TW201111788A - Delivery device capable of calibrating position of the electronic components - Google Patents

Abstract

A delivery device capable of calibrating position of the electronic components is disclosed, the delivery device is installed upon a platform having a test machine, including a transport mechanism and a material moving mechanism, wherein the delivery device is also equipped, in between the transport mechanism and the test machine, with a visual mechanism having an image grabber. The material moving mechanism is provided with an adjustment structure below a driving structure, said adjustment structure has a rotation drive source and the X-Y axial drive source for respectively driving the stacked rack to perform angular rotation and X-Y axial displacement, while the rack of the bottom is equipped with a pick-and-place device, further, the material moving mechanism uses the driving structure to drive the pick-and-place device to take out electronic component under test in the transport mechanism, and transports them to the image grabber of the visual mechanism for image extraction, and then uses the adjustment structure to drive the pick-and-place device to perform angle rotation and X-Y axial displacement so as to compensate and correct positions of electronic components, thereby enabling pins of the electronic components to align precisely with probes of the test machine to accurately perform the test operation and improve practical effectiveness of test quality.

Description

201111788 VI. Description of the Invention: [Technical Field] The present invention provides a conveying device capable of correcting the pin of a component on a pick-and-placer accurately to the probe test quality of the test machine. In order to ensure the quality of the finished IC, the manufacturer is responsible for the quality of the finished IC, and the manufacturer has used a number of processing machines to test the IC to eliminate the bad: 曰j The process is equipped with a test sub-feeding device, a receiving device, a conveying device, and a: the second-eye 2 test sorting machine includes an IC to be tested. The receiving device is used to accommodate the test device IC. The skirt is placed in the feeding device C, 'testing machine is used to test / complete the IC; please refer to the first and second diagrams, and the test and transfer between the test machine to be equipped with a plurality of test sockets with probes The test machine of class i machine is equipped with a feeding stage 2 1 1 and ^^2 before the test machine mechanism 2 and the first carrier stage 2 2 after the test machine work 2 2 The second carrier mechanism 2 2 is further connected to the measuring device 2 21 and the receiving material mechanism 23, and the moving mechanism 2 3 is connected to the measuring device, and the moving structure 2 3 1 is disposed above the 1 inch. Driven-supported frame 2 3 side is provided with the first drive frame 2 3 2 the bottom surface is fixed with the first pick-and-place axial displacement, while the bearing 21 and the test machine 1 are transferred between the test pieces / for the first - Carrier test The test machine 10 is further equipped with a second transfer knot ^ ^ the transfer mechanism 2 3 for the Y-z axial displacement of the frame 2 3 5, and the carrier p 4 ' is used to drive a loader 2 3 6. For the second carrier mechanism=the bottom surface is provided with the second measurement/finished IC, and the transfer mechanism 2 3 j and the test machine 1 are transferred between, the first drive structure 2 3 1 series drives the bearing 2 3 1 to move the 2 2 2 axial displacement, in the first carrier " ί2 and the first pick-and-place device 1 ten out of 1 C, and transfer to the test machine 1 〇 1 1 The feeding stage 2 1 makes the foot contact with the probe in the test seat 1 1 : 2〇1111788 After the test, the first driving structure 2 3 i drives the first pick-and-place device 2 3 3, The test block 11 takes out the measured !c and transfers it to the receiving stage 212 of the first carrier mechanism 2, so that the receiving stage 212 carries out the tested IC; however, due to the increasingly sophisticated and lightweight The distance between the pins is also relatively narrow, so that the accuracy of the alignment of the probes of the C2 1 is relatively high, but the movement of the mechanism 2 3 and the second drive structure 2 31, 2 3 4 have Component assembly, product error 'lead to the first pick-and-placer 2 3 3 and second take Device 236 to be a person on the test base 1, thus easily - cumulative errors, but not easy to make a

The pin solutions to the probes of the health seat 1 1 are inaccurate in returning jobs, resulting in a lack of test quality. SUMMARY OF THE INVENTION The purpose of the present invention is to provide a transportable device for correcting the position of an electronic component, which is mounted on a machine having a test machine, including a carrier mechanism and a writing device #^1, the transmission device In addition, there is a probe with an adjustment test machine under the money organization and the machine. The accurate positioning of each pin is accurate. Ke Zhizhen (four) Jian' _ enhances the quality of the test. The purpose of the invention is to provide a configurable structure. The adjustment structure of the material is based on the image data = ^ ^ transport:: the vehicle to the drive source respectively The automatic pick-and-place device of the pick and place device = the source and the X = each pin are accurately placed on the test machine test stand to make the electronic work, and the practical benefit of improving the convenience of use is achieved.丨彳 贝 执行 执行 执行 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 Before the test machine 5 〇, the electronic component of the ―f/^ measurement is transmitted, the transmission 3 3 g 1 # delivery mechanism 3 2, and the second carrier mechanism 3 2 is equipped with a receiving stage 3 2 2 For carrying the test to be tested/tested separately = load 2 3 21 and - the carrier mechanism 3 1 and the test machine 5 (10) are provided with the 'the other number is the image of the CCD ί?ί with = two central control Unit = Rotating "Moving source, the rotation is ok ^' Shelf 3 5 2 is connected by the rotating shaft - the frame 3 5 4, the ^ 3 to 3 5 3 to the first - the sliding seat 3 5 5 One is located on the bottom of the machine, and the bottom of the 5 is equipped with a γ-axis frame. The stacked machine is used for the laminating machine slides under the machine ^5 4 and is set to 6 = 7 to the bottom. A slide rail 3 5 7 is slidably coupled to the first frame, and the frame 3 5 4: the first slide y:: the 201111788 is provided with an axial drive source and an x-axis drive source, and the shaft end is provided with the 5th 9, And in the linear motor 3 5 9 history two racks 3 5 6 made of the bottom surface 'make linear motor 3 5 9 can drive the 5th 5th Chiang, axial shift, and with the first slip 3 5 7 along the first slide 3 shaft, then drive a Gu ί drive source is - motor 361, the motor 361 text link to 3 2 And on the pulley set 362, there is a second Ί fi 4, a squat, and a third umbrella 5 located below the second frame 356, and the ΐ ΐ frame 3 The top surface of the 6 4 is provided with the second sliding seat 3 6 , 8 of the x-axis, so that the sliding of the 5 is placed on the second sliding frame of the second frame 3 5 6 3 5: the machine 6 1 can drive the third The frame 3 6 4 is X-axis displacement, and the other is ==^1; - the floating head 3 6 6, the first-floating continuation, the second, ΐη, the lower part of the frame 3 6 9 is provided The second adjustable carry-over drive frame 3 6 9 is fixed with a rotary drive source, and the rotary 3 7 i = motor 3 7 0 rotating shaft is coupled to the first frame 2 frame 3 71 is provided with a γ-axis - slide 3 7 in - second machine stacked rack 'the stacked frame is driven to the drive source and the X-axis drive source;; =, = 3 7 4 is slip-connected to the first frame 3 7丄第—;; U g with = 6 and on the underside of the linear motor 3 7 6 = 3 71, making the linear stirrup 3, 7 i end s ΙΐΙ axial position 'And with the first - slip 3 7 4 along the first - slide ί and the axial drive source is - motor 3 7 8 , the motor 3 7 8H by 201111788 pulley set 3 7 9, and on the pulley set 3 7 9 a second connecting wood 380 is provided for connecting a second frame 373 1 , the top surface of the third frame 380 is attached to the shirt shaft ^ and is disposed by the second sliding seat 328 The second frame 3 7 3 ; the dead machine 3 7 8 can drive the third frame 3 81 to be X-axis displacement, and the bottom surface of the black 3 8 1 is equipped with a second floating head 3 8 3, the second pass The second pick-and-place device 3 8 4 is installed below the 8 3 , and the / surface 3 2 and the working material transfer mechanism 3 5 are driven by the first driving structure 3 51 to drive the first pick-up pick-up device 3 6 7 Y-axis displacement to the feeding stage: 匕3! The first pick-and-placer 3 6 7 is assembled on the first float & the carrier, due to the first floating buffer, to prevent pressure loss of the electron to be tested The moving head 3 θ β sub-element 6 1 is transferred to the upper side of the visual mechanism 3 3 and the measured electric power 6 is positioned. The visual mechanism 3 3 takes an image of the image pickup moving head 36 6 and takes image data. Delivered to the central electronic component ►According to the image data control related institutions for the 1 2 system; The axial displacement is to the test machine 5 , to measure: the J sub-element 6 1 is exactly opposite to the probe located in the test stand 51, and the pins of the first j 61 drive the first frame 3 5 4 and the lower side thereof Γ First take the motor 3 5 3 pick-and-placer 3 6 7 to drive the test; rotate the action to make the first linear motor 359 shaft end joint degree compensation correction, and because the linear motor 3 5 9 can drive The second machine adds q ς; a connecting frame 306, so that a sliding rail 3 5 7 is along the first frame 3, and the second frame 356 and the lower two auxiliary displacements of the second frame 3 6 7 drives the electronic component to be tested to move 201111788 to the first machine ίS ^ 1 ί, to the pulley set 3 6 2 via the second link 3 6 3 64 below the first - floating head 3 6 6 , - the pick and place device 3 is moved, so that the electronic component ^1 of the first pick-and-placer 3 6 7 φ is to be compensated for the X-axis position. Therefore, the first pick-and-place operation and the axial displacement of the ill cause The electronic component to be tested ^1 automatically compensates the transfer mechanism 35 to take the second drive structure 3 6 !=2; ii4 on the supply stage 3 21 of the second carrier mechanism 3 2 to take out the next test to be tested Electronic component 6 2, and transferred everywhere' The second visual mechanism 34 is taken by the image capturing device, :===; please refer to the figure H0 to take the C. The first driving structure 3 5 1 is taken out by the first pick-and-placer 36 seat 51 Element 6 1, and moved out! Two receiving platform 31 2, so that the receiving stage 3 1 2 the whole name, the second dare, the first driving structure 3 6 8 drives the second adjustment 5 0 Example 3 8 f and the electronic component to be tested 6 2 Displacement to the test machine, : ί 2 adjustment structure is also driven by the motor 3 7 第 -: the closing element synchronously rotates to make the second pick-and-placer 3; = and The relevant components below it are = belt; group 3 7 9 and second link =

The Li-direction displacement causes the second pick-and-placer 3 8 4 to drive the compensation to be tested. Therefore, the second pick-and-placer 384 can be accurately positioned on the test stand 51 according to the angle of the jr foot. The adjustment structure of the device is 'fit. The pin is accurately placed on the probe in the test stand and is tested 201111788 and 2nd figure 3rd figure 4th figure 5th figure 6th figure 7th figure 8th figure 9th figure 1st figure · f type conveying device Lang Lai Configuration diagram. Schematic diagram of the conventional material transfer mechanism. The configuration diagram of the conveying device and the testing machine of the present invention. A schematic view of the transfer mechanism of the present invention. The front view of the first and second adjustment structures of the present invention. A side view of the first and second adjustment structures of the present invention.

Schematic diagram of the use of the wheeling device of the present invention (1). Schematic diagram of the use of the wheeling device of the present invention (2). Schematic diagram of the use of the delivery device of the present invention (3). Figure 10: Schematic diagram of the use of the wheeling device of the present invention (4). [Main component symbol description] [Literature] Tester: 10 Conveying device: 2 0 Feeding station: 211 Second carrier: 2 2: Receiving stage: 2 2 2 First drive structure: 2 31 A pick and place device: 2 3 3 Shelf: 2 3 5 [Invention] Test stand: 11 First carrying mechanism: 2 i Receiving platform: 212 Feeding station: 2 21 Transfer mechanism: 2 3 Rack: 2 3 2 Second drive structure: 2 3 4 Second pick-and-place device: 2 3 6 Conveying device: 3 0 Feeding station: 311 Second carrying mechanism: 3 2 Receiving platform: 3 2 2 Take Imager: 3 31 Imager: 3 41 First Carrier: 31 Receiving Station: 312 Feeding Station: 3 21 First Vision: 3 3 Second Vision: 3 4 Transfer Mechanism: 3 5 201111788 First drive structure: 3 51 Motor: 3 5 3 First slide: 3 5 5 First slide: 3 5 7 Linear motor: 3 5 9 Motor: 3 61 Second link: 3 6 3 Second Slide: 3 6 5 First pick-and-place: 3 6 7 Shelf: 3 6 9 • First frame: 3 71 Second frame: 3 7 3 Second slip: 3 7 5 First link: 3 7 7 Pulley set: 3 7 9 Third frame: 3 81 Second floating head 3 8 3 Machine: 4 0 Tester: 5 0 φ Electronic components: 61, 6 2 Shelf: 3 5 2 First frame: 3 5 4 Second frame: 3 5 6 Second slip: 3 5 8 First link: 3 6 0 Pulley set: 3 6 2 Third frame: 3 6 4 First floating head: 3 6 6 Second drive structure: 3 6 8 Motor: 3 7 0 First slide: 3 7 2 First slip: 3 7 4 Linear motor: 3 7 6 Motor: 3 7 8 Second link: 3 8 0 Second slide: 3 8 2 Second pick-and-place: 3 8 4 Test stand: 51

Claims (1)

201111788 VII. Patent application scope: 1 · A kind of transport device for correcting the position of electronic components. The transport device is mounted on a machine with a test machine, and includes: Vision mechanism: for taking electronic components; Mechanism: is provided with a driving structure, an adjusting structure and a pick and place device. The driving structure is used to drive the adjusting structure and the displacement of the pick and place, and the electronic component is transferred between the visual mechanism and the testing machine, and the adjusting structure is provided with a rotation. a driving source for driving the first frame to rotate, the bottom of the first frame is provided with a stacked frame, and the X-axis driving source and the γ-axis driving source are respectively disposed on the stacked casing The displacement of the lower picker is driven, so that the pick and place can compensate the position of the correcting electronic component. 2: A transport device for calibrating the position of an electronic component according to the scope of claim 4, wherein the visual mechanism is provided with an image pickup device, the image capture device being C◦D. The conveying device for calibrating the position of the electronic component according to the first aspect of the patent application, wherein the driving structure of the material moving mechanism is provided with a rotating drive source for the frame structure, and the laminated structure of the adjusting structure A second frame is disposed below the frame ^ for receiving the axial drive source and the y-axis drive source to drive the second frame and the y-axis drive source for axial displacement. A third raft with a pick-and-place device is arranged below the two frames, and the third frame and the pick-up device are axially driven by the X-axis driving source, and the angle rotation and the χ-γ axis of the ejector The displacement is used to compensate for the position of the electronic component. Take the state of the singularity of the electronic component and the position of the calibratable electronic component as described in the item “3”, and install the first link at the end of the shaft of the linear motor, . | j.., the device, the towel, the rotary drive of the side-structure, the first frame is connected to the shaft, and the γ-axis drive source is a linear sub-horse. The end is fixed on the first machine. Red, so that the linear motor can drive the axial displacement, and the X-axis drive source is a motor, the first one, the second link on the third frame of the wooden γ-belt set connection drive: with j 11 201111788 6 2 ' And the top surface of the second side having the private direction on the bottom surface is slidably disposed on the top surface of the second sliding frame on the second sliding handle. According to the third item of the patent application scope, the seventh aspect is 7 8 And wherein the adjusting structure is disposed at the position of the first member, and the pick-up device is disposed below the floating head. The bottom of the wood is equipped with a floating head, • according to the scope of the patent application scope item i; view: construct the ^ in the test structure see the mechanism 'and after the test machine with the imager! m Γ Γ 销 销 ί 可 可 可 可 可 可 可 可 可 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子凊 Patent 顚 可 电子 电子 = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = 动 = 动 = 动 动 动 动The electronic component machine has a second driving structure for the belt, wherein the feeding mechanism of the conveying device is connected to the f structure of the testing machine and the second pick and place device for γ-ζ axial displacement, and Transfer electronic components between the second & construction and test machine. The device for correcting the position of the correctable electronic component described in Item 9 of the special sugar package, wherein the first drive structure is provided with a frame for assembling the first adjustment structure, the first adjustment structure is The frame is provided with a rotary driving source for rotating the first frame, and the laminated frame is provided with a second frame below the first frame for receiving the Υ axial driving source And the X-axis driving source, and the γ-axis driving source drives the second frame and the X-axis driving source for γ axial displacement, and the second frame has a third machine with the first pick-and-place device The frame is driven by the χ axial driving source to drive the second frame and the first pick-and-place device to perform X-axis displacement, so that the first take 201111788 is displaced to make up the positive-pick-and-place. According to the patent application scope 10 The device of the present invention, wherein the first adjustment structure is provided with a first link frame by a motor, a Y-connector, a frame, a Y-series, a motor and a drive, and the link frame is connected by a pulley set. Transmission third 2c: horse, 'the shaft of the motor; sued to take the position of the three racks of 12 send = please the position of the electronic components = Two == The top surface is provided with 13 can be placed in the rack;: Please = Fan can correct the position of the electronic component to the first - float "floating installation with 1 4 · According to f please full-time _ items can be Correction 2 yuan = / 25 set this; Move ^ machine wood to make the move, the layered rack is the year 'low T source to drive the third rack and move to: ϊ axis ϊ ίί: ^ set the loss 1 5 · 依The calibratable electronic component bit described in the first patent of the cap patent 201111788 sends the device 'where the rotation of the second adjustment structure is connected to the motor of the first machine as the motor, and reaches the auxiliary rod of the linear motor The end is equipped with a first connection, so that the linear motor can be driven to move axially and the X-axis drive source is - the pulley link is connected to the second link on the third frame. The f-frame is X-axis displacement, and the lower part of the third frame is equipped with a second pick-and-place 1 6 · According to the application for special fiber _ ! 4 items can be corrected • ,:: '; - The bottom of the rack == The top of the rack is provided with a second slide that is slidable on the top surface of the first slide and has a second slide that can be slid on the second slide rail. It 17 to send the calibratable electronic component position as described in the _ ', the first adjustment structure of the middle ho ho is on the bottom of the third frame, the right side of the dream machine, 8 8 below the floating head, set the first item The configurable position of the position of the electric shirt member is arranged; the conveyor device is provided on the side of the testing machine with a carrier _ 19. The structure has at least a stage for sending electronic components. § Wai The device for correcting the position of the calibratable electronic component described in Item 18 is provided with a first carrier 20 (4) in front of the testing machine: a second carrier mechanism is provided behind the main testing machine. To carry the feeding & feeding carrier and receiving carrier respectively, the feeding fee ^=Temple/Electronics' second carrier mechanism has ', ° receiving carrier' for carrying the test / Complete electronic components.