例中,存在對應於電容感測器中之每一者的個別比較器410(展 示四個比較器410,即,4101、4102、410N-1、410N)、存在對應於電容感測器中之每一者的個別充電/放電電路420(展示四個充電放電電路420,即,4201、4202、420N-1、420N),且存在對應於電容感測器中之每一者的個別計數器430(展示四個計數器430,即,4301、4302、430N-1、430N)。在其他實施例中,k、l及/或m可小於n。在其他實施例中,可在一維度中佈局圖4中所說明之多個感測器(例如,可僅包括X感測器或僅包括Y感測器)。 In the embodiment illustrated in FIG. 4, it is assumed that n capacitive sensors in the capacitive sensing region 115 include h X sensors and i Y sensors (h, i) 1 and h+i=n). It is also assumed that in the embodiment illustrated in Figure 4, there are individual comparators 410 corresponding to each of the capacitive sensors (showing four comparators 410, i.e., 410 1 , 410 2 , 410 N-1 , 410 N), corresponding to the presence of each of the individual charge in the capacitive sensing / discharging circuit 420 (shown four charge and discharge circuit 420, i.e., 420 1, 420 2, 420 N-1, 420 N), And there are individual counters 430 corresponding to each of the capacitive sensors (showing four counters 430, ie, 430 1 , 430 2 , 430 N-1 , 430 N ). In other embodiments, k, l, and/or m may be less than n. In other embodiments, the plurality of sensors illustrated in FIG. 4 may be laid out in one dimension (eg, may include only X sensors or only Y sensors).

在圖4中,除了以上所論述之充電/放電控制信號360以及計數器啟用信號380外,說明根據本發明之一實施例之模組間的額外信號。在說明之實施例中,將例如由時脈產生器444所產生的計數器時脈442提供至計數器440。在說明之實施例中,假定將相同計數器時脈442提供至每一計數器440,但在其他實施例中,可將不同計數器時脈442提供至不同計數器440。計數器啟用組態信號470由時脈模組340提供至比較器410。下文將較詳細闡釋計數器啟用組態信號。 In FIG. 4, additional signals between modules in accordance with an embodiment of the present invention are illustrated in addition to the charge/discharge control signals 360 and counter enable signals 380 discussed above. In the illustrated embodiment, counter clock 442, such as generated by clock generator 444, is provided to counter 440. In the illustrated embodiment, it is assumed that the same counter clock 442 is provided to each counter 440, but in other embodiments, different counter clocks 442 may be provided to different counters 440. The counter enable configuration signal 470 is provided by the clock module 340 to the comparator 410. The counter enable configuration signal is explained in more detail below.

圖5說明根據本發明之實施例之關於來自電容感測區域115的一電容感測器502之詳細電容偵測系統的方塊圖。為了說明之簡潔性起見,由電容器(使用電容器符號)來表示電容感測器502。假定具有X以及Y感測器之實施例,感測器502可為X或Y感測器。為了說明之簡潔性起見,圖5中所示的實施例假定電容感測區域模組115中之每一電容感測器與個別比較器模組410、計數器模組430 以及充電/放電模組420相關聯,或多個電容感測器與相同的410、430及/或420相關聯,但相關聯之感測器中的每一者在分離的時間下對於共用的410、430及/或420來操作。為了說明之簡潔性起見,圖5中之實施例亦假定電容感測區域115中的所有感測器與相同時脈模組時脈產生器444以及暫存器448、450、452以及454相關聯。為了易於理解,在描述中,與感測器502相關之信號的數字標籤藉由以“5”開始來區別於與電容感測區域115中之所有感測器相關的信號,例如,計數器時脈542、充電/放電控制560、計數器啟用組態570、計數器啟用580,然而,視實施例而定,與感測器502相關聯之信號可相異於或可不相異於與其他感測器相關的信號。 FIG. 5 illustrates a block diagram of a detailed capacitance sensing system for a capacitive sensor 502 from capacitive sensing region 115, in accordance with an embodiment of the present invention. For the sake of simplicity of the description, the capacitive sensor 502 is represented by a capacitor (using a capacitor symbol). Assuming an embodiment with X and Y sensors, sensor 502 can be an X or Y sensor. For the sake of simplicity of the description, the embodiment shown in FIG. 5 assumes each of the capacitive sensing area modules 115 and the individual comparator modules 410 and counter modules 430. And the charge/discharge module 420 is associated, or the plurality of capacitive sensors are associated with the same 410, 430, and/or 420, but each of the associated sensors is shared at separate times 410, 430 and/or 420 operate. For simplicity of description, the embodiment of FIG. 5 also assumes that all of the sensors in capacitive sensing region 115 are associated with the same clock module clock generator 444 and registers 448, 450, 452, and 454. Union. For ease of understanding, in the description, the digital label of the signal associated with sensor 502 is distinguished from the signals associated with all of the sensors in capacitive sensing region 115 by starting with "5", for example, the counter clock. 542, charge/discharge control 560, counter enable configuration 570, counter enable 580, however, depending on the embodiment, the signals associated with sensor 502 may or may not be different from other sensors. signal of.

在圖5之說明實施例中,與電容感測器502相關聯之充電/放電模組420包括充電/放電電路522。在說明的實施例中,與電容感測器502相關聯之比較器模組410包括第一比較器514以及第二比較器516以及啟用模組512。在說明之實施例中,與電容感測器502相關聯的計數器模組430包括計數器530。 In the illustrated embodiment of FIG. 5, the charge/discharge module 420 associated with the capacitive sensor 502 includes a charge/discharge circuit 522. In the illustrated embodiment, the comparator module 410 associated with the capacitive sensor 502 includes a first comparator 514 and a second comparator 516 and an enable module 512. In the illustrated embodiment, the counter module 430 associated with the capacitive sensor 502 includes a counter 530.

在圖5中所說明之實施例中,當由時脈模組340所發射之充電/放電控制信號560指示電容感測器502應充電時,充電/放電電路522引起電容感測器502充電。當充電/放電控制信號560指示感測器502應放電時,充電/放電電路522引起感測器502放電。將電容感測器502上的電壓518提供至第一比較器514以及第二比較器516。 In the embodiment illustrated in FIG. 5, when the charge/discharge control signal 560 emitted by the clock module 340 indicates that the capacitive sensor 502 should be charged, the charge/discharge circuit 522 causes the capacitive sensor 502 to charge. When the charge/discharge control signal 560 indicates that the sensor 502 should be discharged, the charge/discharge circuit 522 causes the sensor 502 to discharge. Voltage 518 on capacitive sensor 502 is provided to first comparator 514 and second comparator 516.

注意在圖5中所說明之實施例中,可獨立於電容感測器502上之電壓518的值來控制電容感測器502之充電以及放電的時序。下文進一步提供關於在一些實施例中控制電容感測區域115中之感測器之充電以及放電之時序的較多細節。 Note that in the embodiment illustrated in FIG. 5, the timing of charging and discharging of capacitive sensor 502 can be controlled independently of the value of voltage 518 on capacitive sensor 502. Further details regarding the timing of controlling the charging and discharging of the sensors in the capacitive sensing region 115 in some embodiments are provided below.

充電/放電電路522中所包含之元件可視實施例而定來變化且並不限於任何特定組態。在一實施例中,充電/放電電路522包括連接至正壓電源(Vcc)之電流源、與電流源串聯之第一開關,以及與電容感測器502並聯的第二開關。在此實施例中,當充電/放電控制信號560指示充電時,第一開關關閉且第二開關打開,其引起電容感測器110由電流源提供之恆定電流來充電。類似地,在此實施例中,當充電/放電控制信號560指示放電時,第一開關打開且第二開關關閉,其允許電容感測器502經由第二開關放電至大地。讀者將理解在其他實施例中,充電/放電電路522可包含將提供充電以及放電功能性之在不同組態中的元件。 The components included in the charge/discharge circuit 522 may vary depending on the embodiment and are not limited to any particular configuration. In one embodiment, the charge/discharge circuit 522 includes a current source coupled to a positive voltage source (Vcc), a first switch in series with the current source, and a second switch in parallel with the capacitive sensor 502. In this embodiment, when the charge/discharge control signal 560 indicates charging, the first switch is turned off and the second switch is turned on, which causes the capacitive sensor 110 to be charged by a constant current provided by the current source. Similarly, in this embodiment, when the charge/discharge control signal 560 indicates a discharge, the first switch is open and the second switch is closed, which allows the capacitive sensor 502 to discharge to ground via the second switch. The reader will understand that in other embodiments, the charge/discharge circuit 522 can include components that will provide charging and discharging functionality in different configurations.

充電/放電控制信號560以及充電/放電電路522在圖5之實施例中說明為可影響電容感測器502之充電以及放電。在另一實施例中,可存在影響電容感測器502之充電以及影響電容感測器502之放電的分離的功能性。 Charge/discharge control signal 560 and charge/discharge circuit 522 are illustrated in the embodiment of FIG. 5 to affect the charging and discharging of capacitive sensor 502. In another embodiment, there may be separate functionality that affects the charging of capacitive sensor 502 and affects the discharge of capacitive sensor 502.

繼續圖5之實施例之描述,第一比較器514將感測器電壓518與低壓(參考)位準517比較,且產生視感測器電壓518是高於還是低於低壓位準517而定而變化的輸出 511。第二比較器516將感測器電壓518與高壓(參考)位準519比較,且產生視感測器電壓518是高於還是低於高壓位準519而定而變化之輸出513。在另一實施例中,可將比較器514以及516之功能性組合於單一比較元件中。 Continuing with the description of the embodiment of FIG. 5, the first comparator 514 compares the sensor voltage 518 to the low voltage (reference) level 517 and produces a visual sensor voltage 518 that is above or below the low voltage level 517. Changed output 511. The second comparator 516 compares the sensor voltage 518 with the high voltage (reference) level 519 and produces an output 513 that varies depending on whether the senser voltage 518 is above or below the high voltage level 519. In another embodiment, the functionality of comparators 514 and 516 can be combined into a single comparison element.

當參照(refer to)電壓位準517以及519時,術語低以及高應理解為相對於彼此而言,且因此高壓位準519大於低壓位準517。低壓位準517以及高壓位準519的值並不受本發明限制。在一些情形中電壓值517以及519隨時間推移而為恆定的,且在其他情形中電壓值517以及519可隨時間推移而變化。在一實施例中,電壓值517以及519均為非零。 When referring to voltage levels 517 and 519, the terms low and high are understood to be relative to each other, and thus high voltage level 519 is greater than low voltage level 517. The values of low pressure level 517 and high pressure level 519 are not limited by the present invention. In some cases voltage values 517 and 519 are constant over time, and in other cases voltage values 517 and 519 may change over time. In an embodiment, voltage values 517 and 519 are both non-zero.

在一些情形中,可存在針對低壓位準517以及高壓位準519之值均為非零之實施例的優點。在此等情形中之一些情形中,使用零值可比使用非零值時具有更低的抗雜訊的穩定性。在此等情形中之一些情形中,另一方式或此外,值零可在電容器502之充電/放電曲線的非線性範圍內且因此較不穩定。 In some cases, there may be advantages to embodiments in which the low pressure level 517 and the high pressure level 519 are all non-zero. In some of these situations, using a zero value can have lower anti-noise stability than using a non-zero value. In some of these situations, another way or in addition, the value zero may be within the non-linear range of the charge/discharge curve of capacitor 502 and is therefore less stable.

在一些實施例中,低壓位準517以及高壓位準519各自在零與供應電壓(Vcc)間。在此等實施例中之一者的一(非限制性)實例中,低壓位準517大於零且小於或等於正壓電源Vcc之三分之一(亦即,0<V517 Vcc/3),且高壓位準519等於或大於Vcc的三分之二且小於或等於Vcc(亦即,2/3VccV519 Vcc)。在此實施例中,在一些情形中,低壓位準517與高壓位準519間之電壓範圍對應於在充電 或放電期間感測器502上的電壓518之圖表之“較為線性”的區段。 In some embodiments, low voltage level 517 and high voltage level 519 are each between zero and supply voltage (Vcc). In one (non-limiting) example of one of these embodiments, the low voltage level 517 is greater than zero and less than or equal to one-third of the positive voltage source Vcc (ie, 0 < V 517 Vcc/3), and the high voltage level 519 is equal to or greater than two-thirds of Vcc and less than or equal to Vcc (ie, 2/3 Vcc) V 519 Vcc). In this embodiment, in some cases, the voltage range between the low voltage level 517 and the high voltage level 519 corresponds to a "more linear" section of the graph of the voltage 518 on the sensor 502 during charging or discharging.

再次參看圖5中所說明的實施例,使自第一比較器514之輸出511、自第二比較器516之輸出513,以及計數器啟用組態信號570提供至啟用模組512。啟用模組512輸出計數器啟用信號580,其引起與感測器502相關聯的計數器530開始執行或不執行。在一些實施例中,計數器530藉此而被組態以在感測器502上之電壓518在低壓位準517與高壓位準519間變動的時間間隔期間(其中電壓518可正增大及/或正減小)執行。在此等實施例中之一者中,計數器530經組態以在感測器502上之電壓518自低壓位準517增大至高壓位準519的時間間隔期間(當充電時)執行。在此等實施例中之另一者中,計數器530另外或此外經組態以在感測器502上之電壓518自高壓位準519減小至低壓位準517的時間間隔期間(當放電時)運行。在一實施例中,當電壓518在充電期間、在放電期間,或在感測器502之充電以及放電期間於低壓位準517與高壓位準519間變動時,計數器啟用組態信號570控制是否使計數器530運行。在本文之論述中,應理解視實施例而定,當計數器530運行時,低壓值517與高壓值519間的範圍可包括或可不包括低壓值517及/或高壓值519。 Referring again to the embodiment illustrated in FIG. 5, output 511 from first comparator 514, output 513 from second comparator 516, and counter enable configuration signal 570 are provided to enable module 512. The enable module 512 outputs a counter enable signal 580 that causes the counter 530 associated with the sensor 502 to begin or not execute. In some embodiments, counter 530 is thereby configured to have a voltage 518 across sensor 502 that varies between low voltage level 517 and high voltage level 519 (where voltage 518 can be positively increased and / Or is decreasing) execution. In one of these embodiments, the counter 530 is configured to execute during a time interval (when charging) that the voltage 518 on the sensor 502 increases from the low voltage level 517 to the high voltage level 519. In the other of these embodiments, the counter 530 is additionally or additionally configured to reduce the voltage 518 on the sensor 502 from the high voltage level 519 to the low voltage level 517 (when discharging) )run. In one embodiment, the counter enable configuration signal 570 controls whether voltage 518 is varied between low voltage level 517 and high voltage level 519 during charging, during discharging, or during charging and discharging of sensor 502. The counter 530 is operated. In the discussion herein, it should be understood that depending on the embodiment, the range between the low pressure value 517 and the high pressure value 519 may or may not include the low pressure value 517 and/or the high voltage value 519 when the counter 530 is operating.

如在圖5之實施例中所說明地,啟用模組512在計數器530外部,但在另一實施例中,啟用模組512可併入至計數器530中。 As illustrated in the embodiment of FIG. 5, the enablement module 512 is external to the counter 530, but in another embodiment, the enablement module 512 can be incorporated into the counter 530.

如在圖5之實施例中所展示地,將計數器時脈542提供至計數器530。因此,當計數器530執行時,計數器530計數計數器時脈542的循環次數。因此,在說明之實施例中,由計數器530以計數器時脈循環之“單位”或“計數”來量測電容感測器502上之電壓在低壓位準517與高壓位準519間變動的時間間隔(亦即,計數器530計數計數器啟用信號580在“啟用”位準時計數器時脈循環的數目)。在其他實施例中,可以與計數器時脈542之循環之單位不同的單位來量測時間間隔。舉例而言,在此等實施例中之一者中,計數器542可代替地為以基於秒(例如,奈秒、微秒等)之單位來量測時間週期的元件。 Counter clock 542 is provided to counter 530 as shown in the embodiment of FIG. Thus, when counter 530 is executed, counter 530 counts the number of cycles of counter clock 542. Thus, in the illustrated embodiment, the counter 530 measures the time at which the voltage across the capacitive sensor 502 varies between the low voltage level 517 and the high voltage level 519 by the "unit" or "count" of the counter clock cycle. The interval (i.e., counter 530 counts the number of counter clock cycles at which the counter enable signal 580 is "on"). In other embodiments, the time interval may be measured in a different unit than the unit of the cycle of the counter clock 542. For example, in one of these embodiments, counter 542 may instead be an element that measures a time period in units of seconds (eg, nanoseconds, microseconds, etc.).

為了有助於讀者理解,根據一實施例,將與感測器502相關聯之感測器介面125以及與感測器502相關聯之計數器模組430的功能性劃分至圖5中所示之元件中,但不應認為劃分具約束性。在一些實施例中,可將功能性劃分至比圖5中所說明之元件少、多及/或與其不同的元件中。在一些實施例中,可將功能性不同地劃分至圖5中所說明之元件中。在一些實施例中,圖5中之任何元件可具有比本文所描述之功能性多、少及/或與其不同的功能性。 To facilitate the reader's understanding, the functionality of the sensor interface 125 associated with the sensor 502 and the counter module 430 associated with the sensor 502 is divided into the functionality shown in FIG. 5, in accordance with an embodiment. In the component, but the division should not be considered to be binding. In some embodiments, the functionality may be partitioned into fewer, more, and/or different components than those illustrated in FIG. In some embodiments, the functionality may be divided differently into the elements illustrated in FIG. In some embodiments, any of the elements in FIG. 5 may have more or less functionality than described herein and/or functionality different therefrom.

圖6以及7說明根據本發明之各種實施例之當感測器502分別充電以及放電時與計數器530之操作相關的時序圖。 6 and 7 illustrate timing diagrams associated with operation of counter 530 when sensor 502 is separately charged and discharged, in accordance with various embodiments of the present invention.

如在圖6之實施例中所展示地,時序圖602說明隨時間推移之計數器時脈信號542。時序圖604說明隨時間推 移時該計數器530何時執行以及該計數器530何時不執行(停止)。時序圖605說明隨時間推移之計數器啟用信號580,其中在說明之實施例中,計數器啟用信號580為高以用於啟用且為低以用於停用。時序圖606說明隨時間推移之電容感測器502上之電壓518。時序圖608以及610分別說明隨時間推移之低壓位準517以及高壓位準519。時序圖612說明隨時間推移之充電/放電控制信號560,其中在說明的時序圖中,充電/放電控制信號560為高以用於充電且為低以用於放電。 As shown in the embodiment of FIG. 6, timing diagram 602 illustrates counter clock signal 542 over time. Timing diagram 604 illustrates pushing over time When the counter 530 is executed and when the counter 530 is not executed (stopped). Timing diagram 605 illustrates counter enable signal 580 over time, wherein in the illustrated embodiment, counter enable signal 580 is high for enable and low for deactivation. Timing diagram 606 illustrates voltage 518 on capacitive sensor 502 over time. Timing diagrams 608 and 610 illustrate low voltage level 517 and high voltage level 519, respectively, over time. Timing diagram 612 illustrates charge/discharge control signal 560 over time, wherein in the illustrated timing diagram, charge/discharge control signal 560 is high for charging and low for discharge.

在圖6中所說明之實施例中,在時間614,充電/放電控制信號560改變至“充電”位準(見時序圖612),且電容感測器502開始充電。當電容感測器502充電時,電容感測器502上之電壓518隨時間推移而增大(如由時序圖606所說明者)。在時間點616(t_low_n),電容感測器502上之電壓518到達低壓位準517(由時序圖606與時序圖608的交越(crossover)所說明)。因此,在時間點616,計數器啟用信號580改變至“啟用”位準(見時序圖605),且計數器530開始運行(如由時序圖604所說明者)。在一實施例中,時間點616為當到達低壓位準517時之時間點,而在另一實施例中,時間點616為當超過低壓位準517時的時間點。在時間點618(t_high_n),電容感測器502上之電壓518到達高壓位準519(由時序圖606與時序圖610之交越所說明)。因此,在時間點618,計數器啟用信號580改變至“停用”位準(見時序圖605),且計數器530停止 運行(見時序圖604)。在一實施例中,時間點618為當到達高壓位準519時之時間點,而在另一實施例中,時間點618為當超過高壓位準519時的時間點。時間△t_n表示在時間點616(t_low_n)與時間點618(t_high_n)間之時間差,亦即,計數器530運行之時間間隔。在時間點620,充電/放電控制信號560改變至“放電”位準(見時序圖612),且電容感測器110開始放電。在一實施例中,在放電期間,計數器530繼續被停用(亦即,不運行)。在另一實施例中,在放電期間,當感測器電壓518在低壓位準517與高壓位準519間變動時計數器530運行(如下文參看圖7所描述者)。在時間點626,充電/放電信號520完成一充電/放電循環,且因此說明之充電/放電週期T_c等於時間點614與時間點626間的時間差。在一實施例中,充電/放電循環520接著重複進行(亦即,其中充電/放電控制520在時間點626就像在時間點614一樣改變至“充電”位準)。 In the embodiment illustrated in FIG. 6, at time 614, the charge/discharge control signal 560 changes to a "charge" level (see timing diagram 612) and the capacitive sensor 502 begins to charge. As capacitive sensor 502 charges, voltage 518 on capacitive sensor 502 increases over time (as illustrated by timing diagram 606). At time point 616 (t_low_n), voltage 518 on capacitive sensor 502 reaches low voltage level 517 (illustrated by the crossover of timing diagram 606 and timing diagram 608). Thus, at time point 616, counter enable signal 580 changes to the "enabled" level (see timing diagram 605) and counter 530 begins to run (as illustrated by timing diagram 604). In one embodiment, time point 616 is the point in time when low pressure level 517 is reached, while in another embodiment, time point 616 is the point in time when low pressure level 517 is exceeded. At time point 618 (t_high_n), voltage 518 on capacitive sensor 502 reaches high voltage level 519 (illustrated by the crossover of timing diagram 606 and timing diagram 610). Thus, at time point 618, counter enable signal 580 changes to the "deactivated" level (see timing diagram 605) and counter 530 stops Run (see timing diagram 604). In one embodiment, time point 618 is the point in time when high pressure level 519 is reached, while in another embodiment, time point 618 is the point in time when high pressure level 519 is exceeded. The time Δt_n represents the time difference between the time point 616 (t_low_n) and the time point 618 (t_high_n), that is, the time interval during which the counter 530 operates. At time 620, charge/discharge control signal 560 changes to a "discharge" level (see timing diagram 612), and capacitive sensor 110 begins to discharge. In an embodiment, during discharge, counter 530 continues to be deactivated (i.e., not running). In another embodiment, during discharge, counter 530 operates when sensor voltage 518 varies between low voltage level 517 and high voltage level 519 (as described below with reference to FIG. 7). At time 626, the charge/discharge signal 520 completes a charge/discharge cycle, and thus the charge/discharge cycle T_c is illustrated as being equal to the time difference between time point 614 and time point 626. In one embodiment, the charge/discharge cycle 520 is then repeated (i.e., where charge/discharge control 520 changes to a "charge" level at time point 626 as at time point 614).

為了圖7之實施例之描述的簡潔性起見,假定分別隨時間推移之計數器時脈信號542、感測器電壓518、低壓位準517、高壓位準519以及充電/放電控制信號560的時序圖602、606、608、610以及612未自圖6中所描述之實施例改變。時序圖704說明隨時間推移時該計數器530何時運行以及該計數器530何時不運行(停止)。時序圖705說明隨時間推移之計數器啟用信號580。 For the sake of simplicity of the description of the embodiment of FIG. 7, the timing of the counter clock signal 542, the sensor voltage 518, the low voltage level 517, the high voltage level 519, and the charge/discharge control signal 560, respectively, over time is assumed. Figures 602, 606, 608, 610, and 612 are not altered from the embodiment depicted in Figure 6. Timing diagram 704 illustrates when counter 530 runs over time and when counter 530 does not run (stop). Timing diagram 705 illustrates counter enable signal 580 over time.

在圖7中所說明的實施例中,在時間614,充電/放電控制信號560改變至“充電”位準(見時序圖612),且電容感測器502開始充電。當電容感測器502充電時,電容感測器502上之電壓518隨時間推移而增大(如由時序圖606所說明者)。在一實施例中,計數器啟用信號580經啟用,且計數器530在充電的感測器502上之電壓518在低壓位準517與高壓位準519間變動的時間間隔期間運行(如以上參看圖6所描述者)。在另一實施例中,計數器啟用信號580未經啟用,且當感測器502充電時計數器530不運行。在時間點620,充電/放電控制信號560改變至“放電”位準(見時序圖612),且電容感測器110開始放電。在時間點722(t_high_n),電容感測器502上之電壓518到達高壓位準519(由時序圖606與時序圖610之交越所說明)。因此,在時間點722,計數器啟用信號580改變至“啟用”位準(見時序圖705),且計數器530開始執行(如由時序圖704所說明者)。在一實施例中,時間點722為當到達高壓位準519時之時間點,而在另一實施例中,時間點722為當電壓518在高壓位準519之下時的時間點。在時間點724(t_low_n),電容感測器502上之電壓518到達低壓位準517(由時序圖606與時序圖608之交越所說明)。因此,在時間點724,計數器啟用信號580改變至“停用”位準(見時序圖705),且計數器530停止執行(見時序圖704)。在一實施例中,時間點724為當到達低壓位準517時之時間點,而在另一實施例中,時間點724為當電 壓518在低壓位準517之下時的時間點。時間△t_n表示在時間點722(t_high_n)與時間點724(t_low_n)間之時間差,亦即,計數器530運行之時間間隔。在時間點626,充電/放電信號520完成一充電/放電循環,且因此說明之充電/放電週期T_c等於時間點614與時間點626間之時間差。在一實施例中,充電/放電循環520接著重複進行(亦即,其中充電/放電控制520在時間點626就像在時間點614一樣改變至“充電”位準)。 In the embodiment illustrated in FIG. 7, at time 614, the charge/discharge control signal 560 changes to the "charge" level (see timing diagram 612) and the capacitive sensor 502 begins to charge. As capacitive sensor 502 charges, voltage 518 on capacitive sensor 502 increases over time (as illustrated by timing diagram 606). In one embodiment, the counter enable signal 580 is enabled and the counter 530 operates during a time interval during which the voltage 518 on the charged sensor 502 varies between the low voltage level 517 and the high voltage level 519 (as described above with reference to FIG. 6). Described)). In another embodiment, the counter enable signal 580 is not enabled and the counter 530 is not running when the sensor 502 is charging. At time 620, charge/discharge control signal 560 changes to a "discharge" level (see timing diagram 612), and capacitive sensor 110 begins to discharge. At time point 722 (t_high_n), voltage 518 on capacitive sensor 502 reaches high voltage level 519 (illustrated by the crossover of timing diagram 606 and timing diagram 610). Thus, at time point 722, counter enable signal 580 changes to the "enabled" level (see timing diagram 705), and counter 530 begins execution (as illustrated by timing diagram 704). In one embodiment, time point 722 is the point in time when high voltage level 519 is reached, while in another embodiment, time point 722 is the point in time when voltage 518 is below high pressure level 519. At time point 724 (t_low_n), voltage 518 on capacitive sensor 502 reaches low voltage level 517 (illustrated by the crossover of timing diagram 606 and timing diagram 608). Thus, at time point 724, counter enable signal 580 changes to the "deactivate" level (see timing diagram 705), and counter 530 ceases execution (see timing diagram 704). In one embodiment, time point 724 is the point in time when low voltage level 517 is reached, while in another embodiment, time point 724 is current. The point in time when pressure 518 is below low pressure level 517. The time Δt_n represents the time difference between the time point 722 (t_high_n) and the time point 724 (t_low_n), that is, the time interval during which the counter 530 operates. At time 626, the charge/discharge signal 520 completes a charge/discharge cycle, and thus the charge/discharge cycle T_c is illustrated as being equal to the time difference between time point 614 and time point 626. In one embodiment, the charge/discharge cycle 520 is then repeated (i.e., where charge/discharge control 520 changes to a "charge" level at time point 626 as at time point 614).

參看圖6以及7,應注意分別展示於時序圖608以及610中之低壓位準以及高壓位準517以及519的值僅為可能的低壓位準以及高壓位準517以及519的一實例。在一實施例中,將低壓位準以及高壓位準517以及519中之一或兩者輸入至測定模組105中。在一實施例中,建構低壓位準517以及高壓位準519中之一或兩者,例如,以硬編碼/硬連線來建構。在一些實施例中,電壓位準517以及519中的一或兩者是基於可組態及/或不可組態的操作參數。舉例而言,在此等實施例中之一者中,等於低壓位準517以及高壓位準519中之每一者之Vcc的百分比可為可組態的。作為另一實例,在此等實施例中之一者中,低壓位準以及高壓位準517以及519可各自等於Vcc之已建構的百分比。在一些實施例中,電壓位準517以及519中之一或兩者為可組態的。在具有可組態參數之一些實施例中,低壓位準517及/或高壓位準519(或可組態的百分比)可獨立針對每一感測器、共同針對感測器之每一子集 (subset)或共同針對電容感測區域115中的所有感測器來組態。下文進一步給出子集之實例。 Referring to Figures 6 and 7, it should be noted that the low voltage levels shown in timing diagrams 608 and 610 and the values of high pressure levels 517 and 519, respectively, are only examples of possible low voltage levels and high pressure levels 517 and 519. In one embodiment, one or both of the low pressure level and the high pressure levels 517 and 519 are input to the assay module 105. In one embodiment, one or both of the low voltage level 517 and the high voltage level 519 are constructed, for example, hard coded/hardwired. In some embodiments, one or both of voltage levels 517 and 519 are based on configurable and/or non-configurable operating parameters. For example, in one of these embodiments, the percentage of Vcc equal to each of the low pressure level 517 and the high pressure level 519 can be configurable. As another example, in one of these embodiments, the low pressure level and high pressure levels 517 and 519 can each be equal to the constructed percentage of Vcc. In some embodiments, one or both of voltage levels 517 and 519 are configurable. In some embodiments with configurable parameters, the low voltage level 517 and/or the high voltage level 519 (or configurable percentage) can be independently for each sensor, collectively for each subset of the sensors (subset) or collectively configured for all of the sensors in the capacitive sensing region 115. Examples of subsets are further given below.

在一些實施例中,計數器啟用組態信號570可(例如)經由設定狀態暫存器454(見圖4或5)經組態成以下“計數器啟用”模式中的一者:當充電/放電控制信號560在“充電”位準時啟用、當充電/放電控制信號560在“放電”位準時啟用、當充電/放電控制信號560在“充電”位準以及在“放電”位準時啟用。因此,視模式而定,計數器啟用信號580可引起計數器530在充電的感測器502上之電壓在低壓位準與高壓位準517與519間變動的時間間隔期間(如圖6中所示)、在放電的感測器502上之電壓在低壓位準與高壓位準517與519間變動的時間間隔期間(如圖7中所示),或在此等時間間隔之兩者期間運行。在此等實施例中之一些實施例中,計數器啟用模式可針對電容感測區域115中的每一感測器而獨立設定,或針對電容感測區域115中之感測器的每一子集而共同設定,而在此等實施例中之另一者中,計數器啟用模式針對電容感測區域115中之所有感測器而共同設定。下文進一步給出子集的實例。在其他實施例中,計數器啟用模式為不可組態的,例如,模式可被建構或基於可組態及/或不可組態的操作參數。 In some embodiments, the counter enable configuration signal 570 can be configured, for example, via the set state register 454 (see FIG. 4 or 5) to one of the following "counter enabled" modes: when charging/discharging control Signal 560 is enabled at the "charge" level, enabled when charge/discharge control signal 560 is at the "discharge" level, and enabled when charge/discharge control signal 560 is at the "charge" level and at the "discharge" level. Thus, depending on the mode, the counter enable signal 580 can cause the counter 530 to change during the time interval between the low voltage level and the high voltage levels 517 and 519 of the voltage on the charged sensor 502 (as shown in FIG. 6). The voltage on the discharged sensor 502 operates during a time interval between the low voltage level and the high voltage levels 517 and 519 (as shown in Figure 7), or during both of these time intervals. In some of these embodiments, the counter enable mode can be set independently for each of the capacitive sensing regions 115, or for each subset of the sensors in the capacitive sensing region 115. Together, in the other of these embodiments, the counter enable mode is commonly set for all of the sensors in the capacitive sensing region 115. An example of a subset is further given below. In other embodiments, the counter enable mode is not configurable, for example, the mode can be constructed or based on configurable and/or non-configurable operational parameters.

為了描述之簡潔性起見,在圖6以及7之實施例的描述中,假定當充電/放電控制信號560為高時充電發生,且當計數器啟用信號580為高時計數器530運行,但在其他 實施例中,可在觸發信號為低時觸發此等操作。舉例而言,在一實施例中,可在充電/放電控制信號560為低時發生充電。 For the sake of simplicity of the description, in the description of the embodiments of Figures 6 and 7, it is assumed that charging occurs when the charge/discharge control signal 560 is high, and the counter 530 operates when the counter enable signal 580 is high, but in other In an embodiment, such operations can be triggered when the trigger signal is low. For example, in an embodiment, charging may occur when the charge/discharge control signal 560 is low.

視實施例而定,曲線606之充電區段與區段606之放電曲線(見圖6或7)可為彼此的鏡像或可不為彼此的鏡像。因此,視實施例而定,當充電時電壓518在低壓位準517與高壓位準519間變動之時間間隔可與電壓518在低壓位準517與高壓位準519間變動之時間間隔相同或可不同。 Depending on the embodiment, the discharge profile of the charge section and section 606 of curve 606 (see FIG. 6 or 7) may be mirror images of each other or may not be mirror images of each other. Therefore, depending on the embodiment, the time interval during which the voltage 518 varies between the low voltage level 517 and the high voltage level 519 may be the same as the time interval during which the voltage 518 varies between the low voltage level 517 and the high voltage level 519. different.

應注意圖6或7之時序圖602中所說明之計數器時脈信號542的週期(頻率)僅為計數器時脈信號542之可能週期(頻率)的一實例。在一些實施例中,計數器時脈信號542之頻率(週期)為可(例如)經由時脈控制暫存器450(見圖4或5)來組態。在此等實施例中,改變計數器時脈信號542之頻率可在一些情形中改變由計數器530所量測之時間間隔的振幅。在此等實施例中之一些實施例中,計數器時脈信號頻率(週期)可針對電容感測區域115中的每一感測器而獨立設定,或針對電容感測區域115中之感測器的每一子集而共同設定,而在此等實施例中之另一者中,計數器時脈信號頻率(週期)針對電容感測區域115中之所有感測器而共同設定。下文進一步給出子集的實例。在其他實施例中,計數器時脈信號542之頻率(週期)為不可組態的,例如,頻率(週期)可被建構(例如,硬編碼/硬連線)或為可基於可組態及/或不可組態的操作 參數。舉例而言,在一實施例中,計數器時脈542之週期(頻率)可至少部分地視測定時脈846之週期(頻率)而定(下文將參看圖8以及9來對其描述)。 It should be noted that the period (frequency) of the counter clock signal 542 illustrated in the timing diagram 602 of FIG. 6 or 7 is only one example of the possible period (frequency) of the counter clock signal 542. In some embodiments, the frequency (period) of the counter clock signal 542 can be configured, for example, via the clock control register 450 (see FIG. 4 or 5). In such embodiments, changing the frequency of the counter clock signal 542 may change the amplitude of the time interval measured by the counter 530 in some cases. In some of these embodiments, the counter clock signal frequency (period) may be independently set for each sensor in the capacitive sensing region 115, or for a sensor in the capacitive sensing region 115 Each subset is set in common, and in the other of the embodiments, the counter clock signal frequency (period) is commonly set for all of the sensors in the capacitive sensing region 115. An example of a subset is further given below. In other embodiments, the frequency (period) of the counter clock signal 542 is not configurable, for example, the frequency (cycle) can be constructed (eg, hard coded/hardwired) or can be based on configurable and/or Or non-configurable operation parameter. For example, in one embodiment, the period (frequency) of the counter clock 542 may depend, at least in part, on the period (frequency) of the measured clock 846 (described below with reference to Figures 8 and 9).

類似地,圖6或7之時序圖612中所示之充電/放電控制560的頻率(週期)僅為充電/放電控制560之可能頻率(週期)的一實例。在一實施例中,充電/放電控制信號560之所選擇頻率之兩倍(亦即,充電/放電週期的一半)應足以允許電容感測器502上之電壓518在電容感測器502之充電期間到達所選擇的高壓519,及/或在感測器502之放電期間到達所選擇的低壓517。在一些實施例中,充電/放電控制信號560之頻率(週期)為可(例如)經由時脈控制暫存器450(見圖4或5)來組態。在此等實施例中之一些實施例中,充電/放電循環頻率(週期)可針對電容感測區域115中的每一感測器獨立設定,或針對電容感測區域115中之感測器的每一子集共同設定,而在此等實施例中之另一者中,充電/放電循環頻率(週期)針對電容感測區域115中之所有感測器共同設定。下文進一步給出子集的實例。在其他實施例中,充電/放電信號560之頻率(週期)為不可組態的,例如,頻率(週期)可被建構(例如,硬編碼/硬連線)或可基於可組態及/或不可組態的操作參數。舉例而言,在一實施例中,充電/放電信號560之頻率(週期)可至少部分地視測定時脈846之週期(頻率)而定(下文將參看圖8以及9來對其描述)。 Similarly, the frequency (period) of the charge/discharge control 560 shown in the timing diagram 612 of FIG. 6 or 7 is only one example of the possible frequency (period) of the charge/discharge control 560. In one embodiment, twice the selected frequency of the charge/discharge control signal 560 (i.e., half of the charge/discharge cycle) should be sufficient to allow the voltage 518 on the capacitive sensor 502 to be charged at the capacitive sensor 502. The selected high voltage 519 is reached during the period and/or the selected low voltage 517 is reached during the discharge of the sensor 502. In some embodiments, the frequency (period) of the charge/discharge control signal 560 can be configured, for example, via the clock control register 450 (see FIG. 4 or 5). In some of these embodiments, the charge/discharge cycle frequency (period) may be set independently for each sensor in the capacitive sensing region 115, or for a sensor in the capacitive sensing region 115. Each subset is set collectively, and in the other of these embodiments, the charge/discharge cycle frequency (period) is commonly set for all of the sensors in the capacitive sensing region 115. An example of a subset is further given below. In other embodiments, the frequency (period) of the charge/discharge signal 560 is not configurable, for example, the frequency (cycle) can be constructed (eg, hard coded/hardwired) or can be based on configurable and/or Non-configurable operating parameters. For example, in one embodiment, the frequency (period) of the charge/discharge signal 560 may depend, at least in part, on the period (frequency) of the measured clock 846 (described below with reference to Figures 8 and 9).

如以上所提及地,在一些實施例中,計數器時脈542的週期(頻率)及/或週期(頻率)充電/放電頻率560可至少部分地視由時脈產生器444所產生的(內部)測定時脈846而定。視實施例而定,測定時脈846可不包括時脈抖動或可始終或選擇性地包括時脈抖動(例如)以試圖減少電磁干擾。在一些實施例中,時脈抖動為可組態的,(例如)使用可組態的抖動產生器暫存器452(見圖4或5)。舉例而言,在一實施例中,經由抖動產生器暫存器452,時脈抖動可經啟用或停用(亦即,開啟/關閉),且抖動值可被組態,其將應用於測定時脈846。 As mentioned above, in some embodiments, the period (frequency) and/or periodic (frequency) charge/discharge frequency 560 of the counter clock 542 may be at least partially viewed by the clock generator 444 (internal ) Measure clock 846. Depending on the embodiment, the measurement clock 846 may not include clock jitter or may include or optionally include clock jitter (for example) in an attempt to reduce electromagnetic interference. In some embodiments, the clock jitter is configurable, for example using a configurable jitter generator register 452 (see Figure 4 or 5). For example, in one embodiment, via jitter generator buffer 452, clock jitter can be enabled or disabled (ie, turned on/off), and jitter values can be configured, which will be applied to the assay. Clock 846.

在一些實施例中,可建構為不將抖動添加至測定時脈846或始終將抖動添加至測定時脈846。在一些實施例中,額外地或以另一方式,抖動可基於可組態及/或不可組態的操作參數。因此,抖動產生器暫存器452可在一些情形中自電容偵測系統100省略。 In some embodiments, it may be constructed not to add jitter to the assay clock 846 or to always add jitter to the assay clock 846. In some embodiments, additionally or in another manner, the jitter may be based on configurable and/or non-configurable operational parameters. Thus, the jitter generator register 452 can be omitted from the capacitance detection system 100 in some cases.

參看圖9,其為根據本發明之實施例之用於對抖動進行組構之方法900的流程圖。在其他實施例中,可以與圖9中所示之次序不同的次序來執行方法900中所說明之階段,及/或可同時執行一個以上之階段。 Referring to Figure 9, a flowchart of a method 900 for fabricating jitter in accordance with an embodiment of the present invention. In other embodiments, the stages illustrated in method 900 may be performed in an order different than that shown in FIG. 9, and/or more than one stage may be performed simultaneously.

在圖9的說明的實施例中,在階段902中,存在電容偵測系統100之電力開啟。在階段904中,存在初始化。初始化可包括適合於實施例之任何動作。舉例而言,在一些實施例中,初始化包括時脈模組340中之操作參數的組態。繼續所述實例,在一實施例中,尤其以下各項中之任 一者可經組態:抖動啟用/停用、抖動值、時脈除頻器值、高壓位準、低壓位準、計數器時脈週期(頻率)、充電/放電週期(頻率)、計數器啟用模式、累積循環中之充電/放電循環的數目、充電以及放電啟用/停用、自動/手動模式、新設定準備、停止狀態、讀取間之預定時間間隔,及/或開始循環。如以上所論述地,操作參數可獨立針對每一感測器、共同針對感測器之每一子集,或共同針對所有感測器來組態。在階段906中,控制器145判定是否需要抖動。視實施例而定,抖動可因任何原因而需要。在圖9中所說明的實施例中,假定因為預設的抖動經停用且因此在階段908中若存在著產生抖動之需要,則抖動產生器暫存器452經組態以啟用抖動且設定抖動值(例如,作為暫存器之初始化的部分)。若不存在著產生抖動之需要,則跳過階段908。方法900然後結束。 In the illustrated embodiment of FIG. 9, in stage 902, there is power on of the capacitance detection system 100. In stage 904, there is initialization. Initialization may include any action suitable for the embodiments. For example, in some embodiments, the initialization includes configuration of operational parameters in the clock module 340. Continuing with the example, in one embodiment, especially among the following One can be configured: jitter enable/disable, jitter value, clock divider value, high voltage level, low voltage level, counter clock period (frequency), charge/discharge cycle (frequency), counter enable mode The number of charge/discharge cycles in the accumulation cycle, charge and discharge enable/disable, automatic/manual mode, new set preparation, stop state, predetermined time interval between reads, and/or start cycle. As discussed above, the operational parameters can be configured independently for each sensor, collectively for each subset of the sensors, or collectively for all of the sensors. In stage 906, controller 145 determines if jitter is required. Depending on the embodiment, jitter can be required for any reason. In the embodiment illustrated in Figure 9, it is assumed that because the preset jitter is disabled and therefore there is a need to generate jitter in stage 908, the jitter generator register 452 is configured to enable jitter and set The jitter value (for example, as part of the initialization of the scratchpad). If there is no need to generate jitter, then stage 908 is skipped. Method 900 then ends.

視實施例而定,抖動產生器暫存器452可從不被組態或可在每次電力開啟時或更頻繁地被組態。 Depending on the embodiment, the jitter generator register 452 may never be configured or may be configured each time the power is turned on or more frequently.

圖8為根據本發明之實施例之時脈產生器444(視情況地包括抖動)的方塊圖。在圖8之實施例中,將輸入時脈375輸入至時脈變換模組841中。抖動產生器模組845若由抖動產生器暫存器452啟用,則根據抖動暫存器452中之抖動值產生抖動847。變換時脈849(基於輸入時脈375由變換模組841輸出)以及視情況地產生的抖動847由混合器模組843總和在一起,以產生一測定時脈846。 FIG. 8 is a block diagram of a clock generator 444 (optionally including jitter) in accordance with an embodiment of the present invention. In the embodiment of FIG. 8, input clock 375 is input to clock transform module 841. If the jitter generator module 845 is enabled by the jitter generator register 452, the jitter 847 is generated based on the jitter value in the jitter register 452. The transform clock 849 (output based on the input clock 375 by the transform module 841) and optionally generated jitter 847 are summed together by the mixer module 843 to produce a measurement clock 846.

在各種實施例中,可針對電容感測區域115中之所有感測器或電容感測區域115中之感測器的每一子集而存在一種共同抖動847,或可存在針對每一感測器所產生的獨立抖動847。因此,在各種實施例中,可共同啟用/停用抖動,且針對電容感測區域115中之所有感測器或針對感測器的每一子集來設定抖動值,或可啟用/停用抖動,且針對每一感測器獨立設定抖動值。下文進一步給出子集之實例。 In various embodiments, there may be one common jitter 847 for each of the sensors in the capacitive sensing region 115 or each subset of the sensors in the capacitive sensing region 115, or there may be for each sensing Independent jitter 847 generated by the device. Thus, in various embodiments, the jitter can be enabled/disabled together and the jitter value can be set for all of the sensors in the capacitive sensing region 115 or for each subset of the sensors, or can be enabled/disabled Jitter, and the jitter value is set independently for each sensor. Examples of subsets are further given below.

在圖8之一些實施例中,時脈變換模組841將建構的變換應用於輸入時脈375,從而產生變換時脈849。舉例而言,在一實施例中,時脈除頻器值“Z”可經建構,變換模組841使其除以輸入時脈375之頻率,以產生變換時脈849之頻率。在其他實施例中,所施加之變換為可組態的。舉例而言,在一實施例中,例如在時脈控制暫存器450(見圖4或5)中之時脈除頻器值“Z”可用以組態與輸入時脈375之頻率相關之變換時脈849的頻率(例如,產生的時脈849信號之頻率=輸入時脈375信號的頻率/Z)。繼續所述實例,在一實施例中,該變換時脈849之頻率(週期)等於輸入時脈375之頻率(週期)(作為預設值),除非例如藉由設定時脈除頻器值來另外組態。在一實施例中,“Z”可經組態為大於1的值,且因此,若Z經組態,則變換時脈849之頻率小於輸入時脈375的頻率。在另一實施例中,“Z”可經組態為任何值(亦即,引起已產生的時脈849之頻率視“Z”之值而定大於、小於或等於輸入時脈375的頻率)。 In some embodiments of FIG. 8, clock transform module 841 applies the constructed transform to input clock 375 to generate transform clock 849. For example, in one embodiment, the clock divider value "Z" can be constructed and the transform module 841 divides it by the frequency of the input clock 375 to produce the frequency of the transform clock 849. In other embodiments, the applied transformation is configurable. For example, in an embodiment, the clock divider value "Z" in the clock control register 450 (see FIG. 4 or 5) may be used to configure the frequency associated with the input clock 375. The frequency of the clock 849 is transformed (eg, the frequency of the generated clock 849 signal = the frequency of the input clock 375 signal / Z). Continuing with the example, in one embodiment, the frequency (period) of the transform clock 849 is equal to the frequency (period) of the input clock 375 (as a preset value) unless, for example, by setting a clock divider value. Additional configuration. In an embodiment, "Z" may be configured to a value greater than one, and thus, if Z is configured, the frequency of the transform clock 849 is less than the frequency of the input clock 375. In another embodiment, "Z" can be configured to any value (i.e., cause the frequency of the generated clock 849 to be greater than, less than, or equal to the frequency of the input clock 375 depending on the value of "Z") .

在具有可組態時脈除頻器值之實施例中,時脈除頻器值可針對電容感測區域115中的每一感測器獨立設定,或針對電容感測區域115中之感測器的每一子集共同設定,而在此等實施例中之另一者中,時脈除頻器值可針對電容感測區域115中之所有感測器共同設定。下文進一步給出子集的實例。 In embodiments having a configurable clock divider value, the clock divider value can be set independently for each sensor in the capacitive sensing region 115 or for sensing in the capacitive sensing region 115 Each subset of the devices is set collectively, and in the other of these embodiments, the clock divider values can be collectively set for all of the sensors in the capacitive sensing region 115. An example of a subset is further given below.

應注意在一實施例中,其中未存在由時脈變換841所施加之變換或該變換為並不改變輸入時脈375之一種變換(例如,乘以“1”),則變換時脈849等於輸入時脈375。在不存在產生的抖動的實施例中,測定時脈846等於變換時脈849。 It should be noted that in an embodiment where there is no transformation applied by the clock transformation 841 or the transformation is a transformation that does not change the input clock 375 (eg, multiplied by "1"), then the transformation clock 849 is equal to Enter clock 375. In an embodiment where there is no generated jitter, the measurement clock 846 is equal to the transformed clock 849.

在一實施例中,除了可基於該輸入時脈375、由抖動產生器845所產生的抖動847,及/或由時脈變換841所施加之變換外或代替該輸入時脈375、由抖動產生器845所產生的抖動847,及/或由時脈變換841所施加的變換,該測定時脈846亦可基於可組態及/或不可組態的操作參數。在一實施例中,測定時脈846可具有建構的值,例如,硬編碼/硬連線值。 In one embodiment, in addition to or instead of the input clock 375 generated by the jitter generator 845, and/or the conversion applied by the clock transition 841, the input clock 375 is generated by the jitter. The jitter 847 generated by the 845, and/or the transformation applied by the clock transition 841, may also be based on configurable and/or non-configurable operational parameters. In an embodiment, the measurement clock 846 may have a constructed value, such as a hard coded/hardwired value.

在一實施例中,計數器時脈542之頻率等於或為測定時脈846之頻率的某一其他函數。在一實施例中,充電/放電控制560之頻率等於或為測定時脈846之頻率的某一其他函數。舉例而言,在一些實施例中,計數器時脈542之頻率及/或充電放電控制560之頻率可隨著測定時脈846的頻率的增大而增大。 In one embodiment, the frequency of the counter clock 542 is equal to or some other function of the frequency of the measured clock 846. In one embodiment, the frequency of charge/discharge control 560 is equal to or some other function of the frequency of the measured clock 846. For example, in some embodiments, the frequency of the counter clock 542 and/or the frequency of the charge and discharge control 560 may increase as the frequency of the measured clock 846 increases.

再次參看圖5,來自與感測器502相關聯之計數器530之輸出為時間間隔量測結果537(例如,以計數器時脈循環之“單位”或“計數”,或以其他單位),其中時間間隔量測結果537為時間間隔量測結果337中的一者。視實施例而定,累積循環可包括產生時間間隔量測結果537之單一實例之任何數目(等於或大於一)之充電/放電循環。舉例而言,在一實施例中,可在感測器502的單一充電期間、在感測器502之單一放電期間,或在感測器502之單一充電以及放電期間來量測感測器502上之電壓518在低壓位準517與高壓位準519間變動之時間間隔。作為另一實例,在一實施例中,計數器530可在電容感測器502之多個充電及/或放電期間累積地運行,以累積地量測電容感測器110上之電壓在低壓位準與高壓位準314間變動之時間間隔。因此,視實施例而定,在一累積循環中由計數器530所產生的時間間隔量測結果537可包括任何數目(等於或大於一)之充電/放電循環上之時間間隔的累積,在所述時間間隔期間充電及/或放電的電容感測器502上之電壓518在低壓位準517與高壓位準519間變動。讀者將理解時間間隔量測結果537為與感測器502相關聯之測定資料的實例,其提供至用於圖5中所說明之實施例的控制器模組145。 Referring again to FIG. 5, the output from counter 530 associated with sensor 502 is a time interval measurement 537 (eg, "unit" or "count" of the counter clock cycle, or in other units), where time The interval measurement result 537 is one of the time interval measurement results 337. Depending on the embodiment, the accumulation cycle may include a charge/discharge cycle that produces any number (equal to or greater than one) of a single instance of the time interval measurement 537. For example, in one embodiment, sensor 502 can be measured during a single charge of sensor 502, during a single discharge of sensor 502, or during a single charge and discharge of sensor 502. The upper voltage 518 is spaced between the low voltage level 517 and the high pressure level 519. As another example, in an embodiment, the counter 530 can be cumulatively operated during multiple charging and/or discharging of the capacitive sensor 502 to cumulatively measure the voltage across the capacitive sensor 110 at a low voltage level. The time interval between changes with the high pressure level 314. Thus, depending on the embodiment, the time interval measurement 537 generated by the counter 530 in a cumulative cycle may include any number of accumulations (equal to or greater than one) of the time intervals on the charge/discharge cycle, The voltage 518 on the capacitive sensor 502 that is charged and/or discharged during the time interval varies between the low voltage level 517 and the high voltage level 519. The reader will understand that the time interval measurement result 537 is an example of assay data associated with the sensor 502 that is provided to the controller module 145 for the embodiment illustrated in FIG.

假定針對感測器502累積地量測多個時間間隔之實施例,可存在或可不存在量測結果間之一或多個操作參數的變化。舉例而言,視實施例而定,尤其以下各項中之任一 者可在量測結果間變化或可不在量測結果間變化:計數器時脈542、充電/放電控制模式、低壓位準517之值、高壓位準519的值,及/或充電/放電控制信號560。 Assuming an embodiment in which the sensor 502 cumulatively measures a plurality of time intervals, there may or may not be a change in one or more of the operational parameters between the measurements. For example, depending on the embodiment, especially any of the following The change may or may not vary between the measurements: counter clock 542, charge/discharge control mode, low voltage level 517, high voltage level 519, and/or charge/discharge control signal. 560.

在一些情形中,可存在針對時間間隔量測結果537而包括多個量測時間間隔之累積之實施例的優點,其中在所述時間間隔期間充電及/或放電的感測器502上的電壓(在感測器502之多個充電及/或放電上)於低位準517與高位準519間變動。舉例而言,在此等情形中之一些情形中,多個量測時間間隔之累積改良了時間間隔量測結果537受到電容感測器502的電容之較小改變之影響的可能性。繼續所述實例,假定由於例如觸摸一輸入設備(其至少包括電容感測模組115)之覆蓋層之物件而存在著電容的較小改變。在此實例中,若在感測器502之一充電及/或放電上量測時間間隔量測結果537,則時間間隔量測結果537之較小以及可能可忽略的改變可在一些情形中產生。仍繼續所述實例,然而,若時間間隔量測結果537代替性地在感測器502的多個充電及/或放電上累積地量測,則時間間隔量測結果537之較大且可能較易於可辨識之改變可在一些情形中產生。 In some cases, there may be advantages to embodiments that include accumulation of multiple measurement time intervals for time interval measurement results 537, wherein voltages on sensors 502 that are charged and/or discharged during the time intervals (on multiple charges and/or discharges of sensor 502) varies between low level 517 and high level 519. For example, in some of these situations, the accumulation of multiple measurement time intervals improves the likelihood that the time interval measurement result 537 is affected by a small change in the capacitance of the capacitive sensor 502. Continuing with the example, assume that there is a small change in capacitance due to, for example, touching an object of the overlay of an input device that includes at least capacitive sensing module 115. In this example, if the time interval measurement 537 is measured on one of the sensors 502 charging and/or discharging, the smaller and possibly negligible change in the time interval measurement 537 may be generated in some cases. . The example continues, however, if the time interval measurement 537 is cumulatively measured cumulatively across multiple charges and/or discharges of the sensor 502, the time interval measurement 537 is larger and may be more Changes that are easily identifiable can be produced in some situations.

在一些實施例中,可建構在累積循環中之充電/放電循環之數目(等於或大於一),在累積循環期間由計數器530累積地量測時間間隔,或一累積循環中之充電/放電循環之數目可視可組態及/或不可組態的操作參數而定。在一些實施例中,每一累積循環之充電/放電循環的數目可為可(例 如)經由時脈控制暫存器450(見圖4或5)來組態。在此等實施例中之一些實施例中,每一累積循環之充電//放電循環的數目可針對電容感測區域115中之每一感測器獨立設定,或針對電容感測區域115中之感測器的每一子集共同設定,而在此等實施例中之另一者中,每一累積循環之充電/放電循環的數目針對電容感測區域115中之所有感測器共同設定。下文進一步給出子集的實例。 In some embodiments, the number of charge/discharge cycles (equal to or greater than one) that can be constructed in the accumulation cycle, cumulatively measured by the counter 530 during the accumulation cycle, or a charge/discharge cycle in a cumulative cycle The number can vary depending on configurable and/or non-configurable operating parameters. In some embodiments, the number of charge/discharge cycles per cumulative cycle may be For example, it is configured via the clock control register 450 (see Fig. 4 or 5). In some of these embodiments, the number of charge/discharge cycles per accumulation cycle may be set independently for each of the capacitive sensing regions 115, or for the capacitive sensing region 115. Each subset of sensors is set collectively, and in the other of these embodiments, the number of charge/discharge cycles per accumulation cycle is common to all of the sensors in capacitive sensing region 115. An example of a subset is further given below.

參看圖10,其展示根據本發明之一實施例之當累積循環包括s個充電/放電循環時的時序圖。 Referring to Figure 10, there is shown a timing diagram when the accumulation cycle includes s charge/discharge cycles in accordance with an embodiment of the present invention.

在時間1032,一累積循環開始。此累積循環包括s個充電/放電循環(其中s1),其中如以上所闡釋地,在各種實施例中,s可經由時脈控制暫存器450來組態、可經建構,或可視可組態及/或不可組態的操作參數而定。時序圖1028說明s個充電/放電循環。在s個充電/放電循環期間,如以上所論述,累積地量測各時間間隔。在時間1034,在s個充電/放電循環後,該累積循環結束。累積循環之週期T_ac因此等於時間點1034與時間點1032間之時間差。累積循環中所包括之充電/放電循環的數目並不受本發明限制,且圖10中所說明之數目僅為一實例。在圖10中所說明之實施例中,為了簡潔性起見,假定每一充電/放電循環具有相等的持續時間,但在另一實施例中,持續時間可變化。在一實施例中,時序圖1028中所示之每一充電/放電循環可與參看圖6及/或7所描述的時序圖相關聯。 At time 1032, a cumulative cycle begins. This accumulation cycle includes s charge/discharge cycles (where s 1), wherein as explained above, in various embodiments, s may be configured via the clock control register 450, may be constructed, or may be configurable and/or non-configurable operating parameters . Timing diagram 1028 illustrates s charge/discharge cycles. During the s charge/discharge cycles, as discussed above, the time intervals are cumulatively measured. At time 1034, the accumulation cycle ends after s charge/discharge cycles. The period T_ac of the accumulation cycle is therefore equal to the time difference between time point 1034 and time point 1032. The number of charge/discharge cycles included in the accumulation cycle is not limited by the present invention, and the number illustrated in Fig. 10 is only an example. In the embodiment illustrated in Figure 10, for the sake of brevity, it is assumed that each charge/discharge cycle has an equal duration, but in another embodiment, the duration may vary. In an embodiment, each of the charge/discharge cycles shown in timing diagram 1028 can be associated with the timing diagrams described with reference to FIGS. 6 and/or 7.

再次參看圖4之實施例,為了本論述之目的假定多個X及/或Y電容感測器包括於電容感測區域115中,現將進一步參考所述多個X及/或Y電容感測器以詳細說明測定模組105的操作。 Referring again to the embodiment of FIG. 4, it is assumed for the purposes of this discussion that a plurality of X and/or Y capacitive sensors are included in the capacitive sensing region 115, which will now be further referenced to the plurality of X and/or Y capacitive sensing The operation of the measurement module 105 will be described in detail.

視實施例而定,在電容感測區域115中之感測器之間,可存在或可不存在尤其以下各項中之任一者的變化:計數器時脈之週期(頻率)、抖動之包括或排除及/或抖動值、累積地量測之時間間隔的數目(亦即,一累積循環中之充電/放電循環的數目)、低壓位準之值、高壓位準之值、信號的觸發位準(高或低)、計數器啟用模式(亦即,在感測器充電、放電或充電放電期間)、充電/放電控制信號之週期(頻率)等。舉例而言,在一些實施例中,在測定資料經分別提供至控制器145及/或由控制器145分別處理的感測器之間,可在一些情形中允許變化。作為另一實例,在一實施例中,在感測器之間可允許變化,因為控制器145知道如何補償感測器之間的任何變化,及/或因為變化可彼此抵消。作為另一實例,在一些實施例中,可容忍由於與不同感測器相關聯之模組之間的差異的變化,只要該變化不影響由控制器145所執行之存在及/或位置偵測之結果。繼續所述實例,在此等實施例中的一者中,可由控制器145來考慮校準值(例如,當無物件例如接近電容感測區域115時由不同計數器所產生的測定資料)中之差異,使得此差異並不影響存在及/或位置偵測。 Depending on the embodiment, there may or may not be a variation between any of the following in the sensor in the capacitive sensing region 115: the period of the counter clock (frequency), the inclusion of jitter, or Exclusion and/or jitter value, the number of time intervals for cumulative measurement (ie, the number of charge/discharge cycles in a cumulative cycle), the value of the low voltage level, the value of the high voltage level, and the trigger level of the signal (High or Low), counter enable mode (ie, during sensor charging, discharging, or charging and discharging), period (frequency) of charge/discharge control signals, and the like. For example, in some embodiments, variations may be allowed in some cases between assay data being provided to controller 145 and/or separately processed by controller 145. As another example, in an embodiment, variations may be allowed between the sensors because the controller 145 knows how to compensate for any changes between the sensors, and/or because the changes may cancel each other out. As another example, in some embodiments, variations due to differences between modules associated with different sensors may be tolerated as long as the changes do not affect the presence and/or position detection performed by controller 145. The result. Continuing with the example, in one of these embodiments, the difference in calibration values (eg, assay data generated by different counters when no object, such as near capacitive sensing region 115) is considered by controller 145 So that this difference does not affect presence and / or location detection.

視實施例而定,可啟用電容感測區域115中之所有n(n>1)個感測器的充電以及放電,或可停用n個感測器中之至少一者的充電以及放電,例如,其中至少一感測器保持放電。舉例而言,在一考慮到圖5之感測器502的實施例中,若啟用感測器502之充電以及放電,則產生充電/放電控制560,而若停用感測器502之充電以及放電,則不產生充電/放電控制560。舉例而言,在一些實施例中,感測器之充電以及放電的啟用或停用可為可(例如)經由設定/狀態暫存器454來組態。在此等實施例中之一些實施例中,可獨立啟用或停用電容感測區域115中之每一感測器的充電以及放電,或可共同啟用或停用電容感測區域115中之感測器之每一子集的充電以及放電,而在此等實施例中之另一者中,可共同啟用或停用電容感測區域115中之所有感測器的充電以及放電。下文進一步給出子集之實例。舉例而言,在此等實施例中之一者中,可依序交替啟用不同子集的充電以及放電,其他子集之充電以及放電保持停用,直到其依序輪到為止。在另一實施例中,感測器充電以及放電之啟用或停用為不可組態的,例如,啟用或停用可被建構(例如,可經常啟用充電以及放電),或啟用/停用可基於可組態及/或不可組態的操作參數。 Depending on the embodiment, charging and discharging of all n (n > 1) sensors in the capacitive sensing region 115 may be enabled, or charging and discharging of at least one of the n sensors may be disabled, For example, at least one of the sensors remains discharged. For example, in an embodiment in which sensor 502 of FIG. 5 is considered, if charging and discharging of sensor 502 is enabled, charging/discharging control 560 is generated, and if charging of sensor 502 is disabled and When discharged, no charge/discharge control 560 is generated. For example, in some embodiments, the activation or deactivation of the charging and discharging of the sensor can be configured, for example, via the set/status register 454. In some of these embodiments, charging and discharging of each of the capacitive sensing regions 115 can be enabled or disabled independently, or the sense in the capacitive sensing region 115 can be enabled or disabled in common. The charging and discharging of each subset of the detectors, in the other of these embodiments, can collectively enable or disable charging and discharging of all of the sensors in the capacitive sensing region 115. Examples of subsets are further given below. For example, in one of these embodiments, charging and discharging of different subsets may be alternately enabled in sequence, with charging and discharging of other subsets remaining inactive until they are in turn. In another embodiment, the activation or deactivation of sensor charging and discharging is not configurable, for example, enabling or disabling can be configured (eg, charging and discharging can be enabled frequently), or enabling/disabling can be Based on configurable and / or non-configurable operating parameters.

視實施例而定,電容感測區域115中經啟用充電以及放電之每一感測器的充電及/或放電可同步或可不同步(亦即,特定電容感測器之時間614及/或620可與其他感測器之充電及/或放電時間同步或可不同步)。在一些實施例 中,對應於各種感測器的計數器430保持其測定資料直到經讀取為止,或可使用額外記憶體(計數器或另外的裝置)來儲存該測定資料,且因此在此等實施例中已啟用充電以及放電之各感測器之充電以及放電未必需要同步。在此等實施例中之一者中,只要按時準備好對”測定資料並行地提供至控制器145”之每一感測器提供所述測定資料,則未必需要感測器之間的同步。在此等實施例中之另一者中,額外地或以另一方式,在測定資料已分別提供至控制器145及/或由控制器145分別處理之已啟用充電以及放電的感測器之間,可允許非同步。 Depending on the embodiment, the charging and/or discharging of each of the sensors in the capacitive sensing region 115 that are enabled for charging and discharging may or may not be synchronized (ie, the time 614 and/or 620 of the particular capacitive sensor). Can be synchronized or not synchronized with the charging and / or discharging time of other sensors). In some embodiments The counter 430 corresponding to the various sensors maintains its assay data until read, or may use additional memory (counter or additional device) to store the assay data, and thus is enabled in these embodiments The charging and discharging of the respective sensors for charging and discharging do not necessarily need to be synchronized. In one of these embodiments, synchronization of the sensors is not necessarily required as long as the assay data is provided on time for each sensor that "measures data is provided to controller 145 in parallel" . In the other of these embodiments, additionally or alternatively, the measured data has been provided to the controller 145 and/or the sensor-enabled charge and discharge sensor respectively processed by the controller 145 Can be allowed to be asynchronous.

為了進一步說明同步或非同步,現呈現兩個實施例,其不應闡釋為具限制性。在第一實施例中,儘管未必同步(亦即,圖6之時間614以及620未必針對所有啟用的感測器同步),但使經啟用充電以及放電之所有感測器並行充電以及放電。在第二實施例中,感測器的子集在充電/放電控制信號360為高時充電,且在充電/放電控制信號360為低時放電,而不同子集在充電/放電控制信號360為低時充電,且在充電/放電控制信號360為高時放電。繼續此第二實施例,例如,經啟用充電以及放電之X感測器(或Y感測器)可在充電/放電控制信號360之高位準上充電,且在充電/放電控制信號360的低位準上放電,而經啟用充電以及放電之Y感測器(或X感測器)可在充電/放電控制信號360之低位準上充電,且在充電/放電控制信號360的高位準上放電。 To further illustrate synchronization or non-synchronization, two embodiments are presented, which should not be construed as limiting. In the first embodiment, although not necessarily synchronized (i.e., times 614 and 620 of Figure 6 are not necessarily synchronized for all enabled sensors), all of the sensors that are enabled for charging and discharging are charged and discharged in parallel. In a second embodiment, the subset of sensors is charged when the charge/discharge control signal 360 is high, and is discharged when the charge/discharge control signal 360 is low, while the different subsets are at the charge/discharge control signal 360. Charging at low time and discharging when the charge/discharge control signal 360 is high. Continuing with this second embodiment, for example, an X sensor (or Y sensor) that is enabled for charging and discharging can be charged at a high level of the charge/discharge control signal 360, and at a low level of the charge/discharge control signal 360. The discharge is quasi-upper, and the Y sensor (or X sensor) enabled for charging and discharging can be charged at a low level of the charge/discharge control signal 360 and discharged at a high level of the charge/discharge control signal 360.

如以上參看圖6以及7所描述地,在各種實施例中,與感測器相關聯之計數器在感測器之充電期間及/或在感測器的放電期間可(累積)量測當感測器之電壓在低參考位準與高參考位準間變動時的時間間隔。亦根據以上論述,在一實施例中,經啟用充電以及放電之感測器可在充電/放電信號為高時充電,且在充電/放電信號為低時放電,而在另一實施例中,經啟用充電以及放電之感測器可在充電/放電信號為低時充電,且在充電/放電信號為高時放電。因此,當論述多個感測器的操作時,多個可能時序圖為可能的。圖11、12以及13顯示了不應闡釋為具典型性或詳盡性之實例。 As described above with reference to Figures 6 and 7, in various embodiments, the counter associated with the sensor can be (cumulatively) measured during charging of the sensor and/or during discharge of the sensor. The time interval when the voltage of the detector changes between the low reference level and the high reference level. Also in accordance with the above discussion, in one embodiment, the charge and discharge enabled sensor can be charged when the charge/discharge signal is high and discharged when the charge/discharge signal is low, while in another embodiment, The sensor that enables charging and discharging can be charged when the charge/discharge signal is low and discharged when the charge/discharge signal is high. Thus, when discussing the operation of multiple sensors, multiple possible timing diagrams are possible. Figures 11, 12 and 13 show examples that should not be construed as typical or exhaustive.

在圖11中為根據本發明之實施例的與對應於經啟用充電以及放電之X感測器以及Y感測器之計數器430相關的時序圖。就像應自以上論述所理解者,視實施例而定,可啟用電容感測區域115中之所有感測器的充電以及放電,或可啟用少於所有感測器之一些感測器的充電以及放電。為了簡潔性起見,假定對於經啟用充電以及放電之所有感測器而言,充電/放電控制信號360以及累積循環之週期為相同的。 In FIG. 11, a timing diagram associated with a counter 430 corresponding to an X sensor enabled for charging and discharging and a Y sensor is illustrated in accordance with an embodiment of the present invention. As should be understood from the above discussion, depending on the embodiment, charging and discharging of all of the sensors in the capacitive sensing region 115 can be enabled, or charging of some of the sensors of less than all of the sensors can be enabled. And discharge. For the sake of brevity, it is assumed that the charge/discharge control signal 360 and the cycle of the accumulation cycle are the same for all sensors that are enabled for charging and discharging.

時序圖1102說明隨一累積循環中所包括之時間推移之充電放電控制信號360(其中累積循環的週期等於T_ac)。時序圖1104說明與經啟用充電以及放電之X感測器以及Y感測器相關之計數器430之隨時間推移的執行(啟用)以及停止(停用)。在一實施例中,經啟用充電以 及放電之X感測器以及Y感測器儘管未必同步但已並行地充電(當充電/放電控制信號360為高時)以及放電(當充電/放電控制信號360為低時)。在此實施例中,計數器在感測器充電且電壓在低壓位準與高壓位準間變動時運行,其累積地量測經啟用充電以及放電之X感測器以及Y感測器的時間間隔(例如,如在圖6中者)。在另一實施例中,經啟用充電以及放電之X感測器以及Y感測器儘管未必同步但已並行地充電(當充電/放電控制信號360為低時)以及放電(當充電/放電控制信號360為高時)。在此實施例中,計數器在放電期間(當電壓在低壓位準與高壓位準間變動時)運行,其累積地量測經啟用充電以及放電之X感測器以及Y感測器的時間間隔。 Timing diagram 1102 illustrates charge and discharge control signals 360 as a function of time included in a cumulative cycle (where the period of the accumulation cycle is equal to T_ac). Timing diagram 1104 illustrates the execution (activation) and stop (deactivation) of the counter 430 associated with the X sensor and the Y sensor enabled for charging and discharging. In an embodiment, charging is enabled to The X sensor and the Y sensor, although not necessarily synchronized, have been charged in parallel (when the charge/discharge control signal 360 is high) and discharged (when the charge/discharge control signal 360 is low). In this embodiment, the counter operates when the sensor is charged and the voltage fluctuates between a low voltage level and a high voltage level, which cumulatively measures the time interval between the X sensor and the Y sensor that are enabled for charging and discharging. (For example, as in Figure 6). In another embodiment, the X sensor and the Y sensor that are enabled for charging and discharging, although not necessarily synchronized, have been charged in parallel (when the charge/discharge control signal 360 is low) and discharged (when charging/discharging control) When signal 360 is high). In this embodiment, the counter operates during discharge (when the voltage varies between a low voltage level and a high voltage level), which cumulatively measures the time interval between the X sensor and the Y sensor that are enabled for charging and discharging. .

視實施例而定,較早的累積循環或較遲的累積循環可類似於或可不類似於圖11中所說明之累積循環。舉例而言,在一些情形中,可在累積循環之間存在任何操作參數的變化。 Depending on the embodiment, an earlier cumulative cycle or a later cumulative cycle may or may not be similar to the accumulation cycle illustrated in FIG. For example, in some cases, there may be any change in operational parameters between accumulation cycles.

在圖12中為根據本發明之實施例的與對應於經啟用充電以及放電之X感測器以及Y感測器之計數器430相關的時序圖。在圖12中所說明之實施例中,與X感測器相關之計數器以及與Y感測器相關的計數器依序執行。就像應自以上論述理解者,視實施例而定,可啟用電容感測區域115中之所有感測器的充電以及放電,或可啟用少於所有感測器之一些感測器的充電以及放電。為了簡潔性起見,在圖12之實施例中,假定對於經啟用充電以及放電之 所有感測器而言,充電/放電控制信號360以及累積循環之週期為相同的。 In FIG. 12 is a timing diagram associated with a counter 430 corresponding to an X sensor enabled for charging and discharging and a Y sensor in accordance with an embodiment of the present invention. In the embodiment illustrated in Figure 12, the counter associated with the X sensor and the counter associated with the Y sensor are executed sequentially. As should be understood from the above discussion, depending on the embodiment, charging and discharging of all of the sensors in the capacitive sensing region 115 can be enabled, or charging of some of the sensors of less than all of the sensors can be enabled and Discharge. For the sake of simplicity, in the embodiment of Figure 12, it is assumed that for charging and discharging are enabled. For all sensors, the charge/discharge control signal 360 and the cycle of the accumulation cycle are the same.

時序圖1202顯示了隨一累積循環中所包括之時間而推移之充電放電控制信號360(其中累積循環的週期等於T_ac)。時序圖1208顯示了與經啟用充電以及放電之X感測器相關之計數器430之隨時間推移的執行(啟用)以及停止(停用)。時序圖1210顯示了與經啟用充電以及放電之Y感測器相關之計數器430之隨時間推移的執行(啟用)以及停止(停用)。在一實施例中,經啟用充電以及放電之X感測器以及Y感測器儘管未必同步但已並行地充電(當充電/放電控制信號360為高時)以及放電(當充電/放電控制信號360為低時)。然而,在此實施例中,與X感測器相關之計數器在感測器充電且電壓在低壓位準與高壓位準間變動時運行,其累積地量測經啟用充電以及放電之X感測器的時間間隔(例如,如在圖6中)。在此實施例中,與Y感測器相關之計數器在感測器放電且電壓在低壓位準與高壓位準間變動時運行,其累積地量測經啟用充電以及放電之Y感測器的時間間隔(例如,如在圖7中者)。在另一實施例中,經啟用充電以及放電之X感測器以及Y感測器儘管未必同步但已並行地充電(當充電/放電控制信號360為低時)以及放電(當充電/放電控制信號360為高時)。然而,在此實施例中,與X感測器相關之計數器在放電期間(當電壓在低壓位準與高壓位準間變動時)運行,其累積地量測經啟用充電以及放電之X感測器的時間間 隔,且與Y感測器相關之計數器在充電期間(當電壓在低壓位準與高壓位準間變動時)運行,其累積地量測經啟用充電以及放電之Y感測器的時間間隔。在另一實施例中,當充電/放電控制360為高且電壓在低壓位準與高壓位準間變動時,經啟用充電以及放電之X感測器已充電且計數器運行,其累積地量測時間間隔(例如,如在圖6中)。在此實施例中,當充電/放電控制360為低且電壓在低壓位準與高壓位準間變動時,經啟用充電以及放電之Y感測器已充電且計數器運行,其累積地量測時間間隔。在另一實施例中,當充電/放電控制360為高且電壓在低壓位準與高壓位準間變動時,經啟用充電以及放電之X感測器已放電且計數器運行,其累積地量測時間間隔。在此實施例中,當充電/放電控制360為低且電壓在低壓位準與高壓位準間變動時,經啟用充電以及放電之Y感測器已放電且計數器運行,其累積地量測時間間隔(例如,如在圖7中者)。 Timing diagram 1202 shows the charge and discharge control signal 360 as a function of the time included in a cumulative cycle (where the period of the accumulation cycle is equal to T_ac). Timing diagram 1208 shows the execution (activation) and stop (deactivation) of the counter 430 associated with the X sensor that is enabled for charging and discharging. Timing diagram 1210 shows the execution (activation) and stop (deactivation) of the counter 430 associated with the Y sensor that is enabled for charging and discharging. In an embodiment, the X sensor and the Y sensor that are enabled for charging and discharging, although not necessarily synchronized, have been charged in parallel (when the charge/discharge control signal 360 is high) and discharged (when the charge/discharge control signal is 360 is low). However, in this embodiment, the counter associated with the X sensor operates when the sensor is charged and the voltage fluctuates between a low voltage level and a high voltage level, which cumulatively measures X-sensing via enabled charging and discharging. The time interval of the device (for example, as in Figure 6). In this embodiment, the counter associated with the Y sensor operates when the sensor discharges and the voltage fluctuates between a low voltage level and a high voltage level, which cumulatively measures the Y sensor that is enabled for charging and discharging. Time interval (eg, as in Figure 7). In another embodiment, the X sensor and the Y sensor that are enabled for charging and discharging, although not necessarily synchronized, have been charged in parallel (when the charge/discharge control signal 360 is low) and discharged (when charging/discharging control) When signal 360 is high). However, in this embodiment, the counter associated with the X sensor operates during discharge (when the voltage fluctuates between a low voltage level and a high voltage level), which cumulatively measures X-sensing via enabled charging and discharging. Time of the device The counter associated with the Y sensor operates during charging (when the voltage varies between the low voltage level and the high voltage level), which cumulatively measures the time interval of the Y sensor that is enabled for charging and discharging. In another embodiment, when the charge/discharge control 360 is high and the voltage varies between the low voltage level and the high voltage level, the X sensor that is enabled to charge and discharge is charged and the counter is running, which cumulatively measures Time interval (eg, as in Figure 6). In this embodiment, when the charge/discharge control 360 is low and the voltage varies between the low voltage level and the high voltage level, the Y sensor that is enabled for charging and discharging is charged and the counter is running, which cumulatively measures the time. interval. In another embodiment, when the charge/discharge control 360 is high and the voltage varies between the low voltage level and the high voltage level, the X sensor that is enabled for charging and discharging has been discharged and the counter is running, which cumulatively measures time interval. In this embodiment, when the charge/discharge control 360 is low and the voltage varies between the low voltage level and the high voltage level, the Y sensor that has been charged and discharged has been discharged and the counter is running, which cumulatively measures the time. Interval (for example, as in Figure 7).

視實施例而定,較早的累積循環或較遲的累積循環可類似於或可不類似於圖12中所說明之累積循環。舉例而言,在一些情形中,可在累積循環之間存在任何操作參數的變化。 Depending on the embodiment, an earlier cumulative cycle or a later cumulative cycle may or may not be similar to the accumulation cycle illustrated in FIG. For example, in some cases, there may be any change in operational parameters between accumulation cycles.

在圖13中為根據本發明之實施例之與對應於X感測器以及Y感測器之計數器430相關的時序圖。在圖13中所說明之實施例中,啟用至少一X感測器之充電以及放電,且停用所有Y感測器的充電以及放電。為了簡潔性起見,在圖13之實施例中,假定對於經啟用充電以及放電之 所有感測器而言,充電/放電控制信號360以及累積循環之週期為相同的。 In FIG. 13 is a timing diagram associated with a counter 430 corresponding to an X sensor and a Y sensor in accordance with an embodiment of the present invention. In the embodiment illustrated in Figure 13, charging and discharging of at least one X sensor is enabled, and charging and discharging of all Y sensors are disabled. For the sake of simplicity, in the embodiment of Figure 13, it is assumed that for charging and discharging are enabled For all sensors, the charge/discharge control signal 360 and the cycle of the accumulation cycle are the same.

時序圖1302說明了隨一累積循環中所包括之時間而推移之充電放電控制信號360(其中累積循環的週期等於T_ac)。時序圖1308說明了與X感測器相關之計數器430之隨時間推移的運行(啟用)以及停止(停用)。在一實施例中,當充電/放電控制360為高且感測器上之電壓在某一低壓與某一高壓位準間變動時,用於X感測器之計數器的運行是在所述感測器之充電期間發生(見,例如圖6)。然而,在另一實施例中,當充電/放電控制360為高且感測器上之電壓在某一低壓與某一高壓位準間變動時,用於X感測器之計數器的執行是在所述感測器之放電期間發生。時序圖1310說明了由於停用充電以及放電之與Y感測器相關之計數器430之隨時間而推移的停止(停用)。在另一實施例中,可啟用所述Y感測器之充電以及放電,且停用所述X感測器的充電以及放電。 Timing diagram 1302 illustrates charge discharge control signal 360 as a function of time included in a cumulative cycle (where the period of the accumulation cycle is equal to T_ac). Timing diagram 1308 illustrates the running (enabled) and stopped (deactivated) of counter 430 associated with the X sensor over time. In one embodiment, when the charge/discharge control 360 is high and the voltage on the sensor varies between a certain low voltage and a certain high voltage level, the operation of the counter for the X sensor is in the sense Occurs during charging of the detector (see, for example, Figure 6). However, in another embodiment, when the charge/discharge control 360 is high and the voltage on the sensor varies between a certain low voltage and a certain high voltage level, the execution of the counter for the X sensor is This occurs during the discharge of the sensor. Timing diagram 1310 illustrates the cessation (deactivation) of the counter 430 associated with the Y sensor due to deactivation of charging and discharging over time. In another embodiment, charging and discharging of the Y sensor can be enabled and charging and discharging of the X sensor can be disabled.

視實施例而定,較早的累積循環或較遲的累積循環可類似於或可不類似於圖13中所說明之累積循環。舉例而言,在一些情形中,可在累積循環之間存在任何操作參數的變化。繼續所述實例,視實施例而定,在較早的累積循環或較遲的累積循環中,可啟用或可不啟用X感測器之充電以及放電,且可停用或可不停用Y感測器之充電以及放電。舉例而言,在一實施例中,在下一累積循環期間,可停用所有X感測器的充電以及放電且可啟用至少一Y感測 器之充電以及放電、可啟用至少一X感測器之充電以及放電且可停用所有Y感測器之充電以及放電、可啟用至少一X感測器以及至少一Y感測器的充電以及放電等。 Depending on the embodiment, an earlier cumulative cycle or a later cumulative cycle may or may not be similar to the accumulation cycle illustrated in FIG. For example, in some cases, there may be any change in operational parameters between accumulation cycles. Continuing with the example, depending on the embodiment, charging and discharging of the X sensor may or may not be enabled in an earlier cumulative cycle or a later accumulation cycle, and Y sensing may or may not be disabled. Charge and discharge. For example, in an embodiment, charging and discharging of all X sensors may be disabled and at least one Y sensing may be enabled during the next accumulation cycle Charging and discharging, enabling charging and discharging of at least one X sensor and deactivating charging and discharging of all Y sensors, enabling charging of at least one X sensor and at least one Y sensor, and Discharge, etc.

再次參看圖1,現將較詳細地論述控制器145以及控制器介面155。 Referring again to Figure 1, controller 145 and controller interface 155 will now be discussed in greater detail.

電容測定模組105經由控制器介面155將測定資料提供至控制器模組145,所述測定資料允許控制器模組145偵測指狀物或其他物件之存在及/或位置。測定資料可如以上所論述地為(例如)量測的時間間隔337,或(例如)可為表示(為)電容感測區域115中之一或多個電容感測器之電容之函數的其他資料。舉例而言,測定資料可為電壓、電流、其他時間量測結果等,其為電容之函數,且可因此由控制器模組145用以偵測指狀物或其他物件之存在及/或位置。 The capacitance measurement module 105 provides measurement data to the controller module 145 via the controller interface 155, which allows the controller module 145 to detect the presence and/or location of fingers or other objects. The assay data can be, for example, a measured time interval 337 as discussed above, or can be, for example, other than a function of capacitance of one or more capacitive sensors in the capacitive sensing region 115. data. For example, the measurement data may be voltage, current, other time measurement results, etc., which is a function of capacitance, and thus may be used by controller module 145 to detect the presence and/or location of fingers or other objects. .

視實施例而定,可將測定資料推動或拉動至控制器模組145。為了簡潔性起見,以下描述涉及控制器145“讀取”該測定資料,或該測定資料經“接收”、“輸入”或“提供”,且應理解此等術語包括推動該測定資料之實施例以及拉動該測定資料的實施例。視實施例而定,控制器模組145可判定何時應將測定資料輸入至控制器模組145,電容測定模組105可判定何時應將測定資料輸入至控制器模組145,或可由控制器模組以及電容測定模組中之任一者或兩者來判定時序。 Depending on the embodiment, the assay data can be pushed or pulled to the controller module 145. For the sake of brevity, the following description relates to controller 145 "reading" the assay data, or the assay data is "received", "entered" or "provided", and it should be understood that such terms include facilitating the implementation of the assay data. Examples and examples of pulling the assay data. Depending on the embodiment, the controller module 145 can determine when the measurement data should be input to the controller module 145. The capacitance measurement module 105 can determine when the measurement data should be input to the controller module 145, or can be controlled by the controller. Either or both of the module and the capacitance measurement module determine the timing.

視實施例而定,控制器145可並行(儘管未必同步)接收與電容感測區域115中之所有n個感測器相關的測定資料,或可並行(儘管未必同步)接收與少於所有n個感測器之感測器相關的測定資料。 Depending on the embodiment, controller 145 may receive assay data associated with all of the n sensors in capacitive sensing region 115 in parallel (although not necessarily synchronized), or may receive (without necessarily synchronizing) reception with less than all n in parallel. Sensor-related measurement data for each sensor.

在一些實施例中,例如,控制器145並行接收與所有感測器(甚至經停用充電以及放電之感測器(若存在))相關之測定資料。舉例而言,參看圖13,在此等實施例中的一者中,控制器145接收與X感測器以及Y感測器相關之測定資料(即使針對Y感測器停用充電以及放電)。在此等實施例中之一些實施例中,經停用充電以及放電之感測器的測定資料具有對由控制器145進行之處理的可忽略的影響。舉例而言,在此等實施例中之一者中,與經停用充電以及放電之感測器相關之測定資料的值使得所述值對存在及/或位置之偵測具有可忽略的影響。作為另一實例,在此等實施例中的一者中,控制器145知道哪些感測器經停用充電以及放電,且因此可忽略相關的測定資料。 In some embodiments, for example, controller 145 receives in parallel measurement data associated with all of the sensors (even sensors that disable charging and discharging, if present). For example, referring to FIG. 13, in one of these embodiments, the controller 145 receives assay data associated with the X sensor and the Y sensor (even if charging and discharging are disabled for the Y sensor) . In some of these embodiments, the measured data of the sensor that is deactivated for charging and discharging has a negligible effect on the processing performed by controller 145. For example, in one of these embodiments, the value of the assay data associated with the sensor that deactivates the charge and discharge causes the value to have a negligible effect on the presence and/or location detection. . As another example, in one of these embodiments, the controller 145 knows which sensors are deactivated to charge and discharge, and thus the associated assay data can be ignored.

在一些實施例中,例如,控制器145可僅並行接收經啟用充電以及放電之感測器的測定資料。舉例而言,再次參看圖13,在此等實施例中之一者中,控制器145可僅接收與X感測器相關之測定資料。參看圖11或12,在一些實施例中,例如,控制器145可並行接收與經啟用充電以及放電之X感測器以及Y感測器相關的測定資料(無關於感測器之計數器啟用模式)。在一些實施例中,例如,控制器145可並行接收上述測定資料經一起處理之所有感測器 的測定資料,在一些情形中,所述測定資料可與測定資料經分別一起處理之感測器相關之測定資料處於分離的時間下。繼續所述實例,在此等實施例中之一者中且假定分別處理與Y感測器相關之測定資料以及X感測器相關的測定資料,可並行接收與X感測器相關之測定資料,且可並行接收與Y感測器相關之測定資料,其中可並行接收或可不並行接收X測定資料以及Y測定資料。仍繼續所述實例,在此等實施例中的一者中,控制器145可並行接收與經啟用充電以及放電之X感測器相關之測定資料,或可並行接收與所有X感測器相關的測定資料(無關於充電以及放電經啟用還是停用)。 In some embodiments, for example, controller 145 may only receive assay data for sensors that are enabled for charging and discharging in parallel. For example, referring again to FIG. 13, in one of these embodiments, controller 145 can only receive assay data associated with the X sensor. Referring to FIG. 11 or 12, in some embodiments, for example, the controller 145 can receive the measurement data associated with the X sensor and the Y sensor that are enabled for charging and discharging in parallel (without the counter enable mode of the sensor) ). In some embodiments, for example, the controller 145 can receive all of the sensors that are processed together in the above-described assay data in parallel. The measurement data may, in some cases, be separated from the measurement data associated with the sensor that is separately processed together with the measurement data. Continuing with the example, in one of the embodiments, and assuming that the measurement data associated with the Y sensor and the measurement data related to the X sensor are separately processed, the measurement data related to the X sensor can be received in parallel. And the measurement data related to the Y sensor may be received in parallel, wherein the X measurement data and the Y measurement data may be received in parallel or may not be received in parallel. Continuing with the example, in one of these embodiments, the controller 145 can receive assay data associated with the X sensor enabled for charging and discharging in parallel, or can be received in parallel with all X sensors. Measurement data (regardless of whether charging and discharging are enabled or disabled).

在一些實施例中,例如,控制器145可並行接收屬於子集(諸如,下文所給出之實例中之一者)之所有感測器的測定資料。舉例而言,若子集包括並行量測時間間隔之所有感測器,則參看圖11,在此等實施例中之一者中,可並行接收與X感測器以及Y感測器相關的測定資料,而參看圖12,在此等實施例中之另一者中,可分別接收與X感測器以及Y感測器相關之測定資料。 In some embodiments, for example, controller 145 can receive assay data for all of the sensors belonging to a subset, such as one of the examples given below, in parallel. For example, if the subset includes all of the sensors that measure the time interval in parallel, referring to FIG. 11, in one of these embodiments, the X sensor and the Y sensor can be received in parallel. The assay data, while referring to FIG. 12, in the other of these embodiments, the assay data associated with the X sensor and the Y sensor can be received separately.

為了易於描述,測定資料由控制器145並行接收的感測器稱作“群組”,即使群組中之感測器可能未必類似。感測器之群組可包括自一至n之範圍內之任何數目的感測器(其中n為電容感測區域115中之感測器的數目)。 For ease of description, the sensors that measure data received in parallel by controller 145 are referred to as "groups" even though the sensors in the group may not necessarily be similar. The group of sensors can include any number of sensors ranging from one to n (where n is the number of sensors in the capacitive sensing region 115).

在具有電容感測區域115中之感測器之一個以上之群組的實施例中,在一些情形中,在分離時間接收不同群組 之測定資料可為有利的(例如,若存在對介面155之通量(throughput)的限制)。 In embodiments having more than one group of sensors in the capacitive sensing region 115, in some cases, different groups are received at the split time The assay data can be advantageous (e.g., if there is a limit to the throughput of interface 155).

在一些實施例中,控制器145計算或經組態以(例如,基於測定資料之接收間的預定時間間隔)知道何時與感測器之群組相關之測定資料已準備好,且接著讀取該測定資料(若需要)。舉例而言,在此等實施例中之一些實施例中,預定的時間間隔可為可組態的、可經建構(例如,硬編碼/硬連線),及/或可視其他可組態及/或不可組態的操作參數而定。在一些實施例中,可在群組之測定資料準備好時由測定模組105設定(例如)設定/狀態暫存器454中的“新設定準備”指示。在此等實施例中之一者中,可(例如)在控制器145讀取測定資料後由控制器145清除“新設定準備”指示。在此等實施例中之另一者中,可(例如)在預定數目的計數器時脈循環後,由測定模組105來清除“新設定準備”指示。在此等實施例中之一者中,控制器145檢查新設定準備指示之狀態(輪詢),且若“新設定準備”指示經設定,則控制器145讀取該測定資料(若需要)。在此等實施例中的一者中,當群組之測定資料準備好時,控制器145接收由新設定準備指示所產生的中斷,且若需要,則讀取該測定資料。在存在測定資料由控制器145分別接收之感測器之一個以上之群組的實施例中,每一群組可與相異的“新設定準備”指示相關聯。在一實施例中,當測定資料準備好時控制器145可選擇不讀取該測定資料。 In some embodiments, the controller 145 calculates or is configured to know (eg, based on a predetermined time interval between receipts of the assay data) when the assay data associated with the group of sensors is ready, and then read The measurement data (if needed). For example, in some of these embodiments, the predetermined time interval may be configurable, configurable (eg, hard coded/hardwired), and/or visible other configurable and / or depending on the operating parameters that are not configurable. In some embodiments, the "new setup ready" indication in the settings/status register 454 can be set by the assay module 105, for example, when the assay data for the group is ready. In one of these embodiments, the "new setup ready" indication can be cleared by controller 145, for example, after controller 145 reads the assay data. In the other of these embodiments, the "new setup ready" indication can be cleared by the assay module 105, for example, after a predetermined number of counter clock cycles. In one of these embodiments, the controller 145 checks the status of the new setup preparation indication (polling), and if the "new setup preparation" indication is set, the controller 145 reads the measurement data (if needed). . In one of these embodiments, when the measurement data for the group is ready, the controller 145 receives the interrupt generated by the new setup preparation indication and, if necessary, reads the measurement data. In embodiments where there is more than one group of sensors that receive assay data received by controller 145, each group may be associated with a different "new setup ready" indication. In an embodiment, the controller 145 may choose not to read the assay data when the assay data is ready.

在一些實施例中,每一累積循環之開始的時序由控制器145控制,此等實施例在下文中稱作“手動模式”。在一些實施例中,每一累積循環之開始的時序由測定模組105判定,此等實施例本文以下稱作“自動模式”。在一些實施例中,模式(自動或手動)為可(例如)經由模式暫存器448來組態。在此等實施例中之一些實施例中,模式(自動或手動)可針對每一感測器而獨立地組態,可針對感測器之每一子集共同組態,或可針對所有感測器來共同組態。下文給出可能的子集的實例。在另一實施例中,模式(自動或手動)為不可組態的,例如,經建構為自動或手動模式,及/或基於可組態及/或不可組態的操作參數。 In some embodiments, the timing of the beginning of each accumulation cycle is controlled by controller 145, which is hereinafter referred to as "manual mode." In some embodiments, the timing of the beginning of each accumulation cycle is determined by assay module 105, which is hereinafter referred to herein as "automatic mode." In some embodiments, the mode (automatic or manual) can be configured, for example, via mode register 448. In some of these embodiments, the modes (automatic or manual) may be configured independently for each sensor, may be configured for each subset of the sensors, or may be for all senses The detectors are configured together. Examples of possible subsets are given below. In another embodiment, the mode (automatic or manual) is not configurable, for example, constructed in an automatic or manual mode, and/or based on configurable and/or non-configurable operational parameters.

在一些實施例中,在自動模式期間之操作可由控制器145來停止。在此等實施例中之一者中,可(例如)經由模式暫存器448來組態一種停止狀態指示。在此等實施例中的另一者中,另外或此外,可(例如)經由狀態設定暫存器454藉由停用感測器之充電以及放電來停止操作。在此等實施例中之另一者中,另外或此外,可藉由停用至測定模組105的輸入時脈375來停止操作。在一些實施例中,亦可(例如)由測定模組105來停止手動模式期間之操作。在此等實施例中之一者中,測定模組105可藉由(例如)經由狀態設定暫存器454來停用感測器之充電以及放電,藉由(例如)經由模式暫存器448來設定一種停止指示,及/或藉由停用輸入時脈375來停止操作。 In some embodiments, operation during the automatic mode may be stopped by controller 145. In one of these embodiments, a stop status indication can be configured, for example, via mode register 448. In the other of these embodiments, additionally or additionally, operation may be stopped, for example, via state setting register 454 by deactivating charging and discharging of the sensor. In the other of these embodiments, in addition or in addition, the operation can be stopped by deactivating the input clock 375 of the assay module 105. In some embodiments, the operation during the manual mode can also be stopped, for example, by the assay module 105. In one of these embodiments, the measurement module 105 can disable charging and discharging of the sensor by, for example, via the state setting register 454, for example, via the mode register 448. To set a stop indication, and/or to stop the operation by deactivating the input clock 375.

在一些實施例中,當停止操作時,無充電/放電控制信號360產生,且/或計數器時脈442並不供應至計數器430。在一些實施例中,當不再需要停止操作時,該停止狀態指示可被清除且/或感測器的充電被啟用。 In some embodiments, when the operation is stopped, no charge/discharge control signal 360 is generated and/or the counter clock 442 is not supplied to the counter 430. In some embodiments, the stop state indication can be cleared and/or the charging of the sensor is enabled when the stop operation is no longer needed.

在一些實施例中,可由控制器145在手動模式中開始一種累積循環。在一實施例中,可(例如)經由模式暫存器448來設定一種開始循環指示。在另一實施例中,另外或此外,可(例如)經由狀態設定暫存器454藉由啟用感測器之充電以及放電來開始一種累積循環。 In some embodiments, a cumulative cycle can be initiated by the controller 145 in manual mode. In an embodiment, a start loop indication can be set, for example, via mode register 448. In another embodiment, additionally or additionally, a cumulative cycle can be initiated, for example, via state setting register 454 by enabling charging and discharging of the sensor.

在一些實施例中,控制器145可組態系統100之操作參數,例如,時脈模組340中之操作參數中的任一者。如以上所論述地,在一些實施例中,為可組態之每一特定操作參數(例如,尤其以下各項中之任一者:抖動啟用/停用、抖動值、時脈除頻器值、高壓位準、低壓位準、計數器時脈週期(頻率)、充電/放電週期(頻率)、計數器啟用模式、累積循環中之充電/放電循環的數目、充電以及放電啟用/停用、自動/手動模式、新設定準備、停止狀態、讀取間之預定時間間隔,及/或開始循環)可獨立針對每一感測器、共同針對感測器之每一子集,或共同針對所有感測器來組態。子集之實例尤其包括:所有X感測器、所有Y感測器、所有偶數X感測器、所有偶數Y感測器、所有奇數X感測器、所有奇數Y感測器、所有X以及Y偶數感測器、所有X以及Y奇數感測器、偶數X以及奇數Y感測器、偶數Y以及奇數X感測器、電容感測模組115中之佈局之 特定區域中的感測器、佈局之特定區域中的X感測器、佈局之特定區域中的Y感測器、並行充電或放電之所有感測器、具有相同計數器啟用模式之所有感測器、並行量測時間間隔的所有感測器、經啟用之所有感測器、經啟用之所有X感測器、經啟用的所有Y感測器、該測定資料並行提供至控制器145之所有感測器、測定資料由控制器145一起處理之所有感測器、以上的任何組合等。子集之此等實例不應闡釋為具限制性。應理解術語子集未必暗示子集中之感測器為類似的。在一些實施例中,一或多個操作參數可不為可組態的,例如,操作參數可經建構或視其他可組態及/或不可組態的操作參數而定。 In some embodiments, controller 145 can configure operational parameters of system 100, such as any of the operational parameters in clock module 340. As discussed above, in some embodiments, each specific operational parameter is configurable (eg, in any of the following: jitter enable/disable, jitter value, clock divider value) , high voltage level, low voltage level, counter clock period (frequency), charge/discharge cycle (frequency), counter enable mode, number of charge/discharge cycles in the accumulation cycle, charge and discharge enable/disable, automatic / Manual mode, new setup preparation, stop state, predetermined time interval between reads, and/or start cycle) can be independently for each sensor, collectively for each subset of sensors, or collectively for all sensing To configure. Examples of subsets include, in particular, all X sensors, all Y sensors, all even X sensors, all even Y sensors, all odd X sensors, all odd Y sensors, all X and Y-even sensor, all X and Y odd sensors, even X and odd Y sensors, even Y and odd X sensors, layout in capacitive sensing module 115 Sensors in a specific area, X sensors in specific areas of the layout, Y sensors in specific areas of the layout, all sensors that charge or discharge in parallel, all sensors with the same counter enable mode All sensors in parallel measurement time interval, all enabled sensors, all enabled X sensors, all enabled Y sensors, all the senses provided to the controller 145 in parallel The detector, the measurement data are all sensors that are processed together by the controller 145, any combination of the above, and the like. These examples of subsets should not be construed as limiting. It should be understood that the subset of terms does not necessarily imply that the sensors in the subset are similar. In some embodiments, one or more of the operational parameters may not be configurable, for example, the operational parameters may be constructed or may depend on other configurable and/or non-configurable operational parameters.

為了有助於讀者理解,現返回參看圖2A且使用自上而下以及自左至右之慣例來呈現“偶數”以及“奇數”感測器之實例。在一實施例中,感測器232可認為是“奇數”Y感測器中的一者,因為感測器232為最後一行中之第一感測器;感測器234可認為是“偶數”Y感測器中之一者,因為感測器234為最後一行中的第二感測器;作為最後一列中之第一感測器,感測器236可認為是“奇數”X感測器中之一者;以及作為最後一列中的第二感測器,感測器238可認為是“偶數”X感測器中之一者。 To aid the reader's understanding, reference is now made to FIG. 2A and examples of "even" and "odd" sensors are presented using top-down and left-to-right conventions. In an embodiment, the sensor 232 can be considered to be one of the "odd" Y sensors because the sensor 232 is the first sensor in the last row; the sensor 234 can be considered to be "even" One of the Y sensors, because the sensor 234 is the second sensor in the last row; as the first sensor in the last column, the sensor 236 can be considered an "odd" X-sensing One of the devices; and as the second sensor in the last column, the sensor 238 can be considered to be one of the "even" X sensors.

在一實施例中,除了控制器145外,測定模組105亦能夠組態暫存器448、450、452及/或454中之操作參數中的至少一者。 In one embodiment, in addition to the controller 145, the assay module 105 can also configure at least one of the operational parameters in the registers 448, 450, 452, and/or 454.

如以上所提及地,本文所論述之操作參數不應闡釋為具約束性。在一些實施例中,可存在比本文所論述之操作參數多、少及/或與其不同之可組態及/或不可組態的操作參數,其影響測定模組105及/或控制器145的操作。 As mentioned above, the operational parameters discussed herein should not be construed as being binding. In some embodiments, there may be more, less, and/or different configurable and/or non-configurable operational parameters than those discussed herein that affect the assay module 105 and/or controller 145 operating.

圖14為根據本發明之實施例之手動模式方法1400的流程圖。在其他實施例中,可以與圖14中所示之次序不同的次序執行方法1400中所說明之階段,及/或可同時執行一個以上之階段。 14 is a flow diagram of a manual mode method 1400 in accordance with an embodiment of the present invention. In other embodiments, the stages illustrated in method 1400 may be performed in an order different than that shown in FIG. 14, and/or more than one stage may be performed simultaneously.

在圖14中所說明之實施例的階段1402中,存在電容偵測系統100之電力開啟(power up)。在階段1404中,存在初始化。初始化可包括適合於實施例之任何動作。舉例而言,在一些實施例中,初始化包括時脈模組340中之操作參數的組態。繼續所述實例,在一實施例中,尤其以下各項中之任一者可經組態:抖動啟用/停用、抖動值、時脈除頻器值、高壓位準、低壓位準、計數器時脈週期(頻率)、充電/放電週期(頻率)、計數器啟用模式、累積循環中之充電/放電循環的數目、充電以及放電啟用/停用、自動/手動模式、新設定準備、停止狀態、讀取間之預定時間間隔,及/或開始循環。如以上所論述地,操作參數可獨立針對每一感測器、共同針對感測器之每一子集,或共同針對所有感測器來組態。假定模式為手動模式。舉例而言,在各種實施例中,手動模式可為所支援之唯一模式,可為預設模式,或可為在階段1404中所組態的模式。在階段1406中,控制器145判定是否應開始一種累積循環。若否(對階段 1406之否定),則方法1400等待直到應開始一種累積循環為止。若應開始一種累積循環(對1406之肯定),則控制器145引起該累積循環開始進行。舉例而言,在一些實施例中,控制器145可設定一種開始循環指示及/或啟用(各)感測器之充電以及放電。繼續所述實例,在此等實施例中的一者中,該開始循環指示及/或感測器之啟用亦引起相關聯的計數器430被重設(reset)或另外為新計數作好準備。繼續所述實例,在此等實施例中之一者中,在判定已設定該開始循環指示後,測定模組105清除該開始循環指示。 In stage 1402 of the embodiment illustrated in FIG. 14, there is power up of the capacitance detection system 100. In stage 1404, there is initialization. Initialization may include any action suitable for the embodiments. For example, in some embodiments, the initialization includes configuration of operational parameters in the clock module 340. Continuing with the example, in one embodiment, any of the following may be configured: jitter enable/disable, jitter value, clock divider value, high voltage level, low voltage level, counter Clock cycle (frequency), charge/discharge cycle (frequency), counter enable mode, number of charge/discharge cycles in the accumulation cycle, charge and discharge enable/disable, automatic/manual mode, new set preparation, stop state, The predetermined time interval between reads, and/or the start of the loop. As discussed above, the operational parameters can be configured independently for each sensor, collectively for each subset of the sensors, or collectively for all of the sensors. Assume that the mode is manual mode. For example, in various embodiments, the manual mode can be the only mode supported, can be a preset mode, or can be a mode configured in stage 1404. In stage 1406, controller 145 determines if a cumulative cycle should begin. If no (for the stage Negative 1406), method 1400 waits until a cumulative cycle should begin. If a cumulative cycle should be initiated (affirmation of 1406), controller 145 causes the accumulation cycle to begin. For example, in some embodiments, controller 145 can set a start cycle indication and/or enable charging and discharging of the sensor(s). Continuing with the example, in one of these embodiments, the start of the loop indication and/or the activation of the sensor also causes the associated counter 430 to be reset or otherwise ready for a new count. Continuing with the example, in one of the embodiments, after determining that the start loop indication has been set, the assay module 105 clears the start loop indication.

在一些實施例中,在該累積週期期間,測定模組105對感測器充電以及放電一或多次(等於每一累積循環之充電/放電循環的數目),且累積地產生上述的測定資料。舉例而言,在此等實施例中之一些實施例中,每一充電/放電週期可與如以上參看圖6及/或圖7所論述之時序圖相關聯,且/或操作參數可影響如以上所論述的操作。當該累積循環結束時,測定模組105可(例如,在一實施例中)藉由中止充電/放電控制信號360及/或計數器時脈442之產生來使充電以及放電中止。繼續所述實例,在一實施例中,測定模組105可藉由停用充電以及放電及/或藉由設定如以上所論述之停止指示來停止操作。 In some embodiments, during the accumulation period, the measurement module 105 charges and discharges the sensor one or more times (equal to the number of charge/discharge cycles of each accumulation cycle), and cumulatively generates the above-described measurement data. . For example, in some of these embodiments, each charge/discharge cycle can be associated with a timing diagram as discussed above with reference to Figures 6 and/or 7, and/or operational parameters can affect The operations discussed above. When the accumulation cycle is complete, the assay module 105 can (eg, in one embodiment) suspend charging and discharging by suspending the generation of the charge/discharge control signal 360 and/or the counter clock 442. Continuing with the example, in one embodiment, the assay module 105 can cease operation by deactivating charging and discharging and/or by setting a stop indication as discussed above.

如以上所論述地,視實施例而定,控制器145可(例如)基於讀取間之預定的時間間隔來知道該測定資料已準備好,或測定模組105可在測定資料準備好被讀取時來設定一種“新設定準備”指示。假定具有“新設定準備指 示”之實施例,則可由“新設定準備”指示來產生對控制器145之中斷,或控制器145可輪詢以及意識到設定了“新設定準備指示”(對階段1408之肯定)。若且當(if and when)控制器145需要時,則控制器145可在階段1410中讀取關於與設定“新設定準備”指示相關聯之感測器之群組的測定資料。舉例而言,假定如圖4中之實施例,控制器145可讀取對應於與設定“新設定準備”指示相關聯之感測器之群組的計數器430中的任一者。繼續所述實例,在群組包括電容感測區域115中之所有n個感測器之實施例中,控制器145讀取計數器模組330中的所有計數器430。仍繼續所述實例,在群組包括經啟用充電以及放電之所有感測器之實施例中,控制器145讀取與充電以及放電經啟用之感測器相關聯的計數器430。在階段1412中,控制器145處理讀取之測定資料。在階段1414中,假定使用“新設定準備”指示,控制器145清除“新設定準備指示”。在一實施例中,清除“新設定準備指示”引起與群組相關聯之計數器430被重設或另外為新計數作好準備。在無“新設定準備”指示之實施例中,可跳過階段1414。在各種實施例中,階段1414可在階段1412前、在階段1412後,或與階段1412同時發生。方法1400接著返回至階段1406,其中控制器145判定何時觸發下一累積循環。 As discussed above, depending on the embodiment, controller 145 can know that the assay data is ready, for example, based on a predetermined time interval between reads, or that assay module 105 can be read at the assay data. Take a time to set a "new setup ready" indication. Assume that there is a "new setting preparation finger In the embodiment shown, the "new setup ready" indication can be used to generate an interrupt to the controller 145, or the controller 145 can poll and be aware that the "new setup preparation indication" is set (affirmation of stage 1408). And when (if and when) the controller 145 requires, the controller 145 can read the assay data for the group of sensors associated with setting the "new setup ready" indication in stage 1410. For example, Assume that, as in the embodiment of Figure 4, the controller 145 can read any of the counters 430 corresponding to the group of sensors associated with setting the "new settings ready" indication. Continue the example, in the group In an embodiment where the group includes all of the n sensors in the capacitive sensing region 115, the controller 145 reads all of the counters 430 in the counter module 330. The example continues, including enabling charging and discharging in the group. In all of the sensor embodiments, the controller 145 reads the counter 430 associated with the charging and discharging enabled sensors. In stage 1412, the controller 145 processes the read assay data. In stage 1414 , assuming the use of "new In preparation, the controller 145 clears the "new setup preparation indication." In an embodiment, clearing the "new setup preparation indication" causes the counter 430 associated with the group to be reset or otherwise prepared for the new count. In an embodiment without a "new setup ready" indication, stage 1414 can be skipped. In various embodiments, stage 1414 can occur before stage 14, after stage 1412, or concurrent with stage 1412. Method 1400 then returns to stage 1406, wherein controller 145 determines when to trigger the next accumulation cycle.

在方法1400的一實施例中,控制器145及/或測定模組105可在方法1400之任何適當階段期間組態或重組態時脈模組340之操作參數中的任一者。 In an embodiment of method 1400, controller 145 and/or assay module 105 can configure or reconfigure any of the operational parameters of clock module 340 during any suitable phase of method 1400.

圖15為根據本發明之實施例之自動模式方法1500的流程圖。除了階段1506之外,圖15和圖14基本上相同,故只說明階段1506。 15 is a flow diagram of an automatic mode method 1500 in accordance with an embodiment of the present invention. With the exception of stage 1506, Figures 15 and 14 are substantially identical, so only stage 1506 is illustrated.

在階段1506中,控制器145判定是否停止充電以及放電。若控制器145決定停止充電以及放電(對階段1506之肯定),則控制器145(例如)藉由停用充電以及放電及/或藉由設定如以上所論述之停止指示來引起充電以及放電停止。若決定為不停止充電(對階段1506之否定),則控制器145不會使充電及放電停止。若決定為中止”充電以及放電”之停止(對階段1506之否定),則控制器145(例如)藉由清除該停止指示及/或藉由啟用如以上所論述之充電以及放電來中止”停止充電及放電”。只要操作未由控制器145停止,則在一些實施例中,在每一累積循環期間,測定模組105對感測器充電以及放電一或多次(等於每一累積循環之充電/放電循環的數目),且累積地產生該測定資料。舉例而言,在此等實施例中之一些實施例中,每一充電/放電週期可與如以上參看圖6及/或圖7所論述之時序圖相關聯,且/或各操作參數可影響如以上所論述的操作。 In stage 1506, controller 145 determines whether to stop charging and discharging. If controller 145 decides to stop charging and discharging (affirmation of stage 1506), controller 145 causes charging and discharging to cease, for example, by deactivating charging and discharging and/or by setting a stop indication as discussed above. . If it is determined that charging is not to be stopped (negative to stage 1506), the controller 145 does not stop charging and discharging. If it is determined to stop the "charge and discharge" stop (negative to stage 1506), controller 145, for example, suspends by stopping the stop indication and/or by enabling charging and discharging as discussed above. Charging and discharging." As long as the operation is not stopped by the controller 145, in some embodiments, the measurement module 105 charges and discharges the sensor one or more times during each accumulation cycle (equal to the charge/discharge cycle of each accumulation cycle) The number) and cumulatively produced the assay data. For example, in some of these embodiments, each charge/discharge cycle can be associated with a timing diagram as discussed above with reference to Figures 6 and/or 7, and/or various operational parameters can affect The operations as discussed above.

如以上所論述地,視實施例而定,控制器145可(例如)基於讀取間之預定時間間隔來知道該測定資料已準備好,或測定模組105可在測定資料準備好被讀取時來設定“新設定準備”指示。假定具有“新設定準備指示”之實 施例,則可由“新設定準備”指示來產生對控制器145的中斷,或控制器145可輪詢以及意識到設定了“新設定準備指示”(對階段1508之肯定)。若且當控制器145需要時,則控制器145可在說明之實施例的階段1510中讀取關於與設定“新設定準備指示”相關聯之感測器之群組的測定資料。舉例而言,假定如圖4中之實施例,則控制器145可讀取由計數器430所產生的測定資料。繼續所述實例,在群組包括電容感測區域115中之所有n個感測器之實施例中,控制器145可讀取由計數器模組330中之所有計數器430所產生的測定資料。仍繼續所述實例,在群組包括經啟用充電以及放電之所有感測器的實施例中,控制器145可讀取由與充電以及放電經啟用之感測器相關聯之計數器430所產生的測定資料。在階段1512中,控制器145處理讀取之測定資料。在一些實施例中,測定模組105並不在重設計數器430(或另外,使計數器430為新計數作好準備)以及開始新的累積循環前等待控制器145讀取以及處理該測定資料。在存在新設定準備指示之此等實施例中的一些實施例中,測定模組105(例如)在若干個計數器時脈循環後清除新的設定準備指示。在存在新的設定準備指示之此等實施例中的一些實施例中,控制器145可在讀取資料後(若未已清除)來清除新的設定準備指示。在此等實施例中之一些實施例中,可存在記憶體(例如,計數器及/或其他類型之記憶體),其用於當執行當前的累積循環以及產生新的測定資料時儲存緊靠的先前的累積循環 中的測定資料。舉例而言,在具有記憶體之此等實施例中之一些實施例中,控制器145始終自記憶體讀取該測定資料,或若自測定資料已準備好以來新的累積循環已開始,則自記憶體讀取該測定資料。舉例而言,在具有記憶體以及計數器430之此等實施例中的一些實施例中,當計數器430在新的累積循環中產生測定資料時,可將在先前累積循環中由計數器430所產生的測定資料留在記憶體中。 As discussed above, depending on the embodiment, controller 145 can know that the assay data is ready, for example, based on a predetermined time interval between reads, or that assay module 105 can be read at the assay data. To set the "New setting preparation" instruction. Assume that there is a "new setting preparation instruction" Alternatively, an interrupt to controller 145 may be generated by a "new setup ready" indication, or controller 145 may poll and be aware that a "new setup preparation indication" is set (affirmation of stage 1508). If and when the controller 145 requires it, the controller 145 can read the assay data for the group of sensors associated with setting the "new setup preparation indication" in the stage 1510 of the illustrated embodiment. For example, assuming that the embodiment of FIG. 4, the controller 145 can read the assay data generated by the counter 430. Continuing with the example, in embodiments where the group includes all of the n sensors in the capacitive sensing region 115, the controller 145 can read the assay data generated by all of the counters 430 in the counter module 330. Continuing with the example, in embodiments where the group includes all of the sensors that enable charging and discharging, the controller 145 can read the counters 430 generated by the sensors associated with charging and discharging the enabled sensors. Measurement data. In stage 1512, controller 145 processes the measured assay data. In some embodiments, the assay module 105 does not wait for the controller 145 to read and process the assay data before resetting the counter 430 (or otherwise preparing the counter 430 for a new count) and before starting a new accumulation cycle. In some of these embodiments in which there is a new setup preparation indication, the assay module 105 clears, for example, a new setup preparation indication after a number of counter clock cycles. In some of these embodiments in which there is a new setup preparation indication, the controller 145 may clear the new setup preparation indication after reading the data (if not cleared). In some of these embodiments, there may be memory (eg, counters and/or other types of memory) for storing abutting when performing the current accumulation cycle and generating new assay data. Previous cumulative cycle Measurement data in the middle. For example, in some of the embodiments having memory, the controller 145 always reads the assay data from the memory, or if a new accumulation cycle has begun since the assay data is ready, then The measurement data is read from the memory. For example, in some of the embodiments with memory and counter 430, when counter 430 generates assay data in a new accumulation cycle, it may be generated by counter 430 in a previous accumulation cycle. The measurement data is left in the memory.

在方法1500之一實施例中,控制器模組145或測定模組105可在方法1500之任何適當階段組態或重組態時脈模組340的一或多個操作參數。 In one embodiment of method 1500, controller module 145 or assay module 105 can configure or reconfigure one or more operational parameters of clock module 340 at any suitable stage of method 1500.

在一些實施例中,控制器模組145可藉由重組態模式暫存器448而在手動與自動模式間切換。舉例而言,在此等實施例中之一者中,若在執行方法1400之重複(iteration)中的階段1406前將模式重組態為自動模式,則方法1500之階段1506以及後續階段可代替地接著進行。作為另一實例,在此等實施例中之一者中,若在執行階段1506後將模式重組態為手動模式,則方法1400的階段1406以及後續階段可接著進行。 In some embodiments, the controller module 145 can switch between manual and automatic modes by reconfiguring the mode register 448. For example, in one of these embodiments, if the mode is reconfigured to an automatic mode prior to performing stage 1406 in the iteration of method 1400, stage 1506 and subsequent stages of method 1500 can be substituted. The ground is proceeding. As another example, in one of these embodiments, if the mode is reconfigured to the manual mode after execution of stage 1506, stage 1406 and subsequent stages of method 1400 can proceed.

在一實施例中,與以上參看圖9所論述之階段902以及908並行地執行階段1402以及1404或階段1502以及1504。 In an embodiment, stages 1402 and 1404 or stages 1502 and 1504 are executed in parallel with stages 902 and 908 discussed above with reference to FIG.

再次參看圖1,由控制器145(例如,在階段1412或1512中)執行以偵測物件之存在及/或位置的處理以及測定資料之讀取與測定資料之處理間的相互依賴性(若存在) 並不受本發明限制。然而,為了向讀者進一步說明,現提供一些實例。在一實施例中,例如,處理所有讀取之測定資料。在其他實施例中,例如,僅處理讀取之測定資料中的一些測定資料。繼續所述實例,在假定讀取該測定資料時包括與經停用充電以及放電之感測器相關之資料之此等其他實施例中的一者中,忽略了與經停用充電以及放電之感測器相關的資料。在一實施例中,例如,一起處理經並行讀取且指定用於處理之所有測定資料。在其他實施例中,例如,未必一起處理經並行讀取且指定用於處理之所有測定資料。繼續所述實例,在此等其他實施例中的一些實施例中,可在一些情形中分別處理經並行讀取但與不同子集相關之測定資料。上文給出了子集之一些實例。繼續所述實例,在此等其他實施例中的一者中,分別處理與X感測器相關之讀取的測定資料以及與Y感測器相關之讀取的測定資料。在各種實施例中,控制器模組145可分別接收或可不分別接收待分別處理的測定資料(亦即,可在一些情形中並行接收待分別處理之測定資料)。舉例而言,假定分別處理對應於X感測器之測定資料與對應於Y感測器的測定資料,控制器模組145可在處理X感測器測定資料前接收對應於(一或多個)X感測器之測定資料,且在處理Y感測器測定資料前接收對應於(一或多個)Y感測器之測定資料。繼續所述實例,在一實施例中,控制器模組145可接收X感測器(或Y感測器)測定資料、處理X感測器(或Y感測器)測定資料,接著在處理Y感測器(或 X感測器)測定資料前接收Y感測器(或X感測器)測定資料,接著接收(新)X感測器(或Y感測器)測定資料等。在另一實施例中,控制器模組145可並行接收至少一些經分別處理之測定資料,且並行或按序分別處理該測定資料。 Referring again to Figure 1, the controller 145 (e.g., in stage 1412 or 1512) performs the process of detecting the presence and/or location of the object and the interdependence between the reading of the measured data and the processing of the measured data (if presence) It is not limited by the invention. However, for further explanation to the reader, some examples are now provided. In one embodiment, for example, all of the read assay data is processed. In other embodiments, for example, only some of the measured data of the read assay data is processed. Continuing with the example, in one of these other embodiments, including the data relating to the sensor that is deactivated to charge and discharge, the reading of the assay data is ignored, and the deactivated charging and discharging are ignored. Sensor related information. In one embodiment, for example, all assay data that is read in parallel and designated for processing is processed together. In other embodiments, for example, all assay data that is read in parallel and designated for processing is not necessarily processed together. Continuing with the example, in some of these other embodiments, assay data that is read in parallel but associated with a different subset may be processed separately in some cases. Some examples of subsets are given above. Continuing with the example, in one of these other embodiments, the measured data associated with the X sensor and the measured data associated with the Y sensor are processed separately. In various embodiments, the controller module 145 may or may not separately receive the measurement data to be processed separately (that is, the measurement data to be separately processed may be received in parallel in some cases). For example, if it is assumed that the measurement data corresponding to the X sensor and the measurement data corresponding to the Y sensor are separately processed, the controller module 145 may receive (one or more) before processing the X sensor measurement data. The measurement data of the X sensor, and the measurement data corresponding to the (one or more) Y sensors is received before the Y sensor measurement data is processed. Continuing with the example, in one embodiment, the controller module 145 can receive X sensor (or Y sensor) measurement data, process X sensor (or Y sensor) measurement data, and then process Y sensor (or The X sensor receives the Y sensor (or X sensor) measurement data before measuring the data, and then receives the (new) X sensor (or Y sensor) measurement data. In another embodiment, the controller module 145 can receive at least some of the separately processed assay data in parallel, and process the assay data in parallel or sequentially.

再次參看圖1,在控制器模組145偵測接近電容感測區域115之物件之位置的一些實施例中,控制器模組145在偵測該位置後將偵測之位置轉譯成輸出之座標。在此等實施例中,視實施例而定,可將座標輸出至電容偵測系統100內及/或外的任何適當模組。舉例而言,在此等實施例中之一些實施例中,輸出可至(至少至)顯示器,以在顯示器上顯示位置(例如,游標之位置)。在此等實施例中的一者中,可經由USB介面、PS/2介面、並列介面、串列介面或經由任何其他適當介面由控制器模組145輸出座標。在一些實施例中,可藉由主機驅動器(例如,主機滑鼠驅動器,諸如,Microsoft Windows®驅動器、Linux®驅動器或任何其他作業系統主機驅動器),將由控制器模組145輸出之座標轉換成顯示座標。 Referring again to FIG. 1, in some embodiments in which the controller module 145 detects the position of the object approaching the capacitive sensing region 115, the controller module 145 translates the detected position into an output coordinate after detecting the position. . In such embodiments, the coordinates may be output to any suitable module within and/or outside of the capacitance detection system 100, depending on the embodiment. For example, in some of these embodiments, the output can be to (at least to) a display to display a location (eg, the position of the cursor) on the display. In one of these embodiments, the coordinates may be output by the controller module 145 via a USB interface, a PS/2 interface, a parallel interface, a serial interface, or via any other suitable interface. In some embodiments, the coordinates output by controller module 145 can be converted to display by a host drive (eg, a host mouse drive, such as a Microsoft Windows® drive, a Linux® drive, or any other operating system host drive). coordinate.

在控制器模組145偵測接近電容感測區域115之物件之存在的一些實施例中,控制器模組145(額外地或以另一方式)輸出一種是否已偵測到存在之指示。在此等實施例中,視實施例而定,可將該指示輸出至電容偵測系統100內及/或外之任何適當模組。舉例而言,在此等實施例中之一些實施例中,該輸出可至顯示器或至事件登入器。在此 等實施例中之一者中,可經由USB介面、PS/2介面、並列介面、串列介面或任何其他適當介面而由控制器模組145輸出上述與所偵測之存在相關的指示。在一實施例中,若小鍵盤或鍵盤上之鍵包括電容感測區域模組115,則若偵測到存在,則可由控制器模組145輸出對應於鍵之碼。 In some embodiments in which the controller module 145 detects the presence of an object proximate to the capacitive sensing region 115, the controller module 145 (except or otherwise) outputs an indication of whether a presence has been detected. In such embodiments, the indication may be output to any suitable module within and/or outside of the capacitance detection system 100, depending on the embodiment. For example, in some of these embodiments, the output can be to a display or to an event logger. here In one of the embodiments, the controller module 145 can output the indication related to the detected presence via a USB interface, a PS/2 interface, a parallel interface, a serial interface, or any other suitable interface. In an embodiment, if the key on the keypad or the keyboard includes the capacitive sensing area module 115, if the presence is detected, the controller module 145 may output a code corresponding to the key.

在一些實施例中,控制器145進行之位置及/或存在偵測的結果可影響測定模組105及/或控制器145之操作。 In some embodiments, the location and/or presence of the detection by controller 145 may affect the operation of assay module 105 and/or controller 145.

圖16為根據本發明之一實施例之控制器模組145的方塊圖。在圖16中所說明之實施例中,控制器模組145自測定模組105接收該測定資料,且(例如)藉由組態如以上所描述之測定模組105中的操作參數來控制該測定模組105。在說明之實施例中,控制器模組145使用接收之測定資料來偵測(例如)接近電容感測模組115之物件的存在及/或位置。在說明之實施例中,控制器模組145輸出資料,例如,物件之偵測位置的座標,及/或是否已偵測到物件之存在的指示。 16 is a block diagram of a controller module 145 in accordance with an embodiment of the present invention. In the embodiment illustrated in FIG. 16, controller module 145 receives the assay data from assay module 105 and controls the assay data, for example, by configuring operational parameters in assay module 105 as described above. The module 105 is measured. In the illustrated embodiment, the controller module 145 uses the received measurement data to detect, for example, the presence and/or location of an object proximate to the capacitive sensing module 115. In the illustrated embodiment, the controller module 145 outputs data, such as coordinates of the detected position of the object, and/or whether an indication of the presence of the object has been detected.

應注意在本發明之一些實施例中,控制器模組145經組態以基於接收之測定資料來偵測物件的存在及/或位置,而無關於測定模組105中所包括之功能性以及無關於測定資料之格式或內容。在此等實施例中之一些實施例中,只要測定資料為感測器之電容之單調函數,控制器模組145便可使用測定資料來偵測上述之存在及/或位置。 It should be noted that in some embodiments of the invention, the controller module 145 is configured to detect the presence and/or location of an object based on the received assay data, regardless of the functionality included in the assay module 105 and No form or content of the measurement data. In some of these embodiments, the controller module 145 can use the assay data to detect the presence and/or location of the sensor as long as the assay data is a monotonic function of the capacitance of the sensor.

舉例而言,測定資料在以下情形中為電容的單調函數: xy,則f(x)f(y)(單調增大-亦即,測定資料保持電容之次序關係)或x<y,則f(x)f(y)(單調減小-亦即,測定資料顛倒電容之次序關係)。 For example, the measured data is a monotonic function of the capacitance in the following cases: x y, then f(x) f(y) (monotonically increasing - that is, determining the order of the data retention capacitance) or x < y, then f(x) f(y) (monotonically decreasing - that is, determining the order in which the data is reversed).

在此等實施例中的其他實施例中,測定資料可為電容之單調或非單調函數。 In other embodiments of these embodiments, the assay data can be a monotonic or non-monotonic function of the capacitance.

在圖16中所說明之實施例中,控制器模組145包括互動模組1602、校準模組1604、存在偵測模組1610、位置偵測模組1620、偏移計算模組1630、記憶體1640,以及傳輸模組1650。在一實施例中,互動模組1602經組態以經由介面155與測定模組105互動,例如,如本文所描述之組態操作參數、視情況地開始及/或停止充電以及放電、接收上述之測定資料等。模組1602、1604、1610、1620、1630、1640以及1650中的每一者可由能夠執行如本文所定義以及闡釋之功能之軟體、硬體及/或韌體的任何組合所組成。將參看圖17來較詳細地論述模組1602、1604、1610、1620、1630、1640以及1650。應記得如以上所提及地,圖16之方塊圖僅為一實例且在本發明之一些實施例中,控制器145可包含比圖16中所說明之區塊少、多及/或與其不同的區塊。舉例而言,在此等實施例中之一者中,因為並不計算各校準值(見以下圖17之階段1702以及1706),所以省略校準模組1604。作為另一實例,在此等實施例中的一者中,因為並不執行過濾(見以下圖17之階段1722)及/或因為並不執行位置偵測(見以下方法1700的描述), 所以省略了偏移(offset)計算模組1630。作為另一實例,在此等實施例中之一者中,因為並不執行位置偵測(見以下方法1700之描述),所以可省略位置偵測模組1620。在本發明的一些實施例中,可將控制器145之功能性不同地劃分至圖16中所說明之區塊中。在本發明的一些實施例中,可將控制器145之功能性劃分至比圖16中所示之區塊少、多及/或與其不同的區塊中。在本發明之一些實施例中,控制器145可包括額外的功能性、比本文所描述之功能性少及/或與其不同的功能性。在本發明之一些實施例中,本文之1602、1604、1610、1620、1630、1640及/或1650中的一或多者可具有比本文所描述之功能性多、少及/或與其不同之功能性。 In the embodiment illustrated in FIG. 16, the controller module 145 includes an interaction module 1602, a calibration module 1604, a presence detection module 1610, a position detection module 1620, an offset calculation module 1630, and a memory. 1640, and a transmission module 1650. In an embodiment, the interaction module 1602 is configured to interact with the assay module 105 via the interface 155, for example, configuring operational parameters as described herein, optionally starting and/or stopping charging and discharging, receiving the above Measurement data, etc. Each of the modules 1602, 1604, 1610, 1620, 1630, 1640, and 1650 can be comprised of any combination of software, hardware, and/or firmware capable of performing the functions as defined and illustrated herein. Modules 1602, 1604, 1610, 1620, 1630, 1640, and 1650 will be discussed in greater detail with reference to FIG. It should be recalled that, as mentioned above, the block diagram of FIG. 16 is merely an example and in some embodiments of the invention, controller 145 may include fewer, more, and/or different than the blocks illustrated in FIG. Block. For example, in one of these embodiments, the calibration module 1604 is omitted because the calibration values are not calculated (see stages 1702 and 1706 of Figure 17 below). As another example, in one of these embodiments, because filtering is not performed (see stage 1722 of Figure 17 below) and/or because position detection is not performed (see description of method 1700 below), Therefore, the offset calculation module 1630 is omitted. As another example, in one of these embodiments, the position detection module 1620 can be omitted because position detection is not performed (see description of method 1700 below). In some embodiments of the invention, the functionality of controller 145 may be partitioned differently into the blocks illustrated in FIG. In some embodiments of the invention, the functionality of controller 145 may be partitioned into fewer, more, and/or different blocks than those shown in FIG. In some embodiments of the invention, controller 145 may include additional functionality, less functionality than described herein, and/or functionality different therefrom. In some embodiments of the invention, one or more of the numbers 1602, 1604, 1610, 1620, 1630, 1640, and/or 1650 herein may have more, less, and/or different functionality than those described herein. Feature.

為了易於讀者的理解,現將描述邏輯座標之(非約束性)慣例。邏輯座標柵格在一些實施例中幫助執行計算以偵測位置。假定將電容感測模組115中之多個電容感測器佈局為如以上參看圖2所描述的X感測器以及Y感測器,圖18說明根據本發明之一些實施例之應用於感測器之佈局的邏輯座標柵格(或應用於佈局之部分之邏輯座標柵格的部分)。舉例而言,在一實施例中,圖18可展示應用於旋轉至右邊之觸控板右上手角或任何其他柵格位置內之感測器之佈局的邏輯座標柵格。如以上所提及地,本發明並不限制電容感測區域模組115中之感測器的數目,且因此圖18中所示之感測器的數目僅為一實例。如圖18中所展示地,邏輯座標柵格將每一感測器映射至預定數目之單 位,其中每一特定維度中之每兩個感測器間的間隔(亦即,每兩個X感測器間之間隔或每兩個Y感測器間之間隔)為100個單位。在一些實施例中,可將間隔劃分成任何數目的單位。在一些實施例中,邏輯座標柵格可執行任何適當映射。 For ease of understanding by the reader, the (non-binding) convention of logical coordinates will now be described. The logical coordinate grid, in some embodiments, assists in performing calculations to detect position. Assuming that a plurality of capacitive sensors in the capacitive sensing module 115 are arranged as an X sensor and a Y sensor as described above with reference to FIG. 2, FIG. 18 illustrates a sense of application in accordance with some embodiments of the present invention. The logical coordinate grid of the layout of the detector (or part of the logical coordinate grid applied to the portion of the layout). For example, in one embodiment, FIG. 18 may show a logical coordinate grid applied to the layout of sensors in the right upper hand corner of the touchpad to the right or any other grid location. As mentioned above, the present invention does not limit the number of sensors in the capacitive sensing area module 115, and thus the number of sensors shown in Figure 18 is only an example. As shown in Figure 18, the logical coordinate grid maps each sensor to a predetermined number of orders A bit, wherein the interval between each of the two sensors in each particular dimension (i.e., the interval between every two X sensors or the interval between every two Y sensors) is 100 units. In some embodiments, the interval can be divided into any number of units. In some embodiments, the logical coordinate grid can perform any suitable mapping.

假定在電容感測區域模組115中存在一電容感測器及/或控制器145執行存在偵測但不執行位置偵測之實施例,在此等實施例中之一些實施例中邏輯柵格慣例可能並不必要。在電容感測區域模組115中僅存在感測器的一陣列(亦即,X感測器或Y感測器之一陣列)的實施例中,則邏輯座標柵格可假定一種在陣列中之每兩個感測器間之100個或任何其他適當數目之單位的間隔(separation),及/或執行任何適當映射。 It is assumed that there is an embodiment in the capacitive sensing area module 115 in which a capacitive sensor and/or controller 145 performs presence detection but does not perform position detection, in some embodiments of the embodiments, a logic grid Practice may not be necessary. In embodiments where only one array of sensors (ie, an array of X sensors or Y sensors) is present in the capacitive sensing region module 115, the logical coordinate grid can assume one in the array A separation of 100 or any other suitable number of units between each of the two sensors, and/or performing any suitable mapping.

讀者將理解邏輯座標柵格為在一些實施例中經開發以有助於藉由控制器模組145用於偵測位置之計算的慣例,且因此,在一些實施例中,可視控制器模組145是否以及如何經組態以偵測位置而定來應用或省略邏輯座標柵格慣例。為了易於讀者之理解,在方法1700(圖17)之實施例的描述中假定了上述之邏輯座標柵格。 The reader will understand that the logical coordinate grid is a convention developed in some embodiments to facilitate calculation of the position by the controller module 145, and thus, in some embodiments, the visual controller module 145 Whether and how it is configured to detect or omit the logical coordinate grid convention. For ease of understanding by the reader, the logical coordinate grid described above is assumed in the description of the embodiment of method 1700 (Fig. 17).

在一些實施例中,記憶體1640儲存一或多個位準及/或可導出位準之值。在一些實施例中,此等位準由控制器模組145用於偵測接近電容感測區域模組115之指狀物或另一物件的存在,及/或用以偵測指狀物或物件之位置。舉例而言,在此等實施例中之一些實施例中,在輸入設備的 製造過程期間,此等位準中之一或多者(及/或可導出位準之一或多個值)經判定且儲存於記憶體1640中。繼續所述實例,額外地,在此等實施例中之一些實施例中,在開發過程期間,此等位準中之一或多者(及/或可導出位準之一或多個值)經判定且儲存於記憶體中。繼續所述實例,視實施例而定,在輸入設備的壽命期間在初始判定後每一位準可改變或可不改變。 In some embodiments, memory 1640 stores one or more levels and/or values of derivable levels. In some embodiments, the levels are used by the controller module 145 to detect the presence of a finger or another object proximate the capacitive sensing area module 115 and/or to detect a finger or The location of the object. For example, in some of these embodiments, at the input device During the manufacturing process, one or more of these levels (and/or one or more of the values that can be derived) are determined and stored in memory 1640. Continuing with the example, additionally, in some of these embodiments, one or more of the levels (and/or one or more values may be derived) during the development process It is determined and stored in the memory. Continuing with the example, depending on the embodiment, each level may or may not change after the initial determination during the life of the input device.

在一些實施例中,用於存在偵測及/或位置偵測之所述一或多個位準尤其包括以下各項中之任一者:觸摸低位準、觸摸高位準、雜訊容限(margin)位準,及/或max_points位準。 In some embodiments, the one or more levels for presence detection and/or position detection include, in particular, any of the following: touch low level, touch high level, and noise tolerance ( Margin) level, and / or max_points level.

在一些實施例中,將觸摸低位準以及觸摸高位準設定為表面描述符的函數。表面描述符為描述覆蓋層之一或多個特性之值,所述覆蓋層覆蓋系統100的至少電容感測區域模組115(例如,包括至少電容感測區域115之諸如觸控板或鍵之輸入設備的覆蓋層)。特性之實例可尤其包括:覆蓋層之厚度及/或覆蓋層的電性質。舉例而言,優良隔離材料之薄層可由表面描述符之低值來描述,而任何材料的厚層或導電材料之薄層可由表面描述符之高值來描述,或反之亦然。 In some embodiments, the touch low level and the touch high level are set as a function of the surface descriptor. The surface descriptor is a value describing one or more characteristics of the overlay layer, the overlay layer covering at least the capacitive sensing area module 115 of the system 100 (eg, including at least the capacitive sensing area 115 such as a touchpad or a key Enter the overlay of the device). Examples of properties may include, inter alia, the thickness of the cover layer and/or the electrical properties of the cover layer. For example, a thin layer of good isolation material can be described by the low value of the surface descriptor, while a thick layer of any material or a thin layer of conductive material can be described by the high value of the surface descriptor, or vice versa.

舉例而言,在一實施例中,可使用以下方程式來計算觸摸低位準以及觸摸高位準: For example, in one embodiment, the following equations can be used to calculate the touch low level and the touch high level:

TOUCH_HIGH_level=2×TOUCH_LOW_level TOUCH _ HIGH _ level = 2 × TOUCH _ LOW _ level

在此實施例中,當指狀物或其他物件接近時完全不存在覆蓋系統100之至少電容感測區域模組115的覆蓋層(例如,在諸如觸控板或鍵之輸入設備上完全無覆蓋層)時,假定350為表面描述符值。在此所給出之touch_low以及touch_high位準的方程式僅為一實例,且因此不應闡釋為具限制性。 In this embodiment, there is no cover layer covering at least the capacitive sensing area module 115 of the system 100 when the fingers or other objects are in proximity (eg, no coverage on the input device such as a trackpad or key) Layer), assume 350 is the surface descriptor value. The equations of touch_low and touch_high levels given here are only an example, and therefore should not be construed as limiting.

在另一實施例中,可使用其他方程式來計算touch_low以及touch_high位準。在另一實施例中,可除了方程式外或代替方程式使用查表(look-up table)來計算touch_low以及touch_high位準。 In another embodiment, other equations can be used to calculate the touch_low and touch_high levels. In another embodiment, the touch_low and touch_high levels may be calculated using a look-up table in addition to or instead of the equation.

在一實施例中,只要覆蓋系統100之至少電容感測區域模組115的覆蓋層保持相同(例如,用於觸控板或鍵之相同塑膠或其他材料覆蓋層),則touch_low以及touch_high位準保持相同。 In an embodiment, as long as at least the cover layer of the capacitive sensing area module 115 of the overlay system 100 remains the same (eg, the same plastic or other material overlay for the touchpad or keys), the touch_low and touch_high levels are Keep the same.

在一些實施例中,雜訊容限位準視系統100中之電容感測區域模組115及/或電容測定模組125之特定建構而定,及/或視物理環境而定。在此等實施例中,可針對特定建構以及物理環境經驗性地判定雜訊容限位準。舉例而言,在一實施例中,當無物件接近電容感測區域115時隨預定時間週期的推移,可讀取每一感測器之測定資料多次,且可針對每一感測器計算在最大讀數與最小讀數間的 差。在此實施例中,針對電容感測區域115中之所有感測器所計算之差的平均值為雜訊容限位準。計算雜訊容限位準之此描述方法不應闡釋為具限制性,且在其他實施例中,可使用其他方法來判定雜訊容限位準。 In some embodiments, the specific configuration of the capacitive sensing area module 115 and/or the capacitance measuring module 125 in the noise tolerance quasi-view system 100 depends on the physical environment. In such embodiments, the noise tolerance level can be empirically determined for a particular construction and physical environment. For example, in an embodiment, when no object is close to the capacitive sensing region 115, the measurement data of each sensor can be read multiple times with a predetermined time period, and can be calculated for each sensor. Between the maximum and minimum readings difference. In this embodiment, the average of the differences calculated for all of the sensors in the capacitive sensing region 115 is the noise tolerance level. This method of describing the noise tolerance level should not be construed as limiting, and in other embodiments, other methods can be used to determine the noise tolerance level.

在一些實施例中,最大點位準為當前觸摸低位準值或雜訊容限之函數。舉例而言,在一實施例中,由以下演算法給出最大點位準:若(TOUCH_LOW位準3/5)大於NOISE_MARGIN位準 In some embodiments, the maximum point level is a function of the current touch low level value or noise tolerance. For example, in one embodiment, the maximum point level is given by the following algorithm: if (TOUCH_LOW level * 3/5) is greater than the NOISE_MARGIN level

則MAX_POINTS位準=TOUCH_LOW位準3/5 Then MAX_POINTS level = TOUCH_LOW level * 3/5

否則MAX_POINTS位準=NOISE_MARGIN位準 Otherwise MAX_POINTS level = NOISE_MARGIN level

在此所展示之最大點位準之演算法僅為一實例,且因此不應闡釋為具限制性。在另一實施例中,可使用另一演算法。在另一實施例中,可除了演算法外或代替演算法使用查表來判定最大點位準。 The algorithm for the maximum point level shown here is only an example and therefore should not be construed as limiting. In another embodiment, another algorithm can be used. In another embodiment, a lookup table may be used in addition to or in lieu of an algorithm to determine the maximum point level.

在控制器模組145經組態以偵測存在但不偵測位置的一些實施例中,雜訊容限位準及/或最大點位準未必需要判定。 In some embodiments in which the controller module 145 is configured to detect presence but not detect position, the noise tolerance level and/or the maximum point level do not necessarily require a determination.

在一實施例中,觸摸低位準、觸摸高位準及/或max_points位準對surface_descriptor值之部分或全部依賴性可在一些情形中證明為有利的,從而允許經由提供surface_descriptor值而相對簡單地定製硬體建構。 In an embodiment, touching the low level, the touch high level, and/or the max_points level to some or all of the surface_descriptor values may prove advantageous in some cases, allowing for relatively simple customization via providing surface_descriptor values. Hardware construction.

在存在感測器之兩個陣列(例如,X感測器以及Y感測器)的一實施例中,觸摸低位準、觸摸高位準、雜訊容限位準及/或max_points位準之位準可對於兩個陣列而言為相同的。 In one embodiment where there are two arrays of sensors (eg, X sensor and Y sensor), touch low level, touch high level, noise tolerance level, and/or max_points level It can be the same for both arrays.

圖17為根據本發明之實施例之由控制器145執行的處理上述測定資料之方法1700的流程圖。方法1700視實施例而定可用於存在偵測及/或位置偵測。在其他實施例中,可以與圖7中所示之次序不同的次序來執行方法1700中所說明之階段,且/或可同時執行一個以上之階段。 17 is a flow diagram of a method 1700 of processing the assay data performed by controller 145, in accordance with an embodiment of the present invention. Method 1700 can be used for presence detection and/or position detection depending on the embodiment. In other embodiments, the stages illustrated in method 1700 can be performed in an order different than that shown in FIG. 7, and/or more than one stage can be performed simultaneously.

在圖17中所說明的實施例中,在階段1701,存在電容偵測系統100之電力開啟。在一些實施例中,在電力開啟期間,藉由控制器145(例如,校準模組1604)來執行階段1702,其判定與電容感測區域115中之感測器相關之測定資料的校準值。在此等實施例中,測定資料之校準值為當無接近電容感測區域115之指狀物或其他物件存在時之測定資料的值。舉例而言,在此等實施例中之一些實施例中,校準值由互動模組1602接收且傳遞至校準模組1604。在此等實施例中之一者中,校準模組1604將校準值儲存於記憶體1640中。在不使用校準值(見以下階段1706)之實施例中,可省略校準值的判定(亦即,可省略階段1702)。 In the embodiment illustrated in FIG. 17, at stage 1701, there is power on of the capacitance detection system 100. In some embodiments, during power-on, stage 1702 is performed by controller 145 (eg, calibration module 1604) that determines a calibration value for the assay data associated with the sensor in capacitive sensing region 115. In these embodiments, the calibration value of the assay data is the value of the assay data when no fingers or other objects near the capacitive sensing region 115 are present. For example, in some of these embodiments, the calibration values are received by the interaction module 1602 and passed to the calibration module 1604. In one of these embodiments, the calibration module 1604 stores the calibration values in the memory 1640. In embodiments where calibration values are not used (see stage 1706 below), the determination of the calibration values may be omitted (i.e., stage 1702 may be omitted).

在一實施例中,在電力開啟(階段1701)期間及/或在方法1700之任何其他適當階段期間,可更新以下位準中之一或多者(例如)以將環境條件中的改變考慮在內:觸 摸低位準、觸摸高位準、最大點位準及/或雜訊容限位準。在另一實施例中,可省略方法1700期間之更新。 In an embodiment, during power up (stage 1701) and/or during any other suitable phase of method 1700, one or more of the following levels may be updated (eg, to account for changes in environmental conditions) Inside: touch Touch low level, touch high level, maximum point level and/or noise tolerance level. In another embodiment, the update during method 1700 can be omitted.

在一些實施例中,在階段1704前(例如,與階段1701以及1702並行),執行階段902至910、階段1402至1404,及/或階段1502至1504。舉例而言,在一實施例中,在階段1704前,可組態時脈模組340中的一或多個操作參數,例如,尤其是以上所論述之以下各操作參數中之任一者:抖動啟用/停用、抖動值、時脈除頻器值、高壓位準、低壓位準、計數器時脈週期(頻率)、充電/放電週期(頻率)、計數器啟用模式、累積循環中之充電/放電循環的數目、充電以及放電啟用/停用、自動/手動模式、新設定準備、讀取間之預定時間間隔、停止狀態,及/或開始循環。如以上所論述地,一種操作參數可獨立針對每一感測器、共同針對感測器之每一子集,或共同針對所有感測器來組態。 In some embodiments, stages 902 through 910, stages 1402 through 1404, and/or stages 1502 through 1504 are performed prior to stage 1704 (eg, in parallel with stages 1701 and 1702). For example, in an embodiment, prior to stage 1704, one or more operational parameters in the clock module 340 can be configured, such as, in particular, any of the following operational parameters discussed above: Jitter enable/disable, jitter value, clock divider value, high voltage level, low voltage level, counter clock period (frequency), charge/discharge cycle (frequency), counter enable mode, charge in cumulative cycle / The number of discharge cycles, charge and discharge enable/disable, automatic/manual mode, new setup preparation, predetermined time interval between reads, stop state, and/or start cycle. As discussed above, one operational parameter can be configured independently for each sensor, collectively for each subset of sensors, or collectively for all sensors.

在階段1704中,將測定資料提供至控制器模組145,例如,至互動模組1602。舉例而言,充電以及放電以及提供測定資料的各種實施例可如以上所描述地發生,且可視實施例而定在manual_mode或auto_mode下發生。舉例而言,在一實施例中,階段1704可對應於階段1406至1410或對應至階段1506至1510。 In stage 1704, the assay data is provided to controller module 145, for example, to interaction module 1602. For example, various embodiments of charging and discharging, as well as providing assay data, can occur as described above, and can occur under manual_mode or auto_mode, depending on the embodiment. For example, in an embodiment, stage 1704 can correspond to stages 1406 through 1410 or to stages 1506 through 1510.

在一實施例中,以上所論述之階段1512或1412(測定資料之處理)可包含階段1706至1724中的任一者。 In an embodiment, stage 1512 or 1412 (processing of assay data) discussed above may include any of stages 1706 through 1724.

為了簡化本文之處理之描述,在描述的實施例中,假定該測定資料視實施例而定可為電容之單調增大函數或單 調減小函數。因此,將接收之測定資料的絕對值(或接收之測定資料之絕對值減去校準值)描述為在處理期間使用,以允許具有單調增大或減小之函數的實施例。然而,應理解的是,獲取絕對值視實施例而定可能並不必要,且/或在一些實施例中,該測定資料可並非電容之單調函數。 In order to simplify the description of the processing herein, in the described embodiments, it is assumed that the measurement data may be a monotonically increasing function or a single of the capacitance depending on the embodiment. Tune the function. Thus, the absolute value of the received assay data (or the absolute value of the received assay data minus the calibration value) is described as an embodiment used during processing to allow for a function that monotonically increases or decreases. However, it should be understood that obtaining absolute values may not be necessary depending on the embodiment, and/or in some embodiments, the assay data may not be a monotonic function of capacitance.

在一些實施例中,在階段1706中,接收之測定資料(或將用於位置及/或存在偵測的接收之測定資料)各自減少了相對應之感測器的校準值(如在階段1702中所判定者),且獲取每一差之絕對值(且/或可使用查表)。本文使用術語“平衡測定資料”來代表此等差之絕對值,亦即,ABS(接收值-校準值)。舉例而言,校準模組1604可接收來自互動模組1602的測定資料以及來自記憶體1640的校準值,且執行階段1705中之減少功能以及絕對值計算,以產生平衡的測定資料。在一些實施例中,若特定的校準值高於對應於相同感測器之接收的測定資料,則控制器145重新計算對應校準值或所有感測器的校準值,所述重新計算是(例如)藉由平均化對應於正執行重新計算之感測器的連續讀數而進行的。在一實施例中,省略階段1706,且將接收之測定資料的絕對值用於後續計算。為了包括具有階段1706以及未具有階段1706之兩個實施例,方法1700之後續計算將描述為應用於(平衡的)測定資料,其中在此上下文中之括號指出階段1706之可任選的(optional)本質。 In some embodiments, in stage 1706, the received assay data (or the assay data used for location and/or presence detection) is each reduced by a corresponding sensor calibration value (eg, at stage 1702). The person judged in the), and obtain the absolute value of each difference (and / or can use the look-up table). The term "balanced assay data" is used herein to mean the absolute value of this difference, that is, ABS (received value - calibration value). For example, the calibration module 1604 can receive assay data from the interaction module 1602 and calibration values from the memory 1640 and perform the reduction function and absolute value calculations in stage 1705 to produce balanced assay data. In some embodiments, if the particular calibration value is higher than the received assay data corresponding to the same sensor, the controller 145 recalculates the corresponding calibration value or the calibration values for all of the sensors, the recalculation being (eg, ) by averaging the continuous readings corresponding to the sensor that is performing the recalculation. In an embodiment, stage 1706 is omitted and the absolute value of the received assay data is used for subsequent calculations. In order to include two embodiments with stage 1706 and without stage 1706, subsequent calculations of method 1700 will be described as applied to (balanced) assay data, where the brackets in this context indicate optional of stage 1706 (optional) )Nature.

在階段1708中,檢查(平衡的)測定資料是否具有與一或多個位準之預定關係,其指出存在已被偵測(亦即,指狀物或其他物件的存在已影響電容感測區域115中之一或多個感測器的電容)。舉例而言,在一實施例中,由存在偵測模組1610來執行階段1708。視實施例而定,可為了任何目的或不為任何目的來使用該偵測之存在或不存在。 In stage 1708, it is checked whether the (balanced) assay data has a predetermined relationship to one or more levels indicating that the presence has been detected (ie, the presence of a finger or other object has affected the capacitive sensing region The capacitance of one or more of the sensors in 115). For example, in one embodiment, stage 1708 is performed by presence detection module 1610. Depending on the embodiment, the presence or absence of the detection may be used for any purpose or for no purpose.

參看圖19,其為說明根據本發明之實施例之存在偵測的圖表。 Referring to Figure 19, a diagram illustrating presence detection in accordance with an embodiment of the present invention is shown.

圖19展示(例如)因為電容感測區域115中之感測器排列於一維度中或因為(平衡的)測定資料1906對應於X感測器而相對於X軸邏輯座標以繪製於Z軸上的(平衡的)測定資料1906。在後者的情形中,額外地,可將對應於Y感測器之(平衡的)測定資料相對於Y軸邏輯座標以繪製於Z軸上。 19 shows, for example, because the sensors in the capacitive sensing region 115 are arranged in one dimension or because the (balanced) assay data 1906 corresponds to the X sensor and is plotted on the Z axis with respect to the X-axis logical coordinates. (balanced) assay data 1906. In the latter case, additionally, the (balanced) measurement data corresponding to the Y sensor can be plotted on the Z-axis with respect to the Y-axis logical coordinate.

注意在圖19的實施例中,繪製之(平衡的)測定資料1906類似於高斯分佈之形狀。在一些實施例中,可在指狀物或另一物件改變電容感測區域模組115中之一個以上之電容感測器的電容時(但以不同量)產生此形狀。舉例而言,在圖19中所說明之實施例中,對應於點1908之電容感測器比對應於點1910之電容感測器具有上升較多的電容。本發明之(平衡的)測定資料在形狀上並不被約束於高斯分佈或本文所呈現之圖中之任一者中所說明的振幅。 Note that in the embodiment of Figure 19, the plotted (balanced) assay data 1906 is similar to the shape of a Gaussian distribution. In some embodiments, this shape can be produced when the finger or another object changes the capacitance of one or more capacitive sensors in the capacitive sensing area module 115 (but in different amounts). For example, in the embodiment illustrated in FIG. 19, the capacitive sensor corresponding to point 1908 has a much higher capacitance than the capacitive sensor corresponding to point 1910. The (balanced) assay data of the present invention is not constrained in shape by the Gaussian distribution or the amplitudes illustrated in any of the figures presented herein.

圖19之實施例中亦展示X感測器(或一維度)之觸摸高位準1902以及觸摸低位準1904。在另一實施例中, 額外地,可繪製Y感測器(或另一維度)之觸摸低位準以及觸摸高位準。 The touch sensor level 1902 and the touch low level 1904 of the X sensor (or one dimension) are also shown in the embodiment of FIG. In another embodiment, Additionally, the touch level of the Y sensor (or another dimension) and the touch level can be drawn.

在一實施例中,在階段1708中,存在偵測模組1610相對於(例如)儲存於記憶體1640中之touch_low_level以及touch_high_level的值來檢查(平衡的)測定資料。舉例而言,參看圖19,可在階段1708中檢查(平衡的)測定資料中是否存在於觸摸低位準1904與觸摸高位準1902間之至少一點。如圖19中所展示地,點1908以及1910均在觸摸低位準1904與觸摸高位準1902間,且因此,偵測到存在。 In one embodiment, in stage 1708, presence detection module 1610 checks (balanced) assay data against, for example, the values of touch_low_level and touch_high_level stored in memory 1640. For example, referring to FIG. 19, it may be checked in stage 1708 whether the (balanced) assay data is present at least between touch low level 1904 and touch high level 1902. As shown in FIG. 19, points 1908 and 1910 are both between touch low level 1904 and touch high level 1902, and thus, presence is detected.

在另一實施例中,可檢查(平衡的)測定資料中是否有存在於觸摸低位準1904上方之至少一點,且若是,則偵測到存在。然而,在一些情形中,可較佳地具有兩個位準1902以及1904,使得在觸摸高位準1902上方之離群值(outlier)點將不影響偵測的決定。 In another embodiment, it is possible to check (balanced) the assay data for at least one point above the touch low level 1904, and if so, detect the presence. However, in some cases, it may be preferable to have two levels 1902 and 1904 such that an outlier point above the touch high level 1902 will not affect the decision of the detection.

在一些實施例中,(例如)若在感測區域115中僅存在一個感測器或若僅來自一個感測器之資料經分別處理,可存在僅一個對應於(平衡的)測定資料之點(亦即,並不是點之分佈)。在此等實施例中,將一點與一或多個位準相比較,以判定是否偵測到存在。舉例而言,在此等實施例中的一者中,若一點在觸摸低位準與觸摸高位準間,則偵測到存在(亦即,偵測到指狀物或其他物件之存在已影響一感測器之電容)。 In some embodiments, for example, if only one sensor is present in the sensing region 115 or if only data from one sensor is processed separately, there may be only one point corresponding to the (balanced) measurement data. (ie, not the distribution of points). In such embodiments, a point is compared to one or more levels to determine if a presence is detected. For example, in one of the embodiments, if one point is between the touch low level and the touch high level, the presence is detected (ie, the presence of the finger or other object is detected to have affected one). The capacitance of the sensor).

亦應注意在一些實施例中,可執行階段1708,即使對應於一或多個感測器的(平衡的)測定資料並不精確地反映電容,例如,因為(平衡的)測定資料包括與經停用充電以及放電之感測器相關的資料。此等實施例假定“不精確的”(平衡的)測定資料並不包含落在touch_low與touch_high位準間之所述唯一點,或當檢查僅相對於touch_low位準時,則假定“不精確的”(平衡的)測定資料並不包含落在touch_low位準上方的所述唯一點。 It should also be noted that in some embodiments, stage 1708 may be performed even if the (balanced) assay data corresponding to one or more sensors does not accurately reflect the capacitance, for example, because (balanced) assay data includes and Disable sensor-related information for charging and discharging. These embodiments assume that "inaccurate" (balanced) assay data does not include the unique point that falls between the touch_low and touch_high levels, or that "inaccurate" is assumed when the check is only relative to the touch_low level. The (balanced) assay data does not include the unique point that falls above the touch_low level.

若存在對應於X感測器以及Y感測器之(平衡的)測定資料,則在一實施例中,可分別針對該對應於X感測器之(平衡的)測定資料以及對應於Y感測器的(平衡的)測定資料來執行階段1708,且在另一實施例中,可針對該對應於X感測器之(平衡的)測定資料或對應於Y感測器之(平衡的)測定資料來執行階段1708。舉例而言,在一些情形中,可假定處理僅對應於X感測器或Y感測器之(平衡的)測定資料對於偵測存在而言足夠靈敏。在針對(平衡的)測定資料不止一次執行階段1708(例如,分別針對X感測器以及Y感測器資料)的實施例中,可依序或並行執行多個階段1708。在一些實施例中,在階段1708中並非所有可用的(平衡的)測定資料均可與預定的位準相比較以偵測存在,此或許因為認為僅比較可用資料之部分已足夠精確。舉例而言,在此等實施例中之一些實施例中,假定X以及Y感測器在電容感測區域模組115中,可在階 段1708中將對應於僅一些X感測器及/或一些Y感測器之可用的(平衡的)測定資料與位準相比較。 If there is (balanced) measurement data corresponding to the X sensor and the Y sensor, in one embodiment, the (balanced) measurement data corresponding to the X sensor and the corresponding Y sense may be respectively The (balanced) assay data of the detector is to perform stage 1708, and in another embodiment, for (balanced) assay data corresponding to the X sensor or (balanced) corresponding to the Y sensor The data is measured to perform stage 1708. For example, in some cases, it may be assumed that the processing corresponds to only (balanced) assay data of the X sensor or the Y sensor to be sufficiently sensitive to detect presence. In embodiments in which phase 1708 is performed more than once for (balanced) assay data (eg, for X sensors and Y sensor data, respectively), multiple stages 1708 may be performed sequentially or in parallel. In some embodiments, not all of the available (balanced) assay data in stage 1708 can be compared to a predetermined level to detect the presence, perhaps because it is believed that only a portion of the available data is sufficiently accurate. For example, in some of these embodiments, it is assumed that the X and Y sensors are in the capacitive sensing region module 115, In section 1708, the available (balanced) assay data corresponding to only some of the X sensors and/or some of the Y sensors is compared to the level.

假定在階段1708中未偵測到存在(對階段1708之否定),則方法1700視實施例而定重複返回至階段1702或階段1704。在一實施例中,校準值之重校準(階段1702)可在每次未偵測到存在時或偶爾當未偵測到存在時執行。在另一實施例中,不執行重校準且方法1700直接重複返回至階段1704。在一些實施例中,若在階段1708中未偵測到存在,則傳輸模組1650可輸出不存在(亦即,未偵測到之存在)的指示。 Assuming no presence is detected in stage 1708 (negative to stage 1708), method 1700 repeats returning to stage 1702 or stage 1704, depending on the embodiment. In an embodiment, the recalibration of the calibration values (stage 1702) may be performed each time no presence is detected or occasionally when no presence is detected. In another embodiment, recalibration is not performed and method 1700 repeats directly to stage 1704. In some embodiments, if no presence is detected in stage 1708, transmission module 1650 can output an indication that there is no (ie, no detected presence).

假定在階段1708中偵測到存在,則若亦需要位置偵測,則方法1700以始於階段1710之位置偵測繼續進行,其中(例如)由位置偵測模組1620來執行位置偵測。舉例而言,在一實施例中,可將(平衡的)測定資料自校準模組1604或自存在偵測模組1610傳遞至位置偵測模組1620。若不需要位置偵測,且僅需要存在偵測,則在一些實施例中,方法1700跳至階段1724,其假定由傳輸模組1650輸出存在之指示。舉例而言,在本發明的一些實施例中,指狀物或其他物件之存在或不存在之指示可能為僅需要的輸出。在此等實施例中之一者中,電容感測區域115中之每一電容感測器對應於一鍵,且需要針對所述鍵以偵測出是否偵測到指狀物或另一物件的存在。 Assuming that presence is detected in stage 1708, if location detection is also required, method 1700 continues with location detection starting at stage 1710, where location detection is performed, for example, by location detection module 1620. For example, in one embodiment, the (balanced) measurement data can be transmitted from the calibration module 1604 or the self-presence detection module 1610 to the position detection module 1620. If position detection is not required and only detection is required, in some embodiments, method 1700 jumps to stage 1724, which assumes that the indication of presence is output by transmission module 1650. For example, in some embodiments of the invention, the presence or absence of an indication of a finger or other item may be an only desired output. In one of the embodiments, each of the capacitive sensing regions 115 corresponds to a button, and the button needs to be detected to detect whether a finger or another object is detected. The presence.

在一些實施例中,可將例如由存在偵測模組1610在階段1708中所偵測之存在之指示及/或不存在的指示提供至 互動模組1602,例如,以影響測定模組105及/或控制器模組145之操作。自存在偵測模組1610引導至互動模組1602之虛線箭頭在本發明之實施例中表示反饋至互動模組1602的可任選的本質。 In some embodiments, an indication of the presence and/or absence of presence detected by the presence detection module 1610 in stage 1708 can be provided to The interaction module 1602, for example, affects the operation of the assay module 105 and/or the controller module 145. The dashed arrow leading from the presence detection module 1610 to the interaction module 1602 represents an optional nature of the feedback to the interaction module 1602 in an embodiment of the invention.

參看圖20,其為說明根據本發明之實施例之位置偵測演算法的圖表。展示於圖20中的為X感測器(或一維度)之觸摸低位準2004、觸摸高位準2002(以上參看圖19已對其描述)、雜訊容限位準2012以及最大點位準2014。在另一實施例中,額外地,亦可繪製Y感測器(或另一維度)之觸摸低位準、觸摸高位準、雜訊容限位準以及最大點位準。 Referring to Figure 20, a diagram illustrating a position detection algorithm in accordance with an embodiment of the present invention. Shown in Figure 20 is the X sensor (or one dimension) touch low level 2004, the touch high level 2002 (described above with reference to Figure 19), the noise tolerance level 2012, and the maximum point level 2014 . In another embodiment, additionally, the touch low level, the touch high level, the noise tolerance level, and the maximum point level of the Y sensor (or another dimension) may also be drawn.

在圖20的實施例中,例如因為感測區域115中之感測器排列於一維度中或因為(平衡的)測定資料2006對應於X感測器,所以將(平衡的)測定資料2006相對於X軸邏輯座標以繪製於Z軸上。在後者情形中,額外地,可相對於Y軸邏輯座標來繪製對應於Y感測器之(平衡的)測定資料。 In the embodiment of FIG. 20, the (balanced) measurement data 2006 is relatively relative, for example, because the sensors in the sensing region 115 are arranged in one dimension or because the (balanced) measurement data 2006 corresponds to the X sensor. The X-axis logical coordinates are plotted on the Z-axis. In the latter case, additionally, (balanced) assay data corresponding to the Y sensor can be plotted against the Y-axis logical coordinates.

現參看圖21,其說明根據本發明之實施例之(平衡的)測定資料,其中在電容感測區域115中存在多個X感測器以及Y感測器。圖21說明對應於X感測器(如相對於X軸所繪製者)之Z軸上的(平衡的)測定資料2102以及對應於Y感測器(如相對於Y軸所繪製者)之Z軸上的(平衡的)測定資料2104。值(x、z)或(y、z)之對(pair)以下稱作每一軸上的資料點,其中分別在曲線2102或2104 上之每一點之已計算的x或y值為如以上參看圖18所描述之電容感測區域115中之感測器之佈局上的邏輯座標。曲線2106展示(平衡的)測定資料2102與(平衡的)測定資料2104之相交。 Referring now to Figure 21, there is illustrated (balanced) assay data in accordance with an embodiment of the present invention in which a plurality of X sensors and Y sensors are present in capacitive sensing region 115. Figure 21 illustrates (balanced) assay data 2102 on the Z-axis corresponding to the X sensor (as plotted against the X-axis) and Z corresponding to the Y sensor (as plotted against the Y-axis) (Balanced) measurement data on the shaft 2104. Pairs of values (x, z) or (y, z) are hereinafter referred to as data points on each axis, respectively in curves 2102 or 2104 The calculated x or y value for each of the above points is a logical coordinate on the layout of the sensor in the capacitive sensing region 115 as described above with reference to FIG. Curve 2106 shows the intersection of (balanced) assay data 2102 with (balanced) assay data 2104.

本發明並不受圖19、20以及21中所說明之圖表所限制,且在其他實施例中,(平衡的)測定資料當繪製時可未必類似於圖19、20以及21中的圖表。 The present invention is not limited by the diagrams illustrated in Figures 19, 20, and 21, and in other embodiments, the (balanced) assay data may not necessarily be similar to the graphs of Figures 19, 20, and 21 when plotted.

注意在一些情形中可執行位置偵測,即使對應於一或多個感測器之(平衡的)測定資料並不精確地反映電容,例如,因為(平衡的)測定資料包括與經停用充電以及放電之感測器相關的資料,其假定“不精確的”(平衡的)測定資料並不影響本文相關於位置偵測所論述之計算。 Note that position detection can be performed in some cases, even if the (balanced) measurement data corresponding to one or more sensors does not accurately reflect the capacitance, for example, because (balanced) measurement data includes and deactivated charging As well as the sensor related to the discharge, it is assumed that the "inaccurate" (balanced) measurement data does not affect the calculations discussed herein with respect to position detection.

在階段1710中,假定在電容感測區域模組115中存在X感測器以及Y感測器,則在一些實施例中,分別處理對應於Y感測器之(平衡的)測定資料與對應於X感測器的(平衡的)測定資料,以分別判定指狀物或其他物件之X邏輯座標以及Y邏輯座標。若存在著各別的處理,則視實施例而定,可並行地或依序地處理對應於X軸之(平衡的)測定資料以及對應於Y軸的(平衡的)測定資料。若僅將在一維度(亦即,X或Y邏輯座標)中表示位置,則在一實施例中,在階段1710中處理對應於一維度中之感測器(例如,X感測器或Y感測器)之(平衡的)測定資料,以偵測位置。 In stage 1710, assuming that an X sensor and a Y sensor are present in the capacitive sensing area module 115, in some embodiments, the (balanced) measurement data corresponding to the Y sensor is processed and corresponding, respectively. The (balanced) measurement data of the X sensor is used to determine the X logical coordinates of the fingers or other objects and the Y logical coordinates, respectively. If there is a separate process, depending on the embodiment, the (balanced) measurement data corresponding to the X-axis and the (balanced) measurement data corresponding to the Y-axis can be processed in parallel or sequentially. If the position is only represented in one dimension (i.e., X or Y logical coordinates), in one embodiment, the sensor corresponding to one dimension (e.g., X sensor or Y) is processed in stage 1710. (balanced) measurement data of the sensor to detect the position.

舉例而言,在一實施例中,位置偵測模組1620自記憶體1640擷取一或多個位準,以用於位置偵測。 For example, in one embodiment, the position detection module 1620 retrieves one or more levels from the memory 1640 for position detection.

再次參看圖20,在階段1712中,判定在觸摸低位準2004與觸摸高位準2002間之每一維度之(平衡的)測定資料的最大點。(為了論述階段1712,假定觸摸高位準2002上方之任何資料點均為離群值(outliers)且因此被忽略)。 Referring again to FIG. 20, in stage 1712, the maximum point of the (balanced) assay data for each dimension between the touch low level 2004 and the touch high level 2002 is determined. (To discuss stage 1712, it is assumed that any data points above the touch high level 2002 are outliers and are therefore ignored).

舉例而言,在圖20之實施例中,X維度之(平衡的)測定資料2006的最大點為點2008。 For example, in the embodiment of FIG. 20, the maximum point of the (balanced) assay data X of the X dimension is point 2008.

在階段1716中,判定多少以及哪些點將用於計算每一維度之物件之位置。另一方面,使用較少點可在一些情形中引起較快的計算,且/或可在一些情形中減少功率消耗。另一方面,使用較多點可在一些情形中引起較精確的計算。因此,在階段1716中,須判定精確的計算所需要之點的最小數目以及哪些點。在一具有顯示器之實施例中,應由控制器模組145來判定具有足夠解析度之位置,使得若需要,則主機驅動器(或任何其他模組)可將判定的位置轉換成具有適合於建構之顯示器之解析度的顯示座標(例如,按像素)。 In stage 1716, it is determined how many and which points will be used to calculate the position of the object for each dimension. On the other hand, using fewer points may result in faster calculations in some situations, and/or may reduce power consumption in some cases. On the other hand, using more points can lead to more accurate calculations in some situations. Therefore, in stage 1716, the minimum number of points and which points are needed for an accurate calculation must be determined. In an embodiment with a display, the controller module 145 should determine the location with sufficient resolution so that if desired, the host driver (or any other module) can convert the determined location to have a suitable fit. The display coordinates of the resolution of the display (eg, by pixel).

對(平衡的)測定資料中在遠離最大點之任一方向上在最大點位準上方的點的數目進行計數。舉例而言,假定水平地繪製一種維度(例如,X軸或Y軸),對在最大點之右邊之點的數目以及在最大點之左邊之點(其在最大點位準上方)的數目進行計數。 The number of points in the (balanced) measurement data above the maximum point level in any direction away from the maximum point is counted. For example, suppose that one dimension is drawn horizontally (for example, the X-axis or the Y-axis), and the number of points to the right of the maximum point and the number of points to the left of the maximum point (which is above the maximum point level) are performed. count.

再次參看圖20,在最大點2008之右邊的點2020以及2022在最大點位準2014上方(亦即,兩個點在右邊),且在最大點2008之左邊的點2016以及2018在最大點位準2014上方(亦即,兩個點在左邊)。 Referring again to Figure 20, points 2020 and 2022 to the right of the maximum point 2008 are above the maximum point level 2014 (i.e., two points are on the right), and points 2016 and 2018 to the left of the maximum point 2008 are at the maximum point. Above the standard 2014 (ie, two points on the left).

由2×Max(左边点,右边点)+1給出將在說明之實施例中用於計算中之點的數目。換言之,在說明之實施例中,在計算中使用最大點之右邊以及左邊之相同數目的點,其中所使用之數目視任一側上之最大點位準上方之點的較高數目而定。再次參看圖20,其中存在右邊之兩個點以及左邊之兩個點。使用以上方程式,(2 x Max(2,2)+1=2 x 2+1=5),且因此對於圖20之實施例,使用五個點來計算X維度中的位置,亦即,在計算中使用最大點、最大點之左邊的兩個最高點,最大點之右邊的兩個點(最高點)。參看圖20,使用多個點2008、2016、2018、2020以及2022。 The number of points that will be used in the calculation in the illustrated embodiment is given by 2 x Max (left point, right point) +1. In other words, in the illustrated embodiment, the same number of points to the right and to the left of the maximum point are used in the calculation, wherein the number used depends on the higher number of points above the maximum point level on either side. Referring again to Figure 20, there are two points on the right and two points on the left. Using the above equation, (2 x Max(2,2)+1=2 x 2+1=5), and thus for the embodiment of Figure 20, five points are used to calculate the position in the X dimension, ie, The maximum point, the two highest points to the left of the maximum point, and the two points to the right of the maximum point (the highest point) are used in the calculation. Referring to Figure 20, a plurality of points 2008, 2016, 2018, 2020, and 2022 are used.

在另一實施例中,可存在用以判定在計算中使用之點之數目的不同方程式。在另一實施例中,在計算中使用預定數目之點。 In another embodiment, there may be different equations for determining the number of points used in the calculation. In another embodiment, a predetermined number of points are used in the calculation.

在一實施例中,在階段1718中,使用加權平均來計算每一維度中之位置(亦即,未過濾的邏輯座標)。 In an embodiment, in stage 1718, a weighted average is used to calculate the position in each dimension (ie, unfiltered logical coordinates).

在以上加權平均方程式中,對於(在階段1716中所選擇的)點中之每一者,由點之(平衡的)測定資料值來加權(亦即,乘以)對應的感測器的邏輯座標。 In the above weighted average equation, for each of the points (selected in stage 1716), the logic of the corresponding sensor is weighted (ie, multiplied) by the (balanced) measured data value of the point. coordinate.

若需要計算一個以上之維度(例如,X以及Y軸)中之位置,則在一實施例中,分別針對每一軸執行加權平均計算(例如,分別執行兩個加權平均,一個針對X感測器資料,且一個針對Y感測器資料)。 If it is desired to calculate the position in more than one dimension (eg, the X and Y axes), in one embodiment, a weighted average calculation is performed for each axis separately (eg, two weighted averages are performed separately, one for the X sensor) Information, and one for the Y sensor data).

假定在階段1718中執行兩次加權平均計算(一次針對X感測器資料且一次針對Y感測器資料),則在一實施例中,指狀物或其他物件的(未過濾的)位置經偵測為在由兩個加權平均計算所判定之(x,y)未過濾的座標處。若僅存在一維度,則在一實施例中,指狀物或其他物件之(未過濾的)位置經偵測為在由一加權平均計算所判定的未過濾的座標處。 Assuming that two weighted average calculations are performed in stage 1718 (once for the X sensor data and once for the Y sensor data), in one embodiment, the (unfiltered) position of the fingers or other objects is The detection is at the (x, y) unfiltered coordinates determined by the two weighted average calculations. If there is only one dimension, in one embodiment, the (unfiltered) position of the finger or other object is detected as being at the unfiltered coordinates determined by a weighted average calculation.

用於計算未過濾的座標之以上所呈現的方程式不應闡釋為具限制性。在另一實施例中,可(例如)使用高斯近似法來不同地計算未過濾的位置。 The equations presented above for calculating unfiltered coordinates should not be construed as limiting. In another embodiment, unfiltered locations may be calculated differently, for example, using a Gaussian approximation.

在一些實施例中,未過濾的位置由偵測模組1620提供至偏移計算模組1630,及/或儲存於記憶體1640中。 In some embodiments, the unfiltered locations are provided by the detection module 1620 to the offset calculation module 1630 and/or stored in the memory 1640.

在一些實施例中,在階段1722中由偏移計算模組1630使用一種過濾演算法來使每一維度中之(未過濾的)加權邏輯座標平滑化,以最小化電雜訊及/或其他障礙物之效應。舉例而言,在此等實施例中之一些實施例中,使用加權衰減演算法(亦即,加權平均)來計算每一維度中之過 濾的座標。在此等實施例中,為了計算新過濾的座標,計算在新未過濾的座標(在階段1718中所判定)與先前過濾的座標(在階段1722之先前重複中所判定)間的平均值。在此等實施例中之一些實施例中,若由“U”標記(新)未過濾的座標(自1718)、由“Xprev”標記先前過濾的座標、由“Xnew”標記新過濾的座標,且(新)未過濾以及先前過濾的座標之加權值分別為α以及β,則吾人得到:Xnew=αU new +βX prev 。在此等實施例中,α以及β為可縮放的(scalable)且可基於(例如)此等實施例中之一者中的建構來選擇,以產生顯示器上之輸入設備的游標的最平滑移動。舉例而言,在此等實施例中之一者中,α以及β可針對輸入設備之表面覆蓋層(諸如,觸控板的覆蓋層)來定製,及/或針對產生相異量之雜訊之輸入設備的電組件來定製。 In some embodiments, a filter algorithm is used in stage 1722 to smooth (unfiltered) weighted logical coordinates in each dimension to minimize electrical noise and/or other The effect of obstacles. For example, in some of these embodiments, a weighted decay algorithm (ie, a weighted average) is used to calculate the filtered coordinates in each dimension. In such embodiments, to calculate the newly filtered coordinates, the average between the new unfiltered coordinates (determined in stage 1718) and the previously filtered coordinates (determined in the previous iteration of stage 1722) is calculated. In some of these embodiments, if the (U) mark (new) unfiltered coordinates (from 1718), the "X prev " marks the previously filtered coordinates, and the "X new " mark the newly filtered The coordinates, and (new) unfiltered and previously filtered coordinates are α and β , respectively, then we get: X new = αU new + βX prev . In such embodiments, α and β are scalable and can be selected based on, for example, the construction in one of these embodiments to produce the smoothest movement of the cursor of the input device on the display. . For example, in one of these embodiments, alpha and beta may be customized for a surface overlay of an input device, such as a cover layer of a touchpad, and/or for generating dissimilarities The electrical components of the input device are customized.

若需要計算一個以上之維度(例如,X以及Y軸)中之位置,則在一實施例中,分別針對每一軸來執行過濾(例如,分別執行兩個加權衰減演算法,一個針對X感測器資料,且一個針對Y感測器資料)。 If it is desired to calculate positions in more than one dimension (eg, X and Y axes), in one embodiment, filtering is performed separately for each axis (eg, two weighted attenuation algorithms are performed separately, one for X sensing) Information, and one for the Y sensor data).

假定在階段1722中執行兩次過濾(一次針對X感測器資料且一次針對Y感測器資料),則在一實施例中,指狀物或其他物件的過濾位置經偵測為在由兩個加權衰減演算法所判定之(x,y)過濾的座標處。若僅存在一維度,則指狀物或其他物件之過濾的位置經偵測為在由一加權衰減演算法所判定的過濾的座標處。 Assuming that filtering is performed twice in stage 1722 (once for the X sensor data and once for the Y sensor data), in one embodiment, the filter position of the finger or other object is detected as being in two The (x, y) filtered coordinates determined by the weighted decay algorithm. If there is only one dimension, the filtered position of the finger or other object is detected as being at the filtered coordinates as determined by a weighted decay algorithm.

階段1722可在一些情形中證明在使任何位置移動平滑化時為有利的,然而,在其他實施例中,可省略階段1722。舉例而言,在一實施例中,若在階段1708之先前重複中未偵測到存在後在階段1708中偵測到存在,則省略階段1722。在一些情形中,此實施例藉此防止非連續的位置移動之平滑化。 Stage 1722 may prove advantageous in some situations when smoothing any positional movement, however, in other embodiments, stage 1722 may be omitted. For example, in one embodiment, stage 1722 is omitted if a presence is detected in stage 1708 after no presence is detected in the previous iteration of stage 1708. In some cases, this embodiment thereby prevents smoothing of discontinuous positional movements.

視實施例而定,可為了任何目的或不為任何目的來使用在階段1718/1722中所判定的未過濾及/或過濾的位置。舉例而言,在一實施例中,在階段1724中,未過濾及/或過濾的位置可藉由傳輸模組1650輸出至主機驅動器,所述主機驅動器將所述(過濾或未過濾的加權邏輯)座標轉換成顯示座標,使得一位置可顯示於螢幕上。(如以上所提及地,若在階段1708中未偵測到存在且無需位置偵測,則在一些實施例中,方法1700自階段1708跳至階段1724,且在階段1724中,可由傳輸模組1650輸出一種存在之指示)。 Depending on the embodiment, the unfiltered and/or filtered locations determined in stage 1718/1722 may be used for any purpose or for no purpose. For example, in an embodiment, in stage 1724, unfiltered and/or filtered locations may be output to the host driver via transport module 1650, which will drive (filtered or unfiltered weighting logic) The coordinates are converted into display coordinates so that a position can be displayed on the screen. (As mentioned above, if no presence is detected in stage 1708 and no position detection is required, in some embodiments, method 1700 jumps from stage 1708 to stage 1724, and in stage 1724, the transmission mode can be Group 1650 outputs an indication of presence).

在一些實施例中,可將在階段1718/1722中所判定之未過濾及/或過濾的位置或其函數提供至互動模組1602,例如,以影響測定模組105及/或控制器模組145的操作。在一些實施例中,若未偵測到位置,則可將偵測位置之失敗的指示提供至互動模組1602。自偏移計算模組1630引導至互動模組1602之虛線箭頭在本發明之實施例中表示反饋至互動模組1602的可任選的本質。 In some embodiments, the unfiltered and/or filtered locations determined in stages 1718/1722 or functions thereof may be provided to the interaction module 1602, for example, to affect the assay module 105 and/or the controller module. 145 operation. In some embodiments, if no location is detected, an indication of the failure of the detected location may be provided to the interaction module 1602. The dashed arrows directed from the offset calculation module 1630 to the interactive module 1602 represent an optional nature of feedback to the interactive module 1602 in an embodiment of the invention.

在一些實施例中,若未偵測到位置,則可在階段1724中由傳輸模組1650輸出一種偵測位置失敗之指示。 In some embodiments, if no location is detected, an indication of a failed location detection may be output by transmission module 1650 in stage 1724.

在階段1724後,方法1700重複返回至階段1704。 After stage 1724, method 1700 repeats returning to stage 1704.

再次參看圖1,在一些實施例中,存在偵測及/或位置偵測之結果可影響充電以及放電(例如,經由自存在偵測模組1610至互動模組1602之反饋箭頭,及/或經由自偏移計算模組1630至互動模組1602的反饋箭頭)。舉例而言,在此等實施例中之一些實施例中,操作參數之組態可受存在偵測及/或位置偵測的結果影響。繼續所述實例,在此等實施例中之一者中,在初始存在偵測及/或位置偵測結果前可存在一預設(default)操作模式,且視初始結果而定,該操作可切換至或可不切換至一非預設操作模式。假定基於初始結果或隨後的結果使該操作改變至非預設操作模式,該操作視隨後的結果而定可變回至或可不變回至一預設模式。 Referring again to FIG. 1, in some embodiments, the presence of detection and/or position detection may affect charging and discharging (eg, feedback arrows via the self-presence detection module 1610 to the interactive module 1602, and/or Feedback arrow via the self-offset calculation module 1630 to the interaction module 1602). For example, in some of these embodiments, the configuration of the operational parameters may be affected by the results of presence detection and/or position detection. Continuing with the example, in one of the embodiments, there may be a default mode of operation before the initial presence of the detection and/or position detection result, and depending on the initial result, the operation may be Switch to or may not switch to a non-preset mode of operation. It is assumed that the operation is changed to a non-preset operation mode based on the initial result or the subsequent result, and the operation may be changed back to or may not be returned to a preset mode depending on the subsequent result.

在實施例中,假定可存在一或多個功率節省(亦即,省功率)模式以及一或多個正常(非功率節省)模式。視實施例而定,預設模式可為功率節省模式或正常模式。在一實施例中,當有害地影響位置偵測及/或存在偵測之功率節省模式的較低可能性存在時,功率節省模式經組態而代替正常模式以節省功率。在一實施例中,當有害地影響位置偵測及/或存在偵測之功率節省模式的較高可能性存在時,正常模式經組態而代替功率節省模式。在一實施例中,功率節省模式可額外地減少來自測定模組105的電磁干擾(EMI)。 In an embodiment, it is assumed that there may be one or more power saving (ie, power saving) modes and one or more normal (non-power saving) modes. Depending on the embodiment, the preset mode may be a power save mode or a normal mode. In one embodiment, the power save mode is configured to replace the normal mode to save power when there is a lower likelihood of a power save mode that adversely affects position detection and/or presence detection. In one embodiment, the normal mode is configured to replace the power save mode when there is a higher likelihood of a power save mode that adversely affects position detection and/or presence detection. In an embodiment, the power save mode may additionally reduce electromagnetic interference (EMI) from the assay module 105.

在一實施例中,在正常模式中還是在功率節省模式中 執行充電以及放電是可組態的。舉例而言,在一實施例中,可(例如)由控制器145經由模式暫存器448(見圖4)來組態正常模式或功率節省模式。 In an embodiment, in the normal mode or in the power saving mode Performing charging and discharging is configurable. For example, in an embodiment, the normal mode or power save mode can be configured, for example, by controller 145 via mode register 448 (see FIG. 4).

在一些實施例中,測定的時脈頻率(週期)在正常模式中比在功率節省模式中高(低)。如以上參看圖8以及9所提及地,測定時脈846可包括或可不包括抖動,且因此,在正常以及功率節省模式中之測定時脈之本文以下的論述應認為包括適當之具有以及不具有抖動的實施例。舉例而言,在此等實施例中之一些實施例中,例如在時脈控制暫存器450(見圖4或5)中的時脈除頻器值“Z”可用以組態與輸入時脈375之頻率相關之在功率節省模式中之變換時脈849(見圖8)的頻率(例如,在功率節省模式中之變換時脈849信號之頻率=輸入時脈375信號的頻率/Z)。在具有可組態的時脈除頻器值之實施例中,時脈除頻器值可針對電容感測區域115中的每一感測器獨立設定,或針對電容感測區域115中之感測器的每一子集共同設定,而在此等實施例中之另一者中,時脈除頻器值可針對電容感測區域115中之所有感測器共同設定。上文進一步給出子集的實例。 In some embodiments, the measured clock frequency (period) is higher (lower) in the normal mode than in the power saving mode. As mentioned above with reference to Figures 8 and 9, the measurement clock 846 may or may not include jitter, and therefore, the following discussion of the measurement clock in the normal and power saving modes should be considered to include appropriate and not An embodiment with jitter. For example, in some of these embodiments, for example, the clock divider value "Z" in the clock control register 450 (see FIG. 4 or 5) is available for configuration and input. The frequency of the pulse 375 is related to the frequency of the transform clock 849 (see FIG. 8) in the power saving mode (eg, the frequency of the transform clock 849 signal in the power save mode = the frequency of the input clock 375 signal / Z) . In embodiments having a configurable clock divider value, the clock divider value can be set independently for each sensor in the capacitive sensing region 115, or for a sense in the capacitive sensing region 115 Each subset of the detectors is set collectively, and in the other of these embodiments, the clock divider values can be collectively set for all of the sensors in the capacitive sensing region 115. An example of a subset is further given above.

在一實施例中,可存在用於正常以及功率節省模式之不同的可組態時脈除頻器值(亦即,用於正常模式之Z比用於功率節省模式之Z小),而在此等實施例中的另一者中,可不存在正常模式之可組態時脈除頻器(亦即,變換時脈849頻率=輸入時脈375信號的頻率)。 In an embodiment, there may be different configurable clock divider values for normal and power saving modes (ie, Z for normal mode is smaller than Z for power saving mode), and In the other of these embodiments, there may be no configurable clock demultiplexer in the normal mode (i.e., transform clock 849 frequency = frequency of the input clock 375 signal).

如以上所提及地,在一些實施例中,計數器時脈542之頻率等於測定時脈846之頻率或為測定時脈846之頻率的某一其他函數。在一些實施例中,額外地或以另一方式,充電/放電控制560之頻率等於測定時脈846之頻率或為測定時脈846之頻率的某一其他函數。舉例而言,在一些實施例中,計數器時脈542之頻率及/或充電放電控制560之頻率可隨著測定時脈846的增大的頻率而增大。 As mentioned above, in some embodiments, the frequency of the counter clock 542 is equal to the frequency of the measured clock 846 or some other function of the frequency of the measured clock 846. In some embodiments, additionally or alternatively, the frequency of charge/discharge control 560 is equal to the frequency of the measured clock 846 or some other function of the frequency of the measured clock 846. For example, in some embodiments, the frequency of the counter clock 542 and/or the frequency of the charge and discharge control 560 may increase as the frequency of the measured clock 846 increases.

在一實施例中,在功率節省模式中之計數器時脈542之放慢頻率降低了測定資料振幅。舉例而言,在一實施例中,在功率節省模式中之充電放電控制560之放慢頻率降低了電容感測區域115中之充電以及放電的電容感測器的頻率,且因此降低了測定資料產生之頻率。 In one embodiment, the slowing down frequency of the counter clock 542 in the power save mode reduces the measured data amplitude. For example, in one embodiment, the slowing down frequency of the charge and discharge control 560 in the power save mode reduces the frequency of the capacitive and charged capacitive sensors in the capacitive sensing region 115, and thus reduces the measured data. The frequency of generation.

在其他實施例中,可不存在相較於正常模式之功率節省模式的放慢測定時脈846。在此等實施例中之一些實施例中,對於功率節省模式以及正常模式兩者而言可存在相同的時脈除頻器值,或不存在用於功率節省模式以及正常模式的時脈除頻器值。在此等實施例中,在功率節省模式中之功率節省可由於其他操作參數而產生,例如,在功率節省模式中比在正常模式中有較少的經啟用充電以及放電之感測器及/或降低的控制器時脈頻率(如下文所論述)。 In other embodiments, there may be no slowing measurement clock 846 compared to the power save mode of the normal mode. In some of these embodiments, the same clock divider value may exist for both power save mode and normal mode, or there may be no clock saver for power save mode and normal mode Value. In such embodiments, power savings in the power save mode may result from other operational parameters, such as fewer enabled charge and discharge sensors in the power save mode than in the normal mode. Or reduced controller clock frequency (discussed below).

在一些實施例中,在功率節省模式中,除了放慢之測定時脈846外或代替放慢之測定時脈846,用於控制器145操作之時脈可相較於正常模式而放慢。舉例而言,在此等實施例中的一者中,放慢之控制器時脈可降低該測定資料 讀取速率(亦即,增大測定資料之讀取間之預定的時間間隔)。作為另一實例,在此等實施例中的一者中,額外地或以另一方式,放慢之控制器時脈可降低處理該測定資料之速率,其引起藉由傳輸模組1650來進行之位置及/或存在指示之較不頻繁的傳送。在其他實施例中,用於控制器145操作之時脈相較於正常模式可不在功率節省模式中放慢。在此等其他實施例中,在功率節省模式中之功率節省可由於其他的操作參數而產生,例如,在功率節省模式中比在正常模式中有較少的經啟用充電以及放電之感測器及/或在功率節省模式中比在正常模式中有已降低的測定時脈頻率。 In some embodiments, in the power save mode, the clock for operation of the controller 145 may be slower than the normal mode, in addition to or in lieu of the slowed measurement clock 846. For example, in one of these embodiments, the slowed controller clock can reduce the measurement data The read rate (i.e., the predetermined time interval between readings of the assay data is increased). As another example, in one of these embodiments, additionally or in another manner, the slowed controller clock may reduce the rate at which the assay data is processed, which is caused by the transmission module 1650. The location and/or presence of less frequent transmissions. In other embodiments, the clock for operation of controller 145 may not slow down in power save mode compared to normal mode. In such other embodiments, the power savings in the power save mode may result from other operational parameters, such as fewer enabled charge and discharge sensors in the power save mode than in the normal mode. And/or there is a reduced measured clock frequency in the power save mode than in the normal mode.

在一些實施例中,可(例如)經由設定/狀態暫存器454針對功率節省模式來組態感測器之充電以及放電的啟用或停用。在此等實施例中之一些實施例中,針對功率節省模式,可獨立啟用或停用電容感測區域115中之每一感測器的充電以及放電,或可共同啟用或停用電容感測區域115中之感測器之每一子集的充電以及放電,而在此等實施例中之另一者中,可共同啟用或停用電容感測區域115中之所有感測器的充電以及放電。上文給出了子集之實例。在其他實施例中,可建構(例如,硬編碼/硬連線)功率節省模式之感測器之充電以及放電的啟用或停用。 In some embodiments, the charging of the sensor and the enabling or disabling of the discharge can be configured, for example, via the set/status register 454 for the power save mode. In some of these embodiments, for the power save mode, charging and discharging of each of the capacitive sensing regions 115 may be enabled or disabled independently, or capacitive sensing may be enabled or disabled in common. Charging and discharging of each subset of the sensors in region 115, while in the other of these embodiments, the charging of all of the sensors in capacitive sensing region 115 can be enabled or disabled together and Discharge. An example of a subset is given above. In other embodiments, the charging and discharging of the sensors of the power saving mode can be constructed (eg, hard coded/hardwired) enabled or disabled.

在一些實施例中,可(例如)經由設定/狀態暫存器454來組態在正常模式中之感測器之充電以及放電的啟用或停用。舉例而言,在此等實施例中之一些實施例中,上 述組態可允許正常模式以及功率節省模式具有達到相同數目之經啟用充電以及放電的感測器,或在功率節省模式期間比在正常模式期間需要較少之經啟用充電以及放電的感測器。在此等實施例中之一些實施例中,針對正常模式,可獨立啟用或停用電容感測區域115中之每一感測器的充電以及放電,或可共同啟用或停用電容感測區域115中之感測器之每一子集的充電以及放電,而在此等實施例中之另一者中,可共同啟用或停用電容感測區域115中之所有感測器的充電以及放電。上文給出了子集之實例。在其他實施例中,可建構(例如,硬編碼/硬連線)正常模式中之感測器之充電以及放電的啟用或停用。舉例而言,在此等其他實施例中之一者中,所有感測器可在正常模式中經啟用來充電以及放電。 In some embodiments, the charging and discharging of the sensors in the normal mode can be configured, for example, via the set/status register 454. For example, in some of these embodiments, on The configuration may allow the normal mode as well as the power save mode to have the same number of enabled charging and discharging sensors, or less required charging and discharging during the power saving mode than during normal mode. . In some of these embodiments, the charging and discharging of each of the capacitive sensing regions 115 may be independently enabled or disabled for the normal mode, or the capacitive sensing regions may be enabled or disabled together. The charging and discharging of each subset of the sensors in 115, and in the other of these embodiments, the charging and discharging of all of the sensors in the capacitive sensing region 115 can be enabled or disabled in common . An example of a subset is given above. In other embodiments, the charging and discharging of the sensors in the normal mode can be constructed (eg, hard coded/hardwired). For example, in one of these other embodiments, all of the sensors can be enabled to charge and discharge in the normal mode.

在正常模式中以及於功率節省模式中存在相同數目之經啟用充電以及放電之感測器的實施例中,在功率節省模式中之功率節省可由於其他的操作參數而產生,例如,在功率節省模式中比在正常模式中有較低之測定時脈頻率及/或控制器時脈頻率(如上文所論述者)。 In embodiments where there are the same number of sensors that enable charging and discharging in the normal mode and in the power saving mode, the power savings in the power saving mode may result from other operating parameters, for example, in power savings. There is a lower measured clock frequency and/or controller clock frequency in the mode than in the normal mode (as discussed above).

在一實施例中,在正常模式中,電容感測區域115中之所有感測器(經建構或經組態以)經啟用來充電以及放電。在此實施例中,感測器之以下充電以及放電集合中的任一者尤其可經建構或經組態以針對功率節省模式而啟用充電以及放電:僅所有X感測器、僅所有Y感測器、僅偶數X感測器、僅偶數Y感測器、僅奇數X感測器、僅奇 數Y感測器、僅所有X以及Y偶數感測器、僅所有X以及Y奇數感測器、僅偶數X以及奇數Y感測器、僅偶數Y以及奇數X感測器、電容感測模組115中之佈局之特定區域中的感測器、佈局之特定區域中的X感測器、佈局之特定區域中的Y感測器、以上感測器中之任一者的交錯(例如,在一累積週期中之X感測器以及在下一累積週期中之Y感測器,且重複)、以上感測器之任何組合等。此等集合之實例不應解釋為具限制性。 In an embodiment, in the normal mode, all of the sensors in the capacitive sensing region 115 (constructed or configured) are enabled to charge and discharge. In this embodiment, any of the following charging and discharging sets of sensors can be specifically constructed or configured to enable charging and discharging for the power saving mode: only all X sensors, only all sense of Y Detector, only even X sensor, only even Y sensor, only odd X sensor, only odd Number Y sensor, only all X and Y even sensors, only all X and Y odd sensors, only even X and odd Y sensors, only even Y and odd X sensors, capacitive sensing Interleaving of a sensor in a particular area of the layout in group 115, an X sensor in a particular area of the layout, a Y sensor in a particular area of the layout, or any of the above sensors (eg, The X sensor in a cumulative period and the Y sensor in the next accumulation period, and repeated), any combination of the above sensors, and the like. Examples of such collections should not be construed as limiting.

再次參看以上所論述之圖11、12以及13。在一實施例中,圖11以及12說明針對X以及Y感測器啟用充電以及放電之正常模式的實例,而圖13說明具有針對(至少一)X感測器而啟用以及針對Y感測器而停用之充電以及放電之功率節省模式的實例。讀者應顯而易見圖11、12以及13僅為正常模式以及功率節省模式之實例,且視實施例而定,充電以及放電組態可變化。 Referring again to Figures 11, 12 and 13 discussed above. In an embodiment, Figures 11 and 12 illustrate examples of normal modes of enabling charging and discharging for X and Y sensors, while Figure 13 illustrates having enabled for (at least one) X sensors and for Y sensors An example of a power saving mode that disables charging and discharging. The reader should be aware that Figures 11, 12, and 13 are merely examples of normal mode and power saving modes, and depending on the embodiment, the charging and discharging configurations may vary.

現參看圖22,其說明根據本發明之實施例之電容偵測方法2200。在一實施例中,可由控制器145來執行方法2200。 Referring now to Figure 22, a capacitance detection method 2200 in accordance with an embodiment of the present invention is illustrated. In an embodiment, method 2200 can be performed by controller 145.

階段2201、2202以及2204分別對應於階段1701、1702以及1704,因此,請參看圖17的論述。 Stages 2201, 2202, and 2204 correspond to stages 1701, 1702, and 1704, respectively, so please refer to the discussion of FIG.

如以上所提及地,在階段1704(與階段2204對應)前,可組態時脈模組340中之一或多個操作參數。在圖22中所說明之實施例中,在階段2203中組態至少預設模式(視實施例而定,正常模式或功率節省模式)。舉例而言, 在一些實施例中,以下各項中之任一者可經組態:可經由模式暫存器448組態為正常模式或功率節省模式之預設模式,可經由時脈控制暫存器450組態為預設(default)模式的時脈除頻器值,可組態為預設模式之控制器時脈頻率、可經由設定/狀態暫存器454啟用/停用預設模式中之感測器的充電以及放電,及/或可組態適合於預設模式之其他操作參數。繼續所述實例,在一些實施例中,可替代地建構(例如,硬編碼/硬連線)與預設模式相關聯之一或多個操作參數,以在預設模式下實行。在一些實施例中,可在階段2203中來組態與功率節省模式及/或正常模式(無論是否為預設模式)相關聯之操作參數的可組態值,例如,在功率節省模式及/或正常模式中之可組態時脈除頻器值(若存在)、可組態的控制器時脈頻率,及/或經啟用充電以及放電之感測器的可組態的集合。在一些實施例中,可替代地建構(例如,硬編碼/硬連線)與功率節省模式及/或正常模式相關聯之一或多個操作參數,以在相關聯的模式下實行。仍繼續所述實例,在此等實施例中之一些實施例中,例如經由模式暫存器448之模式的任何隨後的改變(見階段2214以及2226)將引起與當前模式相關聯之操作參數值(其經建構或先前在階段2203中經組態)被實行。可(例如)由互動模組1602來執行階段2203。 As mentioned above, one or more operational parameters in the clock module 340 can be configured prior to stage 1704 (corresponding to stage 2204). In the embodiment illustrated in Figure 22, at least a preset mode (depending on the embodiment, normal mode or power save mode) is configured in stage 2203. For example, In some embodiments, any of the following may be configured: a mode that can be configured to be a normal mode or a power save mode via the mode register 448, via the clock control register 450 The clock divider value of the default mode can be configured as the controller clock frequency of the preset mode, and the sensing in the preset mode can be enabled/disabled via the setting/status register 454. Charging and discharging, and/or configurable other operating parameters suitable for the preset mode. Continuing with the example, in some embodiments, one or more operational parameters associated with the preset mode may alternatively be constructed (eg, hard coded/hardwired) to be performed in the preset mode. In some embodiments, the configurable values of the operational parameters associated with the power save mode and/or the normal mode (whether or not the preset mode) may be configured in stage 2203, for example, in power save mode and/or Or configurable clock divider value (if present) in normal mode, configurable controller clock frequency, and/or configurable set of sensors with charging and discharging enabled. In some embodiments, one or more operational parameters associated with the power save mode and/or the normal mode may alternatively be constructed (eg, hard coded/hardwired) to be implemented in an associated mode. Continuing with the example, in some of these embodiments, any subsequent changes, such as via mode of mode buffer 448 (see stages 2214 and 2226), will cause operational parameter values associated with the current mode. (It was constructed or previously configured in stage 2203) was implemented. Stage 2203 can be performed, for example, by the interaction module 1602.

為了實例起見,假定預設模式為正常模式。進一步假定與功率節省模式相對比,在正常模式中,不存在時脈除頻器值(亦即,變換時脈849=輸入時脈375,見圖8), 且因此無需組態時脈暫存器450。亦假定當模式暫存器448中之模式在階段2203中經組態成“正常模式”時,由於模式暫存器448中之組態的“正常模式”,啟用電容感測區域115中之所有n個感測器的充電以及放電,而未必需要階段2203中之設定/狀態暫存器454的分離的組態。此實例不應解釋為限制階段2203。 For the sake of example, assume that the preset mode is the normal mode. Further assuming that in contrast to the power save mode, in the normal mode, there is no clock divider value (i.e., transform clock 849 = input clock 375, see Figure 8), It is therefore not necessary to configure the clock register 450. It is also assumed that when the mode in mode register 448 is configured to "normal mode" in phase 2203, all of the capacitive sensing regions 115 are enabled due to the configured "normal mode" in mode register 448. The charging and discharging of the n sensors does not necessarily require the separate configuration of the set/status register 454 in stage 2203. This example should not be construed as limiting stage 2203.

在一實施例中,以上所論述之階段1512或1412(測定資料之處理)可包含階段2208至2226中的任一者。 In an embodiment, stage 1512 or 1412 (processing of assay data) discussed above may include any of stages 2208 through 2226.

在階段2208中,控制器模組135判定是否偵測到指狀物或其他物件之存在。在一實施例中,階段2208可對應於以上所描述之階段1708。 In stage 2208, controller module 135 determines if the presence of a finger or other item is detected. In an embodiment, stage 2208 may correspond to stage 1708 described above.

若在階段2208中未偵測到存在,則視情況地在階段2209中可如以上相關於方法1700所論述地來重校準各校準值。在另一實施例中,可省略階段2209。在階段2210中,計時器(例如,在該存在偵測模組1610中,見圖16)經啟動或允許繼續運行,以計時未偵測到存在之時間量。在階段2212中,控制器模組145(例如,存在偵測模組1610)判定未偵測到存在之時間是否為較長時間。舉例而言,計時器可產生中斷或計時器可經輪詢。若計時器值在一實施例中在預定的時間量基數以上(或在另一實施例中,大於或等於預定的時間量基數),則認為是較長時間。視實施例而定,預定的時間量基數可變化,且因此本發明並不限制時間量基數之值。在一實施例中,時間量基數為可組態的,且因此可經調整以獲得最佳效能。 If no presence is detected in stage 2208, then each of the calibration values may be recalibrated in stage 2209 as discussed above in relation to method 1700. In another embodiment, stage 2209 can be omitted. In stage 2210, a timer (eg, in the presence detection module 1610, see FIG. 16) is activated or allowed to continue to run to count the amount of time that no time is detected. In stage 2212, controller module 145 (eg, presence detection module 1610) determines if the time of absence is detected to be a longer time. For example, the timer can generate an interrupt or the timer can be polled. If the timer value is above a predetermined amount of time base in one embodiment (or in another embodiment, greater than or equal to a predetermined amount of time base), then it is considered to be a longer time. Depending on the embodiment, the predetermined amount of time base can vary, and thus the present invention does not limit the value of the time amount base. In an embodiment, the amount of time base is configurable and can therefore be adjusted for optimal performance.

若自未偵測到存在以來並非一段較長時間,則方法2200進行至階段2226,其組態正常模式(見以下描述的階段2226)且隨後重複返回至階段2204。若已組態成正常模式(例如,作為預設模式),則方法2200可跳過階段2226,且直接重複返回至階段2204。 If it is not a long time since no presence was detected, then method 2200 proceeds to stage 2226, which configures the normal mode (see stage 2226 described below) and then repeats back to stage 2204. If the normal mode has been configured (eg, as a preset mode), method 2200 can skip phase 2226 and repeat directly to stage 2204.

若為較長時間,則在階段2214中,組態成功率節省模式,若尚未組態(例如,作為預設模式)。舉例而言,在一實施例中,可在模式暫存器448中設定功率節省模式指示。舉例而言,在一些實施例中,額外地或以另一方式,可組態或實行功率節省模式之時脈除頻器值,使得測定時脈846之頻率(其影響例如計數器時脈542的頻率及/或充電/放電控制560之頻率)在功率節省模式中比在正常模式中還低。功率節省模式之時脈除頻器的值(若存在)可視實施例而定來變化且本文中並不限制。舉例而言,在一些實施例中,額外地或以另一方式,可以相較於正常模式之降低之頻率來組態或實行控制器時脈頻率。在功率節省模式中之控制器時脈的頻率可視實施例而定來變化且本文中並不限制。在一些實施例中,額外地或以另一方式,選擇之感測器可經啟用/停用充電以及放電,使得在功率節省模式中比在正常模式中較少感測器經充電以及放電。繼續所述實例,在此等實施例中的一者中,在階段2214中,可在正常模式中啟用之一些感測器在功率節省模式中經停用充電以及放電。在正常模式以及功率節省模式中充電以及放電之感測器的數目之差(若存在)以及在功率節省模式中 充電以及放電之感測器的識別(identity)並不受本發明限制。在一實施例中,基於功率節省與偵測接近電容感測區域115之物件之存在及/或位置之精確度間的取捨來判定:在功率節省模式中充電以及放電之感測器之數目,哪些感測器在功率節省模式期間被充電以及放電,在功率節省模式中之時脈除頻器值,及/或在功率節省模式中的控制器時脈頻率。可(例如)由互動模組1602來執行階段2214。 If it is a long time, in stage 2214, it is configured as a power saving mode if it has not been configured (for example, as a preset mode). For example, in an embodiment, a power save mode indication can be set in mode register 448. For example, in some embodiments, additionally or in another manner, the clock saver value of the power save mode can be configured or implemented such that the frequency of the clock 846 is measured (which affects, for example, the counter clock 542) The frequency and/or frequency of the charge/discharge control 560 is lower in the power save mode than in the normal mode. The value of the clock divider of the power save mode, if any, may vary depending on the embodiment and is not limited herein. For example, in some embodiments, additionally or in another manner, the controller clock frequency can be configured or implemented as compared to the reduced frequency of the normal mode. The frequency of the controller clock in the power saving mode may vary depending on the embodiment and is not limited herein. In some embodiments, additionally or alternatively, the selected sensor may be enabled/disabled for charging and discharging such that fewer sensors are charged and discharged in the power saving mode than in the normal mode. Continuing with the example, in one of these embodiments, in stage 2214, some of the sensors that may be enabled in the normal mode are deactivated for charging and discharging in the power saving mode. The difference in the number of sensors that charge and discharge in normal mode and power save mode, if any, and in power save mode The identity of the sensor for charging and discharging is not limited by the present invention. In one embodiment, the number of sensors that charge and discharge in the power save mode is determined based on a trade-off between the power savings and the accuracy of detecting the presence and/or position of the object proximate to the capacitive sensing region 115, Which sensors are charged and discharged during the power save mode, the clock divider value in the power save mode, and/or the controller clock frequency in the power save mode. Stage 2214 can be performed, for example, by interaction module 1602.

在一實施例中,功率節省模式可包含相較於正常模式之較少之經啟用充電以及放電的感測器。在另一實施例中,功率節省模式可包含比在正常模式中之測定時脈頻率還低的測定時脈頻率。在另一實施例中,功率節省模式可包含較低的控制器時脈頻率。在另一實施例中,功率節省模式可包含相較於正常模式之較低(或相同)數目之經啟用充電以及放電的感測器、相較於正常模式之較低(或相同)的測定時脈頻率,及/或相較於正常模式之較低(或相同)的控制器時脈頻率。在另一實施例中,除了測定時脈頻率、控制器時脈頻率,及/或經啟用充電以及放電之感測器的數目以外或代替測定時脈頻率、控制器時脈頻率,及/或經啟用充電以及放電之感測器的數目,其他的操作參數在功率節省模式與正常模式間可不同。 In an embodiment, the power save mode may include fewer enabled charging and discharging sensors than in the normal mode. In another embodiment, the power save mode may include a measured clock frequency that is lower than the measured clock frequency in the normal mode. In another embodiment, the power save mode may include a lower controller clock frequency. In another embodiment, the power save mode may include a lower (or the same) number of enabled charging and discharging sensors compared to the normal mode, a lower (or the same) determination as compared to the normal mode. Clock frequency, and / or lower (or the same) controller clock frequency compared to normal mode. In another embodiment, in addition to or instead of determining the clock frequency, the controller clock frequency, and/or the number of sensors that are enabled for charging and discharging, the clock frequency, the controller clock frequency, and/or Other operational parameters may differ between the power save mode and the normal mode, depending on the number of sensors that enable charging and discharging.

在一些實施例中,功率節省模式可針對階段2214之不同的執行而不同。舉例而言,在此等實施例中之一些實施例中,可存在多個適當功率模式,其中啟用感測器之不同集合的充電以及放電、其中應用不同控制器時脈頻率,及/ 或其中應用不同的測定時脈頻率,且因此每次執行階段2214時,未必組態成相同的功率模式。繼續所述實例,在此等實施例中之一者中,第一次執行階段2214時,僅所有的X感測器(或少於所有的X感測器)經啟用充電以及放電,但下一次執行階段2214時,僅所有的Y感測器(或少於所有的Y感測器)經啟用充電以及放電,隨後重複所述過程。 In some embodiments, the power save mode may be different for different implementations of stage 2214. For example, in some of these embodiments, there may be multiple suitable power modes in which different sets of charging and discharging of the sensors are enabled, wherein different controller clock frequencies are applied, and / Alternatively, different measured clock frequencies are applied, and thus each time phase 2214 is performed, the same power mode is not necessarily configured. Continuing with the example, in one of the embodiments, when the stage 2214 is first executed, only all of the X sensors (or less than all of the X sensors) are enabled for charging and discharging, but under At one stage 2214, only all of the Y sensors (or less than all of the Y sensors) are enabled to charge and discharge, and then the process is repeated.

可在階段2214中於功率節省模式中啟用充電以及放電之感測器之集合的實例尤其包括以下各項中的任一者:僅所有X感測器、僅所有Y感測器、僅偶數X感測器、僅偶數Y感測器、僅奇數X感測器、僅奇數Y感測器、僅所有X以及Y偶數感測器、僅所有X以及Y奇數感測器、僅偶數X以及奇數Y感測器、僅偶數Y以及奇數X感測器、以上感測器中之任一者之交錯(例如,在一累積週期中之X感測器以及在下一累積週期中的Y感測器,且重複)、以上感測器之任何組合等。此等集合之實例不應解釋為具限制性。 Examples of sets of sensors that may enable charging and discharging in power saving mode in stage 2214 include, in particular, any of the following: only all X sensors, only all Y sensors, only even X Sensor, only even Y sensor, only odd X sensor, odd only Y sensor, only all X and Y even sensors, only all X and Y odd sensors, only even X and odd Interleaving of the Y sensor, only the even Y and the odd X sensor, any of the above sensors (eg, the X sensor in one accumulation period and the Y sensor in the next accumulation period) And repeat), any combination of the above sensors, and the like. Examples of such collections should not be construed as limiting.

若模式已組態為功率節省模式,則可跳過階段2214。 Stage 2214 can be skipped if the mode has been configured for power save mode.

方法2200接著重複至階段2204,其執行在此情形中將根據功率節省模式的充電以及放電。舉例而言,在一實施例中,假定功率節省模式包括僅所有X感測器(或少於所有X感測器)或僅所有Y感測器(或少於所有Y感測器)。繼續所述實例,假定僅X感測器(或僅Y感測器)經充電以及放電(且忽略測定時脈頻率及/或控制器時脈頻 率的任何改變),在一些情形中,相較於所有X以及Y感測器經充電以及放電之模式,可存在50%的功率消耗減少。作為另一實例,假定僅X感測器(或Y感測器)之子集經充電以及放電,在一些情形中,相較於所有X以及Y感測器經充電以及放電之模式,可存在大於50%的功率消耗減少。繼續所述實例,若僅一半之X感測器(或Y感測器)經充電以及放電(且忽略測定時脈頻率及/或控制器時脈頻率的任何改變),在一些情形中,功率消耗可減少至當所有X以及Y感測器經充電以及放電時之位準的25%。功率節省之此等位準(levels)不應解釋為具限制性。 Method 2200 then repeats to stage 2204, which performs charging and discharging according to the power saving mode in this case. For example, in an embodiment, it is assumed that the power save mode includes only all X sensors (or less than all X sensors) or only all Y sensors (or less than all Y sensors). Continuing with the example, assume that only the X sensor (or only the Y sensor) is charged and discharged (and ignores the measured clock frequency and/or the controller clock frequency) Any change in rate), in some cases, may have a 50% reduction in power consumption compared to the mode in which all X and Y sensors are charged and discharged. As another example, assume that only a subset of the X sensors (or Y sensors) are charged and discharged, in some cases, may be greater than the modes of charging and discharging of all X and Y sensors. 50% reduction in power consumption. Continuing with the example, if only half of the X sensors (or Y sensors) are charged and discharged (and ignoring any changes in the measured clock frequency and/or controller clock frequency), in some cases, power Consumption can be reduced to 25% of the level at which all X and Y sensors are charged and discharged. These levels of power savings should not be construed as limiting.

參看圖23,其說明根據本發明之實施例之感測器的佈局。如圖23中所展示地,存在每列六個X感測器2310之六列以及每行六個Y感測器2320之七行。因此,存在比Y感測器少之X感測器。(在另一實施例中,可假定圖23僅展示了佈局之小部分。在此實施例中,亦假定圖樣(pattern)將繼續,使得在總佈局中,將存在比Y感測器少之X感測器。) Referring to Figure 23, a layout of a sensor in accordance with an embodiment of the present invention is illustrated. As shown in FIG. 23, there are six columns of six X sensors 2310 per column and seven rows of six Y sensors 2320 per row. Therefore, there are fewer X sensors than Y sensors. (In another embodiment, it can be assumed that Figure 23 shows only a small portion of the layout. In this embodiment, it is also assumed that the pattern will continue so that there will be fewer than the Y sensor in the overall layout. X sensor.)

在一實施例中,選擇具有最少數量之感測器的軸(在此為X軸),且對所述軸(在此為X軸)上之偶數(或奇數)感測器執行功率節省模式來充電以及放電。為了實例起見,在此實施例中,假定在功率節省模式中充電以及放電偶數X感測器,而停用奇數X感測器以及所有Y感測器2320之充電以及放電。因此,參看圖23中之X感測器的第六列,在此實施例中,充電以及放電偶數X感測器 2330,而在功率節省模式中停用奇數X感測器2340之充電以及放電。 In an embodiment, the axis having the least number of sensors (here the X axis) is selected, and the power saving mode is performed on the even (or odd) sensors on the axis (here the X axis) To charge and discharge. For the sake of example, in this embodiment, it is assumed that the charge and discharge even X sensors are charged in the power save mode, while the charging and discharging of the odd X sensors and all Y sensors 2320 are disabled. Therefore, referring to the sixth column of the X sensor in FIG. 23, in this embodiment, the charge and discharge even X sensors are used. 2330, while charging and discharging of the odd-numbered X sensor 2340 is disabled in the power saving mode.

在偵測到存在之階段2208之任何執行(亦即,對階段2208之肯定)後,在階段2220中追蹤自最後偵測到存在以來之時間量所用的計時器(若先前已啟動計時器)被停止。接著,在階段2224中,例如,如以上相關於階段1710至1724中之任一者所描述地執行位置偵測。額外地或以另一方式,可如以上所描述地輸出一種偵測及/或不存在之指示。 After detecting any execution of stage 2208 of existence (i.e., affirmation of stage 2208), the timer used in the amount of time since the last detected presence was tracked in stage 2220 (if the timer was previously started) aborted. Next, in stage 2224, position detection is performed, for example, as described above in relation to any of stages 1710 through 1724. Additionally or alternatively, an indication of detection and/or absence may be output as described above.

在階段2226中若需要則組態正常模式(其假定尚未組態)(例如,作為預設模式)。在一實施例中,可在模式暫存器448中設定一種正常模式指示。舉例而言,在一些實施例中,額外地或以另一方式,可組態或實行正常模式之時脈除頻器值,使得測定時脈846的頻率在正常模式中比在功率節省模式中還高。在另一實施例中,在正常模式中,變換之時脈頻率849等於輸入時脈375之頻率。正常模式之時脈除頻器的值(若存在)可視實施例而定來變化且本文中並不限制。在一些實施例中,額外地或以另一方式,可組態或實行正常模式之控制器時脈頻率。正常模式之控制器時脈的頻率可視限制而定來變化且本文中並不限制。在一些實施例中,額外地或以另一方式,可啟用充電以及放電,使得在正常模式中比在功率節省模式中有較多的感測器經充電以及放電。在此等實施例中的一者中,在正常模式中充電以及放電所有感測器。在正常模式以及功率節 省模式中充電以及放電之感測器的數目之差(若存在)以及在正常模式中充電以及放電之感測器的識別在本文中並不限制。可(例如)由互動模組1602來執行階段2226。若已組態成正常模式,則可省略階段2226。 The normal mode (which is assumed to have not been configured) is configured in phase 2226 if needed (eg, as a preset mode). In an embodiment, a normal mode indication can be set in mode register 448. For example, in some embodiments, additionally or in another manner, the clock mode divider value of the normal mode can be configured or implemented such that the frequency of the measured clock 846 is in the normal mode compared to the power save mode. Still high. In another embodiment, in the normal mode, the transformed clock frequency 849 is equal to the frequency of the input clock 375. The value of the clock mode divider of the normal mode, if any, may vary depending on the embodiment and is not limited herein. In some embodiments, the controller clock frequency of the normal mode may be configured or implemented additionally or in another manner. The frequency of the controller clock of the normal mode may vary depending on the limitation and is not limited herein. In some embodiments, charging or discharging may be enabled additionally or in another manner such that more sensors are charged and discharged in the normal mode than in the power saving mode. In one of these embodiments, all of the sensors are charged and discharged in the normal mode. In normal mode as well as power section The difference in the number of sensors for charging and discharging in the provincial mode (if present) and the identification of the sensor for charging and discharging in the normal mode are not limited herein. Stage 2226 can be performed, for example, by interaction module 1602. Stage 2226 can be omitted if it has been configured in normal mode.

方法2200接著重複返回至階段2204,其中在此情形中根據正常模式來執行階段2204。 Method 2200 then repeats back to stage 2204, where stage 2204 is performed in accordance with the normal mode.

應注意在一實施例中,例如若需要在功率節省模式與正常模式間改變,則可由存在偵測模組1610將階段2212及/或階段2208之結果提供至互動模組1602。 It should be noted that in an embodiment, the results of stage 2212 and/or stage 2208 may be provided to interaction module 1602 by presence detection module 1610, for example, if a change between power save mode and normal mode is desired.

圖24說明根據本發明之實施例之電容偵測方法2400。在其他實施例中,可以與圖24中所示之次序不同的次序來執行方法2400中所說明之階段,且/或可同時執行一個以上之階段。在一實施例中,可由控制器145來執行方法2400。 FIG. 24 illustrates a capacitance detection method 2400 in accordance with an embodiment of the present invention. In other embodiments, the stages illustrated in method 2400 may be performed in an order different than that shown in FIG. 24, and/or more than one stage may be performed simultaneously. In an embodiment, method 2400 can be performed by controller 145.

階段2401、2402以及2404分別對應於階段1701、1702以及1704,因此,請參看圖17的論述。 Stages 2401, 2402, and 2404 correspond to stages 1701, 1702, and 1704, respectively, so please refer to the discussion of FIG.

如以上所提及地,在階段1704(與階段2404對應)前,可組態時脈模組340中之一或多個操作參數。在圖24中所說明之實施例中,在階段2403中組態成至少預設模式(視實施例而定,正常模式或功率節省模式)。舉例而言,在一些實施例中,以下各項中之任一者可經組態:可經由模式暫存器448組態為正常模式或功率節省模式之預設模式,可經由時脈控制暫存器450組態成預設模式的時脈除頻器值,可組態成控制器時脈頻率,可經由設定/狀態暫存 器454來啟用/停用預設模式中之感測器的充電以及放電,及/或可組態成適合於預設模式之其他操作參數。繼續所述實例,在一些實施例中,可替代地建構(例如,硬編碼/硬連線)與預設模式相關聯之一或多個操作參數,以在預設模式下實行。 As mentioned above, one or more operational parameters in the clock module 340 can be configured prior to stage 1704 (corresponding to stage 2404). In the embodiment illustrated in Figure 24, at least a preset mode (depending on the embodiment, normal mode or power saving mode) is configured in stage 2403. For example, in some embodiments, any of the following may be configured: a mode that can be configured to be in a normal mode or a power save mode via mode register 448, via a clock control The buffer 450 is configured as a preset mode clock divider value, which can be configured as a controller clock frequency, and can be temporarily stored via setting/status The 454 is enabled/disabled to charge and discharge the sensors in the preset mode, and/or can be configured to other operating parameters suitable for the preset mode. Continuing with the example, in some embodiments, one or more operational parameters associated with the preset mode may alternatively be constructed (eg, hard coded/hardwired) to be performed in the preset mode.

為了實例起見,假定預設模式為正常模式。進一步假定與功率節省模式相對比,在正常模式中,不存在時脈除頻器值(亦即,變換時脈849=輸入時脈375,見圖8),且因此無需組態時脈暫存器450。亦假定當模式暫存器448中之模式在階段2403中經組態成“正常模式”時,由於模式暫存器448中之組態的“正常模式”,啟用電容感測區域115中之所有n個感測器的充電以及放電,而未必需要階段2403中之設定/狀態暫存器454的分離的組態。此實例不應解釋為限制階段2403。 For the sake of example, assume that the preset mode is the normal mode. Further assuming that in contrast to the power save mode, in the normal mode, there is no clock divider value (i.e., transform clock 849 = input clock 375, see Figure 8), and thus there is no need to configure clock temporary storage. 450. It is also assumed that when the mode in mode register 448 is configured to "normal mode" in phase 2403, all of the capacitive sensing regions 115 are enabled due to the configured "normal mode" in mode register 448. The charging and discharging of the n sensors does not necessarily require the separate configuration of the set/status register 454 in stage 2403. This example should not be construed as limiting stage 2403.

在一實施例中,以上所論述之階段1512或1412(測定資料之處理)可包含階段2408至2426中的任一者。 In an embodiment, stage 1512 or 1412 (processing of assay data) discussed above may include any of stages 2408 through 2426.

在階段2408中,控制器模組135判定是否偵測到指狀物或其他物件之存在。舉例而言,在一實施例中,階段2408可對應於以上所描述之階段1708。 In stage 2408, controller module 135 determines if the presence of a finger or other item is detected. For example, in an embodiment, stage 2408 can correspond to stage 1708 described above.

若未偵測到存在,則視情況地在階段2409中可如以上相關於方法1700所論述地重校準各校準值。在另一實施例中,可省略階段2409。方法2400接著重複返回至階段2404。 If no presence is detected, then each of the calibration values may be recalibrated in stage 2409 as discussed above in relation to method 1700. In another embodiment, stage 2409 can be omitted. Method 2400 then repeats back to stage 2404.

若在階段2408中偵測到存在(亦即,對2408之肯定),則在階段2420中,例如,如以上相關於階段1710至1724 中之任一者所描述地執行位置偵測。額外地或以另一方式,可如以上所描述地輸出一種偵測及/或不存在之指示。 If presence is detected in stage 2408 (i.e., affirmation of 2408), then in stage 2420, for example, as described above in relation to stages 1710 through 1724 Position detection is performed as described in either of them. Additionally or alternatively, an indication of detection and/or absence may be output as described above.

在階段2422中,判定該偵測位置是否“接近”於階段2422之較早的重複中的先前偵測位置。舉例而言,可由位置偵測模組1620或偏移校準模組1630來執行階段2422。舉例而言,可比較此重複與先前重複之未過濾及/或過濾的位置,以瞭解位置是否接近。繼續所述實例,可將先前(過濾或未過濾的)位置與當前(過濾或未過濾的)位置間之長度向量與預定的長度上限比較。在此實例中,若向量之長度在一實施例中小於該長度上限(或在另一實施例中小於或等於)該長度上限,則該偵測位置接近於先前偵測位置。視實施例而定,預定的長度上限可變化,且因此本發明並不限制該長度上限之值。在一實施例中,該長度上限為可組態的,且因此可經調整以獲得最佳效能。 In stage 2422, it is determined if the detected position is "close" to the previously detected position in the earlier iteration of stage 2422. For example, stage 2422 can be performed by position detection module 1620 or offset calibration module 1630. For example, the location of this repetition and previously repeated unfiltered and/or filtered can be compared to see if the location is close. Continuing with the example, the length vector between the previous (filtered or unfiltered) location and the current (filtered or unfiltered) location can be compared to a predetermined upper length limit. In this example, if the length of the vector is less than the upper limit of the length (or less than or equal to the upper limit of the length) in one embodiment, the detected position is close to the previously detected position. Depending on the embodiment, the predetermined upper limit of the length may vary, and thus the present invention does not limit the value of the upper limit of the length. In an embodiment, the upper length limit is configurable and can therefore be adjusted for optimal performance.

在另一實施例中,在階段2422中,判定該偵測的指狀物或其他物件是否正“緩慢”移動。在此實施例中,可判定被位置改變期間所流逝之時間所除(divided)之後的位置的改變,例如,自先前重複之過濾及/或未過濾的位置的改變。視實施例而定,被認為“緩慢”之速率可變化,且因此本發明並不限制“緩慢”之界定。 In another embodiment, in stage 2422, it is determined whether the detected finger or other item is moving "slowly". In this embodiment, a change in position after the time elapsed during the change of position may be determined, for example, a change from a previously repeated filtering and/or unfiltered position. Depending on the embodiment, the rate considered "slow" may vary, and thus the invention does not limit the definition of "slow".

若該偵測位置接近先前偵測位置(或移動速率緩慢),則執行階段2424。在階段2424中,組態成功率節省模式(若尚未組態)(例如,作為預設模式)。舉例而言,在一實施例中,可在模式暫存器448中設定一種功率節省模式指 示。舉例而言,在一些實施例中,額外地或以另一方式,可組態或實行功率節省模式之時脈除頻器值,使得測定時脈846之頻率(其影響例如計數器時脈542的頻率及/或充電/放電控制560之頻率)在功率節省模式中比在正常模式中還低。功率節省模式之時脈除頻器的值(若存在)可視實施例而定來變化且本文中並不限制。舉例而言,在一些實施例中,額外地或以另一方式,可以相較於正常模式中之頻率已降低的頻率來組態或實行控制器時脈頻率。控制器時脈之頻率可視實施例而定來變化且本文中並不限制。舉例而言,在一些實施例中,額外地或以另一方式,所選擇之感測器可經啟用/停用之充電以及放電,使得在功率節省模式中比在正常模式中較少感測器被充電以及放電。繼續所述實例,在此等實施例中的一者中,在階段2424中,在正常模式中啟用之一些感測器在功率節省模式中停用充電以及放電。仍繼續所述實例,在此等實施例中的一者中,僅圍繞例如對應於最大點(見圖17之階段1712)之感測器之特定區域中的感測器啟用充電以及放電。所述區域之維度並不受本發明限制,且可在一些情形中為可組態的且因此為可調整的,以獲得最佳效能。在正常模式以及功率節省模式中充電以及放電之感測器的數目之差(若存在)以及在功率節省模式中充電以及放電之感測器的識別亦不受本發明限制。在一實施例中,基於功率節省與偵測接近電容感測區域115之物件之存在及/或位置之精確度間的取捨來判定:在功率節省模式中充電以及放電之感測器之數 目,哪些感測器在功率節省模式期間充電以及放電,在功率節省模式中之控制器時脈頻率,及/或在功率節省模式中的時脈除頻器值。可(例如)由互動模組1602來執行階段2424。 If the detected position is close to the previously detected position (or the rate of movement is slow), then stage 2424 is performed. In stage 2424, the power save mode is configured (if not already configured) (eg, as a preset mode). For example, in an embodiment, a power save mode finger can be set in the mode register 448. Show. For example, in some embodiments, additionally or in another manner, the clock saver value of the power save mode can be configured or implemented such that the frequency of the clock 846 is measured (which affects, for example, the counter clock 542) The frequency and/or frequency of the charge/discharge control 560 is lower in the power save mode than in the normal mode. The value of the clock divider of the power save mode, if any, may vary depending on the embodiment and is not limited herein. For example, in some embodiments, additionally or in another manner, the controller clock frequency can be configured or implemented as compared to a frequency in which the frequency in the normal mode has decreased. The frequency of the controller clock may vary depending on the embodiment and is not limited herein. For example, in some embodiments, additionally or in another manner, the selected sensor may be enabled/disabled for charging and discharging such that less sensing is possible in the power saving mode than in the normal mode The device is charged and discharged. Continuing with the example, in one of these embodiments, in stage 2424, some of the sensors enabled in the normal mode disable charging and discharging in the power saving mode. Continuing with the example, in one of these embodiments, charging and discharging are only enabled around sensors in a particular region of the sensor, for example corresponding to the maximum point (see stage 1712 of Figure 17). The dimensions of the regions are not limited by the invention and may in some cases be configurable and therefore adjustable to achieve optimum performance. The difference in the number of sensors that charge and discharge in the normal mode as well as in the power save mode, if any, and the identification of the sensors that charge and discharge in the power save mode are also not limited by the present invention. In one embodiment, the number of sensors that charge and discharge in the power save mode is determined based on a trade-off between the power savings and the accuracy of detecting the presence and/or position of the object proximate to the capacitive sensing region 115. Which sensors are charged and discharged during the power save mode, the controller clock frequency in the power save mode, and/or the clock divider value in the power save mode. Stage 2424 can be performed, for example, by interaction module 1602.

在一實施例中,功率節省模式可包含相較於正常模式之較少之經啟用充電以及放電的感測器。在另一實施例中,功率節省模式可包含比在正常模式中之測定時脈頻率還低的測定時脈頻率。在另一實施例中,功率節省模式可包含較低的控制器時脈頻率。在另一實施例中,功率節省模式可包含相較於正常模式之較低(或相同)數目之經啟用充電以及放電的感測器、相較於正常模式之較低(或相同)的測定時脈,及/或相較於正常模式之較低(或相同)的控制器時脈頻率。在另一實施例中,除了測定時脈頻率、控制器時脈頻率,及/或經啟用充電以及放電之感測器的數目以外或代替測定時脈頻率、控制器時脈頻率,及/或經啟用充電以及放電之感測器的數目,其他的操作參數在功率節省模式與正常模式間可不同。 In an embodiment, the power save mode may include fewer enabled charging and discharging sensors than in the normal mode. In another embodiment, the power save mode may include a measured clock frequency that is lower than the measured clock frequency in the normal mode. In another embodiment, the power save mode may include a lower controller clock frequency. In another embodiment, the power save mode may include a lower (or the same) number of enabled charging and discharging sensors compared to the normal mode, a lower (or the same) determination as compared to the normal mode. Clock, and/or lower (or the same) controller clock frequency compared to normal mode. In another embodiment, in addition to or instead of determining the clock frequency, the controller clock frequency, and/or the number of sensors that are enabled for charging and discharging, the clock frequency, the controller clock frequency, and/or Other operational parameters may differ between the power save mode and the normal mode, depending on the number of sensors that enable charging and discharging.

在一些實施例中,功率節省模式可針對階段2424之不同的執行而不同。舉例而言,在此等實施例中之一些實施例中,可存在多個適當的功率模式,其中啟用各感測器之不同集合的充電以及放電、其中應用不同的控制器時脈頻率,及/或其中應用不同的測定時脈頻率,且因此每次在執行階段2424時,未必組態相同的功率模式。 In some embodiments, the power save mode may be different for different implementations of stage 2424. For example, in some of these embodiments, there may be multiple suitable power modes in which different sets of charging and discharging of the various sensors are enabled, wherein different controller clock frequencies are applied, and / or where different measured clock frequencies are applied, and therefore each time during the execution of stage 2424, the same power mode is not necessarily configured.

假定階段2424之功率節省模式包括降低之測定時脈 頻率的實施例。在一實施例中,在階段2424中,可藉由模式暫存器448中設定功率節省模式指示來將模式組態為功率節省模式。舉例而言,在一實施例中,在階段2424期間,例如藉由組態功率節省模式之時脈除頻器,以便由時脈除頻器值除以輸入時脈來組態該測定時脈頻率(週期)。作為另一實例,在一實施例中,可(例如)事先已在階段2403中定義功率節省模式之時脈除頻器,且一旦在階段2424中組態功率節省模式,則使用功率節省模式的時脈除頻器,使輸入時脈除以時脈除頻器值且可能地與抖動形成總和。 Assume that the power save mode of stage 2424 includes a reduced measurement clock An example of frequency. In an embodiment, in stage 2424, the mode can be configured as a power save mode by setting a power save mode indication in mode register 448. For example, in one embodiment, during phase 2424, the clock pulse divider is configured, for example, by configuring a power save mode to configure the measurement clock by dividing the clock divider value by the input clock. Frequency (cycle). As another example, in an embodiment, the power save mode mode clock divider can be defined, for example, in stage 2403, and once the power save mode is configured in stage 2424, the power save mode is used. The clock divider divides the input clock by the clock divider value and possibly the sum of the jitter.

若模式已為功率節省模式,則可省略階段2424。 Stage 2424 can be omitted if the mode is already in power save mode.

方法2400接著重複至階段2404,其在此情形中將執行對應於功率節省模式的充電以及放電。舉例而言,在一實施例中,假定功率節省模式之時脈除頻器值為Z,且不存在正常模式之時脈除頻器值(亦即,變換時脈849=輸入時脈375)。忽略在正常模式中經啟用充電以及放電且在功率節省模式中未經啟用充電以及放電之感測器的任何差異及/或控制器時脈頻率之任何差異,在一些情形中,功率節省模式中之功率消耗可等於正常模式中之功率消耗的1/Z。功率節省之此位準不應解釋為具限制性。 Method 2400 then repeats to stage 2404, which in this case will perform charging and discharging corresponding to the power saving mode. For example, in one embodiment, it is assumed that the clock saver value of the power save mode is Z, and there is no clock pulse divider value for the normal mode (ie, transform clock 849 = input clock 375) . Ignoring any differences in the sensor that are enabled for charging and discharging in normal mode and that are not enabled for charging and discharging in power saving mode and/or any difference in controller clock frequency, in some cases, in power saving mode The power consumption can be equal to 1/Z of the power consumption in the normal mode. This level of power savings should not be construed as limiting.

若該偵測位置並不接近,則在階段2426中,組態成正常模式(若尚未組態)(例如,作為預設模式)。舉例而言,在一實施例中,可在模式暫存器448中設定正常模式指示。舉例而言,在一些實施例中,額外地或以另一方式, 可組態或實行正常模式之時脈除頻器值,使得測定時脈846的頻率在正常模式中比在功率節省模式中還高(儘管正常模式之時脈除頻器之值本文中並不限制)。在另一實施例中,在正常模式中,變換之時脈頻率849等於輸入時脈375之頻率。正常模式之時脈除頻器的值(若存在)可視實施例而定來變化且本文中並不限制。舉例而言,在一些實施例中,額外地或以另一方式,可組態或實行正常模式之控制器時脈頻率。正常模式之控制器時脈的頻率可視限制而定來變化且本文中並不限制。舉例而言,在一些實施例中,額外地或以另一方式,可啟用充電以及放電,使得在正常模式中比在功率節省模式中有較多的感測器經充電以及放電。在此等實施例中的一者中,在正常模式中充電以及放電所有感測器。在正常模式以及功率節省模式中充電以及放電之感測器的數目之差(若存在)以及在正常模式中充電以及放電之感測器的識別在本文中並不限制。可(例如)由互動模組1602來執行階段2426。若已組態成正常模式,則可省略階段2426。 If the detected position is not close, then in stage 2426, it is configured to the normal mode (if not already configured) (eg, as a preset mode). For example, in an embodiment, a normal mode indication can be set in mode register 448. For example, in some embodiments, additionally or in another manner, The clock divider value of the normal mode can be configured or implemented so that the frequency of the measured clock 846 is higher in the normal mode than in the power save mode (although the value of the clock mode divider in the normal mode is not limit). In another embodiment, in the normal mode, the transformed clock frequency 849 is equal to the frequency of the input clock 375. The value of the clock mode divider of the normal mode, if any, may vary depending on the embodiment and is not limited herein. For example, in some embodiments, additionally or in another manner, the controller clock frequency of the normal mode can be configured or implemented. The frequency of the controller clock of the normal mode may vary depending on the limitation and is not limited herein. For example, in some embodiments, charging or discharging may be enabled additionally or in another manner such that more sensors are charged and discharged in the normal mode than in the power saving mode. In one of these embodiments, all of the sensors are charged and discharged in the normal mode. The difference in the number of sensors that charge and discharge in the normal mode as well as in the power save mode, if any, and the identification of the sensors that charge and discharge in the normal mode are not limited herein. Stage 2426 can be performed, for example, by the interaction module 1602. Stage 2426 can be omitted if it has been configured in normal mode.

方法2400接著重複返回至階段2404,其中在此情形中根據正常模式來執行階段2404。 Method 2400 then repeats back to stage 2404, where stage 2404 is performed in accordance with the normal mode.

應注意在一實施例中,例如若需要在功率節省模式與正常模式間改變,則可由位置偵測模組1620或偏移計算模組1630將階段2422之結果提供至互動模組1602。 It should be noted that in an embodiment, the result of stage 2422 may be provided to interaction module 1602 by position detection module 1620 or offset calculation module 1630, for example, if a change between power save mode and normal mode is desired.

在一些實施例中,可存在兩種類型之功率節省模式的可能性,一者在如在圖22之實施例中之未偵測到存在之時 間已較長時來觸發,且一者在如在圖24之實施例中之偵測位置接近先前偵測位置(或移動速率緩慢)時來觸發。類似地,可存在兩種類型之正常模式的可能性,一者在如圖22之實施例中之未偵測到存在之時間並不長時來觸發,且一者在如圖24之實施例中之偵測位置並不接近先前偵測位置(或移動速率並不緩慢)時來觸發。舉例而言,在此等實施例中的一者中,參看圖22,可如下修改方法2200,以包括如參看圖22所描述之功率節省模式以及如參看圖24所描述之功率節省模式。在修改之2200中,在階段2224後,代替繼續至階段2226,可執行階段2422。若對階段2422的回答為是(亦即,位置接近先前偵測位置或移動速率緩慢),則執行階段2424(亦即,如在圖24之實施例中所描述地,若需要則組態成功率節省模式)。若對階段2422之回答為否(亦即,位置並不接近先前偵測位置或移動速率並不緩慢),則執行階段2426(亦即,如在圖24的實施例中所描述地,若需要則組態成正常模式)。修改之方法2200在重複返回至階段2204前繼續至階段2226(亦即,如在圖22的實施例中所描述地,若需要則組態成正常模式)。 In some embodiments, there may be two types of power saving modes, one of which is not detected as in the embodiment of FIG. The trigger has been triggered for a long time, and one is triggered when the detected position in the embodiment of FIG. 24 is close to the previously detected position (or the moving rate is slow). Similarly, there may be two types of normal mode possibilities, one of which is triggered when the time when no presence is detected in the embodiment of FIG. 22 is not long, and one is in the embodiment of FIG. Triggered when the detected position is not close to the previously detected position (or the moving rate is not slow). For example, in one of these embodiments, referring to FIG. 22, method 2200 can be modified as follows to include a power save mode as described with reference to FIG. 22 and a power save mode as described with reference to FIG. In the modified 2200, after stage 2224, instead of continuing to stage 2226, stage 2422 can be performed. If the answer to stage 2422 is yes (i.e., the position is close to the previously detected position or the rate of movement is slow), then stage 2424 is performed (i.e., as described in the embodiment of Figure 24, the configuration is successful if desired Rate saving mode). If the answer to stage 2422 is no (ie, the location is not close to the previously detected location or the rate of movement is not slow), then stage 2426 is performed (ie, as described in the embodiment of FIG. 24, if needed Then configured as normal mode). The modified method 2200 continues to stage 2226 before repeating the return to stage 2204 (i.e., as described in the embodiment of Fig. 22, configured to the normal mode if desired).

為了實例起見,在一實施例中,假定正常模式與功率節省模式間之差異(其視例如在圖22之實施例中之自偵測到存在的時間是否為較長時間而定來產生)以經啟用充電以及放電之感測器的數目(亦即,在功率節省模式中經啟用充電以及放電之感測器的減少的數目)來表示。在此實 例中進一步假定在此實施例中正常模式與功率節省模式間之差異(其視例如在圖24之實施例中之偵測位置是否接近於先前偵測位置或移動速率是否緩慢而定來產生)以該測定時脈頻率及/或控制器時脈頻率(亦即,功率節省模式中已降低的頻率)來表示。因此,在此實施例中,可尤其存在著時脈頻率(測定時脈及/或控制器時脈)以及經啟用充電以及放電之感測器之值的以下的組合:降低之時脈頻率/減少之經啟用充電以及放電的感測器的數目、降低之時脈頻率/正常之經啟用充電以及放電的感測器數目、正常時脈頻率/減少之經啟用充電以及放電的感測器的數目,以及正常時脈頻率/正常之經啟用充電以及放電的感測器的數目。在一些情形中,可基於經啟用充電以及放電之感測器之數目/選擇及/或時脈頻率來進一步細分此等組合中的每一者(亦即,可存在對應於不同的正常及/或功率節省模式之多個可能的測定時脈頻率、控制器時脈頻率及/或經啟用充電以及放電之感測器的集合)。 For the sake of example, in an embodiment, the difference between the normal mode and the power saving mode is assumed (which is determined, for example, depending on whether the time of detection is present for a longer period of time in the embodiment of FIG. 22) Represented by the number of sensors that are enabled for charging and discharging (ie, the reduced number of sensors that are enabled for charging and discharging in the power saving mode). In this The difference between the normal mode and the power saving mode in this embodiment is further assumed in the example (which is determined depending on whether the detected position in the embodiment of FIG. 24 is close to the previously detected position or the moving rate is slow). This is expressed by the measured clock frequency and/or the controller clock frequency (i.e., the frequency that has been reduced in the power saving mode). Thus, in this embodiment, there may be, inter alia, a combination of the clock frequency (measuring the clock and/or the controller clock) and the value of the sensor that enables charging and discharging: reduced clock frequency / Reduced number of sensors that enable charging and discharging, reduced clock frequency / normal number of sensors that enable charging and discharging, normal clock frequency / reduced enabled charging and discharge sensors The number, as well as the number of normal clock frequencies/normal sensors that enable charging and discharging. In some cases, each of these combinations may be further subdivided based on the number/selection and/or clock frequency of the sensors that are enabled for charging and discharging (ie, there may be corresponding to different normals and/or Or multiple possible measured clock frequencies of the power save mode, controller clock frequency, and/or a set of sensors that enable charging and discharging.

亦將理解的是,根據本發明之系統可為適當程式化的電腦。同樣,本發明涵蓋可由電腦讀取以用於執行本發明之方法的電腦程式。本發明進一步涵蓋確實能實施可由機器執行以用於執行本發明之方法之指令程式的機器可讀記憶體。 It will also be appreciated that the system in accordance with the present invention can be a suitably programmed computer. Also, the present invention contemplates a computer program that can be read by a computer for performing the methods of the present invention. The present invention further encompasses machine readable memory that can implement a program of instructions executable by a machine for performing the methods of the present invention.

儘管關於特定實施例來展示以及描述了本發明,但其並不由此受到限制。讀者現將想到在本發明之範疇內的眾多修改、改變以及改良。 While the invention has been shown and described with respect to specific embodiments, it is not limited thereby. The reader now contemplates numerous modifications, changes, and improvements within the scope of the present invention.

100‧‧‧電容偵測系統 100‧‧‧Capacitance Detection System

105‧‧‧電容測定模組 105‧‧‧Capacitance Measurement Module

115‧‧‧電容感測區域模組 115‧‧‧Capacitive Sensing Area Module

125‧‧‧感測器介面模組 125‧‧‧Sensor Interface Module

135‧‧‧邏輯模組 135‧‧‧Logic Module

145‧‧‧控制器模組 145‧‧‧Controller Module

155‧‧‧控制器介面 155‧‧‧Controller interface

228‧‧‧基板 228‧‧‧Substrate

230‧‧‧導電板 230‧‧‧ Conductive plate

232‧‧‧感測器 232‧‧‧Sensor

234‧‧‧感測器 234‧‧‧ sensor

236‧‧‧感測器 236‧‧‧ sensor

238‧‧‧感測器 238‧‧‧ sensor

310‧‧‧比較器模組 310‧‧‧ Comparator Module

320‧‧‧充電/放電模組 320‧‧‧Charging/discharging module

330‧‧‧計數器模組 330‧‧‧Counter module

337‧‧‧時間間隔 337‧‧ ‧ time interval

340‧‧‧時脈模組 340‧‧‧clock module

360‧‧‧充電/放電控制指示 360‧‧‧Charging/discharging control instructions

375‧‧‧輸入時脈 375‧‧‧ input clock

380‧‧‧計數器啟用指令 380‧‧‧Counter enable command

410‧‧‧比較器 410‧‧‧ comparator

410N‧‧‧比較器 410N‧‧‧ comparator

420‧‧‧充電/放電電路 420‧‧‧Charging/discharging circuit

420N‧‧‧充電/放電電路 420N‧‧‧Charging/discharging circuit

430‧‧‧計數器 430‧‧‧ counter

430N‧‧‧計數器 430N‧‧‧ counter

442‧‧‧計數器時脈 442‧‧‧ Counter clock

444‧‧‧時脈產生器 444‧‧‧ clock generator

448‧‧‧模式暫存器 448‧‧‧ mode register

450‧‧‧控制暫存器 450‧‧‧Control register

452‧‧‧抖動產生器暫存器 452‧‧‧Jitter generator register

454‧‧‧狀態設定暫存器 454‧‧‧Status setting register

470‧‧‧計數器啟用組態信號 470‧‧‧Counter enable configuration signal

502‧‧‧電容感測器 502‧‧‧Capacitive sensor

511‧‧‧輸出 511‧‧‧ output

512‧‧‧啟用模組 512‧‧‧Enable Module

513‧‧‧輸出 513‧‧‧ output

514‧‧‧第一比較器 514‧‧‧First comparator

516‧‧‧第二比較器 516‧‧‧Second comparator

517‧‧‧低壓位準 517‧‧‧Low-pressure level

518‧‧‧感測器電壓 518‧‧‧Sensor voltage

519‧‧‧高壓位準 519‧‧‧High pressure level

522‧‧‧充電/放電電路 522‧‧‧Charging/discharging circuit

530‧‧‧計數器 530‧‧‧ counter

537‧‧‧時間間隔量測結果 537‧‧‧Time interval measurement results

542‧‧‧計數器時脈 542‧‧‧ Counter clock

560‧‧‧充電/放電控制信號 560‧‧‧Charging/discharging control signal

570‧‧‧計數器啟用組態信號 570‧‧‧Counter enable configuration signal

580‧‧‧計數器啟用信號 580‧‧‧Counter enable signal

602‧‧‧時序圖 602‧‧‧ Timing diagram

604‧‧‧時序圖 604‧‧‧ Timing diagram

605‧‧‧時序圖 605‧‧‧ Timing diagram

606‧‧‧時序圖 606‧‧‧ Timing diagram

608‧‧‧時序圖 608‧‧‧ Timing diagram

610‧‧‧時序圖 610‧‧‧Timeline

612‧‧‧時序圖 612‧‧‧ Timing diagram

614‧‧‧時間點 614‧‧ ‧ time point

616‧‧‧時間點 616‧‧‧ time point

618‧‧‧時間點 618‧‧‧ time point

620‧‧‧時間點 620‧‧‧ time point

626‧‧‧時間點 626‧‧‧ time point

704‧‧‧時序圖 704‧‧‧ Timing diagram

705‧‧‧時序圖 705‧‧‧ Timing diagram

722‧‧‧時間點 722‧‧‧ time

724‧‧‧時間點 724‧‧‧ time

841‧‧‧時脈變換模組 841‧‧‧ Clock Transformer Module

843‧‧‧混合器模組 843‧‧‧Mixer module

845‧‧‧抖動產生器模組 845‧‧‧Jitter Generator Module

846‧‧‧測定時脈 846‧‧‧ Determination of the clock

847‧‧‧抖動 847‧‧‧Jitter

849‧‧‧變換時脈 849‧‧‧Change clock

900‧‧‧方法 900‧‧‧ method

902‧‧‧階段 902‧‧‧

904‧‧‧階段 Stage 904‧‧

906‧‧‧階段 906‧‧‧

908‧‧‧階段 908‧‧‧ stage

1028‧‧‧時序圖 1028‧‧‧ Timing diagram

1032‧‧‧時間點 1032‧‧‧ time point

1034‧‧‧時間點 1034‧‧‧Time

1102‧‧‧時序圖 1102‧‧‧ Timing diagram

1104‧‧‧時序圖 1104‧‧‧ Timing diagram

1202‧‧‧時序圖 1202‧‧‧ Timing diagram

1208‧‧‧時序圖 1208‧‧‧ Timing diagram

1210‧‧‧時序圖 1210‧‧‧ Timing diagram

1302‧‧‧時序圖 1302‧‧‧ Timing diagram

1308‧‧‧時序圖 1308‧‧‧ Timing diagram

1310‧‧‧時序圖 1310‧‧‧ Timing diagram

1400‧‧‧手動模式方法 1400‧‧‧Manual mode method

1402‧‧‧階段 1402‧‧‧ stage

1404‧‧‧階段 1404‧‧‧ stage

1406‧‧‧階段 1406‧‧‧ stage

1408‧‧‧階段 1408‧‧‧ stage

1410‧‧‧階段 1410‧‧‧ stage

1412‧‧‧階段 1412‧‧‧

1414‧‧‧階段 1414‧‧‧ stage

1500‧‧‧自動模式方法 1500‧‧‧Automatic mode method

1502‧‧‧階段 1502‧‧‧ stage

1504‧‧‧階段 1504‧‧‧ stage

1506‧‧‧階段 1506‧‧‧ stage

1508‧‧‧階段 Phase 1508‧‧

1510‧‧‧階段 1510‧‧‧ stage

1512‧‧‧階段 1512‧‧‧

1602‧‧‧互動模組 1602‧‧‧Interactive Module

1604‧‧‧校準模組 1604‧‧‧ Calibration Module

1610‧‧‧存在偵測模組 1610‧‧‧ presence detection module

1620‧‧‧位置偵測模組 1620‧‧‧ Position Detection Module

1630‧‧‧偏移計算模組 1630‧‧‧Offset calculation module

1640‧‧‧記憶體 1640‧‧‧ memory

1650‧‧‧傳輸模組 1650‧‧‧Transmission module

1700‧‧‧方法 1700‧‧‧ method

1701‧‧‧階段 Stage 1701‧‧

1702‧‧‧階段 1702‧‧‧

1704‧‧‧階段 Phase 1704‧‧

1706‧‧‧階段 1706‧‧‧

1708‧‧‧階段 Stage 1708‧‧

1710‧‧‧階段 1710‧‧‧ stage

1712‧‧‧階段 Phase 1712‧‧

1716‧‧‧階段 1716‧‧‧ stage

1718‧‧‧階段 1718‧‧‧ stage

1722‧‧‧階段 1722‧‧‧ stage

1724‧‧‧階段 1724‧‧‧ stage

1902‧‧‧觸摸高位準 1902‧‧‧Touch high level

1904‧‧‧觸摸低位準 1904‧‧‧Touch low level

1906‧‧‧(平衡的)測定資料 1906‧‧‧(balanced) measurement data

1908‧‧‧點 1908‧‧ points

1910‧‧‧點 1910‧‧ points

2002‧‧‧觸摸高位準 2002‧‧‧Touch high level

2004‧‧‧觸摸低位準 2004‧‧‧Touch low level

2006‧‧‧(平衡的)測定資料 2006‧‧‧(balanced) measurement data

2008‧‧‧點 2008‧‧‧ points

2012‧‧‧雜訊容限位準 2012‧‧‧Communication tolerance level

2014‧‧‧最大點位準 2014‧‧‧Maximum point

2016‧‧‧點 2016‧‧‧ points

2018‧‧‧點 2018‧‧ points

2020‧‧‧點 2020‧‧‧ points

2022‧‧‧點 2022‧‧ points

2102‧‧‧(平衡的)測定資料 2102‧‧‧(balanced) measurement data

2104‧‧‧(平衡的)測定資料 2104‧‧‧(balanced) measurement data

2106‧‧‧曲線 2106‧‧‧ Curve

4101‧‧‧比較器 4101‧‧‧ Comparator

4201‧‧‧充電/放電電路 4201‧‧‧Charging/discharging circuit

4301‧‧‧計數器 4301‧‧‧Counter

2B01‧‧‧電容感測器 2B01‧‧‧Capacitive Sensor

2B02‧‧‧電容感測器 2B02‧‧‧Capacitive Sensor

2B03‧‧‧電容感測器 2B03‧‧‧Capacitive Sensor

2B04‧‧‧電容感測器 2B04‧‧‧Capacitive sensor

2B05‧‧‧電容感測器 2B05‧‧‧Capacitive Sensor

2B06‧‧‧電容感測器 2B06‧‧‧Capacitive Sensor

2B07‧‧‧電容感測器 2B07‧‧‧Capacitive Sensor

2B08‧‧‧電容感測器 2B08‧‧‧Capacitive Sensor

2B09‧‧‧電容感測器 2B09‧‧‧Capacitive Sensor

2B10‧‧‧電容感測器 2B10‧‧‧Capacitive Sensor

2C01‧‧‧感測器 2C01‧‧‧ sensor

2C02‧‧‧感測器 2C02‧‧‧Sensor

2C03‧‧‧感測器 2C03‧‧‧Sensor

2C04‧‧‧感測器 2C04‧‧‧Sensor

X1‧‧‧行 X1‧‧‧

X2‧‧‧行 X2‧‧‧

X3‧‧‧行 X3‧‧‧

X4‧‧‧行 X4‧‧‧

X5‧‧‧行 X5‧‧‧

X6‧‧‧行 X6‧‧‧

X7‧‧‧行 X7‧‧‧

X8‧‧‧行 X8‧‧‧

X9‧‧‧行 X9‧‧‧

X10‧‧‧行 X10‧‧‧

X11‧‧‧行 X11‧‧‧

X12‧‧‧行 X12‧‧‧

Y1‧‧‧列 Y1‧‧‧ column

Y2‧‧‧列 Y2‧‧‧ column

Y3‧‧‧列 Y3‧‧‧ column

Y4‧‧‧列 Y4‧‧‧ column

Y5‧‧‧列 Y5‧‧‧ column

Y6‧‧‧列 Y6‧‧‧ column

Y7‧‧‧列 Y7‧‧‧ column

Y8‧‧‧列 Y8‧‧‧ column

Y9‧‧‧列 Y9‧‧‧ column

Y10‧‧‧列 Y10‧‧‧ column

Y11‧‧‧列 Y11‧‧‧ column

Y12‧‧‧列 Y12‧‧‧ column

為了理解本發明以及明白如何可在實踐中執行本發明,現將參看附圖來僅作為非限制性實例而描述較佳實施例。 The preferred embodiments are described by way of example only, and not by way of limitation

圖1為根據本發明之實施例之電容偵測系統的方塊圖。 1 is a block diagram of a capacitance detecting system in accordance with an embodiment of the present invention.

圖2A為根據本發明之實施例之電容感測區域模組中的電容感測器之佈局的說明。 2A is an illustration of the layout of a capacitive sensor in a capacitive sensing area module in accordance with an embodiment of the present invention.

圖2B為根據本發明之實施例之電容感測區域模組中的電容感測器之佈局的說明。 2B is an illustration of the layout of a capacitive sensor in a capacitive sensing area module in accordance with an embodiment of the present invention.

圖2C為根據本發明之實施例之四個電容感測器的說明。 2C is an illustration of four capacitive sensors in accordance with an embodiment of the present invention.

圖3為根據本發明之實施例之電容偵測系統的方塊圖。 3 is a block diagram of a capacitance detecting system in accordance with an embodiment of the present invention.

圖4為根據本發明之實施例之電容偵測系統的詳細方塊圖。 4 is a detailed block diagram of a capacitance detecting system in accordance with an embodiment of the present invention.

圖5為根據本發明之實施例之關於一電容感測器之詳細電容偵測系統的方塊圖。 5 is a block diagram of a detailed capacitance sensing system for a capacitive sensor in accordance with an embodiment of the present invention.

圖6說明根據本發明之各種實施例之當相關聯感測器充電時與計數器之操作相關的時序圖。 6 illustrates a timing diagram associated with operation of a counter when an associated sensor is being charged, in accordance with various embodiments of the present invention.

圖7說明根據本發明之各種實施例之當相關聯感測器放電時與計數器之操作相關的時序圖。 Figure 7 illustrates a timing diagram associated with operation of a counter when an associated sensor is discharged, in accordance with various embodiments of the present invention.

圖8為根據本發明之實施例之時脈產生器的方塊圖。 Figure 8 is a block diagram of a clock generator in accordance with an embodiment of the present invention.

圖9為根據本發明之實施例之用於組構抖動之方法的流程圖。 9 is a flow chart of a method for fabricating jitter in accordance with an embodiment of the present invention.

圖10說明根據本發明之實施例之累積循環的時序圖。 Figure 10 illustrates a timing diagram of a cumulative cycle in accordance with an embodiment of the present invention.

圖11說明根據本發明之實施例之關於與X感測器以及Y感測器相關聯之計數器的時序圖。 11 illustrates a timing diagram for a counter associated with an X sensor and a Y sensor, in accordance with an embodiment of the present invention.

圖12說明根據本發明之實施例之關於與X感測器以及Y感測器相關聯之計數器的時序圖。 Figure 12 illustrates a timing diagram for a counter associated with an X sensor and a Y sensor, in accordance with an embodiment of the present invention.

圖13說明根據本發明之實施例之關於與X感測器以及Y感測器相關聯之計數器的時序圖。 Figure 13 illustrates a timing diagram for a counter associated with an X sensor and a Y sensor, in accordance with an embodiment of the present invention.

圖14為根據本發明之實施例之手動模式方法的流程圖。 14 is a flow chart of a manual mode method in accordance with an embodiment of the present invention.

圖15為根據本發明之實施例之自動模式方法的流程圖。 15 is a flow chart of an automatic mode method in accordance with an embodiment of the present invention.

圖16為根據本發明之實施例之控制器模組的方塊圖。 Figure 16 is a block diagram of a controller module in accordance with an embodiment of the present invention.

圖17為根據本發明之實施例之電容偵測方法的流程圖。 17 is a flow chart of a method of detecting capacitance according to an embodiment of the present invention.

圖18為根據本發明之實施例之邏輯座標柵格的說明。 Figure 18 is an illustration of a logical coordinate grid in accordance with an embodiment of the present invention.

圖19為說明根據本發明之實施例之存在偵測演算法的圖表。 19 is a diagram illustrating a presence detection algorithm in accordance with an embodiment of the present invention.

圖20為說明根據本發明之實施例之位置偵測演算法的圖表。 20 is a diagram illustrating a position detection algorithm in accordance with an embodiment of the present invention.

圖21為根據本發明之實施例之(平衡的)測定資料的圖表。 Figure 21 is a graph of (balanced) assay data in accordance with an embodiment of the present invention.

圖22為根據本發明之實施例之功率有效電容偵測方 法的流程圖。 22 is a power effective capacitance detecting method according to an embodiment of the present invention. Flow chart of the law.

圖23為根據本發明之實施例之感測器之佈局的說明。 23 is an illustration of the layout of a sensor in accordance with an embodiment of the present invention.

圖24為根據本發明之實施例之功率有效電容偵測方法的流程圖。 24 is a flow chart of a method for detecting a power effective capacitance in accordance with an embodiment of the present invention.

100‧‧‧電容偵測系統 100‧‧‧Capacitance Detection System

105‧‧‧電容測定模組 105‧‧‧Capacitance Measurement Module

115‧‧‧電容感測區域模組 115‧‧‧Capacitive Sensing Area Module

125‧‧‧感測器介面模組 125‧‧‧Sensor Interface Module

135‧‧‧邏輯模組 135‧‧‧Logic Module

145‧‧‧控制器模組 145‧‧‧Controller Module

155‧‧‧控制器介面 155‧‧‧Controller interface

Claims (8)

一種電容偵測方法,其包含:使充電以及放電已啟用之電容感測區域中的第一多個電容感測器充電以及放電至少一次;產生與所述第一多個經充電以及放電的感測器之電容相關的資料;以及在分析所述產生之資料後,使充電以及放電保持啟用之所述電容感測區域中的第二多個電容感測器充電以及放電至少再一次,所述第一多個電容感測器以及所述第二多個電容感測器包括不同數目之感測器。 A capacitance detecting method includes: charging and discharging a first plurality of capacitive sensors in a capacitive sensing region in which charging and discharging are enabled at least once; generating a sense of charging and discharging the first plurality of charges Capacitance-related data of the detector; and after analyzing the generated data, charging and discharging the second plurality of capacitive sensors in the capacitive sensing region that enable charging and discharging to be enabled at least once again The first plurality of capacitive sensors and the second plurality of capacitive sensors include different numbers of sensors. 如申請專利範圍第1項所述之方法,其中在與至少一次之所述充電以及放電不同之頻率下執行至少再一次的所述充電以及放電。 The method of claim 1, wherein the charging and discharging are performed at least once again at a frequency different from the charging and discharging at least once. 如申請專利範圍第2項所述之方法,其更包含:產生與所述第二多個感測器之電容相關的資料,其中以與在至少一次之所述充電以及放電期間產生包括於第一多個感測器以及第二多個感測器中之感測器之資料的頻率不同的頻率,在至少再一次之所述充電以及放電期間產生所述感測器的資料。 The method of claim 2, further comprising: generating data relating to capacitance of the second plurality of sensors, wherein the generating is included in the charging and discharging at least once The frequency of the data of the sensor of the plurality of sensors and the sensors of the second plurality of sensors is different, and the data of the sensor is generated during at least one of the charging and discharging. 如申請專利範圍第1項所述之方法,其更包含:產生與所述第二多個感測器之電容相關的資料,其中自至少一次之所述充電以及放電到至少再一次之所述充電以及放電之針對包括於第一多個感測器以及第二多個感測器中之感測器所產生之資料值的改變至少部分地與感測器電容中 之任何變化無關。 The method of claim 1, further comprising: generating data relating to capacitance of the second plurality of sensors, wherein the charging and discharging from at least one time to at least one of The change in data values generated by the sensors included in the first plurality of sensors and the second plurality of sensors during charging and discharging is at least partially related to the sensor capacitance Any change is irrelevant. 一種電容偵測方法,其包含:使電容感測區域中的至少一電容感測器充電以及放電至少一次;產生與所述經充電以及放電之至少一感測器之電容相關的資料;以及隨後,由於分析所述產生之資料,以自所述先前產生之改變至少部分地與感測器電容之任何變化無關的值,或以與所述先前產生期間之頻率不同的頻率,產生所述電容感測區域中之每一至少一電容感測器的資料。 A capacitance detecting method includes: charging and discharging at least one capacitive sensor in a capacitive sensing region at least once; generating data related to capacitance of at least one of the charged and discharged electrodes; and subsequently Forming the capacitance due to analysis of the generated data, at a value that is at least partially independent of any change in sensor capacitance from the previously generated change, or at a different frequency than the frequency of the previous generation period Sensing data of each of at least one capacitive sensor in the region. 一種電容偵測模組,其包含:至少一組態暫存器,其用於組態功率節省模式或正常模式;充電/放電模組,其經組態以使充電以及放電經啟用之電容感測區域中的至少一電容感測器充電以及放電;以及計數器模組,其經組態以針對充電以及放電經啟用之每一電容感測器來量測一種與對應的電容感測器之電容相關的時間間隔量測結果;其中功率節省模式與正常模式不同之處是自包含以下各項之群組中所選擇的至少一變數:經啟用充電以及放電之電容感測器的數目、提供至所述計數器模組之計數器時脈之頻率,以及充電以及放電的頻率。 A capacitance detecting module comprising: at least one configuration register for configuring a power saving mode or a normal mode; and a charging/discharging module configured to enable charging and discharging to be activated Charging and discharging at least one capacitive sensor in the measurement region; and a counter module configured to measure a capacitance of the corresponding capacitive sensor for each capacitive sensor enabled for charging and discharging Corresponding time interval measurement result; wherein the power saving mode is different from the normal mode by at least one variable selected from the group consisting of: the number of capacitive sensors enabled for charging and discharging, provided to The counter clock frequency of the counter module, and the frequency of charging and discharging. 如申請專利範圍第6項所述之模組,其中所述至少 一組態暫存器包括一種指示以指出所述電容感測模組中哪些電容感測器已啟用或停用充電以及放電。 The module of claim 6, wherein the at least A configuration register includes an indication to indicate which of the capacitive sensing modules have enabled or disabled charging and discharging. 如申請專利範圍第6項所述之模組,其中所述至少一組態暫存器包括時脈除頻器,所述時脈除頻器用以對正常模式中之時脈的頻率進行除頻,以導出功率節省模式中之所述時脈之頻率,其中所述計數器時脈等於所述時脈或為所述時脈的另一函數。 The module of claim 6, wherein the at least one configuration register comprises a clock divider, and the clock divider is configured to divide a frequency of a clock in a normal mode. And to derive a frequency of the clock in the power save mode, wherein the counter clock is equal to the clock or another function of the clock.
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