TW201227984A - Reaction apparatus for forming semiconductor thin film on glass substrate - Google Patents
Reaction apparatus for forming semiconductor thin film on glass substrate Download PDFInfo
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- 239000011521 glass Substances 0.000 title claims abstract description 24
- 239000004065 semiconductor Substances 0.000 title claims abstract description 9
- 239000000758 substrate Substances 0.000 title abstract description 30
- 239000010409 thin film Substances 0.000 title abstract description 18
- 238000003860 storage Methods 0.000 claims description 15
- 239000000463 material Substances 0.000 claims description 6
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 5
- 229910002804 graphite Inorganic materials 0.000 claims description 5
- 239000010439 graphite Substances 0.000 claims description 5
- 238000000034 method Methods 0.000 abstract description 27
- 230000008569 process Effects 0.000 abstract description 20
- 238000004519 manufacturing process Methods 0.000 abstract description 13
- 238000004544 sputter deposition Methods 0.000 abstract description 13
- 238000013461 design Methods 0.000 abstract description 7
- 230000015572 biosynthetic process Effects 0.000 abstract 1
- 229910021476 group 6 element Inorganic materials 0.000 abstract 1
- 239000010408 film Substances 0.000 description 23
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 description 13
- 229910052711 selenium Inorganic materials 0.000 description 13
- 239000011669 selenium Substances 0.000 description 13
- 238000010438 heat treatment Methods 0.000 description 11
- KTSFMFGEAAANTF-UHFFFAOYSA-N [Cu].[Se].[Se].[In] Chemical compound [Cu].[Se].[Se].[In] KTSFMFGEAAANTF-UHFFFAOYSA-N 0.000 description 9
- HVMJUDPAXRRVQO-UHFFFAOYSA-N copper indium Chemical compound [Cu].[In] HVMJUDPAXRRVQO-UHFFFAOYSA-N 0.000 description 8
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 7
- 229910052733 gallium Inorganic materials 0.000 description 7
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 5
- 238000001816 cooling Methods 0.000 description 5
- 229910052750 molybdenum Inorganic materials 0.000 description 5
- 239000011733 molybdenum Substances 0.000 description 5
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 4
- 239000007789 gas Substances 0.000 description 4
- MARUHZGHZWCEQU-UHFFFAOYSA-N 5-phenyl-2h-tetrazole Chemical compound C1=CC=CC=C1C1=NNN=N1 MARUHZGHZWCEQU-UHFFFAOYSA-N 0.000 description 3
- WUPHOULIZUERAE-UHFFFAOYSA-N 3-(oxolan-2-yl)propanoic acid Chemical compound OC(=O)CCC1CCCO1 WUPHOULIZUERAE-UHFFFAOYSA-N 0.000 description 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 230000009471 action Effects 0.000 description 2
- 230000004397 blinking Effects 0.000 description 2
- 229910052980 cadmium sulfide Inorganic materials 0.000 description 2
- 238000010549 co-Evaporation Methods 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 239000011261 inert gas Substances 0.000 description 2
- 230000005415 magnetization Effects 0.000 description 2
- 230000013011 mating Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- SPVXKVOXSXTJOY-UHFFFAOYSA-N selane Chemical compound [SeH2] SPVXKVOXSXTJOY-UHFFFAOYSA-N 0.000 description 2
- 229910000058 selane Inorganic materials 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- 239000011787 zinc oxide Substances 0.000 description 2
- 241001674044 Blattodea Species 0.000 description 1
- 229920000049 Carbon (fiber) Polymers 0.000 description 1
- 229910002601 GaN Inorganic materials 0.000 description 1
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 1
- 206010036790 Productive cough Diseases 0.000 description 1
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical group [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
- 208000004350 Strabismus Diseases 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 229910021417 amorphous silicon Inorganic materials 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 235000008429 bread Nutrition 0.000 description 1
- 239000004917 carbon fiber Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000012790 confirmation Methods 0.000 description 1
- 238000010924 continuous production Methods 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000004512 die casting Methods 0.000 description 1
- 238000007772 electroless plating Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 125000004435 hydrogen atom Chemical class [H]* 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229920002401 polyacrylamide Polymers 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 210000003802 sputum Anatomy 0.000 description 1
- 208000024794 sputum Diseases 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 230000002194 synthesizing effect Effects 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 238000007738 vacuum evaporation Methods 0.000 description 1
Classifications
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Physical Vapour Deposition (AREA)
Abstract
Description
201227984 六、發明說明: 【發明所屬之技術領域】 本發明是關於一種用於在玻璃上形成半導體薄膜的反 應容器,此反應容器乃是卜ΙΠ-νι族薄膜太陽能電池生產 所需之關鍵設備’並適用於卜111·^1族半導體薄膜太陽能電池 量產方法中之濺鍍/RTP製程。 【先前技術】 薄膜太陽能電池一般可分為矽薄膜、II-VI族薄膜以及 Ι-ΙΙΙ-VI族薄膜等三種,珍薄膜以非晶破薄膜(amorphous silicon)電池為代表’II-VI族薄膜以銻化鎘(CdTe)薄膜為 代表’而I-III-VI族薄膜則以銅銦鎵硝(CuInxGai-xSe2,其 中χ<1 ’簡稱CIGS)薄膜為代表,而這三種薄膜電池也都已 經有薇商在量產’其中以生產銻化鎘薄膜電池之美國公司201227984 VI. Description of the Invention: [Technical Field] The present invention relates to a reaction vessel for forming a semiconductor thin film on glass, which is a key device required for the production of a dih-νι thin film solar cell. It is also applicable to the sputtering/RTP process in the mass production method of the semiconductor thin film solar cell of the 111. [Prior Art] Thin film solar cells are generally classified into three types: tantalum film, II-VI film, and yttrium-yttrium-VI film. The rare film is represented by amorphous silicon battery as 'II-VI film. The cadmium telluride (CdTe) film is representative of 'the I-III-VI film is represented by copper indium gallium nitride (CuInxGai-xSe2, which is referred to as <1 'CIGS) thin film, and these three thin film batteries have also been There is a US company in which the company is in mass production, in which cadmium telluride thin film batteries are produced.
Fisrt Solar最為成功,但是一般認為由於ciGS薄膜具有 • 較錄化鑛薄膜優良之光伏特性,所以CIGS薄膜太陽能電池 會比錄化錫薄膜太陽能電池更具有未來性。 目前CIGS薄膜太陽能電池所使用之基板大致上可以分 為硬性基板(如玻璃與不鏽鋼板)以及軟性基板(如不鏽鋼 薄片與聚亞酿胺薄膜),量產上以使用玻璃基板為主流。 在生產上大致有三種主流製程,分別是共蒸鍍法、濺鍍 /HzSe硒化法以及濺鍍/RTp硒化法,共蒸鍍法利用高真空 蒸鍍將銅銦鎵碼四種元素同時蒸鍵在高溫的基板上以形成 CIGS薄膜。濺鍍/HAe硒化法則是先將銅銦鎵以真空濺鍍 201227984 的方式鍍在基板上,然後再將此基板放入充滿H2Se氣體之 高溫反應爐内,H2Se氣體在高溫下會分解成栖及氫氣,產Fisrt Solar is the most successful, but it is generally believed that CIGS thin film solar cells will be more futuristic than recorded tin thin film solar cells due to the superior photovoltaic properties of ciGS films. At present, substrates used in CIGS thin film solar cells can be roughly classified into rigid substrates (such as glass and stainless steel plates) and flexible substrates (such as stainless steel sheets and polyacrylamide films), and the use of glass substrates is the mainstream in mass production. There are roughly three mainstream processes in production, namely co-evaporation, sputtering/HzSe selenization, and sputtering/RTp selenization. The co-evaporation method uses high vacuum evaporation to simultaneously bond four elements of copper indium gallium code. The vapor bonds are on a high temperature substrate to form a CIGS film. Sputtering/HAe selenization method is to deposit copper indium gallium on the substrate by vacuum sputtering 201227984, and then put the substrate into a high temperature reactor filled with H2Se gas. H2Se gas will decompose into high temperature at high temperature. And hydrogen, produced
生的硒和基板上的銅銦鎵反應形成CIGS薄膜。濺鍍/RTP 硒化法同樣的也是先將銅銦鎵以真空濺鍍的方式鍍在基板 上,再將硒鍍在銅銦鎵,然後將鍍有銅銦鎵硒四種元素的 基板放入快速升溫製程爐(Rapid Thermal Process,簡稱 RTP),在數分鐘内將基板加熱至高溫以形成CIGS薄膜。本 節所提到的高溫若以使用玻璃基板而言約在500°C到550T •之間。 上述三種方法各有優缺點,但是其形成CIGS薄膜於大 面積玻璃上的製程與設備都必須具有以下的基本特性,均 勻的加熱大面積的玻璃、精確的溫度控制、精確的提供足 夠的硒以與銅銦鎵反應。The raw selenium reacts with copper indium gallium on the substrate to form a CIGS film. Sputtering/RTP selenization is also performed by first depositing copper indium gallium on the substrate by vacuum sputtering, then depositing selenium on copper indium gallium, and then placing the substrate coated with four elements of copper indium gallium selenide. A Rapid Thermal Process (RTP) heats the substrate to a high temperature in a few minutes to form a CIGS film. The high temperatures mentioned in this section are between 500 ° C and 550 T • if using a glass substrate. Each of the above three methods has advantages and disadvantages, but the process and equipment for forming a CIGS film on a large-area glass must have the following basic characteristics, uniformly heating a large area of glass, precise temperature control, and accurately providing sufficient selenium to Reacts with copper indium gallium.
濺鍍/RTP硒化法相較於其他方法不論在加熱的均勻性、 溫度的控制性以及硒的控制上都有較佳的表現,更由於製 φ 程時間短因此受到極大的重視,此法在1993年由Seimens 公司率先發表("Novel Rapid Thermal Processing for CIS Thin-Film Solar Cells", Proc. 23rd IEEE PVSCCompared with other methods, the sputter/RTP selenization method has better performance in terms of heating uniformity, temperature control and selenium control, and it is greatly valued because of the short φ process time. Published by Seimens in 1993 ("Novel Rapid Thermal Processing for CIS Thin-Film Solar Cells", Proc. 23rd IEEE PVSC
Conf.,1993,p. 441),在美國專利仍?6,717,112中揭露 了將Siemens的研究化為量產程序的方法,此法主要是將鍍 有銅銦鎵硒四種元素的基板先放入一反應容器中,然後將 此反應容器輸送至不同之程序腔體以形成CIGS薄膜,例如 先將此反應容器送至快速升溫爐中升溫反應,然後送至冷 卻腔體中冷卻,如此一來便形成了連續性的製程(in nne 201227984Conf., 1993, p. 441), still in the US patent? 6,717,112 discloses a method for converting Siemens research into a mass production process, which mainly involves placing a substrate coated with four elements of copper indium gallium selenide into a reaction vessel, and then transporting the reaction vessel to a different one. The process chamber is formed to form a CIGS film. For example, the reaction vessel is sent to a rapid heating furnace for temperature rise reaction, and then sent to a cooling chamber for cooling, thereby forming a continuous process (in nne 201227984).
Pf_s) ’非常的適合大但是在此專利中所描述 的反應容H非常的複雜,專利巾的反應容器必須具有同時 通入其他反應氣體、排氣和保持碼錢反減力的功能, 因此設計了複雜的通排氣口,增加製程躲速升溫爐的複 雜性,另外專利中反應容器所使用的材料包含上蓋的石英、 容器四壁的碳纖強化複合材以及底座的石墨,這樣的組合 增加了反應溫度控制的困難性。 【發明内容】 本發明為一種用於在玻璃上合成半導體薄膜的反應容 器,此反應容器搭配一快速升溫製程(Rapid Thermal Process)與快速升溫爐可以讓CIGS薄膜太陽能電池之濺鍍 /RTP磁化製程具有優異之量產性。 本發明之反應容器包含一上蓋與一底座,上蓋與底座 契合時中間形成一置物空間以置放鍍有銅銦鎵硒之玻璃基 板,並在上蓋與鍍有銅銦鎵硒之玻璃基板之間提供適當之 自由空間以避免上蓋與鍍膜面直接接觸,在加熱過程中玻 璃基板上之硒會氣化充滿自由空間,由於上蓋與底座之契 合部分並非完全緊密之接觸,因此在自由空間内之硒蒸氣 會在升溫過程中由於蒸氣壓之昇高而由密合部分逸出‘,'並 且在恆溫過程中由密合部分擴散出反應容器,因此本發明 在上蓋與底座契合部分設置連續性之榫卯結構,此連續性 之榫卯結構之特徵在於卵眼大於榫頭,由於卯眼大於榫頭, 因此會在連續性之榫卯結構内形成一緩衝空間以控制硒化 201227984 反應時在反應容器内自由空間之喊㈣度, 散過程中會先由反應容器之自由㈣擴散至緩衝空= 再由緩衝㈣擴散至反應容器外,透過此緩衝空間造成兩 階段之猶擴散以達到控制自由㈣内喊度之目的,若為 了對硒蒸氣之逸散有更加之控制,可以設計兩個以上之連 續性之榫卯結構。Pf_s) 'very suitable for large but the reaction volume H described in this patent is very complicated. The reaction container of the patented towel must have the function of simultaneously introducing other reaction gases, exhaust gas and maintaining the deductive force of the code, so the design The complex exhaust port increases the complexity of the process to avoid the speed-up furnace. In addition, the materials used in the patented reaction vessel include the quartz on the cover, the carbon fiber reinforced composite on the wall of the container, and the graphite on the base. This combination has been added. Difficulties in reaction temperature control. SUMMARY OF THE INVENTION The present invention is a reaction vessel for synthesizing a semiconductor thin film on glass. The reaction vessel can be combined with a Rapid Thermal Process and a rapid heating furnace to cause a sputtering/RTP magnetization process for a CIGS thin film solar cell. Excellent mass production. The reaction container of the present invention comprises an upper cover and a base, and a storage space is formed between the upper cover and the base to place a glass substrate coated with copper indium gallium selenide, and between the upper cover and the glass substrate coated with copper indium gallium selenide Provide appropriate free space to avoid direct contact between the upper cover and the coated surface. During the heating process, the selenium on the glass substrate will be vaporized and filled with free space. Since the fit between the upper cover and the base is not completely in close contact, the selenium in the free space The vapor will escape from the close portion due to the increase of the vapor pressure during the heating process, and diffuse out of the reaction vessel by the close portion during the constant temperature process. Therefore, the present invention provides continuity in the portion where the upper cover and the base fit.卯 structure, this continuity of the 榫卯 structure is characterized by the egg eye larger than the hoe, because the 卯 eye is larger than the hoe, it will form a buffer space in the continuous 榫卯 structure to control the selenization 201227984 reaction in the reaction vessel free The shouting of space (four degrees), the process of scattering will first spread from the freedom of the reaction vessel (4) to the buffer space = then from the buffer (four) to the reaction volume Outside the device, the two-stage diffusion is caused by this buffer space to achieve the purpose of controlling freedom (4). If there is more control over the escape of selenium vapor, more than two consecutive structures can be designed.
緩衝空間之設計在於控制反應容器内自由空間的硒蒸 氣’以達到使濺鍍/RTP硒化製程穩定的目的,由於砸化反 應必須在高溫進行’而且高溫的硒具有报強的侵蚀性,因 此一般磁化反應必須使用耐高溫及耐碼侵餘的材料,而由 於這類材料大面積加工技術之限制,會使得上蓋與底座必 定無法緊密契合,會產生間隙,此時位於自由空間内之砸 蒸氣會透過這些間隙大量的直接擴散至反應容器之外,而 使得藏鍍/RTP确化製程極不穩定,有了緩衝空間後,縱使 上蓋與底座無法緊密契合而有間隙,此時位於自由空間内 之硒蒸氣無法直接擴散至反應容器外,而必須先擴散至緩 衝空間’再由緩衝空間擴散至反應容器之外,再由於緩衝 空間内磁蒸氣的濃度大於反應容器之外,也可以大大減緩 自由空間内硒蒸氣至緩衝空間之擴散速度。 相對於設計一複雜而且完全封閉之硒化反應容器,造 成生產製程之複雜度增加及操作上的困難,本發明捨棄完 全封閉而接受有限度的硒損失,以一非常簡單之反應容器 達到控制硒蒸氣之目的,讓濺鍍/RTP硒化之製程更具有量 產性。 201227984 【實施方式】 本發明所敘述之反應容器如圖1所示,圖1所顯示的 是反應容器之上蓋1與底座2契合後的結構圖,當上蓋1 與底座2契合後會在所形成之反應容器的中央部位形成一 置物空間8,此置物空間之大小除了可以置放鍍有銅銦鎵硒 膜層4的玻璃基板9外,還有餘預的自由空間3,此自由空 間可以避免上蓋1和玻璃基板9上之銅銦鎵硒膜層4接觸。 • 當上蓋1與底座2契合時,由於上蓋1具有連續性之榫頭 51,而底座具有連續性之卯眼51,因此在契合時會在契合 面6與契合面7之間形成一連續性之榫卯結構,並由於卯 眼大於榫頭,因此會在此連績性之榫卵結構中形成一緩衝 空間5。 所謂連續性之榫頭51與連續性之卯眼52可以於圖2 與圖3中得到說明,圖2顯示的是上蓋的翻面圖,此上蓋1 Φ 之平面61與平面71是在和底座2契合時的契合接觸面, 在平面61與平面71間製作一環繞著上蓋的連續性突起榫 頭51,在上蓋的中央部位向下挖出一開放空間81,此開放 空間81在未來上蓋1和底座2契合時將會形成圖1中之置 物空間8,而此連續性榫頭51將向下挖出之開放空間81 完全包圍。圖2顯示的是底座2的正面圖,此底座2之平 面62與平面72是在和上蓋1契合時的契合接觸面,在平 面62與平面72間製作一環繞著底座的連續性凹下卯眼52, 此連續性卯眼52和圖2上蓋1之連續性榫頭51在上蓋與 201227984 底座契合時會形成圖i中反應容器之連續性榫卵沾構。另 外由圖2與圖3可以看出當上蓋與底座契合時所^成之置 物空間8的容積大小完全與由上蓋中央所挖出之開放空間 81容積大小相同,因此我們可以說圖i所示反應容器之置 物空間8 ’其容積完全形成於上蓋1。 圖2與圖3所示之上蓋1與底座2,其結構是如此的簡 單,因此在製作上也就相對的非常容易,在材料的選擇上 _ 以具有高導熱係數之材質為最佳選擇,例如石墨,製作時 可以選擇適當大小之石墨厚板,利用大型精密機械加工設 備一次性的將上蓋或底座加工完成,或者也可以利用壓鑄 的方式製作。 如果為了更有效的控制自由空間内磁蒸氣的逸散,在 反應容器之上蓋與底座製作時可以設計一個以上之連續性 榫頭與連續性卯眼,用以在反應容器形成一個以上之榫卯 結構’圖4顯示的是具有兩個榫卯結構的反應容器。 _ 反應容器之設計並不限於圖1之結構,其變化在於置 物空間、連續性榫頭和連續性卯眼是設計在上蓋或底座, 如圖5所示,圖5之上圖顯示的反應容器很明顯的只是將 圖1中的反應容器翻轉,此時連續性卯眼在上蓋,連續性 祥頭在底座,而反應容器之置物空間其容積完全形成於底 座。圏5之中間圖示則是另一種設計,連續性卯眼在底座, 連續性榫頭在上蓋與圖1相同,但是反應容器之置物空間 其容積完全形成於底座〇圖5之上圖示很明顯的只是將圖5 之中間圆示翻轉,連續性卯眼在上蓋,連續性榫碩在底座, 201227984 而反應容器之置物空間其容積完全形成於上蓋。當然還有 另一種設計如圖6所示,那就是將反應容器之置物空間其 部分容積形成於上蓋,部分容積形成於底座,另外也可以 如圖7所示,反應容器之底座中央部位稍微凸起成一平台 以放置玻璃基板’而上蓋中央部位所挖出之開放空間則較 所需之置物空間為大,因此我們也可以用反應容器之置物 空間其容積完全形成於上蓋來說明圖7之設計。 完整的使用濺鍍/RTP硒化製程以製造CIGS薄膜太陽 ® 能電池之製造程序如下所示: 玻璃基板清洗+滅嫂翻電極(Mo)於基板上+第一道雷射劃 線"> 減鍍銅銦鎵膜(CuInGa)於鉬電極上">鍵袖於銅銦鎵膜 上·>RTP硒化製程今硫化鎘(CdS)化學鍍膜+濺鍍氧化鋅緩 衝層今第二道機械劃線今濺鍍透明導電層(摻鋁之氧化 鋅)+第三道機械切割+後段模組製程The buffer space is designed to control the selenium vapor in the free space of the reaction vessel to achieve the purpose of stabilizing the sputtering/RTP selenization process. Since the deuteration reaction must be carried out at a high temperature, and the high-temperature selenium has a strong attack property, Generally, the magnetization reaction must use materials with high temperature resistance and resistance to code intrusion. Due to the limitation of large-area processing technology of such materials, the upper cover and the base must not be closely matched, and a gap will be generated. At this time, the vapor in the free space is generated. A large amount of these gaps will directly diffuse out of the reaction vessel, which makes the Tibetan plating/RTP confirmation process extremely unstable. After the buffer space is provided, even if the upper cover and the base cannot closely fit together, there is a gap, and the space is located in the free space. The selenium vapor cannot be directly diffused outside the reaction vessel, but must first diffuse into the buffer space and then diffuse from the buffer space to the outside of the reaction vessel. Since the concentration of magnetic vapor in the buffer space is greater than that of the reaction vessel, the freedom can be greatly reduced. The diffusion rate of selenium vapor into the buffer space in the space. Compared with the design of a complex and completely closed selenization reaction vessel, resulting in increased complexity of the production process and operational difficulties, the present invention is completely closed and accepts a limited amount of selenium loss, and achieves control of selenium in a very simple reaction vessel. The purpose of the vapor is to make the sputtering/RTP selenization process more mass-produced. 201227984 [Embodiment] The reaction container described in the present invention is as shown in FIG. 1. FIG. 1 is a structural view of the upper cover 1 of the reaction container and the base 2, and is formed when the upper cover 1 is engaged with the base 2. A central portion of the reaction vessel forms a storage space 8 which is different in size from the glass substrate 9 plated with the layer of copper indium gallium selenide film 4, and has a pre-free space 3 which avoids the upper cover. 1 is in contact with the copper indium gallium selenide film layer 4 on the glass substrate 9. • When the upper cover 1 is engaged with the base 2, since the upper cover 1 has a continuous boring head 51 and the base has a continuous squint 51, a continuity is formed between the compliant surface 6 and the compliant surface 7 when engaged. The structure of the sputum, and because the blink is larger than the hoe, a buffer space 5 is formed in the continuous egg structure. The so-called continuous head 51 and the continuous blink 52 can be illustrated in FIG. 2 and FIG. 3. FIG. 2 shows a top view of the upper cover. The plane 61 and plane 71 of the upper cover 1 Φ are in the base 2 When the engagement surface meets the contact surface, a continuous protrusion head 51 surrounding the upper cover is formed between the plane 61 and the plane 71, and an open space 81 is dug downward in the central portion of the upper cover. The open space 81 is in the future cover 1 and the base. When the 2 fits, the storage space 8 in Fig. 1 will be formed, and the continuous boring head 51 will completely surround the open space 81 dug out. 2 is a front view of the base 2, the plane 62 and the plane 72 of the base 2 are a matching contact surface when engaging with the upper cover 1, and a continuous concave sill around the base is formed between the plane 62 and the plane 72. The eye 52, the continuous blink 52 and the continuous head 51 of the upper cover 1 of Fig. 2, when the upper cover is engaged with the base of 201227984, forms a continuity of the reaction container in Fig. i. In addition, as can be seen from FIG. 2 and FIG. 3, when the upper cover is engaged with the base, the volume of the storage space 8 is completely the same as the volume of the open space 81 excavated by the center of the upper cover, so we can say that the figure i is The storage space 8' of the reaction vessel is completely formed in the upper cover 1. The upper cover 1 and the base 2 shown in Fig. 2 and Fig. 3 are so simple in structure that they are relatively easy to manufacture, and the material selection is the best choice for materials having a high thermal conductivity. For example, graphite can be selected from graphite slabs of appropriate size during production, and the upper cover or the base can be processed by a large-scale precision machining equipment at a time, or can be produced by die casting. In order to more effectively control the escape of magnetic vapor in the free space, more than one continuous steamed bread and continuous blink can be designed on the cover and the base of the reaction vessel for forming more than one structure in the reaction vessel. 'Figure 4 shows a reaction vessel with two ruthenium structures. _ The design of the reaction vessel is not limited to the structure of Fig. 1. The change is that the storage space, the continuous hoe and the continuous mortise are designed on the upper cover or the base. As shown in Fig. 5, the reaction container shown in the upper view of Fig. 5 is very It is obvious that the reaction container in Fig. 1 is inverted, in which case the continuous blink is on the upper cover, the continuous head is on the base, and the volume of the reaction container is completely formed on the base. The middle figure of 圏5 is another design, the continuous blinking is at the base, and the continuous hoe is the same as that of Figure 1 in the upper cover, but the volume of the storage space of the reaction container is completely formed on the base. Only the middle circle of Fig. 5 is turned over, the continuous blink is on the top cover, and the continuity is on the base, 201227984, and the storage space of the reaction container is completely formed on the upper cover. Of course, there is another design as shown in Fig. 6, that is, the partial volume of the storage space of the reaction container is formed on the upper cover, and part of the volume is formed on the base. Alternatively, as shown in Fig. 7, the central portion of the base of the reaction container is slightly convex. It is a platform to place the glass substrate' and the open space excavated from the central part of the upper cover is larger than the required space. Therefore, we can also use the storage space of the reaction container to fully form the upper cover to illustrate the design of Figure 7. . The complete manufacturing procedure for making CIGS thin film solar cells using the sputter/RTP selenization process is as follows: Glass substrate cleaning + cockroach flip electrode (Mo) on the substrate + first laser line "> ; CuInGa film on the molybdenum electrode "> key sleeve on the copper indium gallium film ·> RTP selenization process cadmium sulfide (CdS) electroless plating + sputtered zinc oxide buffer layer Two-way mechanical marking, today's sputtering transparent conductive layer (aluminized zinc oxide) + third mechanical cutting + rear module process
本發明之反應容器主要應用在RTP硒化製程,其應用 程序如圖8所示’首先將鍍有銅銦鎵硒及鉬電級之玻璃基 板9放在反應容器之底板2上,然後將反應容器之上蓋1 對準放下101以與底板契合而結合成反應容器,將含有玻 璃基板9之反應容器送入一進料腔體102中,先將進料腔 體之空氣抽出,真空度必須低於10_2torr,然後通入情性 氣體(氮氣或氬氣),如此的操作便可將反應容器内之空氣 置換成惰性氣體,再將反應容器傳送至一快速升溫爐(RTP 201227984 爐)103,於此快速升溫成内以每秒鐘5X之升溫速度將反 應容器升溫至500Τ到55〇°C之間,之後保持溫度數分鐘, 如此快速升溫後再持溫之操作可以使用紅外線加熱之方法 來達成,在完成快速升溫爐段之程序後,反應容器被傳送 至冷卻腔體104,反應容器在此降溫至1〇〇。〇以下然後送出 冷卻腔體104’最後打開反應容器105並取出已在其上形成 CIGS膜之玻璃基板10。 雖然本發明所述之反應容器並不限於所舉之數個範例, 任合依據本專利說明書所作之簡單與等效之改變與修飾皆 屬於本專利所保護之範圍。 201227984 【圖式簡單說明】 第1圖顯示依據本發明精神所設計之反應容器結構圖 第2圖為圖1所揭露之反應容器之上蓋翻面圖 第3圖為圖1所揭露之反應容器之底座正面圖 第4圖為具有兩個榫卯結構之反應容器結構圖 第5圖顯示另外三個依據本發明精神所設計之反應容器 結構圖 第6圖顯示依據本發明精神所設計之反應容器結構圖 第7圖顯示依據本發明精神所設計之反應容器結構圖 第8圖為本發明之反應容器應用於濺鍍/RTP硒化法之 程序圖 【主要元件符號說明】 1 :反應容器之上蓋 2 :反應容器之底座 3 :反應容器置物空間内放入玻璃基板後的自由空間 4 :玻璃基板上的膜層,包含鉬電極與銅銦鎵硒膜 5 :反應容器之榫卯結構所形成之緩衝區域 6 :反應容器上之上蓋與底座契合時的契合面 7 :反應容器上之上蓋與底座契合時的契合面 8 :反應容器之置物空間 9:含有鉬電極與銅銦鎵硒膜之玻璃基板 10 :包含鉬電級與CIGS膜之玻璃基板 51 :連續性榫頭 12 201227984 52 :連續性卯眼 61,71 :位於上蓋之契合接觸平面 62, 72 :位於底座之契合接觸平面 82 :位於上蓋低於契合接觸平面之開放空間 101 :放下上蓋與底座契合以結合成反應容器之動作 102 :進料腔體 103 :快速升溫爐 104 :冷卻腔體 105 :打開反應容器之動作The reaction vessel of the present invention is mainly applied to the RTP selenization process, and its application program is as shown in FIG. 8 'Firstly, a glass substrate 9 plated with copper indium gallium selenide and molybdenum electric grade is placed on the bottom plate 2 of the reaction vessel, and then the reaction is carried out. The upper cover 1 of the container is aligned with the bottom plate 101 to be combined with the bottom plate to be combined into a reaction container, and the reaction container containing the glass substrate 9 is sent into a feeding chamber 102, and the air of the feeding chamber is first withdrawn, and the degree of vacuum must be low. At 10_2torr, then an inert gas (nitrogen or argon) is introduced. This operation can replace the air in the reaction vessel with an inert gas, and then transfer the reaction vessel to a rapid heating furnace (RTP 201227984 furnace) 103. The rapid heating is carried out to raise the temperature of the reaction vessel to between 500 Τ and 55 〇 ° C at a temperature increase rate of 5× per second, and then the temperature is maintained for several minutes. The operation of maintaining the temperature after the rapid temperature rise can be achieved by infrared heating. After the process of completing the rapid heating furnace section, the reaction vessel is transferred to the cooling chamber 104 where the reaction vessel is cooled to 1 Torr. The crucible is then sent out to the cooling chamber 104' to finally open the reaction vessel 105 and take out the glass substrate 10 on which the CIGS film has been formed. While the present invention is not limited to the examples, it is intended to cover all modifications and variations of the present invention. 201227984 [Simplified description of the drawings] Fig. 1 is a structural view of a reaction container designed according to the spirit of the present invention. Fig. 2 is a top view of the upper surface of the reaction container disclosed in Fig. 1. Fig. 3 is a reaction container disclosed in Fig. 1. 4 is a front view of a reaction vessel having two crucible structures. FIG. 5 is a view showing the structure of another three reactors designed according to the spirit of the present invention. FIG. 6 shows a structure of a reaction vessel designed in accordance with the spirit of the present invention. Figure 7 is a view showing the structure of a reaction vessel designed in accordance with the spirit of the present invention. Figure 8 is a flow chart of the reaction vessel of the present invention applied to the sputtering/RTP selenization method. [Main component symbol description] 1 : Reaction vessel upper cover 2 : The base of the reaction vessel 3: the free space after the glass substrate is placed in the reaction container storage space 4: the film layer on the glass substrate, including the molybdenum electrode and the copper indium gallium selenide film 5: the buffer formed by the structure of the reaction vessel Zone 6: The mating surface 7 when the upper lid of the reaction vessel is engaged with the base: the mating surface 8 when the upper lid of the reaction vessel is engaged with the base: the storage space of the reaction vessel 9: containing the molybdenum electrode Glass substrate with copper indium gallium selenide film 10: glass substrate 51 containing molybdenum electric grade and CIGS film: continuous boring head 12 201227984 52: continuous blinking 61, 71: fit contact plane 62 of the upper cover, 72: at the base The contact plane 82 is located in the open space 101 of the upper cover lower than the fit contact plane: the action of lowering the upper cover and the base to be combined into a reaction container 102: the feed chamber 103: the rapid heating furnace 104: the cooling chamber 105: the opening reaction Container action
1313
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| CN116190476A (en) * | 2023-03-06 | 2023-05-30 | 安徽华深铝业有限公司 | Polymer Photovoltaic Panel Structure for Intelligent Street Lighting |
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