TW201233141A - Scanning projectors and image capture modules for 3D mapping - Google Patents

Abstract

Apparatus (20) for mapping includes an illumination module (30), which includes a radiation source (32), which is configured to emit a beam of radiation. A scanner (34) receives and scans the beam over a selected angular range. Illumination optics (35) project the scanned beam so as to create a pattern of spots extending over a region of interest. An imaging module (38) captures an image of the pattern that is projected onto an object (28) in the region of interest. A processor (46) processes the image in order to construct a three-dimensional (3D) map of the object.

Description

201233141 VI. Description of the Invention: [Technical Field] The present invention relates generally to a method and apparatus for projecting and capturing optical radiation, and in particular to projection and image capture for the purpose of 3D mapping . [Prior Art] Various methods for optical 3D mapping (i.e., by processing an optical image of an object to produce a 3D contour of the surface of the object) are known in the art. Such a 3D profile is also referred to as a 3D image, depth map or depth image, and 3D mapping is also referred to as depth mapping. Some 3D mapping methods are based on projecting a laser streak pattern onto the object and then analyzing an image of the pattern on the object. For example, the PCT International Publication No. WO 2007/043036, the disclosure of which is hereby incorporated by reference in its entirety, is incorporated herein by reference in its entirety, the disclosure of the disclosure of the disclosure of the entire disclosure of the disclosure of System and method for object reconstruction. An imaging unit detects the light response of the illuminated area and produces image data. The pattern in the image of the object is used to reconstruct a 3D image of the object in real time with respect to the displacement of one of the reference images of the pattern. Further methods for the use of zebra patterns for 3D mapping are described, for example, in PCT International Publication No. WO 2007/105205, the disclosure of which is incorporated herein by reference. Other optical 3D mapping methods project different kinds of patterns onto the object to be mapped. For example, the disclosure of PCT International Publication No. WO 2008/120217, the disclosure of which is incorporated herein by reference in its entirety in its entire entire entire entire entire entire entire entire entire entire entire entire disclosure Assembly. A light source is irradiated with light to expose the transparent sheet to project the pattern onto an object. An image capture assembly captures an image of the pattern on the object and the image is processed to reconstruct a 3D image of the object. SUMMARY OF THE INVENTION Embodiments of the invention described below provide methods and apparatus for efficient projection of patterns, particularly for 3D mapping, and for imaging such projected patterns. Accordingly, in accordance with an embodiment of the present invention, there is provided an apparatus for mapping comprising an illumination module, the illumination module comprising: a radiation source configured to emit a beam of light; and a scanner It is configured to receive and scan the beam over a selected angular range. The illumination optics are configured to project the scanned beam to form a pattern of spots that extend within a region of interest. An imaging module is configured to capture an image of the pattern projected onto an object in the region of interest. A processor is configured to process the image to construct a three-dimensional (3D) image of the object. The pattern of spots such as shai can be uncorrelated within a depth range mapped by the device. In some embodiments, the source of radiation is controlled to modulate the intensity of one of the beams as the scanner scans the beam, thereby forming the pattern of the spot of light on the region of interest. The illumination module can be configured to modify the pattern in response to the image captured by the imaging module. The illumination module can be configured to control at least one of the radiation source and the scanner to modify a corner of the array of pixels in a selected portion of the region of interest 158131.doc -5 - 201233141 degree. Alternatively or additionally, the illumination module can be configured to control at least one of the radiation source and the scanner to modify a brightness of one of the light spots in a selected region of the region of interest. In an alternate embodiment, the scanner is configured to scan the beam over a first angular range, and the optical devices include a beam splitter configured to form greater than the first A plurality of angularly spaced replicas of the scanned beam that are coextensive within one of the angular extents. The sweeper and the beam splitter can be configured to collage the region of interest β with the pattern formed by the plurality of angularly spaced replicas of the scanned beam. In another embodiment The optical device includes a patterned element configured to form a delta pattern within a first angular range upon illumination by the beam, and the scanner is configured to direct the beam continuously The patterned elements are struck at a plurality of different angles to form a plurality of angularly spaced replicas of the pattern that are coextensive within a second angle range that is greater than one of the first angular ranges. The scanner and the patterning element can be configured to collage the region of interest with the plurality of angularly spaced replicas of the pattern. In still another embodiment 'the scanner is configured to have a beam of light within a first angular range' and the specialized optical device includes a scan extension element configured to disperse the scanned beam In order to cover a second angular range greater than the first angular range in a spatial pattern. The scan extension element can be selected from a face reflector and a diffractive optical element - component group 0. In one disclosed embodiment, the illumination module includes at least one beam sensation 158131.doc • 6 - 201233141 The at least one beam sensor periodically (4) scans the scanned beam at a selected angle within the angular range scanned by the scanner and thereby verifies that the scanner is operating. Typically, the illumination module is configured to inhibit emission of the beam from the source when the sensor fails to periodically receive the scanned beam. In some embodiments, the radiation source includes: a first radiation source that emits an infrared light beam that is modulated to form the pattern of the light spots; and a second radiation source that emits a The visible light beam is modulated to project a visible image onto the region of interest. The scanners and optics are configured to simultaneously project both the infrared beam and the visible beam onto the region of interest. Typically the second (four) source is controlled to project the visible image onto the object in response to the 3D image. In the disclosed embodiment, the processor is configured to obtain a respective difference between the light spots in the plurality of regions of the captured image and the corresponding reference spot positions of the reference image belonging to the pattern. An offset is derived to derive the 3D image, wherein the respective offsets indicate respective distances between the regions and the image capture assembly. In some embodiments, the imaging module includes a position sensitive detector configured to sense and output each of the light in the pattern projected onto the object by the illumination module One of the spots is offset at the point. The imaging module can be configured to scan the position sensitive field of view with the scanner in the illumination module or with the beam from the radiation source. Alternatively, or in addition, the illumination module and the imaging module are configured such that the offsets occur in a first direction, and the imaging module includes a configuration 158131.doc 201233141 extending along the first direction An array of one or more columns of detector elements and astigmatic optics configured to image the pattern onto the array and having an optical power that is greater in the first direction than in a second vertical direction . In some embodiments, the imaging module includes a sensor and imaging optics, the sensors and imaging optics defining scanning in the region of interest in synchronization with the scanned beam of the illumination module One of the sensing areas. The sensor can include an image sensor having a rolling shutter, wherein the scrolling gate is synchronized with the scanned beam. Alternatively or in the alternative, the scanner in the illumination module can be controllable to dynamically change the selected angular range 'and the county module can include an imaging scanner, and the image scanner is in a state of $ The money zone is dynamically scanned to match the selected angular extent of the scanned #beam. According to an embodiment of the present invention, there is also provided a method for mapping a line comprising an illumination module, the illumination module comprising a source configured to transmit with a modulation according to a specified time Change one of the intensity - the radiation beam. The scanner is configured to receive and scan the beam within the region of interest to project the radiation onto the region by a spatial intensity pattern determined by the temporal modulation of the beam. An imaging module is configured to capture an image of the spatial intensity pattern projected onto the object in the region of interest. - The processor passes (4) to process the image to construct a three-dimensional (3D) image of the object. In one disclosed embodiment, the time modulation is binary, and wherein the spatial intensity pattern comprises one of the arrays of light dots 0 158131.doc 201233141 generated by the time modulation. . In an embodiment 10, the imaging module includes a sensor and imaging optics, wherein the sensors and imaging optics are defined in the region of interest in synchronization with the scanned cat beam of the illumination module. Scan one of the sensing areas. In accordance with an embodiment of the present invention, a method for mapping is further provided that the method includes scanning a beam of light within a selected angular range to form a map of light spots extending within the region of interest. Manipulate # and process the image of the pattern projected onto an object in the area of interest to construct a three-dimensional (3D) image of the object. In accordance with an embodiment of the present invention, a method for mapping is provided that includes a radiation beam having an intensity that varies according to a specified time modulation. The beam is scanned within the region of interest to project the radiation onto the region by a spatial intensity pattern determined by the temporal modulation of the beam. An image of one of the s-space intensity patterns projected onto the object of interest is manipulated and processed to construct a three-dimensional (3D) image of the object. The present invention will be more fully understood from the following detailed description of various embodiments of the invention, wherein the embodiments of the invention set forth below particularly provide for effective projection patterns, in particular for 3D mapping and methods and apparatus for efficiently imaging such projected patterns. In some implementations of the invention, the illumination module projects a pattern of light spots onto the area of interest and an imaging module manipulates an image of the pattern on the object in the area. The image is processed to find the position of the light spot of the image of the 15813 丨.doc 201233141 image, and on this basis, a 3D image of the object in the region of interest is constructed. The depth coordinates in the image are typically calculated by triangulation based on the offset of the spots in the image relative to the corresponding reference spot locations in one of the reference images. In the disclosed embodiment, the pattern is dynamically projected, i.e., instead of simultaneously projecting the pattern over the entire area, the pattern is formed by scanning a beam of light emitted by the source of radiation. The beam is scanned within the selected angle range. (The disclosed embodiments relate to controlling and/or extending this range.) The intensity of the beam is typically modulated during the scan to form the desired pattern. The scan is "_" in the sense that it can modify the pattern of the pattern (such as its density, brightness, and/or angular extent) during the mapping of a given scene. Although the embodiments described below are specific to the dot pattern, the principles of the present invention are equally applicable to the formation of other types of patterns for the purpose of 31) mapping. This dynamic scanning method is advantageous in several important respects. By way of example, dynamic scanning in this manner imparts flexibility in patterning, in particular in modifying the pattern based on the image of the area of interest. For example, the angular density of the spots in the pattern and/or the brightness of the spots may vary from region to region depending on the scene conditions and characteristics of the object of interest in the scene. Similarly, the imaging phantom can be dynamically operated in conjunction with the scanning of the illuminating beam such that the active field of view of the imaging module tracks the area of the pattern that is actually illuminated at any one of the scans. It is not necessarily the same as the image thus formed in the area of interest as in the conventional image sensor, but can be used as part of the process of forming the image of 158131.doc •10.201233141 3D, based on a detection during scanning The local signal captured by the device electronically combines the images. Concentrating the illumination and detection sources in a small moving area in this manner enhances the signal/background ratio of the detected pattern and thus improves the accuracy of the 3D mapping. The field of view of the imaging module can be optically (possibly using (at least partially) the same as the scanner as an illumination module) or electronically (using one of the image sensors with a rolling shutter) to track the illumination beam scanning. Some of the embodiments described below relate to extending the angular extent of the scan provided by the illumination module. These embodiments address the need for some 31) mapping systems to have a wide field of view that is much larger than the scanning range of the H-scan. In one such embodiment, the optics of the projection module includes a beam splitter' which simultaneously forms a plurality of angularly spaced replicas of the scanned beam. These replicas are coextensive in a range that is greater than the scan range. In another embodiment, the scanner directs the beam from the light source to continuously strike a patterned element at a plurality of different angles, and thus form a plurality of angularly spaced replicas of the pattern. In either case, the components of the illumination module can be configured to use the pattern to tile the region of interest 1 in this manner, with the adjacent replica of the pattern to cover the region without copying between the regions Significant overlap or gap. (In this context, 'gap or overlap is considered "significant" if it is approximately the spacing between the spots or greater than this magnitude.) Alternatively or additionally, the illumination module may contain, for example, A convex reflector or a diffractive optical element (DOE) - (E) - a known extension element that extends the angular extent covered by the scanned beam. 158131.doc -11. 201233141 The following is a description of other applications of components of a 3D mapping system using a scanned radiation source and variations of components of a 3D mapping system using a scanned radiation source. System Description FIG. 1 is a schematic top plan view of a system 2 for 3D mapping in accordance with an embodiment of the present invention. System 20 is constructed around a mapping device 22 that is configured to capture images and produce a 3D image of a scene. This includes an object 28 such as one of the hands of the device. The depth information in the view produced by device 22 can be used, for example, by a host computer (not shown) to enable the user to interact with the game and the tablet application running on the computer and the components displayed on the display screen. One of the interactions of the user interface - part. (This functionality is set forth, for example, in U.S. Patent Application Publication No. 2009/0183, which is incorporated herein by reference.) The mapping function of the device can also be used for other (4), and is applicable to virtually any suitable type of scene and 3D object. In the picture! In the example shown, the photo-radiation pattern is projected onto the object 28 in the mapping device 22, as will be explained in detail below. The optical radiation used for this purpose is usually in the infrared (IR) _, but is the same as visible or ultraviolet light. (In the embodiment shown in FIG. 7 - the imaging module projects both infrared and visible radiation" an imaging module 3: decodes the image of the pattern on the object to produce each image in the image The number-shift value. The shift value represents the - component (usually the spot) of the pattern in each of the captured images and the pattern - 158131.doc •12· 201233141 Corresponding to the offset between the reference positions of one of the pattern elements. These offsets do not correspond to the respective distances between the points in the actual scene of the pixel and the image manipulation assembly. The original pixel value may be output 38, and the shift value may be calculated by another component of device 22 or by the host computer. One of the processors 46 in device 22 processes the shift values (calculated by module 38 as necessary) After the shift value of the original pixel value) to generate a depth map of the region of interest that is imaged and imaged by device 22. The depth map contains a 3D coordinate array containing the surface of the object - a predefined field of view Depth (z) coordinate value at each point (X, Y) (In the context of an image-related data array, such (χ, Υ) points are also referred to as pixels.) In this embodiment, the process II is based on the lateral shift of the pattern at each pixel by a triangular amount. The 30 coordinates of the point on the surface of the object 28 are measured. The principle of the 4 diopter nose is described, for example, in the above-mentioned pCT publication application WO 2007/043036, WO 2007/105205, and 2〇〇8/12〇 217. In an alternate embodiment, with the necessary modifications, the elements of device 22 may be used in other types of depth mapping systems, such as systems or stereo systems based on measurements of time of flight of light pulses to and from the scene of interest, and Other types of applications using the projected beam. In Figure 1, the X-axis is considered to be along the horizontal direction of the front of the device 22, the Y-axis is vertical (the page is exceeded in this view), and the Z-axis is along the object. The general direction of imaging of the assembly extends away from the device 22. The optical axes of the modules 3A and 38 are parallel to the Z axis 'where the respective pupils on the X axis are separated by a known distance. 158131.doc -13- 201233141 In this configuration, by module 38撷The lateral shift of the pattern in the image will be limited to (in the range of the error) in the X direction, as explained in the above-mentioned PCT published application. As described above, the illumination module 30 uses a pattern of light spots (such as The light spot - an unrelated pattern to illuminate the object of interest. In the context of this patent application and in the scope of the patent application, the word "unrelated pattern" means that its position is not in the plane transverse to the axis of the projection beam. a projected pattern of one of the associated spots (which may be bright or dark). The autocorrelation of the patterns in the position as a function of lateral displacement is greater than the spot size and no greater than may occur from mapping by the system Any shift in the maximum shift within the depth range is not significant in the sense of being irrelevant. Random, pseudo-random and quasi-periodic patterns are usually not related to the extent specified by the above definition. To create a pattern of spots, the module 30 typically includes a suitable source of radiation 32, such as a collimated diode laser or a light emitting diode (LED) or other source of light having a suitably shaped radiation beam. The beam is scanned over a range of angles by a suitable broom 34 and illumination optics 35. The beam is modulated during the scan to produce the pattern. For example, the beam is modulated in time by turning the source 32 on and off to form a spot or other form of binary pattern. Optical device 35 typically includes one or more lenses and/or other opticals, and can be employed in a variety of different forms in different embodiments, as described below. The pattern is projected onto the scene within a corner 124 defining a projection field of view (F〇V) %, thereby converting the time modulation of the source 32 to an object extending in the region of interest of the system 2 One of the desired spatial intensity patterns. 158131.doc 14- 201233141 In the disclosed embodiment, the buckle unloader 34 package 3 has a scanning mirror 50 of one of the mechanical scanning drivers, and can also be used. Other types of scanners (such as acousto-optic scanners). The scanner 34 can include a bi-directional scanning mirror or a pair of one-way scanning mirrors. These mirrors are effective, and they are used in the entire Type 5 microelectromechanical system (MEMS) technology. This type of scanning mirror is a beer.. Brother is made by such as Micro Vision (Washington State

Produced by several manufacturers in Redmond City. The imaging module 38 typically includes an objective lens optics core on the sensor 4() that forms a projection pattern of the projected pattern appearing on the scene in the region of interest. In the example depicted in Figure 1, 'sensing (d) includes -CM〇s image sensor'. The CMOS image sensor comprises a two-dimensional matrix of detector elements 41. The columns and rows of the matrix are aligned with the axes. Alternatively - selection system, other types of sensors can be used in module 38, as described below. The sensor and objective optics 42 define an imaging field of view 44 that is typically contained within F〇v 36 of the region of interest of the device 22. Although the sensor 4 is shown in the pictorial as a detector element 41 having a substantially equal number of columns and rows, in other embodiments set forth below, the sensor may include only a small number of columns. Or even a single column or a single position sensitive detector element. As noted above, the radiation source 32 typically emits infrared radiation. The sensor 4 can include a monochrome sensor that does not have an infrared cut filter to detect an image of the projected pattern having sensitivity. To enhance the contrast of the image captured by sensor 4, optical device 42 or the sensor itself may include a bandpass filter (not shown) that transmits the wavelength of radiation source 32 to block other Environmental radiation in the frequency band. Processor 46 typically includes an embedded microprocessor that is programmed in software (or firmware) to perform the process and control the functionality set forth herein. The processor can, for example, dynamically control the illumination module 3G and/or the imaging module 38 to adjust parameters such as pattern 氆纟, brightness, and angular extent' as explained in detail below. A memory 48 can store code, lookup tables, and/or interim calculation results. Alternatively - or in addition, processor 46 may include programmable hardware logic for performing some or all of its functions. The details of an embodiment of an ice-mapping processor that can be applied to processor 46 are provided in U.S. Patent Application Publication No. 2010/0007717, which is incorporated herein by reference. Sweeping illumination module Figures 2A and 2B are schematic top views of an illumination module 30 in two different stages of operation in accordance with an embodiment of the present invention. In this embodiment, the radiation source 32 includes a laser diode 52 and a collimating lens M. The 5 ray beam from the "Hui 轱 source is scanned by the scanning mirror 5 within an angular range limited by the mechanical and optical properties of the scanner. (The scanner structure is omitted from this and subsequent figures for the sake of simplicity. WA shows that the mirror is at approximately the middle of the scan and in Figure 2] 8 the § mirror is at its most extreme deflection. This deflection can be defined by The wide range of angles covered by the scanned beam. To extend this range, a beam splitting beam, such as a suitable diffractive optical element (D〇E), splits the scanned beam to form a plurality of angular (four) copies of the scanned beam. Object 56' 58, 60. (In the absence of the beam splitter, the module 30 will project only the beam 56.) When the mirror 5 scans the Korean beam, the 'replica 56, 58' 60 is in focus. The areas are swept in parallel to cover a larger angular range than the scan range provided by the scanner alone. I58131.doc •16- 201233141 For the sake of simplicity, Figures 2A and 2B show three replicated beams, but the beam splits The device 55 can also be configured to impart only two replicated beams or to impart a greater number of replicated beams. In general, the beam splitter 55 can be configured to produce substantially any desired layout depending on the application requirements. mXn beam replica Figure 2C is a schematic front elevational view of one of the radiation patterns projected by the illumination module of Figures 2A and 2B. The on/off of the laser diode 52 is shown in accordance with one embodiment of the present invention. The off-modulation causes each beam replica 56, 58, 6, ... to form a respective pattern 64 of spots 66 in a corresponding sub-region of the field of view 36. The fan-out angle of the beam splitting 55 and the scanner 34 The angular scan range is typically selected such that pattern 64 tiles the regions of interest into substantially non-porous and without overlap between the patterns. Such a tile configuration can be effectively used in a wide angle range in a 3D mapping system. An inner projection pattern. Alternatively, the fanout angle and scan range may be selected such that the patterns 64 overlap. The patterns may be light spot patterns as in the depicted embodiment, or may include other types of structured light. Figure 3 is a schematic side elevational view of one of the illumination modules 3A in accordance with an alternative embodiment of the present invention. This embodiment can be used to form the same tiled pattern shown in Figure 2C. However, this is different from here. Other embodiments as described because of its scanning A combination of a diffractive optical element (D〇E) is used as a spatial modulator to form a patterned illumination of the scene. Since this configuration requires the mirror 50 to be 'reduced to a much slower scan rate. It is possible, or the mirror 50 can simply jump between discrete positions, and the illumination source 32 can be pulsed on and off at a much slower rate. In terms of optical principles, this embodiment is similarly incorporated by reference. The present invention is directed to a DOE-based solution as set forth in US Patent Nos. 2009/0185274 and 2010/0284082. These publications disclose a method for forming a diffraction pattern using a pair of DOEs. One of the pair splits an input beam into an output beam of a matrix, while the other applies a pattern to each of the output beams, such as shai. The two D〇E thus collectively project the radiation onto a spatial region of a plurality of B-neighbor items of the pattern. In the present embodiment, the scan pattern of mirror 50 replaces one of the D 〇 E to split the input beam from radiation source 32 into a plurality of intermediate beams η. For this purpose, mirror 50 is scanned in the X and gamma directions to each of the predetermined angles of the matrix and resides at each of these angles for a period of time typically of the order of a few milliseconds. Each dwell point defines a beam 72. The DOE 70 diffracts each of the beams 72 along a respective axis 76 into a patterned output beam 74. The fan-out angle between the axis 76 and the divergence angle of the beam 74 can be selected (by appropriate design of the scan pattern of the DOE 70 and mirror 50) such that the beam is tiled into the field of view 36 in the manner shown in Figure 2C. The embodiment of Figure 3 can be combined with various types of image capture modules 38, as described below. Since the beam 74 is sequentially illuminated, the image capture pattern of the module 38 is synchronized with the illumination sequence to maximize the apostrophe/background ratio in the captured image of the scene of interest. Some types of image sensors, such as CMOS sensors, have a rolling shutter that can be proposed on April 19, 2000, for example, as disclosed in the disclosure of which is incorporated herein by reference. The application in the United States specifically requests the technique in 12/762,373 to synchronize with the illumination sequence. Figure 4 is a side elevational view of one of the illumination modules 3 158 158131.doc 18- 201233141 in accordance with another embodiment of the present invention. Assuming the source 32 is a laser, the beam it emits is strong and should be continuously scanned by the mirror 50. The new eye (4) is all n. In normal operation, the source 32 emits the beam only when the mirror 50 is moved, so that The residence time at all locations of the sights is short and therefore poses no danger to the eyes. Then, if the mechanism of the drive mirror 50 is stuck or mishandled, the light beam can reside at a position for an extended period of time. To avoid this event, the module 30 includes one or more of the beam sensors 8A, 82, ... that are surfaced to the processor 46 (not shown). The sensors are positioned at a selected angle or angles within the angular range of the mirror scan to periodically receive the scanned beam and thereby verify that the scanner is operating. In this example, two sensors are shown on opposite sides of f〇v362, but a single security sensor or a larger number of such sensors can also be used. The mechanism for driving mirror 50 can be programmed, for example, to direct the beam from source 32 toward sensing (4) at the beginning of each scan and to direct beam from source 32 to sensor 82 at the end of each scan. When the beam strikes one of the sensors, the sensor outputs a pulse to the processor 46. The processor monitors the pulses and tracks the time elapsed between pulses. If the time exceeds a predetermined maximum value, the processor will immediately suppress the emission of the beam from the source 32 (usually by (4) simply cutting the beam). Such a material event will occur if the mirror 5 is jammed at a given location. Therefore, in such a case, the beam from the module will be cut off immediately and any potential safety hazards will be avoided. A schematic diagram 5 is a projection side view of a projection module according to still another embodiment of the present invention. 158131.doc -19-201233141 Sexual side view This embodiment specifically relates to the expansion of the scanning range relative to the mirror π by F〇V 36°. In some technologies such as MEMS, the scanning range of the mirror 5 is small, and a (10) mapping application requires a problem of mapping on a wide field of view. In the depicted embodiment, mirror 5G is scanned over an angle equal to %_/2, such that the weight is typically about 1 〇. To 3 〇. Width a - one of the initial FOVs. The beam from the mirror 5 strikes the __scanning extension element (in this case, the convex reflector 88). The scanning extension element extends the beam range such that the device 36 has a determinable amount of about 6Q. To m. The width a. For two-dimensional (XY) knowledge, the element 60 may be spherical, or it may have one surface having eight different radii of curvature along the X and Y directions to produce a width that is wider in one dimension than in the other. A field of view' or it may have some other aspherical shape. Alternatively, the scan spread reflector can be replaced by a DOE or a diffractive element (not shown) having similar scanning spread properties. In addition, the function of the reflector 88 can be performed by a combination of one of the same type or different types of optical elements. Figure 6 is a schematic, pictorial representation of a 3〇 mapping system % in operation, in accordance with an embodiment of the present invention. In this system, the device is used in conjunction with a game console 92 to operate an interactive game with one of the two participants 94 and 96. To this end, device 22 projects a pattern of spots 1 至 onto objects in its field of view (including participants 98 and one of the walls 98 (and other components) of the room in which system 9 is located). The device 22 captures and processes the image of the pattern, as explained above, to form a 3D image of the participant and the scene, the object. The console % responds to the participant's body movement 158131.doc • 20- 201233141 to control the game, and the participant's body movement is detected by the device 22 or console 92 by segmenting and analyzing the changes in the 3D image. System 90 is shown here to illustrate some of the difficulties encountered by 3D mapping systems. Objects on the mapped scene can vary greatly in size, and often small objects (such as participating hands, legs, and heads) move quickly and change their appearance. Moreover, it is often the case that such objects need to be accurately mapped for the purpose of games or other interactive applications running on console 92. At the same time, different objects in the region of interest may reflect the image at a greatly different intensity due to the difference in reflectance and the distance from the device, and the reflection is returned to the device 22β. The patterns in the shirts that are captured may be too dark to provide accurate depth reading. To overcome these problems, the illumination module 3 in the device 22 is adaptively projected' to change the density and/or brightness of the pattern in response to the geometry of the scene. The information about the geometry of the scene is controlled by the imaging module and/or by the image generated by processing the images. During the operation of the system 90, the radiation source 32 and the scanner I are dynamically controlled to Small or rapid changes, or important objects that need close attention or better depth coverage (such as the body of participants 94 and 96) with a larger frost mill is · county {

In order to compensate for the size of the captured scene, the m-sparse pattern covers the large device 22 in response to changes in the scene. The device 22 can dynamically adjust the change in the distance and reflectance within the input scene of the radiation source 32. I58131.doc •21· 201233141 Prison this, ~w clothes straight U objects (such as background 98) direction to project light spots with greater brightness, while reducing the projected power on bright, nearby objects. Alternatively or additionally, the local scanning speed of the mirror and thus the dwell time at each location within the scanning range can be controlled to impart a longer local residence time and therefore a larger margin in areas where more illumination is required End-projection energy ^ These types of adaptive power control enhance the dynamic range of system 90 and optimize the utilization of available radiated power. As another aspect of the dynamic operation of system 90 (not illustrated in Figure 6), the angular extent of the illumination and imaging modules in device 22 can also be dynamically adjusted. For example, after first capturing a wide-angle image and forming a wide-angle, low-resolution 3D image of the region of interest, the device 22 can be controlled to magnify the particular object that has been identified within the region. Thus, the angular scan range of the projected pattern and the sensing range of the imaging module can be reduced to provide a higher resolution depth map of the body of the participant and %. The scanning and sensing range can be adjusted accordingly as the participant moves within the scene. Figure 7 is a schematic side elevational view of an illumination module 11 in accordance with yet another embodiment of the present invention. The module 11A can be used in place of the module 3〇 (FIG. 1) in the device 22, and is provided to simultaneously project an infrared pattern (for 3D mapping) using the same scanning hardware and can be viewed by a user of the device. Additional features in both aspects of the content. In such an embodiment, device 22 may use an infrared pattern to form a 3D image of a given object, and then a visible image suitable for the shape and shape of the object may be projected onto the object. Such functions are for example in the presentation of user interface graphics and text, and in particular in the "Augmented Reality" application 158I31.doc -22. 201233141 (for their device 22 even integrated into the goggles worn by the user It is useful to make the mapping and visible image projections aligned with the user's field of view. An application of this type is set forth, for example, in the disclosure of which is hereby incorporated by reference in its entirety in its entirety in its entirety in the the the the the the the the the As shown in Figure 7, a beam combiner 114, such as a dichroic reflector, aligns the infrared beam from radiation source 32 with a visible beam from a source of visible light 112. Source 112 can be monochromatic or multi-colored. For example, the source m can comprise a laser diode or LED suitable for monochromatic illumination, or it can include different colors whose beams are modulated and combined to project a desired color at each point in the field of view. Multiple laser diodes or LEDs (not shown). For the latter purpose, combiner 114 can combine two or more dichroic elements (not shown) to align all of the different color and infrared beams. When mirror 50 is scanned within FOV 36, processor 46 modulates sources 32 and 72 simultaneously. Source 32 is modulated to produce a desired pattern for 3D mapping at each point in the field of view, while source 112 is based on The pixel value (intensity and possible color) of the visible image to be projected at the same point (which can be based on the 3D image of the object at the point) is modulated. Since the visible and infrared beams are optically aligned and coaxial, the visible image will automatically be registered with the 3d map. Image Capture Configuration Figure 8 is a schematic visualization of an imaging module in accordance with an embodiment of the present invention. This embodiment utilizes the synchronization between the scanning pattern of the illumination module 30 and the continuation pattern of the imaging module. This synchronization enables the use of one of the detector elements 41 having a relatively small number of columns 122 relative to the number of 15 15813I.doc -23· 201233141 image sensor 120. In other words, the image sensor itself has a low resolution in the gamma direction (the vertical direction in the figure) but a high resolution in the x direction. In the depicted embodiment, image sensor 80 has fewer than ten columns and may have, for example, one thousand or more rows. Alternatively, the image sensor can have a larger or smaller number of columns, but still far less than the row. Objective lens optics 42 includes an astigmatic imaging element that maps field of view 44 to image sensor 12A. The optics 42 have a magnification that is greater in the gamma direction than in the other direction such that each column 122 of the image sensor extracts light from a corresponding rectangular region 124 in the field of view. For example, the aspect ratio of each of the rectangular regions 124 can be approximately 10:1 (χ: γ), while the column 122 has an aspect ratio of approximately 1000:1. The different X and Υ magnifications of the optical device 4 2 can be selected in any desired ratio based on the number of columns and rows in the image sensor and the desired size of the field of view. For example, in one embodiment, optical benefit 42 can include a cylindrical lens, and sensor 12 can include only a single column of detector elements. The shot module 30 scans the light beam from the radiation source in the field of view 44 in a raster pattern to cover each of the regions 124 with a plurality of horizontal scan lines. When each line is from the illumination module When the spot is scanned, the corresponding column 122 extracts the radiation reflected from the scene. The readout from the sensor 12 is synchronized with the illumination scan so that substantially only the corresponding region 124 in the scene is illuminated by the scan. The detector elements 41 of the columns 122 are read. Thus, the length of time during which each column 122 is integrated for ambient light is read, and thus the signal/environment ratio in the rounds of the sensor 12 is enhanced. The resolution of the image captured by module 38 in this embodiment depends on the resolution of the illumination 158131.doc • 24· 201233141 scan because the sensor 120 of each column i22 is read multiple times in synchronization with the scan. When the illumination module scans the corresponding area 124, the column is scanned multiple times, and then the second line is scanned multiple times, and then the third line is scanned multiple times, etc. For example, if the first column in the image sensor is responsible for 撷Take the illuminating module - hundreds of scan lines ( 1/10 of the straight yang, then scan the first line after scanning the second line. For this purpose, the sensor 120 includes similar to, for example, a conventional, full-resolution CMOS image sensor. A suitable readout circuit (not shown) for the readout circuit. Alternatively, a vertical fan-out component can be used on the illumination side, and the line of the image sensor can simultaneously scan each of the corresponding illumination illuminations. The β-selection system can vertically scan the image sensor 120 in synchronization with the illumination scan. For example, in this scheme, an imaging sensor having one hundred columns is used, and the image sensor is A column captures, for example, the first, 101st, 201st, 301th scan lines, etc. of the illumination field. Alternatively or in another selection, the imaging module 38 can be implemented, for example, as disclosed in its disclosure A spatially multiplexed imaging scheme of the type described in U.S. Provisional Patent Application Serial No. 61/419,891, filed on Dec. 6, 2011, which is incorporated herein by reference. The image capture module 38 shown in Figure 8 is configured. The full resolution in the χ direction is dependent on the synchronized scanning of the illumination module 3 to provide gamma directional resolution. This embodiment thus allows the image sensor 120 to be made by means of a simpler readout circuit. Smaller and less expensive, while potentially providing an increase in resolution along the 乂 direction. This resolution is useful because, in the configuration that is not shown in the figure, only the image captured by the module 38 The direction of the pattern in the direction shifts 15813I.doc -25- 201233141 bit indicates the depth variation within the scene, as explained above. The high resolution along the other direction thus provides an accurate reading of the spot offset, which in turn will be achieved Accurate calculation of depth coordinates. Figure 9 is a schematic visualization of an imaging module in accordance with another embodiment of the present invention. This embodiment also utilizes synchronization between the scanning pattern of the illumination module 3〇 and the readout pattern of the imaging module. In this case, however, the field of view 44 of the imaging module 38 is effectively scanned. In the embodiment of FIG. 9, the image capture module 38 includes a position sensitive detector 130 configured to sense and output the pattern projected by the illumination module 30 onto the object. One of each spot is offset by X. In other words, when the module 30 sequentially projects each spot to a corresponding position in the region of interest, the detector 13 detects its image and indicates its respective offset with respect to the position of the corresponding reference spot (and Therefore, the depth of the scene at the location is private.) The detector 130 is shown in the figure as a line scan sensor 9 of a detector element 41 having a single column extending in the x-direction. Alternatively, the position sensitive debt detector Π0 can include an analog detector element having an analogy to one of the positions indicative of the spot currently being imaged onto the detector. In the depicted embodiment, objective optics 42 maps one of the rectangular regions 134 of the field of view 44 to the detector element 41 of the column in the sensor 13A. The optical device 42 can be astigmatic as in the previous embodiment, having optical power greater in the X direction than in the x direction, such that the region 134 has a detection of the column in the sensor. The device component has a low aspect ratio (χ: γ). A scanning mirror 132 is synchronized with the raster scan of the illumination module 30 in the gamma direction in the field of view scanning zone 134 such that zone 134 always contains the horizontal line currently under the patterned illumination 158131.doc • 26-201233141. In this way, the image capture module captures an image of a pattern on a scene having a high resolution and an interval/environment ratio while using a simple one-dimensional sensor. Figure 10 is a schematic, pictorial representation of a 3D mapping device 140 in accordance with yet another embodiment of the present invention. In this embodiment, the fields of view of an illumination module 142 and an imaging module 144 are collectively scanned by a common mirror 150 in the Y direction. The illumination module 142 includes a radiation source 32 and a beam scanner in the form of a scanning mirror 152 that scans the radiation beam in the X direction. The imaging module 144 includes a detector 154 whose field of view is scanned in the X direction by an imaging scanner including one of the scanning mirrors 156 in synchronization with the scanning mirror 152. Projection optics 146 project an illumination beam onto the region of interest of device 14 to form a desired pattern of spots on the object in the scene, and objective optics 148 image the spots onto detector ι 54. Therefore, the sensing region of the imaging module 144 is scanned in the region of interest in synchronization with the scanned beam of the illumination module 142. Detector 154 can include, for example, a position sensitive detector as in the embodiment of Fig. 9 or a small area image sensor in which the preamble elements are arranged in columns and rows. As in the previous embodiments, imaging module 144 provides a measure of the spot offset. The measurements can then be processed to produce a depth map. Although the mirror 150 is conveniently shared by both the illumination and imaging modules, each of the modules may have its own, synchronized Y-direction scanning mirror. In the latter case, MEMS technology can be used to generate all of the mirrors in device 14 然而 however 'since the Y-direction scan is relatively slow, so a single mirror 150 with a step-drive is feasible and advantageous for this application. The configuration shown in Figure 10 can be used to maintain the dot density and brightness of the projected pattern as well as the dynamic control of the scanning zone, as explained in the 。 158131.doc -27- 201233141 step. The mirrors 150 and 152 are operable to vary the angular extent within which the illumination beam is scanned, and the mirrors 150 and 156 then match the scan area of the scan detector 154 to the angular extent of the scanned beam. In this manner, for example, device 140 can be first operated to capture a coarse 3D image of one of the entire scenes to cover a wide angular range. The 3D image can be segmented to identify an object of interest, and the scan range of the illumination assembly and imaging assembly can then be dynamically adjusted to capture and map regions of objects having only high resolution. Other applications for such dynamic control will be known to those skilled in the art and are considered to be a tribute to the present invention. Several specific ways to enhance the scanning architecture for pattern projection and image defects have been shown and described above. These embodiments illustrate, by way of example, how aspects of the present invention may be particularly useful for improving eye safety, increasing the field of view, simultaneously using the same scanning hardware to project both infrared and visible images, and by imaging the imaging mode. The group is synchronized with the illumination module to reduce the size of the imaging set. Alternative embodiments and combinations of the above embodiments are also considered to be within the scope of the invention. These schemes can use various combinations of: scanning projection with 3D mapping and projection of visible information; diffractive optics for shaping or splitting the scanning beam; to reduce the refracting and field diffracting optics of the projection system Device; and (4) scanning for projection and shadow (4). It should be understood, therefore, that the various embodiments described above are merely illustrative, and that the invention is not limited to the particulars shown and described herein. Rather, the scope of the present invention includes both the combinations and sub-combinations of the various features described above, and variations of the invention which are apparent to those skilled in the <RTIgt; Modifications. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a schematic plan view of a system for 3D mapping according to an embodiment of the present invention; FIG. 2A and FIG. 2B are diagrams showing an illumination module according to an embodiment of the present invention; 2 is a schematic plan view of one of the two different operational stages; FIG. 2C is a schematic front view of one of the patterns of the modules of FIGS. 2A and 2B according to an embodiment of the present invention; FIG. 3 to FIG. According to another embodiment of the present invention, a schematic plan view of an illumination module; FIG. 6 is a schematic, visualized diagram of a 3] 〇 mapping system in operation according to an embodiment of the present invention; Still another embodiment of the invention, a schematic top view of an illumination module; FIGS. 8 and 9 are schematic, pictorial views of an imaging module in accordance with an embodiment of the present invention; and FIG. In one embodiment, a schematic, visualized diagram of a 3] imaging device. [Major component symbol description] 20 System 22 Mapping device 158131.doc -29· Object illumination module Radiation source Scanner illumination optics Projection field of view Imaging module Sensor detector component Objective optics Imaging field of view Processor memory Body scanning mirror laser diode collimator lens optical splitter of a plurality of angularly spaced replicas of a scanned beam of light scanned by a plurality of angularly spaced replicas of the scanned beam Open replica pattern spot, diffractive optical element intermediate beam • 30- 201233141 74 76 80 82 88 90 92 94 96 98 100 110 112 114 120 122 124 130 132 134 140 142 144 146 Patterned output beam axis beam sensing Beam sensor convex reflector three-dimensional mapping system game console participant participant background light point illumination module visible light source combiner image sensor column rectangular area position sensitive detector scanning mirror rectangular area three-dimensional mapping device illumination module Imaging Module Projection Optics 158131.doc 201233141 148 Objective Mirror Optics 150 Common Mirror 152 Scan Mirror 154 Detector 156 scanning mirror 158131.doc -32·

Claims (1)

201233141 VII. Patent Application Range: 1. A device for mapping, comprising: an illumination module comprising: a radiation source configured to emit a radiation beam; a scanner configured to Receiving and scanning the beam over a selected angular range; and illumination optics configured to project the scanned beam to form a pattern of light spots extending within a region of interest; an imaging module Configuring to capture an image of the pattern projected onto one of the objects of interest; and a processor configured to process the image to construct a three-dimensional (3D) image of the object. 2. The device of claim 1, wherein the pattern of the spots is uncorrelated within a depth range mapped by the device. 3. The apparatus of claim 1, wherein the source of radiation is controlled to modulate an intensity of the beam as the scanner scans the beam, thereby forming the pattern of the spots of light on the region of interest. 4. The device of claim 3, wherein the illumination module is configured to modify the pattern in response to the image captured by the imaging module. 5. The device of claim 4, wherein the illumination module is configured to control at least one of the radiation source and the scanner A to modify the spots in the array selected in a selected portion of the region of interest One angular density. 6. The device of claim 4, wherein the illumination module is configured to control at least one of the radiation source and the scanner to modify a selected region of the region of interest 158]31,doc 201233141 One of the spots is brightness. 7. The device of claim 3, wherein the scanner is configured to scan the beam over a first angular range, and wherein the optical devices comprise a beam splitter, the beam splitter configured to form A plurality of angularly spaced replicas of the scanned beam that are coextensive within a second angular extent of the first angular extent. 8. The device of claim 7, wherein the scanner and the beam splitter are configured to collage the region of interest with the pattern formed by the plurality of angularly spaced replicas of the scanned beam . 9. The device of claim 1, wherein the optical device comprises a patterned element configured to form the pattern in a first angular range upon illumination by the beam, and wherein the scanner Configuring to direct the beam to continuously strike the patterned element at a plurality of different angles to form a plurality of angularly spaced replicas of the pattern that are coextensive over a second angle of the first angular range . 10. The device of claim 9, wherein the scanner and the patterned element are configured to collage the region of interest with the plurality of angularly spaced replicas of the pattern. 11. The device of claim 1, wherein the scanner is configured to scan the beam within a _th angle range, and wherein the optical devices comprise a scan extension element configured to disperse the The scanned beam is adapted to encompass a second angular extent greater than one of the first angular extents in a spatial pattern. 158131.doc 201233141 12. The device of claim 11, wherein the scanning _X rating π component is selected from the group consisting of a convex reflector and a diffractive optical element. 13. The device of claim 1, wherein the illumination module comprises at least one beam sensor, the at least one beam sensor being positioned at a selected angle within the angular range scanned by the scanner for periodicity The scanned beam is received sexually and thereby verifying that the scanner is operating. 14. The device of claim 13, wherein the illumination module is configured to suppress emission of the beam from the Han source when the sensor fails to periodically receive the scanned beam. 15. The device of claim 1, wherein the light source comprises: - a first radiation source that emits an infrared light beam that is modulated to form the pattern of the light spots, and - the second radiation a source that emits a visible light beam that is modulated to project a visible image onto the region of interest, wherein the scanner and optics are configured to simultaneously both the infrared beam and the visible light beam Projected onto the area of interest. 16. The device of claim 15, wherein the second source of radiation is controlled to project the visible image onto the object in response to the 3D image. 17. The device of claim 1, wherein the processor is configured to obtain between the light spots in the plurality of regions of the captured image and the corresponding reference spot locations of the reference image belonging to the pattern The respective offsets are derived to derive the 3D image, wherein the respective offsets indicate respective distances between the regions and the image capture assembly. 18. The device of claim 17, wherein the imaging module includes a position sensitive detection 15813I.doc 201233141 The measurement 's-spot position sensitive detector is configured to sense and output the projection by the illuminating module One of the light spots of each spot in the graph t on the object is offset. 19. The device of claim 18, wherein the imaging module is configured to scan a field of view of the position sensitive detector in synchronization with the scanner in the illumination module. 20. The device of claim 18, wherein the scanner is configured to scan a field of view of the position sensitive detector with the light beam from the radiation source. 21. The device of claim 17, wherein the illumination module and the imaging module are configured such that the offsets occur in a first direction, and wherein the 3H imaging module comprises: - an array of detector elements, Equipped to extend one or more columns in the first direction; and astigmatic optics configured to image the pattern onto the array and having a second direction along the first direction Large one optical power beta 22. As requested! The device includes a sensor and imaging optics, the sensors and imaging optics defining one of scanning within the region of interest in synchronization with the scanned beam of the illumination module Sensing area. 23. The device of claim 22, wherein the sensor comprises an image sensor having a rolling shutter, and wherein the rolling shutter is synchronized with the scanned beam. 2 4 - The device of claim 2, wherein the scanner in the illumination module is controllable to dynamically change the selected angular range, and wherein the imaging module 158131.doc 201233141 includes an imaging scanner The imaging scanner is configured to dynamically scan the sensing region to match the selected angular extent of the scanned beam. 25_A device for mapping, comprising: an illumination module, comprising: a radiation source configured to emit a radiation beam having one of intensity changes according to a specified time modulation; and A scanner 'configured to receive and scan the beam 'in a region of interest' to project the radiation onto the region by a spatial intensity pattern determined by the temporal modulation of the beam; an imaging mode a set configured to capture an image of the spatial intensity pattern projected onto an object in the region of interest; and a processor configured to process the image to construct a three-dimensional image of the object ( 3D) image. 26. The device of claim 25, wherein the time modulation is binary, and wherein the spatial intensity pattern comprises an array of light spots produced by the time modulation. 27. The device of claim 25, wherein the processor is configured to derive the 3D by finding respective offsets between the pattern in the region of the captured image and a reference image of the pattern An image, wherein the respective offsets indicate respective distances between the zones and the image manipulation assembly. 28. The device of claim 25, wherein the imaging module comprises a sensor and imaging optics, the sensors and imaging optics defining the scanned beam in synchronization with the scanned beam of the illumination module One of the sensing areas is scanned within the area. 158131.doc 201233141 29. A method for mapping, comprising: scanning a radiation beam over a selected angular range to form a pattern of light spots extending within a region of interest; capturing projections to the attention An image of the pattern on one of the objects in the area; and processing the image to construct a three-dimensional (3D) image of the object. 30. The method of claim 29, wherein the pattern of the spots is uncorrelated within a depth range mapped by the method. 3. The method of claim 29, wherein scanning the beam comprises modulating an intensity of the beam as the beam is scanned, thereby forming the pattern of the spots on the region of interest. 3. The method of claim 31, wherein forming the pattern comprises modifying the pattern in response to the image captured by the imaging module. 3. The method of claim 32, wherein modifying the pattern comprises modifying an angular density of the spots of the array in the selected portion of the region of interest. 34. The method of claim 32, wherein modifying the pattern comprises modifying a brightness of one of the light spots in the selected area of one of the regions of interest. 35. The method of claim 31, wherein forming the pattern comprises scanning the beam 'within a first angular range' and splitting the scanned beam to form a coextensive region within a second angle greater than the first corner A plurality of angularly spaced replicas of the pattern of the scanned beam of light. 36. The method of claim 35, wherein splitting the scanned beam comprises framing the region of interest with the pattern formed by the plurality of angularly spaced replicas of the scanned beam. The method of claim 29, wherein scanning the beam comprises illuminating the patterned element to form a pattern in a first angular range when illuminated by the s-beam, while directing the beam The patterned elements are continuously struck at a plurality of different angles to form a plurality of angularly spaced replicas of the pattern that are coextensive within a second angle range that is greater than one of the first angular extents. 38. The method of claim 37, wherein directing the beam comprises framing the region of interest with the plurality of angularly spaced replicas of the pattern. 39. The method of claim 29, wherein scanning the beam comprises directing the beam scanned within a first angular range to strike a scanning extension element configured to disperse the scanned beam to cover in a spatial pattern A second angle range greater than one of the first angular ranges. 40. The method of claim 39, wherein the scanning extension element is selected from the group consisting of a convex reflector and a diffractive optical element. 41. The method of claim 29, and comprising sensing the scanned beam at a selected angle within the angular range and verifying the scan by periodically sensing the scanned beam at the selected angle . 42. The method of claim 41, wherein scanning the beam comprises suppressing emission of the beam when the scanned beam is not periodically sensed. 43. The method of claim 29, wherein scanning the beam comprises scanning an infrared beam of one of the sig patterns modulated to form the spot, and wherein the method includes scanning a visible beam with the infrared beam while simultaneously adjusting The visible light beam is changed to simultaneously project both the infrared beam and the visible light beam onto the region of interest while simultaneously projecting a visible image onto the region of interest. The method of claim 43, wherein modulating the visible light beam comprises generating the visible image in response to the 3D image. The method of claim 29, wherein processing the image comprises finding each of the light spots in the plurality of regions of the captured image and the corresponding reference spot positions of the reference shirt image belonging to the pattern Do not offset to derive the 3D image' where the respective offsets indicate the respective distances between the zones and the image capture assembly. The method of claim 45, wherein extracting the image comprises applying a position sensitive detector to sense and output each spot in the pattern projected by the illumination module on the object An offset. The method of claim 46, wherein applying the position sensitive detector comprises scanning a field of view of the position sensitive detector in synchronization with the scanner in the illumination module. The method of claim 46, wherein applying the position sensitive detector comprises scanning a field of view of the position sensitive detector with the beam from the side source. The method of claim 45, wherein the offsets of the respective distances are indicated by a first direction, and wherein the capturing of the image comprises using a trailing edge. The first direction of the ridge is greater along a second vertical direction - the optical power astigmatism optics to image the pattern onto one of the detector element arrays configured to extend along one or more of the columns in the first direction. The method of claim 29 wherein the image is scanned in the region of interest in synchronization with the scanned beam of the illumination implant - a sensing region or a sensor 158131.doc 201233141 5 1. The method of claim 50, wherein the sensor comprises an image sensor having a rolling shutter, and wherein scanning the sensing region comprises synchronizing the rolling shutter with the scanned beam. 52. The method of claim 5, wherein scanning the beam comprises dynamically changing the selected angular extent, and scanning the sensing region comprises dynamically scanning the sensing region to match the selected angular extent of the scanned beam . 53. A method for mapping, comprising: generating a light beam having a intensity that varies according to a specified time modulation; scanning the beam in an area of interest to The time modulation determines a spatial intensity pattern to project the radiation onto the region; capturing a technical image to an image of the spatial intensity pattern on an object of the region of interest; and processing the image to construct the image A three-dimensional (3D) image of an object. 54. The method of claim 53, wherein the time modulation is binary, and wherein the 5 Hz spatial intensity® case comprises an array of spots produced by the time modulation. The method of claim 53, wherein processing the image comprises deriving a (four) image by finding a pattern of the reference image in a plurality of regions of the image and a reference image of the pattern. The respective offsets indicate the respective distances between the area and the image capture assembly. 56. The method of claim 53, wherein the beam is synchronously scanned within the region of interest to scan a sensing region or a sensor within the scanned light region. I58131.doc