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TW201203323A - Manufacturing method of epitaxial substrate - Google Patents

Manufacturing method of epitaxial substrate Download PDF

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Publication number
TW201203323A
TW201203323A TW99122968A TW99122968A TW201203323A TW 201203323 A TW201203323 A TW 201203323A TW 99122968 A TW99122968 A TW 99122968A TW 99122968 A TW99122968 A TW 99122968A TW 201203323 A TW201203323 A TW 201203323A
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layer
substrate
epitaxial
manufacturing
patterned film
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TW99122968A
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Chinese (zh)
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TWI441241B (en
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dong-xing Wu
rui-hua Hong
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Univ Nat Chunghsing
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Abstract

A manufacturing method of epitaxial substrate includes the following steps: first forming a patterned film on a substrate; continuing to form a first epitaxial layer; then using laser to destruct a preset region corresponding to the first epitaxial layer above the substrate, thereby forming a liquefied sacrificial layer between the first epitaxial layer and the substrate; then epitaxially forming a second epitaxial layer from the first epitaxial layer; subsequently etching and removing the patterned film to weaken the structure of the first epitaxial layer, so as to facilitate in etching and removing the first epitaxial film; and finally etching and removing the liquefied sacrificial layer to strip the substrate off the second epitaxial layer, thereby effectively improving the removal efficiency.

Description

201203323 六、發明說明: • 【發明所屬之技術領域】 本發明是有關於一種半導體基板,特別是指一種磊晶 基板的製造方法。 . 【先前技術】 • 在製作光電元件時,所選用的基材往往有傳熱能力不 佳等缺點,為了兼顧光電元件的磊晶品質與散熱能力,在 製造元件的過程中,常見的一道製程是將該基材移除,例 • 如將藍寶石(sapPhire;化學式為ai2o3)基材剝離後,再 貼合高熱傳係數的散熱板’以利光電元件的散熱性能提昇 〇 一種常見的移除基材方式,是將一第一磊晶膜設置於 遠基材與一第二磊晶膜間,再利用濕式蝕刻(评以etching ) 劑將該第一磊晶膜破壞,以移除該基材。但由於該第一磊 晶膜結構緻密且完整,造成钮刻效率過低。 【發明内容】 ® 因此,本發明之目的,即在提供一種可以弱化磊晶膜 結構以提高基板移除效率的磊晶基板的製造方法。 於是’本發明磊晶基板的製造方法,包含以下步驟: • 首先形成一圖樣化膜層於一基板上,並自該圖樣化膜層與 該基板磊晶形成一第一磊晶層,接著,利用雷射破壞該第 —蟲晶層對應位於該基板上方的預定區域,並形成一液化 犧牲層於s亥第一蟲晶層與該基板交界處’再自該第一蟲晶 層磊晶形成_第二磊晶層,接續地,蝕刻移除該圖樣化膜 201203323 層’弱化該第一磊晶層的結構,最後,蝕刻移除該液化犧 牲膜,以將該基板自該第二磊晶膜剝離。 本發明之功效在於該第一磊晶層與該基板交界處形成 有該液化犧牲層’並將該圖樣化膜層移除,弱化該第一磊 晶層的結構,以利蝕刻移除該第一磊晶膜,有效提高移除 效率。 【實施方式】 有關本發明之前述及其他技術内容、特點與功效,在 以下配合參考圖式之一個較佳實施例的詳細說明中,將可 清楚的呈現。 本發明羞晶基板的製造方法之第一較佳實施例包含以 下步驟: 參閱圖1,首先,於一基板1上形成一圖樣化膜層2, 使S亥基板1露出部分預定區域。該基板丨包括一平坦基板 面11,於s亥基板面11上預定區域形成該凸起狀的圖樣化膜 層2,剩餘的部分預定區域則不被該圖樣化膜層2遮蔽,用 於供後續磊晶用。 更進一步說明的是’該圖樣化膜層2為規則條狀圖案 ,該圖樣化膜層2與該基板1露出預定區域的寬度總和範 圍在0.02微米至20微米間。 接著’自該基板1的平坦基板面11所露出的部分預定 區域側向蟲晶,形成一第一蟲晶層3,且該呈凸起狀的圖樣 化膜層2被包覆於該第一磊晶層3中。 參閱圖2 ’利用雷射破壞該第一磊晶層3對應位於該基 201203323 板1上方的預定區域,進而形成一液化犧牲層4於該第一 磊晶層3與該基板1交界處,更進一步說明的是,在本較 佳實施例中,該第一磊晶層3為氮化鎵’經過雷射破壞鍵 結後形成一層嫁與氣氣。 參閱圖3,接著,自該第一磊晶層3向上磊晶形成一第 —蟲晶層5。 參閱圖4與圖5,選用氫氟酸濕式蝕刻劑移除該圖樣化 膜層2,由於該圖樣化膜層2包覆於該第一磊晶層3中,因 此蝕刻移除該圖樣化膜層2後’將產生位於該第一磊晶層3 内部的複數孔洞31,該等孔洞31弱化該第一磊晶層3的結 構強度。 值得一提的是’該第一磊晶層3的厚度大於該圖樣化 膜層2厚度’且該圖樣化膜層2厚度範圍為0.01微米至5 微米。更佳地,該圖樣化膜層2厚度範圍為0>1微米至3微 米。 參閱圖6與圖7,利用濕式蝕刻劑通入該等孔洞3 i中 ,將該液化犧牲層4蝕刻移除,將該基板丨自該第二磊晶 層5上剝離,並將該第一磊晶層3移除。 、’不上所述,於該第一磊晶層3與該基板丨交界處藉由 每射光照射形成有該液化犧牲層 4 ’且由於該圖樣化膜層2201203323 VI. Description of the Invention: • Technical Field of the Invention The present invention relates to a semiconductor substrate, and more particularly to a method of manufacturing an epitaxial substrate. [Prior Art] • When manufacturing photovoltaic elements, the selected substrate often has disadvantages such as poor heat transfer capability. In order to balance the epitaxial quality and heat dissipation capability of the photovoltaic elements, a common process in the process of manufacturing components is common. The substrate is removed, for example, if the sapphire (sapPhire; chemical formula is ai2o3) substrate is peeled off, and then the heat transfer plate with high heat transfer coefficient is attached to facilitate the heat dissipation performance of the photovoltaic element. A common removal In the substrate mode, a first epitaxial film is disposed between the far substrate and a second epitaxial film, and the first epitaxial film is destroyed by wet etching (etching) to remove the first epitaxial film. Substrate. However, since the first epitaxial film structure is dense and complete, the buttoning efficiency is too low. SUMMARY OF THE INVENTION Accordingly, it is an object of the present invention to provide a method of fabricating an epitaxial substrate which can weaken the structure of the epitaxial film to improve substrate removal efficiency. Thus, the method for manufacturing an epitaxial substrate of the present invention comprises the following steps: first forming a patterned film layer on a substrate, and epitaxially forming a first epitaxial layer from the patterned film layer, and then, Destroying the first-small layer corresponding to the predetermined area above the substrate by using a laser, and forming a liquefied sacrificial layer to form an epitaxial layer from the first insect layer at the interface between the first insect layer and the substrate The second epitaxial layer is successively etched to remove the patterned film 201203323 layer to weaken the structure of the first epitaxial layer, and finally, the liquefied sacrificial film is removed by etching to remove the substrate from the second epitaxial layer The film is peeled off. The effect of the present invention is that the liquefied sacrificial layer is formed at the interface between the first epitaxial layer and the substrate, and the patterned film layer is removed, and the structure of the first epitaxial layer is weakened to facilitate etching removal. An epitaxial film effectively improves the removal efficiency. The above and other technical contents, features, and advantages of the present invention will be apparent from the following detailed description of the preferred embodiments. A first preferred embodiment of the method for fabricating a matte substrate of the present invention comprises the following steps: Referring to Figure 1, first, a patterned film layer 2 is formed on a substrate 1 such that the substrate 1 is exposed to a predetermined portion. The substrate 丨 includes a flat substrate surface 11 , and the convex pattern layer 2 is formed on a predetermined area on the substrate surface 11 , and the remaining portion is not covered by the patterned film layer 2 for Subsequent epitaxy. Further, the patterned film layer 2 is a regular strip pattern, and the total width of the patterned film layer 2 and the predetermined area of the substrate 1 is between 0.02 μm and 20 μm. Then, a portion of the predetermined region exposed from the flat substrate surface 11 of the substrate 1 is laterally crystallized to form a first crystal layer 3, and the convex pattern layer 2 is coated on the first layer. In the epitaxial layer 3. Referring to FIG. 2, the first epitaxial layer 3 is separated by a laser to a predetermined area above the substrate 1 of the 201203323, thereby forming a liquefied sacrificial layer 4 at the interface between the first epitaxial layer 3 and the substrate 1. It is further noted that, in the preferred embodiment, the first epitaxial layer 3 is a gallium nitride 'after a laser breakdown bond to form a layer of marshalling gas. Referring to FIG. 3, a first crystal layer 5 is epitaxially formed from the first epitaxial layer 3. Referring to FIG. 4 and FIG. 5, the patterned film layer 2 is removed by using a hydrofluoric acid wet etchant. Since the patterned film layer 2 is coated in the first epitaxial layer 3, the patterning is removed by etching. After the film layer 2 is formed, a plurality of holes 31 are formed inside the first epitaxial layer 3, and the holes 31 weaken the structural strength of the first epitaxial layer 3. It is worth mentioning that 'the thickness of the first epitaxial layer 3 is larger than the thickness of the patterned film layer 2' and the thickness of the patterned film layer 2 ranges from 0.01 micrometers to 5 micrometers. More preferably, the patterned film layer 2 has a thickness ranging from 0 μm to 1 μm to 3 μm. Referring to FIG. 6 and FIG. 7, a wet etchant is introduced into the holes 3 i, the liquefied sacrificial layer 4 is etched away, and the substrate is peeled off from the second epitaxial layer 5, and the An epitaxial layer 3 is removed. And not described above, the liquefied sacrificial layer 4' is formed by irradiation of each of the first epitaxial layer 3 and the substrate, and the patterned layer 2 is formed by the patterning

5移除該基板1的效率, 〖晶層3結構強度的孔洞3 i,再利 ;牲層4’有效提高自該第二磊晶膜 故確貫能達成本發明之目的。 201203323 惟以上所述者,僅為本發明之較佳實施例^已,當不 能以此限定本發明實施之範圍,即大凡依本發明巾請專利 範圍及發明說明内容所作之簡單的等效變化與修飾,皆仍 屬本發明專利涵蓋之範圍内。 【圖式簡單說明】 圖1是側視示意圖,說明本發明蟲晶基板的製造方法 的第-較佳實施例’於-基板依序形成—圖樣化膜層及一 第一磊晶膜; 圖2是延續圖i的側視示意圖,說明利用雷射破壞該 第一磊晶層對應位於基板上的預定區域,並形成一液化犧 牲層於第一磊晶層與基板交界處; 圖3是延續圖2的側視示意圖,說明磊晶成長一第二 蟲晶膜於該第一磊晶膜上; 圖4是延續圖3的側視示意圖,說明利用濕式钱刻移 除該圖樣化膜層; 圖5是延續圖4的側視示意圖,說明移除該圖樣化膜 層以弱化該第一磊晶膜的結構; 圖6是延續圖5的側視示意圖,說明將該液化犧牲層 钮刻移除,分離該基板與該第二磊晶膜;及 圖7是延續圖6的側視示意圖,說明本第一較佳實施 例中的該第二磊晶膜。 201203323 【主要元件符號說明】 1 •… -·…基板 31… …· ·孔洞 11…. .....基板面 4…·. .....液化犧牲層 2 .… •‘…·圖樣化膜層 5 ··. ----第"一從日日膜 3…… .....第 日日膜5, the efficiency of removing the substrate 1, the hole 3 i of the structural strength of the crystal layer 3, and the benefit of the layer 4 i is effectively increased from the second epitaxial film, so that the object of the present invention can be achieved. The above is only the preferred embodiment of the present invention, and the scope of the invention is not limited thereto, that is, the simple equivalent change of the patent scope and the description of the invention according to the invention. And modifications are still within the scope of the invention patent. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a side elevational view showing a first preferred embodiment of a method for fabricating a microcrystalline substrate of the present invention, in which a substrate is sequentially formed, a patterned film layer, and a first epitaxial film; 2 is a side view of the continuation of the figure i, illustrating that the first epitaxial layer corresponding to the predetermined area on the substrate is destroyed by laser, and a liquefied sacrificial layer is formed at the interface between the first epitaxial layer and the substrate; FIG. 3 is a continuation; 2 is a side view showing the epitaxial growth of a second insect film on the first epitaxial film; FIG. 4 is a side elevational view continuing from FIG. 3, illustrating the removal of the patterned film layer by wet etching. FIG. 5 is a side elevational view of FIG. 4, illustrating the structure of removing the patterned film layer to weaken the first epitaxial film; FIG. 6 is a side elevational view continuing from FIG. 5, illustrating the liquefaction sacrificial layer button engraving Removing and separating the substrate and the second epitaxial film; and FIG. 7 is a side elevational view continuing from FIG. 6, illustrating the second epitaxial film in the first preferred embodiment. 201203323 [Explanation of main component symbols] 1 •... -·...substrate 31... ...··孔11...........substrate surface 4...·..... liquefaction sacrificial layer 2 .... •'...·pattern Film layer 5 ··. ----The first one from the day film 3...... ..... day film

77

Claims (1)

201203323 七、申請專利範圍: 1. 一種磊晶基板的製造方法,包含: (a) 形成一圖樣化膜層於一基板上; (b) 自該圖樣化膜層與該基板磊晶,形成一第一遙 晶層; (c) 利用雷射破壞該第一磊晶層對應位於該基板上 方的預定區域’進而形成一液化犧牲層於該第一磊晶層 與該基板交界處; (d) 自e玄第一遙晶層蟲晶形成一第二蟲晶層; (e )银刻移除該圖樣化膜層,弱化該第一磊晶層的 結構;及 (f)蝕刻移除該液化犧牲膜,以將該基板自該第二 遙晶膜剝離。 2. 依據申請專利範圍第丨項所述之磊晶基板的製造方法, 該步驟(a)中,該基板包括一平坦基板面,於該基板面 上預定區域形成凸起狀的圖樣化膜層,該步驟(b)令, 该呈凸起狀的圖樣化膜層被包覆於該第一磊晶層中。 3. 依據巾請專利範圍第i項所述之蟲晶基板的製造方法, e玄步驟(e )巾’利用濕式姓刻劑將該圖樣化膜層移除, 產生位於該第一磊晶層内部的複數孔洞,該等孔洞弱化 該第一磊晶層的結構強度。 4. 依據申請專利範圍第1 、* 靶固弟1項所述之磊晶基板的製造方法, 該步驟(f)中,利用濕式2 用濕式蝕刻劑通入該等孔洞中,將該 液化犧牲膜蝕刻移除,將呤且& Α J砂保將該基板自該第二磊晶層上剝離 201203323 5. 依據申請專利範圍第4項所述之磊晶基板的製造方法, 更包含一實施於該步驟(f)後的步驟(Π),將該第一 蠢晶膜触刻移除β 6. 依據申請專利範圍第丨項述之磊晶基板的製造方法,其 中,該第一磊晶層的厚度大於該圖樣化膜層厚度,該圖 樣化膜層厚度範圍為〇〇1微米至5微米。 7. 依據申請專利範圍第6項述之磊晶基板的製造方法,其 中’該圖樣化膜層厚度範圍為〇1微米至3微米。 8. 依據申請專利範圍第1項述之磊晶基板的製造方法,其 中’該圖樣化膜層為規則條狀圖案,該圖樣化膜層與該 基板露出預定區域的寬度總和範圍在0.02微米至20微 米間。201203323 VII. Patent application scope: 1. A method for manufacturing an epitaxial substrate, comprising: (a) forming a patterned film layer on a substrate; (b) epitaxially crystallizing from the patterned film layer to form a a first remote layer; (c) destroying the first epitaxial layer by a laser corresponding to a predetermined region above the substrate to form a liquefied sacrificial layer at a boundary of the first epitaxial layer and the substrate; (d) Forming a second worm layer from the first crystal layer of e-Xuan; (e) removing the patterned film layer by silver etching, weakening the structure of the first epitaxial layer; and (f) etching to remove the liquefaction The film is sacrificed to peel the substrate from the second crystal film. 2. The method of manufacturing an epitaxial substrate according to the above application, wherein in the step (a), the substrate comprises a flat substrate surface, and a predetermined pattern layer is formed on a predetermined surface of the substrate surface. In step (b), the convex patterned layer is coated in the first epitaxial layer. 3. According to the method for manufacturing the insect crystal substrate described in the scope of the patent application, the e-step (e) towel removes the patterned film layer by using a wet type engraving agent to generate the first epitaxial layer. A plurality of holes inside the layer that weaken the structural strength of the first epitaxial layer. 4. According to the method for producing an epitaxial substrate according to the first application of the patent application, in the first step of the present invention, in the step (f), the wet etchant is introduced into the holes by the wet type 2, and the wet etchant is introduced into the holes. The liquefied sacrificial film is removed by etching, and the substrate is peeled off from the second epitaxial layer. The method of manufacturing the epitaxial substrate according to the fourth aspect of the patent application includes a step (f) after the step (f), the first stray film is touch-etched to remove β 6. The method for manufacturing an epitaxial substrate according to the scope of the patent application, wherein the first The thickness of the epitaxial layer is greater than the thickness of the patterned film layer, and the patterned film layer has a thickness ranging from 微米1 μm to 5 μm. 7. The method of manufacturing an epitaxial substrate according to claim 6, wherein the patterned film layer has a thickness ranging from 微米1 μm to 3 μm. 8. The method of manufacturing an epitaxial substrate according to claim 1, wherein the patterned layer is a regular strip pattern, and the total width of the patterned film layer and the predetermined area of the substrate is 0.02 micron to 20 microns.
TW99122968A 2010-07-13 2010-07-13 Method for manufacturing epitaxial substrate TWI441241B (en)

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