TW201231987A - System for manufacturing power supply unit and method for manufacturing power supply unit, and flicker measurement apparatus - Google Patents
System for manufacturing power supply unit and method for manufacturing power supply unit, and flicker measurement apparatus Download PDFInfo
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- TW201231987A TW201231987A TW100145491A TW100145491A TW201231987A TW 201231987 A TW201231987 A TW 201231987A TW 100145491 A TW100145491 A TW 100145491A TW 100145491 A TW100145491 A TW 100145491A TW 201231987 A TW201231987 A TW 201231987A
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- 238000005476 soldering Methods 0.000 claims description 6
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 claims description 4
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Abstract
Description
201231987 六、發明說明: 【發明所屬之技術領域] 本%明係關於製造電源供應單元(p〇wer supply unit, 簡稱psu)之系統及方法,及閃變(flicker)測量裝置。 【先前技術】 發光二極體(light~emitting diode,簡稱 LED)係關 於將電能轉換成光能的光源。近來,由於LED的優勢,例 如快速處理速度、低耗電、長耐久性等,所以該LED被應 用在照明領域,且使用成為顯示元件。 該LED是藉由接收從電源供應單元(psu)供應的電源 來源來運作。舉例來說,當該pSU不正常運作時,該LED 可能也不正常運作,並可能發生閃變現象。在該閃變現象 中,從該LED發出的光可能閃變。發生在該LED中的閃變 現象可能被將該電源來源供應至該LED的PSU的狀態所影 響。因此’在該PSU的製造中,可進行用以判定該psu的 狀態的測試。 傳統上,為了判定PSU的狀態,使用者視覺地檢查從 連接至該PSU的LED所發出的光。換句話說,當視覺觀察 到該閃變現象時,該使用者判定該PSU是在不正常狀態。 然而,由於該使用者的個別差異(例如年紀、視力、疲勞等 等),測量該閃變現象是有不同的。因此,需要可確實測量 該LED的閃變現象與可精確判定該PSU的品質狀態的技術。 【發明内容】 本發明的一態樣係提供一種製造電源供應單元(PSU) £ 95456 201231987 之^統及製造電源供應單元(PSU)之方法5其可經由測試來 判定至少一 Psu之各者的電性特性與狀態、並可包裝在該 至少一 PSU之中被判定是在正常狀態中的psu。 本發明的另一態樣係提供一種閃變測量裝置,其可測 1至少一發光二極體(led)的閃變、並可判定至少一 psu 的狀態。 本發明的又另一態樣係提供一種閃變測量裝置,其可 儲存與管理藉由狀至少一 PSU的狀態所得到的結果資料、 並可促進該結果資料的使用。 本發明的又另一態樣係提供一種照明裝置,其利用藉 由閃變測量裝置來判定是在正常狀態中的PSU。 一根據本發明的態樣,其提供一種製造PSU的方法,包 含·提供至少一 PSU,其供應調光訊號(dimming signal) 至至少一光源,進行第一測試,其係針對該至少一 PSU的 電性特性;偵測發自該至少一光源的光,測量該至少一光 源的閃變,並基於由測量該閃變所獲得的閃變測量結果來 進行針對該至少一 PSU的狀態的第二測試;以及包裝pSU, 該PSU是由於該第一測試與第二測試而在該至少一 psu之 中被判定是在正常狀態中。 根據本發明的另一態樣,其提供一種用以製造電源供 應單元(PSU)的系統,該系統包含:PSU製造裝備,係用以 提供至少一 PSU,該至少一 PSU供應調光訊號至至少一光 源;第一測試裝備,係用以進行第一測試,其係針對該至 少一 PSU的電性特性;第二測試裝備,係用以偵測發自該 4 95456 201231987 至少-光源的光、測量該至少-光源的閃變、與基於測量 該閃變所獲得的閃變測量結果而進行針對該至少一 p s u的 狀態的第二測試;以及包裝I備以包裝psu,係用以藉由 。玄弟測5式裝備與該第二測試震備來在該至少一 PSU之中 判定該PSU是在正常狀態中。 根據本發明的又另一態樣,其提供一種閃變測量裝置, 其包含:光偵測模組,係用以偵測發自至少一光源的光; 訊號輸入/輸出模組,係用以輸入與輸出訊號,該訊號輸入 /輸出模組連接至至少一 PSU,該至少一 PSU供應調光訊號 至該至少一光源,訊號處理模組,係用以轉換該已彳貞測光 成為電訊號,並處理該電訊號;以及控制模組,係用以基 於調光控制訊號來控制該至少一 PSU、使用該已處理電訊 號來測量該至少一光源的閃變、與基於藉由測量該閃變所 得到的閃變測量結果來判定該至少一 PSU的狀態。 根據本發明的又另一態樣,其提供一種照明裝置,其 包含:用以照明的光源;以及用以供應電源至該光源的 PSU,該PSU係藉由閃變測量裝置來判定是在正常狀態中。 根據本發明的進一步態樣,其提供一種製造pSU的方 法,其包含:基於調光控制訊號來控制該至少一 PSU,該 至少一 PSU供應S周光说说至至少一光源;價測發自該至少 一光源的光;將該已偵測光轉換成電訊號,並處理該電訊 號;使用該已處理電訊號來測量該至少一光源的閃變;以 及基於藉由測量該閃變所得到的閃變測量結果來判定該至 少一 PSU的狀態。201231987 VI. Description of the Invention: [Technical Field to Be Invented] This is a system and method for manufacturing a power supply unit (psu) and a flicker measuring device. [Prior Art] A light-emitting diode (LED) is a light source that converts electrical energy into light energy. Recently, LEDs have been used in the field of illumination due to advantages of LEDs, such as rapid processing speed, low power consumption, long durability, etc., and have been used as display elements. The LED operates by receiving a source of power supplied from a power supply unit (psu). For example, when the pSU is not functioning properly, the LED may not function properly and flicker may occur. In this flicker phenomenon, light emitted from the LED may flicker. The flicker phenomenon that occurs in the LED may be affected by the state in which the power source is supplied to the PSU of the LED. Therefore, in the manufacture of the PSU, a test for determining the state of the psu can be performed. Conventionally, in order to determine the state of the PSU, the user visually checks the light emitted from the LED connected to the PSU. In other words, when visually observing the flicker phenomenon, the user determines that the PSU is in an abnormal state. However, due to individual differences of the user (e.g., age, vision, fatigue, etc.), the measurement of the flicker phenomenon is different. Therefore, there is a need for a technique that can reliably measure the flicker phenomenon of the LED and accurately determine the quality state of the PSU. SUMMARY OF THE INVENTION An aspect of the present invention provides a method of manufacturing a power supply unit (PSU) £95456 201231987 and a method of manufacturing a power supply unit (PSU), which can determine, by testing, at least one of the Psu Electrical characteristics and states, and may be packaged in the at least one PSU to be determined to be psu in a normal state. Another aspect of the present invention provides a flicker measuring apparatus that can measure the flicker of at least one light emitting diode (LED) and can determine the state of at least one psu. Still another aspect of the present invention provides a flicker measuring apparatus that stores and manages result data obtained by the state of at least one PSU, and can facilitate use of the result data. Still another aspect of the present invention provides a lighting apparatus that utilizes a flicker measuring apparatus to determine a PSU that is in a normal state. According to an aspect of the present invention, a method of fabricating a PSU includes providing at least one PSU that supplies a dimming signal to at least one light source for performing a first test for the at least one PSU An electrical characteristic; detecting light emitted from the at least one light source, measuring a flicker of the at least one light source, and performing a second state for the at least one PSU based on a flicker measurement result obtained by measuring the flicker Testing; and packaging the pSU, the PSU being determined to be in a normal state among the at least one psu due to the first test and the second test. According to another aspect of the present invention, there is provided a system for manufacturing a power supply unit (PSU), the system comprising: PSU manufacturing equipment for providing at least one PSU, the at least one PSU supplying a dimming signal to at least a light source; a first test equipment for performing a first test for electrical characteristics of the at least one PSU; and a second test device for detecting light from at least the light source of the 4 95456 201231987, Measuring at least the flicker of the light source, and performing a second test for the state of the at least one psu based on the flicker measurement obtained by measuring the flicker; and packaging I for packaging the psu for use. And the second test equipment is used to determine that the PSU is in a normal state among the at least one PSU. According to still another aspect of the present invention, a flicker measuring device includes: a light detecting module for detecting light emitted from at least one light source; and a signal input/output module for Input and output signals, the signal input/output module is connected to at least one PSU, and the at least one PSU supplies a dimming signal to the at least one light source, and the signal processing module is configured to convert the measured light into an electrical signal. And processing the electrical signal; and the control module is configured to control the at least one PSU based on the dimming control signal, measure the flicker of the at least one light source using the processed electrical signal, and measure the flicker based on The resulting flicker measurement results determine the state of the at least one PSU. According to still another aspect of the present invention, a lighting device includes: a light source for illumination; and a PSU for supplying power to the light source, the PSU being determined by a flicker measuring device to be normal In the state. According to a further aspect of the present invention, there is provided a method of manufacturing a pSU, comprising: controlling the at least one PSU based on a dimming control signal, the at least one PSU supplying a S-light to say at least one light source; Light of the at least one light source; converting the detected light into an electrical signal, and processing the electrical signal; using the processed electrical signal to measure a flicker of the at least one light source; and based on measuring the flicker The flicker measurement results determine the state of the at least one PSU.
S 95456 201231987 根據本發明的進一步態樣,其提供一種控制模組,其 包含··輸入單元’係用以接收需要來產生調光控制訊號的 資訊輸入,該調光控制訊號是使用來控制至少一 PSU的運 作,訊说發射Is,係用以將該調光控制訊號發射(transini t) 至該至少一 PSU ;訊號接收器,係用以接收頻率訊號,該 頻率訊號係對應至至少一光源所偵測的光;第一控制器, 係用以基於該已接收資訊來產生該調光控制訊號;以及第 二控制器,係用以使用該已接收頻率訊號來測量該至少一 光源的閃變,並基於藉由測量該閃變所獲得的閃變測量結 果來測試該至少一 PSU。 【實施方式】 為了本發明的例示實施例’現在將詳細描述相關資訊, 其中的範例將參照圖式來描述’其中,全文中相似的元件 符號指出相似的元件。下面將參照圖式來描述例示實施例 以解釋本發明。 第1圖係說明根據本發明的實施例的用以製造電源供 應單元(PSU)的系統1⑼的方塊圖。 參照第1圖’該系統1 〇 〇可包含psu製造裝備11 〇、 第一測試裝備120、老化測試裝備(aging test equipment) 130、第二測試裝備140、第三測試裝備150、與包裝裝備 (packing equiPment)16〇 。 該PSU製造裝備11〇可提供至少一 PSU。該至少一 PSU 可供應調光訊號至至少一光源’且可使該至少一光源發光。 舉例來說,當PSU不正常運作時,接收供應自該PSU的調 6 95456 201231987 光訊號的光源也可能不正常運作。因此,當該PSU製造裝 備110製造PSU時,可進行判定該PSU是否正常運作的測 試。 該第一測試裝備120可進行用於該至少一 pSU的電性 特性的第一測試,該至少一 psu是由該psu製造裝備11() 所提供。 該老化測試裝備130可在嚴峻的環境中測試該至少一 PSU。該老化測試裝備130可產生老化訊號(該老化訊號包 s預先设疋或輸入的老化條件與老化時間),且可依據該老 化訊號而在老化時間期間的老化條件中的該psu上進行老 化測試。 該第二測試裝備14〇可偵測發射自至少一光源的光、 可測里該至少-光源的閃變、可依據藉由測量該閃變所 獲得的閃變測量結果來進行該至少-PSU的狀態的第二測 試0 該老化測試裝備130是從該第二測試裝備140分萄 來’,如第1圖所示,然而,該老化測試裝備13〇可包含 該第二測試裝備刚中。換句話說,可在進行該老化測 ,後’將該第二測試裝们40組構成用以進行該第二測 減,即測量該閃變。 在包裝一藉由該第一測試農備12〇與該第二測試裝 以判定將是在正常狀態的psu之前,該第三測試化 ::進行該PSU的消耗電源、該PSU的輸出電流、該p 的輸出電壓、該PSU的耐受電壓(wi thstanding V。 £ 95456 201231987 及該PSU是否正常運作之至少—者的第三測試。在該第— 測試、該老化測試與該第二測試期間,可施加應力至屬於 各測試環境的PSU。由於該應力可對於該psu的電性特性 有影響,當完賴第-賴、該老化測試與該第二測試時, 可再次進行該第三測試以測試該psu的電性特性。可不必 定需要該第三測_ 150,且當有必要時,可選擇性地 將該第二測試裝備150包含在該系統1〇〇中。 該包裝裝備160可包I —藉由該第一測試震備12〇、 該第二測試裝it 140與該第三測試裝備15◦在該至少— psu之中判定為正常狀態的PSUe尤其是,該包襄震備 可用靜電消散乙烯基(statie dissipative vinyl)包農該 PSU’且可在包含發膠的包&盒中的事先裝置的單元 (preset unit)中儲存該已包裴的psu。舉例來說,該包 裝備160可將四個PSU儲存在具有二臺(stage)的單—包^ 盒中,使得該二臺之各者可儲存二psu。在包裝製程期間: 該包裝裝備160可判定該包裝盒中的psu的數量、使用 將水氣從該包裝盒移除的矽膠是否包含在包裝盒中、兮: 電消散乙烯基是否使用來包裝、錯誤是否發生在波來^静 心(pearl ite core)中等等。 才亥 第2圖係說明第1圖的PSU製造裝備110的級構的 塊圖。 、方 參照第2圖,該PSU製造裝備110可包含焊膏數 置(solder paste applying apparatus)112、晶片元件: 裝裝置113與回焊裝置1U。 > 8 9s456 201231987 該焊膏敷設裝置112可在包含在PSU中的電路板lu 上敷設焊膏。尤其是,當將焊料遮罩(未圖示)置於該電路 板111上時,該焊膏敷設裝置112可藉由印刷該焊膏來敷 設該焊膏。 該晶片元件安裝裝置113可使用該焊膏將至少一晶片 元件安裝在該電路板U1上。在此例子中,該晶片元件可 例如為需要來使該電路板i丨i起P s U作用的被動元件(例如 電阻電容(RC)電路元件、二極體元件等等)。 該回焊裝置114可使該焊膏在預定溫度回焊、且可將 該晶片元件連接至該電路板111。 一般來忒,可藉由將晶片元件安裝在該電路板111的 表面上來製造PSU,但是不以此為限。因此,可藉由將晶 片元件女裳在該電路板111的另一表面上來製造PSU,且 當有必要時也可安裝在該電路板lu的該表面。在此例子 中,為了在該電路板ill的另一表面上安裝該晶片元件, 該PSU製造裝備110可進一步包含另一焊膏敷設裝置、另 一晶片元件安裝裝置、與另一回焊裝置。 第3圖係說明第1圖的第一測試裝備i 2〇的組構的方 塊圖。 參照第3圖,該第一測試裳備12〇可包含共面檢查裝 置(coplanarity inspecting a卯aratus)121、波焊裝置 (wave soldering apparatus)122、焊料修正裝置 123、元 件測試裝置124、電路板測試裝置125、與PSU測試裝置 126。 9 95456S 95456 201231987 According to a further aspect of the present invention, there is provided a control module comprising: an input unit configured to receive an information input required to generate a dimming control signal, the dimming control signal being used to control at least The operation of a PSU, the transmitting Is is used to transmit the dimming control signal to the at least one PSU; the signal receiver is configured to receive the frequency signal, the frequency signal corresponding to the at least one light source Detecting light; the first controller is configured to generate the dimming control signal based on the received information; and the second controller is configured to measure the flash of the at least one light source by using the received frequency signal And changing the at least one PSU based on a flicker measurement obtained by measuring the flicker. [Embodiment] The present invention will now be described in detail with reference to the preferred embodiments of the invention. The illustrative embodiments are described below to explain the present invention by referring to the figures. Fig. 1 is a block diagram showing a system 1 (9) for manufacturing a power supply unit (PSU) according to an embodiment of the present invention. Referring to FIG. 1 'the system 1 〇〇 may include a psu manufacturing equipment 11 〇, a first test equipment 120, an aging test equipment 130, a second test equipment 140, a third test equipment 150, and packaging equipment ( Packing equiPment)16〇. The PSU manufacturing equipment can provide at least one PSU. The at least one PSU can supply a dimming signal to at least one light source' and can cause the at least one light source to emit light. For example, when the PSU is not functioning properly, the light source receiving the tone signal supplied from the PSU may not function properly. Therefore, when the PSU manufacturing apparatus 110 manufactures a PSU, a test can be made to determine whether the PSU is operating normally. The first test equipment 120 can perform a first test for the electrical characteristics of the at least one pSU, the at least one psu being provided by the psu manufacturing equipment 11(). The burn-in test equipment 130 can test the at least one PSU in a severe environment. The aging test equipment 130 can generate an aging signal (the aging condition and the aging time of the aging signal package s pre-set or input), and can perform the aging test on the psu in the aging condition during the aging time according to the aging signal. . The second test equipment 14 〇 can detect the light emitted from the at least one light source, measure the flicker of the at least-light source, and perform the at least-PSU according to the flicker measurement result obtained by measuring the flicker The second test of the state 0 is that the burn-in test equipment 130 is distributed from the second test equipment 140, as shown in FIG. 1, however, the burn-in test equipment 13 can include the second test equipment. In other words, the aging test can be performed, and then the second test set 40 is configured to perform the second measurement, i.e., the flicker is measured. Before the package 1 is determined by the first test equipment and the second test to be in the normal state of the psu, the third test:: the power consumption of the PSU, the output current of the PSU, The third test of the output voltage of p, the withstand voltage of the PSU (wi thstanding V. £ 95456 201231987 and at least the normal operation of the PSU). During the first test, the burn test and the second test The stress can be applied to the PSU belonging to each test environment. Since the stress can affect the electrical characteristics of the psu, the third test can be performed again when the first test, the burn test and the second test are completed. To test the electrical characteristics of the psu, the third test 150 may not be required, and the second test equipment 150 may optionally be included in the system when necessary. Package I - the PSUe determined to be in a normal state by the first test equipment, the second test equipment 140, and the third test equipment 15 该 among the at least - psu, in particular, the package Static dissipative vinyl can be used (statie dissi Pative vinyl can store the packaged psu in a pre-installation unit in a packet containing the hairspray. For example, the package device 160 can have four PSUs. Stored in a single-package box with two stages, so that each of the two sets can store two psu. During the packaging process: the packaging equipment 160 can determine the number of psu in the package, the use will Whether the silicone removed from the package is contained in the package, 兮: Whether the electric dissipating vinyl is used for packaging, whether the error occurs in the pearl ite core, etc. A block diagram of the stage configuration of the PSU manufacturing equipment 110 of Fig. 1 will be described. Referring to Fig. 2, the PSU manufacturing equipment 110 may include a solder paste applying apparatus 112, a wafer component: a mounting device 113 and a back Welding device 1U. > 8 9s456 201231987 The solder paste laying device 112 can apply solder paste on the circuit board lu included in the PSU. In particular, when a solder mask (not shown) is placed on the circuit board 111 When the solder paste laying device 112 can print the solder The solder paste is applied by the paste. The wafer component mounting device 113 can use the solder paste to mount at least one wafer component on the circuit board U1. In this example, the wafer component can be, for example, required to make the circuit board i a passive component that acts as a P s U (eg, a resistive capacitor (RC) circuit component, a diode component, etc.). The reflow device 114 allows the solder paste to be reflowed at a predetermined temperature and the wafer component can be connected To the circuit board 111. Generally, the PSU can be manufactured by mounting the wafer component on the surface of the circuit board 111, but is not limited thereto. Therefore, the PSU can be fabricated by placing the wafer element on the other surface of the circuit board 111, and can also be mounted on the surface of the circuit board lu when necessary. In this example, to mount the wafer component on the other surface of the circuit board ill, the PSU fabrication equipment 110 may further include another solder paste application device, another wafer component mounting device, and another reflow device. Fig. 3 is a block diagram showing the configuration of the first test equipment i 2 第 of Fig. 1. Referring to FIG. 3, the first test device 12 can include a coplanarity inspecting device 121, a wave soldering device 122, a solder correction device 123, a component testing device 124, and a circuit board. Test device 125, and PSU test device 126. 9 95456
S 201231987 該共面檢查裝置121可檢查至少一 psu的各者的組件 (component)的共面。尤其是,該共面檢查裝置ι21可放射 光線至該至少一 PSU、可接收反射光、且可檢查該組件的 共面(特別是該焊膏的共面)。在此,可放射雷射光、X光 等等至該至少一 PSU。 該波焊裝置122可基於組件是否抬起(iift)來再焊 (re-solder)該焊膏。舉例來說,當該共面檢查裝置121 判定psu的組件已抬起時,可再焊敷設至該Psu的焊膏。 該焊膏修正裝置123可再接觸被附接至該再焊焊膏的 組件’且可消除組件抬起現象。 、 該元件測試装置124可測試被安裝在該電路板Ui上 的至少一晶片元件的電性特性。 該電路板測試裝置125可測試該電路板m ,Μ:。 电性特 該PSU測試裝置126可測試至少一 psu的已消乾 輸出電流、輸出電壓、耐受電壓以及該至少 仏、 常運作的至少一者。 ου疋否正 第4圖係說明第i圖的第二測試裝備14〇 塊圖。可將第4圖的第二測試裝備14〇使為=的方 裝置’以測量回應供應自PSU的調光訊號而運量 閃變、且以判定該psu的狀態。在本說明書中,㈣源的 試裝備140可視為閃變測量裝置140。 ^ —測 參照第4圖,該閃變測量裝置14〇可包含 輸出模組⑷、光源魔、光_模組 ^ j入/ 訊諕處理模 95456 201231987 組143、控制模組144、交流電(AC)電泝罝-,t 原早70 145、與直流 電(DC)電源單元142C。 該訊號輸入/輸出模組141可電性連接至使用來測量 閃變的PSU 146 ^此外,該訊號輸入/輪出模組141可接收 來自外部裝置或來自包含在該閃變測量裴置14〇中的其他 元件的訊號,或可輸出該PSU 146的訊號。為了接收^輸 出訊號,該訊號輸入/輸出模組141可包含接觸終端、及使 用來電性連接至該PSU 146的訊號輸入/輸出終端。 此外’該訊號輸入/輸出模組141可被包含在提供該 PSU 146要安裝的空間的托盤(tray)(未圖示)中。尤其是, 當該接觸終端與該訊號輸入/輸出終端放置在該空間的内 侧與外側時’及當該PSU 146安裝在該空間中時,該托盤 可使該接觸終端能夠連接至該PSU 146。因此,該訊號輸 入/輸出模組141可經由該訊號輸入/輸出終端將訊號轉換 成該PSU 146、或可從該PSU 146輸出訊號至該外部裴置。 該托盤可具有使複數PSU能同時被安裝的結構、或使 單一 PSU被安裝的結構。當該托盤具有使單一 PSU被安裝 的結構時,該閃變測量裝置14〇可包含複數托盤。 安裝在該托盤中的該PSU 146可憑藉該訊號輸入/輸 出模組141來接收包含調光控制訊號的各種訊號、且可輪 出調光訊號。 該PSU 146可憑藉該訊號輸入/輸出模組141藉由接 收供應自該AC電源單元145的AC電源來運作。 該PSU 146可供應調光訊號至該光源142A。該調光訊 11 95456 201231987 號可使該光源142A發光。尤其是,當經由該訊號輸入/輪 出模組141接收來自該控制模組144的該調光控制訊號 時’該PSU 146可基於該調光控制訊號來供應該調光訊號 至該光源142A。 該光源142A、該光偵測模組142B、與該DC電源單元 142C可安裝在外罩(housing)142内。 當從該PSU 146接收該調光訊號時,該光源142A可 發光。致使發光的該光源142A可包含,例如,發光二極體 (LED)、螢光燈、燈等等。 該光偵測模組142B可藉由接收供應自該DC電源單元 142C的DC電源來運作。該光偵測模組142B可置於該光源 142A上方’以偵測從該光源142A發出的光並偵測該發出 光的強度(intensity)。 該訊號處理模組143可將該光偵測模組142B所偵測 到的光轉換成電訊號、並可處理該電訊號。換句話說,該 訊號處理模組143可將已偵測光處理成為可被該控制模組 144所處理的訊號。 該控制模組144可產生調光控制訊號、且可基於該已 產生的調光控制訊號來控制該PSU 146。 此外’該控制模組144可使用該訊號處理模組143所 處理的電訊號來測量該光源142A的閃變。該控制模組144 可基於藉由測量該光源142A的閃變所獲得的閃變測量結 果來測試該PSU 146。 發生在該光源142A中的閃變現象可被該PSU 146的 12 95456 201231987 狀態所影響,且因此該控制模組144可測量該光源屢 的問變,並可狀該PSU 146的狀態。為了 PSH46的狀態,1將正常運作的標準光源使用為該絲 142A。 該控制模組144可基於該閃變測量結果來判定詨ρπ 146是否在正常狀態或*正常狀態、且可財與管理藉由 判定該PSU 146的狀態所獲得的結果資料。使用者可其於 該結果駟料確s忍該PSU 146的狀態,並可在運送產σ之々 挑出瑕疵產品。 第5圖係說明根據本發明的另一實施例的閃變測量裝 置200的組構的方塊圖。在下文中,第4圖的閃變測量裝 置140的組構與運作將進一步參照第5圖來描述。 參照第5圖’ §亥閃變測量裝置2〇〇可包含第一 psu 211、苐 一 PSU 212、第二 PSU 213、第四 psu 214、第五 PSU 215、苐六 PSU 216、第七 PSU 217、第八 psu 218、 第一光源22卜第二光源222、第三光源223、第四光源224、 第五光源225、第六光源226、第七光源227、第八光源228、 第一光偵測模組231、第二光偵測模組232、第三光偵測模 組233、第四光偵測模組234、第五光偵測模組235、第六 光偵測模組236、第七光偵測模組237、第八光偵測模組 238、訊號處理模組240、控制模組250、與AC電源單元 260。 該AC電源單元260可供應電源以驅動該第一 PSU 211 至該第八PSU 218。S 201231987 The coplanar inspection device 121 can check the coplanarity of the components of at least one psu. In particular, the coplanar inspection device ι21 can emit light to the at least one PSU, can receive reflected light, and can inspect the coplanar face of the component (particularly the coplanarity of the solder paste). Here, laser light, X-rays, and the like may be radiated to the at least one PSU. The wave soldering device 122 can re-solder the solder paste based on whether the component is uplifted. For example, when the coplanar inspection device 121 determines that the components of the pSU have been lifted, the solder paste to the Psu can be re-welded. The solder paste correcting device 123 can re-contact the component attached to the reflow solder paste and can eliminate the component lift phenomenon. The component testing device 124 can test the electrical characteristics of at least one of the wafer components mounted on the circuit board Ui. The board test device 125 can test the board m, Μ:. Electrically Special The PSU test set 126 can test at least one of the psu's depleted output current, output voltage, withstand voltage, and at least one of the at least 仏, normally operating. Ου疋No Positive Fig. 4 is a block diagram showing the second test equipment of Fig. i. The second test equipment 14 of Fig. 4 can be made to measure the flicker in response to the dimming signal supplied from the PSU, and to determine the state of the psu. In the present specification, the (four) source test equipment 140 can be regarded as the flicker measuring device 140. ^ - Measurement Referring to FIG. 4, the flicker measuring device 14A may include an output module (4), a light source magic, a light module, a signal processing module 95456, a 201231987 group 143, a control module 144, and an alternating current (AC). ) Electrical traceback -, t original 70 145, and direct current (DC) power unit 142C. The signal input/output module 141 can be electrically connected to the PSU 146 used to measure the flicker. Further, the signal input/rounding module 141 can receive from the external device or from the flicker measurement device. The signal of the other components in the signal, or the signal of the PSU 146 can be output. In order to receive the output signal, the signal input/output module 141 can include a contact terminal and a signal input/output terminal that is electrically connected to the PSU 146. Further, the signal input/output module 141 can be included in a tray (not shown) that provides a space in which the PSU 146 is to be installed. In particular, the tray enables the contact terminal to be connected to the PSU 146 when the contact terminal and the signal input/output terminal are placed on the inner side and the outer side of the space' and when the PSU 146 is installed in the space. Therefore, the signal input/output module 141 can convert the signal to the PSU 146 via the signal input/output terminal, or can output a signal from the PSU 146 to the external device. The tray may have a structure in which a plurality of PSUs can be mounted at the same time, or a structure in which a single PSU is mounted. When the tray has a structure in which a single PSU is mounted, the flicker measuring device 14A may include a plurality of trays. The PSU 146 installed in the tray can receive various signals including the dimming control signal by the signal input/output module 141, and can rotate the dimming signal. The PSU 146 can be operated by the signal input/output module 141 by receiving AC power supplied from the AC power unit 145. The PSU 146 can supply a dimming signal to the light source 142A. The dimming signal 11 95456 201231987 can cause the light source 142A to emit light. In particular, when the dimming control signal from the control module 144 is received via the signal input/rounding module 141, the PSU 146 can supply the dimming signal to the light source 142A based on the dimming control signal. The light source 142A, the light detecting module 142B, and the DC power unit 142C can be mounted in a housing 142. When the dimming signal is received from the PSU 146, the light source 142A can illuminate. The light source 142A that causes illumination may include, for example, a light emitting diode (LED), a fluorescent lamp, a lamp, and the like. The light detecting module 142B can be operated by receiving DC power supplied from the DC power unit 142C. The light detecting module 142B can be placed above the light source 142A to detect light emitted from the light source 142A and detect the intensity of the emitted light. The signal processing module 143 can convert the light detected by the light detecting module 142B into an electrical signal and can process the electrical signal. In other words, the signal processing module 143 can process the detected light into a signal that can be processed by the control module 144. The control module 144 can generate a dimming control signal and can control the PSU 146 based on the generated dimming control signal. In addition, the control module 144 can measure the flicker of the light source 142A by using the electrical signal processed by the signal processing module 143. The control module 144 can test the PSU 146 based on the flicker measurement results obtained by measuring the flicker of the light source 142A. The flicker phenomenon occurring in the light source 142A can be affected by the state of the PSU 146 12 95456 201231987, and thus the control module 144 can measure the repeated changes in the light source and can characterize the state of the PSU 146. For the state of the PSH46, 1 a standard light source that operates normally is used as the wire 142A. The control module 144 can determine whether the 詨ρπ 146 is in a normal state or a normal state based on the flicker measurement result, and can manage and obtain the result data obtained by determining the state of the PSU 146. The user can confirm the state of the PSU 146 and can pick out the product after the delivery of the σ. Figure 5 is a block diagram showing the configuration of a flicker measuring device 200 in accordance with another embodiment of the present invention. Hereinafter, the configuration and operation of the flicker measuring device 140 of Fig. 4 will be further described with reference to Fig. 5. Referring to FIG. 5, the § hai flicker measuring device 2 〇〇 may include a first psu 211, a first PSU 212, a second PSU 213, a fourth psu 214, a fifth PSU 215, a sixth PSU 216, and a seventh PSU 217. , the eighth psu 218, the first light source 22, the second light source 222, the third light source 223, the fourth light source 224, the fifth light source 225, the sixth light source 226, the seventh light source 227, the eighth light source 228, the first light detection The test module 231, the second light detecting module 232, the third light detecting module 233, the fourth light detecting module 234, the fifth light detecting module 235, and the sixth light detecting module 236, The seventh light detecting module 237, the eighth light detecting module 238, the signal processing module 240, the control module 250, and the AC power unit 260. The AC power unit 260 can supply power to drive the first PSU 211 to the eighth PSU 218.
S 13 95456 201231987 雖然未顯示在第5圖中,該第一 PSU 211至該第八PSU 218可接收來自該AC電源單元260的電源,其係經由分別 連接至該第一 PSU 211至該第八PSU 218的訊號輸入/輸出 模組。 該第一 PSU 211至該第八PSU 218可分別連接至該第 一光源211至該第八光源228,以單獨供應調光訊號至該 第一光源211至該第八光源228。可使用該調光訊號以調 整該第一光源211至該第八光源228的照光強度或亮度。 該調光訊號可為DC電壓訊號、脈衝寬度調變(pulse width modulation,簡稱PWM)訊號、與三極管交流(triode alternating current,簡稱 TRIAC)訊號中的一者。 該第一光源221至該第八光源228可發光,以回應供 應自該第一 PSU 211至該第八PSU 218的調光訊號。 該第一光偵測模組231至該第八光偵測模組238可置 於該第一光源221至該第八光源228上,以分別偵測發自 該第一光源221至該第八光源228的光。尤其是,該第一 光偵測模組231至該第八光偵測模組238可偵測發自該第 一光源221至該第八光源228的光、且可偵測該光的強度。 舉例來說,可將光二極體使用為該第一光偵測模組231至 第八光偵測模組238。 雖然未顯示在第5圖,可將DC電源單元連接至該第 一光偵測模組231至該第八光偵測模組238之各者,且可 供應DC電源至該第一光偵測模組231至該第八光偵測模組 238。 ” 95456 14 201231987 該訊號處理模組240可接收來自該第一光偵测模組 231至該第八光偵測模組238的已偵測光、可將該已接收 光轉換成電訊號、且可處理該電訊號。 該訊號處理模組240可包含訊號轉換器241、低帶通 濾波器(low band pass filter)242、類比轉數位轉換器 (analog-to-digital coverter,簡稱 ADC)243 與快速傅立 葉變換(fast Fourier transfer,簡稱 FFT)單元 244。 該訊號轉換器241可將由該第一光偵測模組231至第 八光偵測模組238所偵測的光轉換成電訊號。該電訊號可 為對應至該光的強度的頻率波形訊號。 該低帶通濾波器242可在包含在該電訊號中的高頻气 號上進行滤波,且可使得低頻訊號通過,以從該電訊麥移 除雜訊。 該ADC 243可將低頻訊號轉換成數位訊號。 該FFT單元244可在從該ADC 243輸出的數位訊號上 進行FFT ’且可產生頻率訊號。因此,該頻率訊號可包含 AC組件與DC組件。 該控制模組250可包含輸入單元251、訊號發射器 (signal transmitter)252、訊號接收器253、儲存媒體 254、顯示單元255、第一控制器256與第二控制器257。 該輸入單元251可接收被需要來產生老化訊號的資訊 與被需要來產生調光控制訊號的資訊的輸入,且可接收資 料讀取命令的輸入。 該訊號發射器252可發射預定訊號至該第一 psu 2ΠS 13 95456 201231987 Although not shown in FIG. 5, the first PSU 211 to the eighth PSU 218 can receive power from the AC power unit 260 via respective connections to the first PSU 211 to the eighth Signal input/output module of PSU 218. The first PSU 211 to the eighth PSU 218 can be respectively connected to the first light source 211 to the eighth light source 228 to separately supply the dimming signal to the first light source 211 to the eighth light source 228. The dimming signal can be used to adjust the illumination intensity or brightness of the first source 211 to the eighth source 228. The dimming signal can be one of a DC voltage signal, a pulse width modulation (PWM) signal, and a triode alternating current (TRIAC) signal. The first light source 221 to the eighth light source 228 can emit light in response to the dimming signal supplied from the first PSU 211 to the eighth PSU 218. The first light detecting module 231 to the eighth light detecting module 238 can be disposed on the first light source 221 to the eighth light source 228 to detect the first light source 221 to the eighth Light from source 228. In particular, the first light detecting module 231 to the eighth light detecting module 238 can detect light emitted from the first light source 221 to the eighth light source 228 and can detect the intensity of the light. For example, the photodiode can be used as the first photodetecting module 231 to the eighth photodetecting module 238. Although not shown in FIG. 5, the DC power unit can be connected to each of the first light detecting module 231 to the eighth light detecting module 238, and DC power can be supplied to the first light detecting. Module 231 to the eighth light detecting module 238. 95456 14 201231987 The signal processing module 240 can receive the detected light from the first light detecting module 231 to the eighth light detecting module 238, convert the received light into an electrical signal, and The signal processing module 240 can include a signal converter 241, a low band pass filter 242, an analog-to-digital coverter (ADC) 243 and A fast Fourier transfer (FFT) unit 244. The signal converter 241 converts light detected by the first to eighth light detecting modules 231 to 238 into electrical signals. The electrical signal can be a frequency waveform signal corresponding to the intensity of the light. The low bandpass filter 242 can filter on the high frequency air number included in the electrical signal, and can pass the low frequency signal to the telecommunication. The 243 can convert the low frequency signal into a digital signal. The FFT unit 244 can perform the FFT on the digital signal output from the ADC 243 and can generate a frequency signal. Therefore, the frequency signal can include AC. Component The control module 250 can include an input unit 251, a signal transmitter 252, a signal receiver 253, a storage medium 254, a display unit 255, a first controller 256, and a second controller 257. The input The unit 251 can receive the information needed to generate the aging signal and the information needed to generate the dimming control signal, and can receive the input of the data reading command. The signal transmitter 252 can transmit the predetermined signal to the first psu. 2Π
S 95456 15 201231987 至該第八PSU 218。 該訊號接收器253可接收來自該訊號處理模組240的 頻率訊號。 該儲存媒體254可儲存資訊輸入螢幕(inf〇rmati〇n input screen)、資訊輸出螢幕與各種資料。 該顯示單元255可顯示該資訊輸入螢幕、資訊輸出螢 幕與各種資料。 當用以產生老化訊號的資訊輸入螢幕顯示在該顯示 單元255上時’且當憑藉該輸入單元251來輸入老化條件 與老化時間時’該第一控制器256可產生包含該已輸入老 化條件與該已輸入老化時間的老化訊號。 該第一控制器256可基於該已產生老化訊號來控制該 第一 PSU 211至該第八PSU 218的老化運作。尤其是,該 第一控制器256可控制該訊號發射器252以發射該老化訊 號至該第一 PSU 211至該第八PSU 218。 該第一 PSU 211至該第八PSU 218可接收該老化訊號, 且可在該老化時間期間進行該老化條件中的老化運作。舉 例來說,當將「4(TC」與「10分鐘」設定為該老化條件與 老化時間時,該第一 PSU 211至該第八PSU 218可進行該 老化運作,且同時維持40°C的溫度10分鐘。因此,該第 一 PSU 211至該第八PSU 218可各包含發光組構與溫度感 測器。此外,除了溫度之外,該老化條件可包含高電壓或 震動。 當用以產生調光控制訊號的資訊輸入螢幕顯示在該 16 95456 201231987 顯示單元255上時,且當憑藉該輸入單元251輸入資訊片 段時’該第一控制器256可產生包含該資訊片段的調光控 制訊號。 可單獨為了該第一 PSU 211至該第八PSU 218之各者 產生該調光控制訊號’且該調光控制訊號可包含與該第一 PSU 211至該第八psu 218相關聯的通道資訊。此外,該 調光控制訊號可包含調光訊號範圍,其中,調光訊號是供 應至該第一 PSU 211至該第八PSU 218之各者,調光訊號 間隔(interval)是調整在該調光訊號範圍與週期内,該週 期是調光訊號要供應其中且對應至該調光訊號間隔。 該第一控制器256可基於該已產生的調光控制訊號來 控制該第一 PSU 211至該第八PSU 218。 該第一 PSU 211至該第八PSU 218可接收調光控制訊 號、可在週期期間調整調光訊號間隔在調光訊號範圍内, 且可分別供應調光訊號至該第一光源221至該第八光源 228。 舉例來說,當該第一 PSU 211的第一通道資訊的調光 訊號範圍、調光訊號間隔與週期分別設定成〇. lv至1〇v 的範圍、0.5V與15秒時’該第一 psu 211可調整該調光 訊號間隔以在〇. IV至10V的範圍中每15秒增加〇. 5V,且 可供應DC電壓訊號至該第一光源21卜該第一光源211可 進行調光運作以每15秒改變照度(1 um i nance),以回應該 DC電壓訊號。 該第二控制器257可測量該第一光源221至該第八光 17 95456 201231987 源228之各者的閃變,且可基於閃變測量結果來判定該第 一 PSU 211至該第八PSU 218的狀態。 當該訊號接收器253接收該頻率訊號時,該第二控制 器257可從該頻率訊號分離出該AC組件與該DC組件、可 計算AC組件與DC組件的比例、且可測量該第一光源221 至該第八光源228之各者的閃變。 該頻率訊號可包含與該第一光源221至該第八光源 228相關聯的辨識資訊。該第二控制器257可在該頻率訊 號中驗證該辨識資訊、可將該第一光源221至該第八光源 228之各者的頻率訊號分類、且可將該已分類頻率訊號分 為該AC組件與DC組件。 此外,該第二控制器257可計算該AC組件與DC組件 的比例、且可測量該第一光源221至該第八光源228之各 者的閃變。該比例可使用下列方程式1或2來計算。換句 話說,可使用下例方程式1或2來測量該第一光源221至 該第八光源228之各者的閃變: [方程式1]S 95456 15 201231987 to the eighth PSU 218. The signal receiver 253 can receive the frequency signal from the signal processing module 240. The storage medium 254 can store an information input screen (inf〇rmati〇n input screen), an information output screen and various materials. The display unit 255 can display the information input screen, the information output screen and various materials. When the information input screen for generating the aging signal is displayed on the display unit 255 'and when the aging condition and the aging time are input by the input unit 251, the first controller 256 may generate the included aging condition and The aging signal of the aging time has been input. The first controller 256 can control the aging operation of the first PSU 211 to the eighth PSU 218 based on the generated aging signal. In particular, the first controller 256 can control the signal transmitter 252 to transmit the aging signal to the first PSU 211 to the eighth PSU 218. The first PSU 211 to the eighth PSU 218 can receive the aging signal, and the aging operation in the aging condition can be performed during the aging time. For example, when "4 (TC) and "10 minutes" are set as the aging condition and aging time, the first PSU 211 to the eighth PSU 218 can perform the aging operation while maintaining 40 ° C. The temperature is 10 minutes. Therefore, the first PSU 211 to the eighth PSU 218 may each include a light-emitting structure and a temperature sensor. Further, in addition to temperature, the aging condition may include high voltage or vibration. When the information input screen of the dimming control signal is displayed on the display unit 255 of the 16 95456 201231987, and when the information piece is input by the input unit 251, the first controller 256 can generate a dimming control signal including the information piece. The dimming control signal ' can be generated separately for each of the first PSU 211 to the eighth PSU 218 and the dimming control signal can include channel information associated with the first PSU 211 to the eighth pSU 218. In addition, the dimming control signal may include a dimming signal range, wherein the dimming signal is supplied to each of the first PSU 211 to the eighth PSU 218, and the dimming signal interval is adjusted in the dimming News The first controller 256 can control the first PSU 211 to the eighth based on the generated dimming control signal during the range and the period, where the dimming signal is to be supplied and corresponding to the dimming signal interval. The first PSU 211 to the eighth PSU 218 can receive the dimming control signal, can adjust the dimming signal interval within the dimming signal range during the period, and can respectively supply the dimming signal to the first light source 221 To the eighth light source 228. For example, the dimming signal range, the dimming signal interval, and the period of the first channel information of the first PSU 211 are respectively set to a range of 〇. lv to 1〇v, 0.5V and At 15 seconds, the first psu 211 can adjust the dimming signal interval to increase 〇. 5V every 15 seconds in the range of IV. IV to 10V, and can supply a DC voltage signal to the first light source 21 The light source 211 can perform a dimming operation to change the illuminance every 15 seconds to respond to the DC voltage signal. The second controller 257 can measure the first light source 221 to the eighth light 17 95456 201231987 Source 228 Flashover of each of them, and can be based on flicker measurement The state of the first PSU 211 to the eighth PSU 218 is determined. When the signal receiver 253 receives the frequency signal, the second controller 257 can separate the AC component and the DC component from the frequency signal. Calculating a ratio of the AC component to the DC component, and measuring a flicker of each of the first light source 221 to the eighth light source 228. The frequency signal may include a first light source 221 to the eighth light source 228 Identify information. The second controller 257 can verify the identification information in the frequency signal, classify the frequency signals of each of the first light source 221 to the eighth light source 228, and divide the classified frequency signal into the AC. Components and DC components. In addition, the second controller 257 can calculate the ratio of the AC component to the DC component and can measure the flicker of each of the first light source 221 to the eighth light source 228. This ratio can be calculated using Equation 1 or 2 below. In other words, the flicker of each of the first light source 221 to the eighth light source 228 can be measured using Equation 1 or 2 below: [Equation 1]
Flicker Ratio (〇/〇) =^xl〇〇 [方程式2 ]Flicker Ratio (〇/〇) =^xl〇〇 [Equation 2]
Flicker Ratio (dB) =101og(^^™S) 在方程式1與2中,ACrms表示AC組件的峰值,且 DC表示DC組件。由該方程式1與2所計算的閃變比例可 18 95456 201231987 用「%」或「dB」來表示。 當使用方程式1或2所測量的閃變是小於預定閾值時, 該第二控制器257可判定該第一 PSU 211至該第八PSU 218 是在正常狀態。 當該已測量閃變是等於或大於該預定閾值時,該第二 控制器257可判定該第一 PSU 211至該第八PSU 218是在 不正常狀態。 該第二控制器257可使用單一 PSU的單一組、單一光 源與單一光偵測模組來測量閃變,且可基於閃變測量結果 來判定對應PSU的狀態。舉例來說,可使用第5圖的一組 該第一 PSU 211、第一光源221與第一光偵測模組231來 測量該第一光源221的閃變。 當判定該第一 PSU 211至該第八PSU 218的狀態時, 該第二控制器257可藉由匹配發射至該第一 PSU 211至該 第八PSU 218的調光控制訊號來產生結果資料、產生對應 至由該第一光偵測模組231至該第八光偵測模組238所偵 測的光的頻率訊號、產生該第一光源221至該第八光源228 的閃變測量結果、以及產生該第一 PSU 211至該第八pSU 218的已判定狀態。 該第二控制器257可基於資料產生時間、pSlJ的規格、 光源的規格專來分類結果資料’且可將該已分類結果資料 儲存在該儲存媒體254中。 此外’當從該輸入單元251接收到讀取結果資料的命 令時’該第二控制器257可從該儲存媒體254讀取對應至Flicker Ratio (dB) =101og(^^TMS) In Equations 1 and 2, ACrms represents the peak of the AC component and DC represents the DC component. The flicker ratio calculated by Equations 1 and 2 can be expressed as "%" or "dB" by 18 95456 201231987. When the flicker measured using Equation 1 or 2 is less than a predetermined threshold, the second controller 257 may determine that the first PSU 211 to the eighth PSU 218 are in a normal state. When the measured flicker is equal to or greater than the predetermined threshold, the second controller 257 may determine that the first PSU 211 to the eighth PSU 218 are in an abnormal state. The second controller 257 can measure the flicker using a single group, a single optical source, and a single photodetection module of a single PSU, and can determine the state of the corresponding PSU based on the flicker measurement result. For example, a set of the first PSU 211, the first light source 221, and the first light detecting module 231 of FIG. 5 can be used to measure the flicker of the first light source 221. When determining the state of the first PSU 211 to the eighth PSU 218, the second controller 257 may generate a result data by matching the dimming control signals transmitted to the first PSU 211 to the eighth PSU 218, Generating a frequency signal corresponding to the light detected by the first light detecting module 231 to the eighth light detecting module 238, generating a flicker measurement result of the first light source 221 to the eighth light source 228, And determining the determined state of the first PSU 211 to the eighth pSU 218. The second controller 257 may classify the result data 'based on the data generation time, the specification of the pSlJ, the specification of the light source' and may store the classified result data in the storage medium 254. Further, when the command to read the result data is received from the input unit 251, the second controller 257 can read the correspondence from the storage medium 254 to
S 95456 19 201231987 該命令的結果資料,且可在該顯示單元255上顯示該讀取 結果資料。 該控制模組250可如同單一元件地包含在資料處理裝 置中’例如電腦’或可如分離模組地實施該控制模組250。 如上所述’第5圖的閃變測量裝置200可供應調光訊 號至該第一光源221至該第八光源228,使得可基於預定 閾值來自動測量閃變。因此,可基於閃變測量結果來精確 判定該第一 PSU 211至該第八PSu 218的狀態。 此外’該第—PSU 211至該第八PSU 218的已判定狀 邊可用可項形式來儲存與管理,且因此較容易使用該結果 資料。 第6圖係說明根據本發明的另一實施例的閃變測量裝 置300的外部的結構的圖式。 第6圖的該閃變測量裝置300可包含第一 PSU 311、 第二 PSU 312、第三 pSU 313、第四 psu 314、第五 psu 315、 第六PSU 316、第七psu 317、第八PSU 318、第一外罩32卜 第二外罩322、第三外罩323、第四外罩324、第五外罩325、 第六外罩326、第七外罩327、第八外罩328、訊號處理模 組330、控制模組340、顯示裝置35〇與AC電源單元36〇。 5亥第一外罩321至該第八外罩328之各者可包含至少 一光源與光偵測模組。該至少一光源可裝載在該第一外罩 321至5亥第八外罩328之各者中,且可使用來測量閃變。 可使用該光偵測模組來偵測發射自該至少一光源的光。 該第一外罩321至該第八外罩328可具有相同結構。 20 95456 201231987 在下文中,將參照第7圖來描述該第一外罩32i的結構。 第7圖係說明第6圖的第一外罩321的結構的圖式。 如第7圖所示’該第一外罩321可包含裝載盒321A與外罩 蓋 321B。 該裝载盒321A可包含光源1〇裝載入的空間、及使用 來轉移從外部來源供應至該光源1〇的調光訊號的訊號線 (未圖示)。 該光源10可如同單獨元件、或封裝形式與模組形式 之其中一者地裝載在該装载盒321A。裝載在該第一外罩 321至s亥第八外罩328之各者的裝載盒中的光源的樣式或 類型可彼此相同或不同。 當該光源10裝載在該裝載盒321A中時,可設置該訊 號線以物理地連接至被包含在該光源10中的電極。 該外罩蓋321B可安裝在該裝載盒32iA上方、或可從 該裝載盒321A分離。雖然未顯示在第7圖中,具有可調整 高度的光偵測模組可包含在該外罩蓋321B中。尤其是,可 將該光偵測模組放置在該外罩蓋321B的側壁上,且可藉由 調整該光偵測模組的高度來調整在該光偵測模組與裝載在 該裝載盒中的光源10之間的距離。 可依據在該光偵測模組與該光源10之間的距離來變 化該光偵測模組的光偵測效能。舉例來說,當相較於在該 光偵測模組與該光源10之間的長距離來說,該距離是短的 時了測里咼照度。因此,為了防止不正確地測量照产, 可藉由基於裝载在該裝載盒321A +的光源10的形尺 21S 95456 19 201231987 The result data of the command, and the read result data can be displayed on the display unit 255. The control module 250 can be implemented as a single component in a data processing device, such as a computer, or can be implemented as a separate module. The flicker measuring device 200 of Fig. 5 as described above can supply a dimming signal to the first light source 221 to the eighth light source 228 so that the flicker can be automatically measured based on a predetermined threshold. Therefore, the state of the first PSU 211 to the eighth PSU 218 can be accurately determined based on the flicker measurement result. Further, the determined appearance of the first-PSU 211 to the eighth PSU 218 can be stored and managed in a form of an item, and thus the result data is easier to use. Fig. 6 is a view for explaining the structure of the exterior of the flicker measuring device 300 according to another embodiment of the present invention. The flicker measuring apparatus 300 of FIG. 6 may include a first PSU 311, a second PSU 312, a third pSU 313, a fourth psu 314, a fifth psu 315, a sixth PSU 316, a seventh psu 317, and an eighth PSU. 318, first outer cover 32, second outer cover 322, third outer cover 323, fourth outer cover 324, fifth outer cover 325, sixth outer cover 326, seventh outer cover 327, eighth outer cover 328, signal processing module 330, control mode Group 340, display device 35A and AC power unit 36A. Each of the first housing 321 and the eighth housing 328 may include at least one light source and a light detecting module. The at least one light source can be loaded in each of the first outer covers 321 to 5 and the eighth outer cover 328, and can be used to measure flicker. The light detecting module can be used to detect light emitted from the at least one light source. The first outer cover 321 to the eighth outer cover 328 may have the same structure. 20 95456 201231987 Hereinafter, the structure of the first outer cover 32i will be described with reference to FIG. Fig. 7 is a view for explaining the structure of the first outer cover 321 of Fig. 6. As shown in Fig. 7, the first outer cover 321 may include a loading case 321A and a cover 321B. The loading cassette 321A may include a space into which the light source 1 is loaded, and a signal line (not shown) for transferring a dimming signal supplied from an external source to the light source 1 . The light source 10 can be loaded in the loading cassette 321A as a separate component, or in the form of a package and a module. The pattern or type of light sources loaded in the loading cassettes of each of the first outer cover 321 to the eighth outer cover 328 may be the same or different from each other. When the light source 10 is loaded in the loading cassette 321A, the signal line can be set to be physically connected to the electrodes contained in the light source 10. The outer cover 321B may be mounted above or detachable from the loading case 32iA. Although not shown in Fig. 7, a light detecting module having an adjustable height may be included in the outer cover 321B. In particular, the photodetection module can be placed on the sidewall of the cover 321B, and can be adjusted in the photodetection module and loaded in the loading cartridge by adjusting the height of the photodetection module. The distance between the light sources 10. The light detecting performance of the light detecting module can be changed according to the distance between the light detecting module and the light source 10. For example, when the distance is short compared to the long distance between the light detecting module and the light source 10, the illuminance is measured. Therefore, in order to prevent incorrect measurement of the photographing, the ruler 21 based on the light source 10 loaded on the loading cassette 321A + can be used.
S 95456 201231987 寸等地調整該光偵測模組的高度來調整在該光偵測模組與 光源ίο之間的距離。 ^ 該光偵測模組可包含使用來接收發自該光源1〇的光 的光二極體。該光二極體可藉由約3〇ν的電壓來運作。 當該外罩蓋321Β安裝在該裝載盒321Α上方時,可使 該第一外罩321的内部空間變暗,使得光可被阻擋。因此, 藉由防止已發出光漏到該第一外罩321之外、且同時防止 光進入該第一外罩321,光偵測模組僅可偵測從該光源1〇 發出的光。 §亥第一 PSU 311至該第八psu 318分別可配置在該第 一外罩321至該第八外罩328的前面、可連接至裝載在該 第一外罩321至該第八外罩328中的光源、且可供應調光 訊號至該第一外罩321至該第八外罩328。 該訊號處理模組330可位於中心,且可連接至裝载在 該第一外罩321至該第八外罩328中的光偵測模組,且可 接收由该光偵測模組所偵測的光。此外,該訊號處理模組 330可將已接收光轉換成電訊號、可處理該電訊號以產生 頻率訊號、且可發射該頻率訊號至該控制模組34〇。該頻 率訊號可含AC組件與DC組件。 該控制模組340可位於該訊號處理模組33〇的上方。 該控制模組340可產生調光控制訊號、可測量被裝載在該 第一外罩321至該第八外罩328中的各光源的閃變、且可 基於閃變測量結果來判定該第一 psu 311至該第八 的狀態。 95456 22 201231987 一此外,該控制模組340可儲存與管理在儲存媒體(未 圖不^中藉由判定該第一 PSU3U至該第人psu318的狀態 所獲件的結果資料、可讀取該結果資料以回應讀取命令、 且可在該顯示裝置上顯示該讀取結果資料。 已經插述該第一 PSU 311至該第八PSU 318、及該第 曰外罩321至該第八外罩328。然而,可不限制psu的數 量與外罩的數量,且因此可依據實施例來改變PSU的數量 與外罩的數量。 第8圖係說明根據本發明的實施例而使用來產生調光 控制訊號的資訊輸人營幕5GQ的圖式。第8圖的該資訊輸 ^螢幕500(在下文中稱為「輪入螢幕5〇〇」)可由第4圖的 該控制模組144、第5圖的該控制模組250、或第6圖的該 控制模組340來提供。 該輸入螢幕500可包含第一子螢幕51〇、第二子螢幕 520、第二子螢幕53〇、第四子螢幕54〇、儲存按鈕55〇、 執行按钮560與相關資訊按鈕57〇。 5亥第一子螢幕510至該第四子螢幕540可顯示光源的 輪入螢幕與閃變測量狀態。該輸入螢幕可使得使用來產生 調光控制訊號的資訊的輸入。舉例來說,該第一子螢幕51〇 至該第四子螢幕540可分別對應至該第一 pSu 311至該第 四PSU 314、及裝載在第6圖的該第一外罩321至該第四 外罩324中的光源。 該相關資訊按鈕570可包含自動按鈕571、輸入按鈕 572、搜尋按鈕573與手動按鈕574。可使用該自動按鈕571 23 95456 201231987 與该輸入按紐5 7 2來輪入杳% ^ 水翰入貝訊,該資訊係需要來產生調 控制訊號以控制該第_PSU 311至該第四psu似。 舉例來說’當使用者選擇該自動按紐571時,輸 幕500可輸入使用來產生調光控制訊號的資訊。此外,合 該使用者選擇該輸入按紐572時,該輸人螢幕_可顯: 個別資訊輸入視窗。舉例來說,該輸入螢幕5〇〇可用彈出 (popup)形式來顯示包含複數數入空間的資訊輸入視窗,該 輸入空間使得能夠輸人老化條件、老化時間、調光訊號範 圍、調光訊號間隔、時間週期等。 當使用來產生調光控制訊號的資訊片段是使用該自 動按鈕571《輸入按紐572來輪入時,及當該使用者選擇 該儲存按鈕550時,該控制模組144、25〇或34〇可在儲存 媒體中儲存資訊片段。 當使用來產生調光控制訊號的資訊片段是使用該自 動按鈕571或輸入按鈕572來輪入時,及當該使用者選擇 該執行按鈕560時,該控制模組144、25〇或34〇可產生調 光控制訊號、且可將該已產生調光控制訊號發射至該第— PSU 311 至該第四 PSU 314。 當該第一 PSU 311至該第四PSU 314基於該調光控制 訊號來分別供應調光訊號至該第一外罩321至該第四外罩 324中的光源時,該控制模組ι44、25〇或34〇可接收對應 至發射自各該光源的光的頻率訊號,且可測量閃變。可在 該第一子螢幕510至該第四子螢幕540上顯示測量閃變的 程序。因此’該使用者可驗證閃變測量狀態,並同時監控 24 95456 201231987 5亥第一子螢幕510至該第四子螢幕54〇。 可使用該搜尋按鈕573來搜尋閃變測量結果資料、及 藉由基於閃變測量結果來判定該第一 psu 311至該第四 PSU 314的狀態所獲得的結果資料。此外,可使用該手動 按鈕574以驗證各種設定與使用該輸入螢幕5〇〇的方法。 第8圖說明四個子螢幕(也就是第一子螢幕51〇至第 四子螢幕540),但不以此為限。因此,可依照psu的數量 與包含在閃變測量裝置中的外罩的數量來變化顯示在單一 螢幕上的子螢幕的數量。 苐9圖係說明根據本發明的實施例的製造psu的方法 的流程圖。可藉由第1圖的系統1〇〇來進行第g圖的方法。 參照第9圖,在運作中,該系統1〇〇可提供至少 一 PSU,該至少一 psu係使用來供應調光訊號至至少一光 源。 在運作620中’該系統1〇〇可進行該至少一 psu的電 性特性的第一測試。 在運作630中,該系統1〇〇可基於老化訊號而在老化 時間期間的老化條件中在該至少一 PSU上進行老化測試。 在此處’该老化訊號可包含該老化條件與老化時間。 在運作640中,該系統1〇〇可偵測從該至少一光源發 出的光、可測量該至少一光源的閃變、及可基於閃變測量 結果來進行該至少一 PSXJ的狀態的第二測試。 在該第二測試之後,在運作650中,該系統1〇〇可進 行用於PSU的至少一消耗電源、該PSU的輸出電流、該psu 25 95456 201231987 的輸出電壓、該PSU的耐受電壓、及該PSU是否正常運作 的第三測試。 在運作6 6 0中’該系統10 0可包裝由於在該至少一 psu 之中的該第一測試、第二測試與第三測試而判定是在正常 狀態中的PSU。 第10圖係進一步說明第9圖的運作610的流程圖。 可藉由第2圖所示的該PSU製造裝備11〇來進行第1〇圖的 運作611至613。 參照第10圖,在運作611中,該PSU製造裝備ι10 "T敷β又焊膏在該電路板ill上。 在運作612中,該PSU製造裝備11〇可使用該焊膏來 在該電路板111上安裝至少一晶片元件。 在運作613中,該PSU製造裝備11〇可使得該焊膏在 預定溫度回焊。 可進行運作611至613以藉由在該電路板hi的表面 (例如上表面)上附接晶片元件來製造PSU。舉例來說,當 晶片元件附接在該電路板U1的另一表面(例如下表面)上 時’可在另一表面上進行運作611至613。 第11圖係進一步說明第9圖的運作620的流程圖。 可藉由第3圖所示的第一測試裝備120來進行第η圖的運 作 621 至 627。 參照第11圖,在運作621中,該第一測試裝備120 可檢查該至少一 PSU之各者的組件的共面。 當具有已抬起組件的PSU係存在於運作622中時,該 26 95456 201231987 第一測試裝備120可在運作623中將敷設至該PSU的焊膏 再回焊。在運作624中,該第一測試裝備120可再接觸被 附接至該已再回焊焊膏的組件,且可消除組件抬起現象。 當具有已抬起組件的PSU不存在於運作622中時,或 當該組件抬起現象經由運作623與624而消除時,該第一 測試裝備120可在運作625中測試已安裝在該電路板111 上的至少一晶片元件的電性特性。換句話說,可測試該晶 片元件是否正常運作。 在運作626中,該第一測試裝備120可測試該電路板 111的電性特性。換句話說,可測試該電路板111是否正 常運作。 在運作627中,該第一測試裝備120可測試該PSU的 已消耗電能、該PSU的輸出電流、該PSU的輸出電壓、該 PSU的耐受電壓、與該PSU是否正常運作的至少一者。 該第一測試裝備120可藉由測試各該晶片元件與電路 板111的電性特性來單獨測試該晶片元件或該電路板111。 此外,該第一測試裝備120可藉由測試該PSU的電性特性 來測試在該晶片元件與該電路板111之間的相互(mutua 1) 電性特性。 第12圖係進一步說明第9圖的運作640的流程圖。可 藉由測量光源的閃變來進行運作640的第二測試以判定PSU 的狀態,該測量是藉由接收供應自該PSU的調光訊號。在 本說明書中,可進行第12圖的運作641至646以製造PSU。 可藉由第4圖所示的閃變測量裝置140來進行第12 s 27 95456 201231987 圖的運作641至646。 參照第12圖,在運作641中,該閃變測量裝置140 可基於該調光控制訊號來控制該PSU 146。該調光控制訊 號可包含通道資訊、調光訊號範圍、調光訊號間隔、與週 期’該通道資訊係與該PSU 146相關聯,該調光訊號範圍 中的調光訊號是要供應至該光源142A,該調光訊號間隔是 要被調整在該調光訊號範圍内,且該週期是該調光訊號要 供應的週期且對應至該調光訊號間隔。 在運作642中,該閃變測量裝置140可供應調光訊號 至該光源142A。具體而言,該閃變測量裝置140中的PSU 146可供應該調光訊號至該光源142A。在此,該調光訊號 可為DC電壓訊號、PWM訊號與TRIAC訊號中之一者。 在運作643中,該閃變測量裝置140可偵測來自該光 源142A的光,且可將該已偵測光轉換成電訊號。在運作 644中,該閃變測量裝置140可處理該電訊號。 在運作645中,該閃變測量裝置140可使用該已處理 電訊號來測量該光源142A的閃變。在運作646中,該閃變 測量裝置140可基於該閃變測量結果來判定該PSU 146的 狀態。 如上所述,可使用市售的PSU來進行閃變測量,可基 於閃變測量結果來判定該PSU的狀態,且可提供已判定在 正常狀態中的PSU。然而,製造PSU的方法不限於此,且 可進一步包含設計該PSU的電路與組合該PSU。此外,在 測量該閃變之後,該PSU製造方法可進一步包含包裝已判 28 95456 201231987 定在正常狀態中的PSU。 第13圖係說明根據本發明的另一實施例來藉由進行 第二測試(即測量閃變)的製造PSU的方法的流程圖。可藉 由第5圖的閃變測量裝置200或第6圖的閃變測量裝置300 來進行第13圖的方法。 在運作710中,該閃變測量裝置200或300可產生老 化訊號。當輸入例如老化條件或老化時間的資訊時,該閃 變測量裝置200或300可產生包含該老化條件與該老化時 間的老化訊號。 在運作715中,該閃變測量裝置200或300可基於該 老化訊號來控制至少一 PSU。具體而言,該至少一 PSU可 基於該老化訊號而在該老化時間期間的老化條件中進行老 化運作。當該至少一 PSU接收相同的老化訊號時,可在相 同時間的相同條件中進行該老化運作。 在運作720中,該閃變測量裝置200或300可產生調 光控制訊號。在運作725中,該閃變測量裝置200或300 可基於該調光控制訊號來控制該至少一 PSU。 在運作730中,該閃變測量裝置200或300可供應調 光訊號至至少一光源。該至少一光源可發光以回應該調光 訊號。 在運作735中,該閃變測量裝置200或300可偵測發 射自該至少一光源的光。 在運作740中,該閃變測量裝置200或300可將該已 偵測光轉換成電訊號。在運作745中,該閃變測量裝置200 29 95456 201231987 或300可處理該電訊號,且可產生頻率訊號。在此,該頻 率訊號可包含AC組件與DC組件。 在運作750中’該閃變蜊量裝置2〇〇或3〇〇可從該頻 率訊號分離出該AC組件與DC組件。 在運作755中,該閃變測量裝置2〇〇或3〇〇可計算該 AC組件與DC組件的比例。在運作76〇中,當該已計算的 比例小於預定的閾值時,該閃變測量裝置2〇〇或3〇〇可在 運作765中判定對應的PSU是在正常狀態中。相反地,在 運作760中,當該已計算比例等於或大於該預定閾值時, 該閃變測量裝置2〇〇或300可在運作770中判定對應PSU 是在不正常狀態中。 在運作775中’該閃變測量裝置20〇或300可產生關 於該psu的狀態的結果資料,該PSU的狀態是在運作765 或770中判定。 第14至16圖係分別說明利用psu的照明裝置800、 900與1000的圖式,該psu是使用根據本發明的各種實施 例的PSU製造方法來製造。 該照明裝置800、900與1000可分別利用PSU 813、 912與1130。可使用第1圖的系統100、第4圖的閃變測 量裝置140、第9圖的方法、與第12和13圖的第二測試 方法的其中一者來製造該PSU 813、912與1130。該PSU 813、912與1130可藉由用於電性特性的第一測試與包含 閃變測.量的第二測試來判定是在正常狀態中。 參照第14圖,可將該照明裝置800使用為L管照明 30 95456 201231987 (L-tube lighting) ’且該照明裝置800可包含照明單元 810、調光器(dimmer)820與電源單元830。 該照明單元810可包含主體811、用以照明的光源si2 與該 PSU 813。 該主體811可具有要安裝該光源812的空間與要安裝 該PSU 813的空間。該光源812可包含,例如,led、螢光 燈、燈等。參照第14圖,可在該主體811中的空間中安裝 該光源812與PSU 813。該光源812可連接至該psu 813, 且可接收來自該PSU 813的電源’又該光源812的亮度可 藉由該調光器820來調整。 因為是基於該閃變測量結果來判定該卩別8丨3是在正 常狀癌中’所以該光源812可藉由接收來自該ρςυ 813的 電源來正常地發光。此外,儘管正調整該電源,因為該psu 813疋正常運作,所以該調光器820可精確地調整該光源 812的亮度。 參照第15圖,可使用該照明裝置9〇〇為平面照明裝 置,且該照明裝置900可包含照明單元g 1 〇、調光器920 與電源單元930。 該照明單兀910可包含主體9U、用於照明的光源(未 圖示)與該PSU 912。 該主體911可具有要女裝該光源的空間與要安裝該π。 912的空間。該光源可包含,例如,LED、螢光燈、燈等。 該光源可連接至該PSU 912,且可接收來自該psu 912 的電源,又該光源的焭度可藉由該調光器92〇來調整。 95456 201231987 因為是基於該閃變測量結果來判定該PSU 912是在正 常狀態中,所以該光源可藉由接收來自該PSU 912的電源 來正常地發光。此外,儘管正調整該電源,因為該PSU 912 是正常運作’所以該調光器920可精確地調整該光源的亮 度。 參照第16圖,可使用該照明裝置1〇〇〇為向下照明裝 置以將光導引向下。該照明裝置1000可包含照明單元 1100、調光器1200與電源單元1300。 該照明單元1100可包含主體1110、用於照明的光源 1120 與該 PSU 1130。 該主體1110可具有要安裝該光源1120的空間與要安 裝該PSU 1130的空間。該光源1120可包含,例如,LED、 螢光燈、燈等。 該光源1120可連接至該PSU 1130,且可接收來自該 PSU 1130的電源,又該光源1120的亮度可藉由該調光器 1200來調整。 因為是基於該閃變測量結果來判定該PSU 113〇是在 正常狀態中,所以該光源112 0可藉由接收來自該psu 113 0 的電源來正常地發光。 該照明裝置800、900與1000可使用於戰場、以及工 業與家庭。 該PSU 813、912與1130係應用至該照明震置8〇〇、 900與1000,如第14至16圖所示,但不以此為限。因此, 該PSU 813、912與1130也可應用至各種照明裝置,例如 95456 32 201231987 雲幕燈(ceiling light)、聚光燈等。 此外’可藉由顯示手段(diSpiay means)來利用該psu 813、912與1130,該顯示手段係例如為顯示裝置,而取代 該照明裝置800、900與1〇〇〇。 雖然已經圖示與描述本發明的許多例示實施例,但是 本發明並不限於所述的例示實施例。反而是,能瞭解所屬 技術領域中具有通常知識者可在不㈣本發日㈣原則血於 神下對這些例示實施例做改變,而本發明的Μ是由= 專利範圍與其等效物所定義。 ^ 【圖式簡單說明】 在上述例示實施例的描述並參照其所附圖式之後,本 發明的這些及/或其他態樣、特徵與優點將變得顯而易知且 更容易瞭解,其中: 第1圖係說明根據本發明的實施例的用以製造電源供 應單元(PSU)的系統的方塊圖; 、 第2 的方塊圖 第3 的方塊圖 第4 的方塊圖 圖係說明第1圖的系統中的PSU製造裴備的組構 9 圖係說明第1圖的系統中的第一測試裴備的組構S 95456 201231987 Adjust the height of the light detecting module to adjust the distance between the light detecting module and the light source ίο. ^ The light detecting module can include a light diode for receiving light from the light source. The photodiode can operate with a voltage of about 3 〇ν. When the cover 321 is mounted above the loading case 321A, the internal space of the first cover 321 can be darkened so that light can be blocked. Therefore, the light detecting module can only detect the light emitted from the light source 1 by preventing the emitted light from leaking out of the first cover 321 while preventing the light from entering the first cover 321 . The first PSU 311 to the third pSU 318 can be disposed in front of the first outer cover 321 to the eighth outer cover 328, and can be connected to the light source loaded in the first outer cover 321 to the eighth outer cover 328, The dimming signal can be supplied to the first outer cover 321 to the eighth outer cover 328. The signal processing module 330 can be located at the center and can be connected to the light detecting module mounted in the first cover 321 to the eighth cover 328 and can receive the light detecting module detected by the light detecting module. Light. In addition, the signal processing module 330 can convert the received light into an electrical signal, process the electrical signal to generate a frequency signal, and transmit the frequency signal to the control module 34A. The frequency signal can include an AC component and a DC component. The control module 340 can be located above the signal processing module 33A. The control module 340 can generate a dimming control signal, can measure the flicker of each light source loaded in the first cover 321 to the eighth cover 328, and can determine the first psu 311 based on the flicker measurement result. To the eighth state. 95456 22 201231987 In addition, the control module 340 can store and manage the result data of the obtained component in the storage medium (not determined by the state of the first PSU3U to the first person psu318), and the result can be read. The data is in response to the read command, and the read result data can be displayed on the display device. The first PSU 311 to the eighth PSU 318, and the second cover 321 to the eighth cover 328 have been inserted. The number of psu and the number of outer covers may not be limited, and thus the number of PSUs and the number of outer covers may be changed according to an embodiment. Fig. 8 is a diagram showing information input used to generate dimming control signals according to an embodiment of the present invention. The screen of the 5GQ of the camp. The information screen 500 of the figure 8 (hereinafter referred to as "wheeling screen 5") can be controlled by the control module 144 of FIG. 4 and the control module of FIG. The input screen 500 can be provided by the control module 340 of FIG. 6. The input screen 500 can include a first sub-screen 51, a second sub-screen 520, a second sub-screen 53A, a fourth sub-screen 54, and a storage button. 55〇, execute button 560 and related information button 57 The 5th first sub-screen 510 to the fourth sub-screen 540 can display the wheel-in screen and flicker measurement state of the light source. The input screen can be used to input information for generating a dimming control signal. For example, The first sub-screen 51〇 to the fourth sub-screen 540 may correspond to the first pSu 311 to the fourth PSU 314, respectively, and the light source loaded in the first housing 321 to the fourth housing 324 of FIG. The related information button 570 can include an auto button 571, an input button 572, a search button 573, and a manual button 574. The auto button 571 23 95456 201231987 can be used to enter the 按% ^水翰入 with the input button 5 7 2 Beixun, the information is needed to generate a control signal to control the first _PSU 311 to the fourth psu. For example, when the user selects the automatic button 571, the screen 500 can be input and used to generate a tone. The information of the light control signal. In addition, when the user selects the input button 572, the input screen can display: an individual information input window. For example, the input screen can be popped up. Display contains complex numbers The information input window of the space enables the input of the aging condition, the aging time, the dimming signal range, the dimming signal interval, the time period, etc. When the information segment used to generate the dimming control signal is used, the auto button 571 is used. When the input button 572 is rotated, and when the user selects the save button 550, the control module 144, 25A or 34〇 can store the information segment in the storage medium. When used to generate the dimming control signal The information piece is rotated when the automatic button 571 or the input button 572 is used, and when the user selects the execution button 560, the control module 144, 25 or 34 can generate a dimming control signal, and The generated dimming control signal is transmitted to the first PSU 311 to the fourth PSU 314. When the first PSU 311 to the fourth PSU 314 respectively supply the dimming signals to the light sources in the first cover 321 to the fourth cover 324 based on the dimming control signals, the control module ι 44, 25 〇 or 34〇 can receive a frequency signal corresponding to light emitted from each of the light sources, and can measure flicker. A program for measuring flicker can be displayed on the first sub-screen 510 to the fourth sub-screen 540. Therefore, the user can verify the flicker measurement state and simultaneously monitor the first sub-screen 510 to the fourth sub-screen 54A. The search button 573 can be used to search for flicker measurement result data, and result data obtained by determining the states of the first psu 311 to the fourth PSU 314 based on the flicker measurement results. Additionally, the manual button 574 can be used to verify various settings and methods of using the input screen. Figure 8 illustrates four sub-screens (i.e., the first sub-screen 51 to the fourth sub-screen 540), but is not limited thereto. Therefore, the number of sub-screens displayed on a single screen can be varied in accordance with the number of psu and the number of housings included in the flicker measuring device. Figure 9 is a flow chart illustrating a method of fabricating a pSU in accordance with an embodiment of the present invention. The method of the g-th diagram can be performed by the system 1 of Fig. 1 . Referring to Figure 9, in operation, the system 1 can provide at least one PSU for use in supplying dimming signals to at least one light source. In operation 620, the system 1 can perform a first test of the electrical characteristics of the at least one psu. In operation 630, the system may perform an aging test on the at least one PSU in an aging condition during the aging time based on the aging signal. Here, the aging signal can include the aging condition and the aging time. In operation 640, the system 1 can detect light emitted from the at least one light source, measure flicker of the at least one light source, and perform a second state of the at least one PSXJ based on the flicker measurement result test. After the second test, in operation 650, the system 1 can perform at least one power consumption for the PSU, an output current of the PSU, an output voltage of the psu 25 95456 201231987, a withstand voltage of the PSU, And the third test of whether the PSU is functioning properly. In operation 660, the system 100 can package a PSU that is determined to be in a normal state due to the first test, the second test, and the third test among the at least one psu. Figure 10 is a flow chart further illustrating the operation 610 of Figure 9. The operations 611 to 613 of the first drawing can be performed by the PSU manufacturing equipment 11 shown in Fig. 2. Referring to Fig. 10, in operation 611, the PSU manufactures equipment ι10 "T-coated beta and solder paste on the board ill. In operation 612, the PSU fabrication equipment 11 can use the solder paste to mount at least one wafer component on the circuit board 111. In operation 613, the PSU manufacturing equipment 11 can cause the solder paste to be reflowed at a predetermined temperature. Operations 611 through 613 can be performed to fabricate the PSU by attaching wafer components on the surface (e.g., the upper surface) of the circuit board hi. For example, when the wafer component is attached to another surface (e.g., the lower surface) of the circuit board U1, operations 611 to 613 can be performed on the other surface. Figure 11 is a flow chart further illustrating the operation 620 of Figure 9. The operations 621 to 627 of the nth map can be performed by the first test equipment 120 shown in Fig. 3. Referring to Figure 11, in operation 621, the first test equipment 120 can check the coplanarity of the components of each of the at least one PSU. When a PSU having a raised component is present in operation 622, the first test equipment 120 can be reflowed in the operation 623 to the solder paste applied to the PSU. In operation 624, the first test equipment 120 can re-contact the components that are attached to the reflow solder paste and can eliminate component lift. When the PSU with the raised assembly is not present in operation 622, or when the assembly lift is eliminated via operations 623 and 624, the first test equipment 120 can be tested in operation 625 for installation on the circuit board. The electrical characteristics of at least one of the wafer elements on 111. In other words, it can be tested whether the wafer component is functioning properly. In operation 626, the first test equipment 120 can test the electrical characteristics of the circuit board 111. In other words, it can be tested whether the circuit board 111 is functioning properly. In operation 627, the first test equipment 120 can test at least one of the consumed power of the PSU, the output current of the PSU, the output voltage of the PSU, the withstand voltage of the PSU, and whether the PSU is functioning properly. The first test equipment 120 can individually test the wafer component or the circuit board 111 by testing the electrical characteristics of each of the wafer components and the circuit board 111. Additionally, the first test equipment 120 can test the mutual (mutua 1) electrical characteristics between the wafer component and the circuit board 111 by testing the electrical characteristics of the PSU. Figure 12 is a flow chart further illustrating the operation 640 of Figure 9. A second test of operation 640 can be performed by measuring the flicker of the light source to determine the state of the PSU by receiving a dimming signal supplied from the PSU. In the present specification, operations 641 to 646 of Fig. 12 can be performed to manufacture a PSU. The operations 641 to 646 of the 12th s 27 95456 201231987 diagram can be performed by the flicker measuring device 140 shown in FIG. Referring to FIG. 12, in operation 641, the flicker measurement device 140 can control the PSU 146 based on the dimming control signal. The dimming control signal may include channel information, a dimming signal range, a dimming signal interval, and a period of the channel information associated with the PSU 146, and the dimming signal in the dimming signal range is to be supplied to the light source. 142A, the dimming signal interval is to be adjusted within the dimming signal range, and the period is a period during which the dimming signal is to be supplied and corresponds to the dimming signal interval. In operation 642, the flicker measurement device 140 can supply a dimming signal to the light source 142A. In particular, the PSU 146 in the flicker measurement device 140 is available for dimming signals to the light source 142A. Here, the dimming signal can be one of a DC voltage signal, a PWM signal, and a TRIAC signal. In operation 643, the flicker measuring device 140 can detect light from the light source 142A and can convert the detected light into an electrical signal. In operation 644, the flicker measurement device 140 can process the electrical signal. In operation 645, the flicker measurement device 140 can use the processed electrical signal to measure the flicker of the light source 142A. In operation 646, the flicker measurement device 140 can determine the status of the PSU 146 based on the flicker measurement. As described above, a commercially available PSU can be used for flicker measurement, the state of the PSU can be determined based on the flicker measurement result, and the PSU that has been determined to be in the normal state can be provided. However, the method of manufacturing the PSU is not limited thereto, and may further include a circuit for designing the PSU and combining the PSU. In addition, after measuring the flicker, the PSU manufacturing method may further comprise packaging the PSU that has been determined to be in a normal state 28 95456 201231987. Figure 13 is a flow chart illustrating a method of fabricating a PSU by performing a second test (i.e., measuring flicker) in accordance with another embodiment of the present invention. The method of Fig. 13 can be performed by the flicker measuring device 200 of Fig. 5 or the flicker measuring device 300 of Fig. 6. In operation 710, the flicker measurement device 200 or 300 can generate an aging signal. When inputting information such as aging conditions or aging time, the flicker measuring device 200 or 300 can generate an aging signal including the aging condition and the aging time. In operation 715, the flicker measurement device 200 or 300 can control at least one PSU based on the aging signal. Specifically, the at least one PSU may be aging based on the aging signal during aging conditions during the aging time. When the at least one PSU receives the same aging signal, the aging operation can be performed in the same condition at the same time. In operation 720, the flicker measurement device 200 or 300 can generate a dimming control signal. In operation 725, the flicker measurement device 200 or 300 can control the at least one PSU based on the dimming control signal. In operation 730, the flicker measuring device 200 or 300 can supply a dimming signal to at least one light source. The at least one light source can illuminate to respond to the dimming signal. In operation 735, the flicker measuring device 200 or 300 can detect light emitted from the at least one light source. In operation 740, the flicker measuring device 200 or 300 can convert the detected light into an electrical signal. In operation 745, the flicker measuring device 200 29 95456 201231987 or 300 can process the electrical signal and can generate a frequency signal. Here, the frequency signal can include an AC component and a DC component. In operation 750, the flicker measurement device 2 or 3 can separate the AC component from the DC component from the frequency signal. In operation 755, the flicker measuring device 2 or 3 can calculate the ratio of the AC component to the DC component. In operation 76, the flicker measuring device 2 or 3 may determine, in operation 765, that the corresponding PSU is in a normal state when the calculated ratio is less than a predetermined threshold. Conversely, in operation 760, when the calculated ratio is equal to or greater than the predetermined threshold, the flicker measuring device 2 or 300 may determine in operation 770 that the corresponding PSU is in an abnormal state. In operation 775, the flicker measurement device 20A or 300 can generate result data regarding the state of the pSU, the state of the PSU being determined in operation 765 or 770. Figures 14 through 16 illustrate diagrams of illumination devices 800, 900 and 1000, respectively, utilizing psu, which is fabricated using PSU fabrication methods in accordance with various embodiments of the present invention. The lighting devices 800, 900, and 1000 can utilize PSUs 813, 912, and 1130, respectively. The PSUs 813, 912 and 1130 can be manufactured using one of the system 100 of Fig. 1, the flicker measuring device 140 of Fig. 4, the method of Fig. 9, and the second test method of Figs. 12 and 13. The PSUs 813, 912 and 1130 can be determined to be in a normal state by a first test for electrical characteristics and a second test for flicker measurements. Referring to Fig. 14, the illumination device 800 can be used as an L-tube illumination 30 95456 201231987 (L-tube lighting) and the illumination device 800 can include a lighting unit 810, a dimmer 820, and a power supply unit 830. The lighting unit 810 can include a body 811, a light source si2 for illumination, and the PSU 813. The main body 811 can have a space in which the light source 812 is to be mounted and a space in which the PSU 813 is to be mounted. The light source 812 can include, for example, a led, a fluorescent lamp, a light, or the like. Referring to Fig. 14, the light source 812 and the PSU 813 can be mounted in a space in the main body 811. The light source 812 can be coupled to the psu 813 and can receive power from the PSU 813. The brightness of the light source 812 can be adjusted by the dimmer 820. Since it is determined based on the flicker measurement that the discrimination 8丨3 is in normal cancer, the light source 812 can normally emit light by receiving power from the ρςυ813. Furthermore, although the power supply is being adjusted, the dimmer 820 can accurately adjust the brightness of the light source 812 because the psu 813 is operating normally. Referring to Fig. 15, the illumination device 9 can be used as a planar illumination device, and the illumination device 900 can include a lighting unit g 1 〇, a dimmer 920, and a power supply unit 930. The lighting unit 910 can include a body 9U, a light source (not shown) for illumination, and the PSU 912. The body 911 can have a space for the light source to be worn by the woman and to install the π. 912 space. The light source can include, for example, LEDs, fluorescent lights, lights, and the like. The light source can be coupled to the PSU 912 and can receive power from the pSU 912, and the intensity of the light source can be adjusted by the dimmer 92A. 95456 201231987 Since the PSU 912 is determined to be in a normal state based on the flicker measurement result, the light source can normally emit light by receiving power from the PSU 912. In addition, although the power supply is being adjusted because the PSU 912 is functioning properly, the dimmer 920 can accurately adjust the brightness of the light source. Referring to Fig. 16, the illumination device 1 can be used as a downlighting device to direct light downward. The lighting device 1000 can include a lighting unit 1100, a dimmer 1200, and a power supply unit 1300. The lighting unit 1100 can include a body 1110, a light source 1120 for illumination, and the PSU 1130. The body 1110 can have a space in which the light source 1120 is to be mounted and a space in which the PSU 1130 is to be mounted. The light source 1120 can include, for example, LEDs, fluorescent lights, lights, and the like. The light source 1120 can be coupled to the PSU 1130 and can receive power from the PSU 1130. The brightness of the light source 1120 can be adjusted by the dimmer 1200. Since it is determined based on the flicker measurement that the PSU 113 is in a normal state, the light source 112 0 can normally emit light by receiving power from the psu 113 0 . The lighting devices 800, 900 and 1000 can be used in battlefields, as well as in industry and home. The PSUs 813, 912 and 1130 are applied to the illuminations 8 〇〇, 900 and 1000, as shown in Figures 14 to 16, but not limited thereto. Therefore, the PSUs 813, 912, and 1130 can also be applied to various lighting devices, such as 95456 32 201231987 ceiling light, spotlights, and the like. Further, the psu 813, 912, and 1130 can be utilized by a display means (for example, a display device) instead of the illumination devices 800, 900, and 1 〇〇〇. Although many illustrative embodiments of the invention have been illustrated and described, the invention is not limited to the illustrated embodiments. Rather, it can be understood that those of ordinary skill in the art can make changes to these exemplary embodiments without the principle of the fourth day of the present invention, and the invention is defined by the scope of the patent and its equivalent. . BRIEF DESCRIPTION OF THE DRAWINGS These and/or other aspects, features, and advantages of the present invention will become apparent and appreciated, 1 is a block diagram showing a system for manufacturing a power supply unit (PSU) according to an embodiment of the present invention; 2, a block diagram, a block diagram, a block diagram, and a block diagram of FIG. The structure of the PSU manufacturing equipment in the system 9 shows the structure of the first test equipment in the system of Fig. 1.
J 圖係說明第1圖的系統中的第二測試裝僙的組構 第5圖係說明根據本發明的另一實施例的第二測試沪 備的另一組構的方塊圖; & 第6圖係說明根據本發明的實施例的閃變測量裝置的 95456 33 201231987 外部的結構的圖式; 第7圖係說明第6圖的第—外罩的結構的圖式; 第8圖係㈣根據本發明的實施例而使用來產 控制訊號的資訊輸入螢幕的圖式; 第9圖係說明根據本發明的實施例的製造咖的方法 第10圖係進-步說明第9_方法中的提供 一 PSU的運作的流程圖; 第11圖係進一步說明第9圖的方法中的進行第— 試的運作的流程圖; 第12圖係進一步說明第9圖的方法中的進行第二測 試的運作的流程圖; “ 第13圖係說明根據本發明的另一實施例的進行第一 測試的運作的流程圖;以及 弟14至16圖係刀別說明利用psu的各種照明裝置启 圖式 ,該PSU是藉由根據本發明的各種實施例的Psu 方法來製造。 【主要元件符號說明】 10、 142A 、 812 、 1120 光源 100 系統 110 PSU製造裝備 111 電路板 112 焊膏敷設襞置 113 晶片元件安裝裝置 114 回焊裝置 120 第一測試裝備 121 共面檢查裝置 122 波焊裝置 95456 34 201231987 123 焊料修正裝置 124 元件測試裝置 125 電路板測試裝置126 PSU測試裝置 130 老化測試裝備 140 第二測試裝備 141 訊號輸入/輸出模組 142 外罩 142B 光偵測模組 142C 直流電電源單元 143 訊號處理模組 144 控制模組 145 交流電電源單元 146 、 813 、 912、1130 PSU 150 第三測試裝備 160 包裝裝備 200 、 300 閃變測量裝置 211 > 311 第一 PSU 212 、 312 第二 PSU 213 、 313 第三PSU 214 、 314 第四PSU 215 、 315 第五PSU 216 、 316 第六PSU 217 、 317 第七PSU 218 、 318 第八PSU 221 第一光源 222 第二光源 223 第三光源 224 第四光源 225 第五光源 226 第六光源 227 第七光源 228 八光源 231 第一光偵測模組232 第二光偵測模組 233 第三光偵測模組234 第四光偵測模組 235 第五光偵測模組236 第六光偵測模組 237 第七光偵測模組238 第八光<貞測模組 240 訊號處理模組 241 訊號轉換器 242 低帶通濾波器 243 類比轉數位轉換器 244 快速傅立葉變換單元 35 95456 201231987 250 控制模組 251 輸入單元 252 訊號發射器 253 訊號接收器 254 儲存媒體 255 顯不單元 256 第一控制器 257 第二控制器 260 、 360 AC 電源單元 321 第一外罩 321Α 裝載盒 321Β 外罩蓋 322 第二外罩 323 弟三外罩 324 第四外罩 325 第五外罩 326 第六外罩 327 第七外罩 328 第八外罩 330 訊號處理模組 340 控制模組 350 顯示震置 500 資訊輸入螢幕 510 第一子螢幕 520 第二子螢幕 530 第三子螢幕 540 第四子螢幕 550 儲存按在丑 560 執行按鈕 570 相關資訊按姐 571 自動按鈕 572 輸入按紐: 573 搜尋按叙 574 手動按紐 610、6U、612、613、620、62卜 622、623、624、625、 626、627、630、640、641、642、643、644、645、646、 650、660、710、715、720、725、730、735、740、745、 750、755、760、765、770、775 運作 800、900、1000 照明裝置 810、910、1100 照明單元 811、911、1110 主體 820、920、1200 調光器 830、930、1300 電源單元 36 95456BRIEF DESCRIPTION OF THE DRAWINGS FIG. 5 is a block diagram showing another configuration of a second test in accordance with another embodiment of the present invention; & 6 is a diagram showing the structure of an external structure of a flicker measuring device according to an embodiment of the present invention, 95456 33 201231987; FIG. 7 is a view showing the structure of the first cover of the sixth embodiment; FIG. 8 is a diagram (4) A diagram of an information input screen for producing a control signal according to an embodiment of the present invention; FIG. 9 is a diagram illustrating a method of manufacturing a coffee according to an embodiment of the present invention. FIG. 10 is a description of the method in the ninth method. A flowchart of the operation of a PSU; FIG. 11 is a flow chart further illustrating the operation of the first test in the method of FIG. 9; and FIG. 12 further illustrates the operation of the second test in the method of FIG. Figure 13 is a flow chart illustrating the operation of performing the first test in accordance with another embodiment of the present invention; and the drawings of the brothers 14 to 16 illustrating various lighting device activation patterns using psu, PSU is by various implementations in accordance with the present invention Psu method to manufacture. [Main component symbol description] 10, 142A, 812, 1120 light source 100 system 110 PSU manufacturing equipment 111 circuit board 112 solder paste laying device 113 wafer component mounting device 114 reflow device 120 first test equipment 121 Coplanar inspection device 122 Wave soldering device 95456 34 201231987 123 Solder correction device 124 Component test device 125 Circuit board test device 126 PSU test device 130 Aging test equipment 140 Second test equipment 141 Signal input/output module 142 Cover 142B Light detection Module 142C DC power supply unit 143 Signal processing module 144 Control module 145 AC power supply unit 146, 813, 912, 1130 PSU 150 Third test equipment 160 Packaging equipment 200, 300 Flicker measurement device 211 > 311 First PSU 212 312, second PSU 213, 313 third PSU 214, 314 fourth PSU 215, 315 fifth PSU 216, 316 sixth PSU 217, 317 seventh PSU 218, 318 eighth PSU 221 first light source 222 second light source 223 Third light source 224 fourth light source 225 fifth light source 226 sixth light source 227 The seventh light source 228, the eight light source 231, the first light detecting module 232, the second light detecting module 233, the third light detecting module 234, the fourth light detecting module 235, the fifth light detecting module 236, the sixth light Detection module 237 seventh light detection module 238 eighth light < detection module 240 signal processing module 241 signal converter 242 low band pass filter 243 analog to digital converter 244 fast Fourier transform unit 35 95456 201231987 250 Control Module 251 Input Unit 252 Signal Transmitter 253 Signal Receiver 254 Storage Media 255 Display Unit 256 First Controller 257 Second Controller 260, 360 AC Power Supply Unit 321 First Housing 321 装载 Loading Box 321 Β Cover 322 Second outer cover 323 third outer cover 324 fourth outer cover 325 fifth outer cover 326 sixth outer cover 327 seventh outer cover 328 eighth outer cover 330 signal processing module 340 control module 350 display shock 500 information input screen 510 first sub-screen 520 The second sub-screen 530, the third sub-screen 540, the fourth sub-screen 550, the storage, the ugly 560, the execution button 570, the related information, the 571 automatic button 572 input New Zealand: 573 Search by 574 manual button 610, 6U, 612, 613, 620, 62 622, 623, 624, 625, 626, 627, 630, 640, 641, 642, 643, 644, 645, 646, 650, 660, 710, 715, 720, 725, 730, 735, 740, 745, 750, 755, 760, 765, 770, 775 operating 800, 900, 1000 lighting devices 810, 910, 1100 lighting units 811, 911, 1110 Main body 820, 920, 1200 Dimmer 830, 930, 1300 Power supply unit 36 95456
Claims (1)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020100126560 | 2010-12-10 | ||
| KR1020110100146A KR101811687B1 (en) | 2010-12-10 | 2011-09-30 | System for manufacturing powew supply unit and method for manufacturing powew supply unit, and flicker measurement appratus |
| KR1020110126575A KR20120065231A (en) | 2011-11-30 | 2011-11-30 | Flicker measuring appratus and flicker measuring method thereof |
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| Publication Number | Publication Date |
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| TW201231987A true TW201231987A (en) | 2012-08-01 |
| TWI454714B TWI454714B (en) | 2014-10-01 |
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| TW100145491A TWI454714B (en) | 2010-12-10 | 2011-12-09 | System for manufacturing power supply unit and method for manufacturing power supply unit, and flicker measurement apparatus |
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| JP4221309B2 (en) * | 2004-01-19 | 2009-02-12 | Necディスプレイソリューションズ株式会社 | Flicker detection apparatus, flicker detection method, and projector apparatus |
| TWM348973U (en) * | 2008-07-16 | 2009-01-11 | Reign Power Co Ltd | Multi-functional display power supply |
| KR100981972B1 (en) * | 2009-01-28 | 2010-09-13 | 삼성모바일디스플레이주식회사 | Recording medium storing flicker measuring device, flicker measuring method, and computer program for executing the measuring method |
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